Battery sampling fault alarm method and device, electronic equipment and medium

Abstract

The invention relates to a battery sampling fault alarm method and device, electronic equipment and a medium, and the method comprises the steps: obtaining the fault configuration information of a target battery; the fault configuration information indicates a fault index type and an array organization structure under the fault index type; obtaining at least one target battery cell having a fault in the target battery and the fault type of the target battery cell; according to the fault configuration information, performing fault information organization processing on the fault type of the at least one target battery cell to obtain fault information of the target battery; based on the fault information, performing battery sampling fault alarm processing on the target battery; according to the arrangement of the array organization structure under the fault index type, the storage amount of the fault type of the battery cell can be reduced, the fault information coverage condition in the storage space is avoided, the omission of the battery sampling fault alarm is avoided, and the efficiency of the battery sampling fault alarm is improved.

Description

Technical Field

[0001] The present disclosure relates to the technical field of battery management, and in particular to a battery sampling fault alarm method, device, electronic device, and medium. Background Art

[0002] Current safety battery sampling fault alarm methods primarily process fault alarms based on the faulty cell and fault type. In this method, the battery management system has limited storage space for fault information, while the storage space for cell identifiers and fault types is large. Especially when there are many faults, the fault information in the storage space may overlap, resulting in some missing fault information, leading to omissions in battery sampling fault alarms and poor battery sampling fault alarm efficiency. Summary of the Invention

[0003] The present disclosure provides a battery sampling fault alarm method, device, electronic equipment and medium.

[0004] According to a first aspect of an embodiment of the present disclosure, a battery sampling fault alarm method is provided, the method comprising: obtaining fault configuration information of a target battery; the fault configuration information indicating a fault index type and an array organization structure under the fault index type; obtaining at least one target battery cell in the target battery where a fault occurs, and the fault type of the target battery cell; performing fault information organization processing on the fault type of at least one of the target battery cells according to the fault configuration information to obtain fault information of the target battery; and performing battery sampling fault alarm processing on the target battery based on the fault information.

[0005] In one embodiment of the present disclosure, the fault configuration information includes fault index type configuration information and array organization structure configuration information; there is a corresponding relationship between the fault index type in the fault index type configuration information and the array organization structure in the array organization structure configuration information.

[0006] In one embodiment of the present disclosure, the fault index type in the fault configuration information includes any one of the following: indexing according to the fault type, indexing according to the battery sampling chip corresponding to the battery cell, and indexing according to the fault channel type; the fault channel type is a type obtained by grouping the fault type according to the channel; when indexing according to the fault type, the array organization structure includes an array with the battery sampling chip as the dimension and the fault diagnosis status as the element, and an array with the battery sampling chip as the dimension and the fault diagnosis result as the element; when indexing according to the battery sampling chip, the array organization structure includes an array with the fault type as the dimension and the fault diagnosis status as the element, and an array with the fault type as the dimension and the fault diagnosis result as the element; when indexing according to the fault channel type, the array organization structure includes an array with the channel under the fault channel type as the dimension and the fault diagnosis status as the element, and an array with the channel under the fault channel type as the dimension and the fault diagnosis result as the element.

[0007] In one embodiment of the present disclosure, the fault type includes at least one of the following: a voltage sampling line disconnection fault, a voltage-related chip internal fault, a voltage over-limit fault, a module temperature sampling line electrical fault, a module temperature-related chip internal fault, a module temperature sampling voltage over-limit fault, and a module temperature over-limit fault; the fault channel type includes at least one of the following: a voltage sampling line disconnection fault, a module temperature sampling line electrical fault, and a sampling chip fault; the sampling chip fault includes at least one of the following: a voltage-related chip internal fault, a voltage over-limit fault, a module temperature-related chip internal fault, a module temperature sampling voltage over-limit fault, and a module temperature over-limit fault.

[0008] In one embodiment of the present disclosure, the fault information of at least one target battery cell is organized and processed according to the fault configuration information to obtain the fault information of the target battery, including: for each target battery cell, according to the fault type of the target battery cell, determining the target array organization structure that matches the fault type of the target battery cell under the fault index type; for each target array organization structure, according to the fault type of the target battery cell that matches the target array organization structure, determining the data of the target array under the target array organization structure; and combining the data of the target arrays under each target array organization structure to obtain the fault information of the target battery.

[0009] In one embodiment of the present disclosure, the method further includes: obtaining a newly added target battery cell with a new fault in the target battery, and the fault type of the newly added target battery cell; and updating the fault type of the newly added target battery cell to the fault information of the target battery according to the fault configuration information.

[0010] In one embodiment of the present disclosure, the battery sampling fault alarm processing is performed on the target battery based on the fault information, including: storing the fault information in a memory; when receiving a fault information reading request sent by a cloud platform and / or a diagnostic instrument via a CAN bus, providing the fault information stored in the memory to the cloud platform and / or the diagnostic instrument to implement fault alarm processing.

