Infrared imaging equipment frame frequency automatic test method and device

Abstract

The invention relates to the field of photoelectric system testing, in particular to an automatic frame frequency testing method for infrared imaging equipment, which comprises the following steps: generating a circular motion target, taking the target as a target image for automatic frame frequency testing, and selecting a circular hole target meeting a preset condition in the target image as a moving target; by adjusting the two-dimensional adjusting mechanism, the middle position of the round hole target imaging on the detected infrared imaging equipment is adjusted; adjusting the focal length of the detected infrared imaging equipment, and generating a target imaging focal plane corresponding to the detected infrared imaging equipment; determining a target amplitude and a target frequency corresponding to the moving point target, controlling the two-dimensional moving mechanism to start circular motion through display control, and enabling the detected infrared imaging equipment to start to collect an image; and sending the image stored by the tested infrared imaging device to a frame frequency automatic test device to carry out a frame frequency automatic test. By applying the method, the image frame frequency quantitative test of the frame-frequency-free signal output equipment can be realized, and the frame frequency test precision is superior to + / -1Hz.

Description

Technical Field

[0001] This application relates to the field of optoelectronic system testing, and particularly to a method for automatically testing the frame rate of an infrared imaging device. Background Art

[0002] In optical instruments, the frame rate refers to the number of complete image signals output by a detector per second. The unit of frame rate is expressed in Hz. In an optoelectronic system, considering that the optoelectronic system can process the images output by the detector in the time domain according to their respective usage requirements, the frame rate output of the detector can be increased or decreased. The frame rate of an optoelectronic system usually refers to the number of complete image signals output by an optoelectronic system using various detectors per second. In the application of a reconnaissance and observation system, the application of a high-frame-rate sensor can effectively improve the response speed of an observer to a target; in the application of an optoelectronic search system, the frame rate of the selected detector needs to be determined according to the system search speed, the sensor field of view, and the field of view overlap rate. Therefore, obtaining an accurate sensor frame rate can effectively ensure the search accuracy and search stability of the optoelectronic search system. In the parameter test of an optoelectronic system, it is necessary to quantitatively test its frame rate to obtain accurate response characteristics and provide data support for evaluating the performance of the optoelectronic system.

[0003] Currently, for the frame rate test of an infrared imaging device, it is mainly divided into two categories: devices that can output a frame rate signal and devices that cannot output a frame rate signal. For devices that can output a frame rate signal, the frame rate of the device under test is mainly measured by a signal generator and an oscilloscope; for devices without a frame rate signal output, the method of continuously measuring the number of frames of the full-field signal output in 1 minute and calculating the number of frames output per second is usually adopted; for devices without a frame rate signal output, a method is proposed to capture the image of a high-brightness flashing LED lamp by the camera under test, and the main control computer is used to process the obtained number of bright and dark images captured within a specified period. The frame rate of the device under test is calculated through this number and the period. This test method can be unaffected by the lack of a synchronization signal between the device under test and the LED, etc., and can also be used for devices that can output a frame rate signal.

[0004] However, the above methods can only test the frame rate of a video and cannot confirm whether each frame image changes in real time with the movement of the target, that is, they are frame rate tests in the electrical sense and cannot confirm the frame rate change of the captured images.

[0005] In view of this, how to provide a method that can perform a frame rate test on real-time images, provide a frame rate test means for obtaining the change of the captured images, and provide technical support for effectively evaluating the video image frame rate of an optoelectronic system has become an urgent technical problem to be solved currently. Summary of the Invention

[0006] The embodiments of the present application provide a method for automatically testing the frame rate of an imaging device, an apparatus for automatically testing the frame rate of an imaging device, a computing device, and a computer-readable storage medium, which are used to solve the synchronization problem between the device under test and the test device, and the problem of the test deficiency in the current frame rate test method that cannot exclude whether two adjacent frames of images are duplicate output images.

[0007] In the first aspect of the embodiments of the present application, a method for automatically testing the frame rate of an infrared imaging device is provided, which is characterized by including:

[0008] Generate a target for circular motion, and use the target as the target image for automatic frame rate testing. Select a circular hole target that meets the preset conditions in the target image as the moving target;

[0009] By adjusting the two-dimensional adjustment mechanism, adjust the imaging of the circular hole target to the middle position of the infrared imaging device under test, where the infrared imaging device under test is placed on the two-dimensional adjustment mechanism;

[0010] Adjust the focal length of the infrared imaging device under test to generate the corresponding target imaging focal plane of the infrared imaging device under test, where the target imaging focal plane is a focal plane with sharp edges and clear circular holes;

[0011] Determine the target amplitude and target frequency corresponding to the moving point target. Through the display and control, control the two-dimensional motion mechanism to start circular motion, and the infrared imaging device under test starts to collect images;

[0012] Send the images stored in the infrared imaging device under test to the frame rate automatic test device for frame rate automatic testing.

