Program control method and device, equipment and storage medium

Abstract

The invention is suitable for the field of appliance testing, and provides a program control method and device, equipment and a storage medium, and the method comprises the steps: detecting a first resistance value accessed by a pin of a heating body in a circuit board; determining a target program from a test program and a formal program based on a numerical relationship between the first resistance value and a configured resistance interval; the configured resistance interval is determined based on a test resistance value provided by a test jig; and executing the target program. According to the scheme, extra I / O interface resources do not need to be occupied, and the number of occupied interfaces capable of being used by normal functions is reduced.

Description

Technical Field

[0001] The present application relates to the field of instrument testing, and in particular to a program control method, apparatus, device and storage medium. Background Art

[0002] As a core component of an aerosol generating device's electronic control hardware board, pre-shipment circuit self-testing is crucial for product quality control. Existing technologies typically employ microcontroller-based automated testing solutions, implementing functional verification by embedding test programs in the onboard chip and performing status checks on the I / O (Input / Output) ports.

[0003] Existing solutions rely on dedicated I / O ports as test mode / normal mode selection pins. This not only occupies the main control chip's I / O resources, reducing the number of interfaces available for normal functions, but also forces compromises in the circuit board layout during the hardware design phase. This design limitation becomes particularly prominent when product feature iterations lead to increased I / O requirements. Summary of the Invention

[0004] The embodiments of the present application provide a program control method, apparatus, device and storage medium to solve the problem in the prior art that the execution of chip testing relies on I / O ports as mode judgment pins, reducing the number of interfaces available for normal functions.

[0005] A first aspect of an embodiment of the present application provides a program control method, including:

[0006] Detecting a first resistance value connected to a heating element pin in a circuit board;

[0007] Determining a target program from a test program and a formal program based on a numerical relationship between the first resistance value and a configuration resistance interval, wherein the configuration resistance interval is determined based on a test resistance value provided by a test stand;

[0008] Execute the target program.

[0009] A second aspect of the embodiments of the present application provides a program control device, comprising:

[0010] A detection module, used for detecting a first resistance value connected to a heating element pin in a circuit board;

[0011] a determination module, configured to determine a target program from a test program and a formal program based on a numerical relationship between the first resistance value and a configuration resistance interval; the configuration resistance interval is determined based on a test resistance value provided by a test stand;

[0012] An execution module is used to execute the target program.

[0013] A third aspect of an embodiment of the present application provides an electronic device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the steps of the method described in the first aspect when executing the computer program.

[0014] A fourth aspect of an embodiment of the present application provides a computer-readable storage medium, wherein the computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the steps of the method described in the first aspect are implemented.

[0015] The fifth aspect of the present application provides a computer program product, including a computer-readable code, or a non-volatile computer-readable storage medium carrying the computer-readable code. When the computer-readable code is run in an electronic device, the processor in the electronic device executes the steps in the method described in the first aspect above.

[0016] In an embodiment of the present application, by judging the numerical relationship between the first resistance value currently connected to the heating element pin in the circuit board and the configured resistance range, it is determined whether the current heating element is connected to the resistance value adapted to the test state, and then the target program is determined from the test program and the formal program. By comparing the resistance values ​​connected to the heating element pin, it is determined whether the current circuit board is in a test state or a normal state, and finally the adapted application is executed to enter different circuit board processing processes. There is no need to occupy additional I / O interface resources, and the number of interfaces available for normal functions is reduced. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Various other advantages and benefits will become apparent to those skilled in the art upon reading the detailed description of the preferred embodiment below. The accompanying drawings are for illustration purposes only and are not to be considered as limiting the present application. The same reference numerals are used throughout the drawings to represent the same components. In the drawings:

[0018] Figure 1 This is the process of the program control method in some embodiments of this application Figure 1 ;

[0019] Figure 2 This is the process of the program control method in some embodiments of this application Figure 2 ;

[0020] Figure 3 is a module diagram of a program control device in some embodiments of the present application;

[0021] Figure 4 This is a structural diagram of an electronic device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0022] The following embodiments of the technical solution of the present application will be described in detail with reference to the accompanying drawings. The following embodiments are only used to more clearly illustrate the technical solution of the present application and are therefore only examples and are not intended to limit the scope of protection of the present application.

