Test parameter configuration method and test parameter configuration system

Abstract

The invention relates to a test parameter configuration method and system, and the method comprises the steps: obtaining a plurality of channel objects corresponding to a to-be-tested pin, and enabling the channel objects to comprise channel identifiers and channel information of corresponding test channels; generating test channel group information based on the to-be-tested pin, wherein the test channel group information comprises a test channel group identifier and channel identifiers of a plurality of test channels; generating sub-channel group information corresponding to each test board card based on the test channel group information, and sending the sub-channel group information to the corresponding test board card; the test channel group is traversed, one or more target test channels of the test channel group are determined, and the target test channels correspond to the board card type of the test board card; and obtaining the corresponding channel information from the channel objects of the one or more target test channels, and sending the channel information to the test board card corresponding to the board card type in a broadcast mode, thereby solving the problem of low test parameter configuration efficiency of the to-be-tested chip in related technologies.

Description

Technical Field

[0001] The present application relates to the field of chip testing technology, and in particular to a test parameter configuration method and a test parameter configuration system. Background Art

[0002] Integrated circuit testing applies stimulus to the chip under test (DUT) based on its functionality, measures the chip's output response, and compares the output response with the expected output to determine whether the DUT is qualified. An ATE-based test program typically includes DC parameter testing, which can drive current into the DUT to measure the DUT's output voltage, or apply a certain voltage to the DUT to measure the output current. The tester needs to be configured with different test parameters for different DUT pins, and each DUT pin corresponds to a different test channel on each test board of the tester. Currently, the common practice is to complete parameter settings on the host computer, then send the parameters to each channel of each test board via communication commands, and configure the parameters of the registers corresponding to the channel. However, the large number of test channels leads to low configuration efficiency.

[0003] Currently, no effective solution has been proposed to the problem of low efficiency in configuring test parameters of a chip under test in related technologies. Summary of the Invention

[0004] In this embodiment, a test parameter configuration method and a test parameter configuration system are provided to solve the problem of low test parameter configuration efficiency of a chip to be tested in related technologies.

[0005] In a first aspect, a test parameter configuration method is provided in this embodiment. The method is applied to a test system, wherein the test system includes a host computer and multiple types of test boards communicatively connected to the host computer, wherein the test boards include multiple test channels. The method includes:

[0006] Acquire multiple channel objects corresponding to the pins to be tested, wherein the channel objects include channel identifiers and channel information of corresponding test channels;

[0007] Generate test channel group information based on the pin to be tested, the test channel group information including a test channel group identifier and channel identifiers of a plurality of test channels included in the test channel group;

[0008] Based on the test channel group information, generate sub-channel group information corresponding to each test board, and send the sub-channel group information to the corresponding test board;

[0009] Traversing the test channel group, determining one or more target test channels of the test channel group, wherein the target test channels correspond to a board type of the test board;

[0010] Target information is obtained based on the channel information in the channel object of the one or more target test channels, and the target information is broadcasted to the test board corresponding to the board type, and the target information is used by the test board to perform test parameter configuration. In some embodiments,

[0011] The target information includes test parameters and register addresses, and the steps of executing test parameter configuration on the test board include:

[0012] Acquire channel identifiers of the plurality of test channels based on the received sub-channel group information;

[0013] Based on the channel identifier and the register address, the test parameter is written into a corresponding register of a corresponding test channel.

[0014] In some embodiments, obtaining target information based on channel information in channel objects of the one or more target test channels includes:

[0015] The channel information includes the board type and test parameters of the target test channel, and a driver function is called based on the test parameters to obtain a register address corresponding to the test parameters;

[0016] The board type, the test parameters, and the register address constitute the target information.

[0017] In some embodiments, the test board includes multiple processing units, each processing unit corresponds to multiple test channels, and writing the test parameters into corresponding registers of corresponding test channels based on the channel identifier and the register address includes:

[0018] Traversing each of the channel identifiers to determine the processing unit corresponding to the test channel;

[0019] Writing the channel identifier corresponding to each processing unit into the corresponding group operation register;

[0020] The test parameters are written into a corresponding register of a corresponding test channel based on the register address and the channel identifier in the group operation register.

[0021] In some embodiments, before broadcasting the target information to the test board corresponding to the board type, the method further includes:

[0022] Traversing the parameter list, sequentially obtaining corresponding test parameters in the channel object of the target test channel based on each parameter type in the parameter list, and determining whether the test parameters are processing unit configuration parameters;

[0023] When the test parameter is a configuration parameter of the processing unit, determining whether to use a broadcast mode for configuration based on a parameter type of the test parameter;

[0024] If so, the target information is sent to the test board corresponding to the board type in a broadcast manner.

[0025] In some of these embodiments,

[0026] The channel information includes a board type, and traversing the test channel group to determine one or more target test channels of the test channel group, wherein the target test channels correspond to the board type of the test board, includes:

[0027] Traverse each channel object corresponding to the test channel group to obtain the board type corresponding to the test channel;

[0028] Determine whether the board type exists in the cache; if the board type does not exist, store the board type and the corresponding channel identifier in the cache;

[0029] Repeat the above steps until the test channel group is completely traversed;

[0030] The method further includes: obtaining a channel identifier of the target test channel and a corresponding board type based on the cache. In some embodiments, before obtaining a plurality of channel objects corresponding to the pins to be tested, the method further includes:

[0031] Traverse the test channels and obtain channel objects corresponding to the test channels one by one;

[0032] When the test channel corresponding to the channel object is enabled, the test parameters are saved to the channel object. The channel object corresponding to the test channel includes a plurality of test parameters, and the plurality of test parameters are parameter values corresponding to a plurality of parameter types.

