Test apparatus, method and electronic device

Abstract

The embodiment of the application provides a kind of test equipment, method and electronic equipment, it is related to electromagnetic technical field, can reduce EMC test cost.Test equipment includes: electromagnetic interference filter module;Adapter power supply end, adapter power supply end is used to be electrically connected to the input end of target adapter;Target noise separation module, target noise separation module is electrically connected to ground wire, target noise separation module is used to separate target noise of target frequency range and power supply to adapter power supply end based on the live wire signal and zero line signal output by electromagnetic interference filter module;Analog load, the input end of analog load is used to be electrically connected to the output end of target adapter;Current loop ware, the input end of analog load is electrically connected to ground wire by current loop ware;Measuring module, measuring module is used to obtain target noise source voltage and target noise source impedance according to the target noise separated by target noise separation module.

Description

Technical Field

[0001] This application relates to the field of electromagnetic technology, specifically to a testing device, method, and electronic device. Background Technology

[0002] To ensure product quality, electronic products must undergo electromagnetic compatibility (EMC) testing before leaving the factory. For example, conducted emission (CE) and radiated emission (RE) testing of power adapters for mobile phones and other electronic products during charging are important parts of EMC testing. Figure 1 As shown, conventional RE testing requires a semi-anechoic chamber and control room. The semi-anechoic chamber has metal shielded outer walls, an inner surface covered with absorbing material, and a turntable, test platform, and antenna lifting tower on the ground. The remaining ground surface is a metal reflective surface. CE testing also requires constructing a reflective ground and providing a certain degree of shielding. In other words, EMC testing needs to be conducted in the corresponding test scenario, which is costly. Summary of the Invention

[0003] In view of this, embodiments of this application provide a testing device, method, and electronic device that can reduce EMC testing costs.

[0004] In a first aspect, embodiments of this application provide a testing device, comprising: an electromagnetic interference filtering module electrically connected to a ground wire, used to filter out interference noise based on live wire signals and neutral wire signals; an adapter power supply terminal electrically connected to the input terminal of a target adapter; a target noise separation module electrically connected to a ground wire, used to separate target noise within a target frequency range based on the live wire signals and neutral wire signals output by the electromagnetic interference filtering module and supply power to the adapter power supply terminal; a simulated load, the input terminal of which is electrically connected to the output terminal of the target adapter; a current looper, the input terminal of which is electrically connected to a ground wire via the current looper; and a measurement module used to obtain the target noise source voltage and target noise source impedance based on the target noise separated by the target noise separation module.

[0005] The electromagnetic interference filtering module filters out interference noise to provide power to the target adapter after interference removal. A current looper provides the target noise generated during adapter operation to the target noise separation module, which separates the target noise. A measurement module then obtains the target noise source voltage and impedance based on this noise. These are the key measurement parameters for EMC testing, facilitating EMC testing in conjunction with other simulation-derived parameters. This testing method eliminates the need for a costly testing environment, thus reducing EMC testing costs. By obtaining the target noise source voltage and impedance through testing, equivalent EMC test results can be obtained by combining them with simulation results. Compared to testing in a real anechoic chamber, this method improves testing effectiveness. It eliminates the need for building or renting laboratory space, rotation scanning, and personnel entering and exiting the EMC anechoic chamber to set up the testing system. It offers high testing efficiency, and the smaller size of the testing equipment, using an unshielded design, eliminates the need for a shielded environment. It can be deployed in the adapter production line environment, facilitating adapter placement and improving the flexibility and portability of EMC testing.

[0006] In some possible implementations, the electromagnetic interference filtering module includes: a first electromagnetic interference filter electrically connected to ground, used to filter out interference noise in a first frequency range based on the input live and neutral signals; a second electromagnetic interference filter used to filter out interference noise in a second frequency range based on the input live and neutral signals, wherein the lowest value of the first frequency range is greater than or equal to the highest value of the second frequency range; the target noise separation module includes: a first line impedance stabilization network electrically connected to ground, used to separate a first target noise and a second target noise based on the live and neutral signals output by the first electromagnetic interference filter, wherein the first target noise is live target noise in a third frequency range, and the second target noise is neutral target noise in a third frequency range, the third frequency range being part of the first frequency range; and a second line impedance stabilization network electrically connected to ground, used to separate a third target noise and a second target noise based on the live and neutral signals output by the second electromagnetic interference filter. The fourth target noise, the third target noise is the live wire target noise in the fourth frequency range, and the fourth target noise is the neutral wire target noise in the fourth frequency range, which belongs to the second frequency range; the test equipment also includes: a bypass, which is used to switch between the first state and the second state; in the first state, the bypass is used to connect the power supply output terminal of the first line impedance stabilization network to the power supply terminal of the adapter, and disconnect the power supply output terminal of the second line impedance stabilization network from the power supply terminal of the adapter, and the power supply output terminal is used to output the live wire signal and the neutral wire signal; in the second state, the bypass is used to connect the power supply output terminal of the second line impedance stabilization network to the power supply terminal of the adapter, and disconnect the power supply output terminal of the first line impedance stabilization network from the power supply terminal of the adapter; the measurement module includes: a spectrum analyzer, used to measure the voltage of the target noise source; a vector network analyzer, used to measure the impedance of the target noise source; a multiplexer, which is used in the first state to transmit the first target noise and the second target noise to the spectrum analyzer and the vector network analyzer in a time-division manner, and in the second state to transmit the third target noise and the fourth target noise to the spectrum analyzer and the vector network analyzer in a time-division manner.

[0007] The EMC testing of a power adapter can be divided into two parts based on the test frequency ranges of RE and CE. The test frequency range for CE is [150KHz, 30MHz], and the test frequency range for RE is [30MHz, 1000MHz]. In reality, the RE risk frequency points caused by power adapter noise are distributed in [30MHz, 300MHz]. Therefore, the target noise source voltage and target noise source impedance within the [150KHz, 30MHz] frequency range can be obtained using the test equipment in this embodiment to facilitate RE testing; similarly, the target noise source voltage and target noise source impedance within the [30MHz, 300MHz] frequency range can be obtained using the test equipment in this embodiment to facilitate CE testing.

[0008] In some possible implementations, the test equipment further includes: a voltage regulator, used to regulate the voltage based on the input live and neutral signals, and outputting the regulated live and neutral signals to a first electromagnetic interference filter; a second electromagnetic interference filter specifically used to filter out interference noise in a second frequency range based on the live and neutral signals output by the first electromagnetic interference filter; the first and third frequency ranges are both [30MHz, 300MHz], and the second and fourth frequency ranges are both [150KHz, 30MHz]. The voltage regulator can be used to adjust the mains voltage from an external source and display the output voltage, and can switch between power supply standards such as CE / CCC / FCC.

[0009] In some possible implementations, the test equipment further includes: a socket panel with a plug portion for connecting the input terminal of a target adapter, the plug portion having an adapter power supply terminal; a crown spring contact disposed around the socket panel, the crown spring contact being electrically connected to a ground wire, the crown spring contact having a contact hole; a current looper including: a lifting platform located above the socket panel, the bottom of the lifting platform having a USB male connector electrically connected to a charging cable, the charging cable being electrically connected to a simulated load; a metal post fixedly disposed on the lifting platform; the current looper including a first current loop capacitor and a second current loop capacitor, the first end of the first current loop capacitor being electrically connected to the power supply terminal of the USB male connector, the second end of the first current loop capacitor being electrically connected to the metal post, the first end of the second current loop capacitor being electrically connected to the ground terminal of the USB male connector, the second end of the second current loop capacitor being electrically connected to the metal post; the metal post being inserted into the contact hole of the crown spring contact; the test equipment further includes: a lifting device for driving the lifting platform to perform a lifting function relative to the socket panel.

