Adjusting device and method for common-optical-path multiband common-optical-path assembly common-image-plane debugging

Abstract

The invention provides an adjusting device and method for common-image-plane debugging of a common-optical-path multiband common-optical-path assembly. The adjusting device comprises a height-adjustable supporting frame assembly, a collimator, an electric cross signal generator, a display, a theodolite and an auto-collimation reflector. The optical bench is fixedly installed on the height-adjustable supporting frame assembly, and the auto-collimation reflector, the low-illumination detector and the short-wave detector are installed on the same side of the optical bench. During assembly and adjustment, the assembled height-adjustable supporting frame assembly and the common-light-path assembly are subjected to assembly stress release, then the theodolite and the collimator are subjected to intervisibility alignment, the height-adjustable supporting frame assembly is moved into a light path of the collimator after alignment, and the theodolite and the auto-collimation reflector are adjusted to be auto-collimation; and adjusting to enable the cross image of the collimator target to coincide with the electric cross images output by the two detectors, thereby realizing the debugging of the image surfaces of the low-illumination light path and the short-wave light path. Common-image-plane debugging of all optical paths can be completed through one-time installation of the device, operation is easy, efficiency is high, and debugging precision is high.

Description

Technical Field

[0001] The present invention belongs to the technical field of optical precision alignment, and particularly relates to an adjustment device and method for co-image plane debugging of a common optical path multi-band common optical path component. Background Art

[0002] The common optical path component is a key component in an optoelectronic system and is widely used in the field of dual-band imaging. The traditional common optical path dual-band system usually adopts a Cassegrain structure to receive target image information. Among them, the short-wavelength optical path images the image information on the short-wave detector image plane, while the low-light optical path images the image information on the low-light detector image plane. This structure needs to ensure the target clarity of dual-band imaging while guaranteeing optical, mechanical, and thermal performance to meet the requirements of the action distance and imaging quality of the common optical path component.

[0003] Currently, after the common optical path is integrated, the industry usually uses a fixed structure or a simple mechanical adjustment method to perform image plane debugging on the detector to solve the problem of imaging plane offset. However, in the actual integration and application process, the common optical path dual-band system faces many challenges. Usually, a collimator standard cross target is used as the target source, and the imaging effect of the target in each channel on the display is observed through a CCD sensor imaging system, and the front and back movement of the CCD is adjusted to achieve clear imaging of the target. However, this method has the following problems in practical applications: (1) Unreliable fixation and difficult to guarantee the collinearity of the optical axis. The traditional method lacks a dedicated fixing device and only relies on a simple support structure to fix the common optical path system to the debugging platform; this fixing method cannot reliably guarantee the parallelism of the optical axis and the installation reference plane, easily resulting in local blurring of the imaging plane and affecting the debugging accuracy and imaging quality. (2) System shaking leads to low debugging efficiency. During the debugging process, due to the unstable fixation of the system, it is easy to shake due to external forces or operations, resulting in repeated debugging actions; this not only prolongs the debugging time, but also reduces work efficiency and increases labor costs. (3) Insufficient assembly stress and environmental adaptability. The traditional method does not use effective screw connections or other reliable fixing methods, and only fixes the system through simple clamping. This method is easy to introduce assembly stress, and when the environmental temperature changes, the residual stress cannot be completely eliminated, which may cause the optical path to shift or the position of the imaging plane to change, thereby affecting the synchronous clarity of dual-band imaging and the long-term stability and environmental adaptability of the optical system. Summary of the Invention

[0004] The purpose of the present invention is to overcome the deficiencies that the co-image plane debugging of the existing common optical path multi-band common optical path component requires multiple installations and adjustments, the adjustment process is complex, the adjustment accuracy is insufficient, and it is difficult to adapt to dynamic stress changes in a complex environment, and to provide an adjustment device and method for co-image plane debugging of a common optical path multi-band common optical path component.

[0005] To achieve the above object, the technical solution provided by the present invention is as follows:

[0006] The common optical path component includes an optical bench, a low-light detector, and a short-wave detector. The adjustment device for the common image plane debugging of the common optical path multi-band common optical path component includes a height-adjustable support frame assembly, a collimator, an electric cross signal generator, a display, a theodolite, and a self-aligning reflector.

[0007] Both ends of the optical bench are fixedly installed on the height-adjustable support frame assembly, and the self-aligning reflector is installed on the optical bench and is on the same side as the low-light detector and the short-wave detector; both the low-light detector and the short-wave detector are electrically connected to the electric cross signal generator and the display.

