Semiconductor laser cos appearance detection device

Abstract

The application relates to the technical field of semiconductor laser detection, in particular to a semiconductor laser COS appearance detection device which comprises a base, a detection block is arranged on the base, an inner-recessed detection groove for placing a semiconductor laser COS is arranged on the upper surface of the detection block, one side of the detection block provided with the detection groove is provided with a cover plate, an observation groove opposite to the detection groove is arranged on the cover plate, a magnetic block is arranged on the cover plate, and a magnetic suction block matched with the magnetic block is arranged on the detection block. An operator places the semiconductor laser COS in the detection groove, presses the cover plate on the semiconductor laser COS, and fixes the cover plate on the detection block through the magnetic block and the magnetic suction block, so that the semiconductor laser COS is tightly fixed. The operator performs appearance detection on the semiconductor laser COS through the observation groove. The cover plate is fixed on the semiconductor laser COS through magnetic suction, the semiconductor laser COS is convenient to take and install, is not limited by other external components, is widely used in various occasions and places, is convenient to carry and circulate, and is convenient to use.

Description

Technical Field

[0001] This application relates to the technical field of semiconductor laser inspection, and in particular to a semiconductor laser COS appearance inspection device. Background Technology

[0002] This application relates to the technical field of semiconductor laser inspection, and in particular to a semiconductor laser COS appearance inspection device.

[0003] Related technology can be found in Chinese Patent No. CN221936541U, which discloses a semiconductor laser appearance inspection fixture, comprising: a fixture body, the outer surface of which has a mounting groove for placing the laser, and the interior of which has a conveying channel communicating with the mounting groove. The conveying channel has at least one opening adapted for connection to a negative pressure device. By placing the semiconductor laser in the mounting groove and then connecting the negative pressure device at the opening of the conveying channel, the semiconductor laser can be fixed by vacuum adsorption.

[0004] Currently, most common detection devices use vacuum adsorption to fix the COS of the laser. This requires an external vacuum tube connected to a negative pressure device. The use of such devices is limited by the positions of the negative pressure device and the vacuum tube, resulting in poor flexibility and restricted application. Summary of the Invention

[0005] For ease of use, this application provides a semiconductor laser COS appearance inspection device.

[0006] The semiconductor laser COS appearance inspection device provided in this application adopts the following technical solution:

[0007] A semiconductor laser COS appearance inspection device includes a base, a detection block on the base, a recessed detection groove for placing the semiconductor laser COS on the upper surface of the detection block, a cover plate on the side of the detection block with the detection groove, an observation groove opposite to the detection groove on the cover plate, a magnetic block on the cover plate, and a magnetic attraction block that cooperates with the magnetic block on the detection block.

[0008] By adopting the above technical solution, the operator places the semiconductor laser COS in the testing slot and presses the cover plate onto the COS. The cover plate is fixed to the testing block by magnetic blocks and magnetic suction blocks, thus pressing and fixing the semiconductor laser COS. The operator then performs visual inspection of the semiconductor laser COS through the observation slot. The cover plate fixes the semiconductor laser COS magnetically, making it easy to install and remove, and not limited by other external components. This allows for a wide range of applications and locations, and it is easy to carry and distribute, making it convenient to use.

[0009] Preferably, the detection block is provided with several horizontally arranged rotating shafts, and a rotating disk is rotatably connected to the end of each rotating shaft. The axis of the rotating disk is perpendicular to the rotating shaft, and the detection groove is formed on the rotating disk.

[0010] By adopting the above technical solution, the operator can turn the rotating disk to rotate the semiconductor laser COS, thereby observing the semiconductor laser COS from various angles, which is convenient to use.

[0011] Preferably, the detection block is rotatably connected to the base, and a square hole is opened on the side wall of the detection block. A square rod is inserted through the square hole. One end of the square rod extends out of the square hole and is located on one side of the base and is provided with a handle. The other end is located in the square hole and is fixed with a drive rack. A drive gear that meshes with the drive rack is coaxially fixed at the end of the rotating shaft away from the rotating disk.

[0012] By employing the above technical solution, the operator rotates the square rod, which causes the entire detection block to rotate around its axis, thus allowing observation of the semiconductor laser COS. Alternatively, pushing or pulling the square rod drives a rack and pinion, which in turn drives a rotating shaft and disc around the shaft, allowing for further observation of the semiconductor laser COS. By controlling the square rod, the operator can rotate the semiconductor laser COS from two angles, thus providing a wider observation range and greater flexibility and convenience.

[0013] Preferably, the rotating disk includes a fixed disk and a moving disk, the lower surface of the fixed disk is fixedly connected to the rotating shaft, the moving disk is rotatably connected to the fixed disk, and the detection groove is formed on the moving disk.

