ATE test system, method and device, readable storage medium and electronic equipment
By introducing an ATE test engine into the ATE test system, and using the management module to centrally manage external device control instructions, the resource dispersion caused by the independent operation of multiple terminals is solved, and more efficient testing efficiency is achieved.
Patent Information
- Application Number
- CN202510349473.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-03-24
- Publication Date
- 2025-08-01
AI Technical Summary
In the existing ATE testing system, multiple ATE testing terminals operate independently, resulting in dispersed resource use and low overall testing efficiency.
The ATE test engine is introduced, and the external device control instructions are centrally managed through the management module to achieve unified control of external devices.
The overall testing efficiency of the ATE testing system has been improved, especially in scenarios where multiple terminals or instruction sets have been significantly improved.
Smart Images
Figure CN120405371A_ABST
Abstract
Description
Technical Field
[0001] This application belongs to the technical field of ATE testing, and particularly relates to an ATE testing system, method, device, computer-readable storage medium, and electronic device. Background Art
[0002] Automatic Test Equipment (ATE) is a key device used in the semiconductor industry to test the functions, performance, and reliability of chips. It can detect whether a chip meets the design specifications by simulating the chip's working environment and applying test signals.
[0003] In the prior art, the ATE test program (ATE Application), as an ATE test terminal, is directly connected to external devices. When multiple ATE test terminals are connected to the ATE test system, each ATE test terminal operates independently, resulting in a decentralized use of resources and thus a relatively low overall test efficiency. Summary of the Invention
[0004] In view of this, embodiments of this application provide an ATE testing system, method, device, computer-readable storage medium, and electronic device to solve the problem of relatively low test efficiency in the prior art.
[0005] A first aspect of embodiments of this application provides an ATE testing system, which may include: an ATE test terminal, an ATE test engine, and external devices; the ATE test engine includes various different management modules, and each management module is used to manage one different type of the external devices;
[0006] The ATE test terminal sends external device control instructions to the ATE test engine;
[0007] The ATE test engine determines a target management module among the various different management modules, centrally manages the external device control instructions through the target management module, and sends the external device control instructions to the external devices; wherein, the target management module is the management module corresponding to the external device control instructions;
[0008] The external devices execute the external device control instructions.
[0009] In a specific implementation manner of the first aspect, the various different management modules may include:
[0010] The Serial management module is used to manage light source devices;
[0011] The GPIB management module is used to manage robotic arms;
[0012] The XDMA management module is used to manage the DIG digital board;
[0013] The Socket management module is used to manage other external devices.
[0014] In a specific implementation manner of the first aspect, the ATE test engine runs as a server, and the external device runs as a client.
[0015] In a specific implementation manner of the first aspect, the ATE test engine runs as a client, and the external device runs as a server.
[0016] In a specific implementation manner of the first aspect, the ATE test engine is located in the intranet, and the ATE test terminal is located in the extranet;
[0017] Alternatively, the ATE test engine and the ATE test terminal are located in the same network environment.
[0018] A second aspect of the embodiments of the present application provides an ATE test method, which is applied to a preset ATE test engine. The ATE test engine includes various different management modules, and each management module is used to manage a different type of external device; the method may include:
[0019] Receiving an external device control instruction sent by an ATE test terminal;
[0020] Determining a target management module among the various different management modules; wherein, the target management module is the management module corresponding to the external device control instruction;
[0021] Centrally managing the external device control instruction through the target management module, and sending the external device control instruction to the external device.
[0022] In a specific implementation manner of the second aspect, the various different management modules may include:
[0023] The Serial management module is used to manage the light source device;
[0024] The GPIB management module is used to manage the robotic arm;
[0025] The XDMA management module is used to manage the DIG digital board;
[0026] The Socket management module is used to manage other external devices.
[0027] In a specific implementation manner of the second aspect, the ATE test engine runs as a server, and the external device runs as a client.
[0028] In a specific implementation manner of the second aspect, the ATE test engine runs as a client, and the external device runs as a server.
[0029] In a specific implementation manner of the second aspect, the ATE test engine is located in the internal network, and the ATE test terminal is located in the external network;
[0030] Alternatively, the ATE test engine and the ATE test terminal are located in the same network environment.
