Sample analyzer and particle imaging method

Abstract

The embodiment of the invention discloses a sample analyzer and a particle imaging method. Determining a depth-of-field range according to feature information of particles in the initial image, and controlling the imaging device to shoot a plurality of depth-of-field images of the particles of the to-be-detected sample within the depth-of-field range under the relative movement of the imaging device and the sample bearing component, namely, the plurality of depth-of-field images respectively correspond to different depths of field of shooting of the plurality of particles; the plurality of depth-of-field images cover all clear focal planes of particles in the to-be-detected sample, so that the problem of out-of-focus blurring is solved, each particle in the to-be-detected sample can be imaged at a proper depth of field, and each particle in the to-be-detected sample can clearly display visual characteristics such as form and structure. A doctor can conveniently judge the physiological state of the to-be-detected sample according to clear imaging of the particles in the to-be-detected sample.

Description

Technical Field

[0001] Embodiments of the present application relate to the field of medical devices, and in particular, to a sample analyzer and a particle imaging method. Background Art

[0002] Imaging analysis of biological samples of the human body is an important item for analyzing the health status of the human body. By imaging and detecting the components, morphology, and other characteristics of particles in biological samples, a preliminary diagnosis of the health status of the human body can be made. However, due to the differences in the characteristics of various particles in biological samples, it is difficult to ensure that all particles can be clearly displayed in the same captured image during imaging, which brings trouble to the observation of particles in biological samples.

[0003] For example, taking urine samples as an example, the analysis of urine formed elements is an important item in clinical urine examinations and plays an important role in the diagnosis of diseases. Currently in the industry, the method for detecting urine formed element images is to take a single digital image with a single focus depth of the sedimented urine in a counting chamber, and then use digital image processing methods to classify the formed elements in the urine.

[0004] However, the sizes of formed elements such as red blood cells, white blood cells, epithelium, casts, and crystals in human urine samples are different, and they are distributed at different spatial positions in the urine samples, resulting in difficulty in presenting the integrity and clarity of all formed elements in a single imaging focal plane. A single imaging focal plane cannot clearly display the morphology of all formed elements, resulting in some formed elements being out of focus and showing blurriness. Pathological features often hide in the three-dimensional subtle morphology, making it difficult for doctors to discover the pathological features of the formed elements that are out of focus and show blurriness, and unable to make an accurate diagnosis. Therefore, the method of directly detecting a single focal plane will lead to missed detection and misdetection of some components, increasing clinical risks. Summary of the Invention

[0005] Embodiments of the present application provide a sample analyzer and a particle imaging method for taking multiple depth-of-field images of particles in a sample to be measured within the depth of field, so that each particle in the sample to be measured can be clearly imaged at an appropriate depth of field.

[0006] In a first aspect of the embodiments of the present application, a sample analyzer is provided. The sample analyzer includes:

[0007] A sample carrier component for carrying a sample to be measured;

[0008] An imaging device for taking pictures of the sample to be measured loaded on the sample carrier component; and

[0009] A driving device for driving the imaging device and / or the sample carrier component so that the imaging device and the sample carrier component move relative to each other;

[0010] A controller, configured to control the imaging device to capture a sample to be tested in the sample carrier member to obtain an initial image of particles in the sample to be tested, determine characteristic information of the particles in the sample to be tested according to the initial image, and determine a depth of field range for capturing the sample to be tested according to the characteristic information of the particles;

[0011] The controller is further configured to, under the relative movement, control the imaging device to capture multiple depth-of-field images of the particles in the sample to be tested within the depth of field range, and obtain a detection result of the particles in the sample to be tested according to some or all of the multiple depth-of-field images.

[0012] A second aspect of the embodiments of the present application provides a sample analyzer, which includes:

[0013] A sample carrier member, configured to carry a sample to be tested;

[0014] An imaging device, configured to capture the sample to be tested loaded in the sample carrier member; and

[0015] A driving device, configured to drive the imaging device and / or the sample carrier member to cause relative movement between the imaging device and the sample carrier member;

[0016] A controller, configured to have a first detection mode and a second detection mode. In the first detection mode, the controller is configured to, under the relative movement, when controlling the imaging device to capture the sample to be tested loaded in the sample carrier member, capture multiple first depth-of-field images of the particles in the sample to be tested within a first depth of field range; and obtain a detection result of the particles in the sample to be tested according to some or all of the multiple first depth-of-field images;

[0017] In the second detection mode, the controller is configured to, under the relative movement, when controlling the imaging device to capture the sample to be tested loaded in the sample carrier member, capture multiple second depth-of-field images of the particles in the sample to be tested within a second depth of field range; and obtain a detection result of the particles in the sample to be tested according to some or all of the multiple second depth-of-field images;

[0018] Wherein, the first depth of field range is different from the second depth of field range.

[0019] A third aspect of the embodiments of the present application provides a sample analyzer, which includes:

[0020] A sample carrier member, configured to carry a sample to be tested;

[0021] An imaging device, configured to capture the sample to be tested loaded in the sample carrier member; and

[0022] A driving device for driving the imaging device and / or the sample carrier member so that the imaging device and the sample carrier member move relative to each other;

[0023] A controller configured to have a third detection mode and a fourth detection mode. In the third detection mode, when the controller controls the imaging device to capture the sample to be tested loaded in the sample carrier member during the relative movement, the controller captures multiple third depth-of-field images of the particles of the sample to be tested according to a first depth-of-field interval; and obtains a detection result of the particles of the sample to be tested based on some or all of the multiple third depth-of-field images;

[0024] In the fourth detection mode, the controller is further configured to, during the relative movement, when controlling the imaging device to capture the sample to be tested loaded in the sample carrier member, capture multiple fourth depth-of-field images of the particles of the sample to be tested according to a second depth-of-field interval; and obtain a detection result of the particles of the sample to be tested based on some or all of the multiple fourth depth-of-field images;

[0025] Wherein, the first depth-of-field interval is different from the second depth-of-field interval.

[0026] A fourth aspect of the embodiments of the present application provides a sample analyzer, which includes:

[0027] A sample carrier member for carrying a sample to be tested;

[0028] An imaging device for capturing the sample to be tested loaded in the sample carrier member; and

[0029] A driving device for driving the imaging device and / or the sample carrier member so that the imaging device and the sample carrier member move relative to each other;

[0030] A controller configured to have a first imaging mode and a second imaging mode. In the first imaging mode, when the controller controls the imaging device to capture the sample to be tested loaded in the sample carrier member during the relative movement, the controller captures multiple third depth-of-field images of the particles of the sample to be tested according to a first depth-of-field interval;

[0031] In the second imaging mode, the controller is further configured to, during the relative movement, when controlling the imaging device to capture the sample to be tested loaded in the sample carrier member, capture multiple fourth depth-of-field images of the particles of the sample to be tested according to a second depth-of-field interval;

[0032] The controller is further configured to obtain a detection result of the particles of the sample to be measured according to part or all of the multiple third depth-of-field images and part or all of the multiple fourth depth-of-field images;

[0033] Wherein, the first depth-of-field interval is different from the second depth-of-field interval.

[0034] In a fifth aspect of the embodiments of the present application, a sample analyzer is provided, and the sample analyzer includes:

[0035] A sample carrying component for carrying a sample to be measured;

[0036] An imaging device for photographing the sample to be measured loaded on the sample carrying component; and,

[0037] A driving device for driving the imaging device and / or the sample carrying component so that the imaging device and the sample carrying component move relative to each other;

[0038] A controller for controlling the imaging device to photograph multiple depth-of-field images of the particles of the sample to be measured according to a preset depth-of-field interval during the relative movement; wherein, the multiple depth-of-field images are arranged in an increasing or decreasing order of depth of field;

[0039] The controller is further configured to determine a first image to be processed among the multiple depth-of-field images arranged in the order, and after the first image to be processed, determine a depth-of-field image as an image to be processed every n depth-of-field images, and obtain multiple images to be processed, where n is a positive integer;

[0040] Perform image fusion on the region with the highest clarity among the multiple images to be processed to obtain a particle detection image of the sample to be measured, and obtain a detection result of the particles of the sample to be measured according to the particle detection image.

[0041] In a sixth aspect of the embodiments of the present application, a particle imaging method is provided, and the method is applied to a sample analyzer, and the sample analyzer includes a sampling device, a sample carrying component, an imaging device, and a driving device; the sampling device is used to suck a sample to be measured and pour the sample to be measured into the sample carrying component; the sample carrying component is used to load the sample to be measured poured by the sampling device; the imaging device is used to photograph the sample to be measured loaded on the sample carrying component; the driving device is used to drive the imaging device and / or the sample carrying component so that the imaging device and the sample carrying component move relative to each other;

[0042] The method includes:

[0043] Control the imaging device to capture the sample to be tested in the sample carrier component to obtain an initial image of the particles in the sample to be tested;

[0044] Determine the characteristic information of the particles in the sample to be tested according to the initial image, and determine the depth of field range for photographing the sample to be tested according to the characteristic information of the particles;

[0045] Under the relative movement, control the imaging device to capture multiple depth-of-field images of the particles in the sample to be tested within the depth of field range.

[0046] As can be seen from the above technical solutions, the embodiments of the present application have the following advantages:

[0047] Determine the depth of field range according to the characteristic information of the particles in the initial image, and capture multiple depth-of-field images of the particles in the sample to be tested within this depth of field range, that is, multiple depth-of-field images respectively correspond to different depths of field for photographing various particles, so that the multiple depth-of-field images cover all the clear focal planes of the particles in the sample to be tested, thereby solving the problem of out-of-focus blur, enabling each particle in the sample to be tested to be imaged at an appropriate depth of field, and further ensuring that each particle in the sample to be tested can clearly display visible features such as morphology and structure, facilitating the doctor to judge the physiological state of the sample to be tested based on the clear imaging of the particles. Description of the Drawings

[0048] Figure 1 It is a schematic structural diagram of a sample analyzer in an embodiment of the present application;

[0049] Figure 2 It is an exemplary schematic diagram of the initial image of the sample to be tested and its binary image in an embodiment of the present application;

[0050] Figure 3 It is a display effect schematic diagram of the circumscribed frame determining the contour of the particles in the binary image in an embodiment of the present application;

[0051] Figure 4 It is a schematic diagram of determining different depth of field ranges and different depth of field intervals of the sample to be tested in an embodiment of the present application;

[0052] Figure 5 Based on Figure 2 It is an exemplary schematic diagram of multiple depth-of-field images captured for the sample to be tested within the depth of field range based on the shown initial image;

[0053] Figure 6 Based on Figure 2 It is a particle detection image of the sample to be tested obtained by image fusion of multiple depth-of-field images captured for the particles in the sample to be tested based on the shown initial image;

[0054] Figure 7This is a schematic flowchart of a particle imaging method in an embodiment of the present application. Detailed implementation manners

[0055] The embodiments of the present application provide a sample analyzer and a particle imaging method, which are used to take multiple depth-of-field images of particles in a test sample within the depth of field, so that each particle in the test sample can be clearly imaged at an appropriate depth of field.