[0011] According to a second aspect of an embodiment of the present disclosure, a battery sampling fault alarm device is also provided, comprising: a first acquisition module for acquiring fault configuration information of a target battery; the fault configuration information indicates a fault index type and an array organization structure under the fault index type; a second acquisition module for acquiring at least one target battery cell in a target battery where a fault occurs, and the fault type of the target battery cell; an organization processing module for performing fault information organization processing on the fault type of at least one target battery cell according to the fault configuration information to obtain the fault information of the target battery; and an alarm processing module for performing battery sampling fault alarm processing on the target battery based on the fault information.

[0012] According to a third aspect of an embodiment of the present disclosure, an electronic device is further provided, comprising: a processor; and a memory for storing instructions executable by the processor; wherein the processor is configured to: implement the steps of the battery sampling fault alarm method as described above.

[0013] According to a fourth aspect of an embodiment of the present disclosure, a non-transitory computer-readable storage medium is further provided. When instructions in the storage medium are executed by a processor, the processor is enabled to execute the battery sampling fault alarm method as described above.

[0014] According to a fifth aspect of an embodiment of the present disclosure, a chip is also provided, comprising one or more interface circuits and one or more processors; the interface circuit is used to receive a signal from a memory of an electronic device and send the signal to the processor, wherein the signal includes a computer instruction stored in the memory, and when the processor executes the computer instruction, the electronic device executes the battery sampling fault alarm method as described above.

[0015] The technical solutions provided by the embodiments of the present disclosure bring at least the following beneficial effects:

[0016] By obtaining the fault configuration information of the target battery; the fault configuration information indicates the fault index type and the array organization structure under the fault index type; obtaining at least one target battery cell with a fault in the target battery and the fault type of the target battery cell; organizing and processing the fault information of the fault type of at least one target battery cell according to the fault configuration information to obtain the fault information of the target battery; and performing battery sampling fault alarm processing on the target battery based on the fault information; wherein, the setting of the array organization structure under the fault index type can reduce the storage amount of the battery cell's fault type, avoid the overwriting of fault information in the storage space, avoid the omission of battery sampling fault alarm, and improve the efficiency of battery sampling fault alarm.

[0017] It is to be understood that the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the disclosure. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] The accompanying drawings herein are incorporated into and constitute a part of the specification, illustrate embodiments consistent with the present disclosure, and together with the description are used to explain the principles of the present disclosure, and do not constitute an improper limitation of the present disclosure.

[0019] Figure 1 This is a flow chart of a battery sampling fault alarm method according to an embodiment of the present disclosure;

[0020] Figure 2 It is a structural diagram of the battery management system;

[0021] Figure 3 This is a schematic diagram of the battery sampling fault alarm framework;

[0022] Figure 4 This is a schematic structural diagram of a battery sampling fault alarm device according to an embodiment of the present disclosure;

[0023] Figure 5 This is a structural block diagram of an electronic device according to an exemplary embodiment of the present disclosure;

[0024] Figure 6 This is a schematic diagram of the structure of a chip according to an embodiment of the present disclosure. DETAILED DESCRIPTION

[0025] In order to enable ordinary persons in the art to better understand the technical solutions of the present disclosure, the technical solutions in the embodiments of the present disclosure will be clearly and completely described below with reference to the accompanying drawings.

[0026] It should be noted that the terms "first," "second," and the like in the specification and claims of the present disclosure and the above-mentioned drawings are used to distinguish similar objects and are not necessarily used to describe a specific order or precedence. It should be understood that the numbers used in this manner are interchangeable where appropriate so that the embodiments of the present disclosure described herein can be implemented in an order other than those illustrated or described herein. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with the present disclosure. Instead, they are merely examples of apparatus and methods consistent with certain aspects of the present disclosure as detailed in the appended claims.

[0027] Current safety battery sampling fault alarm methods primarily process fault alarms based on the faulty cell and fault type. In this method, the battery management system has limited storage space for fault information, while the storage space for cell identifiers and fault types is large. Especially when there are many faults, the fault information in the storage space may overlap, resulting in some missing fault information, leading to omissions in battery sampling fault alarms and poor battery sampling fault alarm efficiency.

[0028] Figure 1 The flowchart of the battery sampling fault alarm method according to one embodiment of the present disclosure is shown. It should be noted that the battery sampling fault alarm method according to this embodiment can be applied to a battery sampling fault alarm device, which can be configured in an electronic device or chip to enable the electronic device or chip to perform the battery sampling fault alarm function.

[0029] Among them, the electronic device can be any device with computing capabilities, such as a personal computer (PC), a mobile terminal, a server, a controller in a vehicle, etc. The mobile terminal can be, for example, a vehicle-mounted device, a mobile phone, a tablet computer, a personal digital assistant, a wearable device, and other hardware devices with various operating systems, touch screens and / or display screens.

[0030] In addition, the battery sampling fault alarm device can also be software in an electronic device, such as a battery management system. In the following embodiments, the battery management system is used as an example for description.