[0023] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those skilled in the art to which this application belongs; the terms used herein are only for the purpose of describing specific embodiments and are not intended to limit this application; the terms "including" and "having" and any variations thereof in the specification and claims of this application and the above-mentioned figure descriptions are intended to cover non-exclusive inclusions.

[0024] In the description of the embodiments of this application, the technical terms "first" and "second" are used only to distinguish different objects and should not be understood to indicate or imply relative importance or implicitly specify the quantity, specific order, or primary and secondary relationship of the indicated technical features. In the description of the embodiments of this application, the meaning of "plurality" is more than two, unless otherwise clearly and specifically defined.

[0025] References herein to "embodiments" mean that a particular feature, structure, or characteristic described in connection with the embodiments may be included in at least one embodiment of the present application. The appearance of this phrase in various places in the specification does not necessarily refer to the same embodiment, nor does it constitute an independent or alternative embodiment that is mutually exclusive of other embodiments. It is understood, both explicitly and implicitly, by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0026] In the description of the embodiments of this application, the term "and / or" is simply a description of the association relationship between associated objects, indicating that three relationships can exist. For example, A and / or B can represent the following three situations: A exists alone, A and B exist simultaneously, and B exists alone. In addition, the character " / " in this document generally indicates that the associated objects are in an "or" relationship.

[0027] In order to illustrate the technical solution described in this application, specific embodiments are provided below.

[0028] In an optional embodiment, combined with Figure 1 As shown, the embodiment of the present application provides a program control method, including:

[0029] Step 101: Detect a first resistance value connected to a heating element pin in a circuit board.

[0030] Optionally, the circuit board is a circuit board in an aerosol generating device. Optionally, the aerosol generating device may be a HNB (Heat Not Burning) device.

[0031] Heating-not-burning appliances heat the aerosol matrix through electric heating or other heating methods to release substances such as flavor components in the aerosol matrix. Since the aerosol matrix does not participate in combustion, it avoids the production of a large amount of harmful components due to high-temperature decomposition at 900°C. While meeting consumer needs, it reduces harm to the body and reduces environmental smoke pollution.

[0032] The heating element is a device used by the aerosol generating device to heat the aerosol matrix.

[0033] The circuit board is provided with pins for connecting to the heating element, namely the heating element pins.

[0034] When testing a circuit board, a resistance value is connected through the heater pin, and each target test item in the circuit board is tested under this resistance value.

[0035] Step 102 : determining a target program from the test program and the official program based on a numerical relationship between the first resistance value and the configured resistance range.

[0036] The test program is used to perform test processing on each target test item of the circuit board. The formal program is used to ensure the normal use of each function in the circuit board.

[0037] This configuration resistance range is determined based on the test resistance value provided by the test fixture. This test resistance value is used to test the heating element. The test fixture is used to test circuit boards and can connect a larger resistance value to the heating element pins on the circuit board.

[0038] Optionally, the minimum value in the configured resistance interval is greater than the resistance value of the actual heating element. In one example, the minimum value in the configured resistance interval may be approximately 10 times the resistance value of the actual heating element. For example, if the resistance value of the actual heating element is 0.5Ω, the configured resistance interval may be [4.5Ω, 5.5Ω].

[0039] By judging the numerical relationship between the first resistance value currently connected to the heater pin in the circuit board and the configured resistance range, it is determined whether the current heater is connected to a resistance value that matches the test state, and then the target program is determined from the test program and the formal program. By comparing the resistance values ​​connected to the heater pin, the current state of the circuit board is determined without occupying additional I / O interface resources.

[0040] In an optional implementation process, the circuit board can be placed on a test stand to detect resistance values ​​on the test stand that are significantly different from those of a normal heater, thereby entering a self-test program. The difference between the resistance value actually connected to the heater pin and the configured resistance range can be used to determine whether a formal program or a test program needs to be executed. This reduces misjudgments when the heater is normal and reduces the occupancy of I / O pins in the chip.