[0056] Terms such as "first", "second", "third", "fourth", etc. (if any) in the description, claims and the above drawings of the present application are used to distinguish similar objects, and do not necessarily describe a specific order or sequence. It should be understood that the data used in this way can be interchanged under appropriate circumstances, so that the embodiments described here can be implemented in an order other than those illustrated or described here. In addition, the terms "comprising" and "having" and any variations thereof are intended to cover non-exclusive inclusion. For example, a process, method, system, product or device comprising a series of steps or units does not necessarily have to be limited to those steps or units clearly listed, but may include other steps or units not clearly listed or inherent to these processes, methods, products or devices.

[0057] In the embodiments of the present application, a sample analyzer refers to an instrument used to detect and analyze a test sample to obtain the detection result of the test sample, which may specifically be a urine analyzer, a blood cell analyzer, a film reader, a biochemical analyzer, an immunoassay analyzer, a blood analyzer and other sample analysis instruments. Figure 1 A schematic structural diagram of a sample analyzer in an embodiment of the present application is provided, as Figure 1 shown, which includes a sample carrier component, an imaging device and a controller, and further includes a driving device.

[0058] The sample carrier component is used to load the test sample perfused by the sampling device, such as loading urine samples, blood samples, bone marrow samples or body fluid samples and other test samples.

[0059] The imaging device is a microscope imaging device. The microscope imaging device includes visual perception devices such as a CCD and an image acquisition card. The imaging device is located above the sample carrier component and is used to take pictures of the particles sedimented in the sample carrier component from bottom to top or from top to bottom, and convert various particles in the test sample such as urine into digital image signals.

[0060] Particles are substances in the sample that have a certain shape and can be recognized through a microscope. By classifying and detecting the particles in the test sample, such as determining the type of particles in the test sample and determining whether the particles are normal or abnormal, the detection results for the particles in the test sample can assist doctors in diagnosing diseases.

[0061] The driving device can drive the imaging device and / or the sample carrier under the control of the controller, so that the imaging device and the sample carrier move relative to each other. For example, the driving device can be connected to the imaging device and drive the imaging device alone, or be connected to the sample carrier and drive the sample carrier alone, or be connected to the imaging device and the sample carrier and drive the imaging device and the sample carrier simultaneously, so as to move the imaging device closer to or farther away from the sample carrier, thereby changing the depth of field of imaging the sample to be measured in the sample carrier.

[0062] The controller is connected to the imaging device. The controller is used to obtain the digital image signal generated by the imaging device. The controller performs image processing and analysis on the digital image signal, extracts the visible targets in the image according to information such as pixel distribution and gray level change, models the feature space of the particles, calculates the feature sets of each segmented target, and identifies the particles through image recognition algorithms and image segmentation algorithms such as artificial neural networks that imitate the human brain, and performs classification, counting and detection.

[0063] In the embodiment of the present application, when the sample to be measured is a urine sample, the sample carrier can be a counting chamber. The counting chamber has a liquid inlet hole and a liquid outlet hole, and valves are provided on the liquid inlet hole and the liquid outlet hole, or valves are provided on the pipelines connected to the liquid inlet hole and the liquid outlet hole. When the valves are closed, a sealed cavity is formed in the counting chamber.

[0064] When the sample to be measured is a urine sample, as Figure 1 shown, the sample analyzer may further include a sample loading device and a sample sucking device. The sample loading device is used to transport the test tube rack containing test tubes to the loading position, and the sample sucking device is used to suck the sample to be measured on the test tube rack from the loading position, and then pour the sucked sample to be measured into the sample carrier.

[0065] The imaging analysis of human biological samples is an important item for analyzing human physiological states. By imaging and detecting the components, morphology and other characteristics of the particles in the biological samples, a preliminary diagnosis of the human physiological state can be made. However, due to the differences in the characteristics of various particles in the biological samples, it is difficult to ensure that all particles can be clearly displayed in the same captured image during imaging, which brings trouble to the observation of the particles in the biological samples.

[0066] For example, taking urine samples as an example, the sizes of particles such as red blood cells, white blood cells, epithelium, casts, and crystals in human urine samples are different, and they are distributed in different spatial positions in the urine samples, resulting in the fact that it is difficult for a single imaging focal plane to present the integrity and clarity of all particles. A single imaging focal plane and imaging with a single depth of field cannot clearly display the morphologies of all particles, resulting in some particles being out of focus and appearing blurred. And the pathological features often hide in the three-dimensional subtle morphologies, resulting in doctors being difficult to discover the pathological features of the particles that are blurred due to out-of-focus, and unable to make an accurate diagnosis.

[0067] In addition, casts with different morphologies and different inclusions in the sample to be tested have different clinical diagnostic values. When the limitation of the depth of field results in out-of-focus and blurred casts obtained, it is difficult to classify them in more detail and impossible to determine the categories of internal inclusions.

[0068] Therefore, directly adopting the method of single-depth-of-field imaging and detecting a single focal plane will lead to missed detection and misdetection of some components, increasing clinical risks.

[0069] To solve the above technical problems, based on the structural composition of the aforementioned sample analyzer, in an embodiment of the present application, after the sample to be tested in the sample carrier settles, the controller of the sample analyzer can control the imaging device to photograph the sample to be tested in the current field of view of the sample carrier to obtain an initial image of the particles in the sample to be tested, determine the characteristic information of the particles in the sample to be tested according to the initial image, and determine the depth-of-field range for photographing the sample to be tested according to the characteristic information of the particles.

[0070] Moreover, since the imaging device and the sample carrier can move relative to each other, providing a basis for changing the depth of field of the imaging device for photographing the particles, therefore, the controller can also control the imaging device to photograph multiple depth-of-field images of the particles in the sample to be tested within this depth-of-field range under the relative movement of the imaging device and the sample carrier, and, according to some or all of the multiple depth-of-field images, obtain the detection result of the particles in the sample to be tested.

[0071] When photographing the initial image, the imaging device can use a focusing algorithm for the current field of view to determine the initial position of the imaging device for photographing the sample to be tested, and then photograph the initial image of the sample to be tested corresponding to this initial position in the current field of view.

[0072] Among them, the characteristic information of the particles can be the characteristics that can affect the clarity of the particles photographed at different depths of field. The depth-of-field range refers to the value range of the depth of field for photographing the particles in the sample to be tested. For example, the depth-of-field range is 12μm, indicating that the range of the depth of field that can be changed based on the depth of field of the initial image is 12μm. Assuming the depth of field of the initial image is 100μm, then subsequent photographing can be performed within multiple intervals with a depth-of-field range of 12μm, such as 100 - 112μm, 88 - 100μm, 94 - 106μm, 95 - 107μm, etc., to photograph the particles in the sample to be tested at multiple depths of field.

[0073] Of course, in addition to being expressed as the difference between the upper limit value and the lower limit value of the interval as described above, the depth-of-field range can also be directly expressed as an interval, such as expressing the depth-of-field range as multiple intervals such as 100 - 112μm, 88 - 100μm, 94 - 106μm, etc. There is no limitation here.

[0074] It should be noted that the statement "controlling the imaging device to take multiple depth-of-field images of the particles of the sample to be measured within the depth-of-field range" means taking multiple depths of field for shooting from the lower limit value to the upper limit value of the interval corresponding to the depth-of-field range. In this way, all particles in the sample to be measured can be imaged at their respective appropriate depths of field, ensuring clear imaging of each particle. For example, if the depth-of-field range is 100 - 112 μm, it means taking multiple depths of field for shooting from 100 μm to 112 μm. The depths of field used within this depth-of-field range include the upper limit value, the lower limit value, and multiple depth-of-field values such as any value within the interval of this depth-of-field range.

[0075] Therefore, the depth-of-field range is determined according to the characteristic information of the particles in the initial image, and multiple depth-of-field images of the particles of the sample to be measured are taken within this depth-of-field range. That is, each of the multiple depth-of-field images corresponds to a different depth of field for shooting different particles, so that the multiple depth-of-field images cover all the clear focal planes of the particles in the sample to be measured, thus solving the problem of out-of-focus blur, enabling each particle in the sample to be measured to be imaged at an appropriate depth of field, and further ensuring that each particle in the sample to be measured can clearly display visible characteristics such as morphology and structure, facilitating the doctor to judge the physiological state of the sample to be measured based on the clear imaging of the particles.

[0076] In this embodiment, the sample to be measured can be a biological sample such as a blood smear sample, a pathological section sample, a fecal sample, a body fluid sample, a urine sample, etc. that can be used to analyze the health status of an organism. When the sample to be measured is a urine sample, the particles in the sample to be measured can be the formed components in the urine sample, and the sample carrier component can be a counting chamber.

[0077] When the characteristic differences between the particles in the sample to be measured are large and a single depth of field cannot clearly image all the particles, the depth-of-field range for imaging the particles in the sample to be measured can be determined according to the characteristic information of the particles in the sample to be measured. Therefore, the sample to be measured and the particles therein can also be other samples and the target cells, crystals, etc. of the particles therein that require adjustment of the depth-of-field range during imaging, such as blood smear samples, pathological section samples, and the tumor cells, diseased cells, etc. therein.

