Novel jig for chip test module

Abstract

The invention discloses a novel jig for a chip test module, and the novel jig comprises a jig frame which comprises a limiting frame for placing a chip, the jig frame can be separated into at least two jig sub-frames at the limiting frame, and at least two adjacent jig sub-frames are connected through an adjustable connection assembly; and the test board is arranged below the jig frame, the test board comprises a contact which is in contact with a pin of a chip, and each jig sub-frame and the test board are positioned through a positioning structure. The novel jig has the advantages that the influence of jig frame machining precision and assembling errors on chip testing is reduced, the assembling precision and stability between the jig frame and the testing plate can be improved, and the open-circuit and short-circuit abnormal conditions of the testing chip are reduced.

Description

Technical Field

[0001] The present invention relates to the field of image sensor testing, and particularly to a novel fixture for a chip testing module. Background Art

[0002] With the vigorous development of semiconductor technology, chips are more and more widely used, and the requirements for chip performance are also getting higher and higher. A normal chip requires thousands of process steps from a silicon wafer to the final packaged product. The multiple process steps inevitably generate complexity during processing, especially in multiple patterning technologies. Due to the fine characteristics of the chip structure and the cumbersome complexity of the manufacturing process, potential defects will inevitably be left during production, resulting in the chips produced not meeting the standard requirements and being prone to failure for various reasons at any time. Therefore, in order to ensure chip quality, chips are usually tested to ensure the yield rate of the chips leaving the factory.

[0003] In actual testing work, various factors will affect the chip test results, thereby affecting the production quality and preparation scale of integrated circuits, etc. For example, during the chip testing process, the assembly accuracy of the fixture carrying the test module has an important impact on the chip test results. There may be an offset between the test module and the test board due to processing or assembly problems of the fixture, resulting in abnormal open / short circuit of the test chip, affecting the test results and causing great losses to production. Therefore, it is necessary to improve the existing structure.

[0004] It can be understood that the above statements only provide background art related to the present invention and do not necessarily constitute prior art. Summary of the Invention

[0005] Based on the foregoing technical problems, the purpose of the present invention is to provide a novel fixture for a chip testing module. The novel fixture combines a separable fixture frame with a test board, realizes the positioning of each fixture sub-frame of the fixture frame on the test board by means of a positioning structure, and then connects each fixture sub-frame through an adjustable connection component to achieve the assembly of the entire fixture frame on the test board. This structure reduces the influence of the processing accuracy and assembly error of the fixture frame on chip testing, helps to improve the assembly accuracy and stability between the fixture frame and the test board, and reduces the abnormal open / short circuit situation of the test chip.

[0006] To achieve the above purpose, the present invention is realized through the following technical solutions:

[0007] A novel fixture for a chip testing module, comprising:

[0008] A fixture frame, which includes a limiting frame for placing chips, and the fixture frame can be separated into at least two fixture sub-frames at the limiting frame, and at least two adjacent fixture sub-frames are connected by an adjustable connection component;

[0009] A test board, which is arranged below the fixture frame, and the test board includes contacts that contact the pins of the chip, and positioning between each fixture sub-frame and the test board is achieved through a positioning structure.

[0010] Optionally, the fixture frame includes an adjacent first fixture sub-frame and a second fixture sub-frame, and the first fixture sub-frame and the second fixture sub-frame are connected by the adjustable connection component to adjust the connection fastening position between the two.

[0011] Optionally, the first fixture sub-frame and the second fixture sub-frame can be expanded along the X direction or the Y direction through the adjustable connection component.

[0012] Optionally, the adjustable connection component includes a first connection block of the first fixture sub-frame and a second connection block of the second fixture sub-frame. The first connection block is provided with a first waist-shaped hole, and the second connection block is provided with a second waist-shaped hole. When the fixture frame is placed on the test board, at least part of the first waist-shaped hole and the second waist-shaped hole overlap in the vertical direction, and a fastening bolt passes through the first waist-shaped hole and the second waist-shaped hole to connect the first fixture sub-frame and the second fixture sub-frame.

[0013] Optionally, the first fixture sub-frame includes two first connection blocks distributed from top to bottom, and the second fixture sub-frame includes one second connection block. When the fixture frame is placed on the test board, the second connection block can be inserted between the two first connection blocks, and a fastening bolt sequentially passes through the first waist-shaped hole, the second waist-shaped hole and the first waist-shaped hole to connect the first fixture sub-frame and the second fixture sub-frame.

