Charging equipment test method and related equipment

Abstract

The invention discloses a charging equipment test method and related equipment.The method is applied to a charging equipment test system, the charging equipment test system comprises a tester, an adapter plate and a simulation board of charging equipment, the tester is connected with the adapter plate, and a first interface of the adapter plate is connected with a second interface of the simulation board; the method comprises the steps that the analog board generates a first electronic signal and sends the first electronic signal to the adapter board, and the first electronic signal is used for representing a test result of the charging equipment; the adapter plate receives the first electronic signal and converts the first electronic signal into a corresponding first communication signal; the adapter plate sends a first communication signal to the tester; and the tester receives the first communication signal and determines a test result of the charging equipment according to the first communication signal. By adopting the method provided by the invention, the complexity of the test process of the charging equipment is reduced, and the test efficiency of the charging equipment is improved.

Description

Technical Field

[0001] The present invention relates to the technical field of charging device testing, and particularly to a testing method and related device for a charging device Background Art

[0002] In the testing of device performance, operation stability, software program logic, etc. in a charging device, steps such as injecting signals into the printed circuit board (PCB) of the charging device and collecting signals are included

[0003] Since a large number of interfaces and lines of different types of signals are configured in the charging device, a large number of different types of signals need to be input to or received from the charging device in the existing testing steps. Furthermore, a variety of different types of signal generators and oscilloscopes and other devices need to be connected to the charging device. And the charging device is usually configured inside large devices such as vehicles, and the signal interfaces and transmission lines in the charging device are configured relatively concealed, and some interfaces and lines even need to be connected to testing devices such as generators and oscilloscopes by means of flying wires. Therefore, a large number of testing devices such as oscilloscopes and generators need to be connected during the testing process of the charging device, the testing process of the charging device is complex, and thus the problem of low testing efficiency of the charging device is caused Summary of the Invention

[0004] In view of the above problems, embodiments of the present application provide a testing method and related device for a charging device. Adopting the solution of the present application is beneficial to solving the problem of low testing efficiency of the charging device

[0005] In a first aspect, an embodiment of the present application provides a testing method for a charging device, which is applied to a charging device testing system. The charging device testing system includes a tester, an adapter board, and an analog board of the charging device. The tester is connected to the adapter board, and a first interface of the adapter board is connected to a second interface of the analog board. The method includes: the analog board generates a first electronic signal and sends the first electronic signal to the adapter board, where the first electronic signal is used to represent the testing result of the charging device; the adapter board receives the first electronic signal and converts the first electronic signal into a corresponding first communication signal; the adapter board sends the first communication signal to the tester; the tester receives the first communication signal and determines the testing result of the charging device according to the first communication signal

[0006] It can be seen that in the embodiment of the present application, the tester is connected to the analog board of the charging device through the adapter board, so that the tester can obtain the information of the first electronic signal generated by the analog board during actual operation through the first communication signal sent by the adapter board, thus eliminating the need to connect hardware such as generators and oscilloscopes to the charging device by means of flying wires for testing the charging device, reducing the complexity of the testing process of the charging device, and improving the testing efficiency of the charging device

[0007] In combination with the first aspect, in a possible embodiment, before the simulation board generates the first electronic signal, the method also includes: the tester generates a test operation instruction corresponding to the charging device; and the tester controls the operation of the simulation board according to the test operation instruction.

[0008] In combination with the first aspect, in a possible embodiment, the tester generates a test run instruction corresponding to the charging device, including: the tester generates the test run instruction according to the function of the charging device, and the function of the device includes at least one of a basic hardware function, a protocol compatibility function or a fault protection function.

[0009] It can be seen that in the embodiment of the present application, the tester automatically generates test running instructions based on the device functions of the charging device, so that after the simulation board of the charging device is connected to the tester, the tester can directly test the simulation board of the charging device according to the automatically generated test running instructions, thereby realizing the test automation of the charging device and improving the test efficiency of the charging device.

[0010] In combination with the first aspect, in a possible embodiment, the tester generates a test run instruction according to the function of the charging device, including: the tester determines a target fault event from multiple preset fault events, the preset fault events include multiple non-mutually exclusive charging device fault events, and the charging device fault events included in the target fault events respectively correspond to a fault protection function in the device function of the charging device; the tester generates a test run instruction according to the target fault event, and the test run instruction includes a fault protection function test for multiple fault events included in the target fault event.

[0011] It can be seen that in the embodiment of the present application, the tester generates corresponding test running instructions based on the actual target fault event, so that when the tester tests the charging device according to the test running instructions, the various operating parameters of the simulation board are consistent with the actual fault event, further improving the credibility of the test results.

[0012] In combination with the first aspect, the test run instruction includes a first signal value and a target signal type, the tester includes multiple test boards, the test boards are used to generate communication signals of corresponding signal types, and the tester controls the operation of the simulation board according to the test run instruction, including: the tester determines the target board from multiple test boards, and the signal type corresponding to the target board includes the target signal type; if the target signal type is a constant value signal, the tester controls the target board to generate a second communication signal according to the first signal value; the tester sends the second communication signal to the adapter board; the adapter board receives the second communication signal and converts the second communication signal into a corresponding second electronic signal; the adapter board sends the second electronic signal to the simulation board; the simulation board receives the second electronic signal and operates according to the instruction of the second electronic signal.

[0013] In combination with the first aspect, in a possible embodiment, if the target signal type is a non-constant numerical signal, after the tester determines the target board from multiple test boards, the method also includes: the tester generates a second signal value based on the first signal value, and the absolute value of the difference between the second signal value and the first signal value is not greater than a preset difference; the tester controls the target board to generate a second communication signal corresponding to the test run instruction based on the second signal value; the tester sends the second communication signal to the adapter board; the adapter board receives the second communication signal and converts the second communication signal into a corresponding second electronic signal; the adapter board sends the second electronic signal to the simulation board; the simulation board receives the second electronic signal and runs according to the instruction of the second electronic signal.