[0031] A third aspect of the embodiments of the present application provides an ATE test device, which is applied to a preset ATE test engine. The ATE test engine includes various different management modules, and each management module is used to manage a different type of external device; the device may include:
[0032] An instruction receiving module, configured to receive an external device control instruction sent by an ATE test terminal;
[0033] A management module determination module, configured to determine a target management module among the various different management modules; wherein, the target management module is the management module corresponding to the external device control instruction;
[0034] An instruction management module, configured to centrally manage the external device control instruction through the target management module and send the external device control instruction to the external device.
[0035] In a specific implementation manner of the third aspect, the various different management modules may include:
[0036] A Serial management module, configured to manage a light source device;
[0037] A GPIB management module, configured to manage a robotic arm;
[0038] An XDMA management module, configured to manage a DIG digital board;
[0039] A Socket management module, configured to manage other external devices.
[0040] In a specific implementation manner of the third aspect, the ATE test engine runs as a server, and the external device runs as a client.
[0041] In a specific implementation manner of the third aspect, the ATE test engine runs as a client, and the external device runs as a server.
[0042] In a specific implementation manner of the third aspect, the ATE test engine is located in the internal network, and the ATE test terminal is located in the external network;
[0043] Alternatively, the ATE test engine and the ATE test terminal are located in the same network environment.
[0044] A fourth aspect of the embodiments of the present application provides a computer-readable storage medium storing a computer program, and when the computer program is executed by a processor, the steps of any of the above ATE test methods are implemented.
[0045] A fifth aspect of the embodiments of the present application provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, the steps of any of the above ATE test methods are implemented.
[0046] A sixth aspect of the embodiments of the present application provides a computer program product. When the computer program product runs on an electronic device, the electronic device is caused to execute the steps of any of the above ATE test methods.
[0047] The beneficial effects of the embodiments of the present application compared with the prior art are as follows: The ATE test system in the embodiments of the present application includes: an ATE test terminal, an ATE test engine, and an external device; the ATE test engine includes various different management modules, and each management module is used to manage one different type of the external device; the ATE test terminal sends an external device control instruction to the ATE test engine; the ATE test engine determines a target management module among the various different management modules, centrally manages the external device control instruction through the target management module, and sends the external device control instruction to the external device; wherein, the target management module is the management module corresponding to the external device control instruction; the external device executes the external device control instruction. Through the embodiments of the present application, on the basis of the existing ATE test system, an ATE test engine is introduced. The ATE test terminal is not directly connected to the external device, but is centrally managed by the ATE test engine, thereby effectively improving the overall test efficiency. Description of the Drawings
[0048] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following will briefly introduce the drawings required for use in the embodiments or the description of the prior art. Obviously, the following drawings are only some embodiments of the present application. For those of ordinary skill in the art, other drawings can be obtained according to these drawings without creative efforts.
[0049] Figure 1 It is a schematic diagram of a typical ATE test system;
[0050] Figure 2 It is a schematic diagram of an ATE test system in an embodiment of the present application;
[0051] Figure 3 It is a schematic diagram of an ATE test engine in an embodiment of the present application;
[0052] Figure 4 It is a flowchart of an embodiment of an ATE test method in an embodiment of the present application;
[0053] Figure 5 It is a structural diagram of an embodiment of an ATE test device in an embodiment of the present application;
[0054] Figure 6 It is a schematic block diagram of an electronic device in an embodiment of the present application. Detailed implementation manners
[0055] To make the invention objectives, features, and advantages of the present application more obvious and understandable, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present application. Obviously, the embodiments described below are only a part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present application.
[0056] It should be understood that when used in this specification and the appended claims, the term "comprising" indicates the presence of the described features, wholes, steps, operations, elements, and / or components, but does not exclude the presence or addition of one or more other features, wholes, steps, operations, elements, components, and / or their combinations.
[0057] It should also be understood that the terms used in this specification of the present application are only for the purpose of describing specific embodiments and are not intended to limit the present application. As used in this specification of the present application and the appended claims, unless the context clearly indicates otherwise, the singular forms "a", "an", and "the" are intended to include the plural forms.
[0058] It should be further understood that the term " / and / " used in this specification of the present application and the appended claims refers to any combination and all possible combinations of one or more of the related listed items, and includes these combinations.
[0059] As used in this specification and the appended claims, the term "if" may be construed contextually as "when" or "once" or "in response to determining" or "in response to detecting". Similarly, the phrase "if determined" or "if [described condition or event] is detected" may be construed contextually to mean "once determined" or "in response to determining" or "once [described condition or event] is detected" or "in response to detecting [described condition or event]".