[0014] Optionally, the positioning structure includes a first structure of the fixture sub-frame and a second structure on the test board that is adapted to the first structure.

[0015] Optionally, there is a clearance fit between the first structure of the fixture sub-frame and the corresponding second structure.

[0016] Optionally, at least part of the side wall of the first structure is in the same plane as the side wall of the limiting frame.

[0017] Optionally, the first structure is a convex structure, and correspondingly, the second structure is a groove structure;

[0018] Or, the first structure is a groove structure, and correspondingly, the second structure is a convex structure.

[0019] Optionally, the convex structure is at least one of a cylinder, a cone, or an irregular cube;

[0020] The groove structure is a groove structure or a through groove structure.

[0021] Optionally, fixing holes for the bolt assembly to pass through are formed on the sub-fixture frame, and third waist-shaped holes corresponding to the fixing holes are formed on the test board. The bolt assembly passes through the fixing holes and the third waist-shaped holes to connect and fix the sub-fixture frame and the test board.

[0022] Optionally, a steel sheet is arranged between the fixture frame and the test board, and through holes for the pins of the chip to pass through are formed on the steel sheet.

[0023] The present invention has the following advantages compared with the prior art:

[0024] In a novel fixture for a chip test module of the present invention, a separable fixture frame and a test board are combined. The positioning of each sub-fixture frame of the fixture frame on the test board is realized by means of a positioning structure, and then each sub-fixture frame is connected by an adjustable connection component to realize the assembly of the entire fixture frame on the test board. This structure reduces the influence of the differences and errors in processing accuracy or manual assembly on chip testing, helps to improve the assembly accuracy and stability between the fixture frame and the test board, and reduces the open-circuit and short-circuit abnormal conditions of the tested chips. Description of the Drawings

[0025] Figure 1 is a schematic perspective view of an existing fixture for a chip test module;

[0026] Figure 2 is a schematic perspective view of a novel fixture for a chip test module of the present invention;

[0027] Figure 3 is Figure 2 a schematic bottom view of the novel fixture in Detailed Embodiments

[0028] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are some but not all of the embodiments of the present invention. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without creative efforts shall fall within the protection scope of the present invention.

[0029] It should be noted that in this article, relational terms such as first and second are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. At the same time, in this article, the terms "include", "comprise", "have" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or terminal device including a series of elements not only includes those elements, but also includes other elements not expressly listed, or also includes elements inherent to such process, method, article or terminal device. Without further limitation, elements defined by the statement "including..." or "comprising..." do not exclude the existence of additional elements in the process, method, article or terminal device including the said elements.

[0030] It should be noted that the accompanying drawings are all in a very simplified form and use non-precise ratios, only for the purpose of conveniently and clearly assisting in explaining the purpose of the embodiments of the present invention.

[0031] As can be seen from the foregoing, in the process of semiconductor chip production, the testing of chips is crucial. However, in actual testing, various factors affect the chip test results. For example, Figure 1 As shown, it is a schematic diagram of a fixture 100 of a test module for an image sensor applied to a COM package. The fixture 100 mainly includes a PCB test board 110, a steel sheet 120, and a Socket fixture frame 130. The three are correspondingly provided with positioning holes 140 for positioning posts to pass through to achieve positioning and limiting, and are fixedly combined by fixing bolt posts 150. However, there is a contradiction in the machining accuracy of the positioning holes 140 in this three-component combination structure: if the opening diameters of the PCB test board 110, the steel sheet 120, and the Socket fixture frame 130 are small, the movement margin between the three is small, resulting in difficulty in disassembly and assembly during the assembly process, and easily causing deformation and wear of the positioning posts; if the opening diameters of the PCB test board 110, the steel sheet 120, and the Socket fixture frame 130 are large, the movement margin is large during the assembly process, causing the positioning posts to lose their limiting function. Both of the above situations will cause the test module to be offset from the PCB test board 110, increasing the error of manual assembly of the module, easily causing abnormal open and short circuits of the test chip, and affecting the test results.