[0014] In combination with the first aspect, in a possible embodiment, the tester controls the target board to generate a second communication signal corresponding to the test run instruction according to the second signal value, and also includes: the tester generates a third signal value according to the first signal value and the second signal value, and the absolute value of the difference between the average value of the third signal value and the second signal value minus the first signal value is not greater than a preset difference; the tester controls the target board to generate a second communication signal corresponding to the test run instruction according to the third signal value.

[0015] It can be seen that in the embodiment of the present application, the tester generates signal values ​​such as the second signal value and the third signal value through the first signal value, and then controls the target board to generate a corresponding second communication signal according to the second signal value and the third signal value, so that the second electronic signal finally input into the simulation board can simulate the numerical fluctuation of the real signal, thereby further improving the credibility of the detection result.

[0016] In combination with the first aspect, in a possible embodiment, the adapter board includes an environment simulation circuit, and the environment simulation circuit is used to simulate the external circuit environment when the charging device is in a charging mode or a discharging mode.

[0017] It can be seen that the different connection modes in the environmental simulation circuit in the embodiment of the present application can simulate the external circuit environment of the charging device corresponding to the simulation board under various operating conditions such as charging and discharging, further improving the authenticity of the first communication signal and thereby improving the credibility of the test results.

[0018] In a second aspect, an embodiment of the present application further provides an electronic device comprising a processor, a memory, an interface, and one or more programs, wherein the one or more programs are stored in the memory and configured to be executed by the processor, and one or more instructions are suitable for being loaded by the processor and executing part or all of the method of the first aspect.

[0019] In a third aspect, an embodiment of the present application provides a computer-readable storage medium storing a computer program for electronic data exchange, where the computer program causes a processor to execute some or all of the methods in the first aspect.

[0020] In a fourth aspect, the present application provides a computer program product, which, when read and executed by a computer, causes the computer to execute the method in any possible design of the first aspect above.

[0021] It can be understood that the beneficial effects of the embodiments in the second aspect and the fourth aspect can refer to the beneficial effects in the method of the first aspect, and will not be elaborated here. Description of the Drawings

[0022] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the following will briefly introduce the drawings required for use in the description of the embodiments or the prior art. Obviously, the drawings in the following description are only some embodiments of the present application. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0023] Figure 1 It is a schematic diagram of an application scenario of a test method for a charging device provided by an embodiment of the present application;

[0024] Figure 2 It is a schematic flowchart of a test method for a charging device provided by an embodiment of the present application;

[0025] Figure 3 It is a schematic diagram of the structure of a first interface and a second interface provided by an embodiment of the present application;

[0026] Figure 4 It is a schematic flowchart of another test method for a charging device provided by an embodiment of the present application;

[0027] Figure 5 It is a schematic diagram of the configuration of a test board provided by an embodiment of the present application;

[0028] Figure 6 It is a schematic diagram of a display panel provided by an embodiment of the present application;

[0029] Figure 7 It is a schematic diagram of the control logic of a tester provided by an embodiment of the present application;

[0030] Figure 8 It is a schematic diagram of the structure of an environment simulation circuit provided by an embodiment of the present application;

[0031] Figure 9 It is a schematic diagram of the structure of an electronic device provided by an embodiment of the present application. Detailed implementation manners

[0032] In order to enable those skilled in the art of the present technology to better understand the solutions of this application, the technical solutions in the embodiments of this application will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of this application. Obviously, the described embodiments are only a part of the embodiments of this application, rather than all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by those of ordinary skill in the art without making creative efforts belong to the scope of protection of this application.

[0033] The terms "first", "second", etc. in the specification and claims of this application and the above accompanying drawings are used to distinguish different objects, rather than to describe a specific order. In addition, the terms "include" and "have" and any variations thereof are intended to cover non-exclusive inclusion. For example, a process, method, system, product, or device that includes a series of steps or units is not limited to the listed steps or units, but optionally further includes steps or units not listed, or optionally further includes other steps or units inherent to these processes, methods, products, or devices.

[0034] Referring to "embodiment" herein means that the specific features, structures, or characteristics described in connection with the embodiment can be included in at least one embodiment of this application. The appearance of this phrase at various positions in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment mutually exclusive with other embodiments. Those skilled in the art will explicitly and implicitly understand that the embodiments described herein can be combined with other embodiments.

[0035] The embodiments of this application will be described below in conjunction with the accompanying drawings.

[0036] Please refer to Figure 1 , Figure 1 which is a schematic diagram of an application scenario of a test method for a charging device provided by an embodiment of this application. The application scenario 100 includes: a tester 101, an adapter board 102, and a simulation board 103. Among them, the tester 101 here is used to test the simulation board 103 to obtain test results in aspects such as the program logic, device performance, and operation stability of the charging device corresponding to the simulation board 103.

[0037] The adapter board 102 is used to convert the communication signal of the tester 101 into an electronic signal that can be input into the analog board 103, or convert the electronic signal generated by the analog board 103 into a communication signal that can be input into the tester 101. The adapter board 102 is connected to the second interface of the analog board 103 through the first interface. All the test-related electronic signals generated during the operation of the analog board 103 or the electronic signals that need to be input by the adapter board 102 are input and output through the first interface and the second interface here. The electronic signals here specifically include power supply signals, IOI signals, IOO signals, PWM signals, resistance signals, communication signals, analog-to-digital conversion ADC signals, etc. The second interface of the adapter board 102 can be adapted to the first interface on the analog board of any type and signal charging device.

[0038] The analog board 103 is specifically an analog device of the charging device. The charging device mentioned here is specifically a charging device used in a new energy vehicle, which includes an on-board charger (OBC) and a DC-DC converter (DCDC). The analog board 103 is a device dedicated to testing made according to the specifications and hardware configurations of the corresponding charging device. Compared with the actual charging device, there is a first interface configured according to a unified specification on the analog board 103, and the first interface is connected to the second interface so that all the signals related to testing during the operation of the analog board 103 are input or output through the first interface and the second interface.

