Electronic component wholesale platform based on multi-channel data synchronous optimization

Abstract

The invention discloses an electronic component wholesale platform based on multi-channel data synchronous optimization, and relates to the technical field of electronic component warehousing management. The electronic component wholesale platform based on multi-channel data synchronous optimization comprises a batch quality inspection difference analysis module, a warehousing area storage monitoring module and a warehousing optimization mark judgment module. According to the method, the difference analysis is carried out on the quality detection data of each link of the electronic component so as to judge whether to execute the quality sampling detection of the electronic component and obtain the warehousing sending instruction, and then the electronic component is stored in different regions and the storage performance is monitored; and finally, carrying out storage performance monitoring optimization on the electronic components in the batch area, and judging whether to execute area storage result visualization or not, thereby realizing more accurate warehousing management of the electronic components. The problem that in the prior art, quality differences are not fully considered in the warehousing management process of electronic components after wholesale by an electronic component wholesale platform is solved.

Description

Technical Field

[0001] The present invention relates to the technical field of warehousing management of electronic components, and particularly to an electronic component wholesale platform optimized based on multi-channel data synchronization. Background Art

[0002] Electronic component wholesale platforms aim to provide convenient trading and information management services for electronic component suppliers, wholesalers, distributors, and end customers. With the rapid development of electronic technology and the increasing demand for components, many problems have gradually emerged in traditional procurement models and inventory management methods, such as information asymmetry, cumbersome procurement processes, and difficult inventory management. On many existing wholesale platforms, product quality management and inventory management are separate systems, and there is a lack of effective communication and data sharing mechanisms between the two. The quality inspection of components mainly relies on manual spot checks and the quality guarantees of suppliers, but lacks a systematic quality control mechanism. Especially when purchasing a large number of components, it is difficult to conduct a comprehensive inspection of each component. In addition, if the platform's inspection and quality spot checks on incoming components are not strict enough, the inspection processes and standards may be relatively loose. It may only rely on the supplier's certificate of conformity or randomly sample some products, while ignoring the comprehensive inspection of all incoming components. In order to improve trading efficiency, reduce costs, and achieve precise docking of the supply chain, electronic component wholesale platforms have emerged. The functions of electronic component wholesale platforms are not limited to providing a trading medium. More importantly, through multi-channel data synchronization and intelligent management, they optimize procurement, inventory, logistics, and other links to improve the efficiency of the entire supply chain, thereby promoting the rapid development of the industry.

[0003] Existing electronic component wholesale platforms usually have multiple suppliers and procurement sources. The warehousing process requires multiple steps such as order confirmation, acceptance, and barcode scanning for warehousing. The platform automatically records all warehousing times, quantities, prices, and other information and updates the inventory data in a timely manner. The use of barcode or QR code scanning technology helps the platform accurately record and track inventory. Each electronic component has a unique barcode or QR code, and warehouse staff can quickly complete warehousing, outbound, and inventory counting operations through scanning. In addition, the inventory system is integrated with the order management system, procurement system, etc. When an order is created, shipped, or returned, the inventory data is updated in real time.

[0004] For example, the patent application with publication number CN117993766A discloses a rapid electronic component inspection method and an electronic component procurement management system, which includes: an electronic component procurement management platform generates an electronic component purchase order based on a first instruction from a selection unit, and generates an electronic component inspection plan based on the electronic component purchase order and a second instruction from the selection unit. The electronic component inspection plan generated based on the electronic component purchase order and the second instruction from the selection unit includes: determining the specification requirements corresponding to the target electronic component based on the electronic component purchase order and determining basic inspection items; determining additional inspection items based on the second instruction from the selection unit; merging the basic inspection items and additional inspection items to obtain target inspection items; determining a target inspection sample that meets the minimum loss requirement based on the inspection requirements of the target inspection item; and generating an electronic component inspection plan.

[0005] For example, the invention patent announcement with announcement number: CN117541029B discloses a multi-channel logistics big data analysis and inference system, which includes: a logistics data entry module, which is used to enter logistics data through an inference service processor; a data multi-source coupling processing module, which is used to pre-screen each transportation logistics chain based on logistics data, and obtain the execution fit of each transportation logistics chain through multi-source coupling processing; and an inference execution shared cloud, which is used to lock the target execution transportation system for shared push display.

[0006] However, in the process of implementing the technical solutions of the invention in the embodiments of the present application, the present application found that the above technology has at least the following technical problems: During the electronic component procurement process, suppliers may provide substandard or inconsistently quality components. Inadequate component quality inspections or unclear standards can easily lead to substandard components entering inventory. The involvement of unqualified suppliers can easily lead to platforms purchasing substandard components, which in turn affects the quality of electronic component inventory. Furthermore, the storage environment of electronic components significantly impacts their quality. A poor storage environment can cause damage or performance degradation. If these inspection cycles are too long or infrequent, quality issues during storage may go undetected.

[0007] In the existing technology, due to the lack of precise inventory quality management of electronic components, inventory management work only stays at the quantity level, ignoring the evaluation of the quality of electronic components, resulting in components with quality problems continuing to occupy the inventory. There is also a problem that the electronic component wholesale platform does not fully consider the quality differences in the warehousing management process of electronic components after wholesale. Summary of the Invention

[0008] Embodiments of the present application provide an electronic component wholesale platform optimized based on multi-channel data synchronization, which solves the problem in the prior art that the quality differences are not fully considered in the warehousing management process after the wholesale of electronic components, and realizes more accurate warehousing management of electronic components.

[0009] Embodiments of the present application provide an electronic component wholesale platform optimized based on multi-channel data synchronization, including: a batch quality inspection difference analysis module, a warehousing area storage monitoring module, and a warehousing optimization marking judgment module; the batch quality inspection difference analysis module is used to perform difference analysis on the quality inspection data of each link of the electronic components of the preset purchase batch, and based on the results of the difference analysis, judge the quality sampling inspection of the electronic components and obtain the warehousing sending instruction; the warehousing area storage monitoring module is used to, when the warehousing sending instruction of the electronic components of the preset purchase batch is allowed to be warehoused, store the electronic components of the preset purchase batch in different regions in combination with the quality sampling inspection results of the electronic components, and monitor the storage performance of the stored electronic components based on the quality inspection warning cycle of each region to obtain the component storage performance monitoring results; the warehousing optimization marking judgment module is used to optimize the storage performance monitoring of the electronic components stored in the batch area in combination with the component storage performance monitoring results. After performing the storage performance monitoring optimization, judge whether the electronic component wholesale platform sends a warehousing marking instruction, and judge whether to execute the visualization of the regional storage result to the platform visualization interface based on the ratio result of the marked area to the batch area.