[0014] By adopting the above technical solution, the semiconductor laser COS is mounted on a moving disk and can rotate around the axis of the moving disk, increasing the rotation dimension of the semiconductor laser COS and making it easier to observe and use.

[0015] Preferably, a rotating rod is fixed on the lower surface of the moving plate, passing through the fixed plate and inserted into the rotating shaft. The rotating rod and the fixed plate are rotatably connected. The rotating shaft is hollow, and a control rod is rotatably connected inside the rotating shaft. The control rod is connected to the rotating rod through a bevel gear pair. The end of the control rod away from the rotating rod protrudes from the rotating shaft. A self-control rod parallel to the square rod is rotatably connected inside the detection block. The self-control rod is connected to the end of the control rod away from the rotating rod through a bevel gear pair.

[0016] By adopting the above technical solution, the operator rotates the self-control lever, which drives the control lever to rotate through the bevel gear pair. The other end of the control lever drives the self-rotating rod to rotate through the bevel gear pair, thereby driving the moving plate and the semiconductor laser COS to rotate, changing the angle of the semiconductor laser COS for easier observation.

[0017] Preferably, the end of the self-control lever opposite to the handle is provided with a gripper extending from the end of the detection block.

[0018] By adopting the above technical solution, the self-control rod and the square rod are located on both sides of the detection block. The operator holds one in each hand to operate them, thereby enabling multi-dimensional control of the semiconductor laser COS and facilitating observation.

[0019] Preferably, a return spring is provided between the square rod and the square hole. When the return spring is in its natural state, the upper surface of the rotating disk faces the upper surface of the detection block. A return torsion spring is provided between the self-control rod and the detection block. When the return torsion spring is in its natural state, the opening of the detection groove faces the outside of the detection block.

[0020] By adopting the above technical solution, after the observation is completed, the operator releases the square rod and the self-control rod, and the detection block is reset under the action of the reset spring and the reset torsion spring, which makes it convenient for the operator to pick up and put down the semiconductor laser COS.

[0021] Preferably, the inner wall of the observation slot is provided with a pressure plate for pressing onto the COS heat sink of the semiconductor laser, the pressure plate being made of a deformable flexible material.

[0022] By adopting the above technical solution, the pressure plate presses and fixes the heat sink of the semiconductor laser, improving the stability of the semiconductor laser COS. During the movement of the semiconductor laser COS, the flexible pressure plate always fits against it, which neither interferes with its movement nor fails to ensure the pressing effect.

[0023] In summary, this application includes the following beneficial technical effects:

[0024] With the cover plate, the detection block is freed from the limitations of the vacuum tube, making it suitable for a wider range of applications and easy to carry and use. Attached Figure Description

[0025] Figure 1 This is a schematic diagram of the overall structure of the embodiment;

[0026] Figure 2 This is a schematic diagram of the detection block in the embodiment;

[0027] Figure 3 This is a schematic diagram of the connection between the square rod inside the detection block and the rotating shaft in the embodiment;

[0028] Figure 4 This is a schematic diagram of the connection between the self-control lever and the control lever in the embodiment.

[0029] Explanation of reference numerals in the attached figures:

[0030] 1. Base; 11. Base plate; 12. Vertical plate; 2. Detection block; 21. Rotating disk; 211. Moving disk; 2111. Detection slot; 212. Fixed disk; 213. Rotating rod; 22. Magnetic block; 23. Rotating shaft; 231. Drive gear; 24. Square hole; 3. Cover plate; 31. Observation slot; 32. Pressing plate; 4. Square rod; 41. Handle; 42. Drive rack; 5. Control rod; 6. Self-control rod; 61. Grab. Detailed Implementation

[0031] The present application will be further described in detail below with reference to all the accompanying drawings.

[0032] Example

[0033] This application discloses a semiconductor laser COS appearance inspection device, referring to... Figure 1 and Figure 2 The system includes a base 1, on which a detection block 2 is rotatably connected. A cover plate 3 is provided on the upper surface of the detection block 2. A semiconductor laser (COS) is sandwiched between the detection block 2 and the cover plate 3 for observation. A magnetic block is provided on the cover plate 3, and a magnetic suction block 22 that cooperates with the magnetic block is provided on the detection block 2. The cover plate 3 is magnetically attached to the detection block 2 for easy placement and removal.

[0034] Reference Figure 1 and Figure 2 The base 1 includes a horizontal substrate 11 and vertical plates 12 fixed to both ends of the substrate 11. A detection block 2 is rotatably connected between the two vertical plates 12. The detection block 2 can rotate around its own axis, thereby changing the angle of the semiconductor laser COS and enabling multi-angle observation of the semiconductor laser COS. Furthermore, the axial direction of the detection block 2 is referred to as the x-axis, the horizontal plane perpendicular to the x-axis is called the y-axis, and the vertical plane perpendicular to the x-axis is called the z-axis.

