Rapid pattern spacing screening method for chip design

Abstract

The invention provides a rapid graph spacing screening method for chip design, which can rapidly complete distance check between graphs, reduce computing resources and improve layout design efficiency. Comprising the following steps: step 1, obtaining a graph needing to be checked, and screening out a graph of a specified type; step 2, combining repeated graphs which are in the same graph layer and have the same shape; 3, the current layer is divided into a plurality of rectangular areas with the length and the width being specified sizes, every two rectangular areas are arranged in a partial area overlapping mode, and logic and operation are conducted on the graphs screened in the same layer and each rectangular area; and step 4, performing center point distance calculation on all the graphs in the same rectangular area in pairs, reserving two graphs of which the distance is smaller than a set distance, and recording the positions and the distance of the two graphs so as to complete distance inspection between the graphs.

Description

Technical Field

[0001] The present invention relates to the technical field of integrated circuit pattern inspection, in particular to a fast pattern spacing screening method for chip design. Background Art

[0002] During the chip design process, designers need to perform design rule checks (DRCs) multiple times to ensure that the graphics in the layout comply with the design rules. Among them, graphic spacing restrictions are common chip design rules, which generally stipulate that the distance between graphics of specified types must not be less than a specific value. Therefore, during the chip layout design process, it is necessary to always ensure that the designed patterns do not violate the graphic spacing restriction rules. However, for large-scale integrated circuits, the number of patterns in the chip layout is huge and the structure is complex. Importing and exporting layout files and performing design rule checks occupy a lot of computing resources and are time-consuming, which greatly affects the design progress. Summary of the Invention

[0003] In response to the above problems, the present invention provides a fast pattern spacing screening method for chip design, which can quickly complete the distance check between patterns, reduce computing resources, and improve layout design efficiency.

[0004] The present invention adopts the following technical solution, a method for rapid pattern spacing screening for chip design, comprising the following steps:

[0005] Step 1: Get the graphics to be checked and filter out graphics of a specified type;

[0006] Step 2: Merge the same and repeated shapes in the same layer;

[0007] Step 3: Split the current layer into multiple rectangular areas of specified length and width. Arrange the multiple rectangular areas in a matrix, with some areas overlapping between them. Then, perform a logical AND operation on the selected graphics in the same layer and each rectangular area, storing the selected graphics in the corresponding rectangular area and removing the graphics in the overlapping area.

[0008] Step 4: Calculate the center point distance between all the shapes in the same rectangular area, retain the two shapes whose distance is less than the set distance, and record the position and distance between the two shapes.

[0009] Furthermore, in the step 1, it also includes:

[0010] S1.1. Obtain a graphic interface having multiple layers, and obtain a graphic to be inspected in the graphic interface;

[0011] S1.2. Determine whether the graphics to be checked are in the same layer. If not, filter out graphics of a specified type from each layer in the order in which the layers are stacked, ensuring that the graphics to be checked are in the same layer. If they are in the same layer, filter out graphics of the specified type from the current layer.

[0012] Furthermore, the specified graphic type is filtered to be a circle, rectangle or other polygonal graphics;

[0013] Furthermore, in the step 2, the method further includes: counting the size, center coordinates, and type of the shapes selected in the same layer, and merging all repeated shapes with the same parameters according to the statistical data until only one is retained;

[0014] Furthermore, in step 4, the center point distances of all graphics in the same layer and within the same rectangular area are calculated for each pair. The distance calculation formula is:

[0015]

[0016] Among them, (x i 、y i ) is the coordinate of the center point of figure i, (x j 、y j ) is the coordinate of the center point of figure j, i≠j, i≥1, j≥1;

[0017] D is the distance between the center points of shape i and shape j;

[0018] Furthermore, in the step 4, it also includes:

[0019] S4.1. If the distance between the center points of two graphics exceeds the set distance, the two graphics being compared are removed. If the distance between the center points of two graphics is less than the set distance, the two graphics being compared are retained, and the positions and distances between the two graphics are recorded.

[0020] S4.2. Determine whether all graphics in the same layer have completed the distance check. If so, output the position and spacing information of the graphics retained in the current layer to complete the distance check between the graphics in the current layer. If not, continue executing step 4 until the distance check between the graphics in the current layer is completed.

[0021] S4.3. Determine whether all layers have completed the distance check for the graphics. If so, output the position and spacing information of the graphics retained in all layers to complete the distance check between the graphics on all layers. If not, continue with step 2 until the distance check between the graphics on all layers is completed.

[0022] Furthermore, after step 4, the method further includes:

[0023] All the graphics retained after step 4 are fused in pairs. If two graphics are exactly the same, the two graphics are merged.