[0010] Furthermore, perform a difference analysis on the quality inspection data of each link of the preset procurement batch of electronic components. The specific steps are as follows: Obtain the quality inspection data of the preset procurement batch of electronic components. The quality inspection data includes the appearance quality inspection defect rate, the size quality inspection pass rate, and the performance quality inspection pass rate. The appearance quality inspection defect rate includes the appearance production quality inspection defect rate, the appearance supply quality inspection defect rate, and the appearance acceptance quality inspection defect rate. Based on the appearance quality inspection defect rate, perform a parameter interaction difference analysis to obtain the appearance defect rate difference value. The appearance defect rate difference value includes the production-supply defect difference value, the production-acceptance defect difference value, and the supply-acceptance defect difference value. The size quality inspection pass rate includes the size production quality inspection pass rate, the size supply quality inspection pass rate, and the size acceptance quality inspection pass rate. Based on the size quality inspection pass rate, perform a parameter interaction difference analysis to obtain the size pass rate difference value. The size pass rate difference value includes the production-supply size difference value, the production-acceptance size difference value, and the supply-acceptance size difference value. The performance quality inspection pass rate includes the performance production quality inspection pass rate, the performance supply quality inspection pass rate, and the performance acceptance quality inspection pass rate. Based on the performance quality inspection pass rate, perform a parameter interaction difference analysis to obtain the performance pass rate difference value. The performance pass rate difference value includes the production-supply performance difference value, the production-acceptance performance difference value, and the supply-acceptance performance difference value. Based on the appearance defect rate difference value, the size pass rate difference value, and the performance pass rate difference value, obtain the corresponding maximum quality inspection difference value. Perform a difference ratio analysis on the maximum quality inspection difference value and the reference difference value obtained from the preset database to obtain the difference ratio result of the maximum quality inspection difference value. The maximum quality inspection difference value includes the maximum appearance defect difference, the maximum size pass difference, and the maximum performance pass difference. The reference difference value includes the reference minimum appearance defect difference, the reference minimum size pass difference, and the reference minimum performance pass difference. The difference ratio result of the maximum quality inspection difference value includes the appearance difference ratio result, the size difference ratio result, and the performance difference ratio result. Perform a weighted operation and coupling process on the difference ratio result of the maximum quality inspection difference value and the corresponding difference evaluation compensation value to obtain the quality inspection difference detection value. The difference evaluation compensation value includes the appearance quality inspection difference compensation value, the size quality inspection difference compensation value, and the performance quality inspection difference compensation value. The quality inspection difference detection value is used to quantitatively evaluate the difference degree of the quality inspection data of each link of the preset procurement batch of electronic components. The quality inspection difference detection value represents the quantitative data of the combined impact of the maximum appearance defect difference, the maximum size pass difference, and the maximum performance pass difference on the difference degree of the quality inspection data of each link of the preset procurement batch of electronic components.

[0011] Further, the judgment of the quality sampling inspection of electronic components is carried out, and the specific process is as follows: According to the preset allowable threshold range obtained from the preset database, it is judged whether the obtained quality inspection difference detection value is within the preset allowable threshold range; if the quality inspection difference detection value is within the preset allowable threshold range obtained from the preset database, the quality sampling inspection of electronic components is not performed, and the quality sampling inspection result of electronic components is recorded as qualified for quality inspection differences and no sampling inspection is carried out; if the quality inspection difference detection value is not within the preset allowable threshold range obtained from the preset database, the quality sampling inspection of electronic components is carried out in combination with the preset sampling ratio, and the quality sampling inspection result of electronic components is recorded as to be sampled; the preset sampling ratio represents the result of mapping the real-time quality inspection difference detection value into the quality sampling mapping set in the preset database, and the quality sampling mapping set represents the mapping relationship between the quality inspection difference detection value and the preset sampling ratio.

[0012] Further, the acquisition of the warehousing sending instruction is as follows: When the quality sampling inspection result of electronic components is qualified for quality inspection differences and no sampling inspection is carried out, an allowable warehousing instruction is sent to the electronic components of the preset purchase batch; when the quality sampling inspection result of electronic components is to be sampled, the sampling quality pass rate after the quality sampling inspection of electronic components is obtained; the obtained sampling quality pass rate is compared and judged with the sampling pass rate threshold obtained from the preset database; if the obtained sampling quality pass rate is not less than the sampling pass rate threshold, an allowable warehousing instruction is sent to the electronic components of the preset purchase batch, otherwise, a rejection warehousing instruction is sent to the electronic components of the preset purchase batch. [[ID=�]]

[0013] Further, the electronic components of the preset purchase batch are stored in different regions in combination with the quality sampling inspection result of electronic components, and the specific process is as follows: If the quality sampling inspection result of electronic components is qualified for quality inspection differences and no sampling inspection is carried out, the electronic components of the corresponding preset purchase batch are stored in the qualified area; if the quality sampling inspection result of electronic components is to be sampled, the electronic components of the preset purchase batch are stored in the warning area based on the preset number of warning areas; the preset number of warning areas represents the result of mapping the real-time sampling quality pass rate into the warning area mapping set in the preset database, and the warning area mapping set represents the mapping relationship between the sampling quality pass rate and the preset number of warning areas.

[0014] Further, the storage performance of the stored electronic components is monitored based on the quality inspection warning periods of each region, and the specific steps are as follows: Obtain the storage performance monitoring data of the preset electronic components within the quality inspection warning periods of each region. The storage performance monitoring data includes storage performance data and performance monitoring interference data; the storage performance data includes component leakage current and component noise margin; the performance monitoring interference data includes monitoring static electricity intensity, monitoring temperature, monitoring humidity, and monitoring electromagnetic interference; Perform weighted operation on the proportion of monitoring static electricity intensity difference, the proportion of monitoring temperature difference, and the proportion of monitoring humidity difference with the corresponding interference difference compensation values and then perform coupling processing to obtain the conductive interference compensation amount. The interference difference compensation values include static electricity interference compensation value, temperature interference compensation value, and humidity interference compensation value; Correct the component leakage current approximation operation according to the obtained conductive interference compensation amount, correct the component noise margin ratio result by the monitoring electromagnetic interference approximation operation, and then perform weighted operation and coupling with the corresponding performance compensation values to obtain the component storage detection value; The performance compensation values include conductive performance monitoring compensation value and anti-interference performance monitoring compensation value; The component storage detection value is used to quantitatively evaluate the performance monitoring quality of the stored electronic components in the corresponding region; The component storage detection value represents the quantitative data for evaluating the performance monitoring quality of the stored electronic components jointly by the storage performance data and the performance monitoring interference data.

[0015] Further, the specific process for obtaining the component storage performance monitoring result is as follows: Determine whether the obtained component storage detection value is within the preset storage monitoring threshold range obtained from the preset database; If the component storage detection value is within the preset storage monitoring threshold range obtained from the preset database, the component storage performance monitoring result is that the components are to be optimized for storage monitoring; If the component storage detection value is not within the preset storage monitoring threshold range obtained from the preset database, the component storage performance monitoring result is that the components are to be optimized for storage spot-checking.

[0016] Further, the specific steps for optimizing the storage performance monitoring of the stored electronic components in the batch region in combination with the component storage performance monitoring result are as follows: When the component storage performance monitoring result is that the components are to be optimized for storage monitoring, map based on the deviation degree between the component storage detection value and the reference component storage detection value into the storage monitoring mapping set in the preset database to obtain the optimized monitoring frequency. The storage monitoring mapping set represents the mapping relationship between the component storage detection value and the optimized monitoring frequency; When the component storage performance monitoring result is that the components are to be optimized for storage spot-checking, map based on the deviation degree between the component storage detection value and the reference component storage detection value into the storage spot-checking mapping set in the preset database to obtain the optimized spot-checking frequency. The storage spot-checking mapping set represents the mapping relationship between the component storage detection value and the optimized spot-checking frequency.

