Part detection method and device and related equipment

Abstract

The invention provides a part detection method and device and related equipment. The method comprises the steps that parameter information of three-dimensional modeling of a measuring head entity is acquired; determining detection information of the to-be-detected part; performing interference verification on the detection information based on the parameter information, and screening target detection information from the detection information; and controlling the measuring head entity to detect the plurality of second position points and the plurality of second features corresponding to the to-be-detected part, and generating a detection result. In the detection process of the to-be-detected part, firstly, the parameter information of the measuring head entity and the detection information of the to-be-detected part are determined, so that interference verification is performed on the detection information through the parameter information, and it is ensured that the measuring head entity does not interfere with the to-be-detected part in the detection process of the to-be-detected part; the multiple second position points and the multiple second features of the to-be-detected part are safely detected, and the detection efficiency of the to-be-detected part is improved.

Description

Technical Field

[0001] The embodiments of the present application relate to the technical field of part detection, and in particular, to a method and device for detecting parts and related equipment. Background Art

[0002] Large parts have characteristics such as large blank size, high processing difficulty, long processing time, and poor precision control. Therefore, during the processing, the processing quality of the previous process has a great influence on the processing quality of the next process, and it is necessary to detect large parts in real time. In the existing detection technologies, generally, the detection mainly focuses on the points of large parts, but this detection method ignores the relevant characteristics of large parts themselves, so that a lot of detection points need to be defined during the detection process, resulting in the problem of low detection efficiency. Summary of the Invention

[0003] The embodiments of the present application provide a method and device for detecting parts and related equipment to solve the problem of low detection efficiency in the prior art.

[0004] To solve the above problems, the present application is implemented as follows:

[0005] In a first aspect, the embodiments of the present application provide a method for detecting parts, the method including:

[0006] Obtaining parameter information of the three-dimensional modeling of the probe entity, where the parameter information includes the size data and model data of the probe entity, and the probe entity is used to detect a part to be detected;

[0007] Determining the detection information of the part to be detected, where the detection information includes a plurality of first position points and a plurality of first features that need to be detected during the detection of the part to be detected, the first features include the shape features of the part to be detected, and among the plurality of first features, the shape features included in different first features are different;

[0008] Performing interference verification on the detection information based on the parameter information, and screening out target detection information from the detection information, where the target detection information includes a plurality of second position points and a plurality of second features, the plurality of first position points include the plurality of second position points, the second position point is a position point where the probe entity does not interfere with the second position point when the probe entity moves to the position for detecting the second position point, and the second feature is a feature where the probe entity does not interfere with the second feature when the probe entity moves to the position for detecting the second feature;

[0009] Control the probe entity to detect the multiple second position points and the multiple second features corresponding to the part to be measured, and generate a detection result, where the detection result is used to indicate whether the part to be measured is qualified.

[0010] Optionally, the controlling the probe entity to detect the multiple second position points and the multiple second features corresponding to the part to be measured, and generate a detection result includes:

[0011] Generate detection path information based on the position information of the multiple second features and the position information of the multiple second position points, where the detection path information is the shortest movement path required for the probe entity to detect the multiple second features and the multiple second position points;

[0012] Generate a detection macro program file according to the detection path information, where the detection macro program file is used to control the probe entity to detect the part to be measured based on the detection path information;

[0013] Based on the detection macro program file, control the probe entity to detect the multiple second position points and the multiple second features corresponding to the part to be measured, and generate a detection result.

[0014] Optionally, the determining the detection information of the part to be measured includes:

[0015] Determine the data acquisition plane of the part to be measured, where the data acquisition plane is the coordinate system plane in which the part to be measured is located during the detection process, and the coordinate system plane is used to determine the coordinates of the part to be measured;

[0016] Determine the data acquisition method of the part to be measured, where the data acquisition method is used to determine the multiple preset position points of the part to be measured, and the multiple first position points include the multiple preset position points;

[0017] Based on the user's input, determine multiple first features and multiple fifth position points to be detected on the part to be measured, where the multiple first position points include the multiple fifth position points;

[0018] Determine multiple first coordinate information corresponding one-to-one to the multiple first position points in the coordinate system plane according to the data acquisition plane, and determine multiple second coordinate information corresponding one-to-one to the multiple first features in the coordinate system plane according to the data acquisition plane;

[0019] Generate the detection information according to the multiple first coordinate information, the multiple second coordinate information, the multiple first position points, and the multiple first features.

[0020] Optionally, when the first feature includes a linear feature, the first feature further includes determining a third position point on the linear feature; when the first feature includes a planar feature, the first feature further includes determining four fourth position points on the planar feature;

[0021] Generating the detection information according to the multiple first coordinate information, the multiple second coordinate information, the multiple first position points, and the multiple first features includes:

[0022] Determining, according to the fetching plane, the fourth coordinate information corresponding to each of the third position points in the first feature, and / or determining, according to the fetching plane, the fifth coordinate information corresponding to each of the fourth position points in the first feature;

[0023] Generating the detection information according to the multiple first coordinate information, the third coordinate information, the multiple first features, and the multiple first position points, where the third coordinate information includes the fourth coordinate information corresponding to each of the third position points and / or the fifth coordinate information corresponding to each of the fourth position points.

[0024] Optionally, the detection information further includes feature data;

[0025] When the first feature is a cylindrical hole feature, the feature data includes the cylinder center, cylinder diameter, detection depth, and tool lift height corresponding to the cylindrical hole feature. The detection depth is the detection depth of the probe entity in the first feature, and the tool lift height is the tool usage data during the process of cutting the first feature with a tool;

[0026] When the first feature is a cylindrical boss feature, the feature data includes the cylinder center, cylinder diameter, detection depth, and tool lift height corresponding to the cylindrical boss feature;

[0027] When the first feature is a horizontal rectangular inner hole feature, the feature data includes the length, width, and inner hole center position corresponding to the horizontal rectangular inner hole feature;

[0028] When the first feature is a horizontal rectangular outer contour feature, the feature data includes the outer contour length, outer contour width, and outer contour center position corresponding to the horizontal rectangular outer contour feature;

[0029] When the first feature is an inclined rectangular inner hole feature, the feature data includes the length, width, and inner hole center position corresponding to the inclined rectangular inner hole feature;

[0030] When the first feature is an inclined rectangular outer contour feature, the feature data includes the outer contour length, outer contour width, and outer contour center position corresponding to the inclined rectangular outer contour feature, which are determined as the feature data;

[0031] When the first feature is a rectangular groove feature, the feature data includes the groove width and groove center position corresponding to the rectangular groove feature;

[0032] When the first feature is a rectangular boss feature, the feature data includes the boss width and boss center position corresponding to the rectangular boss feature.

