Data monitoring module, data monitoring method and intelligent card testing equipment

Abstract

The invention provides a data monitoring module, a data monitoring method and intelligent card testing equipment, and the method comprises the steps: building a signal path for monitoring communication data between a to-be-tested intelligent card and a to-be-tested read-write module through a simulation intelligent card under the condition that the to-be-tested intelligent card is disposed in the data monitoring module; the signal acquisition unit acquires an original clock signal, an original reset signal and an original communication data signal generated when the to-be-tested smart card communicates with the to-be-tested read-write module based on the signal path; the signal processing unit is used for generating an underclocking clock signal, a standard reset signal and a standard communication data signal; and the output connection assembly is used for outputting the underclocking clock signal, the standard reset signal and the standard communication data signal to the intelligent card test equipment, so that the intelligent card test equipment restores the communication data. In the mode, the compatibility of the data monitoring module can be improved by establishing the monitoring path from the to-be-tested smart card to the to-be-tested read-write module, so that the accuracy of the smart card test equipment is improved.

Description

Technical Field

[0001] The present application relates to the field of smart card testing technology, and in particular to a smart data monitoring module, a data monitoring method and a smart card testing device. Background Art

[0002] With the widespread adoption of smart card technology, accurate capture and timing analysis of communication data between smart cards and reader / writer devices have become increasingly critical during R&D and testing. This is especially true when supporting smart cards with multiple voltage levels (such as Class A 5.0V, Class B 3.0V, and Class C 1.8V). Monitoring equipment must possess excellent voltage compatibility and data restoration capabilities to meet the demands of complex testing environments.

[0003] Currently, most monitoring devices on the market exist as standalone devices that often lack a unified architecture with the main control test platform. Furthermore, their connections to the reader / writer device under test and the smart card are non-standard, requiring the use of multiple adapter cables and intermediate modules. This type of architecture is not only complex in wiring and operation, but also subject to signal interference and poor contact, impacting the accuracy of monitoring data. Furthermore, some devices lack a unified level adaptation and frequency reduction mechanism for smart cards with varying voltage levels or high-frequency jitter signals, leading to data recovery failures or test blind spots. Summary of the Invention

[0004] In view of this, the purpose of this application is to provide a data monitoring module, a data monitoring method and a smart card testing device. By establishing a monitoring path from the smart card to be tested to the read-write module to be tested, standardized capture of communication data between multi-voltage level, multi-standard smart cards and read-write devices can be achieved, thereby improving the compatibility of the data monitoring module and enhancing the accuracy of the smart card testing equipment.

[0005] In the first aspect, the present invention provides a data monitoring module, comprising: an analog smart card, a signal acquisition unit, a signal processing unit and an output connection component connected in sequence; the analog smart card is connected to the read-write module to be tested; the output connection component is connected to an external smart card testing device; the analog smart card is used to establish a signal path for monitoring the communication data between the smart card to be tested and the read-write module to be tested when the smart card to be tested is set in the data monitoring module; the signal acquisition unit is used to obtain the original clock signal, original reset signal and original communication data signal generated when the smart card to be tested communicates with the read-write module to be tested based on the signal path; the signal processing unit is used to down-convert the original clock signal to generate a down-converted clock signal; the original reset signal and the original communication data signal are converted to generate a standard reset signal and a standard communication data signal; the output connection component is used to output the down-converted clock signal, the standard reset signal and the standard communication data signal to the smart card testing device, so that the smart card testing device can restore the communication data between the smart card to be tested and the read-write module to be tested.

[0006] In an optional embodiment, the smart card testing device includes a first smart card slot; the data monitoring module also includes a second smart card slot; the second smart card slot is respectively connected to the simulated smart card and the signal acquisition unit; the second smart card slot is used to install the smart card to be tested; the data monitoring module can be plugged into the first smart card slot through the output connection component; the simulated smart card can be pluggably connected to the third smart card slot of the read-write module to be tested.

[0007] In an optional embodiment, standard contact points that comply with preset smart card standards are arranged on the output connection component; and the data monitoring module is connected to the first smart card slot via the standard contact points.

[0008] In an optional embodiment, the signal processing unit includes a clock processing circuit; the clock processing circuit includes a connected three-state buffer and a divider; the divider is composed of a plurality of D-type flip-flops cascaded; the three-state buffer is connected to the signal acquisition unit; the output end of the divider is connected to the output connection component; the three-state buffer is used to level buffer the received original clock signal to generate a buffered original clock signal; the divider is used to perform frequency division of the buffered original clock signal at a preset multiple to generate a reduced-frequency clock signal, and output the reduced-frequency clock signal to the smart card testing device through the output connection component.

[0009] In an optional embodiment, the signal processing unit also includes a level conversion circuit; the level conversion circuit includes at least one buffer, the input end of the buffer is connected to the signal acquisition unit, and the output end of the buffer is connected to the output connection component; the buffer is used to perform level conversion on the received original reset signal to generate a standard reset signal, and / or perform level conversion on the original communication data signal to generate a standard communication data signal; the standard reset signal and the standard communication data signal are output to the smart card testing equipment through the output connection component; the smart card testing equipment is used to calculate the bit duration based on the reduced-frequency clock signal, determine the communication start time based on the standard reset signal, and decode the standard communication data signal based on the bit duration to restore the communication data between the smart card to be tested and the read-write module to be tested.

[0010] In an optional implementation, the preset input high level recognition range of the buffer is 1.5V to 5.0V.

[0011] In a second aspect, the present invention provides a data monitoring method, which is applied to the data monitoring module of any of the aforementioned embodiments; the method includes: establishing a signal path for monitoring the communication data between the smart card to be tested and the read-write module to be tested by simulating a smart card when the smart card to be tested is set in the data monitoring module; obtaining the original clock signal, original reset signal and original communication data signal generated when the smart card to be tested communicates with the read-write module to be tested based on the signal path by a signal acquisition unit; performing frequency reduction processing on the original clock signal by a signal processing unit to generate a frequency reduction clock signal; performing signal conversion on the original reset signal and the original communication data signal to generate a standard reset signal and a standard communication data signal; outputting the frequency reduction clock signal, standard reset signal and standard communication data signal to the smart card testing equipment through an output connection component, so that the smart card testing equipment can restore the communication data between the smart card to be tested and the read-write module to be tested.