[0078] In this embodiment, a preferred implementation manner for determining the depth-of-field range for shooting the sample to be measured according to the characteristic information of the particles is that when it is determined that the characteristic information of the particles in the sample to be measured meets the first set condition, the depth-of-field range for shooting the sample to be measured is determined as the first depth-of-field range, and the imaging device is controlled to take multiple depth-of-field images of the particles of the sample to be measured within the first depth-of-field range.

[0079] When it is determined that the characteristic information of the particles in the sample to be measured meets the second set condition, the depth-of-field range for shooting the sample to be measured is determined as the second depth-of-field range, and the imaging device is controlled to take multiple depth-of-field images of the particles of the sample to be measured within the second depth-of-field range.

[0080] Among them, the first setting condition is used to indicate that the imaging range of particles in the initial image of the sample to be measured is greater than or equal to the preset imaging range, and the second setting condition is used to indicate that the imaging ranges of all particles in the initial image of the sample to be measured are less than the preset imaging range, and the first depth of field range is greater than the second depth of field range.

[0081] The imaging range can be represented by any visible feature in the image. For example, the imaging range of particles is represented by the imaging area of the particles in the initial image of the sample to be measured, or the imaging range of the particles is represented by the length, width, contour perimeter, and number of pixels displayed by the particles in the initial image. There is no limitation here.

[0082] When the imaging range of particles is represented by the imaging area, the preset imaging range is the preset imaging area threshold. When there are particles in the sample to be measured with an imaging area greater than or equal to the preset imaging area threshold, the depth of field range for photographing the sample to be measured is determined as the first depth of field range; when the imaging areas of all particles in the sample to be measured are less than the preset imaging area threshold, the depth of field range for photographing the sample to be measured is determined as the second depth of field range.

[0083] Therefore, when the imaging range of particles in the sample to be measured in the initial image is greater than or equal to the preset imaging range, for example, when there are particles in the sample to be measured with an imaging area greater than or equal to the preset imaging area threshold, it indicates that there are relatively large particles in the sample to be measured. At this time, a larger depth of field is required for photographing. At the same time, in order to enable even smaller particles in the sample to be measured to be clearly imaged, a larger first depth of field range is required to take multiple depth-of-field images of the sample to be measured to ensure that larger particles can be clearly imaged and smaller particles can also be clearly imaged.

[0084] When the imaging ranges of all particles in the sample to be measured in the initial image are less than the preset imaging range, for example, when the imaging areas of all particles in the sample to be measured are less than the preset imaging area threshold, it indicates that the particles in the sample to be measured are generally small. At this time, a smaller depth of field is required for photographing, and multiple depth-of-field images of the sample to be measured are taken within the smaller second depth of field range to ensure that all relatively small particles in the sample to be measured can be clearly imaged.

[0085] When determining the specific value of the depth of field range, if the imaging areas of all particles in the sample to be measured are less than the preset imaging area threshold, the second depth of field range is determined as the preset depth of field range; when there are particles in the sample to be measured with an imaging area greater than the preset imaging area threshold, the first depth of field range is calculated based on the maximum imaging area of the particles in the sample to be measured, the preset imaging area threshold, and the preset depth of field range, and the calculated first depth of field range is greater than the preset depth of field range.

[0086] For example, set the preset imaging area threshold as S0. The maximum imaging area of the particles in the initial image can be determined as S. If S < S0, the depth of field range is determined as the preset depth of field range, such as a value of 12 μm. If S ≥ S0, the first depth of field range is calculated based on the maximum imaging area S, the preset imaging area threshold S0, and the above-mentioned preset depth of field range. For example, the first depth of field range Z can be calculated based on the following formula:

[0087]

[0088] Among them, λ refers to the preset depth of field range, which can be default set to a value such as 12 μm.

[0089] Of course, when S ≥ S0, the calculation formula for the first depth of field range is not limited to the formulas listed above. For example, it can also be other formulas calculated based on the maximum imaging area S, the preset imaging area threshold S0, and the preset depth of field range, as long as the value of the calculated first depth of field range is greater than the value of the preset depth of field range. It is not limited here.

[0090] In this embodiment, the depth of field range for photographing the sample to be measured is determined according to the characteristic information of the particles. Another preferred implementation manner may be that the characteristic information includes the category of the formed components in the sample to be measured (such as the category of the formed components in a urine sample). When there are formed components in the sample to be measured whose category meets the preset category, the depth of field range for photographing the sample to be measured is determined as the first depth of field range, and the imaging device is controlled to take multiple depth-of-field images of the formed components in the sample to be measured within the first depth of field range.

[0091] When the categories of all formed components in the sample to be measured do not meet the preset category, the depth of field range for photographing the sample to be measured is determined as the second depth of field range, and the imaging device is controlled to take multiple depth-of-field images of the formed components in the sample to be measured within the second depth of field range.

[0092] Among them, the preset category includes uric acid crystals, ammonium phosphate crystals, squamous epithelial cells, casts, etc.; the first depth of field range is greater than the second depth of field range.

[0093] When determining the categories of each formed element in the initial image, the categories of each formed element in the initial image can be determined by means of feature matching or template comparison. For example, identify the features of the formed elements, and perform feature matching between the identified features and the features corresponding to the pre-determined formed element categories. If the features of a certain formed element match the features corresponding to the pre-determined white blood cell component, then determine that this formed element is a white blood cell component. It is also possible to use the method of template comparison to compare the formed elements in the initial image with the template images corresponding to the pre-determined formed element categories, and determine that the category of this formed element is the pre-determined formed element category when matching. Among them, the above-mentioned methods of feature matching or template comparison can be processed and executed based on image processing methods such as neural network algorithms, image feature recognition algorithms, and computer vision processing.

[0094] Therefore, when there are formed elements in the test sample that meet the above-mentioned preset categories, taking pictures within a relatively large depth of field range can make all formed elements image within their respective appropriate focal planes, ensuring that multiple depth-of-field images clearly show the morphology of all formed elements; when there are no formed elements in the test sample that meet the preset categories, that is, when they are all formed elements with small areas such as small-area crystals, small red blood cells, single small-area bacilli, single small-area cocci, etc. with small individual sizes, taking pictures within a relatively small depth of field range can make all formed elements with small individual sizes clearly image, facilitating the observation of visual features such as the morphology and structure of the formed elements.

[0095] In this embodiment, when determining the imaging area of the particles in the initial image, a preferred implementation manner may be to determine the imaging range of each particle in the test sample in the initial image according to the initial image; and for each particle, determine the imaging area of the particle in the initial image according to the imaging range of the particle.

[0096] Among them, when determining the imaging area of the particle in the initial image according to the imaging range of the particle, the imaging area of the imaging range can be calculated, such as using calculus to calculate the imaging area of the imaging range. It can also be to perform binarization processing on the initial image to obtain the corresponding binary image, determine the connected domain of each particle in the test sample according to the binary image; and for each particle, use the number of pixel points in the connected domain of the particle as the imaging area of the particle.

[0097] Such as Figure 2As shown, the imaging device uses a focusing algorithm for the current field of view to determine the initial position at which the imaging device captures the sample to be measured, and then captures the initial image of the sample to be measured corresponding to the initial position in the current field of view. It can be seen from the initial image that there are multiple particles in the current field of view, and each particle has a corresponding imaging range. The initial image can be binarized, converted into a binary image, and the connected components corresponding to each particle in the binary image can be determined. The number of pixel points in the connected component can be counted, and the number of pixel points in the connected component is used as the imaging area of the particle.

[0098] Of course, the actual area of the connected component can also be calculated, such as by using calculus processing to calculate the actual area of the connected component.

[0099] In addition, when determining the imaging range of each particle, the particles of the sample to be measured in the initial image can be segmented according to an image segmentation algorithm to obtain the imaging range of each particle. The image segmentation algorithm can segment the particles in the initial image through the color information and edge information of the image to obtain the target contour of each particle. The color information adopted here includes but is not limited to: RGB, YCbCr, HSV, HSI, etc. The edge information adopted here can be the edge information extracted by an edge detection algorithm. Edge detection refers to determining the pixel points belonging to edge pixels in the image by detecting the degree of change in pixel values in the boundary region, and then connecting the edge pixel points together to form the target contour of the particle, so as to determine the area where the imaging range of each particle is located. The operators involved include but are not limited to: canny operator, sobel operator, prewitt operator, laplacian operator, etc.

[0100] Of course, the image segmentation algorithm can also be performed using deep learning. The methods based on deep learning include but are not limited to: some instance segmentation methods, including but not limited to using Mask R-CNN, Instance-sensitive FCN, FCIS, YOLCAT, SOLO, BlendMask, YOLO series, etc.; it can also be some semantic segmentation methods, including but not limited to using SegNet, RefineNet, PSPNet, DeepLab series, etc.

[0101] Among them, the imaging range of the particle is the area enclosed by the contour of the particle in the initial image; or, the imaging range of the particle is the area enclosed by the bounding box circumscribing the contour of the particle in the initial image. The bounding box can be a bounding rectangle, a bounding circle, or other various shapes of bounding boxes, which is not limited here.

[0102] Such as Figure 2As shown in the "binary image", the contours of each particle are segmented and determined through an image segmentation algorithm, and the area enclosed by the contour of the particle is the imaging range of the particle in the initial image. It can also be like Figure 3 As shown, the minimum bounding rectangle method is used to determine the minimum bounding rectangle of the contour of each particle in the initial image, and the area enclosed by the minimum bounding rectangle can be used as the imaging range of the particle in the initial image. Although the area of the minimum bounding rectangle is not the actual area of the particle within the rectangle and is relatively larger, it can still represent the area characteristics of the particle, that is, for particles with a large area, the area of its minimum bounding rectangle is still large; for particles with a small area, the area of its minimum bounding rectangle is still small. Among them, the minimum bounding rectangle determination method includes, but is not limited to, methods such as sampling to find the minimum bounding rectangle of the connected domain of the binary image after image segmentation.

