Solar cell testing device, solar cell and photovoltaic module

Abstract

The invention provides a solar cell testing device which comprises a testing circuit board, one side of the testing circuit board is provided with a plurality of probes, and the plurality of probes are arranged to be a plurality of first probe rows and a plurality of second probe rows which are arranged along a first direction. Wherein the first probe row and the second probe row are alternately distributed in the second direction, the distance between the first probe row or the second probe row and the adjacent probe rows on the two sides is not equal, the first probe row and the second probe row are used for testing collector grid lines of solar cells with different polarities, and the first direction intersects with the second direction. According to the testing device disclosed by the invention, the plurality of rows of probe rows are arranged on the testing circuit board at unequal intervals, so that the probes can avoid the position, lower than the collector grid line, of the confluence part in the process of testing the solar cell, and the testing precision is improved.

Description

Technical Field

[0001] The present disclosure relates to the technical field of solar cell testing, and in particular, to a solar cell testing device, a solar cell, and a photovoltaic module. Background Art

[0002] Solar cell testing is an important link for evaluating the performance and quality of solar cells, mainly involving measuring characteristic parameters such as open-circuit voltage, short-circuit current, maximum output power, and fill factor, so as to evaluate performance characteristics such as its energy conversion efficiency and stability.

[0003] During the current process of testing the EL and IV of cell wafers, the pads on the surface of the test circuit board are in contact and conduct with the busbar part on the cell wafer. This layout of the pads on the test circuit board is more suitable for the case where the busbar part on the cell wafer surface is located above the collector grid line. For the case where the busbar part is located below the collector grid line, the test accuracy will be reduced. Summary of the Invention

[0004] In view of the above problems, embodiments of the present disclosure provide a solar cell testing device, a solar cell, and a photovoltaic module.

[0005] One aspect of the present disclosure provides a solar cell testing device, including: a test circuit board, on one side of the test circuit board, a plurality of probes are provided, and the plurality of probes are provided as a plurality of first probe rows and a plurality of second probe rows that are all arranged along a first direction. Among them, the first probe rows and the second probe rows are alternately distributed along a second direction, and the distance between the first probe row or the second probe row and the adjacent probe rows on both sides is not equal. The first probe rows and the second probe rows are used to test the collector grid lines of solar cells with different polarities, and the first direction intersects with the second direction.

[0006] According to an embodiment of the present disclosure, the distance between the first probe row or the second probe row and the adjacent probe row on the relative first side is a first distance, and the distance between the first probe row or the second probe row and the adjacent probe row on the relative second side is a second distance. Among them, the relative first side and the relative second side are the relative sides with respect to the first probe row or the second probe row. The second distance is greater than the first distance.

[0007] According to an embodiment of the present disclosure, at least one of the first probe rows and the second probe rows includes a first part and a second part where the probes are continuously distributed, and the first part includes edge probes. Among them, at least one first part in each column is not collinear with the second part, and the distance along the second direction of the first part that is not collinear with the second part is equal.

[0008] According to an embodiment of the present disclosure, the distance along the second direction between the second part and the non-collinear first part is greater than or equal to 0.8 mm.

[0009] According to an embodiment of the present disclosure, at least one avoidance groove extending in a first direction is further provided on one side of the test circuit board, and the avoidance groove is provided between probe rows with a larger pitch.

[0010] According to an embodiment of the present disclosure, the solar cell testing device further includes: a dividing plate for adsorbing and fixing the solar cell. Wherein, the projection of the dividing plate and the avoidance groove overlap in the thickness direction of the test circuit board.

[0011] According to an embodiment of the present disclosure, at least one row of adsorption holes extending in the first direction is further provided on one side of the test circuit board, and the adsorption holes are provided between probe rows with a first pitch.

[0012] According to an embodiment of the present disclosure, the test circuit board includes a first region and a second region, and a plurality of probes are arranged in the first region. Wherein, when the second region contacts the solar cell, the solar cell completely covers the first region, and the first region does not contact the solar cell.

[0013] Another aspect of the present disclosure provides a solar cell, including: a semiconductor substrate. A plurality of collector grid lines arranged on one side of the semiconductor substrate and extending in a second direction. Wherein, at least part of the collector grid lines are electrically connected to multiple rows of current collecting parts and test points arranged in a first direction, the current collecting parts are used for collecting and transmitting current to an external circuit, and the test points are used for contacting the probes when testing the solar cell. The collector grid lines include first collector grid lines and second collector grid lines with different polarities, the test points corresponding to the first collector grid lines and the second collector grid lines are the first test points and the second test points respectively, the first test points and the second test points are alternately distributed in the second direction, and the distance between the first test point or the second test point and the adjacent test points on both sides is not equal, and the first direction intersects the second direction.

