Cold strip billet surface quality evaluation method, device, equipment and medium
By obtaining the thickness of the cold belt blank sample and the length and quantity of the grinding wheel residue, using scanning electron microscope and energy spectrum analysis technology, the influence of residue on quality during the surface grinding of the cold belt blank is solved, and objective evaluation and efficient detection of the surface quality of the cold belt blank is achieved.
Patent Information
- Application Number
- CN202510733959.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-06-04
- Publication Date
- 2025-08-19
AI Technical Summary
In the prior art, the residues of the grinding wheel abrasive particles during the surface grinding of the cold strip blank have an adverse effect on the surface quality of the cold strip blank, resulting in damage to the subsequent cold rolling process and the final product quality, and lack of effective evaluation methods.
By obtaining the thickness of the cold tape blank sample and the length and quantity of the grinding wheel residue, scanning electron microscopy and energy spectrum analysis technology were used to determine the surface quality level and evaluate the severity of the contamination of the surface of the cold tape blank with the target residue.
The objective evaluation of the surface quality of the cold strip blank is achieved, the impact of residues on subsequent cold rolling processes and final product quality is reduced, and the accuracy and efficiency of detection are improved.
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Figure CN120507387A_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the field of metallurgy technology, and in particular to a method, device, equipment and medium for evaluating the surface quality of a cold strip. Background Art
[0002] Cold strip surface grinding is a crucial process in the steel production process. It is mainly used to remove defects on the surface of the cold strip, such as cracks, oxide scale, inclusions, etc., to improve the surface quality and performance of the cold strip.
[0003] In the prior art, the surface grinding of cold strip blanks mainly adopts the grinding wheel grinding method, which utilizes the high-speed rotating grinding wheel to contact the surface of the cold strip blank and removes surface defects through the cutting action of abrasive grains.
[0004] However, during the cold strip surface grinding process, abrasive grains from the grinding wheel can fall off due to wear. Some of these detached grains can become embedded in the cold strip surface, forming residues. These residues can negatively impact subsequent cold rolling processes and the quality of the final product. Therefore, evaluating the impact of these residues on the surface quality of the cold strip is a pressing technical challenge. Summary of the Invention
[0005] In view of the above problems, the present application is proposed to provide a cold strip surface quality evaluation method, device, equipment and medium that solve the above problems. The surface quality grade of the cold strip to be tested can be objectively evaluated based on the thickness of the sample of the cold strip to be tested, and the length and quantity of the abrasive residues in the grinding wheel, so that the surface quality grade can be used as a reference for the subsequent cold rolling process and the final product quality evaluation, thereby reducing the impact of the surface quality of the cold strip on the subsequent cold rolling process and the final product quality evaluation.
[0006] In a first aspect, the present application provides a method for evaluating the surface quality of a cold strip, the method comprising:
[0007] Obtaining the thickness of the sample of the cold strip to be tested;
[0008] Determining an area to be detected on the sample and a plurality of target residues on the surface of the area to be detected; detecting the length of each of the target residues; wherein the target residues are residues comprising at least one of aluminum oxide and silicon oxide;
[0009] The surface quality grade of the cold strip to be inspected is determined based on the thickness, the length and the number of the target residues; wherein the surface quality grade is used to characterize the severity of contamination of the surface of the cold strip to be inspected by the target residues, and the higher the surface quality grade, the more target residues there are on the surface of the cold strip to be inspected.
[0010] Optionally, determining the surface quality grade of the cold strip to be inspected based on the thickness, the length, and the amount of the target residues includes:
[0011] If the thickness is less than a preset thickness threshold, determining the surface quality grade of the cold strip to be inspected based on the length, the number and a preset first evaluation standard;
[0012] If the thickness is greater than or equal to the thickness threshold, the surface quality grade of the cold strip to be inspected is determined according to the length, the number and a preset second evaluation criterion.
[0013] Optionally, determining the surface quality grade of the cold strip to be inspected based on the length, the number, and a preset first evaluation criterion includes:
[0014] Determine a first number of first target residues having a length greater than a preset first length threshold and less than or equal to a preset second length threshold;
[0015] determining a second number of second target residues having a length greater than the second length threshold and less than or equal to a preset third length threshold;
[0016] Determining a third number of third target residues having a length greater than a third length threshold; wherein the first length threshold is less than the second length threshold, and the second length threshold is less than the third length threshold;
[0017] The surface quality grade of the cold strip to be inspected is determined according to the first quantity, the second quantity, the third quantity and a preset first evaluation standard.
[0018] Optionally, determining the surface quality grade of the cold strip to be inspected according to the first quantity, the second quantity, the third quantity and a preset first evaluation standard includes:
[0019] Based on the first evaluation standard, determining a first evaluation level corresponding to the first quantity, a second evaluation level corresponding to the second quantity, and a third evaluation level corresponding to the third quantity; the first evaluation level is used to characterize the severity of contamination of the surface of the cold strip to be detected by the first target residue, and the higher the first evaluation level, the larger the first quantity; the second evaluation level is used to characterize the severity of contamination of the surface of the cold strip to be detected by the second target residue, and the higher the second evaluation level, the larger the second quantity; the third evaluation level is used to characterize the severity of contamination of the surface of the cold strip to be detected by the third target residue, and the higher the third evaluation level, the larger the third quantity;
[0020] The highest evaluation level among the first evaluation level, the second evaluation level, and the third evaluation level is determined as the surface quality level of the cold strip to be inspected.
