Test device and test method

Abstract

The invention discloses test equipment and a test method. The test equipment comprises a test fixture, a plurality of probes and an ejection element. The testing jig is of an annular structure and surrounds a central area. The plurality of probes are radially arranged in the test fixture, and when the plurality of probes are located at an initial position, a plurality of first ends of the plurality of probes are located in the central area. The ejection element is located above the central area. When the ejection element moves towards the central area, the ejection element pushes the plurality of first ends, so that the plurality of second ends of the plurality of probes are far away from the test fixture.

Description

Technical Field

[0001] The present invention relates to a test device, and more particularly to a test device capable of simultaneously driving a plurality of probes for detection. Background Art

[0002] During the R & D or production stage of electronic products, test devices are generally required for electrical tests to check whether the functions of the electronic products are normal. The test device can check by contacting the device under test of the electronic product via a probe. However, nowadays, electronic products provide diverse functions, so there are more devices under test that need to be tested, which increases the detection time. Summary of the Invention

[0003] In view of this, the present invention provides a test device that can simultaneously move a plurality of probes for measurement, thereby reducing the detection time.

[0004] An embodiment of the present invention discloses a test device, including a test fixture, a plurality of probes, and an ejecting element. The test fixture is an annular structure surrounding a central area. The plurality of probes are radially arranged in the test fixture, and when the plurality of probes are in an initial position, a plurality of first ends of the plurality of probes are located in the central area. The ejecting element is located above the central area. After the ejecting element moves towards the central area, the ejecting element pushes the plurality of first ends, so that a plurality of second ends of the plurality of probes are away from the test fixture.

[0005] According to an embodiment of the present invention, the end of the ejecting element has a conical surface, wherein when the ejecting element moves towards the central area to a contact position, the conical surface simultaneously contacts the plurality of first ends of the plurality of probes.

[0006] According to an embodiment of the present invention, the plurality of probes are separated from each other, and the extensions of the plurality of probes pass through the center of the central area.

[0007] According to an embodiment of the present invention, the test device further includes a plurality of accommodating shells disposed in the test fixture; and a plurality of springs disposed in the plurality of accommodating shells. The plurality of probes are respectively movably disposed in the plurality of accommodating shells, and the plurality of springs respectively provide elastic forces to the plurality of probes.

[0008] According to an embodiment of the present invention, the test device further includes a carrier, on which the test fixture is placed; and a moving frame disposed on the carrier for moving the ejecting element.

[0009] According to an embodiment of the present invention, the above-mentioned test equipment further includes a plurality of signal terminals, which are arranged on the above-mentioned moving rack and surround the above-mentioned ejecting element. When the above-mentioned ejecting element pushes the above-mentioned plurality of first ends and moves to a detection position, the above-mentioned plurality of signal terminals respectively contact the above-mentioned plurality of probes.

[0010] According to an embodiment of the present invention, the above-mentioned test fixture is placed on a product to be tested, and the above-mentioned product to be tested has a plurality of test holes. After the above-mentioned ejecting element pushes the above-mentioned plurality of first ends, the above-mentioned plurality of second ends respectively extend into the above-mentioned plurality of test holes.

[0011] An embodiment of the present invention discloses a test method for a test equipment, including placing a test fixture into a product to be tested, wherein the above-mentioned test fixture is an annular structure surrounding a central area, a plurality of probes are radially arranged in the above-mentioned test fixture, and when the above-mentioned plurality of probes are in an initial position, the plurality of first ends of the above-mentioned plurality of probes are located in the above-mentioned central area; moving an ejecting element to a contact position, the above-mentioned ejecting element contacts the above-mentioned plurality of first ends; and moving the above-mentioned ejecting element to a detection position, the above-mentioned ejecting element pushes the above-mentioned plurality of probes, so that the plurality of second ends of the above-mentioned plurality of probes respectively extend into the plurality of test holes of the above-mentioned product to be tested.

[0012] According to an embodiment of the present invention, the above-mentioned test method further includes that when the above-mentioned ejecting element is moved to the above-mentioned detection position, a plurality of signal terminals respectively contact the above-mentioned plurality of probes.

[0013] According to an embodiment of the present invention, the above-mentioned plurality of signal terminals are arranged annularly on the above-mentioned ejecting element, and the above-mentioned signal terminals and the above-mentioned ejecting element are fixed on a moving rack. Description of the Drawings

[0014] Figure 1 It is a perspective view of a test equipment according to an embodiment of the present invention.

