Method and device for predicting reliability of pressure transmitter in containment of nuclear power plant

Abstract

The invention discloses a reliability prediction method and device for a pressure transmitter in a containment of a nuclear power plant. The method comprises the following steps: acquiring a product process factor and a user factor of the pressure transmitter; determining the physical factor failure rate of the pressure transmitter; and finally, based on the physical factor failure rate, the product process factor and the user factor, determining the failure rate of the pressure transmitter after the serious accident by using an FIDES reliability prediction model. Starting from a failure mechanism and a failure mode, the influence of severe accidents (temperature, irradiation and vibration) of the nuclear power plant on the transmitter is considered, and meanwhile, the user process control and quality control level is also considered. On the basis of the FIDES model, the influence of irradiation is introduced, and the reliability prediction of the transmitter after the serious accident of the nuclear power plant is realized.

Description

Technical Field

[0001] The present invention relates to the technical field of reliability prediction, and particularly relates to a method and device for predicting the reliability of a pressure transmitter inside a nuclear power plant containment vessel. Background Art

[0002] In the prior art, whether it is the ML-HDBK-217 manual in the United States or the reliability prediction methods for electronic components in China, traditional life prediction methods and means are adopted. With the idea of mathematical statistics, the failure data in the use of electronic products are statistically analyzed and the parameters are fitted to obtain a life prediction model. The standardized and process-based prediction lacks the understanding of the principle and essence of failure, and also results in inaccurate and unconvincing prediction results, which has no guiding significance for improving product reliability. It has the following defects:

[0003] 1) It cannot quantitatively analyze the influence of environmental stress on the reliability of components.

[0004] 2) It does not consider the user process control and quality control levels.

[0005] 3) It does not consider new failure mechanisms such as irradiation effects.

[0006] The existing patent CN105868543B discloses a method for evaluating the acceleration factor of the storage life test based on the inverse Gaussian life distribution, including: a storage life model of an electronic whole machine product based on the inverse Gaussian life distribution with competing failures; calculating respectively the average storage life of the electronic whole machine product based on the inverse Gaussian life distribution under actual use conditions and the average storage life under accelerated stress conditions; calculating the acceleration factor of the electronic whole machine product according to the average storage life under the actual use conditions and the average storage life under the accelerated stress conditions.

[0007] The existing patent CN117494451A discloses a method for evaluating the remaining life of over-aged stored components, including the following steps: Step 1: Analysis and classification of over-aged storage re-inspection data; Step 2: Analysis of the storage failure mechanism and failure mode of over-aged stored components; Step 3: Analysis of relevant over-aged re-inspection test items of over-aged stored components; Step 4: Research on the life evaluation method of over-aged stored electrical parameter degraded components; Step 5: Research on the life evaluation method of over-aged stored electrical parameter non-degraded components.

[0008] In summary, the above two existing patents do not solve the problems in the prior art that do not consider the user process control and quality control levels and new failure mechanisms such as irradiation effects, and cannot quantitatively analyze the influence of environmental stress on the reliability of components. Summary of the Invention

[0009] Based on the above technical problems, the present invention proposes a reliability prediction method and device for a pressure transmitter inside the containment of a nuclear power plant, which solves the problem in the prior art that new failure mechanisms such as user process control, quality control level, and radiation effects are not considered, and the impact of environmental stress on the reliability of components cannot be quantitatively analyzed.

[0010] A reliability prediction method for a pressure transmitter inside the containment of a nuclear power plant, comprising:

[0011] Obtaining the product process factor and user factor of the pressure transmitter;

[0012] Determining the physical factor failure rate of the pressure transmitter;

[0013] Based on the physical factor failure rate, product process factor, and user factor, using the FIDES reliability prediction model to determine the failure rate of the pressure transmitter after a severe accident, and realizing reliability prediction.

[0014] Further, determining the physical factor failure rate of the pressure transmitter includes:

[0015] Classifying the pressure transmitter into radiation-resistant components and radiation-sensitive components;

[0016] For radiation-resistant components, based on the base failure rate due to temperature factors and the base failure rate due to stress factors, determining the corresponding physical factor failure rate;

[0017] For radiation-sensitive components, based on the base failure rate due to temperature factors, the base failure rate due to stress factors, the base failure rate due to radiation factors, and the radiation acceleration factor, determining the corresponding physical factor failure rate.

[0018] Further, the radiation-sensitive components include diodes, triodes, and operational amplifiers.