[0103] In this embodiment, when taking multiple depth-of-field images of the particles of the sample to be measured within the first depth-of-field range, the interval between the depths of field used for two adjacent shootings is the first depth-of-field interval. When taking multiple depth-of-field images of the particles of the sample to be measured within the second depth-of-field range, the interval between the depths of field used for two adjacent shootings is the second depth-of-field interval. Among them, the depth-of-field interval refers to the difference (also referred to as "interval") between the depths of field used for two adjacent shootings when taking multiple pictures of the particles of the sample to be measured within this depth-of-field range. The first depth-of-field interval is greater than or equal to the second depth-of-field interval.

[0104] For example, after taking the initial image with a depth of field of 100 μm, assuming that within the first depth-of-field range of 100 - 120 μm, the first depth-of-field interval of 2 μm is used to take pictures of the sample to be measured, then the depth of field for the first shooting is 102 μm. The depth of field can be adjusted under the relative movement between the imaging device and the sample carrier component, that is, the distance between the imaging device and the sample carrier component is adjusted under the relative movement between the imaging device and the sample carrier component, so that under this adjustment, the imaging device takes pictures of the particles of the sample to be measured with a depth of field of 102 μm. For example, if the imaging device takes pictures of the sample to be measured from bottom to top relative to the sample carrier component, the driving device can drive the imaging device to move upward by a certain distance, or drive the sample carrier component to move downward by a certain distance, or simultaneously drive the imaging device to move upward by a certain distance and drive the sample carrier component to move downward by a certain distance, so that the imaging device obtains a depth of field of 102 μm for taking pictures of the particles of the sample to be measured and takes pictures at this depth of field. And the depth of field for the second shooting is 104 μm. Similarly, the distance between the imaging device and the sample carrier component is adjusted under the relative movement between the imaging device and the sample carrier component, so that the imaging device takes pictures of the particles of the sample to be measured with a depth of field of 104 μm; and so on. When the first depth-of-field range is 100 - 120 μm and the first depth-of-field interval is 2 μm, 10 depth-of-field images can be obtained.

[0105] For another example, after taking an initial image with a depth of field of 100 μm, assuming that within the second depth of field range of 100 - 112 μm, the second depth of field interval is 1 μm, the depth of field for the first shot is 101 μm. The depth of field can be adjusted under the relative movement between the imaging device and the sample carrier component, that is, the distance between the imaging device and the sample carrier component can be adjusted under the relative movement between the imaging device and the sample carrier component, so that under this adjustment, the imaging device takes pictures of the particles of the sample to be measured with a depth of field of 101 μm. For example, if the imaging device takes pictures of the sample to be measured from bottom to top relative to the sample carrier component, the driving device can drive the imaging device to move upward by a certain distance, or drive the sample carrier component to move downward by a certain distance, or simultaneously drive the imaging device to move upward by a certain distance and drive the sample carrier component to move downward by a certain distance, so that the imaging device obtains a depth of field of 101 μm for taking pictures of the particles of the sample to be measured and takes pictures at this depth of field. The depth of field for the second shot is 102 μm. Similarly, the distance between the imaging device and the sample carrier component is adjusted under the relative movement between the imaging device and the sample carrier component, so that the imaging device takes pictures of the particles of the sample to be measured with a depth of field of 102 μm; and so on. When the second depth of field range is 100 - 112 μm and the second depth of field interval is 1 μm, 12 depth of field images can be taken.

[0106] That is to say, assuming the depth of field range is Z and the depth of field interval is dz, the number of images N that need to be taken for each field of view in addition to the initial image is N = ceil(Z / dz), where ceil represents rounding up. Then, under the current field of view, the imaging device is moved N times in sequence by the distance corresponding to the depth of field interval dz for taking pictures, and multiple depth of field images of the current field of view are obtained.

[0107] It can be seen from this that within the same depth of field range, the smaller the depth of field interval, the more depth of field images can be taken, and the distribution of the depth of field of multiple depth of field images is more delicate and uniform, which can ensure that each particle has at least one appropriate depth of field for imaging, and is suitable for taking pictures of samples to be measured where the imaging range of particles in the image is less than the preset imaging range, or the formed classification categories in the sample to be measured do not meet the above preset categories, and the imaging range gaps between particles are small; while the larger the depth of field interval, the fewer depth of field images can be taken within the same depth of field range, which can reduce the number of shootings, thereby reducing the consumption of imaging resources, and at the same time can also reduce the consumption of processing resources during subsequent depth of field image processing, and is suitable for taking pictures of samples to be measured where the imaging range of particles in the image is greater than or equal to the preset imaging range, or the formed classification categories meet the above preset categories, and the imaging range gaps between particles are large, so that particles with a larger imaging range can obtain clear imaging.

[0108] Therefore, when the imaging range of the particles in the initial image is greater than or equal to the preset imaging range, or there are formed classification categories that meet the above preset categories, at this time, the difference in the imaging range between the particles in the sample to be tested is relatively large. The particles of the sample to be tested can be photographed at a relatively large first depth-of-field interval within the first depth-of-field range, so that the particles with a relatively large imaging range (such as a relatively large imaging area) can obtain clear imaging at an appropriate depth of field, and the particles with a relatively small imaging range in the sample to be tested can also be clearly imaged at their appropriate depths of field. At the same time, it can also reduce the consumption of shooting resources and the consumption of image processing resources.

[0109] When none of the formed classification categories in the sample to be tested meet the above preset categories, or the imaging range of the particles in the initial image is less than the preset imaging range, at this time, the difference in the imaging range between the particles in the sample to be tested is relatively small. The particles of the sample to be tested can be photographed at a relatively small second depth-of-field interval within the second depth-of-field range, so that each particle with a relatively small imaging range (such as a relatively small imaging area) in the sample to be tested has at least one appropriate depth of field for imaging, so that each particle in the sample to be tested can be clearly imaged, which is beneficial to morphological observation.

[0110] When photographing the particles of the sample to be tested within the first depth-of-field range, the first depth-of-field range includes a first sub-depth-of-field range and a second sub-depth-of-field range. The sum of the first sub-depth-of-field range and the second sub-depth-of-field range is the first depth-of-field range, and the upper limit value of the second sub-depth-of-field range is less than or equal to the lower limit value of the first sub-depth-of-field range.

[0111] The controller can control the imaging device to take multiple depth-of-field images of the particles of the sample to be tested within the first sub-depth-of-field range, and the interval between the depths of field used for two adjacent shootings is the first depth-of-field interval; and control the imaging device to take multiple depth-of-field images of the particles of the sample to be tested within the second sub-depth-of-field range, and the interval between the depths of field used for two adjacent shootings is the second depth-of-field interval. Among them, the first depth-of-field interval is greater than or equal to the second depth-of-field interval.

[0112] For example, such as Figure 4As shown, when the imaging range of the particles in the initial image is greater than or equal to the preset imaging range, or when the formed categories meet the above preset categories, that is, in the current field of view of the sample to be tested, there are particles with an imaging range S2 greater than or equal to the preset imaging range S0, and there are also particles with an imaging range S1 less than the preset imaging range S0. At this time, within the first depth of field range (set as Z), the particles of the sample to be tested can be photographed using a smaller second sub-depth of field range Z2, and the depth of field interval in this range is the second depth of field interval, which can make the particles with a smaller imaging range all have an appropriate depth of field for clear imaging. Moreover, the particles of the sample to be tested are photographed using a larger first sub-depth of field range Z1, and the depth of field interval in this range is the first depth of field interval, which can make the particles with a larger imaging range obtain clear imaging at an appropriate depth of field, while also reducing the consumption of shooting resources and the consumption of image processing resources.

[0113] Therefore, by dynamically adjusting the depth of field interval within the depth of field range of the same sample to be tested for particle shooting, particles with different imaging ranges or different categories of the sample to be tested can all be imaged at an appropriate depth of field to obtain clear imaging.

[0114] For example, Figure 2 In the initial image shown, multiple particles are different from each other in terms of morphology, structure, size, etc., and some particles can be clearly displayed, while some particles cannot be clearly displayed and their contours are blurred. The reason is that only at a single depth of field and only at a single imaging focal plane, some particles cannot be clearly imaged at this single depth of field, so it is difficult to clearly display all particles that are different from each other in terms of morphology, structure, size, etc. Some particles cannot be imaged at an appropriate depth of field, resulting in low display quality of the particles.

[0115] And through this embodiment and the above-mentioned various preferred embodiments, based on Figure 2 the initial image shown, after determining the depth of field range and the depth of field interval based on the characteristic information of the particles in the initial image, multiple depth of field images of the particles of the sample to be tested are taken within this depth of field range using this depth of field interval, that is, n depth of field images as shown in Figure 5 are obtained. It can be seen from the n depth of field images that each particle has at least one depth of field image that can be clearly displayed. For example, the particle with a larger imaging area in the upper right corner has multiple clearly displayed images, and the particle with a smaller imaging area in the lower left corner can be clearly displayed in the first image.

[0116] In this embodiment, after obtaining multiple depth of field images, to further facilitate the observation of each particle, the area with the highest clarity in multiple regions of each depth of field image can be extracted, and the areas with the highest clarity of multiple depth of field images are image-fused to obtain a particle detection image of the sample to be tested.

[0117] For example, the sharpness of each pixel point (x, y) in each depth-of-field image of the current field of view can be calculated, and the information of the pixel point corresponding to the maximum sharpness in the depth-of-field image is selected as the information of the corresponding pixel point of the particle detection image of the sample to be measured. For example, among multiple depth-of-field images, if the 5×5 area (i.e., 5 pixel units × 5 pixel units) in the upper left corner of a certain depth-of-field image has the highest sharpness among all areas, then the 5×5 area in the upper left corner of this depth-of-field image will be used as the 5×5 area in the upper left corner of the particle detection image of the sample to be measured, and so on. Other areas in the particle detection image of the sample to be measured can be determined in turn.

[0118] Among them, the images to be evaluated include but are not limited to one or more channels of color spaces such as grayscale, RGB, YCbCr, HSV, and HSI. The sharpness described here is a concept describing the clarity of an image, and can also be judgment indexes such as focus degree, contrast, and blurriness that can characterize the clarity of an image. The evaluation methods of image sharpness adopted include but are not limited to evaluation based on image gradient, evaluation based on frequency domain, evaluation based on statistics, evaluation based on information entropy, etc. Among them, the evaluation functions based on image gradient include but are not limited to: Brenner function, Tenengrad function, Laplacian function, Variance function, Roberts function, Energy Gradient function (EOG), etc.; the evaluation functions based on frequency domain include but are not limited to: two-dimensional discrete Fourier transform, discrete cosine transform, etc.; the evaluation functions based on statistics include but are not limited to: Range function, Vollaths function, etc.