[0012] In the third aspect, the present invention provides a smart card testing device, including a main control module; also including a data monitoring module of any of the above-mentioned embodiments; the main control module includes a first smart card slot; the data monitoring module includes a second smart card slot and an output connection component; the data monitoring module can be pluggably connected to the first smart card slot through the output connection component; the second smart card slot is used to install the smart card to be tested.

[0013] In an optional embodiment, the data monitoring module includes an analog smart card, which is suitable for inserting into the third smart card slot of the read-write module to be tested; the main control module also includes a contactless circuit; the first smart card slot is used to install a contact smart card; the contactless circuit is used to communicate with the contactless smart card; when the output connection component is not connected to the first smart card slot and the smart card to be tested is a contact smart card, the main control module is connected to the smart card to be tested through the first smart card slot; when the output connection component is not connected to the first smart card slot and the smart card to be tested is a contactless smart card, the main control module is communicated with the contactless smart card through the contactless circuit; when the output connection component is connected to the first smart card slot, the main control module receives the original communication signal output from the data monitoring module through the first smart card slot to monitor the communication data between the read-write module to be tested and the smart card to be tested.

[0014] In an optional embodiment, the main control module also includes a connected main control chip and a functional test module; the main control chip is configured to perform a preset functional test on the smart card to be tested through the functional test module when the smart card to be tested is set in the first smart card slot; the preset functional test includes at least one of an anti-removal test and a power consumption sampling test.

[0015] An embodiment of the present application provides a data monitoring module, a data monitoring method and a smart card testing device, comprising: an emulated smart card, a signal acquisition unit, a signal processing unit and an output connection component connected in sequence; the emulated smart card is connected to the read-write module to be tested; the output connection component is connected to the external smart card testing device; the emulated smart card is used to establish a signal path for monitoring the communication data between the smart card to be tested and the read-write module to be tested when the smart card to be tested is set in the data monitoring module; the signal acquisition unit is used to obtain the original clock signal, original reset signal and original communication data signal generated when the smart card to be tested communicates with the read-write module to be tested based on the signal path; the signal processing unit is used to down-convert the original clock signal to generate a down-converted clock signal; the original reset signal and the original communication data signal are converted to generate a standard reset signal and a standard communication data signal; the output connection component is used to output the down-converted clock signal, the standard reset signal and the standard communication data signal to the smart card testing device, so that the smart card testing device can restore the communication data between the smart card to be tested and the read-write module to be tested. In this method, by integrating the simulated smart card, signal acquisition unit, signal processing unit and output connection component in the data monitoring module, a monitoring signal path is formed from the read-write device to be tested to the smart card to be tested. This can achieve high-precision capture and standardized processing of the original signal in the communication process between the smart card to be tested and the read-write device, thereby effectively improving the integrity and decodability of the communication data, and further significantly improving the data monitoring capability and test reliability of the smart card test equipment in multi-type and multi-interface environments, meeting the comprehensive testing needs in complex R&D and testing applications.

[0016] Other features and advantages of the present application will be described in the following description, and in part will become apparent from the description or be understood by practicing the present application. The objectives and other advantages of the present application are realized and obtained by the structures particularly pointed out in the description, claims and drawings.

[0017] In order to make the above-mentioned objects, features and advantages of the present application more obvious and easy to understand, preferred embodiments are given below and described in detail with reference to the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the specific implementation methods of the present application or the technical solutions in the prior art, the following is a brief introduction to the drawings required for use in the specific implementation methods or the description of the prior art. Obviously, the drawings described below are some implementation methods of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0019] Figure 1 Schematic diagram of the data monitoring module provided in an embodiment of the present application;

[0020] Figure 2 Schematic diagram of the simulated smart card, output connection component, and second smart card slot of the data monitoring module provided in an embodiment of the present application;

[0021] Figure 3 A schematic diagram of a first smart card slot of a smart card testing device provided in an embodiment of the present application;

[0022] Figure 4 A schematic diagram of a clock processing circuit provided in an embodiment of the present application;

[0023] Figure 5 A schematic diagram of a level conversion circuit provided in an embodiment of the present application;

[0024] Figure 6 Flowchart of the data monitoring method provided in the embodiment of the present application;

[0025] Figure 7 A schematic diagram of the main control chip of the main control module provided in an embodiment of the present application;

[0026] Figure 8 A schematic diagram of a contactless circuit of a main control module provided in an embodiment of the present application;

[0027] Figure 9 A schematic diagram of a power switch circuit of a main control module provided in an embodiment of the present application;

[0028] Figure 10 Schematic diagram of the signal amplification circuit of the main control module provided in an embodiment of the present application.

[0029] Icon: 1-Signal acquisition unit; 2-Signal processing unit; 3-Reader / writer module to be tested; 4-Smart card to be tested; 5-Smart card testing equipment. DETAILED DESCRIPTION

[0030] To make the purpose, technical solutions, and advantages of the embodiments of this application more clear, the technical solutions of this application will be clearly and completely described below in conjunction with the accompanying drawings. Obviously, the embodiments described are part of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of this application.

[0031] To facilitate understanding of this embodiment, the embodiments of this application are described in detail below.

[0032] Example 1:

[0033] Figure 1 Schematic diagram of the data monitoring module provided in an embodiment of the present application.

[0034] Reference Figure 1 and Figure 2 The data monitoring module includes: a simulated smart card SIM3, a signal acquisition unit 1, a signal processing unit 2 and an output connection component J1 connected in sequence; the simulated smart card SIM3 is connected to the read-write module 3 to be tested; the output connection component J1 is connected to the external smart card test device 5.

[0035] The simulated smart card SIM3 is used to establish a signal path for monitoring the communication data between the smart card 4 to be tested and the read-write module 3 to be tested when the smart card 4 to be tested is set in the data monitoring module.

[0036] Here, the smart card 4 to be tested refers to a smart card that is inserted into the data monitoring module, participates in communications and is monitored, including but not limited to: financial IC cards (such as bank cards), social security cards, mobile communication SIM cards and transportation cards.

[0037] The reader / writer module 3 under test refers to the smart card reader / writer device being tested during the test process, including but not limited to the following: bank IC card readers / writers, social security card readers / writers, SIM card readers / writers, transportation card ticket machines or recharge terminals, and commercial IC card payment terminals such as POS machines.

