Temperature measuring circuit, temperature measuring equipment and vehicle

Abstract

The invention is suitable for the technical field of temperature detection, and provides a temperature measuring circuit, temperature measuring equipment and a vehicle. The temperature measurement circuit comprises a temperature detection module, a counting module, a comparison module and an analog-to-digital conversion module, the temperature detection module is electrically connected with the comparison module, the analog-to-digital conversion module and the counting module, and the counting module is electrically connected with the comparison module. According to the invention, the temperature measurement process is segmented, and in each segment, the change range of the measured voltage is relatively small, so that the voltage can be obviously changed even if the temperature change is very small. The amplification effect improves the sensitivity of the voltage to the temperature change, and after the sensitivity of the measured voltage to the temperature change is improved, the temperature value can be measured and recorded more accurately, so that high-precision measurement can be kept under the condition of large-range temperature change.

Description

Technical Field

[0001] This application belongs to the technical field of temperature detection, and particularly relates to a temperature measurement circuit, a temperature measurement device, and a vehicle. Background Art

[0002] In the fields of automotive and consumer electronics, temperature is a key parameter that helps the system monitor and control various processes. In these fields, a temperature measurement circuit is usually used to measure the temperature, and then the measurement result is sent to the controller for corresponding adjustments or responses. The current temperature measurement circuit can provide good accuracy under a small range of temperature changes, but there are still challenges under a large range of temperature changes. Summary of the Invention

[0003] Embodiments of this application provide a temperature measurement circuit, a temperature measurement device, and a vehicle, which can solve the problem that the current temperature measurement circuit cannot meet the temperature measurement accuracy under a large range of temperature changes.

[0004] In a first aspect, embodiments of this application provide a temperature measurement circuit, including a temperature detection module, a counting module, a comparison module, and an analog-to-digital conversion module. The temperature detection module is electrically connected to the comparison module, the analog-to-digital conversion module, and the counting module respectively, and the counting module is electrically connected to the comparison module;

[0005] The temperature detection module is configured to output a target voltage according to the current temperature and a preset parameter relationship. The analog-to-digital conversion module is configured to convert the target voltage into a digital signal; the comparison module is configured to output a logic signal to the counting module when the target voltage is equal to a reference voltage; the counting module is configured to output a pulse signal to the temperature detection module each time it receives the logic signal; the temperature detection module is further configured to adjust the preset parameter relationship according to the number of received pulse signals, and output a new target voltage according to the current temperature and the adjusted preset parameter relationship; the comparison module is further configured to output the logic signal to the counting module when the new target voltage is equal to the reference voltage.

[0006] In a possible implementation manner of the first aspect, the temperature measurement circuit further includes a clock generation module, and the clock generation module is electrically connected to the temperature detection module, the counting module, the comparison module, and the analog-to-digital conversion module respectively;

[0007] The clock generation module is used to output a clock signal with multiple detection periods, and each detection period includes a detection period and a reset period; when the clock signal is in the detection period, the temperature detection module, the counting module, the comparison module, and the analog-to-digital conversion module all start to work; when the clock signal is in the reset period, the temperature detection module, the counting module, the comparison module, and the analog-to-digital conversion module are all reset.

[0008] In a possible implementation manner of the first aspect, the temperature detection module includes a temperature detection unit and a reference unit. The temperature detection unit is electrically connected to the reference unit, the counting module, the analog-to-digital conversion module, the comparison module, and the clock generation module respectively. The preset parameter relationship includes a temperature-current relationship and a current-voltage relationship;

[0009] The reference unit is used to output a target current according to the current temperature and the temperature-current relationship; when the clock signal is in the detection period, the temperature detection unit is used to output the target voltage according to the target current and the current-voltage relationship; the temperature detection unit is further used to adjust the current-voltage relationship according to the number of received pulse signals, and output the new target voltage according to the target current and the adjusted current-voltage relationship.

[0010] In a possible implementation manner of the first aspect, the temperature detection unit includes a first switch unit, a first resistor unit, n second resistor units, n second switch units, and a control unit. The first end of the first switch unit, the first end of the first resistor unit, and the first end of each second resistor unit are all electrically connected to the reference unit. The second end of the first switch unit and the reset end of the control unit are both electrically connected to the clock generation module. The first end of each second switch unit is electrically connected to the second end of the corresponding second resistor unit. The n output ends of the control unit are electrically connected to the second ends of the n second switch units in one-to-one correspondence. The control end of the control unit is electrically connected to the counting module. The third end of the first switch unit, the second end of the first resistor unit, and the third end of each second switch unit are all grounded, where n is a natural number greater than 0;

[0011] When the clock signal is in the detection period, the first switch unit is disconnected; the first resistor unit is configured to output the target voltage according to the target current; the control unit is configured to send a first control signal to each of the a second switch units and send a second control signal to the remaining n - a second switch units when receiving a pulse signals; the second switch unit is configured to be turned on according to the first control signal, so that the second resistor unit is connected in parallel with the first resistor unit to adjust the current-voltage relationship; the first resistor unit and the a second resistor units connected in parallel are configured to output the new target voltage according to the target current; the second switch unit is further configured to be turned off according to the second control signal; where 0 < a ≤ n.

[0012] In a possible implementation manner of the first aspect, the control unit includes an inverter, a first flip-flop, and n - 1 logic sub-units. The input end of the inverter and the input end of the first flip-flop are both electrically connected to the counting module. The reset end of the first flip-flop and the reset ends of the n - 1 logic sub-units are both electrically connected to the clock generation module. The output end of the first flip-flop is electrically connected to the second end of one of the second switch units. The output ends of the n - 1 logic sub-units are electrically connected to the remaining n - 1 second switch units correspondingly. The second input end of each logic sub-unit is electrically connected to the output end of the inverter. The first input end of the first logic sub-unit is electrically connected to the output end of the first flip-flop. The first input end of the bth logic sub-unit is electrically connected to the output end of the (b - 1)th logic sub-unit, where 1 < b ≤ n - 1.