[0119] In addition, another preferred implementation manner for obtaining the particle detection image of the sample to be measured can be that multiple depth-of-field images correspond to the same shooting field of view of the imaging device for the sample to be measured, and multiple depth-of-field images have multiple groups of regions with the same position under the shooting field of view. Then, the region with the highest sharpness in each group of regions with the same position can be determined, and the regions with the highest sharpness in multiple groups of regions with the same position are fused to obtain the particle detection image of the sample to be measured. Among them, multiple groups of regions with the same position can include any regions, such as the 5×5 area in the upper left corner of multiple depth-of-field images, or the white blood cell area at the same position in multiple depth-of-field images.

[0120] For example, for the white blood cell area at the same position in multiple depth-of-field images, calculate the white blood cell area with the highest sharpness, and use this white blood cell area with the highest sharpness as the area at the corresponding position in the particle detection image of the sample to be measured. And so on, the areas with the highest sharpness in other groups of regions with the same position can be determined and fused to obtain the particle detection image of the sample to be measured.

[0121] For example, through any of the above-mentioned image fusion methods based on sharpness, it is possible to perform based onFigure 2 The initial image shown performs image fusion on multiple depth-of-field images of the particles of the sample to be tested, and finally, a particle detection image of the sample to be tested as shown in Figure 6 can be obtained.

[0122] Based on the same inventive concept as the foregoing embodiment, the embodiment of the present application further provides a second embodiment of the sample analyzer. In this embodiment, the controller is configured to have a first detection mode and a second detection mode. In the first detection mode, when the controller controls the imaging device to capture the sample to be tested loaded in the sample carrier component under the relative movement between the imaging device and the sample carrier component, the controller is used to capture multiple first depth-of-field images of the particles of the sample to be tested within the first depth-of-field range; and, based on some or all of the multiple first depth-of-field images, obtain the detection result of the particles of the sample to be tested.

[0123] In the second detection mode, when the controller controls the imaging device to capture the sample to be tested loaded in the sample carrier component under the relative movement between the imaging device and the sample carrier component, the controller is used to capture multiple second depth-of-field images of the particles of the sample to be tested within the second depth-of-field range; and, based on some or all of the multiple second depth-of-field images, obtain the detection result of the particles of the sample to be tested.

[0124] Among them, the first depth-of-field range is different from the second depth-of-field range. The sample to be tested processed and detected by the controller in the first detection mode is different from the sample to be tested processed and detected by the controller in the second detection mode, that is, for different samples to be tested, the controller executes different detection modes and uses different depth-of-field ranges for imaging. In this way, the depth-of-field range of imaging can be adaptively adjusted according to the different characteristic information of the particles in the sample to be tested, such as adaptively adjusting the depth-of-field range of imaging according to the imaging area of the particles in the sample to be tested in the image, so that clear images of all particles can be obtained for various different samples to be tested, providing accurate and reliable detection images for the observation of the particles.

[0125] In this embodiment, when it is determined that the characteristic information of the particles in the sample to be tested meets the first set condition, the depth-of-field range for capturing the sample to be tested is determined as the first depth-of-field range; when it is determined that the characteristic information of the particles in the sample to be tested meets the second set condition, the depth-of-field range for capturing the sample to be tested is determined as the second depth-of-field range. Among them, the first set condition is used to indicate that the imaging range of the particles in the sample to be tested in the initial image is greater than or equal to the preset imaging range, and the second set condition is used to indicate that the imaging range of all particles in the sample to be tested in the initial image is less than the preset imaging range, and the first depth-of-field range is greater than the second depth-of-field range.

[0126] In addition, the method for determining the above depth-of-field range may also be as follows: when there are formed components in the sample to be measured whose classification categories conform to the preset categories, determine the depth-of-field range for photographing the sample to be measured as the first depth-of-field range;

[0127] when the categories of all formed components in the sample to be measured do not conform to the preset categories, determine the depth-of-field range for photographing the sample to be measured as the second depth-of-field range;

[0128] wherein, the preset categories include uric acid crystals, ammonium phosphate crystals, squamous epithelial cells, casts, etc.; the first depth-of-field range is greater than the second depth-of-field range.

[0129] Here, the determination and application of the first depth-of-field range and the second depth-of-field range are similar to the determination and application of the first depth-of-field range and the second depth-of-field range described in the previous embodiment. The specific implementation can refer to the explanation in the previous embodiment and will not be elaborated here.

[0130] In a preferred implementation manner of this embodiment, when taking multiple depth-of-field images of the particles of the sample to be measured within the first depth-of-field range, the interval between the depths of field used for two adjacent shootings is the first depth-of-field interval; when taking multiple depth-of-field images of the particles of the sample to be measured within the second depth-of-field range, the interval between the depths of field used for two adjacent shootings is the second depth-of-field interval. Among them, the first depth-of-field interval is greater than or equal to the second depth-of-field interval.

[0131] In another preferred implementation manner of this embodiment, the first depth-of-field range includes a first sub-depth-of-field range and a second sub-depth-of-field range, and the sum of the first sub-depth-of-field range and the second sub-depth-of-field range is the first depth-of-field range; the upper limit value of the second sub-depth-of-field range is less than or equal to the lower limit value of the first sub-depth-of-field range. When taking multiple depth-of-field images of the particles of the sample to be measured within the first depth-of-field range, the controller can control the imaging device to take multiple depth-of-field images of the particles of the sample to be measured within the first sub-depth-of-field range, and the interval between the depths of field used for two adjacent shootings is the first depth-of-field interval; and, control the imaging device to take multiple depth-of-field images of the particles of the sample to be measured within the second sub-depth-of-field range, and the interval between the depths of field used for two adjacent shootings is the second depth-of-field interval. Among them, the first depth-of-field interval is greater than or equal to the second depth-of-field interval.

[0132] Here, the determination and application of the first depth-of-field interval and the second depth-of-field interval are similar to the determination and application of the first depth-of-field interval and the second depth-of-field interval described in the previous embodiment. The specific implementation can refer to the explanation in the previous embodiment and will not be elaborated here.

[0133] Based on the same inventive concept as the foregoing embodiments, an embodiment of the present application further provides a third embodiment of the sample analyzer. In this embodiment, the controller is configured to have a third detection mode and a fourth detection mode. In the third detection mode, when the controller controls the imaging device to capture the sample to be tested loaded in the sample carrier member during the relative movement between the imaging device and the sample carrier member, the controller is configured to capture multiple third depth-of-field images of the particles of the sample to be tested according to the first depth-of-field interval; and obtain the detection result of the particles of the sample to be tested according to some or all of the multiple third depth-of-field images.

[0134] In the fourth detection mode, when the controller controls the imaging device to capture the sample to be tested loaded in the sample carrier member during the relative movement between the imaging device and the sample carrier member, the controller is further configured to capture multiple fourth depth-of-field images of the particles of the sample to be tested according to the second depth-of-field interval; and obtain the detection result of the particles of the sample to be tested according to some or all of the multiple fourth depth-of-field images.

[0135] Wherein, the first depth-of-field interval is different from the second depth-of-field interval. The sample to be tested processed and detected by the controller in the third detection mode is different from the sample to be tested processed and detected by the controller in the fourth detection mode, that is, for different samples to be tested, the controller executes different imaging modes and uses different depth-of-field intervals for imaging. In this way, the depth-of-field interval of imaging can be adaptively adjusted according to the different characteristic information of the particles in the sample to be tested and the difference in the characteristic information of the particles, such as adaptively adjusting the depth-of-field interval of imaging according to the different imaging areas of the particles in the image of the sample to be tested and the difference in the imaging areas between the particles, so that clear images of all particles can be obtained for various samples to be tested, providing accurate and reliable detection images for the observation of the particles.

[0136] The specific implementation manner of the determination and application of the first depth-of-field interval and the second depth-of-field interval in this embodiment is similar to the determination and application of the first depth-of-field interval and the second depth-of-field interval described in the first embodiment, and reference can be made to the explanation in the first embodiment, which will not be elaborated here.

[0137] Based on the same inventive concept as the foregoing embodiments, an embodiment of the present application further provides a fourth embodiment of the sample analyzer. In this embodiment, the controller is configured to have a first imaging mode and a second imaging mode. In the first imaging mode, when the controller controls the imaging device to capture the sample to be tested loaded in the sample carrier member during the relative movement between the imaging device and the sample carrier member, the controller is configured to capture multiple third depth-of-field images of the particles of the sample to be tested according to the first depth-of-field interval.

[0138] In the second imaging mode, the controller is further configured to, when the imaging device takes pictures of the sample to be tested loaded in the sample carrier component under the relative movement between the imaging device and the sample carrier component, take multiple fourth depth-of-field images of the particles of the sample to be tested according to the second depth-of-field interval.

[0139] The controller is further configured to obtain the detection result of the particles of the sample to be tested according to some or all of the multiple third depth-of-field images and some or all of the multiple fourth depth-of-field images.

[0140] Among them, the first depth-of-field interval is different from the second depth-of-field interval. The sample to be tested processed and detected by the controller in the first imaging mode and the sample to be tested processed and detected by it in the second imaging mode can be the same sample to be tested. That is, for the same sample to be tested, the controller executes different imaging modes and uses different depth-of-field intervals for imaging. In this way, the depth-of-field interval of imaging can be adaptively adjusted according to the differences in the characteristic information of the particles in the sample to be tested and the changes in the differences in the characteristic information of the particles. For example, the depth-of-field interval of imaging is adaptively adjusted according to the differences in the imaging area of the particles of the sample to be tested in the image and the changes in the differences in the imaging area between the particles, so that the particles with different characteristic information in the sample to be tested can all obtain clear images, providing accurate and reliable detection images for the observation of the particles.