[0021] Optionally, determining the surface quality grade of the cold strip to be inspected based on the length, the number, and a preset second evaluation criterion includes:
[0022] determining a fourth number of fourth target residues having a length greater than a preset fourth length threshold and less than or equal to a preset fifth length threshold;
[0023] determining a fifth number of fifth target residues having a length greater than the fifth length threshold and less than or equal to a preset sixth length threshold;
[0024] determining a sixth number of sixth target residues having a length greater than the sixth length threshold and less than or equal to a preset seventh length threshold;
[0025] determining a seventh number of seventh target residues having a length greater than a seventh length threshold; wherein the fourth length threshold is less than the fifth length threshold, the fifth length threshold is less than the sixth length threshold, and the sixth length threshold is less than the seventh length threshold; the fourth length threshold is less than the first length threshold, and the seventh length threshold is greater than the third length threshold;
[0026] The surface quality grade of the cold strip to be inspected is determined according to the fourth quantity, the fifth quantity, the sixth quantity, the seventh quantity and a preset second evaluation criterion.
[0027] Optionally, determining the surface quality grade of the cold strip to be inspected according to the fourth quantity, the fifth quantity, the sixth quantity, the seventh quantity and a preset second evaluation standard includes:
[0028] Based on the second evaluation standard, a fourth evaluation grade corresponding to the fourth quantity, a fifth evaluation grade corresponding to the fifth quantity, a sixth evaluation grade corresponding to the sixth quantity, and a seventh evaluation grade corresponding to the seventh quantity are determined; the fourth evaluation grade is used to characterize the severity of the contamination of the surface of the cold strip to be detected by the fourth target residue, and the higher the fourth evaluation grade is, the larger the fourth quantity is; the fifth evaluation grade is used to characterize the severity of the contamination of the surface of the cold strip to be detected by the fifth target residue, and the higher the fifth evaluation grade is, the larger the fifth quantity is; the sixth evaluation grade is used to characterize the severity of the contamination of the surface of the cold strip to be detected by the sixth target residue, and the higher the sixth evaluation grade is, the larger the sixth quantity is; the seventh evaluation grade is used to characterize the severity of the contamination of the surface of the cold strip to be detected by the seventh target residue, and the higher the seventh evaluation grade is, the larger the seventh quantity is;
[0029] The highest evaluation level among the fourth evaluation level, the fifth evaluation level, the sixth evaluation level and the seventh evaluation level is determined as the surface quality level of the cold strip to be inspected, wherein the higher the surface quality level, the worse the surface quality.
[0030] Optionally, obtaining the thickness of the sample of the cold strip to be tested, and the length and quantity of the target residues on the sample, includes:
[0031] Obtaining the single-point thickness of multiple detection points on the sample of the cold strip to be detected;
[0032] The average value of all single-point thicknesses is taken as the thickness of the sample of the cold strip to be tested.
[0033] In a second aspect, the present application provides a cold strip surface quality evaluation device, the device comprising:
[0034] An acquisition module, used to obtain the thickness of the sample of the cold strip to be tested;
[0035] A detection module, configured to determine an area to be detected on the sample and a plurality of target residues on the surface of the area to be detected; and to detect the length of each of the target residues; wherein the target residues are residues comprising at least one of aluminum oxide and silicon oxide;
[0036] A determination module is used to determine the surface quality grade of the cold strip to be inspected based on the thickness, the length and the number of the target residues; wherein the surface quality grade is used to characterize the severity of contamination of the surface of the cold strip to be inspected by the target residues, and the higher the surface quality grade, the more target residues there are on the surface of the cold strip to be inspected.
[0037] In a third aspect, the present application provides an electronic device comprising: a memory and a processor, wherein the memory and the processor are communicatively connected to each other, computer instructions are stored in the memory, and the processor executes the method described in the first aspect by executing the computer instructions.
[0038] In a fourth aspect, the present application provides a computer-readable storage medium, wherein the computer-readable storage medium stores computer instructions, and the computer instructions are used to enable the computer to execute the method described in the first aspect.
[0039] The technical solutions provided in the embodiments of this application have at least the following technical effects or advantages:
[0040] The embodiment of the present application provides a method, device, equipment and medium for evaluating the surface quality of a cold strip blank, which obtains the thickness of a sample of the cold strip blank to be tested, determines the area to be tested on the sample, and multiple target residues on the surface of the area to be tested; detects the length of each target residue; wherein the target residue is a residue comprising at least one component of aluminum oxide and silicon oxide, that is, a residue formed by a grinding wheel; determines the surface quality grade of the cold strip blank to be tested based on the thickness, length and number of target residues; wherein the surface quality grade is used to characterize the severity of contamination of the surface of the cold strip blank to be tested by the target residues, and the higher the surface quality grade, the more target residues there are on the surface of the cold strip blank to be tested. This method can objectively evaluate the surface quality grade of the cold strip blank to be tested, so that the surface quality grade can be used as a reference when evaluating the quality of the subsequent cold rolling process and the final product, thereby reducing the impact of the surface quality of the cold strip blank on the subsequent cold rolling process and the quality evaluation of the final product.