[0013] In a possible implementation manner of the first aspect, the logic sub-unit includes a first AND gate, a second flip-flop, a second AND gate, and a third flip-flop. The second input end of the first AND gate and the second input end of the second AND gate are both electrically connected to the output end of the inverter. The output end of the first AND gate is electrically connected to the input end of the second flip-flop. The output end of the second flip-flop is electrically connected to the first input end of the second AND gate. The output end of the second AND gate is electrically connected to the input end of the third flip-flop. The reset ends of the second flip-flop and the third flip-flop are both electrically connected to the clock generation module. The output end of the third flip-flop is electrically connected to the corresponding second switch unit. In the first logic sub-unit, the first input end of the first AND gate is electrically connected to the output end of the first flip-flop. In the bth logic sub-unit, the first input end of the first AND gate is electrically connected to the output end of the third flip-flop in the (b - 1)th logic sub-unit.

[0014] In a possible implementation of the first aspect, the reference unit includes a current generating unit, and the current generating unit is electrically connected to the temperature detecting unit;

[0015] The current generating unit is configured to output the target current according to the current temperature and the temperature-current relationship.

[0016] In a possible implementation of the first aspect, the reference unit further includes a voltage generating unit, and the voltage generating unit is electrically connected to the current generating unit and the comparison module respectively;

[0017] The current generating unit is further configured to output a first voltage to the voltage generating unit; the voltage generating unit is configured to output the reference voltage to the comparison module according to the first voltage.

[0018] In a possible implementation of the first aspect, the temperature measurement circuit further includes a storage module, and the storage module is electrically connected to the counting module, the analog-to-digital conversion module and the clock generating module respectively;

[0019] When the clock signal is in the detection period, the storage module is configured to store and output the digital signal; the storage module is further configured to store and output the pulse signal.

[0020] In a second aspect, an embodiment of the present application provides a temperature measurement device, including the temperature measurement circuit according to any one of the first aspect.

[0021] In a third aspect, an embodiment of the present application provides a vehicle, including the temperature measurement circuit according to any one of the first aspect.

[0022] The beneficial effects of the embodiments of the present application compared with the prior art are as follows:

[0023] An embodiment of the present application provides a temperature measurement circuit, including a temperature detection module, a counting module, a comparison module and an analog-to-digital conversion module. The temperature detection module is electrically connected to the comparison module, the analog-to-digital conversion module and the counting module respectively, and the counting module is electrically connected to the comparison module.

[0024] The temperature detection module is used to output a target voltage according to the relationship between the current temperature and the preset parameters. The analog-to-digital conversion module is used to convert the target voltage into a digital signal. The comparison module is used to output a logic signal to the counting module when the target voltage is equal to the reference voltage. When the comparison module outputs the logic signal, it indicates the end of a temperature measurement stage. The counting module is used to output a pulse signal to the temperature detection module every time it receives the logic signal. The temperature detection module is also used to adjust the relationship of the preset parameters according to the number of received pulse signals, and output a new target voltage according to the current temperature and the adjusted relationship of the preset parameters. When the temperature detection module outputs the new target voltage, it indicates that the temperature measurement enters the next temperature measurement stage. The comparison module is also used to output a logic signal to the counting module when the new target voltage is equal to the reference voltage. When the comparison module outputs the logic signal again, it indicates the end of the next temperature measurement stage. Repeat the above process until the entire temperature measurement process is divided into multiple temperature measurement stages.

[0025] As can be seen from the above, in this application, the reference voltage is used as the basis for segmentation. When the measured voltage is equal to the reference voltage, segmentation processing is performed: that is, the relationship of the preset parameters is adjusted to make the temperature detection module output a new target voltage, so as to enter the next temperature measurement stage. This application segments the temperature measurement process and performs independent measurement and adjustment within each segment, so that the measured voltage can more finely respond to the change of temperature. Within each segment, the change range of the measured voltage is relatively small, so even a very small temperature change will cause a significant change in the voltage. This "amplification" effect improves the sensitivity of the voltage to temperature changes. Since within each segment, the relationship between the voltage and the temperature is more clear and stable, the temperature value can be measured and recorded more accurately. By continuously repeating the above process, this application can maintain high-precision measurement within a large temperature range. In summary, the temperature measurement circuit provided by the embodiment of this application can solve the problem that the current temperature measurement circuit cannot meet the temperature measurement accuracy under large-range temperature changes.

[0026] It can be understood that the beneficial effects of the second to third aspects above can refer to the relevant descriptions in the first aspect above, and will not be repeated here. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following will briefly introduce the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings in the following description are only some embodiments of the present application. For those of ordinary skill in the art, without creative efforts, other drawings can also be obtained based on these drawings.

