Noise suppression test method and device of vehicle-mounted chip, electronic equipment and medium

Abstract

The invention particularly relates to a noise suppression test method and device for a vehicle-mounted chip, electronic equipment and a medium, and the method comprises the steps: correspondingly generating a noise waveform and a to-be-tested noise signal based on each piece of noise information of a vehicle, simulating a real noise signal of the vehicle based on the to-be-tested noise signal, and obtaining a target noise signal, the target noise signal is injected into the vehicle-mounted chip data link, the error code state of the vehicle-mounted chip data link is recognized, if no error code exists in the vehicle-mounted chip data link, the resistance value of the digital potentiometer is adjusted, the initial resistance value of the digital potentiometer is reset, and the step of injecting the target noise signal into the vehicle-mounted chip data link through the noise injection module continues to be executed; and generating a noise suppression test result of the vehicle-mounted chip until error codes exist in the data link of the vehicle-mounted chip. Therefore, the problem that the inhibition capability of the SerDes chip in the ultimate noise environment cannot be accurately evaluated due to the fact that complex noise interference in a real vehicle-mounted environment cannot be comprehensively simulated is solved.

Description

Technical Field

[0001] This application relates to the field of chip testing technologies, and particularly to a method, device, electronic device, and medium for noise suppression testing of in-vehicle chips. Background Art

[0002] With the development of automotive intelligence, the demand for high-speed data transmission in in-vehicle systems is increasing day by day. SerDes (Serializer / Deserializer) technology has become one of the key technologies in in-vehicle networks due to its high-efficient data transmission ability and low pin count. However, the in-vehicle environment is complex and changeable, with various noise sources such as electromagnetic interference, power supply noise, and mechanical vibration. These noises may cause data transmission errors in SerDes chips, thereby affecting the stability and reliability of in-vehicle systems. Therefore, evaluating the noise suppression ability of SerDes chips in a noisy environment has become an important link to ensure their reliability and stability.

[0003] In related technologies, the SerDes chip testing method is mainly based on the laboratory standard testing environment. However, this testing method cannot comprehensively simulate the complex noise interference in the real in-vehicle environment, which may lead to a deviation between the test result and the actual performance, and thus cannot accurately evaluate the noise suppression ability of SerDes chips in an extreme noise environment. This problem urgently needs to be solved. Summary of the Invention

[0004] This application provides a method, device, electronic device, and medium for noise suppression testing of in-vehicle chips to solve the problems that the test result deviates from the actual performance due to the inability to comprehensively simulate the complex noise interference in the real in-vehicle environment, and thus cannot accurately evaluate the noise suppression ability of SerDes chips in an extreme noise environment.

[0005] In a first aspect embodiment of this application, a method for noise suppression testing of in-vehicle chips is provided, including the following steps:

[0006] Obtain at least one piece of noise information of the vehicle, and generate a noise waveform corresponding to each piece of noise information;

[0007] Generate a to-be-tested noise signal corresponding to each noise waveform, so as to simulate the real noise signal of the vehicle based on the to-be-tested noise signal, obtain the target noise signal of the vehicle, and inject the target noise signal into the in-vehicle chip data link by using a noise injection module;

[0008] Identify the error code status of the in-vehicle chip data link, and determine whether there is an error in the in-vehicle chip data link. If there is no such error in the in-vehicle chip data link, adjust the resistance value of the digital potentiometer of the noise injection module, and reset the initial resistance value of the digital potentiometer of the noise injection module. Then continue to execute the step of injecting the target noise signal into the in-vehicle chip data link using the noise injection module until there is such an error in the in-vehicle chip data link, and generate the noise suppression test result of the in-vehicle chip.

[0009] According to an embodiment of the present application, before obtaining at least one piece of noise information of the vehicle, it further includes:

[0010] Construct a test environment for the in-vehicle chip;

[0011] Start the test program of the in-vehicle chip, initialize the configuration parameters of the in-vehicle chip, and after initializing the configuration parameters of the in-vehicle chip, detect the connection status of the test interface of the in-vehicle chip;

[0012] Judge whether there is an error in the test interface connection status. If there is no error in the test interface connection status, set the initial resistance value of the digital potentiometer of the noise injection module.

[0013] According to an embodiment of the present application, the judgment of whether there is an error in the in-vehicle chip data link includes:

[0014] Obtain the error rate of the in-vehicle chip data link, and judge whether the error rate is greater than a preset error rate;

[0015] If the error rate is greater than the preset error rate, it is determined that there is such an error in the in-vehicle chip data link.

[0016] According to an embodiment of the present application, the adjustment of the resistance value of the digital potentiometer of the noise injection module includes:

[0017] Reduce the resistance value of the digital potentiometer based on a preset adjustment sequence, and record the error rate corresponding to the reduced resistance value of the digital potentiometer.

[0018] According to an embodiment of the present application, after there is such an error in the in-vehicle chip data link, it further includes:

[0019] Increase the resistance value of the digital potentiometer based on a preset adjustment sequence, and judge the error code status of the in-vehicle chip data link based on the increased resistance value of the digital potentiometer;

[0020] If there is such an error in the in-vehicle chip data link, continue to execute the step of increasing the resistance value of the digital potentiometer based on the preset adjustment sequence until there is no such error in the in-vehicle chip data link.

