Test system and control method for coarse and fine tracking optoelectronic equipment

Abstract

The present invention provides a test system and control method for coarse and fine tracking optoelectronic devices, which can be applied to the field of tracking and aiming technology. The test system includes: a main axis, an auxiliary axis, a pitch axis, a fine tracking light tube, and a coarse tracking light tube, disposed on a base; wherein the fine tracking light tube is used to emit a fine tracking beam, the coarse tracking light tube is used to emit a coarse tracking beam, the main axis is used to adjust the position of the fine tracking beam within a first plane, the pitch axis is used to adjust the angle between the fine tracking beam and the horizontal plane, and the auxiliary axis is used to adjust the position of the coarse tracking beam within the first plane. After reflection, the fine tracking beam is parallel to the coarse tracking beam, and the first plane is a plane perpendicular to the emission direction of the fine tracking beam. Therefore, the test system of the present invention can complete coarse and fine integrated dynamic testing of coarse and fine tracking optoelectronic devices, simplifying the testing process of coarse and fine tracking optoelectronic devices.

Description

Technical Field

[0001] The present invention relates to the field of tracking and aiming technology, and more particularly to a test system and control method for coarse and fine tracking and aiming optoelectronic equipment. Background Art

[0002] Electro-optical tracking and aiming systems play a vital role in scenarios requiring high precision, rapid response, and strong anti-interference capabilities. The core component of an electro-optical tracking and aiming system is the coarse and fine tracking and aiming optoelectronic device. The control technology for this device typically utilizes a coarse and fine composite axis coordinated control strategy to ensure accurate, stable, and reliable tracking and aiming.

[0003] In order to enable the coarse and fine tracking optoelectronic equipment to achieve accurate, stable and reliable tracking and aiming effects, it needs to be tested. However, the inventors have found that there are at least the following problems in the relevant technology: the testing process of the coarse and fine tracking optoelectronic equipment is relatively complicated. Summary of the Invention

[0004] In view of this, the present invention provides a test system and control method for coarse and fine tracking optoelectronic equipment.

[0005] One aspect of the present invention provides a test system for coarse and fine tracking optoelectronic equipment, comprising a main axis, an auxiliary axis, a pitch axis, a fine tracking light pipe, and a coarse tracking light pipe arranged on a base;

[0006] The fine tracking light tube is used to emit a fine tracking beam, the coarse tracking light tube is used to emit a coarse tracking beam, the main axis is used to adjust the position of the fine tracking beam in a first plane, the pitch axis is used to adjust the angle between the fine tracking beam and a horizontal plane, and the auxiliary axis is used to adjust the position of the coarse tracking beam in the first plane. After reflection, the fine tracking beam is parallel to the coarse tracking beam, and the first plane is a plane perpendicular to the emission direction of the fine tracking beam.

[0007] According to an embodiment of the present invention, the above-mentioned testing system further includes:

[0008] A telescopic shaft, on which the coarse tracking light tube is arranged, is used to adjust the distance between the coarse tracking light beam and the fine tracking light beam.

[0009] According to an embodiment of the present invention, a reflection mirror is provided on the rotation axis of the auxiliary axis, and the fine tracking beam is emitted from the fine tracking light tube and is reflected by the reflection mirror to be parallel to the coarse tracking beam.

[0010] According to an embodiment of the present invention, the rotation axis of the auxiliary shaft is parallel to the rotation axis of the main shaft.

[0011] According to an embodiment of the present invention, the auxiliary shaft is rigidly connected to the auxiliary rocker arm, the telescopic shaft is arranged at one end of the auxiliary rocker arm, and the auxiliary shaft adjusts the position of the coarse tracking beam in the first plane through the auxiliary rocker arm.

[0012] According to an embodiment of the present invention, the pitch axis is provided with an operating hand wheel, a turbine and a worm, and the pitch axis adjusts the angle between the fine tracking beam and the horizontal plane through the operating hand wheel, the turbine and the worm.

[0013] According to an embodiment of the present invention, the main shaft is driven by a first permanent magnet DC torque motor, and the auxiliary shaft is driven by a second permanent magnet DC torque motor.

[0014] According to an embodiment of the present invention, a main shaft counterweight is provided at one end of the precision tracking light tube.

[0015] According to an embodiment of the present invention, the interior of the base is a hollow structure, and the base is provided with a base counterweight.