[0039] In the embodiment of the present application, the analog board 103 generates a first electronic signal and sends the first electronic signal to the adapter board 102. The first electronic signal here is specifically signals such as current signals, voltage signals, and IO signals generated during the operation of the analog board 103. The first electronic signal is used to characterize the test result of the charging device.

[0040] The adapter board 102 receives the first electronic signal and converts the first electronic signal into a corresponding first communication signal. The tester 101 cannot directly obtain the electronic signal generated during the operation of the analog board 103, so it is necessary to convert the first electronic signal into a corresponding first communication signal through the adapter board 102 so that the tester 101 can receive the first communication signal here, thereby determining the specific value or generation time of the electronic signal generated by the analog board 103, and then analyzing the test result of the analog board 103. The communication signals here specifically include simulation signals, analog signals, or digital signals, etc.

[0041] After the tester 101 receives the first communication signal generated by the adapter board based on the first electronic signal, it determines the test result of the charging device according to the first communication signal. For example, electronic signals such as relatively large voltage signals or current signals generated by the simulation board 103 during operation will also be converted by the adapter board 102 into corresponding communication signals and sent to the tester 101, so that the tester does not need to directly contact the simulation board, reducing the test risk.

[0042] Based on the communication signal, the tester 101 can know the specific values of signals such as current signals, voltage signals, and IO signals generated by the simulation board 103 during operation, as well as information such as the generation time, and then determine the test results of aspects such as the charging device program logic, device performance, and operation stability corresponding to the simulation board 103.

[0043] It can be seen that in the embodiment of the present application, the tester is connected to the simulation board of the charging device through the adapter board, enabling the tester to obtain information about the first electronic signal generated by the simulation board during actual operation through the first communication signal sent by the adapter board, so that there is no need to connect to the charging device through hardware such as a generator and an oscilloscope in a way such as flying wires for testing the charging device, reducing the complexity of the test process of the charging device and improving the test efficiency of the charging device.

[0044] Please refer to Figure 2 , Figure 2 which is a schematic flowchart of a test method for a charging device provided by an embodiment of the present application, and can be implemented based on the Figure 1 application scenario 100 shown, as Figure 2 shown, including steps S201 - S204:

[0045] S201: The simulation board generates a first electronic signal and sends the first electronic signal to the adapter board. The first electronic signal is used to represent the test result of the charging device.

[0046] Specifically, the first electronic signal here is a real signal generated by the simulation board during operation. The simulation board also includes a first interface, and the simulation board is connected to the second interface of the adapter board through the first interface to send different types of electronic signals to the adapter board through the first interface and the second interface.

[0047] Exemplarily, please refer to Figure 3 , Figure 3 which is a schematic structural diagram of a first interface and a second interface provided by an embodiment of the present application. Among them, the first interface and the second interface each include two rows of gold finger interfaces. Figure 3 The structures of the first interface and the second interface shown are only examples, and in the actual charging device test system, the first interface and the second interface may also have other different structures or appearances.

[0048] The following takes the first interface as an example for illustration. The first interface includes two rows of gold finger interfaces. The number of gold finger interfaces in one row is greater than that in the other row. For example, the number of gold finger interfaces in one row is 72PIN, and the number of gold finger interfaces in the other row is 56PIN. To balance the ground wire of the analog board, at least 2PINs are designed at the head, tail, and middle of each gold finger as grounding PINs, so that each component in the analog board can achieve common grounding, thereby reducing the influence between different signals. Except for the grounding PINs, other PINs are used to receive or send the following types of signals: power supply signal, IOI signal, IOO signal, PWM signal, resistance signal, communication signal, ADC signal, etc.

[0049] The number of PINs and the corresponding signal types in the first interface and the second interface are only examples. In actual applications, there may be more or fewer PINs and types. The second interface on the adapter board has the same type and number as the first interface on the analog board, which will not be elaborated here.

[0050] It can be seen that through the above interface configuration, the tester can send or obtain various types of signals from the analog board through the adapter board, and by reasonably allocating the ground wire, the interference between different signals is also reduced, improving the test efficiency and the credibility of the test results at the same time.

[0051] S202: The adapter board receives the first electronic signal and converts the first electronic signal into a corresponding first communication signal.

[0052] Specifically, the adapter board transfers the first electronic signal sent by the analog board into a first communication signal that can be directly input into the tester. Here, the first communication signal is specifically a simulation signal, an analog signal, or a digital signal, etc.

[0053] The first communication signal is specifically generated by the adapter board reducing the first electronic signal in equal proportion; or is generated by the adapter board according to the corresponding relationship between the electronic signal and the communication signal; or is generated by the adapter board based on the value of the electronic signal.

[0054] S203: The adapter board sends the first communication signal to the tester.

[0055] S204: The tester receives the first communication signal and determines the test result of the charging device according to the first communication signal.

[0056] Specifically, based on the first communication signal here, the tester can determine information such as the time and value of various electronic signals generated by the analog board of the charging device during operation. For example, the specific value of the voltage signal at different times, the generation time of the IO signal, etc. Furthermore, based on the information of the first electrical signal generated by the analog board, the tester can analyze and obtain test results in aspects such as the program logic, device performance, and operation stability of the charging device. For example, whether the specific value of the voltage signal at different times is within a reasonable range, whether the generation time of the IO signal meets the requirements, etc.

[0057] The above application embodiment describes a test method for a charging device in which the tester passively receives the first electronic signal sent by the analog board. Based on this, on the premise that the tester instructs the analog board to run through a test operation instruction to generate the corresponding first electronic signal, the application embodiment also provides another test method for the charging device. Please refer to Figure 4 , Figure 4 is a schematic flowchart of another test method for the charging device provided by the application embodiment, including steps S401 - S406:

[0058] S401: The tester generates a test operation instruction corresponding to the charging device.

[0059] Specifically, in the application embodiment, the analog board operates based on the instruction of the charging device and generates the first electrical signal. For example, the test operation instruction specifically instructs "the analog board charges at 12V voltage", and the tester sends the electronic signal corresponding to the test operation instruction to the analog board, so that the analog board operates in the state of "charging at 12V voltage" and generates the corresponding first electronic signal. Exemplarily, the first electronic signal specifically includes one or more of signals such as charging voltage and charging current.