[0010] Because the input terminal of the simulated load is electrically connected to the power supply terminal VBUS and the ground terminal VGND of the USB male connector, and the power supply terminal VBUS and the ground terminal VGND of the USB male connector are electrically connected to the metal post through the first current loop capacitor and the second current loop capacitor, respectively, and the metal post is electrically connected to the ground wire through the crown spring contact, the input terminal of the simulated load is electrically connected to the ground wire G through the USB male connector, the first current loop capacitor, the second current loop capacitor, the metal post, and the crown spring contact to achieve a compact and short-path noise current loop, reducing the impact of loop inductance on the high-frequency current test results. After the USB male connector is plugged into the target adapter, the target adapter can be made to work for testing to obtain the target noise source voltage and the target noise source impedance. After the test of the current target adapter is completed, the lifting platform can be raised by the lifting device, so that the USB male connector is unplugged from the output terminal of the target adapter. Then the target adapter can be removed from the socket panel, and the next target adapter to be tested can be replaced. The replaced target adapter is plugged into the socket panel, and the test process is repeated to test the replaced target adapter. It is evident that the combination of the lifting platform and the lifting device makes it easier to test a large number of adapters.

[0011] In some possible implementations, the testing equipment further includes: a first circuit board detachably connected to a lifting platform, a USB male connector fixed to the first circuit board, the lifting platform being a metal platform, the second terminals of a first current loop capacitor and a second current loop capacitor being electrically connected to the lifting platform through a grounding portion on the first circuit board, and the lifting platform being connected to a metal post; a second circuit board disposed on the lifting platform, the second circuit board having a USB female connector electrically connected to a charging cable; and a connector, the first and second circuit boards being electrically connected via a connector. When testing different target adapters, the position of the USB connector can be easily changed to match the target adapter by disassembling the first circuit board on the lifting platform.

[0012] In some possible implementations, the test equipment further includes: a third circuit board on which a bypass, a first line impedance stabilizing network, and a second line impedance stabilizing network are mounted; a fourth circuit board on which a multiplexer, a first electromagnetic interference filter, and a second electromagnetic interference filter are mounted; a controller mounted on the fourth circuit board for controlling the multiplexer and the lifting device; and a metal shielding cover, forming an accommodating space with the third circuit board, within which the bypass, the first line impedance stabilizing network, and the second line impedance stabilizing network are located. The metal shielding cover can reduce interference to the first and second line impedance stabilizing networks, enabling them to output cleaner power signals for testing of the target adapter. Furthermore, in conjunction with the third and fourth circuit boards, it provides a compact design that balances space utilization and cost.

[0013] In some possible implementations, the first line impedance stabilization network includes: a first neutral input terminal and a first neutral output terminal; a first neutral inductor electrically connected between the first neutral input terminal and the first neutral output terminal, wherein the first neutral inductor is an air-core coil inductor, the side of the first neutral inductor near the first neutral input terminal is a first cylindrical coil, the side of the first neutral inductor near the first neutral output terminal is a first conical transition coil, and the conical end of the first conical transition coil is electrically connected to the first neutral output terminal; a first live wire input terminal and a first live wire output terminal, wherein the first neutral output terminal and the first live wire output terminal are power supply output terminals of the first line impedance stabilization network; and a first live wire inductor electrically connected between the first live wire input terminal and the first live wire output terminal, wherein the first live wire inductor is an air-core coil inductor, the side of the first live wire inductor near the first live wire input terminal is a second cylindrical coil, the side of the first live wire inductor near the first live wire output terminal is a second conical transition coil, and the conical end of the second conical transition coil is electrically connected to the first live output terminal. The tapered transition structure of the inductor is used to reduce the impact of inductor parasitic parameters on the high-frequency band, so as to realize the first line impedance stabilization network in the operating frequency range of [30MHz, 300MHz].

[0014] In some possible implementations, the first line impedance stabilization network further includes: a first ferrite rod at least partially inserted into the first cylindrical coil, the depth of insertion of the first ferrite rod into the first cylindrical coil being adjustable; a first neutral input terminal electrically connected to ground via a first capacitor; a first neutral output terminal electrically connected to a first neutral noise terminal via a second capacitor; the first neutral noise terminal electrically connected to ground via a first resistor, and the first neutral noise terminal electrically connected to a multiplexer via a corresponding first neutral noise RF port; a second ferrite rod at least partially inserted into the second cylindrical coil, the depth of insertion of the second ferrite rod into the second cylindrical coil being adjustable; a first live wire input terminal electrically connected to ground via a third capacitor; a first live wire output terminal electrically connected to the first live wire noise terminal via a fourth capacitor; the first live wire noise terminal electrically connected to ground via a second resistor, and the first live wire noise terminal electrically connected to the multiplexer via a corresponding first live wire noise RF port. The magnetic rod is inserted into the inductor coil to increase the inductance value in the low-frequency range. This helps to avoid the input impedance of the target noise signal being too small due to the inductance value. The insertion depth is adjustable, and it can be adjusted to the optimal matching position before testing to improve test reliability.

[0015] In some possible implementations, the power supply output terminals of the second line impedance stabilization network include a second neutral output terminal and a second live output terminal; the bypass includes a first bypass unit and a second bypass unit, and the adapter power supply terminals include a neutral power supply terminal and a live power supply terminal; the first input terminal of the first bypass unit is electrically connected to the first neutral output terminal, the second input terminal of the first bypass unit is electrically connected to the second neutral output terminal, and the output terminal of the first bypass unit is electrically connected to the neutral power supply terminal; the first input terminal of the second bypass unit is electrically connected to the first live output terminal, and the second terminal of the second bypass unit is electrically connected to the second live output terminal. The output terminals of the two bypass units are electrically connected to the live wire power supply terminal. In the first state, the first input terminal and the output terminal of the first bypass unit are connected, while the second input terminal and the output terminal of the first bypass unit are disconnected. In the second state, the first input terminal and the output terminal of the first bypass unit are disconnected, while the second input terminal and the output terminal of the first bypass unit are connected. In the second state, the first input terminal and the output terminal of the second bypass unit are connected, while the first input terminal and the output terminal of the second bypass unit are disconnected.

[0016] In some possible implementations, the second line impedance stabilization network includes: a second neutral line input terminal; a second neutral line inductor electrically connected between the second neutral line input terminal and the second neutral line output terminal, the second neutral line inductor being an air-core coil inductor or a cylindrical coil; a third magnetic rod at least partially inserted into the second neutral line inductor, the insertion depth of the third magnetic rod into the second neutral line inductor being adjustable; the second neutral line input terminal being electrically connected to ground via a fifth capacitor; the second neutral line output terminal being electrically connected to a second neutral line noise terminal via a sixth capacitor; the second neutral line noise terminal being electrically connected to ground via a third resistor, and the second neutral line noise terminal being connected to ground via a corresponding second neutral line noise... The acoustic RF port is electrically connected to the multiplexer; a second live wire input terminal; a second live wire inductor electrically connected between the second live wire input terminal and the second live wire output terminal, the second live wire inductor being an air-core coil inductor and a cylindrical coil; a fourth ferrite rod at least partially inserted into the second live wire inductor, the depth of insertion of the fourth ferrite rod into the second live wire inductor being adjustable; the second live wire input terminal is electrically connected to the ground wire through a seventh capacitor; the second live wire output terminal is electrically connected to the second live wire noise terminal through an eighth capacitor; the second live wire noise terminal is electrically connected to the ground wire through a fourth resistor, and the second live wire noise terminal is electrically connected to the multiplexer through a corresponding second live wire noise RF port.

[0017] Secondly, embodiments of this application provide an electromagnetic compatibility testing method, comprising: obtaining the target noise source voltage and the target noise source impedance through the aforementioned testing equipment; obtaining cable radiation test results through cable radiation model simulation; obtaining environmental test results through test environment model simulation; and obtaining electromagnetic compatibility test results based on the target noise source voltage, the target noise source impedance, the cable radiation test results, and the environmental test results.

[0018] Thirdly, embodiments of this application provide an electronic device, including: a processor and a memory, wherein the memory is used to store at least one instruction, and when the instruction is loaded and executed by the processor, the electronic device performs the above-described electromagnetic compatibility test method.