[0031] Among them, the structural diagram of the battery management system can be as follows Figure 2 As shown. Figure 2 The battery management system includes a battery management controller, at least one acquisition slave board, and at least one battery cell analog quantity acquisition chip (ie, a battery sampling chip).

[0032] The battery management controller is communicatively connected to at least one acquisition slave board; one acquisition slave board is connected to at least one battery cell analog quantity acquisition chip; and one battery cell analog quantity acquisition chip is connected to at least one battery cell to acquire parameters of the at least one battery cell. Examples of battery cell parameters include battery cell voltage, battery cell temperature, and parameters of the electrical connector to which the battery cell belongs. The electrical connector may be a connector for multiple battery cells connected in parallel. The parameters of the electrical connector may include at least one of the following: temperature, voltage, etc.

[0033] Among them, Figure 2 In the example, there are three acquisition slave boards, each connected to the battery management controller. There are nine cell analog data acquisition chips. Cell analog data acquisition chips 1 through 3 are connected to acquisition slave board 1; cell analog data acquisition chips 4 through 6 are connected to acquisition slave board 2; and cell analog data acquisition chips 7 through 9 are connected to acquisition slave board 3.

[0034] Among them, the battery cell analog quantity acquisition chip 1 is responsible for collecting parameters of chips 1 to 16; the battery cell analog quantity acquisition chip 2 is responsible for collecting parameters of chips 17 to 32; the battery cell analog quantity acquisition chip 3 is responsible for collecting parameters of chips 33 to 48; the battery cell analog quantity acquisition chip 4 is responsible for collecting parameters of chips 49 to 64; the battery cell analog quantity acquisition chip 5 is responsible for collecting parameters of chips 65 to 80; the battery cell analog quantity acquisition chip 6 is responsible for collecting parameters of chips 81 to 96; the battery cell analog quantity acquisition chip 7 is responsible for collecting parameters of chips 97 to 112; the battery cell analog quantity acquisition chip 8 is responsible for collecting parameters of chips 113 to 128; and the battery cell analog quantity acquisition chip 9 is responsible for collecting parameters of chips 129 to 144.

[0035] like Figure 1 As shown, the method includes the following steps:

[0036] Step 101: Acquire fault configuration information of a target battery; the fault configuration information indicates a fault index type and an array organization structure under the fault index type.

[0037] In an embodiment of the present disclosure, the fault configuration information may include fault index type configuration information and array organization structure configuration information; there is a corresponding relationship between the fault index type in the fault index type configuration information and the array organization structure in the array organization structure configuration information.

[0038] In an embodiment of the present disclosure, the fault index type in the fault configuration information may include any one of the following: indexing according to the fault type, indexing according to the battery sampling chip corresponding to the battery cell, and indexing according to the fault channel type; the fault channel type is the type obtained by grouping the fault types according to the channel.

[0039] In the disclosed embodiments, indexing by fault type means that one or more array structures can be set for each fault type. The fault type can include at least one of the following: voltage sampling line disconnection fault, voltage-related chip internal fault, voltage over-limit fault, module temperature sampling line electrical fault, module temperature-related chip internal fault, module temperature sampling voltage over-limit fault, and module temperature over-limit fault.

[0040] A voltage sampling line disconnection fault refers to a disconnection in the connection line between the voltage-related chip in the battery sampling chip and the voltage sensor installed on the battery cell. A module temperature sampling line electrical fault refers to an electrical fault in the connection line between the temperature-related chip in the battery sampling chip and the temperature sensor installed around the battery cell.

[0041] Among them, when the fault index type indicated by the fault configuration information is indexed according to the fault type, the array organization structure under the fault index type may include an array with the battery sampling chip as the dimension and the fault diagnosis status as the element, and an array with the battery sampling chip as the dimension and the fault diagnosis result as the element.

[0042] An array with battery sampling chip as the dimension and fault diagnosis status as the element may include multiple elements. The first element is the fault diagnosis status of the first battery sampling chip; the i-th element is the fault diagnosis status of the i-th battery sampling chip. The value of the fault diagnosis status may be, for example, 0 or 1. 0 indicates that the battery sampling chip has not been diagnosed in the current driving cycle; 1 indicates that the battery sampling chip has been diagnosed in the current driving cycle.

[0043] The array, whose dimensions are battery sampling chips and whose elements are fault diagnosis results, may include multiple elements. The first element is the fault diagnosis result for the first battery sampling chip; the i-th element is the fault diagnosis result for the i-th battery sampling chip. The value of the fault diagnosis result may be, for example, 0 or 1. A value of 0 indicates that the battery sampling chip has a fault during the current driving cycle; a value of 1 indicates that the battery sampling chip has no fault or has recovered from the fault during the current driving cycle.

[0044] In the embodiment of the present disclosure, indexing is performed according to the battery sampling chips corresponding to the battery cells, which means that one or more array organization structures can be set for each battery sampling chip.