[0013] In the second aspect of the embodiments of the present application, an apparatus for automatically testing the frame rate of an infrared imaging device is provided, which is characterized by including:

[0014] A selection module, configured to generate a target for circular motion, and use the target as the target image for automatic frame rate testing. Select a circular hole target that meets the preset conditions in the target image as the moving target;

[0015] An adjustment module, configured to adjust the imaging of the circular hole target to the middle position of the infrared imaging device under test by adjusting the two-dimensional adjustment mechanism, where the infrared imaging device under test is placed on the two-dimensional adjustment mechanism;

[0016] A generation module, configured to adjust the focal length of the infrared imaging device under test to generate the corresponding target imaging focal plane of the infrared imaging device under test, where the target imaging focal plane is a focal plane with sharp edges and clear circular holes;

[0017] A motion module, configured to determine a target amplitude and a target frequency corresponding to a moving point target, and start a circular motion of a two-dimensional motion mechanism through display and control, and the infrared imaging device to be measured starts to acquire images;

[0018] A test module, configured to send the images stored in the infrared imaging device to be measured to a frame rate automatic test device for frame rate automatic test.

[0019] In a third aspect of the embodiments of the present application, a computing device is provided, including:

[0020] A memory and a processor;

[0021] The memory is used to store computer-executable instructions, and the processor is used to execute the computer-executable instructions. When the computer-executable instructions are executed by the processor, the steps of the above-mentioned method for automatically testing the frame rate of an infrared imaging device are implemented.

[0022] According to a fourth aspect of the embodiments of the present application, a computer-readable storage medium is provided, which stores computer-executable instructions. When the instructions are executed by a processor, the steps of the above-mentioned method for automatically testing the frame rate of an infrared imaging device are implemented.

[0023] The present application provides a method for automatically testing the frame rate of an infrared imaging device, including: generating a target for circular motion and using the target as a target image for automatic frame rate testing, and selecting a circular hole target that meets preset conditions in the target image as a moving target; adjusting a two-dimensional adjustment mechanism to adjust the imaging of the circular hole target to the middle position of the infrared imaging device to be measured, where the infrared imaging device to be measured is placed on the two-dimensional adjustment mechanism; adjusting the focal length of the infrared imaging device to be measured to generate a target imaging focal plane corresponding to the infrared imaging device to be measured, where the target imaging focal plane is a focal plane with sharp edges and clear circular holes; determining a target amplitude and a target frequency corresponding to the moving point target, and starting a circular motion of a two-dimensional motion mechanism through display and control, and the infrared imaging device to be measured starts to acquire images; the display and control controls the two-dimensional motion mechanism to perform a corresponding circular motion according to the selected target amplitude and target frequency; sending the images stored in the infrared imaging device to be measured to a frame rate automatic test device for frame rate automatic test.

[0024] Applying the method for automatically testing the frame rate of an infrared imaging device provided by the embodiments of the present application can realize quantitative testing of the image frame rate of a device without frame rate signal output, and the frame rate testing accuracy is better than ±1 Hz.

[0025] The above description is only an overview of the technical solutions of the present application. In order to be able to understand the technical means of the present application more clearly, it can be implemented according to the content of the description. And in order to make the above and other purposes, features and advantages of the present application more obvious and understandable, the following specifically illustrates the specific embodiments of the present application. Brief Description of the Drawings

[0026] By reading the following detailed description of the preferred embodiments, various other advantages and benefits will become clear to those of ordinary skill in the art. The drawings are only for the purpose of showing the preferred embodiments and are not considered as a limitation of the present application. Moreover, throughout the drawings, the same reference numerals are used to represent the same components. In the drawings:

[0027] Figure 1 is a schematic structural diagram of an automatic frame rate testing device for an infrared imaging device provided by an embodiment of the present application;

[0028] Figure 2 is a schematic structural diagram of a display control and testing unit of an automatic frame rate testing device for an infrared imaging device provided by an embodiment of the present application;

[0029] Figure 3 is a schematic structural diagram of a moving target generation unit of an automatic frame rate testing device for an infrared imaging device provided by an embodiment of the present application;