[0008] The collimator is used to emit parallel light beams to the common optical path component, so that the cross target is imaged on the image planes of the low-light detector and the short-wave detector through the common optical path component, and is used to achieve the initial positioning of the optical bench by aligning with the theodolite.

[0009] The self-aligning reflector is used to cooperate with the theodolite, and by adjusting the height-adjustable support frame assembly, the optical axis of the common optical path component is perpendicular to the normal of the image planes of the low-light detector and the short-wave detector; the electric cross signal generator is used to input electric cross signals to the low-light detector and the short-wave detector, and the display is used to display the electric cross images output by the low-light detector and the short-wave detector and the target cross image of the collimator.

[0010] Further, the height-adjustable support frame assembly includes a bottom plate, a support plate, a top plate, a positioning seat, and an adjustment assembly; two support plates are vertically and symmetrically fixed on the top of the bottom plate, and both ends of the top plate are fixedly connected to the tops of the two support plates respectively.

[0011] A positioning plate is fixedly provided on the lower surface of the top plate and the top surface of the bottom plate respectively, for fixedly connecting with the ear supports at both ends of the optical bench; several adjustment assemblies are vertically and evenly distributed on the bottom surface of the bottom plate, for adjusting the height of the height-adjustable support frame assembly.

[0012] Further, the top plate includes a connecting plate and inclined plates symmetrically and fixedly butted at both ends of the top plate; the end parts of the two inclined plates are respectively fixedly connected to the tops of the two support plates.

[0013] Further, a single adjustment assembly includes a steel sleeve, a base, an adjustment stud, a pressing plate, and a second screw; the steel sleeve is vertically fixed inside the bottom of the bottom plate, and the central hole of the steel sleeve has internal threads.

[0014] The adjusting stud is of a cylindrical structure. An external thread that mates with the internal thread of the central hole of the steel sleeve is provided on the outer wall of the upper section. The lower end is vertically installed in the mounting hole at the top of the base and can rotate about the axis within the mounting hole. An annular disc that extends radially outward along the adjusting stud body is provided on the adjusting stud body for rotating the adjusting stud.

[0015] Further, one end of the steel sleeve has a flange, and a plurality of through holes are opened on the flange. A plurality of first screws are further included. The first screws pass through the through holes on the flange and the threaded holes on the bottom plate to fixedly connect the steel sleeve to the bottom of the bottom plate.

[0016] Further, the base is of an inverted T-shaped structure. A hemispherical hole is opened at the center of the top of the base, and threaded holes are opened on both sides of the top.

[0017] The lower end of the adjusting stud is a conical spherical structure that is fitted and installed in the hemispherical hole. An annular groove is opened on the adjusting stud body and close to the root position of the large end of the conical spherical structure.

[0018] A pressing plate and a second screw are further included. A through hole that mates with the annular groove is provided at the center of the pressing plate, and the pressing plate is fixedly connected to the top of the base through the second screw to vertically press the conical spherical structure of the adjusting stud in the hemispherical hole.

[0019] Further, handles are installed on the side wall of the support plate and the side wall of the top plate.

[0020] Further, the positioning seat is of an L-shaped structure. A threaded hole that mates with the corresponding through hole on the ear of the optical bench is opened on the first inner wall at the right-angle turning of the L-shaped structure for fixing the positioning seat to the upper ear or the lower ear of the optical bench through a fastener.

[0021] A through hole that mates with the threaded hole on the top plate or the bottom plate is opened on the second inner wall at the right-angle turning of the L-shaped structure for fixing the positioning seat to the top plate or the bottom plate through a fastener.

[0022] Further, a U-shaped groove with an opening facing outward is provided on the top of the bottom plate and on one side of the installation positions of the low-illuminance detector and the short-wave detector for making way for a wrench when the optical bench, the bottom plate, and the positioning seat are fixedly installed.

[0023] A common-path multi-band common-image-plane debugging method is realized by using the above adjustment device. The debugging method includes the following steps:

[0024] Step 1: Fix the optical bench on the height-adjustable support frame assembly and place it in a high and low temperature test chamber to perform a high and low temperature cycle test according to the set temperature to release the assembly stress.

