Signal conversion device for VDIS test and use method

Abstract

The invention discloses a signal conversion device for a VDIS test and a use method, and belongs to the technical field of power equipment. The device comprises a signal conversion assembly, an optical signal probe, a fixing part, a probe cable and an output coaxial cable; the optical signal probe is installed at the signal position of a VDIS through the fixing piece, a full-spectrum photosensitive element is installed in the optical signal probe, the optical signal probe is connected with the input end of the signal conversion assembly through a probe cable, the output coaxial cable is connected with the output end of the signal conversion assembly, and the input end and the output end of the signal conversion assembly are each provided with a discharge tube. A clamping resistor is arranged in the signal conversion assembly, and during use, the output end of the signal conversion assembly is connected with waveform recording equipment through an output coaxial cable. According to the invention, the display signal of the live display can be converted into the electric signal for direct measurement without opening the shell of the sample.

Description

Technical Field

[0001] The present invention belongs to the technical field of electric power equipment, and in particular relates to a signal conversion device for VDIS test and a use method thereof. Background Art

[0002] As a key safety device in the power system, the core function of the voltage detecting and indicating system (VDIS) is to intuitively reflect the high-voltage live status through visual signals to prevent safety accidents caused by misoperation. According to the current standard requirements, this type of device must pass two core tests to verify its performance: the clear display test requires that the frequency of repeated display is equal to or greater than 1Hz within the range of 40% (or 45%) of the nominal voltage to the rated voltage Ur; the response time measurement test requires that the response time t be measured and recorded at 40% (or 45%) of the nominal voltage. r No more than 1s. Figure 1 As shown, the display modes of high-voltage live display devices in actual projects are diverse, and the specific display implementation methods also include the following situations: 1) The display light is off when not energized, and the red light is on when energized; 2) The display light is green when not energized, and the red light is on when energized; 3) The green display light is on when not energized, and the red light is off; when energized, the green display light is off, and the red light is on; 4) The intelligent display device uses a liquid crystal display, and the display area is green when not energized and red when energized. In addition, the VDIS display mode is divided into two categories: one is that the high voltage gradually increases from zero to the nominal voltage, and the display gradually changes from dark to bright; the other is that the high voltage gradually increases from zero to the nominal voltage, and the display gradually changes from dark to bright, and the display light flashes during the change.

[0003] Currently, the following methods are used for the clear perceptibility of visual indication test of high-voltage live display devices: First, when the frequency of repeated display is determined to be equal to or greater than 1Hz, the test piece is opened, and a recorder probe is directly connected to the electrodes of the display light to record its power supply waveform for judgment. This method opens the test piece casing, which is likely to change the state parameters of the test piece and easily cause safety problems. Second, the response time test directly connects the recorder probe to the electrodes of the display light to record its power supply waveform for judgment, or uses the external control switch electrodes of the live display for judgment. It is impossible to directly judge the repetition frequency of the display and the difference between the display and the switch value. Summary of the Invention

[0004] The object of the present invention is to provide a signal conversion device for VDIS test and a method of use, which can convert the display signal of a live display into an electrical signal for direct measurement without opening the test sample housing.

[0005] In order to achieve the above object, the present invention adopts the following technical solutions:

[0006] In a first aspect, a signal conversion device for VDIS testing includes: a signal conversion component, an optical signal probe, a fixing member, a probe cable, and an output coaxial cable;

[0007] The optical signal probe is installed at the signal position of the VDIS through the fixing part, and a full-spectrum photosensor is installed in the optical signal probe. The optical signal probe is connected to the input end of the signal conversion component through the probe cable, and the output coaxial cable is connected to the output end of the signal conversion component. Discharge tubes are provided at both the input and output ends of the signal conversion component, and a clamping resistor is provided in the signal conversion component. When in use, the output end of the signal conversion component is connected to the waveform recording device through the output coaxial cable.

