NVMe solid state disk testing method and device, medium and program product

Abstract

The invention discloses an NVMe solid state disk testing method and device, a medium and a program product, and relates to the field of data processing. The method comprises the following steps: when the temperature in the temperature control box reaches a preset temperature, acquiring the real-time hard disk temperature of a tested hard disk in the temperature control box; when the real-time temperature of the hard disk is kept in a stable temperature range, acquiring reference performance data of the tested hard disk; the temperature control box is controlled to adjust the temperature in the box from the preset temperature; acquiring real-time performance data of the tested hard disk; determining performance change data of the tested hard disk according to the real-time performance data and the reference performance data; when the performance change data reaches a set change threshold value, the fluctuation reaction temperature and the fluctuation reaction time are determined; and determining a temperature fluctuation resistance test result of the tested hard disk according to the fluctuation reaction time and the temperature difference between the preset temperature and the fluctuation reaction temperature in the box. Through the steps of the method, the temperature fluctuation resistance of the NVMe solid state disk can be accurately tested.

Description

Technical Field

[0001] The present invention relates to the technical field of data processing, and particularly to a method, device, medium and program product for testing an NVMe solid state drive. Background Art

[0002] An NVMe (Non-Volatile Memory Express) solid state drive is a hard disk drive that uses non-volatile memory express storage technology. It uses a PCIe (peripheral component interconnect express) interface to directly connect to a computer system, supports the NVMe protocol to optimize the performance of the solid state drive, provides extremely high data transfer speeds and low latency, and is suitable for high-performance computing and data-intensive applications that require fast read and write operations.

[0003] In application scenarios such as portable mobile devices, outdoor monitoring devices, some industrial environments, and edge computing devices, there are often situations where the ambient temperature fluctuates, and temperature has a greater impact on the performance of NVMe solid state drives.

[0004] Therefore, the temperature fluctuation resistance test of NVMe hard disks is crucial for ensuring their reliability and stability under different environmental conditions. The temperature fluctuation resistance test can evaluate the performance changes of the hard disk at different temperatures and temperature fluctuations, so as to understand the ability of the NVMe hard disk to maintain its performance within a certain range without being affected by temperature fluctuations.

[0005] Currently, the related technology lacks a technical solution that can accurately test the temperature fluctuation resistance of NVMe hard disks. Summary of the Invention

[0006] Aiming at the above technical problems and deficiencies, the purpose of the present invention is to provide a method, device, medium and program product for testing an NVMe solid state drive, which can accurately test the temperature fluctuation resistance of the NVMe hard disk.

[0007] To achieve the above object, in a first aspect, the present invention provides an NVMe solid state drive testing method, including: when the temperature inside the temperature control box reaches a preset temperature, obtaining the real-time temperature of the hard disk under test in the temperature control box, where the hard disk under test includes an NVMe solid state drive; when the real-time temperature of the hard disk remains within a stable temperature range, obtaining the reference performance data of the hard disk under test; in the case of determining the reference performance data, controlling the temperature control box to adjust the temperature inside the box starting from the preset temperature; in the case of the temperature inside the box changing, obtaining the real-time performance data of the hard disk under test; according to the real-time performance data and the reference performance data, determining the performance change data of the hard disk under test; when the performance change data reaches a set change threshold, determining the temperature inside the box at this time as the fluctuation response temperature, and determining the adjustment time experienced from the preset temperature to the fluctuation response temperature as the fluctuation response time; according to the fluctuation response time and the temperature difference inside the box between the preset temperature and the fluctuation response temperature, determining the test result of the temperature fluctuation resistance of the hard disk under test.

[0008] The present invention adopts the above technical solution to accurately test the temperature fluctuation resistance of the NVMe solid state drive by precisely controlling and monitoring the temperature change of the hard disk in the temperature control box and the corresponding performance change. First, after the temperature control box reaches the preset temperature and stabilizes, the reference performance data of the hard disk under test is recorded to ensure the consistency of the test starting point. Then, the temperature inside the box is gradually adjusted to simulate the temperature fluctuations that may be encountered in actual use, while continuously collecting the real-time performance data of the hard disk. By comparing the real-time performance data with the reference performance data, the change in the hard disk performance is quantified, and when the change reaches the preset threshold, the fluctuation response temperature and the fluctuation response time are determined. These two parameters directly reflect the response speed and adaptability of the hard disk to temperature changes. Finally, combining the fluctuation response time and the temperature change range, the temperature fluctuation resistance of the hard disk, that is, its ability to maintain performance stability under temperature fluctuations, is comprehensively evaluated. The present invention not only considers the performance of the hard disk at extreme temperatures, but also considers the performance change during the temperature change process, providing a comprehensive evaluation to ensure the reliability and stability of the NVMe solid state drive under various environmental conditions. Through this method, the performance stability of the NVMe hard disk under temperature fluctuations can be accurately tested, thereby evaluating its temperature fluctuation resistance.

[0009] Combined with some embodiments of the first aspect, in some embodiments, controlling the temperature control box to adjust the temperature inside the box starting from the preset temperature includes: generating a temperature control instruction according to a set temperature change rate; sending the temperature control instruction to the temperature control box so that the temperature control box adjusts the temperature inside the box starting from the preset temperature.

[0010] Adopting the technical solution of the above embodiment, by generating a temperature control instruction according to the set temperature change rate and sending it to the temperature control box, precise control of the temperature inside the box is achieved. This operation method makes the test process more operable and controllable, avoids the randomness of temperature adjustment, ensures the consistency and repeatability of the test. For testers, they can accurately adjust the temperature according to the predetermined test plan, providing a reliable basis for accurately evaluating the performance of the hard disk with temperature changes subsequently, helping to improve the standardization level of the test and ensuring the accuracy and reliability of the test results.

[0011] Combined with some embodiments of the first aspect, in some embodiments, before generating the temperature control instruction according to the set temperature change rate, it further includes: determining the temperature change rate according to the preset temperature and the volume of the temperature control box.

[0012] Adopting the technical solution of the above embodiment, considering the factor of the volume of the temperature control box, it can make the determination of the temperature change rate more in line with the actual test environment. Temperature control boxes with different volumes will have different effects on temperature adjustment. By incorporating it into the calculation, the determination of the temperature change rate can be made more scientific and reasonable, improving the accuracy of the temperature adjustment process, thereby providing more targeted and effective data for the subsequent performance test of the NVMe solid-state drive, and further better reflecting the true performance of the hard disk in different environments, providing more accurate conditions for hard disk performance evaluation.

[0013] Combined with some embodiments of the first aspect, in some embodiments, determining the temperature change rate according to the preset temperature and the volume of the temperature control box includes: calculating the temperature change rate according to the preset temperature change rate formula, and the temperature change rate formula includes: ; Wherein, v represents the temperature change rate; v 0 represents the reference temperature change rate; T target represents the target temperature to be adjusted to; T preset represents the preset temperature; T ref represents the reference temperature difference; V represents the volume of the temperature control box; V ref represents the reference volume; m and n are control parameters.

[0014] Adopting the technical solution of the above-mentioned embodiment, this formulaic calculation method provides a standardized and quantitative means for determining the temperature change rate. At the same time, it takes into account various influencing factors, including the target temperature, preset temperature, and the volume of the temperature control box, making the calculation of the temperature change rate more rigorous and meticulous. It can be flexibly adjusted according to different test conditions. By reasonably setting these parameters, it can simulate various complex actual environments and provide an accurate temperature change rate basis for testing the performance of different specifications of NVMe solid-state drives under different temperature scenarios.