[0019] Fourthly, embodiments of this application also provide a computer-readable storage medium, the computer-readable storage medium including a stored program, wherein the program, when executed by a processor, implements the electromagnetic compatibility testing method as described in the above embodiments.

[0020] Fifthly, embodiments of this application also provide a computer program product, the program product including a program that, when run by an electronic device, causes the electronic device to implement the electromagnetic compatibility testing method as described in the above embodiments.

[0021] Sixthly, embodiments of this application also provide a chip system, including: a communication interface for inputting and / or outputting data; and a processor for executing a computer-executable program, causing a device equipped with the chip system to perform the electromagnetic compatibility testing method as described in the above embodiments. Attached Figure Description

[0022] To more clearly illustrate the technical solutions of the embodiments of this application, the drawings used in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0023] Figure 1 This is a schematic diagram of an EMC anechoic chamber environment in the prior art;

[0024] Figure 2 This is a schematic diagram of an EMC testing principle in an embodiment of this application;

[0025] Figure 3 for Figure 2 The corresponding diagrams of the three models and their corresponding EMC anechoic chamber environments;

[0026] Figure 4 This is a structural block diagram of a testing device according to an embodiment of this application;

[0027] Figure 5 This is a schematic diagram of the structure of a testing device according to an embodiment of this application;

[0028] Figure 6 for Figure 5 Top view of the middle section of the structure;

[0029] Figure 7 This is a schematic diagram of the structure of a first line impedance stabilization network in an example of this application;

[0030] Figure 8 This is a schematic diagram of the structure of a second line impedance stabilization network in an embodiment of this application;

[0031] Figure 9 This is a flowchart illustrating an electromagnetic compatibility testing method according to an embodiment of this application;

[0032] Figure 10 This is a structural block diagram of an electronic device according to an embodiment of this application. Detailed Implementation

[0033] To better understand the technical solution of this application, the embodiments of this application will be described in detail below with reference to the accompanying drawings.

[0034] It should be understood that the described embodiments are merely some, not all, of the embodiments in this application. All other embodiments obtained by those skilled in the art based on the embodiments in this application without inventive effort are within the scope of protection of this application.

[0035] The terminology used in the embodiments of this application is for the purpose of describing particular embodiments only and is not intended to be limiting of this application. The singular forms “a,” “the,” and “the” used in the embodiments of this application and the appended claims are also intended to include the plural forms unless the context clearly indicates otherwise.

[0036] It should be understood that the term "and / or" used in this article is merely a description of the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A existing alone, A and B existing simultaneously, or B existing alone. Additionally, the character " / " in this article generally indicates that the preceding and following related objects have an "or" relationship.

[0037] In this embodiment of the application, based on the principle of EMC testing, the radiation process of the power adapter can be divided into three models, such as... Figure 2 and Figure 3 As shown, the model includes a power adapter model, a cable radiation model, and a test environment model. Taking the RE test of a mobile phone power adapter as an example, the influencing factors of the power adapter model include the target noise source voltage and the target noise source impedance. Here, Us(f) represents the magnitude of the noise source voltage at each frequency, and Zs(f) represents the impedance of the noise source at each frequency, composed of the real impedance Rs(f) and the imaginary impedance jXs(f). The cable radiation model involves radiators that can include all possible radiators such as data cables, mobile phones, power strips, and power cords. Influencing factors include the cable and the placement of the mobile phone. The cable radiation model can be expressed using an ABCD matrix model, which can handle the input impedance of cable radiation and the maximum gain in a certain direction. The reason for using the ABCD matrix is ​​that it can be easily cascaded with other subsequent models. The test environment model can be a semi-anechoic chamber propagation model. This model is determined by the anechoic chamber environment. In the RE test, the ground reflection path and the direct path are superimposed at the test antenna, further weighting the noise spectrum. The three models are cascaded together, and the test results of the three models, along with the test results that can achieve equivalent RE testing, are used. Specifically, for the cable radiation model and the test environment model, the corresponding test results can be obtained based on electromagnetic simulation. For the power adapter model, the target noise, including the target noise source voltage and the target noise source impedance, can be obtained based on actual testing of the power adapter.

[0038] like Figure 4As shown in the illustration, this application provides a testing device for testing a power adapter to obtain target noise, specifically the target noise source voltage and impedance. The testing device includes an Electromagnetic Interference (EMI) filter module 1, electrically connected to ground (G). The EMI filter module 1 filters out interference noise based on the live wire (N) signal and the neutral wire (L) signal. It should be noted that the interference noise here differs from the target noise. Interference noise refers to external interference signals originating from the power supply signal input to the EMI filter module 1, while target noise refers to the noise of the target adapter under test, originating from the subsequent target adapter. The EMI filter module 1 filters out external interference noise while providing external power to other test devices, thereby reducing the adverse effects of external interference noise on the test. The testing device also includes an adapter power supply terminal 2, electrically connected to the input terminal of the target adapter 3, i.e., the adapter power supply terminal 2 supplies power to the target adapter 3. The target noise separation module 4 is electrically connected to the ground wire G. It separates target noise within the target frequency range based on the live wire (N) and neutral wire (L) signals output by the electromagnetic interference filtering module 1 and supplies power to the adapter power supply terminal 2. The target noise refers to the noise of the target adapter 3. This noise flows back to the target noise separation module 4 through the current loop of the ground wire G, allowing the module to separate the target noise. Furthermore, the target noise separation module 4 also supplies power to the adapter power supply terminal 2 based on the neutral wire (N) and live wire (L) signals output by the electromagnetic interference filtering module 1, ensuring that the power input signal of the target adapter 3 is a filtered signal. The test equipment also includes a simulated load 5. The input terminal of the simulated load 5 is electrically connected to the output terminal of the target adapter 3. The simulated load 5 can be, for example, a programmable fast-charging protocol electronic load, meaning it can simulate loads of different specifications and protocols to allow the target adapter 3 to operate in the required test mode. The target adapter 3 converts the input AC power to DC power and provides the converted DC power output to the simulated load 5. The test equipment also includes a current looper 6. The input terminal of the simulated load 5 is electrically connected to the ground wire G through the current looper 6. The current looper 6 is used to provide a target noise current loop on the ground wire G so that when the target adapter 3 is working, the target noise generated can be separated by the target noise separation module 4 through the loop on the ground wire G. The test equipment also includes a measurement module 7, which is used to obtain the target noise source voltage and the target noise source impedance based on the target noise separated by the target noise separation module 4.

[0039] The test equipment in this embodiment can filter out interference noise through an electromagnetic interference filtering module to provide power to the target adapter after interference removal. A current looper can provide the target noise generated during the operation of the target adapter to a target noise separation module, which separates the target noise. A measurement module then obtains the target noise source voltage and impedance based on the target noise. The target noise source voltage and impedance are key measurement parameters for EMC testing, facilitating EMC testing in conjunction with other simulation-derived measurement parameters. This testing method eliminates the need for a costly testing environment, thus reducing EMC testing costs. Obtaining the target noise source voltage and impedance through testing allows for equivalent EMC test results to be obtained in conjunction with simulation results. Compared to testing in a real anechoic chamber, this improves testing effectiveness. It eliminates the need for building or renting laboratory space, rotation scanning, and personnel entering and exiting the EMC anechoic chamber to set up the test system. The testing efficiency is high, and the test equipment is small in size, employing an unshielded design that eliminates the need for a shielded environment. It can be deployed in the adapter production line environment, facilitating adapter placement and improving the flexibility and portability of EMC testing.