[0014] Another aspect of the present disclosure provides a photovoltaic module, including: a solar cell, and a plurality of solar cells are electrically connected to form a battery string. A packaging layer for covering the surfaces of the plurality of solar cells. A cover plate for covering the surface of the packaging layer facing away from the plurality of solar cells.

[0015] By describing the embodiments of the present disclosure with reference to the following drawings, the above content and other objects, features and advantages of the present disclosure will become clearer. In the drawings: BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Through the following description of the embodiments of the present disclosure with reference to the accompanying drawings, the above content and other objects, features and advantages of the present disclosure will become clearer. In the drawings:

[0017] Figure 1 Schematically shows the distribution diagram of the test points of the probe row of the solar cell test device according to an embodiment of the present disclosure on the solar cell;

[0018] Figure 2 Schematically shows the relative position diagram of the avoidance groove of the solar cell test device according to an embodiment of the present disclosure on the solar cell;

[0019] Figure 3 Schematically shows the relative position diagram of the adsorption hole of the solar cell test device according to an embodiment of the present disclosure on the solar cell;

[0020] Figure 4 Schematically shows the depression position diagram when the solar cell test device according to an embodiment of the present disclosure is attached to the solar cell.

[0021]

Description of the Reference Numerals

[0022] 1 - Collector grid line; 2 - Busbar part; 3 - Square solid figure; 4 - First circular solid figure; 5 - Blank area; 6 - Second circular solid figure; 7 - White area; 8 - Black area. Detailed Embodiment

[0023] To make the purpose, technical solutions and advantages of the present disclosure clearer and more understandable, the following further elaborates on the present disclosure in detail with reference to specific embodiments and the accompanying drawings.

[0024] It should be noted that in the description of the drawings or the specification, similar or identical parts are all denoted by the same reference numerals. The technical features in each of the embodiments exemplified in the specification can be freely combined to form a new solution on the premise of no conflict. In addition, each claim can be regarded as an independent embodiment, or the technical features in each claim can be combined to form a new embodiment. Moreover, in the drawings, the shape or thickness of the embodiment can be enlarged, and it is simplified or conveniently marked. Furthermore, the elements or implementation manners not depicted or described in the drawings are in the forms known to those of ordinary skill in the art. In addition, although this document may provide examples containing parameters with specific values, it should be understood that the parameters do not necessarily exactly equal the corresponding values, but can be approximated to the corresponding values within an acceptable error tolerance or design constraints.

[0025] Unless there are technical obstacles or contradictions, the above various embodiments of the present disclosure can be freely combined to form additional embodiments, and these additional embodiments are all within the protection scope of the present disclosure.

[0026] Although the present disclosure has been described with reference to the accompanying drawings, the embodiments disclosed in the drawings are intended to exemplify the embodiments of the present disclosure and should not be construed as a limitation on the present disclosure. The dimensional ratios in the drawings are merely illustrative and should not be construed as a limitation on the present disclosure.

[0027] Although some embodiments of the general concept of the present disclosure have been shown and described, those of ordinary skill in the art will understand that changes may be made to these embodiments without departing from the principles and spirit of the general concept of the present disclosure, and the scope of the present disclosure is defined by the claims and their equivalents.

[0028] Figure 1 Schematically shown is a distribution diagram of test points of a probe row of a solar cell test device according to an embodiment of the present disclosure on a solar cell.

[0029] According to an embodiment of the present disclosure, as Figure 1 shown, the present disclosure provides a solar cell test device, including: a test circuit board, on one side of which a plurality of probes are provided, and the plurality of probes are provided as a plurality of first probe rows and a plurality of second probe rows that are all arranged along a first direction y. Among them, the first probe rows and the second probe rows are alternately distributed along a second direction x, and the distance between a first probe row or a second probe row and the adjacent probe rows on both sides is not equal. The first probe rows and the second probe rows are used to test the collector grid lines 1 of solar cells with different polarities, and the first direction y intersects with the second direction x.

[0030] In some embodiments, the test circuit board is, for example, rectangular, with a size that can be 200 mm * 150 mm, made of FR-4 material, and the surface is gold-plated to improve conductivity.

[0031] On one side of the test circuit board, a plurality of probes are provided. The diameter of the probes is, for example, 0.6 mm, the length is 10 mm, the material is beryllium copper alloy, and the surface is gold-plated.

[0032] The probe arrangement includes a plurality of first probe rows and a plurality of second probe rows, all arranged along a first direction (y-axis).

[0033] The first probe rows and the second probe rows are alternately distributed along a second direction (x-axis), and the distance between a first probe row and the adjacent second probe row is not the same as the distance between this second probe row and the adjacent other first probe row.