[0141] The determination and application of the first depth-of-field interval and the second depth-of-field interval in this embodiment are similar to the determination and application of the first depth-of-field interval and the second depth-of-field interval described in the first embodiment. The explanation in the first embodiment can be referred to, and details will not be repeated here.

[0142] Based on the same inventive concept as the foregoing embodiments, the fifth embodiment of the sample analyzer is also proposed in the embodiments of the present application. In this embodiment, the controller is configured to control the imaging device to take multiple depth-of-field images of the particles of the sample to be tested according to a preset depth-of-field interval under the relative movement between the imaging device and the sample carrier component. Among them, the multiple depth-of-field images are arranged in the order of increasing or decreasing depth of field.

[0143] The controller is further configured to determine the first image to be processed among the multiple depth-of-field images arranged in order, and after the first image to be processed, determine one depth-of-field image as the image to be processed every n depth-of-field images, where n is a positive integer, to obtain multiple images to be processed.

[0144] Perform image fusion on the area with the highest clarity among the multiple images to be processed to obtain the particle detection image of the sample to be tested, and obtain the detection result of the particles of the sample to be tested according to the particle detection image.

[0145] For example, 20 depth-of-field images of the particles of the sample to be measured are captured according to a preset depth-of-field interval. These 20 depth-of-field images are arranged in the order of increasing or decreasing depth of field. Assuming that the first depth-of-field image is determined as the first image to be processed, and one depth-of-field image is determined as an image to be processed every other depth-of-field image, then the 3rd, 5th, 7th, 9th... 19th depth-of-field images will be determined as images to be processed, a total of 10 depth-of-field images. Image fusion is performed on the regions with the highest clarity in these 10 depth-of-field images to obtain a particle detection image of the sample to be measured. Moreover, based on the particle detection image, a detection result of the particles of the sample to be measured is obtained.

[0146] Of course, the interval for obtaining depth-of-field images does not necessarily have to be fixed and can be dynamically changed. For example, one depth-of-field image can be continuously determined as an image to be processed every other depth-of-field image; or one depth-of-field image can be determined as an image to be processed every other depth-of-field image first, and then one depth-of-field image can be determined as an image to be processed every two depth-of-field images later. There is no limitation here.

[0147] Among them, image fusion is performed on the regions with the highest clarity in multiple images to be processed. The method is similar to the method of fusing multiple depth-of-field images described in the first embodiment. For specific details, reference can be made to the explanation in the first embodiment, and details will not be elaborated here.

[0148] In this embodiment, the determination and application of the preset depth-of-field interval are similar to the determination and application of the first depth-of-field interval and the second depth-of-field interval described in the first embodiment. For specific details, reference can be made to the explanation in the first embodiment, and details will not be elaborated here.

[0149] Obviously, if more depth-of-field images are sampled at intervals, the depth-of-field interval between multiple depth-of-field images to be processed will be larger; conversely, if fewer depth-of-field images are sampled at intervals, the depth-of-field interval between multiple depth-of-field images to be processed will be smaller. Therefore, by sampling multiple depth-of-field images at intervals, the depth-of-field interval between multiple depth-of-field images to be processed can also be changed and adjusted. Compared with adjusting and changing the depth-of-field interval during imaging, the method of this embodiment can reduce the operation of the controller to adjust the depth-of-field interval of the imaging device for imaging the sample to be measured, without the process of setting and adjusting the depth-of-field interval, thereby improving the imaging efficiency.

[0150] Next, based on the structure of the foregoing sample analyzer, with the sample analyzer as the description object, a particle imaging method executed by the sample analyzer will be further described. Please refer to Figure 7 , an embodiment of the particle imaging method in the embodiments of the present application includes:

[0151] 701. Control the imaging device to capture the sample to be tested in the sample carrier component to obtain an initial image of the particles in the sample to be tested;

[0152] 702. Determine the characteristic information of the particles in the sample to be tested according to the initial image, and determine the depth of field range for photographing the sample to be tested according to the characteristic information of the particles;

[0153] 703. Under the relative movement of the imaging device and the sample carrier component, control the imaging device to capture multiple depth-of-field images of the particles in the sample to be tested within the depth of field range;

[0154] The method of this embodiment can be applied to the above sample analyzer, and its structure includes:

[0155] A sample carrier component for carrying the sample to be tested;

[0156] An imaging device for photographing the sample to be tested loaded on the sample carrier component; and,

[0157] A driving device for driving the imaging device and / or the sample carrier component so that the imaging device and the sample carrier component move relatively.

[0158] The specific structure of the sample analyzer, the positional relationship and functions between the component parts have been described in detail above, and will not be elaborated here.

[0159] In this embodiment, after multiple depth-of-field images are captured, these multiple depth-of-field images can be output. Alternatively, the multiple depth-of-field images are subjected to image fusion to obtain a depth-of-field fused image, and the depth-of-field fused image is output.

[0160] Among them, the method of performing image fusion on multiple depth-of-field images is similar to the method of performing image fusion on multiple depth-of-field images described in the first embodiment. Specifically, reference can be made to the explanation in the first embodiment, and details will not be elaborated here.

[0161] Therefore, in this embodiment, the depth of field range is determined according to the characteristic information of the particles in the initial image, and multiple depth-of-field images of the particles in the sample to be tested are captured within this depth of field range, that is, the multiple depth-of-field images respectively correspond to different depths of field for photographing various particles, so that the multiple depth-of-field images cover all the clear focal planes of the particles in the sample to be tested, thereby solving the problem of out-of-focus blur, enabling each particle in the sample to be tested to be imaged at an appropriate depth of field, and further ensuring that each particle in the sample to be tested can clearly display visible characteristics such as morphology and structure, facilitating the doctor to judge the physiological state of the sample to be tested based on the clear imaging of the particles.

[0162] The specific explanations of various preferred embodiments of this embodiment are similar to those of various preferred embodiments of the first embodiment of the aforementioned sample analyzer, and will not be elaborated here.

[0163] Based on the structure of the aforementioned sample analyzer below, with the sample analyzer as the object of description, the particle imaging method performed by the sample analyzer will be further described. The second embodiment of the particle imaging method in the embodiments of the present application includes:

[0164] In the first detection mode, when controlling the imaging device to take pictures of the sample to be tested loaded in the sample carrying component under the relative movement of the imaging device and the sample carrying component, take multiple first depth-of-field images of the particles of the sample to be tested within the first depth-of-field range; and, obtain the detection result of the particles of the sample to be tested according to some or all of the multiple first depth-of-field images;

[0165] In the second detection mode, when controlling the imaging device to take pictures of the sample to be tested loaded in the sample carrying component under the relative movement of the imaging device and the sample carrying component, take multiple second depth-of-field images of the particles of the sample to be tested within the second depth-of-field range; and, obtain the detection result of the particles of the sample to be tested according to some or all of the multiple second depth-of-field images;

[0166] Among them, the first depth-of-field range is different from the second depth-of-field range.

[0167] The method of this embodiment can be applied to the above sample analyzer, and its structure includes:

[0168] A sample carrying component for carrying the sample to be tested;

[0169] An imaging device for taking pictures of the sample to be tested loaded in the sample carrying component; and,

[0170] A driving device for driving the imaging device and / or the sample carrying component so that the imaging device and the sample carrying component move relatively.

[0171] The specific structure of the sample analyzer and the positional relationship and functions between the components have been described in detail above, and will not be elaborated here.

[0172] Therefore, in this embodiment, the depth-of-field range of imaging can be adaptively adjusted according to the different characteristic information of the particles in the sample to be tested. For example, the depth-of-field range of imaging can be adaptively adjusted according to the different imaging areas of the particles in the sample to be tested in the image, so that clear images of all particles can be obtained for various different samples to be tested, providing accurate and reliable detection images for the observation of particles.

[0173] Next, based on the structure of the aforementioned sample analyzer, with the sample analyzer as the object of description, the particle imaging method executed by the sample analyzer will be further described. The third embodiment of the particle imaging method in the embodiments of the present application includes:

[0174] In the third detection mode, when the controller controls the imaging device to capture the sample to be tested loaded in the sample carrier component under the relative movement between the imaging device and the sample carrier component, the controller is configured to capture multiple third depth-of-field images of the particles of the sample to be tested according to the first depth-of-field interval; and obtain the detection result of the particles of the sample to be tested based on some or all of the multiple third depth-of-field images.

[0175] In the fourth detection mode, when the controller controls the imaging device to capture the sample to be tested loaded in the sample carrier component under the relative movement between the imaging device and the sample carrier component, the controller is further configured to capture multiple fourth depth-of-field images of the particles of the sample to be tested according to the second depth-of-field interval; and obtain the detection result of the particles of the sample to be tested based on some or all of the multiple fourth depth-of-field images.

[0176] Wherein, the first depth-of-field interval is different from the second depth-of-field interval.

[0177] The method of this embodiment can be applied to the aforementioned sample analyzer, and its structure includes:

[0178] A sample carrier component for carrying the sample to be tested;

[0179] An imaging device for capturing the sample to be tested loaded in the sample carrier component; and

[0180] A driving device for driving the imaging device and / or the sample carrier component to make the imaging device and the sample carrier component move relative to each other.

[0181] The specific structure of the sample analyzer and the positional relationship and functions between the components have been described in detail above and will not be elaborated here.

[0182] Therefore, in this embodiment, the depth-of-field interval of imaging can be adaptively adjusted according to the differences in the characteristic information of the particles in the sample to be tested and the magnitude of the differences in the characteristic information of the particles. For example, the depth-of-field interval of imaging can be adaptively adjusted according to the differences in the imaging area of the particles of the sample to be tested in the image and the magnitude of the differences in the imaging areas between the particles, so that clear images of all particles can be obtained for various different samples to be tested, providing accurate and reliable detection images for the observation of the particles.

[0183] Next, based on the structure of the aforementioned sample analyzer, with the sample analyzer as the object of description, the particle imaging method executed by the sample analyzer will be further described. The fourth embodiment of the particle imaging method in the embodiments of the present application includes:

[0184] In the first imaging mode, when the controller is used to control the imaging device to capture the sample to be tested loaded in the sample carrier component during the relative movement between the imaging device and the sample carrier component, multiple third depth-of-field images of the particles of the sample to be tested are captured according to the first depth-of-field interval.