[0041] Optionally, the numerical relationship between the first resistance value and the configured resistance interval includes: the first resistance value is within the configured resistance interval, or the first resistance value is not within the configured resistance interval.

[0042] In an optional embodiment, step 102 determines the target program from the test program and the formal program based on the numerical relationship between the first resistance value and the configured resistance range, including:

[0043] When the first resistance value is within the configured resistance interval, the test program is determined as the target program; when the first resistance value is not within the configured resistance interval, the formal program is determined as the target program.

[0044] Step 103: execute the target program.

[0045] When the target program is determined to be a test program, the self-test process of the circuit board is triggered. When the target program is determined to be a formal program, the normal use of various functions in the circuit board is triggered.

[0046] The above-mentioned implementation process of the present application determines whether the current heater is connected to a resistance value that is compatible with the test state by judging the numerical relationship between the first resistance value currently connected to the heater pin in the circuit board and the configured resistance range, and then determines the target program from the test program and the formal program. By comparing the resistance values ​​connected to the heater pin, the test state or normal state of the current circuit board is determined, and finally the adapted application is executed to enter different circuit board processing processes. There is no need to occupy additional I / O interface resources, reducing the number of interfaces available for normal functions.

[0047] In some cases, operators cannot observe the status of the circuit board while it is performing self-tests. The lack of a status feedback mechanism during the test process prevents operators from using intuitive visual indicators to confirm the board's real-time test progress and interim results. This leads to inefficient fault location and makes it difficult to distinguish between test program anomalies and physical hardware damage.

[0048] On this basis, the following solutions are proposed in the embodiments of the present application.

[0049] In an alternative embodiment, in combination with Figure 2 As shown, if the target program is a test program, step 103 executes the target program, including:

[0050] Step 201: Obtain the user's test trigger operation.

[0051] The test triggering operation of the user is, for example, a touch operation on a specific key, a function operation on a specific component, a plugging operation on a specific interface, etc.

[0052] Step 202 : Based on the test triggering operation, each time a target test item to be executed is determined, a display screen connected to the circuit board is lit up.

[0053] Different test trigger operations by the user can determine different target test items. Each time a target test item is determined, the display screen connected to the circuit board is lit up once, reminding the user to start the test while displaying the relevant test content on the display screen.

[0054] In an optional embodiment, determining a target test item to be executed based on a test triggering operation includes:

[0055] In a case where the acquired test trigger operation is that a set button is touched, a set test item of the circuit board is determined as a target test item to be executed, where the set test item includes at least one of the following tests: resistance measurement in the circuit board, power-on test of the circuit board, temperature detection of the circuit board, display function test of a display screen connected to the circuit board, ranging function test of an infrared sensor in the circuit board, and power supply interface test in the circuit board;

[0056] When the acquired test trigger operation is that the microphone is blown, the airflow detection function of the microphone is used as the target test item to be executed;

[0057] In the case where the acquired test trigger operation is the charging interface being plugged into a charging power source, detecting whether the charging current is normal is set as the target test item to be executed.

[0058] The above process can determine the corresponding target test items through different test triggering operations, meet the testing requirements in different situations, and improve the convenience of user test triggering.

[0059] During implementation, each of the aforementioned target test items can be determined while the display screen connected to the circuit board is off. When different target test items begin to be implemented, the display screen is illuminated. While the display screen is illuminated, the corresponding test process is carried out and the relevant test items and test data are displayed, providing status feedback on the test process and test phases. Operators can confirm the real-time test progress and interim results of the board through intuitive visual indications, improving the efficiency of locating test faults and effectively determining the cause of the fault.

[0060] Step 203 : Based on the target program, a test operation of the target test item is executed, and the target test item and corresponding measurement values ​​are displayed on a display screen.

[0061] The above target test items can be executed in any order.

[0062] In an optional implementation process, the circuit board is placed on a test stand, and the large-value resistor on the test stand is connected to the heating element pin of the circuit board. At this time, the circuit board detects that the connected resistance value is large and is within the configured resistance range, and then executes the test program.