[0034] Generally, the distance between the current collecting parts 2 of the battery is equal, and currently, probe rows with the same distance are mostly used to test the current collecting parts 2 (main grid, pad or thickened section of the collector grid line). Therefore, when the collector grid line (fine grid) is disconnected at the current collecting part 2, it may cause the probe to be suspended, thereby reducing the test accuracy.

[0035] By setting the unequal spacing between adjacent probe rows, each probe row can be offset relative to the bus bar 2 to test the collector grid lines near the bus bar 2, which increases the probability of the probe row being pressed onto the collector grid line during the test and eliminates the problem of poor contact caused by pressing onto the hollowed-out area.

[0036] For example, the first probe row is used to test the first collector grid line of the solar cell, and the second probe row is used to test the second collector grid line. Each probe row can contain 50 to 60 probes, and the spacing between the probes within each row is 1 mm.

[0037] It can be understood that during the test, the number of probes in each row can correspond to the number of collector grid lines of the solar cell being tested. For a back-contact solar cell, the first probe row and the second probe row can be appropriately misaligned along the first direction y to respectively achieve the test of the first collector grid line and the second collector grid line. The polarities of the first collector grid line and the second collector grid line are opposite. For example, the first collector grid line is the positive electrode, the second collector grid line is the negative electrode, or the first collector grid line is the negative electrode, and the second collector grid line is the positive electrode.

[0038] For example, the first direction (y-axis) is perpendicular to the second direction (x-axis) to form a rectangular coordinate system, which is convenient for precise positioning and testing.

[0039] Place or adsorb the solar cell on the test circuit board to ensure that the collector grid lines are aligned with the probes. Through the probe rows on the test circuit board, the electrical properties of the positive and negative collector grid lines are respectively tested, such as the open-circuit voltage, short-circuit current, etc.

[0040] During the test, the probes on the test circuit board are in contact with the collector grid lines of the cell Figure 1 The probes in the y direction are uniformly arranged in an array corresponding one-to-one with the collector grid lines. The positive test probes are in contact with the positive collector grid lines, and the negative test probes are in contact with the negative collector grid lines. The number of rows of collector grid lines in the y direction corresponds one-to-one with the number of rows of test probes. Figure 1 The probe rows in the x direction are arranged at unequal intervals, and the number of columns of the probes on the test circuit board that can match the 18BB (main grid) cell is also set to 18 columns. Since the probes on the test circuit board contact the collector grid lines of the cell rather than the bus bar 2, it does not necessarily have to be an 18BB arrangement corresponding one-to-one with the bus bar 2. At the same time, in order to improve the test accuracy, the arrangement can be made in 18 columns or an increased number of columns in the x direction according to the test needs. The more test points there are, the higher the test accuracy.

[0041] Exemplarily, the more the test points are arranged, the higher the test accuracy. When the number of test points increases to the limit and forms a straight line, the square test pads come into contact with the collector grid lines, that is, the contact area is maximized at all positions of the collector grid lines except at the current collecting part 2, and the test accuracy is optimized, ensuring that there are test pads at the collector grid lines to detect and collect current.

[0042] This embodiment provides a specific solar cell testing device. Through the first probe row and the second probe row that are alternately distributed and have unequal spacings, it can effectively test collector grid lines of different polarities. This design improves the test accuracy and efficiency and is suitable for rapid detection in large-scale production.

[0043] According to an embodiment of the present disclosure, the spacing between the first probe row or the second probe row and the adjacent probe row on the relative first side is the first spacing, and the spacing between the first probe row or the second probe row and the adjacent probe row on the relative second side is the second spacing. Herein, the relative first side and the relative second side are the relative sides with respect to the first probe row or the second probe row. The second spacing is greater than the first spacing.

[0044] In some embodiments, the probe rows for testing collector grid lines of different polarities can be offset relative to the current collecting part. Among them, the probe rows for testing collector grid lines of the same polarity have the same offset direction relative to the current collecting part, and are opposite to the offset direction of the probe rows for testing collector grid lines of different polarities relative to the current collecting part.

[0045] For example, the first probe row is used to test the collector grid lines of the first polarity and is all offset to the left relative to the current collecting part, while the second probe row is used to test the collector grid lines of the second polarity and is all offset to the right relative to the current collecting part. Furthermore, a layout can be formed where there are two rows of probe rows between adjacent column current collecting parts and no probe rows between adjacent column current collecting parts.

