Weld detection method, system, electronic device, and storage medium
By constructing dispersion curves and determining guided wave parameters, Lamb waves are used to detect weld defects in real time, solving the problem of thick-walled butt welds being unable to be detected in real time during the welding process and achieving efficient quality control and defect identification.
Patent Information
- Application Number
- CN202510945112.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2025-07-09
- Publication Date
- 2025-10-10
- Estimated Expiration
- 2045-07-09
AI Technical Summary
In the existing technology, non-destructive testing methods for thick-walled butt welds are unable to detect defects in the weld and heat-affected zone in real time during the welding process, resulting in increased rework times and difficulties in quality control.
By obtaining weld thickness information, constructing a dispersion curve, determining the guided wave parameters and probe position, and using a guided wave probe to detect welds in real time during the welding process, Lamb waves are used for ultrasonic testing to quickly identify defects such as cracks, lack of fusion, and incomplete penetration.
It realizes real-time quality control of thick-wall welds during the welding process, reduces the repair cycle and difficulty, and improves detection efficiency and accuracy.
Smart Images

Figure CN120446302B_ABST
Abstract
Description
Technical Field
[0001] The present application relates to technical fields such as industrial non-destructive testing, and in particular to a weld detection method, system, electronic equipment, and storage medium. Background Art
[0002] In the design and construction of large structural parts and important pressure vessels for nuclear power and petroleum, large and thick plates and forgings are often selected for key pressure-bearing structures or important containers. However, during the manufacturing process, welding is required to achieve structural connection and construction. The quality requirements of such welds are very high, so non-destructive testing of welds is crucial.
[0003] In related technologies, non-destructive testing of this type of thick-walled butt welds generally requires that the testing process be carried out only after the base, filling and cover welding of the entire weld are completed. If defects are found inside the weld and it does not meet the design requirements, it will need to be ground, gouged, or even machined, which is time-consuming and cannot guarantee that the weld will be qualified after one repair. Therefore, this method is not advisable for important welds that require multiple repairs. Summary of the Invention
[0004] To this end, the purpose of the embodiments of the present application is to propose a weld detection method, system, electronic device, storage medium and computer program product, which can quickly detect defects such as cracks, lack of fusion, and incomplete penetration in thick-walled and unfinished welds.
[0005] An embodiment of the present application provides a method for detecting a weld, the method comprising: obtaining thickness information of a weld to be detected, and constructing a dispersion curve corresponding to the thickness information; determining waveguide parameter information and probe position information based on the dispersion curve; and detecting the weld to be detected based on the waveguide parameter information and the probe position information to obtain a detection result.
[0006] Exemplarily, the waveguide parameter information includes the waveguide frequency and the waveguide incident angle, and determining the waveguide parameter information and the probe position information based on the dispersion curve includes: determining the waveguide frequency based on the dispersion curve; determining the waveguide incident angle based on the phase velocity corresponding to the waveguide frequency and the waveguide incident wave velocity; and determining the probe position information based on the waveguide incident angle and the thickness information.
[0007] Exemplarily, the waveguide parameter information includes the waveguide frequency and the waveguide incident angle, and determining the waveguide parameter information and the probe position information based on the dispersion curve includes: determining the probe position information; determining the waveguide incident angle based on the probe position information and the thickness information; determining the phase velocity based on the waveguide incident angle and the waveguide incident wave velocity, and determining the waveguide frequency based on the dispersion curve and the phase velocity.
[0008] Exemplarily, the dispersion curve corresponding to the thickness information includes a first dispersion curve corresponding to the weld thickness and a second dispersion curve corresponding to the base material thickness, and determining the guided wave frequency based on the dispersion curve includes: determining the frequency corresponding to the intersection of the first dispersion curve and the second dispersion curve as the guided wave frequency.
[0009] Exemplarily, determining the guided wave incident angle based on the phase velocity corresponding to the guided wave frequency and the guided wave incident wave velocity includes: determining a first ratio between the guided wave incident wave velocity and the phase velocity; and determining the arcsine result of the first ratio as the guided wave incident angle.
[0010] Exemplarily, the thickness information includes the weld thickness and the base material thickness, the probe position information includes the waveguide probe spacing, and determining the probe position information based on the waveguide incident angle and the thickness information includes: adding the weld thickness and the base material thickness to obtain a first sum, and determining the tangent value of the waveguide incident angle; determining the product of the first sum, the tangent value and the first coefficient as a first product, wherein the waveguide probe spacing is greater than or equal to the first product.
[0011] Exemplarily, the probe position information includes the probe front end distance and the probe front end distance, the thickness information includes the weld thickness and the weld depth, and determining the guided wave incident angle based on the probe position information and the thickness information includes: determining a second sum between the probe front end distance and the probe front end distance, and a third sum between the weld thickness and the weld depth; determining a second ratio between the second sum and the third sum; and determining the arcsine result of the second ratio as a guided wave incident angle threshold, wherein the guided wave incident angle is greater than or equal to the guided wave incident angle threshold.
[0012] Exemplarily, determining the phase velocity based on the guided wave incident angle and the guided wave incident wave velocity includes: determining the sine value of the guided wave incident angle; and determining a third ratio between the guided wave incident wave velocity and the sine value as the phase velocity.