[0019] Further, based on the base failure rate due to temperature factors, the base failure rate due to stress factors, the base failure rate due to radiation factors, and the radiation acceleration factor, determining the corresponding physical factor failure rate includes:

[0020] Based on the base failure rate due to temperature factors, the base failure rate due to stress factors, the base failure rate due to radiation factors, and the radiation acceleration factor, determining the corresponding physical factor failure rate through Formula 1, Formula 1,

[0021]

[0022] Wherein, λ physical is the physical factor failure rate, t phase represents the working time of the pressure transmitter under the same environmental conditions, T Total represents the total mission duration, λ oTH represents the base failure rate due to temperature factors, πThermal Denotes the acceleration factor related to the combination of voltage stress and temperature, π mech Denotes the acceleration factor of mechanical vibration, λ omech Denotes the base failure rate of the stress factor, λ OFZ Denotes the base failure rate of the radiation factor, π FZ Denotes the irradiation acceleration factor, π Induced Is the induction factor representing the contribution of overstress not listed, λ OFZ ×π FZ Denotes the failure rate after irradiation correction.

[0023] Furthermore, for the triode, based on the failure rate after irradiation at normal temperature and the suppression factor of irradiation by temperature, the failure rate after irradiation correction is determined.

[0024] Furthermore, the product of the failure rate after irradiation at normal temperature and the suppression factor of irradiation by temperature is used as the failure rate after irradiation correction.

[0025] Furthermore, the suppression factor of irradiation by temperature is determined by Formula 2. Formula 2,

[0026]

[0027] where, π TH-FZ Is the suppression factor of irradiation by temperature, t1 is the operating time before failure at normal operating temperature, and t2 is the operating time before failure at severe accident temperature.

[0028] Furthermore, for the diode and the operational amplifier, the failure rate after irradiation at normal temperature is used as the failure rate after irradiation correction.

[0029] Furthermore, it also includes: calculating the failure rate of all pressure transmitters according to the component count method.

[0030] Furthermore, the FIDES reliability prediction model is expressed as: λ = λ Physical ×π PM ×π Process where, λ Physical Is the physical factor failure rate of the pressure transmitter, π PM Is the product process factor of the pressure transmitter, π Process Is the user factor of the pressure transmitter.

[0031] A reliability prediction device for a pressure transmitter inside the containment of a nuclear power plant, characterized by comprising:

[0032] An acquisition module, configured to acquire the product process factor and the user factor of the pressure transmitter;

[0033] A determination module for determining the physical factor failure rate of a pressure transmitter;

[0034] A reliability prediction module for determining the failure rate of a pressure transmitter after a severe accident based on the physical factor failure rate, product process factors, and user factors, and using the FIDES reliability prediction model to achieve reliability prediction.

[0035] A computer-readable storage medium, characterized in that the computer-readable storage medium includes a stored computer program, wherein the computer program can execute the above method when run by an electronic device.

[0036] A computer program product, including a computer program, characterized in that the computer program executes the steps of the above method when executed by a processor.

[0037] An electronic device, including a memory and a processor, characterized in that a computer program is stored in the memory, and the processor is configured to execute the above method through the computer program.

[0038] Based on the above technical solutions, the present invention has at least the following beneficial effects:

[0039] 1. Starting from the failure mechanism and failure mode, the present invention considers the impact of a severe accident in a nuclear power plant (temperature, irradiation, vibration) on the transmitter, as well as the user's process control and quality control levels. Based on the physical factor failure rate, the product process factors, and the user factors, the FIDES reliability prediction model is used to determine the failure rate of the pressure transmitter after a severe accident. This method can be used for the reliability prediction of pressure vessels in the containment vessel after a severe accident. Compared with conventional reliability prediction methods, the calculation results are more accurate.

[0040] 2. On the basis of the FIDES model, the present invention introduces the influence of irradiation. For radiation-sensitive components, based on the basic failure rate of temperature factors, stress factors, radiation factors, and the irradiation acceleration factor, the corresponding physical factor failure rate is determined, and then the reliability prediction of the transmitter after a severe accident in a nuclear power plant is realized. Description of the Drawings

[0041] The specification drawings constituting a part of the present invention are used to provide a further understanding of the present invention. The schematic embodiments of the present invention and their descriptions are used to explain the present invention and do not constitute an improper limitation of the present invention. In the drawings:

[0042] Figure 1 It is a flowchart of a method for predicting the reliability of a pressure transmitter in the containment vessel of a nuclear power plant according to an embodiment of the present invention;

[0043] Figure 2The change of the reliability of the triode of the pressure transmitter over time (total time 240h) after a severe accident;

[0044] Figure 3 Schematic diagram of a reliability prediction device for a pressure transmitter inside the containment of a nuclear power plant according to an embodiment of the present invention;

[0045] Figure 4 Block diagram of a computer system of an electronic device for implementing the embodiments of the present application according to an embodiment of the present invention.