[0046] Exemplarily, the range of the first spacing between the first probe row and the second probe row on one side is greater than or equal to 7 mm and less than or equal to 12 mm, such as 7 mm, 7.5 mm, 8 mm, 8.7 mm, 9 mm, 9.5 mm, 10.33 mm or any value between any two of the above. The range of the second spacing between the first polarity probe row and the second probe row on the other side is greater than or equal to 10 mm and less than or equal to 15 mm, such as 10 mm, 11 mm, 12 mm, 13 mm, 14 mm, 15 mm or any value between any two of the above.

[0047] It can be understood that according to different test requirements, in other embodiments, the offset directions of some probe rows for testing collector grid lines of the same polarity relative to the current collecting part can also be different, or can be the same as the offset directions of some probe rows for testing collector grid lines of different polarities relative to the current collecting part.

[0048] In this embodiment, by controlling the offset direction of the probe row relative to the bus bar portion, the spacing between different rows of probes can be flexibly controlled, which is applicable to solar cells with different gate line layouts.

[0049] According to an embodiment of the present disclosure, at least one of the first probe row and the second probe row includes a first portion and a second portion where the probes are continuously distributed, and the first portion includes edge probes. Among them, at least one first portion of each column is non-collinear with the second portion, and the spacing of the first portions non-collinear with the second portion in the second direction is equal.

[0050] In some embodiments, for example, for a solar cell provided with end lines, the probe row for testing the bus bar portion of the same column can be divided into two parts, that is, a first part for testing the edge region near the cell and a second part for testing the central region far from the cell edge. As Figure 1 shown, the test points of the solar cell corresponding to the probes in the first part are square solid figures 3, and the test points of the solar cell corresponding to the probes in the second part are first circular solid figures 4.

[0051] The probes in the second part are offset relative to the bus bar portion to ensure their close contact with the collector grid lines, which can improve the test accuracy. Since the edge region of the cell is provided with end lines, that is, grid lines connecting multiple collector grid lines of the same polarity arranged along the extension direction of the bus bar portion of this column, the probes in the first part can directly contact the end lines, which is equivalent to the above-mentioned close contact with the collector grid lines. At the same time, since the spacing between adjacent end lines is the same as the spacing between adjacent main grids, the spacing between the first part probes in adjacent columns is also the same, which helps to improve the force uniformity during the test of the edge region of the solar cell and reduce the possible damage to the cell caused by the test.

[0052] The test process includes, for example: placing the solar cell on the test circuit board to ensure that the first collector grid line and the second collector grid line are aligned with the corresponding probe rows. Testing the first end line in the edge region of the cell through the first part (including edge probes) of the first probe row. Testing the first collector grid line in the central region of the cell through the second part (middle probes) of the first probe row. Testing the second end line in the edge region of the cell through the first part (including edge probes) of the second probe row. Testing the second collector grid line in the central region of the cell through the second part (middle probes) of the second probe row.

[0053] It can be understood that in other embodiments, the probes in the first part can also be collinear with the probes in the second part, that is, both generate an offset relative to the bus bar portion, which is convenient for improving the versatility of the solar cell test device.

[0054] In this embodiment, by setting the probe rows in the edge region of the solar cell to be non - collinear with the probe rows in the central region, the test stability of the edge region is improved while ensuring the test accuracy.

[0055] According to an embodiment of the present disclosure, the distance between the second part and the non - collinear first part in the second direction is greater than or equal to 0.8 mm.

[0056] In some embodiments, the first part includes edge probes for testing the collector grid lines in the edge region of the battery. The second part includes intermediate probes for testing the collector grid lines in the central region of the battery.

[0057] At least one first part in each column is non - collinear with the second part, that is, there is an offset between the edge probes and the intermediate probes in the second direction (x - axis). And the distance between the second part and the non - collinear first part in the second direction is greater than or equal to 0.8 mm to ensure the test accuracy. Among them, the width of the current - collecting part is, for example, 1 mm.

[0058] It can be understood that the distance between different part probes in the same column in the second direction is related to the width of the current - collecting part, and can be adaptively adjusted based on the current - collecting parts with different widths.

[0059] Since the probe needs to be away from the possible depression at the current - collecting part to avoid probe suspension, but at the same time, in order to accurately test the current collected on the surface of the solar cell (the closer the probe pressing point is to the current - collecting part, the better the uniform distribution and stability of the collected current), the probe of the second part can be as close as possible to the current - collecting part for testing, but the minimum distance between the test point and the current - collecting part needs to be greater than or equal to 0.8 mm to avoid possible probe suspension.

[0060] For example, the first part in the first probe row includes 5 probes (one of which is an edge probe) with no offset in the second direction (x - axis). The second part includes 40 intermediate probes, which are offset 1.0 mm to the right relative to the current - collecting part in the second direction (x - axis) (meeting the spacing requirement of ≥0.8 mm). The first part and the second part are non - collinear, and the offset is evenly distributed in the second direction.