[0033] In some embodiments, generating sub-channel group information corresponding to each test board based on the test channel group information and sending the information to the corresponding test board includes:

[0034] Based on the test channel group information, the channel identifiers of the test channels in the test channel group are grouped to generate the sub-channel group information corresponding to each test board;

[0035] Sending the sub-channel group information to the corresponding test board, the sub-channel group information including a test channel group identifier and a test board channel identifier, the test board channel identifier being a channel identifier belonging to the test board;

[0036] Determining whether the test channel group identifier exists in a register of the test board;

[0037] When the test channel group identifier does not exist, the test channel group identifier and the test board channel identifier are written into the register.

[0038] In the second aspect, a test parameter configuration system is provided in this embodiment.

[0039] The test parameter configuration system is applied to a test system, which includes a host computer and multiple types of test boards communicatively connected to the host computer, wherein the test boards include multiple test channels. The test parameter configuration system includes:

[0040] Software layer: used to obtain the pins to be tested corresponding to the test items;

[0041] Driver layer: used to obtain multiple channel objects corresponding to the pins to be tested, the channel objects including the channel identifier and channel information of the test channels; based on the pins to be tested, generate test channel group information, the test channel group information including the test channel group identifier and the channel identifiers of the multiple test channels included in the test channel group; based on the test channel group information, generate sub-channel group information corresponding to each of the test boards; traverse the test channel group to determine one or more target test channels of the test channel group, the target test channels corresponding to the board type of the test board; obtain target information based on the channel information in the channel objects of the one or more target test channels, and send the target information to the test board corresponding to the board type in a broadcast manner, the target information is used by the test board to execute test parameter configuration;

[0042] Transport layer: used to transmit the sub-channel group information corresponding to each test board and the broadcast instruction containing the target information to each test board;

[0043] Board layer: used to perform test parameter configuration based on the target information.

[0044] In some embodiments, the channel information includes test parameters and register addresses, and the board layer is used to:

[0045] Based on the received sub-channel group information, the channel identifiers of the multiple test channels are acquired; based on the channel identifiers and the register addresses, the test parameters are written into corresponding registers of corresponding test channels.

[0046] In some embodiments, the board layer includes multiple types of test boards, each of which includes a controller and multiple processing units, each processing unit corresponding to multiple test channels.

[0047] Compared with the related art, the test parameter configuration method provided in this embodiment obtains the correspondence between the functional pins of the chip and the test channels, test parameters, and board types by obtaining multiple channel objects corresponding to the pins to be tested; generates corresponding test channel group information based on the pins to be tested, and manages multiple test channels corresponding to the same pins to be tested and distributed on different types of test boards in the form of channel groups; generates sub-channel group information corresponding to each test board based on the test channel group information and sends it to the corresponding test board, so that the test board can obtain each test channel belonging to the board; and determines one or more target test channels of the test channel group by traversing the test channel group. Channel, the target test channel corresponds to the board type of the test board, and the channel information of the parameter configuration is classified and transmitted according to the board type; the target information is obtained based on the channel information in the channel object of one or more target test channels, and the target information is sent to the test board corresponding to the board type in a broadcast manner. The target information is used for the test board to execute the test parameter configuration, and the test parameters corresponding to the pins to be tested are sent to all types of boards at one time through the broadcast instruction, which improves the configuration efficiency and solves the problem of low test parameter configuration efficiency of the chip to be tested in the related art. The parameter configuration is converted from the serial configuration of each test channel to the broadcast configuration, which improves the configuration efficiency.

[0048] The details of one or more embodiments of the present application are set forth in the following drawings and description to make other features, objects, and advantages of the present application more readily apparent. BRIEF DESCRIPTION OF THE DRAWINGS

[0049] The drawings described herein are used to provide a further understanding of the present application and constitute a part of the present application. The illustrative embodiments of the present application and their descriptions are used to explain the present application and do not constitute an improper limitation on the present application. In the drawings:

[0050] Figure 1 is a structural block diagram of a test system according to some embodiments of the present application;

[0051] Figure 2 is a flowchart of a test parameter configuration method according to some embodiments of the present application;

[0052] Figure 3 is a flow chart of parameter configuration of a test board execution in some embodiments of the present application;

[0053] Figure 4 is a flowchart of writing test parameters into channel registers in some embodiments of the present application;

[0054] Figure 5 This is a flowchart of broadcasting test parameters according to some embodiments of the present application;

[0055] Figure 6is a flowchart of obtaining a target test channel in some embodiments of the present application;

[0056] Figure 7 This is a flowchart of obtaining a test channel object in some embodiments of the present application;

[0057] Figure 8 This is a flowchart of sending test channel group information in some embodiments of the present application;

[0058] Figure 9 is a flow chart of a test parameter configuration method according to some preferred embodiments of the present application;

[0059] Figure 10 This is a structural block diagram of a test parameter configuration system in some embodiments of the present application. DETAILED DESCRIPTION

[0060] In order to more clearly understand the purpose, technical solutions and advantages of this application, the present application is described and illustrated below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain this application and are not intended to limit this application.

[0061] Unless otherwise defined, the technical terms or scientific terms involved in this application should have the general meaning understood by people with ordinary skills in the technical field to which this application belongs. The words "one", "an", "a", "the", "these" and the like in this application do not indicate quantitative restrictions, and they can be singular or plural. The terms "include", "comprise", "have" and any variants thereof involved in this application are intended to cover non-exclusive inclusions; for example, a process, method and system, product or device comprising a series of steps or modules (units) is not limited to the listed steps or modules (units), but may include unlisted steps or modules (units), or may include other steps or modules (units) inherent to these processes, methods, products or devices. The words "connect", "connected", "coupled" and the like involved in this application are not limited to physical or mechanical connections, but may include electrical connections, whether direct or indirect. The "plurality" involved in this application refers to two or more. "And / or" describes the relationship between related objects, indicating that three possible relationships exist. For example, "A and / or B" can represent: A exists alone, A and B exist simultaneously, and B exists alone. Generally, the character " / " indicates that the related objects are in an "or" relationship. The terms "first," "second," "third," etc. used in this application are only used to distinguish similar objects and do not represent a specific ordering of the objects.