[0046] Figure 5 Schematic diagram of an electronic device for reliability prediction of a pressure transmitter inside the containment of a nuclear power plant according to an embodiment of the present invention. Detailed implementation manners

[0047] It should be noted that, without conflict, the embodiments in the present invention and the features in the embodiments may be combined with each other. The present invention will be described in detail below with reference to the drawings and in combination with the embodiments.

[0048] The following further describes the present invention in detail with specific embodiments, and these embodiments should not be construed as limiting the scope claimed by the present invention.

[0049] Embodiment

[0050] To solve the problem in the prior art that new failure mechanisms such as user process control, quality control level, and irradiation effect are not considered, and the impact of environmental stress on the reliability of components cannot be quantitatively analyzed, the present invention proposes a reliability prediction method and device for a pressure transmitter inside the containment of a nuclear power plant.

[0051] According to one aspect of the embodiments of the present application, a reliability prediction method for a pressure transmitter inside the containment of a nuclear power plant is provided.

[0052] As Figure 1 shown in the flowchart of a reliability prediction method for a pressure transmitter inside the containment of a nuclear power plant, the method includes:

[0053] S1, obtaining the product process factor and user factor of the pressure transmitter.

[0054] The product process factor π of the pressure transmitter PM and the user factor π Process , both factors are obtained by scoring in FIDES. Considering that the scoring criteria for each factor in the Fides scoring table are relatively vague and the considered factors are too complex (R & D, production, manufacturing, etc. links), the reference values in the manual are used in this embodiment. Specifically, the product process factor π PMThe evaluation score depends on the quality levels of electronic components, circuit boards, etc. in the target product; user factor π Process It involves quality support factors included in the main stages of the entire life cycle.

[0055] S2. Determine the physical factor failure rate of the pressure transmitter.

[0056] Furthermore, determining the physical factor failure rate of the pressure transmitter includes:

[0057] S201. Classify the pressure transmitter into radiation-resistant components and radiation-sensitive components.

[0058] The pressure transmitter includes diodes, triodes, resistors, capacitors, transformers, operational amplifiers, circuit boards, etc. Among them, the radiation-resistant components include resistors, capacitors, transformers, and circuit boards; the radiation-sensitive components include diodes, triodes, and operational amplifiers.

[0059] S202. For the radiation-resistant components, determine the corresponding physical factor failure rate based on the base failure rate of temperature factors and the base failure rate of stress factors.

[0060] Specifically, through the formula:

[0061] Determine the corresponding physical factor failure rate.

[0062] S203. For the radiation-sensitive components, determine the corresponding physical factor failure rate based on the base failure rate of temperature factors, the base failure rate of stress factors, the base failure rate of radiation factors, and the irradiation acceleration factor.

[0063] Furthermore, for the radiation-sensitive components, determining the corresponding physical factor failure rate based on the base failure rate of temperature factors, the base failure rate of stress factors, the base failure rate of radiation factors, and the irradiation acceleration factor includes:

[0064] Based on the base failure rate of temperature factors, the base failure rate of stress factors, the base failure rate of radiation factors, and the irradiation acceleration factor, determine the corresponding physical factor failure rate through Formula 1. Formula 1,

[0065]

[0066] Among them, λ physical is the physical factor failure rate, t phase represents the working time of the pressure transmitter under the same environmental conditions, T Total represents the total mission duration, λ oTH represents the base failure rate of temperature factors, π Thermal represents the acceleration factor related to the combination of voltage stress and temperature, π mechRepresents the acceleration factor of mechanical vibration, λ omech Represents the base failure rate of the stress factor, λ OFZ Represents the base failure rate of the radiation factor, π FZ Represents the irradiation acceleration factor, π Induced Is the induction factor representing the contribution of overstress not listed, λ OFZ ×π FZ Represents the failure rate after irradiation correction.

[0067] Furthermore, for the triode, based on the failure rate after irradiation at normal temperature and the suppression factor of temperature on irradiation, the failure rate after irradiation correction is determined. In this embodiment, the product of the failure rate after irradiation at normal temperature and the suppression factor of temperature on irradiation is used as the failure rate after irradiation correction, that is, the corresponding expression is: λ OFZ ×π FZ =λ FZ *π TH-FZ =λ FZ-th 。Among them, π TH-FZ Is the suppression factor of temperature on irradiation, λ FZ Is the failure rate after irradiation at normal temperature, λ FZ-th Is the failure rate after irradiation correction.

[0068] [[ID=3S4]]Furthermore, the suppression factor of temperature on irradiation is determined by Formula 2, Formula 2,

[0069]

[0070] Among them, π TH-FZ Is the suppression factor of temperature on irradiation, t1 is the operating time before failure at normal operating temperature, and t2 is the operating time before failure at severe accident temperature.