[0040] In some embodiments, the electromagnetic interference filtering module 1 includes: a first electromagnetic interference filter 11, electrically connected to ground G, used to filter out interference noise in a first frequency range [30MHz, 300MHz] based on the input live wire N signal and neutral wire L signal; it should be noted that [30MHz, 300MHz] is only a specific example of the first frequency range; and a second electromagnetic interference filter 12, used to filter out interference noise in a second frequency range [150KHz, 30MHz] based on the input live wire N signal and neutral wire L signal; it should be noted that [150KHz, 30MHz] is only a specific example of the second frequency range, and the lowest value of the first frequency range is greater than or equal to the highest value of the second frequency range. Figure 4In the illustrated structure, the live (N) and neutral (L) signals input to the second electromagnetic interference (EMI) filter 12 originate from the output of the first EMI filter 11. It is understood that in other possible implementations, the live (N) and neutral (L) signals input to the second EMI filter 12 may also be provided by other devices. The first EMI filter 11 and the second EMI filter 12 are used to filter out interference noise from the input signal in different frequency ranges to cooperate with the target noise separation module 4 in acquiring target noise in different frequency ranges. The target noise separation module 4 includes: a first line impedance stabilization network. Network (LISN) 41, the first line impedance stabilization network 41 is electrically connected to ground G. The first line impedance stabilization network 41 is used to separate the first target noise and the second target noise based on the live wire N signal and the neutral wire L signal output by the first electromagnetic interference filter 11. The first target noise is the live wire N target noise in the third frequency range [30MHz, 300MHz], and the second target noise is the neutral wire L target noise in the third frequency range [30MHz, 300MHz]. It should be noted that [30MHz, 300MHz] is only a specific example of the third frequency range. The third frequency range belongs to the first frequency range. In the specific example, the first frequency range is equal to the third frequency range. The second line impedance stabilization network 42 is electrically connected to the ground wire G. The second line impedance stabilization network 42 is used to separate the third target noise and the fourth target noise based on the live wire N signal and the neutral wire L signal output by the second electromagnetic interference filter 12. The third target noise is the live wire N target noise in the fourth frequency range [150KHz, 30MHz], and the fourth target noise is the neutral wire L target noise in the fourth frequency range [150KHz, 30MHz]. It should be noted that [150KHz, 30MHz] is only a specific example of the fourth frequency range. The fourth frequency range belongs to the second frequency range. In the specific example, the fourth frequency range is equal to the second frequency range. The test equipment also includes a bypass 8, which is used to switch between a first state and a second state. In the first state, the bypass 8 is used to connect the power supply output terminal of the first line impedance stabilization network 41 to the power supply terminal 2 of the adapter, and to disconnect the power supply output terminal of the second line impedance stabilization network 42 from the power supply terminal 2 of the adapter. The power supply output terminal is used to output the live wire N signal and the neutral wire L signal. In the second state, the bypass 8 is used to connect the power supply output terminal of the second line impedance stabilization network 42 to the power supply terminal 2 of the adapter, and to disconnect the power supply output terminal of the first line impedance stabilization network 41 from the power supply terminal 2 of the adapter.In other words, bypass 8 is used to bypass the other when testing is performed using either the first line impedance stabilization network 41 or the second line impedance stabilization network 42. For example, it provides a 50Ω dummy load to avoid test errors caused by inductive series and capacitive parallel connections in the other network. Measurement module 7 includes: a spectrum analyzer 71 for measuring the target noise source voltage; a vector network analyzer 72 for measuring the target noise source impedance; and a multiplexer 73, which, in a first state, transmits the first and second target noises to the spectrum analyzer 71 and the vector network analyzer 72 in a time-division multiplexing manner. Multiplexer 73 is also used in a second state to transmit the third and fourth target noises to the spectrum analyzer 71 and the vector network analyzer 72 in a time-division multiplexing manner. Switching between states can be achieved using a high-frequency relay. The ports of bypass 8 connected to the spectrum analyzer 71 and the vector network analyzer 72 can be equipped with radio frequency limiters.

[0041] Specifically, the first electromagnetic interference filter 11 and the second electromagnetic interference filter 12 may include multi-stage differential-mode filters and common-mode filters. The first electromagnetic interference filter 11 and the second electromagnetic interference filter 12 are used to filter out external interference signals in different frequency ranges, so as to avoid the adverse effects of external interference signals on the test results. The target adapter 3 operates at different times to achieve testing of different parameters. For example, when bypass 8 is operating in the first state, the first line impedance stabilization network 41 provides the target adapter 3 with the live wire N signal and neutral wire L signal after filtering out interference noise in the [30MHz, 300MHz] frequency range, and separates the live wire N target noise and neutral wire L target noise in the [30MHz, 300MHz] frequency range. The live wire N target noise and neutral wire L target noise are then output to the spectrum analyzer 71 in a time-division manner, and also output to the vector network analyzer 72 in a time-division manner. The spectrum analyzer 71 obtains the target noise source voltage of the live wire N and neutral wire L in the [30MHz, 300MHz] frequency range, and the vector network analyzer 72 obtains the target noise source impedance of the live wire N and neutral wire L in the [30MHz, 300MHz] frequency range. When the bypass 8 is operating in the second state, the second line impedance stabilization network 42 provides the target adapter 3 with the live wire N signal and the neutral wire L signal after filtering out interference noise in the frequency range of [150KHz, 30MHz]. The target noise of live wire N and neutral wire L in the frequency range of [150KHz, 30MHz] are separated respectively, and the target noise of live wire N and neutral wire L are output to the spectrum analyzer 71 in a time-division manner. The target noise of live wire N and neutral wire L in the frequency range of [150KHz, 30MHz] are output to the vector network analyzer 72 in a time-division manner. The target noise source voltage of live wire N and neutral wire L in the frequency range of [150KHz, 30MHz] is obtained by the spectrum analyzer 71, and the target noise source impedance of live wire N and neutral wire L in the frequency range of [150KHz, 30MHz] is obtained by the vector network analyzer 72.

[0042] The EMC testing of a power adapter can be divided into two parts based on the test frequency ranges of RE and CE. The test frequency range for CE is [150KHz, 30MHz], and the test frequency range for RE is [30MHz, 1000MHz]. In reality, the RE risk frequency points caused by power adapter noise are distributed in [30MHz, 300MHz]. Therefore, the target noise source voltage and target noise source impedance within the [150KHz, 30MHz] frequency range can be obtained using the test equipment in this embodiment to facilitate RE testing; similarly, the target noise source voltage and target noise source impedance within the [30MHz, 300MHz] frequency range can be obtained using the test equipment in this embodiment to facilitate CE testing.

[0043] In some embodiments, the test equipment further includes: a voltage regulator 9, which is used to regulate the voltage based on the input live wire N signal and neutral wire L signal, and output the regulated live wire N signal and neutral wire L signal to a first electromagnetic interference filter 11; a second electromagnetic interference filter 12 is specifically used to filter out interference noise in a second frequency range based on the live wire N signal and neutral wire L signal output by the first electromagnetic interference filter 11. The first frequency range and the third frequency range are both [30MHz, 300MHz], and the second frequency range and the fourth frequency range are both [150KHz, 30MHz].

[0044] Specifically, the voltage regulator 9 can be a digital display single-phase voltage regulator with an autotransformer structure. It can be used to regulate the mains voltage from the outside and display the output voltage. It can switch between power supply standards such as CE / CCC / FCC.