[0024] If there is an overlap between two graphics, the overlapped parts of the two graphics will be merged.

[0025] The beneficial effect of the present invention is that it reduces the graphic screening area, merges repeated graphics with the same parameters, thereby reducing the number of graphics for distance comparison and reducing repeated computing resources, so that the distance check between graphics can be completed in a short time, thereby improving the layout design efficiency of chip designers and having good use value. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] Figure 1 It is a schematic flow diagram of the present invention;

[0027] Figure 2 It is a diagram showing the arrangement structure of the rectangular areas in the present invention;

[0028] Figure 3 It is a distance position diagram between two graphics in the present invention;

[0029] Figure 4 This is the effect diagram after the overlapping parts of the two graphics in the present invention are merged. DETAILED DESCRIPTION

[0030] like Figures 1 to 3 As shown, a fast pattern spacing screening method for chip design of the present invention comprises the following steps:

[0031] Step 1: Get the graphics to be checked and filter out the graphics of a specified type. The specified graphics type to be filtered out is a circle, rectangle, or other polygonal graphics. It should be noted that filtering out the specified type of graphics does not refer to graphics of the same structure, but can cover multiple types of graphics with different structures. For example, if the graphics to be checked include circles and rectangles, then the specified types of graphics to be filtered out are circles and rectangles.

[0032] Specifically, in step 1, it also includes:

[0033] S1.1. Obtain a graphic interface having multiple layers, and obtain a graphic to be inspected in the graphic interface;

[0034] S1.2. Determine whether the graphics to be checked are in the same layer. If not, filter out graphics of a specified type from each layer in the order in which the layers are stacked, ensuring that the graphics to be checked are in the same layer. If they are in the same layer, filter out graphics of the specified type from the current layer.

[0035] Step 2: Merge the same and repeated shapes in the same layer;

[0036] Specifically, step 2 further includes: counting the size, center coordinates, and type of the shapes selected in the same layer, and based on the statistical data, deleting and merging all duplicate shapes with exactly the same parameters until only one is retained to reduce repeated calculations;

[0037] Step 3: Divide the current layer into a plurality of rectangular regions 1, each 2000 μm by 2000 μm in length and width. The plurality of rectangular regions 1 are arranged in a matrix, and the rectangular regions are partially overlapped. The rectangular regions can be of any length, width, and number, and are not limited to the 3×3 illustrated in this embodiment. Then, a logical AND operation is performed on the selected graphics in the same layer and each rectangular region, so that the selected graphics are stored in the corresponding rectangular region 1. The portion of the graphics in the overlapping region is removed, that is, the portion of the selected graphics located outside the blank rectangular frame is removed.

[0038] Figure 2 The grid line part 2 in the figure is the part of the figure that exceeds the blank rectangular frame, that is, there is an overlapping part between the rectangular areas 1, and the grid line part 2 is the overlapping area. The size of the rectangular area 1 includes the blank rectangular frame in the figure and the grid line parts 2 adjacent to it above, below, left and right.

[0039] Step 4: Calculate the center point distance between all the graphics in the same rectangular area, retain the two graphics whose distance is less than the set distance, and record the position and distance between the two graphics;

[0040] Specifically, in step 4, the center point distances of all graphics in the same layer and within the same rectangular area are calculated. The distance calculation formula is:

[0041]

[0042] Among them, (x i 、y i ) is the coordinate of the center point of figure i, (x j 、y j ) is the coordinate of the center point of figure j, i≠j, i≥1, j≥1;

[0043] D is the distance between the center points of shape i and shape j;

[0044] Furthermore, in step 4, it also includes:

[0045] S4.1. If the distance between the center points of two graphics exceeds the set distance, the two graphics being compared are removed. If the distance between the center points of two graphics is less than the set distance, the two graphics being compared are retained, and the positions and distances between the two graphics are recorded.

[0046] S4.2. Determine whether all graphics in the same layer have completed the distance check. If so, output the position and spacing information of the graphics retained in the current layer to complete the distance check between the graphics in the current layer. If not, continue with step 4 until the distance check between the graphics in the current layer is completed.

[0047] S4.3. Determine whether the distance check of the graphics on all layers has been completed. If so, output the position and spacing information of the graphics retained on all layers to complete the distance check between the graphics on all layers. If not, continue with step 2 until the distance check between the graphics on all layers is completed.

[0048] Finally, after completing the distance check between graphics on all layers, you can quickly find graphics that are too close and modify them based on the position and spacing information of the graphics retained in all output layers, thereby improving the design efficiency of layout designers.