[0060] In addition, in the description of this application, the terms "first", "second", "third", etc. are only used for distinguishing descriptions and should not be construed as indicating or implying relative importance.
[0061] An Automatic Test Equipment (ATE) is a key device used in the semiconductor industry to test the functions, performance, and reliability of chips. It can detect whether a chip meets the design specifications by simulating the chip's working environment and applying test signals.
[0062] Depending on different external devices, different data communication methods are often required in the ATE test system. As an example, RS232 can be used to control a light source device, GPIB to control a robotic arm, XDMA to control a DIG digital board, Socket to control other external devices, etc.
[0063] The ATE test system accesses different external devices through different data communication methods, and the ATE provider integrates the access according to the test environment of the chip manufacturer. Since the devices and technical standards used by each manufacturer are different, protocol adaptation is required for multiple data communication methods in the ATE test system.
[0064] Figure 1 Shown is a schematic diagram of a typical ATE test system. Among them, the ATE test program (ATE Application) serves as the ATE test terminal, which is the core component of the entire ATE test system and controls the entire chip test process. Different protocol modules are respectively implemented inside the ATE test terminal for different external devices. When a new external device is connected, a new protocol module needs to be developed. Usually, the ATE test terminal is directly connected to the external device. In the case of multiple ATE test terminals being connected to the test system, each ATE test terminal operates independently, and the resource usage is scattered, resulting in a relatively low overall test efficiency.
[0065] In view of this, in the embodiments of this application, based on the existing ATE test system, an ATE test engine is introduced. The ATE test terminal is not directly connected to the external device, but is centrally managed by the ATE test engine, thereby effectively improving the overall test efficiency.
[0066] Figure 2 The figure shows a schematic diagram of an ATE test system in an embodiment of the present application. Among them, the ATE test system may include, but is not limited to, an ATE test terminal, an ATE test engine, and external devices. The specific number of ATE test terminals and the specific number of external devices can both be flexibly set according to actual situations. Figure 2 Taking 3 ATE test terminals and 4 external devices as an example, in different actual situations, there may be more or fewer ATE test terminals and external devices. The embodiments of the present application do not make specific limitations on this.
[0067] A client / server (C / S) architecture can be adopted between the ATE test terminal and the ATE test engine. The ATE test engine is independently deployed as the server. The ATE test terminal can be shut down and exited at any time without affecting the test task. The ATE test engine can be directly connected to the external devices and provide interfaces for the ATE test terminal to control the external devices. The ATE test terminal only needs to call the interfaces provided by the ATE test engine to achieve the control of the external devices.
[0068] During the test process, the ATE test terminal can send external device control instructions to the ATE test engine; the ATE test engine can centrally manage the received external device control instructions and send the external device control instructions to the external devices; the external devices can execute the external device control instructions to complete the corresponding test tasks.
[0069] In a specific implementation manner of the embodiment of the present application, the ATE test engine may include various different management modules (Managers) to respectively correspond to different data communication methods. Each management module is used to manage a different type of external device, so as to achieve access to various different types of external devices. As an example, as Figure 3 shown, the Serial management module can be used to manage the light source device, the GPIB management module can be used to manage the robotic arm, the XDMA management module can be used to manage the DIG digital board, the Socket management module can be used to manage other external devices, etc. The ATE test engine may also include a request queue (Request Queue) and a response queue (Response Queue) to facilitate data interaction with the ATE test terminal.
[0070] After receiving the external device control instruction sent by the ATE test terminal, the ATE test engine can determine the target management module among various different management modules, where the target management module is the management module corresponding to the external device control instruction. The ATE test engine can centrally manage the external device control instruction through the target management module and send the external device control instruction to the external device.
[0071] The ATE test engine can cache the requests of the ATE test terminal. The same instructions will be uniformly processed in the ATE test engine instead of being repeatedly executed one by one. For scenarios with multiple terminals or concentrated instructions, the overall test efficiency can be effectively improved. Taking the CMOS image sensor (CIS) test as an example, the CIS test system is an independent test system. For the ATE test system, it is equivalent to an external device. During the CIS test process, there are a large number of instructions for controlling the light source device. When receiving multiple instructions for the light source device, the ATE test engine can cache and centrally process them, thus avoiding frequent switching of the light source device.