[0063] After detecting that the user has pressed a specific test button, some self-test functions in the circuit board can be turned on, the display screen can be lit, and self-test of some circuit functions can be started, including measuring resistance, power-on test of the circuit board, temperature test of the circuit board, etc. During the test, the current test item is displayed in real time through text. After the test passes, a screen test prompt action (such as outputting text, displaying a specific picture, indicator light, vibration, etc.) is issued to prompt the start of testing the display function of the screen. When the countdown is completed, the display screen is controlled to display several different pages simultaneously in full red, full blue, full green, and the main screen for a period of time, so that the operator can observe the quality of the screen. Then, the infrared sensor ranging test is performed. The operator passes his hand or a fixture in front of the infrared sensor to observe the value change and determine whether it is normal. The test items and the infrared ranging values ​​and value change information under different situations are displayed. After the test passes, if it is detected that the test time is reached or the self-test function of this part is completed, the screen will be turned off.

[0064] In addition, you can continue processing other test items.

[0065] For example, when the user blows on the microphone, the test of the airflow detection function of the microphone in the circuit board is triggered, and the airflow detection result of the microphone is displayed on the display screen. When the user blows on the microphone, the screen shows that there is airflow passing through the microphone. When the user stops blowing, it shows that there is no airflow passing. After the detection is completed, the display screen turns off.

[0066] Insert the charging power supply into the charging port of the circuit board, detect the charging current and display the detection value on the display screen, so that the user can judge whether the charging current is normal.

[0067] Step 204 : After each test operation of a target test item is completed, the flag of the target test item is set, and the display screen is controlled to turn off.

[0068] The above different test operations can be performed when the screen is off. There is no order requirement and the order can be adjusted according to the convenience and speed of operation.

[0069] After each target test item is tested successfully, its flag bit can be set.

[0070] When each pair of tests completes a target test item, the display screen is controlled to turn off and enter the device sleep state. The screen turning off can remind the user that the current test item has been tested.

[0071] The above implementation process associates different target test items with the lighting and extinguishing of the display screen to realize reminders of the start and end of the test. When the display screen is lit, the corresponding test processing process is implemented and the relevant test items and corresponding test data are output and displayed, and data feedback of the test process and test stage is realized. The operator can confirm the real-time test progress and interim results of the board through intuitive visual indications, improve the efficiency of locating test faults, and effectively determine the cause of the fault.

[0072] In an optional embodiment, executing the target program further includes:

[0073] When the display screen is off, if it is detected that the low power test switch is activated, the power consumption data of the circuit board is detected based on the target program; when the display screen is on, the power consumption data is displayed.

[0074] The user can toggle the low power switch of the test stand to trigger the power consumption data detection of the circuit board in the sleep state.

[0075] In this process, when the acquired test trigger operation is that the low-power switch of the test stand is turned on, the low-power detection of the circuit board in the sleep state (display screen is off) is used as the target test item to be executed.

[0076] The low-power test of the circuit board can be combined with the aforementioned screen-off and screen-on process of the display screen. When the display screen is off, if it is detected that the low-power test switch is in the on state, the low-power test process is automatically executed, and the power consumption data of the circuit board is automatically detected based on the target program. When the display screen is on, the power consumption data is displayed to achieve effective feedback output of the test data.

[0077] In some cases, since the test code and the main program (formal program) in the circuit board are in the same storage space, although they are isolated by software logic, there are still two hidden dangers: first, in extreme cases, the test program may interfere with the operation of the main program due to address overflow or pointer error; second, the test mode judgment logic may be falsely triggered by electromagnetic interference or voltage fluctuations, causing the device to abnormally enter the test state at the user end.

[0078] On this basis, the following solutions are proposed in the embodiments of the present application.

[0079] After executing the target program in step 103, the method further includes:

[0080] Check whether the flag bits of each target test item corresponding to the test program are all set; if the flag bits of each target test item are all set, delete the test program or close the program entry of the test program.

[0081] During the implementation process, after all target test items are successfully tested, you can jump to the formal program, close the self-test program entrance or destroy the test program part, and effectively avoid the test program interfering with the use of the formal program.

