Circuit for testing function extension component and electronic equipment

By combining the control circuit with the adapter circuit and the gate circuit of the indicator circuit, the hot plug of the function expansion component is realized, which solves the problem of inefficient testing in the prior art, improves the test efficiency and simplifies operation.

CN120407303APending Publication Date: 2025-08-01INSPUR SUZHOU INTELLIGENT TECH CO LTD
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Patent Information

Application Number
CN202510491235.3
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-04-18
Publication Date
2025-08-01

AI Technical Summary

Technical Problem

The testing efficiency of functional extension components in the prior art is inefficient, and special fixtures and multiple switches are required to replace the test components, resulting in complex and time-consuming operation.

Method used

It provides a circuit for testing functional expansion components, including control circuits, adapter circuits and indicator circuits. The gate circuit realizes hot swapping of the functional expansion components. The control circuit sends a control signal to the indicator circuit to control the components to power on or off, so that repeated testing can be achieved when the motherboard is turned on and entered the operating system.

Benefits of technology

It realizes hot swapping of functional extension components, shortens replacement time, improves testing efficiency, simplifies operation steps, and reduces testing time.

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Abstract

The invention discloses a circuit for testing a function extension component and electronic equipment, relates to the technical field of circuits, and tests the function extension component by combining a control circuit with an indicating circuit and a switching circuit. The control circuit sends different control signals to the gating circuit of the indicating circuit so as to control the function expansion assembly to be powered on or powered off, the function of inserting or removing the function expansion assembly when the mainboard is started and enters an operating system is achieved, namely, hot plugging of the function expansion assembly is achieved, and the function expansion assembly is convenient to use. According to the invention, the test can be repeatedly carried out only by starting up and entering the operating system once, and the function extension component does not need to be powered on or powered off by controlling the on-off of the mainboard when the function extension component is replaced every time, so that the replacement time of the function extension component is shortened, and the test time of the function extension component is further shortened; the test efficiency of the function extension component is improved, and the operation steps are simplified.
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Description

Technical Field

[0001] This application relates to the field of circuit technologies, and in particular, to a circuit and an electronic device for testing a function expansion component. Background Art

[0002] ]>At present, in order to save design costs, some electronic devices integrate certain functions into corresponding function expansion components, such as small boards. This function expansion component can be reused in different models of electronic devices and only needs to be connected to the main board through reserved interfaces. Like the main board, the function expansion component also needs to be functionally tested to ensure functional integrity when adapted to the whole machine main board.

[0003] In the related art, currently testing a laptop small board not only requires setting up a dedicated tooling fixture and installing and connecting it, but also requires the main board to power on and enter a dedicated OS (Operating System) for testing, which is time-consuming. Each time, the main board needs to be powered on and off to replace the function expansion component to be tested, resulting in low efficiency. Summary of the Invention

[0004] This application provides a circuit and an electronic device for testing a function expansion component, which improves the testing efficiency of the function expansion component and realizes hot plugging of the function expansion component under the operating system.

[0005] In a first aspect, this application provides a circuit for testing a function expansion component, including: a control circuit, a transfer circuit, and an indication circuit;

[0006] The control circuit is electrically connected to the indication circuit and the transfer circuit respectively through a plurality of input / output ports. The transfer circuit is used to be electrically connected to each signal pin on the function expansion component through a plurality of connection pins; the control circuit is used to combine the indication circuit and the transfer circuit to test the function expansion component;

[0007] The indication circuit includes a gating circuit; the gating circuit is used to select a first path or a second path of the gating circuit to be connected to a power supply pin among the connection pins of the transfer circuit according to a control signal from the control circuit; wherein, the first path is connected to the power supply pin of the transfer circuit, and the function expansion component is powered on; the second path is connected to the power supply pin among the connection pins of the transfer circuit, and the function expansion component is powered off.

[0008] In a second aspect, this application also provides an electronic device, including the system for testing a function expansion component provided in the first aspect.

[0009] The circuit and electronic device for testing a function expansion component provided by an embodiment of the present application test the function expansion component by setting a control circuit in combination with an indication circuit and an adapter circuit. The control circuit sends different control signals to a gating circuit in the indication circuit to control the power-on or power-off of the function expansion component, realizing the function of inserting or removing the function expansion component when the main board boots into the operating system, that is, realizing the hot plugging of the function expansion component. It is only necessary to boot once into the OS to repeatedly perform the test, without the need to control the power-on or power-off of the function expansion component by controlling the power-on and power-off of the main board every time the function expansion component is replaced, shortening the replacement time of the function expansion component, and thus also shortening the test time of the function expansion component, improving the test efficiency of the function expansion component, and simplifying the operation steps. BRIEF DESCRIPTION OF THE DRAWINGS

[0010] In order to more clearly illustrate the embodiments of the present application, the drawings required for use in the embodiments will be briefly introduced below. Obviously, the drawings in the following description are only some embodiments of the present application, and those of ordinary skill in the art can obtain other drawings based on these drawings without creative efforts.

[0011] Figure 1 It is a schematic structural diagram of a circuit for testing a function expansion component provided by an embodiment of the present application;

[0012] Figure 2 It is a schematic circuit diagram of a control circuit provided by an embodiment of the present application;

[0013] Figure 3 It is a schematic circuit diagram of an adapter circuit provided by an embodiment of the present application;

[0014] Figure 4 It is a schematic circuit diagram of an indication circuit provided by an embodiment of the present application;

[0015] Figure 5 It is a schematic structural diagram of a function expansion component provided by an embodiment of the present application. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0016] In order to be able to more clearly understand the above objects, features, and advantages of the present application, the solution of the present application will be further described below. It should be noted that, without conflict, the embodiments of the present application and the features in the embodiments can be combined with each other.

[0017] Many specific details are set forth in the following description in order to fully understand the present application, but the present application can also be implemented in other ways different from those described herein; obviously, the embodiments in the specification are only some embodiments of the present application, rather than all embodiments.