[0015] Combined with some embodiments of the first aspect, in some embodiments, according to the fluctuation response time and the temperature difference inside the box between the preset temperature and the fluctuation response temperature, the temperature fluctuation resistance test result of the hard disk under test is determined, including: through a preset temperature fluctuation resistance evaluation formula, the temperature fluctuation resistance test result is calculated, and the temperature fluctuation resistance evaluation formula includes: ; Δ T = T r －T 0 ; Δ P ( t )= P ( t ) －P 0 ; Among them, S represents the temperature fluctuation resistance test result, Δ T represents the temperature difference inside the box, T 0 represents the preset temperature, T r represents the fluctuation response temperature, Δ P ( t ) represents the performance change data, P ( t ) represents the real-time performance data at time t , P 0 is the reference performance data, P th is the set performance change threshold, t r represents the fluctuation response time, α、β is the adjustment parameter.

[0016] Adopting the technical solution of the above embodiment, a temperature fluctuation resistance evaluation formula is introduced to calculate the test result of temperature fluctuation resistance. This formula comprehensively considers multiple important factors, including the integral term of performance change data over time and the logarithmic term of the temperature difference inside the chamber, and the weights can be adjusted according to different test requirements by adjusting parameters. This makes the evaluation of the temperature fluctuation resistance test result more comprehensive and detailed, avoiding the limitations of single-index evaluation, and can evaluate the performance of the hard disk from multiple dimensions such as the change of performance over time and the temperature difference, providing a scientific, quantitative and adjustable evaluation method for accurately evaluating the resistance of the hard disk under temperature fluctuations, which helps to make more precise comparison and screening of different hard disks.

[0017] Combined with some embodiments of the first aspect, in some embodiments, according to the fluctuation response time and the temperature difference inside the chamber between the preset temperature and the fluctuation response temperature, the test result of the temperature fluctuation resistance of the hard disk to be tested is determined, specifically including: when the temperature inside the chamber reaches the fluctuation response temperature, the real-time temperature of the hard disk at this time is determined as the hard disk response temperature; according to the hard disk response temperature, the fluctuation response time and the temperature difference inside the chamber, the test result of the temperature fluctuation resistance is determined.

[0018] Adopting the technical solution of the above embodiment, the determination index of the test result is further refined, making the evaluation of the hard disk performance more accurate. The hard disk response temperature provides the temperature information when the hard disk performance begins to be affected, and together with the fluctuation response time and the temperature difference inside the chamber, it constitutes a more complete evaluation system, providing more abundant data dimensions for testers, helping to more deeply understand the details of the performance change of the hard disk during temperature fluctuations, and more accurately evaluating the temperature fluctuation resistance of the hard disk.

[0019] Combined with some embodiments of the first aspect, in some embodiments, after determining the test result of the temperature fluctuation resistance of the hard disk to be tested according to the fluctuation response time and the temperature difference between the preset temperature and the fluctuation response temperature, it further includes: controlling the temperature inside the chamber to adjust from the fluctuation response temperature to the preset temperature; when the temperature inside the chamber is adjusted to the preset temperature, determining the recovery time for the real-time temperature of the hard disk to recover from the hard disk response temperature to within the stable temperature range; and determining the test result of the temperature fluctuation recovery ability of the hard disk to be tested according to the recovery time.

[0020] Adopting the technical solution of the above embodiment, the test method is further improved, and the test of the NVMe solid-state drive can be extended to the evaluation of the thermal recovery performance. It not only pays attention to the resistance of the hard disk during the temperature rise process, but also considers the recovery ability during the temperature drop, making the performance evaluation of the NVMe solid-state drive more comprehensive. By measuring the recovery time, the self-regulation and recovery ability of the hard disk after temperature fluctuations can be better understood, providing a more complete evaluation of the performance of the product in application scenarios with frequent temperature changes, and providing a more comprehensive reference for the optimization and practical application of the hard disk.

[0021] In a second aspect, an embodiment of the present invention provides an electronic device, including: one or more processors and a memory; the memory is coupled to the one or more processors, and the memory is used to store computer program code, the computer program code includes computer instructions, and the one or more processors call the computer instructions to cause the electronic device to execute the method described in the first aspect or the second aspect, and any possible implementation manner in the first aspect or the second aspect.

[0022] In a third aspect, the present invention provides a computer-readable storage medium, including instructions, when the above instructions run on the above electronic device, causing the above electronic device to execute the method described in the first aspect or the second aspect, and any possible implementation manner in the first aspect or the second aspect.

[0023] In a fourth aspect, the present invention provides a computer program product containing instructions, when the above computer program product runs on the above electronic device, causing the above electronic device to execute the method described in the first aspect or the second aspect, and any possible implementation manner in the first aspect or the second aspect.

[0024] It can be understood that the electronic device provided in the second aspect above, the storage medium provided in the third aspect, and the computer program product provided in the fourth aspect are all used to execute the method provided by the present invention. Therefore, the beneficial effects that can be achieved can refer to the beneficial effects in the corresponding method, and will not be elaborated here.

[0025] One or more technical solutions provided by the present invention have at least the following technical effects or advantages: 1. A comprehensive NVMe solid-state drive test process is provided, covering multiple aspects from temperature control to performance data acquisition and analysis. First, it places the hard disk in a temperature control box, obtains baseline performance data after reaching the preset temperature and stabilizing, then adjusts the temperature inside the box and continuously obtains real-time performance data to calculate the performance change. When the performance change reaches the threshold, key indicators such as the fluctuation response temperature and the fluctuation response time are determined, and then the temperature fluctuation resistance test result is obtained through a series of complex calculations. Moreover, it further involves adjusting the temperature back to the preset temperature from the fluctuation response temperature and measuring the recovery time to evaluate the temperature fluctuation recovery ability. This complete test process makes the performance evaluation of the NVMe solid-state drive more systematic and comprehensive, can comprehensively examine the performance of the hard disk under different temperature conditions, including various situations during temperature rise and fall, provides rich data for the performance evaluation of the product, helps to deeply understand the performance characteristics of the hard disk under different temperature scenarios, and provides comprehensive performance information for the research, production, and application of the hard disk.

[0026] 2. In terms of temperature control, the present invention demonstrates a high degree of precision. By considering the preset temperature and the volume of the temperature control box, using a specific temperature change rate formula to determine the temperature change rate, and generating and sending temperature control instructions according to this rate, the accuracy and controllability of temperature adjustment are ensured, avoiding the randomness and inaccuracy of temperature adjustment that may occur in previous tests. At the same time, in terms of performance evaluation, a complex temperature fluctuation resistance evaluation formula is used, comprehensively considering multiple dimensions such as the change of performance over time and the temperature difference. By adjusting the parameter settings, the evaluation becomes more scientific and flexible, and the performance of the hard disk can be quantitatively evaluated from multiple important indicators and different perspectives, thus realizing a detailed and accurate test of the hard disk performance, providing a more scientific and quantitative means for performance comparison and screening between different hard disks, and helping to improve the accuracy and reliability of the evaluation.

