Optical power measuring device

Abstract

The application discloses an optical power measuring device, and relates to the technical field of optical measurement, which comprises a reflector and an optical power meter, the reflector comprises a reflecting surface, and the optical power meter comprises a photosensitive surface; the reflector is arranged in a to-be-measured area, is used for reflecting light emitted by a to-be-measured light machine to the to-be-measured area through the reflecting surface when the to-be-measured light machine generates a projection picture, and forms a reflected light path, wherein the to-be-measured area is an area to be subjected to optical power measurement in the projection picture; the optical power meter is arranged on the reflected light path, is used for receiving light conducted by the reflected light path through the photosensitive surface, and performing optical power measurement on the to-be-measured area according to the received light, so as to obtain an optical power measurement value corresponding to the to-be-measured area. The application can perform optical power measurement on a DLP projection light machine with a small projection picture size without customizing an optical power meter with a small-size photosensitive surface.

Description

Technical Field

[0001] The present application relates to the field of optical measurement technology, and in particular to an optical power measurement device. Background Art

[0002] In the field of 3D printing, Digital Light Processing (DLP), with its high precision and rapid prototyping capabilities, has become a core technology in stereolithography 3D printing systems. DLP 3D printing equipment typically uses a monochrome DLP projector operating in the UV (Ultraviolet) wavelength range to precisely project a pre-set pattern onto a photosensitive resin surface, curing it layer by layer to build a three-dimensional model. To ensure print quality and process consistency, accurately measuring and calibrating the optical power across each area of ​​the projected image is crucial, as it directly impacts the curing of the photosensitive resin and the quality of the final product.

[0003] Currently, the projection screen size of DLP projectors is relatively small, typically only a few centimeters to more than ten centimeters. However, the photosensitive surface size of standard optical power meters is relatively large. When using standard optical power meters to measure the optical power of a DLP projector's projection screen, it is difficult to accurately locate and measure the optical power of a specific area in the projection screen. To address this, one feasible approach is to customize an optical power meter with a small photosensitive surface to measure the optical power of DLP projectors with smaller projection screens, but this is costly. Summary of the Invention

[0004] The main purpose of this application is to provide an optical power measurement device, which aims to solve the technical problem of high cost in customizing an optical power meter with a small-sized photosensitive surface when measuring the optical power of a DLP projector with a smaller projection screen size.

[0005] To achieve the above-mentioned object, the present application provides an optical power measurement device, the device comprising a reflector and an optical power meter, the reflector comprising a reflective surface, and the optical power meter comprising a photosensitive surface;

[0006] The reflector is provided in the area to be measured, and is used to reflect the light emitted by the optical machine to be measured to the area to be measured through the reflective surface when the optical machine to be measured generates a projection image, and form a reflected light path, wherein the area to be measured is the area in the projection image where the optical power measurement is to be performed;

[0007] The optical power meter is arranged on the reflected light path, and is used to receive the light transmitted by the reflected light path through the photosensitive surface, and measure the optical power of the area to be measured based on the received light to obtain the optical power measurement value corresponding to the area to be measured.

[0008] In one embodiment, the photosensitive surface is configured such that, when receiving the light transmitted by the reflective light path, the incident angle of the light is smaller than a preset angle.

[0009] In one embodiment, the device further comprises a reflector bracket detachably connected to the reflector, for fixing the reflector to the area to be measured.

[0010] In one embodiment, the reflector bracket includes a reflector fixing member detachably connected to the reflector, and a reflector moving platform movably connected to the reflector fixing member;

[0011] The reflector fixing member is used to fix the reflector;

[0012] The reflector moving platform is used to move the reflector fixing member to fix the reflector to the area to be measured.

[0013] In one embodiment, the device further comprises an optical power meter bracket detachably connected to the optical power meter, and the optical power meter bracket is used to fix the optical power meter to the reflected light path.

[0014] In one embodiment, the optical power meter bracket includes an optical power meter fixing piece detachably connected to the optical power meter, and an optical power meter moving platform movably connected to the optical power meter fixing piece;

[0015] The optical power meter fixing member is used to fix the optical power meter;

[0016] The optical power meter moving platform is used to move the optical power meter fixing part to fix the optical power meter on the reflected light path.

[0017] In one embodiment, the optical power meter fixing member includes a rotating unit for rotating the optical power meter to set the photosensitive surface so that when receiving the light transmitted by the reflective light path, the incident angle of the light is smaller than a preset angle.

[0018] In one embodiment, the apparatus further includes a central control unit connected to the optical power meter, wherein the central control unit is configured to:

[0019] Obtaining an optical power measurement value corresponding to the measured area and a size of the reflecting surface obtained by measuring the optical power meter;

[0020] The optical power density corresponding to the area to be measured is calculated based on the optical power measurement value and the size of the reflecting surface.

[0021] In one embodiment, the light emitted by the light machine to be measured is monochromatic light, and the central control unit is further used to:

[0022] The pre-calibrated reflectivity of the reflecting surface to the monochromatic light is obtained, and the optical power density corresponding to the area to be measured is calculated based on the optical power measurement value, the size of the reflecting surface and the reflectivity.

[0023] In one embodiment, the reflector moving platform is parallel to the projection screen, the central control unit is connected to the reflector moving platform, and the central control unit is further configured to:

[0024] The coordinates to be measured corresponding to the area to be measured are determined, and according to the coordinates to be measured, the reflector moving platform is controlled to move the reflector fixing member until the reflector is fixed to the area to be measured.

[0025] In one embodiment, the reflector moving platform is parallel to the optical power meter moving platform, the central control unit is also connected to the optical power meter moving platform, and the central control unit is further configured to:

[0026] Determining a first straight-line distance between the optical machine to be measured and the reflector moving platform, and a second straight-line distance between the reflector moving platform and the optical power meter moving platform;

[0027] Calculating an angle between the reflected light path and the reflector moving platform according to the coordinates to be measured and the first straight-line distance;

[0028] Calculating the coordinates of the intersection between the reflected light path and the optical power meter mobile platform according to the optical path angle and the second straight-line distance;

[0029] According to the intersection coordinates, the optical power meter moving platform is controlled to move the optical power meter fixing member until the optical power meter is fixed to the reflected light path.

