Superconducting wire critical current data processing method and automatic data processing system

Abstract

The invention discloses a superconducting wire critical current data processing method and an automatic data processing system, and relates to the technical field of superconducting wire critical current measurement, and the method comprises the following steps: obtaining superconducting wire U-I measurement data, and generating an initial U-I curve; determining a background voltage linear data segment according to the initial U-I curve and performing fitting to generate a background function straight line; subtracting the background function straight line from the initial U-I curve to obtain a background-deducted U-I curve; and obtaining an electric field criterion critical current, a resistivity criterion critical current and a superconductivity and quench transition index based on deducting a background U-I curve. According to the method, the background function straight line is generated, the background function straight line is subtracted from the initial U-I curve, the electric field criterion critical current, the resistivity criterion critical current and the superconducting and quench transition index are obtained on the basis of deducting the background U-I curve, and the accuracy of critical current data processing and the data processing efficiency are improved.

Description

Technical Field

[0001] The present application relates to the technical field of superconducting wire critical current measurement, and in particular to a superconducting wire critical current data processing method and an automatic data processing system. Background Art

[0002] Superconducting wires are widely used in many fields, including magnetic resonance imaging (MRI), nuclear magnetic resonance spectrometers (NMR), large particle accelerators, superconducting energy storage systems (SMES), and magnetic confinement fusion devices (Tokamak). The critical current of superconducting wires is one of the most important performance indicators of superconducting wire applications. Therefore, research on superconducting wire critical current data processing technology is needed.

[0003] During the critical current test ramp-up process, a significant induced voltage will appear in the test curve. This is because the critical current test sample itself is a small inductor, so the presence of induced voltage in the test curve is unavoidable. Furthermore, certain contact voltages and transfer voltages may also be present. The superposition of these three background voltages can lead to inaccurate critical current data processing or the inability to determine the critical current and superconducting quench transition index. Critical current data processing is typically done manually, requiring approximately >60 sets of data to be processed daily. Each set of data takes approximately 10 minutes to process, requiring technicians to spend >10 hours of work per day.

[0004] However, there is currently no existing technology that considers the impact of background voltage on critical current data, and the accuracy of critical current data processing is poor. In addition, the current manual processing of critical current data is inefficient. Summary of the Invention

[0005] The present application provides a superconducting wire critical current data processing method and automatic data processing system to solve the problems in the prior art of not considering the influence of background voltage on critical current data, poor accuracy of critical current data processing, and low efficiency of manual processing of critical current data.

[0006] In one aspect, the present application provides a method for processing superconducting wire critical current data, comprising the following steps: Step 1: Obtain superconducting wire UI measurement data, and generate an initial UI curve based on the superconducting wire UI measurement data.

[0007] Step 2: Determine the background voltage linear data segment according to the initial UI curve and perform fitting to generate a background function straight line.

[0008] Step three: subtract the background function straight line from the initial UI curve to obtain a background-subtracted UI curve.

[0009] Step 4: obtaining the electric field criterion critical current, the resistivity criterion critical current and the superconducting quench transition index based on the background-subtracted UI curve.

[0010] In one possible implementation, step 2 includes: The background voltage linear data segment is determined according to the initial UI curve and fitted to obtain a background voltage linear function.

[0011] A background function straight line is generated according to the background voltage linear function.

[0012] In a possible implementation, the background voltage linear function is shown as follows: V0=A0+B0*I.

[0013] Wherein, V0 represents the background voltage, I represents the current, A0 represents the background voltage when the current is 0, and B0 represents the slope of the line showing the change of background voltage with current.

[0014] In a possible implementation, in step 4, the electric field criterion critical current is determined based on the background-subtracted UI curve and according to E=0.1 uV / cm or E=1 uV / cm.

[0015] In a possible implementation, in step 4, based on the background UI curve subtracted and according to ρ=10 -13 Ω*m or ρ=10 -14 Ω*m determines the resistivity criterion critical current.

[0016] In a possible implementation, in step 4, the superconducting quench transition index is calculated based on the following formula: U c =I c *ρ c *L / S.

[0017] E c = U c / L.

[0018] n=lg(E s / E c ) / lg(I s / I c ).

