Test equipment and adapter

Abstract

A test apparatus includes a test device, a load board, and an adapter. The load board is arranged on the testing device. The adapter is arranged on the load board and configured to support an object to be tested, and the adapter is electrically connected with the load board and the object to be tested. The test device is configured to transmit a test signal to an object to be tested through the load board and the adapter and receive a feedback signal from the object to be tested. The test equipment can allow high-speed internal detection when an electronic test is carried out on an object to be tested.

Description

Technical Field

[0001] The present invention relates to an adapter and a test device configured with such an adapter, and in particular to an adapter for connecting a device under test so that a probe can test the device under test. Background Art

[0002] With the increasing demand for current electronic devices, the quality of each component of the electronic device has also become an important issue in the industry. In addition to improving the manufacturing technology of components, the test accuracy of components has also become increasingly important.

[0003] For example, the industry usually uses a probe station to test the electrical behavior of electronic components. Therefore, the standard of the test accuracy of the probe station is undoubtedly an important issue that the industry pays great attention to. Summary of the Invention

[0004] One object of the present invention is to provide a test device that can allow high-speed internal detection when performing an electronic test on a device under test.

[0005] According to an embodiment of the present invention, a test device includes a test device, a load board, and an adapter. The load board is disposed on the test device. The adapter is disposed on the load board and configured to support the device under test, and the adapter is electrically connected to the load board and the device under test. The test device is configured to transmit a test signal to the device under test through the load board and the adapter and receive a feedback signal from the device under test.

[0006] In one or more embodiments of the present invention, the above-mentioned adapter includes a socket and a connection board. The socket is disposed on the load board and electrically connected to the load board. The connection board is detachably connected to the socket and electrically connected to the socket. The connection board defines a detection area, the detection area is away from the load board and configured to place the device under test thereon. The connection board is electrically connected to the device under test.

[0007] In one or more embodiments of the present invention, the above-mentioned load board has a surface, the surface is away from the test device, and the socket is disposed on the surface. The connection board is connected to the socket along a direction that intersects the normal of the surface.

[0008] In one or more embodiments of the present invention, the above-mentioned direction is perpendicular to the normal.

[0009] In one or more embodiments of the present invention, the vertical projection of the above-mentioned adapter toward the load board is within the range of the surface.

[0010] In one or more embodiments of the present invention, the above-mentioned connection board includes a board body, a plurality of conductive parts, and a terminal part. The detection area is located on the board body. The conductive parts are located in the detection area and configured to be electrically connected to the device under test. The terminal part is connected to the edge of the board body and electrically connected to the conductive parts, and the terminal part is configured to be inserted into the socket and electrically connected to the socket.

[0011] In one or more embodiments of the present invention, at least one of the above conductive portions has a wire structure shape.

[0012] In one or more embodiments of the present invention, the above conductive portions are separated from each other.

[0013] In one or more embodiments of the present invention, the above connecting plate is at least partially parallel to the load plate.

[0014] In one or more embodiments of the present invention, the above adapter further includes a pair of guiding portions. The guiding portions are connected to opposite ends of the socket, and the guiding portions are configured to guide and fix the connecting plate therein.

[0015] In one or more embodiments of the present invention, the above test device further includes a frame, a platform, a probe fixture, and at least one probe. The frame defines an accommodating space, and the test device and the load plate are at least partially located in the accommodating space. The platform is connected to the frame and has an opening that communicates with the accommodating space and exposes the adapter. The probe fixture is disposed on the platform. The probe fixture fixes the probe and is configured to control the probe to contact the object to be tested through the opening.

[0016] In one or more embodiments of the present invention, the above test device further includes a plurality of rollers. The rollers are connected to a side of the test device away from the load plate.

[0017] In one or more embodiments of the present invention, the above test device further includes a microscope. The microscope is slidably connected to the platform and is configured to obtain an image of the object to be tested.

[0018] In one or more embodiments of the present invention, the above test device further includes a display device. The display device is connected to the frame and is signal-connected to the microscope.

[0019] One of the objects of the present invention is to provide an adapter that can allow high-speed internal detection when performing an electronic test on an object to be tested.

[0020] According to an embodiment of the present invention, an adapter includes a socket and a connecting plate. The socket is disposed on the load plate and is electrically connected to the load plate. The socket has an opening that faces a direction that intersects the normal of the load plate. The connecting plate is configured to be removably inserted into the opening and is electrically connected to the socket. The connecting plate defines a detection area that is away from the load plate and is configured to place the object to be tested thereon. The connecting plate is electrically connected to the object to be tested.

[0021] In one or more embodiments of the present invention, the above direction is perpendicular to the normal.