[0033] Optionally, after controlling the probe entity to detect the multiple second position points and the multiple second features corresponding to the part to be measured and generating a detection result, the method further includes:

[0034] When the detection result indicates that the data parameter of the part to be measured is less than a preset data parameter, scrapping the part to be measured, where the data parameter is used to represent the size and shape of the part to be measured;

[0035] When the detection result indicates that the data parameter of the part to be measured is greater than the preset data parameter, performing a compensation mechanism on the part to be measured, where the compensation mechanism is used to perform secondary cutting on the part to be measured so that the data parameter of the part to be measured is equal to the preset data parameter.

[0036] In a second aspect, an embodiment of the present application further provides a part detection device, and the device includes:

[0037] An acquisition module that acquires parameter information of the three-dimensional modeling of the probe entity, where the parameter information includes the size data and model data of the probe entity, and the probe entity is used to detect a part to be measured;

[0038] A determination module for determining the detection information of the part to be measured, where the detection information includes multiple first position points and multiple first features that need to be detected during the detection of the part to be measured, the first features include the shape features of the part to be measured, and among the multiple first features, different first features include different shape features;

[0039] A verification module is configured to perform interference verification on the detection information based on the parameter information, and screen out target detection information from the detection information. The target detection information includes a plurality of second position points and a plurality of second features. The plurality of first position points include the plurality of second position points. The second position point is a position point where the probe entity will not interfere with the second position point when the probe entity moves to a position for detecting the second position point. The second feature is a feature where the probe entity will not interfere with the second feature when the probe entity moves to a position for detecting the second feature.

[0040] A detection module is configured to control the probe entity to detect the plurality of second position points and the plurality of second features corresponding to the part to be measured, and generate a detection result, where the detection result is used to indicate whether the part to be measured is qualified.

[0041] In a third aspect, an embodiment of the present application further provides an electronic device, including: a transceiver, a memory, a processor, and a program stored on the memory and executable on the processor; the processor is configured to read the program in the memory to implement the steps in the method described in the first aspect above.

[0042] In a fourth aspect, an embodiment of the present application further provides a readable storage medium for storing a program, where the program, when executed by a processor, implements the steps in the method described in the first aspect above.

[0043] In a fifth aspect, an embodiment of the present application further provides a computer program product, where the computer program product is stored in a storage medium, and the computer program product is executed by at least one processor to implement the steps in the method described in the first aspect above.

[0044] During the detection process of the part to be measured in the present application, the parameter information of the probe entity and the detection information of the part to be measured are first determined, so as to perform interference verification on the detection information through the parameter information, ensuring that the probe entity will not interfere with the part to be measured during the detection process of the part to be measured, realizing the safe detection of a plurality of second position points and a plurality of second features of the part to be measured, and improving the detection efficiency of the part to be measured. Description of the Drawings

[0045] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the following will briefly introduce the drawings required for the description of the embodiments of the present application. Obviously, the following drawings are only some embodiments of the present application. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0046] Figure 1Flow chart of a method for detecting a part provided by an embodiment of the present application;

[0047] Figure 2 One of the flow charts provided by an embodiment of the present application;

[0048] Figure 3 Another flow chart provided by an embodiment of the present application;

[0049] Figure 4 Structural diagram of a part detection device provided by an embodiment of the present application;

[0050] Figure 5 Structural diagram of an electronic device provided by an embodiment of the present application. Detailed implementation manners

[0051] Next, the technical solutions in the embodiments of the present application will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are some, but not all, of the embodiments of the present application. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present application without creative efforts shall fall within the protection scope of the present application.

[0052] The terms "first", "second", etc. in the embodiments of the present application are used to distinguish similar objects and do not necessarily describe a specific order or sequence. In addition, the terms "comprising" and "having" and any variations thereof are intended to cover non-exclusive inclusion. For example, a process, method, system, product or device that includes a series of steps or units does not necessarily have to be limited to those clearly listed steps or units, but may include other steps or units not clearly listed or inherent to these processes, methods, products or devices. In addition, the use of "and / or" in the present application means at least one of the connected objects. For example, A and / or B and / or C means including A alone, B alone, C alone, as well as the situation where A and B exist, B and C exist, A and C exist, and A, B, and C all exist, a total of 7 situations.

[0053] Refer to Figure 1 , Figure 1 which is a flow chart of a method for detecting a part provided by an embodiment of the present application.

[0054] Step 101: Obtain the parameter information of the three-dimensional modeling of the probe entity. The parameter information includes the dimension data and model data of the probe entity. Herein, the probe entity is used to detect the part to be measured.

[0055] In this embodiment, the probe entity refers to a sensor or probe used for detection. The probe entity can be used to obtain data of physical quantities (such as temperature, pressure, displacement, etc.) and convert them into readable signals. In this embodiment, the probe entity is mainly used to detect the dimensions, shapes, etc. of the part to be measured, and determine whether the part to be measured is qualified. It should be noted that since there are differences among probe entities of different brands or different specifications of the same brand, in order to achieve accurate interference simulation in the subsequent detection process, it is necessary to perform three-dimensional modeling on the probe entity. Specifically, after performing three-dimensional modeling on the probe entity, the corresponding dimension data and model data of the probe entity are determined.

[0056] Exemplarily, a probe entity library can be established according to different brands and different specifications. For example, files can be named in the way of "brand name_D diameter XL effective length". For example, ABC_D10XL40 represents a probe entity with a brand of ABC, a diameter of 10, and an effective length of 40.

[0057] Step 102: Determine the detection information of the part to be measured. The detection information includes a plurality of first position points and a plurality of first features that need to be detected during the detection of the part to be measured. The first features include the shape features of the part to be measured, and among the plurality of first features, the shape features included in different first features are different.

[0058] In this embodiment, the detection information of the part to be measured includes a plurality of first position points and a plurality of first features that need to be detected during the detection of the part to be measured. Among them, the plurality of first position points can be user input or preset detection points. For example, the user can arbitrarily set a plurality of first position points to be detected on the part to be measured. The plurality of first features are the shape features of the part to be measured. For example, the part to be measured is cylindrical or rectangular in shape, and the shape features included in different first features are different.

[0059] In this embodiment, the part to be measured can be any part, such as a large part, a small part, etc. In this application, the part to be measured is taken as an example of a large part for illustration, and the following detected parts are all large parts. In the prior art, for large parts, generally only their position points can be detected, and their own features cannot be detected. However, in this application, before detection, the detection information of the large part is determined, including a plurality of first position points and a plurality of first features, thereby achieving the effect of simultaneously detecting the features and position points of the part to be detected.

[0060] Therefore, in this embodiment, before the user detects the part to be measured, multiple first position points and multiple first features to be detected can be set. Compared with the prior art where only the position points of the part to be measured can be detected, in this application, multiple first position points and multiple first features can be detected, so as to realize the comprehensive detection of the part to be measured.