[0028] Figure 1 It is a schematic block diagram of a temperature measurement circuit provided by an embodiment of the present application;

[0029] Figure 2 It is a schematic block diagram of a temperature measurement circuit provided by another embodiment of the present application;

[0030] Figure 3 It is a schematic block diagram of a temperature detection module provided by an embodiment of the present application;

[0031] Figure 4 It is a schematic block diagram of a temperature detection unit provided by an embodiment of the present application;

[0032] Figure 5 It is a schematic block diagram of a reference unit provided by an embodiment of the present application;

[0033] Figure 6 It is a schematic diagram of the circuit connection of a temperature detection unit provided by an embodiment of the present application;

[0034] Figure 7 It is a schematic diagram of the circuit connection of a reference unit provided by an embodiment of the present application;

[0035] Figure 8 It is a schematic block diagram of a temperature measurement circuit provided by another embodiment of the present application;

[0036] Figure 9 It is a sectional view of a temperature measurement circuit provided by an embodiment of the present application;

[0037] Figure 10 It is a timing diagram of a temperature measurement circuit provided by an embodiment of the present application.

[0038] In the figure: 10, temperature detection module; 11, temperature detection unit; 111, first switch unit; 112, first resistor unit; 113, second resistor unit; 114, control unit; 1141, logic sub-unit; 115, second switch unit; 12, reference unit; 121, current generation unit; 122, voltage generation unit; 20, clock generation module; 30, counting module; 40, comparison module; 50, analog-to-digital conversion module; 51, analog-to-digital converter; 60, storage module. Detailed implementation manners

[0039] In the following description, specific details such as specific system architectures and technologies are presented for the purpose of illustration rather than limitation, so as to thoroughly understand the embodiments of the present application. However, those skilled in the art should clearly understand that the present application can also be implemented in other embodiments without these specific details. In other cases, detailed descriptions of well-known systems, devices, circuits, and methods are omitted to avoid unnecessary details from interfering with the description of the present application.

[0040] It should be understood that when used in the specification of this application and the appended claims, the term "comprising" indicates the presence of the described features, integers, steps, operations, elements and / or components, but does not exclude the presence or addition of one or more other features, integers, steps, operations, elements, components and / or their combinations.

[0041] It should also be understood that the term "and / or" used in the specification of this application and the appended claims refers to any combination and all possible combinations of one or more of the associated listed items, and includes these combinations.

[0042] As used in the specification of this application and the appended claims, the term "if" can be interpreted as "when" or "once" or "in response to determining" or "in response to detecting" depending on the context. Similarly, the phrase "if determined" or "if [the described condition or event] is detected" can be interpreted as meaning "once determined" or "in response to determining" or "once [the described condition or event] is detected" or "in response to detecting [the described condition or event]" depending on the context.

[0043] In addition, in the description of the specification of this application and the appended claims, the terms "first", "second", "third", etc. are only used for distinguishing descriptions and should not be construed as indicating or implying relative importance.

[0044] Reference to "one embodiment" or "some embodiments" or the like described in the specification of this application means that a specific feature, structure or characteristic described in connection with that embodiment is included in one or more embodiments of this application. Thus, statements such as "in one embodiment", "in some embodiments", "in other some embodiments", "in still other embodiments", etc. that appear in different places in this specification do not necessarily all refer to the same embodiment, but mean "one or more but not all embodiments", unless otherwise specifically emphasized in other ways. The terms "comprising", "including", "having" and their variants all mean "including but not limited to", unless otherwise specifically emphasized in other ways.

[0045] In today's automotive and consumer electronics fields, temperature, as a core physical quantity, directly affects system safety and performance. Taking new energy vehicles as an example, the temperature monitoring of the power battery pack needs to cover extreme working conditions from -40°C to 85°C. A monitoring deviation of 1°C in thermal runaway may cause a 30% attenuation of the battery life and even trigger the risk of thermal diffusion. In these fields, temperature measurement circuits are usually used to measure temperature and then send the measurement results to the controller so that the controller can make corresponding adjustments or responses. However, the current temperature measurement circuits cannot meet the temperature measurement accuracy under large-scale temperature changes.

[0046] In view of the above problems, the embodiment of the present application provides a temperature measurement circuit, which segments the temperature measurement process and performs independent measurement and adjustment within each segment, so that the measured voltage can more finely respond to temperature changes. Within each segment, the change range of the measured voltage is relatively small, so even a very small temperature change will cause a significant change in voltage. This "amplification" effect improves the sensitivity of the voltage to temperature changes. Since the relationship between voltage and temperature is more explicit and stable within each segment, the temperature value can be measured and recorded more accurately. By continuously repeating the above process, the present application can maintain high-precision measurement within a large temperature range.

[0047] The technical solution of the present application will be described in detail below with reference to the embodiments.

[0048] As Figure 1 shown, the temperature measurement circuit includes a temperature detection module 10, a counting module 30, a comparison module 40, and an analog-to-digital conversion module 50. The temperature detection module 10 is electrically connected to the comparison module 40, the analog-to-digital conversion module 50, and the counting module 30 respectively, and the counting module 30 is electrically connected to the comparison module 40.

[0049] Specifically, the temperature detection module 10 is configured to output a target voltage according to the current temperature and a preset parameter relationship. It should be noted that the preset parameter relationship is the relationship between temperature and voltage. The analog-to-digital conversion module 50 is configured to convert the target voltage into a digital signal, where the digital signal is the measured temperature value. The comparison module 40 is configured to compare the reference voltage and the target voltage. When the target voltage is equal to the reference voltage, a logic signal is output to the counting module 30. It should be noted that when the target voltage is equal to the reference voltage, the logic signal output by the comparison module 40 flips. It should be noted that the reference voltage can be generated by an external circuit or by the temperature detection module 10. When the comparison module 40 outputs a logic signal, it indicates the end of a temperature measurement stage. The counting module 30 is configured to output a pulse signal to the temperature detection module 10 each time it receives a logic signal. It should be noted that the counting module 30 will count each time it receives a logic signal. The temperature detection module 10 is further configured to adjust the preset parameter relationship according to the number of received pulse signals, and output a new target voltage according to the current temperature and the adjusted preset parameter relationship. When the temperature detection module 10 outputs a new target voltage, it indicates that the temperature measurement enters the next temperature measurement stage. The comparison module 40 is further configured to compare the new target voltage and the reference voltage. When the new target voltage is equal to the reference voltage, a logic signal is output to the counting module 30. When the comparison module 40 outputs a logic signal again, it indicates the end of the next temperature measurement stage. Repeat the above process until the entire temperature measurement process is divided into multiple temperature measurement stages.