[0027] 3. The comprehensive consideration of the hard disk performance not only focuses on the temperature fluctuation resistance of the hard disk during the temperature rise process, but also evaluates the recovery ability of the hard disk when the temperature drops. During the test process, through a series of operations and index calculations, the resistance of the hard disk during temperature fluctuations can be accurately determined, including the fluctuation response time, the fluctuation response temperature, and the corresponding temperature difference, etc. On this basis, the temperature inside the box is further adjusted back to the preset temperature from the fluctuation response temperature, and the recovery time for the hard disk to recover from the hard disk response temperature to the stable temperature range is measured to evaluate the temperature fluctuation recovery ability. This comprehensive consideration makes our understanding of the hard disk performance more complete, avoiding the limitations of evaluating from a single resistance perspective, providing more comprehensive information about the performance of the hard disk in actual applications, helping to better select and use hard disks in various scenarios with frequent temperature fluctuations, and at the same time providing comprehensive guidance for the performance optimization and improvement of the hard disk, ensuring the reliability and stability of the hard disk in different environments. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] The drawings herein are incorporated into the specification and form a part of this specification, showing embodiments consistent with the present invention, and are used together with the specification to explain the principles of the present invention. Obviously, the drawings in the following description are only some embodiments of the present invention. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts. In the drawings: Figure 1 is a schematic flow chart of a method for testing an NVMe solid state drive according to an embodiment of the present invention; Figure 2 is a schematic diagram of an application scenario of a method for testing an NVMe solid state drive according to an embodiment of the present invention; Figure 3 is a schematic flow chart of another method for testing an NVMe solid state drive according to an embodiment of the present invention; Figure 4 It is a schematic diagram of the architecture of an electronic device according to an embodiment of the present invention. Specific embodiments

[0029] The terms used in the following embodiments of the present invention are only for the purpose of describing specific embodiments and are not intended to limit the present invention. As used in the specification of the present invention, the singular forms "a", "an", "the above", "the", and "this" are also intended to include the plural forms unless the context clearly indicates otherwise. It should also be understood that the term "and / or" used in the present invention refers to any or all possible combinations including one or more of the listed items.

[0030] Hereinafter, the terms "first" and "second" are only used for descriptive purposes and cannot be construed as implying relative importance or implicitly indicating the quantity of the indicated technical features. Thus, the features defined with "first" and "second" may explicitly or implicitly include one or more of such features. In the description of the embodiments of the present invention, unless otherwise specified, the meaning of "a plurality" is two or more.

[0031] It should also be noted that, unless otherwise clearly specified and defined, in the embodiments of the present invention, terms such as "arranged" and "connected" should be understood in a broad sense. For example, "connected" may be a fixed connection, a detachable connection, or an integral connection; it may be a mechanical connection or an electrical connection; it may be a direct connection or an indirect connection through an intermediate medium, and it may be the communication inside two elements; it may be a wired communication connection or a wireless communication connection. For those of ordinary skill in the art, the specific meanings of the above terms in the present invention can be understood according to specific circumstances. The embodiments of the present invention will be specifically described below.

[0032] The embodiments of the present invention provide a method for testing an NVMe solid-state drive, which can accurately evaluate the performance and temperature fluctuation resistance of the NVMe solid-state drive at different temperatures.

[0033] First, after raising the temperature inside the temperature control box to a preset temperature, the real-time temperature of the hard disk under test is obtained to ensure that it is within a stable temperature range. The reference performance data obtained at this time provides an important reference for subsequent comparisons. Then, after determining the reference performance data, the temperature control box is controlled to adjust the temperature inside the box starting from the preset temperature. As the temperature inside the box changes, the real-time performance data of the hard disk under test is continuously obtained. By comparing the real-time performance data and the reference performance data, the performance change data of the hard disk under test can be determined.

[0034] When the performance change data reaches the set change threshold, the internal temperature of the box at this time is determined as the fluctuation response temperature, which reflects the node at which the hard disk performance begins to show obvious fluctuations under temperature changes. The adjustment time experienced from the preset temperature to the fluctuation response temperature is determined as the fluctuation response time, which reflects the time length experienced by the hard disk performance from stability to obvious fluctuations.

[0035] Finally, the temperature fluctuation resistance test result of the hard disk under test is determined according to the fluctuation response time and the temperature difference inside the box between the preset temperature and the fluctuation response temperature. If the fluctuation response time is long and the temperature difference inside the box is large, it means that the hard disk can maintain stable performance for a long time during the temperature change process, and a large temperature change amplitude is required to show obvious performance fluctuations, which indicates that the hard disk has good temperature fluctuation resistance; on the contrary, if the fluctuation response time is short and the temperature difference inside the box is small, it means that the hard disk is more sensitive to temperature changes and has weak temperature fluctuation resistance.

[0036] The following will specifically describe the method of this embodiment in conjunction with Figure 1 as follows, including the following steps: Step 201, when the internal temperature of the temperature control box reaches the preset temperature, obtain the real-time temperature of the hard disk under test in the temperature control box.

[0037] Among them, the hard disk under test includes an NVMe solid-state drive. It can be understood that for the convenience of explanation, the hard disk under test or the NVMe solid-state drive is simply referred to as the hard disk in the following text.

[0038] The temperature control box has an accurate temperature control function and can stabilize the internal temperature at the preset temperature according to the test requirements. The temperature control box usually consists of a temperature control system, heating and cooling elements, temperature sensors, etc. As Figure 2 shown, the temperature control box is connected to the test device, can receive instructions from the test device, accurately adjust the internal temperature of the box, and can perform heating or cooling operations at different rates. The temperature sensor can monitor the internal temperature of the box in real time and feedback the temperature data to the test device to ensure the accuracy and stability of the temperature. The design of the temperature control box is aimed at providing a controllable temperature environment for the solid-state drive.

[0039] In this embodiment, temperature sensors can be installed on the hard disk, and these sensors can directly measure the surface temperature of the hard disk or the temperature of key internal components to obtain the real-time temperature of the hard disk, and transmit these temperature data to the connected test device.

[0040] Alternatively, utilize the built-in temperature monitoring function of the hard disk itself. If the hard disk has such a function, the real-time temperature reported by the hard disk can be read through specific software or interfaces. In addition, external temperature monitoring devices, such as infrared thermometers, can be used to perform non-contact temperature measurement on the hard disk from the outside. Regardless of which method is adopted, it is necessary to ensure the accuracy and timeliness of temperature measurement in order to provide reliable temperature data for subsequent test steps.

[0041] Step 202, when the real-time temperature of the hard disk remains within a stable temperature range, obtain the baseline performance data of the hard disk under test.

[0042] Among them, the baseline performance data includes key performance indicator data such as sequential read and write speeds, random read and write speeds, IOPS (number of input / output operations per second), and response time of the hard disk under test within the stable temperature range.

[0043] Specifically, the test device can use professional hard disk performance test software, such as CrystalDiskMark, ASSD Benchmark, etc. These software can comprehensively test key performance indicators such as sequential read and write speeds, random read and write speeds, and IOPS of the hard disk.

[0044] At the same time, the performance monitoring tools built into the operating system can also be combined, such as the Task Manager or Resource Monitor in the Windows system, to obtain the performance performance of the hard disk under different operations, such as data transfer rate, response time, etc. In addition, for server-level NVMe solid-state drives, special server performance monitoring software and tools can also be used, and these tools can usually provide more detailed and accurate performance data.

[0045] During the process of obtaining the baseline performance data, multiple tests should be carried out and the average value should be taken to reduce the influence of accidental factors and ensure that the obtained baseline performance data has high reliability and representativeness.

[0046] Step 203, when the baseline performance data is determined, control the temperature control box to adjust the temperature inside the box starting from the preset temperature.

[0047] In this embodiment, the test device usually has special control software and a communication module, and establishes a connection with the temperature control box through this communication module. For example, it can be a wired connection (such as a serial cable, USB cable, etc.) or a wireless connection (such as Bluetooth, Wi-Fi, etc.). The control software of the test device will send detailed temperature adjustment instructions to the temperature control box, and the instructions clearly specify the target temperature and the rate and method of temperature adjustment, such as linear heating, exponential heating, etc. After receiving the instructions, the temperature control box starts its internal heating or cooling mechanism to adjust the temperature inside the box.