[0061] Step 103: Perform interference verification on the detection information based on the parameter information, and screen out the target detection information from the detection information. The target detection information includes multiple second position points and multiple second features, and the multiple first position points include the multiple second position points. The second position point is a position point where the probe entity will not interfere with the second position point when the probe entity moves to the position for detecting the second position point, and the second feature is a feature where the probe entity will not interfere with the second feature when the probe entity moves to the position for detecting the second feature.

[0062] In this embodiment, in the field of part detection, interference verification is a high-precision detection technology, mainly used to detect and verify the geometric shape, size, surface quality and other characteristics of mechanical parts. In this application, it is used to verify whether the probe entity will collide with the part to be measured, so as to avoid damage to the probe entity and the part to be measured during the detection process.

[0063] Specifically, the interference verification of the detection information is performed through the parameter information, and the verification is respectively performed among the multiple first position points and the multiple first features, so as to screen out the target detection information from the multiple first position points. Specifically, the target detection information includes multiple second position points and multiple second features. The second position point is a position point where the probe entity will not interfere with the second position point when the probe entity moves to the position for detecting the second position point, and the second feature is a feature where the probe entity will not interfere with the second feature when the probe entity moves to the position for detecting the second feature. Specifically, before the detection, the system stores the data in the order of taking plane points, ordinary detection points, and detection features according to all the first position points and all the first features, performs interference simulation on the safety height points, approach points, retraction points, and touch points of various detection features, automatically ignores the detection features with interference in the output, and reminds the user to manually process the interference result. It should be noted that the calculation process of the interference verification can be determined by calculating the coordinates between the probe entity and the multiple first position points and the multiple first features.

[0064] Step 104: Control the probe entity to detect the multiple second position points and the multiple second features corresponding to the part to be measured, and generate a detection result, where the detection result is used to indicate whether the part to be measured is qualified.

[0065] In this embodiment, after the interference verification is completed, all the determined second position points and all the second features are comprehensively generated into a detection path, thereby controlling the probe entity to detect all the second position points and all the second features according to the detection path, and generating a detection result. It should be noted that the detection result may include features such as the shape and size of the part to be measured, so it can be judged whether the part to be measured is qualified. The operator can further process or scrap the part to be measured according to the detection result subsequently.

[0066] The schematic flow chart of another implementation manner in this embodiment is as Figure 2 shown. After determining the machining features (first features) and the data acquisition points (first position points) of the part to be measured, after verifying the safety of the interference model for multiple first features and multiple first position points, multiple second features and multiple second position points are screened out. Thereby, a measurement path is generated according to the multiple second features and multiple second position points, and a detection macro program file (CNC macro program file) for controlling the movement of the probe entity is generated according to the measurement path to detect the part to be measured. Subsequently, the machining quality can also be judged according to the detection result. When the machining quality is qualified, the detection is ended. When the machining quality is unqualified, if there is an overcut situation, special adoption or scrapping is carried out. If there is no overcut situation, the in-machine compensation mechanism is executed for further cutting to make the part to be measured qualified.

[0067] During the detection process of the part to be measured in this application, the parameter information of the probe entity and the detection information of the part to be measured are first determined, so as to perform interference verification on the detection information through the parameter information, ensuring that the probe entity will not interfere with the part to be measured during the detection process of the part to be measured, realizing the safe detection of multiple second position points and multiple second features of the part to be measured, and improving the detection efficiency of the part to be measured.

[0068] In some feasible implementation manners, optionally, controlling the probe entity to detect the multiple second position points and the multiple second features corresponding to the part to be measured and generate a detection result includes:

[0069] Generating detection path information based on the position information of the multiple second features and the position information of the multiple second position points, where the detection path information is the shortest movement path required for the probe entity to detect the multiple second features and the multiple second position points;

[0070] Generating a detection macro program file according to the detection path information, where the detection macro program file is used to control the probe entity to detect the part to be measured based on the detection path information;

[0071] Based on the detected macro program file, control the probe entity to detect the multiple second position points and the multiple second features corresponding to the part to be measured, and generate a detection result.

[0072] In this embodiment, the position information corresponding to the multiple second features and the position information corresponding to the multiple second position points are determined according to the multiple second features and the multiple second position points. Exemplarily, the position information may be coordinate information, that is, a three-dimensional coordinate system is generated during the detection process, and the coordinates of the multiple second features and the multiple second position points are determined through the three-dimensional coordinate system, so as to generate the detection path information of the probe entity. Specifically, during the detection process of the probe entity for the part to be measured, the shortest motion algorithm is used to optimize the multiple coordinate information to obtain the detection path information, that is, the motion path of the probe entity is the least and all the second features and second position points are detected.

[0073] After generating the detection path information, convert the detection path information into a detected macro program file (CNC macro program file) for controlling the motion of the probe entity. The detected macro program file is used to generate a control program in the server to control the probe entity to move along a set route.

[0074] In this embodiment, the detection routes of all the second position points and the second features are optimized by using the shortest path algorithm, reducing the idle running time of the probe on the machine tool and improving the detection efficiency. After the detection route is confirmed, the system will output a detected macro program suitable for the operation of the numerical control machine tool according to the post-processing rules. The post-processing rules include modules such as data acquisition points, ordinary points, and features. Users can generate macro programs supporting any probe through the configuration file, thereby improving the detection efficiency of the parts.

[0075] Optionally, the determining the detection information of the part to be measured includes:

[0076] Determine the data acquisition plane of the part to be measured. The data acquisition plane is the coordinate system plane where the part to be measured is located during the detection process, and the coordinate system plane is used to determine the coordinates of the part to be measured;

[0077] Determine the data acquisition method of the part to be measured. The data acquisition method is used to determine the multiple preset position points of the part to be measured, and the multiple first position points include the multiple preset position points;

[0078] Based on the user's input, determine multiple first features and multiple fifth position points that need to be detected on the part to be measured, where the multiple first position points include the multiple fifth position points;

[0079] Determine a plurality of first coordinate information corresponding one-to-one to the plurality of first position points in the coordinate system plane according to the data acquisition plane, and determine a plurality of second coordinate information corresponding one-to-one to the plurality of first features in the coordinate system plane according to the data acquisition plane;

[0080] Generate the detection information according to the plurality of first coordinate information, the plurality of second coordinate information, the plurality of first position points, and the plurality of first features.

[0081] In this embodiment, a schematic flowchart of another implementation manner in this embodiment is as Figure 3 shown. Before determining the plurality of first position points and the plurality of first features, it is also necessary to load the three-dimensional model of the probe entity to determine the parameter information related to the probe entity. In addition, it is also necessary to determine the data acquisition plane and the data acquisition method of the part to be measured. After determining the machining features (first features) and the data acquisition points (first position points) of the part to be measured, after verifying the safety of the interference model for the plurality of first features and the plurality of first position points, a plurality of second features and a plurality of second position points are screened out. Then, a measurement path is generated according to the plurality of second features and the plurality of second position points, and a detection macro program file (CNC macro program file) for controlling the movement of the probe entity is generated according to the measurement path to detect the part to be measured. Subsequently, the machining quality can also be judged according to the detection result. When the machining quality is qualified, the detection ends. When the machining quality is unqualified, if there is an overcut situation, special adoption or scrapping is carried out. If there is no overcut situation, an in-machine compensation mechanism is executed for further cutting to make the part to be measured qualified.