[0017] Further, to determine whether the electronic component wholesale platform sends a warehousing marking instruction, the specific process is as follows: Obtain the optimized sampling frequency for storing electronic components in the batch area, and compare and judge the obtained optimized sampling frequency with the preset maximum sampling frequency obtained from the preset database; when the obtained optimized sampling frequency is greater than the preset maximum sampling frequency obtained from the preset database, the electronic component wholesale platform sends a warehousing marking instruction.

[0018] Further, based on the ratio result of the marked area to the batch area, determine whether to perform the visualization of the area storage result to the platform visualization interface. The specific process is as follows: Combine the ratio result of the marked area to the batch area with the reference area ratio range obtained from the preset database for judgment; if the ratio result of the marked area to the batch area is within the reference area ratio range obtained from the preset database, do not perform the visualization of the area storage result to the platform visualization interface, and continuously monitor the ratio result of the marked area to the batch area; if the ratio result of the marked area to the batch area is not within the reference area ratio range obtained from the preset database, perform the visualization of the area storage result to the platform visualization interface.

[0019] One or more technical solutions provided in the embodiments of the present application have at least the following technical effects or advantages: 1. By performing a difference analysis on the quality inspection data of each link of the electronic components to determine whether to perform the quality sampling inspection of the electronic components and obtain the warehousing sending instruction, then storing the electronic components in different areas and monitoring the storage performance, and finally optimizing the storage performance monitoring of the electronic components in the batch area and determining whether to perform the visualization of the area storage result, the quality management of the electronic components before warehousing and during the storage process by the electronic component wholesale platform is further improved, and thus more accurate warehousing management of the electronic components is achieved, effectively solving the problem that the quality differences are not fully considered in the warehousing management process of the electronic component wholesale platform after the wholesale of the electronic components in the prior art.

[0020] 2. By judging whether the quality inspection difference detection value is within the preset difference allowable threshold range to determine the quality sampling inspection of the electronic components. If the quality inspection difference detection value is not within the preset difference allowable threshold range obtained from the preset database, the quality sampling inspection of the electronic components is performed in combination with the preset sampling ratio, so as to achieve a more accurate judgment of the difference analysis of the quality inspection data of each link of the electronic components in the preset purchase batch, and perform the quality sampling inspection of the electronic components in combination with the judgment result, and further improve the quality management of the electronic components before warehousing by the electronic component wholesale platform.

[0021] 3. By determining whether the detected component storage value is within the preset storage monitoring threshold range obtained from the preset database, and then combining the component storage performance monitoring results to optimize the storage performance monitoring of the electronic components stored in the batch area, the corresponding optimized monitoring frequency and optimized sampling frequency are obtained, thus achieving a more accurate judgment of the performance monitoring quality of the electronic components in the storage area, and further improving the quality management in the process of storage monitoring of electronic components by the electronic component wholesale platform. Description of the Drawings

[0022] Figure 1 The structural schematic diagram of the electronic component wholesale platform based on multi-channel data synchronization optimization provided by the embodiment of the present application. Detailed Embodiments

[0023] The embodiment of the present application provides an electronic component wholesale platform based on multi-channel data synchronization optimization, which solves the problem of imperfect inventory quality management of electronic components in the existing electronic component wholesale platform. By performing difference analysis on the quality inspection data of each link of the preset purchase batch of electronic components, and based on the results of the difference analysis, making a judgment on the quality sampling inspection of electronic components and obtaining the warehousing sending instruction. Then, combining the quality sampling inspection results of electronic components, the electronic components of the preset purchase batch are stored in different areas. Based on the quality inspection warning period of each area, the storage performance of the stored electronic components is monitored to obtain the component storage performance monitoring results. Finally, combining the component storage performance monitoring results, the storage performance monitoring of the electronic components stored in the batch area is optimized to judge whether the electronic component wholesale platform sends the warehousing marking instruction, and according to the ratio result of the marked area and the batch area, it is judged whether to execute the visualization of the area storage result to the platform visualization interface, realizing more accurate warehousing management of electronic components.

[0024] The technical solution in the embodiment of the present application is to solve the problem that the quality differences are not fully considered in the warehousing management process after the wholesale of electronic components by the electronic component wholesale platform. The general idea is as follows: By performing difference analysis on the quality inspection data of each link of the electronic components to judge whether to perform quality sampling inspection of the electronic components and obtain the warehousing sending instruction, then storing the electronic components in different areas and performing storage performance monitoring, and finally combining the component storage performance monitoring results to perform storage performance monitoring optimization, and judging whether to visualize the area storage result to the platform visualization interface, achieving the effect of more accurate warehousing management of electronic components.

[0025] In order to better understand the above technical solution, the above technical solution will be described in detail below in combination with the accompanying drawings of the specification and specific embodiments.

[0026] As shown Figure 1 in the figure, it is a schematic structural diagram of an electronic component wholesale platform based on multi-channel data synchronization optimization provided by an embodiment of the present application. The electronic component wholesale platform based on multi-channel data synchronization optimization provided by the embodiment of the present application includes: a batch quality inspection difference analysis module, a warehousing area storage monitoring module, and a warehousing optimization marking judgment module; the batch quality inspection difference analysis module is used to perform difference analysis on the quality inspection data of each link of the electronic components of a preset purchase batch, and based on the results of the difference analysis, judge the quality sampling inspection of the electronic components and obtain the warehousing sending instruction; the warehousing area storage monitoring module is used to, when the warehousing sending instruction of the electronic components of the preset purchase batch is allowed to be warehoused, combine the quality sampling inspection results of the electronic components to store the electronic components of the preset purchase batch in different areas, and monitor the storage performance of the stored electronic components based on the quality inspection warning period of each area to obtain the component storage performance monitoring results; the warehousing optimization marking judgment module is used to combine the component storage performance monitoring results to optimize the storage performance monitoring of the electronic components stored in the batch area. After performing the storage performance monitoring optimization, judge whether the electronic component wholesale platform sends a warehousing marking instruction, and based on the ratio result of the marked area to the batch area, judge whether to execute the visualization of the area storage result to the platform visualization interface.

[0027] In this embodiment, for example, semiconductor components (integrated circuits) are basic components that can play specific functions in electronic circuits. Semiconductor components (taking integrated circuits as an example), as high-precision and high-integration electronic components, are crucial for the quality, reliability, and final use effect of products. High-end electronic components such as integrated circuits have very strict environmental requirements during storage and transportation, such as temperature and humidity control, anti-static protection, etc. If not properly managed, it will lead to device performance degradation or failure.

[0028] In the operation of the electronic component wholesale platform, when the electronic components are warehoused, there is a lack of strict quality inspection procedures, and the appearance, function, and specifications of the components are not comprehensively inspected, resulting in unqualified products entering the inventory. At the same time, during the storage process of the electronic components in the inventory, there is a lack of continuous monitoring of the performance. Once the environmental conditions change, or the components have not been used for a long time, it may lead to quality degradation, but due to the lack of monitoring, it cannot be detected in time. To solve the many problems existing in the inventory management during the electronic component wholesale process, the electronic component wholesale platform must take measures to strengthen the inventory quality management. The algorithm of the present application effectively reduces product failures caused by component quality problems and improves the overall reliability of electronic components by further improving the quality management before and during the storage process of electronic components, which is of great significance for enterprises to enhance market competitiveness, ensure product reliability, and improve customer satisfaction.