[0038] The simulated smart card SIM3 is the interface component that establishes a physical and electrical connection between the data monitoring module and the read / write module 3 under test. One end of the simulated smart card SIM3 is constructed in the physical appearance of a standard smart card (for example, conforming to the size and appearance of an ID-1 type IC card) and has contact points that comply with standards such as ISO7816, allowing it to be pluggably connected to the smart card slot of the read / write module 3 under test. Structurally, the simulated smart card SIM3 can be a small PCB probe board that is connected to the main circuit board of the data monitoring module via a flexible cable, leading out contact signals such as power, ground, clock, reset, and data I / O of the read / write module 3 under test.

[0039] When a smart card 4 under test is placed in the second smart card slot SIM2 or CARD2 of the data monitoring module, the simulated smart card SIM3 works together with the second smart card slot SIM2 or CARD2 to establish a complete signal path for monitoring bidirectional data communication between the smart card 4 under test and the read / write module 3 under test. This means that signals emitted by the read / write module 3 under test will enter the data monitoring module through the simulated smart card SIM3 and be transmitted to the smart card 4 under test. Similarly, response signals from the smart card 4 under test will also pass through this signal path and be transmitted back to the read / write module 3 under test via the simulated smart card SIM3.

[0040] Among them, reference Figure 2 The second smart card slot can accommodate IC cards of different sizes on the market. SIM2 is suitable for small-size cards, and CARD2 is suitable for large-size cards.

[0041] By simulating the relay and branch structure of the smart card SIM3, a bypass monitoring path is established between the reader and the smart card. The signal acquisition unit 1 is used to achieve non-intrusive, synchronous, and complete communication data capture, ensuring that the test process does not affect the original communication process, while ensuring the real-time and accuracy of data monitoring.

[0042] The signal acquisition unit 1 is used to acquire, based on a signal path, an original clock signal, an original reset signal and an original communication data signal generated when the smart card 4 to be tested communicates with the read / write module 3 to be tested.

[0043] Here, the signal acquisition unit 1 is set at the key node of the above-mentioned signal path, and its input end is connected to the signal line led out of the simulated smart card SIM3 and the corresponding signal line of the second smart card slot SIM2 or CARD2. Based on the established signal path, the signal acquisition unit 1 acquires in real time the various original electrical signals generated when the smart card 4 to be tested communicates with the read-write module 3 to be tested. The original signal specifically includes: the original clock signal C_CLK provided by the read-write module 3 to be tested, the original reset signal C_RST issued by the read-write module 3 to be tested, and the original communication data signal IO_Port transmitted bidirectionally between the read-write module 3 to be tested and the smart card 4 to be tested. In order to ensure the integrity and anti-interference of the signal, the input end of the signal acquisition unit 1 can be integrated with a preliminary signal buffer or protection circuit.

[0044] The signal processing unit 2 is used to perform frequency reduction processing on the original clock signal to generate a frequency-reduced clock signal; and perform signal conversion on the original reset signal and the original communication data signal to generate a standard reset signal and a standard communication data signal.

[0045] Here, the signal processing unit 2 is connected to the output end of the signal acquisition unit 1, receives the acquired original clock signal, original reset signal, and original communication data signal, and performs special processing on these signals to optimize their characteristics to facilitate subsequent accurate decoding by the external smart card test equipment 5. The signal processing unit 2 mainly performs the following two processes:

[0046] 1. Perform frequency reduction processing on the original clock signal to generate a frequency-reduced clock signal.

[0047] To address the issue of direct measurement errors due to the high frequency or jitter of the original clock signal, the signal processing unit 2 is internally provided with a clock processing circuit. This circuit includes a tri-state buffer U5, which buffers the original clock signal and then divides the buffered original clock signal by a fixed factor using a frequency divider. The resulting reduced-frequency clock signal DT_CLK has a significantly longer period, enabling the external smart card test equipment 5 to measure its period with greater relative accuracy, thereby precisely calculating the bit duration ETU of the original communication.

[0048] 2. Perform signal conversion on the original reset signal and the original communication data signal to generate a standard reset signal and a standard communication data signal.

[0049] Considering that the smart card 4 and the read / write module 3 under test may operate under different voltage logic standards (e.g., 5.0V for Class A, 3.0V for Class B, and 1.8V for Class C), a level conversion circuit is internally provided in the signal processing unit 2. This level conversion circuit utilizes a buffer with a wide input high-level recognition range to perform level-compatible processing and drive on the original reset signal and the original communication data signal. The processed standard reset signal and standard communication data signal have a unified, standardized logic level that is easily recognized by the external smart card test equipment 5, thus resolving the compatibility issue with signals from different types of smart cards.

[0050] The output connection component J1 is used to output the reduced-frequency clock signal, the standard reset signal and the standard communication data signal to the smart card test device 5 so that the smart card test device 5 can restore the communication data between the smart card 4 to be tested and the read / write module 3 to be tested.

[0051] Here, the output connection component J1 is the physical interface for connecting the data monitoring module to the external smart card test device 5. Structurally, the output connection component J1 can be designed in the form of a standard IC card edge connector (such as a standard IC1 type IC card with a width of 54mm and a thickness of 0.8mm, and the physical interface is also designed as an IC card contact in accordance with the ISO1816-1 standard). The output connection component J1 is connected to the output end of the signal processing unit 2 and is responsible for outputting the processed down-clock signal, standard reset signal, and standard communication data signal to the smart card test device 5. These optimized signals can ensure that the smart card test device 5 obtains higher accuracy and reliability when performing subsequent communication data decoding and protocol analysis, thereby accurately restoring the original communication data between the smart card 4 to be tested and the read-write module 3 to be tested.

[0052] Through the above-mentioned structure and functional design, the data monitoring module of the embodiment of the present invention can effectively intervene in the communication between the smart card 4 to be tested and the read-write module 3 to be tested. By performing high-precision frequency reduction processing and wide-range level compatible conversion on key signals, it provides high-quality monitoring signals for external testing equipment, significantly improving the accuracy of smart card communication data monitoring and the scope of applicability to different types of smart cards.