[0071] The failure rate after irradiation at normal temperature is determined by Formula 3, and the said Formula 3, Among them, λ FZ Is the failure rate after irradiation at normal temperature, D is the total radiation dose, β is the shape parameter, and θ is the scale parameter.

[0072] Furthermore, for the diode and the operational amplifier, the failure rate after irradiation at normal temperature is used as the failure rate after irradiation correction.

[0073] The acceleration factor π Thermal Related to the combined voltage stress and temperature in Formula 1, Among them, T j-c o m p Is the ambient temperature at which the component operates; π El Is the coefficient related to the reverse voltage (for signal diodes: when When When When, π El = 0.056, for other types: π El = 1); E a is the activation energy of the component.

[0074] The acceleration factor π of the mechanical vibration in Formula 1 mech , and the corresponding calculation formula is Formula 5, where, G RMS is the vibration amplitude Grms related to each random vibration phase.

[0075] The induction factor π in Formula 1 Induced , and the corresponding calculation formula is Formula 6, where π Placement represents the influence of the position of the item in the device or system. The position here indicates the position of the item or the position of the function to which it belongs (in particular, whether it is an interface element); π Application represents the influence of the use environment during the use of the product containing the item; π Ruggedizing represents the influence of establishing the overstress tolerance policy in product development; C Sensibility represents the overstress sensitivity coefficient inherent in the item technology.

[0076] Formula 7, where, is the component absorbed radiation dose rate under accident conditions, and D is the radiation absorbed dose. The radiation absorbed dose is calculated by Formula 8, where, where, q is the electron unit charge; V BE is the emitter junction voltage; ΔI B is the base current change; K i is the ionization damage coefficient (for different components, the difference in their radiation tolerance results in different values); c is the Boltzmann constant; T is the absolute temperature. For ΔI B the base current change, it can be calculated by Formula 9, where, C% is the failure criterion; I B0 is the base current under normal operating conditions; I C0 is the collector current under normal operating conditions; hfe is the current gain; IC is the collector current; IB is the base current;

[0077] Furthermore, it also includes: calculating the failure rate of all pressure transmitters according to the component counting method. Specifically, through Formula 10, where, λ S is the total failure rate of the pressure transmitter; N iis the number of individual components; λ is the failure rate of a type of component; n is the number of types of components.

[0078] For devices with little impact from other radiation, the impact of radiation on components can be ignored. Only consider devices affected by temperature, electrical stress, and mechanical stress (such as transformers, resistors, capacitors, circuit boards, etc.). The calculation method of λ for these components can refer to the "FIDES guide 2022". Physical The calculation method can refer to the "FIDES guide 2022".

[0079] S3. Based on the physical factor failure rate, product process factor, and user factor, use the FIDES reliability prediction model to determine the failure rate of the pressure transmitter after a severe accident and achieve reliability prediction.

[0080] Assuming that the effects of irradiation, temperature, electrical stress, and mechanical stress are independent of each other, the FIDES reliability prediction model is expressed as λ = λ Physical × π PM × π Process .

[0081] In a specific embodiment of the present invention, the γ irradiation dose rate inside the containment of a nuclear power plant under normal operating conditions is 0.4 Gy / h. Assume that a nuclear power plant that has been operating normally for 10 years has a severe accident. The variation of γ radiation dose with time within 240 h after the accident is as shown in Table 1 below, and the temperature and mechanical vibration data are as shown in Table 1 below. The housing of the pressure transmitter can withstand 40% of the irradiation effect, and the failure rate of the triode in the pressure transmitter under irradiation follows a Weibull distribution. The determination process of the physical factor failure rate of the triode and the total failure rate of the triode is as follows:

[0082] Table 1 Environmental conditions inside the containment under severe accidents

[0083]

[0084] π Thermal = 2886.3197. Based on the above formula five, the acceleration factor for horizontal vibration is determined as The acceleration factor for vertical vibration is According to formula six, it can be determined that Taking the reduction of the current gain to 80% of the normal current gain h fe0 as the failure criterion, ΔI can be determined through formula nine B = 0.25I B0 , combined with formula seven and eight, the pre-failure operating time t1 at normal operating temperature, the pre-failure operating time t2 at severe accident temperature, and the component failure times at high temperature and normal temperature can be determined. Based on formula two, the failure rate after irradiation correction can be obtained. Substituting the above calculation results into formula one, the physical factor failure rate of the device can be obtained, and then λ = λ Physical × πPM ×π Process =4.5517×10 -06 。For example Figure 2 is the variation of the reliability of the transistor of the pressure transmitter with time (total time 240h) after a severe accident.