[0030] Figure 4 is a schematic flow diagram of the calculation of a test module of an automatic frame rate testing device for an infrared imaging device provided by an embodiment of the present application;

[0031] Figure 5 is a schematic flow diagram of an automatic frame rate testing method for an infrared imaging device provided by an embodiment of the present application;

[0032] Figure 6 is a schematic flow diagram of another automatic frame rate testing method for an infrared imaging device provided by an embodiment of the present application;

[0033] Figure 7 is a schematic structural diagram of an automatic frame rate testing device for an infrared imaging device provided by an embodiment of the present application. Detailed Embodiments

[0034] The exemplary embodiments of the present disclosure will be described in more detail with reference to the drawings. Although the exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure can be implemented in various forms and should not be limited by the embodiments set forth herein. On the contrary, these embodiments are provided so that the present disclosure can be more thoroughly understood and the scope of the present disclosure can be fully communicated to those skilled in the art.

[0035] The method proposed in the embodiment of the present application provides a basis for selecting the simulated target size, motion frequency, and motion amplitude. It simulates a point target in circular motion at infinity through a projection optical system and simulates the energy of the point target through a blackbody, enabling the point target in circular motion to be clearly imaged in the infrared imaging device under test. The infrared imaging device under test collects images of the moving point target for a certain period and then transmits the images to an industrial control computer. The system test module processes the collected images, obtains the fitted circular trajectory after collection as the reference circle, and performs image processing based on the pixel size, focal length of the device under test, and the frequency and amplitude of the moving point target to obtain the change error between each frame of the image and the reference circle, and judges the inter-frame change of the images, thereby obtaining the frame frequency of the collected image frames with inter-frame changes.

[0036] Compared with the existing test methods, this method uses a continuous circular motion target source, solves the synchronization problem between the device under test and the test device, so this test is not affected by the synchronization between devices. At the same time, the present invention obtains the frame frequency of the test device by comparing the centroid distance and Hausdorff distance between the first frame and other frames, and judges whether two adjacent frames of the collected images are duplicate outputs of the same frame by comparing the angular changes of adjacent frames of the collected images, solving the test deficiency in the current frame frequency test method that cannot exclude whether two adjacent frames of images are duplicate output images while testing the frame frequency.

[0037] See Figure 1 , Figure 1 It is a schematic structural diagram of an automatic frame frequency test device for an infrared imaging device provided by an embodiment of the present application. As Figure 1 shown, the present application mainly consists of a display and control unit, a moving target generation unit, and a projection optical system. Among them, the projection optical system adopts a long-focus and large-field-of-view transmissive structure, with a projection optical system focal length of 500 mm, an exit pupil diameter of 250 mm, a field of view of ±2.5°, and two specifications of wavelength bands: 3um - 5um and 8um - 12um.

[0038] See Figure 2 , Figure 2 It is a schematic structural diagram of the display and control unit of an automatic frame frequency test device for an infrared imaging device provided by an embodiment of the present application. Figure 2The display control and test unit includes a blackbody controller, a horizontal and vertical two-dimensional motion mechanism controller, and an industrial computer (including display control and test programs, and a display). The control of the host computer is realized through RS422 serial communication, which can complete the control of the blackbody controller and the horizontal and vertical two-dimensional motion mechanism controller, so as to realize the control of the blackbody and the two-dimensional motion mechanism; the blackbody controller can control the temperature adjustment of the blackbody and receive the feedback temperature information of the blackbody; the two-dimensional motion mechanism controller can realize the motion of the two-dimensional motion mechanism; the digital video signal of the thermal imager to be measured generates a sequence of raw format pictures, and the original information such as the motion frame frequency of the point target is input in the test module, and the frame frequency of the thermal imager can be obtained through the calculation of the test module. The calculation process of the test module is as Figure 4 shown, where Figure 4 is a schematic diagram of the calculation process of the test module of an infrared imaging device frame frequency automatic test device provided by an embodiment of the present application.