[0025] Step 2: Optical axis calibration of the common optical path component;

[0026] Set up and turn on the collimator and the theodolite, and align the collimator and the theodolite so that they can see each other;

[0027] Place the height-adjustable support frame assembly after stress release between the collimator and the theodolite, adjust the height of the height-adjustable support frame assembly so that the autocollimation mirror is autocollimated with the theodolite, and ensure that the common optical path component is perpendicular to the visual axis of the theodolite.

[0028] Step 3: Image plane debugging of the low-light optical path;

[0029] Power on the low-light detector, the electric cross signal generator and the display; adjust the adjustment mechanism of the CCD camera on the low-light detector along the direction perpendicular to the optical axis so that the target cross image of the collimator on the display coincides with the electric cross image output by the low-light detector;

[0030] Adjust the adjustment mechanism of the CCD camera on the low-light detector along the optical axis direction so that the target cross image of the collimator on the display is clearly visible.

[0031] Step 4: Image plane debugging of the short-wave optical path;

[0032] Power on the short-wave detector, adjust the installation position of the low-light detector on the optical bench, and adjust the adjustment mechanism of the short-wave camera on the short-wave detector along the direction perpendicular to the optical axis so that the target cross image of the collimator on the display coincides with the electric cross image output by the short-wave detector;

[0033] Adjust the adjustment mechanism of the short-wave camera on the short-wave detector along the optical axis direction so that the target cross image of the collimator on the display is clearly visible.

[0034] The advantages of the present invention are:

[0035] 1. The adjustment device for co-image plane debugging of the common optical path multi-band common optical path component provided by the present invention includes a collimator, an electric cross signal generator, a display, a theodolite, and an autocollimation mirror. The optical bench is reliably fixed on the adjustment device through a positioning component, and its height position can be realized through an adjustment component installed at the bottom of the bottom plate. Through the mutual cooperation and adjustment of the collimator, the electric cross signal generator, the display, the theodolite, and the autocollimation mirror, the co-image plane debugging of the common optical path dual-band can be realized with one installation. Compared with the traditional method, the debugging efficiency is significantly higher. The traditional debugging method requires repeated operations and takes about 4 hours, while all co-image plane debugging can be completed in 2 hours by using the device of the present invention.

[0036] 2. In the adjustment device of the present invention, a support assembly composed of a support plate and a connecting plate is designed. The optical bench is reliably fixed on the connecting plate at the top of the support assembly and the bottom plate at the bottom through upper and lower positioning seats and fastened with screws, preventing shaking and avoiding operation risks such as scratching and edge breakage on the surface of the optical glass during the debugging process. At the same time, it ensures the reliable installation of the common optical path dual-band common optical path component and the stability of the pose of the common optical path component during the debugging process, with the image plane debugging accuracy ≤ 5μm. In contrast, the traditional debugging method can only ensure seeing the target imaging, with low debugging accuracy.

[0037] 3. In the present invention, positioning surfaces are provided on the lower surface of the connecting plate and the upper surface of the bottom plate for installing the positioning seats, and the optical bench is fixed through the positioning seats, ensuring the parallelism between the optical axis of the common optical path component and the installation reference plane, and the parallelism accuracy is controlled within 20", ensuring a clear and uniform imaging surface.

[0038] 4. Before performing the debugging operation with the device of the present invention, first position and install the common optical path component on the height-adjustable support frame assembly designed by the present invention. Then, put the assembled common optical path component and the height-adjustable support frame assembly as a whole into a high and low temperature test chamber for high and low temperature cyclic stress release from -55°C to +70°C to meet environmental adaptability and avoid the problem of image plane defocus caused by assembly stress. BRIEF DESCRIPTION OF THE DRAWINGS

[0039] The above and / or additional aspects and advantages of the present invention will become apparent and be readily understood from the following description of the embodiments in conjunction with the accompanying drawings, where:

[0040] Figure 1 is a schematic three-dimensional structure diagram of the adjustment device of the present invention;

[0041] Figure 2 is the front view of the adjustment device of the present invention;

[0042] Figure 3 is the left view of the adjustment device of the present invention;

[0043] Figure 4 is the top view of the adjustment device of the present invention;

[0044] Figure 5 is the sectional view of the adjustment component in the present invention;

[0045] Description of the reference numerals: 1 - bottom plate, 2 - support plate, 3 - handle, 4 - upper positioning seat, 5 - connecting plate, 6 - inclined plate, 7 - adjustment assembly, 701 - steel sleeve, 702 - first screw, 703 - base, 704 - adjustment stud, 705 - pressing plate, 706 - second screw, 8 - lower positioning seat, 9 - low - illuminance detector, 10 - optical bench, 11 - short - wave detector, 12 - collimator, 13 - electric cross - signal generator, 14 - display, 15 - theodolite, 16 - autocollimating mirror. Detailed implementation manners

[0046] The embodiments of the present invention will be described in detail below. The embodiments are exemplary and are intended to explain the present invention, but should not be construed as limiting the present invention.