[0085] According to another aspect of the embodiments of the present application, the present invention also provides a reliability prediction device for a pressure transmitter inside the containment of a nuclear power plant. As Figure 3 shown, the device includes: an acquisition module 301, a determination module 302, and a reliability prediction module 303.

[0086] The acquisition module 301 is configured to acquire the product process factor and user factor of the pressure transmitter.

[0087] The determination module 302 is configured to determine the physical factor failure rate of the pressure transmitter.

[0088] The reliability prediction module 303 is configured to determine the failure rate of the pressure transmitter after a severe accident based on the physical factor failure rate, the product process factor, and the user factor, and use the FIDES reliability prediction model to achieve reliability prediction.

[0089] As an optional solution, the above device is further configured to: determine the physical factor failure rate of the pressure transmitter, including:

[0090] Classify the pressure transmitter into radiation-resistant components and radiation-sensitive components;

[0091] For radiation-resistant components, determine the corresponding physical factor failure rate based on the base failure rate of temperature factors and the base failure rate of stress factors;

[0092] For radiation-sensitive components, determine the corresponding physical factor failure rate based on the base failure rate of temperature factors, the base failure rate of stress factors, the base failure rate of radiation factors, and the irradiation acceleration factor.

[0093] As an optional solution, the above device is further configured to: the radiation-sensitive components include diodes, transistors, and operational amplifiers.

[0094] As an optional solution, the above device is further configured to: determine the corresponding physical factor failure rate based on the base failure rate of temperature factors, the base failure rate of stress factors, the base failure rate of radiation factors, and the irradiation acceleration factor, including:

[0095] Based on the base failure rate of temperature factors, the base failure rate of stress factors, the base failure rate of radiation factors, and the irradiation acceleration factor, determine the corresponding physical factor failure rate through Formula 1. Formula 1,

[0096]

[0097] where λ physical is the failure rate due to physical factors, t phase represents the operating time of the pressure transmitter under the same environmental conditions, T Total represents the total mission duration, λ oTH represents the base failure rate due to temperature factors, π Thermal represents the acceleration factor related to the combination of voltage stress and temperature, π mech represents the acceleration factor of mechanical vibration, λ omech represents the base failure rate due to stress factors, λ OFZ represents the base failure rate due to radiation factors, π FZ represents the irradiation acceleration factor, π Induced is the induction factor representing the contribution of overstress not listed, λ OFZ ×π FZ represents the failure rate after irradiation correction.

[0098] As an alternative, the above device is also used for: for a triode, determining the failure rate after irradiation correction based on the failure rate after irradiation at room temperature and the suppression factor of irradiation by temperature.

[0099] As an alternative, the above device is also used for: taking the product of the failure rate after irradiation at room temperature and the suppression factor of irradiation by temperature as the failure rate after irradiation correction.

[0100] As an alternative, the above device is also used for: the suppression factor of irradiation by temperature is determined by Formula 2, Formula 2,

[0101]

[0102] where π TH-FZ is the suppression factor of irradiation by temperature, t1 is the operating time before failure at normal operating temperature, and t2 is the operating time before failure at severe accident temperature.

[0103] As an alternative, the above device is also used for: for a diode and an operational amplifier, taking the failure rate after irradiation at room temperature as the failure rate after irradiation correction.

[0104] As an alternative, the above device is also used for: calculating the failure rate of all pressure transmitters according to the component count method.

[0105] As an alternative, the FIDES reliability prediction model is expressed as: λ = λ Physical ×π PM ×π Process where λ Physical is the failure rate due to physical factors of the pressure transmitter, πPM is the product process factor of the pressure transmitter, π Process is the user factor of the pressure transmitter.

[0106] It should be noted that, for the foregoing method embodiments, for the sake of simple description, they are all expressed as a series of action combinations. However, those skilled in the art should know that this application is not limited by the described action sequence, because according to this application, certain steps can be in other sequences or performed simultaneously. Secondly, those skilled in the art should also know that the embodiments described in the specification are all preferred embodiments, and the actions and modules involved are not necessarily essential to this application.

[0107] In the embodiments of this application, the term "module" or "unit" refers to a computer program with a predetermined function or a part of a computer program, which works together with other related parts to achieve a predetermined goal, and can be fully or partially implemented by using software, hardware (such as a processing circuit or a memory), or a combination thereof. Similarly, a processor (or multiple processors or memories) can be used to implement one or more modules or units. In addition, each module or unit can be a part of an overall module or unit that includes the function of that module or unit.

[0108] Regarding the device in the above embodiments, the specific manner in which each module performs operations has been described in detail in the embodiments related to the method, and will not be elaborated here.