[0061] The first part in the second probe row includes 5 probes (one of which is an edge probe) with no offset in the second direction (x - axis). The second part includes 40 intermediate probes, which are offset 1.0 mm to the left relative to the current - collecting part in the second direction (x - axis) (meeting the spacing requirement of ≥0.8 mm). The first part and the second part are non - collinear, and the offset is evenly distributed in the second direction.

[0062] Among them, the first probe row and the second probe row are respectively in contact with collector grid lines with different polarities.

[0063] In this embodiment, by setting the distance between the probe rows for testing the central region and the edge region of the solar cell, the probes in the central region can maintain a certain distance from the possible depressions at the busbar portion while being as close as possible to the busbar portion, further improving the accuracy of the test.

[0064] Figure 2 Schematically shows a relative position diagram of the avoidance groove of the solar cell testing device according to an embodiment of the present disclosure on the solar cell.

[0065] According to an embodiment of the present disclosure, at least one avoidance groove extending in the first direction is further provided on one side of the test circuit board, and the avoidance groove is provided between the probe rows with a larger pitch.

[0066] In some embodiments, on one side of the test circuit board, at least one avoidance groove is arranged to extend along the first direction (y-axis), corresponding to Figure 2 the blank area 5 at the center. The avoidance groove is provided between the probe rows with a larger pitch (such as the second pitch).

[0067] For example, the width of the avoidance groove is 6 mm and the depth is 5 mm. The length of the avoidance groove only occupies a part of the test board, and the direction of the length is the same as the y-axis direction.

[0068] The first probe row is offset to the left relative to the busbar portion, and the second probe row is offset to the right relative to the busbar portion. An avoidance groove is provided between the first probe row and the second probe row on the right (for example, the pitch is 15 mm). The deviation distances of the first probe row and the second probe row relative to the busbar portion are, for example, equal. At the avoidance groove, the test points are arranged on both sides of the busbar portions of the adjacent two columns of solar cell wafers away from each other, which is beneficial to improving the pressing effect of the probes, making the mechanical structure more stable, and improving the test accuracy.

[0069] In addition, the avoidance groove provides a buffer space for the mechanical stress that may be generated during the test, avoiding interference between the probe rows. The avoidance groove can also improve the heat dissipation performance of the test circuit board, preventing the temperature rise problem caused by long-term testing. And the avoidance groove simplifies the installation and maintenance of the probe rows, improving the manufacturing efficiency.

[0070] This embodiment introduces the avoidance groove design, further optimizing the mechanical, heat dissipation and other functions and performances of the solar cell testing device.

[0071] According to an embodiment of the present disclosure, the solar cell testing device further includes: a dividing disk for adsorbing and fixing the solar cell. Among them, the projections of the dividing disk and the avoidance groove in the thickness direction of the test circuit board overlap.

[0072] In some embodiments, when a relief groove is provided, a dividing plate may also be provided to adsorb and fix the solar cell to ensure the stability of the cell's position during the test. The dividing plate is disposed on one side of the test circuit board close to the solar cell (i.e., the side with probes), and overlaps with the projection of the relief groove in the thickness direction of the test circuit board. The number of dividing plates may be the same as or less than the number of relief grooves provided. For example, the number of relief grooves is 4, and the number of dividing plates is 4, or the number of relief grooves is 4, and the number of dividing plates is 2.

[0073] For example, the dividing plate adsorbs and fixes the solar cell by vacuum. By setting the adsorption area of the dividing plate to overlap with the projection of the relief groove in the thickness direction, the dividing plate can be partially located within the relief groove during the test, ensuring that when the dividing plate adsorbs or moves, it will not interfere with other parts of the test circuit board. This design helps to save the overall space of the test device and improve the efficiency and convenience of the test.

[0074] In addition, adsorbing the solar cell on the side where the test device of the solar cell is located can also reduce the occlusion of the light source on the other side (i.e., the front side), improving the test accuracy.

[0075] The test process includes, for example: placing the solar cell on the dividing plate and fixing it by vacuum adsorption. Ensuring that the positive and negative electrode collector grid lines of the cell are aligned with the corresponding probe rows. Testing the positive electrode collector grid line through the first probe row. Testing the negative electrode collector grid line through the second probe row. Ensuring the stability of the cell's position during the test through the collaborative design of the relief groove and the dividing plate, while avoiding mechanical interference.

[0076] This embodiment further improves the stability and test accuracy of the solar cell test device by introducing the dividing plate design and overlapping its projection with the relief groove in the thickness direction.

[0077] Figure 3 Schematically shows the relative position diagram of the adsorption holes of the solar cell test device according to an embodiment of the present disclosure on the solar cell.