[0013] Exemplarily, determining the waveguide frequency based on the dispersion curve and the phase velocity includes: determining a frequency corresponding to the phase velocity in the dispersion curve as the waveguide frequency.
[0014] Exemplarily, the detection result includes a detection waveform of the weld to be detected, and the detection of the weld to be detected based on the waveguide parameter information and the probe position information to obtain the detection result includes: arranging the probe based on the probe position information, and emitting ultrasonic waves based on the waveguide parameter information, controlling the waveguide probe to move in a direction parallel to the weld, and obtaining the detection waveform of the weld to be detected.
[0015] Exemplarily, the method further includes: detecting a simulated test plate based on the waveguide parameter information and the probe position information to obtain an initial waveguide waveform; and determining a weld defect condition based on the initial waveguide waveform and the detection waveform of the weld to be detected.
[0016] Another embodiment of the present application provides a weld detection system, which includes: a weld to be detected; a waveguide transmitting probe and a waveguide receiving probe, wherein the waveguide transmitting probe and the waveguide receiving probe are symmetrically arranged on both sides of the weld to be detected; and a data processing device connected to the waveguide transmitting probe and the waveguide receiving probe, wherein the data processing device is used to implement the steps of the above-mentioned weld detection method.
[0017] Another embodiment of the present application provides an electronic device, including a memory and a processor, wherein the memory stores a computer program, and the processor implements the steps of the method of any of the above embodiments when executing the computer program.
[0018] Another embodiment of the present application provides a computer-readable storage medium having a computer program stored thereon. When the computer program is executed by a processor, the steps of the method of any of the above embodiments are implemented.
[0019] Another embodiment of the present application provides a computer program product, which includes instructions. When the instructions are executed by a processor of a computer device, the computer device is enabled to perform the steps of the method of any of the above embodiments.
[0020] In the above-described embodiment, the weld inspection method includes: obtaining thickness information of the weld to be inspected and constructing a dispersion curve corresponding to the thickness information; determining guided wave parameter information and probe position information based on the dispersion curve; and inspecting the weld to be inspected based on the guided wave parameter information and probe position information to obtain an inspection result. The weld inspection method of the present invention is suitable for thick, incomplete welds and can quickly detect defects such as cracks, lack of fusion, and incomplete penetration in the weld and heat-affected zone. BRIEF DESCRIPTION OF THE DRAWINGS
[0021] Figure 1 A flow chart of a weld detection method provided in an embodiment of the present application;
[0022] Figure 2 A schematic diagram of a weld to be inspected provided in an embodiment of the present application;
[0023] Figure 3 A flowchart for determining probe position information provided in an embodiment of the present application;
[0024] Figure 4 A schematic diagram of a waveguide path provided in an embodiment of the present application;
[0025] Figure 5 Flowchart for determining the guided wave incident angle provided for the embodiments of the present application;
[0026] Figure 6 Flowchart for determining the guided wave probe spacing provided for the embodiments of the present application;
[0027] Figure 7 Flowchart for determining the weld defect condition provided for the embodiments of the present application;
[0028] Figure 8 Flowchart for the detection method of the weld based on the minimum probe spacing provided for the embodiments of the present application;
[0029] Figure 9 Flowchart for the detection method of the weld provided for another embodiment of the present application;
[0030] Figure 10 Schematic diagram of the guided wave path provided for another embodiment of the present application;
[0031] Figure 11 Flowchart for determining the guided wave incident angle provided for another embodiment of the present application;
[0032] Figure 12 Flowchart for determining the phase velocity provided for the embodiments of the present application;
[0033] Figure 13 Flowchart for the detection method of the weld provided for another embodiment of the present application;
[0034] Figure 14 Block diagram of the electronic device provided for the embodiments of the present application. DETAILED DESCRIPTION
[0035] The embodiments of the present application are described in detail below with reference to the accompanying drawings, in which the same or similar components or components having the same or similar functions are denoted by the same or similar reference numerals throughout. The embodiments described below by reference to the accompanying drawings are exemplary and are intended to explain the present application, and cannot be understood as limiting the present application.
[0036] In some examples, the non-destructive testing of the thick-wall butt weld includes inter-pass detection of the weld bead by using penetration testing, which is a method of detecting by penetrating the penetrant into the weld. This method can only detect near-surface open defects and cannot detect defects that may exist in the content of the weld. For narrow gap grooves or welds with uneven weld beads, penetration testing will not completely remove the penetrant, which will affect the subsequent welding and is not conducive to quality control.
[0037] In some cases, nondestructive testing of thick-walled butt welds also involves radiographic testing. This method can detect internal defects in the weld, but the thicker grooves and base metal create blind spots in the heat-affected zone (HAZ) of the groove. Radiographic testing results in the weld appearing bright white on both sides of the weld on radiographic films, obscuring the groove and HAZ. Furthermore, the X-shaped symmetrical grooves of thick butt welds prevent film from closely adhering to the weld, resulting in geometric magnification during radiographic testing. This reduces film clarity and contrast, hindering defect detection.
[0038] Therefore, in the construction of large structures and important pressure vessels, conventional inspection methods cannot meet the inspection quality requirements for large and thick-walled butt welds. Currently, there is no suitable and reliable inspection method for quality inspection of incomplete welds.
[0039] Based on this, the present application proposes a weld detection method, which can track the local filling welding or root weld of thick-walled butt welds in real time during the welding process.