[0050] As can be seen from the above, this application uses the reference voltage as the basis for segmentation. When the measured voltage is equal to the reference voltage, segmentation processing is performed: that is, the preset parameter relationship is adjusted to make the temperature detection module output a new target voltage, thereby entering the next temperature measurement stage. This application segments the temperature measurement process and performs independent measurement and adjustment within each segment, enabling the measured voltage to more finely respond to temperature changes. Within each segment, the change range of the measured voltage is relatively small, so even a small temperature change will cause a significant change in the voltage. This "amplification" effect improves the sensitivity of the voltage to temperature changes. Since within each segment, the relationship between voltage and temperature is clearer and more stable, the temperature value can be measured and recorded more accurately. By continuously repeating the above process, this application can maintain high-precision measurement within a large temperature range. In summary, the temperature measurement circuit provided by the embodiments of this application can solve the problem that the current temperature measurement circuit cannot meet the temperature measurement accuracy under large temperature changes.

[0051] Exemplarily, as Figure 9 shown, when the temperature starts to rise from 0, the target voltage output by the temperature detection module 10 also starts to rise from 0, and the target voltage has a high linearity with the temperature. The comparison module 40 compares the target voltage with the reference voltage and outputs a logic signal to the counting module 30 when the target voltage first rises to equal the reference voltage. When the comparison module 40 outputs the logic signal for the first time, it indicates the end of the first temperature measurement stage. When receiving the logic signal, the counting module 30 outputs a pulse signal to the temperature detection module 10. The temperature detection module 10 adjusts the preset parameter relationship according to 1 pulse signal and outputs a new target voltage according to the current temperature and the adjusted preset parameter relationship. When the temperature detection module 10 outputs the new target voltage for the first time, it indicates that the temperature measurement enters the second temperature measurement stage. After that, the comparison module 40 continues to compare the new target voltage with the reference voltage and outputs a logic signal to the counting module 30 again when the new target voltage rises to equal the reference voltage again. When the comparison module 40 outputs the logic signal for the second time, it indicates the end of the second temperature measurement stage. When receiving the logic signal, the counting module 30 outputs a pulse signal to the temperature detection module 10 again. The temperature detection module 10 adjusts the preset parameter relationship according to 2 pulse signals and outputs a new target voltage according to the current temperature and the adjusted preset parameter relationship. When the temperature detection module 10 outputs the new target voltage for the second time, it indicates that the temperature measurement enters the third temperature measurement stage. Repeat the above process until the entire temperature measurement process is divided into multiple temperature measurement stages. It should be noted that this application only gives an example for the case where the temperature rises from low to high. For the case where the temperature drops from high to low, the application can be adaptively adjusted, which also belongs to the scope protected by this application.

[0052] In some embodiments, such as Figure 2As shown, the temperature measurement circuit further includes a clock generation module 20, and the clock generation module 20 is electrically connected to the temperature detection module 10, the counting module 30, the comparison module 40, and the analog-to-digital conversion module 50 respectively.

[0053] Specifically, the clock generation module 20 is configured to output a clock signal having a plurality of detection cycles, and each detection cycle includes a detection period and a reset period. When the clock signal is in the detection period, the temperature detection module 10, the counting module 30, the comparison module 40, and the analog-to-digital conversion module 50 all start to work. When the clock signal is in the reset period, the temperature detection module 10, the counting module 30, the comparison module 40, and the analog-to-digital conversion module 50 are all reset.

[0054] Since the power supply chip generally supplies power continuously during operation, in order to enable the temperature measurement circuit to perform a reset operation, the present application introduces the clock generation module 20, and the temperature measurement circuit is reset by the clock signal output by the clock generation module 20.

[0055] In some embodiments, as Figure 3 shown, the temperature detection module 10 includes a temperature detection unit 11 and a reference unit 12. The temperature detection unit 11 is electrically connected to the reference unit 12, the counting module 30, the analog-to-digital conversion module 50, the comparison module 40, and the clock generation module 20 respectively. The preset parameter relationships include a temperature-current relationship and a current-voltage relationship.

[0056] Specifically, the reference unit 12 is configured to output a target current according to the current temperature and the temperature-current relationship. In the present application, the current output by the reference unit 12 is proportional to the temperature, and the current and the temperature have a high linearity. When the clock signal is in the detection period, the temperature detection unit 11 is configured to output a target voltage according to the target current and the current-voltage relationship; the temperature detection unit 11 is further configured to adjust the current-voltage relationship according to the number of received pulse signals, and output a new target voltage according to the target current and the adjusted current-voltage relationship. During segmented processing, the temperature detection unit 11 will forcibly adjust the target voltage to a new voltage, that is, the new target voltage. In the new temperature measurement stage, the new target voltage is used as the initial value, and the temperature measurement is continued according to the target current corresponding to the current temperature and the adjusted current-voltage relationship.

[0057] It should be noted that the reference voltage can be generated by an external circuit or by the reference unit 12.