[0016] Another aspect of the present invention provides a control method applied to the above-mentioned test system, comprising:

[0017] Inputting the expected spindle trajectory of the spindle in the test system at time i into the test system, and outputting the actual spindle trajectory of the spindle, where i is an integer greater than 0;

[0018] Inputting the expected auxiliary axis trajectory of the auxiliary axis in the test system at the i-th moment into the test system, and outputting the actual auxiliary axis trajectory of the auxiliary axis;

[0019] determining a position error between the main axis and the auxiliary axis based on the expected trajectory of the main axis, the expected trajectory of the auxiliary axis, the actual trajectory of the main axis, and the actual trajectory of the auxiliary axis;

[0020] According to the position error, the expected trajectory of the auxiliary axis at the (i+1)th moment is generated to control the main axis and the auxiliary axis to maintain synchronization.

[0021] According to an embodiment of the present invention, since coarse and fine tracking optoelectronic devices require testing of both fine and coarse tracking functions, the fine tracking beam is used to test the fine tracking function of the coarse and fine tracking optoelectronic devices, while the coarse tracking beam is used to test the coarse tracking function of the coarse and fine tracking optoelectronic devices. Since the fine and coarse tracking beams are parallel, both coarse and fine tracking functions of the coarse and fine tracking optoelectronic devices can be tested simultaneously. Furthermore, the position of the fine tracking beam within a first plane can be adjusted via the main axis, while the position of the coarse tracking beam within the first plane can be adjusted via the auxiliary axis. Furthermore, the angle of the fine tracking beam can be adjusted via the pitch axis, thereby accommodating the different angles of the coarse and fine tracking optoelectronic devices being tested. Testing of the coarse and fine tracking optoelectronic devices can be completed in a laboratory, simplifying the testing process for the coarse and fine tracking optoelectronic devices and reducing testing costs. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] The above and other objects, features and advantages of the present invention will become more apparent through the following description of the embodiments of the present invention with reference to the accompanying drawings, in which:

[0023] Figure 1 A schematic structural diagram of a testing system for coarse and fine tracking and aiming optoelectronic devices according to an embodiment of the present invention is shown;

[0024] Figure 2 A schematic structural diagram of an auxiliary axis of a test system for coarse and fine tracking of optoelectronic devices according to an embodiment of the present invention is shown;

[0025] Figure 3 A schematic structural diagram of the pitch axis of a testing system for coarse and fine tracking and aiming optoelectronic devices according to an embodiment of the present invention is shown;

[0026] Figure 4 A flow chart showing a control method applied to the test system of the present invention according to an embodiment of the present invention is shown;

[0027] Figure 5 A schematic diagram of the control principle of a control method according to an embodiment of the present invention is shown. DETAILED DESCRIPTION

[0028] Hereinafter, embodiments of the present invention will be described with reference to the accompanying drawings. However, it should be understood that these descriptions are exemplary only and are not intended to limit the scope of the present invention. In the following detailed description, for ease of explanation, many specific details are set forth to provide a comprehensive understanding of embodiments of the present invention. However, it is apparent that one or more embodiments may also be implemented without these specific details. In addition, in the following description, descriptions of known structures and technologies are omitted to avoid unnecessary confusion of the concept of the present invention.

[0029] The terms used herein are only for describing specific embodiments and are not intended to limit the present invention. The terms "comprise", "include", etc. used herein indicate the presence of the features, steps, operations and / or components, but do not exclude the presence or addition of one or more other features, steps, operations or components.

[0030] All terms used herein (including technical and scientific terms) have the meanings commonly understood by those skilled in the art unless otherwise defined. It should be noted that the terms used herein should be interpreted as having a meaning consistent with the context of this specification and should not be interpreted in an idealized or overly rigid manner.

[0031] When expressions such as "at least one of A, B, and C, etc." are used, they should generally be interpreted in accordance with the meaning commonly understood by those skilled in the art (for example, "a system having at least one of A, B, and C" should include but is not limited to a system having A alone, B alone, C alone, A and B, A and C, B and C, and / or A, B, C, etc.).

[0032] The coordinated coarse-fine composite axis control strategy works by combining coarse and fine tracking. First, the coarse tracking mechanism performs preliminary target positioning within a large field of view; then, the fine tracking mechanism makes detailed adjustments within a smaller field of view. This process involves the combined use of infrared and television detectors with large fields of view and direct-drive motors, and the coordinated operation of piezoelectric ceramic fast-reflection mirrors and fine-tracking televisions with small fields of view.