[0040] Figure 1 This is a flow chart of a weld detection method according to an embodiment of the present application.
[0041] As an example, Figure 1 As shown, the weld inspection methods include:
[0042] S101, obtaining thickness information of the weld to be inspected, and constructing a dispersion curve corresponding to the thickness information.
[0043] S102: Determine waveguide parameter information and probe position information based on the dispersion curve.
[0044] S103, inspecting the weld to be inspected based on the guided wave parameter information and the probe position information to obtain an inspection result.
[0045] For example, first obtain the thickness information of the weld to be inspected. This application is aimed at the inspection of large and thick-walled butt welds. The thickness information of the weld to be inspected may include the thickness of the weld itself and the thickness of the base material. Construct a dispersion curve corresponding to the thickness information. It can be understood that if both the weld thickness and the base material thickness are obtained, then construct a dispersion curve corresponding to the weld thickness and a dispersion curve corresponding to the base material thickness respectively. The dispersion curve characterizes the relationship between frequency and phase velocity at different thicknesses. Then, determine the guided wave parameter information and the probe position information based on the dispersion curve. Arrange the probe according to the probe position information, determine the emission waveform according to the guided wave parameter information, and detect the weld to be inspected based on the ultrasonic wave emitted by the probe to obtain the detection result.
[0046] It should be noted that this application is a real-time process, and detection can still be performed during the welding process. When the weld thickness increases, the waveguide parameter information and probe position information can be readjusted for detection, and historical data can also be used for detection.
[0047] The weld inspection method of the present application is aimed at thick-walled and unfinished welds. It combines the material and specifications of the weld to be inspected, the length, width and thickness of the completed weld, and configures appropriate guided wave probe parameters to complete non-destructive inspection of the local weld at the root of thick-walled butt welds. It overcomes the shortcomings of traditional penetrant testing and radiographic testing, and can quickly detect defects such as cracks, lack of fusion, and incomplete penetration in the weld and heat-affected zone.
[0048] Figure 2 It is a schematic diagram of a weld to be inspected according to an embodiment of the present application.
[0049] like Figure 2 As shown, the weld is an unfinished weld, with the parent metals 1 connected by weld 2. The waveguide probes used in this application are arranged in a group, one transmitting and one receiving. Two waveguide probes are placed on either side of the weld to be inspected, with waveguide probes 3 symmetrically and vertically positioned on either side of weld 2. Weld 2 can be the root of a weld or a localized weld. Waveguide probe 3 transmits ultrasonic Lamb waves, and another waveguide probe receives the waveguide data after it passes through the weld.
[0050] The weld detection method of the present application can effectively control quality problems in the welding process because it can detect in real time during the welding process, while also avoiding unnecessary rework cycles and difficulties.
[0051] The following describes the detection process.
[0052] As an example, Figure 3 As shown, the waveguide parameter information includes the waveguide frequency and the waveguide incident angle. The waveguide parameter information and probe position information are determined based on the dispersion curve, including:
[0053] S301: Determine the waveguide frequency based on the dispersion curve.
[0054] S302 : Determine the guided wave incident angle based on the phase velocity corresponding to the guided wave frequency and the guided wave incident wave velocity.
[0055] S303: Determine probe position information based on the guided wave incident angle and thickness information.
[0056] Exemplarily, the dispersion curve includes a dispersion curve corresponding to the base material thickness and a dispersion curve corresponding to the weld thickness, and a suitable guided wave frequency is selected according to the two dispersion curves. The dispersion curve represents the relationship between the frequency and the phase velocity, and records the corresponding phase velocity at the guided wave frequency. According to the phase velocity corresponding to the guided wave frequency and the guided wave incident wave velocity, the guided wave incidence angle is determined, and the guided wave incident wave velocity can be obtained by table lookup according to the material properties, the base material thickness T and the weld thickness t. According to Snell's law, Snell's law describes the refraction relationship of light or sound waves at the interface of two media. That is, based on the phase velocity corresponding to the guided wave frequency and the guided wave incident wave velocity, the guided wave incidence angle is determined. Finally, the probe position information is determined according to the guided wave incidence angle and the thickness information, such as the base material thickness and the weld thickness. The probe position information, for example, includes the spacing between the probes.
[0057] As an example, the dispersion curve corresponding to the thickness information includes a first dispersion curve corresponding to the weld thickness and a second dispersion curve corresponding to the base material thickness, and the guided wave frequency is determined based on the dispersion curve, including:
[0058] The frequency corresponding to the intersection of the first dispersion curve and the second dispersion curve is determined as the guided wave frequency.
[0059] Exemplarily, as shown in the guided wave schematic diagram Figure 4 , first, the base material thickness T and the weld thickness t of the weld to be detected are measured, thereby dividing the weld to be detected into two large plates with different boundary conditions. According to the material properties and the particle motion equation of elasticity, two sets of Rayleigh-Lamb wave equations under different thicknesses can be derived. It can be understood that the Rayleigh-Lamb wave equation corresponding to the base material thickness T and the Rayleigh-Lamb wave equation corresponding to the weld thickness t are derived, so as to obtain the phase velocity C P corresponding to the thickness T and t.