[0049] And after step 4, it also includes:

[0050] All the graphics retained after step 4 are subjected to pattern fusion in pairs. If two graphics are exactly the same, they are merged to remove duplicate graphics. In particular, the sameness of two graphics can still be determined by counting the size, center coordinates, and type of these graphics, and then merging all duplicate graphics with exactly the same parameters to remove duplicate graphics.

[0051] like Figure 4 As shown, if there is an overlap between two graphics, the overlapped parts of the two graphics are merged, thereby removing the duplicate graphics area;

[0052] For chip design, the final result is an interface where the distance between graphics of a specified type must not be less than a specific value, and identical graphics are merged and the overlapping parts of two graphics are merged.

[0053] It will be apparent to those skilled in the art that the present invention is not limited to the details of the exemplary embodiments described above and that the invention can be embodied in other specific forms without departing from the spirit or essential characteristics of the invention. Therefore, the embodiments should be considered in all respects as illustrative and non-restrictive, and the scope of the invention is defined by the appended claims, not the foregoing description, and all variations within the meaning and range of equivalents of the claims are intended to be included therein. Any reference sign in a claim should not be construed as limiting the claim to which it relates.

[0054] In addition, it should be understood that although this specification is described in terms of implementation methods, not every implementation method contains only one independent technical solution. This narrative method of the specification is only for the sake of clarity. Those skilled in the art should regard the specification as a whole. The technical solutions in each embodiment can also be appropriately combined to form other implementation methods that can be understood by those skilled in the art.

Claims

1. A fast pattern spacing screening method for chip design, characterized by: The following steps are involved: Step 1: Get the graphics to be checked and filter out graphics of a specified type; Step 2: Merge the same and repeated shapes in the same layer; Step 3: Split the current layer into multiple rectangular areas of specified length and width. Arrange the multiple rectangular areas in a matrix, with some areas overlapping between them. Then, perform a logical AND operation on the selected graphics in the same layer and each rectangular area, storing the selected graphics in the corresponding rectangular area and removing the graphics in the overlapping area. Step 4: Calculate the center point distance between all figures within the same rectangular area. Keep the two figures whose distance is less than the set distance, and record the position and distance between the two figures to complete the distance check between the figures.

2. The fast pattern spacing screening method for chip design according to claim 1, characterized in that: In the step 1, it also includes: S1.

1. Obtain a graphic interface having multiple layers, and obtain a graphic to be inspected in the graphic interface; S1.

2. Determine whether the graphics to be checked are in the same layer. If not, filter out graphics of the specified type from each layer in the order of layer stacking to ensure that the graphics to be checked are in the same layer. If they are in the same layer, filter out graphics of the specified type from the current layer.

3. The fast pattern spacing screening method for chip design according to claim 1, characterized in that: Filters the specified graphic type to be a circle, rectangle, or other polygonal graphic.

4. The method for rapid pattern spacing screening for chip design according to claim 2, wherein: The step 2 further includes: counting the size, center coordinates and graphic type of the graphics selected in the same layer, and merging all repeated graphics with the same parameters according to the statistical data until only one is retained.

5. The method for rapid pattern spacing screening for chip design according to claim 1, wherein: In step 4, the center point distances of adjacent graphics in the same layer and within the same rectangular area are calculated. The distance calculation formula is: Among them, (x i 、y i ) is the coordinate of the center point of figure i, (x j 、y j ) is the coordinate of the center point of figure j, i≠j, i≥1, j≥1; D is the distance between the center points of shape i and shape j.

6. The method for rapid pattern spacing screening for chip design according to claim 1, wherein: In the step 4, it also includes: S4.

1. If the distance between the center points of two graphics exceeds the set distance, the two graphics being compared are removed. If the distance between the center points of two graphics is less than the set distance, the two graphics being compared are retained, and the positions and distances between the two graphics are recorded. S4.

2. Determine whether all graphics in the same layer have completed the distance check. If so, output the position and spacing information of the graphics retained in the current layer to complete the distance check between the graphics in the current layer. If not, continue executing step 4 until the distance check between the graphics in the current layer is completed. S4.

3. Determine whether the distance check of the graphics on all layers has been completed. If so, output the position and spacing information of the graphics retained on all layers to complete the distance check between the graphics on all layers. If not, continue to execute step 2 until the distance check between the graphics on all layers is completed.

7. The method for rapid pattern spacing screening for chip design according to claim 1, characterized in that: After step 4, the method further includes: All the graphics retained after step 4 are fused in pairs. If two graphics are exactly the same, the two graphics are merged. If there is an overlap between two graphics, the overlapped parts of the two graphics will be merged.

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