[0053] In one embodiment, referring to Figure 2 and Figure 3 The smart card testing device 5 includes a first smart card slot CARD1; the data monitoring module also includes a second smart card slot SIM2 or CARD2; the second smart card slot SIM2 or CARD2 is connected to the simulated smart card SIM3 and the signal acquisition unit 1 respectively.

[0054] Here, the first smart card slot CARD1 is located on the external smart card test device 5 and its structure complies with the size and contact arrangement requirements of the ISO7816 or ID-1 standard contact IC card slot. The first smart card slot CARD1 is used to electrically connect to the output connection component J1 in the data monitoring module.

[0055] Through the design of standard slots, testers can easily and quickly plug and replace data monitoring modules, improving the modularity and maintainability of test equipment.

[0056] The second smart card slot SIM2 or CARD2 is located in the data monitoring module and is designed to comply with ISO7816 standards. It is used to install the smart card 4 to be tested so that the smart card 4 to be tested can communicate with the read / write device to be tested through the data monitoring module.

[0057] The second smart card slot SIM2 or CARD2 is used to install the smart card 4 to be tested.

[0058] Here, the signal pins of the second smart card slot SIM2 or CARD2 are inside the data monitoring module and are electrically connected to the corresponding signal pins of the simulated smart card SIM3 and the input end of the signal acquisition unit 1. This connection method ensures that when the simulated smart card SIM3 captures a signal from the read-write module 3 to be tested, or when the smart card 4 to be tested generates a response signal itself, these signals can be sensed by the signal acquisition unit 1. Specifically, the clock, reset and data signals emitted by the read-write module 3 to be tested will enter the data monitoring module through the simulated smart card SIM3, with one part supplied to the smart card 4 to be tested in the second smart card slot SIM2 or CARD2, and the other part captured by the signal acquisition unit 1. The response data signal generated by the smart card 4 to be tested will also be captured by the signal acquisition unit 1 through the pins of the second smart card slot SIM2 or CARD2, and at the same time transmitted back to the read-write module 3 to be tested through the simulated smart card SIM3.

[0059] The data monitoring module can be plugged into the first smart card slot CARD1 through the output connection component J1.

[0060] Here, the data monitoring module is pluggably connected to the first smart card slot CARD1 of the smart card testing device 5 via its output connector J1. Output connector J1 is equipped with standard contacts that conform to the pre-set smart card standard; the data monitoring module connects to the first smart card slot CARD1 via these standard contacts. The data monitoring module can be easily inserted into the first smart card slot CARD1 of the smart card testing device 5 like a regular IC card, establishing a secure electrical connection.

[0061] The simulated smart card SIM3 can be pluggably connected to the third smart card slot of the read / write module 3 to be tested.

[0062] Here, the simulated smart card SIM3 can be pluggably connected to the third smart card slot of the read / write module 3 under test. The third smart card slot is the same slot on the read / write module 3 under test that is originally used to insert a regular IC card. By inserting the simulated smart card SIM3 into the slot of the read / write module 3 under test, the data monitoring module successfully intervenes in the communication link between the read / write module 3 under test and the smart card 4 under test.

[0063] The data monitoring module in the embodiment of the present application can be easily integrated into the test environment. Its second smart card slot SIM2 or CARD2 is used to fix the smart card 4 to be tested, the simulated smart card SIM3 is used to connect the read-write module 3 to be tested, and the output connection component J1 is used to communicate with the smart card test equipment 5, together forming a complete signal monitoring path and data transmission link.

[0064] In one embodiment, referring to Figure 4 The signal processing unit 2 includes a clock processing circuit; the clock processing circuit includes a connected three-state buffer U5U5 and a frequency divider; the frequency divider (U1-U4) is composed of a plurality of D-type flip-flops cascaded; the three-state buffer U5 is connected to the signal acquisition unit 1; the output end of the frequency divider is connected to the output connection component J1.

[0065] Here, the clock processing circuit is used to accurately process the original clock signal to generate a stable frequency-reduced clock signal that is easy to be analyzed by the external smart card test equipment 5 .

[0066] The tri-state buffer U5 is used to perform level buffering on the received original clock signal to generate a buffered original clock signal.

[0067] Here, the input of tri-state buffer U5 is connected to signal acquisition unit 1 to receive the original clock signal C_CLK obtained from the signal path. The main function of tri-state buffer U5 is to level-buffer the received original clock signal. This buffering process can enhance the clock signal's driving capability, improve the signal waveform, or achieve signal isolation, thereby generating a buffered original clock signal, providing a stable, high-quality signal source for subsequent frequency division processing. The enable terminal of tri-state buffer U5 can be controlled as needed to selectively connect or disconnect the clock signal path.

[0068] The frequency divider is used to divide the buffered original clock signal by a preset frequency to generate a reduced-frequency clock signal, and output the reduced-frequency clock signal to the smart card test device 5 through the output connection component J1.

[0069] Here, the input end of the frequency divider is connected to the output end of the tri-state buffer U5 to receive the buffered original clock signal. The frequency divider is composed of a plurality of D-type flip-flops connected in cascade.

[0070] Specifically, refer to Figure 4 Using four 74HC74 dual D-type flip-flop chips (U1, U2, U3, and U4), these eight D-type flip-flops are configured in a serially cascaded divide-by-two structure, forming a hardware frequency divider with a total frequency division ratio of 256 (2 to the power of 8). Each D-type flip-flop connects its Q output to the clock input of the next D-type flip-flop, halving the frequency step by step.

[0071] The frequency divider divides the buffered original clock signal by a preset factor (e.g., 256) to generate a down-clocked clock signal DT_CLK. This down-clocked clock signal has a significantly lower frequency than the original clock signal, and its period is correspondingly lengthened. This reduces the relative error in the external smart card test device 5's period measurement to calculate the bit duration, thereby improving measurement accuracy.

[0072] The output end of the frequency divider, that is, the port for outputting the frequency-reduced clock signal, is connected to the output connection component J1 of the data monitoring module. Through the output connection component J1, the frequency-reduced clock signal is finally output to the smart card test device 5.

[0073] Through the clock processing circuit composed of the tri-state buffer U5 and the multi-stage D-type flip-flop frequency divider, the data monitoring module of the present application can effectively and accurately pre-process the captured original clock signal.