[0060] Exemplarily, the Rayleigh-Lamb wave equation is as follows:
[0061]
[0062]
[0063] Wherein, p represents the longitudinal wave vector component in the thickness direction, q represents the transverse wave vector component in the thickness direction, f represents the frequency, C P represents the guided wave phase velocity, E represents the material elastic modulus, v represents the Poisson's ratio, p represents the material density, and G represents the shear modulus. The material elastic modulus E, the Poisson's ratio v, the material density p and the shear modulus G can be obtained by table lookup according to the standard. The dispersion curve is a multivariate curve, which can be drawn by software. The dispersion curve of the present application corresponds to the thickness, and the frequency thickness product can be formed. and and phase velocity C P The dispersion curve of .
[0064] For example, the guided wave frequency is determined based on the first dispersion curve corresponding to the weld thickness t and the second dispersion curve corresponding to the base material thickness T. The frequency corresponding to the intersection of the first dispersion curve and the second dispersion curve is determined as the guided wave frequency. It can be understood that the two sets of phase velocities C according to the base material thickness T and the weld thickness t are: P For the dispersion curve, select an appropriate f such that the phase velocity corresponding to that value of f on the dispersion curve of thickness T is equal to the phase velocity corresponding to that value of f on the dispersion curve of thickness t. Determine f as the waveguide frequency and record the phase velocity corresponding to that waveguide frequency.
[0065] As an example, Figure 5 As shown, the guided wave incident angle is determined based on the phase velocity corresponding to the guided wave frequency and the guided wave incident wave velocity, including:
[0066] S501, determining a first ratio between the incident wave velocity and the phase velocity of the guided wave.
[0067] S502: Determine the arcsine result of the first ratio as the guided wave incident angle.
[0068] For example, after determining the waveguide frequency and the phase velocity corresponding to the waveguide frequency, the waveguide incident wave velocity C is determined according to the material properties, the parent material thickness T and the weld thickness t. W , and then calculate the guided wave incident angle The calculation formula for the guided wave incident angle is as follows:
[0069] ,
[0070] in, represents the incident angle of the guided wave, C W represents the incident wave velocity of the guided wave, C P Determine the phase velocity of the guided wave incident wave velocity C W and phase velocity C P The first ratio between , and then determine the arc sine of the first ratio as the guided wave incident angle.
[0071] like Figure 4 As shown in the guided wave diagram, the guided wave incident angle calculated by this method allows the guided wave to first reach the bottom of the base material, then be reflected into the weld, and finally be received by the receiving guided wave probe.
[0072] As an example, Figure 6As shown, the thickness information includes the weld thickness and the base material thickness, and the probe position information includes the distance between the guided wave probes. The probe position information is determined based on the guided wave incident angle and the thickness information, including:
[0073] S601: Add the weld thickness and the base material thickness to obtain a first sum value, and determine the tangent value of the guided wave incident angle.
[0074] S602: Determine a product of the first sum, the tangent value, and the first coefficient as a first product, wherein the waveguide probe spacing is greater than or equal to the first product.
[0075] For example, to ensure that the waveguide path can be successfully Figure 4 As shown in the schematic diagram, the calculated waveguide incident angle and thickness information are determined to determine the probe position information, and the probe position information includes the waveguide probe spacing, which is as follows: Figure 4 The distance L shown. Add the weld thickness t and the base material thickness T to obtain the first sum (t+T), the tangent value of the guided wave incident angle , the first coefficient can be 2.5, and the first coefficient is obtained according to the actual waveform path. The calculation formula for the waveguide probe spacing is as follows:
[0076]
[0077] It should be noted that L calculated in the above formula is the minimum distance between waveguide probes. The actual distance between waveguide probes must be greater than or equal to this value when selected.
[0078] As an example, the detection result includes the detection waveform of the weld to be detected. The weld to be detected is detected based on the waveguide parameter information and the probe position information to obtain the detection result, including: arranging the probe based on the probe position information, and emitting ultrasonic waves based on the waveguide parameter information, controlling the waveguide probe to move in a direction parallel to the weld, and obtaining the detection waveform of the weld to be detected.
[0079] For example, the above method selects the appropriate frequency and phase velocity through the dispersion curve, then calculates the waveguide incident angle, determines the position information of the waveguide probe based on the waveguide incident angle, and then places the waveguide probe according to the position information of the waveguide probe, emits Lamb waves according to the incident angle and the waveguide frequency, and detects the weld to be inspected. The waveguide probe can also be connected to a mechanical control device, which is used to control the position movement of the waveguide. For example, after calculating the position information of the waveguide probe, the waveguide probe is moved to the target position according to the position information, and then the distance between the two waveguide probes is kept unchanged, and the waveguide probe is controlled to move in a direction parallel to the weld until the Lamb wave covers the entire weld. It should be noted that the moving speed does not exceed 100 mm / s. Of course, if the weld is short, the entire weld can be covered without moving the waveguide probe, and the control probe is not moved.
[0080] As an example, Figure 7 As shown, the weld detection method also includes:
[0081] S701 , detecting a simulated test board based on the guided wave parameter information and the probe position information to obtain an initial guided wave waveform.
[0082] S702: Determine the weld defect condition based on the initial guided wave waveform and the detection waveform of the weld to be detected.