[0021] According to the noise suppression test method of the vehicle-mounted chip of the present application, a noise waveform and a noise signal to be tested are generated corresponding to each piece of noise information of the acquired vehicle, so as to simulate the real noise signal of the vehicle based on the noise signal to be tested to obtain the target noise signal of the vehicle. The target noise signal is injected into the vehicle-mounted chip data link, and its error code state is identified. If there is no error code in the vehicle-mounted chip data link, the resistance value of the digital potentiometer of the noise injection module is adjusted, and the initial digital potentiometer resistance value of the noise injection module is reset, and the step of injecting the target noise signal into the vehicle-mounted chip data link by using the noise injection module is continued until there is an error code in the vehicle-mounted chip data link, and the noise suppression test result of the vehicle-mounted chip is generated. Thereby, the problems that the test result deviates from the actual performance due to the inability to comprehensively simulate the complex noise interference in the real vehicle environment, and thus the suppression ability of the SerDes chip in the extreme noise environment cannot be accurately evaluated are solved. Based on the real vehicle scenario, the real vehicle interference noise not covered by the conventional test standard is collected, and the collected noise is simulated and generated by the test system and injected into the SerDes test platform, so as to evaluate the noise suppression performance of the SerDes chip, and further obtain its reliability and stability in actual application.

[0022] The second aspect embodiment of the present application provides a noise suppression test device for a vehicle-mounted chip, including:

[0023] An acquisition module, configured to acquire at least one piece of noise information of the vehicle, and generate a noise waveform corresponding to each piece of noise information;

[0024] A signal simulation module, configured to generate a noise signal to be tested corresponding to each noise waveform, so as to simulate the real noise signal of the vehicle based on the noise signal to be tested, obtain the target noise signal of the vehicle, and inject the target noise signal into the vehicle-mounted chip data link by using a noise injection module;

[0025] A generation module, configured to identify the error code state of the vehicle-mounted chip data link, and determine whether there is an error code in the vehicle-mounted chip data link. If there is no such error code in the vehicle-mounted chip data link, the resistance value of the digital potentiometer of the noise injection module is adjusted, and the initial digital potentiometer resistance value of the noise injection module is reset, and the step of injecting the target noise signal into the vehicle-mounted chip data link by using the noise injection module is continued until there is such an error code in the vehicle-mounted chip data link, and the noise suppression test result of the vehicle-mounted chip is generated.

[0026] According to an embodiment of the present application, before acquiring at least one piece of noise information of the vehicle, the acquisition module is further configured to:

[0027] Construct a test environment to be tested for the vehicle-mounted chip;

[0028] Start the test program of the vehicle-mounted chip, initialize the configuration parameters of the vehicle-mounted chip, and after initializing the configuration parameters of the vehicle-mounted chip, detect the connection status of the test interface of the vehicle-mounted chip;

[0029] Determine whether there is an error code in the connection status of the test interface. If there is no error code in the connection status of the test interface, set the initial digital potentiometer resistance value of the noise injection module.

[0030] According to an embodiment of the present application, the generating module is specifically configured to:

[0031] Obtain the bit error rate of the data link of the vehicle-mounted chip, and determine whether the bit error rate is greater than a preset bit error rate;

[0032] If the bit error rate is greater than the preset bit error rate, it is determined that there is an error code in the data link of the vehicle-mounted chip.

[0033] According to an embodiment of the present application, the generating module is specifically configured to:

[0034] Reduce the digital potentiometer resistance value based on a preset adjustment sequence, and record the bit error rate corresponding to the reduced digital potentiometer resistance value.

[0035] According to an embodiment of the present application, after there is an error code in the data link of the vehicle-mounted chip, the generating module is further configured to:

[0036] Increase the digital potentiometer resistance value based on a preset adjustment sequence, and determine the error code status of the data link of the vehicle-mounted chip based on the increased digital potentiometer resistance value;

[0037] If there is an error code in the data link of the vehicle-mounted chip, continue to execute the step of increasing the digital potentiometer resistance value based on the preset adjustment sequence until there is no error code in the data link of the vehicle-mounted chip.

[0038] The noise suppression test device for in-vehicle chips according to the present application generates a noise waveform and a to-be-tested noise signal corresponding to each noise information of the vehicle, based on the to-be-tested noise signal, simulates the real noise signal of the vehicle to obtain the target noise signal of the vehicle, injects the target noise signal into the in-vehicle chip data link, and identifies its error code status. If there is no error code in the in-vehicle chip data link, adjust the resistance value of the digital potentiometer of the noise injection module, and reset the initial resistance value of the digital potentiometer of the noise injection module, and continue to execute the step of injecting the target noise signal into the in-vehicle chip data link by using the noise injection module until there is an error code in the in-vehicle chip data link, and generate the noise suppression test result of the in-vehicle chip. Thus, the problems that the test result deviates from the actual performance due to the inability to comprehensively simulate the complex noise interference in the real in-vehicle environment, and further the inability to accurately evaluate the suppression ability of the SerDes chip in the extreme noise environment are solved. Based on the real vehicle scenario, the real vehicle interference noise not covered by the conventional test standard is collected, and the collected noise is simulated and generated by the test system and injected into the SerDes test platform, so as to evaluate the noise suppression performance of the SerDes chip, and further obtain its reliability and stability in the actual application.