[0045] In some embodiments, such as Figure 4 and Figure 5 As shown, the testing equipment also includes: a socket panel 100, which has a plug portion for connecting the input terminal of the target adapter 3, and the plug portion has the aforementioned adapter power supply terminal 2. Figure 5 (Not shown in the image); a crown spring contact 200 is disposed around the socket panel 100, and the crown spring contact 200 is electrically connected to the ground wire G ( Figure 5 (Not shown in the image), the crown spring contact 200 is provided with a spring contact hole; the current looper 6 includes: a lifting platform 300 located above the socket panel 100, the bottom of the lifting platform 300 is provided with a USB male connector 301, the USB male connector 301 is electrically connected to the charging cable 302, and the charging cable 302 is electrically connected to the analog load 5 ( Figure 5 (Not shown in the image). A metal column 303 is fixedly installed on the lifting platform 300, and the current looper 6 includes a first current loop capacitor C61 ( Figure 5 (not shown in the image) and the second current loop capacitor C62 ( Figure 5(Not shown in the image), the first end of the first current loop capacitor C61 is electrically connected to the power supply terminal VBUS of the USB male connector 301, and the second end of the first current loop capacitor C61 is electrically connected to the metal post 303. The first end of the second current loop capacitor C62 is electrically connected to the ground terminal VGND of the USB male connector 301, and the second end of the second current loop capacitor C62 is electrically connected to the metal post 303. The metal post 303 is electrically connected to the ground wire G. The input of the target adapter 3 is an AC signal, and the output is a DC signal. The target adapter 3 outputs a DC signal through the power supply terminal VBUS and the ground terminal VGND. The metal post 303 is inserted into the spring hole of the crown spring contact 200. During the lifting process of the lifting platform 300 relative to the socket panel 100, the metal post 303 can maintain good contact with the crown spring contact 200, so that the power supply terminal VBUS and the ground terminal VGND on one side of the lifting platform 300 are electrically connected to the ground wire G on the side of the socket panel 100 through the first current loop capacitor C61 and the second current loop capacitor C62. Figure 5 and Figure 6 As shown, the testing equipment also includes a lifting device 400, which drives the lifting platform 300 to perform a lifting function relative to the socket panel 100. The lifting device 400 may include, for example, a stepper motor 401, a screw 402, a bolt 403, and a fixing bracket 404. There may be multiple sets of stepper motors 401, screws 402, bolts 403, and fixing brackets 404. Figure 6The four sets shown are: fixed brackets 404 for fixing bolts 403 and lifting platform 300; multiple fixed brackets 404 can be evenly distributed around the lifting platform 300 to achieve stable support. Screws 402 are threadedly connected to bolts 403. The bottom of the screw 402 is connected to a stepper motor 401, which controls the rotation of the screw 402. The rotation of the screw 402, in conjunction with the bolts 403 and fixed brackets 404, enables the lifting function of the lifting platform 300. The lifting platform 300 enables more efficient batch testing of target adapters 3. With the platform 300 raised, the target adapter 3 is plugged into the socket panel 100, connecting its input to the adapter power supply terminal 2 on the socket panel 100. Then, the lifting device 400 controls the platform 300 to descend, connecting the USB male connector 301 at the bottom of the platform 300 to the output of the target adapter 3. The output of the target adapter 3 can be electrically connected to the analog load 5 via the USB male connector 301 and charging cable 302. Furthermore, since the input of the analog load 5 is electrically connected to the USB male connector 301 and charging cable 302... The power supply terminal VBUS and the ground terminal VGND of the SB male connector 301 are connected to the metal post 303 through the first current loop capacitor C61 and the second current loop capacitor C62, respectively. The metal post 303 is connected to the ground wire G through the crown spring contact 200. The input terminal of the analog load 5 is connected to the ground wire G through the USB male connector 301, the first current loop capacitor C61, the second current loop capacitor C62, the metal post 303 and the crown spring contact 200 to achieve a compact and short-path noise current loop, thereby reducing the impact of loop inductance on the high-frequency current test effect. After the USB male connector 301 is plugged into the target adapter 3, the target adapter 3 can be made to work for testing, obtaining the target noise source voltage and impedance. After the current target adapter 3 is tested, the lifting platform 300 can be raised by the lifting device 400, so that the USB male connector 301 is unplugged from the output end of the target adapter 3. Then the target adapter 3 can be removed from the socket panel 100, and the next target adapter 3 to be tested can be replaced. The replaced target adapter 3 is plugged into the socket panel 100, and the above process is repeated to test the replaced target adapter 3. It can be seen that the cooperation of the lifting platform 200 and the lifting device 400 can more conveniently realize the testing of a batch of adapters 3.

[0046] In some embodiments, the testing equipment further includes: a first circuit board 311, with a USB male connector 301 fixed to the first circuit board 311, for example, the USB male connector 301 soldered to the first circuit board 311. The first circuit board 311 is detachably connected to the lifting platform 300, for example, the first circuit board 311 can be fixed to the lifting platform 300 by screws. After the lifting platform 300 descends, the output end of the target adapter 3 is plugged into the USB male connector 301 through a SUB female connector. Since the position of the USB female connector at the output end of different target adapters 3 may be different, a first circuit board 311 corresponding to the target adapter 3 can be set so that the position of the USB male connector 301 on different first circuit boards 311 matches the position of the USB female connector on the corresponding target adapter 3. When testing different target adapters 3, the position of the USB male connector 301 can be easily changed to match the target adapter 3 by removing the first circuit board 311 on the lifting platform 300. The lifting platform 300 is a metal lifting platform. The second ends of the first current loop capacitor C61 and the second current loop capacitor C62 are electrically connected to the lifting platform 300 through the grounding part on the first circuit board 311. The lifting platform 300 is connected to the metal pillar 300. The metal lifting platform 300 serves as part of the current loop to improve the stability of the current loop. The test equipment also includes a second circuit board 312 disposed on the lifting platform 300. The second circuit board 312 is provided with a USB female connector 321, which is electrically connected to the charging cable 302. The test equipment also includes a connector 322. The first circuit board 311 and the second circuit board 312 are electrically connected through the connector 322. Specifically, the connector 322 can be a board-to-board (BTB) connector, which facilitates the connection of the second circuit board 312 to the replaced first circuit board 311 through the connector 322 when the first circuit board 311 is replaced.

[0047] In some embodiments, the test equipment further includes: a third circuit board 313, on which a bypass 8, a first line impedance stabilizing network 41, and a second line impedance stabilizing network 42 are disposed; a fourth circuit board 314, on which a multiplexer 73, a first electromagnetic interference filter 11, and a second electromagnetic interference filter 12 are disposed; and a controller 500 disposed on the fourth circuit board 314, which is used to control the multiplexer 500 and the lifting device 400. In addition, the controller 500 can also be used to control the bypass 8. The controller 500 can independently control the above-mentioned devices, for example, by executing corresponding control instructions according to a preset process to realize the test process. The controller 500 can also respond to external operations to control the above-mentioned devices. For example, the controller 500 can be connected to an external host computer 74 via wired or wireless means. The host computer 74 sends control instructions to the controller 500, and the controller 500 controls the above-mentioned devices based on the control instructions to perform the test. The testing equipment also includes a metal shield 600, and a accommodating space formed by the metal shield 600 and the third circuit board 313. The bypass 8, the first line impedance stabilizing network 41, and the second line impedance stabilizing network 42 are located within this accommodating space. This reduces interference to the first and second line impedance stabilizing networks 41 and 42, allowing them to output cleaner power signals for testing of the target adapter 3. Additionally, the target noise signal separated by the first and second line impedance stabilizing networks 41 and 42 can be transmitted via RF cables to a multiplexer 73 on the fourth circuit board 314. The output of the multiplexer 73 is connected to an RF port 700, which includes a live (N) RF port 701 and a neutral (L) RF port 702. The socket panel 100, the third circuit board 313, and the fourth circuit board 314 can be housed in the chassis 800. The third circuit board 313 and the fourth circuit board 314 can be fixed to the inner wall of the chassis 800 by multiple fixing screws. The RF port 700 is located on the chassis 800 and is connected to the spectrum analyzer 71 outside the chassis 800. Figure 5 (not shown in the image) and Vector Network Analyzer 72 ( Figure 5 (Not shown in the image). Multiplexer 73 is used in a first state to transmit the target noise output from the first line impedance stabilization network 41 to the spectrum analyzer 71 and vector network analyzer 72 via RF port 700. Multiplexer 73 is also used in a second state to switch to transmitting the target noise output from the second line impedance stabilization network 42 to the spectrum analyzer 71 and vector network analyzer 72 via RF port 700. Figure 5 In this context, ground wire G can be understood as the grounding line on the third circuit board 313 or the fourth circuit board 314.