[0072] In a specific implementation manner of the embodiment of the present application, the ATE test engine can run as a client. Correspondingly, at this time, the external device can run as a server.
[0073] In another specific implementation manner of the embodiment of the present application, the ATE test engine can run as a server. Correspondingly, at this time, the external device can run as a client.
[0074] In a specific implementation manner of the embodiment of the present application, the ATE test terminal and the ATE test engine can be located in the same network environment. For example, both of them can be located in the internal network.
[0075] In another specific implementation manner of the embodiment of the present application, the ATE test terminal and the ATE test engine can be located in different network environments. For example, the ATE test engine can be located in the internal network, and the ATE test terminal can be located in the external network. Through this network isolation method, the security of the system can be improved.
[0076] In summary, based on the existing ATE test system, the embodiment of the present application introduces the ATE test engine. The ATE test terminal is not directly connected to the external device, but is centrally managed by the ATE test engine, thereby effectively improving the overall test efficiency.
[0077] Corresponding to the foregoing ATE test system, an ATE test method provided by the embodiment of the present application is applied to the ATE test engine and may include the following Figure 4 process:
[0078] Step S401: Receive the external device control instruction sent by the ATE test terminal.
[0079] Step S402: Determine the target management module among various different management modules.
[0080] Among them, the target management module is the management module corresponding to the external device control instruction.
[0081] Step S403: Centralize the management of the external device control instruction through the target management module, and send the external device control instruction to the external device.
[0082] In a specific implementation manner of the embodiment of the present application, the ATE test engine may include various different management modules, which respectively correspond to different data communication methods. Each management module is used to manage a different type of external device, so as to realize the access to various different types of external devices. As an example, the Serial management module can be used to manage the light source device, the GPIB management module can be used to manage the robotic arm, the XDMA management module can be used to manage the DIG digital board, the Socket management module can be used to manage other external devices, etc. The ATE test engine may also include a request queue and a response queue to facilitate data interaction with the ATE test terminal.
[0083] The ATE test engine can cache the requests of the ATE test terminal. The same instructions will be uniformly processed in the ATE test engine instead of being repeatedly executed one by one. For scenarios with multiple terminals or relatively concentrated instructions, the overall test efficiency can be effectively improved.
[0084] In a specific implementation manner of the embodiment of the present application, the ATE test engine can run as a client. Correspondingly, at this time, the external device can run as a server.
[0085] In another specific implementation manner of the embodiment of the present application, the ATE test engine can run as a server. Correspondingly, at this time, the external device can run as a client.
[0086] In a specific implementation manner of the embodiment of the present application, the ATE test terminal and the ATE test engine can be located in the same network environment. For example, both of them can be located in the internal network.
[0087] In another specific implementation manner of the embodiment of the present application, the ATE test terminal and the ATE test engine can be located in different network environments. For example, the ATE test engine can be located in the internal network, and the ATE test terminal can be located in the external network. Through this network isolation method, the security of the system can be improved.
[0088] It should be understood that the sequence numbers of the steps in the above embodiments do not indicate the order of execution. The order of execution of each process should be determined according to its function and internal logic, and should not constitute any limitation to the implementation process of the embodiments of the present application.
[0089] Corresponding to the foregoing ATE test method, an ATE test device provided by an embodiment of the present application is applied to an ATE test engine. The ATE test engine includes various different management modules, and each management module is used to manage a different type of external device. The device may include:
[0090] An instruction receiving module 501, configured to receive an external device control instruction sent by an ATE test terminal;
[0091] A management module determination module 502, configured to determine a target management module among the various different management modules; wherein, the target management module is the management module corresponding to the external device control instruction;
[0092] An instruction management module 503, configured to centrally manage the external device control instruction through the target management module and send the external device control instruction to the external device.
[0093] In a specific implementation manner of the embodiment of the present application, the various different management modules may include:
[0094] A Serial management module, configured to manage a light source device;
[0095] A GPIB management module, configured to manage a robotic arm;
[0096] An XDMA management module, configured to manage a DIG digital board;
[0097] A Socket management module, configured to manage other external devices.
[0098] In a specific implementation manner of the embodiment of the present application, the ATE test engine may run as a client. Correspondingly, at this time, the external device may run as a server.
[0099] In another specific implementation manner of the embodiment of the present application, the ATE test engine may run as a server. Correspondingly, at this time, the external device may run as a client.