[0039] An embodiment of the third aspect of the present application provides an electronic device, including: a memory, a processor, and a computer program stored on the memory and executable on the processor, and the processor executes the program to implement the noise suppression test method for in-vehicle chips as described in the above embodiment.

[0040] An embodiment of the fourth aspect of the present application provides a computer-readable storage medium, and the computer-readable storage medium stores computer instructions for causing the computer to execute the noise suppression test method for in-vehicle chips as described in the above embodiment.

[0041] An embodiment of the fifth aspect of the present application provides a computer program product, including a computer program, and the computer program is executed to implement the noise suppression test method for in-vehicle chips as described in the above embodiment.

[0042] The additional aspects and advantages of the present application will be partially given in the following description, partially become obvious from the following description, or be understood through the practice of the present application. Description of the Drawings

[0043] The above and / or additional aspects and advantages of the present application will become obvious and easy to understand from the following description of the embodiments in conjunction with the drawings, where:

[0044] Figure 1 It is a flowchart of a noise suppression test method for in-vehicle chips according to an embodiment of the present application;

[0045] Figure 2 Flow chart of a system for the noise suppression ability of a SerDes chip according to an embodiment of the present application;

[0046] Figure 3 Schematic structural diagram of a real vehicle SerDes transmission link interference noise acquisition system according to an embodiment of the present application;

[0047] Figure 4 Schematic structural diagram of a noise injection test system according to an embodiment of the present application;

[0048] Figure 5 Schematic hardware architecture diagram of a noise injection module according to an embodiment of the present application;

[0049] Figure 6 Example diagram of a noise suppression test device for an in-vehicle chip according to an embodiment of the present application;

[0050] Figure 7 Schematic structural diagram of an electronic device according to an embodiment of the present application. Detailed implementation manners

[0051] The embodiments of the present application are described in detail below. The examples of the embodiments are shown in the accompanying drawings, where the same or similar reference numerals indicate the same or similar elements or elements with the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and are intended to explain the present application, and should not be construed as limiting the present application.

[0052] The noise suppression test method, device, electronic device and medium of an in-vehicle chip according to an embodiment of the present application will be described below with reference to the accompanying drawings. In view of the problem in the above-mentioned background technology that due to the inability to comprehensively simulate the complex noise interference in the real in-vehicle environment, the test results deviate from the actual performance, and thus the suppression ability of the SerDes chip in the extreme noise environment cannot be accurately evaluated, the present application provides a noise suppression test method for an in-vehicle chip. In this method, a noise waveform and a noise signal to be tested are respectively generated based on each piece of noise information obtained for the vehicle, so as to simulate the real noise signal of the vehicle based on the noise signal to be tested to obtain the target noise signal of the vehicle. The target noise signal is injected into the data link of the in-vehicle chip, and its error code state is identified. If there is no error code in the data link of the in-vehicle chip, the resistance value of the digital potentiometer of the noise injection module is adjusted, and the initial resistance value of the digital potentiometer of the noise injection module is reset, and the step of injecting the target noise signal into the data link of the in-vehicle chip by using the noise injection module is continued until there is an error code in the data link of the in-vehicle chip, and the noise suppression test result of the in-vehicle chip is generated. Thereby, the problems that due to the inability to comprehensively simulate the complex noise interference in the real in-vehicle environment, the test results deviate from the actual performance, and thus the suppression ability of the SerDes chip in the extreme noise environment cannot be accurately evaluated, etc. are solved. The in-vehicle interference noise not covered by the conventional test standards is collected based on the real vehicle scenario, and the collected noise is simulated and generated by the test system and injected into the SerDes test platform, so as to evaluate the noise suppression performance of the SerDes chip, and further obtain its reliability and stability in actual applications.

[0053] Specifically, Figure 1 is a schematic flowchart of a noise suppression test method for an in-vehicle chip provided by an embodiment of the present application.

[0054] As Figure 1 shown, the noise suppression test method for the in-vehicle chip includes the following steps:

[0055] In step S101, at least one piece of noise information of the vehicle is obtained, and a noise waveform is generated correspondingly based on each piece of noise information.

[0056] According to an embodiment of the present application, before obtaining at least one piece of noise information of the vehicle, it further includes: constructing a test environment for the in-vehicle chip; starting the test program of the in-vehicle chip, initializing the configuration parameters of the in-vehicle chip, and after initializing the configuration parameters of the in-vehicle chip, detecting the connection state of the test interface of the in-vehicle chip; determining whether there is an error code in the test interface connection state, and if there is no error code in the test interface connection state, setting the initial resistance value of the digital potentiometer of the noise injection module.