[0074] In one embodiment, referring to Figure 5The signal processing unit 2 further includes a level conversion circuit; the level conversion circuit includes at least one buffer (U6 and U7), the input end of the buffer is connected to the signal acquisition unit 1, and the output end of the buffer is connected to the output connection component J1.

[0075] Here, the level conversion circuit is used to process the original reset signal and original communication data signal received from the signal acquisition unit 1 to ensure that the logic levels of these signals can be correctly identified and processed by the subsequent smart card testing equipment 5, thereby achieving wide compatibility with smart card communications of different voltage levels.

[0076] The buffer is used to perform level conversion on the received original reset signal to generate a standard reset signal, and / or perform level conversion on the original communication data signal to generate a standard communication data signal; and output the standard reset signal and standard communication data signal to the smart card test device 5 through the output connection component J1.

[0077] Here, the level conversion circuit includes at least one buffer. In a specific implementation, separate buffers can be provided for the original reset signal and the original communication data signal. Specifically, a tri-state buffer U7 of the SN74LV1T34 model is used to process the original reset signal C_RST, and another tri-state buffer U6 of the same model is used to process the original communication data signal IO_Port.

[0078] The input end of each buffer is connected to the signal acquisition unit 1 for receiving the original reset signal and the original communication data signal acquired from the signal path. The output end of each buffer is connected to the output connection component J1 of the data monitoring module.

[0079] The buffer is used to perform level conversion on the received original reset signal to generate a standard reset signal, and / or to perform level conversion on the original communication data signal to generate a standard communication data signal. Level conversion mainly refers to level adaptation and buffer drive to ensure that the output signal has a unified, standard logic level characteristic and has sufficient drive capability. The buffer's preset input high level recognition range is 1.5V to 5.0V, which enables the data monitoring module to be compatible with signals from smart cards with different operating voltage levels such as Class A (5.0V), Class B (3.0V) and Class C (1.8V).

[0080] The standard reset signal DT_RST and the standard communication data signal DT_IO generated after processing are output to the smart card test device 5 through the output connection component J1.

[0081] The smart card testing device 5 is used to calculate the bit duration based on the reduced-frequency clock signal, determine the communication start time based on the standard reset signal, and decode the standard communication data signal based on the bit duration to restore the communication data between the smart card 4 to be tested and the read-write module 3 to be tested.

[0082] Here, the smart card testing device 5 will be used to calculate the bit duration of the communication based on the down-converted clock signal obtained from the clock processing circuit, determine the start time of the communication based on the received standard reset signal, and decode the standard communication data signal based on the accurately calculated bit duration to accurately restore the original communication data between the smart card 4 to be tested and the read-write module 3 to be tested.

[0083] Through the level conversion circuit, the data monitoring module of the present application can not only accurately process the clock signal, but also effectively process the reset and data signals, ensuring wide compatibility with communication monitoring of various types of smart cards.

[0084] An embodiment of the present application provides a data monitoring module, comprising: an analog smart card, a signal acquisition unit, a signal processing unit and an output connection component connected in sequence; the analog smart card is connected to the read-write module to be tested; the output connection component is connected to an external smart card testing device; the analog smart card is used to establish a signal path for monitoring the communication data between the smart card to be tested and the read-write module to be tested when the smart card to be tested is set in the data monitoring module; the signal acquisition unit is used to obtain the original clock signal, original reset signal and original communication data signal generated when the smart card to be tested communicates with the read-write module to be tested based on the signal path; the signal processing unit is used to down-convert the original clock signal to generate a down-converted clock signal; the original reset signal and the original communication data signal are converted to generate a standard reset signal and a standard communication data signal; the output connection component is used to output the down-converted clock signal, the standard reset signal and the standard communication data signal to the smart card testing device, so that the smart card testing device can restore the communication data between the smart card to be tested and the read-write module to be tested. In this method, by integrating the simulated smart card, signal acquisition unit, signal processing unit and output connection component in the data monitoring module, a monitoring signal path is formed from the read-write device to the smart card to be tested. This can achieve high-precision capture and standardized processing of the original signal during the communication process between the smart card to be tested and the read-write device, thereby effectively improving the integrity and decodability of the communication data, and further significantly improving the data monitoring capability and test reliability of the smart card test equipment in a multi-type, multi-interface environment, meeting the comprehensive testing needs in complex R&D and testing applications. In this method, the communication link between the smart card to be tested and the read-write module to be tested can be conveniently and reliably intervened, thereby accurately capturing and processing the original communication signal, and then providing the external smart card test equipment with high-quality monitoring signals suitable for smart cards of various voltage types, significantly improving the accuracy of communication data restoration and the wide applicability of monitoring.

[0085] Example 2:

[0086] Figure 6 Flowchart of the data monitoring method provided in the embodiment of the present application.

[0087] Reference Figure 6 , the data monitoring method is applied to the above-mentioned data monitoring module; the method includes:

[0088] Step S101 , by simulating a smart card and in the case where the smart card to be tested is set in a data monitoring module, a signal path for monitoring communication data between the smart card to be tested and the read / write module to be tested is established.

[0089] Here, by simulating a smart card, when the smart card to be tested is set in the data monitoring module, a signal path for monitoring the communication data between the smart card to be tested and the read-write module to be tested is established.

[0090] Specifically, the smart card to be tested is first installed into the second smart card slot of the data monitoring module. Then, the simulated smart card of the data monitoring module is pluggably connected to the third smart card slot of the read / write module to be tested. Simultaneously, the data monitoring module is connected to the first smart card slot of an external smart card test device via its output connection assembly.

[0091] Through this physical connection, the simulated smart card serves as the interface between the data monitoring module and the read / write module under test, while the second smart card slot is connected to the smart card under test. Circuitry within the data monitoring module connects the contact signals of the simulated smart card with the corresponding contact signals of the second smart card slot, thus forming a complete, monitorable signal path between the read / write module under test and the smart card under test. This signal path carries all electrical signals exchanged between the two.

[0092] Step S102: The signal acquisition unit acquires, based on the signal path, an original clock signal, an original reset signal, and an original communication data signal generated when the smart card to be tested communicates with the read / write module to be tested.