[0032] Based on the above problems, the present invention provides a new fixture 200 for a chip test module, and this new fixture 200 is applied to the functional test of an image sensor for COM package. As Figure 2 and Figure 3As shown in combination, the new fixture 200 includes a separable fixture frame 210 and a test board. With the positioning structure 240, each fixture sub-frame (212, 213) of the fixture frame 210 can be positioned on the test board, and then each fixture sub-frame is connected by an adjustable connection component 230 to achieve the assembly of the entire fixture frame 210 on the test board. This structure can reduce the influence of the machining accuracy of the fixture frame 210 and the assembly error on chip testing, and helps to reduce the open-circuit and short-circuit abnormal conditions of the tested chips. In this embodiment, the test board is a PCB test board 220. Of course, in other embodiments, it can also be other types of test boards, and the present invention does not limit this.

[0033] Specifically, as Figure 2 and Figure 3 As shown in combination, the fixture frame 210 includes a limit frame 211 for placing chips. The fixture frame 210 can be separated into at least two fixture sub-frames (212, 213) at the limit frame 211, that is, each fixture sub-frame includes a part of the side of the limit frame 211. At least two adjacent fixture sub-frames are connected by an adjustable connection component 230, and the connection fastening position of the adjustable connection component 230 is adjustable; the PCB test board 220 is arranged below the fixture frame 210, and the PCB test board 220 includes contacts 221 that contact the pins of the chip. The positioning between each fixture sub-frame and the PCB test board 220 is achieved through the positioning structure 240. In actual application, each fixture sub-frame of the fixture frame 210 is positioned with the PCB test board 220 through the positioning structure 240, and then each fixture sub-frame is connected by the adjustable connection component 230 to achieve the assembly of the fixture frame 210 on the PCB test board 220, and further achieve the assembly of the new fixture 200.

[0034] As described above, the fixture frame 210 in the new fixture 200 is separable, and the adjustable connection component 230 enables the adjustable connection fastening position between the adjacent fixture sub-frames of the fixture frame 210, so that there is a large adjustment margin for the connection between the fixture sub-frames, which can effectively reduce the influence of processing or assembly errors on the chip test results, the processing accuracy of the fixture frame 210 can be ignored, and it also has a good limiting effect. During actual assembly, the positioning of each fixture sub-frame on the PCB test board can be achieved through the positioning structure 240 first, and then each fixture sub-frame can be fixedly connected through the adjustable connection component 230. By combining the positioning structure 240 and the adjustable connection component 230, while achieving accurate positioning, the limiting effect of the adjustable connection component 230 can be fully exerted to ensure the assembly effect. This method helps to improve the accuracy and stability of the assembly of each fixture sub-frame and the PCB test board 220, reduces the influence of processing accuracy or manual assembly differences and errors on the chip test, and at the same time can also reduce the open-circuit and short-circuit abnormalities of the test module carried by the fixture for testing the chip, avoiding affecting the test results.

[0035] As Figure 2 shown, in this embodiment, the fixture frame 210 includes an adjacent first fixture sub-frame 212 and a second fixture sub-frame 213, and the first fixture sub-frame 212 and the second fixture sub-frame 213 are connected by the adjustable connection component 230, that is, the connection fastening position between the first fixture sub-frame 212 and the second fixture sub-frame 213 is adjustable, and further, the distance between the side walls of the limiting frames 211 included in the two can be adjusted, that is, the size of the limiting frame 211 is adjusted. Further, in this embodiment, the first fixture sub-frame 212 and the second fixture sub-frame 213 can be expanded or separated along the X direction through the adjustable connection component 230, that is, the first fixture sub-frame 212 and the second fixture sub-frame 213 are oppositely arranged, and the fastening connection position between the two can change along the X direction, thereby realizing the expansion or separation of the two along the X direction.

[0036] Further, the adjustable connection assembly 230 includes a first connection block 231 of the first jig sub-frame 212 and a second connection block 232 of the second jig sub-frame 213. The first connection block 231 is provided with a first waist-shaped hole, and the second connection block 232 is provided with a second waist-shaped hole. When the jig frame 210 is placed on the PCB test board 220, at least a partial area of the first waist-shaped hole and the second waist-shaped hole coincides in the vertical direction. The fastening bolt 233 passes through the first waist-shaped hole and the second waist-shaped hole to fasten and connect the first jig sub-frame 212 and the second jig sub-frame 213. As can be seen from the above, the first jig sub-frame 212 and the second jig sub-frame 213 provide a large margin of movement for assembly through their respective waist-shaped holes, so that each jig sub-frame can be accurately assembled after being positioned based on the positioning structure 240. At the same time, the fastening bolt 233 fastens and connects the adjacent jig sub-frames after positioning to ensure the assembly effect of the jig frame 210.