[0082] In an optional embodiment, after deleting the test program or closing the program entry of the test program, the method further includes:

[0083] When it is detected that the heating element pin in the circuit board is connected to the second resistance value, the formal procedure is executed.

[0084] After deleting the test program or closing the program entry of the test program, the only program available in the circuit board is the formal program. Therefore, when it is detected that the heater pin in the circuit board is connected to the second resistance value, it is considered that the heater pin of the current circuit board is connected to the heater, and the second resistance is the resistance value of the heater itself. At this time, the formal program is executed to ensure the normal use of various functions in the circuit board.

[0085] It should be understood that, although the various steps in the flowcharts involved in the various embodiments described above are displayed in sequence according to the instructions of the arrows, these steps are not necessarily executed in sequence in the order indicated by the arrows. Unless otherwise specified herein, there is no strict order restriction on the execution of these steps, and these steps can be executed in other orders. Moreover, at least a portion of the steps in the flowcharts involved in the various embodiments described above can include multiple steps or multiple stages, and these steps or stages are not necessarily executed and completed at the same time, but can be executed at different times, and the execution order of these steps or stages is not necessarily to be carried out in sequence, but can be executed in turn or alternately with other steps or at least a portion of steps or stages in other steps.

[0086] Based on the same inventive concept, the present application also provides a program control device. The program control device provided in the present application can implement each process of the program control method embodiment described above and achieve the same technical effect. Therefore, the specific limitations in one or more program control device embodiments provided below can refer to the limitations of the program control method described above. To avoid repetition, they are not further described here.

[0087] In this embodiment, the computing side can be divided into functional modules according to the above method. For example, each function can be divided into functional modules, or two or more functions can be integrated into one processing module.

[0088] See also Figure 3 , Figure 3 This is a module diagram of a program control device provided in an embodiment of the present application. For the sake of convenience, only the parts related to the embodiment of the present application are shown.

[0089] The program control device 300 includes:

[0090] The detection module 301 is used to detect the first resistance value connected to the heating element pin in the circuit board;

[0091] A determination module 302 is configured to determine a target program from a test program and a formal program based on a numerical relationship between the first resistance value and a configured resistance interval, wherein the configured resistance interval is determined based on a test resistance value provided by a test stand, wherein the test resistance value is used to perform a test on the heating element;

[0092] The execution module 303 is used to execute the target program.

[0093] Optionally, the determination module 302 is specifically configured to:

[0094] In a case where the first resistance value is within the configured resistance range, determining the test program as the target program;

[0095] When the first resistance value is not within the configured resistance range, the official program is determined as the target program.

[0096] Optionally, if the target program is the test program, the execution module 303 is specifically configured to:

[0097] Get the user's test trigger action;

[0098] Based on the test triggering operation, each time a target test item to be executed is determined, lighting up a display screen connected to the circuit board;

[0099] executing a test operation of the target test item based on the target program, and displaying the target test item and corresponding measurement values ​​on the display screen;

[0100] After each test operation of the target test item is completed, the flag bit of the target test item is set to control the display screen to turn off.

[0101] Optionally, the execution module 303 is specifically configured to:

[0102] In a case where the acquired test trigger operation is that a set button is touched, determining a set test item of the circuit board as a target test item to be executed, the set test item including at least one of the following tests: resistance measurement in the circuit board, power-on test of the circuit board, temperature detection of the circuit board, display function test of the display screen connected to the circuit board, ranging function test of the infrared sensor in the circuit board, and power supply interface test in the circuit board;

[0103] When the acquired test trigger operation is blowing of the microphone, the airflow detection function of the microphone is used as the target test item to be executed;

[0104] In a case where the acquired test triggering operation is the charging interface being plugged into a charging source, detecting whether the charging current is normal is taken as a target test item to be executed.

[0105] Optionally, the execution module 303 is further specifically configured to:

[0106] When the display screen is off, if it is detected that the low power consumption test switch is activated, detecting the power consumption data of the circuit board based on the target program;

[0107] When the display screen is lit, the power consumption data is displayed.