[0033] During coarse tracking, the system fuses infrared and television tracking data to stably track the target and ensure reliable handover to fine tracking. The coordinated motion control of the coarse and fine tracking systems leverages the target information acquired by each, and through data fusion processing, actual target alignment information is obtained.

[0034] The acquisition, tracking, and pointing (ATP) process is typically verified step-by-step through field testing or by switching between coarse and fine optical tubes. These tests are performed at varying distances to verify the effectiveness of the electro-optical tracking and pointing system. However, this testing process is complex and costly.

[0035] In view of this, the present invention proposes a test system for coarse and fine tracking optoelectronic equipment, comprising: a main axis, an auxiliary axis, a pitch axis, a fine tracking light tube and a coarse tracking light tube arranged on a base; wherein, the fine tracking light tube is used to emit a fine tracking light beam, the coarse tracking light tube is used to emit a coarse tracking light beam, the main axis is used to adjust the position of the fine tracking light beam in a first plane, the pitch axis is used to adjust the angle between the fine tracking light beam and the horizontal plane, the auxiliary axis is used to adjust the position of the coarse tracking light beam in the first plane, the fine tracking beam is parallel to the coarse tracking beam after reflection, and the first plane is a plane perpendicular to the emission direction of the fine tracking beam.

[0036] Figure 1 A schematic structural diagram of a testing system for coarse and fine tracking of optoelectronic devices according to an embodiment of the present invention is shown.

[0037] like Figure 1 As shown, a testing system 100 for coarse and fine tracking of optoelectronic devices includes a main axis 120 , an auxiliary axis 130 , a pitch axis 140 , a fine tracking light pipe 150 , and a coarse tracking light pipe 160 , which are arranged on a base 110 .

[0038] Among them, the fine tracking light tube 150 is used to emit the fine tracking beam L1, the coarse tracking light tube 160 is used to emit the coarse tracking beam L2, the main axis 120 is used to adjust the position of the fine tracking beam L1 within the first plane, the pitch axis 140 is used to adjust the angle between the fine tracking beam L1 and the horizontal plane, and the auxiliary axis 130 is used to adjust the position of the coarse tracking beam L2 within the first plane. After reflection, the fine tracking beam L1 is parallel to the coarse tracking beam L2. The first plane is a plane perpendicular to the emission direction X1 of the fine tracking beam L1.

[0039] According to an embodiment of the present invention, since the coarse and fine tracking optoelectronic device needs to test the fine tracking function and the coarse tracking function, the fine tracking beam L1 is used to test the fine tracking function of the coarse and fine tracking optoelectronic device, and the coarse tracking beam L2 is used to test the coarse tracking function of the coarse and fine tracking optoelectronic device. The fine tracking beam L1 and the coarse tracking beam L2 are parallel, so the coarse tracking function and the fine tracking function of the coarse and fine tracking optoelectronic device can be tested simultaneously.

[0040] According to an embodiment of the present invention, the position of the fine tracking beam L1 in the first plane can be adjusted by the main axis 120, the position of the coarse tracking beam L2 in the first plane can be adjusted by the auxiliary axis 130, and the angle of the fine tracking beam L1 can be adjusted by the pitch axis 140, thereby adapting to different angles of the coarse and fine tracking optoelectronic device being tested, and the testing of the coarse and fine tracking optoelectronic device can be completed in the laboratory, which simplifies the testing process of the coarse and fine tracking optoelectronic device and reduces the testing cost.

[0041] According to an embodiment of the present invention, Figure 1As shown, the test system 100 may further include a telescopic shaft 170, on which the coarse tracking light pipe 160 is disposed. The telescopic shaft 170 is used to adjust the distance between the coarse tracking beam L2 and the fine tracking beam L1 to accommodate different coarse and fine tracking optoelectronic devices being tested.

[0042] According to an embodiment of the present invention, the interior of the base 110 may be a hollow structure, and the base 110 may be provided with a base counterweight 111 .

[0043] According to an embodiment of the present invention, the base 110 can be designed as a C-shaped structure with a hollow interior for wiring. The base counterweight 111 maintains the center of gravity of the platform, facilitating lifting. The base counterweight 111 can be positioned on the edge of the base 110. The base 110 can have pre-recorded mounting holes, allowing it to be secured to brackets of varying heights during installation, ensuring platform stability and adapting to various coarse and fine tracking optoelectronic devices.

[0044] According to an embodiment of the present invention, the frame and the base 110 may be made of high-strength cast aluminum alloy ZL201A. The mechanical properties of ZL201A, such as tensile strength and hardness, are significantly better than those of aluminum-silicon alloy ZL104, and it has better processing properties.