[0109] According to one aspect of this application, a computer program product is provided, and the computer program product includes a computer program.

[0110] The serial numbers of the above embodiments of this application are only for description and do not represent the superiority or inferiority of the embodiments.

[0111] Figure 4 Schematically shows a block diagram of a computer system of an electronic device for implementing the embodiments of this application.

[0112] It should be noted that Figure 4 The computer system 1100 of the electronic device shown is only an example and should not impose any limitation on the functions and usage scope of the embodiments of this application.

[0113] Such as Figure 4As shown, computer system 1100 includes a central processing unit 1101 (CPU), which can perform various appropriate actions and processes according to a program stored in a read-only memory 1102 (ROM) or a program loaded from a storage section 1108 into a random access memory 1103 (RAM). In the random access memory 1103, various programs and data required for system operation are also stored. The central processing unit 1101, the read-only memory 1102, and the random access memory 1103 are connected to each other via a bus 1104. An input / output interface 1105 (Input / Output interface, i.e., I / O interface) is also connected to the bus 1104.

[0114] The following components are connected to the input / output interface 1105: an input section 1106 including a keyboard, a mouse, etc.; an output section 1107 including, for example, a cathode ray tube (CRT), a liquid crystal display (LCD), etc., and a speaker, etc.; a storage section 1108 including a hard disk, etc.; and a communication section 1109 including a network interface card such as a local area network card, a modem, etc. The communication section 1109 performs communication processing via a network such as the Internet. A drive 1110 is also connected to the input / output interface 1105 as needed. A removable medium 1111, such as a magnetic disk, an optical disk, a magneto-optical disk, a semiconductor memory, etc., is installed on the drive 1110 as needed so that a computer program read from it can be installed into the storage section 1108 as needed.

[0115] Specifically, according to an embodiment of the present application, the processes described in each method flowchart can be implemented as a computer software program. For example, an embodiment of the present application includes a computer program product, which includes a computer program carried on a computer-readable medium, and the computer program includes program codes for performing the methods shown in the flowcharts. In such an embodiment, the computer program can be downloaded and installed from a network via the communication section 1109, and / or installed from the removable medium 1111. When the computer program is executed by the central processing unit 1101, various functions defined in the system of the present application are executed.

[0116] In such an embodiment, the computer program can be downloaded and installed from a network via the communication section 1109, and / or installed from the removable medium 1111. When the computer program is executed by the central processing unit 1101, various functions provided by the embodiment of the present application are executed.

[0117] According to another aspect of the embodiments of the present application, an electronic device for reliability prediction of a pressure transmitter inside a containment of a nuclear power plant is further provided. In this embodiment, the electronic device is taken as an example of a terminal device for illustration. As Figure 5 shown, the electronic device includes a memory 1202 and a processor 1204. A computer program is stored in the memory 1202, and the processor 1204 is configured to execute the steps in any of the above method embodiments through the computer program.

[0118] Optionally, in this embodiment, the above electronic device may be located in at least one of multiple network devices in a computer network.

[0119] Optionally, in this embodiment, the above processor may be configured to execute the methods in the embodiments of the present application through a computer program.

[0120] Optionally, those of ordinary skill in the art can understand that Figure 5 the structure shown is only schematic Figure 5 and does not limit the structure of the above electronic device. For example, the electronic device may further include more or fewer components (such as a network interface, etc.) than those shown Figure 5 in it, or have a different configuration from that shown Figure 5 in it.

[0121] Among them, the memory 1202 can be used to store software programs and modules, such as program instructions / modules corresponding to the reliability prediction method and device of the pressure transmitter inside the containment of a nuclear power plant in the embodiments of the present application. The processor 1204 executes various functional applications and data processing by running the software programs and modules stored in the memory 1202, that is, implements the above reliability prediction method of the pressure transmitter inside the containment of a nuclear power plant. The memory 1202 may include a high-speed random access memory, and may also include a non-volatile memory, such as one or more magnetic storage devices, flash memories, or other non-volatile solid-state memories. In some instances, the memory 1202 may further include a memory remotely set relative to the processor 1204, and these remote memories can be connected to the terminal through a network. Examples of the above network include but are not limited to the Internet, an enterprise intranet, a local area network, a mobile communication network, and combinations thereof. Among them, the memory 1202 can specifically but not limitedly be used to store the failure rate data information after radiation correction. As an example, as Figure 5 shown, the above memory 1202 may include but are not limited to the acquisition module 301, the determination module 302, and the reliability prediction module 303 in the above device. In addition, it may further include but are not limited to other module units in the above device, which are not elaborated in this example.