[0030] In one embodiment, the central control unit is further connected to the rotation unit, and the central control unit is further configured to:

[0031] According to the optical path angle, the rotating unit is controlled to rotate the optical power meter until the incident angle of the light is less than a preset angle when the photosensitive surface receives the light transmitted by the reflective light path.

[0032] Since the projection screen size of a DLP projector is relatively small, usually only a few centimeters to more than ten centimeters, and the photosensitive surface size of a standard optical power meter is relatively large, when using a standard optical power meter to measure the optical power of the projection screen of a DLP projector, it is difficult to accurately locate and measure the optical power of a specific area in the projection screen.

[0033] In contrast, an embodiment of the present application provides an optical power measurement device, including a reflector and an optical power meter, wherein the reflector includes a reflecting surface, and the optical power meter includes a photosensitive surface; the reflector is arranged in the area to be measured, and is used to reflect the light emitted by the optical machine to be measured to the area to be measured through the reflecting surface when the optical machine to be measured generates a projection image, and form a reflective light path, wherein the area to be measured is the area in the projection image where the optical power measurement is to be performed; the optical power meter is arranged on the reflective light path, and is used to receive the light transmitted by the reflective light path through the photosensitive surface, and measure the optical power of the area to be measured based on the received light, and obtain the optical power measurement value corresponding to the area to be measured. The embodiment of the present application does not choose to make high-cost miniaturization improvements to the structure of the optical power meter, but takes a different approach, introducing a reflector with a reflecting surface size equivalent to that of the area to be measured at the area to be measured of the projection image, accurately covering the area to be measured, thereby "guiding" the light emitted by the optical machine to the area to be measured to the photosensitive surface of the standard optical power meter by reflection, thereby achieving indirect measurement of the optical power at the area to be measured.

[0034] Through this optical power measurement device, the embodiment of the present application will make high-cost miniaturized improvements to the standard optical power meter, simplifying it to low-cost customization and precise matching of the reflective surface size of the reflector, thereby achieving accurate measurement of the optical power of a specific area in a small projection area without changing the structure of the standard optical power meter. This not only effectively avoids the high cost of customizing a miniature optical power meter, but also improves the adaptability and practicality of the measurement system, thereby achieving the technical effect of reducing costs, improving measurement accuracy and operational feasibility. BRIEF DESCRIPTION OF THE DRAWINGS

[0035] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present application and, together with the description, serve to explain the principles of the present application.

[0036] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on the structures shown in these drawings without paying any creative work.

[0037] Figure 1 A schematic structural diagram of an optical power measurement device provided in the first embodiment of the present application;

[0038] Figure 2 This is a schematic structural diagram of a reflector bracket in an optical power measurement device according to an embodiment of the present application;

[0039] Figure 3 This is a schematic diagram of a scene of a reflector bracket in the optical power measurement device according to an embodiment of the present application;

[0040] Figure 4 This is a schematic structural diagram of an optical power meter bracket in an optical power measurement device according to an embodiment of the present application;

[0041] Figure 5 This is a schematic diagram of the angle adjustment of the test probe in the optical power measurement device according to an embodiment of the present application;

[0042] Figure 6 Schematic diagram of the points for optical power measurement in a specific embodiment of the present application.

[0043] Description of the accompanying figures:

[0044] 100. Optical power measuring device; 1. Reflector; 2. Optical power meter; 3. Reflector bracket, 31. Reflector fixing member, 32. Reflector movable platform; 4. Optical power meter bracket, 41. Optical power meter fixing member, 411. Rotating unit, 42. Optical power meter movable platform; 5. Optical device to be measured; 6. Projection screen.

[0045] The purpose, features and advantages of this application will be further explained in conjunction with the embodiments and with reference to the accompanying drawings. DETAILED DESCRIPTION

[0046] Exemplary embodiments will be described in detail herein, with examples illustrated in the accompanying drawings. In the following description, when referring to the drawings, identical numerals in different figures represent identical or similar elements, unless otherwise indicated. The embodiments described in the following exemplary embodiments are not intended to represent all embodiments consistent with the present application. Rather, they are merely examples of apparatus and methods consistent with certain aspects of the present application, as detailed in the appended claims.

[0047] It should be understood that the specific embodiments described herein are merely used to explain the technical solutions of the present application and are not intended to limit the present application.

[0048] Since the projection screen size of a DLP projector is relatively small, usually only a few centimeters to more than ten centimeters, and the photosensitive surface size of a standard optical power meter is relatively large, when using a standard optical power meter to measure the optical power of the projection screen of a DLP projector, it is difficult to accurately locate and measure the optical power of a specific area in the projection screen.

[0049] In contrast, the optical power measurement device provided in the embodiment of the present application does not choose to make high-cost miniaturization improvements to the structure of the optical power meter, but takes a different approach. A reflector with a reflecting surface size equivalent to that of the area to be measured is introduced at the area to be measured on the projection screen, accurately covering the area to be measured. In this way, the light emitted by the optical machine to be measured to the area to be measured is "guided" to the photosensitive surface of the standard optical power meter by reflection, thereby realizing indirect measurement of the optical power in the area to be measured.

[0050] Through this optical power measurement device, the embodiment of the present application will make high-cost miniaturized improvements to the standard optical power meter, simplifying it to low-cost customization and precise matching of the reflective surface size of the reflector, thereby achieving accurate measurement of the optical power of a specific area in a small projection area without changing the structure of the standard optical power meter. This not only effectively avoids the high cost of customizing a miniature optical power meter, but also improves the adaptability and practicality of the measurement system, thereby achieving the technical effect of reducing costs, improving measurement accuracy and operational feasibility.