[0060] In a possible embodiment, the tester generates a test operation instruction corresponding to the charging device, including: the tester generates a test operation instruction according to the function of the charging device, and the function of the device includes at least one of the basic hardware function, protocol compatibility function, or fault protection function.

[0061] Specifically, in the application embodiment, the test operation instruction is generated based on the device function of the charging device corresponding to the analog board. The device function here is specifically determined by the tester obtaining the device identifier such as the name and number of the charging device and according to the corresponding relationship between the device identifier and the device function stored in the tester; or determined by the tester according to the information input by the tester.

[0062] The device functions here include basic hardware functions such as charging function, discharging function, etc.; the protocol compatibility functions include the compatibility functions of the charging device with charging protocols or communication protocols, etc.; the fault protection functions include the protection functions of the charging device against different types of faults, such as unstable voltage, overheating, etc.

[0063] After determining the device functions of the charging device, the tester generates test run instructions for one or more of the device functions of the charging device, so that the simulation board of the charging device operates according to the test run instructions, obtaining a first electrical signal corresponding to the test result, and obtaining the test results of one or more device functions of the charging device based on the corresponding first electrical signal.

[0064] It can be seen that in the embodiments of the present application, the tester automatically generates test run instructions based on the device functions of the charging device. Then, after the simulation board of the charging device is connected to the tester, the tester can directly test the simulation board of the charging device according to the automatically generated test run instructions, realizing the automation of the charging device test and improving the test efficiency of the charging device.

[0065] In a possible embodiment, the tester generates test run instructions according to the functions of the charging device, including: the tester determines a target fault event from multiple preset fault events, where the preset fault events include multiple non - mutually exclusive charging device fault events, and the charging device fault events included in the target fault event respectively correspond to one fault protection function in the device functions of the charging device; the tester generates test run instructions according to the target fault event, and the test run instructions include the fault protection function tests for the multiple fault events included in the target fault event.

[0066] Specifically, in the embodiments of the present application, a method for generating test run instructions for fault protection function tests is described in detail. Multiple preset fault events are stored in the tester, and the preset fault events are specifically events pre - edited according to the fault events that may occur during the actual operation of the charging device. For example, the voltage of the charging device is unstable during charging, the temperature of the charging device is too high during discharging, etc.

[0067] First, the tester needs to determine a target fault event from multiple preset fault events. The target fault event is a preset fault event among the multiple preset fault events that may occur on the charging device corresponding to the simulation board being tested. That is to say, the charging device fault events included in the target fault event respectively correspond to one fault protection function of the charging device.

[0068] Exemplarily, for a charging device without V2V discharging function, the fault events occurring during V2V discharging cannot be determined as the target fault events of this charging device.

[0069] After determining the target fault event of the charging device, the tester generates a test operation instruction for the charging device according to the target fault event. The test board controls the simulation board to operate according to the test operation instruction, so as to simulate the target fault event on the simulation board, so that the simulation board generates a first electronic signal in response to the target fault event. Finally, the tester can judge the possible operating conditions and response results of the simulation board (which is also the charging device corresponding to the simulation board) when the target fault event occurs based on the first communication signal corresponding to the first electronic signal generated by the simulation board, thus realizing the test of the charging device.

[0070] It can be seen that in the embodiment of the present application, the tester generates a corresponding test operation instruction according to the real target fault event, so that in the process of testing the charging device according to the test operation instruction, various operating parameters of the simulation board conform to the real fault event, further improving the credibility of the test result.

[0071] In a possible embodiment, if the tester fails to determine the target fault event from multiple preset fault events, the method further includes: the tester generates multiple fault protection function groups from the device functions of the charging device, and each fault protection function group includes a preset number of non-mutually exclusive fault protection functions; the tester calculates the correlation score of the multiple fault protection function groups, and the possibility of simultaneous occurrence of the fault protection functions in the fault protection function group is positively correlated with the correlation score of the fault protection function group; the tester generates a target fault event according to the fault protection function group with the highest correlation score, and the target fault event includes a charging device fault event for a preset number of non-mutually exclusive fault protection functions.

[0072] Specifically, in the embodiment of the present application, if the tester fails to determine the target fault event from multiple preset fault events, that is to say, all of the multiple preset fault events include charging device fault events that conflict with the device functions of the charging device, and none of the multiple preset fault events can occur during the operation of the charging device to be tested, the tester will generate a target fault event through the device functions of the charging device.

[0073] The tester determines multiple fault protection function groups, and each fault protection group includes multiple non-mutually exclusive fault protection functions. Here, the mutually exclusive fault protection functions refer to fault protection functions that cannot occur simultaneously. For example, the overvoltage fault protection function and the undervoltage fault protection function are a group of mutually exclusive fault protection functions.

[0074] In addition, the embodiment of the present application also limits the number of fault protection functions included in the fault protection function group, so as to avoid requiring the simulation board to respond to too many fault signals simultaneously during subsequent tests, which does not conform to the occurrence logic of fault events in the actual operation process. Inputting a large number of fault-related signals to the simulation board at the same time during subsequent tests may also affect the accuracy of the test results of the simulation board.

[0075] The tester generates a target fault event according to the fault protection function group with the highest correlation score among the determined multiple fault protection function groups. Here, the correlation score is mainly calculated based on the possibility of the fault protection functions in the fault protection function group occurring simultaneously. Therefore, the target fault event generated according to the fault protection function group with the highest correlation score is the most complex fault event that the charging device to be tested may encounter in actual operation.

[0076] It can be seen that in the embodiment of the present application, if the tester cannot determine the target fault event from multiple preset fault events, the corresponding target fault event is generated according to the fault protection function group with the highest correlation score, so as to test the simulation board of the charging device through the fault events that the charging device may encounter in actual operation, making the test content more conform to the actual operation logic of the charging device and further improving the credibility of the test results.

[0077] S402: The tester controls the operation of the simulation board according to the test operation instruction.