[0048] In some embodiments, such as Figure 7 As shown, the first line impedance stabilization network 41 includes: a first neutral input terminal Lin1 and a first neutral output terminal Lout1. The first neutral input terminal Lin1 is electrically connected to the first electromagnetic interference filter 11, and the first neutral output terminal Lout1 is electrically connected to the socket panel 100; a first neutral inductor LL1 is electrically connected between the first neutral input terminal Lin1 and the first neutral output terminal Lout1. The first neutral inductor LL1 is an air-core coil inductor, and its inductance value is, for example, 5μH. The side of the first neutral inductor LL1 closest to the first neutral input terminal Lin1 is a first cylindrical coil, and the side of the first neutral inductor LL1 closest to the first neutral output terminal Lout1 is a first tapered transition coil. The tapered end of the first tapered transition coil is electrically connected to the first neutral output terminal Lout1. The first live wire input terminal Nin1 and the first live wire output terminal Nout1 are connected. The first live wire input terminal Nin1 is electrically connected to the first electromagnetic interference filter 11, and the first live wire output terminal Nout1 is electrically connected to the socket panel 100. The first neutral wire output terminal Lout1 and the first live wire output terminal Nout1 are the power supply output terminals of the first line impedance stabilization network 41. The first live wire inductor NL1 is electrically connected between the first live wire input terminal Nin1 and the first live wire output terminal Nout1. The first live wire inductor NL1 is an air-core coil inductor. The side of the first live wire inductor NL1 closest to the first live wire input terminal Nin1 is a second cylindrical coil, and the side of the first live wire inductor NL1 closest to the first live wire output terminal Nout1 is a second tapered transition coil. The tapered end of the second tapered transition coil is electrically connected to the first live wire output terminal Nout1. The tapered transition structure of the inductor is used to reduce the influence of inductor parasitic parameters on the high-frequency band, so as to realize the operating frequency range of the first line impedance stabilization network 41 in the range of [30MHz, 300MHz].

[0049] In some embodiments, the first line impedance stabilization network 41 further includes: a first magnetic rod M1 at least partially inserted into the first cylindrical coil, the depth of insertion of the first magnetic rod M1 into the first cylindrical coil being adjustable, and the first magnetic rod M1 being inserted from the end of the first cylindrical coil away from the first tapered transition coil; the first neutral input terminal Lin1 is electrically connected to the ground wire G through a first capacitor C1, the first capacitor C being, for example, a 4.7nF, 630V 1812 ceramic capacitor. Figure 7 The left end of the ground wire G is the ground input terminal of the first line impedance stabilization network 41, and is electrically connected to the first electromagnetic interference filter 11. Figure 7The right end of the ground wire G is the ground output terminal of the first line impedance stabilization network 41, and is electrically connected to the socket panel 100; the first neutral output terminal Lout1 is electrically connected to the first neutral noise terminal Ln1 through the second capacitor C2; the first neutral noise terminal Ln1 is electrically connected to the ground wire G through the first resistor R1, the resistance of the first resistor R1 being, for example, 1KΩ; the first neutral noise terminal Ln1 is electrically connected to the multiplexer 73 through the corresponding first neutral noise RF port Lr1; the first neutral noise RF port Lr1 is also connected to the ground wire G; the first neutral noise RF port Lr1 is a port on the RF signal line, which is used to transmit the neutral L target noise output by the first neutral noise terminal Ln1 to the multiplexer 73; the second magnetic rod M2, which is at least partially inserted into the second cylindrical coil, is... The depth to which the two magnetic rods M2 are inserted into the second cylindrical coil is adjustable. The second magnetic rod M2 is inserted from the end of the second cylindrical coil away from the second conical transition coil. The first live wire input terminal Nin1 is electrically connected to the ground wire G through the third capacitor C3. The first live wire output terminal Nout1 is electrically connected to the first live wire noise terminal Nn1 through the fourth capacitor C4. The first live wire noise terminal Nn1 is electrically connected to the ground wire G through the second resistor R2. The first live wire noise terminal Nn1 is electrically connected to the multiplexer 73 through the corresponding first live wire noise RF port Nr1. The first live wire noise RF port Nr1 is also connected to the ground wire G. The first live wire noise RF port Nr1 is a port on the RF signal line. This RF signal line is used to transmit the live wire N target noise output by the first live wire noise terminal Nn1 to the multiplexer 73. The magnetic rod is inserted into the inductor coil to increase the inductance value in the low-frequency range. This helps to avoid the input impedance of the target noise signal being too small due to the inductance value. The insertion depth is adjustable, and it can be adjusted to the optimal matching position before testing to improve test reliability.

[0050] In some embodiments, such as Figure 7 and Figure 8As shown, the power supply output terminals of the second line impedance stabilization network 42 include a second neutral output terminal Lout2 and a second live output terminal Nout2; the bypass 8 includes a first bypass unit 81 and a second bypass unit 82, and the adapter power supply terminal 2 includes a neutral power supply terminal 21 and a live power supply terminal 22. The first input terminal of the first bypass unit 81 is electrically connected to the first neutral output terminal Lout1, the second input terminal of the first bypass unit 81 is electrically connected to the second neutral output terminal Lout2, and the output terminal of the first bypass unit 81 is electrically connected to the neutral power supply terminal 21. The first input terminal of the second bypass unit 82 is electrically connected to the first live output terminal Nout1, the second input terminal of the second bypass unit 82 is electrically connected to the second live output terminal Nout2, and the output terminal of the second bypass unit 82 is electrically connected to the live power supply terminal 22. In the first state, the first input and output of the first bypass unit 81 are connected, and the second input and output of the first bypass unit 81 are disconnected, that is, the first neutral output Lout1 is connected to the neutral power supply terminal 21. The first input and output of the second bypass unit 82 are connected, and the second input and output of the second bypass unit 82 are disconnected, that is, the first live output Nout1 is connected to the live power supply terminal 22. In the second state, the first input and output of the first bypass unit 81 are disconnected, and the second input and output of the first bypass unit 81 are connected, that is, the second neutral output Lout2 is connected to the neutral power supply terminal 21. The first input and output of the second bypass unit 82 are disconnected, and the second input and output of the second bypass unit 82 are connected, that is, the second live output Nout2 is connected to the live power supply terminal 22.

[0051] In some embodiments, such as Figure 8 As shown, the second line impedance stabilization network 42 includes: a second neutral input terminal Lin2, which is electrically connected to the second electromagnetic interference filter 12; a second neutral inductor LL2 electrically connected between the second neutral input terminal Lin2 and the second neutral output terminal Lout2, wherein the second neutral inductor LL2 is an air-core coil inductor, the second neutral inductor LL2 is a cylindrical coil, and the inductance value of the second neutral inductor LL2 is, for example, 50μH; a third magnetic rod M3 at least partially inserted into the second neutral inductor LL2, the depth of the third magnetic rod M3 inserted into the second neutral inductor LL2 being adjustable; and the second neutral input terminal Lin2 being electrically connected to the ground wire G through a fifth capacitor C5. Figure 8The left end of the ground wire G is the ground input terminal of the second line impedance stabilization network 52, which is electrically connected to the second electromagnetic interference filter 12. The right end of the ground wire G is the ground output terminal of the second line impedance stabilization network 42, which is electrically connected to the socket panel 100. The second neutral output terminal Lout2 is electrically connected to the second neutral noise terminal Ln2 through the sixth capacitor C6. The fifth capacitor C5 and the sixth capacitor C6 can be, for example, 100nF, 630V 1812 ceramic capacitors. The second neutral noise terminal Ln2 is electrically connected to the ground wire G through the third resistor R3. The resistance value of the third resistor R3 is, for example, 1KΩ. The second neutral noise terminal Ln2 is electrically connected to the multiplexer 73 through the corresponding second neutral noise RF port Lr2. The second line impedance stabilization network 42 also includes a second live wire input terminal Nin2, which is electrically connected to the second electromagnetic interference filter 12; and a second live wire inductor NL2, which is an air-core coil inductor or a cylindrical coil, electrically connected between the second live wire input terminal Nin2 and the second live wire output terminal Nout2. The second line impedance stabilization network 42 also includes a fourth ferrite rod M4, at least partially inserted into the second live wire inductor NL2, with adjustable insertion depth. The second live wire input terminal Nin2 is electrically connected to ground G via a seventh capacitor C7. The second live wire output terminal Nout2 is electrically connected to the second live wire noise terminal Nn2 via an eighth capacitor C8. The second live wire noise terminal Nn2 is electrically connected to ground G via a fourth resistor R4, and is also electrically connected to the multiplexer 73 via a corresponding second live wire noise RF port Nr2. All of the above-mentioned first magnetic rod M1 to fourth magnetic rod M4 can be nickel-zinc high-frequency magnetic rods.