[0051] In order to better understand the technical solution of the present application, a detailed description will be given below in conjunction with the accompanying drawings and specific implementation methods.

[0052] This application provides an optical power measurement device according to a first embodiment.

[0053] Please refer to Figure 1 , Figure 1 This is a schematic structural diagram of the optical power measurement device provided in the first embodiment of the present application.

[0054] In this embodiment, the optical power measurement device 100 includes a reflector 1 and an optical power meter 2. The reflector 1 includes a reflective surface, and the optical power meter 2 includes a photosensitive surface.

[0055] The reflector 1 is provided in the area to be measured and is used to reflect the light emitted from the light machine 5 to the area to be measured through the reflective surface when the light machine 5 to be measured generates the projection image 6, and form a reflected light path, wherein the area to be measured is the area in the projection image 6 where the optical power measurement is to be performed;

[0056] The optical power meter 2 is arranged on the reflected light path, and is used to receive the light transmitted by the reflected light path through the photosensitive surface, and measure the optical power of the area to be measured according to the received light to obtain the optical power measurement value corresponding to the area to be measured.

[0057] Those skilled in the art will appreciate that reflector 1 is an optical element with a surface reflective function, used to reflect incident light at a certain angle. The reflective surface refers to the effective reflective surface on reflector 1. The reflective light path refers to the light propagation path formed by reflection when light encounters the interface between different media during propagation. Optical power meter 2 is a standard instrument used to measure the optical power of incident light. It includes components such as a detector (also called a test probe), an amplifier circuit, and a display unit. Optical power refers to the rate at which light energy passes through a certain cross-section and is usually measured in watts (W). The photosensitive surface refers to the surface of the detector on which photosensitive material is distributed and is responsible for receiving light. Optical power measurement refers to measuring the optical power of incident light, and the optical power measurement value refers to the optical power measured by optical power meter 2.

[0058] In this embodiment, the optical machine to be measured 5 refers to an optical machine that needs to perform optical power measurement, and the projection image 6 refers to an image formed by the light emitted by the optical machine to be measured 5 .

[0059] It should be noted that, in this embodiment, performing optical power measurement on the light measuring device 5 actually refers to performing optical power measurement on multiple areas to be measured on the projection screen 6 generated by the light measuring device 5 .

[0060] When the optical power of the photoelectric device 5 to be measured is measured by the optical power measuring device 100 in this embodiment, it is pre-determined which areas in the projection image 6 generated by the photoelectric device 5 to be measured need to be measured for optical power, and the size and shape of the area to be measured corresponding to each area to be measured are clarified, so as to select a reflector 1 with a specific size and shape of a reflecting surface to reflect the light emitted by the photoelectric device 5 to the area to be measured, ensuring that the photosensitive surface of the optical power meter 2 only receives the light signal reflected from the area to be measured, minimizing the light interference from other areas in the projection image 6, significantly improving the accuracy and reliability of the optical power measurement results, and realizing high-precision optical power measurement.

[0061] In addition, since it may be necessary to perform optical power tests on areas to be measured of different sizes and / or shapes when measuring the optical power of the optical machine 5 in different scenarios, compared with the related art of directly performing high-cost miniaturized customized modifications to the optical power meter 2, this embodiment customizes the size and / or shape of the reflecting surface on the reflector 1. It can flexibly adapt to the optical power measurement requirements in various complex situations without changing the structure of the optical power meter 2, greatly enhancing the adaptability and practicality of the system, and the cost of customizing the reflector 1 is much lower than that of customizing the optical power meter 2.

[0062] It's worth noting that when the reflective surface on the reflector 1 is parallel to the projection screen 6, if the distance between the plane on which the reflective surface lies and the plane on which the projection screen 6 lies is less than a preset value, the two planes can be considered the same plane. Therefore, the reflective surface should be customized to be identical in shape and size to the area to be measured, ensuring that the reflective surface only reflects light emitted by the photodetector 5 to the area to be measured. However, when the reflective surface on the reflector 1 is parallel to the projection screen 6, the center area of ​​the projection screen 6 (referring to the area covered when the photodetector 5 to be measured is projected onto the projection screen 6; in this embodiment, the line connecting the projection lens of the photodetector 5 to be measured and the geometric center of the projection screen 6 is perpendicular to the plane on which the projection screen 6 lies) generally cannot be used as the area to be measured. This is because when the reflector 1 is directly in front of this center area, light emitted from the photodetector 5 to be measured and irradiated to the center area will be reflected by the reflector 1 back to the photodetector 5 to be measured along its original path. This prevents the light from being received by the optical power meter 2, thus preventing effective optical power measurement.

[0063] In a feasible implementation manner, the photosensitive surface is configured such that, when receiving light transmitted by the reflective light path, the incident angle of the light is smaller than a preset angle.

[0064] Those skilled in the art will appreciate that the photosensitive surface of the optical power meter 2 responds differently to light incident at different angles. Generally speaking, when light is incident at a vertical angle (i.e., 0 degrees), the photosensitive material on the photosensitive surface absorbs photons most efficiently and converts them into electrical signals. As the angle of incidence deviates from the normal to the photosensitive surface, the effective absorption area of ​​the photosensitive material decreases relative to the actual area of ​​the incident light, resulting in a decrease in response efficiency and, in turn, a decrease in the optical power value measured by the optical power meter 2.

[0065] It should be noted that the preset angle is a pre-set angle used to ensure that the light transmitted by the reflected light path enters the photosensitive surface at a vertical or nearly vertical angle.

[0066] Exemplarily, the photosensitive surface is configured such that when receiving light transmitted by the reflected light path, the incident angle of the light is 0 degrees (that is, the light transmitted by the reflected light path is incident on the photosensitive surface at a vertical angle, or it can also be described as: the light transmitted by the reflected light path is perpendicular to the photosensitive surface).