[0018] In order to enable those skilled in the art to better understand the present application, the present application is further described in detail below with reference to the accompanying drawings and specific implementation methods.

[0019] The existing testing solution involves setting up a simple fixture to secure the motherboard to be tested with the small board. The operator places the motherboard on the fixture and connects the relevant external functional devices, corresponding functional expansion components, and the motherboard's functional interfaces to the operating system for functional testing. For example, the operator connects the JLED1 and JREAD interfaces on the MMC&SD board to the corresponding interfaces on the motherboard via a cable. After booting up and entering the OS, the operator follows the prompts on the human-computer interface to test the TP (Touch Pad), LED (Light-Emitting Diode), and SD card functions on the small board. For example, when testing the TP function, the operator presses the left and right SW00 and SW01 buttons on the TP. When testing the LED, the operator observes whether the three corresponding LEDs light up properly. When testing the SD card, the operator inserts the SD (Secure Digital) card according to the prompts to confirm whether the SD card is recognized by the OS. After completing these operations, the operator shuts down the motherboard, removes the small board from the motherboard, and replaces it with another one for the next round of testing. The overall testing process is time-consuming, as the motherboard must be turned on and off each time to replace the functional expansion component to be tested, which is inefficient.

[0020] In order to solve the above problems, an embodiment of the present application provides a circuit for testing a function expansion component. Figure 1 This is a schematic diagram of a circuit for testing a function expansion component provided in an embodiment of the present application. Figure 1 As shown, the circuit for testing the function expansion component includes: a control circuit 1, a switching circuit 2, and an indication circuit 3; the control circuit 1 is electrically connected to the indication circuit 3 and the switching circuit 2 through multiple input and output ports, and the switching circuit 2 is used to electrically connect to each signal pin on the function expansion component 4 through multiple connecting pins; the control circuit 1 is used to test the function expansion component 4 in combination with the indication circuit 3 and the switching circuit 2; the indication circuit 3 includes a gating circuit; the gating circuit is used to select the first path or the second path of the gating circuit to be connected to the power supply pin VDD among the connecting pins of the switching circuit 2 according to the control signal from the control circuit 1; wherein, the first path is connected to the power supply pin VDD among the connecting pins of the switching circuit 2, and the function expansion component 4 is powered on; the second path is connected to the power supply pin VDD among the connecting pins of the switching circuit 2, and the function expansion component 4 is powered off.

[0021] Figure 1 In the figure, the first path is shown by a solid line and the second path is shown by a dotted line. The first path and the second path are not turned on at the same time.

[0022] Specifically, as Figure 1 shown, the control circuit 1 is electrically connected to the transfer circuit 2 through a plurality of input / output ports, and the transfer circuit 2 is electrically connected to each signal pin on the function expansion component 4 through a plurality of connection pins. The control circuit 1 is electrically connected to the indication circuit 3 through a plurality of input / output ports, and the indication circuit 3 further includes a gating circuit, and the control circuit 1 is configured to send a control signal to the gating circuit.

[0023] Exemplarily, when it is necessary to test the function expansion component 4, the gating circuit in the indication circuit 3 selects to conduct the connection between the first path of the gating circuit and the power supply pin VDD among the connection pins of the transfer circuit 2 according to the first control signal, so that the power supply pin VDD is electrically connected to the power signal VCC, for example. The function expansion component 4 accesses the power signal VCC through the power supply pin VDD, and the function expansion component 4 is powered on for function testing. When it is necessary to replace the function expansion component 4, the gating circuit selects to conduct the connection between the second path of the gating circuit and the power supply pin VDD among the connection pins of the transfer circuit 2 according to the second control signal, so that the power supply pin VDD is electrically connected to the suspension pin, for example. The function expansion component 4 accesses the suspension signal through the power supply pin VDD, so that the function expansion component 4 is powered off, and the current function expansion component 4 can be removed.

[0024] Exemplarily, the function expansion component 4 is, for example, a small board, a circuit board integrating electronic components on a substrate with a smaller size, having specific functions and interfaces, and can be used as a printed circuit board in various electronic devices. It can be understood that it can also be other types of function expansion components 4, and the embodiments of the present application do not limit this.

[0025] Therefore, in the embodiments of the present application, by providing the control circuit 1 in combination with the indication circuit 3 and the transfer circuit 2 to test the function expansion component 4, the control circuit 1 sends different control signals to the gating circuit of the indication circuit 3 to control the power-on or power-off of the function expansion component 4, realizing the function of inserting or removing the function expansion component 4 when the main board 5 boots into the operating system, that is, realizing the hot plugging of the function expansion component 4. It is only necessary to boot once into the OS to perform repeated tests, without having to power on or power off the function expansion component 4 by controlling the power-on and power-off of the main board 5 every time the function expansion component 4 is replaced, shortening the replacement time of the function expansion component 4, and further shortening the test time of the function expansion component 4, improving the test efficiency of the function expansion component 4, and simplifying the operation steps.

[0026] Figure 2 It is a schematic circuit diagram of a control circuit provided by an embodiment of the present application. Figure 3 It is a schematic circuit diagram of a transfer circuit provided by an embodiment of the present application. Figure 4 It is a schematic circuit diagram of an indication circuit provided by an embodiment of the present application. Figure 5A schematic diagram of the structure of a function expansion component provided in an embodiment of the present application. Figures 1 to 5 The transfer circuit 2 includes a first interface 21, which is used to electrically connect to the storage device interface 41 of the function expansion component 4; the selection circuit includes a first selection circuit 31, and the first selection circuit 31 includes a first switching switch 311. The control end of the first switching switch 311 is electrically connected to the first input and output port of the control circuit 1; the static contact of the first switching switch 311 is connected to the first power supply pin VDD-1 of the first interface 21; the first moving contact of the first switching switch 311 receives the power signal VCC; the second moving contact of the first switching switch 311 is suspended; the first moving contact of the first switching switch 311 is connected to the static contact of the first switching switch 311 to form a first path; the second moving contact of the first switching switch 311 is connected to the static contact of the first switching switch 311 to form a second path.