[0062] The test parameter configuration method provided in the embodiment of the present application can be Figure 1 The test system shown is executed. Figure 1 This is a test system structure diagram of the test parameter configuration method of some embodiments of the present application, such as Figure 1 As shown, the test system includes a host computer 10 and multiple types of test boards 20 and 30 (two types are shown in the figure) that are communicatively connected to the host computer. The test board 20 includes multiple test channels 21 (three are shown in the figure), and the test board 30 includes multiple test channels 31 (two are shown in the figure). It can be understood by those skilled in the art that Figure 1 The structure shown is only for illustration and does not limit the structure of the above test system. Figure 1 More components as shown in , or with Figure 1 Different configurations shown.

[0063] In this embodiment, a test parameter configuration method is provided. Figure 2 is a flow chart of a test parameter configuration method in some embodiments of the present application, such as Figure 2 As shown, the process includes the following steps:

[0064] Step S201: Acquire multiple channel objects corresponding to the pins to be tested, wherein the channel objects include channel identifiers and channel information of corresponding test channels.

[0065] The test channel is used to connect the pins corresponding to the functional pins on the DUT on the test station to the test board. The test board is used to apply excitation signals to the pins of the DUT or measure response signals. Functional pins are pin names corresponding to chip functions. Pins to be tested are functional pins related to test items that have input or output voltage or current signals during the test process. They can correspond to pins of multiple DUTs. In a specific embodiment, the functional pins of the chip may include power pins, I 2 C pin, serial port input pin, etc., where the pin to be tested is I 2 C pin is used as an example, the pin to be tested is I 2 The C pin can correspond to multiple DUT's I 2 C pin.

[0066] Each test board can include multiple test channels, enabling parallel testing of multiple DUTs. Each test channel has a corresponding channel identifier, used to distinguish it from the others. A channel object is created by the driver software for each test channel and stores channel information corresponding to that test channel. Specifically, this channel information may include the board type and test parameters of the test board where the test channel resides.

[0067] For the same pin under test, different types of test boards can correspond to different test channels. Based on the hardware connection relationship between each test channel and the DUT pin on each type of test board, the correspondence between the pin under test, the test channel, and the board type of the test board can be pre-acquired. In some embodiments, the user can manually or automatically set the test parameters and register addresses corresponding to each functional pin of the chip under test. The test parameters of this embodiment are applicable to different types of test boards.

[0068] In some embodiments, the host computer saves parameter types to a parameter list and sequentially stores test parameters corresponding to the parameter types in channel objects. The host computer selects a test item and the corresponding pin to be tested, and then drives the software to obtain multiple channel objects corresponding to the pin to be tested. The correspondence between the pin to be tested, the test board, the test channel, and the test parameters is obtained.

[0069] Step S202: Generate test channel group information based on the pin to be tested, where the test channel group information includes a test channel group identifier and channel identifiers of multiple test channels included in the test channel group.

[0070] Based on the test items to be executed, one or more corresponding pins to be tested can be determined. Once the pins to be tested are determined, test channel group information corresponding to the pins to be tested is generated based on the correspondence between the pins to be tested and the corresponding test channels of different types of boards. The test channel group information includes a test channel group identifier and the channel identifier of the test channel corresponding to the pin to be tested on each type of test board.

[0071] Step S203: Generate sub-channel group information corresponding to each test board based on the test channel group information, and send the information to the corresponding test board.

[0072] Each test channel in the same test channel group can belong to multiple test boards. The test board to which each test channel belongs is determined based on its channel identifier. The channel identifiers of the test channels in the test channel group are grouped according to the test boards to which they belong. Sub-channel group information corresponding to each test board is generated and sent to the corresponding test board. The sub-channel group information includes the test channel group identifier and the identifiers of the channels in the test channel group that belong to the test board.

[0073] Step S204 , traversing the test channel group to determine one or more target test channels in the test channel group, where the target test channels correspond to the board type of the test board.

[0074] Traverse the test channel group and determine one or more target test channels from all test channels. Specifically, the target test channels correspond to the types of test boards on which the test channels in the test channel group are located, and one target test channel is determined for each type of test board. The target test channels can be determined by dividing the test channels according to board type and randomly selecting one from the test channels corresponding to the same board type as the target test channel; or by traversing the test channels and determining the target test channels according to the board type corresponding to the test channels. This embodiment does not limit the method for obtaining the target test channels.

[0075] Step S205 , acquiring target information based on the channel information in the channel objects of one or more target test channels, and broadcasting the target information to the test board corresponding to the board type, wherein the target information is used for the test board to execute test parameter configuration.

[0076] There can be one or more test boards of the same type, and the target test channels, test parameters, and register addresses of the same type of test boards are the same. In this embodiment, the channel information includes the board type and test parameters of the test board where the test channel is located. The driver software calls the driver function based on the test parameters to obtain the register address corresponding to the test parameters, thereby enabling the driver software to obtain target information based on the channel information. The target information includes the board type, test parameters, and register address of the test board where the test channel is located, where the register address is the register address corresponding to the test parameter.