[0022] In one or more embodiments of the present invention, the above-mentioned connection plate includes a plate body, a plurality of conductive parts, and a terminal part. The detection area is located on the plate body. The conductive parts are located in the detection area and are configured to be electrically connected to the object under test. The terminal part is connected to the edge of the plate body and is electrically connected to the conductive parts. The terminal part is configured to be inserted into a socket and electrically connected to the socket.

[0023] In one or more embodiments of the present invention, at least one of the above-mentioned conductive parts has a wire structure shape.

[0024] In one or more embodiments of the present invention, the above-mentioned conductive parts are separated from each other.

[0025] In one or more embodiments of the present invention, the above-mentioned adapter further includes a pair of guiding parts. The guiding parts are connected to opposite ends of the socket and are configured to guide and fix the connection plate therein.

[0026] The above embodiments of the present invention have at least the following advantages:

[0027] (1) The application of the adapter connected between the load board and the object under test allows for high-speed internal detection when performing electronic tests on the object under test.

[0028] (2) Since the connection plate is at least partially parallel to the load board, and the object under test is placed on the connection plate in a substantially horizontal manner, this is conducive to using probes to test the object under test. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] Figure 1 FIG. is a perspective view of a test device according to an embodiment of the present invention.

[0030] Figure 2 FIG. is for showing Figure 1 Another perspective view of the test device, wherein the frame, platform, probe holder, and probe are omitted.

[0031] Figure 3 FIG. is for showing Figures 1 - 2 The top view of the adapter.

[0032] Figure 4 FIG. is for showing Figure 3 The top view of the adapter, wherein the connection plate has been detached from the socket.

[0033] Figure 5 FIG. is for showing Figure 3 The top view of the adapter, wherein the object under test is placed in the detection area.

[0034] Figure 6 FIG. is for showing Figure 5 The cross-sectional view along line A-A. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0035] The following will disclose multiple embodiments of the present invention with the accompanying drawings. For the sake of clear illustration, many practical details will be described together in the following narrative. However, it should be understood that these practical details are not used to limit the present invention. That is to say, in some embodiments of the present invention, these practical details are unnecessary. In addition, for the purpose of simplifying the drawings, some conventional structures and elements will be shown in a simple schematic manner in the drawings, and the same reference numerals will be used to represent the same or similar elements in all the drawings. And if possible in implementation, the features of different embodiments can be applied interactively.

[0036] Unless otherwise defined, all the terms (including technical and scientific terms) used herein have their ordinary meanings, which can be understood by those skilled in the art. Further, the definitions of the above terms in commonly used dictionaries should be interpreted as being consistent with the meaning in the relevant field of the present invention. Unless specifically defined otherwise, these terms will not be construed as idealized or overly formal meanings.

[0037] Please refer to Figures 1 - 2 . Figure 1 FIG. 100 is a perspective view showing a test device 100 according to an embodiment of the present invention. Figure 2 To illustrate Figure 1 Another perspective view of the test device 100, in which the frame 140, the platform 150, the probe fixture 160 and the probes 170 are omitted. In this embodiment, as Figures 1 - 2 shown, a test device 100 includes a test unit 110, a load board 120 and an adapter 130. The load board 120 is disposed on the test unit 110. In fact, the load board 120 is a circuit board. The adapter 130 is disposed on the load board 120 and configured to hold a device under test 200 (see the device under test 200 in Figures 5 - 6 ). The adapter 130 is electrically connected to the load board 120 and the device under test 200. In practical applications, the test unit 110 includes a transmitter 111 and a receiver 112. The transmitter 111 is configured to transmit test signals to the device under test 200 through the load board 120 and the adapter 130. The receiver 112 is configured to receive feedback signals from the device under test 200 through the load board 120 and the adapter 130. For example, the test unit 110 is a high-speed memory test unit, and the device under test 200 is a memory card, such as a dynamic random-access memory (DRAM).

[0038] As described above, because the adapter 130 electrically connects the load board 120 and the DUT 200, no transmission lines are required between the load board 120 and the DUT 200. This avoids the limitations on test speeds associated with transmission lines. Instead, the use of the adapter 130 between the load board 120 and the DUT 200 allows for high-speed internal probing during electronic testing of the DUT 200.

[0039] Furthermore, if Figure 1 As shown, the test equipment 100 further includes a frame 140, a platform 150, a probe fixture 160 and at least one probe 170. The frame 140 defines an accommodating space AS, and the test device 110 and the load plate 120 are at least partially located in the accommodating space AS defined by the frame 140. The platform 150 is connected to the frame 140. The platform 150 has an opening OP1, and the opening OP1 is connected to the accommodating space AS defined by the frame 140. The opening OP1 of the platform 150 exposes the adapter 130. The probe fixture 160 is disposed on the platform 150. The probe fixture 160 fixes the probe 170 and is configured to control the probe 170 to contact the object to be tested 200 through the opening OP1 of the platform 150. To simplify the drawings, the frame 140, the platform 150, the probe fixture 160 and the probe 170 are not shown. Figure 2 middle.

