Automatic test system of DCS (Distributed Control System) equipment

Abstract

The invention discloses an automatic test system for DCS equipment, and the system achieves an automatic test process through an integrated control center, a matrix change-over switch, a terminal strip, an input / output IO test tool and an integrated test tool. And the control center stores a terminal-offset address corresponding relation table and a plurality of test cases, and realizes rapid switching between a single test and an integrated test by controlling the matrix change-over switch. In the single body test stage, the control center controls the IO test tool to carry out batch DCS IO variable automatic test by closing single body test contacts of the matrix change-over switch and utilizing the switching matrix and the terminal strip; and in the integration test stage, the control center controls the integration test contact to be closed and dispatches the integration test tool to carry out the integration test. According to the system, manual intervention is effectively reduced, and the testing efficiency and accuracy are improved. According to the invention, manual operation errors are reduced, and the efficiency and accuracy of DCS testing are improved.

Description

Technical Field

[0001] The present application relates to the field of automated control technology, and in particular to an automatic testing system for DCS equipment. Background Art

[0002] In a distributed control system (DCS), factory testing is divided into three main phases: unit testing, integration testing, and system testing. The unit testing and integration testing phases must be performed sequentially, meaning the unit testing phase must be completed using a test device before the integration testing phase can be performed using the test device. Different test devices are used in the unit testing and integration testing phases (for example, test transposition A is used in the unit testing phase, while test transposition B is used in the integration testing phase). Therefore, after completing the unit testing phase and entering the integration testing phase, testers are required to manually disconnect the DCS internal cabinet from test transposition A and then connect the DCS internal cabinet to test device B. This process is prone to human error and may result in damage to equipment such as boards. Furthermore, due to the large amount of manual operation, testing efficiency is significantly affected, resulting in wasted time and additional risks.

[0003] Therefore, how to optimize the wiring process and reduce manual intervention to improve test efficiency and reduce errors is a technical problem that technicians in this field urgently need to solve. Summary of the Invention

[0004] Based on the above problems, the present application provides an automatic testing system for DCS equipment, which can optimize the wiring process and reduce manual intervention to improve testing efficiency and reduce errors.

[0005] The embodiments of this application disclose the following technical solutions:

[0006] An automatic test system for DCS equipment, comprising: a control center, a matrix switching switch, a terminal block, an input / output (IO) test fixture, and an integrated test fixture; the control center stores a terminal-offset address correspondence table and multiple test cases; the matrix switching switch includes a single test contact A, an integrated test contact B, and a common contact C; the single test contact A is connected to the IO test fixture, and the integrated test contact B is connected to the integrated test fixture; the matrix switching switch is provided with a switching matrix, wherein each port in the switching matrix corresponds to a pair of terminals in the terminal block;

[0007] The control center is connected to the IO test fixture, the integrated test fixture and the matrix switch respectively; the terminal block is connected to the IO test fixture; the terminal block is also connected to the distributed control system DCS through the matrix switch, and the terminals in the terminal block are connected through the switching matrix of the matrix switch; the integrated test fixture and the DCS are connected through the matrix switch;

[0008] When the DCS enters the single-stage IO channel test, the control center is used to control the single-stage test contact of the matrix switch to close, and based on the terminal-offset address correspondence table and the multiple test cases, control the IO test tool to perform DCS IO variable batch automatic testing through the switching matrix of the matrix switch and the terminal block;

[0009] When the DCS switches from the single-stage IO channel test to the integrated stage test, the control center is used to control the integrated test contacts of the matrix switch to close, and control the integrated test tooling to perform the DCS integrated test.

[0010] In one possible implementation, when the DCS enters the single-stage IO channel test, the control center is specifically configured to:

[0011] The IO ports in the test case are traversed, and for each IO port in the test case, the port is set as the IO port to be tested, and the offset address of the IO port to be tested is determined in the correspondence between the terminal and the offset address according to the marked name of the IO port to be tested.

[0012] In a possible implementation, when the DCS enters the single-stage IO channel test, the control center is further configured to:

[0013] For each IO port to be tested, the corresponding port of the switching matrix in the matrix switch is controlled to be closed according to its offset address, so as to realize the physical connection of the corresponding terminal of the switching matrix in the terminal block.