[0039] See Figure 3 , Figure 3 is a schematic diagram of the structure of the moving target generation unit of an infrared imaging device frame frequency automatic test device provided by an embodiment of the present application. Figure 3 The moving target generation unit mainly consists of a blackbody, a target, and a horizontal and vertical two-dimensional motion mechanism. Among them, the blackbody is a differential blackbody, the background sensor is placed on the target frame where the target is placed, and the blackbody is placed behind the target, which can be used to simulate infrared targets with different radiation energies, and the temperature range is adjustable from 5°C to 100°C. The blackbody is temperature-controlled through the display control and test unit; the target is placed on the target frame, and the diameter range of the circular target is 0.1mm - 2.5mm. The target frame is controlled by the horizontal and vertical two-dimensional motion mechanism and can complete a circumferential motion of ±2.5°; the two-dimensional motion mechanism can realize the uniform motion, sine motion, etc. of the target in the horizontal and vertical directions, with a speed accuracy of up to ±5um and an angle accuracy of up to ±2″.

[0040] Figure 1 The infrared imaging device frame frequency automatic test device mainly consists of Figure 2 the display control and test unit, Figure 3 the moving target generation unit, and the projection optical system, and can complete the automatic test and evaluation of the frame frequency of the infrared imaging device.

[0041] Among them, the moving target generation unit is controlled by the display control and test unit, and according to needs, generates point targets with a certain energy and circular motion at a certain frequency and amplitude. After passing through the projection optical system, it can simulate moving infrared targets with different sizes and different radiation energies at infinity; the imaging device to be measured is placed at the front end of the projection optical system, the images are collected and saved, and the captured pictures are processed by the display control and test unit to complete the automatic test of the frame frequency.

[0042] Figure 2The display control and test unit mainly consists of a blackbody controller, a horizontal and vertical two-dimensional motion mechanism controller, a display control and test program, and a display.

[0043] Among them, the blackbody controller is mainly used to control Figure 3 the temperature of the blackbody in the moving target generation unit, and the horizontal and vertical two-dimensional motion mechanism controller is mainly used to control Figure 3 the motion amplitude, motion frequency, and motion form of the horizontal and vertical two-dimensional motion mechanism in the moving target generation unit. The test module in the display control and test program calculates according to Figure 4 the test module calculation flowchart is mainly used to complete the automatic test of the frame rate of the acquired image, and the display is mainly used for image display.

[0044] Figure 3 The moving target generation unit mainly consists of a blackbody, a target, and a horizontal and vertical two-dimensional motion mechanism.

[0045] Among them, the blackbody is mainly used to generate an infrared target source with adjustable radiation energy; the target is of an insert type, and according to the specifications of the thermal imager to be measured, round hole targets of different size specifications are selected to obtain a movable target source for observation; the horizontal and vertical two-dimensional motion machine mainly realizes the circular motion of point targets.

[0046] Figure 4 The test module is mainly used to realize the automatic test of the frame rate. It can support devices with and without video output. The test module performs time-domain and mean filtering, and binarization processing on the acquired picture sequence to obtain the position of the target in the image; it judges the frame rate and eliminates duplicate frames by the centroid distance and Hausdorff distance, and automatically calculates the frame rate of the device under test.

[0047] The calculation process of the test module is as Figure 4 shown.

[0048] The test module calculation flowchart first uses the acquisition card on the industrial computer to collect the digital Cameralink images of the infrared sensor and saves them as a picture sequence in raw format (or uses the picture sequence in raw format provided by the device under test). It performs time-domain and mean filtering on the picture sequence, binarizes each frame of the image, and finds the position of the target in the image; it calculates the centroid of the target in each frame, and judges the centroid distance and Hausdorff distance between each frame from the first frame backward. If the centroid distance and Hausdorff distance between two adjacent frames are less than half of the distance that this frame should travel, it is considered that this frame is the same as the previous frame, and this frame is removed. After the judgment, the remaining number of frames is the actual number of frames of the infrared sensor. It calculates the frames corresponding to the Nth minimum values of the centroid distance and Hausdorff distance between the target in the first frame and the target in each frame respectively; it calculates the average of the frames corresponding to the N minimum values, and divides the number of frames by the time of one cycle corresponding to the point target motion to obtain the frame rate.

[0049] See Figure 5 , Figure 5 which is a schematic flow chart of a method for automatically testing the frame rate of an infrared imaging device provided by an embodiment of the present application. As Figure 5 shown, it specifically includes the following steps.