[0067] This embodiment maximizes the light absorption efficiency of the photosensitive material by setting the photosensitive surface of the optical power meter 2 so that when receiving the light transmitted by the reflected light path, the incident angle of the light is less than the preset angle, so that the light transmitted by the reflected light path enters the photosensitive surface at a vertical or nearly vertical angle, thereby ensuring that the optical power meter 2 can accurately measure the energy of the incident light, thereby improving the accuracy of the optical power measurement and ensuring the accuracy of the optical power measurement results.

[0068] In one possible implementation, Figure 2 As shown, the optical power measuring device 100 further includes a reflector bracket 3 detachably connected to the reflector 1 , for fixing the reflector 1 to the area to be measured.

[0069] It should be noted that the reflector bracket 3 is a mechanical structure for fixing and supporting the reflector 1. It has an adjustable design and a detachable design. It is used to stably fix the reflector 1 in a specific position and adjust the angle of the reflector 1 as needed to ensure that the reflective surface on the reflector 1 can just reflect the light emitted by the light machine 5 to the area to be measured.

[0070] In this embodiment, the reflector 1 is mounted and fixed on the reflector bracket 3 through the detachable design of the reflector bracket 3, so that the position and angle of the reflector 1 can be changed by adjusting the reflector bracket 3, so that the reflective surface on the reflector 1 can just reflect the light emitted by the light machine 5 to the area to be measured.

[0071] In this embodiment, the reflector 1 is fixed by the reflector bracket 3, which can ensure that the reflector 1 remains stable during the entire measurement period and will not be easily displaced or tilted due to external interference (such as vibration, airflow, etc.), thereby maintaining the consistency of the optical path and the accuracy of the measurement data, reducing the risk of accidental falling or collision of the reflector 1 during operation, and extending the service life of the reflector 1.

[0072] In this embodiment, the detachable design of the reflector bracket 3 allows the user to quickly replace the appropriate reflector 1 based on the size and shape of the specific test area. This design also facilitates maintenance of the reflector 1. When the reflector 1 needs cleaning or is worn, it can be quickly removed from the reflector bracket 3 and processed, thereby reducing downtime and ensuring the accuracy of measurement results. This design also facilitates transportation and storage of the equipment, especially in multi-location use or mobile testing scenarios. The user can easily detach the reflector 1 from the reflector bracket 3, making it easier to carry and protecting the precision optical components from damage.

[0073] In this embodiment, the adjustable design of the reflector bracket 3 allows the user to accurately adjust the position and angle of the reflector 1 during actual application, ensuring that the reflective surface accurately reflects the light emitted by the optical machine 5 to the area to be measured, reducing light interference from other areas, thereby providing accuracy and reliability of optical power measurement.

[0074] For example, in a feasible embodiment, the reflector bracket 3 includes a reflector fixing member 31 detachably connected to the reflector 1 , and a reflector moving platform 32 movably connected to the reflector fixing member 31 ;

[0075] The reflector fixing member 31 is used to fix the reflector 1;

[0076] The reflector moving platform 32 is used to move the reflector fixing member 31 to fix the reflector 1 to the area to be measured.

[0077] It is understandable that after the reflector 1 is fixed to the area to be measured, the reflective surface and the area to be measured are closely matched.

[0078] It should be noted that, in this embodiment, the reflector bracket 3 mainly includes a reflector fixing part 31 and a reflector moving platform 32, wherein the reflector fixing part 31 is used to fix the reflector 1 to ensure that it will not shift or loosen during the optical power measurement process. The fixing method can be vacuum adsorption, magnetic adsorption, bolt fixing, etc. The reflector moving platform 32 is a device that can drive the reflector fixing part 31 and the reflector 1 thereon to move on a two-dimensional plane.

[0079] For ease of understanding, in one example, the reflector moving platform 32 can be a rectangular flat plate that generates a magnetic field at different positions through electromagnetism, and the reflector fixing part 31 can be a fixture made of a magnet. By controlling the position of the electromagnetism on the rectangular flat plate, the reflector fixing part 31 can be controlled to move in a plane on the reflector moving platform 32.

[0080] In another example, Figure 3 As shown, the reflector bracket 3 includes a reflector fixing member 31 and a reflector moving platform 32. The reflector fixing member 31 is used to fix the reflector 1. The reflector moving platform 32 can be a rectangular frame. Two sliding rods, one horizontal and one vertical, are provided in the frame. The reflector fixing member 31 is located at the intersection of the two sliding rods. On the basis of the plane coordinate system constructed based on the projection screen 6, the horizontal sliding rod can move in the plane along the vertical direction (i.e. Figure 3 The vertical slider can also slide along the horizontal direction (i.e. Figure 3 The mirror fixing member 31 slides along the x-axis direction of the plane coordinate system in the plane coordinate system, thereby changing the intersection position and driving the mirror fixing member 31 to move.

[0081] In this embodiment, the reflector bracket 3 includes a reflector fixing part 31 detachably connected to the reflector 1, and a reflector moving platform 32 movably connected to the reflector fixing part 31, wherein the reflector fixing part 31 can ensure that the reflector 1 remains firmly in a predetermined position during the measurement process, avoiding position displacement due to vibration or external interference, and ensuring the accuracy and consistency of the measurement results. The reflector moving platform 32 allows the reflector fixing part 31 and the reflector 1 thereon to move flexibly on a two-dimensional plane, so that the user can easily adjust the position of the reflector 1 to accurately align with the area to be measured, greatly improving the flexibility, accuracy and ease of operation of the optical power testing device.

[0082] In one possible implementation, please refer to Figure 1 and Figure 4 The optical power measurement device 100 further includes an optical power meter bracket 4 detachably connected to the optical power meter 2 , and the optical power meter bracket 4 is used to fix the optical power meter 2 to the reflected light path.

[0083] It should be noted that the optical power meter bracket 4 is a mechanical structure used to fix and support the optical power meter 2. It has an adjustable design and a detachable design. It is used to move the optical power meter 2 to the reflected light path and fix it, and adjust the angle of the optical power meter 2 as needed to ensure that the light transmitted by the reflected light path can be incident on the photosensitive surface of the optical power meter 2 at a vertical or nearly vertical angle.