[0048] The test device continuously receives the real-time temperature data fed back by the temperature control box, and determines whether the progress of temperature adjustment meets the expectations by analyzing this data. If a deviation occurs during the temperature adjustment process, the test device will promptly adjust the command parameters and send them to the temperature control box again. For example, if the temperature rises too slowly, the test device may increase the heating power of the temperature control box or adjust the working time ratio of the heating element.

[0049] Meanwhile, the test device can precisely control the temperature control box to reach specific temperature values at different time nodes according to the preset complex temperature change scenarios, so as to better simulate various temperature change situations that may be encountered in actual use, and provide an accurate and diverse temperature environment for the performance test of the NVMe solid-state drive.

[0050] Step 204: Under the condition of the temperature change inside the box, obtain the real-time performance data of the hard disk under test.

[0051] Specifically, the test device can use the built-in performance monitoring module to communicate with the hard disk and continuously read the key performance indicators of the hard disk at different temperatures. For example, the test device can send commands to the hard disk at regular intervals to request information such as the current read and write speeds, response times, and data transmission stability. At the same time, the test device can also combine professional hard disk performance test software and obtain more detailed performance data through the interfaces provided by the software.

[0052] The test device continuously collects data according to the preset time interval to ensure that the subtle changes in the hard disk performance during the temperature change process can be captured. During the data collection process, the test device will perform real-time processing and analysis on the data, screen out the effective performance data, and store it for subsequent comparison and analysis. In addition, the test device can also cooperate with other external monitoring devices, such as temperature sensors, to associate the temperature data with the hard disk performance data in order to more comprehensively understand the performance of the hard disk at different temperatures. Through these methods, the test device can accurately obtain the real-time performance data of the hard disk under test under the condition of the temperature change inside the box.

[0053] Step 205: Determine the performance change data of the hard disk under test according to the real-time performance data and the reference performance data.

[0054] Specifically, for each specific performance metric, such as read / write speed, response time, IOPS, etc., the test device will conduct precise comparative analysis. Taking read / write speed as an example, the test device will perform a subtraction operation on the read / write speed values obtained in real time at different temperatures and the read / write speed in the previously determined benchmark performance data to obtain the speed difference. Then, this difference is divided by the benchmark read / write speed and multiplied by 100% to obtain the percentage change in read / write speed. For response time, a similar operation is carried out to calculate the percentage change in response time. For IOPS, the change range is also calculated by comparing the real-time value and the benchmark value.

[0055] Next, the test device will assign different weights to each performance metric according to different application scenarios and test requirements. For example, if the read / write speed is more important in a certain specific application, then the read / write speed metric may be assigned a larger weight; while the response time may have a greater weight in some scenarios with high requirements for immediacy. By the method of weighted average, the percentage changes of each performance metric are multiplied by the corresponding weights and then added together to obtain a comprehensive performance change value.

[0056] Throughout the process, the test device will continuously record the time points when performance changes occur and the corresponding temperature values. This can clearly show the relationship between performance changes and temperature changes. For example, in which temperature range the performance begins to show obvious changes, and whether the change trend is linear or non-linear. At the same time, the test device will also analyze the stability of performance changes to determine whether the performance changes are continuously and steadily decreasing or increasing, or there are fluctuations. If there are fluctuations, analyze the amplitude and frequency of the fluctuations to determine the performance stability of the hard disk at different temperatures. Through these detailed and comprehensive analysis processes, the test device can accurately determine the performance change data of the hard disk under test, providing a strong basis for evaluating the temperature fluctuation resistance of the hard disk.

[0057] Step 206, when the performance change data reaches the set change threshold, determine the temperature inside the chamber at this time as the fluctuation response temperature, and determine the adjustment time experienced from the preset temperature to the fluctuation response temperature as the fluctuation response time.

[0058] Specifically, when the performance change data reaches the set change threshold, the test device will perform the following operations to determine the fluctuation response temperature and the fluctuation response time. First, for the determination of the fluctuation response temperature, the test device will continuously monitor the temperature inside the chamber and the performance change data of the hard disk under test. Once the performance change data meets the set threshold conditions, the test device immediately reads the temperature inside the temperature control chamber at this time and marks this temperature as the fluctuation response temperature. This means that at this temperature, the performance change of the hard disk reaches a critical level, which may have a greater impact on the normal use or stability of the hard disk.

[0059] For the determination of the fluctuation response time, the test device records the starting time point when the temperature inside the chamber starts to be adjusted from the preset temperature, and the time point when the performance change data reaches the threshold. By calculating the time difference between these two time points, the adjustment time experienced from the preset temperature change to the fluctuation response temperature, i.e., the fluctuation response time, can be determined.

[0060] By accurately determining the fluctuation response temperature and the fluctuation response time, the test device can more comprehensively evaluate the temperature fluctuation resistance of the hard disk under test, providing important reference bases for the design, production, and use of the hard disk.

[0061] Step 207: Determine the test result of the temperature fluctuation resistance of the hard disk under test according to the fluctuation response time and the temperature difference inside the chamber between the preset temperature and the fluctuation response temperature.

[0062] When determining the test result of the temperature fluctuation resistance of the hard disk under test, the test device mainly relies on two key factors: the fluctuation response time and the temperature difference inside the chamber between the preset temperature and the fluctuation response temperature.

[0063] First of all, the fluctuation response time reflects the time length experienced by the hard disk performance from the stable state to the obvious change. If the fluctuation response time is longer, it means that the hard disk can maintain the performance stability for a relatively long time during the temperature change process. This indicates that the hard disk has a lower sensitivity to temperature changes and has a better ability to resist the influence of temperature changes. For example, in some environments with relatively slow temperature fluctuations, such a hard disk can continuously work stably and will not quickly experience a performance decline due to the gradual change of temperature.

[0064] Secondly, the temperature difference inside the chamber between the preset temperature and the fluctuation response temperature reflects the temperature change range required to trigger the performance change of the hard disk. A larger temperature difference indicates that the hard disk will experience a performance change within a relatively large temperature change range, which also reflects that the hard disk has a stronger resistance to temperature changes. For example, in some environments with relatively drastic temperature changes, a hard disk with better temperature fluctuation resistance can maintain relative stability of performance within a large temperature fluctuation range and will not immediately lose its due performance due to a large temperature change.

[0065] Taking into comprehensive consideration the fluctuation response time and the temperature difference inside the box, the test device can comprehensively evaluate the stability and reliability of the hard disk under test under different temperature change conditions. If a hard disk has a long fluctuation response time and a large temperature difference inside the box, then the test device can determine that the hard disk has good temperature fluctuation resistance under different temperature environments, its performance is not easily affected by temperature fluctuations, and it can maintain stable and reliable performance within a large temperature range. On the contrary, if the fluctuation response time is short and the temperature difference inside the box is small, it can be determined that the hard disk under test has weak temperature fluctuation resistance and is prone to performance instability when the temperature changes, and its performance is easily affected by temperature fluctuations.

[0066] In this embodiment, the above method is adopted to accurately evaluate the temperature fluctuation resistance of the NVMe solid-state drive by precisely controlling and monitoring the real-time temperature and performance data of the NVMe solid-state drive in the temperature control box. When the temperature control box reaches the preset temperature and the hard disk temperature is stable, the reference performance data of the hard disk under test is recorded. Then, the temperature inside the box is gradually adjusted to simulate the temperature fluctuations that may be encountered in actual applications, while continuously monitoring the performance changes of the hard disk. By comparing the real-time performance data with the reference data, the change in the hard disk performance can be quantified, and the fluctuation response temperature and the fluctuation response time can be determined when the change reaches the preset threshold. These two parameters directly reflect the response speed and adaptability of the hard disk to temperature changes. Finally, combining the fluctuation response time and the temperature change range, the temperature fluctuation resistance of the hard disk under test is evaluated, that is, its ability to maintain stable performance under temperature fluctuations. This method not only considers the real-time performance of the NVM hard disk at different temperatures, but also considers the performance changes during the temperature change process, and can accurately evaluate the temperature fluctuation resistance of the NVMe hard disk to ensure the reliability and stability of the NVMe hard disk under various temperature conditions.