[0029] Further, perform a differential analysis on the quality inspection data of each link of the preset procurement batch of electronic components. The specific steps are as follows: A1. Obtain the quality inspection data of the preset procurement batch of electronic components. The quality inspection data includes the appearance quality inspection defect rate, the size quality inspection pass rate, and the performance quality inspection pass rate. Among them, the appearance quality inspection defect rate includes the appearance production quality inspection defect rate, the appearance supply quality inspection defect rate, and the appearance acceptance quality inspection defect rate; the size quality inspection pass rate includes the size production quality inspection pass rate, the size supply quality inspection pass rate, and the size acceptance quality inspection pass rate; the performance quality inspection pass rate includes the performance production quality inspection pass rate, the performance supply quality inspection pass rate, and the performance acceptance quality inspection pass rate. Specifically, obtain the appearance production quality inspection defect rate, the size production quality inspection pass rate, and the performance production quality inspection pass rate through the production quality management system (Intelligent Quality Solutions); obtain the appearance supply quality inspection defect rate, the size supply quality inspection pass rate, and the performance supply quality inspection pass rate through the supply quality management system (SupplierSoft); obtain the appearance acceptance quality inspection defect rate, the size acceptance quality inspection pass rate, and the performance acceptance quality inspection pass rate through the acceptance quality management system (MasterControl).

[0030] A2. Perform a parameter interaction differential analysis based on the appearance quality inspection defect rate to obtain the appearance defect rate difference value. The appearance defect rate difference value includes the production - supply defect difference value, the production - acceptance defect difference value, and the supply - acceptance defect difference value. The method for obtaining the appearance defect rate difference value is as follows: ; ; ; In the formula, represents the batch number of the purchased electronic components, , represents the total quantity of the purchased electronic component batch, represents the production - supply defect difference value of the nth batch of the purchased electronic components, represents the production - acceptance defect difference value of the nth batch of the purchased electronic components, represents the supply - acceptance defect difference value of the nth batch of the purchased electronic components, represents the appearance production quality inspection defect rate of the nth batch of the purchased electronic components, represents the appearance supply quality inspection defect rate of the nth batch of the purchased electronic components, represents the appearance acceptance quality inspection defect rate of the nth batch of the purchased electronic components.

[0031] A3. Based on the qualified rate of dimensional quality inspection, perform parameter interaction difference analysis to obtain the dimensional qualified rate difference value, which includes the production - supply dimensional difference value, the production - acceptance dimensional difference value, and the supply - acceptance dimensional difference value. The method for obtaining the dimensional qualified rate difference value is as follows: ; ; ; In the formula, represents the production - supply dimensional difference value of the nth batch of purchased electronic components, represents the production - acceptance dimensional difference value of the nth batch of purchased electronic components, represents the supply - acceptance dimensional difference value of the nth batch of purchased electronic components, represents the dimensional production quality inspection qualified rate of the nth batch of purchased electronic components, represents the dimensional supply quality inspection qualified rate of the nth batch of purchased electronic components, represents the dimensional acceptance quality inspection qualified rate of the nth batch of purchased electronic components.

[0032] A4. Based on the qualified rate of performance quality inspection, perform parameter interaction difference analysis to obtain the performance qualified rate difference value, which includes the production - supply performance difference value, the production - acceptance performance difference value, and the supply - acceptance performance difference value. The method for obtaining the performance qualified rate difference value is as follows: ; ; ; In the formula, represents the production - supply performance difference value of the nth batch of purchased electronic components, represents the production - acceptance performance difference value of the nth batch of purchased electronic components, represents the supply - acceptance performance difference value of the nth batch of purchased electronic components, represents the performance production quality inspection qualified rate of the nth batch of purchased electronic components, represents the performance supply quality inspection qualified rate of the nth batch of purchased electronic components, represents the performance acceptance quality inspection qualified rate of the nth batch of purchased electronic components.

[0033] A5. Based on the appearance defect rate difference value, the dimensional qualified rate difference value, and the performance qualified rate difference value, obtain the corresponding maximum quality inspection difference value, and perform difference ratio analysis on the maximum quality inspection difference value and the reference difference value obtained from the preset database to obtain the difference ratio result of the maximum quality inspection difference value. The method for obtaining the difference ratio result of the maximum quality inspection difference value is as follows: ; ; ; Wherein, represents the proportion result of the appearance difference of the nth batch of purchased electronic components, represents the proportion result of the size difference of the nth batch of purchased electronic components, represents the proportion result of the performance difference of the nth batch of purchased electronic components, represents the maximum appearance defect difference of the nth batch of purchased electronic components, represents the maximum size qualification difference of the nth batch of purchased electronic components, represents the maximum performance qualification difference of the nth batch of purchased electronic components, represents the reference minimum appearance defect difference, represents the reference minimum size qualification difference, represents the reference minimum performance qualification difference.

[0034] It should be added that the proportion result of the maximum difference value in quality inspection includes the proportion result of appearance difference, the proportion result of size difference, and the proportion result of performance difference; the maximum difference value in quality inspection includes the maximum appearance defect difference, the maximum size qualification difference, and the maximum performance qualification difference, and the corresponding maximum appearance defect difference, maximum size qualification difference, and maximum performance qualification difference are obtained through statistical analysis of the appearance defect rate difference value, size qualification rate difference value, and performance qualification rate difference value respectively by using the max function in Python. The reference difference value includes the reference minimum appearance defect difference, the reference minimum size qualification difference, and the reference minimum performance qualification difference, and the corresponding reference minimum appearance defect difference, reference minimum size qualification difference, and reference minimum performance qualification difference are represented by the minimum values corresponding to the collected historical maximum appearance defect difference, maximum size qualification difference, and maximum performance qualification difference respectively.

[0035] A6, perform a weighted operation on the proportion result of the maximum difference value in quality inspection and the corresponding difference evaluation compensation value and then perform a coupling process to obtain the quality inspection difference detection value. The method for obtaining the quality inspection difference detection value is as follows: ; Wherein, represents the quality inspection difference detection value of the nth batch of purchased electronic components, represents the appearance quality inspection difference compensation value, represents the size quality inspection difference compensation value, represents the performance quality inspection difference compensation value, represents the proportion result of the appearance difference of the nth batch of purchased electronic components, It represents the proportion result of the size difference of the nth batch of purchased electronic components. It represents the proportion result of the performance difference of the nth batch of purchased electronic components.

[0036] It should be understood that the quality inspection difference detection value represents the quantitative data of the degree of difference in the quality inspection data of each link of the electronic components of the preset purchase batch, which is jointly affected by the maximum appearance defect difference, the maximum size qualification difference, and the maximum performance qualification difference, and is used to quantitatively evaluate the degree of difference in the quality inspection data of each link of the electronic components of the preset purchase batch; among them, the quality inspection difference detection value includes the influence of multiple aspects of parameters. Specifically, with the increase of the appearance difference proportion result (i.e., with the increase of the maximum appearance defect difference), the size difference proportion result (i.e., with the increase of the maximum size qualification difference), and the performance difference proportion result (i.e., with the increase of the maximum performance qualification difference), the quality inspection difference detection value increases accordingly. The difference evaluation compensation value includes the appearance quality inspection difference compensation value, the size quality inspection difference compensation value, and the performance quality inspection difference compensation value; it is obtained from the preset database. For example, the real-time appearance difference proportion result (i.e., in the quality inspection difference detection value), the size difference proportion result (i.e., in the quality inspection difference detection value), and the performance difference proportion result (i.e., in the quality inspection difference detection value) are input into the mapping set of the appearance difference proportion result, the size difference proportion result, and the performance difference proportion result preset in the database and their corresponding compensation values respectively to obtain the corresponding appearance quality inspection difference compensation value, the size quality inspection difference compensation value, and the performance quality inspection difference compensation value.