[0083] Exemplarily, the simulated test plate can be inspected based on the waveguide frequency, waveguide incident angle and probe position information calculated above, that is, the waveguide probe is placed according to the position information of the waveguide probe, and Lamb waves are emitted according to the waveguide incident angle and waveguide frequency. The simulated test plate is inspected to obtain a set of initial waveguide waveforms. It can be understood that the initial waveguide waveform is a control group to facilitate subsequent comparison with the detection waveform to determine whether the weld has defects or determine the location information of the weld defect.
[0084] For example, if a defect waveform is found during the inspection process, the position can be marked and recorded. After the weld inspection scan is completed, the weld data is compared with the initial guided wave waveform to finally complete the inspection.
[0085] The weld detection method of the present application can realize ultrasonic detection of incomplete welds, which can greatly reduce the occurrence of defects in the welding process of thick-walled welds. It can perform real-time monitoring of thick-walled welds during the welding process, reduce the occurrence of defects, avoid the need for a large amount of grinding and machining due to internal defects, reduce labor intensity, and improve quality.
[0086] Figure 8 It is a schematic diagram of a weld detection method according to an embodiment of the present application.
[0087] like Figure 8As shown, first measure the base material thickness T and the root or local weld thickness t on both sides of the weld to be inspected, establish the Rayleigh-Lamb wave equation and dispersion curve, and calculate the two sets of phase velocities C according to the base material thickness T and the weld thickness t. P Dispersion curve, select the appropriate Lamb wave mode, this mode should have ultrasonic frequency f and phase velocity C P Calculate and determine the incident angle of the guided wave The minimum guided wave probe spacing L is selected by calculation. The waveform display is adjusted on the simulated test plate to obtain a set of initial guided wave data. Then, a scan is performed on the weld to be inspected, and the curve is found and recorded. Finally, the weld inspection data is verified against the initial guided wave data to complete the inspection.
[0088] Another method for determining the parameters of a waveguide probe is described below.
[0089] As an example, Figure 9 As shown, the waveguide parameter information includes the waveguide frequency and the waveguide incident angle. The waveguide parameter information and probe position information are determined based on the dispersion curve, including:
[0090] S901, determine probe position information.
[0091] S902: Determine the guided wave incident angle based on the probe position information and thickness information.
[0092] S903 , determining a phase velocity based on the guided wave incident angle and the guided wave incident wave velocity, and determining a guided wave frequency based on the dispersion curve and the phase velocity.
[0093] Exemplarily, the above-mentioned method for determining the waveguide probe parameters is to first determine the waveguide parameter information and then determine the waveguide probe position information. The present application can also first determine the probe position information and then determine the waveguide parameter information. The following is a detailed description of first determining the probe position information and then determining the waveguide parameter information.
[0094] For example, appropriate probe position information can be configured first according to the structural conditions of the workpiece base material and weld to be measured. Figure 10 As shown in the schematic diagram of the probe guided wave, the base material thickness is T, the weld thickness is t, the weld depth is h, the probe tip distance is b, and the probe front distance is i. It can be understood that the probe tip distance b is the distance from the probe tip to the groove. The groove is the indentation on the upper side of the weld where welding is not completed. The probe front distance i is the distance between the center point of the guided wave probe and the tip of the guided wave probe. First, configure the appropriate probe position information. Based on the probe position and thickness information, determine the guided wave incident angle. Then, determine the phase velocity based on the guided wave incident angle and the guided wave incident wave velocity. Finally, determine the guided wave frequency based on the dispersion curve and phase velocity.
[0095] For example, according to the structure of the workpiece base material and the weld to be measured, configure the appropriate probe front end distance b and probe front edge distance i to measure the upslope width c of the weld to be measured. Therefore, the distance between the two probes is: .
[0096] It should be noted that for the method of first determining the probe position information and then determining the guided wave parameter information, only the dispersion curve corresponding to the weld thickness t can be constructed, without constructing the dispersion curve corresponding to the parent material thickness T. The method for constructing the dispersion curve is the same as the above method and will not be repeated here.
[0097] As an example, Figure 11 As shown, the probe position information includes the probe front end distance and the probe front edge distance, and the thickness information includes the weld thickness and the weld depth. The guided wave incident angle is determined based on the probe position information and the thickness information, including:
[0098] S1101, determining a second sum of the probe front end distance and the probe front edge distance, and a third sum of the weld thickness and the weld depth.
[0099] S1102, determining a second ratio between the second sum and the third sum.
[0100] S1103: Determine an arcsine result of the second ratio as a waveguide incident angle threshold, wherein the waveguide incident angle is greater than or equal to the waveguide incident angle threshold.
[0101] For example, a second sum (b+i) between the probe tip distance b and the probe front distance i, a third sum (h+t) between the weld thickness t and the weld depth h, and a second ratio between the second sum and the third sum are determined. , determine the arc sine result of the second ratio as the waveguide incident angle threshold, the waveguide incident angle is greater than or equal to the waveguide incident angle threshold, that is, the waveguide incident angle .
[0102] This application also combines the base material thickness T, weld thickness t, weld depth h, probe front end distance b and probe front edge distance i to determine the guided wave incident angle under the condition of meeting the full inspection coverage of the weld by ultrasonic guided waves. .
[0103] As an example, Figure 12 As shown, the phase velocity is determined based on the guided wave incident angle and the guided wave incident wave velocity, including:
[0104] S1201, determine the sine value of the guided wave incident angle.