[0050] Step S501: Generate a target that makes a circular motion, and use the target as the target image for automatic frame rate testing. Select a circular hole target that meets the preset conditions in the target image as the moving target;

[0051] Step S502: Adjust the two-dimensional adjustment mechanism to adjust the imaging of the circular hole target to the middle position of the infrared imaging device under test, where the infrared imaging device under test is placed on the two-dimensional adjustment mechanism;

[0052] Step S503: Adjust the focal length of the infrared imaging device under test to generate a target imaging focal plane corresponding to the infrared imaging device under test, where the target imaging focal plane is a focal plane with sharp edges and clear circular holes;

[0053] Step S504: Determine the target amplitude and target frequency corresponding to the moving point target, and start the circular motion through the display and control to control the two-dimensional motion mechanism. The infrared imaging device under test starts to collect images;

[0054] Step S505: Send the images stored in the infrared imaging device under test to the frame rate automatic test device for frame rate automatic testing.

[0055] See Figure 6 , Figure 6 which is a schematic flow chart of another method for automatically testing the frame rate of an infrared imaging device provided by an embodiment of the present application.

[0056] In the embodiment of the present application, the selection of the circular hole target that meets the preset conditions in the target image includes:

[0057] Based on the focal length of the infrared imaging device under test, the focal length of the optical projection system, and the pixel size of the infrared detector, determine the diameter of the circular hole target in the target image;

[0058] Based on the diameter of the circular hole target, select the circular hole target that meets the preset conditions in the target image as the moving target.

[0059] For the selection of the circular hole target: To ensure that the target can be clearly imaged during the movement, select a circular hole target that is greater than or equal to 3 pixels of the infrared imaging device under test as the moving target. The selection of the circular hole target size is shown in formula (1):

[0060]

[0061] In the formula:

[0062] A is the diameter of the selected circular hole target, with the unit of um;

[0063] f is the focal length of the infrared imaging device under test, with the unit of mm;

[0064] F is the focal length of the optical projection system, with the unit of mm;

[0065] α is the pixel size of the infrared detector, with the unit of um.

[0066] For the self-alignment of the infrared imaging device under test and the optical projection device: Place the infrared imaging device under test on the two-dimensional adjustment mechanism, and adjust the two-dimensional adjustment mechanism to make the circular hole target image at the middle position of the infrared imaging device under test;

[0067] In the embodiment of the present application, adjusting the focal length of the infrared imaging device under test to generate the target imaging focal plane corresponding to the infrared imaging device under test includes:

[0068] By adjusting the blackbody temperature, adjust the imaging of the circular hole target on the infrared imaging device under test to generate the target imaging focal plane corresponding to the infrared imaging device under test.

[0069] In the embodiment of the present application, determining the amplitude and frequency corresponding to the moving point target includes:

[0070] According to the field of view size and the designed frame rate of the infrared imaging device under test, determine the amplitude and frequency corresponding to the moving point target.

[0071] For the focusing of the infrared imaging device under test: Adjust the blackbody temperature to make the energy of the circular hole target clearly image in the middle of the imaging device, and adjust the focal length of the imaging device to make its edge sharp and the circular hole clear to obtain the best focal plane of the imaging device;

[0072] For the setting of the amplitude and frequency of the moving point target: Select the amplitude and frequency of the moving point according to the field of view size and the designed frame rate of the infrared imaging device under test. The maximum moving speed of this system is 10° / S. Taking circular motion as an example, the moving point target makes a sine motion in the x and y directions, and its motion equations are shown in formulas (2) and (3):

[0073] x = Asin(2πft) (2)

[0074] y = Acos(2πft) (3)

[0075] In the formula: x is the angular value of the target deviating from the center of the circle in the horizontal direction, with the unit of °; y is the angular value of the target deviating from the center of the circle in the vertical direction, with the unit of °; A is the amplitude, with the unit of °; f is the frequency, with the unit of Hz.

[0076] The angular velocity of the target's circular motion is shown in Formulas (4) and (5):

[0077]

[0078]

[0079] In the formula: t is the motion time, with the unit of s.

[0080] It can be seen from this that the maximum angular velocity during the circular motion is 2πfA.

[0081] In this imaging device frame rate automatic test equipment, the amplitude A is less than or equal to 2.5°. When A is 2.5°, the frequency setting should be less than or equal to 0.64 Hz.

[0082] In this test equipment, if the period of the device under test is selected as an integer multiple of the point target motion period, the motion frequency of the point target can be selected as 2 Hz, 1 Hz, etc. The amplitude A is selected to be less than or equal to 0.45 times the field of view range of the infrared imaging device under test, so as to ensure that the point target can be clearly imaged within the field of view of the device under test, and avoid unclear imaging caused by off-axis field of view image quality factors. In case of special situations where the off-axis image quality is poor, the required target motion amplitude can be selected according to the actual image situation to ensure that the moving target can be clearly imaged at different positions.