[0057] Specifically, to address the issue in the prior art where complex noise interference in a real vehicle environment cannot be fully simulated, resulting in a deviation between the test results and the actual performance, and thus the inability to accurately evaluate the noise suppression ability of in-vehicle chips (such as SerDes chips) in an extreme noise environment, the embodiments of this application collect real vehicle interference noise not covered by the conventional test standards based on the real vehicle scenario, and simulate and generate the collected noise through a test system and inject it into the SerDes test platform to evaluate the noise suppression performance of the SerDes chip, thereby evaluating its reliability and stability in actual applications.

[0058] Specifically, as Figure 2 shown, before conducting the SerDes chip noise suppression test, it is first necessary to construct the test environment for the in-vehicle chip, install the SerDes chip on the test platform, ensure correct electrical connection, and check whether the link between the serializer and the deserializer is normal after the digital power is applied; secondly, start the test program of the host computer test system, that is, start the test program of the SerDes chip and initialize the configuration parameters of the SerDes chip. After initializing the configuration parameters of the SerDes chip, detect the connection status of the test interface of the SerDes chip. If there is no error in the connection status of the test interface, control and adjust the resistance value of the initial digital potentiometer in the noise injection module through the host computer control system to adjust the injection current of the target noise signal.

[0059] Furthermore, the main test systems involved in the SerDes chip noise suppression test method of the embodiments of this application include a real vehicle SerDes transmission link interference noise acquisition system, a noise injection test system, and a hardware architecture of the noise injection module. Among them, as Figure 3 shown, the real vehicle SerDes transmission link interference noise acquisition system is a noise acquisition board, which mainly includes a noise acquisition port, a high-speed connector, high-speed signal lines, in-vehicle components (including the serializer end and the deserializer end), and a high-speed oscilloscope. Among them, the noise acquisition board is connected in series to the in-vehicle component link, and the high-speed oscilloscope is connected to the noise acquisition port of the noise acquisition board. The noise acquisition port is used to collect at least one noise information of the vehicle, capture the corresponding noise waveform according to the at least one noise information of the vehicle, and send the captured noise waveform to the high-speed oscilloscope, and the high-speed oscilloscope stores the noise waveform into the real vehicle interference noise signal waveform library.

[0060] In step S102, a to-be-tested noise signal is generated corresponding to each noise waveform to simulate the real noise signal of the vehicle based on the to-be-tested noise signal, obtain the target noise signal of the vehicle, and inject the target noise signal into the in-vehicle chip data link using the noise injection module.

[0061] Specifically, as Figure 4As shown in the figure, the noise injection test system of the embodiment of the present application mainly includes a digital power supply, a noise injection module, a serializer test platform, a deserializer test platform, a host computer control system, a cable, a control signal, and an arbitrary waveform signal generator. Among them, the serializer test platform is used to install the serializer chip to be tested; the deserializer test platform is used to install the deserializer chip to be tested; the noise injection module is connected in series between the serializer test platform and the deserializer test platform through a cable, and is used to inject a target noise signal into the high-speed communication link between the serializer and the deserializer, and supports single-ended / differential noise injection. The noise current intensity is adjusted by a digital potentiometer; the host computer control system includes system control software and status data acquisition software, which is used to control the arbitrary waveform signal generator to generate a target noise signal, collect the status of the SerDes chip (such as bit error rate, lock status, etc.) and record the status signals of the serializer and the deserializer; the arbitrary waveform generator is used to generate an arbitrary waveform model to simulate the noise signal of the newly added on-vehicle environment, and is adjustable; the cable is a commonly used SerDes transmission connection cable for vehicles, such as a coaxial cable, a shielded twisted pair cable, etc.

[0062] Specifically, based on the captured noise waveform, the arbitrary waveform generator generates a noise signal to be tested correspondingly, so as to simulate the real noise signal of the vehicle based on the noise signal to be tested, obtain the target noise signal of the vehicle, and use the noise injection module to inject the target noise signal into the on-vehicle chip data link.

[0063] Among them, the digital power supply is the power supply of the serializer test platform and the deserializer test platform, with ≥ two channels, the supply voltage ≥ 12V, and the supply current ≥ 1A; the generation of the arbitrary waveform noise signal can be programmed through the host computer control system, the output signal frequency ≥ 10MHz, the signal rise and fall edges can be adjusted down to 1ns, and the output amplitude can be adjusted from -6V to 12V and can be programmed; in the serializer test platform, the high-speed connector interface operates at a frequency ≥ 6GHz, is externally powered by 12V, supports USB to I2C communication, and the I2C rate is 100Kbps to 1Mbps; in the deserializer test platform, the high-speed connector interface operates at a frequency ≥ 6GHz, is externally powered by 12V, supports USB to I2C communication, and the I2C rate is 100Kbps to 1Mbps; the high-speed connector interface of the noise injection module operates at a frequency ≥ 6GHz and has an I2C control interface; the high-speed oscilloscope has a bandwidth ≥ 500MHz, a sampling rate ≥ 10GSa / s, and a storage depth ≥ 500Mpts, and is programmable and controllable.

[0064] It should be noted that the serializer test platform and the deserializer can both be powered by an external digital power supply, or the serializer test platform can be powered by the deserializer test platform through a cable, or the deserializer test platform can be powered by the serializer test platform through a cable. The power supply of the serializer test platform and the deserializer test platform can be configured according to the actual application situation.