[0077] After obtaining the target test channel in step S204, the corresponding channel information is obtained from the corresponding channel object. Based on the channel information, the target information is obtained and broadcasted to the corresponding test board. It should be noted that different target test channels correspond to different board types. Based on a target test channel, the test parameters contained in the target information and the register addresses corresponding to the test parameters are obtained and broadcasted to the test board. The board type of the test board being sent must be consistent with the board type corresponding to the target test channel.

[0078] The test board may include a controller. When receiving target information, the controller may send the test parameters to registers corresponding to each test channel in the sub-test channel group corresponding to the test board according to register addresses corresponding to the test parameters in the target information.

[0079] Furthermore, the controllers of the various test boards can execute their respective test parameter configurations in parallel to complete register configurations corresponding to the test channel group.

[0080] Through steps S201 to S205, by acquiring multiple channel objects corresponding to the pins to be tested, the corresponding relationship between the functional pins of the chip and the test channels, test parameters, and board types is obtained; by generating corresponding test channel group information based on the pins to be tested, multiple test channels corresponding to the same pins to be tested and distributed on different types of test boards are managed in the form of channel groups; by generating sub-channel group information corresponding to each test board based on the test channel group information and sending it to the corresponding test board, it is convenient for the test board to obtain each test channel belonging to the board; by traversing the test channel group, one or more target test channels of the test channel group are determined, and the target test channels are The test channel corresponds to the board type of the test board, and the channel information of the parameter configuration is classified and transmitted according to the board type; the target information is obtained based on the channel information in the channel object of one or more target test channels, and the target information is sent to the test board corresponding to the board type in a broadcast manner. The target information is used for the test board to execute the test parameter configuration, and the test parameters corresponding to the pins to be tested are sent to all types of boards at one time through the broadcast instruction, which improves the configuration efficiency and solves the problem of low test parameter configuration efficiency of the chip to be tested in the related technology. The parameter configuration is converted from the serial configuration of each test channel to the broadcast configuration, which improves the configuration efficiency.

[0081] In some embodiments, the target information includes test parameters and register addresses. Figure 3 This is a flow chart of the test board execution parameter configuration in some embodiments of the present application, such as Figure 3 As shown, the process includes the following steps:

[0082] Step S301: Acquire channel identifiers of multiple test channels based on the received sub-channel group information.

[0083] In step S203 of the above embodiment, each test board receives the sub-channel group information sent by the host computer. The sub-channel group information includes a test channel group identifier and channel identifiers belonging to the test board in the test channel group.

[0084] Step S302: writing the test parameters into the corresponding register of the corresponding test channel based on the channel identifier and the register address.

[0085] In step S205 of the above embodiment, the test board receives target information, which includes test parameters and register addresses. Based on the channel identifier of the test channel group belonging to the test board received in step S301, the test channel to which the target information received in step S205 is to be written is obtained. Based on the register address in the target information, the test parameters are written to the corresponding register of the test channel.

[0086] Through steps S301 to S302, the test board obtains the channel identifiers of multiple test channels based on the received sub-channel group information, and obtains the test channels corresponding to the pins to be tested belonging to the test board; the test parameters and register addresses obtained based on the target information are written into the corresponding registers of the corresponding test channels. Different types of test boards obtain the test parameters and register addresses based on the received target information, and complete the parameter configuration of the test boards of this type, so that the parameter configuration of the same pins to be tested can be compatible with different types of test boards, thereby improving the hardware environment adaptability of the test system; and different types of test boards can complete the automatic configuration of parameters without the operator having to perform additional settings, thereby improving the efficiency and automation of chip testing.

[0087] In some embodiments, the test board includes multiple processing units, each processing unit corresponds to multiple test channels. Figure 4 This is a flowchart of writing test parameters into channel registers in some embodiments of the present application, such as Figure 4 As shown, the process includes the following steps:

[0088] Step S401: traverse each channel identifier to determine the processing unit corresponding to the test channel.

[0089] The controller of the test board can obtain the channel identifier of each test channel belonging to the test board in the test channel group based on the received sub-channel group information, traverse each channel identifier, and determine the processing unit corresponding to the test channel based on the channel identifier. Specifically, the channel identifier can be a channel number.

[0090] Specifically, each test board includes multiple processing units, and the test channels corresponding to each processing unit are numbered sequentially as channel identifiers. In one specific embodiment, the test board includes four processing units, each of which includes eight test channels. The test channels are numbered 0 to 7, 8 to 15, 16 to 23, and 24 to 31, respectively. The corresponding processing unit can be determined based on the channel number.

[0091] Step S402: Write the channel identifier corresponding to each processing unit into the corresponding group operation register.

[0092] Based on the channel number (i.e., channel identifier) of each test channel, the test channels belonging to the test board in the test channel group are divided into different processing units, and the test channels belonging to different processing units are processed separately. Specifically, test channels belonging to the same processing unit can be grouped by writing the corresponding channel number to the group operation register.

[0093] Step S403: writing the test parameters into the corresponding register of the corresponding test channel based on the register address and the channel identifier in the group operation register.

[0094] According to the register address, the test parameters are written to the register corresponding to each channel number in the group operation register. Each test channel that can be broadcast in the test channel group corresponds to a different register, but the register addresses corresponding to the test parameters stored in different registers are the same.

[0095] Furthermore, when each test channel belonging to the same test board in the test channel group belongs to multiple processing units, steps S402 and S403 are repeatedly executed according to the test channel numbers corresponding to different processing units to complete the test parameter configuration of each processing unit.

[0096] Through steps S401 to S403, by traversing each channel identifier in the sub-channel group information, the processing unit corresponding to the test channel is determined, and each test channel is divided into processing units to facilitate subsequent execution of group operations; by writing the channel identifier corresponding to each processing unit into the corresponding group operation register, and based on the register address and the channel identifier in the group operation register, the test parameters are written into the corresponding register of the corresponding test channel. Only two instructions are needed to complete the parameter configuration of multiple test channels on the same processing unit, thereby improving the parameter configuration efficiency.