[0082] Specifically, the data acquisition plane is the coordinate system plane where the part to be measured is located during the detection process. By determining the data acquisition plane, the coordinate information of the position point or feature can be accurately determined. Exemplarily, in the actual application process, the user selects the data acquisition plane on the entity according to the requirements of the data acquisition type. The normal direction of the data acquisition plane is generally X-, X+, Y-, Y+, Z+. The number of data acquisition planes corresponding to the data acquisition type may be 3 or 5, at least 3 and at most 5. Exemplarily, when the data acquisition method is four-sided centering, 5 data acquisition planes are required. The data acquisition method is used to determine a plurality of preset position points of the part to be measured. The plurality of first position points include the plurality of preset position points. Generally, there are 9 common data acquisition methods for box-type parts. Exemplarily, four-sided centering, upper left, lower left, upper right, lower right, etc. Through the above data acquisition methods, a plurality of preset position points to be detected can be determined.

[0083] In this embodiment, the user can also set multiple first features and multiple fifth position points to be detected by themselves. Among them, when setting the multiple fifth position points, the user specifies the detection position on the surface to be detected by using the mouse picking method. The system will record this position in real time and create a solid sphere to represent that this position needs to be detected. During the specifying process, the system will perform an interference check on the detection position. If there is interference, the detection point cannot be generated. When setting the first feature, the detection of the first feature can be completed by setting multiple position points included in the first feature.

[0084] Multiple first coordinate information corresponding to multiple first position points are respectively determined through the fetching plane, and multiple second coordinate information corresponding one-to-one to multiple first features are determined in the coordinate system plane according to the fetching plane, so as to generate detection information. During the detection process of the probe entity, interference experiments and subsequent detections can be carried out through the first coordinate information and the second coordinate information, thereby improving the accuracy of the test.

[0085] Optionally, when the first feature includes a straight line feature, the first feature further includes determining a third position point on the straight line feature; when the first feature includes a plane feature, the first feature further includes determining four fourth position points on the plane feature;

[0086] Generating the detection information according to the multiple first coordinate information, the multiple second coordinate information, the multiple first position points, and the multiple first features includes:

[0087] Determining, according to the fetching plane, fourth coordinate information corresponding to each third position point in the first feature, and / or determining, according to the fetching plane, fifth coordinate information corresponding to each fourth position point in the first feature;

[0088] Generating the detection information according to the multiple first coordinate information, the third coordinate information, the multiple first features, and the multiple first position points, where the third coordinate information includes fourth coordinate information corresponding to each third position point and / or fifth coordinate information corresponding to each fourth position point.

[0089] In this embodiment, different first features determine coordinate information in different ways. Specifically, when the first feature is a straight line feature, the first feature can be represented by a third position point on the straight line; when the first feature is a plane feature, the first feature can be represented by four fourth position points on the plane. It should be noted that the third position point and the fourth position point can be determined according to the preset position or can be selected by the user himself, and no specific limitation is made in this embodiment.

[0090] After determining different first features, according to the number-taking plane, determine the fourth coordinate information corresponding to each of the third position points and determine the fifth coordinate information corresponding to each of the fourth position points, where the first straight line can include both a straight line and a plane, or only include a straight line or only include a plane, and thus determine the corresponding coordinate information according to the actual situation.

[0091] In this embodiment, the third coordinate information includes the fourth coordinate information corresponding to each of the third position points and / or the fifth coordinate information corresponding to each of the fourth position points. Thus, detection information is generated through a plurality of first coordinate information, third coordinate information, a plurality of first features, and a plurality of first position points.

[0092] In this embodiment, by defining the coordinate information corresponding to different first features, the position of the first feature can be accurately determined, which facilitates the detection and interference experiment of the probe entity and avoids the problem that the probe entity cannot accurately detect the first feature.

[0093] Optionally, the detection information further includes feature data;

[0094] When the first feature is a cylindrical hole feature, the feature data includes the cylindrical center, cylindrical diameter, detection depth, and tool-lifting height corresponding to the cylindrical hole feature. The detection depth is the detection depth of the probe entity in the first feature, and the tool-lifting height is the tool usage data during the process of using a tool to cut the first feature;

[0095] When the first feature is a cylindrical boss feature, the feature data includes the cylindrical center, cylindrical diameter, detection depth, and tool-lifting height corresponding to the cylindrical boss feature;

[0096] When the first feature is a horizontal rectangular inner hole feature, the feature data includes the length, width, and inner hole center position corresponding to the horizontal rectangular inner hole feature;

[0097] When the first feature is a horizontal rectangular outer contour feature, the feature data includes the outer contour length, outer contour width, and outer contour center position corresponding to the horizontal rectangular outer contour feature;

[0098] When the first feature is an inclined rectangular inner hole feature, the feature data includes the length, width, and inner hole center position corresponding to the inclined rectangular inner hole feature;

[0099] When the first feature is an inclined rectangular outer contour feature, the feature data includes the outer contour length, outer contour width, and outer contour center position corresponding to the inclined rectangular outer contour feature determined as the feature data;

[0100] When the first feature is a rectangular groove feature, the feature data includes the groove width and the groove center position corresponding to the rectangular groove feature;

[0101] When the first feature is a rectangular boss feature, the feature data includes the boss width and the boss center position corresponding to the rectangular boss feature.

[0102] In this embodiment, the detection information further includes feature data, where the feature data corresponding to different first features is different. Specifically, the first feature can also be a cylindrical hole, a cylindrical boss, a rectangular hole, a rectangular boss, a waist-shaped groove, a plane, etc. The following will be described through several different first features.

[0103] When the first feature is a cylindrical hole feature, the feature data includes the cylinder center, cylinder diameter, detection depth, and tool lift height corresponding to the cylindrical hole feature. A cylindrical hole is a hole with a cylindrical shape, usually used in materials such as metal, plastic, or wood. Its characteristic is that the shape of the hole is a cylinder, usually having a certain diameter and depth. The cylinder center is the center position point of the cylindrical hole, the cylinder diameter is the diameter of the cylindrical hole, the detection depth is the detection depth of the probe entity in the cylindrical hole, that is, the depth of the cylindrical hole, and the tool lift height is the tool usage data during the process of using the tool to cut the cylindrical hole, such as the tool height, etc.