[0041] The above description is only an overview of the technical solution of the present application. In order to more clearly understand the technical means of the present application, it can be implemented in accordance with the contents of the specification. In order to make the above and other purposes, features and advantages of the present application more obvious and easy to understand, the specific implementation methods of the present application are listed below. BRIEF DESCRIPTION OF THE DRAWINGS
[0042] Various other advantages and benefits will become apparent to those skilled in the art upon reading the detailed description of the preferred embodiment below. The accompanying drawings are for illustration purposes only and are not to be considered as limiting the present application. The same reference symbols are used throughout the drawings to represent the same components. In the drawings:
[0043] Figure 1 This is a flow chart of a cold strip surface quality evaluation method provided in an embodiment of the present application;
[0044] Figure 2 Schematic diagram of a detection field of view for preliminary screening provided in an embodiment of the present application;
[0045] Figure 3 This is a structural block diagram of a cold strip surface quality evaluation device provided in an embodiment of the present application. DETAILED DESCRIPTION
[0046] In order to make the purpose, technical solutions and advantages of the present application clearer, the implementation methods of the present application will be further described in detail below with reference to the accompanying drawings. It should be understood that the embodiments of the present disclosure and the specific features in the embodiments are detailed descriptions of the technical solutions of the present application, rather than limitations on the technical solutions of the present application. In the absence of conflict, the embodiments of the present application and the technical features in the embodiments can be combined with each other.
[0047] Figure 1 This is a flow chart of a cold strip surface quality evaluation method provided in an embodiment of the present application. Figure 1 As shown, the method includes:
[0048] Step S110: Obtain the thickness of the cold strip sample to be tested.
[0049] In this embodiment, the cold strip to be tested is a surface-grinded cold strip. Samples of a predetermined size, for example, 20 mm x 20 mm, can be randomly sampled along the strip's rolling direction. Sampling along the rolling direction ensures that the test results truly reflect the strip's performance in its primary operating direction, ensuring data reliability and process compatibility. Sample thickness can be measured using a vernier caliper.
[0050] Step S120 , determining a region to be detected on the sample and a plurality of target residues on the surface of the region to be detected; and detecting the length of each target residue.
[0051] The target residue is a residue containing at least one of aluminum oxide and silicon oxide.
[0052] In this embodiment, a random area to be tested is determined on the sample. For example, a 10 mm x 10 mm square is marked along the rolling direction of the sample using a stylus. The sample is then ultrasonically treated in an alcohol solution for 5 minutes, followed by drying with a hair dryer. Ultrasonic treatment removes interference from residues other than the target residue.
[0053] Next, place the sample under an electron microscope for observation. Adjust the microscope's focus and contrast to ensure clear visibility at a 500x field of view. The initial field of view can be adjusted to the upper left corner of the square area to be inspected, using 500x magnification for a preliminary screening of the area. During this initial screening, search for target residues from left to right and from top to bottom along the rolling direction. Figure 2This is a schematic diagram of a detection field of view for preliminary screening provided in an embodiment of the present application, such as Figure 2 As shown, select the top, middle, and bottom positions from top to bottom, and screen each position from left to right three times. If suspected target residues are found in the initial screening, they can be confirmed using 2000x magnification. If the residue's morphology at 2000x magnification confirms that the suspected residue is the target residue, use the measurement software provided by the electron microscope to measure the length of the residue. If the residue's morphology cannot confirm whether the suspected residue is the target residue, use energy spectrum analysis to verify the residue's composition. If the residue is confirmed to be aluminum oxide, silicon oxide, or a mixture of the two, measure the residue's length. Record the number of target residues and their corresponding lengths.
[0054] During surface grinding of a cold strip, abrasive grains from the grinding wheel are dislodged due to wear. Some of these dislodged grains become embedded in the surface of the cold strip, forming target residues. Since grinding wheels are primarily composed of aluminum oxide, silicon oxide, or a mixture of the two, the target residues are likely composed of aluminum oxide, silicon oxide, or a mixture of the two. Scanning electron microscopy (SEM) can detect micron-level residues, complementing visual inspection and enabling higher-precision quality control. For complex surface impurities and residues on cold strip, visual inspection alone cannot distinguish the residue types. The SEM's energy spectrum analysis function can identify impurities and residues of varying composition, allowing for individual counts of target residues resulting from grinding. By examining three fields of view within a 10mm x 10mm inspection area, a scientifically sound residue profile for the entire sample is obtained, improving inspection efficiency.
[0055] Optionally, step S110 includes:
[0056] The single-point thicknesses of multiple detection points on the sample of the cold strip blank to be detected are obtained; and the average value of all the single-point thicknesses is used as the thickness of the sample of the cold strip blank to be detected.
[0057] In the embodiment of the present application, a vernier caliper can be used to measure the thickness of the sample. For example, the thickness of three test points can be randomly measured, and the average thickness of the three test points can be calculated as the thickness of the sample, so that the measured thickness is more realistic.
[0058] Step S130: Determine the surface quality grade of the cold strip to be inspected based on the thickness, length, and the amount of target residues.
[0059] The surface quality grade is used to characterize the severity of contamination of the surface of the cold strip to be inspected by the target residues. The higher the surface quality grade, the more target residues there are on the surface of the cold strip to be inspected.
[0060] In the embodiments of this application, when surface grinding a cold strip, a greater downward pressure is applied to thicker cold strips, which results in a greater likelihood of the target residue remaining on the strip. A smaller downward pressure is applied to thinner cold strips, which results in no or less target residue remaining on the strip. Therefore, the surface quality of the cold strip being tested can be evaluated based on thickness, length, and quantity. The surface quality grade can be used to reflect the quality of the surface.
[0061] Optionally, step S130 includes:
[0062] Step S1301: If the thickness is less than a preset thickness threshold, the surface quality grade of the cold strip to be inspected is determined according to the length, quantity and a preset first evaluation standard.