[0100] In a specific implementation manner of the embodiment of the present application, the ATE test terminal and the ATE test engine may be in the same network environment. For example, both of them may be in an intranet.
[0101] In another specific implementation manner of the embodiments of the present application, the ATE test terminal and the ATE test engine may be located in different network environments. For example, the ATE test engine may be located in the internal network, and the ATE test terminal may be located in the external network. By this way of network isolation, the security of the system can be improved.
[0102] Those skilled in the art can clearly understand that for the convenience and conciseness of description, the specific working processes of the above-described devices, modules, and units can refer to the corresponding processes in the foregoing embodiments, and will not be elaborated herein.
[0103] In the above embodiments, the descriptions of the various embodiments have their own emphases. For the parts not detailed or recorded in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.
[0104] Figure 6 The schematic block diagram of an electronic device provided by the embodiments of the present application is shown. For the convenience of description, only the parts related to the embodiments of the present application are shown.
[0105] As Figure 6 shown, the electronic device 6 of this embodiment includes: a processor 60, a memory 61, and a computer program 62 stored in the memory 61 and executable on the processor 60. When the processor 60 executes the computer program 62, the steps in the above-mentioned various ATE test method embodiments are implemented. Alternatively, when the processor 60 executes the computer program 62, the functions of the various modules / units in the above-mentioned device embodiments are implemented.
[0106] Exemplarily, the computer program 62 may be divided into one or more modules / units. The one or more modules / units are stored in the memory 61 and executed by the processor 60 to complete the present application. The one or more modules / units may be a series of computer program instruction segments capable of performing specific functions, and these instruction segments are used to describe the execution process of the computer program 62 in the electronic device 6.
[0107] The electronic device 6 is the physical carrier of the ATE test engine, and may include, but is not limited to, computing devices such as desktop computers, notebooks, palm computers, and servers. Those skilled in the art can understand that Figure 6 merely examples of the electronic device 6, which do not constitute a limitation to the electronic device 6. It may include more or fewer components than shown in the figure, or combine certain components, or different components. For example, the electronic device 6 may further include input / output devices, network access devices, buses, etc.
[0108] The processor 60 may be a Central Processing Unit (CPU), or may also be other general-purpose processors, Digital Signal Processors (DSPs), Application Specific Integrated Circuits (ASICs), Field-Programmable Gate Arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose processor may be a microprocessor or the processor may also be any conventional processor, etc.
[0109] The memory 61 may be an internal storage unit of the electronic device 6, such as the hard disk or memory of the electronic device 6. The memory 61 may also be an external storage device of the electronic device 6, such as a plug-in hard disk, Smart Media Card (SMC), Secure Digital (SD) card, Flash Card, etc. equipped on the electronic device 6. Further, the memory 61 may also include both the internal storage unit and the external storage device of the electronic device 6. The memory 61 is used to store the computer program and other programs and data required by the electronic device 6. The memory 61 may also be used to temporarily store data that has been output or is to be output.
[0110] Those skilled in the art can clearly understand that, for the convenience and brevity of description, only the above division of each functional unit and module is used as an example. In actual applications, the above functions can be allocated to different functional units and modules as needed, that is, the internal structure of the device can be divided into different functional units or modules to complete all or part of the functions described above. Each functional unit and module in the embodiments can be integrated in a processing unit, or each unit can exist physically alone, or two or more units can be integrated in one unit. The above integrated units can be implemented in the form of hardware or in the form of software functional units. In addition, the specific names of each functional unit and module are only for the convenience of mutual distinction and do not limit the protection scope of this application. The specific working processes of the units and modules in the above system can refer to the corresponding processes in the foregoing method embodiments and will not be elaborated here.
[0111] In the above embodiments, the descriptions of the respective embodiments have their own emphases. For parts not detailed or recorded in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.
[0112] Those of ordinary skill in the art can realize that the units and algorithm steps of each example described in combination with the embodiments disclosed herein can be implemented by electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are executed in a hardware or software manner depends on the specific application and design constraints of the technical solution. Professional technicians can use different methods for each specific application to implement the described functions, but such implementation should not be considered to exceed the scope of this application.
[0113] In the embodiments provided in this application, it should be understood that the disclosed device / electronic device and method can be implemented in other ways. For example, the device / electronic device embodiments described above are merely illustrative. For example, the division of the modules or units is only a logical function division. In actual implementation, there may be other division methods. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the displayed or discussed couplings or direct couplings or communication connections to each other can be through some interfaces. The indirect coupling or communication connection of the device or unit can be in an electrical, mechanical or other form.