[0104] When the first feature is a cylindrical boss feature, the feature data includes the cylinder center, cylinder diameter, detection depth, and tool lift height corresponding to the cylindrical boss feature. A cylindrical boss is a mechanical part or structural feature, usually referring to a cylindrical part protruding on a plane or the surface of an object. Its shape is similar to a short cylinder and is usually used to provide support, positioning, connection, or as a mounting base for other components. The cylinder center is the center position point of the cylindrical boss, the cylinder diameter is the diameter of the cylindrical boss, the detection depth is the detection depth of the probe entity in the cylindrical boss, that is, the depth of the cylindrical boss, and the tool lift height is the tool usage data during the process of using the tool to cut the cylindrical boss, such as the tool height, etc.

[0105] When the first feature is a horizontal rectangular inner hole feature, the feature data includes the length, width, and inner hole center position corresponding to the horizontal rectangular inner hole feature. A horizontal rectangular inner hole refers to a rectangular hole opened along the horizontal plane in a rectangular object or structure. Select the bottom plane where the rectangular inner hole is located, and the system automatically obtains the adjacent planes related to the bottom plane. The length is the length of the long side of the horizontal rectangular inner hole, the width is the width of the short side of the horizontal rectangular inner hole, and the inner hole center position is the center position point of the horizontal rectangular inner hole.

[0106] When the first feature is the horizontal rectangular outer contour feature, the feature data includes the outer contour length, outer contour width, and outer contour center position corresponding to the horizontal rectangular outer contour feature; the horizontal rectangular outer contour refers to the external shape or boundary of a rectangular object, usually referring to the contour line of a rectangle formed on a horizontal plane. Select the top plane where the rectangular outer contour is located, and the system automatically obtains the adjacent planes related to the top plane. The outer contour length is the length of the long side of the horizontal rectangular outer contour, the outer contour width is the width of the short side of the horizontal rectangular outer contour, and the outer contour center position is the center position point of the horizontal rectangular outer contour.

[0107] When the first feature is the inclined rectangular inner hole feature, the feature data includes the length, width, and inner hole center position corresponding to the inclined rectangular inner hole feature; the inclined rectangular inner hole refers to a rectangular-shaped hole opened in a rectangular object or structure, and its edge is at a certain inclination angle relative to the horizontal or vertical plane of the object. Select the bottom plane where the inclined rectangular inner hole is located, and the system automatically obtains the adjacent planes related to the bottom plane. The length is the length of the long side of the inclined rectangular inner hole, the width is the width of the inclined rectangular inner hole, and the inner hole center position is the center position point of the inclined rectangular inner hole.

[0108] When the first feature is the inclined rectangular outer contour feature, the feature data includes the outer contour length, outer contour width, and outer contour center position corresponding to the inclined rectangular outer contour feature; the inclined rectangular outer contour refers to the external shape or boundary of a rectangular object, and its edge is at a certain inclination angle relative to the horizontal or vertical plane. Select the top plane where the rectangular outer contour is located, and the system automatically obtains the adjacent planes related to the top plane. The outer contour length is the length of the long side of the inclined rectangular outer contour, the outer contour width is the width of the short side of the inclined rectangular outer contour, and the outer contour center position is the center position point of the inclined rectangular outer contour.

[0109] When the first feature is the rectangular groove feature, the feature data includes the groove width and groove center position corresponding to the rectangular groove feature; the rectangular groove refers to a rectangular-shaped recessed area opened on the surface of an object. Select the bottom plane where the inclined rectangular groove is located and specify the detection direction as the X direction or Y direction, and the system automatically obtains 4 adjacent planes related to the bottom plane. The groove width is the width of the rectangular groove, and the groove center position is the center position point of the rectangular groove.

[0110] When the first feature is the rectangular boss feature, the feature data includes the boss width and boss center position corresponding to the rectangular boss feature. The rectangular boss refers to a rectangular-shaped part protruding from the surface of an object. Select the top plane where the inclined rectangular boss is located and specify the detection direction as the X direction or Y direction, and the system automatically obtains 4 adjacent planes related to the top plane. The groove width is the width of the rectangular boss, and the groove center position is the center position point of the rectangular boss.

[0111] In this embodiment, by setting the feature data of different first features, accurate detection of different first features can be achieved, improving the accuracy of detection. In other embodiments, the first feature may also include other shapes, which are not specifically limited in this application.

[0112] Optionally, after controlling the probe entity to detect the multiple second position points and the multiple second features corresponding to the part to be measured and generating a detection result, the method further includes:

[0113] When the detection result indicates that the data parameter of the part to be measured is less than the preset data parameter, scrapping the part to be measured, where the data parameter is used to represent the size and shape of the part to be measured;

[0114] When the detection result indicates that the data parameter of the part to be measured is greater than the preset data parameter, performing a compensation mechanism on the part to be measured, where the compensation mechanism is used to perform secondary cutting on the part to be measured so that the data parameter of the part to be measured is equal to the preset data parameter.

[0115] In this embodiment, when the detection result indicates that the data parameter of the part to be measured is less than the preset data parameter, it indicates that the part to be measured is overcut at this time, so the part to be measured needs to be scrapped. When the detection result indicates that the data parameter of the part to be measured is greater than the preset data parameter, it indicates that the part to be measured is not completely cut at this time. The compensation mechanism for the part to be measured can be used to perform secondary cutting on the part to be measured until the part to be measured is qualified. The in-machine measurement and compensation processing method for the part to be measured in this application meets the requirement of continuously measuring a large number of features on the machine tool, and effectively improves the quality stability during the processing of the part to be measured. After a certain process is completed, the in-machine measurement and compensation processing program is executed. According to the measurement result, the processing parameters can be intervened in a timely manner, effectively reducing the situation of quality anomalies, thereby improving the processing quality of the part to be measured.

[0116] In the detection process of the part to be measured in this application, the parameter information of the probe entity and the detection information of the part to be measured are first determined, and then the detection information is interfered and verified through the parameter information, ensuring that the probe entity will not interfere with the part to be measured during the detection process of the part to be measured, realizing safe detection of the multiple second position points and multiple second features of the part to be measured, and improving the detection efficiency of the part to be measured.

[0117] See Figure 4 , Figure 4 is the structural diagram of the part detection device provided by the embodiment of the present application. As Figure 4 shown, the part detection device 400 includes:

[0118] An acquisition module 410 acquires parameter information for three-dimensional modeling of a probe entity, where the parameter information includes dimension data and model data of the probe entity, and wherein the probe entity is used to detect a part to be measured;

[0119] A determination module 420 is configured to determine detection information of the part to be measured, where the detection information includes a plurality of first position points and a plurality of first features that need to be detected during the detection of the part to be measured, the first features include shape features of the part to be measured, and among the plurality of first features, the shape features included in different first features are different;

[0120] A verification module 430 is configured to perform interference verification on the detection information based on the parameter information, and filter out target detection information from the detection information, where the target detection information includes a plurality of second position points and a plurality of second features, the plurality of first position points include the plurality of second position points, the second position point is a position point where the probe entity does not interfere with the second position point when the probe entity moves to a position for detecting the second position point, and the second feature is a feature where the probe entity does not interfere with the second feature when the probe entity moves to a position for detecting the second feature;

[0121] A detection module 440 is configured to control the probe entity to detect the plurality of second position points and the plurality of second features corresponding to the part to be measured, and generate a detection result, where the detection result is used to indicate whether the part to be measured is qualified.