[0047] Referring to Figures 1-5 , this embodiment provides an adjustment device for the co - image - plane debugging of a common - path multi - band common - path component. The common - path component includes a low - illuminance detector 9, an optical bench 10, and a short - wave detector 11. The low - illuminance detector 9 and the short - wave detector 11 are fixedly installed on the same side wall of the optical bench. The low - illuminance detector 9 is composed of a CCD camera and a lens and is used to realize low - illuminance optical path imaging; the short - wave detector 11 is composed of a short - wave camera and a lens and realizes short - wave optical path imaging.

[0048] The adjustment device includes a height - adjustable support frame assembly, a collimator 12, an electric cross - signal generator 13, a display 14, a theodolite 15, and an autocollimating mirror 16. The height - adjustable support frame assembly includes a bottom plate 1, two support plates 2, an upper positioning seat 4, a connecting plate 5, two inclined plates 6, a plurality of adjustment assemblies 7, and a lower positioning seat 8. The plurality of adjustment assemblies are evenly distributed on the bottom surface of the bottom plate to form an adjustable platform for adjusting the installation height of the optical imaging system on the adjustment device. The two support plates 2 are vertically and symmetrically fixed on the top surface of the bottom plate 2. The two inclined plates 6 are symmetrically fixed at both ends of the connecting plate 5, and the combined body after connection is fixed on the tops of the two support plates. The end of the inclined plate is fixedly connected to the end of the support plate.

[0049] The upper positioning seat 4 and the lower positioning seat 8 are respectively fixed at the corresponding positions on the lower surface of the connecting plate 5 and the upper surface of the bottom plate. The optical bench 10 is arranged in the space formed by the bottom plate 1 and the connecting plate 5, and the lugs at the upper and lower ends of the optical bench 10 are respectively fixed on the upper positioning seat 4 and the lower positioning seat 8. The low - illuminance detector 9 and the short - wave detector 11 are fixedly connected to the optical bench 10, and the autocollimating mirror 16 is bonded to the surface of the optical bench 10 and is on the same side as the low - illuminance detector 9 and the short - wave detector 11. The low - illuminance detector 9 and the short - wave detector 11 are both connected to the electric cross - signal generator 13 and the display 14 through cables.

[0050] The collimator 12 is used to provide an infinite target (cross target). By cooperating with the theodolite 15, the autocollimating mirror 16 and the theodolite are self-collimated to realize the initial positioning of the optical bench 10 and ensure the correct installation position of the optical bench (the optical axis can vertically incident on the common optical path component). The autocollimating mirror 16 is bonded to the optical bench to provide a reflected image of the graticule of the theodolite 15, which can cooperate with the theodolite. By adjusting the height-adjustable support frame assembly, the optical axis of the common optical path component is perpendicular to the image plane normal of the low-light detector and the short-wave detector. The electric cross signal generator 13 is used to input a standard cross target signal to the low-light detector 9 and the short-wave detector 11. The display 14 is used to real-time display the electric cross target images output by the low-light detector 9 and the short-wave detector 11 and the cross image of the collimator target.

[0051] Specifically, the bottom plate 1 is a cube flat plate. Since the lower positioning seat 8 is connected to the bottom plate by screws, the wrench will interfere with the bottom plate during installation. Therefore, a relief U-shaped groove is opened on one side of the top of the bottom plate near the installation position of the lower positioning seat 8 to make way for the wrench. Three threaded holes are opened on the lower surface of the bottom plate 1 and near the edge of the bottom plate for installing 3 adjustment components 7. Two threaded holes are opened at positions on the top of the bottom plate that are symmetric with respect to the U-shaped groove for fixedly installing the support plate 2. A positioning installation surface is machined at the middle position of the top of the bottom plate, and two threaded holes are opened at the same time for installing and fixing the lower positioning seat 8.