[0122] Optionally, the above-mentioned transmission device 1206 is used to receive or send data via a network. Specific examples of the above-mentioned network may include a wired network and a wireless network. In one example, the transmission device 1206 includes a network adapter (Network Interface Controller, NIC), which can be connected to other network devices and routers through network cables, thereby enabling communication with the Internet or a local area network. In one example, the transmission device 1206 is a radio frequency (RF) module, which is used to communicate with the Internet wirelessly.

[0123] In addition, the above-mentioned electronic device further includes: a display 1208 for displaying the physical factor failure rate; and a connection bus 1210 for connecting each module component in the above-mentioned electronic device.

[0124] In other embodiments, the above-mentioned terminal device or server may be a node in a distributed system, where the distributed system may be a blockchain system, and the blockchain system may be a distributed system formed by connecting the multiple nodes in a form of network communication. Among them, the nodes can form a peer-to-peer network, and any form of computing device, such as electronic devices like servers and terminals, can become a node in the blockchain system by joining the peer-to-peer network.

[0125] According to one aspect of the present application, there is provided a computer-readable storage medium. The processor of the electronic device reads the computer instructions from the computer-readable storage medium, and the processor executes the computer instructions, so that the electronic device executes a reliability prediction method for a pressure transmitter inside the containment of a nuclear power plant provided in various optional implementation manners of the above aspect.

[0126] Optionally, in this embodiment, the above-mentioned computer-readable storage medium may be set to store instructions for executing the methods in various embodiments of the present application.

[0127] Optionally, in this embodiment, those of ordinary skill in the art can understand that all or part of the steps in the various methods of the above embodiments can be completed by instructing the relevant hardware of the terminal device through a program, and the program can be stored in a computer-readable storage medium. The storage medium may include: a flash drive, a read-only memory (ROM), a random access memory (RAM), a magnetic disk, or an optical disc, etc.

[0128] The serial numbers of the above embodiments of the present application are only for description and do not represent the superiority or inferiority of the embodiments.

[0129] If the integrated units in the above embodiments are implemented in the form of software functional units and sold or used as independent products, they can be stored in the above computer-readable storage media. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or all or part of this technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions for causing one or more electronic devices to execute all or part of the steps of the methods described in various embodiments of this application.

[0130] In the above embodiments of this application, the descriptions of each embodiment have their own focuses. For the parts not detailed in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0131] In the several embodiments provided in this application, it should be understood that the disclosed application program can be implemented in other ways. Among them, the device embodiments described above are only illustrative. For example, the division of the units is only a logical function division. In actual implementation, there can be other division methods. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the displayed or discussed couplings or direct couplings or communication connections to each other can be through some interfaces. The indirect couplings or communication connections of units or modules can be in electrical or other forms.

[0132] The units described as separate components may or may not be physically separated. The components displayed as units may or may not be physical units, that is, they can be located in one place, or distributed to multiple network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0133] In addition, the functional units in each embodiment of this application can be integrated in a processing unit, or each unit exists physically alone, or two or more units can be integrated in one unit. The above integrated units can be implemented in the form of hardware or in the form of software functional units.

[0134] The above are only the preferred embodiments of the present invention and are not used to limit the present invention. For those skilled in the art, the present invention can have various changes and modifications. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principle of the present invention shall be included within the protection scope of the present invention.

[0135] In summary, from the above description, it can be seen that the above embodiments of the present invention achieve the following technical effects:

[0136] 1. Starting from the failure mechanism and failure mode, the present invention considers the impacts on the transmitter after a severe accident in a nuclear power plant (temperature, irradiation, vibration), as well as the user's process control and quality control levels. Based on the physical factor failure rate, the product process factor, and the user factor, the FIDES reliability prediction model is used to determine the failure rate of the pressure transmitter after a severe accident. This method can be used for the reliability prediction of the pressure vessel inside the containment after a severe accident. Compared with the conventional reliability prediction methods, the calculation results are more accurate.

[0137] 2. On the basis of the FIDES model, the present invention introduces the influence of irradiation. For radiation-sensitive components, based on the basic failure rate of temperature factors, the basic failure rate of stress factors, the basic failure rate of radiation factors, and the irradiation acceleration factor, the corresponding physical factor failure rate is determined, thereby realizing the reliability prediction of the transmitter after a severe accident in a nuclear power plant.

[0138] It should be noted that in this text, relational terms such as "first" and "second" are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. Moreover, the term "comprising", "including" or any other variant thereof is intended to cover non-exclusive inclusion, so that a process, method, article or device comprising a series of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such process, method, article or device. Without further limitation, an element defined by the statement "comprising an..." does not exclude the existence of additional identical elements in the process, method, article or device comprising the element.