[0084] In this embodiment, the optical power meter 2 is installed and fixed on the optical power meter bracket 4 through the detachable design of the optical power meter bracket 4, so that the position and angle of the optical power meter 2 can be changed by adjusting the optical power meter bracket 4, and the optical power meter 2 can be moved to the reflected light path and fixed, and it is ensured that the light transmitted by the reflected light path can be incident on the photosensitive surface of the optical power meter 2 at a vertical or nearly vertical angle.

[0085] In this embodiment, the optical power meter 2 is fixed by the optical power meter bracket 4, which can ensure that the optical power meter 2 remains stable during the entire measurement period and will not be easily displaced or tilted due to external interference (such as vibration, airflow, etc.), thereby maintaining the consistency of the optical path and the accuracy of the measurement data, reducing the risk of accidental falling or collision of the optical power meter 2 during operation, and extending the service life of the optical power meter 2.

[0086] In this embodiment, the detachable design of the optical power meter bracket 4 makes the maintenance of the optical power meter 2 easier. When the optical power meter 2 needs to be cleaned or is worn, it can be quickly removed from the optical power meter bracket 4 and processed, thereby reducing downtime and ensuring that the accuracy of the measurement results is not affected. In addition, this design also facilitates the transportation and storage of the equipment. Especially in multi-location use or mobile testing scenarios, the user can easily separate the optical power meter 2 from the optical power meter bracket 4, making it easier to carry and protect the optical power meter 2 from damage.

[0087] In this embodiment, the adjustable design of the optical power meter bracket 4 allows the user to accurately adjust the position and angle of the optical power meter 2 during actual application, so that the light transmitted by the reflected light path can be incident on the photosensitive surface of the optical power meter 2 at a vertical or nearly vertical angle, thereby maximizing the light absorption efficiency of the photosensitive material on the photosensitive surface, ensuring that the optical power meter 2 can accurately measure the energy of the incident light, thereby improving the accuracy of the optical power measurement and ensuring the accuracy of the optical power measurement results.

[0088] For example, in a feasible embodiment, the optical power meter bracket 4 includes an optical power meter fixing member 41 detachably connected to the optical power meter 2 , and an optical power meter moving platform 42 movably connected to the optical power meter fixing member 41 ;

[0089] The optical power meter fixing member 41 is used to fix the optical power meter 2;

[0090] The optical power meter moving platform 42 is used to move the optical power meter fixing member 41 to fix the optical power meter 2 on the reflected light path.

[0091] It should be noted that, in this embodiment, the optical power meter bracket 4 mainly includes an optical power meter fixing part 41 and an optical power meter moving platform 42, wherein the optical power meter fixing part 41 is used to fix the optical power meter 2 to ensure that it will not shift or loosen during the optical power measurement process. The fixing method can be vacuum adsorption, magnetic adsorption, bolt fixing, etc. The optical power meter moving platform 42 is a device that can drive the optical power meter fixing part 41 and the optical power meter 2 thereon to move on a two-dimensional plane, which is similar to the reflector moving platform 32 in the above embodiment and will not be repeated here.

[0092] In this embodiment, the optical power meter bracket 4 includes an optical power meter fixing part 41 detachably connected to the optical power meter 2, and an optical power meter moving platform 42 movably connected to the optical power meter fixing part 41, wherein the optical power meter fixing part 41 can ensure that the optical power meter 2 is firmly maintained in a predetermined position during the measurement process, avoiding position deviation due to vibration or external interference, and ensuring the accuracy and consistency of the measurement results. The optical power meter moving platform 42 allows the optical power meter fixing part 41 and the optical power meter 2 thereon to move flexibly in a two-dimensional plane, so that the user can easily adjust the position of the optical power meter 2 to accurately align with the reflected light path, greatly improving the flexibility, accuracy and ease of operation of the optical power testing device.

[0093] Furthermore, in a feasible embodiment, the optical power meter fixture 41 includes a rotating unit 411 for rotating the optical power meter 2 to set the photosensitive surface so that when receiving light transmitted by the reflected light path, the incident angle of the light is less than a preset angle.

[0094] It should be noted that the rotating unit 411 is a device for adjusting the angle of the optical power meter 2. It allows at least the pitch and yaw angles of the optical power meter 2 to be adjusted to change the orientation of the photosensitive surface on the detector (i.e., the test probe) to ensure that the light transmitted by the reflected light path (i.e., the reflected light) can be irradiated onto the photosensitive surface at an ideal incident angle (less than a preset angle), such as Figure 5 shown.

[0095] It is easy to understand that the rotating unit 411 has a locking mechanism so as to fix the optimal angle after finding it, so as to prevent the optical power meter 2 from shifting in angle due to factors such as vibration during the measurement process.

[0096] Exemplarily, the optical power meter fixture 41 includes a rotating unit 411 for rotating the optical power meter 2 so as to set the photosensitive surface so that when receiving the light transmitted by the reflected light path, the incident angle of the light is 0 degrees (that is, the light transmitted by the reflected light path is incident on the photosensitive surface at a vertical angle, or it can also be described as: the light transmitted by the reflected light path is perpendicular to the photosensitive surface).

[0097] This embodiment provides the ability to perform fine angle adjustment on the optical power meter 2 through the rotating unit 411, ensuring that the light transmitted by the reflected light path is incident on the photosensitive surface at a vertical or nearly vertical angle, thereby maximizing the light absorption efficiency and reducing measurement errors, ensuring the accuracy and reliability of the measurement results.

[0098] In addition, compared with the method of adjusting the angle of the optical power meter 2 by adjusting the entire optical power meter bracket 4, the rotating unit 411 significantly reduces the operation difficulty and time cost, so that even non-professionals can quickly get started and obtain accurate measurement results.