[0037] It should be noted that the present invention does not limit the number of the adjustable connection assemblies 230, nor does it limit the number of connection blocks of each jig sub-frame. In practical applications, it can be set according to requirements. For example, as Figure 2 shown, in this embodiment, the first jig sub-frame 212 includes two first connection blocks 231 distributed from top to bottom. The second jig sub-frame 213 includes a second connection block 232. When the jig frame 210 is placed on the PCB test board 220 after being positioned by the positioning structure 240, the second connection block 232 can be inserted between the two first connection blocks 231 and at least a partial area of the first waist-shaped hole and the second waist-shaped hole coincides in the vertical direction. The fastening bolt 233 passes through the first waist-shaped hole, the second waist-shaped hole and the first waist-shaped hole in sequence to fasten and connect the first jig sub-frame 212 and the second jig sub-frame 213. In this embodiment, the second connection block 232 of the second jig sub-frame 213 is inserted between the two first connection blocks 231 of the first jig sub-frame 212. In the fastened connection state, the two first connection blocks 231 clamp the second connection block 232, which helps to further ensure the connection stability between the first jig sub-frame 212 and the second jig sub-frame 213 and increase the structural stability of the new jig 200. Further, in this embodiment, the first connection block 231 is a part of the first jig sub-frame 212 and is integrally formed with other parts of the first jig sub-frame 212; the second connection block 232 is a part of the second jig sub-frame 213 and is integrally formed with other parts of the second jig sub-frame 213 to reduce the assembly error of the overall structure.

[0038] On the other hand, the positioning structure 240 includes a first structure 241 of the fixture sub-frame (212, 213) and a second structure 242 on the PCB test board 220 that is adapted to the first structure 241 (please refer to Figure 2 and Figure 3 ). In actual application, the positioning between the fixture sub-frame and the PCB test board 220 is achieved through the first structure 241 and the second structure 242, which helps to achieve the precise positioning of each fixture sub-frame and facilitates the assembly of each fixture sub-frame on the PCB test board 220. After the positioning of the two is completed, each fixture sub-frame is fixedly connected through the adjustable connection component 230, which helps to reduce the assembly error.

[0039] Furthermore, there is a clearance fit between the first structure 241 of the fixture sub-frame and the corresponding second structure 242, so as to provide a buffer space for the assembly of each fixture sub-frame on the PCB test board 220, increase the movement margin of adjacent fixture sub-frames during the assembly process, help the assembly of each fixture sub-frame, and at the same time avoid damage to the positioning structure 240 during use. The clearance-fit first structure 241 and second structure 242 are combined with the adjustable connection component 230, which greatly increases the flexibility of the fixture frame 210 in assembling on the PCB test board 220 and achieves a balance between precise positioning and stable assembly; on the other hand, by adjusting the fastening positions of the first structure 241, the second structure 242, and the adjustable connection component 230, the size of the limit frame 211 of the fixture frame 210 can be adjusted to a certain extent.

[0040] In this embodiment, the first structure 241 of the fixture sub-frame is a convex structure, i.e., a positioning block. Correspondingly, the second structure 242 of the PCB test board 220 is a groove structure, i.e., a positioning groove. The size of the convex structure is slightly smaller than the size of the groove structure to achieve the clearance fit between the two. Specifically, as shown in Figure 2 and Figure 3 in combination, two first structures 241 are provided at the bottom of both the first fixture sub-frame 212 and the second fixture sub-frame 213. The first structure 241 is a rectangular boss structure. Four second structures 242 are correspondingly provided on the PCB test board 220. The second structure 242 is a rectangular through-groove structure. The size of the rectangular boss structure is slightly smaller than the size of the rectangular through-groove structure. The processing difficulty of the rectangular boss structure and the rectangular through-groove structure is relatively small, which is beneficial to the processing and preparation of the fixture frame 210 and the PCB test board 220. In actual application, the assembly accuracy of the entire new fixture 200 can be controlled by controlling the processing accuracy of the grooving position on the PCB test board 220.