[0035] Reference Figure 1 and Figure 2 The upper surface of the detection block 2 is rotatably connected to several rotating shafts 23 along the y-axis, which are distributed along the length of the detection block 2. One end of each rotating shaft 23 passes through the detection block 2, and the other end is connected to a rotating disk 21. The axis of the rotating disk 21 is set along the z-axis. The rotating shafts 23 can drive the rotating disk 21 to rotate along its own axis.

[0036] Reference Figures 1 to 3The rotating disk 21 includes a fixed disk 212 and a moving disk 211. The lower surface of the fixed disk 212 is fixedly connected to the rotating shaft 23, and the moving disk 211 is rotatably connected to the upper surface of the fixed disk 212. The upper surface of the moving disk 211 has a recessed detection groove 2111 for placing a semiconductor laser COS. The cover plate 3 has several through observation grooves 31. The inner wall of each observation groove 31 is fixed with an annular pressing plate 32 for pressing onto the heat sink of the semiconductor laser COS. The pressing plate 32 is made of a flexible material. An opening for the surface of the semiconductor laser COS is located at the center of the pressing plate 32.

[0037] Reference Figures 1 to 3 The operator places the semiconductor laser COS into the detection slot 2111, and the cover plate 3 magnetically attaches to the detection block 2 to press the semiconductor laser COS firmly. At this time, the semiconductor laser COS is clamped between the moving plate 211 and the pressure plate 32. The operator can perform visual inspection of the semiconductor laser COS through the observation slot 31. Furthermore, the operator can rotate the detection block 2, the rotating shaft 23, and the moving plate 211 respectively, so that the semiconductor laser COS can be rotated around the x-axis, y-axis, and z-axis, thereby allowing for multi-angle observation along the y-axis, which is convenient to use.

[0038] Reference Figures 1 to 3 The detection block 2 has a square hole 24 at one end along the x-axis, and a square rod 4 passes through the square hole 24. One end of the square rod 4 is located inside the detection block 2, and the other end extends out of the square hole 24 and is located outside the vertical plate 12, where a handle 41 is fixed. The part of the square rod 4 extending out of the square hole 24 is circular. The operator can rotate the detection block 2 by using the handle 41.

[0039] Reference Figures 1 to 3 A square rod 4 is slidably connected within a square hole 24. A drive rack 42 is coaxially fixed to the end of the square rod 4 away from the handle 41. A drive gear 231, meshing with the drive rack 42, is coaxially fixed to the end of the rotating shaft 23 away from the rotating disk 21. When the operator pulls the square rod 4, the drive rack 42 slides, thereby causing the drive gear 231 and the rotating shaft 23 to rotate, which in turn causes the rotating disk 21 and the semiconductor laser COS to rotate around the y-axis.

[0040] Reference Figures 1 to 3 The operator can control the semiconductor laser COS to rotate around the x-axis and y-axis by rotating or pulling the square rod 4, which is convenient to use.

[0041] Reference Figures 1 to 4 The other end of the detection block 2 is rotatably connected to a self-control rod 6. One end of the self-control rod 6 is located inside the detection block 2, and the other end is connected to a gripper 61 that passes through the detection block 2 and is located on the other side of the base 1 via a gear.

[0042] Reference Figures 1 to 4A control rod 5, coaxially arranged with the rotating shaft 23, is rotatably connected inside the detection block 2. The rotating shaft 23 is hollow, and the control rod 5 passes through and is rotatably connected to the rotating shaft 23. One end of the control rod 5 extends from the end of the rotating shaft 23 and is connected to the self-control rod 6 through a bevel gear pair, while the other end is located below the fixed plate 212. When the operator rotates the self-control rod 6, the self-control rod 6 drives the control rod 5 to rotate within the rotating shaft 23 through the bevel gear pair.

[0043] Reference Figures 1 to 4 A rotating rod 213, passing through a fixed plate 212 and inserted into a rotating shaft 23, is fixed to the lower surface of the moving plate 211. The rotating rod 213 and the fixed plate 212 are rotatably connected. The lower end of the rotating rod 213 is connected to the control lever 5 via a bevel gear pair. When the control lever 5 rotates, it drives the rotating rod 213 to rotate, thereby driving the moving plate 211 to rotate.

[0044] Reference Figures 1 to 4 The operator controls the square lever 4 with one hand to rotate the semiconductor laser COS in the x and y directions, and controls the self-control lever 6 with the other hand to rotate the semiconductor laser COS in the z direction. It is easy to operate and allows for multi-angle observation of the semiconductor laser COS. It is flexible and convenient to use.