[0122] Optionally, the detection module 440 includes:

[0123] A first generation sub-module is configured to generate detection path information based on the position information of the plurality of second features and the position information of the plurality of second position points, where the detection path information is the shortest movement path that the probe entity needs to move to detect the plurality of second features and the plurality of second position points;

[0124] A second generation sub-module is configured to generate a detection macro program file according to the detection path information, where the detection macro program file is used to control the probe entity to detect the part to be measured based on the detection path information;

[0125] A detection sub-module is configured to control the probe entity to detect the plurality of second position points and the plurality of second features corresponding to the part to be measured based on the detection macro program file, and generate a detection result.

[0126] Optionally, the determination module 420 includes:

[0127] The first determination sub-module is configured to determine the data acquisition plane of the part to be measured. The data acquisition plane is the coordinate system plane in which the part to be measured is located during the detection process, and the coordinate system plane is used to determine the coordinates of the part to be measured.

[0128] The second determination sub-module is configured to determine the data acquisition method of the part to be measured. The data acquisition method is used to determine multiple preset position points of the part to be measured, and the multiple first position points include the multiple preset position points.

[0129] The third determination sub-module is configured to determine multiple first features and multiple fifth position points that need to be detected on the part to be measured based on the user's input. Among them, the multiple first position points include the multiple fifth position points.

[0130] The fourth determination sub-module is configured to determine multiple first coordinate information corresponding one-to-one to the multiple first position points in the coordinate system plane according to the data acquisition plane, and to determine multiple second coordinate information corresponding one-to-one to the multiple first features in the coordinate system plane according to the data acquisition plane.

[0131] The third generation sub-module is configured to generate the detection information according to the multiple first coordinate information, the multiple second coordinate information, the multiple first position points, and the multiple first features.

[0132] Optionally, the determination module 420 includes:

[0133] The fifth determination sub-module is configured to, when the first feature includes a straight line feature, further determine a third position point on the straight line feature; when the first feature includes a plane feature, further determine four fourth position points on the plane feature.

[0134] The third generation sub-module includes:

[0135] The determination unit is configured to determine, according to the data acquisition plane, the fourth coordinate information corresponding to each third position point in the first feature, and / or to determine, according to the data acquisition plane, the fifth coordinate information corresponding to each fourth position point in the first feature.

[0136] The generation unit is configured to generate the detection information according to the multiple first coordinate information, the third coordinate information, the multiple first features, and the multiple first position points. The third coordinate information includes the fourth coordinate information corresponding to each third position point and / or the fifth coordinate information corresponding to each fourth position point.

[0137] Optionally, the detection information further includes feature data.

[0138] When the first feature is a cylindrical hole feature, the feature data includes the cylindrical center, cylindrical diameter, detection depth, and tool lift height corresponding to the cylindrical hole feature. The detection depth is the detection depth of the probe entity in the first feature, and the tool lift height is the tool usage data during the process of using the tool to cut the first feature;

[0139] When the first feature is a cylindrical boss feature, the feature data includes the cylindrical center, cylindrical diameter, detection depth, and tool lift height corresponding to the cylindrical boss feature;

[0140] When the first feature is a horizontal rectangular inner hole feature, the feature data includes the length, width, and inner hole center position corresponding to the horizontal rectangular inner hole feature;

[0141] When the first feature is a horizontal rectangular outer contour feature, the feature data includes the outer contour length, outer contour width, and outer contour center position corresponding to the horizontal rectangular outer contour feature;

[0142] When the first feature is an inclined rectangular inner hole feature, the feature data includes the length, width, and inner hole center position corresponding to the inclined rectangular inner hole feature;

[0143] When the first feature is an inclined rectangular outer contour feature, the outer contour length, outer contour width, and outer contour center position corresponding to the inclined rectangular outer contour feature are determined as the feature data;

[0144] When the first feature is a rectangular groove feature, the feature data includes the groove width and groove center position corresponding to the rectangular groove feature;

[0145] When the first feature is a rectangular boss feature, the feature data includes the boss width and boss center position corresponding to the rectangular boss feature.

[0146] Optionally, it further includes:

[0147] A first processing module, configured to scrap the part to be measured when the detection result indicates that the data parameter of the part to be measured is less than a preset data parameter, where the data parameter is used to represent the size and shape of the part to be measured;

[0148] A second processing module, configured to execute a compensation mechanism on the part to be measured when the detection result indicates that the data parameter of the part to be measured is greater than the preset data parameter, where the compensation mechanism is used to perform re-cutting on the part to be measured so that the data parameter of the part to be measured is equal to the preset data parameter.

[0149] During the detection process of the part to be measured, the parameter information of the probe entity and the detection information of the part to be measured are first determined, so as to perform interference verification on the detection information through the parameter information, ensuring that the probe entity will not interfere with the part to be measured during the detection process of the part to be measured, realizing the safe detection of multiple second position points and multiple second features of the part to be measured, and improving the detection efficiency of the part to be measured.

[0150] The embodiment of the present application also provides an electronic device. Please refer to Figure 5 , the electronic device may include a processor 501, a memory 502, and a program 5021 stored in the memory 502 and executable on the processor 501.

[0151] When the program 5021 is executed by the processor 501, it can implement Figure 1 any step in the corresponding method embodiment:

[0152] Obtain the parameter information of the three-dimensional modeling of the probe entity, where the parameter information includes the dimension data and model data of the probe entity, and wherein the probe entity is used to detect the part to be measured;

[0153] Determine the detection information of the part to be measured, where the detection information includes multiple first position points and multiple first features that need to be detected during the detection process of the part to be measured, the first features include the shape features of the part to be measured, and among the multiple first features, the shape features included in different first features are different;

[0154] Based on the parameter information, perform interference verification on the detection information, and screen out the target detection information from the detection information, where the target detection information includes multiple second position points and multiple second features, the multiple first position points include the multiple second position points, the second position point is a position point where the probe entity will not interfere with the second position point when the probe entity moves to the position for detecting the second position point, and the second feature is a feature where the probe entity will not interfere with the second feature when the probe entity moves to the position for detecting the second feature;

[0155] Control the probe entity to detect the multiple second position points and the multiple second features corresponding to the part to be measured, and generate a detection result, where the detection result is used to indicate whether the part to be measured is qualified.