[0185] In the second imaging mode, when the controller is further used to control the imaging device to capture the sample to be tested loaded in the sample carrier component during the relative movement between the imaging device and the sample carrier component, multiple fourth depth-of-field images of the particles of the sample to be tested are captured according to the second depth-of-field interval.

[0186] The controller is further used to obtain the detection result of the particles of the sample to be tested according to some or all of the multiple third depth-of-field images and some or all of the multiple fourth depth-of-field images.

[0187] Wherein, the first depth-of-field interval is different from the second depth-of-field interval.

[0188] The method of this embodiment can be applied to the above sample analyzer, and its structure includes:

[0189] A sample carrier component for carrying the sample to be tested;

[0190] An imaging device for capturing the sample to be tested loaded in the sample carrier component; and,

[0191] A driving device for driving the imaging device and / or the sample carrier component so that the imaging device and the sample carrier component move relatively.

[0192] The specific structure of the sample analyzer, the positional relationship and functions between the components have been described in detail above, and will not be elaborated here.

[0193] Therefore, in this embodiment, the depth-of-field interval of imaging can be adaptively adjusted according to the differences in the characteristic information of the particles in the sample to be tested and the changes in the differences in the characteristic information of the particles. For example, the depth-of-field interval of imaging can be adaptively adjusted according to the differences in the imaging areas of the particles of the sample to be tested in the image and the changes in the differences in the imaging areas between the particles, so that the particles with different characteristic information in the sample to be tested can all obtain clear imaging, providing accurate and reliable detection images for the observation of the particles.

[0194] Based on the structure of the foregoing sample analyzer, taking the sample analyzer as the description object, the particle imaging method executed by the sample analyzer will be further described below. The fifth embodiment of the particle imaging method in the embodiments of the present application includes:

[0195] Under the relative movement of the imaging device and the sample carrier component, control the imaging device to capture multiple depth-of-field images of the particles of the sample to be measured according to a preset depth-of-field interval; wherein, the multiple depth-of-field images are arranged in ascending or descending order of depth of field;

[0196] The controller is further configured to, among the multiple depth-of-field images arranged in sequence, determine the first image to be processed, and after the first image to be processed, determine one depth-of-field image as the image to be processed every n depth-of-field images, where n is a positive integer, to obtain multiple images to be processed;

[0197] Perform image fusion on the region with the highest clarity among the multiple images to be processed to obtain a particle detection image of the sample to be measured, and based on the particle detection image, obtain the detection result of the particles of the sample to be measured.

[0198] The method of this embodiment can be applied to the above sample analyzer, and its structure includes:

[0199] A sample carrier component for carrying the sample to be measured;

[0200] An imaging device for capturing the sample to be measured loaded on the sample carrier component; and,

[0201] A driving device for driving the imaging device and / or the sample carrier component to make the imaging device and the sample carrier component move relative to each other.

[0202] The specific structure of the sample analyzer, the positional relationship and functions among the components have been described in detail above, and will not be elaborated here.

[0203] Therefore, in this embodiment, if more depth-of-field images are sampled at intervals for depth-of-field image sampling, the depth-of-field interval between the multiple depth-of-field images to be processed will be larger; conversely, if fewer depth-of-field images are sampled at intervals for depth-of-field image sampling, the depth-of-field interval between the multiple depth-of-field images to be processed will be smaller. Therefore, by sampling multiple depth-of-field images at intervals, the depth-of-field interval between the multiple depth-of-field images to be processed can also be changed and adjusted. Compared with adjusting and changing the depth-of-field interval during imaging, the method of this embodiment can reduce the operation of the controller to adjust the depth-of-field interval of the imaging device for imaging the sample to be measured, without the setting and adjustment process of the depth-of-field interval, thereby improving the imaging efficiency.

[0204] Those skilled in the art can clearly understand that for the convenience and simplicity of description, the specific working processes of the above-described system, device, and unit can refer to the corresponding processes in the foregoing method embodiments, and will not be elaborated here.

[0205] In several embodiments provided by the present application, it should be understood that the disclosed systems, devices, and methods can be implemented in other ways. For example, the device embodiments described above are merely illustrative. For example, the division of the units is only a logical function division. In actual implementation, there may be other division methods. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the displayed or discussed coupling or direct coupling or communication connection between each other can be through some interfaces, and the indirect coupling or communication connection of the device or unit can be in electrical, mechanical, or other forms.

[0206] The units described as separate components may or may not be physically separated. The components displayed as units may or may not be physical units, that is, they can be located in one place, or they can be distributed to multiple network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0207] In addition, in each embodiment of the present application, the functional units can be integrated in a processing unit, or each unit can exist physically alone, or two or more units can be integrated in one unit. The above-mentioned integrated units can be implemented in the form of hardware or in the form of software functional units.

[0208] If the above-mentioned integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on such an understanding, the technical solution of the present application, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. The computer software product is stored in a storage medium and includes several instructions for causing a computer device (which can be a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the methods described in each embodiment of the present application. The foregoing storage medium includes: USB flash drives, mobile hard disks, read-only memories (ROM, read-only memory), random access memories (RAM, random access memory), magnetic disks, or optical discs and other various media that can store program codes.

Claims

1. A sample analyzer, characterized in that, The sample analyzer includes: a sample carrying component for carrying a sample to be tested; an imaging device for photographing the sample to be tested loaded on the sample carrying component; and a driving device for driving the imaging device and / or the sample carrying component so that the imaging device and the sample carrying component move relative to each other; a controller for controlling the imaging device to photograph the sample to be tested in the sample carrying component to obtain an initial image of the particles in the sample to be tested, determining characteristic information of the particles in the sample to be tested according to the initial image, and determining a depth of field range for photographing the sample to be tested according to the characteristic information of the particles; The controller is further configured to, under the relative movement, control the imaging device to photograph multiple depth of field images of the particles in the sample to be tested within the depth of field range, and obtain a detection result of the particles in the sample to be tested according to some or all of the multiple depth of field images.

2. The sample analyzer according to claim 1, characterized in that, Specifically, when it is determined that the characteristic information of the particles in the sample to be tested meets a first set condition, the controller determines that the depth of field range for photographing the sample to be tested is a first depth of field range, and controls the imaging device to photograph multiple depth of field images of the particles in the sample to be tested within the first depth of field range; when it is determined that the characteristic information of the particles in the sample to be tested meets a second set condition, the controller determines that the depth of field range for photographing the sample to be tested is a second depth of field range, and controls the imaging device to photograph multiple depth of field images of the particles in the sample to be tested within the second depth of field range; wherein, the first set condition is used to indicate that the imaging range of the particles in the sample to be tested in the initial image is greater than or equal to a preset imaging range, the second set condition is used to indicate that the imaging ranges of all the particles in the sample to be tested in the initial image are less than the preset imaging range, and the first depth of field range is greater than the second depth of field range.

3. The sample analyzer according to claim 2, characterized in that, The characteristic information includes the imaging area of the particles in the sample to be tested in the initial image, and the preset imaging range is a preset imaging area threshold; Specifically, when there are particles in the sample to be tested with an imaging area greater than or equal to the preset imaging area threshold, the controller determines that the depth of field range for photographing the sample to be tested is the first depth of field range; when the imaging areas of all the particles in the sample to be tested are less than the preset imaging area threshold, the controller determines that the depth of field range for photographing the sample to be tested is the second depth of field range.

4. The sample analyzer according to claim 1, characterized in that, The characteristic information of the particles includes the category of the formed components in the sample to be tested; Specifically, when there are formed components in the sample to be tested with a formed component category meeting a preset category, the controller determines that the depth of field range for photographing the sample to be tested is the first depth of field range, and controls the imaging device to photograph multiple depth of field images of the formed components in the sample to be tested within the first depth of field range. When all the categories of the formed components in the sample to be tested do not conform to the preset categories, determine that the depth-of-field range for photographing the sample to be tested is the second depth-of-field range, and control the imaging device to capture multiple depth-of-field images of the formed components in the sample to be tested within the second depth-of-field range; Wherein, the preset categories include one or more of uric acid crystals, magnesium ammonium phosphate crystals, squamous epithelial cells, and casts; the first depth-of-field range is greater than the second depth-of-field range.

5. The sample analyzer according to any one of claims 2 to 4, characterized in that, When capturing multiple depth-of-field images of the particles in the sample to be tested within the first depth-of-field range, the interval between the depths of field used in two adjacent captures is the first depth-of-field interval; When capturing multiple depth-of-field images of the particles in the sample to be tested within the second depth-of-field range, the interval between the depths of field used in two adjacent captures is the second depth-of-field interval; The first depth-of-field interval is greater than or equal to the second depth-of-field interval.

6. The sample analyzer according to any one of claims 2 to 4, characterized in that, The first depth-of-field range includes a first sub-depth-of-field range and a second sub-depth-of-field range, and the sum of the first sub-depth-of-field range and the second sub-depth-of-field range is the first depth-of-field range; the upper limit value of the second sub-depth-of-field range is less than or equal to the lower limit value of the first sub-depth-of-field range; When capturing multiple depth-of-field images of the particles in the sample to be tested within the first depth-of-field range, the controller is specifically configured to: Control the imaging device to capture multiple depth-of-field images of the particles in the sample to be tested within the first sub-depth-of-field range, and the interval between the depths of field used in two adjacent captures is the first depth-of-field interval; and, Control the imaging device to capture multiple depth-of-field images of the particles in the sample to be tested within the second sub-depth-of-field range, and the interval between the depths of field used in two adjacent captures is the second depth-of-field interval; Wherein, the first depth-of-field interval is greater than or equal to the second depth-of-field interval.

7. The sample analyzer according to any one of claims 2 to 3, characterized in that, The controller is specifically configured to: When the imaging area of all the particles in the sample to be tested is less than the preset imaging area threshold, determine that the second depth-of-field range is the preset depth-of-field range; When there are particles in the sample to be tested with an imaging area greater than the preset imaging area threshold, calculate the first depth-of-field range based on the maximum imaging area of the particles in the sample to be tested, the preset imaging area threshold, and the preset depth-of-field range; The first depth-of-field range is greater than the preset depth-of-field range.