[0078] Specifically, the tester generates a corresponding communication signal through the test operation instruction, and then sends the communication signal to the adapter board. The adapter board converts the communication signal corresponding to the test operation instruction into a corresponding electronic signal and sends it to the simulation board to control the operation of the simulation board.

[0079] Optionally, if the simulation board also includes a wireless communication module, the tester directly sends the control instruction corresponding to the test operation instruction to the simulation board through wireless communication to control the operation of the simulation board.

[0080] In a possible embodiment, the test run instruction includes a first signal value and a target signal type, the tester includes multiple test boards, the test boards are used to generate communication signals of corresponding signal types, and the tester controls the operation of the simulation board according to the test run instruction, including: the tester determines the target board from multiple test boards, and the signal type corresponding to the target board includes the target signal type; if the target signal type is a constant value signal, the tester controls the target board to generate a second communication signal according to the first signal value; the tester sends the second communication signal to the adapter board; the adapter board receives the second communication signal and converts the second communication signal into a corresponding second electronic signal; the adapter board sends the second electronic signal to the simulation board; the simulation board receives the second electronic signal and operates according to the instruction of the second electronic signal.

[0081] Specifically, in the embodiment of the present application, in order to control the operation of the simulation board, the tester needs to send the electronic signal corresponding to the test running instruction to the simulation board. To this end, the tester generates a corresponding second communication signal through the target board according to the first signal value and the target signal type included in the running test instruction, and then converts the second communication signal into a corresponding second electronic signal through the adapter board. Finally, the adapter board sends the second electronic signal to the simulation board, so that the simulation board runs according to the instructions of the second electronic signal.

[0082] Exemplarily, if the test run instruction is "a power outage occurred during charging", then in order to make the simulation board operate according to "a power outage occurred during charging", it is necessary to send a "power off signal" to the simulation board. The tester generates a second communication signal based on the first signal value and the target signal type in the test run instruction, and then sends the second communication signal to the adapter board. The adapter board converts the second communication signal into a second electronic signal. The second electronic signal here is the "power off signal". After the second electronic signal is sent from the adapter board to the simulation board, the simulation board can operate according to the "a power outage occurred during charging" indicated by the test run instruction.

[0083] The target signal types include constant value signals and non-constant value signals, wherein a constant value signal is a signal whose value does not change. A non-constant value signal refers to a signal whose value fluctuates, changes periodically, or suddenly. For example, an AC current signal, a pulse voltage signal, an alarm signal, etc.

[0084] The tester includes a plurality of test boards, each of which is used to generate a communication signal of a corresponding type, and each of which corresponds to one or more signal types. If the target signal type is a constant value signal, the tester directly controls the target board of the corresponding signal type according to the first signal value to obtain the corresponding second communication signal.

[0085] For example, see Figure 5 , Figure 5A schematic diagram of the configuration of a test board provided by an embodiment of the present application. Among them, four different test boards are configured in the tester. The first test board is used to generate a power input signal, the second test board is used to generate an IO signal, the third test board is used to generate a voltage signal, and the fourth test board is used to generate a resistance signal. Each test board can also generate one or more independent signals. For example, the first test board can generate multiple independent power input signals to simultaneously input multiple power input signals to a charging device, or separately input power input signals to multiple charging devices at the same time.

[0086] If the signal type in the test operation instruction here is an IO signal, the second test board here is the target board. The tester generates a second communication signal according to the first signal value and the target board, that is, inputs the first signal value into the second test board (target board) to generate the second communication signal here.

[0087] In a possible embodiment, if the target signal type is a non-constant numerical signal, after the tester determines the target board from multiple test boards, the method further includes: the tester generates a second signal value according to the first signal value, and the absolute value of the difference between the second signal value and the first signal value is not greater than a preset difference; the tester controls the target board to generate a second communication signal corresponding to the test operation instruction according to the second signal value; the tester sends the second communication signal to the adapter board; the adapter board receives the second communication signal and converts the second communication signal into a corresponding second electronic signal; the adapter board sends the second electronic signal to the simulation board; the simulation board receives the second electronic signal and operates according to the indication of the second electronic signal.

[0088] Specifically, since non-constant numerical signals (such as voltage signals or current signals) may have small fluctuations in value due to various reasons (for example, the actual instantaneous value of a constant current voltage of 12V may be slightly greater than or slightly less than 12V), in the embodiment of the present application, the tester will simulate small fluctuations in the real circuit environment through the following method to generate a corresponding second signal value.

[0089] The tester generates a second signal value based on the first signal value, and the absolute value of the difference between the second signal value and the first signal value is not greater than a preset difference. Here, the tester specifically calculates the ratio and / or offset of the first signal value through a preset corresponding relationship or a preset algorithm, and then calculates the corresponding second signal value according to the first signal value and the corresponding ratio and / or offset.

[0090] Exemplarily, if the first signal value is 12V, on the premise that the preset difference is 0.5V, the corresponding second signal value can be 12.5V, 11.5V and other values.

[0091] After obtaining the corresponding second signal value, the tester controls the target board to generate a corresponding second communication signal according to the second signal value, so that the adapter board converts the second communication signal into a corresponding second electronic signal and inputs it to the analog board.

[0092] In a possible embodiment, the tester controls the target board to generate a second communication signal corresponding to the test run instruction according to the second signal value, and further includes: the tester generates a third signal value according to the first signal value and the second signal value, and the absolute value of the difference between the average value of the third signal value and the second signal value minus the first signal value is not greater than a preset difference; the tester controls the target board to generate a second communication signal corresponding to the test run instruction according to the third signal value.

[0093] Specifically, in the embodiment of the present application, after the tester generates a second communication signal according to the second signal value and the target board, the tester also generates a third signal value according to the first signal value and the second signal value, so as to be able to change the signal value of the second communication signal multiple times to further simulate the signal instability characteristic of a non-constant value signal.