[0063] In an embodiment of the present application, if the thickness is less than a preset thickness threshold, it indicates that the cold strip to be tested is relatively thin. The surface quality grade of the cold strip to be tested is evaluated based on the length, quantity and the first evaluation criteria for thinner cold strips to be tested.
[0064] Optionally, step S1301 includes:
[0065] The first step is to determine a first number of first target residues whose length is greater than a preset first length threshold and less than or equal to a preset second length threshold;
[0066] Step 2: determining a second number of second target residues having a length greater than a second length threshold and less than or equal to a preset third length threshold;
[0067] Step 3: determining a third number of third target residues having a length greater than a third length threshold; wherein the first length threshold is less than the second length threshold, and the second length threshold is less than the third length threshold;
[0068] In an embodiment of the present application, the target residues can be classified according to their length, with shorter ones being one category, middle ones being one category, and longer ones being one category. The number of target residues in each category is then counted separately, namely the first number, the second number, and the third number.
[0069] Step 4: Determine the surface quality grade of the cold strip to be inspected based on the first quantity, the second quantity, the third quantity and a preset first evaluation standard.
[0070] In the embodiment of the present application, the surface quality grade of the cold strip to be inspected is determined according to the amount of each type of target residues and with reference to the first evaluation standard.
[0071] Optionally, the fourth step includes:
[0072] Based on the first evaluation standard, a first evaluation level corresponding to the first quantity, a second evaluation level corresponding to the second quantity, and a third evaluation level corresponding to the third quantity are determined; and the highest evaluation level among the first evaluation level, the second evaluation level, and the third evaluation level is determined as the surface quality level of the cold strip to be tested.
[0073] Among them, the first evaluation level is used to characterize the severity of the contamination of the surface of the cold strip to be tested by the first target residue. The higher the first evaluation level, the larger the first number; the second evaluation level is used to characterize the severity of the contamination of the surface of the cold strip to be tested by the second target residue. The higher the second evaluation level, the larger the second number; the third evaluation level is used to characterize the severity of the contamination of the surface of the cold strip to be tested by the third target residue. The higher the third evaluation level, the larger the third number.
[0074] In this embodiment of the present application, the first evaluation criterion can be used to determine the impact of each type of residue on the surface quality of the cold strip to be inspected based on the amount of each type of target residue. This impact is characterized by an evaluation grade. Finally, the highest evaluation grade among all evaluation grades is determined as the surface quality grade of the cold strip to be inspected.
[0075] For example, the first evaluation criteria are shown in Table 1:
[0076] Table 1
[0077]
[0078]
[0079] As shown in Table 1, to examine the grinding residue on 1.2 mm thick 4J29 cold strip, 20 mm × 20 mm specimens were randomly selected along the rolling direction from the surface-ground 4J29 cold strip. The strip thickness was measured using a vernier caliper, and the average thickness was calculated from three random measurements. The three measured thicknesses were 1.22 mm, 1.24 mm, and 1.22 mm, respectively. Therefore, the average thickness of the sample was 1.22 mm. A 10 mm × 10 mm square was scratched along the rolling direction on the sample using a stylus to serve as the test area. The sample was ultrasonically treated in an alcohol solution for 5 minutes and then dried with a hair dryer. The sample was then placed under an electron microscope for observation. The focus and contrast were adjusted to ensure a clear view of the sample at a 500x field of view. The initial field of view was adjusted to the upper left corner of the test area. A preliminary screening of the test area was performed using 500x magnification, selecting the top, middle, and bottom locations along the rolling direction, and performing three rounds of inspection. Suspected target residues were confirmed using 2000x magnification. Energy spectrum analysis was used, if necessary, to verify the composition of the particles containing the residues. When the residues were confirmed to be aluminum oxide, silicon oxide, or a mixture of the two, the length of the residues was measured using the electron microscope's built-in measurement software. The number and length of target residues observed in all fields of view were counted. A statistical analysis revealed that across all fields of view, there were seven target residues with a length of 12 < L ≤ 24, four with a length of 24 < L ≤ 60, and no target residues larger than 60 μm. Since the sample thickness was ≤ 2 mm, the surface quality grade of the sample was rated 3 based on comparison with Table 1.
[0080] Step S1302: If the thickness is greater than or equal to the thickness threshold, the surface quality grade of the cold strip to be inspected is determined according to the length, quantity and a preset second evaluation standard.
[0081] In an embodiment of the present application, if the thickness is greater than or equal to the thickness threshold, it means that the cold strip to be tested is thicker. Then, the surface quality grade of the cold strip to be tested is evaluated based on the length, quantity and the second evaluation criteria for thicker cold strips to be tested.
[0082] Optionally, step S1302 includes:
[0083] The first step is to determine a fourth number of fourth target residues whose length is greater than a preset fourth length threshold and less than or equal to a preset fifth length threshold.
[0084] The second step is to determine a fifth number of fifth target residues whose length is greater than a fifth length threshold and less than or equal to a preset sixth length threshold.
[0085] Step 3: Determine a sixth number of sixth target residues whose length is greater than a sixth length threshold and less than or equal to a preset seventh length threshold.
[0086] Step 4: Determine the seventh number of seventh target residues whose length is greater than a seventh length threshold.
[0087] Among them, the fourth length threshold is smaller than the fifth length threshold, the fifth length threshold is smaller than the sixth length threshold, and the sixth length threshold is smaller than the seventh length threshold; the fourth length threshold is smaller than the first length threshold, and the seventh length threshold is larger than the third length threshold.