[0041] Further, at least part of the side walls of the first structure 241 of the fixture sub-frame are in the same plane as the side walls of the limiting frame 211, so as to facilitate the processing and preparation of the fixture sub-frame, which helps to reduce the assembly error and improve the processing accuracy. In this embodiment, one side wall of the rectangular boss structure is in the same vertical plane as the side wall of the limiting frame 211 at its corresponding position, so as to facilitate positioning and at the same time help to reduce the processing error of the fixture sub-frame.

[0042] It can be understood that the structural types of the first structure 241 and the second structure 242 of the positioning structure 240 are not limited to the above. In other embodiments, it can also be other structural cooperation modes, and the present invention does not limit this. For example, in other embodiments, the first structure 241 is a groove structure, and correspondingly, the second structure 242 is a protrusion structure. Further, the present invention does not limit the shape and structure of the protrusion structure and the groove structure corresponding to it. The protrusion structure can be at least one of a cylinder, a cone, or an irregular cube. On the other hand, the groove structure can be a groove structure or a through groove structure, and the present invention does not limit this. Further, the present invention does not limit the number of the positioning structures 240, which can be set according to actual needs.

[0043] Further, to achieve stable assembly between the fixture frame 210 and the PCB test board 220, in this embodiment, the fixture frame 210 and the PCB test board 220 are fixedly connected through a bolt assembly 250. Specifically, as Figure 2 shown, two fixing holes 214 for the bolt assembly 250 to pass through are provided on both the first fixture sub-frame 212 and the second fixture sub-frame 213 of the fixture frame 210, and four third waist-shaped holes 222 corresponding to the fixing holes 214 are provided on the PCB test board 220. A plurality of bolt assemblies 250 respectively pass through the fixing holes 214 and the third waist-shaped holes 222 to fixedly connect the fixture frame 210 composed of the first fixture sub-frame 212 and the second fixture sub-frame 213 with the PCB test board 220. The third waist-shaped holes 222 provide a large adjustment margin for each fixture sub-frame, so as to facilitate the tight fixing between each fixture sub-frame and the PCB test board 220.

[0044] In this embodiment, during actual assembly, the boss structures of each jig sub-frame are snapped into the groove structures of the PCB test board 220, and then each jig sub-frame is firmly connected through the adjustable connection assembly 230 to assemble and form the jig frame 210 on the PCB test board 220. After the assembly of each jig sub-frame is completed, each jig sub-frame is connected to the PCB test board 220 through the bolt assembly 250 passing through the fixing holes 214 and the third waist-shaped holes 222, thereby completing the assembly of the new jig 200. This method enables the test module and the PCB test board 220 to be accurately aligned, reducing the impact on chip testing due to differences and errors in processing accuracy or manual assembly, and helping to reduce the probability of abnormal open and short circuits in the tested chips. Further, during the assembly process, when positioning between each jig sub-frame and the PCB test board 220 through the positioning structure 240, it can be ensured that at least part of the side walls of the protruding structures of each jig sub-frame are closely attached to the inner side walls of the groove structures, so that the groove structures can lock the protruding structures, thereby ensuring the positioning stability between each jig sub-frame and the PCB test board 220 and helping to improve the stability of the overall structure.

[0045] It should be noted that the jig frame 210 of the present invention is not limited to including the above two jig sub-frames. In other embodiments, the jig frame 210 may also be composed of more than two jig sub-frames. The connection method between adjacent jig sub-frames is similar to or the same as the connection method between the above two jig sub-frames, and the present invention does not limit this. Further, the expandable or separable direction between adjacent jig sub-frames is not limited to the above X direction. In other embodiments, it may also expand or separate along other directions, such as the Y direction or the inclined direction, and the present invention does not limit this.

[0046] Further, as Figure 2 shown, in this embodiment, a steel sheet 260 is provided between the jig frame 210 and the PCB test board 220. Through holes for the pins of the chip to pass through are opened on the steel sheet 260. At the same time, various through holes required for assembly may also be opened on the steel sheet 260, such as through holes for the protruding structures of the positioning structure 240 to pass through, and in actual applications, they can be opened according to requirements.