[0093] Here, after the signal path is established, the method enters the signal acquisition phase. The signal acquisition unit acquires the original clock signal, original reset signal and original communication data signal generated when the smart card under test communicates with the read / write module under test based on the signal path.

[0094] When the read / write module to be tested begins to communicate with the smart card to be tested, which is set in the second smart card slot of the data monitoring module, a series of electrical signals are generated between them. The signal acquisition unit captures these original signals flowing through the signal path in real time. These signals include: Original clock signal: usually provided by the read / write module to be tested, used to synchronize the communication between the two parties. Original reset signal: usually issued by the read / write module to be tested, used to initialize the smart card to be tested. Original communication data signal: the actual data stream transmitted bidirectionally between the read / write module to be tested and the smart card to be tested, expressed as voltage pulses.

[0095] Step S103 , down-converting the original clock signal through the signal processing unit to generate a down-converted clock signal; performing signal conversion on the original reset signal and the original communication data signal to generate a standard reset signal and a standard communication data signal.

[0096] Here, after the original communication signal is obtained, the original clock signal is frequency-reduced by the signal processing unit to generate a frequency-reduced clock signal; and the original reset signal and the original communication data signal are converted to generate a standard reset signal and a standard communication data signal.

[0097] The frequency-reduced clock signal, standard reset signal and standard communication data signal are output to the smart card test equipment through the output connection component, so that the smart card test equipment can restore the communication data between the smart card to be tested and the read-write module to be tested.

[0098] Step S104 : outputting the frequency-reduced clock signal, the standard reset signal, and the standard communication data signal to the smart card test equipment through the output connection component, so that the smart card test equipment can restore the communication data between the smart card to be tested and the read / write module to be tested.

[0099] The data monitoring module's output connector transmits the reduced-frequency clock signal, standard reset signal, and standard communication data signal generated by the signal processing unit to an externally connected smart card test device. Upon receiving the signals, the smart card test device uses the precise reduced-frequency clock signal to calculate the original communication bit duration. It then uses the standard reset signal to determine the communication start and synchronization points. Furthermore, it accurately decodes the standard communication data signal based on the bit duration, thereby fully reconstructing the actual communication content between the smart card under test and the reader / writer module under test.

[0100] An embodiment of the present application provides a data monitoring method, in which the data monitoring module can effectively establish a monitoring link, accurately capture and optimize the processing of key signals in the communication process, and provide a reliable data basis for external testing equipment, thereby achieving high-fidelity monitoring of smart card communications.

[0101] Example 3:

[0102] The smart card test equipment includes a main control module; it also includes the above-mentioned data monitoring module; refer to Figure 3 , the main control module includes a first smart card slot CARD1; refer to Figure 2 The data monitoring module includes a second smart card slot SIM2 or CARD2 and an output connection component J1.

[0103] The data monitoring module can be pluggably connected to the first smart card slot CARD1 through the output connection component J1; the second smart card slot SIM2 or CARD2 is used to install the smart card to be tested.

[0104] Here, the main control module is used to execute various test instructions, process data, and communicate with external devices (such as a host computer). The main control module physically includes a first smart card slot, CARD1, designed as an IC card holder that complies with international standards, such as an ID-1 semi-insertable contact IC card holder. This first smart card slot is not only used to directly read and write smart cards, power them, reset them, and perform functional tests, but also serves as an interface for connecting to the data monitoring module.

[0105] The data monitoring module is a key component for monitoring communication data. It includes a second smart card slot (SIM2 or CARD2) for installing the smart card under test, an analog smart card interface for connecting to the read / write module under test, and an output connection component J1.

[0106] The data monitoring module is pluggable and connectable to the main control module's first smart card slot, CARD1, via its output connector, J1. When data monitoring is required, the data monitoring module can be inserted into the main control module's first smart card slot like a standard IC card. This pluggable connection establishes a stable electrical connection between the data monitoring module and the main control module, enabling communication signals captured and processed by the data monitoring module to be efficiently transmitted to the main control module for further analysis and restoration.

[0107] At the same time, the second smart card slot SIM2 or CARD2 on the data monitoring module is used to install the smart card to be tested. When performing data monitoring operation, the user inserts the smart card whose communication with the read / write module to be tested needs to be monitored into this second smart card slot SIM2 or CARD2.

[0108] Through this combined structure of the main control module and the data monitoring module, and the convenient connection between them through the first smart card slot CARD1 and the output connection component J1, the smart card testing equipment can not only independently perform various functional tests on the smart card (when the data monitoring module is not connected and the smart card to be tested is directly inserted into the first smart card slot CARD1), but can also effectively monitor and analyze the communication data between the smart card to be tested and the external read-write module after connecting to the data monitoring module, thereby providing an integrated and multi-functional smart card testing solution.

[0109] In one embodiment, the data monitoring module includes a simulated smart card SIM3, which is suitable for being inserted into the third smart card slot of the read / write module to be tested.

[0110] The main control module further includes a contactless circuit; the first smart card slot CARD1 is used to install a contact smart card; and the contactless circuit is used to communicate with the contactless smart card.

[0111] When the output connection component is not connected to the first smart card slot CARD1 and the smart card to be tested is a contact smart card, the main control module is connected to the smart card to be tested through the first smart card slot CARD1; when the output connection component J1 is not connected to the first smart card slot CARD1 and the smart card to be tested is a contactless smart card, the main control module is connected to the contactless smart card through a contactless circuit; when the output connection component J1 is connected to the first smart card slot CARD1, the main control module receives the original communication signal output from the data monitoring module through the first smart card slot CARD1 to monitor the communication data between the read-write module to be tested and the smart card to be tested.

[0112] Here, in order to support the testing of different types of smart cards, the main control module also includes a contactless circuit, refer to Figure 8 The contactless circuit enables the main control module to communicate with the contactless smart card. Specifically, the contactless circuit includes the main control chip U11 ( Figure 7 ) SPI interface, contactless baseband chip U13, and antennas (TX1 and TX2) connected to the baseband chip. The main control chip U11 exchanges data with the baseband chip U13 via the SPI bus (RC523_NSS, RC523_SCK, RC523_MISO, and RC523_MOSI signal lines). The baseband chip U13 drives the antenna to emit electromagnetic waves, performing near-field coupling communication with the contactless smart card, following contactless communication standards such as ISO14443.