[0058] In some embodiments, as Figure 4As shown in the figure, the temperature detection unit 11 includes a first switch unit 111, a first resistor unit 112, n second resistor units 113, n second switch units 115, and a control unit. The first ends of the first switch unit 111, the first resistor unit 112, and each second resistor unit 113 are all electrically connected to the reference unit 12. The second end of the first switch unit 111 and the reset end of the control unit 114 are both electrically connected to the clock generation module 20. The first end of each second switch unit 115 is electrically connected to the second end of the corresponding second resistor unit 113. The n output ends of the control unit 114 are electrically connected to the second ends of the n second switch units 115 in one-to-one correspondence. The control end of the control unit 114 is electrically connected to the counting module 30. The third end of the first switch unit 111, the second end of the first resistor unit 112, and the third end of each second switch unit 115 are all grounded. Here, n is a natural number greater than 0.

[0059] Specifically, when the clock signal is in the detection period, the first switch unit 111 is turned off. The first resistor unit 112 is used to output a target voltage according to the target current. The control unit 114 is used to send a first control signal to a second switch units 115 and a second control signal to the remaining n - a second switch units 115 when receiving a pulse signals. The a second switch units 115 are used to conduct according to the first control signal, so that the a second resistor units 113 are connected in parallel with the first resistor unit 112. After the a second resistor units 113 are connected in parallel with the first resistor unit 112, the resistance value inside the temperature detection unit 11 will be changed. In this application, the current-voltage relationship is adjusted by changing the resistance value inside the temperature detection unit 11. The remaining n - a second switch units 115 are used to turn off according to the second control signal. Here, 0 < a ≤ n.

[0060] As can be seen from the above, the control unit 114 will control the a second switch units 115 to conduct according to the a pulse signals received, and then the a second resistor units 113 are connected in parallel with the first resistor unit 112. In this application, the parallel relationship between the resistor units is changed to change the resistance value inside the temperature detection unit 11, and the current-voltage relationship is adjusted by changing the resistance value inside the temperature detection unit 11. After the current-voltage relationship is changed, the temperature detection unit 11 outputs a new target voltage according to the target current and the adjusted current-voltage relationship to complete the segmented processing of each temperature measurement stage.

[0061] It should be noted that the first control signal and the second control signal are opposite level signals.

[0062] Exemplarily, such as Figure 6As shown, the first switching unit 111 includes a first field-effect transistor M1. The gate of the first field-effect transistor M1 is electrically connected to the clock generation module 20. The drain of the first field-effect transistor M1 is electrically connected to the reference unit 12. The source and the substrate of the first field-effect transistor M1 are both grounded.

[0063] Specifically, when the clock signal is in the detection period, the first field-effect transistor M1 is turned off. When the clock signal is in the reset period, the first field-effect transistor M1 is turned on, and the voltage output by the temperature detection unit 11 is pulled down to 0V.

[0064] Exemplarily, as Figure 6 As shown, the first resistor unit 112 includes a first resistor R1 and a second field-effect transistor M2. The first end of the first resistor R1 is electrically connected to the reference unit 12. The second end of the first resistor R1 is electrically connected to the drain of the second field-effect transistor M2. The gate of the second field-effect transistor M2 is used to receive the power supply voltage VDD. The source and the substrate of the second field-effect transistor M2 are both grounded.

[0065] Specifically, when the clock signal is in the detection period, the first field-effect transistor M1 is turned off; the second field-effect transistor M2 is turned on under the action of the power supply voltage VDD, so that the second end of the first resistor R1 is conducted to the ground, and the target current I_PTAT flows through the first resistor R1, thereby generating a target voltage VOUT at the first end of the first resistor R1. When the clock signal is in the reset period, the first field-effect transistor M1 is turned on, and the target voltage VOUT is directly pulled down to 0V.

[0066] It should be noted that the resistance value of the first resistor R1 is not affected by temperature.

[0067] Exemplarily, as Figure 6 As shown, the second resistor unit 113 includes a second resistor R2. The first end of the second resistor R2 is electrically connected to the reference unit 12. The second end of the second resistor R2 is electrically connected to the first end of the second switching unit 115.

[0068] Exemplarily, as Figure 6 As shown, the second switching unit 115 includes a third field-effect transistor M3. The drain of the third field-effect transistor M3 is electrically connected to the second end of the second resistor R2. The gate of the third field-effect transistor M3 is electrically connected to an output end of the control unit 114. The source and the substrate of the third field-effect transistor M3 are both grounded.

[0069] Specifically, when the clock signal is in the detection period, the first field-effect transistor M1 is turned off. The first resistor R1 is used to output a target voltage according to a target current. The control unit 114 is configured to send a first control signal to a third field-effect transistors M3 respectively when receiving a pulse signals, and send a second control signal to the remaining n - a third field-effect transistors M3 respectively. The a third field-effect transistors M3 are configured to be turned on according to the first control signal, so that a second resistors R2 are connected in parallel with the first resistor R1. After the a second resistors R2 are connected in parallel with the first resistor R1, the resistance value inside the temperature detection unit 11 will be changed. In this application, the current-voltage relationship is adjusted by changing the resistance value inside the temperature detection unit 11. The remaining n - a third field-effect transistors M3 are configured to be turned off according to the second control signal. Wherein, 0 < a ≤ n.

[0070] As can be seen from the above, the control unit 114 will control the a third field-effect transistors M3 to be turned on according to the received a pulse signals, and then make the a second resistors R2 connected in parallel with the first resistor R1. In this application, the parallel relationship between the resistors is changed to change the resistance value inside the temperature detection unit 11, and the current-voltage relationship is adjusted by changing the resistance value inside the temperature detection unit 11. After the current-voltage relationship is changed, the temperature detection unit 11 outputs a new target voltage according to the target current and the adjusted current-voltage relationship to complete the segmented processing of each temperature measurement stage.