[0052] Specifically, the two support plates 2 are herringbone solid plates. Threaded holes are opened at the upper ends for fixed connection with the through holes at one end of the inclined plate 6. The other end of the inclined plate is fixed to one end of the connecting plate 5. After installation, the included angle between the inclined plate and the support plate 2 is 45°, so as to ensure that the connecting plate 5 is parallel to the bottom plate. Threaded holes are opened on the side walls of the support plate 2 for installing a handle 3 respectively to facilitate moving and adjusting the overall position of the device.

[0053] The connecting plate 5 is a cuboid structure. Threaded holes are opened at both ends for connecting with the through holes at the ends of the two inclined plates respectively. A threaded hole is opened on the side surface of the connecting plate for installing a handle 3. A positioning surface is opened on the lower surface of the connecting plate 5, and a threaded hole is opened on the positioning surface for positioning and installing the upper positioning seat 4.

[0054] The handles 3 installed on the side walls of the support plate 2 and the connecting plate 5 are both in a portal-shaped structure. The two ends of the handle opening symmetrically extend outwards with shoulders, and through holes are opened on the shoulders for fixed connection with the support plate and the connecting plate 5 respectively.

[0055] The upper positioning seat 4 is an L-shaped structure. Two through holes are opened on the step surface of the L-shaped structure for fixing with the lower surface of the connecting plate 5. Two threaded holes are opened on the inner side wall of the L-shaped structure for fixed connection with the lugs at the upper end of the optical bench by screws.

[0056] The lower positioning seat 8 is an L-shaped structure. Two through holes are opened on the step surface of the L-shaped structure for fixing to the upper surface of the bottom plate; two threaded holes are opened on the inner side wall of the L-shaped structure for fixedly connecting with the lugs at the lower end of the optical bench through screws.

[0057] The adjustment assembly 7 includes a steel sleeve 701, a first screw 702, a base 703, an adjustment stud 704, a pressing plate 705 and a second screw 706. Among them, the base 703 is an inverted T-shaped cylinder with a semi-spherical hole in the middle, and threaded holes are opened on both sides at the top of the base for connecting with the corresponding through holes of the pressing plate 705, and the pressing plate is fixed to the top of the base through the second screw 706. The adjustment stud 704 is a cross-shaped cylinder, the upper half of the vertical column is processed with an external thread, a circular groove is processed on the outer wall of the lower half of the rod body, and the end is a conical sphere; the cross column of the adjustment stud is a circular disc, and this circular disc is held by hand to rotate during adjustment. The steel sleeve 701 is installed in the threaded hole at the bottom of the bottom plate and fixed to the top plate through the first screw 702. The external thread of the vertical column of the adjustment stud 704 is matched with the internal thread of the steel sleeve 701, and rotating the adjustment stud 704 can adjust the up and down height of the bottom plate.

[0058] Both the first screw 702 and the second screw 706 are standard parts.

[0059] The pressing plate 705 is a semi-circular pressing plate, and through holes are processed on it, and it is connected with the corresponding threaded holes at the top of the base 703 through the second screw 706.

[0060] The steel sleeve 701 is a hollow cylinder, the inner hole is processed with an internal thread that matches the external thread of the adjustment stud 704; the outer wall is processed with an external thread that matches the internal thread of the inner hole of the bottom plate 1. One end of the steel sleeve is provided with a flange, and 4 through holes are symmetrically distributed on the flange, and are fixedly connected to the corresponding 4 threaded holes of the bottom plate 1 through the first screw 702.

[0061] This embodiment also provides a common optical path multi-band common image plane debugging method, which is realized based on the above adjustment device. Specifically, it includes the following steps:

[0062] Step 1: Fix the upper and lower ends of the optical bench 10 to the upper positioning seat 4 and the lower positioning seat 8 respectively. After installation, put the combination of the height-adjustable support frame assembly and the common optical path assembly into a high and low temperature test chamber, and perform high and low temperature cyclic stress release according to the set temperature. In this embodiment, a high and low temperature cycle test is carried out between -55°C and +70°C to fully release the assembly stress. After the test is completed, take out the height-adjustable support frame assembly equipped with the common optical path assembly.

[0063] Step 2: Optical axis calibration of the common optical path assembly

[0064] Set up the collimator 12 and theodolite 15, and reserve space between the two for the installation of the height-adjustable support frame assembly. Adjust the theodolite to a horizontal level and align it with the collimator. The center of the collimator 12 objective lens is at the same height as the center of the theodolite 15 objective lens, ensure that the visual axis is aligned, and establish an accurate debugging benchmark.