[0113] Combined with the first smart card slot CARD1 of the main control module and the contactless circuit, the smart card test equipment has dual-mode direct testing capabilities.

[0114] When the data monitoring module's output connector J1 is not connected to the first smart card slot CARD1 and the smart card under test is a contactless smart card, the main control module connects to the smart card under test via the first smart card slot CARD1. In this mode, the main control module can directly read and write, power, reset, and perform various functional tests on the contactless smart card inserted into the first smart card slot CARD1.

[0115] When the data monitoring module's output connector J1 is not connected to the first smart card slot CARD1 and the smart card under test is a contactless smart card, the main control module communicates with the contactless smart card via the contactless circuit. In this mode, the main control module communicates with the contactless smart card placed in the sensing area through its contactless circuit to perform contactless-related tests.

[0116] When the data monitoring module's output connector J1 is connected to the first smart card slot CARD1, the main control module receives signals from the data monitoring module through the first smart card slot CARD1 to monitor the communication data between the read / write module under test and the smart card under test. In this mode, the main control module's first smart card slot CARD1 serves as the signal input interface for the data monitoring module. The data monitoring module intervenes between the read / write module under test and the smart card under test, capturing and processing the raw communication signals between them, and then outputting the processed signals to the main control module. After receiving these signals, the main control module can decode and analyze them to restore the complete communication content between the two, thus realizing the data monitoring function.

[0117] Through the configuration of the above-mentioned structure and working mode, the smart card testing device provided in the embodiment of the present application can not only be used as an independent testing tool to perform direct functional testing on contact and contactless smart cards, but can also be transformed into an accurate communication data monitoring device by connecting to a data monitoring module, thereby improving the efficiency of smart card research and development, debugging and fault analysis.

[0118] In one embodiment, the main control module further includes a connected main control chip U11 and a function test module.

[0119] The main control chip U11 is configured to perform a preset functional test on the smart card to be tested through the functional test module when the smart card to be tested is set in the first smart card slot CARD1; the preset functional test includes at least one of an anti-removal test and a power consumption sampling test.

[0120] Here, the functional test module integrates the hardware circuits required to perform specific physical or electrical characteristic tests.

[0121] The main control chip U11 is configured to perform a preset functional test on the smart card under test through the function test module when the smart card under test is directly set in the first smart card slot CARD1 of the main control module (ie, not connected through the data monitoring module).

[0122] The preset functional test may specifically include at least one of an anti-unplug test and a power consumption sampling test.

[0123] Anti-unplug test: The functional test module contains a power control circuit for implementing the anti-unplug test. This power control circuit is controlled by the main control chip.

[0124] For contact smart cards, refer to Figure 9The main control chip U11 uses control signals to turn the power switch circuit (including 2.0V linear regulator U15 and PNP transistor Q1) on and off, thereby precisely controlling the power supply to the smart card under test in the first smart card slot. By suddenly cutting power at a specific moment during a simulated transaction or data read / write process, the user can simulate accidental card removal, thereby testing the data integrity of the smart card and its application, as well as the system's fault tolerance.

[0125] For contactless smart cards, refer to Figure 8 The main control chip U11 can control the on / off state of a P-type MOS transistor Q5 through a control signal, thereby controlling the emission of electromagnetic waves from the baseband chip antenna in the contactless circuit. By suddenly stopping the emission of electromagnetic waves, the scenario of a contactless smart card being removed from the sensing field can be simulated, thus implementing a contactless anti-removal test.

[0126] Power consumption sampling test (primarily for contactless smart cards): The functional test module includes a signal amplification circuit for implementing contactless smart card power consumption testing. The signal amplification circuit is connected to the analog-to-digital conversion interface of the main control chip U11.

[0127] Reference Figure 9 A sampling resistor R3 (10 ohm, 1% precision resistor) is connected in series in the ground path of the first smart card slot CARD1. When the smart card to be tested is working, the current it consumes will generate a small voltage drop on the sampling resistor.

[0128] Reference Figure 10 A signal amplification circuit (composed of resistors R36, R37 and an operational amplifier U18) is connected to both ends of the sampling resistor to amplify the collected weak voltage drop signal PD_Point by a specific multiple (eg, approximately 19 times).

[0129] The amplified voltage signal AD_IN is output to the AD conversion module integrated into the main control chip U11. The main control chip U11 samples this voltage signal through the AD conversion module. Based on the sampled value, the known sampling resistor value, and the amplification factor, it calculates the instantaneous current of the smart card 4 under test during operation. Furthermore, it calculates the instantaneous power consumption based on the operating voltage. Through continuous sampling, a power consumption curve for the smart card under different operations can be plotted.

[0130] By integrating the above-mentioned functional test modules and using the main control chip for precise control and data acquisition, the smart card testing device provided in the embodiment of the present application can perform various key functional tests on the directly connected smart card to be tested, including anti-removal test and power consumption sampling test, thereby comprehensively evaluating the electrical characteristics and stability of the smart card.

[0131] The computer program product provided in the embodiments of the present application includes a computer-readable storage medium storing program code. The instructions included in the program code can be used to execute the methods described in the previous method embodiments. For specific implementation, please refer to the method embodiments and will not be repeated here.

[0132] Those skilled in the art will clearly understand that, for the convenience and brevity of description, the specific working processes of the above-described systems and devices can refer to the corresponding processes in the aforementioned method embodiments and will not be repeated here.

[0133] In addition, in the description of the embodiments of this application, unless otherwise specified or limited, the terms "installed," "connected," and "connected" should be understood in a broad sense. For example, they can refer to fixed connections, detachable connections, or integral connections; they can refer to mechanical connections or electrical connections; they can refer to direct connections or indirect connections through an intermediate medium; and they can refer to internal connections between two components. Those skilled in the art will understand the specific meanings of the above terms in this application based on the specific circumstances.

[0134] In the description of this application, it should be noted that the terms "center," "upper," "lower," "left," "right," "vertical," "horizontal," "inner," and "outer," etc., indicating orientations or positional relationships, are based on the orientations or positional relationships shown in the accompanying drawings and are intended solely to facilitate the description of this application and simplify the description. They do not indicate or imply that the devices or components referred to must have a specific orientation, be constructed, or operate in a specific orientation. Therefore, they should not be construed as limitations on this application. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and should not be construed as indicating or implying relative importance.