[0015] Figure 2 It is a perspective view of a test fixture and a probe device according to an embodiment of the present invention.

[0016] Figure 3 It is an exploded view of a test fixture, a probe device and a product to be tested according to an embodiment of the present invention.

[0017] Figure 4 It is a sectional view of a probe device according to an embodiment of the present invention.

[0018] Figure 5 It is a step diagram of a test method of a test equipment according to an embodiment of the present invention.

[0019] Figure 6A And Figure 6BStereogram and schematic diagram of the testing method of the present invention at the process stage, where the ejecting element is at the contact position.

[0020] Figure 7A And Figure 7B Stereogram and schematic diagram of the testing method of the present invention at the process stage, where the ejecting element and the signal terminal are at the detection position.

[0021] Description of main component symbols

[0022] Testing device 1

[0023] Testing fixture 10

[0024] Perforation 11

[0025] Carrier table 20

[0026] Positioning structure 21

[0027] Moving frame 30

[0028] Support frame 31

[0029] Moving arm 32

[0030] Driving device 40

[0031] Ejecting element 50

[0032] Conical surface 51

[0033] Signal terminal 60

[0034] Probe device 70

[0035] Receiving shell 71

[0036] Probe 72

[0037] Limiting structure 721

[0038] First end 722

[0039] Second end 723

[0040] Spring 73

[0041] Central axis AX1

[0042] Center C1

[0043] Vertical direction D1

[0044] Product under test P1

[0045] Test hole P10

[0046] Component under test P20

[0047] Central region Z1

[0048] The following specific embodiments will further illustrate the present invention in conjunction with the above-mentioned drawings. Specific embodiments

[0049] For the convenience of those of ordinary skill in the art to understand and implement the present invention, the present invention will be further described in detail below in conjunction with the drawings and embodiments. It should be understood that the present invention provides many applicable creative concepts, which can be implemented in various specific forms. The specific embodiments discussed herein are only specific ways of manufacturing and using the present invention, and are not intended to limit the scope of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without making creative efforts fall within the scope of protection of the present invention.

[0050] In addition, repeated reference numerals or markings may be used in different embodiments. These repetitions are only for the purpose of simply and clearly describing the present invention, and do not represent any correlation between the different embodiments and / or structures discussed. It should be noted that when an element is considered to be "connected" to another element, it may be directly connected to the other element or there may be intervening elements present. When an element is considered to be "disposed on" another element, it may be directly disposed on the other element or there may be intervening elements present.

[0051] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those of ordinary skill in the technical field of the present invention. The terms used herein in the specification of the present invention are only for the purpose of describing specific embodiments, and are not intended to limit the present invention. The term "and / or" used herein includes any and all combinations of one or more of the related listed items.

[0052] Figure 1 FIG. 19 is a perspective view of a test device 1 according to an embodiment of the present invention. The test device 1 is used to test a product under test P1. The test device 1 includes a test fixture 10, a carrier 20, a moving frame 30, a driving device 40, an ejecting element 50, and a plurality of signal terminals 60. The test fixture 10 is placed on the carrier 20. In this embodiment, the test fixture 10 and the product under test P1 may be annular structures, and the product under test P1 may be placed inside the product under test P1. The product under test P1 may be a base of an electronic device. In other words, the product under test P1 can be connected to different electronic devices and provide different functions such as power or control signals for the electronic devices.

[0053] The carrier 20 may include a positioning structure 21 for fixing the test fixture 10 and the product under test P1 in position on the carrier 20. A moving frame 30 is disposed on the carrier 20. The moving frame 30 includes a support frame 31 and a moving arm 32. The support frame 31 may extend perpendicular to the carrier 20. The moving arm 32 may extend perpendicular to the support frame 31. The moving arm 32 is movably disposed on the support frame 31 and can move along the support frame 31. In this embodiment, the support frame 31 may extend along a vertical direction D1. The moving arm 32 may extend perpendicular to the vertical direction D1 and can move along the vertical direction D1. A driving device 40 is used to generate a control signal to control the moving arm 32 to move along the support frame 31.