[0108] Optionally, the device further comprises:

[0109] Program processing module, used to:

[0110] Detecting whether the flag bits of each target test item corresponding to the test program are all set;

[0111] When the flag bits of all the target test items are set, the test program is deleted, or the program entry of the test program is closed.

[0112] Optionally, the execution module 303 is further specifically configured to:

[0113] When it is detected that the heating element pin in the circuit board is connected to a second resistance value, the formal procedure is executed.

[0114] The above integrated modules can be implemented in the form of hardware. It should be noted that the division of modules in this embodiment is schematic and is only a logical function division. In actual implementation, there may be other division methods.

[0115] It should be noted that the relevant contents of each step involved in the above method embodiment can be referred to the functional description of the corresponding functional module and will not be repeated here.

[0116] In one embodiment, Figure 4 As shown, an electronic device is provided. The electronic device 4 of this embodiment includes: at least one processor 400 ( Figure 4 Only one is shown), a memory 401 and a computer program 402 stored in the memory 401 and executable on the at least one processor 400, wherein the processor 400 implements the steps of any of the above-mentioned method embodiments when executing the computer program 402.

[0117] The electronic device 4 may be an aerosol generating device, such as an HNB device; or a circuit board in an aerosol generating device. The electronic device 4 may include, but is not limited to, a processor 400 and a memory 401. It will be understood by those skilled in the art that Figure 4 It is only an example of the electronic device 4 and does not constitute a limitation of the electronic device 4. It may include more or fewer components than shown in the figure, or a combination of certain components, or different components. For example, the electronic device may also include input and output devices, network access devices, buses, etc.

[0118] The processor 400 may be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. A general-purpose processor may be a microprocessor or any conventional processor.

[0119] The memory 401 may be an internal storage unit of the electronic device 4, such as a hard disk or memory of the electronic device 4. The memory 401 may also be an external storage device of the electronic device 4, such as a plug-in hard disk, a smart media card (SMC), a secure digital (SD) card, a flash card, etc. equipped on the electronic device 4. Furthermore, the memory 401 may include both an internal storage unit of the electronic device 4 and an external storage device. The memory 401 is used to store the computer program and other programs and data required by the electronic device. The memory 401 may also be used to temporarily store data that has been output or is about to be output.

[0120] Those skilled in the art can clearly understand that, for the convenience and brevity of description, only the division of the above-mentioned functional units and modules is used as an example for illustration. In actual applications, the above-mentioned functions can be distributed and completed by different functional units and modules as needed, that is, the internal structure of the device can be divided into different functional units or modules to complete all or part of the functions described above. The functional units and modules in the embodiment can be integrated into one processing unit, or each unit can exist physically alone, or two or more units can be integrated into one unit. The above-mentioned integrated unit can be implemented in the form of hardware or in the form of software functional units. In addition, the specific names of the functional units and modules are only for the convenience of distinguishing each other, and are not used to limit the scope of protection of this application. The specific working process of the units and modules in the above-mentioned system can refer to the corresponding process in the aforementioned method embodiment, and will not be repeated here.

[0121] In the above embodiments, the description of each embodiment has its own focus. For parts that are not described or recorded in detail in a certain embodiment, reference can be made to the relevant description of other embodiments.

[0122] Those skilled in the art will appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0123] In the embodiments provided in the present application, it should be understood that the disclosed devices / electronic devices and methods can be implemented in other ways. For example, the device / electronic device embodiments described above are merely schematic. For example, the division of the modules or units is merely a logical function division. In actual implementation, there may be other division methods, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of devices or units, which can be electrical, mechanical or other forms.

[0124] The units described as separate components may or may not be physically separate, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed across multiple network units. Some or all of these units may be selected to achieve the purpose of this embodiment according to actual needs.

[0125] In addition, the functional units in the various embodiments of the present application may be integrated into a single processing unit, or each unit may exist physically separately, or two or more units may be integrated into a single unit. The aforementioned integrated units may be implemented in the form of hardware or software functional units.