[0135] Finally, it should be noted that the above-described embodiments are only specific implementation methods of the present application, which are used to illustrate the technical solutions of the present application, rather than to limit them. The scope of protection of the present application is not limited thereto. Although the present application has been described in detail with reference to the above-described embodiments, those skilled in the art should understand that any person skilled in the art can modify or easily conceive of changes to the technical solutions described in the above-described embodiments within the technical scope disclosed in the present application, or perform equivalent replacements for some of the technical features thereof. Such modifications, changes, or replacements do not deviate from the spirit and scope of the technical solutions of the embodiments of the present application, and should be included in the scope of protection of the present application. Therefore, the scope of protection of the present application shall be based on the scope of protection of the claims.

Claims

1. A data monitoring module, characterized in that: include: A simulated smart card, a signal acquisition unit, a signal processing unit and an output connection component are connected in sequence; the simulated smart card is connected to the read / write module to be tested; the output connection component is connected to an external smart card test device; The simulated smart card is used to establish a signal path for monitoring communication data between the smart card to be tested and the read-write module to be tested when the smart card to be tested is set in the data monitoring module; The signal acquisition unit is configured to acquire, based on the signal path, an original clock signal, an original reset signal, and an original communication data signal generated when the smart card to be tested communicates with the read / write module to be tested; The signal processing unit is configured to perform frequency reduction processing on the original clock signal to generate a frequency-reduced clock signal; and perform signal conversion on the original reset signal and the original communication data signal to generate a standard reset signal and a standard communication data signal; The output connection component is used to output the reduced-frequency clock signal, the standard reset signal and the standard communication data signal to the smart card testing device, so that the smart card testing device can restore the communication data between the smart card to be tested and the read-write module to be tested.

2. The data monitoring module according to claim 1, characterized in that: The smart card testing device includes a first smart card slot; the data monitoring module also includes a second smart card slot; the second smart card slot is connected to the simulated smart card and the signal acquisition unit respectively; The second smart card slot is used to install the smart card to be tested; The data monitoring module can be plugged into the first smart card slot through the output connection component; The simulated smart card can be pluggably connected to the third smart card slot of the read-write module to be tested.

3. The data monitoring module according to claim 2, characterized in that: The output connection component is provided with standard contact points that comply with preset smart card standards; the data monitoring module is connected to the first smart card slot via the standard contact points.

4. The data monitoring module according to claim 1, characterized in that: The signal processing unit includes a clock processing circuit; the clock processing circuit includes a connected tri-state buffer and a frequency divider; the frequency divider is composed of a plurality of cascaded D-type flip-flops; the tri-state buffer is connected to the signal acquisition unit; the output end of the frequency divider is connected to the output connection component; The tri-state buffer is used to perform level buffering on the received original clock signal to generate a buffered original clock signal; The frequency divider is used to perform frequency division of the buffered original clock signal at a preset rate to generate the reduced-frequency clock signal, and output the reduced-frequency clock signal to the smart card testing device through the output connection component.

5. The data monitoring module according to claim 4, characterized in that: The signal processing unit further includes a level conversion circuit; the level conversion circuit includes at least one buffer, an input end of the buffer is connected to the signal acquisition unit, and an output end of the buffer is connected to the output connection component; The buffer is configured to perform level conversion on the received original reset signal to generate the standard reset signal, and / or perform level conversion on the original communication data signal to generate the standard communication data signal; and output the standard reset signal and the standard communication data signal to the smart card test device through the output connection component; The smart card testing device is used to calculate the bit duration based on the reduced-frequency clock signal, determine the communication start time based on the standard reset signal, and decode the standard communication data signal based on the bit duration to restore the communication data between the smart card to be tested and the read-write module to be tested.

6. The data monitoring module according to claim 5, characterized in that: The preset input high level recognition range of the buffer is 1.5V to 5.0V.

7. A data monitoring method, characterized in that: The method is applied to the data monitoring module according to any one of claims 1 to 6 above, comprising: By simulating a smart card, when the smart card to be tested is set in the data monitoring module, a signal path for monitoring communication data between the smart card to be tested and the read-write module to be tested is established; Acquire, by a signal acquisition unit based on the signal path, an original clock signal, an original reset signal, and an original communication data signal generated when the smart card to be tested communicates with the read / write module to be tested; Performing frequency reduction processing on the original clock signal through a signal processing unit to generate a frequency-reduced clock signal; performing signal conversion on the original reset signal and the original communication data signal to generate a standard reset signal and a standard communication data signal; The frequency-reduced clock signal, the standard reset signal and the standard communication data signal are output to the smart card testing device through the output connection component, so that the smart card testing device can restore the communication data between the smart card to be tested and the read-write module to be tested.

8. A smart card testing device, characterized in that: comprising a main control module; further comprising the data monitoring module according to any one of claims 1 to 6; the main control module comprising a first smart card slot; the data monitoring module comprising a second smart card slot and an output connection component; The data monitoring module can be pluggably connected to the first smart card slot through the output connection component; the second smart card slot is used to install the smart card to be tested.

9. The smart card testing device according to claim 8, characterized in that: The data monitoring module includes an analog smart card, which is suitable for inserting into the third smart card slot of the read-write module to be tested; The main control module further includes a contactless circuit; the first smart card slot is used to install a contact smart card; the contactless circuit is used to communicate with the contactless smart card; When the output connection component is not connected to the first smart card slot and the smart card to be tested is the contact smart card, the main control module is connected to the smart card to be tested through the first smart card slot; when the output connection component is not connected to the first smart card slot and the smart card to be tested is the contactless smart card, the main control module is communicatively connected to the contactless smart card through the contactless circuit; when the output connection component is connected to the first smart card slot, the main control module receives the original communication signal output from the data monitoring module through the first smart card slot to monitor the communication data between the read-write module to be tested and the smart card to be tested.

10. The smart card testing device according to claim 8, characterized in that: The main control module also includes a connected main control chip and a functional test module; The main control chip is configured to perform a preset functional test on the smart card to be tested through the functional test module when the smart card to be tested is set in the first smart card slot; the preset functional test includes at least one of an anti-removal test and a power consumption sampling test.

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