[0014] In a possible implementation, when the DCS enters the single-stage IO channel test, the control center is further configured to:

[0015] For each IO port to be tested, a communication protocol and an actual roll call name of the IO port to be tested are determined in the test case, so as to communicate with the IO port to be tested based on the communication protocol and the actual roll call name.

[0016] In a possible implementation, the multiple test cases include a digital input DI test case, a digital output DO test case, an analog input AI test case, and an analog output AO test case.

[0017] In one possible implementation, when the IO port to be tested is the DI test case or the AI ​​test case, the control center is specifically configured to: send a test signal to the IO port to be tested, receive a first feedback signal fed back by the IO port to be tested based on the test signal, and verify an input response of the IO port to be tested based on the first feedback signal to complete the test of the IO port to be tested; the first feedback signal is a level value or signal strength of the IO port to be tested.

[0018] In one possible implementation, when the IO port to be tested is the DO test case or the AO test case, the control center is specifically used to: notify the IO port to be tested to feed back a second feedback signal, and evaluate the output performance of the IO port to be tested based on the second feedback signal to complete the test of the IO port to be tested; the second feedback signal is the output voltage or current value of the IO port to be tested.

[0019] In a possible implementation, the matrix switch is in the form of a plug-in card.

[0020] In a possible implementation, the annotated point name of each IO port in the test case corresponds one-to-one to an address entry in the terminal-offset address correspondence table.

[0021] In a possible implementation, the control center further includes a display module;

[0022] The display module is used to display the test status, feedback signal and test progress in real time.

[0023] Compared with the existing technology, this application has the following beneficial effects:

[0024] The present application provides an automatic testing system for DCS equipment. Specifically, the system includes a control center, a matrix switching switch, a terminal block, an input / output (IO) test fixture, and an integrated test fixture. The control center stores a terminal-offset address correspondence table and multiple test cases. The matrix switching switch includes single-unit test contacts, integrated test contacts, and common contacts, wherein the single-unit test contacts are connected to the IO test fixture, and the integrated test contacts are connected to the integrated test fixture. A port in the switching matrix corresponds to a pair of terminals in the terminal block. The control center is connected to the IO test fixture, the integrated test fixture, and the matrix switching switch respectively, and the terminal block is connected to the IO test fixture and the DCS, and the connection is achieved through the switching matrix of the matrix switching switch. When the DCS enters the single-unit stage IO channel test, the control center controls the single-unit test contacts of the matrix switching switch to close, and based on the terminal-offset address correspondence table and multiple test cases, controls the IO test fixture to perform batch automatic testing of DCS IO variables through the switching matrix and terminal block. When the DCS switches from the unit test phase to the integration test phase, the control center controls the integration test contacts of the matrix switching switch to close, and performs integration testing of the DCS through the integration test fixture. This application eliminates the manual connection and disconnection test transposition operations through automated control, thereby greatly reducing the risk of human error and avoiding equipment damage caused by improper operation. At the same time, the automatic test system can quickly switch between the unit test phase and the integration test phase, improving test efficiency and avoiding time waste and process interruption in traditional methods. In addition, the control center can perform DCS IO channel testing in batches and automatically through the preset terminal-offset address correspondence table and test cases, reducing human intervention and ensuring the accuracy and consistency of test results. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] In order to more clearly illustrate the technical solutions in this embodiment or the prior art, the following is a brief introduction to the drawings required for use in the embodiments or the prior art descriptions. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0026] Figure 1 A structural diagram of an automatic test system for DCS equipment provided in an embodiment of the present application;

[0027] Figure 2 A front view of a plug-in card matrix switch provided in an embodiment of the present application;

[0028] Figure 3 This is a rear view of a plug-in card matrix switch provided in an embodiment of the present application. DETAILED DESCRIPTION

[0029] To facilitate understanding of the technical solutions provided by the embodiments of the present application, the background technology involved in the embodiments of the present application will be described below.

[0030] In a distributed control system (DCS), factory testing is divided into three phases: unit testing, integration testing, and system testing. Unit testing and integration testing must be performed sequentially. The two phases utilize different test equipment: unit testing uses a unit test fixture, while integration testing uses an integration test fixture. Therefore, after completing unit testing, testers must manually disconnect the DCS cabinet from the unit test fixture and then reconnect it to the integration test fixture. This manual switching process is prone to operational errors and may damage equipment. Furthermore, the extensive manual effort reduces testing efficiency, increases time costs, and increases risk.