[0078] According to an embodiment of the present disclosure, at least one column of adsorption holes extending in a first direction is further provided on one side of the test circuit board, and the adsorption holes are disposed between probe rows with a first pitch.

[0079] In some embodiments, adsorption holes may also be used to adsorb the solar cell to further optimize the spatial layout of the probes and reduce the interference of non-probe components such as the dividing plate.

[0080] It can be understood that according to different test requirements, both adsorption holes and dividing plates may be provided, or only one of them may be provided.

[0081] For example, on one side of the test circuit board, at least one column of suction holes is arranged to extend along the first direction (y-axis), such as Figure 3 the second circular solid figure 6 in

[0082] In order to ensure close contact between the probe and the collector grid line, the suction holes can be arranged between adjacent probe rows with a first pitch (i.e., a smaller pitch, such as 8 mm).

[0083] For example, the diameter of the suction hole can be 5 mm, and the pitch between the suction holes in the same column can be 7 mm. The suction holes fix the solar cell through vacuum suction to ensure the stable position of the cell during the test.

[0084] The test process includes, for example: placing the solar cell on the test circuit board and fixing it through vacuum suction by the suction holes. Ensure that the positive and negative collector grid lines of the cell are aligned with the corresponding probe rows. Test the positive collector grid line through the first probe row. Test the negative collector grid line through the second probe row. The design of the suction holes ensures the stable position of the cell during the test and avoids test errors caused by movement.

[0085] In this embodiment, by introducing the suction holes and arranging them between the probe rows with the first pitch, and fixing the solar cell through vacuum suction, the stability and accuracy of the test are further improved.

[0086] Figure 4 Schematically shows the depression position diagram when the solar cell test device according to an embodiment of the present disclosure is attached to the solar cell.

[0087] According to an embodiment of the present disclosure, the test circuit board includes a first region and a second region, and a plurality of probes are arranged in the first region. Among them, when the second region contacts the solar cell, the solar cell completely covers the first region, and the first region does not contact the solar cell.

[0088] In some embodiments, the test circuit board is divided into a first region and a second region. Among them, a plurality of probes are arranged in the first region for testing the collector grid lines of the solar cell, corresponding to Figure 4 the white region 7 in Figure 4 The second region is used to contact the solar cell and support it, corresponding to

[0089] For example, the first region is located at the center of the test circuit board, and the second region is a border region surrounding the first region with a width of 10 mm. The second region is relatively 0.02 mm to 0.08 mm higher than the first region, and the height of the second region is slightly lower than the height of the test probes.

[0090] A plurality of probes are disposed in the first region, including a plurality of first probe rows and a plurality of second probe rows, both arranged along the first direction (y-axis). The first probe rows and the second probe rows are alternately distributed along the second direction (x-axis).

[0091] When the solar cell is placed on the test circuit board, the cell completely covers the first region, and the cell edge contacts the second region. The first region only contacts the collector grid lines of the cell through the probes, so as to form a cavity between the test circuit board in the first region and the solar cell (i.e., the first region is recessed relative to the second region). When the adsorption holes are used to adsorb the solar cell, a vacuum region can be formed at this cavity to achieve stable adsorption and fixation of the solar cell. At the same time, due to the existence of this cavity, mechanical damage to the cell surface can also be avoided.

[0092] The testing process includes, for example: placing the solar cell on the test circuit board, ensuring that the cell edge contacts the second region and the cell completely covers the first region. Testing the positive collector grid lines through the first probe rows. Testing the negative collector grid lines through the second probe rows. The first region does not contact the cell surface, avoiding damage to the cell, and at the same time ensuring accurate contact between the probes and the collector grid lines.

[0093] In this embodiment, by dividing the first region (probe testing area) and the second region (cell contact area), it is ensured that the solar cell completely covers the first region and does not contact the first region, which not only protects the cell surface but also realizes accurate testing.

[0094] Another aspect of the present disclosure provides a solar cell, including: a semiconductor substrate. A plurality of collector grid lines disposed on one side of the semiconductor substrate and extending along the second direction. At least part of the collector grid lines are electrically connected to a plurality of rows of current collecting parts and test points arranged along the first direction. The current collecting parts are used to collect and transmit current to an external circuit, and the test points are used to contact the probes when the solar cell is being tested. The collector grid lines include first collector grid lines and second collector grid lines with different polarities. The test points corresponding to the first collector grid lines and the second collector grid lines are the first test points and the second test points respectively. The first test points and the second test points are alternately distributed along the second direction, and the distance between the first test point or the second test point and the adjacent test points on both sides is not equal. The first direction intersects the second direction.