[0019] Among them, I c Indicates electric field criterion 0.1uV / cm or resistivity criterion ρ=10 -14 The current corresponding to Ω*m is in A.

[0020] ρ c Resistivity criterion ρ=10 -14 Ω*m.

[0021] L represents the distance between the sample voltage leads, in cm.

[0022] S represents the sample area, in mm 2 .

[0023] U c Indicates electric field criterion 0.1uV / cm or resistivity criterion ρ=10 -14 The voltage corresponding to Ω*m, in uV.

[0024] E c Indicates electric field criterion 0.1uV / cm or resistivity criterion ρ=10 -14 The electric field corresponding to Ω*m is in uV / cm.

[0025] E s Indicates that it is greater than the electric field criterion of 0.1uV / cm to 1uV / cm or greater than the resistivity criterion ρ=10 -14 Ω*m to ρ=10 -13 The electric field corresponding to any point of Ω*m, the unit is uV / cm.

[0026] I s Indicates that it is greater than the electric field criterion of 0.1uV / cm to 1uV / cm or greater than the resistivity criterion ρ=10 -14 Ω*m to ρ=10 -13 The current corresponding to any point of Ω*m, the unit is A.

[0027] E s with I s Corresponding.

[0028] n represents the superconducting quench transition index.

[0029] On the other hand, the present application also provides a superconducting wire critical current data automatic processing system, including: a data import module and a data processing module.

[0030] The data import module is used to import superconducting wire UI measurement data and to input sample area and sample voltage lead spacing.

[0031] The data processing module is used to execute a superconducting wire critical current data processing method of the present application.

[0032] In a possible implementation, a superconducting wire critical current data automatic processing system further includes: a display module.

[0033] The display module is used to display the process and result data of the data import module and the data processing module.

[0034] The superconducting wire critical current data processing method and data automatic processing system in this application have the following advantages: By generating a background function line, subtracting the background function line from the initial UI curve, and then deriving the electric field criterion critical current, resistivity criterion critical current, and superconducting quench transition index based on the background UI curve, the accuracy and efficiency of critical current data processing are improved. The present invention utilizes an automatic data processing system to execute a superconducting wire critical current data processing method. In practical applications, the overall processing efficiency is increased by over 96%, and automatic processing of a set of data takes only 3 seconds, saving at least one dedicated data processing staff member. BRIEF DESCRIPTION OF THE DRAWINGS

[0035] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0036] Figure 1 A flow chart of a method for processing superconducting wire critical current data provided in an embodiment of the present application; Figure 2 Schematic diagram of the initial UI curve and background function line provided in the embodiment of the present application; Figure 3 A schematic diagram of a background-subtracted UI curve provided in an embodiment of the present application; Figure 4 Schematic diagram of processing curves of electric field criterion critical current and resistivity criterion critical current provided in the embodiments of the present application; Figure 5 A schematic diagram of a display module of a superconducting wire critical current data automatic processing system provided in an embodiment of the present application. DETAILED DESCRIPTION

[0037] The following will be combined with the drawings in the embodiments of this application to clearly and completely describe the technical solutions in the embodiments of this application. Obviously, the embodiments described are only part of the embodiments of this application, not all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of this application.

[0038] like Figure 1 As shown, the embodiment of the present application provides a method for processing superconducting wire critical current data, comprising the following steps: Step 1: Obtain superconducting wire UI measurement data, and generate an initial UI curve based on the superconducting wire UI measurement data.

[0039] Step 2: Determine the background voltage linear data segment according to the initial UI curve and perform fitting to generate a background function straight line.

[0040] Step three: subtract the background function straight line from the initial UI curve to obtain a background-subtracted UI curve.

[0041] Step 4: obtaining the electric field criterion critical current, the resistivity criterion critical current and the superconducting quench transition index based on the background-subtracted UI curve.

[0042] Exemplarily, step 2 includes: The background voltage linear data segment is determined according to the initial UI curve and fitted to obtain a background voltage linear function.

[0043] A background function straight line is generated according to the background voltage linear function.

[0044] Exemplarily, the background voltage linear function is shown as follows: V0=A0+B0*I.