[0045] Among them, when the fault index type indicated by the fault configuration information is indexed according to the battery sampling chip corresponding to the battery cell, the array organization structure under the fault index type may include an array with the fault type as the dimension and the fault diagnosis status as the element, and an array with the fault type as the dimension and the fault diagnosis result as the element.

[0046] The array with fault type as a dimension and fault diagnosis status as an element may include multiple elements. The first element is the fault diagnosis status for the first fault type; the i-th element is the fault diagnosis status for the i-th fault type. The value of the fault diagnosis status may be, for example, 0 or 1. 0 indicates that the diagnosis of the first fault type has not been completed in this driving cycle; 1 indicates that the diagnosis of the first fault type has been completed in this driving cycle. The fact that the diagnosis of the first fault type has not been completed in this driving cycle means that the battery sampling chip has not yet performed diagnostic processing for the fault corresponding to the first fault type.

[0047] The array with fault type as the dimension and fault diagnosis result as the element may include multiple elements. The first element is the fault diagnosis result for the first fault type; the i-th element is the fault diagnosis result for the i-th fault type. The value of the fault diagnosis result may be, for example, 0 or 1. 0 indicates that a fault exists for the first fault type in this driving cycle; 1 indicates that no fault exists or the fault has recovered for the first fault type in this driving cycle. No fault exists for the first fault type in this driving cycle means that the battery sampling chip does not have the fault corresponding to the first fault type.

[0048] In the disclosed embodiment, indexing by fault channel type means that one or more array organizational structures can be set for each fault channel type. Fault channel types can include at least one of the following: a voltage sampling line disconnection fault, a module temperature sampling line electrical fault, or a sampling chip fault. Sampling chip faults can include at least one of the following: a voltage-related chip internal fault, a voltage over-limit fault, a module temperature-related chip internal fault, a module temperature sampling voltage over-limit fault, or a module temperature over-limit fault.

[0049] Among them, when the fault index type indicated by the fault configuration information is indexed according to the fault channel type, the array organization structure under the fault index type may include an array with the channel under the fault channel type as the dimension and the fault diagnosis status as the element, and an array with the channel under the fault channel type as the dimension and the fault diagnosis result as the element.

[0050] In the case where the fault channel type is a voltage sampling line disconnection fault, an array with the channel under the fault channel type as the dimension and the fault diagnosis status as the element may include multiple elements. The first element is the fault diagnosis status of the first voltage sampling channel; the i-th element is the fault diagnosis status of the i-th voltage sampling channel. The value of the fault diagnosis status may be, for example, 0 or 1. 0 indicates that the channel diagnosis is not complete; 1 indicates that the channel diagnosis is complete. An array with the channel under the fault channel type as the dimension and the fault diagnosis result as the element may include multiple elements. The first element is the fault diagnosis result of the first voltage sampling channel; the i-th element is the fault diagnosis result of the i-th voltage sampling channel. The value of the fault diagnosis result may be, for example, 0 or 1. 0 indicates that the channel has a fault; 1 indicates that the channel has no fault or the fault has recovered.

[0051] In the case where the fault channel type is an electrical fault in the module temperature sampling line, an array with the channel under the fault channel type as the dimension and the fault diagnosis status as the element may include multiple elements. The first element is the fault diagnosis status of the first temperature sampling channel; the i-th element is the fault diagnosis status of the i-th temperature sampling channel. The value of the fault diagnosis status may be, for example, 0 or 1. 0 indicates that the channel diagnosis is not complete; 1 indicates that the channel diagnosis is complete. An array with the channel under the fault channel type as the dimension and the fault diagnosis result as the element may include multiple elements. The first element is the fault diagnosis result of the first temperature sampling channel; the i-th element is the fault diagnosis result of the i-th temperature sampling channel. The value of the fault diagnosis result may be, for example, 0 or 1. 0 indicates that the channel is faulty; 1 indicates that the channel is not faulty or the fault has recovered.

[0052] In the case where the fault channel type is a sampling chip fault, an array with the channel under the fault channel type as a dimension and the fault diagnosis status as an element may include multiple elements. The first element is the fault diagnosis status of the first battery sampling chip; the i-th element is the fault diagnosis status of the i-th battery sampling chip. The value of the fault diagnosis status may be, for example, 0 or 1. 0 indicates that the diagnosis is not complete; 1 indicates that the diagnosis is complete. An array with the channel under the fault channel type as a dimension and the fault diagnosis result as an element may include multiple elements. The first element is the fault diagnosis result of the first battery sampling chip; the i-th element is the fault diagnosis result of the i-th battery sampling chip. The value of the fault diagnosis result may be, for example, 0 or 1. 0 indicates that a fault exists; 1 indicates that the fault does not exist or the fault has recovered.

[0053] Step 102: Acquire at least one target cell in the target battery that has a fault, and the fault type of the target cell.