[0027] Figure 2 The figure exemplifies that the control circuit 1 may include, for example, a control chip U1 and peripheral circuits such as power supply, oscillation, and reset for the normal operation of the control chip U1. The specific working principles of the peripheral circuits are well known to those skilled in the art and are not limited here.

[0028] Combine Figure 3 and Figure 5 It can be seen that the first interface 21 in the switching circuit 2 is used to electrically connect to the storage device interface 41 of the function expansion component 4. The storage device is, for example, an SD card or an MMC (Multi-Media Card).

[0029] Reference Figure 4 The first switching switch 311 may, for example, include a first relay Relay1, the third contact of the first relay Relay1 serving as a static contact, the second contact of the first relay Relay1 serving as a second moving contact suspended, and the sixth contact of the first relay Relay1 serving as a first moving contact receiving a power signal VCC, wherein the voltage of the power signal VCC is, for example, 3V.

[0030] Exemplarily, when it is necessary to detect whether the function of the storage device interface 41 of the function expansion component 4 is normal, a storage device is inserted into the storage device interface 41 of the function expansion component 4, and is electrically connected to the corresponding interface of the main board 5 through the storage device interface 41 of the function expansion component 4, and the main board 5 is powered on to enter the operation interface of the system. The first input / output port of the control circuit 1 sends a first control signal to the control end of the first switch 311. For example, the first input / output port of the control circuit 1 sends a first control signal to the second contact of the first relay Relay1, so that the first moving contact of the first switch 311 is conducted with the static contact of the first switch 311, that is, the sixth contact of the first relay Relay1 is electrically connected to the third contact, and the first moving contact of the first switch 311 accesses the power supply signal VCC. The power supply signal VCC is sent to the storage device interface 41 of the function expansion component 4 through the first power supply pin VDD-1 of the first interface 21 of the connection circuit 2, so that the function expansion component 4 is powered on, and the storage device inserted in the storage device interface 41 is tested. If the corresponding storage device can be normally obtained under the operating system and can be normally read and written, it indicates that the function of the storage device interface 41 of the function expansion component 4 is normal; if the corresponding storage device cannot be obtained or cannot be normally read and written, it indicates that the function of the storage device interface 41 of the function expansion component 4 is abnormal.

[0031] When it is necessary to replace another function expansion component 4, the first input / output port of the control circuit 1 sends a second control signal to the control end of the first switch 311. For example, the first input / output port of the control circuit 1 sends a second control signal to the second contact of the first relay Relay1, so that the second moving contact of the first switch 311 is conducted with the static contact of the first switch 311, that is, the first contact of the first relay Relay1 is electrically connected to the third contact, so that the second moving contact of the first switch 311 is suspended, the second path is conducted, and the suspension signal is sent to the storage device interface 41 of the function expansion component 4 through the first interface 21, so that the function expansion component 4 is powered off.

[0032] Optionally, in combination with Figures 1 to 5 , the first gating circuit 31 further includes a first triode Q1, and the first input / output port of the control circuit 1 is electrically connected to the first switch 311 through the first triode Q1.

[0033] Figure 4 It is exemplarily shown in that the first triode Q1 is, for example, an NPN triode. When it is necessary to detect whether the function of the storage device interface 41 of the function expansion component 4 is normal, a storage device is inserted into the storage device interface 41 of the function expansion component 4, and is electrically connected to the corresponding interface of the main board 5 through the storage device interface 41 of the function expansion component 4, and the main board 5 is powered on to enter the operation interface of the system. Figure 4Exemplarily, the first input / output port of the control circuit 1 is, for example, port P3.2. The base of the first triode Q1 is electrically connected to port P3.2 of the control circuit 1. The collector of the first triode Q1 is connected to the power supply signal VCC. The emitter of the first triode Q1 is electrically connected to the second contact of the first relay Relay1. The second contact of the first relay Relay1 serves as the control end of the first switching switch 311.

[0034] According to the working principle of the triode, a first control signal is sent to the base of the first triode Q1 through port P3.2 of the control circuit 1. The first control signal is, for example, a high-level signal, which turns on the first triode Q1, causing the first moving contact of the first switching switch 311 to conduct with the static contact of the first switching switch 311, that is, the sixth contact of the first relay Relay1 is electrically connected to the third contact. The first moving contact of the first switching switch 311 is connected to the power supply signal VCC. The power supply signal VCC is sent to the storage device interface 41 of the function expansion component 4 through the first interface 21 of the connection circuit 2, powering on the function expansion component 4 and testing the storage device inserted in the storage device interface 41.

[0035] When it is necessary to replace the next function expansion component 4, a second control signal is sent to the base of the first triode Q1 through the first input / output port of the control circuit 1. The second control signal is, for example, a low-level signal, which turns off the first triode Q1, causing the second moving contact of the first switching switch 311 to conduct with the static contact of the first switching switch 311, that is, the first contact of the first relay Relay1 is electrically connected to the third contact, suspending the second moving contact of the first switching switch 311 and powering off the function expansion component 4.

[0036] Optionally, in combination with Figures 1 to 5 , the indication circuit 3 further includes a first detection trigger circuit 33. The control circuit 1 sends a first control signal to the first gating circuit 31 based on the first detection trigger circuit 33 being in a conducting state. The first switching switch 311 selects the first path of the first gating circuit 31 to be connected to the first power supply pin VDD-1 of the first interface 21 based on the first control signal.