[0065] Furthermore, as Figure 5 shown, the hardware architecture of the noise injection module according to an embodiment of the present application mainly includes a power supply module, a digital potentiometer, a noise injection interface, a control interface, a high-speed connector, a high-speed signal line, a serializer test platform, and a deserializer test platform. Among them, the noise injection interface is used to connect an arbitrary waveform signal generator to access noise; the digital potentiometer is connected in series between the noise injection interface and the SerDes high-speed signal line, and its resistance value is adjustable, and is used to limit the current intensity of the injected noise; the control interface is used to connect to the host computer control system, and the system control software can control the resistance of the digital potentiometer; the noise injection module can access single-ended signal noise and differential signal noise.

[0066] In step S103, identify the error code status of the in-vehicle chip data link, and determine whether there is an error in the in-vehicle chip data link. If there is no error in the in-vehicle chip data link, adjust the resistance value of the digital potentiometer of the noise injection module, and reset the initial resistance value of the digital potentiometer of the noise injection module, and continue to execute the step of injecting the target noise signal into the in-vehicle chip data link using the noise injection module until there is an error in the in-vehicle chip data link, and generate the noise suppression test result of the in-vehicle chip.

[0067] According to an embodiment of the present application, determining whether there is an error in the in-vehicle chip data link includes: obtaining the error rate of the in-vehicle chip data link, and determining whether the error rate is greater than a preset error rate; if the error rate is greater than the preset error rate, it is determined that there is an error in the in-vehicle chip data link.

[0068] According to an embodiment of the present application, adjusting the resistance value of the digital potentiometer of the noise injection module includes: reducing the resistance value of the digital potentiometer based on a preset adjustment sequence, and recording the error rate corresponding to the reduced resistance value of the digital potentiometer.

[0069] According to an embodiment of the present application, after there is an error in the in-vehicle chip data link, it further includes: increasing the resistance value of the digital potentiometer based on a preset adjustment sequence, and determining the error code status of the in-vehicle chip data link based on the increased resistance value of the digital potentiometer; if there is an error in the in-vehicle chip data link, continue to execute the step of increasing the resistance value of the digital potentiometer based on the preset adjustment sequence until there is no error in the in-vehicle chip data link.

[0070] Among them, both the preset error rate and the preset adjustment sequence can be set by those skilled in the art according to actual test requirements, or can be obtained through a limited number of computer simulations, and no specific limitation is made here.

[0071] Specifically, as Figure 2 shown, after injecting the target noise signal into the in-vehicle chip data link using the noise injection module, it is necessary to further analyze the stability of the target noise signal. First, identify the error state of the in-vehicle chip data link and determine whether there is an error in the in-vehicle chip data link. If the error rate of the in-vehicle chip data link is greater than the preset error rate, it can be determined that there is an error in the in-vehicle chip data link. If there is an error in the in-vehicle chip data link, it indicates that the currently injected target noise signal has exceeded the range that the chip under test can effectively suppress. Therefore, in order to evaluate the performance of the SerDes chip under lower noise conditions or find the maximum noise threshold it can withstand, it is necessary to increase the digital potentiometer resistance of the noise injection module based on the preset adjustment sequence, thereby reducing the noise current injected into the in-vehicle chip data link, that is, reducing the noise intensity, until the error disappears. This can reduce the impact on the SerDes chip, and then approach the actual noise tolerance of the SerDes chip, helping to determine its accurate noise suppression ability boundary.

[0072] Furthermore, if there is no error in the in-vehicle chip data link, it indicates that the currently injected target noise signal has not exceeded the range that the chip under test can effectively suppress. Therefore, in order to evaluate the performance of the SerDes chip under higher noise conditions, it is necessary to reduce the digital potentiometer resistance based on the preset adjustment sequence (for example, from 50 kΩ → 30 kΩ), and record the error rate corresponding to the reduced digital potentiometer resistance. At the same time, it is necessary to adjust the starting resistance and other relevant parameters for the next round of testing, that is, reset the initial digital potentiometer resistance of the noise injection module, so as to help start testing from different starting points, thereby comprehensively understanding the performance of the SerDes chip within the entire noise range, and continue to execute the step of injecting the target noise signal into the in-vehicle chip data link using the noise injection module until there is an error in the in-vehicle chip data link. After there is an error in the in-vehicle chip data link, increase the digital potentiometer resistance of the noise injection module based on the above-mentioned preset adjustment sequence, and finely adjust the digital potentiometer resistance, thereby reducing the noise current injected into the in-vehicle chip data link, and finally until the error disappears. This can ensure that each test can provide valuable data, helping to comprehensively understand the noise suppression ability of the SerDes chip, and finally generating the noise suppression test result of the in-vehicle chip.