[0031] In order to solve this problem, an embodiment of the present application provides an automatic test system for DCS equipment, which includes a control center, a matrix switching switch, a terminal block, an input and output IO test tool and an integrated test tool. The control center stores a terminal-offset address correspondence table and multiple test cases, and is responsible for overall test management. The matrix switching switch is provided with single test contacts, integrated test contacts and common contacts, wherein the single test contacts are connected to the IO test tool, the integrated test contacts are connected to the integrated test tool, and each port of the switching matrix corresponds to the terminal in the terminal block. The control center is connected to the IO test tool, the integrated test tool and the matrix switching switch respectively, and the terminal block is connected to the test tool and the DCS system at the same time, and the dynamic switching of the signal path is realized through the matrix switching switch. When the DCS enters the single IO channel test phase, the control center controls the matrix switching switch to close the single test contact, and based on the address correspondence table and test cases, automatically executes IO variable tests in batches by switching the matrix and terminal blocks; when switching to the integrated test phase, the control center switches the matrix switching switch to the integrated test contact, controls the integrated test tooling to perform integrated testing on the DCS, and realizes full-process automated test management. This application eliminates the manual connection and disconnection of test devices through automated control, greatly reduces the risk of human error, and avoids equipment damage caused by improper operation. At the same time, the automatic test system can quickly switch between the single test phase and the integrated test phase, which improves test efficiency and reduces time waste and process interruptions in traditional methods. In addition, the control center can perform IO channel testing of the DCS in batches and automatically through the preset terminal-offset address correspondence table and test cases, reducing manual intervention and ensuring the accuracy and consistency of the test results.

[0032] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of this application, and do not represent all the embodiments of the automatic test system for DCS equipment. All other embodiments derived by persons of ordinary skill in the art based on the embodiments of this application without inventive effort are within the scope of protection of this application.

[0033] See also Figure 1 , Figure 1 This is a structural diagram of an automatic test system for DCS equipment provided in an embodiment of the present application.

[0034] like Figure 1 The system shown includes a control center, a matrix switching switch, a terminal block, an IO test fixture and an integrated test fixture.

[0035] The control center stores a terminal-offset address correspondence table and multiple test cases; the matrix switch includes a single test contact A, an integrated test contact B, and a common contact C. The single test contact A is connected to the IO test fixture, and the integrated test contact B is connected to the integrated test fixture; the matrix switch is provided with a switching matrix, and one port in the switching matrix corresponds to a pair of terminals in the terminal block;

[0036] The control center is respectively connected to the IO test tool, the integrated test tool and the matrix switching switch; the terminal block is connected to the IO test tool; the terminal block is also connected to the distributed control system DCS through the matrix switching switch, and the terminals in the terminal block are connected through the switching matrix of the matrix switching switch; the integrated test tool is connected to the DCS through the matrix switching switch.

[0037] When the DCS enters the single-stage IO channel test, the control center is used to control the single-stage test contact of the matrix switch to close, and based on the terminal-offset address correspondence table and the multiple test cases, control the IO test tool to perform DCS IO variable batch automatic testing through the switching matrix of the matrix switch and the terminal block;

[0038] When the DCS switches from the single-stage IO channel test to the integrated stage test, the control center is used to control the integrated test contacts of the matrix switch to close, and control the integrated test tooling to perform the DCS integrated test.

[0039] For example, assuming there are two terminal blocks, one is 101BN and the other is 102BN, the terminal number and offset address corresponding to each variable are defined for these two terminal blocks, as shown in Table 1:

[0040] Table 1 Terminal-offset address correspondence table

[0041] Serial number variable Terminal blocks Terminal number Offset address 1 HYRIS234SY 101BN 1A, 1B 10101 2 HYRIS235SY 101BN 2A, 2B 10102 3 HYRIS236SY 101BN 3A, 3B 10103 4 HYRIS237SY 101BN 4A, 4B 10104 5 HYRIS238SY 101BN 5A, 5B 10105 6 HYRIS239SY 101BN 6A, 6B 10106 7 HYRIS240SY 101BN 7A, 7B 10107 8 HYRIS241SY 101BN 8A, 8B 10108 9 HYRIS242SY 101BN 9A, 9B 10109 10 HYRIS243SY 101BN 10A, 10B 10110 11 HYRIS244SY 102BN 1A, 1B 10201 12 HYRIS245SY 102BN 2A, 2B 10202 13 HYRIS246SY 102BN 3A, 3B 10203 14 HYRIS247SY 102BN 4A, 4B 10204 15 HYRIS248SY 102BN 5A, 5B 10205 16 HYRIS249SY 102BN 6A, 6B 10206 17 HYRIS250SY 102BN 7A, 7B 10207 18 HYRIS251SY 102BN 8A, 8B 10208 19 HYRIS252SY 102BN 9A, 9B 10209 20 HYRIS253SY 102BN 10A, 10B 10210

[0042] Table 1 defines the corresponding terminal blocks for each variable, along with the corresponding terminal numbers and offset addresses. For example, the first variable, HYRIS234SY, is located on terminals 1A and 1B on terminal block 101BN, corresponding to offset address 10101. This correspondence helps the control center accurately select the correct terminal connection path during testing, ensuring test accuracy and effectiveness. The variables in Table 1 are the annotation points.

[0043] In one possible implementation, when the DCS enters the single-stage IO channel test, the control center performs the following specific operations:

[0044] First, traverse the IO ports in the test case: the control center will first check all IO ports in the test case.

[0045] Secondly, set the IO port to be tested: For each IO port, the control center marks it as a port to be tested and prepares for the corresponding test.

[0046] Then, search for the marked point name: according to the marked point name of the IO port to be tested, the control center searches in the terminal and offset address correspondence table.

[0047] Finally, determine the offset address: Through the search, the control center can determine the offset address of the IO port to be tested and prepare relevant information for subsequent tests.

[0048] This process ensures that the offset address of each IO port is accurately confirmed when performing IO channel testing, making the testing process more efficient and accurate.

[0049] In a possible implementation, when the DCS enters the single-stage IO channel test, the specific operation steps of the control center further include:

[0050] First, the matrix switching is controlled according to the offset address: for each IO port to be tested, the control center first identifies the matrix switching switch that needs to be operated through its offset address.

[0051] Then, the switch matrix closes the corresponding port: the control center instructs the matrix switch to close the corresponding port based on the offset address. This process ensures that the correct connection is established between the IO port to be tested and the specific terminal in the physical terminal block.

[0052] Finally, physical connection is achieved: through the control of the switching matrix, the DCS system can physically connect the IO port to be tested with the corresponding terminal in the terminal block, thereby completing the test preparation of the IO port.

[0053] This process ensures that when performing IO channel testing, there is a correct physical connection between the tested port and the actual hardware, allowing accurate and effective testing.

[0054] In a possible implementation, when the DCS enters the single-stage IO channel test, the specific operations of the control center further include:

[0055] First, determine the communication protocol and actual name of the IO port to be tested: For each IO port to be tested, the control center obtains the port's communication protocol and actual name information from the test case. This information includes the communication standard (such as Modbus, Ethernet / IP, etc.) and the actual address or identifier associated with the IO port.

[0056] Next, the control center communicates with the IO port under test: Based on the communication protocol and the actual roll call, the control center establishes a connection with the IO port under test through an appropriate communication method to perform data transmission or control operations. This process typically includes sending test commands and reading or writing data.

[0057] Finally, verify the communication process: The control center verifies whether the normal function of the port meets expectations by communicating with the IO port to be tested, ensuring that its role in the entire system can be correctly performed.

[0058] This process ensures that when conducting IO channel testing, each IO port is not only correctly connected to the hardware, but also works properly in terms of communication protocol and data transmission, thereby ensuring the accuracy and effectiveness of the test.

[0059] In one possible implementation, the multiple test cases include digital input (DI) test cases, digital output (DO) test cases, analog input (AI) test cases, and analog output (DO) test cases.