[0037] In this embodiment, through comprehensive quantitative analysis of the correlation and mutual influence among multiple aspects of parameters in the quality inspection difference detection value. For example, taking semiconductor components (integrated circuits) as an example, if the appearance defects involve packaging and welding problems, it may lead to unstable signal transmission or poor electrical contact, thereby affecting performance. That is, when the appearance defect rate difference value and the appearance difference proportion result increase, the performance qualification rate difference value and the performance difference proportion result increase accordingly; the increase in size difference may cause problems in the packaging process of semiconductor components, resulting in uneven packaging appearance, and even appearance defects such as cracks, bubbles, or poor packaging. Appearance defects (such as surface scratches, packaging cracks) may directly affect the performance of semiconductor components. That is, with the increase of the maximum size qualification difference, the maximum appearance defect difference increases accordingly, so that the size difference proportion result and the appearance difference proportion result increase accordingly, and further the quality inspection difference detection value also increases accordingly, and the degree of difference in the quality inspection data of each link of the electronic components of the preset purchase batch increases.

[0038] Through the quantitative evaluation of the degree of difference in the quality inspection data of each link of the preset procurement batch of electronic components, the quality control of the preset procurement batch of electronic components before warehousing is realized, and further the inventory quality management of the electronic component wholesale platform for the degree of difference in the quality inspection data of each link of the electronic components is improved.

[0039] Further, a judgment on the quality sampling inspection of electronic components is carried out, and the specific process is as follows: B1. According to the preset difference allowable threshold range obtained from the preset database, it is judged whether the obtained quality inspection difference detection value is within the preset difference allowable threshold range; among them, the preset difference allowable threshold range is set by professionals according to the standards in the field. For example, the preset difference allowable threshold range is set to be 0.5 to 1.0.

[0040] B2. If the quality inspection difference detection value is within the preset difference allowable threshold range obtained from the preset database, the quality sampling inspection of the electronic components is not performed, and the quality sampling inspection result of the electronic components is recorded as qualified for quality inspection differences and no sampling inspection is carried out; if the quality inspection difference detection value is not within the preset difference allowable threshold range obtained from the preset database, the quality sampling inspection of the electronic components is carried out in combination with the preset sampling ratio, and the quality sampling inspection result of the electronic components is recorded as to be sampled and detected; the preset sampling ratio represents the result of mapping the real-time quality inspection difference detection value into the quality sampling mapping set in the preset database, and the quality sampling mapping set represents the mapping relationship between the quality inspection difference detection value and the preset sampling ratio.

[0041] In this embodiment, by combining the preset difference allowable threshold range to judge the degree of difference in the quality inspection data of each link of the preset procurement batch of electronic components, the accuracy of the quality sampling inspection result of the electronic components is improved, and further the reliability of the inventory quality management of the electronic component wholesale platform for the degree of difference in the quality inspection data of each link of the electronic components is improved.

[0042] Further, the acquisition of the warehousing sending instruction is as follows: when the quality sampling inspection result of the electronic components is qualified for quality inspection differences and no sampling inspection is carried out, an allowable warehousing instruction is sent to the electronic components of the preset procurement batch; when the quality sampling inspection result of the electronic components is to be sampled and detected, the sampling quality pass rate after performing the quality sampling inspection of the electronic components is obtained; the obtained sampling quality pass rate is compared and judged with the sampling pass rate threshold obtained from the preset database; if the obtained sampling quality pass rate is not less than the sampling pass rate threshold, an allowable warehousing instruction is sent to the electronic components of the preset procurement batch, otherwise, a rejection warehousing instruction is sent to the electronic components of the preset procurement batch. Among them, the sampling quality pass rate in the sampling process is obtained through an automated test system; the sampling pass rate threshold is set by professionals according to the standards in the field. For example, the sampling pass rate threshold is set to be 95%. In this embodiment, by obtaining the warehousing sending instruction, the accuracy of the warehousing quality management of the electronic components of the preset purchase batch is improved.

[0043] Furthermore, the electronic components of the preset purchase batch are stored in different regions in combination with the results of the quality sampling inspection of the electronic components. The specific process is as follows: If the result of the quality sampling inspection of the electronic components is qualified for quality inspection differences and no sampling inspection is performed, the electronic components of the corresponding preset purchase batch are stored in the qualified area; If the result of the quality sampling inspection of the electronic components is to be sampled and inspected, the electronic components of the preset purchase batch are stored in the warning area based on the preset number of warning areas; The preset number of warning areas represents the result of mapping the real-time sampling inspection quality pass rate into the warning area mapping set in the preset database, and the warning area mapping set represents the mapping relationship between the sampling inspection quality pass rate and the preset number of warning areas.

[0044] In this embodiment, by storing the electronic components of the preset purchase batch in different regions in combination with the results of the quality sampling inspection of the electronic components, the differential management of the electronic components is realized according to different results of the quality sampling inspection of the electronic components, thereby improving the quality management efficiency of the electronic components during the warehousing process of the electronic component wholesale platform.

[0045] Furthermore, the storage performance of the stored electronic components is monitored based on the quality inspection warning cycle of each region. The specific steps are as follows: M1. Obtain the storage performance monitoring data of the preset electronic components within the quality inspection warning cycle of each region. The storage performance monitoring data includes storage performance data and performance monitoring interference data. Among them, the storage performance data includes the component leakage current and the component noise margin; Specifically, the component leakage current of the preset electronic component is obtained by a leakage current tester, and the component noise margin of the preset electronic component is obtained by a noise analyzer; The unit of the component leakage current is the same as that of the reference component leakage current, both are amperes, and the reference component leakage current is represented by the result of summing and averaging the collected historical component leakage currents; The unit of the component noise margin is the same as that of the reference noise margin, both are decibels, and the reference noise margin is represented by the result of summing and averaging the collected historical component noise margins.

[0046] Among them, the performance monitoring interference data includes monitoring static electricity intensity, monitoring temperature, monitoring humidity, and monitoring electromagnetic interference; the corresponding monitoring static electricity intensity, monitoring temperature, monitoring humidity, and monitoring electromagnetic interference are obtained through an electrostatic field meter, a temperature sensor, a humidity sensor, and an electromagnetic field intensity meter deployed at the center point of the component test rack. The unit of the monitored static electricity intensity is the same as that of the reference stored static electricity intensity, both being volts; the unit of the monitored temperature is the same as that of the reference stored temperature, both being degrees Celsius; the unit of the monitored humidity is the same as that of the reference stored humidity, both being percentages; the unit of the monitored electromagnetic interference is the same as that of the reference stored electromagnetic interference, both being volts per meter; the corresponding reference stored static electricity intensity, reference stored temperature, reference stored humidity, and reference stored electromagnetic interference are represented by the results of summing and averaging the collected historical monitored static electricity intensity, monitored temperature, monitored humidity, and monitored electromagnetic interference respectively.