[0105] S1202, determining a third ratio between the guided wave incident wave velocity and the sine value as the phase velocity.
[0106] For example, the sine value of the incident angle of the guided wave is determined , determine the incident wave velocity C of the guided wave according to the material properties W , according to Snell's law , the third ratio between the incident wave velocity and the sine value of the guided wave is determined to be the phase velocity, that is, the phase velocity It should be noted that according to the incident angle of the guided wave The range of phase velocity can be derived When the incident angle of the guided wave takes a certain value according to its own range, the phase velocity is also determined.
[0107] As an example, determining the waveguide frequency based on the dispersion curve and the phase velocity includes: determining a frequency corresponding to the phase velocity in the dispersion curve as the waveguide frequency.
[0108] For example, according to the dispersion curve corresponding to the weld thickness t obtained in the above steps, when the phase velocity is known, the guided wave frequency can be obtained through the dispersion curve.
[0109] When the waveguide frequency, waveguide incident angle, and probe position information are all determined, the weld to be inspected can be inspected. The inspection method is the same as described above and will not be repeated here.
[0110] Figure 13 This is a flow chart of a weld detection method according to another embodiment of the present application.
[0111] like Figure 13 As shown in the figure, first measure the base material thickness T and the root or local weld thickness t on both sides of the weld to be inspected. According to the material properties and the particle motion equation of elastic mechanics, the Rayleigh-Lamb wave equation of the weld thickness t is derived, and the phase velocity C corresponding to the weld thickness t is obtained. P Dispersion curve. According to the structure of the workpiece base material and the weld to be tested, configure the appropriate probe front end distance b and probe front edge distance i, and measure the upslope width c of the weld to be tested. Therefore, the distance between the two probes is: . Determine the angle of incidence , determine the incident wave velocity C according to the material properties W , combined with the base material thickness T, weld thickness t, weld depth h, probe tip distance b and probe front i, determine the incident angle while meeting the full coverage of ultrasonic guided wave inspection for the weld : Calculate the phase velocity C P Range, by Snell's law: , calculated to obtain: Then determine the frequency of the ultrasonic guided wave, combine it to obtain the dispersion curve and phase velocity C PThe ultrasonic guided wave frequency f in the appropriate Lamb wave mode is selected. The probe is placed on the simulated test plate and the waveform display is adjusted to obtain an initial set of guided wave data. The probe is then placed on the weld to be inspected. During the inspection, the probe slides parallel to the weld at a speed not exceeding 100 mm / s. Any defect waveforms detected during the inspection are marked and recorded, ultimately completing the inspection.
[0112] This application's lambda-based ultrasonic guided wave inspection method can rapidly detect defects such as cracks, lack of fusion, and incomplete penetration in welds and heat-affected zones. Furthermore, the configuration and selection of the guided wave probe can be determined based on the thickness of both the base metal and the weld itself. Using the appropriate guided wave probe for nondestructive testing of the root of thick-walled butt welds effectively controls welding quality while also avoiding unnecessary repair cycles and complications.
[0113] The present application also proposes a weld detection system.
[0114] As an example, Figure 2 As shown, the weld detection system includes: a weld to be detected; a waveguide transmitting probe and a waveguide receiving probe, which are symmetrically arranged on both sides of the weld to be detected; and a data processing device connected to the waveguide transmitting probe and the waveguide receiving probe, the data processing device is used to implement the steps of the weld detection method according to the above-mentioned method.
[0115] The present application also proposes a computer-readable storage medium.
[0116] In this embodiment, a computer program is stored on a computer-readable storage medium, and when the computer program is executed by a processor, the steps of the above-mentioned weld detection method are implemented.
[0117] Figure 14 A block diagram of an electronic device provided in accordance with an embodiment of the present application.
[0118] An embodiment of the present application provides an electronic device, including a memory and a processor, wherein the memory stores a computer program, and the processor implements the above-mentioned weld detection method when executing the computer program.
[0119] like Figure 14 As shown, for ease of understanding, the embodiment of the present application shows a specific electronic device.
[0120] Electronic device is intended to refer to various forms of digital computers, such as laptop computers, desktop computers, workstations, personal digital assistants, servers, blade servers, mainframe computers, and other suitable computers. Electronic device may also refer to various forms of mobile devices, such as personal digital assistants, cellular phones, smartphones, wearable devices, and other similar computing devices. The components shown herein, their connections and relationships, and their functions are intended to be examples only and are not intended to limit the implementation of the present disclosure described and / or claimed herein.
[0121] like Figure 14 As shown, the device includes a computing unit 1401, which can perform various appropriate actions and processes according to a computer program stored in a read-only memory (ROM) 1402 or a computer program loaded from a storage unit 1408 into a random access memory (RAM) 1403. RAM 1403 may also store various programs and data required for the operation of the electronic device. Computing unit 1401, ROM 1402, and RAM 1403 are interconnected via a bus 1404. An input / output (I / O) interface 1405 is also connected to bus 1404.
[0122] Multiple components in the electronic device are connected to the I / O interface 1405, including an input unit 1406, such as a keyboard and mouse; an output unit 1407, such as various types of displays and speakers; a storage unit 1408, such as a magnetic disk and optical disk; and a communication unit 1409, such as a network card, a modem, a wireless communication transceiver, etc. The communication unit 1409 allows the electronic device to exchange information / data with other devices via a computer network such as the Internet and / or various telecommunication networks.