[0008] In some embodiments, the signal conversion assembly includes: an output cable head, a ground terminal, an output terminal, an input cable head, an input terminal, and a power switch;

[0009] Several output terminals and input terminals are arranged on the shell surface of the signal conversion component, and the output terminals and the input terminals are electrically connected inside the shell of the signal conversion component. The grounding terminal is arranged on the shell surface and grounded. The output cable head is installed on the output terminal and connected to the output coaxial cable. The input cable head is installed on the input terminal and connected to the probe cable. The power switch is arranged on the shell surface. When in use, the power switch controls the signal conversion component to be turned on or off.

[0010] In some embodiments, the optical signal probe includes: a light mask, a filter, a full-spectrum photosensor, a filter holder, and a probe fixing slot;

[0011] The filter is installed on the inner side of the light cover through the filter clamp, the probe fixing groove is set on the outer side of the light cover, and a full-spectrum photosensor is set at one end of the probe cable and extends into the light cover. The full-spectrum photosensor is located between the filter and the probe cable.

[0012] In some embodiments, the probe cable is a two-core shielded cable, the fixing member is a fixing bracket or a fixing rubber belt, and the fixing member is installed on the probe fixing slot.

[0013] In some embodiments, a plurality of filter holders are evenly arranged along the inner circumference of the mask.

[0014] In some embodiments, the fixing bracket includes a fixing clamp, a serpentine tube, and a base;

[0015] The base has a built-in magnet, one end of the serpentine tube is mounted on the base, and the other end is provided with a fixing clip, which is clamped on the probe fixing slot.

[0016] In some embodiments, the fixing rubber belt includes a rubber belt, an optical probe fixing hole is defined in the rubber belt, the optical signal probe passes through the optical probe fixing hole, and the rubber belt is embedded in the probe fixing groove.

[0017] In a second aspect, a method for using a signal conversion device for a VDIS test comprises the following steps:

[0018] The switch output point signal of the VDIS is input to the input end of the signal conversion component through a two-core shielded cable, and then passes through the output end of the signal conversion component and is output to the waveform recording device through an output coaxial cable;

[0019] The waveform recording device is then connected to the high-voltage loop voltage signal, and during the process, the changing waveforms of the high-voltage loop voltage signal and the switch output point signal are recorded, and corresponding parameters are measured.

[0020] In a third aspect, a method for using a signal conversion device for a VDIS test is provided, based on the signal conversion device, comprising the following steps:

[0021] First, insert the optical signal probe into the optical probe fixing hole and fix it to the optical display signal position of the VDIS with a rubber band;

[0022] After the optical display signal of VDIS is converted into an electrical signal by the optical signal probe, it is input to the input end of the signal conversion component through a two-core shielded cable, and then passes through the output end of the signal conversion component and is output to the waveform recording device through the output coaxial cable.

[0023] In some embodiments, the following steps are further included:

[0024] When VDIS has been installed on the device, install the optical signal probe on the fixing clamp, magnetically attach the base to the device housing near VDIS, and adjust the serpentine tube to fix the optical signal probe to the optical display signal position of VDIS.

[0025] After the optical display signal of VDIS is converted into an electrical signal by the optical signal probe, it is input to the input end of the signal conversion component through a two-core shielded cable, and then passes through the output end of the signal conversion component and is output to the waveform recording device through the output coaxial cable.

[0026] Compared with the prior art, the present invention has the following beneficial effects:

[0027] The present invention provides a signal conversion device for VDIS testing. A full-spectrum photosensitive element is installed in an optical signal probe, which can accurately identify the various color changes of a high-voltage live display device. Its high-speed response characteristics meet the requirements of clear display testing and response time measurement, and avoid signal distortion. In addition, discharge tubes are provided at the input and output ends of the signal conversion component to prevent transient overvoltage from damaging the equipment during high-voltage testing. A clamping resistor is provided in the signal conversion component to eliminate floating potential interference and improve test safety and anti-interference capabilities. The optical signal probe of the present invention is connected to the input end of the signal conversion component through a probe cable, and the output coaxial cable is connected to the output end of the signal conversion component. The output end of the signal conversion component is connected to a waveform recording device through an output coaxial cable, and can convert the display signal of the live display into an electrical signal for direct measurement without opening the test piece housing.

[0028] Furthermore, a filter is set in front of the full-spectrum photosensor to extract the display light status and corresponding color signal that need to be tested; the filter is installed on the inner side of the light mask through the filter clamp, and filters of different colors can be quickly replaced.