[0067] The following combines Figure 3 to specifically illustrate the method of this embodiment, including the following steps.

[0068] Step 301, when the temperature inside the temperature control box reaches the preset temperature, obtain the real-time temperature of the hard disk under test in the temperature control box.

[0069] This step can refer to the description in the foregoing embodiment and will not be elaborated here.

[0070] Step 302, when the real-time temperature of the hard disk remains within the stable temperature range, obtain the reference performance data of the hard disk under test.

[0071] This step can refer to the description in the foregoing embodiment and will not be elaborated here.

[0072] Step 303, in the case of determining the reference performance data, generate a temperature control instruction according to the set temperature change rate.

[0073] Among them, a reasonable temperature change rate can more realistically simulate the temperature change situations that may be encountered in actual application scenarios. The test device needs to comprehensively consider various factors to determine this temperature change rate, such as the possible temperature fluctuation amplitude and speed in different application scenarios. If the temperature change rate is too fast, it may lead to inaccurate test results because the hard disk may not be able to make a real performance response under such rapid temperature changes; while if the temperature change rate is too slow, it will prolong the test time and reduce the test efficiency. By precisely calculating and selecting an appropriate temperature change rate, the temperature control instructions generated by the test device can ensure that the subsequent temperature adjustment process is both practically meaningful and can efficiently conduct the test.

[0074] In some embodiments, it is necessary to first determine the temperature change rate according to the preset temperature and the volume of the temperature control box.

[0075] Among them, the preset temperature provides a reference for the starting point and the target range of temperature adjustment. If the difference between the preset temperature and the typical temperature that the hard disk may face during actual use is large, for example, when simulating extreme environments, the temperature change rate can be appropriately slowed down to more carefully observe the performance changes of the hard disk under a large temperature span and avoid inaccurate test results caused by rapid temperature changes.

[0076] Secondly, the volume of the temperature control box also plays an important role in determining the temperature change rate. A larger volume means that there is more air in the temperature control box, and it takes longer to adjust the temperature uniformity. At this time, if the temperature change rate is too fast, it may lead to too large a temperature difference at different positions in the box, affecting the accurate assessment of the hard disk's temperature fluctuation resistance. Therefore, for a temperature control box with a large volume, a relatively slow temperature change rate should be selected to ensure that the temperature in the box changes uniformly and stably. For a temperature control box with a smaller volume, it is relatively easy to achieve temperature uniformity adjustment. On the premise of ensuring test accuracy, the temperature change rate can be appropriately increased according to factors such as the difference between the preset temperature and the actual application scenario to improve the test efficiency.

[0077] Specifically, the temperature change rate can be calculated according to the temperature change rate formula. The temperature change rate formula includes: ; In the above formula, v represents the temperature change rate to be calculated (℃ / min); v 0 represents the reference temperature change rate (℃ / min), which is a preset reference rate and can be determined according to past experience or test results of similar devices; T target represents the target temperature to be adjusted to; T preset represents the preset temperature;T ref represents the reference temperature difference. A fixed standard temperature difference can be selected for normalization to adjust the temperature change rate according to different temperature ranges, avoiding deviations in the calculation of the temperature change rate due to different test temperature ranges; V represents the volume of the temperature control box; V ref represents the reference volume. A fixed volume can be selected for normalization; m and n are control parameters that can be determined based on prior experimental tests.

[0078] This temperature change formula comprehensively considers the reference temperature change rate, the target and preset temperature difference, the volume of the temperature control box, and specific control parameters. Through the interaction of these factors, it dynamically adjusts the temperature change rate, ensuring the adaptability and accuracy of the test. The temperature difference normalization in the formula makes the test results in different temperature ranges comparable, while the volume adjustment term considers the influence of temperature control boxes of different sizes on the thermal response. The introduction of control parameters allows for fine-tuning according to specific test conditions and equipment characteristics, so that the calculated temperature change rate is both scientific and practical, suitable for test environments with different volume and temperature requirements.

[0079] Step 304: Send a temperature control instruction to the temperature control box so that the temperature control box adjusts the temperature inside the box starting from the preset temperature.

[0080] Among them, the test device serves as the control center. Through communication with the temperature control box, it ensures that the temperature control box can accurately execute the temperature control instruction. After receiving the instruction, the temperature control box will adjust the temperature inside the box in a specific manner and speed according to the requirements in the instruction. The test device needs to continuously monitor the temperature adjustment process of the temperature control box to ensure that the temperature change meets the expectations. If there are inaccuracies or instabilities in the temperature adjustment, the test device needs to make timely adjustments or resend the instruction. In this way, the test device can effectively control the entire temperature adjustment process and provide reliable environmental conditions for obtaining the performance data of the hard disk under test at different temperatures.

[0081] Step 305: Obtain the real-time performance data of the hard disk under test under the condition of temperature change inside the box.

[0082] This step can refer to the description in the foregoing embodiments and will not be elaborated here.

[0083] Step 306: Determine the performance change data of the hard disk under test according to the real-time performance data and the reference performance data.

[0084] This step can refer to the description in the foregoing embodiments and will not be elaborated here.

[0085] Step 307: When the performance change data reaches the set change threshold, determine the temperature inside the chamber at this time as the fluctuation response temperature, and determine the adjustment time experienced from the preset temperature to the fluctuation response temperature as the fluctuation response time.

[0086] This step can refer to the description in the foregoing embodiments and will not be elaborated here.

[0087] Step 308: Determine the test result of the temperature fluctuation resistance of the hard disk under test according to the fluctuation response time and the temperature difference inside the chamber between the preset temperature and the fluctuation response temperature.

[0088] Specifically, through a preset temperature fluctuation resistance evaluation formula, calculate the temperature fluctuation resistance test result. The temperature fluctuation resistance evaluation formula includes: ; Δ T = T r －T 0 ; Δ P ( t )= P ( t ) －P 0 ; In this formula, S represents the temperature fluctuation resistance test result, Δ T represents the temperature difference inside the chamber, T 0 represents the preset temperature, T r represents the fluctuation response temperature, Δ P ( t ) represents the performance change data, P ( t ) represents the real-time performance data at time t , P 0 is the reference performance data, P th is the set performance change threshold, t r represents the fluctuation response time, α、β is an adjustment parameter, which can be calibrated through a large number of experiments and adjusted and determined based on field experience.

[0089] In item, the integral is from the time t = 0 when the temperature starts to be adjusted to the fluctuation response time t r .

[0090] e-αt It is an exponential decay function, and its value gradually decreases as time increases. This indicates that during the test, the closer to the fluctuation response time, the smaller the contribution of this part to the overall result, because the performance is more likely to change later and the contribution to the temperature fluctuation resistance is lower. For example, at the initial stage of a sudden temperature change, the hard disk needs to adapt quickly, and at this time, performance fluctuations may cause data packet loss or delays, while subsequent fluctuations have less impact due to system regulation.

[0091] α > 0, which is used to control the influence weight of performance changes on the integral part. α The acquisition method of is as follows: 1) Experimental design: In a controllable temperature control environment, conduct stepped temperature change tests on multiple NVMe solid-state drives (such as rising from 25°C to 60°C at a rate of 5°C / min), and record the change curves of performance data (read / write speed, response time, IOPS) over time.