[0083] According to the above limitations, the number of pixel intervals of the moving point is shown in Formulas (6) and (7):

[0084]

[0085]

[0086] In the formula: Δx is the pixel change amount of the adjacent points of the device under test in the x direction; Δy is the pixel change amount of the adjacent points of the device under test in the y direction; f p is the motion point target frequency, with the unit of Hz; f t is the designed frequency of the device under test, with the unit of Hz; A is the amplitude, with the unit of °; N y is the number of pixels in the vertical direction of the device under test; W is the vertical field of view of the device under test, with the unit of °; a N is the angle between the circle in the horizontal direction and the x-axis, with the unit of °.

[0087] Among them, W can be obtained through actual measurement or calculation. The calculation is shown in Formula (8):

[0088]

[0089] In the formula: a is the size of the similar pixels of the device under test, with the unit of um; f is the focal length of the device under test, with the unit of mm.

[0090] For the tested point targets or circular arc segments, a positioning accuracy with a centroid better than ±1 pixel can be obtained. In this test method, considering factors such as sampling error, the threshold of the centroid distance between adjacent points required when changing frames is determined to be 2 pixels in any direction of x and y.

[0091] Combined with the above conditions, for the infrared imaging device under test with a resolution of 640×512, 15um, 300mm, and a focal length of 50Hz, the frame rate of the moving point target is selected as 1Hz, and the amplitude is selected as 0.45 times the vertical field of view (0.66°). The minimum pixel change amounts in the X and Y directions calculated according to formulas (6)-(8) for the interval between two adjacent moving points are 21 pixels, and half of the distance is 10.5 pixels, which is greater than the threshold required for the frame-to-frame change amount. The test frame rate is 50Hz.

[0092] At the same time, it can be calculated according to formulas (6)-(8) that currently this method is suitable for the high-precision automatic frame rate test of infrared devices under test with a minimum resolution of 320×256 and a maximum frame rate of 300Hz, and can cover the mainstream application requirements of current infrared devices.

[0093] In the embodiment of the present application, the step of sending the image stored in the infrared imaging device under test to the frame rate automatic test device further includes: automatically collecting the image stored in the infrared imaging device under test through the frame rate automatic test device.

[0094] For the infrared imaging device under test to collect images: the infrared imaging device under test saves the image and transmits it to the frame rate automatic test device, or collects the image through this frame rate automatic test device.

[0095] In the embodiment of the present application, the step of sending the image stored in the infrared imaging device under test to the frame rate automatic test device for frame rate automatic test includes:

[0096] Sending the image stored in the infrared imaging device under test to the frame rate automatic test device and inputting the motion frame rate corresponding to each moving target;

[0097] Loading the collected image for frame rate automatic test and outputting the image acquisition frame rate and the image effective frame rate.

[0098] In the embodiment of the present application, the step of loading the collected image for frame rate automatic test and outputting the image acquisition frame rate and the image effective frame rate includes:

[0099] Loading the collected image, generating a picture sequence in a target format, and performing binarization processing on the picture sequence to determine the position of the moving target in the picture;

[0100] Calculating the centroid of the moving target in each frame, and judging the centroid distance and Hausdorff distance between the targets in each frame from the first frame backward to obtain the calculation result;

[0101] According to the calculated result, determine the remaining number of frames after completion, and based on the remaining number of frames, determine the actual number of frames for image acquisition;

[0102] Calculate respectively the frames where the minimum values of the centroid distance and Hausdorff distance between the moving target in the first frame and the moving target in each frame are located;

[0103] Determine the average number of frames corresponding to the minimum value, and based on the average number of frames and the time of the target period corresponding to the moving target, determine the effective frame rate of the image.

[0104] Turn on the frame rate test module. First, input the frame rate of the point target movement, then load the acquired images for automatic frame rate test, and finally output the image acquisition frame rate and the effective frame rate of the image as 50 Hz.

[0105] Corresponding to the above method embodiment, this specification also provides an embodiment of an automatic frame rate test device for an infrared imaging device. Figure 7 It is a schematic structural diagram of an automatic frame rate test device for an infrared imaging device provided by an embodiment of the present application. As Figure 7 shown, it specifically includes the following modules.