[0029] Furthermore, the probe cable is a two-core shielded cable, and the output coaxial cable is connected to the output end of the signal conversion component, which can reduce the influence of the surrounding electromagnetic field on the signal during the high-voltage test.

[0030] Furthermore, the light mask is made of rubber or flexible plastic, which can isolate the interference of the outside world and other displays of the high-voltage live display device on the test signal.

[0031] Furthermore, the base has a built-in magnet, one end of the serpentine tube is mounted on the base, and a fixing clip is provided at the other end. The fixing clip is clamped on the probe fixing slot, and can quickly fix the probe at the position of the measured signal.

[0032] Furthermore, the optical signal probe passes through the optical probe fixing hole, and the rubber belt is embedded in the probe fixing groove, so that the probe can be quickly fixed at the position of the measured signal. BRIEF DESCRIPTION OF THE DRAWINGS

[0033] Figure 1 These are example diagrams of the measurement results of a response time measurement test conducted using the prior art, where (a) to (e) are example diagrams of waveforms of different signals.

[0034] Figure 2 A structural diagram of a signal conversion device for a VDIS test provided in an embodiment, wherein (a) is a structural diagram of a signal conversion component, (b) is a structural diagram of a fixed rubber belt, and (c) is a structural diagram of a fixed bracket;

[0035] Figure 3 A circuit schematic diagram of a signal conversion device for VDIS testing provided in an embodiment;

[0036] Figure 4 A schematic diagram of the specific structure of the signal conversion component provided in the embodiment;

[0037] Figure 5 A structural diagram of an optical signal probe provided in an embodiment, wherein (a) is an axonometric view of the optical signal probe, and (b) is a cross-sectional view of the optical signal probe;

[0038] Figure 6 Figure 1 is a diagram of a fixed bracket structure provided in an embodiment, wherein (a) is a diagram of the fixed bracket before installation, and (b) is a diagram of the fixed bracket after installation;

[0039] Figure 7 Diagram of the structure of the fixed rubber belt provided in the embodiment, wherein (a) is a diagram of the fixed rubber belt before installation, and (b) is a diagram of the fixed rubber belt after installation;

[0040] Figure 8 Schematic diagram of fixing the optical signal probe in the test position using a fixing rubber band provided in an embodiment, wherein (a) is a diagram before fixing, and (b) is a diagram after fixing;

[0041] Figure 9 Waveform diagrams of a conversion test using an optical probe provided in an embodiment, wherein (a) and (b) are waveform diagrams of different time resolutions;

[0042] Figure 10 Waveform diagrams of response time tests provided in the embodiments, where (a) is the waveform diagram before using a shielded cable and a clamping resistor, and (b) is the waveform diagram after using a shielded cable and a clamping resistor;

[0043] In the figure, 1. Signal conversion component; 2. Optical signal probe; 3. Fixing bracket; 4. Fixing rubber belt; 5. Probe cable; 6. Output coaxial cable; 11. Output cable head; 12. Ground terminal; 13. Output terminal; 14. Input cable head; 15. Input terminal; 16. Power switch; 21. Optical cover; 22. Filter; 23. Full-spectrum photosensor; 24. Two-core shielded cable; 25. Filter clamp; 26. Probe fixing slot; 31. Fixing clip; 32. Serpentine tube; 33. Base; 41. Rubber belt; 42. Optical probe fixing hole. DETAILED DESCRIPTION

[0044] Hereinafter, only certain exemplary embodiments are briefly described, and the described embodiments may be modified in various different ways without departing from the spirit or scope of the present invention. Therefore, the drawings and description are to be regarded as illustrative in nature and not restrictive.

[0045] In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like to indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed or operate in a specific orientation, and therefore should not be understood as limiting the present invention.

[0046] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of the technical features being referred to. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of such features. In the description of the present invention, "plurality" means two or more, unless otherwise specifically defined.