[0071] It should be noted that the resistance value of the second resistor R2 is not affected by temperature.

[0072] Exemplarily, as Figure 6 shown, the control unit 114 includes an inverter INV, a first flip-flop D1, and n - 1 logic sub-units 1141. The input end of the inverter INV and the input end of the first flip-flop D1 are both electrically connected to the counting module 30. The reset end of the first flip-flop D1 and the reset ends of the n - 1 logic sub-units 1141 are both electrically connected to the clock generation module 20. The output end of the first flip-flop D1 is electrically connected to the second end of a second switch unit 115. The output ends of the n - 1 logic sub-units are electrically connected to the remaining n - 1 second switch units 115 correspondingly. The second input end of each logic sub-unit 1141 is electrically connected to the output end of the inverter INV. The first input end of the first logic sub-unit 1141 is electrically connected to the output end of the first flip-flop D1. The first input end of the b-th logic sub-unit 1141 is electrically connected to the output end of the (b - 1)-th logic sub-unit 1141. Wherein, 1 < b ≤ n - 1.

[0073] Specifically, the inverter INV is configured to invert the signal output by the counting module 30 to obtain signal. Wherein, the waveform of the signal output by the counting module 30 and signal is as Figure 10When the counting module 30 outputs a pulse signal, the SW1 signal output by the first trigger D1 is the first control signal to turn on one of the n second switch units 115. The second logic subunit 1141 is based on the SW1 signal and The SW2 signal outputted by the signal is the second control signal. The remaining n-2 logic subunits 1141 are controlled according to the corresponding SW signal and The signals also output a second control signal.

[0074] When the counting module 30 outputs two pulse signals, the SW1 signal output by the first trigger D1 and the SW2 signal output by the first logic subunit 1141 are both first control signals, so that two of the n second switch units 115 are turned on. The remaining n-2 logic subunits 1141 are turned on according to the corresponding SW signals and The signals both output the second control signal. The waveforms of the SW1 signal and the SW2 signal are as follows: Figure 10 The subsequent states are similar.

[0075] For example, Figure 6 As shown, the logic subunit 1141 includes a first AND gate AND1, a second trigger D2, a second AND gate AND2 and a third trigger D3. The second input terminal of the first AND gate AND1 and the second input terminal of the second AND gate AND2 are both electrically connected to the output terminal of the inverter INV, the output terminal of the first AND gate AND1 is electrically connected to the input terminal of the second trigger D2, the output terminal of the second trigger D2 is electrically connected to the first input terminal of the second AND gate AND2, the output terminal of the second AND gate AND2 is electrically connected to the input terminal of the third trigger D3, the reset terminal of the second trigger D2 and the reset terminal of the third trigger D3 are both electrically connected to the clock generation module 20, and the output terminal of the third trigger D3 is electrically connected to the corresponding second switch unit 115; in the first logic subunit 1141, the first input terminal of the first AND gate AND1 is electrically connected to the output terminal of the first trigger D1, and in the bth logic subunit, the first input terminal of the first AND gate AND1 is electrically connected to the output terminal of the third trigger D3 in the b-1th logic subunit 1141.

[0076] Specifically, the specific working principle of the logic subunit 1141 is explained by taking the first logic subunit 1141 as an example. Figure 10 As shown, when the counting module 30 outputs two pulse signals, the SW1 signal output by the first trigger D1 is the first control signal, that is, a high level signal. The first AND gate AND1 is based on the SW1 signal and The second trigger D2 outputs a V_b1 signal according to the V_a1 signal, and the second AND gate AND2 outputs a V_b1 signal according to the V_b1 signal and The signal output is the V_c1 signal. The third flip-flop D3 outputs the SW2 signal according to the V_c1 signal. When the counting module 30 outputs two pulse signals, the SW2 signal becomes a high-level signal. Similarly, when the counting module 30 outputs three pulse signals, the SW3 signal output by the second logic sub-unit 1141 becomes a high-level signal, and subsequent states follow the same pattern.

[0077] In some embodiments, as Figure 5 shown, the reference unit 12 includes a current generation unit 121, and the current generation unit 121 is electrically connected to the temperature detection unit 11.

[0078] Specifically, the current generation unit 121 is configured to output a target current according to the current temperature and the temperature-current relationship.

[0079] In some embodiments, as Figure 5 shown, the reference unit 12 further includes a voltage generation unit 122, and the voltage generation unit 122 is electrically connected to the current generation unit 121 and the comparison module 40 respectively.

[0080] Specifically, the current generation unit 121 is further configured to output a first voltage to the voltage generation unit 122. The voltage generation unit 122 is configured to output a reference voltage to the comparison module 40 according to the first voltage.

[0081] Exemplarily, as Figure 7 shown, the current generation unit 121 includes a fourth field-effect transistor M4, a fifth field-effect transistor M5, a sixth field-effect transistor M6, a first operational amplifier AMP1, a third resistor R3, a fourth resistor R4, a fifth resistor R5, a first triode Q1, and a second triode Q2. The source, substrate of the fourth field-effect transistor M4, the source, substrate of the fifth field-effect transistor M5, the source, and source substrate of the sixth field-effect transistor M6 are all configured to receive the power supply voltage VDD. The gate of the fourth field-effect transistor M4 is electrically connected to the gates of the fifth field-effect transistor M5, the sixth field-effect transistor M6, and the output terminal of the first operational amplifier AMP1 respectively. The drain of the sixth field-effect transistor M6 is electrically connected to the temperature detection unit 11. The drain of the fourth field-effect transistor M4 is electrically connected to the first end of the third resistor R3. The drain of the fifth field-effect transistor M5 is electrically connected to the first end of the fourth resistor R4 and the current generation unit 121 respectively. The second end of the third resistor R3 is electrically connected to the first input terminal of the first operational amplifier AMP1 and the emitter of the first triode Q1 respectively. The second end of the fourth resistor R4 is electrically connected to the second input terminal of the first operational amplifier AMP1 and the first end of the fifth resistor R5 respectively. The second end of the fifth resistor R5 is electrically connected to the emitter of the second triode Q2. The bases of the first triode Q1, the second triode Q2, the collector of the first triode Q1, and the collector of the second triode Q2 are all grounded.