[0088] In the embodiment of the present application, since target residues are more likely to appear in thicker cold strips to be tested, more categories of target residues can be set for thicker cold strips to be tested, with shorter ones being one category, middle ones being two categories, and longer ones being one category. The number of target residues in each category is then counted separately, namely the fourth number, the fifth number, the sixth number, and the seventh number.
[0089] Step 5: Determine the surface quality grade of the cold strip to be inspected based on the fourth quantity, the fifth quantity, the sixth quantity, the seventh quantity and the preset second evaluation standard.
[0090] In the embodiment of the present application, the surface quality grade of the cold strip to be inspected is determined according to the amount of each type of target residues and with reference to the second evaluation standard.
[0091] Optionally, the fifth step includes:
[0092] Based on the second evaluation standard, the fourth evaluation level corresponding to the fourth quantity, the fifth evaluation level corresponding to the fifth quantity, the sixth evaluation level corresponding to the sixth quantity, and the evaluation level corresponding to the seventh quantity are determined; and the highest evaluation level among the fourth evaluation level, the fifth evaluation level, the sixth evaluation level, and the seventh evaluation level is determined as the surface quality level of the cold strip to be tested.
[0093] Among them, the fourth evaluation level is used to characterize the severity of the contamination of the surface of the cold strip to be tested by the fourth target residue. The higher the fourth evaluation level, the larger the fourth number; the fifth evaluation level is used to characterize the severity of the contamination of the surface of the cold strip to be tested by the fifth target residue. The higher the fifth evaluation level, the larger the fifth number. The sixth evaluation level is used to characterize the severity of the contamination of the surface of the cold strip to be tested by the sixth target residue. The higher the sixth evaluation level, the larger the sixth number. The seventh evaluation level is used to characterize the severity of the contamination of the surface of the cold strip to be tested by the seventh target residue. The higher the seventh evaluation level, the larger the seventh number.
[0094] In this embodiment of the present application, the second evaluation criterion can be used to determine the impact of each type of residue on the surface quality of the cold strip to be inspected based on the amount of each type of target residue. This impact is characterized by an evaluation grade. Finally, the highest evaluation grade among all evaluation grades is determined as the surface quality grade of the cold strip to be inspected.
[0095] For example, the second evaluation criteria are shown in Table 2:
[0096] Table 2
[0097]
[0098] As shown in Table 2, to examine the grinding residue on 2.5 mm thick 4J29 cold strip, 20 mm × 20 mm specimens were randomly selected along the rolling direction from the surface-ground 4J29 cold strip. The strip thickness was measured using a vernier caliper, and the average thickness was calculated from three random measurements. The three measured thicknesses were 2.52 mm, 2.50 mm, and 2.48 mm, respectively. Therefore, the average thickness of the sample was 2.5 mm. A 10 mm × 10 mm square was scratched along the rolling direction on the sample using a stylus to serve as the test area. The sample was ultrasonically treated in an alcohol solution for 5 minutes and then dried with a hair dryer. The sample was then placed under an electron microscope for observation. The focus and contrast were adjusted to ensure clear visibility at a 500x field of view. The initial field of view was adjusted to the upper left corner of the test area. A preliminary screening of the test area was performed using 500x magnification, selecting the top, middle, and bottom locations along the rolling direction, and performing three rounds of inspection. Suspected target residues were confirmed using 2000x magnification. Energy dispersive spectrometry was used to verify the composition of the particles containing the residues, if necessary. If the residues were confirmed to be aluminum oxide, silicon oxide, or a mixture of the two, the length of the residues was measured using the electron microscope's built-in measurement software. The number and length of target residues observed in all fields of view were counted. Across all fields of view, there were four target residues with a diameter of 10 ≤ L ≤ 20, four with a diameter of 20 < L ≤ 50, and no target residues larger than 50 μm. Since the sample thickness was ≥ 2 mm, the surface quality grade of the sample was determined to be Level 2, as compared to Table 2.
[0099] The method in the embodiment of the present application can use a fully automatic scanning electron microscope and an energy spectrum analyzer, and automatically count the number of target residues and automatically measure the length of the target residues through a set field of view movement program and an analysis component program. According to the evaluation criteria in Tables 1 and 2, the surface quality grade corresponding to the target residue is obtained, thereby minimizing the intervention of the inspection personnel. This not only saves manpower, but also improves the objectivity and accuracy of the inspection.
[0100] Based on the same application concept, the embodiment of the present invention also provides a cold strip surface quality evaluation device, Figure 3This is a structural block diagram of a cold strip surface quality evaluation device provided in an embodiment of the present application. Figure 3 As shown, the device 300 includes an acquisition module 301 , a detection module 302 and a determination module 303 .
[0101] An acquisition module 301 is used to obtain the thickness of a sample of a cold strip to be tested;
[0102] The detection module 302 is configured to determine a region to be detected on the sample and a plurality of target residues on the surface of the region to be detected; and to detect the length of each target residue; wherein the target residue is a residue comprising at least one of aluminum oxide and silicon oxide;
[0103] Determination module 303 is used to determine the surface quality grade of the cold strip to be inspected based on the thickness, length and number of target residues; wherein the surface quality grade is used to characterize the severity of contamination of the surface of the cold strip to be inspected by the target residues. The higher the surface quality grade, the more target residues there are on the surface of the cold strip to be inspected.