[0045] Wherein, V0 represents the background voltage, I represents the current, A0 represents the background voltage when the current is 0, and B0 represents the slope of the line showing the change of background voltage with current.

[0046] Specifically, in this embodiment, the background voltage linear function obtained by step 2 is fitted with A0 equal to -3.73149 and B0 equal to 0.00715. The initial UI curve and the background function straight line are as follows: Figure 2 As shown, Figure 2 The original curve in is the initial UI curve, and the background straight line is the background function straight line.

[0047] Specifically, in this embodiment, the background-subtracted UI curve obtained in step 3 is as follows: Figure 3 As shown, Figure 3 The UI curve after background subtraction is the UI curve after background subtraction.

[0048] Exemplarily, in step 4, the electric field criterion critical current is determined based on the background-subtracted UI curve and according to E=0.1 uV / cm or E=1 uV / cm.

[0049] For example, in step 4, based on the background UI curve subtracted and according to ρ=10 -13 Ω*m or ρ=10 -14 Ω*m determines the resistivity criterion critical current.

[0050] Exemplarily, in step 4, the superconducting quench transition index is calculated based on the following formula: U c =I c *ρ c *L / S.

[0051] E c = U c / L.

[0052] n=lg(E s / E c ) / lg(I s / I c ).

[0053] Among them, I c Indicates electric field criterion 0.1uV / cm or resistivity criterion ρ=10 -14 The current corresponding to Ω*m is in A.

[0054] ρ c Resistivity criterion ρ=10 -14 Ω*m.

[0055] L represents the distance between the sample voltage leads, in cm.

[0056] S represents the sample area, in mm 2 .

[0057] U c Indicates electric field criterion 0.1uV / cm or resistivity criterion ρ=10 -14 The voltage corresponding to Ω*m, in uV.

[0058] E c Indicates electric field criterion 0.1uV / cm or resistivity criterion ρ=10 -14 The electric field corresponding to Ω*m is in uV / cm.

[0059] E s Indicates that it is greater than the electric field criterion of 0.1uV / cm to 1uV / cm or greater than the resistivity criterion ρ=10 -14 Ω*m to ρ=10 -13 The electric field corresponding to any point of Ω*m, the unit is uV / cm.

[0060] I s Indicates that it is greater than the electric field criterion of 0.1uV / cm to 1uV / cm or greater than the resistivity criterion ρ=10 -14 Ω*m to ρ=10 -13 The current corresponding to any point of Ω*m, the unit is A.

[0061] E s with I s Corresponding.

[0062] n represents the superconducting quench transition index.

[0063] Specifically, if Figure 4 The diagram shows a processing curve diagram of the electric field criterion critical current and resistivity criterion critical current provided in the embodiment of the present application. Figure 4 The electric field criterion critical current and resistivity criterion critical current can be obtained. Figure 4 The superconducting quench transition index is calculated by taking the upper point. In this embodiment, the corresponding relationship between each criterion and the electric field, critical current, and superconducting quench transition index is shown in Table 1: Table 1 Corresponding relationships between various criteria and electric field, critical current, and superconducting quench transition index

[0064] The embodiment of the present application further provides a superconducting wire critical current data automatic processing system, comprising: a data import module and a data processing module.

[0065] The data import module is used to import superconducting wire UI measurement data and to input sample area and sample voltage lead spacing.

[0066] The data processing module is used to execute a superconducting wire critical current data processing method of the present application.

[0067] Specifically, in this embodiment, the sample area S is 2.227 mm 2 , the sample voltage lead spacing is 50cm.

[0068] Exemplarily, a superconducting wire critical current data automatic processing system further includes: a display module.

[0069] The display module is used to display the process and result data of the data import module and the data processing module.

[0070] Specifically, if Figure 5 As shown, the process and result data of the data import module and the data processing module are displayed through the display module.

[0071] Specifically, in this embodiment, the data import module, the data processing module, and the display module are all set on the computer through software programming to realize automatic processing of critical current data.

[0072] This embodiment of the present application improves the accuracy and efficiency of critical current data processing by generating a background function line, subtracting the background function line from the initial UI curve, and then deriving the electric field criterion critical current, resistivity criterion critical current, and superconducting quench transition index based on the background UI curve. This method improves the accuracy and efficiency of critical current data processing. Executing this method of superconducting wire critical current data processing through an automatic data processing system improves overall processing efficiency by over 96% in practical applications. Automatically processing a set of data takes only 3 seconds, saving at least one dedicated data processing staff member.