[0106] A selection module 701, configured to generate a target for circular motion and use the target as the target image for automatic frame rate test, and select a circular hole target that meets the preset conditions in the target image as the moving target;

[0107] An adjustment module 702, configured to adjust the imaging of the circular hole target to the middle position of the measured infrared imaging device by adjusting a two-dimensional adjustment mechanism, where the measured infrared imaging device is placed on the two-dimensional adjustment mechanism;

[0108] A generation module 703, configured to adjust the focal length of the measured infrared imaging device to generate a target imaging focal plane corresponding to the measured infrared imaging device, where the target imaging focal plane is a focal plane with sharp edges and clear circular holes;

[0109] A motion module 704, configured to determine the target amplitude and target frequency corresponding to the moving point target, start circular motion through the display and control to control the two-dimensional motion mechanism, and the measured infrared imaging device starts to acquire images;

[0110] A test module 705, configured to send the images stored in the measured infrared imaging device to an automatic frame rate test device for automatic frame rate test.

[0111] In an alternative embodiment, the selection module 701 is further configured to:

[0112] Determine the diameter of the circular hole target in the target image based on the focal length of the infrared imaging device under test, the focal length of the optical projection system, and the pixel size of the infrared detector.

[0113] Based on the diameter of the circular hole target, select the circular hole targets in the target image that meet the preset conditions as moving targets.

[0114] In an alternative embodiment, the generating module 703 is further configured to:

[0115] By adjusting the blackbody temperature, adjust the imaging of the circular hole target on the infrared imaging device under test to generate the target imaging focal plane corresponding to the infrared imaging device under test.

[0116] In an alternative embodiment, the motion module 704 is further configured to:

[0117] Determine the amplitude and frequency corresponding to the moving point target according to the field of view size and designed frame rate of the infrared imaging device under test.

[0118] In an alternative embodiment, the testing module 705 is further configured to:

[0119] Automatically collect the images stored in the infrared imaging device under test through a frame rate automatic testing device.

[0120] In an alternative embodiment, the testing module 705 is further configured to:

[0121] Send the images stored in the infrared imaging device under test to the frame rate automatic testing device and input the motion frame rates corresponding to each moving target.

[0122] Load the collected images for frame rate automatic testing and output the image acquisition frame rate and the image effective frame rate.

[0123] In an alternative embodiment, the testing module 705 is further configured to:

[0124] Load the collected images, generate a picture sequence in a target format, and perform binarization processing on the picture sequence to determine the positions of the moving targets in the pictures.

[0125] Calculate the centroid of each frame of the moving target, and judge the distance between the target centroids and the Hausdorff distance between each frame from the first frame backward to obtain the calculation result.

[0126] According to the calculation result, determine the remaining number of frames after the end, and based on the remaining number of frames, determine the actual number of image acquisition frames.

[0127] Calculate the frames where the minimum values of the centroid distance and Hausdorff distance between the moving target in the first frame and each frame of the moving target are located respectively.

[0128] Determine the average number of frames corresponding to the minimum value. Based on the average number of frames and the time of the target period corresponding to the moving target, determine the effective frame rate of the image.

[0129] Each embodiment in this specification is described in a progressive manner. For the same or similar parts among the embodiments, reference can be made to each other. Each embodiment focuses on the differences from other embodiments. In particular, for the automatic evaluation and recommendation device based on the association between the analysis model and the label, since it is basically similar to the embodiment of the automatic evaluation and recommendation method based on the association between the analysis model and the label, the description is relatively simple. For the relevant parts, reference can be made to the partial description of the embodiment of the automatic evaluation and recommendation method based on the association between the analysis model and the label.

[0130] In the above embodiments, the descriptions of the embodiments have their own focuses. For the parts not detailed in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0131] The preferred embodiments of this specification disclosed above are only used to help explain this specification. The alternative embodiments do not describe all the details in detail, nor do they limit the invention to the specific embodiments described. Obviously, many modifications and changes can be made according to the content of the embodiments of this specification. These embodiments are selected and specifically described in this specification to better explain the principles and practical applications of the embodiments of this specification, so that those skilled in the art can understand and utilize this specification well. This specification is only limited by the claims and their full scope and equivalents.

Claims

1. An automatic test method for the frame rate of an infrared imaging device, characterized in that, Including: Generate a target of circular motion, and use the target as the target image for automatic frame rate testing. Select a circular hole target that meets the preset conditions in the target image as the motion target. Adjust the two-dimensional adjustment mechanism to adjust the imaging of the circular hole target to the middle position of the infrared imaging device under test, where the infrared imaging device under test is placed on the two-dimensional adjustment mechanism. Adjust the focal length of the infrared imaging device under test to generate the corresponding target imaging focal plane of the infrared imaging device under test, where the target imaging focal plane is a focal plane with sharp edges and clear circular holes. Determine the target amplitude and target frequency corresponding to the moving point target. Control the two-dimensional motion mechanism to start circular motion through the display and control, and the infrared imaging device under test starts to collect images. Send the images stored in the infrared imaging device under test to the frame rate automatic test device for frame rate automatic testing.