[0097] Furthermore, the multi-test board processes the parameter configurations of multiple test channels in the test board in parallel based on steps S401 to S403, thereby improving the parameter configuration efficiency.

[0098] In some embodiments, Figure 5 This is a flowchart of the test parameter broadcast transmission of some embodiments of the present application, such as Figure 5 As shown, the process includes the following steps:

[0099] Step S501 , traverse the parameter list, sequentially obtain the corresponding test parameters in the channel object of the target test channel based on each parameter type in the parameter list, and determine whether the test parameter is a processing unit configuration parameter.

[0100] The parameter list is a parameter configuration table for the driver software. The user calls the parameter sending function interface to send the set parameter type to the driver software, and the driver software saves the parameter type in the parameter configuration table.

[0101] Specifically, the channel object corresponding to the test channel includes several test parameters, and the several test parameters are parameter values corresponding to multiple parameter types.

[0102] Before sending the target information to the test board via broadcast, the parameter list is first traversed. Based on the parameter types in the parameter list, the corresponding test parameters are sequentially obtained from the channel objects of the target test channel. Based on the value of the test parameter, it is determined whether the test parameter is a processing unit configuration parameter. Specifically, the value of the test parameter can be compared with the preset processing unit configuration parameters, and based on the comparison result, it is determined whether the test parameter is a processing unit configuration parameter. If the test parameter is not a processing unit configuration parameter, the parameter is directly sent to the corresponding test board.

[0103] Alternatively, the driver software may directly determine whether the test parameter is a processing unit configuration parameter based on a preset test parameter type.

[0104] Step S502: When the test parameter is a configuration parameter of the processing unit, it is determined whether to use a broadcast mode for configuration based on the parameter type of the test parameter.

[0105] If the test parameter is a processing unit configuration parameter, the parameter type determines whether to use broadcast configuration. Parameter types can include current and voltage values, mode configuration parameters, and more. Test parameter type conditions can be pre-set. If the parameter type does not meet the condition, the parameter is directly sent to the corresponding test board.

[0106] In a specific embodiment, some parameter types, such as current and voltage values, need to be set individually for different types of test boards, and are therefore not suitable for the broadcast method.

[0107] Step S503: If yes, the target information is sent to the test board corresponding to the board type in a broadcast manner.

[0108] If the parameter type meets the type condition, it is determined that the configuration can be performed using the broadcast mode. According to the board type in the target information, the target information is sent to the test board corresponding to the board type via the broadcast mode.

[0109] Through steps S501 to S503, by traversing the parameter list, the corresponding test parameters are obtained in turn based on the parameter types in the parameter list, and it is determined whether the test parameter is a processing unit configuration parameter, and the test parameters that do not meet the broadcast conditions are eliminated according to the value of the test parameter; based on the parameter type of the test parameter, it is determined whether to use the broadcast method for configuration, and the test parameters that do not meet the broadcast conditions are further eliminated. Only the configuration parameters that meet the conditions are broadcast, avoiding errors in the parameter configuration process and improving the efficiency of parameter configuration.

[0110] In some embodiments, Figure 6 This is a flowchart of obtaining a target test channel in some embodiments of the present application, such as Figure 6As shown, the process includes the following steps:

[0111] Step S601: traverse each channel object corresponding to the test channel group to obtain the board type corresponding to the test channel.

[0112] The test channel group is traversed, and the board type in the channel information is obtained according to the channel object corresponding to each test channel in the test channel group.

[0113] Step S602 , determining whether the board type exists in the cache; if the board type does not exist, storing the board type and the corresponding channel identifier in the cache.

[0114] After obtaining the board type corresponding to the test channel, query the cache. If the board type does not exist in the cache, store the board type and the channel identifier of the test channel in the cache; if the board type already exists in the cache, continue to traverse each test channel until all test channels in the test channel group are traversed.

[0115] Step S603: Repeat the above steps until the test channel group is completely traversed.

[0116] Steps S601 to S602 are executed for each test channel group to obtain the board types corresponding to all test channels in the test channel group.

[0117] Step S604: Acquire the channel identifier of the target test channel and the corresponding board type based on the cache.

[0118] According to the channel identifiers stored in the cache, the target test channels corresponding to the respective board types are determined.

[0119] Through steps S601 to S604, by traversing each channel object corresponding to the test channel group, the board type corresponding to the test channel is obtained, and the board type corresponding to each test channel is stored in the cache, and only one corresponding test channel is saved for each board type. All test channels in the test channel group are repeatedly traversed to obtain each board type and the corresponding target test channel. These are used as data sources for test parameters corresponding to different types of test boards and register addresses corresponding to the test parameters, thereby realizing parallel configuration of test parameters for different types of test boards.

[0120] In some embodiments, Figure 7 This is a flowchart before obtaining multiple channel objects corresponding to the pins to be tested in some embodiments of the present application, such as Figure 7 As shown, the process includes the following steps:

[0121] Step S701: traverse the test channels and obtain channel objects corresponding to the test channels one by one.

[0122] The parameter list is a parameter configuration table for the driver software. The user calls the parameter sending function interface to send the set parameter type to the driver software, and the driver software saves the parameter type in the parameter configuration table.

[0123] The driver software traverses the test channels and obtains the channel objects corresponding to the test channels one by one; therefore, based on the test items, the driver software can obtain the channel objects corresponding to the corresponding pins to be tested through the interface function API, and then obtain the test parameters in the channel objects.