[0045] According to an embodiment of the present invention, the main shaft 120 is driven by a first permanent magnet DC torque motor, and the auxiliary shaft 130 is driven by a second permanent magnet DC torque motor 131 .

[0046] According to an embodiment of the present invention, the spindle 120 can be supported by precision mechanical bearings and directly driven by a first permanent magnet DC torque motor. The spindle 120 can also be configured with a high-precision absolute photoelectric encoder 132, so as to achieve continuous and unlimited rotation. At the same time, the spindle 120 can also be configured with a conductive slip ring 133 to meet the transmission requirements of the test product signal.

[0047] According to an embodiment of the present invention, the rotation axis of the auxiliary shaft 130 is parallel to the rotation axis of the main shaft 120 .

[0048] like Figure 1 As shown, to balance the unbalanced torque caused by auxiliary shaft 130, a main shaft counterweight 121 is installed on one end of fine tracking light pipe 150 to ensure smooth operation of main shaft 120. The main shaft 120's main function is to carry fine tracking light pipe 150 and transmit fine tracking beam L1, while also driving auxiliary shaft 130.

[0049] Figure 2 A schematic structural diagram of an auxiliary axis of a test system for coarse and fine tracking of optoelectronic devices according to an embodiment of the present invention is shown.

[0050] like Figure 2As shown, the auxiliary shaft 130 can also be supported by the same precision mechanical bearings as the main shaft 120 and directly driven by a second permanent magnet DC torque motor 131. Furthermore, the auxiliary shaft 130 can be equipped with a high-precision absolute photoelectric encoder 132 to achieve continuous, unlimited rotation. To ensure efficient transmission of test product signals, the auxiliary shaft 130 is also equipped with a conductive slip ring 133.

[0051] According to an embodiment of the present invention, Figure 2 As shown, a reflector 134 is provided on the rotation axis of the auxiliary shaft 130 , and the fine tracking beam L1 is emitted from the fine tracking light pipe 150 and is reflected by the reflector 134 to be parallel to the coarse tracking beam L2 .

[0052] According to an embodiment of the present invention, the primary function of auxiliary shaft 130 is to carry coarse tracking light pipe 160. To ensure that the coarse tracking beam L2 emitted by coarse tracking light pipe 160 remains parallel to the fine tracking beam L1, a reflector 134 is mounted at the rotation center of the auxiliary shaft 130's axis of rotation and is equipped with an adjustment bracket to facilitate adjustment of the angle of reflector 134. This mounting arrangement ensures that the distance between coarse tracking beam L2 and fine tracking beam L1 remains constant regardless of the rotation of main shaft 120 and auxiliary shaft 130.

[0053] According to an embodiment of the present invention, the auxiliary shaft 130 can be rigidly connected to the auxiliary rocker arm 135, and the telescopic shaft 170 is set at one end of the auxiliary rocker arm 135. The auxiliary shaft 130 adjusts the position of the coarse tracking beam L2 in the first plane through the auxiliary rocker arm 135.

[0054] According to an embodiment of the present invention, the auxiliary rocker arm 135 and the auxiliary shaft 130 can be rigidly connected via screws and employ an asymmetric structural design. One end of the auxiliary rocker arm 135 is used to mount the telescopic shaft 170 and the coarse tracking light pipe 160, while the other end is used to mount a counterweight. Because the distances between the coarse and fine optical paths of different coarse and fine tracking optoelectronic devices under test typically vary, an adjustable telescopic shaft 170 is added to the mounting position of the coarse tracking light pipe 160. The telescopic shaft 170 can be secured to the auxiliary rocker arm 135 via a spur hole, and its length can be adjusted within a certain range. This design allows the coarse tracking light pipe 160 to move within a certain range along the auxiliary rocker arm 135, thereby enabling precise adjustment of the distance between the coarse and fine optical paths.

[0055] Figure 3 A schematic structural diagram of the pitch axis of a testing system for coarse and fine tracking of optoelectronic devices according to an embodiment of the present invention is shown.

[0056] like Figure 3As shown, the pitch axis 140 is provided with an operating hand wheel 141 , a turbine 142 and a worm 143 , and the pitch axis 140 adjusts the angle between the fine tracking beam L1 and the horizontal plane by operating the hand wheel 141 , the turbine 142 and the worm 143 .