[0047] In the present invention, unless otherwise expressly specified or limited, terms such as "installed," "connected," "connected," and "fixed" should be understood broadly. For example, they may refer to fixed connection, detachable connection, or integration; mechanical connection, electrical connection, or communication; direct connection or indirect connection through an intermediate medium; and internal communication between two components or interaction between two components. Those skilled in the art will understand the specific meanings of the above terms in the present invention based on specific circumstances.

[0048] It should be noted that the terms "including" and "having" and any variations thereof in the description and claims of the present invention are intended to cover non-exclusive inclusions. For example, a process, method, system, product or apparatus comprising a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units that are not explicitly listed or are inherent to these processes, methods, systems, products or apparatus.

[0049] In this specification, the signal conversion component is a signal conversion device (signal conversion equipment), which is a device that converts the optical signal or on / off switch signal of the high-voltage live display device into an electrical signal that is easy to measure.

[0050] like Figure 2As shown, this embodiment provides a signal conversion device for VDIS testing, comprising: a signal conversion assembly 1, an optical signal probe 2, a fixing member, a probe cable 5, and an output coaxial cable 6. The optical signal probe 2 is mounted at the VDIS signal position via the fixing member, a full-spectrum photosensor 23 is installed within the optical signal probe 2, the optical signal probe 2 is connected to the input end of the signal conversion assembly 1 via the probe cable 5, and the output coaxial cable 6 is connected to the output end of the signal conversion assembly 1. Discharge tubes are provided at both the input and output ends of the signal conversion assembly 1, and a clamping resistor is provided within the signal conversion assembly 1. When in use, the output end of the signal conversion assembly 1 is connected to a waveform recording device via the output coaxial cable 6. The fixing member is a fixing bracket 3 or a fixing rubber band 4.

[0051] like Figure 4 As shown, the signal conversion component 1 includes an output cable head 11, a ground terminal 12, an output terminal 13, an input cable head 14, an input terminal 15 and a power switch 16. The circuit principle is as follows Figure 3 As shown, the optical signal probe 2 converts the received optical signal into an electrical signal indicating a change in circuit parameters through the AA" port of the live display, and then inputs the electrical signal into the input port AA of the signal conversion component 1 through the AA' port of the probe cable 5. The voltage signal corresponding to the change in the optical signal due to the change in circuit parameters is output through the BB port via the output coaxial cable 6, and a waveform recording device (oscilloscope or waveform recorder, etc.) records the electrical signal corresponding to the change in the optical signal. Figure 3 The conversion principle for only one channel is implemented. Signal conversion component 1 utilizes power supply isolation measures, allowing the addition of multiple independent input and output channels using the same principle. Discharge tubes GS1 and GS2 are installed at the input and output ports of the signal conversion component 1 circuit for overvoltage protection, and internal clamping resistors are also included.

[0052] Several output terminals 13 and input terminals 15 are set on the shell surface of the signal conversion component 1, and the output terminals 13 and the input terminals 15 are electrically connected inside the shell of the signal conversion component 1. The grounding terminal 12 is set on the shell surface and grounded. The output cable head 11 is installed on the output terminal 13 and connected to the output coaxial cable 6. The input cable head 14 is installed on the input terminal 15 and connected to the probe cable 5. The power switch 16 is set on the shell surface. When in use, the power switch 16 controls the signal conversion component 1 to be turned on or off.

[0053] like Figure 5 As shown, the optical signal probe 2 includes a light shield 21, a filter 22, a full spectrum photosensitive element 23, a filter holder 25 and a probe fixing slot 26, and the probe cable 5 is a two-core shielded cable 24. The light shield 21 is made of opaque rubber or flexible plastic material such as Figure 5The inner side of the light mask has a card slot for installing the filter and a filter card head 25 for limiting the position. The filter card heads are evenly arranged 3 or 4 along the inner circumference of the light mask 21, which can easily install and remove the filter 22. A full-spectrum photosensor 23 is installed at the center of the light mask 1. The full-spectrum photosensor 23 can adopt a full-spectrum high-speed photosensor, such as the model PT850D5C photosensor. The rear part of the full-spectrum photosensor 23 is connected to a two-core shielded cable 24. The end of the two-core shielded cable 24 is equipped with a two-core cable head that can be connected to the input end of the signal conversion component 1. A probe fixing groove 26 is designed at the root of the outer side of the light mask 21. A fixing bracket 3 or a fixing rubber belt 4 can be installed as needed to fix the optical signal probe 2 at the signal position to be tested, such as Figure 8 shown.