[0099] Based on the above first embodiment, an optical power measurement device according to a second embodiment of the present application is proposed.

[0100] In the second embodiment of the present application, for the same or similar contents as those in the above embodiments, please refer to the above introduction and will not be repeated hereafter.

[0101] In this embodiment, the optical power measurement device 100 further includes a central control unit (not shown) connected to the optical power meter 2. The central control unit is configured to:

[0102] Obtaining the optical power measurement value corresponding to the measured area and the size of the reflecting surface measured by the optical power meter 2;

[0103] The optical power density corresponding to the area to be measured is calculated based on the optical power measurement value and the size of the reflecting surface.

[0104] Those skilled in the art will appreciate that optical power density refers to the optical power received per unit area, typically expressed in watts per square meter or watts per square centimeter, and is used to reflect the concentration of light energy in a certain area. It is calculated by dividing the optical power by the area.

[0105] It should be noted that the central control unit refers to an electronic device or module with data acquisition, processing and control functions, which is usually composed of a processor, memory, input and output interfaces, etc., and can specifically be a microcontroller, system-level chip, field programmable gate array, etc.

[0106] In this embodiment, the central control unit is connected to the optical power meter 2 and is responsible for receiving measurement data, performing calculations according to a preset algorithm, and outputting results. It is a core component for realizing intelligent measurement.

[0107] In this embodiment, the central control unit can determine the area of ​​the reflecting surface based on the size of the reflecting surface, and then divide the optical power measurement value by the area of ​​the reflecting surface to calculate the corresponding optical power density to reflect the optical power distribution of the optical machine 5 to be measured in the measured area.

[0108] This embodiment realizes the automatic calculation and output of the original optical power measurement value to the optical power density by introducing a central control unit, thereby providing more precise and reference-worthy data, which helps to judge the luminous uniformity, focusing effect or whether there is a problem of local over-brightness / darkness of the light machine 5 to be measured at various positions.

[0109] In a feasible implementation manner, the light emitted by the light machine to be measured 5 is monochromatic light, and the central control unit is further used to:

[0110] Obtain the reflectivity of the pre-calibrated reflective surface to monochromatic light, and calculate the optical power density corresponding to the area to be measured based on the optical power measurement value, the size of the reflective surface, and the reflectivity.

[0111] Those skilled in the art will recognize that monochromatic light refers to electromagnetic waves with a single wavelength or frequency. In optics, it typically refers to light within a specific wavelength range. In practical applications, "monochromatic light" often refers to light with a near-single wavelength. Reflectivity refers to the ability of a material surface to reflect incident light. It is expressed as the ratio of the reflected light intensity to the incident light intensity, usually expressed as a percentage (%) or a decimal.

[0112] In this embodiment, when the light emitted by the optical machine 5 to be measured is monochromatic light, the reflectivity of the reflecting surface to this type of monochromatic light can be pre-calibrated, so that when calculating the light power density, the pre-calibrated reflectivity can be combined to compensate for the light power loss caused by the non-ideal nature of the reflecting surface, thereby improving the accuracy of the measurement results.

[0113] For example, when the optical machine 5 to be measured is a DLP 3D printing optical machine, and is actually a UV (Ultraviolet) monochrome DLP projection optical machine, the light it emits is monochromatic light such as ultraviolet light (also called ultraviolet light). At this time, when selecting the reflector 1, a reflector 1 coated with an anti-UV film on the reflective surface can be selected to improve the reflectivity of ultraviolet light, and the reflectivity of the reflective surface to ultraviolet light can be pre-calibrated, so that in actual applications, the loss of reflectivity can be compensated to provide accuracy in optical power measurement.

[0114] In a feasible embodiment, the reflector moving platform 32 is parallel to the projection screen 6, and the central control unit is connected to the reflector moving platform 32. The central control unit is further used to:

[0115] The coordinates to be measured corresponding to the area to be measured are determined, and according to the coordinates to be measured, the reflector moving platform 32 is controlled to move the reflector fixing member 31 until the reflector 1 is fixed to the area to be measured.

[0116] It is understandable that after the reflector 1 is fixed to the area to be measured, the reflective surface and the area to be measured are closely matched.

[0117] It should be noted that the coordinates to be measured refer to the two-dimensional coordinates of the geometric center of the area to be measured on the projection screen 6 .

[0118] In this embodiment, the geometric center of the projection screen 6 can be used as the origin, the horizontal direction of the projection screen 6 can be used as the X-axis, and the vertical direction of the projection screen 6 can be used as the Y-axis to establish a plane coordinate system of the projection screen 6. When the reflector moving platform 32 is parallel to the projection screen 6, the reflector moving platform 32 is controlled to move the reflector fixing part 31 according to the measured coordinates corresponding to the measured area in the plane coordinate system until the reflector 1 is fixed to the measured area, ensuring that the reflective surface on the reflector 1 can just reflect the light emitted by the measured light machine 5 to the measured area.

[0119] In a feasible embodiment, the reflector moving platform 32 is parallel to the optical power meter moving platform 42, and the central control unit is also connected to the optical power meter moving platform 42. The central control unit is further used to:

[0120] Determine a first straight-line distance between the optical machine to be measured 5 and the reflector moving platform 32 , and a second straight-line distance between the reflector moving platform 32 and the optical power meter moving platform 42 ;

[0121] Calculate the angle between the reflected light path and the reflector moving platform 32 according to the coordinates to be measured and the first straight-line distance;

[0122] Calculate the coordinates of the intersection between the reflected light path and the optical power meter moving platform 42 based on the light path angle and the second straight line distance;

[0123] According to the intersection coordinates, the optical power meter moving platform 42 is controlled to move the optical power meter fixing member 41 until the optical power meter 2 is fixed to the reflected light path.