[0057] According to an embodiment of the present invention, a pair of high-precision angular contact ball bearings can be installed in the pitch axis 140. These bearings are installed back-to-back and preloaded to support the shaft system components and ensure the accuracy and load-bearing stiffness of the shaft. Figure 3 As shown, the rotation of the pitch axis 140 is controlled by the handwheel 141, the worm gear 142 and the worm 143, so as to adapt to the coarse and fine tracking optoelectronic devices to be measured at different angles and distances, so that the rotation axis of the main shaft 120, the azimuth axis of the coarse and fine tracking optoelectronic devices to be measured and the rotation axis of the pitch axis 140 intersect at one point.

[0058] In other embodiments, Figure 4 A flow chart of a control method applied to the test system of the present invention according to an embodiment of the present invention is shown.

[0059] like Figure 4 As shown, the method includes operations S410 to S440.

[0060] In operation S410 , the expected spindle trajectory of the spindle in the test system at time i is input to the test system, and the actual spindle trajectory of the spindle is output, where i is an integer greater than 0.

[0061] In operation S420 , the expected auxiliary axis trajectory of the auxiliary axis in the test system at the i-th moment is input to the test system, and the actual auxiliary axis trajectory of the auxiliary axis is output.

[0062] In operation S430 , a position error between the main shaft and the auxiliary shaft is determined based on the main shaft desired trajectory, the auxiliary shaft desired trajectory, the main shaft actual trajectory, and the auxiliary shaft actual trajectory.

[0063] In operation S440 , an expected trajectory of the auxiliary axis at the (i+1)th moment is generated according to the position error, so as to control the main axis and the auxiliary axis to maintain synchronization.

[0064] According to an embodiment of the present invention, a position-rate closed-loop control system can be formed based on the main shaft and the auxiliary shaft respectively, and the expected distance between the main shaft and the auxiliary shaft can be determined based on the expected main shaft trajectory of the main shaft and the expected auxiliary shaft trajectory in the test system at the i-th moment, the actual distance between the main shaft and the auxiliary shaft can be determined based on the actual main shaft trajectory of the main shaft and the actual auxiliary shaft trajectory of the auxiliary shaft in the test system at the i-th moment, and the position error between the main shaft and the auxiliary shaft can be determined based on the expected distance and actual distance between the main shaft and the auxiliary shaft.

[0065] According to an embodiment of the present invention, the position error can be compensated to the expected trajectory of the auxiliary axis at the (i+1)th moment, so that the motion error of the auxiliary axis is compensated, thereby achieving synchronization between the main axis and the auxiliary axis.

[0066] According to an embodiment of the present invention, the purpose of the control method is to ensure that the main axis and the auxiliary axis are synchronized in position. Figure 5 As shown in Figure 1, this control method is based on a closed-loop position-rate control system formed by the main and auxiliary axes. By compensating the position error between the two axes to the desired trajectory of the auxiliary axis, it can effectively prevent the position difference between the main and auxiliary axes from accumulating and increasing over multiple revolutions.

[0067] Figure 5 A schematic diagram of the control principle of a control method according to an embodiment of the present invention is shown.

[0068] like Figure 5 As shown in Figure 1, the test system can include a Digital Signal Processor Motion Controller (DSP), which includes a spindle position controller, a spindle speed controller, an auxiliary axis position controller, and an auxiliary axis speed controller. Taking the spindle as an example, the desired spindle trajectory is sequentially input into the spindle position controller and the spindle speed controller. The controller then outputs a signal to control the spindle's trajectory. This signal is then transmitted to the spindle driver via a digital-to-analog (DA) converter, which then drives the spindle motor. Taking into account the clock transmission mechanism of the absolute encoder, information fusion technology is also added. After the position information of the main shaft obtained from the absolute encoder is fused and processed, one position signal is sent to the main shaft driver for phase finding and current closed loop of the main shaft motor; another position signal is sent to the DSP motion controller for position, speed closed loop and synchronization correction. The control principles of the main shaft and the auxiliary shaft are similar. The control reference of the auxiliary shaft is the main shaft, which will not be repeated here. The control method of the embodiment of the present invention ultimately achieves the purpose of synchronous control of the main shaft and the auxiliary shaft, ensuring that the coarse tracking beam and the fine tracking beam can always remain stable in spatial position.