[0094] Exemplarily, if the first signal value here is a 12V signal and the signal type is a voltage signal, the specific value of the second signal value generated by the tester based on the first signal value may be 11.5V. The tester generates a second communication signal according to 11.5V. After a preset time, the tester generates a new third signal value: 12.2V according to the first signal value (12V) and the second signal value (11.5V). The absolute value of the difference between the average value of the third signal value and the second signal value minus the first signal value is not greater than the preset difference, and then the third signal value is sent to the target board to change the signal value of the second communication signal sent to the adapter board to the third signal value.

[0095] Furthermore, the tester also generates a new third signal value and a new second communication signal at a preset interval to simulate the fluctuation change of the value of the second communication signal at the preset interval.

[0096] If the signal type here is an alternating voltage signal, the target board also includes a Field Programmable Gate Array (FPGA) program, so that the target board can output a second communication signal of the alternating voltage signal type based on the first signal value (including voltage value, offset, phase and frequency, etc.).

[0097] It can be seen that in the embodiment of the present application, the tester generates signal values such as a second signal value and a third signal value through a first signal value, and then controls the target board to generate a corresponding second communication signal according to the second signal value and the third signal value, so that the second electronic signal finally input to the analog board can simulate the numerical fluctuation of the real signal, further improving the credibility of the detection result.

[0098] In a possible embodiment, the tester further includes a display panel, and the display panel is used to display the signal values of the first communication signal and the second communication signal.

[0099] Specifically, the display panel here is used to display the signal values of the signals generated by the input analog board and the analog board during operation, such as the voltage value of the voltage signal, the resistance value of the resistance signal, etc.

[0100] During the actual test process, the tester will send multiple second communication signals to the adapter board to send the second electronic signals corresponding to the multiple second communication signals and receive multiple first communication signals. Therefore, the real-time signal values of various first communication signals and second communication signals are displayed through this display panel to help the tester perform test-related operations.

[0101] Exemplarily, please refer to Figure 6 , Figure 6 is a schematic diagram of a display panel provided by the embodiment of the present application. In the Figure 6 display panel shown, signal values of various different types are displayed, including KL30 voltage, CP frequency, CP duty cycle, constant current resistance, DC AC voltage, OBC voltage, OBC current, DCDC voltage, DCDC current, charging temperature Charging Temp voltage, electronic lock Elcok mode, relay QC voltage, and LED indicator signal. Based on the type, model of the charging device, and different test schemes, the display panel may display more or fewer signal values, which will not be elaborated here.

[0102] Taking the KL30 signal as an example, the KL30 here is an electrical interface signal, usually used to indicate the state of certain currents or voltages in the electrical system. The signal values of the KL30 signal include voltage value, average voltage value, and average current value. The key is specifically a physical key or a virtual key. Relevant testers or users can change the voltage value based on this key, so as to generate corresponding test operation instructions. It can be seen that if the rated voltage value of the KL30 signal is changed to 12V through the key, the first signal value in the corresponding test operation instruction is 12V, and the corresponding signal type is the KL30 voltage signal.

[0103] The LED signals here include LED1 and LED2. LED1 and LED2 respectively correspond to a real LED indicator on the analog board. Among them, the indicator corresponding to LED1 is in the on state at this time, and the indicator corresponding to LED2 is in the off state at this time.

[0104] Further, please refer to Figure 7 , Figure 7 which is a schematic diagram of the control logic of a tester provided by an embodiment of the present application. It includes a system variable library for recording signal values of various signal types, and a display panel is also used to display the signal values stored in the system variable library. When relevant testers generate corresponding test operation instructions through the Figure 6 keys or indicators shown and interact with the display panel, or after the test nodes here generate test operation instructions based on the method for automatically generating test operation instructions provided by the foregoing embodiments of the application, the display panel or the test nodes change the corresponding signal values in the system variable library. This change is further detected by the simulation node based on a running script (such as a Control script), and then through the control module, the Run-Time Environment Module (RTE) module controls the hardware operation in the tester, so that the tester generates a corresponding second communication signal, thereby changing the signals in the analog board.

[0105] S403: The analog board generates a first electronic signal and sends the first electronic signal to the adapter board. The first electronic signal is used to represent the test result of the charging device.

[0106] S404: The adapter board receives the first electronic signal and converts the first electronic signal into a corresponding first communication signal.

[0107] S405: The adapter board sends the first communication signal to the tester.

[0108] S406: The tester receives the first communication signal and determines the test result of the charging device according to the first communication signal.

[0109] For the detailed description of steps S403 - S406, please refer to the relevant content of steps S201 - S204, which will not be elaborated here.

[0110] The foregoing embodiments of the application describe a test method for a charging device in which a corresponding first electrical signal is generated by an analog board based on a test operation instruction of a tester. In addition, an embodiment of the present application also provides a test method for a charging device in which an adapter board includes an environmental simulation circuit. The adapter board includes an environmental simulation circuit, and the environmental simulation circuit is used to simulate the external circuit environment when the charging device is in the charging mode or the discharging mode.

[0111] Specifically, in the embodiments of the present application, the environmental simulation circuit in the adapter board can simulate the corresponding external circuit environment based on the current operating state of the test board (including the charging mode and the discharging mode), so that the simulation board can be tested in a real external circuit environment.

[0112] The charging mode of the charging device refers to that the charging device is charged through an external power source. Taking the charging device of a new energy vehicle as an example, the charging mode here specifically refers to that the new energy vehicle is charged through a charging pile. For the simulation board, the simulation board is charged through the charging pile simulated by the environmental simulation circuit to realize the test of the simulation board in the charging mode.

[0113] The discharging mode refers to that the charging device discharges to an external device to charge other devices. Similarly, taking the charging device of a new energy vehicle as an example, the discharging mode here is to discharge to other vehicles to charge other vehicles, that is, V2V charging (Vehicle-to-Vehicle Charging). For the simulation board, the simulation board discharges through other vehicles simulated by the environmental simulation circuit to realize the test of the simulation board in the discharging mode.

[0114] Further, the environmental simulation circuit switches different operating modes through the indication signal sent by the tester (the indication signal here is also generated by the corresponding test board card), so as to affect the first electronic signal through the environmental simulation circuit before converting the first electronic signal into the first communication signal, so as to further simulate the real operating environment.