[0047] In summary, in a novel fixture 200 for a chip test module according to the present invention, the novel fixture 200 combines a separable fixture frame 210 with a test board, realizes the positioning between each fixture sub-frame of the fixture frame 210 and the test board by means of a positioning structure 240, and connects and fixes each fixture sub-frame through an adjustable connection component 230 with an adjustable fastening position, providing a relatively large margin of movement for each fixture sub-frame, improving the assembly flexibility while ensuring the positioning accuracy. This method can further ensure the accuracy and stability of the assembly of each fixture sub-frame and the test board, reduce the influence of machining accuracy or manual assembly differences and errors on chip testing, and at the same time reduce the open-circuit and short-circuit abnormal conditions when the test module carried by the fixture tests the chip, avoiding affecting the test results.

[0048] Although the content of the present invention has been described in detail through the above preferred embodiments, it should be recognized that the above description should not be considered as a limitation of the present invention. After those skilled in the art have read the above content, various modifications and alternatives to the present invention will be obvious. Therefore, the protection scope of the present invention should be defined by the appended claims.

Claims

1. A new fixture for a chip test module, characterized in that, Comprising: A fixture frame, which includes a limit frame for placing a chip, and the fixture frame can be separated into at least two fixture sub-frames at the limit frame, and at least two adjacent fixture sub-frames are connected by an adjustable connection component; A test board, which is arranged below the fixture frame, and the test board includes contacts that contact the pins of the chip, and positioning between each fixture sub-frame and the test board is achieved through a positioning structure.

2. The novel fixture for a chip test module according to claim 1, wherein the fixture frame includes an adjacent first fixture sub-frame and a second fixture sub-frame, and the first fixture sub-frame and the second fixture sub-frame are connected by the adjustable connection component to adjust the connection fastening position between the two.

3. The novel fixture for a chip test module according to claim 2, wherein the first fixture sub-frame and the second fixture sub-frame can be expanded along the X direction or the Y direction through the adjustable connection component.

4. The novel fixture for a chip test module according to claim 2, wherein the adjustable connection component includes a first connection block of the first fixture sub-frame and a second connection block of the second fixture sub-frame, the first connection block is provided with a first waist-shaped hole, the second connection block is provided with a second waist-shaped hole, when the fixture frame is placed on the test board, at least part of the areas of the first waist-shaped hole and the second waist-shaped hole coincide in the vertical direction, and a fastening bolt passes through the first waist-shaped hole and the second waist-shaped hole to connect the first fixture sub-frame and the second fixture sub-frame.

5. The novel fixture for a chip test module according to claim 4, wherein the first fixture sub-frame includes two first connection blocks distributed from top to bottom, the second fixture sub-frame includes a second connection block, when the fixture frame is placed on the test board, the second connection block can be inserted between the two first connection blocks, and a fastening bolt sequentially passes through the first waist-shaped hole, the second waist-shaped hole and the first waist-shaped hole to connect the first fixture sub-frame and the second fixture sub-frame.

6. The novel fixture for a chip test module according to claim 1, wherein the positioning structure includes a first structure of the fixture sub-frame and a second structure on the test board that is adapted to the first structure.

7. The novel fixture for a chip test module according to claim 6, wherein a clearance fit is provided between the first structure of the fixture sub-frame and its corresponding second structure.

8. The novel fixture for a chip test module according to claim 6, wherein at least part of the side wall of the first structure is on the same plane as the side wall of the limit frame.

9. The novel fixture for a chip test module according to claim 6, wherein the first structure is a convex structure, and correspondingly, the second structure is a groove structure; or, the first structure is a groove structure, and correspondingly, the second structure is a convex structure.

10. The novel fixture for a chip test module according to claim 9, wherein the convex structure is at least one of a cylinder, a cone or an irregular cube; The groove structure is a concave groove structure or a through groove structure.

11. The novel fixture for a chip test module according to claim 1, characterized in that Fixing holes for the bolt assembly to pass through are formed in the fixture sub-frame, third waist-shaped holes corresponding to the fixing holes are formed in the test board, and the bolt assembly passes through the fixing holes and the third waist-shaped holes to connect and fix the fixture sub-frame and the test board.

12. The novel fixture for a chip test module according to claim 1, characterized in that A steel sheet is arranged between the fixture frame and the test board, and through holes for the pins of the chip to pass through are formed in the steel sheet.

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