[0082] Specifically, the current generation unit 121 utilizes the temperature characteristics of a triode: namely, the voltage between the base and the emitter of the triode changes with temperature. Through the first triode Q1, the second triode Q2, and the first operational amplifier AMP1, a voltage proportional to temperature is generated across the fifth resistor R5, and then a target current I_PTAT proportional to temperature is generated. The target current I_PTAT is mirror-output through the fifth field-effect transistor M5 and the sixth field-effect transistor M6. Among them, a first voltage independent of temperature is generated across the fourth resistor R4. The specific principle is as follows: The voltage across the fourth resistor R4 is represented by the voltage between the base and the emitter of the triode, and finally a first voltage independent of temperature is obtained and transmitted to the voltage generation unit 122.

[0083] Exemplarily, as Figure 7 shown, the voltage generation unit 122 includes a seventh field-effect transistor M7, a sixth resistor R6, a seventh resistor R7, and a second operational amplifier AMP2. The source and the substrate of the seventh field-effect transistor M7 are used to receive the power supply voltage VDD. The gate of the seventh field-effect transistor M7 is electrically connected to the output terminal of the second operational amplifier AMP2. The first input terminal of the second operational amplifier AMP2 is electrically connected to the first terminal of the fourth resistor R4. The second input terminal of the second operational amplifier AMP2 is electrically connected to the first terminals of the sixth resistor R6 and the seventh resistor R7 respectively. The second terminal of the sixth resistor R6 is electrically connected to the drain of the seventh field-effect transistor M7 and the comparison module 40 respectively. The second terminal of the seventh resistor R7 is grounded.

[0084] Specifically, the voltage generation unit 122 utilizes a feedback loop formed by the second operational amplifier AMP2, the sixth resistor R6, the seventh resistor R7, and the seventh field-effect transistor M7, and finally outputs a reference voltage VREF independent of temperature to the comparison module 40.

[0085] In some embodiments, as Figure 8 shown, the temperature measurement circuit further includes a storage module 60. The storage module 60 is electrically connected to the counting module 30, the analog-to-digital conversion module 50, and the clock generation module 20 respectively.

[0086] Specifically, when the clock signal is in the detection period, the storage module 60 is used to store and output the digital signal; the storage module 60 is also used to store the pulse signal and send the pulse signal to an external controller to inform the controller that this temperature measurement stage has ended and the next temperature measurement stage will be entered. When the clock signal is in the reset period, the storage module 60 is used to output the digital signal saved at the end of the detection period.

[0087] Exemplarily, as Figure 8As shown, the analog-to-digital conversion module 50 includes an analog-to-digital converter 51, and the analog-to-digital converter 51 is electrically connected to the temperature detection unit 11, the comparison module 40, the storage module 60, and the clock generation module 20 respectively.

[0088] Exemplarily, the storage module 60 includes a memory.

[0089] It should be noted that the analog-to-digital converter 51, the memory, the clock generation module 20, the counting module 30, and the comparison module 40 can all be implemented by existing technologies, and the specific structures thereof are not limited in this application.

[0090] The embodiment of the present application also provides a temperature measurement device, including the above-mentioned temperature measurement circuit. Since the temperature measurement device provided by the embodiment of the present application includes the above-mentioned temperature measurement circuit, when the temperature measurement device provided by the embodiment of the present application performs temperature measurement, it can segment the temperature measurement process and perform independent measurement and adjustment within each segment, so that the measured voltage can respond more finely to the change of temperature. Within each segment, the change range of the measured voltage is relatively small, so even a very small temperature change will cause a significant change in voltage. This "amplification" effect improves the sensitivity of the voltage to temperature changes. Since within each segment, the relationship between the measured voltage and temperature is clearer and more stable, the temperature value can be measured and recorded more accurately. By continuously repeating the above process, the present application can maintain high-precision measurement within a large temperature range.

[0091] The embodiment of the present application provides a vehicle, including the above-mentioned temperature measurement circuit. Since the vehicle provided by the embodiment of the present application adopts all the technical solutions of all the above embodiments, it has at least all the beneficial effects brought by the technical solutions of the above embodiments, which will not be elaborated here one by one.

[0092] In the above embodiments, the descriptions of each embodiment have their own emphases. For the parts not detailed or recorded in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0093] The above embodiments are only used to illustrate the technical solutions of the present application, rather than to limit them; although the present application has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that they can still modify the technical solutions recorded in the foregoing embodiments, or perform equivalent replacements for some of the technical features; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present application, and should all be included in the protection scope of the present application.