[0065] After the theodolite 15 is aligned with the collimator 12, the height-adjustable support frame assembly is placed between the collimator and the theodolite. The adjustment assembly 7 at the bottom of the base plate 1 is adjusted to align the autocollimator 16 with the theodolite to ensure that the common optical path assembly is perpendicular to the theodolite visual axis.

[0066] Step 3: Low illumination optical path image plane debugging

[0067] Power is supplied to the low illumination detector 9, the electric cross signal generator 13 and the display 14, and the cross target provided by the collimator is injected through the common optical path, imaged by the low illumination detector 9 and displayed on the display 14. The adjustment mechanism of the CCD camera on the low illumination detector 9 is translated up and down and left and right along the plane perpendicular to the optical axis, so that the cross image of the collimator target on the display coincides with the electric cross image output by the low illumination detector; at the same time, the clarity of the cross image of the collimator target is observed. If it is not clear, the adjustment mechanism of the CCD camera on the low illumination detector 9 is moved forward and backward along the optical axis direction to ensure that the cross image of the collimator target is clearly visible.

[0068] Step 4: Short-wavelength optical path image plane debugging

[0069] Power is supplied to the shortwave detector 11, the electric cross signal generator 13 and the display 14, and the cross target provided by the collimator is injected through the common optical path channel, imaged by the shortwave detector 11 and displayed on the display 14. The adjustment mechanism of the shortwave camera on the shortwave detector 11 is translated up and down and left and right along the plane perpendicular to the optical axis, so that the cross image of the collimator target on the display coincides with the electric cross image output by the shortwave detector; at the same time, the clarity of the cross image of the collimator target should be observed. If it is not clear, the adjustment mechanism of the shortwave camera on the shortwave detector 11 is moved forward and backward along the optical axis direction to ensure that the cross image of the collimator target is clearly visible.

[0070] The adjustment device of the present invention can realize the common image plane adjustment of all optical paths by one installation, and has reliable positioning and high adjustment efficiency.

[0071] The above description is only a specific implementation mode of the present invention, but the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can easily think of various equivalent modifications or substitutions within the technical scope disclosed in the present invention, and these modifications or substitutions should be included in the protection scope of the present invention.

Claims

1. Adjusting device for co - image - plane debugging of a common - optical - path multi - band common - optical - path component. The common - optical - path component includes an optical bench, a low - illumination detector, and a short - wave detector; characterized in that, The adjustment device includes a height-adjustable support frame assembly, a collimator, an electric cross signal generator, a display, a theodolite, and an autocollimation mirror; Both ends of the optical bench are fixedly installed on the height-adjustable support frame assembly, and the autocollimation mirror is installed on the optical bench and is on the same side as the low-light detector and the short-wave detector; Both the low-light detector and the short-wave detector are electrically connected to the electric cross signal generator and the display; The collimator is used to emit parallel light beams to the common optical path assembly, so that the cross target is imaged on the image planes of the low-light detector and the short-wave detector through the common optical path assembly, and is used to achieve the initial positioning of the optical bench by aligning with the theodolite; The autocollimation mirror is used to cooperate with the theodolite, and by adjusting the height-adjustable support frame assembly, the optical axis of the common optical path assembly is perpendicular to the normal of the image planes of the low-light detector and the short-wave detector; The electric cross signal generator is used to input electric cross signals to the low-light detector and the short-wave detector, and the display is used to display the electric cross images output by the low-light detector and the short-wave detector and the target cross image of the collimator.

2. The adjustment device according to claim 1, characterized in that The height-adjustable support frame assembly includes a bottom plate, a support plate, a top plate, a positioning seat, and an adjustment assembly; Two of the support plates are vertically and symmetrically fixed on the top of the bottom plate, and both ends of the top plate are respectively fixedly connected to the tops of the two support plates; Positioning plates are fixed on the lower surface of the top plate and the top surface of the bottom plate respectively, and are used to be fixedly connected to the ear supports at both ends of the optical bench; A plurality of the adjustment assemblies are vertically and evenly distributed on the bottom surface of the bottom plate and are used to adjust the height of the height-adjustable support frame assembly.