[0092] 2) Data fitting: Use the least squares method or the gradient descent algorithm to adjust α to minimize the residual between the integral term of the formula and the measured performance decay curve. For example, if the early performance fluctuations have a significant impact on stability, α needs to be increased to strengthen the time decay effect (such as α = 0.05); if the later fluctuations are still critical, then decrease α (such as α = 0.02).

[0093] 3) Verification criterion: Evaluate the consistency between the predicted S value and the actual failure rate through the correlation coefficient (R²). If R² ≥ 0.85, the value of α is valid. Among them, the correlation coefficient R² is an index to measure the degree of coincidence between the predicted value and the actual data change, and its value range is 0 - 1. The closer it is to 1, the stronger the ability to explain the data change.

[0094] Among them, represents the relative stability of performance and can be used as a stability factor: When ∣Δ P ( t )∣ = 0, that is, when the performance does not change, this item is 1, indicating that the performance is completely stable; when ∣Δ P ( t )∣ = P th , that is, when the performance change threshold is reached), this item is 0, indicating that the performance just begins to show obvious changes. In this way, the performance change is incorporated into the integral calculation, and by multiplying the exponential decay function, the contribution to the temperature fluctuation resistance is calculated according to the performance stability within the time before the performance starts to change.

[0095] It should be noted that in this temperature fluctuation resistance evaluation formula, the absolute value |ΔP(t)| of ΔP(t) is calculated. Even if the positive and negative of different indicators cancel each other out, resulting in ΔP(t) approaching zero, |ΔP(t)| will still accumulate the absolute value changes of each indicator to ensure that performance fluctuations are fully captured.

[0096] When the performance change approaches the threshold P th the stability factor approaches zero, highlighting the negative impact of significant deviation from the benchmark. If ΔP(t) = 0 (no change in all indicators), then this factor is 1, representing complete stability; if there is positive and negative cancellation, |ΔP(t)| will still accumulate fluctuations to avoid misjudgment.

[0097] In βln ( 1+ Δ T ) term, ln ( 1+ Δ T ) processes the temperature difference Δ T . The logarithmic function is used because it has the characteristic of slow growth. When Δ T is small, its growth is slow, and when Δ T is large, its growth rate will not be too fast, which conforms to the evaluation logic of the temperature difference, that is, the larger the temperature difference, the greater the contribution to the temperature fluctuation resistance, but the growth rate will not increase linearly. For example, the impact of the temperature rising from 30°C to 40°C may be less than the impact of rising from 50°C to 60°C. The logarithmic function can more smoothly depict this non-linear relationship and avoid result distortion under large temperature differences.

[0098] β > 0 is used to adjust the influence weight of the temperature difference on the overall result. The way to obtain β is as follows: 1) Experimental design: Set multiple groups of temperature differences ΔT (such as 10°C, 20°C, 30°C), test the hard disk performance at the same temperature change rate, and record the relationship between ΔT and the performance degradation rate.

[0099] 2) Logarithmic function adaptation: If the performance degradation rate grows non-linearly with ΔT (for example, the degradation rate at ΔT = 20°C is 1.5 times that at ΔT = 10°C), then by adjusting β, the β ln(1 + ΔT) in the formula is matched with the actual trend. For example, if the measured data is fitted as the performance degradation rate = 0.3ln(1 + ΔT), then β = 0.3.

[0100] In the experiment, the Taguchi method can also be used to design multi-factor experiments, combining different α 、 β values (such as α = 0.02 / 0.05, β= 0.1 / 0.3), test the correlation between the S value and the actual performance under each set of parameters, and select the optimal combination. At the same time, an optimization algorithm (such as a genetic algorithm) can also be embedded in the test to dynamically adjust α、β according to the real-time test data to ensure that the formula adapts to different hard disk models and temperature change modes.

[0101] The S calculated in this embodiment is a numerical value of the temperature fluctuation resistance test result. S The larger the value, the better the temperature fluctuation resistance of the hard disk.

[0102] The temperature fluctuation resistance evaluation formula of this embodiment combines integration and logarithmic functions, comprehensively considers the influence of performance changes and temperature differences on temperature fluctuation resistance, and at the same time can flexibly adjust the weights of the two by adjusting parameters, and can evaluate the temperature fluctuation resistance of NVMe solid state drives more comprehensively and meticulously.

[0103] In some embodiments, this step 308 may further specifically include: when the temperature inside the box reaches the fluctuation response temperature, determining the real-time temperature of the hard disk at this time as the hard disk response temperature; determining the temperature fluctuation resistance test result according to the hard disk response temperature, the fluctuation response time and the temperature difference inside the box.

[0104] Specifically, when the test device conducts a temperature fluctuation resistance test on the NVMe solid state drive, it will adjust the temperature inside the temperature control box and continuously monitor the hard disk performance data. During the temperature adjustment process, once the change data of the hard disk performance reaches the preset change threshold, the temperature inside the box at this time will be marked as the fluctuation response temperature. At the same time, the test device will record the real-time temperature of the hard disk at this time and define it as the hard disk response temperature. The hard disk response temperature is a very important indicator, which represents the actual temperature state when the hard disk performance begins to change significantly, and can accurately reflect the instantaneous temperature at which the hard disk responds to temperature fluctuations. This temperature can clearly indicate under what temperature environment the performance of the hard disk begins to be significantly affected, providing key data support for subsequent analysis and evaluation.

[0105] In the comparative test of different hard disks, the hard disk response temperature is a very valuable reference, which can help to deeply understand the temperature characteristics of each hard disk when its performance is affected, so as to better judge the differences in temperature fluctuation resistance of different hard disks.

[0106] After determining the hard disk response temperature, the test device will evaluate the temperature fluctuation resistance test result based on the hard disk response temperature, the fluctuation response time and the temperature difference inside the box. Among them, the hard disk response temperature, the fluctuation response time and the temperature difference inside the box are three key elements.

[0107] First, based on the hard disk reaction temperature, the change range compared to the initial stable temperature can be determined. Here, the initial stable temperature refers to the real-time temperature of the hard disk under test when obtaining the benchmark performance data in step 302. A smaller change range means that when the hard disk experiences temperature fluctuations, its own temperature changes relatively smoothly without significant fluctuations, indicating that the hard disk can stabilize its temperature state to a certain extent.

[0108] A longer fluctuation reaction time indicates that the time period from the start of temperature adjustment to a significant change in the hard disk performance is longer, reflecting that the hard disk can withstand temperature changes for a longer time while maintaining relatively stable performance. A larger temperature difference inside the chamber represents a larger temperature span from the initially set temperature to the temperature at which the hard disk performance begins to be affected, indicating that the hard disk can maintain a certain degree of performance stability under a large range of temperature fluctuations.

[0109] When the test device observes that the hard disk has a smaller change range of the hard disk reaction temperature, a longer fluctuation reaction time, and a larger temperature difference inside the chamber, it will determine that the hard disk has good temperature fluctuation resistance. This is because these characteristics comprehensively reflect the excellent performance of the hard disk when facing temperature changes, that is, it can withstand large temperature fluctuations for a long time and its own temperature will not change significantly, thus ensuring relatively stable performance.

[0110] By comprehensively considering these three indicators, the test device can evaluate the temperature fluctuation resistance of the NVMe solid-state drive in a more comprehensive and accurate way, providing a scientific basis for the performance evaluation, product optimization of the hard disk, and the selection of applicability in different application scenarios, ensuring that the reliability and stability of the hard disk can be reasonably evaluated under different environmental temperatures.