[0124] Step S702 : When the test channel corresponding to the channel object is enabled, save the test parameters to the channel object. The channel object corresponding to the test channel includes a plurality of test parameters, which are parameter values corresponding to various parameter types.

[0125] The test channels are traversed. Based on the communication status between the host computer and each test board, the corresponding test channel is determined to be enabled. If enabled, the test parameters are stored in the corresponding channel object. The enabled state indicates that the test channel is valid. Furthermore, based on the channel ID of the test channel, a table of correspondences between board type and test channel is queried to obtain the corresponding board type and channel ID for the test channel, which are then stored in the channel object.

[0126] Through steps S701-S702, each test channel is traversed. If a test channel is enabled, the test parameters corresponding to the test channel are stored in the channel object, completing the data preparation for each channel parameter configuration. In this embodiment, by obtaining the channel object of the test channel, test parameters corresponding to multiple parameter types are stored in the channel object. Based on the test item, multiple channel objects corresponding to the pins to be tested are obtained, as well as the board type, channel identifier, and test parameters of the corresponding test channels included in the channel objects.

[0127] In some embodiments, Figure 8 This is a flowchart of sending sub-channel group information in some embodiments of the present application, such as Figure 8 As shown, the process includes the following steps:

[0128] Step S801: based on the test channel group information, group the channel identifiers of the test channels in the test channel group to generate sub-channel group information corresponding to each test board.

[0129] In this embodiment, a unique test channel group identifier corresponding to the pin to be tested is generated in a preset manner based on the serial number or identifier of the pin to be tested. The test channel group identifier of each test channel is used to determine the test board to which the test channel belongs. The channel identifiers of the test channels in the test channel group are grouped according to the test board to which they belong, generating sub-channel group information. The sub-channel group information includes the test channel group identifier and the test board channel identifier, where the test board channel identifier is the channel identifier belonging to the test board. This sub-channel group information is then sent to the test board.

[0130] Step S802: Send the sub-channel group information to the corresponding test board, wherein the sub-channel group information includes a test channel group identifier and a test board channel identifier, and the test board channel identifier is a channel identifier belonging to the test board.

[0131] Furthermore, before the test board receives the sub-channel group information sent by the driver software, the test channel group identifiers already stored in the test board can be checked to determine whether the number of test channel group identifiers stored in the test board exceeds a preset threshold. If the number exceeds the preset threshold, the stored test channel group identifiers are cleared to avoid the number of test channel group identifiers stored in the register exceeding the limit and causing a storage error, thereby improving the stability of the parameter configuration process.

[0132] Step S803: Determine whether the test channel group identifier exists in the register of the test board.

[0133] After the test board receives the test channel group identifier in the sub-channel group information, it queries whether the test channel group identifier exists in the register used to store the test channel group identifier. If it exists, it means that the information of the test channel group has been stored in the previous test, including the test channel group identifier and the channel identifiers of each test channel, etc. At this time, the test channel group identifier can be returned to the driver software.

[0134] Step S804: if the test channel group identifier does not exist, write the test channel group identifier and the test board channel identifier into the register.

[0135] If the test channel group ID does not exist in the register, the test board writes the test channel group ID into the register, writes the channel ID of each test channel in the sub-channel group information into the register, and returns the test channel group ID to the driver software. The driver software can obtain the target test channel corresponding to the test channel group based on the returned test channel group ID.

[0136] Through steps S801 to S804, a test channel group identifier is generated based on the pin to be tested and sent to the test board. The test board determines whether the test channel group identifier exists in the register of the test board. If the serial number does not exist, the test channel group identifier and the test board channel identifier are written into the register, providing necessary test channel information for subsequent parameter configuration inside each test board, thereby ensuring the correctness of the parameter configuration.

[0137] The test parameter configuration method of the present application is described and illustrated below through some preferred embodiments. Figure 9 is a flow chart of a test parameter configuration method of some preferred embodiments of the present application, such as Figure 9 As shown, the process includes the following steps:

[0138] Step S901, save the parameter type to the parameter list;

[0139] Step S902: traverse the test channels and obtain channel objects corresponding to the test channels one by one;

[0140] Step S903: If the test channel corresponding to the channel object is enabled, save the test parameters to the channel object;

[0141] Step S904, obtaining multiple pins to be tested and corresponding test parameters;

[0142] Step S905: Generate corresponding test channel group information based on the pin to be tested, where the test channel group information includes a test channel group identifier and channel identifiers of multiple test channels included in the test channel group.

[0143] Step S906: Generate sub-channel group information corresponding to each test board based on the test channel group information, and send it to the corresponding test board;

[0144] Step S907, traverse each channel object corresponding to the test channel group to obtain the board type corresponding to the test channel;

[0145] Step S908, determining whether the board type exists in the cache; if the board type does not exist, storing the board type and the corresponding channel identifier in the cache;

[0146] Step S909, repeating steps S907 to S908 until the test channel group is completely traversed;

[0147] Step S910, obtaining the channel identifier of the target test channel and the corresponding board type based on the cache;

[0148] Step S911: traverse the parameter list and sequentially obtain the corresponding test parameters in the test channel based on each parameter type in the parameter list;

[0149] Step S912: Calling a driver function based on the test parameters to obtain a register address corresponding to the test parameters, and obtaining target information of a target test channel, the target information including the test parameters and the register address;

[0150] Step S913, determining whether the test parameter is a processing unit configuration parameter;

[0151] Step S914: If yes, determine whether to use broadcast mode configuration based on the parameter type of the test parameter;

[0152] Step S915: If yes, the target information is sent to the test board corresponding to the board type in a broadcast manner;

[0153] Step S916: Each test board obtains channel identifiers of multiple test channels based on the received sub-channel group information;

[0154] Step S917, traverse each channel identifier to determine the processing unit corresponding to the test channel;

[0155] Step S918, writing the channel identifier corresponding to each processing unit into the corresponding group operation register;

[0156] Step S919: writing the test parameters into the corresponding register of the corresponding test channel based on the register address and the channel identifier in the group operation register.