3. The adjustment device according to claim 2, wherein The top plate includes a connecting plate and inclined plates symmetrically and fixedly butted at both ends of the top plate; The end parts of the two inclined plates are respectively fixedly connected to the tops of the two support plates.

4. The adjustment device according to claim 2, wherein A single adjustment assembly includes a steel sleeve, a base, an adjustment screw, a pressing plate, and a second screw; The steel sleeve is vertically fixed inside the bottom of the bottom plate, and the central hole of the steel sleeve has internal threads; The adjustment screw is of a cylindrical structure, and the outer wall of the upper section is provided with external threads that match the internal threads in the central hole of the steel sleeve. The lower end is vertically installed in the installation hole at the top of the base and can rotate around the axis in the installation hole; an annular disk extending radially outward along the body of the adjustment screw is provided on the body of the adjustment screw for rotating the adjustment screw.

5. The adjustment device according to claim 4, characterized in that, One end of the steel sleeve has a flange, and a plurality of through holes are opened in the flange; It also includes a plurality of first screws, and the first screws pass through the through holes in the flange and the threaded holes on the bottom plate to fixedly connect the steel sleeve to the bottom of the bottom plate.

6. The adjustment device according to claim 5, characterized in that The base is of an inverted T-shaped structure, a hemispherical hole is opened at the center of the top of the base, and threaded holes are opened on both sides of the top; The lower end of the adjustment screw is a conical spherical structure that fits and installs in the hemispherical hole; an annular groove is opened on the body of the adjustment screw and near the root of the large end of the conical spherical structure; It further includes a pressing plate and a second screw; a through hole matching with the annular groove is provided at the center of the pressing plate, and the pressing plate is fixedly connected to the top of the base through the second screw, so as to vertically press the conical spherical structure of the adjusting stud in the hemispherical hole.

7. The adjusting device according to claim 2, wherein Handles are installed on the side wall of the support plate and the side wall of the top plate.

8. The adjustment device according to claim 2, wherein The positioning seat is of an L-shaped structure; a threaded hole matching with the corresponding through hole on the optical bench support ear is provided on the first inner wall at the right-angle turning of the L-shaped structure, for fixing the positioning seat to the upper support ear or the lower support ear of the optical bench through a fastener; A through hole matching with the threaded hole on the top plate or the bottom plate is provided on the second inner wall at the right-angle turning of the L-shaped structure, for fixing the positioning seat to the top plate or the bottom plate through a fastener.

9. The adjustment device according to claim 2, wherein A U-shaped groove with an outward opening is provided on the top of the bottom plate and on one side of the installation positions of the low-illuminance detector and the short-wave detector, for making way for a wrench when the optical bench is fixedly installed with the bottom plate and the positioning seat.

10. A common optical path multi-band common image plane debugging method, characterized in that, It is realized by using the adjusting device according to any one of claims 1-9; the debugging method includes the following steps: Step 1: Fix the optical bench on the height-adjustable support frame assembly, and place it in a high and low temperature test chamber, and perform a high and low temperature cycle test according to the set temperature to release the assembly stress; Step 2: Optical axis calibration of the common optical path assembly; Set up and turn on the collimator and the theodolite, and align the collimator and the theodolite for line of sight; Place the height-adjustable support frame assembly after releasing the stress between the collimator and the theodolite, adjust the height of the height-adjustable support frame assembly, and make the autocollimation mirror autocollimate with the theodolite to ensure that the common optical path assembly is perpendicular to the line of sight of the theodolite; Step 3: Image plane debugging of the low-illuminance optical path; Power on the low-illuminance detector, the electric cross signal generator and the display; adjust the adjustment mechanism of the CCD camera on the low-illuminance detector along the direction perpendicular to the optical axis, so that the target cross image of the collimator on the display coincides with the electric cross image output by the low-illuminance detector; Adjust the adjustment mechanism of the CCD camera on the low-illuminance detector along the optical axis, so that the target cross image of the collimator on the display is clearly visible; Step 4: Image plane debugging of the short-wave optical path; Power on the short-wave detector, adjust the installation position of the low-illuminance detector on the optical bench, and adjust the adjustment mechanism of the short-wave camera on the short-wave detector along the direction perpendicular to the optical axis, so that the target cross image of the collimator on the display coincides with the electric cross image output by the short-wave detector; Adjust the adjustment mechanism of the short-wave camera on the short-wave detector along the optical axis, so that the target cross image of the collimator on the display is clearly visible.

Images