Claims

1. A temperature measurement circuit, characterized in that, It includes a temperature detection module, a counting module, a comparison module and an analog-to-digital conversion module. The temperature detection module is electrically connected to the comparison module, the analog-to-digital conversion module and the counting module respectively, and the counting module is electrically connected to the comparison module; The temperature detection module is used to output a target voltage according to the current temperature and a preset parameter relationship. The analog-to-digital conversion module is used to convert the target voltage into a digital signal. The comparison module is used to output a logic signal to the counting module when the target voltage is equal to a reference voltage. The counting module is used to output a pulse signal to the temperature detection module every time it receives the logic signal; The temperature detection module is further used to adjust the preset parameter relationship according to the number of the received pulse signals, and output a new target voltage according to the current temperature and the adjusted preset parameter relationship; The comparison module is further used to output the logic signal to the counting module when the new target voltage is equal to the reference voltage.

2. The temperature measurement circuit according to claim 1, wherein The temperature measurement circuit further includes a clock generation module, and the clock generation module is electrically connected to the temperature detection module, the counting module, the comparison module and the analog-to-digital conversion module respectively; The clock generation module is used to output a clock signal with multiple detection periods. Each detection period includes a detection period and a reset period. When the clock signal is in the detection period, the temperature detection module, the counting module, the comparison module and the analog-to-digital conversion module all start to work. When the clock signal is in the reset period, the temperature detection module, the counting module, the comparison module and the analog-to-digital conversion module are all reset.

3. The temperature measurement circuit according to claim 2, characterized in that, The temperature detection module includes a temperature detection unit and a reference unit. The temperature detection unit is electrically connected to the reference unit, the counting module, the analog-to-digital conversion module, the comparison module and the clock generation module respectively. The preset parameter relationship includes a temperature-current relationship and a current-voltage relationship; The reference unit is used to output a target current according to the current temperature and the temperature-current relationship; When the clock signal is in the detection period, the temperature detection unit is used to output the target voltage according to the target current and the current-voltage relationship. The temperature detection unit is further used to adjust the current-voltage relationship according to the number of the received pulse signals, and output the new target voltage according to the target current and the adjusted current-voltage relationship.

4. The temperature measurement circuit according to claim 3, wherein The temperature detection unit includes a first switch unit, a first resistor unit, n second resistor units, n second switch units, and a control unit. The first end of the first switch unit, the first end of the first resistor unit, and the first end of each second resistor unit are all electrically connected to the reference unit. The second end of the first switch unit and the reset end of the control unit are both electrically connected to the clock generation module. The first end of each second switch unit is electrically connected to the second end of the corresponding second resistor unit. The n output ends of the control unit are electrically connected to the second ends of the n second switch units in a one-to-one correspondence. The control end of the control unit is electrically connected to the counting module. The third end of the first switch unit, the second end of the first resistor unit, and the third end of each second switch unit are all grounded, where n is a natural number greater than 0. When the clock signal is in the detection period, the first switch unit is turned off. The first resistor unit is used to output the target voltage according to the target current. The control unit is used to send a first control signal to a second switch units and a second control signal to the remaining n - a second switch units respectively when receiving a pulse signals. The second switch unit is used to conduct according to the first control signal, so that the second resistor unit is connected in parallel with the first resistor unit to adjust the current-voltage relationship. The first resistor unit and a second resistor units connected in parallel are used to output the new target voltage according to the target current. The second switch unit is also used to turn off according to the second control signal, where 0 < a ≤ n.

5. The temperature measurement circuit according to claim 4, wherein, The control unit includes an inverter, a first flip-flop, and n - 1 logic sub-units. The input end of the inverter and the input end of the first flip-flop are both electrically connected to the counting module. The reset end of the first flip-flop and the reset ends of the n - 1 logic sub-units are both electrically connected to the clock generation module. The output end of the first flip-flop is electrically connected to the second end of a second switch unit. The output ends of the n - 1 logic sub-units are electrically connected to the remaining n - 1 second switch units correspondingly. The second input end of each logic sub-unit is electrically connected to the output end of the inverter. The first input end of the first logic sub-unit is electrically connected to the output end of the first flip-flop. The first input end of the b-th logic sub-unit is electrically connected to the output end of the (b - 1)-th logic sub-unit, where 1 < b ≤ n - 1.

6. The temperature measurement circuit according to claim 5, wherein The logic sub-unit includes a first AND gate, a second flip-flop, a second AND gate, and a third flip-flop. The second input terminal of the first AND gate and the second input terminal of the second AND gate are both electrically connected to the output terminal of the inverter. The output terminal of the first AND gate is electrically connected to the input terminal of the second flip-flop. The output terminal of the second flip-flop is electrically connected to the first input terminal of the second AND gate. The output terminal of the second AND gate is electrically connected to the input terminal of the third flip-flop. The reset terminals of the second flip-flop and the third flip-flop are both electrically connected to the clock generation module. The output terminal of the third flip-flop is electrically connected to the corresponding second switch unit; In the first logic sub-unit, the first input terminal of the first AND gate is electrically connected to the output terminal of the first flip-flop. In the b-th logic sub-unit, the first input terminal of the first AND gate is electrically connected to the output terminal of the third flip-flop in the (b - 1)-th logic sub-unit.

7. The temperature measurement circuit according to claim 3, wherein The reference unit includes a current generation unit, and the current generation unit is electrically connected to the temperature detection unit; The current generation unit is configured to output the target current according to the current temperature and the temperature-current relationship.

8. The temperature measurement circuit according to claim 7, characterized in that, The reference unit further includes a voltage generation unit, and the voltage generation unit is respectively electrically connected to the current generation unit and the comparison module; The current generation unit is further configured to output a first voltage to the voltage generation unit; the voltage generation unit is configured to output the reference voltage to the comparison module according to the first voltage.

9. A temperature measuring device, characterized in that, Comprising the temperature measurement circuit according to any one of claims 1-8.

10. A vehicle, characterized in that, Comprising the temperature measurement circuit according to any one of claims 1-8.

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