[0073] According to the noise suppression test method of the in-vehicle chip of the present application, a noise waveform and a noise signal to be tested are respectively generated based on each piece of noise information of the vehicle obtained, so as to simulate the real noise signal of the vehicle based on the noise signal to be tested to obtain the target noise signal of the vehicle. The target noise signal is injected into the data link of the in-vehicle chip, and its error code state is identified. If there is no error code in the data link of the in-vehicle chip, the resistance value of the digital potentiometer of the noise injection module is adjusted, and the initial resistance value of the digital potentiometer of the noise injection module is reset, and the step of injecting the target noise signal into the data link of the in-vehicle chip by using the noise injection module is continued until there is an error code in the data link of the in-vehicle chip, and the noise suppression test result of the in-vehicle chip is generated. Thereby, the problems that the test result deviates from the actual performance due to the inability to comprehensively simulate the complex noise interference in the real in-vehicle environment, and thus the suppression ability of the SerDes chip in the extreme noise environment cannot be accurately evaluated are solved. The real vehicle interference noise not covered by the conventional test standard is collected based on the real vehicle scenario, and the collected noise is simulated and generated by the test system and injected into the SerDes test platform, so as to evaluate the noise suppression performance of the SerDes chip, and further obtain its reliability and stability in the actual application.

[0074] Next, a noise suppression test device for an in-vehicle chip according to an embodiment of the present application will be described with reference to the accompanying drawings.

[0075] Figure 6 It is a block diagram of a noise suppression test device for an in-vehicle chip according to an embodiment of the present application.

[0076] As Figure 6 shown, the noise suppression test device 10 for the in-vehicle chip includes: an acquisition module 100, a signal simulation module 200, and a generation module 300.

[0077] Among them, the acquisition module 100 is configured to acquire at least one piece of noise information of the vehicle and respectively generate a noise waveform based on each piece of noise information;

[0078] The signal simulation module 200 is configured to respectively generate a noise signal to be tested based on each noise waveform, so as to simulate the real noise signal of the vehicle based on the noise signal to be tested to obtain the target noise signal of the vehicle, and inject the target noise signal into the data link of the in-vehicle chip by using the noise injection module;

[0079] A generation module 300 is configured to identify the error code status of the in-vehicle chip data link, and determine whether there is an error in the in-vehicle chip data link. If there is no error in the in-vehicle chip data link, it adjusts the resistance value of the digital potentiometer of the noise injection module, and resets the initial resistance value of the digital potentiometer of the noise injection module, and continues to execute the step of injecting the target noise signal into the in-vehicle chip data link by using the noise injection module until there is an error in the in-vehicle chip data link, and generates a noise suppression test result of the in-vehicle chip.

[0080] According to an embodiment of the present application, before obtaining at least one piece of noise information of the vehicle, the obtaining module 100 is further configured to:

[0081] Construct a test environment to be tested for the in-vehicle chip;

[0082] Start the test program of the in-vehicle chip, initialize the configuration parameters of the in-vehicle chip, and after initializing the configuration parameters of the in-vehicle chip, detect the connection status of the test interface of the in-vehicle chip;

[0083] Determine whether there is an error in the connection status of the test interface. If there is no error in the connection status of the test interface, set the initial resistance value of the digital potentiometer of the noise injection module.

[0084] According to an embodiment of the present application, the generation module 300 is specifically configured to:

[0085] Obtain the error rate of the in-vehicle chip data link, and determine whether the error rate is greater than a preset error rate;

[0086] If the error rate is greater than the preset error rate, it is determined that there is an error in the in-vehicle chip data link.

[0087] According to an embodiment of the present application, the generation module 300 is specifically configured to:

[0088] Reduce the resistance value of the digital potentiometer based on a preset adjustment sequence, and record the error rate corresponding to the reduced resistance value of the digital potentiometer.

[0089] According to an embodiment of the present application, after there is an error in the in-vehicle chip data link, the generation module 300 is further configured to:

[0090] Increase the resistance value of the digital potentiometer based on a preset adjustment sequence, and determine the error code status of the in-vehicle chip data link based on the increased resistance value of the digital potentiometer;

[0091] If there is an error in the in-vehicle chip data link, continue to execute the step of increasing the resistance value of the digital potentiometer based on the preset adjustment sequence until there is no error in the in-vehicle chip data link.

[0092] The noise suppression test device for in-vehicle chips according to the present application generates a noise waveform and a to-be-tested noise signal corresponding to each noise information of the vehicle, and based on the to-be-tested noise signal, simulates the real noise signal of the vehicle to obtain the target noise signal of the vehicle. The target noise signal is injected into the in-vehicle chip data link, and its error code state is identified. If there is no error code in the in-vehicle chip data link, the resistance value of the digital potentiometer of the noise injection module is adjusted, and the initial digital potentiometer resistance value of the noise injection module is reset, and the step of injecting the target noise signal into the in-vehicle chip data link by using the noise injection module is continued until there is an error code in the in-vehicle chip data link, and the noise suppression test result of the in-vehicle chip is generated. Thus, the problems that the test result deviates from the actual performance due to the inability to comprehensively simulate the complex noise interference in the real in-vehicle environment, and thus the suppression ability of the SerDes chip in the extreme noise environment cannot be accurately evaluated are solved. Based on the real vehicle scenario, the in-vehicle interference noise not covered by the conventional test standards is collected, and the collected noise is simulated and generated by the test system and injected into the SerDes test platform, so as to evaluate the noise suppression performance of the SerDes chip, and further obtain its reliability and stability in actual applications.