[0156] Optionally, the controlling the probe entity to detect the multiple second position points and the multiple second features corresponding to the part to be measured and generate a detection result includes:

[0157] Generate inspection path information based on the position information of the multiple second features and the position information of the multiple second position points, where the inspection path information is the shortest movement path required for the probe entity to inspect the multiple second features and the multiple second position points;

[0158] Generate an inspection macro program file according to the inspection path information, where the inspection macro program file is used to control the probe entity to inspect the part to be measured based on the inspection path information;

[0159] Based on the inspection macro program file, control the probe entity to inspect the multiple second position points and the multiple second features corresponding to the part to be measured, and generate an inspection result.

[0160] Optionally, determining the inspection information of the part to be measured includes:

[0161] Determine the data acquisition plane of the part to be measured, where the data acquisition plane is the coordinate system plane in which the part to be measured is located during the inspection process, and the coordinate system plane is used to determine the coordinates of the part to be measured;

[0162] Determine the data acquisition method of the part to be measured, where the data acquisition method is used to determine multiple preset position points of the part to be measured, and the multiple first position points include the multiple preset position points;

[0163] Based on the input of the user, determine multiple first features and multiple fifth position points to be inspected on the part to be measured, where the multiple first position points include the multiple fifth position points;

[0164] Determine multiple first coordinate information corresponding to the multiple first position points one by one in the coordinate system plane according to the data acquisition plane, and determine multiple second coordinate information corresponding to the multiple first features one by one in the coordinate system plane according to the data acquisition plane;

[0165] Generate the inspection information according to the multiple first coordinate information, the multiple second coordinate information, the multiple first position points, and the multiple first features.

[0166] Optionally, in the case where the first feature includes a linear feature, the first feature further includes determining a third position point on the linear feature; in the case where the first feature includes a planar feature, the first feature further includes determining four fourth position points on the planar feature;

[0167] The generating the inspection information according to the multiple first coordinate information, the multiple second coordinate information, the multiple first position points, and the multiple first features includes:

[0168] Determine the fourth coordinate information corresponding to each of the third position points in the first feature according to the data extraction plane, and / or determine the fifth coordinate information corresponding to each of the fourth position points in the first feature according to the data extraction plane;

[0169] Generate the detection information according to the multiple first coordinate information, the third coordinate information, the multiple first features and the multiple first position points, where the third coordinate information includes the fourth coordinate information corresponding to each of the third position points and / or the fifth coordinate information corresponding to each of the fourth position points.

[0170] Optionally, the detection information further includes feature data;

[0171] When the first feature is a cylindrical hole feature, the feature data includes the cylinder center, cylinder diameter, detection depth, and tool lift height corresponding to the cylindrical hole feature. The detection depth is the detection depth of the probe entity in the first feature, and the tool lift height is the tool usage data during the process of using a tool to cut the first feature;

[0172] When the first feature is a cylindrical boss feature, the feature data includes the cylinder center, cylinder diameter, detection depth, and tool lift height corresponding to the cylindrical boss feature;

[0173] When the first feature is a horizontal rectangular inner hole feature, the feature data includes the length, width, and inner hole center position corresponding to the horizontal rectangular inner hole feature;

[0174] When the first feature is a horizontal rectangular outer contour feature, the feature data includes the outer contour length, outer contour width, and outer contour center position corresponding to the horizontal rectangular outer contour feature;

[0175] When the first feature is an inclined rectangular inner hole feature, the feature data includes the length, width, and inner hole center position corresponding to the inclined rectangular inner hole feature;

[0176] When the first feature is an inclined rectangular outer contour feature, the feature data includes the outer contour length, outer contour width, and outer contour center position corresponding to the inclined rectangular outer contour feature;

[0177] When the first feature is a rectangular groove feature, the feature data includes the groove width and groove center position corresponding to the rectangular groove feature;

[0178] When the first feature is a rectangular boss feature, the feature data includes the boss width and boss center position corresponding to the rectangular boss feature.

[0179] Optionally, after controlling the probe entity to detect the multiple second position points and the multiple second features corresponding to the part to be measured and generating a detection result, the method further includes:

[0180] When the detection result indicates that the data parameter of the part to be measured is less than a preset data parameter, scrapping the part to be measured, where the data parameter is used to represent the size and shape of the part to be measured;

[0181] When the detection result indicates that the data parameter of the part to be measured is greater than the preset data parameter, performing a compensation mechanism on the part to be measured, where the compensation mechanism is used to perform secondary cutting on the part to be measured so that the data parameter of the part to be measured is equal to the preset data parameter.

[0182] In the detection process of the part to be measured in this application, the parameter information of the probe entity and the detection information of the part to be measured are first determined, so as to perform interference verification on the detection information through the parameter information, ensuring that the probe entity will not interfere with the part to be measured during the detection process of the part to be measured, realizing the safe detection of multiple second position points and multiple second features of the part to be measured, and improving the detection efficiency of the part to be measured.

[0183] This application embodiment also provides a computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, it implements each process of the above-mentioned detection method embodiment of the part and can achieve the same technical effect. To avoid repetition, it will not be elaborated here. Among them, the computer-readable storage medium, such as a read-only memory (ROM for short), a random access memory (RAM for short), a magnetic disk or an optical disc, etc.

[0184] This application embodiment further provides a computer program product, which is stored in a storage medium. The computer program product is executed by at least one processor to implement each process of the above-mentioned detection method embodiment of the part and can achieve the same technical effect. To avoid repetition, it will not be elaborated here.

[0185] It should be noted that in this article, the term "including", "comprising" or any other variant thereof is intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements not only includes those elements, but also includes other elements not explicitly listed, or further includes elements inherent to such process, method, article or device. Without further limitation, an element defined by the statement "including a..." does not exclude the existence of another identical element in the process, method, article or device including the element.

[0186] Through the description of the above embodiments, those skilled in the art can clearly understand that the methods of the above embodiments can be implemented by means of software plus a necessary general hardware platform. Of course, they can also be implemented by hardware. However, in many cases, the former is a better implementation method. Based on such an understanding, the technical solution of the present application, in essence or the part that contributes to the prior art, can be embodied in the form of a software product. This computer software product is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disk) and includes several instructions for causing a terminal (which can be a mobile phone, computer, server, air conditioner, or network device, etc.) to execute the methods described in various embodiments of the present application.

[0187] The embodiments of the present application have been described above in conjunction with the accompanying drawings. However, the present application is not limited to the above specific implementation manners. The above specific implementation manners are merely illustrative rather than restrictive. Under the inspiration of the present application, those of ordinary skill in the art can also make many forms without departing from the purpose of the present application and the scope protected by the claims, and all of them belong to the protection scope of the present application.