[0047] M2, after performing a weighted operation on the monitored static electricity intensity difference ratio, monitored temperature difference ratio, and monitored humidity difference ratio with the corresponding interference difference compensation values, a conductive interference compensation amount is obtained through coupling processing. The method for obtaining the conductive interference compensation amount is as follows: ; In the formula, represents the conductive interference compensation amount, represents the static electricity interference compensation value, represents the temperature interference compensation value, represents the humidity interference compensation value, represents the reference stored static electricity intensity, represents the monitored static electricity intensity, represents the reference stored temperature, represents the monitored temperature, represents the reference stored humidity, represents the monitored humidity.

[0048] The interference difference compensation values include the static electricity interference compensation value, the temperature interference compensation value, and the humidity interference compensation value; by inputting the real-time monitored static electricity intensity difference ratio, monitored temperature difference ratio, and monitored humidity difference ratio into the mapping sets of the monitored static electricity intensity difference ratio, monitored temperature difference ratio, and monitored humidity difference ratio and their corresponding compensation values preset in the database, the corresponding static electricity interference compensation value, temperature interference compensation value, and humidity interference compensation value are obtained.

[0049] M3, the leakage current approximation operation of components is corrected according to the obtained conductive interference compensation amount, and the result of the monitoring electromagnetic interference approximation operation for the component noise margin ratio is corrected and then coupled with the corresponding performance compensation value through weighted operation to obtain the component storage detection value. The component storage detection value is used to quantitatively evaluate the performance monitoring quality of the storage electronic components in the corresponding area, representing the quantitative data of the combined effect of the stored performance data and the performance monitoring interference data on the performance monitoring quality evaluation of the storage electronic components. The method for obtaining the component storage detection value is as follows: ; In the formula, represents the component storage detection value, represents the conductive performance monitoring compensation value, represents the anti-interference performance monitoring compensation value, represents the conductive interference compensation amount, represents the component leakage current, represents the reference component leakage current, represents the reference storage electromagnetic interference, represents the monitoring electromagnetic interference, represents the component noise margin, represents the reference noise margin.

[0050] It should be added that the performance compensation value includes the conductive performance monitoring compensation value and the anti-interference performance monitoring compensation value; by inputting the real-time component leakage current compensation result (i.e., the result of correcting the component leakage current approximation operation by the conductive interference compensation amount, represented by the part in the component storage detection value), and the component noise margin compensation result (i.e., the result of correcting the component noise margin ratio result by the monitoring electromagnetic interference approximation operation, represented by the part in the component storage detection value) into the mapping sets of the preset component leakage current compensation result, component noise margin compensation result and their corresponding compensation values in the database, the corresponding conductive performance monitoring compensation value and anti-interference performance monitoring compensation value are obtained.

[0051] In this embodiment, the detected values of component storage take into account the correlations and mutual influence relationships among various parameters. For example, the electrostatic strength is an important factor affecting the electrical performance of components. As the monitored electrostatic strength increases, problems such as electrical breakdown and increased leakage current may occur. When the electrostatic strength increases, it may cause uneven electric field distribution on the surface or inside of the component, resulting in increased leakage current. Especially in a high-humidity environment, the influence of static electricity on the leakage current is more significant. At the same time, an increase in temperature usually changes the conductivity of materials. As the monitored temperature increases, the resistance of the material may decrease, which will affect the situation of static electricity accumulation. Especially in semiconductor materials, an increase in temperature may make charges move more easily, thus causing the monitored electrostatic strength to increase accordingly.

[0052] In addition, electromagnetic interference is an important factor affecting the performance of components, especially its impact on the noise margin. The noise margin of a component refers to the maximum amount of external noise that the component can withstand. As the monitored electromagnetic interference increases, external noise will enter the circuit system of the component through electromagnetic coupling and other means, resulting in the affected output signal of the component and reducing the noise margin of the component. Electromagnetic interference may cause signal distortion, data errors, or unstable functions of the component. Among them, as the leakage current of the component increases, the component can no longer effectively isolate different signal channels, that is, the isolation degree between the noise source and the signal source becomes worse, and the noise signal is more likely to be amplified, thus generating signal cross-interference, which in turn affects the signal quality and reduces the noise margin of the component, realizing a more accurate assessment of the performance monitoring quality of stored electronic components, and further effectively improving the accuracy of performance monitoring quality management of stored electronic components.

[0053] Furthermore, the specific process for obtaining the monitoring results of component storage performance is as follows: C1, determine whether the detected values of component storage obtained are within the preset storage monitoring threshold range retrieved from the preset database; among them, the preset storage monitoring threshold range is set by professionals according to the standards in the field. For example, the preset storage monitoring threshold range is set to be from 1.0 to 2.0.

[0054] C2, if the detected values of component storage are within the preset storage monitoring threshold range retrieved from the preset database, then the monitoring result of component storage performance is that the component awaits storage monitoring optimization; if the detected values of component storage are not within the preset storage monitoring threshold range retrieved from the preset database, then the monitoring result of component storage performance is that the component awaits storage spot-check optimization.

[0055] In this embodiment, by combining the preset storage monitoring threshold range to obtain the monitoring results of component storage performance, the reliability of the monitoring results of component storage performance is further improved, and thus the improvement of the inventory quality management of electronic components corresponding to the monitoring results of component storage performance is realized.

[0056] Further, the specific steps for optimizing the storage performance monitoring of the electronic components stored in the batch area in combination with the monitoring results of the storage performance of the components are as follows: H1. When the monitoring result of the storage performance of the component is that the component to be stored needs monitoring optimization, map based on the deviation degree between the storage detection value of the component and the reference storage detection value of the component into the storage monitoring mapping set in the preset database to obtain the optimized monitoring frequency. The storage monitoring mapping set represents the mapping relationship between the storage detection value of the component and the optimized monitoring frequency. The deviation degree between the storage detection value of the component and the reference storage detection value of the component is the result of taking the absolute value of the difference operation between the storage detection value of the component and the reference storage detection value of the component.

[0057] H2. When the monitoring result of the storage performance of the component is that the component to be stored needs spot check optimization, map based on the deviation degree between the storage detection value of the component and the reference storage detection value of the component into the storage spot check mapping set in the preset database to obtain the optimized spot check frequency. The storage spot check mapping set represents the mapping relationship between the storage detection value of the component and the optimized spot check frequency.

[0058] In this embodiment, by combining the optimized monitoring frequency and the optimized spot check frequency to optimize the storage performance monitoring of the electronic components stored in the batch area, the inventory quality management of the electronic components stored in the batch area is further optimized.

[0059] Further, it is judged whether the electronic component wholesale platform sends an inbound marking instruction. The specific process is as follows: Obtain the optimized spot check frequency of the electronic components stored in the batch area, and compare and judge the obtained optimized spot check frequency with the preset maximum spot check frequency obtained from the preset database; when the obtained optimized spot check frequency is greater than the preset maximum spot check frequency obtained from the preset database, the electronic component wholesale platform sends an inbound marking instruction.

[0060] In this embodiment, the preset maximum spot check frequency is set by professionals according to the standards in the field. For example, the preset maximum spot check frequency is set to 24 hours / time. By sending an inbound marking instruction to the electronic component wholesale platform, the accuracy of the storage performance monitoring of the electronic components in the process of inventory quality management of the electronic components is effectively improved.