[0054] like Figure 6 As shown, the fixing bracket 3 includes a fixing clamp 31, a serpentine tube 32, and a base 33. The base 33 is equipped with a magnet, which allows the fixing bracket to be directly attached to the switch cabinet or control cabinet where the high-voltage live display device is installed. The fixing clamp 31 on the fixing bracket 3 is then used to clamp the probe, and the serpentine tube 32 is used to adjust the angle of the probe to fix it at the signal position of the high-voltage live display device.

[0055] like Figure 7 As shown, the fixed rubber belt 4 includes a rubber belt 41, and an optical probe fixing hole 42 is opened on the rubber belt 41. The optical signal probe 2 is inserted into the optical probe fixing hole 42 on the fixed rubber belt 4, and the fixed rubber belt 4 is embedded in the probe fixing groove 26 on the optical signal probe 2. The optical signal probe 2 is fixed to the signal position of the high-voltage live display device by the elasticity of the rubber belt 41, as shown in FIG. Figure 8 shown.

[0056] The above structure adopts a full-spectrum high-speed photosensitive element, which can directly convert the status of different color displays of the live display; the light cover made of rubber or flexible plastic and other materials can isolate the interference of the outside world and other displays of the live display device on the test signal; a filter structure is added in front of the full-spectrum high-speed photosensitive element to extract the color signal corresponding to the display light status to be tested; the light cover adopts a multi-point filter card to install the filter, which can quickly replace the filters of different colors; the signal input and output adopt a two-core shielded cable and an output coaxial cable, which can reduce the influence of the surrounding electromagnetic field on the signal during the high-voltage test; the signal conversion component adopts a clamping resistor R, which can effectively clamp the potential. When the VDIS test switch K in the circuit is disconnected, the output potential is limited to about 0V to prevent the suspended circuit from inducing the changing potential in the electromagnetic field, such as Figure 10(a) Interference in channel 1; a serpentine tube holder with a magnetic base can quickly secure the probe to the measured signal location; a fixed rubber belt can quickly secure the optical signal probe to the measured signal location; a probe fixing slot is provided on the optical mask to quickly and reliably secure the probe to the measured signal location.

[0057] Working Principle: The working process of the signal conversion device for VDIS test provided in this embodiment is divided into three cases:

[0058] In the first case, the optical signal probe 2 is passed through the optical probe fixing hole 42 of the fixing rubber belt 4 and fixed to the signal position of the high voltage live display, such as Figure 8 Then, the output cable of the optical signal probe 2 is connected to a channel of the input terminal 15 of the signal conversion component 1, and the signal of the corresponding channel output terminal 13 of the signal conversion component 1 is connected to the waveform recording device through the output coaxial cable 6.

[0059] In the second case, if the high-voltage live display has been installed on the equipment, fix the optical signal probe 2 at the fixing clip 31 of the fixing bracket 3, and then magnetically attract the base 33 of the fixing bracket 3 to the iron parts around the high-voltage live display, adjust the serpentine tube 32 to fix the optical signal probe 2 to the signal position of the high-voltage live display, and then connect the output cable of the optical signal probe 2 to the input port of the signal conversion component 1, and then connect the output cable of the probe to a channel of the input terminal 15 of the signal conversion component 1, and connect the signal of the corresponding channel output terminal 13 of the signal conversion component 1 to the waveform recording device through the output coaxial cable 6.

[0060] In the third case, the switch output signal of the high-voltage live display is connected to a channel of the input terminal 15 using a double-shielded cable similar to the optical signal probe 2, and the signal of the corresponding channel output terminal 13 of the signal conversion component 1 is connected to the waveform recording device through the output coaxial cable 6. The waveform recording device is then connected to the voltage signal of the high-voltage circuit, and records similar Figure 1 The waveforms of the high voltage signal change and the signal change of the live display are shown. The corresponding time and other parameters can be measured from the waveforms.