[0054] In one embodiment of the present disclosure, the battery management system may, in one example, execute step 103 upon obtaining the fault type of a target battery cell that has failed in the target battery. In another example, the battery management system may execute step 103 upon obtaining the fault types of a certain number of target battery cells that have failed in the target battery.

[0055] Step 103 : Organize and process the fault information of the fault type of at least one target battery cell according to the fault configuration information to obtain the fault information of the target battery.

[0056] In the embodiment of the present disclosure, the process of the battery management system executing step 103 may, for example, be as follows: for each target battery cell, according to the fault type of the target battery cell, determine the target array organization structure that matches the fault type of the target battery cell under the fault index type; for each target array organization structure, according to the fault type of the target battery cell that matches the target array organization structure, determine the data of the target array under the target array organization structure; and combine and process the data of the target array under each target array organization structure to obtain the fault information of the target battery.

[0057] Among them, the fault index type indicated by the fault configuration information is indexed according to the fault type, and the data organization result when indexed according to the fault type includes a first array with the battery sampling chip as the dimension and the fault diagnosis status as the element, and a second array with the battery sampling chip as the dimension and the fault diagnosis result as the element. In the above case, for each target battery cell, if the fault type of the target battery cell is the i-th fault type, the value of the i-th element in the second array is set to 0, and the value of the i-th element in the first array is set to 1. For the j-th battery cell that has been diagnosed and has no faults, the value of the j-th element in the first array is set to 1, and the value of the j-th element in the second array is set to 1. For the k-th battery cell that has not been diagnosed, the value of the k-th element in the first array is set to 0, and the value of the k-th element in the second array is set to 1.

[0058] In the disclosed embodiment, to ensure the accuracy of the target battery's fault information, the target battery's fault information can be promptly updated based on the fault type of the newly added target cell in the target battery. Accordingly, the battery management system can also perform the following processes: obtaining the newly added target cell in the target battery and the fault type of the newly added target cell; and updating the target battery's fault information with the fault type of the newly added target cell according to the fault configuration information.

[0059] Step 104 : Based on the fault information, perform battery sampling fault alarm processing on the target battery.

[0060] In the embodiment of the present disclosure, the process of the battery management system executing step 104 may, for example, be to store the fault information in the memory; upon receiving a fault information reading request sent by the cloud platform and / or the diagnostic instrument via the Controller Area Network (CAN) bus, the fault information stored in the memory is provided to the cloud platform and / or the diagnostic instrument to implement fault alarm processing.

[0061] The battery management system can be installed in a vehicle to manage and process the batteries in the vehicle. The batteries in the vehicle can be power batteries and / or energy storage batteries. The cloud platform can communicate with the vehicle's onboard terminal (Telematics Box, TBOX); the onboard terminal communicates with the battery management system via the CAN bus, thereby achieving communication between the cloud platform and the battery management system. The diagnostic instrument can directly communicate with the battery management system via the CAN bus.

[0062] Among them, the cloud platform and / or diagnostic instrument communicates with the battery management system through the CAN bus, which facilitates the cloud platform and / or diagnostic instrument to configure the fault configuration information of the battery management system, and also facilitates the cloud platform and / or diagnostic instrument to timely update the fault configuration information in the battery management system.

[0063] In the battery sampling fault alarm method of the embodiment of the present disclosure, the fault configuration information of the target battery is obtained; the fault configuration information indicates the fault index type and the array organization structure under the fault index type; at least one target battery cell with a fault in the target battery and the fault type of the target battery cell are obtained; according to the fault configuration information, the fault information of the fault type of at least one target battery cell is organized and processed to obtain the fault information of the target battery; based on the fault information, the battery sampling fault alarm is processed for the target battery; wherein, the setting of the array organization structure under the fault index type can reduce the storage amount of the fault type of the battery cell, avoid the overwriting of fault information in the storage space, avoid the omission of the battery sampling fault alarm, and improve the efficiency of the battery sampling fault alarm.

[0064] The following examples are given to illustrate this. Figure 3 The figure shows the framework diagram of battery sampling fault alarm. Figure 3In the battery management system, the battery management controller can communicate with the diagnostic instrument via the CAN bus and communicate with the cloud platform via the CAN bus and the vehicle terminal TBOX. The battery management controller can obtain the fault configuration (i.e., fault configuration information) issued by the cloud platform and / or the diagnostic instrument via the CAN bus, and can provide the target battery's fault information to the cloud platform and / or the diagnostic instrument via the CAN bus.

[0065] The process of the battery management controller determining fault information in combination with the fault configuration may be, for example, as follows: Step 301: Start. Step 302: The controller (battery management controller) identifies a cell sampling fault. If the fault is confirmed, the cell sampling fault is combined, the fault code (fault type, cell identification, etc.) is determined, and stored. If the fault is not confirmed, the cell sampling fault is re-identified. Step 303: Calculate and store a snapshot of the cell sampling fault to obtain at least one array of data, which is then combined to obtain fault information. Step 304: Fault alarm.