[0040] Furthermore, if Figure 1 As shown, the testing apparatus 100 further includes a plurality of rollers 180. The rollers 180 are connected to a side of the testing device 110 away from the load plate 120. Each of the rollers 180 is configured to roll on a floor surface. This allows a user to efficiently and easily move the testing device 110 between different working positions.

[0041] Furthermore, if Figure 1 As shown, the testing apparatus 100 further includes a microscope 190 and a display device 195. The microscope 190 is slidably connected to the platform 150 and is configured to capture an image of the object under test 200 through the opening OP1 of the platform 150. The display device 195 is connected to the frame 140 and is signal-connected to the microscope 190. Thus, the image captured by the microscope 190 can be displayed on the display device 195.

[0042] Please refer to Figure 3 . Figure 3 To illustrate Figures 1 - 2 In this embodiment, as shown in FIG. Figures 2 - 3As shown, the adapter 130 includes a socket 131 and a connection plate 132. The socket 131 is disposed on the load board 120 and electrically connected to the load board 120. The connection plate 132 is detachably connected to the socket 131 and electrically connected to the socket 131. The connection plate 132 defines a detection area PA (for the detection area PA, see Figure 3 ), and the detection area PA is away from the load board 120 and configured to place the object under test 200 thereon. The connection plate 132 is electrically connected to the object under test 200.

[0043] Specifically, as Figures 2 - 3 shown, the connection plate 132 includes a plate body 133 and a plurality of conductive parts 134. The detection area PA is located on the plate body 133. The conductive parts 134 are located in the detection area PA and configured to be electrically connected to the object under test 200. In other words, the conductive parts 134 can serve as electrical contact points for contacting the object under test 200.

[0044] Furthermore, in this embodiment, at least one of the conductive parts 134 is in a wire structure shape. For example, as Figures 2 - 3 shown, two of the conductive parts 134 are respectively in a wire structure shape. Moreover, the conductive parts 134 are separated from each other in the detection area PA.

[0045] Please refer to Figure 4 . Figure 4 To illustrate the top view of the adapter 130 of Figure 3 , where the connection plate 132 has been detached from the socket 131. In this embodiment, as Figure 4 shown, the connection plate 132 further includes a terminal part 135. The terminal part 135 connects to the edge of the plate body 133 and is electrically connected to the conductive parts 134. The terminal part 135 is configured to be inserted into the socket 131 so as to be electrically connected to the socket 131.

[0046] Furthermore, as Figures 2 - 4 shown, the adapter 130 further includes a pair of guiding parts 136. The guiding parts 136 are connected to opposite ends of the socket 131 and configured to guide and fix the connection plate 132 therein.

[0047] Please refer to Figures 5 - 6 . Figure 5 To illustrate the top view of the adapter 130 of Figure 3 , where the object under test 200 is placed in the detection area PA. Figure 6 To illustrate the cross-sectional view along line A-A of Figure 5 . In this embodiment, as Figures 5 - 6 shown, the load board 120 has a surface SF, and the surface SF is away from the test device 110 (for the test device 110, see Figures 1 - 2 ), and the socket 131 is disposed on the surface SF of the load board 120. The socket 131 has an opening OP2 (for the opening OP2, see Figure 6) The opening OP2 faces the direction D, and the direction D intersects the normal N of the load board 120. The connection board 132 is detachably inserted into the opening OP2 such that the connection board 132 is electrically connected to the socket 131 along the direction D. In practical applications, the direction D is perpendicular to the normal N of the load board 120 and parallel to the surface SF.

[0048] Furthermore, as Figures 1 - 3 and Figures 5 - 6 shown, the vertical projection of the adapter 130 facing the load board 120 is within the range of the surface SF. In other words, when viewed along the normal N of the surface SF, the size of the adapter 130 is smaller than that of the load board 120.

[0049] Furthermore, as Figure 6 shown, the connection board 132 is at least partially parallel to the load board 120. In this way, the device under test 200 is placed on the connection board 132 in a substantially horizontal manner, which is beneficial for testing the device under test 200 using the probe 170 (for the probe 170, please refer to Figure 1 ).

[0050] In summary, the technical solutions disclosed in the above embodiments of the present invention have at least the following advantages:

[0051] (1) The application of the adapter connected between the load board and the device under test allows for high-speed internal probing when performing electronic testing on the device under test.

[0052] (2) Since the connection board is at least partially parallel to the load board, and the device under test is placed on the connection board in a substantially horizontal manner, this is beneficial for testing the device under test using a probe.

[0053] Although the present invention has been disclosed as above in embodiments, it is not intended to limit the present invention. Those skilled in the art can make various modifications and refinements without departing from the spirit and scope of the present invention. Therefore, the protection scope of the present invention shall be determined by the scope defined by the appended claims.