[0037] Exemplarily, in combination with Figures 1 to 5When it is necessary to detect whether the function of the storage device interface 41 of the function expansion component 4 is normal, the first detection trigger circuit 33 is turned on. The first detection trigger circuit 33 sends a first trigger signal to the control circuit 1. Based on the first trigger signal, the control circuit 1 sends a first control signal to the first gating circuit 31. The first switching switch 311 in the first gating circuit 31 selects the first path of the first gating circuit 31 to be connected to the first power supply pin VDD-1 of the first interface 21 based on the first control signal, that is, the first moving contact of the first switching switch 311 is connected to the static contact of the first switching switch 311, which means the sixth contact of the first relay Relay1 is electrically connected to the third contact. The power supply signal is sent to the storage device interface 41 of the function expansion component 4 through the first power supply pin VDD-1 of the first interface 21 of the connection circuit 2, so that the function expansion component 4 is powered on to test the storage device inserted in the storage device interface 41.

[0038] When it is necessary to replace with another function expansion component 4, the first detection trigger circuit 33 is disconnected. The first detection trigger circuit 33 sends a second trigger signal to the control circuit 1. Based on the second trigger signal, the control circuit 1 sends a second control signal to the first gating circuit 31. The first switching switch 311 in the first gating circuit 31 selects the second path of the first gating circuit 31 to be connected to the first power supply pin VDD-1 of the first interface 21 based on the second control signal, that is, the second moving contact of the first switching switch 311 is connected to the static contact of the first switching switch 311, which means the first contact of the first relay Relay1 is electrically connected to the third contact. The suspension signal is sent to the storage device interface 41 of the function expansion component 4 through the first interface 21 to power off the function expansion component 4.

[0039] Optionally, as Figure 4 shown, the first detection trigger circuit 33 includes a first switch K1. One end of the first switch K1 is grounded, and the other end is electrically connected to the second input / output port of the control circuit 1.

[0040] Illustratively, when it is necessary to detect whether the function of the storage device interface 41 of the function expansion component 4 is normal, the first switch K1 is turned on, and the first switch K1 sends a low-level signal to the second input / output port of the control circuit 1. The second input / output port of the control circuit 1 is, for example, port P3.7 of the control circuit 1. Based on the low-level signal, the control circuit 1 sends a first control signal to the first selection circuit 31. The first switching switch 311 in the first selection circuit 31 selects, based on the first control signal, the first path of the first selection circuit 31 to be connected to the first power supply pin VDD-1 of the first interface 21. That is, the first moving contact of the first switching switch 311 is connected to the static contact of the first switching switch 311, that is, the sixth contact of the first relay Relay1 is electrically connected to the third contact. The power signal is sent to the storage device interface 41 of the function expansion component 4 through the first power supply pin VDD-1 of the first interface 21 of the connection circuit 2, thereby powering on the function expansion component 4 and testing the storage device inserted in the storage device interface 41.

[0041] When the next function expansion component 4 needs to be replaced, the first switch K1 is disconnected, the first detection trigger circuit 33 sends a high-level signal to the control circuit 1, and the control circuit 1 sends a second control signal to the first selection circuit 31 based on the high level. The first switching switch 311 in the first selection circuit 31 selects the second path of the first selection circuit 31 based on the second control signal and connects it to the first power supply pin VDD-1 of the first interface 21, that is, the second moving contact of the first switching switch 311 is connected to the static contact of the first switching switch 311, that is, the first contact of the first relay Relay1 is electrically connected to the third contact, and the suspension signal is sent to the storage device interface 41 of the function expansion component 4 through the first interface 21 to power off the function expansion component 4.

[0042] Optionally, combined Figures 1 to 5 The switching circuit 2 includes a second interface 22, which is used to be electrically connected to the functional component interface 42 of the functional expansion component 4; the gating circuit includes a second gating circuit 32, and the second gating circuit 32 includes a second switching switch 321, and the control end of the second switching switch 321 is electrically connected to the third input and output port of the control circuit 1; the static contact of the second switching switch 321 is connected to the second power supply pin of the second interface 22; the first moving contact of the second switching switch 321 receives a power signal; the second moving contact of the second switching switch 321 is electrically connected to the fourth input and output port of the control circuit 1; the first moving contact of the second switching switch 321 is connected to the static contact of the second switching switch 321 to form a first path; the second moving contact of the second switching switch 321 is connected to the static contact of the second switching switch 321 to form a second path.

[0043] When the function component interface 42 of the function expansion component 4 performs a short - circuit test in the powered - on state, if a short - circuit occurs between any two pins, it is very easy to burn out the function expansion component 4. To avoid this problem, before testing whether there is a short - circuit between any two pins of the function component interface 42 of the function expansion component 4 in the embodiment of the present application, the function component interface 42 needs to be powered off first.

[0044] The third input / output port of the control circuit 1 sends a second control signal to the control end of the second switch 321, making the second moving contact of the second switch 321 conduct with the static contact of the second switch 321. The second power - supply pin of the second interface 22 is electrically connected to the fourth input / output port of the control circuit 1, and the second power - supply pin of the second interface 22 of the connection circuit 2 no longer supplies power to the function component interface 42, powering off the function expansion component 4 to prevent it from being burned during the short - circuit test.

[0045] After testing whether there is a short - circuit between any two pins of the function component interface 42 of the function expansion component 4, the third input / output port of the control circuit 1 sends a first control signal to the control end of the second switch 321, making the first moving contact of the second switch 321 conduct with the static contact of the second switch 321. The second power - supply pin of the second interface 22 of the connection circuit 2 accesses the power - supply signal VCC to power on the function expansion component 4.

[0046] Optionally, the second gating circuit 32 further includes a second triode Q2, and the third input / output port of the control circuit 1 is electrically connected to the second switch 321 through the second triode Q2.