Claims

1. A method for detecting parts, characterized in that: The method comprises: Acquire parameter information of three-dimensional modeling of a probe entity, wherein the parameter information includes size data and model data of the probe entity, wherein the probe entity is used to detect a part to be measured; Determine detection information of the part to be detected, wherein the detection information includes a plurality of first position points and a plurality of first features that need to be detected during the detection process of the part to be detected, wherein the first features include shape features of the part to be detected, and among the plurality of first features, different first features include different shape features; Perform interference verification on the detection information based on the parameter information, and filter out target detection information from the detection information, wherein the target detection information includes a plurality of second position points and a plurality of second features, the plurality of first position points include the plurality of second position points, the second position points are position points where the probe entity will not interfere with the second position points when the probe entity moves to a position for detecting the second position points, and the second features are features where the probe entity will not interfere with the second features when the probe entity moves to a position for detecting the second features; The probe entity is controlled to detect the plurality of second position points and the plurality of second features corresponding to the part to be measured, and a detection result is generated, wherein the detection result is used to indicate whether the part to be measured is qualified.

2. The method according to claim 1, characterized in that The controlling the probe entity to detect the plurality of second position points and the plurality of second features corresponding to the part to be measured and generating a detection result includes: Based on the position information of the plurality of second features and the position information of the plurality of second position points, generating detection path information, the detection path information being the shortest motion path required for the probe entity to move to detect the plurality of second features and the plurality of second position points; Generate a detection macro program file according to the detection path information, wherein the detection macro program file is used to control the probe entity to detect the part to be detected based on the detection path information; Based on the detection macro program file, the probe entity is controlled to detect the multiple second position points and the multiple second features corresponding to the part to be detected, and a detection result is generated.

3. The method according to claim 1, characterized in that The step of determining the detection information of the part to be tested includes: Determine a data acquisition plane of the part to be measured, wherein the data acquisition plane is a coordinate system plane where the part to be measured is located during the detection process, and the coordinate system plane is used to determine the coordinates of the part to be measured; Determine a data acquisition method for the part to be measured, wherein the data acquisition method is used to determine a plurality of preset position points of the part to be measured, wherein the plurality of first position points include the plurality of preset position points; Based on the user's input, determining a plurality of first features and a plurality of fifth position points that need to be detected on the part to be tested, wherein the plurality of first position points include the plurality of fifth position points; Determine a plurality of first coordinate information corresponding one-to-one to the plurality of first position points in the coordinate system plane according to the data acquisition plane, and determine a plurality of second coordinate information corresponding one-to-one to the plurality of first features in the coordinate system plane according to the data acquisition plane; The detection information is generated according to the plurality of first coordinate information, the plurality of second coordinate information, the plurality of first position points, and the plurality of first features.

4. The method according to claim 3, characterized in that In the case where the first feature includes a straight line feature, the first feature further includes determining a third position point on the straight line feature; in the case where the first feature includes a plane feature, the first feature further includes determining four fourth position points on the plane feature; The generating the detection information according to the plurality of first coordinate information, the plurality of second coordinate information, the plurality of first position points, and the plurality of first features comprises: Determine, according to the data acquisition plane, fourth coordinate information corresponding to each of the third position points in the first feature, and / or determine, according to the data acquisition plane, fifth coordinate information corresponding to each of the fourth position points in the first feature; The detection information is generated according to the multiple first coordinate information, the third coordinate information, the multiple first features and the multiple first position points, and the third coordinate information includes the fourth coordinate information corresponding to each of the third position points and / or the fifth coordinate information corresponding to each of the fourth position points.

5. The method according to claim 3, characterized in that: The detection information also includes characteristic data; In the case where the first feature is a cylindrical hole feature, the feature data includes the center of the cylinder, the diameter of the cylinder, the detection depth and the tool lift height corresponding to the cylindrical hole feature, the detection depth is the detection depth of the probe entity in the first feature, and the tool lift height is the tool usage data in the process of using the tool to cut the first feature; In the case where the first feature is a cylindrical boss feature, the feature data includes a cylinder center, a cylinder diameter, a detection depth, and a tool lift height corresponding to the cylindrical boss feature; In the case where the first feature is a horizontal rectangular inner hole feature, the feature data includes the length, width and inner hole center position corresponding to the horizontal rectangular inner hole feature; In the case where the first feature is a horizontal rectangular outer contour feature, the feature data includes an outer contour length, an outer contour width and an outer contour center position corresponding to the horizontal rectangular outer contour feature; In the case where the first feature is an inclined rectangular inner hole feature, the feature data includes the length, width and inner hole center position corresponding to the inclined rectangular inner hole feature; In the case where the first feature is an inclined rectangular outer contour feature, the feature data includes an outer contour length, an outer contour width and an outer contour center position corresponding to the inclined rectangular outer contour feature, which are determined as the feature data; In the case where the first feature is a rectangular groove feature, the feature data includes a groove width and a groove center position corresponding to the rectangular groove feature; In the case where the first feature is a rectangular boss feature, the feature data includes a boss width and a boss center position corresponding to the rectangular boss feature.

6. The method according to claim 1, characterized in that After controlling the probe entity to detect the plurality of second position points and the plurality of second features corresponding to the part to be measured and generating a detection result, the method further comprises: If the detection result indicates that the data parameter of the part to be tested is less than a preset data parameter, the part to be tested is scrapped, and the data parameter is used to represent the size and shape of the part to be tested; When the detection result indicates that the data parameter of the part to be tested is greater than the preset data parameter, a compensation mechanism is executed on the part to be tested, and the compensation mechanism is used to cut the part to be tested again so that the data parameter of the part to be tested is equal to the preset data parameter.

7. A parts detection device, characterized in that: The device comprises: An acquisition module is used to acquire parameter information of three-dimensional modeling of a probe entity, wherein the parameter information includes size data and model data of the probe entity, wherein the probe entity is used to detect a part to be measured; A determination module, used to determine the detection information of the part to be detected, wherein the detection information includes a plurality of first position points and a plurality of first features that need to be detected during the detection process of the part to be detected, wherein the first features include shape features of the part to be detected, and among the plurality of first features, different first features include different shape features; a verification module, configured to perform interference verification on the detection information based on the parameter information, and filter out target detection information from the detection information, wherein the target detection information includes a plurality of second position points and a plurality of second features, the plurality of first position points include the plurality of second position points, the second position points are position points where the probe entity will not interfere with the second position points when the probe entity moves to a position for detecting the second position points, and the second features are features where the probe entity will not interfere with the second features when the probe entity moves to a position for detecting the second features; The detection module is used to control the probe entity to detect the multiple second position points and the multiple second features corresponding to the part to be tested, and generate a detection result, wherein the detection result is used to indicate whether the part to be tested is qualified.

8. An electronic device, comprising: A memory, a processor, and a program stored in the memory and executable on the processor; wherein the processor is used to read the program in the memory to implement the steps in the part detection method as described in any one of claims 1 to 6.

9. A readable storage medium for storing a program, characterized in that: When the program is executed by a processor, the steps of the component detection method according to any one of claims 1 to 6 are implemented.

10. A computer program product, characterized in that The computer program product is stored in a storage medium, and the computer program product is executed by at least one processor to implement the steps in the component detection method according to any one of claims 1 to 6.

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