[0157] Through steps S901 to S919, multiple test channels distributed on different types of test boards are managed in the form of a test channel group, and the board type, test parameters and register address corresponding to each test channel are obtained; each test channel in the test channel group is divided according to the board type, each type of test board corresponds to a target test channel, and the channel information of the parameter configuration is classified and transmitted according to the board type; based on the configuration object and type of the test parameter, the configuration object and type are screened, and the qualified test parameters are sent to all types of boards at one time through broadcast instructions, thereby improving the configuration efficiency; the parallel configuration of the test parameters is executed separately inside different types of test boards, and only two instructions are needed to complete the parameter configuration of multiple test channels on the same processing unit, which solves the problem of low test parameter configuration efficiency of the chip to be tested in the related art, and converts the parameter configuration from serial configuration of each test channel to broadcast configuration and parallel configuration, thereby improving the configuration efficiency.

[0158] It should be noted that the steps shown in the above process or the flowchart in the accompanying drawings can be executed in a computer system such as a set of computer-executable instructions, and although a logical order is shown in the flowchart, in some cases, the steps shown or described can be executed in an order different from that shown here.

[0159] In some embodiments, the present application also provides a test parameter configuration system, which is applied to a test system, the test system including a host computer and various types of test boards connected to the host computer for communication, the test boards including multiple test channels. The terms "module", "layer", "unit", etc. used below may refer to a combination of software and / or hardware that can implement a predetermined function. In some embodiments, Figure 10 This is a structural block diagram of the test parameter configuration system of some embodiments of the present application, such as Figure 10 As shown, the test parameter configuration system includes:

[0160] Software layer: used to obtain the pins to be tested corresponding to the test items;

[0161] Driver layer: used to obtain multiple channel objects corresponding to the pins to be tested, wherein the channel objects include the channel identifier and channel information of the test channels; based on the pins to be tested, generate test channel group information, wherein the test channel group information includes the test channel group identifier and the channel identifiers of the multiple test channels included in the test channel group; based on the test channel group information, generate sub-channel group information corresponding to each test board; traverse the test channel group to determine one or more target test channels of the test channel group, wherein the target test channels correspond to the board type of the test board; obtain target information based on the channel information in the channel objects of the one or more target test channels, and send the target information to the test board corresponding to the board type in a broadcast manner, wherein the target information is used by the test board to execute test parameter configuration;

[0162] Transport layer: used to transmit the sub-channel group information corresponding to each test board and the broadcast instructions containing target information to each test board;

[0163] Board layer: used to perform test parameter configuration based on target information.

[0164] The test parameter configuration system of this embodiment obtains the pins to be tested corresponding to the test items through the software layer, manages multiple test channels corresponding to the multiple pins to be tested in the form of channel groups through the driver layer, divides all test channels in each test channel group according to board type, and each type of test board corresponds to a target test channel. The target information of the parameter configuration is classified and transmitted according to the board type; the sub-channel group information and the broadcast instruction containing the target information are transmitted to each test board through the transport layer, and the test parameters are distributed to all types of boards at one time, thereby improving configuration efficiency; the test parameter configuration is executed in parallel by multiple test boards in the board layer, thereby solving the problem of low test parameter configuration efficiency of the chip to be tested in the related art, and converting the parameter configuration from serial configuration of each test channel to broadcast configuration and parallel configuration, thereby improving configuration efficiency.

[0165] In some embodiments, the target information includes test parameters and register addresses, and the board layer is used to: obtain channel identifiers of multiple test channels based on the received sub-channel group information; and write the test parameters into corresponding registers of corresponding test channels based on the channel identifiers and register addresses.

[0166] The test parameter configuration system of this embodiment obtains the corresponding test parameters and register addresses through the channel information of the target test channels corresponding to different types of test boards, and completes the parameter configuration of the test board of this type, so that the parameter configuration of the same pin to be tested can be compatible with different types of test boards, thereby improving the hardware environment adaptability of the test system; and different types of test boards can complete the automatic configuration of parameters without the operator performing additional settings, thereby improving the efficiency and automation of chip testing.

[0167] In some embodiments, the board layer includes multiple types of test boards, each of which includes a controller and multiple processing units, each of which corresponds to multiple test channels.

[0168] It should be noted that, for specific examples in this embodiment, reference may be made to the examples described in the above embodiments and optional implementation modes, and will not be repeated in this embodiment.

[0169] It should be understood that the specific embodiments described herein are only used to explain this application and are not used to limit it. Based on the embodiments provided in this application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0170] Obviously, the accompanying drawings are merely examples or embodiments of the present application. A person skilled in the art can also apply the present application to other similar situations based on these drawings without inventive effort. Furthermore, it is understandable that, although the work involved in this development process may be complex and lengthy, certain design, manufacturing, or production changes based on the technical content disclosed in this application are merely routine technical means for a person skilled in the art and should not be considered to constitute a deficiency in the disclosure of the present application.

[0171] The term "embodiment" as used in this application refers to specific features, structures, or characteristics described in conjunction with the embodiment that can be included in at least one embodiment of this application. The appearance of this phrase in various places in the specification does not necessarily mean that the embodiment is the same, nor does it mean that it is mutually exclusive with other embodiments and is independent or optional. It is understood, either explicitly or implicitly, by those skilled in the art that the embodiments described in this application can be combined with other embodiments when there is no conflict.