[0047] Figure 4 It is exemplarily shown in [the figure] that the second gating circuit 32 includes three triodes, namely the second triode Q2, the third triode Q3, and the fourth triode Q4, and all are NPN triodes. Figure 4Also exemplarily shown is that the third input / output port of the control circuit 1 is, for example, port P3.3, port P3.4, and port P3.5 of the control circuit 1. The base of the second triode Q2 is electrically connected to port P3.3 of the control circuit 1. The collector of the second triode Q2 is connected to the power supply signal VCC. The emitter of the second triode Q2 is electrically connected to the second contact of the second relay Relay2, and the second contact of the second relay Relay2 serves as the control end of the second switching switch 321. The base of the third triode Q3 is electrically connected to port P3.4 of the control circuit 1. The collector of the third triode Q3 is connected to the power supply signal VCC. The emitter of the third triode Q3 is electrically connected to the second contact of the third relay Relay3, and the second contact of the third relay Relay3 serves as the control end of the second switching switch 321. The base of the fourth triode Q4 is electrically connected to port P3.5 of the control circuit 1. The collector of the fourth triode Q4 is connected to the power supply signal VCC. The emitter of the fourth triode Q4 is electrically connected to the second contact of the fourth relay Relay4, and the second contact of the fourth relay Relay4 serves as the control end of the second switching switch 321.

[0048] The first contact of the second relay Relay2 serves as the first moving contact of the second switching switch 321, the third contact of the second relay Relay2 serves as the static contact of the second switching switch 321, and the sixth contact of the second relay Relay2 serves as the second moving contact of the second switching switch 321. The first contact of the third relay Relay3 serves as the first moving contact of the second switching switch 321, the third contact of the third relay Relay3 serves as the static contact of the second switching switch 321, and the sixth contact of the third relay Relay3 serves as the second moving contact of the second switching switch 321. The first contact of the fourth relay Relay4 serves as the first moving contact of the second switching switch 321, the third contact of the fourth relay Relay4 serves as the static contact of the second switching switch 321, and the sixth contact of the fourth relay Relay4 serves as the second moving contact of the second switching switch 321.

[0049] Before testing whether there is a short circuit between any two pins of the function component interface 42 of the test function expansion component 4, first power down the function component interface 42. The port P3.3 of the control circuit 1 sends a second control signal to the base of the second triode Q2, the port P3.4 of the control circuit 1 sends a third control signal to the base of the third triode Q3, and the port P3.5 of the control circuit 1 sends a second control signal to the base of the fourth triode Q4. The second control signal is, for example, a high-level signal, which turns on the second triode Q2, the third triode Q3, and the fourth triode Q4. The turned-on second triode Q2 makes the third contact of the second relay Relay2 conduct with the sixth contact of the second relay Relay2, and the second power supply pin S1 of the second interface 22 is electrically connected to the port P2.0 of the control circuit 1. Since the second power supply pin S1 of the second interface 22 is electrically connected to the +3V power supply pin of the function component interface 42 of the function expansion component 4, the +3V power supply pin of the function component interface 42 of the function expansion component 4 is electrically connected to the port P2.0 of the control circuit 1. The turned-on third triode Q3 makes the third contact of the third relay Relay3 conduct with the sixth contact of the third relay Relay3, and the power supply pin S2 of the second interface 22 is electrically connected to the port P3.0 of the control circuit 1. Since the second power supply pin S2 of the second interface 22 is electrically connected to the +5V ALW power supply pin of the function component interface 42 of the function expansion component 4, the +5V ALW power supply pin of the function component interface 42 of the function expansion component 4 is electrically connected to the port P3.0 of the control circuit 1. The turned-on fourth triode Q4 makes the third contact of the fourth relay Relay4 conduct with the sixth contact of the fourth relay Relay4, and the second power supply pin S2 of the second interface 22 is electrically connected to the port P3.1 of the control circuit 1. Since the second power supply pin S3 of the second interface 22 is electrically connected to the +3V ALW power supply pin of the function component interface 42 of the function expansion component 4, the +3V ALW power supply pin of the function component interface 42 of the function expansion component 4 is electrically connected to the port P3.1 of the control circuit 1, powering down the function expansion component 4.

[0050] After testing whether there is a short circuit between any two pins of the functional component interface 42 of the functional expansion component 4, the port P3.3 of the control circuit 1 sends a first control signal to the base of the second triode Q2, the port P3.4 of the control circuit 1 sends a first control signal to the base of the third triode Q3, and the port P3.5 of the control circuit 1 sends a first control signal to the base of the fourth triode Q4. The first control signal is, for example, a low-level signal, which turns off the second triode Q2, the third triode Q3, and the fourth triode Q4. The turned-off second triode Q2 makes the third contact of the second relay Relay2 conduct with the first contact of the second relay Relay2, the second power supply pin S1 of the second interface 22 accesses the power supply signal VCC, and sends the power supply signal VCC to the +3V power supply pin of the functional component interface 42 of the functional expansion component 4. The turned-off third triode Q3 makes the third contact of the third relay Relay3 conduct with the first contact of the third relay Relay3, the second power supply pin S2 of the second interface 22 accesses the power supply signal VCC, and sends the power supply signal VCC to the +5V ALW power supply pin of the functional component interface 42 of the functional expansion component 4. The turned-off fourth triode Q4 makes the third contact of the fourth relay Relay4 conduct with the first contact of the fourth relay Relay4, the second power supply pin S3 of the second interface 22 accesses the power supply signal VCC, and sends the power supply signal VCC to the +3V ALW power supply pin of the functional component interface 42 of the functional expansion component 4, so that the functional expansion component 4 is powered on.

[0051] Optionally, in combination with Figures 1 to 5 , the indication circuit 3 further includes a second detection trigger circuit 34; the control circuit 1 sends a second control signal to the second gating circuit 32 based on the second detection trigger circuit 34 being in a conducting state; the second switching switch 321 selects the second path of the second gating circuit 32 to be connected to the second power supply pin of the second interface 22 based on the second control signal.