[0095] In some embodiments, the material of the semiconductor substrate may be selected from materials such as silicon (Si), germanium (Ge), or materials such as gallium arsenide (GaAs). Obviously, in terms of the conduction type, the semiconductor substrate may be an intrinsic conduction substrate, an N-type conduction substrate, or a P-type conduction substrate. Preferably, the semiconductor substrate is a P-type conduction substrate or an N-type conduction substrate. Compared with the intrinsic conduction substrate, the P-type conduction substrate or the N-type conduction substrate has better conductivity, so that the finally manufactured solar cell has a lower bulk resistivity, thereby improving the efficiency of the solar cell.

[0096] A plurality of current collecting grid lines extending along the second direction (x-axis) are provided on one side of the semiconductor substrate. The current collecting grid lines include a first current collecting grid line and a second current collecting grid line, and the polarities of the first current collecting grid line and the second current collecting grid line are opposite, and are respectively used for collecting and transmitting the photocurrent.

[0097] For example, the material of the current collecting grid line includes materials such as silver, copper, silver-coated copper, or nickel, and no special limitation is made here.

[0098] The current collecting part (main grid, pad or thickened section of the current collecting grid line) is used for collecting and transmitting current to the external circuit, with a length of, for example, 1 mm and a width of, for example, 0.3 mm.

[0099] The test points are arranged on the current collecting grid line beside the current collecting part and are used for contacting with the probe for testing. Among them, the first test point is located on the first current collecting grid line, and the second test point is located on the second current collecting grid line.

[0100] The first test point and the second test point are respectively arranged along the first direction (y-axis) and are alternately distributed along the second direction (x-axis). The distance between each column of the first test points and the test points in the adjacent columns on both sides is different. Or the distance between each column of the second test points and the test points in the adjacent columns on both sides is different. That is, the test points are offset along the first direction (y-axis) relative to the current collecting part (main grid, pad or thickened section of the current collecting grid line), and the offset amount is, for example, 0.8 mm. This design avoids the possible probe suspension problem when testing the main grid pad and improves the test accuracy.

[0101] In this embodiment, by arranging the test points on the current collecting grid line beside the current collecting part to make it offset relative to the current collecting part, the possible probe suspension problem when testing the current collecting part is avoided. Through the alternate distribution and unequal spacing design, the accuracy and reliability of testing the solar cell are improved.

[0102] Another aspect of the present disclosure provides a photovoltaic module, including: a solar cell, and a plurality of solar cells are electrically connected to form a battery string. An encapsulation layer for covering the surfaces of the plurality of solar cells. A cover plate for covering the surface of the encapsulation layer facing away from the plurality of solar cells.

[0103] In some embodiments, a battery string includes, for example, a plurality of solar cells as in the embodiments of the present disclosure, and test points are provided on the current collecting grid lines.

[0104] For example, the battery string is composed of 12 solar cells connected in series, and each cell is connected through an electrical connector, such as a solder ribbon.

[0105] The test points (the first test point and the second test point) of each cell are alternately distributed along the second direction (x-axis), and the offset from the current collecting part is 0.8 mm.

[0106] The encapsulation layer covers the surfaces of the plurality of solar cells, is made of EVA (ethylene-vinyl acetate copolymer) material, and has a thickness of 0.5 mm. The encapsulation layer covers the upper and lower surfaces of the battery string to ensure isolation of the cells from the external environment and prevent moisture and dust from invading. The EVA material melts during the lamination process to tightly bond the battery string and the cover plate.

[0107] The cover plate covers the surface of the encapsulation layer facing away from the plurality of solar cells, is made of tempered glass, has a thickness of 3.2 mm, and has high light transmittance and impact resistance. The tempered glass cover plate has a high light transmittance (≥91%) to ensure that the solar cells fully receive light energy. The surface of the cover plate is, for example, subjected to an anti-reflection treatment to further improve the light energy utilization rate.

[0108] In this embodiment, a plurality of solar cells are connected in series to form a battery string, and an EVA encapsulation layer and a tempered glass cover plate are used for protection to form an efficient and durable photovoltaic module, which is suitable for large-scale solar power generation systems.

[0109] It should be understood that the specific order or hierarchy of steps in the disclosed process is an example of an exemplary method. Based on design preferences, it should be understood that the specific order or hierarchy of steps in the process can be rearranged without departing from the scope of the present disclosure. The appended method claims present the elements of the various steps in an exemplary order and are not limited to the specific order or hierarchy.

[0110] It should also be noted that the directional terms mentioned in the embodiments, such as "upper", "lower", "front", "rear", "left", "right", etc., are only references to the directions in the drawings and are not used to limit the scope of the present disclosure. Throughout the drawings, the same elements are denoted by the same or similar reference numerals. When it may cause confusion in the understanding of the present disclosure, conventional structures or configurations will be omitted. And the shapes, sizes, and positional relationships of the components in the drawings do not reflect the true sizes, proportions, and actual positional relationships.