[0073] Although the preferred embodiments of the present application have been described, those skilled in the art may make additional changes and modifications to these embodiments once they have learned the basic creative concept. Therefore, the appended claims are intended to be interpreted as including the preferred embodiments and all changes and modifications that fall within the scope of the present application.

[0074] Obviously, those skilled in the art may make various changes and modifications to this application without departing from the spirit and scope of this application. Thus, if these modifications and variations of this application fall within the scope of the claims of this application and their equivalents, this application is intended to include these modifications and variations.

Claims

1. A method for processing superconducting wire critical current data, characterized in that: The following steps are involved: Step 1: Obtain superconducting wire UI measurement data, and generate an initial UI curve based on the superconducting wire UI measurement data; Step 2: determining the background voltage linear data segment according to the initial UI curve and performing fitting to generate a background function straight line; Step 3, subtracting the background function straight line from the initial UI curve to obtain a background-subtracted UI curve; Step 4: obtaining the electric field criterion critical current, the resistivity criterion critical current and the superconducting quench transition index based on the background-subtracted UI curve.

2. A superconducting wire critical current data processing method according to claim 1, characterized in that: Step 2 includes: Determine the background voltage linear data segment according to the initial UI curve and perform fitting to obtain a background voltage linear function; A background function straight line is generated according to the background voltage linear function.

3. The method for processing superconducting wire critical current data according to claim 2, characterized in that: The linear function of the background voltage is shown as follows: V0=A0+B0*I, Wherein, V0 represents the background voltage, I represents the current, A0 represents the background voltage when the current is 0, and B0 represents the slope of the line showing the change of background voltage with current.

4. The method for processing superconducting wire critical current data according to claim 1, characterized in that: In step 4, the electric field criterion critical current is determined based on the background-subtracted UI curve and according to E=0.1 uV / cm or E=1 uV / cm.

5. The method for processing superconducting wire critical current data according to claim 1, characterized in that: In step 4, based on the background UI curve subtracted and according to ρ=10 -13 Ω*m or ρ=10 -14 Ω*m determines the resistivity criterion critical current.

6. The method for processing superconducting wire critical current data according to claim 1, characterized in that: In step 4, the superconducting quench transition index is calculated based on the following formula: U c =I c *r c *L / S, And c = U c / L, n=lg(E s / E c ) / lg(I s / I c ), Among them, I c Indicates electric field criterion 0.1uV / cm or resistivity criterion ρ=10 -14 The current corresponding to Ω*m is in A; ρ c Resistivity criterion ρ=10 -14 Ω*m; L represents the distance between the sample voltage leads, in cm; S represents the sample area, in mm 2 ; U c Indicates electric field criterion 0.1uV / cm or resistivity criterion ρ=10 -14 The voltage corresponding to Ω*m is in uV; E c Indicates electric field criterion 0.1uV / cm or resistivity criterion ρ=10 -14 The electric field corresponding to Ω*m is in uV / cm; E s Indicates that it is greater than the electric field criterion of 0.1uV / cm to 1uV / cm or greater than the resistivity criterion ρ=10 -14 Ω*m to ρ=10 -13 The electric field corresponding to any point of Ω*m, in uV / cm; I s Indicates that it is greater than the electric field criterion of 0.1uV / cm to 1uV / cm or greater than the resistivity criterion ρ=10 -14 Ω*m to ρ=10 -13 The current corresponding to any point of Ω*m, the unit is A; E s with I s corresponding; n represents the superconducting quench transition index.

7. A superconducting wire critical current data automatic processing system, characterized in that: include: Data import module and data processing module; The data import module is used to import the superconducting wire UI measurement data and input the sample area and the sample voltage lead spacing; The data processing module is used to execute the superconducting wire critical current data processing method according to any one of claims 1 to 6.

8. The superconducting wire critical current data automatic processing system according to claim 7, characterized in that: Also includes: Display module; The display module is used to display the process and result data of the data import module and the data processing module.

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