[0061] Test verification: Use ordinary light emitting diode to test this device, the test waveform is as follows Figure 9 As shown in the figure, the test stabilization time of the device is about 20μs (including the response time of the light-emitting diode), and the startup time is about 0.2μs. The standard test clearly shows that the display frequency is equal to or greater than 1Hz within the range of 40% (or 45%) of the nominal voltage to the rated voltage Ur; the response time measurement test requires that the response time t be measured and recorded at 40% (or 45%) of the nominal voltage. rThe signal conversion device provided in this embodiment fully meets the measurement requirements of the standard. Figure 10 As shown in the figure, it is the response time test waveform of the device test. Figure 10 As shown in (b), the signal conversion device provided in this embodiment is installed with a two-core shielded cable and a clamping resistor, which can effectively suppress the interference in channel 1.

[0062] Therefore, the signal conversion device provided in this embodiment is used to directly record the light display signal of the live display; there is no need to open the test sample casing, ensuring that the performance of the test sample is not affected; this device is not directly electrically connected to the live display device, ensuring the safety of personnel and equipment during the test process; this device adopts a two-core shielded cable structure to avoid interference of the high-voltage circuit on the measurement circuit during the test; this device can measure the time response of a live display device without a switching output; this device can directly measure a variety of live display devices such as a single light color change display and a liquid crystal color change display; the device's own response time can be less than 5μs, which fully meets the above-mentioned repeated display frequency equal to or greater than 1Hz and the response time t r Parameter measurement requirement of no more than 1s.

[0063] This embodiment also provides a method for using a signal conversion device for a VDIS test, comprising the following steps:

[0064] The switch output point signal of the VDIS is input to the input end of the signal conversion component 1 through a two-core shielded cable, and then output to the waveform recording device through the output end of the signal conversion component 1 and the output coaxial cable 6; the waveform recording device is then connected to the high-voltage loop voltage signal, and the changing waveforms of the high-voltage loop voltage signal and the switch output point signal are recorded during the process, and the corresponding parameters are measured.

[0065] For the test light display signal, the method further comprises the following steps:

[0066] First, insert the optical signal probe 2 into the optical probe fixing hole 42 and fix it at the optical display signal position of the VDIS through the rubber belt 41; after the optical display signal of the VDIS is converted into an electrical signal by the optical signal probe 2, it is input to the input end of the signal conversion component 1 through a two-core shielded cable, and then through the output end of the signal conversion component 1 and output to the waveform recording device through the output coaxial cable 6.

[0067] When VDIS has been installed on the device, the optical signal probe 2 is installed on the fixing clamp 31, the base 33 is magnetically attracted to the device housing near the VDIS, and the serpentine tube 32 is adjusted to fix the optical signal probe 2 to the optical display signal position of the VDIS. After the optical display signal of the VDIS is converted into an electrical signal by the optical signal probe 2, it is input to the input end of the signal conversion component 1 through a two-core shielded cable, and then through the output end of the signal conversion component 1 and output to the waveform recording device through the output coaxial cable 6.

[0068] It is known from common technical knowledge that the present invention can be implemented by other embodiments that do not deviate from its spirit or essential features. Therefore, the embodiments disclosed above are merely illustrative in all respects and are not exclusive. All modifications within the scope of the present invention or equivalent to the scope of the present invention are intended to be encompassed by the present invention.

Claims

1. A signal conversion device for VDIS test, characterized in that: include: A signal conversion component (1), an optical signal probe (2), a fixing member, a probe cable (5) and an output coaxial cable (6); The optical signal probe (2) is installed at the signal position of the VDIS through the fixing member. A full-spectrum photosensor (23) is installed in the optical signal probe (2). The optical signal probe (2) is connected to the input end of the signal conversion component (1) through the probe cable (5). The output coaxial cable (6) is connected to the output end of the signal conversion component (1). Discharge tubes are provided at the input end and the output end of the signal conversion component (1). A clamping resistor is provided in the signal conversion component (1). When in use, the output end of the signal conversion component (1) is connected to a waveform recording device through the output coaxial cable (6).