[0045] Reference Figures 1 to 4 A return spring is provided between the square rod 4 and the square hole 24. When the return spring is in its natural state, the upper surface of the rotating disk 21 faces the upper surface of the detection block 2. A return torsion spring is provided between the self-control rod 6 and the detection block 2. When the return torsion spring is in its natural state, the opening of the detection groove 2111 faces the outside of the detection block 2. After the test is completed, the operator releases the square rod 4 and the self-control rod 6, and the rotating disk 21 returns to its original position under the action of the return spring and the return torsion spring, thus facilitating the operator to pick up and put away the semiconductor laser COS.

[0046] The implementation principle of the semiconductor laser COS appearance inspection device in this application embodiment is as follows: The operator places the semiconductor laser COS in the inspection slot 2111, and closes it with the cover plate 3, so that the semiconductor laser COS is sandwiched between the inspection block 2 and the cover plate 3. The operator controls the square rod 4 with one hand and the self-control rod 6 with the other hand. The operator pulls or rotates the square rod 4 to control the semiconductor laser COS to rotate along the x-axis or y-axis, and rotates the self-control rod 6 with the other hand to control the semiconductor laser COS to rotate along the z-axis. The two hands work together to operate, thereby allowing for multi-angle observation of the semiconductor laser COS.

[0047] The above are all preferred embodiments of this application, and are not intended to limit the scope of protection of this application. Therefore, all equivalent changes made in accordance with the structure, shape and principle of this application should be covered within the scope of protection of this application.

Claims

1. A semiconductor laser COS appearance inspection device, comprising a base (1), characterized in that: The base (1) is provided with a detection block (2), and the upper surface of the detection block (2) is provided with a concave detection groove (2111) for placing a semiconductor laser COS. The side of the detection block (2) with the detection groove (2111) is provided with a cover plate (3). The cover plate (3) is provided with an observation groove (31) that is directly opposite to the detection groove (2111). The cover plate (3) is provided with a magnetic block, and the detection block (2) is provided with a magnetic suction block (22) that cooperates with the magnetic block. The detection block (2) is provided with several horizontally arranged rotating shafts (23), and the ends of the rotating shafts (23) are rotatably connected to a rotating disk (21). The axis of the rotating disk (21) is perpendicular to the rotating shafts (23), and the detection groove (2111) is opened on the rotating disk (21). The detection block (2) is rotatably connected to the base (1). The detection block (2) has a square hole (24) on its side wall. A square rod (4) is inserted through the square hole (24). One end of the square rod (4) extends out of the square hole (24) and is located on one side of the base (1) with a handle (41). The other end is located in the square hole (24) and is fixed with a drive rack (42). The end of the rotating shaft (23) away from the rotating disk (21) is coaxially fixed with a drive gear (231) that meshes with the drive rack (42). The rotating disk (21) includes a fixed disk (212) and a moving disk (211). The lower surface of the fixed disk (212) is fixedly connected to the rotating shaft (23). The moving disk (211) is rotatably connected to the fixed disk (212). The detection groove (2111) is opened on the moving disk (211). The lower surface of the moving plate (211) is fixed with a rotating rod (213) that passes through the fixed plate (212) and is inserted into the rotating shaft (23). The rotating rod (213) and the fixed plate (212) are rotatably connected. The rotating shaft (23) is hollow. A control rod (5) is rotatably connected inside the rotating shaft (23). The control rod (5) is connected to the rotating rod (213) through a bevel gear pair. The end of the control rod (5) away from the rotating rod (213) passes out from inside the rotating shaft (23). A self-control rod (6) parallel to the square rod (4) is rotatably connected inside the detection block (2). The self-control rod (6) is connected to the end of the control rod (5) away from the rotating rod (213) through a bevel gear pair.

2. The semiconductor laser COS appearance inspection device according to claim 1, characterized in that: The self-control lever (6) has a gripper (61) extending from the end of the detection block (2) at the end opposite to the handle (41).

3. The semiconductor laser COS appearance inspection device according to claim 1, characterized in that: A reset spring is provided between the square rod (4) and the square hole (24). When the reset spring is in its natural state, the upper surface of the rotating disk (21) faces the upper surface of the detection block (2). A reset torsion spring is provided between the self-control rod (6) and the detection block (2). When the reset torsion spring is in its natural state, the opening of the detection groove (2111) faces the outside of the detection block (2).

4. The semiconductor laser COS appearance inspection device according to claim 1, characterized in that: The inner wall of the observation slot (31) is provided with a pressure plate (32) for pressing onto the COS heat sink of the semiconductor laser. The pressure plate (32) is made of a deformable flexible material.

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