[0115] Exemplarily, please refer to Figure 8 , Figure 8 FIG. is a schematic structural diagram of an environmental simulation circuit provided by an embodiment of the present application, where the environmental simulation circuit is used to simulate the external transmission environment of a control pilot function (CP) signal. The environmental simulation circuit includes a first resistor R1, a second resistor R2, a third resistor R3, a first relay Relay1, a second relay Relay2, and a third relay Relay3. The first port of the first resistor R1 is connected to the tester, and the second port of the first resistor R1 is connected to the first port of the first relay Relay1; the second port of the first relay Relay1 is connected to the first port of the second resistor R2 and the first port of the third resistor R3, and the third port of the first relay Relay1 is connected to the first port of the second relay Relay2; the second port of the second relay Relay2 is connected to the simulation board; the second port of the second resistor R2 is connected to the first port of the third relay Relay3, and the second port of the third relay Relay3 is grounded through the second port of the third resistor R3.

[0116] Among them, the resistance value of the first resistor is 1 KΩ, the resistance value of the second resistor is 1.5 KΩ, and the resistance value of the third resistor is 3 KΩ.

[0117] In the charging mode, the first end and the third port of the first relay are conducted, and the second relay is closed. The second communication signal (specifically a CP signal) generated by the tester is converted into a corresponding second electronic signal after being input into the adapter board, and then input into the environment simulation circuit from the CP1 interface and then into the simulation board from the CP interface, so as to simulate the real external circuit environment in which an external power supply (such as a charging pile) sends a CP signal to the simulation board.

[0118] Furthermore, the second electronic signal here also outputs from the environment simulation circuit through the CP_Measure interface here and then is converted into a corresponding communication signal and input into the tester, so that the tester can determine specific information such as the specific value of the second electronic signal here and the time when it is input into the simulation board.

[0119] In the discharging mode, the second end and the third port of the first relay are conducted, the second relay is closed, and the third relay is used to adjust the resistance value of the environment simulation circuit. The first electronic signal generated by the simulation board is input into the ground wire through the CP interface, the second relay and R3, R2, thus simulating the real external circuit environment in which the simulation board sends a CP signal to other devices in the discharging mode. Among them, the second electronic signal outputs from the environment simulation circuit through the CP_Measure interface here and then is converted into a corresponding communication signal and input into the tester, so that the tester can determine specific information such as the specific value of the first electronic signal here and the time when it outputs from the simulation board.

[0120] It can be seen that in the embodiment of the present application, through different connection modes in the environment simulation circuit, the external circuit environment of the corresponding charging device of the simulation board in various operating states such as charging and discharging can be simulated, further improving the authenticity of the first communication signal, and thus improving the credibility of the test results. The tester automatically generates a test operation instruction according to the device function of the charging device to test the simulation board, realizing the test automation of the charging device.

[0121] Through the method in the above application embodiment, it can be seen that the tester tests the charging device by obtaining the first communication signal generated by the adapter board according to the first electrical signal of the simulation board, reducing the complexity of the test process of the charging device and improving the test efficiency of the charging device. Various operating parameters of the simulation board during the test process are determined based on real fault events, improving the credibility of the test results. The second signal value and the third signal value are generated according to the first signal value, and further enabling the second electronic signal input into the simulation board to simulate the numerical fluctuation of the real signal, further improving the credibility of the detection results.

[0122] Based on the description of the above method embodiment, please refer toFigure 9 , Figure 9 is a schematic structural diagram of an electronic device provided by an embodiment of the present application. Figure 9 The illustrated electronic device 900 (the electronic device 900 may specifically be a computer device, such as Figure 1 the illustrated tester 101, adapter board 102, or simulation board 103) includes a processor 901, a memory 902, an interface 903 (the interface 903 may specifically be a Figure 1 illustrated first interface or second interface), and a bus 904. Among them, the memory 901, the processor 902, and the interface 903 are communicatively connected to each other through the bus 904.

[0123] The processor 901 may be a general-purpose central processing unit (CPU), a microprocessor, an application-specific integrated circuit (ASIC), a graphics processing unit (GPU), or one or more integrated circuits, and is used to execute relevant programs to implement the functions required to be executed by the units in the electronic device 900 in the embodiments of the present application, or to execute the test method of the charging device in the method embodiments of the present application.

[0124] The processor 901 can also be an integrated circuit chip with the ability to process signals. In the implementation process, each step of the test method for the charging device of the present application can be completed by the integrated logic circuit in the hardware of the processor 901 or the instructions in the form of software. The above-mentioned processor 901 can also be a general-purpose processor, a digital signal processor (DSP), an application-specific integrated circuit (ASIC), a field programmable gate array (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components. It can implement or execute the various methods, steps, and logic block diagrams disclosed in the embodiments of the present application. The general-purpose processor can be a microprocessor or the processor can also be any conventional processor, etc. The steps of the method disclosed in combination with the embodiments of the present application can be directly embodied as being executed by the hardware decoding processor, or executed by the combination of the hardware and software modules in the decoding processor. The software module can be located in a mature storage medium in the art such as a random access memory, a flash memory, a read-only memory, a programmable read-only memory, or an electrically erasable programmable memory, a register, etc. This storage medium is located in the memory 902, and the processor 901 reads the information in the memory 902 and combines its hardware to complete the functions required to be executed by the units included in the electronic device 900 in the embodiments of the present application, or execute the test method for the charging device in the method embodiments of the present application.

[0125] The memory 902 can be a read-only memory (ROM), a static storage device, a dynamic storage device, or a random access memory (RAM).

[0126] The memory 902 can store a program. When the program stored in the memory 901 is executed by the processor 902, the processor 901 and the interface 903 are used to execute each step of the test method for the charging device in the embodiments of the present application.

[0127] The interface 903 uses a transceiver device such as, but not limited to, a transceiver to implement the communication between the electronic device 900 and other devices or communication networks. For example, data can be obtained through the interface 903.