[0111] Step 309, control the temperature inside the chamber to be adjusted from the fluctuation reaction temperature to the preset temperature.

[0112] Specifically, the test device will perform an adjustment operation on the temperature of the temperature control chamber. Its task is to gradually reduce the temperature inside the chamber from the reached fluctuation reaction temperature to the initially set preset temperature. This process is to further investigate the performance of the hard disk during the temperature drop after experiencing a temperature increase and resulting in performance changes. The test device will precisely control the temperature adjustment through its internal temperature control system to ensure that the temperature change process is controllable, and the corresponding temperature adjustment rate can be set according to different test requirements, preparing for the subsequent evaluation of the hard disk's temperature fluctuation recovery ability.

[0113] By adjusting the temperature back from the fluctuation reaction temperature, it simulates the temperature drop situation that the hard disk may experience in actual applications, providing conditions for a more comprehensive evaluation of the hard disk's performance recovery under different temperature change situations.

[0114] Step 310, when the temperature inside the box is adjusted to the preset temperature, determine the recovery time for the real-time hard disk temperature to recover from the hard disk response temperature to within the stable temperature range.

[0115] Specifically, when the test device adjusts the temperature inside the box to the preset temperature, it will closely monitor the real-time temperature of the NVMe solid-state drive under test. At this time, the test device will monitor the real-time temperature of the hard disk, starting from the hard disk response temperature when the previous performance of the hard disk began to change significantly until the real-time temperature of the hard disk returns to the stable temperature range again. The test device will record the time elapsed from the hard disk response temperature to the recovery to the stable temperature range, and this time is the recovery time.

[0116] The recovery time is an important indicator, which reflects the speed at which the hard disk's own temperature returns from the state where its performance is affected to the normal stable state after the temperature drops. The test device will accurately measure this time to subsequently evaluate the hard disk's ability to recover from temperature fluctuations during the temperature drop process, to provide information on the hard disk's ability to recover from the performance fluctuation state to the normal state in different temperature environments, and to help understand the hard disk's thermal balance and temperature regulation mechanism.

[0117] Step 311, determine the test result of the temperature fluctuation recovery ability of the hard disk under test based on the recovery time.

[0118] Among them, the test device will use the recovery time as the key basis for judging the hard disk's temperature fluctuation recovery ability because the length of the recovery time directly reflects the duration required for the hard disk to reach performance stability again after the temperature drops.

[0119] If the recovery time is short, it indicates that the hard disk can quickly return to the normal temperature state after the temperature drops, and thus can recover its normal performance faster, which means that the hard disk has good temperature fluctuation recovery ability.

[0120] On the contrary, if the recovery time is long, it means that the hard disk takes a long time to recover from the performance instability state caused by temperature fluctuations, and its temperature fluctuation recovery ability is relatively weak.

[0121] The test device will, according to the pre-set evaluation criteria, convert the length of the recovery time into a quantitative evaluation of the hard disk's temperature fluctuation recovery ability, so as to provide more comprehensive information for the performance evaluation of the hard disk, help judge the hard disk's self-recovery ability after experiencing temperature fluctuations, and provide valuable references for the performance optimization of the product, application adaptation in different environments, and quality control, to ensure that the hard disk can operate more stably and reliably in actual applications, especially in environments where the temperature often fluctuates.

[0122] The method of this embodiment adopts the above steps, which can accurately evaluate the performance and temperature fluctuation resistance of the NVMe solid-state drive under different temperature conditions, and also takes into account its temperature fluctuation recovery ability.

[0123] First, place the NVMe solid-state drive to be tested in a temperature control box. When the temperature in the temperature control box reaches the preset temperature and the real-time temperature of the hard drive is within the stable temperature range, the baseline performance data of the hard drive will be obtained. After determining the baseline performance data, according to the preset temperature and the volume of the temperature control box, the temperature change rate will be calculated through the preset temperature change rate formula, and the corresponding temperature control instruction will be generated and sent to the temperature control box to adjust the temperature inside the box starting from the preset temperature. During the temperature change inside the box, the real-time performance data of the hard drive will be continuously obtained, and the performance change data will be calculated based on this. When the performance change data reaches the set change threshold, the temperature inside the box at this time will be determined as the fluctuation response temperature, and the adjustment time from the preset temperature to this point will be determined as the fluctuation response time.

[0124] To evaluate the temperature fluctuation resistance of the hard drive, a preset temperature fluctuation resistance evaluation formula can be used to calculate the temperature fluctuation resistance test results, which involves multiple parameters such as the fluctuation response time, preset temperature, fluctuation response temperature, and performance change data. In addition, when the temperature inside the box reaches the fluctuation response temperature, the real-time temperature of the hard drive will be determined as the hard drive response temperature, and then the temperature fluctuation resistance test results will be comprehensively determined based on the hard drive response temperature, fluctuation response time, and the temperature difference inside the box.

[0125] This embodiment further improves the test process. After completing the temperature fluctuation resistance test, the temperature inside the box will be adjusted back from the fluctuation response temperature to the preset temperature, and the real-time temperature of the hard drive will be monitored during this process to determine its recovery time from the hard drive response temperature to the stable temperature range. Based on the recovery time, the temperature fluctuation recovery ability test results of the hard drive to be tested can be determined, which provides a richer dimension for comprehensively evaluating the hard drive performance. Through a series of coherent operations such as temperature control, continuous monitoring of performance data, quantitative evaluation of performance changes, temperature fluctuation resistance test, and temperature fluctuation recovery ability test, the entire technical solution forms a systematic NVMe solid-state drive performance evaluation system, which helps to deeply understand the performance stability and reliability of the hard drive under different temperature conditions, provides a comprehensive and scientific test basis for the research, production, and application of the hard drive, can be used for product quality control, performance optimization, and adaptation to different application scenarios to ensure that the hard drive can work stably at various environmental temperatures, especially suitable for application scenarios such as portable mobile devices, outdoor monitoring devices, industrial environments, and edge computing devices with temperature fluctuations.

[0126] In this embodiment, factors such as the volume of the temperature control box are fully considered in terms of temperature regulation. By introducing different formulas and parameters, the testing process becomes more accurate and quantifiable, and can more accurately reflect the performance of the hard disk under different temperature changes, providing a comprehensive and detailed technical framework for the performance evaluation of NVMe solid-state drives.

[0127] The method provided in the above embodiment can be executed by a testing device, and the testing device may include an electronic device. The following describes this electronic device in the embodiments of the present invention from the perspective of hardware processing. Please refer to Figure 4 , which is a schematic structural diagram of an entity device of the electronic device in the embodiments of the present invention.

[0128] It should be noted that Figure 4 The structure of the electronic device shown is only an example and should not impose any limitations on the functions and usage scope of the embodiments of the present invention.

[0129] As Figure 4 shown, the electronic device includes a central processing unit (CPU) 401, which can perform various appropriate actions and processes according to the program stored in the read-only memory (ROM) 402 or the program loaded from the storage section 408 into the random access memory (RAM) 403, such as executing the method described in the above embodiment. In the random access memory (RAM) 403, various programs and data required for system operation are also stored. The central processing unit (CPU) 401, the read-only memory (ROM) 402, and the random access memory (RAM) 403 are connected to each other through a bus 404. The input / output (I / O) interface 405 is also connected to the bus 404.

[0130] The following components are connected to the input / output (I / O) interface 405: an input section 406 including an audio input device, a button switch, etc.; an output section 407 including a display, an audio output device, an indicator light, etc.; a storage section 408 including a hard disk, etc.; and a communication section 409 including a network interface card such as a LAN (Local Area Network) card, a modem, etc. The communication section 409 performs communication processing via a network such as the Internet. A drive 410 is also connected to the input / output (I / O) interface 405 as needed. A removable medium 411, such as a magnetic disk, an optical disk, a magneto-optical disk, a semiconductor memory, etc., is installed on the drive 410 as needed so that a computer program read from it can be installed into the storage section 408 as needed.