[0124] It should be noted that the first straight-line distance refers to the straight-line distance between the optical machine to be measured 5 and the reflector movable platform 32, that is, the distance between the projection lens of the optical machine to be measured 5 and the plane on which the reflector movable platform 32 is located. The second straight-line distance refers to the straight-line distance between the reflector movable platform 32 and the optical power meter movable platform 42, that is, the distance between the plane on which the reflector movable platform 32 is located and the plane on which the optical power meter movable platform 42 is located. The first straight-line distance and the second straight-line distance can be measured by a camera device in actual application or can be pre-entered by the user.

[0125] It should also be noted that the optical path angle between the reflected light path and the reflector moving platform 32 refers to the angle between the axis of the reflected light path and the plane on which the reflector moving platform 32 is located, and the coordinates of the intersection between the reflected light path and the optical power meter moving platform 42 refer to the coordinates of the intersection between the axis of the reflected light path and the plane on which the optical power meter moving platform 42 is located.

[0126] In this embodiment, a spatial rectangular coordinate system can be established based on the plane coordinate system of the projection screen 6, with the optical path of the light emitted by the optical device 5 to be measured toward the geometric center of the projection screen 6 as the Z axis. Thus, when the plane where the reflector moving platform 32 is located, the plane where the reflective surface of the reflector 1 is located, and the plane where the projection screen 6 is located are parallel to each other, and the distances between these three planes are all less than a preset value, and these three planes can be considered to be the same plane, the three-dimensional coordinates corresponding to the geometric center of the reflective surface in the spatial rectangular coordinate system are determined based on the coordinates to be measured, and the three-dimensional coordinates corresponding to the projection lens of the optical device 5 to be measured in the spatial rectangular coordinate system are determined based on the first straight-line distance. For example, if the coordinates to be measured are (x, y), then the three-dimensional coordinates corresponding to the geometric center of the reflective surface are (x, y, 0), and if the first straight-line distance is z, then the three-dimensional coordinates corresponding to the projection lens are (0, 0, z). Based on these two three-dimensional coordinates and in combination with the principle of optical reflection, the optical path angle between the reflected light path and the reflector moving platform 32 is calculated.

[0127] Accordingly, when the plane where the reflector moving platform 32 is located, the plane where the optical power meter moving platform 42 is located, and the plane where the photosensitive surface of the optical power meter 2 is located are parallel to each other, and the distance between the plane where the optical power meter moving platform 42 is located and the plane where the optical power meter 2 is located is less than the preset value, the two planes can be regarded as the same plane. The Z-axis coordinate value corresponding to the plane where the optical power meter moving platform 42 is located in the spatial rectangular coordinate system is determined according to the second straight-line distance, and the coordinates of the intersection between the reflected light path and the optical power meter moving platform 42 are calculated in combination with the three-dimensional coordinates corresponding to the geometric center of the reflecting surface and the optical path angle between the reflected light path and the reflector moving platform 32.

[0128] In this embodiment, the central control unit can calculate the incident angle of the light emitted by the measured optical machine 5 to the measured position based on the measured coordinates and the first straight-line distance, and thus calculate the light path angle between the reflected light path and the reflector moving platform 32 through optical theorem, and combine with the second straight-line distance to calculate the intersection coordinates between the reflected light path and the optical power meter moving platform 42, and then control the optical power meter moving platform 42 to move the optical power meter fixing part 41 until the optical power meter 2 is fixed to the reflected light path, thereby realizing the movement of the optical power meter 2 to the emission light path without manual operation by the user.

[0129] Furthermore, in a feasible implementation manner, the central control unit is further connected to the rotation unit 411, and the central control unit is further configured to:

[0130] According to the angle of the optical path, the rotating unit 411 is controlled to rotate the optical power meter 2 until the incident angle of the light on the photosensitive surface is smaller than a preset angle when the light is received by the light transmitted by the reflected light path.

[0131] Exemplarily, the central control unit is further connected to the rotation unit 411, and the central control unit is used to:

[0132] According to the angle of the optical path, the rotating unit 411 is controlled to rotate the optical power meter 2 until the incident angle of the light is 0 degrees when the photosensitive surface receives the light transmitted by the reflected light path (that is, the light transmitted by the reflected light path is incident on the photosensitive surface at a vertical angle, or it can also be described as: the light transmitted by the reflected light path is perpendicular to the photosensitive surface).

[0133] In this embodiment, after calculating the optical path angle between the reflected light path and the reflector moving platform 32, the central control unit can calculate the optical path angle between the reflected light path and the optical power meter moving platform 42 through optical principles, and then adjust the angle of the optical power meter 2 through the rotation unit 411, so that when the light transmitted by the reflected light path enters the photosensitive surface, the incident angle is less than the preset angle, thereby realizing automatic adjustment of the angle of the optical power meter 2.

[0134] For ease of understanding, Figure 6 As shown, in a specific embodiment, when the reflective surface of the reflector, the plane on which the reflector moving platform is located, and the plane on which the projection screen is located can be considered to be in the same plane and parallel to the plane on which the optical power meter moving platform is located, for a light machine to be tested with a projection distance (i.e., the distance between the projection lens of the light machine to be tested and the plane on which the projection screen is located, equivalent to the first straight-line distance) of 140 mm and a projection screen size of 144 mm * 81 mm, a nine-point uniformity light power density test of the screen is performed, and the length and width are divided according to 1:2:2:1, and the intersection position is the nine-point position (i.e., the area to be tested).

[0135] Taking the geometric center of the projection screen as the coordinate origin (0, 0), for any point (x, y) on the projection screen, the incident angle θ (i.e., the optical path angle) of the corresponding light at the plane where the optical power meter moving platform is located after being reflected by the reflective surface of the reflector is:

[0136]

[0137] Where d is the photographic distance.