[0052] like Figure 9 As shown in the embodiments of this application, an electromagnetic compatibility testing method is also provided, including:

[0053] Step 101: Obtain the target noise source voltage and target noise source impedance by testing with a testing device. The testing device can be any of the testing devices in the above embodiments. The specific process and principle of this step are the same as those in the above embodiments, and will not be repeated here.

[0054] Step 102: Obtain cable radiation test results through cable radiation model simulation;

[0055] Step 103: Obtain environmental test results through test environment model simulation. In this embodiment of the application, the execution order between steps 101, 102 and 103 is not limited.

[0056] Step 104: Obtain the electromagnetic compatibility test results based on the target noise source voltage, target noise source impedance, cable radiation test results, and environmental test results.

[0057] The execution entity of this method can be the aforementioned host computer 74.

[0058] like Figure 10 As shown in the illustration, this application also provides an electronic device 900, which includes a processor 901. The processor 901 is used to execute computer programs or instructions stored in a memory 902 to implement the electromagnetic compatibility testing method as described in the above embodiments. The electronic device 900 can be the host computer 74 described above.

[0059] It should be noted that processor 901 can be any chip with computing capabilities, and is not limited to a central processing unit (CPU). For example, processor 901 can be a chip that includes one or more transistors, resistors, capacitors and other circuit elements to perform a certain function; or it can be an integrated circuit in various packages that can implement the above methods.

[0060] For example, processor 901 may include one or more processing units, such as a neural network processing unit (NPU), an application processor (AP), a modem processor, a graphics processing unit (GPU), an image signal processor (ISP), a controller, a digital signal processor (DSP), a baseband processor, etc. The different processing units may be independent devices or integrated into one or more processors. The controller can generate operation control signals based on the instruction opcode and timing signals to control instruction fetching and execution.

[0061] Memory 902 can be used to store executable program code, including instructions. The internal memory may include a program storage area and a data storage area. The program storage area may store the operating system, at least one application program required for a function, etc. The data storage area may store data created during the use of the electronic device (such as input data, output data, etc.). Furthermore, the internal memory may include high-speed random access memory, and may also include non-volatile memory, such as at least one disk storage device, flash memory device, universal flash storage (UFS), etc. The processor executes various functional applications and data processing of the electronic device by running instructions stored in the internal memory and / or instructions stored in memory located within the processor.

[0062] It is understood that the structure illustrated in Embodiment 6 of this application is merely an example and does not constitute a limitation on the electronic device. The electronic device in the embodiments of this application may include more or fewer components than illustrated, or combine some components, or split some components, or have different component arrangements. The illustrated components may be implemented in hardware, software, or a combination of software and hardware.

[0063] This application also provides a computer-readable storage medium, which includes a stored program, wherein the program, when executed by a processor, implements the electromagnetic compatibility testing method as described in the above embodiments.

[0064] This application also provides a computer program product, which includes a program that, when run by an electronic device, enables the electronic device to implement the electromagnetic compatibility testing method as described in the above embodiments.

[0065] This application also provides a chip system, including: a communication interface for inputting and / or outputting data; and a processor for executing a computer-executable program, causing a device equipped with the chip system to perform the electromagnetic compatibility testing method as described in the above embodiments.

[0066] The electronic devices involved in this application may be any product such as a personal computer (PC) or a server.

[0067] In the above embodiments, implementation can be achieved, in whole or in part, through software, hardware, firmware, or any combination thereof. When implemented in software, it can be implemented, in whole or in part, as a computer program product. The computer program product includes one or more computer instructions. When the computer program instructions are loaded and executed on a computer, all or part of the processes or functions described in this application are generated. The computer can be a general-purpose computer, a special-purpose computer, a computer network, or other programmable device. The computer instructions can be stored in a computer-readable storage medium or transmitted from one computer-readable storage medium to another. For example, the computer instructions can be transmitted from one website, computer, server, or data center to another website, computer, server, or data center via wired (e.g., coaxial cable, fiber optic, digital subscriber line) or wireless (e.g., infrared, wireless, microwave, etc.) means. The computer-readable storage medium can be any available medium accessible to a computer or a data storage device such as a server or data center that integrates one or more available media. The available medium can be a magnetic medium (e.g., floppy disk, hard disk, magnetic tape), an optical medium (e.g., DVD), or a semiconductor medium (e.g., solid-state drive).

[0068] In this application embodiment, "at least one" refers to one or more, and "more than one" refers to two or more. "And / or" describes the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent the existence of A alone, the simultaneous existence of A and B, or the existence of B alone. A and B can be singular or plural. The character " / " generally indicates that the preceding and following related objects are in an "or" relationship. "At least one of the following" and similar expressions refer to any combination of these items, including any combination of single or plural items. For example, at least one of a, b, and c can represent: a, b, c, ab, ac, bc, or abc, where a, b, and c can be single or multiple.

[0069] The above are merely preferred embodiments of this application and are not intended to limit this application. Various modifications and variations can be made to this application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the protection scope of this application.

Claims

1. A test apparatus, characterized by, The test device comprises: an electromagnetic interference filtering module electrically connected to a ground wire, the electromagnetic interference filtering module being configured to filter out interference noise based on a live wire signal and a neutral wire signal; an adapter power supply end configured to be electrically connected to an input end of a target adapter; a target noise separation module electrically connected to the ground wire, the target noise separation module being configured to separate target noise of a target frequency range based on the live wire signal and the neutral wire signal output by the electromagnetic interference filtering module and supply power to the adapter power supply end; an analog load, an input end of the analog load being configured to be electrically connected to an output end of the target adapter; a current loop, the input end of the analog load being electrically connected to the ground wire through the current loop; a measurement module configured to obtain a target noise source voltage and a target noise source impedance according to the target noise separated by the target noise separation module.

2. The test device according to claim 1, wherein: the electromagnetic interference filtering module comprises: a first electromagnetic interference filter electrically connected to the ground wire, the first electromagnetic interference filter being configured to filter out interference noise of a first frequency range based on the input live wire signal and the input neutral wire signal; a second electromagnetic interference filter configured to filter out interference noise of a second frequency range based on the input live wire signal and the input neutral wire signal, a lowest value of the first frequency range being greater than or equal to a highest value of the second frequency range; the target noise separation module comprises: a first line impedance stabilization network electrically connected to the ground wire, the first line impedance stabilization network being configured to separate a first target noise and a second target noise based on the live wire signal and the neutral wire signal output by the first electromagnetic interference filter, the first target noise being a live wire target noise of a third frequency range, the second target noise being a neutral wire target noise of the third frequency range, the third frequency range belonging to the first frequency range; a second line impedance stabilization network electrically connected to the ground wire, the second line impedance stabilization network being configured to separate a third target noise and a fourth target noise based on the live wire signal and the neutral wire signal output by the second electromagnetic interference filter, the third target noise being a live wire target noise of a fourth frequency range, the fourth target noise being a neutral wire target noise of the fourth frequency range, the fourth frequency range belonging to the second frequency range; the test device further comprises a bypass switch configured to switch between a first state and a second state; in the first state, the bypass switch is configured to make a power supply output end of the first line impedance stabilization network conductive to the adapter power supply end and make a power supply output end of the second line impedance stabilization network cut off from the adapter power supply end, the power supply output end being configured to output the live wire signal and the neutral wire signal. In the second state, the bypasser is configured to make the power supply output end of the second line impedance stabilization network conductive to the adapter power supply end and make the power supply output end of the first line impedance stabilization network cut off to the adapter power supply end; The measuring module comprises: a spectrum analyzer configured to measure a target noise source voltage; a vector network analyzer configured to measure a target noise source impedance; a multiplexer configured to, in the first state, time-divisionally transmit the first target noise and the second target noise to the spectrum analyzer and the vector network analyzer, and configured to, in the second state, time-divisionally transmit the third target noise and the fourth target noise to the spectrum analyzer and the vector network analyzer.