[0123] Computing unit 1401 can be any general-purpose and / or specialized processing component with processing and computing capabilities. Some examples of computing unit 1401 include, but are not limited to, a central processing unit (CPU), a graphics processing unit (GPU), various specialized artificial intelligence (AI) computing chips, various computing units running machine learning model algorithms, a digital signal processor (DSP), and any suitable processor, controller, microcontroller, etc. Computing unit 1401 executes the various methods described above, such as the weld detection method. For example, in some embodiments, the weld detection method can be implemented as a computer software program tangibly embodied in a machine-readable medium, such as storage unit 1408. In some embodiments, part or all of the computer program can be loaded and / or installed onto the electronic device via ROM 1402 and / or communication unit 1409. When the computer program is loaded into RAM 1403 and executed by computing unit 1401, the weld detection method described above can be executed. Alternatively, in other embodiments, computing unit 1401 can be configured to execute the weld detection method via any other suitable means (e.g., via firmware).
[0124] It should be noted that the logic and / or steps represented in the flowcharts or otherwise described herein, for example, can be considered as a sequenced list of executable instructions for implementing the logical functions, and can be embodied in any computer-readable medium for use by, or in conjunction with, an instruction execution system, apparatus, or device (e.g., a computer-based system, a system including a processor, or other system that can fetch and execute instructions from an instruction execution system, apparatus, or device). For purposes of this application, a "computer-readable medium" can be any device that can contain, store, communicate, propagate, or transport a program for use by, or in conjunction with, an instruction execution system, apparatus, or device. More specific examples (non-exhaustive list) of computer-readable media include the following: an electrical connection with one or more wires (electronic device), a portable computer disk cartridge (magnetic device), random access memory (RAM), read-only memory (ROM), erasable and programmable read-only memory (EPROM or flash memory), fiber optic devices, and a portable compact disc read-only memory (CDROM). Furthermore, the computer-readable medium may even be paper or other suitable medium on which the program is printed, since the program may be obtained electronically, for example, by optically scanning the paper or other medium and then editing, interpreting or otherwise processing it in a suitable manner if necessary, and then storing it in a computer memory.
[0125] It should be understood that portions of the application can be implemented in hardware, software, firmware, or combinations thereof. In the above embodiments, multiple steps or methods can be implemented in software or firmware that is stored in memory and executed by a suitable instruction execution system. For example, if implemented in hardware, as in another embodiment, implementation can be with any or a combination of the following technologies, which are all well-known in the art: a discrete logic circuit having logic gates for implementing logic functions upon an application of data signals, an application specific integrated circuit having appropriate combinational logic gates, a programmable gate array (PGA), a field programmable gate array (FPGA), etc.
[0126] In the description of the present application, the description of the terms "one embodiment", "some embodiments", "an example", "a specific example", or "some examples" etc. means that the specific feature, structure, material or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the present application. The illustrative representation of the above terms in the present application does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described can be combined in any one or more embodiments or examples in a suitable manner.
[0127] In the description of the present application, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, and are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be understood as a limitation on the present application.
[0128] In addition, the terms "first", "second", etc. used in the embodiments of the present application are only for the purpose of description and can not be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated in the embodiments. Therefore, the features defined with the terms "first", "second" and the like in the embodiments of the present application can be explicitly or implicitly indicated to include at least one of the features. In the description of the present application, the meaning of the word "plurality" is at least two or two or more, such as two, three, four, etc., unless otherwise specifically limited in the embodiments.
[0129] In the present application, unless otherwise explicitly specified or limited in the embodiments, the terms "mounting", "connecting", "connecting" and "fixing" and the like appearing in the embodiments should be understood in a broad sense, for example, the connection can be fixed connection, or detachable connection, or integral, can be understood, or mechanical connection, electrical connection, etc. Of course, it can also be directly connected, or indirectly connected through an intermediate medium, or it can be the internal communication of two elements, or the interaction relationship of two elements. For those skilled in the art, the specific meaning of the above terms in the present application can be understood according to the specific implementation situation.
[0130] In the present application, unless otherwise explicitly specified and limited, the first feature is "on" or "under" the second feature. The first and second features can be in direct contact, or the first and second features can be indirectly contacted through an intermediate medium. Moreover, the first feature "above", "above" and "above" the second feature can be directly above or obliquely above the first feature, or only indicates that the horizontal height of the first feature is higher than that of the second feature. The first feature "below", "below" and "below" the second feature can be directly below or obliquely below the first feature, or only indicates that the horizontal height of the first feature is less than that of the second feature.
[0131] Although the embodiments of the present application have been shown and described above, it can be understood that the above embodiments are exemplary and cannot be understood as limiting the present application. Those skilled in the art can make changes, modifications, replacements and variations to the above embodiments within the scope of the present application.