[0139] It should be noted that in the description of this specification, the descriptions with reference to terms such as "one embodiment", "some embodiments", "example", "specific example", or "some examples" mean that the specific features, structures, materials, or characteristics described in connection with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials, or characteristics described can be combined in a suitable manner in any one or more embodiments or examples. In addition, without contradiction, those skilled in the art can combine and combine the different embodiments or examples described in this specification and the features of different embodiments or examples.

Claims

1. A reliability prediction method for a pressure transmitter inside the containment of a nuclear power plant, characterized in that Including: Obtain the product process factors and user factors of the pressure transmitter; Determine the physical factor failure rate of the pressure transmitter, where the physical factors include temperature, vibration, and irradiation; Based on the physical factor failure rate, the product process factors, and the user factors, use the FIDES reliability prediction model to determine the failure rate of the pressure transmitter after a severe accident, and achieve reliability prediction.

2. The method according to claim 1, characterized in that, Determining the physical factor failure rate of the pressure transmitter includes: Classify the pressure transmitter into radiation-resistant components and radiation-sensitive components; For radiation-resistant components, determine the corresponding physical factor failure rate based on the base failure rate of the temperature factor and the base failure rate of the stress factor; For radiation-sensitive components, determine the corresponding physical factor failure rate based on the base failure rate of the temperature factor, the base failure rate of the stress factor, the base failure rate of the radiation factor, and the irradiation acceleration factor.

3. The method according to claim 2, characterized in that, The radiation-sensitive components include diodes, triodes, and operational amplifiers.

4. The method according to claim 3, wherein Based on the base failure rate of the temperature factor, the base failure rate of the stress factor, the base failure rate of the radiation factor, and the irradiation acceleration factor, determining the corresponding physical factor failure rate includes: Based on the base failure rate of the temperature factor, the base failure rate of the stress factor, the base failure rate of the radiation factor, and the irradiation acceleration factor, determine the corresponding physical factor failure rate through Formula 1, and Formula 1 is Among them, λ physical is the failure rate due to physical factors, t phase represents the working time of the pressure transmitter under the same environmental conditions, T Total represents the total mission duration, λ oTH represents the base failure rate due to temperature factors, π Thermal represents the acceleration factor related to the combination of voltage stress and temperature, π mech represents the acceleration factor of mechanical vibration, λ omech represents the base failure rate due to stress factors λ OFZ represents the basic failure rate of radiation factors, π FZ represents the irradiation acceleration factor, π Induced is the induction factor representing the contribution of overstresses not listed, λ OFZ ×π FZ represents the failure rate after irradiation correction.

5. The method according to claim 4, wherein For the triode, determine the failure rate after irradiation correction based on the failure rate after irradiation at room temperature and the suppression factor of temperature on irradiation.

6. The method according to claim 5, wherein Take the product of the failure rate after irradiation at room temperature and the suppression factor of temperature on irradiation as the failure rate after irradiation correction.

7. The method according to claim 6, wherein The suppression factor of temperature on irradiation is determined through Formula 2, and Formula 2 is where, π TH-FZ is the inhibition factor of temperature on irradiation, t1 is the operation time before failure at normal operating temperature, and t2 is the operation time before failure at severe accident temperature.

8. The method according to claim 4, wherein For the diode and the operational amplifier, take the failure rate after irradiation at room temperature as the failure rate after irradiation correction.

9. The method according to claim 4, characterized in that Also including: Calculate the failure rate of all pressure transmitters according to the component count method.

10. The method according to any one of claims 1 to 9, characterized in that, The FIDES reliability prediction model is expressed as: λ = λ Physical × π PM × π Process , where λ Physical is the physical factor failure rate of the pressure transmitter, and π PM is the product process factor of the pressure transmitter, and π Process is the user factor of the pressure transmitter.

11. A reliability prediction device for a pressure transmitter inside a containment of a nuclear power plant, characterized in that, Including: An acquisition module for acquiring the product process factors and user factors of the pressure transmitter; A determination module for determining the physical factor failure rate of the pressure transmitter; A reliability prediction module for, based on the physical factor failure rate, the product process factors, and the user factors, using the FIDES reliability prediction model to determine the failure rate of the pressure transmitter after a severe accident, and achieving reliability prediction.

12. A computer-readable storage medium, characterized in that, The computer-readable storage medium includes a stored computer program, where the computer program, when run by an electronic device, executes the method described in any one of claims 1 to 10.

13. A computer program product, comprising a computer program, characterized in that, When the computer program is executed by a processor, it implements the steps of the method described in any one of claims 1 to 10.

14. An electronic device, comprising a memory and a processor, characterized in that, A computer program is stored in the memory, and the processor is set to execute the method described in any one of claims 1 to 10 through the computer program.

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