[0104] Optionally, the determining module 303 includes:
[0105] a first determining unit, configured to determine a surface quality grade of the cold strip to be inspected based on the length, quantity, and a preset first evaluation criterion if the thickness is less than a preset thickness threshold;
[0106] The second determining unit is configured to determine the surface quality grade of the cold strip to be inspected based on the length, quantity and a preset second evaluation criterion if the thickness is greater than or equal to the thickness threshold.
[0107] Optionally, the first determining unit includes:
[0108] A first determining subunit is configured to determine a first number of first target residues whose length is greater than a preset first length threshold and less than or equal to a preset second length threshold;
[0109] a second determining subunit, configured to determine a second number of second target residues having a length greater than a second length threshold and less than or equal to a preset third length threshold;
[0110] a third determining subunit, configured to determine a third number of third target residues having a length greater than a third length threshold; wherein the first length threshold is less than the second length threshold, and the second length threshold is less than the third length threshold;
[0111] The fourth determining subunit is used to determine the surface quality grade of the cold strip to be inspected according to the first quantity, the second quantity, the third quantity and a preset first evaluation standard.
[0112] Optionally, the fourth determining subunit is further configured to:
[0113] Based on the first evaluation standard, a first evaluation level corresponding to the first quantity, a second evaluation level corresponding to the second quantity, and a third evaluation level corresponding to the third quantity are determined; the first evaluation level is used to characterize the severity of contamination of the surface of the cold strip to be detected by the first target residue, and the higher the first evaluation level, the larger the first number; the second evaluation level is used to characterize the severity of contamination of the surface of the cold strip to be detected by the second target residue, and the higher the second evaluation level, the larger the second number; the third evaluation level is used to characterize the severity of contamination of the surface of the cold strip to be detected by the third target residue, and the higher the third evaluation level, the larger the third number;
[0114] The highest evaluation level among the first evaluation level, the second evaluation level and the third evaluation level is determined as the surface quality level of the cold strip to be inspected, wherein the higher the surface quality level, the worse the surface quality.
[0115] Optionally, the second determining unit includes:
[0116] a fifth determining subunit, configured to determine a fourth number of fourth target residues having a length greater than a preset fourth length threshold and less than or equal to the preset fifth length threshold;
[0117] a sixth determining subunit, configured to determine a fifth number of fifth target residues having a length greater than a fifth length threshold and less than or equal to a preset sixth length threshold;
[0118] a seventh determining subunit, configured to determine a sixth number of sixth target residues having a length greater than a sixth length threshold and less than or equal to a preset seventh length threshold;
[0119] an eighth determining subunit, configured to determine a seventh number of seventh target residues having a length greater than a seventh length threshold; wherein the fourth length threshold is less than the fifth length threshold, the fifth length threshold is less than the sixth length threshold, and the sixth length threshold is less than the seventh length threshold; the fourth length threshold is less than the first length threshold, and the seventh length threshold is greater than the third length threshold;
[0120] The ninth determining subunit is configured to determine the surface quality grade of the cold strip to be inspected according to the fourth quantity, the fifth quantity, the sixth quantity, the seventh quantity and a preset second evaluation criterion.
[0121] Optionally, the ninth determining subunit is further configured to:
[0122] Based on the second evaluation standard, a fourth evaluation level corresponding to the fourth quantity, a fifth evaluation level corresponding to the fifth quantity, a sixth evaluation level corresponding to the sixth quantity, and a seventh evaluation level corresponding to the seventh quantity are determined; the fourth evaluation level is used to characterize the severity of contamination of the surface of the cold strip to be detected by the fourth target residue, and the higher the fourth evaluation level, the larger the fourth number; the fifth evaluation level is used to characterize the severity of contamination of the surface of the cold strip to be detected by the fifth target residue, and the higher the fifth evaluation level, the larger the fifth number; the sixth evaluation level is used to characterize the severity of contamination of the surface of the cold strip to be detected by the sixth target residue, and the higher the sixth evaluation level, the larger the sixth number; the seventh evaluation level is used to characterize the severity of contamination of the surface of the cold strip to be detected by the seventh target residue, and the higher the seventh evaluation level, the larger the seventh number;
[0123] The highest evaluation level among the fourth evaluation level, the fifth evaluation level, the sixth evaluation level and the seventh evaluation level is determined as the surface quality level of the cold strip to be inspected, wherein the higher the surface quality level, the worse the surface quality.
[0124] Optionally, the acquisition module 301 is further configured to:
[0125] Obtaining the single-point thickness of multiple different test points on the sample of the cold strip to be tested;
[0126] The average value of all single-point thicknesses is taken as the thickness of the sample of the cold strip to be tested.
[0127] It can be understood that the device provided in the above embodiment is only illustrated by the division of the above functional modules. In actual applications, the above functions can be assigned to different functional modules as needed, that is, the internal structure of the device can be divided into different functional modules to complete all or part of the functions described above.
[0128] An embodiment of the present invention further provides an electronic device, which may include a processor and a memory, wherein the processor and the memory may be communicatively connected to each other via a bus or other means.
[0129] The processor may be a central processing unit (CPU), or an application-specific integrated circuit (ASIC), or may be configured to implement one or more integrated circuits of the embodiments of the present application, or may be other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, or combinations of the above chips.
[0130] The memory may include a large capacity memory for data or instructions. By way of example and not limitation, the memory may include a hard disk drive (HDD), a floppy disk drive, a flash memory, an optical disk, a magneto-optical disk, a magnetic tape, or a universal serial bus (USB) drive, or a combination of two or more of these. Where appropriate, the memory may include removable or non-removable (or fixed) media. Where appropriate, the memory may be internal or external to the electronic device. In certain embodiments, the memory may be a non-volatile solid-state memory.