[0131] Specifically, according to an embodiment of the present invention, the process described above with reference to the flowchart can be implemented as a computer software program. For example, an embodiment of the present invention includes a computer program product that includes a computer program carried on a computer-readable medium, and the computer program includes a computer program for performing the method shown in the flowchart. In such an embodiment, the computer program can be downloaded and installed from a network through the communication section 409 and / or installed from the removable medium 411. When the computer program is executed by a central processing unit (CPU) 401, various functions defined in the present invention are executed.

[0132] It should be noted that specific examples of computer-readable storage media may include, but are not limited to: an electrical connection having one or more wires, a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM), a flash memory, an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the above. In the present invention, a computer-readable storage medium can be any tangible medium that contains or stores a program that can be used by or in conjunction with an instruction execution system, apparatus, or device.

[0133] The flowcharts and block diagrams in the accompanying drawings illustrate the possible architectures, functions, and operations of systems, methods, and computer program products according to various embodiments of the present invention. Each block in the flowchart or block diagram may represent a module, a segment of a program, or a part of code that contains one or more executable instructions for implementing the specified logical function. It should also be noted that in some alternative implementations, the functions marked in the blocks may occur in a different order than that marked in the accompanying drawings.

[0134] Specifically, the electronic device of this embodiment includes a processor and a memory. The memory is coupled to one or more processors. The memory is used to store computer program code, and the computer program code includes computer instructions. One or more processors invoke the computer instructions to cause the electronic device to execute the method provided in the above embodiment.

[0135] On the other hand, the present invention also provides a computer-readable storage medium. This storage medium may be included in the electronic device described in the above embodiment; or it may exist separately and not be assembled into the electronic device. The above storage medium carries one or more computer programs. When the one or more computer programs are executed by a processor of the electronic device, the electronic device is caused to implement the method provided in the above embodiment.

[0136] As described above, the above embodiments are only used to illustrate the technical solutions of the present invention and are not intended to limit them. Although the present invention has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that they can still modify the technical solutions described in the foregoing embodiments or perform equivalent replacements for some of the technical features. These modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the various embodiments of the present invention.

[0137] As used in the above embodiments, depending on the context, the term "when..." may be interpreted to mean "if...", or "after...", or "in response to determining...", or "in response to detecting...". Similarly, depending on the context, the phrase "when determining..." or "if detecting (the stated condition or event)" may be interpreted to mean "if determining...", or "in response to determining...", or "when detecting (the stated condition or event)", or "in response to detecting (the stated condition or event)".

[0138] Those of ordinary skill in the art can understand that all or part of the processes in the methods of the above embodiments can be completed by hardware instructed by a computer program. This program can be stored in a computer-readable storage medium. When the program is executed, it can include the processes of the above method embodiments. The foregoing storage medium includes: various media that can store program codes such as ROM or random access memory RAM, magnetic disks, or optical discs.

Claims

1. A method for testing an NVMe solid state drive, characterized in that, Including: When the temperature inside the temperature control box reaches the preset temperature, obtain the real-time hard disk temperature of the hard disk under test in the temperature control box, and the hard disk under test includes an NVMe solid-state drive; When the real-time hard disk temperature remains within the stable temperature range, obtain the reference performance data of the hard disk under test; When the reference performance data is determined, control the temperature control box to adjust the temperature inside the box starting from the preset temperature; When the temperature inside the box changes, obtain the real-time performance data of the hard disk under test; According to the real-time performance data and the reference performance data, determine the performance change data of the hard disk under test; When the performance change data reaches the set change threshold, determine the temperature inside the box at this time as the fluctuation reaction temperature, and determine the adjustment time experienced by the preset temperature changing to the fluctuation reaction temperature as the fluctuation reaction time; According to the fluctuation reaction time and the temperature difference inside the box between the preset temperature and the fluctuation reaction temperature, determine the temperature fluctuation resistance test result of the hard disk under test.

2. The method according to claim 1, wherein The controlling the temperature control box to adjust the temperature inside the box starting from the preset temperature includes: Generate a temperature control command according to the set temperature change rate; Send the temperature control command to the temperature control box so that the temperature control box adjusts the temperature inside the box starting from the preset temperature.

3. The method according to claim 2, wherein Before generating the temperature control command according to the set temperature change rate, it further includes: Determine the temperature change rate according to the preset temperature and the volume of the temperature control box.

4. The method according to claim 3, wherein The determining the temperature change rate according to the preset temperature and the volume of the temperature control box includes: Calculate the temperature change rate according to a preset temperature change rate formula, and the temperature change rate formula includes: ； Among them, v represents the rate of change of the temperature; v 0 represents the reference rate of change of the temperature; T target represents the target temperature to be adjusted to; T preset represents the preset temperature; T ref represents the reference temperature difference; V represents the volume of the temperature control box; V ref represents the reference volume; m and n are control parameters.

5. The method according to any one of claims 1-4, characterized in that, The determining the temperature fluctuation resistance test result of the hard disk under test according to the fluctuation reaction time and the temperature difference inside the box between the preset temperature and the fluctuation reaction temperature includes: Calculate the temperature fluctuation resistance test result through a preset temperature fluctuation resistance evaluation formula, and the temperature fluctuation resistance evaluation formula includes: ； Δ T = T r －T 0 ; Δ P ( t )= P ( t ) －P 0 ; Among them, S represents the test result of the temperature fluctuation resistance, Δ T represents the temperature difference inside the box, T 0 represents the preset temperature, T r represents the fluctuation response temperature, Δ P ( t ) represents the performance change data, P ( t ) represents the real-time performance data at time t , P 0 is the reference performance data, P th is the set performance change threshold, t r represents the fluctuation response time, α、β is the adjustment parameter.

6. The method according to claim 1, characterized in that, The determining the temperature fluctuation resistance test result of the hard disk under test according to the fluctuation reaction time and the temperature difference inside the box between the preset temperature and the fluctuation reaction temperature specifically includes: When the temperature inside the box reaches the fluctuation reaction temperature, determine the real-time hard disk temperature at this time as the hard disk reaction temperature; According to the hard disk reaction temperature, the fluctuation reaction time, and the temperature difference inside the box, determine the temperature fluctuation resistance test result.

7. The method according to claim 6, characterized in that, After determining the temperature fluctuation resistance test result of the hard disk under test according to the fluctuation reaction time and the temperature difference between the preset temperature and the fluctuation reaction temperature, it further includes: Control the temperature inside the box to adjust from the fluctuation reaction temperature to the preset temperature; When the temperature inside the box is adjusted to the preset temperature, determine the recovery time for the real-time hard disk temperature to recover from the hard disk reaction temperature to within the stable temperature range; According to the recovery time, determine the temperature fluctuation recovery ability test result of the hard disk under test.

8. An electronic device, characterized in that, Including one or more processors and a memory; The memory is coupled to the one or more processors, and the memory is used to store computer program code, the computer program code includes computer instructions, and the one or more processors call the computer instructions to cause the electronic device to execute the method according to any one of claims 1-7.

9. A computer-readable storage medium storing computer instructions, characterized in that, When the computer instructions run on the electronic device, the electronic device is caused to execute the method according to any one of claims 1-7.

10. A computer program product, characterized in that, When the computer program product runs on the electronic device, the electronic device is caused to execute the method according to any one of claims 1-7.

Images