[0066] Figure 4 The figure is a schematic structural diagram of a battery sampling fault alarm device according to an embodiment of the present disclosure.

[0067] like Figure 4 As shown, the battery sampling fault alarm device may include: a first acquisition module 401 , a second acquisition module 402 , an organization processing module 403 and an alarm processing module 404 .

[0068] Among them, the first acquisition module 401 is used to obtain the fault configuration information of the target battery; the fault configuration information indicates the fault index type and the array organization structure under the fault index type; the second acquisition module 402 is used to obtain at least one target battery cell in the target battery where a fault occurs, and the fault type of the target battery cell; the organization processing module 403 is used to organize the fault information of the fault type of at least one target battery cell according to the fault configuration information to obtain the fault information of the target battery; the alarm processing module 404 is used to perform battery sampling fault alarm processing on the target battery based on the fault information.

[0069] In one embodiment of the present disclosure, the fault configuration information includes fault index type configuration information and array organization structure configuration information; there is a corresponding relationship between the fault index type in the fault index type configuration information and the array organization structure in the array organization structure configuration information.

[0070] In one embodiment of the present disclosure, the fault index type in the fault configuration information includes any one of the following: indexing according to the fault type, indexing according to the battery sampling chip corresponding to the battery cell, and indexing according to the fault channel type; the fault channel type is a type obtained by grouping the fault type according to the channel; when indexing according to the fault type, the array organization structure includes an array with the battery sampling chip as the dimension and the fault diagnosis status as the element, and an array with the battery sampling chip as the dimension and the fault diagnosis result as the element; when indexing according to the battery sampling chip, the array organization structure includes an array with the fault type as the dimension and the fault diagnosis status as the element, and an array with the fault type as the dimension and the fault diagnosis result as the element; when indexing according to the fault channel type, the array organization structure includes an array with the channel under the fault channel type as the dimension and the fault diagnosis status as the element, and an array with the channel under the fault channel type as the dimension and the fault diagnosis result as the element.

[0071] In one embodiment of the present disclosure, the fault type includes at least one of the following: a voltage sampling line disconnection fault, a voltage-related chip internal fault, a voltage over-limit fault, a module temperature sampling line electrical fault, a module temperature-related chip internal fault, a module temperature sampling voltage over-limit fault, and a module temperature over-limit fault; the fault channel type includes at least one of the following: a voltage sampling line disconnection fault, a module temperature sampling line electrical fault, and a sampling chip fault; the sampling chip fault includes at least one of the following: a voltage-related chip internal fault, a voltage over-limit fault, a module temperature-related chip internal fault, a module temperature sampling voltage over-limit fault, and a module temperature over-limit fault.

[0072] In one embodiment of the present disclosure, the organization processing module 403 is specifically used to, for each target battery cell, determine a target array organization structure that matches the fault type of the target battery cell under the fault index type according to the fault type of the target battery cell; for each target array organization structure, determine the data of the target array under the target array organization structure according to the fault type of the target battery cell that matches the target array organization structure; and combine and process the data of the target arrays under each target array organization structure to obtain the fault information of the target battery.

[0073] In one embodiment of the present disclosure, the device also includes: a third acquisition module and an update module; the third acquisition module is used to obtain a newly added target battery cell with a new fault in the target battery, and the fault type of the newly added target battery cell; the update module is used to update the fault type of the newly added target battery cell to the fault information of the target battery according to the fault configuration information.

[0074] In one embodiment of the present disclosure, the alarm processing module 404 is specifically used to store the fault information in a memory; when receiving a fault information reading request issued by the cloud platform and / or the diagnostic instrument through the CAN bus, the fault information stored in the memory is provided to the cloud platform and / or the diagnostic instrument to implement fault alarm processing.

[0075] In the battery sampling fault alarm device of the embodiment of the present disclosure, the fault configuration information of the target battery is obtained; the fault configuration information indicates the fault index type and the array organization structure under the fault index type; at least one target battery cell with a fault in the target battery and the fault type of the target battery cell are obtained; according to the fault configuration information, the fault information of the fault type of at least one target battery cell is organized and processed to obtain the fault information of the target battery; based on the fault information, the battery sampling fault alarm is processed for the target battery; wherein, the setting of the array organization structure under the fault index type can reduce the storage amount of the fault type of the battery cell, avoid the overwriting of fault information in the storage space, avoid the omission of the battery sampling fault alarm, and improve the efficiency of the battery sampling fault alarm.

[0076] According to one embodiment of the present disclosure, an electronic device is further provided, including: a processor; and a memory for storing instructions executable by the processor, wherein the processor is configured to: implement the battery sampling fault alarm method described above.

[0077] In order to implement the above embodiments, the present disclosure also proposes a non-transitory computer-readable storage medium.

[0078] When the instructions in the storage medium are executed by the processor, the processor is enabled to execute the battery sampling fault alarm method as described above.