[0131] In one embodiment, the memory may be a read-only memory (ROM). In one embodiment, the ROM may be a mask-programmable ROM, a programmable ROM (PROM), an erasable PROM (EPROM), an electrically erasable PROM (EEPROM), an electrically rewritable ROM (EAROM), or a flash memory, or a combination of two or more of these.
[0132] The processor implements any one of the cold strip surface quality evaluation methods in the above embodiments by reading and executing computer program instructions stored in the memory.
[0133] In one example, the electronic device may further include a communication interface and a bus. The processor, memory, and communication interface are connected via the bus and communicate with each other. The communication interface is primarily used to enable communication between the various modules, devices, units, and / or devices in the embodiments of this application. Where appropriate, the bus may include one or more buses.
[0134] In addition, in conjunction with the cold strip surface quality evaluation method in the above-mentioned embodiment, embodiments of the present invention may provide a computer-readable storage medium for implementation. The computer-readable storage medium stores computer program instructions; when the computer program instructions are executed by a processor, any of the cold strip surface quality evaluation methods in the above-mentioned embodiment is implemented.
[0135] Those skilled in the art will appreciate that all or part of the processes in the above-mentioned embodiments can be implemented by instructing the relevant hardware through a computer program. The program can be stored in a computer-readable storage medium. When the program is executed, it can include the processes of the embodiments of the above-mentioned methods. The storage medium can be a read-only memory (ROM), a random access memory (RAM), a flash memory, a hard disk drive (HDD), or a solid-state drive (SSD). The storage medium can also include a combination of the above-mentioned types of memory.
[0136] The technical solutions in the above embodiments of the present application have at least the following technical effects or advantages:
[0137] The embodiment of the present application provides a method, device, equipment and medium for evaluating the surface quality of a cold strip blank, which obtains the thickness of a sample of the cold strip blank to be tested, determines the area to be tested on the sample, and multiple target residues on the surface of the area to be tested; detects the length of each target residue; wherein the target residue is a residue comprising at least one component of aluminum oxide and silicon oxide, that is, a residue formed by a grinding wheel; determines the surface quality grade of the cold strip blank to be tested based on the thickness, length and number of target residues; wherein the surface quality grade is used to characterize the severity of contamination of the surface of the cold strip blank to be tested by the target residues, and the higher the surface quality grade, the more target residues there are on the surface of the cold strip blank to be tested. This method can objectively evaluate the surface quality grade of the cold strip blank to be tested, so that the surface quality grade can be used as a reference when evaluating the quality of the subsequent cold rolling process and the final product, thereby reducing the impact of the surface quality of the cold strip blank on the subsequent cold rolling process and the quality evaluation of the final product.
[0138] In the description provided herein, numerous specific details are described. However, it is understood that embodiments of the present invention may be practiced without these specific details. In some instances, well-known methods, structures, and techniques are not shown in detail so as not to obscure the understanding of this description.
[0139] Similarly, it should be understood that in order to streamline the present disclosure and aid in understanding one or more of the various inventive aspects, in the above description of exemplary embodiments of the invention, various features of the invention are sometimes grouped together into a single embodiment, figure, or description thereof. However, this disclosed method should not be interpreted as reflecting an intention that the claimed invention requires more features than are expressly recited in each claim. Rather, as reflected in the claims below, inventive aspects lie in less than all the features of the individual embodiments disclosed above. Accordingly, the claims following the detailed description are hereby expressly incorporated into this detailed description, with each claim standing on its own as a separate embodiment of the invention.
[0140] It should be noted that the above embodiments illustrate rather than limit the invention, and that a person skilled in the art may devise alternative embodiments without departing from the scope of the appended claims. In the claims, any reference signs placed between brackets should not be construed as limiting the claims. The word "comprising" does not exclude the presence of components or steps not listed in the claims. The word "a" or "an" preceding a component does not exclude the presence of a plurality of such components. The present invention may be implemented by means of hardware comprising several different components and by means of a suitably programmed computer. In a unit claim enumerating several means, several of these means may be embodied by the same item of hardware. The use of the words first, second, and third etc. does not indicate any order. These words may be interpreted as names.
Claims
1. A method for evaluating the surface quality of a cold strip, characterized in that: The method comprises: Obtaining the thickness of the sample of the cold strip to be tested; Determining an area to be detected on the sample and a plurality of target residues on the surface of the area to be detected; detecting the length of each of the target residues; wherein the target residues are residues comprising at least one of aluminum oxide and silicon oxide; The surface quality grade of the cold strip to be inspected is determined based on the thickness, the length and the number of the target residues; wherein the surface quality grade is used to characterize the severity of contamination of the surface of the cold strip to be inspected by the target residues, and the higher the surface quality grade, the more target residues there are on the surface of the cold strip to be inspected.
2. The cold strip surface quality evaluation method according to claim 1, characterized in that: Determining the surface quality grade of the cold strip to be inspected based on the thickness, the length, and the amount of the target residues includes: If the thickness is less than a preset thickness threshold, determining the surface quality grade of the cold strip to be inspected based on the length, the number and a preset first evaluation standard; If the thickness is greater than or equal to the thickness threshold, the surface quality grade of the cold strip to be inspected is determined according to the length, the number and a preset second evaluation criterion.