[0172] The above-described embodiments merely represent several implementation methods of the present application. While the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of patent protection. It should be noted that a person of ordinary skill in the art may make various modifications and improvements without departing from the spirit of the present application, and these modifications and improvements fall within the scope of protection of the present application. Therefore, the scope of protection of the present application shall be determined by the appended claims.

Claims

1. A test parameter configuration method, characterized in that: The method is applied to a test system, the test system including a host computer and multiple types of test boards communicatively connected to the host computer, the test boards including multiple test channels, and the method including: Acquire multiple channel objects corresponding to the pins to be tested, wherein the channel objects include channel identifiers and channel information of corresponding test channels; Generate test channel group information based on the pin to be tested, the test channel group information including a test channel group identifier and channel identifiers of a plurality of test channels included in the test channel group; Based on the test channel group information, generate sub-channel group information corresponding to each test board, and send the sub-channel group information to the corresponding test board; Traversing the test channel group, determining one or more target test channels of the test channel group, wherein the target test channels correspond to a board type of the test board; Target information is acquired based on the channel information in the channel objects of the one or more target test channels, and the target information is broadcasted to the test board corresponding to the board type, where the target information is used by the test board to execute test parameter configuration.

2. The method according to claim 1, characterized in that The target information includes test parameters and register addresses, and the steps of executing test parameter configuration on the test board include: Acquire channel identifiers of the plurality of test channels based on the received sub-channel group information; Based on the channel identifier and the register address, the test parameter is written into a corresponding register of a corresponding test channel.

3. The method according to claim 1 or 2, characterized in that Acquiring target information based on channel information in the channel objects of the one or more target test channels includes: The channel information includes the board type and test parameters of the target test channel, and a driver function is called based on the test parameters to obtain a register address corresponding to the test parameters; The board type, the test parameters, and the register address constitute the target information.

4. The method according to claim 2, characterized in that The test board includes a plurality of processing units, each processing unit corresponds to a plurality of test channels, and the step of writing the test parameters into a corresponding register of the corresponding test channel based on the channel identifier and the register address includes: Traversing each of the channel identifiers to determine the processing unit corresponding to the test channel; Writing the channel identifier corresponding to each processing unit into the corresponding group operation register; The test parameters are written into a corresponding register of a corresponding test channel based on the register address and the channel identifier in the group operation register.

5. The method according to claim 2, characterized in that Before sending the target information to the test board corresponding to the board type in a broadcasting manner, the method further includes: Traversing the parameter list, sequentially obtaining corresponding test parameters in the channel object of the target test channel based on each parameter type in the parameter list, and determining whether the test parameters are processing unit configuration parameters; When the test parameter is a configuration parameter of the processing unit, determining whether to use a broadcast mode for configuration based on a parameter type of the test parameter; If so, the target information is sent to the test board corresponding to the board type in a broadcast manner.

6. The method according to claim 1, characterized in that The channel information includes a board type, and traversing the test channel group to determine one or more target test channels of the test channel group, wherein the target test channels correspond to the board type of the test board, includes: Traverse each channel object corresponding to the test channel group to obtain the board type corresponding to the test channel; Determine whether the board type exists in the cache; if the board type does not exist, store the board type and the corresponding channel identifier in the cache; Repeat the above steps until the test channel group is completely traversed; The channel identifier of the target test channel and the corresponding board type are acquired based on the cache.

7. The method according to claim 1, characterized in that Before obtaining multiple channel objects corresponding to the pins to be tested, it also includes: Traverse the test channels and obtain channel objects corresponding to the test channels one by one; When the test channel corresponding to the channel object is enabled, the test parameters are saved to the channel object. The channel object corresponding to the test channel includes a plurality of test parameters, and the plurality of test parameters are parameter values corresponding to a plurality of parameter types.

8. The method according to claim 1, characterized in that The generating, based on the test channel group information, sub-channel group information corresponding to each test board and sending the sub-channel group information to the corresponding test board includes: Based on the test channel group information, the channel identifiers of the test channels in the test channel group are grouped to generate the sub-channel group information corresponding to each test board; Sending the sub-channel group information to the corresponding test board, the sub-channel group information including a test channel group identifier and a test board channel identifier, the test board channel identifier being a channel identifier belonging to the test board; Determining whether the test channel group identifier exists in a register of the test board; When the test channel group identifier does not exist, the test channel group identifier and the test board channel identifier are written into the register.

9. A test parameter configuration system, characterized in that: The test parameter configuration system is applied to a test system, which includes a host computer and multiple types of test boards communicatively connected to the host computer, wherein the test boards include multiple test channels. The test parameter configuration system includes: Software layer: used to obtain the pins to be tested corresponding to the test items; Driver layer: used to obtain multiple channel objects corresponding to the pins to be tested, the channel objects including the channel identifier and channel information of the test channels; based on the pins to be tested, generate test channel group information, the test channel group information including the test channel group identifier and the channel identifiers of the multiple test channels included in the test channel group; based on the test channel group information, generate sub-channel group information corresponding to each of the test boards; traverse the test channel group to determine one or more target test channels of the test channel group, the target test channels corresponding to the board type of the test board; obtain target information based on the channel information in the channel objects of the one or more target test channels, and send the target information to the test board corresponding to the board type in a broadcast manner, the target information is used by the test board to execute test parameter configuration; Transport layer: used to transmit the sub-channel group information corresponding to each test board and the broadcast instruction containing the target information to each test board; Board layer: used to perform test parameter configuration based on the target information.

10. The test parameter configuration system according to claim 9, characterized in that: The board layer includes multiple types of test boards, each of which includes a controller and multiple processing units, and each processing unit corresponds to multiple test channels.

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