[0061] Further, based on the ratio result of the marked area to the batch area, it is determined whether to perform the visualization of the area storage result to the platform visualization interface. The specific process is as follows: The ratio result of the marked area to the batch area is combined with the reference area ratio range obtained from the preset database for judgment; if the ratio result of the marked area to the batch area is within the reference area ratio range obtained from the preset database, the visualization of the area storage result to the platform visualization interface is not performed, and at the same time, the ratio result of the marked area to the batch area is continuously monitored; if the ratio result of the marked area to the batch area is not within the reference area ratio range obtained from the preset database, the visualization of the area storage result to the platform visualization interface is performed. Among them, the ratio result of the marked area to the batch area is the ratio of the number of marked areas to the total number of batch areas, and the reference area ratio range is obtained from the preset database. For example, the reference area ratio range is set to 0.5 to 1.

[0062] In this embodiment, the area storage result is visualized to the platform visualization interface through a visualization tool (such as ECharts); it realizes the improvement of the warehousing decision-making efficiency of the electronic component wholesale platform by visualizing the inventory quality management of electronic components.

[0063] In summary, the embodiment of the present application performs differential analysis on the quality inspection data of each link of the electronic components to determine whether to perform quality sampling inspection of the electronic components and obtain the warehousing sending instruction, then stores the electronic components in different areas and monitors the storage performance, and finally optimizes the storage performance monitoring of the electronic components in the batch area and determines whether to perform the visualization of the area storage result, so as to realize the further improvement of the quality management of the electronic components before warehousing and during the storage process of the electronic component wholesale platform, and further realize the more accurate warehousing management of the electronic components, effectively solving the problem that the existing technology does not fully consider the quality differences in the warehousing management process after the wholesale of electronic components by the electronic component wholesale platform.

[0064] Those skilled in the art should understand that the embodiments of the present invention can be provided as methods, systems, or computer program products. Therefore, the present invention can take the form of a complete hardware embodiment, a complete software embodiment, or an embodiment combining software and hardware aspects. Moreover, the present invention can take the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0065] The present invention is described with reference to the flowcharts and / or block diagrams of systems, apparatus (systems), and computer program products according to embodiments of the invention. It should be understood that each flow and / or block in the flowcharts and / or block diagrams, and combinations of flows and / or blocks in the flowcharts and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to the processors of general-purpose computers, special-purpose computers, embedded processors, or other programmable data processing devices to produce a machine, such that the instructions executed by the processors of the computer or other programmable data processing devices produce means for implementing the functions specified in the flow Figure 1 one flow or multiple flows and / or blocks Figure 1 or means for implementing the functions specified in multiple blocks.

[0066] These computer program instructions can also be stored in a computer-readable memory that can direct a computer or other programmable data processing device to work in a specific manner, such that the instructions stored in the computer-readable memory produce a manufacture including instruction means that implement the functions specified in the flow Figure 1 one flow or multiple flows and / or blocks Figure 1 or means for implementing the functions specified in multiple blocks.

[0067] These computer program instructions can also be loaded onto a computer or other programmable data processing device, such that a series of operational steps are executed on the computer or other programmable device to produce a computer-implemented process, and thus the instructions executed on the computer or other programmable device provide steps for implementing the functions specified in the flow Figure 1 one flow or multiple flows and / or blocks Figure 1 or means for implementing the functions specified in multiple blocks.

[0068] Although the preferred embodiments of the present invention have been described, additional changes and modifications can be made to these embodiments by those skilled in the art once they learn the basic creative concepts. Therefore, the appended claims are intended to be construed to include the preferred embodiments and all changes and modifications that fall within the scope of the present invention.

[0069] Obviously, those skilled in the art can make various changes and modifications to the present invention without departing from the spirit and scope of the present invention. Thus, if these modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalent technologies, the present invention is also intended to include these modifications and variations.

Claims

1. An electronic component wholesale platform based on the optimization of multi-channel data synchronization, characterized in that, Including: Batch quality inspection difference analysis module, warehousing area storage monitoring module, and warehousing optimization marking judgment module; The batch quality inspection difference analysis module is used to perform difference analysis on the quality inspection data of each link of the electronic components in the preset purchase batch, and based on the results of the difference analysis, judge the quality sampling inspection of the electronic components and obtain the warehousing sending instruction; The warehousing area storage monitoring module is used to, when the warehousing sending instruction of the electronic components in the preset purchase batch is allowed to be warehoused, store the electronic components in the preset purchase batch in different areas in combination with the quality sampling inspection results of the electronic components, and monitor the storage performance of the stored electronic components based on the quality inspection warning cycle of each area to obtain the component storage performance monitoring results; The warehousing optimization marking judgment module is used to optimize the storage performance monitoring of the electronic components stored in the batch area in combination with the component storage performance monitoring results. After performing the storage performance monitoring optimization, judge whether the electronic component wholesale platform sends a warehousing marking instruction, and judge whether to execute the visualization of the area storage result to the platform visualization interface based on the ratio result of the marked area to the batch area.

2. The electronic component wholesale platform based on multi-channel data synchronization optimization according to claim 1, characterized in that The specific steps for performing difference analysis on the quality inspection data of each link of the electronic components in the preset purchase batch are as follows: Obtain the quality inspection data of the electronic components in the preset purchase batch, where the quality inspection data includes the appearance quality inspection defect rate, the size quality inspection pass rate, and the performance quality inspection pass rate; The appearance quality inspection defect rate includes the appearance production quality inspection defect rate, the appearance supply quality inspection defect rate, and the appearance acceptance quality inspection defect rate; Perform parameter interaction difference analysis based on the appearance quality inspection defect rate to obtain the appearance defect rate difference value, where the appearance defect rate difference value includes the production-supply defect difference value, the production-acceptance defect difference value, and the supply-acceptance defect difference value; The size quality inspection pass rate includes the size production quality inspection pass rate, the size supply quality inspection pass rate, and the size acceptance quality inspection pass rate; Perform parameter interaction difference analysis based on the size quality inspection pass rate to obtain the size pass rate difference value, where the size pass rate difference value includes the production-supply size difference value, the production-acceptance size difference value, and the supply-acceptance size difference value; The performance quality inspection pass rate includes the performance production quality inspection pass rate, the performance supply quality inspection pass rate, and the performance acceptance quality inspection pass rate; Perform parameter interaction difference analysis based on the performance quality inspection pass rate to obtain the performance pass rate difference value, where the performance pass rate difference value includes the production-supply performance difference value, the production-acceptance performance difference value, and the supply-acceptance performance difference value; Obtain the corresponding maximum quality inspection difference value based on the appearance defect rate difference value, the size pass rate difference value, and the performance pass rate difference value, and perform difference ratio analysis on the maximum quality inspection difference value and the reference difference value obtained from the preset database to obtain the difference ratio result of the maximum quality inspection difference value; The maximum quality inspection difference value includes the maximum appearance defect difference, the maximum size qualification difference, and the maximum performance qualification difference. The reference difference value includes the reference minimum appearance defect difference, the reference minimum size qualification difference, and the reference minimum performance qualification difference. The proportion result of the maximum quality inspection difference value difference includes the appearance difference proportion result, the size difference proportion result, and the performance difference proportion result; Perform a weighted operation on the proportion result of the maximum quality inspection difference value difference and the corresponding difference evaluation compensation value, and then perform a coupling process to obtain a quality inspection difference detection value; The difference evaluation compensation value includes an appearance quality inspection difference compensation value, a size quality inspection difference compensation value, and a performance quality inspection difference compensation value; The quality inspection difference detection value is used to quantitatively evaluate the difference degree of the quality inspection data of each link of the electronic components in a preset purchase batch; The quality inspection difference detection value represents the quantitative data of the difference degree of the quality inspection data of each link of the electronic components in a preset purchase batch jointly by the maximum appearance defect difference, the maximum size qualification difference, and the maximum performance qualification difference.