[0054] An ejecting element 50 and a plurality of signal terminals 60 are fixed to the moving arm 32 of the moving frame 30. In other words, the moving arm 32 can move the ejecting element 50 and the signal terminals 60 along the vertical direction D1. The ejecting element 50 and the signal terminals 60 may extend along the vertical direction D1, and the signal terminals 60 are arranged around the ejecting element 50. In other words, the ejecting element 50 and the signal terminals 60 are parallel to each other and separated from each other. The end of the ejecting element 50 has a tapered surface 51 facing the test fixture 10.

[0055] Figure 2 Is a perspective view of the test fixture 10 and the probe device 70 according to an embodiment of the present invention. Figure 3 Is an exploded view of the test fixture 10, the probe device 70 and the product under test P1 according to an embodiment of the present invention.

[0056] Figure 4 Is a sectional view of the probe device 70 according to an embodiment of the present invention. In this embodiment, the test fixture 10 surrounds a central region Z1. A central axis AX1 passes through the center C1 of the central region Z1. The test fixture 10 surrounds the central axis AX1 and extends along a plane perpendicular to the central axis AX1. As Figure 1 shown, the ejecting element 50 is in a raised position. The ejecting element 50 is located above the central region Z1, and the central axis AX1 passes through the top end and the center of the ejecting element 50. In other words, the ejecting element 50 can move up or down along the central axis AX1.

[0057] The test fixture 10 may have a plurality of through holes 11 extending perpendicular to the central axis AX1 (or the vertical direction D1) and separated from each other. The through holes 11 may be radially arranged along an annular path surrounding the central axis AX1. In other words, the extension of each through hole 11 passes through the center C1 of the central region Z1.

[0058] A plurality of probe devices 70 are respectively disposed within the through holes 11 of the test fixture 10. Each probe device 70 includes a housing 71, a probe 72, and a spring 73. The housing 71 can be fixed within the through hole 11. The housing 71 extends perpendicular to the central axis AX1 (or the vertical direction D1) and is separated from each other. The housing 71 is radially arranged along an annular path surrounding the central axis AX1. In other words, the extension of each housing 71 passes through the center C1 of the central region Z1.

[0059] The probes 72 are respectively movably disposed within the housing 71. The probes 72 extend perpendicular to the central axis AX1 (or the vertical direction D1) and are separated from each other. The probes 72 are radially arranged along an annular path surrounding the central axis AX1. In other words, the extension of each probe 72 passes through the center C1 of the central region Z1, and the probes 72 are radially arranged within the test fixture 10.

[0060] As Figure 4 shown, the probe 72 may have a limiting structure 721 to prevent the probe 72 from detaching from the housing 71. In this embodiment, the length of the probe 72 is greater than the length of the housing 71. In other words, the first end 722 and the second end 723 of the probe 72 protrude from the housing 71. The spring 73 is disposed within the housing 71. In this embodiment, one end of the spring 73 abuts against the housing 71, and the other end of the spring 73 abuts against the limiting structure 721. The spring 73 provides an elastic force to the probe 72 to maintain the probe 72 in an initial position. As Figure 2 shown, when the probe 72 is in an initial position, the first end 722 of the probe 72 is located within the central region Z1.

[0061] Figure 5 It is a step diagram of the test method of the test device 1 according to an embodiment of the present invention. Figure 6A And Figure 6B are a perspective view and a schematic view of the test method of the present invention in the process stage, where the ejecting element 50 is in the contact position. In step S10, the product P1 to be tested is placed on the carrier 20, and the test fixture 10 is placed into the product P1 to be tested. As Figure 1 shown, the ejecting element 50 and the signal terminal 60 are in a raised position. In the vertical direction D1, the ejecting element 50 and the signal terminal 60 are located above the central region Z1 of the test fixture 10. In addition, the probe 72 is in an initial position, and the first end 722 of the probe 72 is located within the central region Z1.

[0062] In step S20, the driving device 40 controls the moving arm 32 to move towards the test fixture 10 in the vertical direction D1. When the moving arm 32 moves and the ejecting element 50 and the signal terminal 60 move towards the central region Z1 and reach the contact position, the conical surface 51 of the ejecting element 50 simultaneously contacts the first end 722 of the probe 72, and the signal terminal 60 is separated from the probe 72.