[0060] As shown in Table 2, Table 2 is an example of a DI test case provided by this application:

[0061] Table 2 DI test cases

[0062]

[0063] As shown in Table 3, Table 3 is an example of a DO test case provided by this application:

[0064] Table 3DO test cases

[0065]

[0066]

[0067] As shown in Table 4, Table 4 is an example of an AI test case provided by this application:

[0068] Table 4 AI test cases

[0069]

[0070] As shown in Table 5, Table 5 is an example of an AO test case provided by this application:

[0071] Table 5 AO test cases

[0072]

[0073] In a possible implementation, when the IO port to be tested is the DI test case or the AI ​​test case, the specific operations of the control center include:

[0074] First, a test signal is issued: Based on the test case, the control center sends a preset test signal through the control system to the DI or AI port under test. For DI ports, this is usually a binary signal (such as a high or low level); for AI ports, this is usually an analog signal (such as a change in voltage or current).

[0075] Then, the feedback signal is received: the IO port under test generates a feedback signal based on the received test signal and returns the feedback signal to the control center. This feedback signal may be the port's level value (for DI port) or signal strength (for AI port).

[0076] Next, the control center verifies the input response based on the received first feedback signal. This includes determining whether the voltage level or signal strength is within the specified range to confirm whether the port is responding correctly to the test signal.

[0077] Finally, the test is completed: if the input response is normal, the test is considered passed; if the response is abnormal, the control center will further analyze the problem and may make adjustments or mark the port as requiring further maintenance.

[0078] This process ensures that both DI test cases and AI test cases can correctly receive and respond to external signals in actual work, thereby verifying whether their functions are normal.

[0079] In a possible implementation, when the IO port to be tested is the DO test case or the AO test case, the specific operations of the control center include:

[0080] First, the feedback signal is notified: The control center first instructs the IO port under test to output a signal according to the requirements of the DO or AO test case. For DO ports, this usually means outputting a specific level signal (such as a high or low level); for AO ports, this usually means outputting an analog signal (such as a certain voltage or current value).

[0081] Then, a second feedback signal is received: After the IO port under test outputs the test signal, a feedback signal is generated and returned to the control center. The second feedback signal may be the output voltage value (for AO ports) or current value (for AO ports), or the level value of the digital output signal (for DO ports).

[0082] Next, output performance is evaluated: Based on the received second feedback signal, the control center evaluates the output performance of the IO port under test. This includes checking whether the output voltage, current value, or level signal is within the specified range and comparing it with the expected output standard.

[0083] Finally, the test is completed: if the output performance meets the expected requirements, the test is considered passed; if the output performance does not meet the standards, the control center may conduct further analysis to find the cause and make necessary adjustments to the port or mark it as requiring maintenance.

[0084] Through this process, the control center can verify whether the output signals of the DO and AO ports meet the system requirements, thereby ensuring the normal output performance of each part of the system and ensuring the accuracy and completeness of the test.

[0085] In a possible implementation, the matrix switch is in the form of a plug-in card, such as Figure 2 and Figure 3 shown.

[0086] In a possible implementation, the annotated point name of each IO port in the test case corresponds one-to-one to an address entry in the terminal-offset address correspondence table.

[0087] In a possible implementation, the control center further includes a display module;

[0088] The display module is used to display the test status, feedback signal and test progress in real time.

[0089] This application eliminates manual operations through automated control, reduces the risk of human error and equipment damage, while improving test efficiency and accuracy, achieving rapid switching between unit testing and integration testing, and ensuring the efficiency and consistency of the testing process.

[0090] The above is a detailed introduction to the automatic test system for DCS equipment provided by the present application. The various embodiments in the specification are described in a progressive manner, and each embodiment focuses on the differences from other embodiments. The same or similar parts between the various embodiments can be referred to each other. For the devices disclosed in the embodiments, since they correspond to the methods disclosed in the embodiments, the description is relatively simple, and the relevant parts can be referred to the method section. It should be pointed out that for ordinary technicians in this technical field, without departing from the principles of the present application, several improvements and modifications can be made to the present application, and these improvements and modifications also fall within the scope of protection of the claims of the present application.

[0091] It should be understood that in this application, "at least one (item)" means one or more, and "plurality" means two or more. "And / or" is used to describe the association relationship of associated objects, indicating that three relationships may exist. For example, "A and / or B" can mean: only A exists, only B exists, and A and B exist at the same time, where A and B can be singular or plural. The character " / " generally indicates that the previous and next associated objects are in an "or" relationship. "At least one of the following items" or similar expressions refers to any combination of these items, including any combination of single items or plural items. For example, at least one of a, b or c can mean: a, b, c, "a and b", "a and c", "b and c", or "a and b and c", where a, b, c can be single or multiple.