[0111] In the foregoing detailed description, various features are combined in a single embodiment to simplify the present disclosure. This method of disclosure should not be interpreted as reflecting an intention that the embodiments of the claimed subject matter require more features than are expressly recited in each claim. On the contrary, as reflected in the appended claims, the present disclosure lies in a state less than all the features of the disclosed single embodiment. Accordingly, the appended claims are hereby expressly incorporated into the detailed description, with each claim standing alone as a separate embodiment of the present disclosure.

[0112] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the quantity of the indicated technical features. Thus, features defined with "first" and "second" may explicitly or implicitly include one or more of such features. In the description of the present disclosure, "a plurality of" means at least two, such as two, three, etc., unless otherwise specifically defined. Regarding the term "comprising" used in the specification or claims, the manner in which this word encompasses is similar to the term "including", as explained when "including," is used as a transitional word in the claims. Any use of the term "or" in the specification or claims of the claims is intended to mean "non-exclusive or."

[0113] The specific embodiments described above have further elaborated on the purpose, technical solutions, and beneficial effects of the present disclosure. It should be understood that the above are only specific embodiments of the present disclosure and are not used to limit the present disclosure. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principles of the present disclosure shall be included within the protection scope of the present disclosure.

Claims

1. A solar cell testing device, characterized in that, Comprising: A test circuit board, on one side of which there are provided a plurality of probes, and the plurality of probes are arranged as a plurality of first probe rows and a plurality of second probe rows that are all arranged along a first direction; Wherein, the first probe rows and the second probe rows are alternately distributed along a second direction, and the distance between the first probe row or the second probe row and the adjacent probe rows on both sides is not equal. The first probe rows and the second probe rows are used to test the collector grid lines of solar cells with different polarities, and the first direction intersects the second direction.

2. The solar cell testing device according to claim 1, characterized in that, The distance between the first probe row or the second probe row and the adjacent probe row on the relative first side is a first distance, and the distance between the first probe row or the second probe row and the adjacent probe row on the relative second side is a second distance; Wherein, the relative first side and the relative second side are the relative sides with respect to the first probe row or the second probe row; The second distance is greater than the first distance.

3. The solar cell testing device according to claim 1, wherein At least one of the first probe rows and the second probe rows includes a first part and a second part where the probes are continuously distributed, and the first part includes edge probes; Wherein, at least one of each column of the first parts is not collinear with the second part, and the distance along the second direction of the first parts that are not collinear with the second part is equal.

4. The solar cell testing device according to claim 3, characterized in that, The distance along the second direction between the second part and the non - collinear first part is greater than or equal to 0.8 mm.

5. The solar cell testing device according to claim 1 or 2, characterized in that, On one side of the test circuit board, there is also provided at least one avoidance groove extending along the first direction, and the avoidance groove is arranged between the probe rows with a larger distance.

6. The solar cell testing device according to claim 5, characterized in that, Also comprising: An indexing plate for adsorbing and fixing the solar cell; Wherein, the projection of the indexing plate and the avoidance groove overlap in the thickness direction of the test circuit board.

7. The solar cell testing device according to claim 2, characterized in that, On one side of the test circuit board, there is also provided at least one column of adsorption holes extending along the first direction, and the adsorption holes are arranged between the probe rows with the first distance.

8. The solar cell testing device according to claim 1, characterized in that, The test circuit board includes a first area and a second area, and the plurality of probes are arranged in the first area; Wherein, when the second area contacts the solar cell, the solar cell completely covers the first area, and the first area does not contact the solar cell.

9. A solar cell, characterized in that, Comprising: A semiconductor substrate; A plurality of collector grid lines arranged on one side of the semiconductor substrate and extending along a second direction; Wherein, at least part of the collector grid lines are electrically connected to a plurality of columns of current - collecting parts and test points arranged along a first direction. The current - collecting parts are used to collect and transmit current to an external circuit, and the test points are used to contact the probes when testing the solar cell; The collector grid lines include first collector grid lines and second collector grid lines with different polarities. The test points corresponding to the first collector grid lines and the second collector grid lines are a first test point and a second test point respectively. The first test point and the second test point are alternately distributed along the second direction, and the distance between the first test point or the second test point and the adjacent test points on both sides is not equal. The first direction intersects the second direction.

10. A photovoltaic module, characterized in that, Comprising: The solar cell according to claim 9, wherein a plurality of the solar cells are electrically connected to form a battery string; An encapsulation layer for covering the surfaces of a plurality of the solar cells; A cover plate for covering the surface of the encapsulation layer facing away from a plurality of the solar cells.

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