[0069] The flowcharts and block diagrams in the accompanying drawings illustrate the possible architectures, functions, and operations of the systems, methods, and computer program products according to various embodiments of the present invention. In this regard, each box in the flowchart or block diagram may represent a module, program segment, or portion of code, which contains one or more executable instructions for implementing the specified logical function. It should also be noted that in some alternative implementations, the functions marked in the boxes may occur in an order different from that marked in the accompanying drawings. For example, two boxes shown in succession may actually be executed substantially in parallel, or they may sometimes be executed in the opposite order, depending on the functions involved. It should also be noted that each box in the block diagram or flowchart, as well as the combination of boxes in the block diagram or flowchart, may be implemented using a dedicated hardware-based system that performs the specified function or operation, or may be implemented using a combination of dedicated hardware and computer instructions. It will be understood by those skilled in the art that the features described in the various embodiments of the present invention may be combined and / or coupled in various ways, even if such combinations or couplings are not explicitly described in the present invention. In particular, the features described in the various embodiments of the present invention may be combined and / or coupled in various ways without departing from the spirit and teachings of the present invention. All such combinations and / or combinations fall within the scope of the present invention.

[0070] The above describes embodiments of the present invention. However, these embodiments are for illustrative purposes only and are not intended to limit the scope of the present invention. Although each embodiment has been described separately above, this does not mean that the measures in each embodiment cannot be advantageously used in combination. Without departing from the scope of the present invention, those skilled in the art may make various substitutions and modifications, which should all fall within the scope of the present invention.

Claims

1. A test system for coarse and fine tracking optoelectronic equipment, characterized in that: It includes a main axis, an auxiliary axis, a pitch axis, a fine tracking light tube, a coarse tracking light tube and a telescopic axis arranged on the base; Wherein, the fine tracking light tube is used to emit a fine tracking beam, the coarse tracking light tube is used to emit a coarse tracking beam, the fine tracking beam is used to test the fine tracking function of the coarse and fine tracking optoelectronic device, and the coarse tracking beam is used to test the coarse tracking function of the coarse and fine tracking optoelectronic device. The main axis is used to adjust the position of the fine tracking beam in the first plane, the pitch axis is used to adjust the angle between the fine tracking beam and the horizontal plane, and the auxiliary axis is used to adjust the position of the coarse tracking beam in the first plane. After reflection, the fine tracking beam is parallel to the coarse tracking beam. The first plane is a plane perpendicular to the exit direction of the fine tracking beam. The coarse tracking light tube is arranged on the telescopic axis. The telescopic shaft is used to adjust the distance between the coarse tracking beam and the fine tracking beam. The rotating shaft of the auxiliary shaft is provided with a reflector. The fine tracking beam is emitted from the fine tracking light tube and is parallel to the coarse tracking beam after being reflected by the reflector. The rotating shaft of the auxiliary shaft is parallel to the rotating axis of the main shaft. The auxiliary shaft is rigidly connected to the auxiliary rocker arm. The telescopic shaft is provided at one end of the auxiliary rocker arm. The auxiliary shaft adjusts the position of the coarse tracking beam in the first plane through the auxiliary rocker arm. The reflector is installed at the rotation center of the rotating shaft of the auxiliary shaft. The main shaft carries the fine tracking light tube and transmits the fine tracking beam, while driving the auxiliary shaft to move together.

2. The test system according to claim 1, wherein: The pitch axis is provided with an operating hand wheel, a turbine and a worm, and the pitch axis adjusts the angle between the fine tracking beam and the horizontal plane through the operating hand wheel, the turbine and the worm.

3. The test system according to claim 1, wherein: The main shaft is driven by a first permanent magnet DC torque motor, and the auxiliary shaft is driven by a second permanent magnet DC torque motor.

4. The test system according to claim 1, wherein: One end of the precision tracking light tube is provided with a main shaft counterweight.

5. The test system according to claim 1, wherein: The interior of the base is a hollow structure, and the base is provided with a base counterweight.

6. A control method applied to the test system according to any one of claims 1 to 5, characterized in that: The method comprises: Inputting the expected spindle trajectory of the spindle in the test system at time i into the test system, and outputting the actual spindle trajectory of the spindle, where i is an integer greater than 0; Inputting the expected auxiliary axis trajectory of the auxiliary axis in the test system at the i-th moment into the test system, and outputting the actual auxiliary axis trajectory of the auxiliary axis; Determining a position error between the main shaft and the auxiliary shaft according to the expected trajectory of the main shaft, the expected trajectory of the auxiliary shaft, the actual trajectory of the main shaft, and the actual trajectory of the auxiliary shaft; According to the position error, an expected trajectory of the auxiliary axis at the (i+1)th moment is generated to control the main axis and the auxiliary axis to maintain synchronization.

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