[0054]

Symbol Description

[0055] 100: Testing device

[0056] 110: Testing apparatus

[0057] 111: Transmitter

[0058] 112: Receiver

[0059] 120: Load board

[0060] 130: Adapter

[0061] 131: Socket

[0062] 132: Connection board

[0063] 133: Plate body

[0064] 134: Conductive part

[0065] 135: Terminal part

[0066] 136: Guide part

[0067] 140: Frame

[0068] 150: Platform

[0069] 160: Probe fixture

[0070] 170: Probe

[0071] 180: Roller

[0072] 190: Microscope

[0073] 195: Display device

[0074] 200: Object to be measured

[0075] A - A: Line segment

[0076] D: Direction

[0077] AS: Accommodation space

[0078] N: Normal line

[0079] OP1, OP2: Opening

[0080] PA: Detection area

[0081] SF: Surface.

Claims

1. A testing device, characterized in that, Comprising: A test device; A load board, disposed on the test device; And An adapter, disposed on the load board and configured to support a device under test, the adapter being electrically connected to the load board and the device under test, Wherein, the test device is configured to transmit a test signal to the device under test through the load board and the adapter and receive a feedback signal from the device under test.

2. The test device according to claim 1, characterized in that, The adapter comprises: A socket, disposed on the load board and electrically connected to the load board; and A connection board, detachably connected to the socket and electrically connected to the socket, the connection board defining a detection area, the detection area being away from the load board and configured to place the device under test thereon, the connection board being electrically connected to the device under test.

3. The testing device according to claim 2, wherein The load board has a surface, the surface being away from the test device, the socket being disposed on the surface, the connection board being connected to the socket along a direction that intersects the normal of the surface.

4. The test device according to claim 3, characterized in that, The direction is perpendicular to the normal.

5. The test device according to claim 3, characterized in that, The perpendicular projection of the adapter onto the load board is within the range of the surface.

6. The test device according to claim 2, characterized in that, The connection board comprises: A board body, the detection area being located on the board body; A plurality of conductive parts, located in the detection area and configured to be electrically connected to the device under test; and A terminal part, connecting to the edge of the board body and electrically connected to the plurality of conductive parts, the terminal part being configured to be inserted into the socket and electrically connected to the socket.

7. The test device according to claim 6, characterized in that, At least one of the plurality of conductive parts is in a wire structure shape.

8. The test device according to claim 6, wherein The plurality of conductive parts are separated from each other.

9. The test device according to claim 2, characterized in that The connection board is at least partially parallel to the load board.

10. The test device according to claim 2, wherein The adapter further comprises: A pair of guiding parts, connecting to opposite ends of the socket, the plurality of guiding parts being configured to guide and fix the connection board therein.

11. The test device according to claim 1, characterized in that Also comprising: A frame, defining an accommodation space, the test device and the load board being at least partially located in the accommodation space; A platform, connecting to the frame, the platform having an opening, the opening communicating with the accommodation space and exposing the adapter; A probe fixing member, disposed on the platform; And At least one probe, the probe fixing member fixing the probe and configured to control the probe to contact the device under test through the opening.

12. The test device according to claim 11, wherein, Also comprising: A plurality of rollers, connecting to a side of the test device away from the load board.

13. The testing device according to claim 11, wherein Also comprising: A microscope, slidably connected to the platform and configured to obtain an image of the device under test.

14. The test device according to claim 13, characterized in that, Also comprising: A display device, connecting to the frame and signal-connected to the microscope.

15. An adapter, characterized in that, Comprising: A socket, disposed on the load board and electrically connected to the load board, the socket having an opening, the opening facing a direction that intersects the normal of the load board; And A connection board, configured to be detachably inserted into the opening and electrically connected to the socket, the connection board defining a detection area, the detection area being away from the load board and configured to place a device under test thereon, the connection board being electrically connected to the device under test.

16. The adapter according to claim 15, wherein, The direction is perpendicular to the normal.

17. The adapter according to claim 15, characterized in that The connection board comprises: A board body, the detection area being located on the board body; A plurality of conductive parts, located in the detection area and configured to be electrically connected to the device under test; and The terminal part is connected to the edge of the plate body and electrically connected to the plurality of conductive parts, and the terminal part is configured to be inserted into the socket and electrically connected to the socket.

18. The adapter according to claim 17, wherein At least one of the plurality of conductive parts has a wire structure shape.

19. The adapter according to claim 17, characterized in that, The plurality of conductive parts are separated from each other.

20. The adapter according to claim 15, characterized in that, It further includes: A pair of guiding parts are connected to opposite ends of the socket, and the plurality of guiding parts are configured to guide and fix the connecting plate therein.

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