[0079] In order to implement the above embodiments, the present disclosure also provides a computer program product.

[0080] When the computer program product is executed by a processor of an electronic device, the electronic device is enabled to execute the above method.

[0081] Figure 5 The figure is a structural block diagram of an electronic device according to an exemplary embodiment. Figure 5 The electronic device shown is only an example and should not limit the functions and scope of use of the embodiments of the present disclosure.

[0082] like Figure 5As shown, the electronic device 1000 includes a processor 111, which can perform various appropriate actions and processes according to a program stored in a read-only memory (ROM) 112 or a program loaded from a memory 116 to a random access memory (RAM) 113. Various programs and data required for the operation of the electronic device 1000 are also stored in the RAM 113. The processor 111, the ROM 112, and the RAM 113 are connected to each other via a bus 114. An input / output (I / O) interface 115 is also connected to the bus 114.

[0083] The following components are connected to the I / O interface 115: a memory 116 including a hard disk, etc.; and a communication part 117 including a network interface card such as a local area network (LAN) card, a modem, etc., which performs communication processing via a network such as the Internet; a drive 118 is also connected to the I / O interface 115 as needed.

[0084] In particular, according to an embodiment of the present disclosure, the processes described above with reference to the flowcharts can be implemented as computer software programs. For example, an embodiment of the present disclosure includes a computer program carried on a computer-readable medium, the computer program including program code for executing the method shown in the flowchart. In such an embodiment, the computer program can be downloaded and installed from a network via the communication section 117. When the computer program is executed by the processor 111, the above-mentioned functions defined in the method of the present disclosure are performed.

[0085] In an exemplary embodiment, a storage medium including instructions is further provided, such as a memory including instructions, and the instructions can be executed by the processor 111 of the electronic device 1000 to perform the above method. Alternatively, the storage medium can be a non-transitory computer-readable storage medium, for example, a ROM, a random access memory (RAM), a CD-ROM, a magnetic tape, a floppy disk, an optical data storage device, etc.

[0086] In the present disclosure, a computer-readable storage medium may be any tangible medium that contains or stores a program that can be used by or in conjunction with an instruction execution system, apparatus, or device. In the present disclosure, a computer-readable signal medium may include a data signal propagated in baseband or as part of a carrier wave, which carries computer-readable program code. This propagated data signal may take a variety of forms, including but not limited to electromagnetic signals, optical signals, or any suitable combination of the foregoing. A computer-readable signal medium may also be any computer-readable medium other than a computer-readable storage medium that can send, propagate, or transmit a program for use by or in conjunction with an instruction execution system, apparatus, or device. The program code contained on the computer-readable medium may be transmitted using any suitable medium, including but not limited to wireless, wire, optical cable, RF, etc., or any suitable combination of the foregoing.

[0087] Figure 6 FIG. 1 is a schematic diagram of the structure of a chip according to an embodiment of the present disclosure. Figure 6 As shown, the chip includes a processor 601 and an interface circuit 602. There may be one or more processors 601, and one or more interface circuits 602.

[0088] Optionally, the chip also includes a memory 603, which is used to store necessary computer programs and data; the interface circuit 602 is used to receive signals from the memory 603 and send signals to the processor 601, where the signals include computer instructions stored in the memory 603. When the processor 601 executes the computer instructions, the electronic device executes the battery sampling fault alarm method described in the above embodiment of the present disclosure.

[0089] Furthermore, the word "exemplary" is used herein to mean serving as an example, instance, or illustration. Any aspect or design described herein as "exemplary" is not necessarily to be construed as advantageous over other aspects or designs. Rather, the use of the word exemplary is intended to present concepts in a concrete manner. As used herein, the term "or" is intended to mean an inclusive "or" rather than an exclusive "or." That is, unless otherwise specified or clear from the context, "X applies to A or B" is intended to mean any of the natural inclusive permutations. That is, if X applies to A; X applies to B; or X applies to both A and B, then "X applies to A or B" satisfies any of the aforementioned instances. Furthermore, the articles "a" and "an," as used in this application and the appended claims, are generally understood to mean "one or more," unless otherwise specified or clear from the context to refer to the singular form.

[0090] Likewise, although the present disclosure has been shown and described with respect to one or more implementations, equivalent variations and modifications will occur to those skilled in the art after reading and understanding the specification and drawings. The present disclosure includes all such modifications and variations and is limited only by the scope of the claims. In particular, with respect to the various functions performed by the components described above (e.g., elements, resources, etc.), unless otherwise indicated, the terms used to describe such components are intended to correspond to any component (functionally equivalent) that performs the specific functions of the described components, even if structurally not equivalent to the disclosed structures. In addition, although specific features of the present disclosure may have been disclosed with respect to only one of several implementations, such features may be combined with one or more other features of other implementations as may be desired and beneficial for any given or specific application. In addition, with respect to the terms "including," "having," "having," "having," or variations thereof used in the specific embodiments or claims, such terms are intended to be inclusive in a manner similar to the term "comprising."