[0052] Specifically, before testing whether there is a short circuit between any two pins of the functional component interface 42 of the function expansion component 4, it is necessary to power down the functional component interface 42, turn on the second detection trigger circuit 34. The second detection trigger circuit 34 sends a third trigger signal to the control circuit 1. Based on the third trigger signal, the control circuit 1 sends a second control signal to the second gating circuit 32. The second switching switch 321 in the second gating circuit 32 selects the second path of the first gating circuit 31 to be connected to the second power supply pin of the second interface 22 based on the second control signal, that is, the second moving contact of the second switching switch 321 is connected to the static contact of the first switching switch 311, which means the third contact of the second relay Relay2 is connected to the sixth contact of the second relay Relay2, the third contact of the third relay Relay3 is connected to the sixth contact of the third relay Relay3, the third contact of the fourth relay Relay4 is connected to the sixth contact of the fourth relay Relay4. The second moving contact of the second switching switch 321 is electrically connected to the fourth input / output port of the control circuit 1. The +3V power supply pin of the functional component interface 42 of the function expansion component 4 is electrically connected to the port P2.0 of the control circuit 1. The +5V ALW power supply pin of the functional component interface 42 of the function expansion component 4 is electrically connected to the port P3.0 of the control circuit 1. The +3V ALW power supply pin of the functional component interface 42 of the function expansion component 4 is electrically connected to the port P3.1 of the control circuit 1, so as to power down the function expansion component 4.

[0053] After testing whether there is a short circuit between any two pins of the functional component interface 42 of the function expansion component 4, disconnect the second detection trigger circuit 34. The second detection trigger circuit 34 sends a fourth trigger signal to the control circuit 1. Based on the fourth trigger signal, the control circuit 1 sends a first control signal to the second gating circuit 32. The second switching switch 321 in the second gating circuit 32 selects the first path of the second gating circuit 32 to be connected to the second power supply pin of the second interface 22 based on the first control signal, that is, the first moving contact of the second switching switch 321 is connected to the static contact of the first switching switch 311, which means the third contact of the second relay Relay2 is connected to the first contact of the second relay Relay2, the third contact of the third relay Relay3 is connected to the first contact of the third relay Relay3, the third contact of the fourth relay Relay4 is connected to the first contact of the fourth relay Relay4. The power supply signal VCC is sent to the functional component interface 42 of the function expansion component 4 through the second interface 22, so as to power on the function expansion component 4 interface.

[0054] Optionally, in combination with Figures 1 to 5 , the second detection trigger circuit 34 includes a second switch K2. One end of the second switch K2 is grounded, and the other end is electrically connected to the fourth input / output port of the control circuit 1.

[0055] For example, in combination Figures 1 to 5 Before testing whether any two pins of the functional component interface 42 of the functional expansion component 4 are short-circuited, the second switch K2 is turned on, and the second switch K2 sends a low-level signal to the fourth input / output port of the control circuit 1. The fourth input / output port of the control circuit 1 is, for example, port P3.6 of the control circuit 1. Based on the low-level signal, the control circuit 1 sends a first control signal to the second selection circuit 32. The second switching switch 321 in the second selection circuit 32 selects the second path of the second selection circuit 32 to be connected to the second power supply pin of the second interface 22 based on the second control signal. The second power supply pin S1 of the second interface 22 is electrically connected to port P2.0 of the control circuit 1, the second power supply pin S2 of the second interface 22 is electrically connected to port P3.0 of the control circuit 1, and the second power supply pin S3 of the second interface 22 is electrically connected to port P3.1 of the control circuit 1. Power is no longer supplied to the functional component interface 42, and the interface of the functional expansion component 4 is powered off.

[0056] After testing whether any two pins of the functional component interface 42 of the function expansion component 4 are short-circuited, the second switch K2 is disconnected, and the second switch K2 sends a high-level signal to the control circuit 1. Based on the high-level signal, the control circuit 1 sends a first control signal to the second selection circuit 32. The second switching switch 321 in the second selection circuit 32 selects the first path of the second selection circuit 32 to be connected to the first power supply pin VDD-1 of the second interface 22 based on the first control signal. The second power supply pin S1 of the second interface 22 is connected to the power signal VCC and sends the power signal VCC to the +3V power supply pin of the functional component interface 42 of the function expansion component 4. The second power supply pin S2 of the second interface 22 is connected to the power signal VCC and sends the power signal VCC to the +5VALW power supply pin of the functional component interface 42 of the function expansion component 4. The third power supply pin S3 of the second interface 22 is connected to the power signal VCC and sends the power signal VCC to the +3V ALW power supply pin of the functional component interface 42 of the function expansion component 4, thereby powering on the function expansion component 4.

[0057] Optionally, combined Figures 1 to 5 The indication circuit 3 also includes a warning circuit 35; the control circuit 1 is further used to control the second switching switch 321 through a control signal to form a second moving contact of the first path and the static contact of the second switching switch 321 to be conductive, to assign different levels to any two pins of the second interface 22 of the switching circuit 2, and to send a third control signal to the warning circuit 35 to indicate a short-circuit fault when it is detected that the actual level is different from the assigned level; otherwise, a fourth control signal is sent to the warning circuit 35 to indicate that the short-circuit test has passed.

[0058] Exemplarily, after the functional component interface 42 is powered off, the control circuit 1 assigns different levels to any two pins of the second interface 22 of the switching circuit 2, for example, assigns a high level to pin 3 of the second interface 22 through port P2.1 of the control circuit 1, and assigns a low level to pin 4 of the second interface 22 through port P2.2 of the control circuit 1. After a period of time, when the control circuit 1 detects that the actual level and the amplitude level are different, for example, the actual level of pin 3 of the second interface 22 is a low level, or the actual level of pin 4 of the second interface 22 is a high level, a third control signal is sent to the warning circuit 35 to indicate a short circuit fault; otherwise, a fourth control signal is sent to the warning circuit 35 to indicate that the short circuit test has passed.

[0059] Exemplarily, the warning circuit 35 may be, for example, a sound warning unit 351 and / or a display warning unit 352. The sound warning unit 351 includes a fifth transistor Q5 and a sound warning element Bell. The base of the fifth transistor Q5 is connected to the port P4.0 of the control circuit 1 through the first resistor R1. The emitter of the fifth transistor Q5 is electrically connected to the first end of the sound warning element Bell. The second end of the sound warning element Bell is grounded.