[0126] If the integrated module / unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the present application implements all or part of the process in the above-mentioned embodiment method, and can also be completed by instructing the relevant hardware through a computer program. The computer program can be stored in a computer-readable storage medium, and when the computer program is executed by the processor, it can implement the steps of the above-mentioned various method embodiments. Among them, the computer program includes computer program code, and the computer program code can be in source code form, object code form, executable file or some intermediate form. The computer-readable medium may include: any entity or device capable of carrying the computer program code, recording medium, USB flash drive, mobile hard disk, magnetic disk, optical disk, computer memory, read-only memory (ROM), random access memory (RAM), electric carrier signal, telecommunication signal and software distribution medium. It should be noted that the content contained in the computer-readable medium can be appropriately increased or decreased according to the requirements of legislation and patent practice in the jurisdiction. For example, in some jurisdictions, according to legislation and patent practice, computer-readable media do not include electric carrier signals and telecommunication signals.

[0127] The present application implements all or part of the processes in the above-mentioned embodiment methods, and may also be implemented through a computer program product. When the computer program product runs on an electronic device, the electronic device can implement the steps in the above-mentioned method embodiments when executing the computer program product.

[0128] The above-described embodiments are only used to illustrate the technical solutions of the present application, rather than to limit them. Although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. These modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the various embodiments of the present application, and should all be included in the scope of protection of the present application.

Claims

1. A program control method, characterized in that: include: Detecting a first resistance value connected to a heating element pin in a circuit board; Determining a target program from a test program and a formal program based on a numerical relationship between the first resistance value and a configuration resistance interval, wherein the configuration resistance interval is determined based on a test resistance value provided by a test stand; Execute the target program.

2. The method according to claim 1, characterized in that The determining of the target program from the test program and the formal program based on the numerical relationship between the first resistance value and the configuration resistance range includes: In a case where the first resistance value is within the configured resistance range, determining the test program as the target program; When the first resistance value is not within the configured resistance range, the official program is determined as the target program.

3. The method according to claim 1, characterized in that If the target program is the test program, executing the target program includes: Get the user's test trigger action; Based on the test triggering operation, each time a target test item to be executed is determined, lighting up a display screen connected to the circuit board; executing a test operation of the target test item based on the target program, and displaying the target test item and corresponding measurement values ​​on the display screen; After each test operation of the target test item is completed, the flag bit of the target test item is set to control the display screen to turn off.

4. The method according to claim 3, characterized in that Determining target test items to be executed based on the test triggering operation includes: In a case where the acquired test trigger operation is that a set button is touched, determining a set test item of the circuit board as a target test item to be executed, the set test item including at least one of the following tests: resistance measurement in the circuit board, power-on test of the circuit board, temperature detection of the circuit board, display function test of the display screen connected to the circuit board, ranging function test of the infrared sensor in the circuit board, and power supply interface test in the circuit board; When the acquired test trigger operation is blowing of the microphone, the airflow detection function of the microphone is used as the target test item to be executed; In a case where the acquired test triggering operation is that the charging interface is plugged into a charging power source, detecting whether the charging current is normal is taken as a target test item to be executed.

5. The method according to claim 3, characterized in that The executing of the target program further includes: When the display screen is off, if it is detected that the low power consumption test switch is activated, detecting the power consumption data of the circuit board based on the target program; When the display screen is lit, the power consumption data is displayed.

6. The method according to claim 1, characterized in that After executing the target program, the method further includes: Detecting whether the flag bits of each target test item corresponding to the test program are all set; When the flag bits of all the target test items are set, the test program is deleted, or the program entry of the test program is closed.

7. The method according to claim 6, characterized in that After deleting the test program or closing the program entry of the test program, the method further includes: When it is detected that the heating element pin in the circuit board is connected to a second resistance value, the formal procedure is executed.

8. A program control device, characterized in that: include: A detection module, used for detecting a first resistance value connected to a heating element pin in a circuit board; a determination module, configured to determine a target program from a test program and a formal program based on a numerical relationship between the first resistance value and a configuration resistance interval; the configuration resistance interval is determined based on a test resistance value provided by a test stand; An execution module is used to execute the target program.

9. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 7 are implemented.

10. A computer-readable storage medium storing a computer program, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 7 are implemented.

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