[0114] The units described as separate components may or may not be physically separated. The components displayed as units may or may not be physical units, that is, they can be located in one place, or they can be distributed to multiple network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of this embodiment.
[0115] In addition, the functional units in each embodiment of this application can be integrated in a processing unit, or each unit can exist physically alone, or two or more units can be integrated in one unit. The above integrated units can be implemented in the form of hardware or in the form of software functional units.
[0116] If the integrated module / unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, to implement all or part of the processes in the above-described embodiment methods of this application, it can also be completed by instructing relevant hardware through a computer program. The computer program can be stored in a computer-readable storage medium. When the computer program is executed by a processor, the steps of the above-described various method embodiments can be implemented. Among them, the computer program includes computer program code, and the computer program code can be in the form of source code, object code, executable file, or some intermediate form, etc. The computer-readable storage medium can include: any entity or device that can carry the computer program code, recording medium, USB flash drive, mobile hard disk, magnetic disk, optical disc, computer memory, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), electrical carrier signal, telecommunication signal, and software distribution medium, etc. It should be noted that the content included in the computer-readable storage medium can be appropriately increased or decreased according to the requirements of legislation and patent practice within the jurisdiction. For example, in some jurisdictions, according to legislation and patent practice, the computer-readable storage medium does not include electrical carrier signals and telecommunication signals.
[0117] The above-described embodiments are only used to illustrate the technical solutions of this application, rather than to limit them; although this application has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that: they can still modify the technical solutions recorded in the foregoing embodiments, or perform equivalent replacements on some of the technical features; and these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the various embodiments of this application, and should all be included in the protection scope of this application.
Claims
1. An ATE test system, characterized in that, Including: An ATE test terminal, an ATE test engine, and external devices; the ATE test engine includes various different management modules, and each management module is used to manage one different type of the external devices; The ATE test terminal sends an external device control instruction to the ATE test engine; The ATE test engine determines a target management module among the various different management modules, centrally manages the external device control instruction through the target management module, and sends the external device control instruction to the external device; wherein, the target management module is the management module corresponding to the external device control instruction; The external device executes the external device control instruction.
2. The ATE test system according to claim 1, wherein The various different management modules include: A Serial management module, used to manage light source devices; A GPIB management module, used to manage robotic arms; An XDMA management module, used to manage DIG digital boards; A Socket management module, used to manage other external devices.
3. The ATE test system according to claim 1, wherein The ATE test engine runs as a server, and the external device runs as a client.
4. The ATE test system according to claim 1, wherein The ATE test engine runs as a client, and the external device runs as a server.
5. The ATE test system according to any one of claims 1 to 4, characterized in that The ATE test engine is located in the internal network, and the ATE test terminal is located in the external network; Or, the ATE test engine and the ATE test terminal are located in the same network environment.
6. An ATE test method, characterized in that, Applied to a preset ATE test engine, the ATE test engine includes various different management modules, and each management module is used to manage one different type of external device; the method includes: Receiving an external device control instruction sent by an ATE test terminal; Determining a target management module among the various different management modules; wherein, the target management module is the management module corresponding to the external device control instruction; Centrally managing the external device control instruction through the target management module, and sending the external device control instruction to the external device.
7. The ATE test method according to claim 6, wherein The various different management modules include: A Serial management module, used to manage light source devices; A GPIB management module, used to manage robotic arms; An XDMA management module, used to manage DIG digital boards; A Socket management module, used to manage other external devices.
8. An ATE test device, characterized in that, Applied to a preset ATE test engine, the ATE test engine includes various different management modules, and each management module is used to manage one different type of external device; the device includes: An instruction receiving module, used to receive an external device control instruction sent by an ATE test terminal; A management module determination module, used to determine a target management module among the various different management modules; wherein, the target management module is the management module corresponding to the external device control instruction; An instruction management module, used to centrally manage the external device control instruction through the target management module, and send the external device control instruction to the external device.
9. A computer-readable storage medium storing a computer program, characterized in that, When the computer program is executed by a processor, it implements the steps of the ATE test method according to any one of claims 6 to 7.
10. An electronic device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, When the processor executes the computer program, the steps of the ATE test method described in any one of claims 6 to 7 are implemented.