3. The cold strip surface quality evaluation method according to claim 2, characterized in that: Determining the surface quality grade of the cold strip to be inspected based on the length, the number, and a preset first evaluation standard includes: Determine a first number of first target residues having a length greater than a preset first length threshold and less than or equal to a preset second length threshold; determining a second number of second target residues having a length greater than the second length threshold and less than or equal to a preset third length threshold; Determining a third number of third target residues having a length greater than a third length threshold; wherein the first length threshold is less than the second length threshold, and the second length threshold is less than the third length threshold; The surface quality grade of the cold strip to be inspected is determined according to the first quantity, the second quantity, the third quantity and a preset first evaluation standard.
4. The cold strip surface quality evaluation method according to claim 3, characterized in that: Determining the surface quality grade of the cold strip to be inspected based on the first quantity, the second quantity, the third quantity, and a preset first evaluation standard includes: Based on the first evaluation standard, determining a first evaluation level corresponding to the first quantity, a second evaluation level corresponding to the second quantity, and a third evaluation level corresponding to the third quantity; the first evaluation level is used to characterize the severity of contamination of the surface of the cold strip to be detected by the first target residue, and the higher the first evaluation level, the larger the first quantity; the second evaluation level is used to characterize the severity of contamination of the surface of the cold strip to be detected by the second target residue, and the higher the second evaluation level, the larger the second quantity; the third evaluation level is used to characterize the severity of contamination of the surface of the cold strip to be detected by the third target residue, and the higher the third evaluation level, the larger the third quantity; The highest evaluation level among the first evaluation level, the second evaluation level, and the third evaluation level is determined as the surface quality level of the cold strip to be inspected.
5. The cold strip surface quality evaluation method according to claim 3, characterized in that: Determining the surface quality grade of the cold strip to be inspected based on the length, the number, and a preset second evaluation criterion includes: determining a fourth number of fourth target residues having a length greater than a preset fourth length threshold and less than or equal to a preset fifth length threshold; determining a fifth number of fifth target residues having a length greater than the fifth length threshold and less than or equal to a preset sixth length threshold; determining a sixth number of sixth target residues having a length greater than the sixth length threshold and less than or equal to a preset seventh length threshold; determining a seventh number of seventh target residues having a length greater than a seventh length threshold; wherein the fourth length threshold is less than the fifth length threshold, the fifth length threshold is less than the sixth length threshold, and the sixth length threshold is less than the seventh length threshold; the fourth length threshold is less than the first length threshold, and the seventh length threshold is greater than the third length threshold; The surface quality grade of the cold strip to be inspected is determined according to the fourth quantity, the fifth quantity, the sixth quantity, the seventh quantity and a preset second evaluation criterion.
6. The cold strip surface quality evaluation method according to claim 5, characterized in that: Determining the surface quality grade of the cold strip to be inspected based on the fourth quantity, the fifth quantity, the sixth quantity, the seventh quantity and a preset second evaluation standard includes: Based on the second evaluation standard, a fourth evaluation grade corresponding to the fourth quantity, a fifth evaluation grade corresponding to the fifth quantity, a sixth evaluation grade corresponding to the sixth quantity, and a seventh evaluation grade corresponding to the seventh quantity are determined; the fourth evaluation grade is used to characterize the severity of the contamination of the surface of the cold strip to be detected by the fourth target residue, and the higher the fourth evaluation grade is, the larger the fourth quantity is; the fifth evaluation grade is used to characterize the severity of the contamination of the surface of the cold strip to be detected by the fifth target residue, and the higher the fifth evaluation grade is, the larger the fifth quantity is; the sixth evaluation grade is used to characterize the severity of the contamination of the surface of the cold strip to be detected by the sixth target residue, and the higher the sixth evaluation grade is, the larger the sixth quantity is; the seventh evaluation grade is used to characterize the severity of the contamination of the surface of the cold strip to be detected by the seventh target residue, and the higher the seventh evaluation grade is, the larger the seventh quantity is; The highest evaluation level among the fourth evaluation level, the fifth evaluation level, the sixth evaluation level and the seventh evaluation level is determined as the surface quality level of the cold strip to be inspected, wherein the higher the surface quality level, the worse the surface quality.
7. The cold strip surface quality evaluation method according to claim 1, characterized in that: The step of obtaining the thickness of the sample of the cold strip to be tested, and the length and quantity of the target residues on the sample, comprises: Obtaining the single-point thickness of multiple detection points on the sample of the cold strip to be detected; The average value of all single-point thicknesses is taken as the thickness of the sample of the cold strip to be tested.
8. A cold strip surface quality evaluation device, characterized in that: The device comprises: An acquisition module, used to obtain the thickness of the sample of the cold strip to be tested; A detection module, configured to determine an area to be detected on the sample and a plurality of target residues on the surface of the area to be detected; and to detect the length of each of the target residues; wherein the target residues are residues comprising at least one of aluminum oxide and silicon oxide; A determination module is used to determine the surface quality grade of the cold strip to be inspected based on the thickness, the length and the number of the target residues; wherein the surface quality grade is used to characterize the severity of contamination of the surface of the cold strip to be inspected by the target residues, and the higher the surface quality grade, the more target residues there are on the surface of the cold strip to be inspected.
9. An electronic device, characterized in that: include: A memory and a processor, wherein the memory and the processor are communicatively connected to each other, the memory stores computer instructions, and the processor executes the method according to any one of claims 1 to 7 by executing the computer instructions.
10. A computer-readable storage medium, characterized in that The computer-readable storage medium stores computer instructions, and the computer instructions are used to enable the computer to execute the method according to any one of claims 1 to 7.