2. A signal conversion device for VDIS test according to claim 1, characterized in that: The signal conversion component (1) comprises: an output cable head (11), a ground terminal (12), an output terminal (13), an input cable head (14), an input terminal (15) and a power switch (16); A plurality of output terminals (13) and input terminals (15) are provided on the housing surface of the signal conversion component (1); the output terminals (13) and the input terminals (15) are electrically connected inside the housing of the signal conversion component (1); a grounding terminal (12) is provided on the housing surface and is grounded; an output cable head (11) is installed on the output terminal (13) and is connected to an output coaxial cable (6); an input cable head (14) is installed on the input terminal (15) and is connected to a probe cable (5); a power switch (16) is provided on the housing surface; when in use, the power switch (16) controls the signal conversion component (1) to be turned on or off.

3. The signal conversion device for VDIS test according to claim 1, characterized in that: The optical signal probe (2) comprises: a light cover (21), a filter (22), a full-spectrum photosensitive element (23), a filter holder (25) and a probe fixing slot (26); The filter (22) is mounted on the inner side of the light shield (21) through a filter clamp (25), the probe fixing groove (26) is arranged on the outer side of the light shield (21), a full-spectrum photosensitive element (23) is arranged at one end of the probe cable (5) and extends into the interior of the light shield (21), and the full-spectrum photosensitive element (23) is located between the filter (22) and the probe cable (5).

4. A signal conversion device for VDIS test according to claim 3, characterized in that: The probe cable (5) is a two-core shielded cable, the fixing part is a fixing bracket (3) or a fixing rubber belt (4), and the fixing part is installed on the probe fixing groove (26).

5. The signal conversion device for VDIS test according to claim 3, characterized in that: A plurality of filter clamps (25) are evenly arranged along the inner circumference of the light mask (21), and the light mask (21) is made of rubber or flexible plastic.

6. The signal conversion device for VDIS test according to claim 4, characterized in that: The fixing bracket (3) comprises a fixing clamp (31), a serpentine tube (32) and a base (33); The base (33) has a built-in magnet. One end of the serpentine tube (32) is mounted on the base (33), and the other end is provided with a fixing clamp (31). The fixing clamp (31) is clamped on the probe fixing groove (26).

7. The signal conversion device for VDIS test according to claim 6, characterized in that: The fixed rubber belt (4) comprises a rubber belt (41), an optical probe fixing hole (42) is provided on the rubber belt (41), the optical signal probe (2) passes through the optical probe fixing hole (42), and the rubber belt (41) is embedded in the probe fixing groove (26).

8. A method for using a signal conversion device for VDIS testing, characterized in that: The following steps are involved: The switch output point signal of the VDIS is input to the input end of the signal conversion component (1) through a two-core shielded cable, and then output to the waveform recording device through the output end of the signal conversion component (1) and the output coaxial cable (6); The waveform recording device is then connected to the high-voltage loop voltage signal, and during the process, the changing waveforms of the high-voltage loop voltage signal and the switch output point signal are recorded, and corresponding parameters are measured.

9. A method for using a signal conversion device for VDIS testing, characterized in that: The signal conversion device according to claim 7 comprises the following steps: First, insert the optical signal probe (2) into the optical probe fixing hole (42) and fix it to the optical display signal position of the VDIS through the rubber band (41); The optical display signal of the VDIS is converted into an electrical signal by an optical signal probe (2), input to the input end of the signal conversion component (1) through a two-core shielded cable, and then output to the waveform recording device through the output end of the signal conversion component (1) and an output coaxial cable (6).

10. The method for using the signal conversion device for VDIS test according to claim 9, characterized in that: The following steps are also included: When the VDIS is already installed on the device, the optical signal probe (2) is mounted on the fixing clamp (31), the base (33) is magnetically attracted to the device housing near the VDIS, and the serpentine tube (32) is adjusted to fix the optical signal probe (2) to the optical display signal position of the VDIS. The optical display signal of the VDIS is converted into an electrical signal by an optical signal probe (2), input to the input end of the signal conversion component (1) through a two-core shielded cable, and then output to the waveform recording device through the output end of the signal conversion component (1) and an output coaxial cable (6).

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