[0093] Figure 7 The structural schematic diagram of the electronic device provided by the embodiment of the present application. The electronic device may include:

[0094] A memory 701, a processor 702, and a computer program stored on the memory 701 and executable on the processor 702.

[0095] When the processor 702 executes the program, it implements the noise suppression test method for the in-vehicle chip provided in the above embodiment.

[0096] Further, the electronic device further includes:

[0097] A communication interface 703 for communication between the memory 701 and the processor 702.

[0098] The memory 701 is used to store a computer program executable on the processor 702.

[0099] The memory 701 may include a high-speed RAM memory, and may also include a non-volatile memory, such as at least one disk memory.

[0100] If the memory 701, the processor 702, and the communication interface 703 are implemented independently, the communication interface 703, the memory 701, and the processor 702 can be interconnected via a bus and communicate with each other. The bus can be an Industry Standard Architecture (ISA) bus, a Peripheral Component Interconnect (PCI) bus, an Extended Industry Standard Architecture (EISA) bus, etc. The bus can be divided into an address bus, a data bus, a control bus, etc. For ease of representation, Figure 7 only a thick line is used to represent it in Figure 7 , but it does not mean that there is only one bus or one type of bus.

[0101] Optionally, in a specific implementation, if the memory 701, the processor 702, and the communication interface 703 are integrated on a single chip, the memory 701, the processor 702, and the communication interface 703 can communicate with each other through an internal interface.

[0102] The processor 702 may be a Central Processing Unit (CPU), or an Application Specific Integrated Circuit (ASIC), or one or more integrated circuits configured to implement the embodiments of the present application.

[0103] This embodiment also provides a computer-readable storage medium, on which a computer program is stored. When the program is executed by a processor, the noise suppression test method of the in-vehicle chip as described above is implemented.

[0104] This embodiment also provides a computer program product, including a computer program, which is executed to implement the noise suppression test method of the in-vehicle chip in the above embodiment.

[0105] In the description of this specification, the descriptions with reference to terms such as "one embodiment", "some embodiments", "examples", "specific examples", or "some examples" etc. mean that the specific features, structures, materials, or characteristics described in connection with the embodiment or example are included in at least one embodiment or example of this application. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials, or characteristics described can be combined in any one or N embodiments or examples in a suitable manner. In addition, without contradiction, those skilled in the art can combine and combine the different embodiments or examples described in this specification and the features of different embodiments or examples.

[0106] In addition, the terms "first" and "second" are used for descriptive purposes only and cannot be construed as indicating or implying relative importance or implicitly specifying the quantity of the indicated technical features. Thus, the features defined with "first" and "second" may explicitly or implicitly include at least one of such features. In the description of this application, "N" means at least two, such as two, three, etc., unless otherwise specifically defined.

[0107] Any process or method description shown in the flowchart or described in other ways herein can be understood to represent a module, segment, or portion of code including one or more N executable instructions for implementing a customized logical function or process, and the scope of the preferred embodiments of this application includes additional implementations, where the functions can be executed in a substantially simultaneous manner or in the reverse order according to the involved functions, rather than in the order shown or discussed, which should be understood by those skilled in the art to which the embodiments of this application belong.

[0108] The logic and / or steps represented in the flowchart or otherwise described herein, for example, can be considered as a definite sequence list of executable instructions for implementing logical functions, and can be specifically implemented in any computer-readable medium for use by an instruction execution system, apparatus, or device (such as a computer-based system, a system including a processor, or other systems that can fetch and execute instructions from the instruction execution system, apparatus, or device), or in conjunction with these instruction execution systems, apparatus, or devices. For the purposes of this specification, a "computer-readable medium" can be any device that can contain, store, communicate, propagate, or transport a program for use by or in conjunction with an instruction execution system, apparatus, or device. More specific examples (non-exhaustive list) of computer-readable media include the following: an electrical connection part (electronic device) having one or N wirings, a portable computer disk cartridge (magnetic device), a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber device, and a portable compact disc read-only memory (CDROM). Additionally, the computer-readable medium can even be paper or other suitable media on which a program can be printed, because the program can be obtained electronically, for example, by optically scanning the paper or other media, followed by editing, interpretation, or otherwise processing as appropriate, and then storing it in a computer memory.

[0109] It should be understood that various parts of the present application can be implemented by hardware, software, firmware, or a combination thereof. In the above embodiments, the N steps or methods can be implemented by software or firmware stored in a memory and executed by a suitable instruction execution system. For example, if implemented in hardware, as in another embodiment, any one or a combination of the following techniques well known in the art can be used: discrete logic circuits having logic gate circuits for implementing logical functions on data signals, application-specific integrated circuits having appropriate combinational logic gate circuits, programmable gate arrays (PGAs), field-programmable gate arrays (FPGAs), etc.

[0110] Those of ordinary skill in the art of this technology can understand that all or part of the steps carried by the methods of the above embodiments can be completed by a program instructing relevant hardware, and the program can be stored in a computer-readable storage medium. When the program is executed, it includes one or a combination of the steps of the method embodiments.

[0111] In addition, each functional unit in various embodiments of the present application may be integrated into one processing module, or each unit may exist physically alone, or two or more units may be integrated into one module. The above-mentioned integrated module may be implemented in the form of hardware or in the form of a software functional module. When the integrated module is implemented in the form of a software functional module and sold or used as an independent product, it may also be stored in a computer-readable storage medium.