8. The sample analyzer according to any one of claims 1 to 7, characterized in that, The controller is further configured to determine the imaging range of each particle in the initial image based on the initial image; and, For each particle, determine the imaging area of the particle in the initial image based on the imaging range of the particle.

9. The sample analyzer according to claim 8, wherein The controller is specifically configured to perform binarization processing on the initial image to obtain a corresponding binary image, and determine the connected domains of each particle in the sample to be tested based on the binary image; and, For each particle, use the number of pixel points in the connected domain of the particle as the imaging area of the particle.

10. The sample analyzer according to claim 8, wherein, When determining the imaging range of each particle, the controller is specifically configured to segment each particle in the initial image of the sample to be tested according to an image segmentation algorithm to obtain the imaging range of each particle.

11. The sample analyzer according to claim 10, characterized in that, The imaging range of the particle is the area enclosed by the contour of the particle in the initial image; or, The imaging range of the particle is the area enclosed by the circumscribed rectangle of the contour of the particle in the initial image.

12. The sample analyzer according to claim 1, wherein The controller is further configured to extract the region with the highest sharpness from multiple regions of each depth-of-field image, and perform image fusion on the regions with the highest sharpness of the multiple depth-of-field images to obtain a particle detection image of the sample to be measured.

13. The sample analyzer according to claim 1, wherein, The multiple depth-of-field images correspond to the same shooting field of view of the imaging device for the sample to be measured, and the multiple depth-of-field images have multiple sets of regions with the same position in the shooting field of view; The controller is further configured to determine the region with the highest sharpness in each set of the regions with the same position, and perform image fusion on the regions with the highest sharpness of the multiple sets of regions with the same position to obtain a particle detection image of the sample to be measured.

14. The sample analyzer according to claim 1, characterized in that, The sample to be measured includes one or more of a blood sample, a pathological section sample, a fecal sample, a body fluid sample, and a urine sample.

15. The sample analyzer according to claim 14, characterized in that, When the sample to be measured is a urine sample, the particles in the sample to be measured are the formed components in the urine sample, and the sample carrier is a counting chamber.

16. A sample analyzer, characterized in that, The sample analyzer includes: A sample carrier for carrying the sample to be measured; An imaging device for photographing the sample to be measured loaded on the sample carrier; and, A driving device for driving the imaging device and / or the sample carrier so that the imaging device and the sample carrier move relative to each other; A controller configured to have a first detection mode and a second detection mode. In the first detection mode, when the controller controls the imaging device to photograph the sample to be measured loaded in the sample carrier during the relative movement, the controller is configured to photograph multiple first depth-of-field images of the particles of the sample to be measured within a first depth-of-field range; and obtain a detection result of the particles of the sample to be measured according to some or all of the multiple first depth-of-field images; In the second detection mode, when the controller controls the imaging device to photograph the sample to be measured loaded in the sample carrier during the relative movement, the controller is configured to photograph multiple second depth-of-field images of the particles of the sample to be measured within a second depth-of-field range; and obtain a detection result of the particles of the sample to be measured according to some or all of the multiple second depth-of-field images; Wherein, the first depth-of-field range is different from the second depth-of-field range.

17. The sample analyzer according to claim 16, characterized in that, The controller is specifically configured to determine that the depth-of-field range for photographing the sample to be measured is the first depth-of-field range when it is determined that the characteristic information of the particles in the sample to be measured meets a first set condition; Determine that the depth-of-field range for photographing the sample to be measured is the second depth-of-field range when it is determined that the characteristic information of the particles in the sample to be measured meets a second set condition; Wherein, the first set condition is used to indicate that the imaging range of the particles in the test sample in the initial image is greater than or equal to a preset imaging range, the second set condition is used to indicate that the imaging ranges of all the particles in the test sample in the initial image are less than the preset imaging range, and the first depth-of-field range is greater than the second depth-of-field range; Or, The characteristic information includes the categories of the formed components in the test sample; specifically, the controller is configured to determine that the depth-of-field range for photographing the test sample is the first depth-of-field range when there are formed components in the test sample whose categories meet the preset categories; When the categories of all the formed components in the test sample do not meet the preset categories, determine that the depth-of-field range for photographing the test sample is the second depth-of-field range; Wherein, the preset categories include one or more of uric acid crystals, ammonium phosphate crystals, squamous epithelial cells, and casts; and the first depth-of-field range is greater than the second depth-of-field range.

18. The sample analyzer according to claim 17, wherein, When taking multiple depth-of-field images of the particles of the test sample within the first depth-of-field range, the interval between the depths-of-field used for two adjacent shootings is the first depth-of-field interval; When taking multiple depth-of-field images of the particles of the test sample within the second depth-of-field range, the interval between the depths-of-field used for two adjacent shootings is the second depth-of-field interval; The first depth-of-field interval is greater than or equal to the second depth-of-field interval.

19. The sample analyzer according to claim 17, characterized in that, The first depth-of-field range includes a first sub-depth-of-field range and a second sub-depth-of-field range, and the sum of the first sub-depth-of-field range and the second sub-depth-of-field range is the first depth-of-field range; the upper limit value of the second sub-depth-of-field range is less than or equal to the lower limit value of the first sub-depth-of-field range; When taking multiple depth-of-field images of the particles of the test sample within the first depth-of-field range, the controller is specifically configured to: Control the imaging device to take multiple depth-of-field images of the particles of the test sample within the first sub-depth-of-field range, and the interval between the depths-of-field used for two adjacent shootings is the first depth-of-field interval; and, Control the imaging device to take multiple depth-of-field images of the particles of the test sample within the second sub-depth-of-field range, and the interval between the depths-of-field used for two adjacent shootings is the second depth-of-field interval; Wherein, the first depth-of-field interval is greater than or equal to the second depth-of-field interval.

20. A sample analyzer, characterized in that, The sample analyzer includes: A sample carrying component for carrying a test sample; An imaging device for photographing the test sample loaded on the sample carrying component; and, A driving device for driving the imaging device and / or the sample carrying component so that the imaging device and the sample carrying component move relative to each other; A controller configured to have a third detection mode and a fourth detection mode. In the third detection mode, when the controller controls the imaging device to photograph the test sample loaded in the sample carrying component during the relative movement, the controller is configured to take multiple third depth-of-field images of the particles of the test sample according to the first depth-of-field interval; and obtain a detection result of the particles of the test sample according to some or all of the multiple third depth-of-field images; In the fourth detection mode, the controller is further configured to, under the relative movement, when controlling the imaging device to capture the sample to be tested loaded in the sample carrying component, capture a plurality of fourth depth-of-field images of the particles of the sample to be tested according to a second depth-of-field interval; and obtain a detection result of the particles of the sample to be tested according to some or all of the plurality of fourth depth-of-field images; Wherein, the first depth-of-field interval is different from the second depth-of-field interval.

21. A sample analyzer, characterized in that, The sample analyzer includes: A sample carrying component for carrying the sample to be tested; An imaging device for capturing the sample to be tested loaded in the sample carrying component; and A driving device for driving the imaging device and / or the sample carrying component to enable relative movement between the imaging device and the sample carrying component; A controller configured to have a first imaging mode and a second imaging mode. In the first imaging mode, the controller is configured to, under the relative movement, when controlling the imaging device to capture the sample to be tested loaded in the sample carrying component, capture a plurality of third depth-of-field images of the particles of the sample to be tested according to a first depth-of-field interval; In the second imaging mode, the controller is further configured to, under the relative movement, when controlling the imaging device to capture the sample to be tested loaded in the sample carrying component, capture a plurality of fourth depth-of-field images of the particles of the sample to be tested according to a second depth-of-field interval; The controller is further configured to obtain a detection result of the particles of the sample to be tested according to some or all of the plurality of third depth-of-field images and some or all of the plurality of fourth depth-of-field images; Wherein, the first depth-of-field interval is different from the second depth-of-field interval.

22. A sample analyzer, characterized in that, The sample analyzer includes: A sample carrying component for carrying the sample to be tested; An imaging device for capturing the sample to be tested loaded in the sample carrying component; and A driving device for driving the imaging device and / or the sample carrying component to enable relative movement between the imaging device and the sample carrying component; A controller for, under the relative movement, controlling the imaging device to capture a plurality of depth-of-field images of the particles of the sample to be tested according to a preset depth-of-field interval; wherein, the plurality of depth-of-field images are arranged in the order of increasing or decreasing depth of field; The controller is further configured to determine a first image to be processed among the plurality of depth-of-field images arranged in the order, and after the first image to be processed, determine a depth-of-field image as an image to be processed every n depth-of-field images to obtain a plurality of the images to be processed, where n is a positive integer; Perform image fusion on the region with the highest clarity among the plurality of images to be processed to obtain a particle detection image of the sample to be tested, and obtain a detection result of the particles of the sample to be tested according to the particle detection image.

23. A particle imaging method, characterized in that, The method is applied to a sample analyzer, which includes a sampling device, a sample carrier component, an imaging device, and a driving device; the sampling device is used to aspirate a sample to be tested and perfusion the sample to be tested into the sample carrier component; the sample carrier component is used to load the sample to be tested perfused by the sampling device; the imaging device is used to photograph the sample to be tested loaded by the sample carrier component; the driving device is used to drive the imaging device and / or the sample carrier component so that the imaging device and the sample carrier component move relative to each other; The method includes: Controlling the imaging device to photograph the sample to be tested in the sample carrier component to obtain an initial image of the particles in the sample to be tested; Determining the characteristic information of the particles in the sample to be tested according to the initial image, and determining the depth of field range for photographing the sample to be tested according to the characteristic information of the particles; Under the relative movement, controlling the imaging device to photograph multiple depth-of-field images of the particles in the sample to be tested within the depth of field range.

24. The particle imaging method according to claim 23, wherein After photographing the multiple depth-of-field images, the method further includes: Outputting the multiple depth-of-field images; Or, Performing image fusion on the multiple depth-of-field images to obtain a depth-of-field fusion image, and outputting the depth-of-field fusion image.

Images