[0060] The display warning unit 352 includes a second resistor R2 and a first display warning element LED-1. The first end of the second resistor R2 is connected to the power signal VCC, the second end of the second resistor R2 is electrically connected to the first end of the first display warning element LED-2, and the second end of the first display warning element LED-1 is electrically connected to port P4.2 of the control circuit 1.

[0061] The display warning unit 352 further includes, for example, a third resistor R3 and a second display warning element LED-2. A first end of the third resistor R3 is connected to the power signal VCC, a second end of the third resistor R3 is electrically connected to a first end of the second display warning element LED-2, and a second end of the second display warning element LED-2 is electrically connected to P4.1 of the control circuit 1.

[0062] When a short circuit fault occurs, the control circuit 1 sends a third control signal to the sound warning unit 351 and / or the first display warning unit 352 to turn on the sound warning unit 351 and / or the first display warning unit 352. For example, port P4.0 of the control circuit 1 sends a high-level signal to the sound warning unit 351 to drive the sound warning element Bell to sound, and / or port P4.2 of the control circuit 1 sends a low-level signal to the first display warning unit 352 to drive the first display warning element LED-1 to display.

[0063] The short - circuit test passes. The port P4.1 of the control circuit 1 sends a fourth control signal to the second display warning unit 352 to turn on the second display warning component LED - 2. The control circuit 1 sends a low - level signal to the second display warning unit 352 to drive the second display warning component LED - 2 to display.

[0064] Optionally, as Figure 5 shown, the control circuit 1 is further configured to obtain a trigger signal of the function expansion component 4 through the transfer circuit 2 and send an indicator light control signal to the function expansion component 4 through the transfer circuit 2 to control the display of the indicator light of the function expansion component 4.

[0065] Specifically, as Figure 5 shown, the indicator lights may include, for example, a power - on light PW_LED, a low - battery light B_LOW_LED, and a battery - charging light B_CHG_LED. The first target pin 9 of the function component interface 42 is electrically connected to the first end of the power - on light PW_LED, the power signal +5VALW is electrically connected to the second end of the power - on light. The second target pin 10 of the function component interface 42 is electrically connected to the first end of the low - battery light B_LOW_LED, the power signal +3VALW is electrically connected to the second end of the low - battery light B_LOW_LED. The third target pin 11 of the function component interface 42 is electrically connected to the first end of the battery - charging light B_CHG_LED, and the power signal +5VALW is electrically connected to the second end of the battery - charging light B_CHG_LED.

[0066] Exemplarily, as Figure 5 shown, when testing whether the function of the function expansion component 4 is normal, the switch SW00 corresponding to the left touch - key signal TP_Left is turned on. The first connection pin 7 of the transfer circuit 2 corresponding to the left touch - key signal TP_Left is pulled down to a low - level signal. The control circuit 1 detects that the port P2.3 connected to the first connection pin 7 of the transfer circuit 2 is pulled down to a low - level signal. The ports P2.5, P2.6, and P2.7 of the control circuit 1 send indicator light control signals to the first target pin 9, the second target pin 10, and the third target pin 11 of the function component interface 42 of the function expansion component 4 through the transfer circuit 2. Based on the power - on light PW_LED, the low - battery light B_LOW_LED, and the battery - charging light B_CHG_LED lighting up, it is determined that the power signal, the left touch - key, the power - on light PW_LED, the low - battery light B_LOW_LED, and the battery - charging light B_CHG_LED corresponding to the connection of the left touch - key signal TP_Left are normal.

[0067] Turn on and connect the switch SW01 corresponding to the right touch button signal TP_Right. The second connection pin 8 of the transfer circuit 2 corresponding to the right touch button signal TP_Right is pulled low to a low-level signal. The control circuit 1 detects that the port P2.4 connected to the second connection pin 8 of the transfer circuit 2 is pulled low to a low-level signal. The port P2.5, port P2.6, and port P2.7 of the control circuit 1 send indicator control signals to the first target pin 9, second target pin 10, and third target pin 11 of the function component interface 42 of the function expansion component 4 through the transfer circuit 2. Based on the power-on light PW_LED, battery low-power light B_LOW_LED, and battery charging light B_CHG_LED lighting up, it is determined that the power signal, right touch button, power-on light PW_LED, battery low-power light B_LOW_LED, and battery charging light B_CHG_LED corresponding to the connection of the right touch button signal TP_Righ are normal.

[0068] Thus, the function test is carried out by using the indicator of the function expansion component 4 itself, which simplifies the circuit layout and eliminates the need to introduce additional circuits.

[0069] The overall test process of the function expansion component will be described below in combination with the specific circuit structure.

[0070] Insert the function expansion component to be tested into the relevant interfaces of the circuit and the main board 5, power on the circuit, and turn on the main board 5 to enter the operation interface. Press the switch SW00 corresponding to TP_Left to test the functions of the left touch button, power-on light PW_LED, battery low-power light B_LOW_LED, and battery charging light B_CHG_LED. Press the switch SW01 corresponding to TP_Right to test the functions of the right touch button, power-on light PW_LED, battery low-power light B_LOW_LED, and battery charging light B_CHG_LED. Press the second switch K2 to perform a short-circuit test on the function expansion component, and confirm the short-circuit condition of the function expansion component according to the sound warning unit 351 and / or the display warning unit 352. Release the second switch K2, insert the storage device into the storage device interface 41, press the first switch K1, test the function of the storage device interface 41, and the operating system interface prompts that the storage device test is normal, and the test is completed.

[0071] The embodiment of the present application also provides an electronic device. The electronic device includes the circuit for testing the function expansion component as provided in the above embodiment. Therefore, it can also solve the same technical problems as the above embodiment of the circuit for testing the function expansion component and achieve the same technical effects, which will not be elaborated here.