[0092] It should also be noted that, in this document, relational terms such as first and second, etc., are used only to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "comprises," "comprising," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or device comprising a series of elements includes not only those elements, but also other elements not explicitly listed, or elements inherent to such process, method, article, or device. In the absence of further limitations, an element defined by the phrase "comprising a ..." does not exclude the presence of additional identical elements in the process, method, article, or device comprising the element.

[0093] The above description of the disclosed embodiments is intended to enable one skilled in the art to implement or use the present application. Various modifications to these embodiments will be readily apparent to one skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the present application. Therefore, the present application is not limited to the embodiments shown herein, but is intended to conform to the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. An automatic test system for DCS equipment, characterized in that: The test system includes: a control center, a matrix switching switch, a terminal block, an input / output (IO) test fixture, and an integrated test fixture; the control center stores a terminal-offset address correspondence table and multiple test cases; the matrix switching switch includes a single test contact A, an integrated test contact B, and a common contact C; the single test contact A is connected to the IO test fixture, and the integrated test contact B is connected to the integrated test fixture; the matrix switching switch is provided with a switching matrix, and one port in the switching matrix corresponds to a pair of terminals in the terminal block; The control center is connected to the IO test fixture, the integrated test fixture and the matrix switch respectively; the terminal block is connected to the IO test fixture; the terminal block is also connected to the distributed control system DCS through the matrix switch, and the terminals in the terminal block are connected through the switching matrix of the matrix switch; the integrated test fixture and the DCS are connected through the matrix switch; When the DCS enters the single-stage IO channel test, the control center is used to control the single-stage test contact of the matrix switch to close, and based on the terminal-offset address correspondence table and the multiple test cases, control the IO test tool to perform DCS IO variable batch automatic testing through the switching matrix of the matrix switch and the terminal block; When the DCS switches from the single-stage IO channel test to the integrated stage test, the control center is used to control the integrated test contacts of the matrix switch to close, and control the integrated test tooling to perform the DCS integrated test.

2. The system according to claim 1, wherein: When the DCS enters the single-stage IO channel test, the control center is specifically used to: The IO ports in the test case are traversed, and for each IO port in the test case, the port is set as the IO port to be tested, and the offset address of the IO port to be tested is determined in the correspondence between the terminal and the offset address according to the marked name of the IO port to be tested.

3. The system according to claim 2, characterized in that When the DCS enters the single-stage IO channel test, the control center is also used to: For each IO port to be tested, the corresponding port of the switching matrix in the matrix switch is controlled to be closed according to its offset address, so as to realize the physical connection of the corresponding terminal of the switching matrix in the terminal block.

4. The system according to claim 3, characterized in that When the DCS enters the single-stage IO channel test, the control center is also used to: For each IO port to be tested, a communication protocol and an actual roll call name of the IO port to be tested are determined in the test case, so as to communicate with the IO port to be tested based on the communication protocol and the actual roll call name.

5. The system according to claim 2, wherein: The multiple test cases include digital input DI test cases, digital output DO test cases, analog input AI test cases and analog output AO test cases.

6. The system according to claim 5, characterized in that When the IO port to be tested is the DI test case or the AI ​​test case, the control center is specifically configured to: send a test signal to the IO port to be tested, receive a first feedback signal fed back by the IO port to be tested based on the test signal, and verify an input response of the IO port to be tested based on the first feedback signal to complete the test of the IO port to be tested; the first feedback signal is a level value or signal strength of the IO port to be tested.

7. The system according to claim 5, characterized in that When the IO port to be tested is the DO test case or the AO test case, the control center is specifically used to: notify the IO port to be tested to feed back a second feedback signal, and evaluate the output performance of the IO port to be tested based on the second feedback signal to complete the test of the IO port to be tested; the second feedback signal is the output voltage or current value of the IO port to be tested.

8. The system according to any one of claims 1 to 7, characterized in that: The matrix switch is in the form of a plug-in board.

9. The system according to claim 2, wherein: The labeled point name of each IO port in the test case corresponds one-to-one to the address entry in the terminal-offset address correspondence table.

10. The system according to any one of claims 1 to 9, characterized in that: The control center also includes a display module; The display module is used to display the test status, feedback signal and test progress in real time.

Images