[0128] The bus 904 can include a path for transmitting information between various components of the electronic device 900 (for example, the processor 901, the memory 902, the interface 903).

[0129] It should be noted that although Figure 9The illustrated electronic device 900 only shows a memory, a processor, and an interface. However, in the specific implementation process, those skilled in the art should understand that the electronic device 900 also includes other components necessary for normal operation. At the same time, according to specific needs, those skilled in the art should understand that the electronic device 900 may also include hardware components for implementing other additional functions. In addition, those skilled in the art should understand that the electronic device 900 may also only include the components necessary for implementing the embodiments of the present application, and does not necessarily include Figure 9 all the components shown in

[0130] Embodiments of the present application also provide a chip, which includes a processor and a data interface. The processor reads instructions stored on a memory through the data interface to implement the test method of the charging device.

[0131] Optionally, as an implementation, the chip may further include a memory, and instructions are stored in the memory. The processor is configured to execute the instructions stored on the memory. When the instructions are executed, the processor is used to execute the test method of the charging device.

[0132] Embodiments of the present application also provide a computer-readable storage medium, in which instructions are stored. When it runs on a computer or a processor, it causes the computer or the processor to execute one or more steps in any of the above methods.

[0133] Embodiments of the present application also provide a computer program product containing instructions. When the computer program product runs on a computer or a processor, it causes the computer or the processor to execute one or more steps in any of the above methods.

[0134] As described above, the above are only the specific implementation manners of the embodiments of the present application, but the protection scope of the embodiments of the present application is not limited thereto. Any changes or substitutions within the technical scope disclosed in the embodiments of the present application should be covered by the protection scope of the embodiments of the present application. Therefore, the protection scope of the embodiments of the present application should be subject to the protection scope of the claims.

[0135] The device embodiments described above are only illustrative. The units and modules described as separate components may or may not be physically separated. In addition, some or all of the units and modules can be selected according to actual needs to achieve the purpose of the solution of this embodiment. Those of ordinary skill in the art can understand and implement it without creative work.

[0136] The above are only specific embodiments of the present application. It should be noted that for those of ordinary skill in the art, without departing from the principle of the present application, several improvements and refinements can be made, and these improvements and refinements should also be regarded as the protection scope of the present application.

Claims

1. A method for testing a charging device, characterized in that, Applied to a charging device test system, the charging device test system includes a tester, a transfer board, and an analog board of the charging device. The tester is connected to the transfer board, and a first interface of the transfer board is connected to a second interface of the analog board. The method includes: The analog board generates a first electronic signal and sends the first electronic signal to the transfer board. The first electronic signal is used to represent the test result of the charging device. The transfer board receives the first electronic signal and converts the first electronic signal into a corresponding first communication signal. The transfer board sends the first communication signal to the tester. The tester receives the first communication signal and determines the test result of the charging device according to the first communication signal.

2. The method according to claim 1, wherein Before the analog board generates the first electronic signal, the method further includes: The tester generates a test operation instruction corresponding to the charging device. The tester controls the operation of the analog board according to the test operation instruction.

3. The method according to claim 2, wherein The tester generates a test operation instruction corresponding to the charging device, including: The tester generates a test operation instruction according to the function of the charging device. The functions of the device include at least one of a hardware basic function, a protocol compatibility function, or a fault protection function.

4. The method according to claim 3, wherein The tester generates a test operation instruction according to the function of the charging device, including: The tester determines a target fault event from multiple preset fault events. The preset fault events include multiple non-exclusive charging device fault events. The charging device fault events included in the target fault event respectively correspond to a fault protection function in the device functions of the charging device. The tester generates a test operation instruction according to the target fault event. The test operation instruction includes a fault protection function test for multiple fault events included in the target fault event.

5. The method according to claim 2, characterized in that, The test operation instruction includes a first signal value and a target signal type. The tester includes multiple test boards. The test boards are used to generate communication signals of corresponding signal types. The tester controls the operation of the analog board according to the test operation instruction, including: The tester determines a target board from the multiple test boards. The signal type corresponding to the target board includes the target signal type. If the target signal type is a constant value signal, the tester controls the target board to generate a second communication signal according to the first signal value. The tester sends the second communication signal to the transfer board. The transfer board receives the second communication signal and converts the second communication signal into a corresponding second electronic signal. The transfer board sends the second electronic signal to the analog board. The analog board receives the second electronic signal and operates according to the indication of the second electronic signal.

6. The method according to claim 5, characterized in that, If the target signal type is a non-constant value signal, after the tester determines the target board from the multiple test boards, the method further includes: The tester generates a second signal value according to the first signal value, and the absolute value of the difference between the second signal value and the first signal value is not greater than a preset difference; The tester controls the target board to generate a second communication signal corresponding to the test operation instruction according to the second signal value; The tester sends the second communication signal to the adapter board; The adapter board receives the second communication signal and converts the second communication signal into a corresponding second electronic signal; The adapter board sends the second electronic signal to the analog board; The analog board receives the second electronic signal and operates according to the indication of the second electronic signal.

7. The method according to claim 6, characterized in that, The tester controls the target board to generate a second communication signal corresponding to the test operation instruction according to the second signal value, and further includes: The tester generates a third signal value according to the first signal value and the second signal value, and the absolute value of the difference between the average value of the third signal value and the second signal value minus the first signal value is not greater than the preset difference; The tester controls the target board to generate a second communication signal corresponding to the test operation instruction according to the third signal value.

8. The method according to any one of claims 1 to 7, characterized in that The adapter board includes an environment simulation circuit, and the environment simulation circuit is used to simulate the external circuit environment when the charging device is in the charging mode or the discharging mode.

9. An electronic device, characterized in that, It includes a processor, a memory, an interface, and one or more programs. The one or more programs are stored in the memory and are configured to be executed by the processor. The programs include instructions for performing the steps in the method according to any one of claims 1-8.

10. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a computer program for electronic data exchange, wherein the computer program causes the processor to execute the method according to any one of claims 1-8.

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