3. The test apparatus of claim 2, wherein, Further comprising: a voltage regulator configured to regulate input live line signals and zero line signals and output the regulated live line signals and zero line signals to the first electromagnetic interference filter; the second electromagnetic interference filter is specifically configured to filter out interference noise in the second frequency range based on the live line signals and zero line signals output by the first electromagnetic interference filter; the first frequency range and the third frequency range are both [30 MHz, 300 MHz], and the second frequency range and the fourth frequency range are both [150 KHz, 30 MHz].

4. The test apparatus of claim 2, wherein, Further comprising: a socket panel, wherein a plug-in part for connecting an input end of the target adapter is arranged on the socket panel, and the plug-in part is provided with the adapter power supply end; a crown spring elastic sheet arranged around the socket panel, wherein the crown spring elastic sheet is electrically connected to the ground wire, and the crown spring elastic sheet is provided with an elastic sheet hole; the current loop device comprises: a lifting table located above the socket panel, wherein a bottom of the lifting table is provided with a USB male head, the USB male head is electrically connected to a charging line, and the charging line is electrically connected to the analog load; a metal column is fixedly arranged on the lifting table, the current loop device comprises a first current loop capacitor and a second current loop capacitor, a first end of the first current loop capacitor is electrically connected to a power supply end of the USB male head, a second end of the first current loop capacitor is electrically connected to the metal column, a first end of the second current loop capacitor is electrically connected to a grounding end of the USB male head, and a second end of the second current loop capacitor is electrically connected to the metal column; the metal column is inserted into the elastic sheet hole of the crown spring elastic sheet; the test equipment further comprises: a lifting device configured to drive the lifting table to perform a lifting function relative to the socket panel.

5. The test apparatus of claim 4, wherein, Further comprising: a first circuit board, wherein the first circuit board is detachably connected to the lifting table, the USB male head is fixed on the first circuit board, the lifting table is a metal lifting table, the second ends of the first current loop capacitor and the second current loop capacitor are electrically connected to the lifting table through a grounding part on the first circuit board, and the lifting table is connected to the metal column; a second circuit board arranged on the lifting table, wherein a USB female seat is arranged on the second circuit board, and the USB female seat is electrically connected to the charging line. A connector, the first circuit board and the second circuit board are electrically connected through the connector.

6. The test apparatus of claim 4, wherein, Further comprising: A third circuit board, the bypass, the first line impedance stabilization network and the second line impedance stabilization network are arranged on the third circuit board; A fourth circuit board, the multiplexer, the first electromagnetic interference filter and the second electromagnetic interference filter are arranged on the fourth circuit board; A controller arranged on the fourth circuit board, the controller is used to control the multiplexer and the lifting device; A metal shield, the metal shield and the third circuit board form a containing space, the bypass, the first line impedance stabilization network and the second line impedance stabilization network are located in the containing space.

7. The test device according to claim 2, wherein, The first line impedance stabilization network comprises: A first neutral input end and a first neutral output end; A first neutral inductor electrically connected between the first neutral input end and the first neutral output end, the first neutral inductor is a hollow coil inductor, a side of the first neutral inductor close to the first neutral input end is a first cylindrical coil, a side of the first neutral inductor close to the first neutral output end is a first tapered transition coil, a tapered end of the first tapered transition coil is electrically connected to the first neutral output end; A first fire input end and a first fire output end, the first neutral output end and the first fire output end are power output ends of the first line impedance stabilization network; A first fire inductor electrically connected between the first fire input end and the first fire output end, the first fire inductor is a hollow coil inductor, a side of the first fire inductor close to the first fire input end is a second cylindrical coil, a side of the first fire inductor close to the first fire output end is a second tapered transition coil, a tapered end of the second tapered transition coil is electrically connected to the first fire output end.

8. The test device according to claim 7, wherein, The first line impedance stabilization network further comprises: A first magnetic bar at least partially inserted into the first cylindrical coil, a depth of the first magnetic bar inserted into the first cylindrical coil is adjustable; The first neutral input end is electrically connected to the ground through a first capacitor; The first neutral output end is electrically connected to a first neutral noise end through a second capacitor; The first neutral noise end is electrically connected to the ground through a first resistor, and the first neutral noise end is electrically connected to the multiplexer through a corresponding first neutral noise radio frequency port; A second magnetic bar at least partially inserted into the second cylindrical coil, a depth of the second magnetic bar inserted into the second cylindrical coil is adjustable; The first fire input end is electrically connected to the ground through a third capacitor; The first fire output end is electrically connected to a first fire noise end through a fourth capacitor; The first fire noise end is electrically connected to the ground through a second resistor, and the first fire noise end is electrically connected to the multiplexer through a corresponding first fire noise radio frequency port.

9. The test device according to claim 7 or 8, wherein, The power supply output end of the second line impedance stabilization network comprises a second zero line output end and a second live line output end; The bypasser comprises a first bypass unit and a second bypass unit, and the adapter power supply end comprises a zero line power supply end and a live line power supply end; The first input end of the first bypass unit is electrically connected to the first zero line output end, the second input end of the first bypass unit is electrically connected to the second zero line output end, and the output end of the first bypass unit is electrically connected to the zero line power supply end; The first input end of the second bypass unit is electrically connected to the first live line output end, the second end of the second bypass unit is electrically connected to the second live line output end, and the output end of the second bypass unit is electrically connected to the live line power supply end; In the first state, the first input end and the output end of the first bypass unit are connected, the second input end and the output end of the first bypass unit are disconnected, the first input end and the output end of the second bypass unit are connected, and the second input end and the output end of the second bypass unit are disconnected; In the second state, the first input end and the output end of the first bypass unit are disconnected, the second input end and the output end of the first bypass unit are connected, the first input end and the output end of the second bypass unit are disconnected, and the second input end and the output end of the second bypass unit are connected.

10. The test device according to claim 9, wherein The second line impedance stabilization network comprises: a second zero line input end; a second zero line inductor electrically connected between the second zero line input end and the second zero line output end, the second zero line inductor being a hollow coil inductor, and the second zero line inductor being a cylindrical coil; a third magnetic bar at least partially inserted into the second zero line inductor, the third magnetic bar being adjustable in depth inserted into the second zero line inductor; the second zero line input end being electrically connected to the ground through a fifth capacitor; the second zero line output end being electrically connected to a second zero line noise end through a sixth capacitor; the second zero line noise end being electrically connected to the ground through a third resistor, and the second zero line noise end being electrically connected to the multiplexer through a corresponding second zero line noise radio frequency port; a second live line input end; a second live line inductor electrically connected between the second live line input end and the second live line output end, the second live line inductor being a hollow coil inductor, and the second live line inductor being a cylindrical coil; a fourth magnetic bar at least partially inserted into the second live line inductor, the fourth magnetic bar being adjustable in depth inserted into the second live line inductor; the second live line input end being electrically connected to the ground through a seventh capacitor; the second live line output end being electrically connected to a second live line noise end through an eighth capacitor; the second live line noise end being electrically connected to the ground through a fourth resistor, and the second live line noise end being electrically connected to the multiplexer through a corresponding second live line noise radio frequency port.

11. An electromagnetic compatibility test method, characterized by, comprising: obtaining a target noise source voltage and a target noise source impedance by testing through the test device according to any one of claims 1 to 10; obtaining a cable radiation test result by simulating through a cable radiation model; An environmental test result is obtained by simulating the test environment model; An electromagnetic compatibility test result is obtained according to the target noise source voltage, the target noise source impedance, the cable radiation test result and the environmental test result.

12. An electronic device, comprising: Comprise: A processor and a memory, the memory is used to store at least one instruction, the instruction is loaded and executed by the processor, and when the instruction is executed, the electronic equipment executes the method as claimed in claim 11.

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