3. The electronic component wholesale platform based on multi-channel data synchronization optimization as claimed in claim 2, wherein The judgment of the quality sampling inspection of electronic components is carried out according to the following specific process: According to the preset difference allowable threshold range obtained from the preset database, judge whether the obtained quality inspection difference detection value is within the preset difference allowable threshold range; If the quality inspection difference detection value is within the preset difference allowable threshold range obtained from the preset database, do not perform the quality sampling inspection of electronic components, and record the quality sampling inspection result of the electronic components as qualified for quality inspection difference and not subject to sampling inspection; If the quality inspection difference detection value is not within the preset difference allowable threshold range obtained from the preset database, perform the quality sampling inspection of electronic components in combination with the preset sampling ratio, and record the quality sampling inspection result of the electronic components as to be sampled and inspected; The preset sampling ratio represents the result of mapping the real-time quality inspection difference detection value into the quality sampling mapping set in the preset database, and the quality sampling mapping set represents the mapping relationship between the quality inspection difference detection value and the preset sampling ratio.

4. The electronic component wholesale platform based on multi-channel data synchronization optimization according to claim 3, wherein The acquisition of the warehousing sending instruction is carried out according to the following specific process: When the quality sampling inspection result of the electronic components is qualified for quality inspection difference and not subject to sampling inspection, send an allowable warehousing instruction to the electronic components in the preset purchase batch; When the quality sampling inspection result of the electronic components is to be sampled and inspected, obtain the sampling quality pass rate after performing the quality sampling inspection of the electronic components; Compare and judge the obtained sampling quality pass rate with the sampling pass rate threshold obtained from the preset database; If the obtained sampling quality pass rate is not less than the sampling pass rate threshold, send an allowable warehousing instruction to the electronic components in the preset purchase batch, otherwise, send a rejection warehousing instruction to the electronic components in the preset purchase batch.

5. The electronic component wholesale platform optimized based on multi-channel data synchronization as claimed in claim 3, wherein The sub-regional storage of the electronic components in the preset purchase batch in combination with the quality sampling inspection result of the electronic components is carried out according to the following specific process: If the quality sampling inspection result of the electronic components is qualified for quality inspection difference and not subject to sampling inspection, store the electronic components corresponding to the preset purchase batch in the qualified area; If the quality sampling inspection result of electronic components is to be sampled and inspected, the electronic components of the preset purchase batch are stored in the warning area based on the preset number of warning areas; The preset number of warning areas represents the result of mapping the real-time sampling inspection quality pass rate into the warning area mapping set in the preset database, and the warning area mapping set represents the mapping relationship between the sampling inspection quality pass rate and the preset number of warning areas.

6. The electronic component wholesale platform based on multi-channel data synchronization optimization according to claim 1, characterized in that, The storage performance of the stored electronic components is monitored based on the quality inspection warning period of each area. The specific steps are as follows: Obtain the storage performance monitoring data of the preset electronic components within the quality inspection warning period of each area. The storage performance monitoring data includes storage performance data and performance monitoring interference data; The storage performance data includes component leakage current and component noise margin; The performance monitoring interference data includes monitored static electricity intensity, monitored temperature, monitored humidity, and monitored electromagnetic interference; The proportion of the monitored static electricity intensity difference, the proportion of the monitored temperature difference, and the proportion of the monitored humidity difference are subjected to weighted operation with the corresponding interference difference compensation values and then coupled to obtain the conductive interference compensation amount. The interference difference compensation values include static electricity interference compensation value, temperature interference compensation value, and humidity interference compensation value; The component leakage current approach operation is corrected according to the obtained conductive interference compensation amount, and the monitored electromagnetic interference approach operation corrects the component noise margin ratio result and then performs weighted operation with the corresponding performance compensation values and couples them to obtain the component storage detection value; The performance compensation values include conductive performance monitoring compensation value and anti-interference performance monitoring compensation value; The component storage detection value is used to quantitatively evaluate the performance monitoring quality of the stored electronic components in the corresponding area; The component storage detection value represents the quantitative data for evaluating the performance monitoring quality of the stored electronic components jointly by the storage performance data and the performance monitoring interference data.

7. The electronic component wholesale platform based on multi-channel data synchronization optimization as claimed in claim 6, wherein The specific process of obtaining the component storage performance monitoring result is as follows: Judge whether the obtained component storage detection value is within the preset storage monitoring threshold range obtained from the preset database; If the component storage detection value is within the preset storage monitoring threshold range obtained from the preset database, the component storage performance monitoring result is that the component is to be optimized for storage monitoring; If the component storage detection value is not within the preset storage monitoring threshold range obtained from the preset database, the component storage performance monitoring result is that the component is to be optimized for storage spot check.

8. The electronic component wholesale platform optimized based on multi-channel data synchronization as claimed in claim 7, wherein The specific steps for optimizing the storage performance monitoring of the stored electronic components in the batch area in combination with the component storage performance monitoring result are as follows: When the component storage performance monitoring result is that the component is to be optimized for storage monitoring, based on the deviation degree between the component storage detection value and the reference component storage detection value, it is mapped into the storage monitoring mapping set in the preset database to obtain the optimized monitoring frequency. The storage monitoring mapping set represents the mapping relationship between the component storage detection value and the optimized monitoring frequency; When the monitoring result of the component storage performance is that the component storage spot check needs to be optimized, map the deviation degree between the component storage detection value and the reference component storage detection value into the storage spot check mapping set in the preset database to obtain the optimized spot check frequency, and the storage spot check mapping set represents the mapping relationship between the component storage detection value and the optimized spot check frequency.

9. The electronic component wholesale platform optimized based on multi-channel data synchronization as claimed in claim 8, wherein The specific process of judging whether the electronic component wholesale platform sends an inbound marking instruction is as follows: Obtain the optimized spot check frequency of the electronic components stored in the batch area, and compare and judge the obtained optimized spot check frequency with the preset maximum spot check frequency obtained from the preset database; When the obtained optimized spot check frequency is greater than the preset maximum spot check frequency obtained from the preset database, the electronic component wholesale platform sends an inbound marking instruction.

10. The electronic component wholesale platform optimized based on multi-channel data synchronization as claimed in claim 1, wherein The specific process of judging whether to execute the visualization of the regional storage result to the platform visualization interface based on the ratio result of the marked area to the batch area is as follows: Combine the ratio result of the marked area to the batch area with the reference area ratio range obtained from the preset database for judgment; If the ratio result of the marked area to the batch area is within the reference area ratio range obtained from the preset database, do not execute the visualization of the regional storage result to the platform visualization interface, and continuously monitor the ratio result of the marked area to the batch area; If the ratio result of the marked area to the batch area is not within the reference area ratio range obtained from the preset database, execute the visualization of the regional storage result to the platform visualization interface.

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