[0138] The angle component θ in the X direction X (i.e. yaw angle) can be calculated using the following formula:

[0139]

[0140] The angular component θ in the Y direction Y (i.e. pitch angle) can be calculated using the following formula:

[0141]

[0142] Through the above method, the coordinates of the nine points and the corresponding angle components of the incident angle of the light in the X and Y directions can be calculated, as shown in the following table:

[0143]

[0144] During the test, the reflective surface size of the reflector is 3 mm * 3 mm. The reflector is moved to each coordinate point in turn to reflect the light, and the optical power meter is moved to the propagation path of the reflected light (i.e., the reflected light path) in turn. The angle of the optical power meter is adjusted according to the X and Y angular components in the table above so that the light transmitted by the reflected light path is perpendicular to the photosensitive surface (i.e., the photosensitive surface is set so that when receiving the light transmitted by the reflected light path, the incident angle of the light is less than the preset angle). During the test, ensure that the spot size is smaller than the sensing surface size, that is, ensure that the reflective surface size is smaller than the sensing surface size. Read the optical power value corresponding to each point (i.e., the optical power measurement value corresponding to the area to be tested) and divide it by the reflective surface size to obtain the optical power density of that point (i.e., the optical power density corresponding to the area to be tested).

[0145] It should be noted that the above embodiments / implementations are only used to assist in understanding the present application and do not constitute a limitation on the optical power measurement device of the present application. More simple transformations based on this technical concept are all within the scope of protection of the present application.

[0146] The above description is only part of the embodiments of the present application and does not limit the patent scope of the present application. All equivalent structural transformations made by using the contents of the present application specification and drawings under the technical concept of the present application, or direct / indirect application in other related technical fields are included in the patent protection scope of the present application.

Claims

1. An optical power measurement device, characterized in that: The device includes a reflector moving platform, an optical power meter moving platform, a reflector and an optical power meter, wherein the reflector includes a reflective surface, and the optical power meter includes a photosensitive surface, and the size of the reflective surface is smaller than that of the photosensitive surface; The reflector is provided in the area to be measured, and is used to reflect the light emitted by the optical machine to be measured to the area to be measured through the reflective surface when the optical machine to be measured generates a projection image, and form a reflected light path, wherein the area to be measured is the area in the projection image where the optical power measurement is to be performed; The optical power meter is provided on the reflected light path, and is used to receive the light transmitted by the reflected light path through the photosensitive surface, and measure the optical power of the area to be measured based on the received light to obtain the optical power measurement value corresponding to the area to be measured; The reflector moving platform is used to move the reflector to fix the reflector to the area to be measured; The optical power meter moving platform is used to move the optical power meter so as to fix the optical power meter on the reflected light path.

2. The optical power measurement device according to claim 1, wherein: The photosensitive surface is configured such that, when receiving the light transmitted by the reflective light path, the incident angle of the light is smaller than a preset angle.

3. The optical power measuring device according to claim 2, wherein: The device further comprises a reflector bracket detachably connected to the reflector, and the reflector bracket comprises the reflector moving platform.

4. The optical power measurement device according to claim 3, wherein: The reflector bracket includes a reflector fixing piece detachably connected to the reflector, and a reflector moving platform movably connected to the reflector fixing piece; The reflector fixing member is used to fix the reflector; The reflector moving platform is used to move the reflector fixing member to fix the reflector to the area to be measured.

5. The optical power measurement device according to claim 4, wherein: The device further comprises an optical power meter bracket detachably connected to the optical power meter, and the optical power meter bracket comprises the optical power meter moving platform.

6. The optical power measurement device according to claim 5, wherein: The optical power meter bracket includes an optical power meter fixing piece detachably connected to the optical power meter, and an optical power meter moving platform movably connected to the optical power meter fixing piece; The optical power meter fixing member is used to fix the optical power meter; The optical power meter moving platform is used to move the optical power meter fixing part to fix the optical power meter on the reflected light path.

7. The optical power measurement device according to claim 6, wherein: The optical power meter fixing member includes a rotating unit for rotating the optical power meter to set the photosensitive surface so that when receiving the light transmitted by the reflective light path, the incident angle of the light is smaller than a preset angle.

8. The optical power measurement device according to claim 7, wherein: The device further includes a central control unit connected to the optical power meter, wherein the central control unit is configured to: Obtaining an optical power measurement value corresponding to the measured area and a size of the reflecting surface obtained by measuring the optical power meter; The optical power density corresponding to the area to be measured is calculated based on the optical power measurement value and the size of the reflecting surface.

9. The optical power measurement device according to claim 8, wherein: The light emitted by the light machine to be measured is monochromatic light, and the central control unit is further used for: The pre-calibrated reflectivity of the reflecting surface to the monochromatic light is obtained, and the optical power density corresponding to the area to be measured is calculated based on the optical power measurement value, the size of the reflecting surface and the reflectivity.

10. The optical power measurement device according to claim 9, wherein: The reflector moving platform is parallel to the projection screen, the central control unit is connected to the reflector moving platform, and the central control unit is further used to: The coordinates to be measured corresponding to the area to be measured are determined, and according to the coordinates to be measured, the reflector moving platform is controlled to move the reflector fixing member until the reflector is fixed to the area to be measured.

11. The optical power measuring device according to claim 10, wherein: The reflector moving platform is parallel to the optical power meter moving platform, the central control unit is also connected to the optical power meter moving platform, and the central control unit is further used to: Determining a first straight-line distance between the optical machine to be measured and the reflector moving platform, and a second straight-line distance between the reflector moving platform and the optical power meter moving platform; Calculating an angle between the reflected light path and the reflector moving platform according to the coordinates to be measured and the first straight-line distance; Calculating the coordinates of the intersection between the reflected light path and the optical power meter mobile platform according to the optical path angle and the second straight-line distance; According to the intersection coordinates, the optical power meter moving platform is controlled to move the optical power meter fixing member until the optical power meter is fixed to the reflected light path.

12. The optical power measurement device according to claim 11, wherein: The central control unit is also connected to the rotating unit, and is further used for: According to the optical path angle, the rotating unit is controlled to rotate the optical power meter until the incident angle of the light is less than a preset angle when the photosensitive surface receives the light transmitted by the reflective light path.

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