[0112] The above-mentioned storage medium may be a read-only memory, a magnetic disk, an optical disc, etc. Although the embodiments of the present application have been shown and described above, it can be understood that the above embodiments are exemplary and should not be construed as limiting the present application. Those of ordinary skill in the art can make changes, modifications, substitutions, and variations to the above embodiments within the scope of the present application.

Claims

1. A noise suppression test method for in-vehicle chips, characterized in that, Including the following steps: Obtain at least one piece of noise information of the vehicle, and correspondingly generate a noise waveform based on each piece of noise information; Correspondingly generate a to-be-tested noise signal based on each noise waveform, to simulate the real noise signal of the vehicle based on the to-be-tested noise signal, obtain the target noise signal of the vehicle, and use a noise injection module to inject the target noise signal into the in-vehicle chip data link; Identify the error code state of the in-vehicle chip data link, and determine whether there is an error in the in-vehicle chip data link. If there is no error in the in-vehicle chip data link, adjust the resistance value of the digital potentiometer of the noise injection module, and reset the initial resistance value of the digital potentiometer of the noise injection module, and continue to execute the step of using the noise injection module to inject the target noise signal into the in-vehicle chip data link until there is an error in the in-vehicle chip data link, and generate the noise suppression test result of the in-vehicle chip.

2. The method according to claim 1, wherein Before obtaining at least one piece of noise information of the vehicle, it further includes: Construct a to-be-tested environment for the in-vehicle chip; Start the test program of the in-vehicle chip, initialize the configuration parameters of the in-vehicle chip, and after initializing the configuration parameters of the in-vehicle chip, detect the connection state of the test interface of the in-vehicle chip; Determine whether there is an error in the test interface connection state. If there is no error in the test interface connection state, set the initial resistance value of the digital potentiometer of the noise injection module.

3. The method according to claim 1, characterized in that, The determination of whether there is an error in the in-vehicle chip data link includes: Obtain the error rate of the in-vehicle chip data link, and determine whether the error rate is greater than a preset error rate; If the error rate is greater than the preset error rate, it is determined that there is an error in the in-vehicle chip data link.

4. The method according to claim 1, wherein The adjustment of the resistance value of the digital potentiometer of the noise injection module includes: Reduce the resistance value of the digital potentiometer based on a preset adjustment sequence, and record the error rate corresponding to the reduced resistance value of the digital potentiometer.

5. The method according to claim 1, wherein After there is an error in the in-vehicle chip data link, it further includes: Increase the resistance value of the digital potentiometer based on a preset adjustment sequence, and determine the error code state of the in-vehicle chip data link based on the increased resistance value of the digital potentiometer; If there is an error in the in-vehicle chip data link, continue to execute the step of increasing the resistance value of the digital potentiometer based on the preset adjustment sequence until there is no error in the in-vehicle chip data link.

6. A noise suppression test device for an in-vehicle chip, characterized in that, It includes: An acquisition module, configured to obtain at least one piece of noise information of the vehicle, and correspondingly generate a noise waveform based on each piece of noise information; A signal simulation module, configured to correspondingly generate a to-be-tested noise signal based on each noise waveform, to simulate the real noise signal of the vehicle based on the to-be-tested noise signal, obtain the target noise signal of the vehicle, and use a noise injection module to inject the target noise signal into the in-vehicle chip data link; A generation module, configured to identify an error code status of the in-vehicle chip data link, and determine whether there is an error code in the in-vehicle chip data link. If there is no such error code in the in-vehicle chip data link, adjust a resistance value of a digital potentiometer of the noise injection module, and reset an initial resistance value of the digital potentiometer of the noise injection module, and continue to execute the step of injecting the target noise signal into the in-vehicle chip data link by using the noise injection module until there is such an error code in the in-vehicle chip data link, and generate a noise suppression test result of the in-vehicle chip.

7. The device according to claim 6, characterized in that, Before obtaining at least one piece of noise information of the vehicle, the obtaining module is further configured to: Construct a test environment to be tested for the in-vehicle chip; Start a test program of the in-vehicle chip, initialize configuration parameters of the in-vehicle chip, and after initializing the configuration parameters of the in-vehicle chip, detect a connection status of a test interface of the in-vehicle chip; Determine whether there is an error code in the connection status of the test interface. If there is no error code in the connection status of the test interface, set an initial resistance value of a digital potentiometer of the noise injection module.

8. The device according to claim 6, characterized in that The generation module is specifically configured to: Obtain an error code rate of the in-vehicle chip data link, and determine whether the error code rate is greater than a preset error code rate; If the error code rate is greater than the preset error code rate, determine that there is such an error code in the in-vehicle chip data link.

9. An electronic device, characterized in that, It includes: A memory, a processor, and a computer program stored on the memory and executable on the processor. The processor executes the program to implement the noise suppression test method for an in-vehicle chip according to any one of claims 1-5.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that, The program is executed by the processor to be used for implementing the noise suppression test method for an in-vehicle chip according to any one of claims 1-5.

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