[0091] Other embodiments of the present disclosure will readily occur to those skilled in the art after considering the specification and practicing the invention disclosed herein. This application is intended to cover any variations, uses, or adaptations of the present disclosure that follow the general principles of the present disclosure and include common knowledge or customary techniques in the art not disclosed herein. The description and examples are to be considered as exemplary only, with the true scope and spirit of the present disclosure being indicated by the following claims.

[0092] It should be understood that the present disclosure is not limited to the exact structures that have been described above and shown in the drawings, and that various modifications and changes can be made without departing from the scope thereof. The scope of the present disclosure is limited only by the appended claims.

Claims

1. A battery sampling fault alarm method, characterized in that: The method comprises: Obtaining fault configuration information of the target battery; the fault configuration information indicates a fault index type and an array organization structure under the fault index type; Obtain at least one target cell in a target battery that has a fault, and a fault type of the target cell; According to the fault configuration information, performing fault information organization processing on the fault type of at least one of the target battery cells to obtain fault information of the target battery; Based on the fault information, battery sampling fault alarm processing is performed on the target battery.

2. The method according to claim 1, characterized in that The fault configuration information includes fault index type configuration information and array organization structure configuration information; There is a corresponding relationship between the fault index type in the fault index type configuration information and the array organization structure in the array organization structure configuration information.

3. The method according to claim 1 or 2, characterized in that The fault index type in the fault configuration information includes any one of the following: indexing according to the fault type, indexing according to the battery sampling chip corresponding to the battery cell, and indexing according to the fault channel type; The fault channel type is a type obtained by grouping fault types according to channels; When indexing by fault type, the array organization structure includes an array with the battery sampling chip as the dimension and the fault diagnosis status as the element, and an array with the battery sampling chip as the dimension and the fault diagnosis result as the element; When indexing according to the battery sampling chip, the array organization structure includes an array with fault type as a dimension and fault diagnosis status as an element, and an array with fault type as a dimension and fault diagnosis result as an element; When indexing according to the fault channel type, the array organization structure includes an array with the channel under the fault channel type as the dimension and the fault diagnosis status as the element, and an array with the channel under the fault channel type as the dimension and the fault diagnosis result as the element.

4. The method according to claim 3, characterized in that The fault type includes at least one of the following: voltage sampling line disconnection fault, voltage-related chip internal fault, voltage over-limit fault, module temperature sampling line electrical fault, module temperature-related chip internal fault, module temperature sampling voltage over-limit fault, module temperature over-limit fault; The fault channel type includes at least one of the following: voltage sampling line disconnection fault, module temperature sampling line electrical fault, sampling chip fault; the sampling chip fault includes at least one of the following: voltage-related chip internal fault, voltage over-limit fault, module temperature-related chip internal fault, module temperature sampling voltage over-limit fault, module temperature over-limit fault.

5. The method according to claim 1, wherein The step of organizing and processing the fault information of the at least one target battery cell according to the fault configuration information to obtain the fault information of the target battery includes: For each target battery cell, according to the fault type of the target battery cell, determining a target array organization structure matching the fault type of the target battery cell under the fault index type; For each target array organizational structure, determining target array data under the target array organizational structure according to a fault type of a target cell matching the target array organizational structure; The data of the target arrays under each target array organization structure are combined and processed to obtain the fault information of the target battery.

6. The method according to claim 1 or 5, characterized in that The method further comprises: Obtaining a newly added target cell with a new fault in the target battery and a fault type of the newly added target cell; According to the fault configuration information, the fault type of the newly added target battery cell is updated to the fault information of the target battery.

7. The method according to claim 1, characterized in that The performing battery sampling fault alarm processing on the target battery based on the fault information includes: Storing the fault information in a memory; When a fault information reading request is received from the cloud platform and / or the diagnostic instrument via the CAN bus, the fault information stored in the memory is provided to the cloud platform and / or the diagnostic instrument to implement fault alarm processing.

8. A battery sampling fault alarm device, characterized in that: The device comprises: A first acquisition module is configured to acquire fault configuration information of a target battery; the fault configuration information indicates a fault index type and an array organization structure under the fault index type; A second acquisition module is used to acquire at least one target battery cell having a fault in the target battery and a fault type of the target battery cell; an organization and processing module, configured to perform fault information organization processing on the fault type of at least one of the target cells according to the fault configuration information, to obtain fault information of the target cell; An alarm processing module is used to perform battery sampling fault alarm processing on the target battery based on the fault information.

9. An electronic device, characterized in that: include: processor; a memory for storing instructions executable by the processor; Wherein, the processor is configured to: Implement the steps of the battery sampling fault alarm method according to any one of claims 1 to 7. 10 . A non-transitory computer-readable storage medium, which, when instructions in the storage medium are executed by a processor, enables the processor to execute the battery sampling fault alarm method according to any one of claims 1 to 7.

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