2. The method according to claim 1, wherein The step of selecting a circular hole target that meets the preset conditions in the target image as the motion target includes: Based on the focal length of the infrared imaging device under test, the focal length of the optical projection system, and the pixel size of the infrared detector, determine the diameter of the circular hole target in the target image. Based on the diameter of the circular hole target, select a circular hole target that meets the preset conditions in the target image as the motion target.

3. The method according to claim 1, characterized in that, The step of adjusting the focal length of the infrared imaging device under test to generate the corresponding target imaging focal plane of the infrared imaging device under test includes: Adjust the imaging of the circular hole target on the infrared imaging device under test by adjusting the blackbody temperature to generate the corresponding target imaging focal plane of the infrared imaging device under test.

4. The method according to claim 1, wherein The step of determining the target amplitude and target frequency corresponding to the moving point target, controlling the two-dimensional motion mechanism to start circular motion through the display and control, and the infrared imaging device under test starts to collect images includes: According to the field of view size and designed frame rate of the infrared imaging device under test, determine the target amplitude and target frequency corresponding to the circular motion point target. Control the two-dimensional motion mechanism to start circular motion through the display and control, and the infrared imaging device under test starts to collect images.

5. The method according to claim 1, characterized in that, The step of sending the images stored in the infrared imaging device under test to the frame rate automatic test device further includes: Automatically collect the images stored in the infrared imaging device under test through the frame rate automatic test device.

6. The method according to claim 1, wherein The step of sending the images stored in the infrared imaging device under test to the frame rate automatic test device for frame rate automatic testing includes: Send the images stored in the infrared imaging device under test to the frame rate automatic test device and input the motion frame rate corresponding to each motion target. Load the collected images for frame rate automatic testing and output the image acquisition frame rate and the image effective frame rate.

7. The method according to claim 1, characterized in that, The step of loading the collected images for frame rate automatic testing and outputting the image acquisition frame rate and the image effective frame rate includes: Load the collected images, generate a picture sequence in the target format, and perform binary processing on the picture sequence to determine the position of the motion target in the pictures. Calculate the centroid of the motion target in each frame, and judge the distance between the target centroids and the Hausdorff distance between each frame from the first frame backward to obtain the calculation result. According to the calculation result, determine the remaining number of frames after the end, and based on the remaining number of frames, determine the actual number of frames of image acquisition. Calculate the frame numbers corresponding to the minimum values of the centroid distance and Hausdorff distance between the moving target in the first frame and the moving targets in each frame respectively; Determine the average value of the frame numbers corresponding to the minimum values. Based on the average value of the frame numbers and the time of the target period corresponding to the moving target, determine the effective frame rate of the image.

8. An automatic test device for the frame rate of an infrared imaging device, characterized in that, It includes: A selection module, configured to generate a target for circular motion and use the target as the target image for automatic frame rate testing, and select a circular hole target that meets the preset conditions in the target image as the moving target; An adjustment module, configured to adjust the imaging of the circular hole target to the middle position of the infrared imaging device under test by adjusting the two-dimensional adjustment mechanism, where the infrared imaging device under test is placed on the two-dimensional adjustment mechanism; A generation module, configured to adjust the focal length of the infrared imaging device under test to generate a target imaging focal plane corresponding to the infrared imaging device under test, where the target imaging focal plane is a focal plane with sharp edges and clear circular holes; A motion module, configured to determine the target amplitude and target frequency corresponding to the moving point target, start circular motion through the display and control to control the two-dimensional motion mechanism, and the infrared imaging device under test starts to collect images; A test module, configured to send the images stored in the infrared imaging device under test to the frame rate automatic test device for frame rate automatic testing.

9. A computing device, including: A memory and a processor; The memory is used to store computer-executable instructions, and the processor is used to execute the computer-executable instructions. When the computer-executable instructions are executed by the processor, the steps of the method according to any one of claims 1 to 7 are implemented.

10. A computer-readable storage medium, comprising: Computer-executable instructions, where when the computer-executable instructions are executed by the processor, the steps of the method according to any one of claims 1 to 7 are implemented.

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