[0063] Figure 7A and Figure 7B FIGS. are the perspective view and the schematic view of the test method of the present invention in the process stage, wherein the ejecting element 50 and the signal terminal 60 are located at the detection position. In step S30, when the moving arm 32 continues to move the ejecting element 50 from the contact position to the detection position, the conical surface 51 of the ejecting element 50 simultaneously pushes the first ends 722 of all the probes 72 to move, and the second ends 723 of the probes 72 are respectively moved away from the test fixture 10 and move towards the test holes P10 of the product under test P1.

[0064] When the moving arm 32 moves the ejecting element 50 and the signal terminal 60 to the detection position, the signal terminals 60 can simultaneously contact the probes 72 respectively. In addition, the second ends 723 of the probes 72 respectively extend into the test holes P10 of the product under test P1 and contact the elements under test P20 in the test holes P10 of the product under test P1. At this time, the test instrument (not shown) can transmit test signals to the elements under test P20 through the signal terminals 60 and the probes 72, or the elements under test P20 transmit test signals to the test instrument through the signal terminals 60 and the probes 72, so as to complete the test of the product under test P1 by the test device 1.

[0065] In this embodiment, the test device 1 of the present invention can test a plurality of elements under test P20 of the product under test P1. In particular, when the product under test P1 is in a ring structure, and the test holes P10 and the elements under test P20 are located inside the ring structure. The ejecting element 50 can move along a radial path to simultaneously contact the elements under test P20 inside the ring structure by a plurality of probes 72, thereby increasing the test speed.

[0066] For those of ordinary skill in the art, other corresponding changes or adjustments can be made according to the actual needs generated by combining the creative solutions and creative concepts of the present invention, and these changes and adjustments should fall within the protection scope of the claims of the present invention.

Claims

1. A testing device, characterized in that, Comprising: A test fixture, which is an annular structure surrounding a central region; A plurality of probes, radially arranged within the above-mentioned test fixture, and when the plurality of probes are in an initial position, a plurality of first ends of the plurality of probes are located within the central region; An ejecting element, located above the central region; Wherein after the ejecting element moves towards the central region, the ejecting element pushes the plurality of first ends, so that a plurality of second ends of the plurality of probes move away from the test fixture.

2. The test device according to claim 1, characterized in that, The end of the ejecting element has a conical surface, and when the ejecting element moves towards the central region to a contact position, the conical surface simultaneously contacts the plurality of first ends of the plurality of probes.

3. The testing device according to claim 1, wherein The plurality of probes are separated from each other, and the extensions of the plurality of probes pass through the center of the central region.

4. The test device according to claim 1, wherein, Further comprising: A plurality of accommodating shells, arranged within the test fixture; And A plurality of springs, arranged within the plurality of accommodating shells; Wherein the plurality of probes are respectively movably arranged within the plurality of accommodating shells, and the plurality of springs respectively provide elastic forces to the plurality of probes.

5. The test device according to claim 1, characterized in that Further comprising: A carrier platform for placing the test fixture; And A moving frame, arranged on the carrier platform for moving the ejecting element.

6. The test device according to claim 5, characterized in that, Further comprising a plurality of signal terminals, arranged on the moving frame and surrounding the ejecting element, Wherein when the ejecting element pushes the plurality of first ends and moves to a detection position, the plurality of signal terminals respectively contact the plurality of probes.

7. The test device according to claim 1, characterized in that Wherein the test fixture is placed on a product to be tested, and the product to be tested has a plurality of test holes. After the ejecting element pushes the plurality of first ends, the plurality of second ends respectively extend into the plurality of test holes.

8. A testing method for a testing device, characterized in that, Comprising: Placing a test fixture into a product to be tested, wherein the test fixture is an annular structure surrounding a central region, a plurality of probes are radially arranged within the test fixture, and when the plurality of probes are in an initial position, a plurality of first ends of the plurality of probes are located within the central region; Moving an ejecting element to a contact position, where the ejecting element contacts the plurality of first ends; and Moving the ejecting element to a detection position, where the ejecting element pushes the plurality of probes, so that a plurality of second ends of the plurality of probes respectively extend into a plurality of test holes of the product to be tested.

9. The testing method of the testing device according to claim 8, characterized in that, When moving the ejecting element to the detection position, a plurality of signal terminals respectively contact the plurality of probes.

10. The testing method of the testing device according to claim 9, characterized in that, The plurality of signal terminals are annularly arranged around the ejecting element, and the signal terminals and the ejecting element are fixed on a moving frame.

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