Claims
1. A method for detecting a weld, characterized in that: The method comprises: Obtaining thickness information of the weld to be inspected, and constructing a dispersion curve corresponding to the thickness information, wherein the thickness information includes a base material thickness and a weld thickness, and the dispersion curve corresponding to the thickness information includes a first dispersion curve corresponding to the weld thickness and a second dispersion curve corresponding to the base material thickness; Determining waveguide parameter information and probe position information based on the dispersion curve, wherein the waveguide parameter information includes the waveguide frequency and the waveguide incident angle, and the probe position information includes the waveguide probe spacing; determining the frequency corresponding to the intersection of the first dispersion curve and the second dispersion curve as the waveguide frequency; determining the waveguide incident angle based on the phase velocity corresponding to the waveguide frequency and the waveguide incident wave velocity; and determining the waveguide probe spacing based on the base material thickness, the weld thickness, and the waveguide incident angle; Detecting the weld to be detected based on the guided wave parameter information and the probe position information to obtain a detection result; The determining the distance between the waveguide probes based on the thickness of the base material, the thickness of the weld, and the waveguide incident angle includes: Adding the weld thickness and the base material thickness to obtain a first sum value, and determining a tangent value of the guided wave incident angle; A product of the first sum, the tangent value, and the first coefficient is determined as a first product, wherein the waveguide probe spacing is greater than or equal to the first product.
2. The weld detection method according to claim 1, characterized in that: The determining of the guided wave incident angle based on the phase velocity corresponding to the guided wave frequency and the guided wave incident wave velocity comprises: determining a first ratio between the incident wave velocity of the guided wave and the phase velocity; An arc sine result of the first ratio is determined to be the guided wave incident angle.
3. The weld detection method according to claim 1, characterized in that: The detection result includes a detection waveform of the weld to be detected, and the detection of the weld to be detected based on the waveguide parameter information and the probe position information to obtain the detection result includes: The probe is arranged based on the probe position information, and ultrasonic waves are emitted based on the waveguide parameter information. The waveguide probe is controlled to move in a direction parallel to the weld to obtain a detection waveform of the weld to be detected.
4. The weld detection method according to claim 3, characterized in that: The method further comprises: Detecting a simulated test plate based on the waveguide parameter information and the probe position information to obtain an initial waveguide waveform; The weld defect condition is determined based on the initial guided wave waveform and the detection waveform of the weld to be detected.
5. A method for detecting a weld, characterized in that: The method comprises: Obtaining thickness information of the weld to be inspected, and constructing a dispersion curve corresponding to the thickness information, wherein the thickness information includes the weld thickness t and the weld depth h, and the dispersion curve includes a first dispersion curve corresponding to the weld thickness; Determine probe position information, and determine guided wave parameter information based on the probe position information, the thickness information, and the dispersion curve, wherein the guided wave parameter information includes a guided wave incident angle and a guided wave frequency, and the probe position information includes a probe front end distance b and a probe front edge distance i, determine a second sum value b+i between the probe front end distance b and the probe front edge distance i, a third sum value h+t between the weld thickness t and the weld depth h, and determine a second ratio between the second sum value and the third sum value , determining an arcsine result of the second ratio as a waveguide incident angle threshold, the waveguide incident angle being greater than or equal to the waveguide incident angle threshold, determining a phase velocity based on the waveguide incident angle and the waveguide incident wave velocity, and determining the waveguide frequency based on the phase velocity and the first dispersion curve; Detecting the weld to be detected based on the guided wave parameter information and the probe position information to obtain a detection result; Determining the waveguide frequency based on the phase velocity and the first dispersion curve includes: determining a frequency corresponding to the phase velocity in the first dispersion curve as the waveguide frequency.
6. The weld detection method according to claim 5, characterized in that: The determining of the phase velocity based on the guided wave incident angle and the guided wave incident wave velocity comprises: Determining the sine value of the guided wave incident angle; A third ratio between the incident wave velocity of the guided wave and the sine value is determined as the phase velocity.
7. The weld detection method according to claim 5, characterized in that: The detection result includes a detection waveform of the weld to be detected, and the detection of the weld to be detected based on the waveguide parameter information and the probe position information to obtain the detection result includes: The probe is arranged based on the probe position information, and ultrasonic waves are emitted based on the waveguide parameter information. The waveguide probe is controlled to move in a direction parallel to the weld to obtain a detection waveform of the weld to be detected.
8. The weld detection method according to claim 7, characterized in that: The method further comprises: Detecting a simulated test plate based on the waveguide parameter information and the probe position information to obtain an initial waveguide waveform; The weld defect condition is determined based on the initial guided wave waveform and the detection waveform of the weld to be detected.
9. A weld detection system, characterized in that: The system comprises: Welds to be inspected; A waveguide transmitting probe and a waveguide receiving probe are symmetrically arranged on both sides of the weld to be inspected; A data processing device connected to the guided wave transmitting probe and the guided wave receiving probe, the data processing device being used to implement the steps of the weld detection method according to any one of claims 1 to 4, or to implement the steps of the weld detection method according to any one of claims 5 to 8.
10. An electronic device, characterized in that: The invention comprises a memory and a processor, wherein the memory stores a computer program, and is characterized in that when the processor executes the computer program, the steps of the weld detection method according to any one of claims 1 to 4 are implemented, or the steps of the weld detection method according to any one of claims 5 to 8 are implemented.
11. A computer-readable storage medium, characterized in that A computer program is stored thereon, and when the computer program is executed by a processor, the steps of the weld detection method according to any one of claims 1 to 4 are implemented, or the steps of the weld detection method according to any one of claims 5 to 8 are implemented.
Citation Information
Patent Citations
Air coupling ultrasonic detection method for defects
CN110554088A
Weld joint detection method, device and equipment and storage medium
CN111505118A