[0072] The circuit and electronic device for testing the function expansion component provided by this application test the function expansion component by setting a control circuit in combination with an indication circuit and a transfer circuit. The control circuit sends different control signals to the gating circuit in the indication circuit to control the power-on or power-off of the function expansion component, realizing the function of inserting or removing the function expansion component when the main board boots into the operating system, that is, realizing the hot pluggable function of the function expansion component. It only needs to boot once into the OS to perform repeated tests, without having to control the power-on or power-off of the function expansion component by controlling the power-on and power-off of the main board 5 every time the function expansion component is replaced, shortening the replacement time of the function expansion component, and thus also shortening the test time of the function expansion component, improving the test efficiency of the function expansion component, and simplifying the operation steps.

[0073] It should be noted that in this text, relational terms such as "first" and "second" are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. Moreover, the term "comprising", "including" or any other variant thereof is intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements not only includes those elements, but also includes other elements not expressly listed, or also includes elements inherent to such process, method, article or device. Without further limitation, an element defined by the statement "including a..." does not exclude the existence of additional identical elements in the process, method, article or device including the element.

[0074] The above are only the specific implementation manners of this application, enabling those skilled in the art to understand or implement this application. Various modifications to these embodiments will be obvious to those skilled in the art, and the general principles defined herein can be implemented in other embodiments without departing from the spirit or scope of this application. Therefore, this application will not be limited to these embodiments herein, but will conform to the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A circuit for testing a function expansion component, characterized in that, Including: A control circuit, a switching circuit, and an indication circuit; The control circuit is electrically connected to the indication circuit and the switching circuit respectively through a plurality of input / output ports. The switching circuit is used to be electrically connected to each signal pin on the function expansion component through a plurality of connection pins. The control circuit is used to test the function expansion component in combination with the indication circuit and the switching circuit; The indication circuit includes a gating circuit. The gating circuit is used to select the connection between the first path or the second path of the gating circuit and the power supply pin among the connection pins of the switching circuit according to a control signal from the control circuit. Among them, the first path is connected to the power supply pin among the connection pins of the switching circuit, and the function expansion component is powered on. The second path is connected to the power supply pin among the connection pins of the switching circuit, and the function expansion component is powered off.

2. The circuit for functional expansion component testing according to claim 1, characterized in that, The switching circuit includes a first interface, and the first interface is used to be electrically connected to the storage device interface of the function expansion component; The gating circuit includes a first gating circuit. The first gating circuit includes a first switching switch. The control end of the first switching switch is electrically connected to the first input / output port of the control circuit. The static contact of the first switching switch is connected to the first power supply pin of the first interface. The first moving contact of the first switching switch receives a power signal. The second moving contact of the first switching switch is suspended; When the first moving contact of the first switching switch is conducted with the static contact of the first switching switch, a first path is formed. When the second moving contact of the first switching switch is conducted with the static contact of the first switching switch, a second path is formed.

3. The circuit for testing the function expansion component according to claim 2, characterized in that, The first gating circuit further includes a first triode, and the first input / output port of the control circuit is electrically connected to the first switching switch through the first triode.

4. The circuit for testing the function expansion component according to claim 2, wherein, The indication circuit further includes a first detection trigger circuit. Based on the first detection trigger circuit being in a conducting state, the control circuit sends a first control signal to the first gating circuit. The first switching switch selects the connection between the first path of the first gating circuit and the first power supply pin of the first interface based on the first control signal.

5. The circuit for testing a function expansion component according to claim 4, characterized in that, The first detection trigger circuit includes a first switch. One end of the first switch is grounded, and the other end is electrically connected to the second input / output port of the control circuit.

6. The circuit for testing a function expansion component according to claim 1, wherein The switching circuit includes a second interface, and the second interface is used to be electrically connected to the function component interface of the function expansion component; The gating circuit includes a second gating circuit. The second gating circuit includes a second switching switch. The control end of the second switching switch is electrically connected to the third input / output port of the control circuit. The static contact of the second switching switch is connected to the second power supply pin of the second interface. The first moving contact of the second switching switch receives a power signal. The second moving contact of the second switching switch is electrically connected to the fourth input / output port of the control circuit; The first movable contact of the second switch is connected to the static contact of the second switch to form a first path; the second movable contact of the second switch is connected to the static contact of the second switch to form a second path.

7. The circuit for testing the function expansion component according to claim 6, characterized in that, The second gating circuit further includes a second transistor, and the third input and output port of the control circuit is electrically connected to the second switch via the second transistor.

8. The circuit for functional expansion component testing according to claim 6, characterized in that, The indication circuit also includes a second detection trigger circuit; the control circuit sends a second control signal to the second selection circuit based on the second detection trigger circuit being in the on state; the second switching switch selects the second path of the second selection circuit to be connected to the second power supply pin of the second interface based on the second control signal.

9. The circuit for testing the function expansion component according to claim 8, characterized in that, The second detection trigger circuit includes a second switch, one end of the second switch is grounded, and the other end is electrically connected to the fourth input / output port of the control circuit.

10. The circuit for testing the function expansion component according to claim 6, characterized in that, The indicator circuit also includes a warning circuit; The control circuit is further configured to assign different levels to any two pins of the second interface of the transfer circuit when the second moving contact of the second switching switch forming the first path is connected to the static contact of the second switching switch through a control signal, and to send a third control signal to the warning circuit to indicate a short circuit fault when it is detected that the actual level is different from the assigned level; otherwise, a fourth control signal is sent to the warning circuit to indicate that the short circuit test has passed.

11. The circuit for testing the function expansion component according to claim 1, characterized in that, The control circuit is further configured to obtain a trigger signal of the function expansion component through the switching circuit, and send an indicator light control signal to the function expansion component through the switching circuit to control the display of the indicator light of the function expansion component.

12. An electronic device, characterized in that, The invention comprises a system for testing a function expansion component as claimed in any one of claims 1 to 11.