Engineering equipment with detachable double-source interface

Abstract

The invention relates to the technical field of engineering detection equipment, and particularly discloses detachable engineering equipment with double-source interfaces, which comprises a plurality of test tools and upright posts, the test tools are combined into a fixed structure according to a specific rule, at least one station is arranged on each test tool, and the upright posts are arranged on the test tools. A first lateral circuit board, a second lateral circuit board and an end circuit board are arranged on each station; the combined test tools are arranged in rows on at least two vertical columns. The first lateral circuit board is connected with a first telescopic spring probe and a first red positive electrode power-on wire. The second lateral circuit board is connected with a second telescopic spring probe and a first black negative electrode power-on wire. And an internal supply positive and negative electrode circuit is integrated in the end part circuit board.

Description

Technical Field

[0001] The present application relates to the technical field of engineering detection equipment, and in particular to an engineering device with a detachable dual-source interface. Background Art

[0002] In the field of engineering testing equipment, especially in scenarios involving parallel testing of multiple workpieces (such as batch quality inspection of electronic components), traditional testing equipment cannot meet the collaborative needs of dynamic configuration of multiple workstations and lightweight and highly stable frames. Summary of the Invention

[0003] The purpose of this application is to provide an engineering device with a detachable dual-source interface to solve the problem in the prior art that traditional detection equipment cannot meet the collaborative requirements of multi-station dynamic configuration and lightweight and highly stable framework.

[0004] To achieve the above-mentioned purpose, the embodiment of the present application provides a detachable dual-source interface engineering device, including: a plurality of test fixtures and columns, wherein: The test fixture is assembled into a fixed structure according to a specific rule, and at least one workstation is provided on the test fixture, and each of the workstations is provided with a first lateral circuit board, a second lateral circuit board and an end circuit board; The assembled test fixtures are arranged in a row on at least two vertically arranged columns; The first side circuit board is connected to a first telescopic spring probe and a first red positive current conducting wire, and the second side circuit board is connected to a second telescopic spring probe and a first black negative current conducting wire; The end circuit board is integrated with internally supplied positive and negative circuits.

[0005] Optionally, at least one positioning partition is provided in the workstation, and the positioning partition divides the workstation into a plurality of sub-workstations, and the workpieces to be tested are placed in the sub-workstations.

[0006] Optionally, the uprights, upper connecting plates and lower connecting plates form a frame; There are four columns in total. After the test tool is assembled, two columns are provided on each side, and a middle support block is provided between the two columns on each side.

[0007] Optionally, the bottom of the frame is connected to a support leg; A limiting strip is provided on the side of the column, and an equal number of wire hanging hooks are provided on the column at the wire outlet end of the frame according to the number of layers of the test tooling layout.

[0008] Optionally, a first switch is provided between the first telescopic spring probe and the first red positive current conducting wire, and a second switch is provided between the second telescopic spring probe and the first black positive current conducting wire.

[0009] Optionally, a first pad is connected between the first switch and the first red positive-electrode power-carrying wire, and a second pad is connected between the second switch and the first black positive-electrode power-carrying wire.

[0010] Optionally, a third telescopic spring probe, a fourth telescopic spring probe, a second red positive-electrode power-carrying wire, and a second black negative-electrode power-carrying wire are connected to the end circuit board.

[0011] Optionally, a third switch is provided between the third telescopic spring probe and the second red positive electrode current conducting wire, and a fourth switch is provided between the fourth telescopic spring probe and the second black positive electrode current conducting wire.

[0012] Optionally, a third pad is connected between the third switch and the second red positive electrode power-carrying wire, and a fourth pad is connected between the fourth switch and the second black positive electrode power-carrying wire.

[0013] Optionally, it further includes a single-chip microcomputer, which is connected to the first lateral circuit board, the second lateral circuit board and the end circuit board respectively, and the single-chip microcomputer model is STM32G031G8U6; The VDD pin of the microcontroller is connected to the power supply VCC and one end of the capacitor C1 respectively, and the other end of the capacitor C1 is grounded; the PF2-NRST pin of the microcontroller is connected to one end of the capacitor C2, and the other end of the capacitor C2 is grounded, and the VSS pin of the microcontroller is grounded.

[0014] The embodiments of the present application have the following advantages: Compared with the existing technology, the engineering equipment provided by the above technical solution adopts a lightweight design as a whole, has a simple and compact structure, is easy to install and debug, and has stable and reliable performance, which greatly improves the work efficiency of workpiece testing operators. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] To more clearly illustrate the embodiments of this application or the technical solutions in the prior art, the following briefly introduces the drawings required for the embodiments or the description of the prior art. Obviously, the drawings described below are merely illustrative, and those skilled in the art can, without inventive effort, derive other implementation drawings based on the provided drawings.

[0016] Figure 1 A schematic diagram of the three-dimensional structure of an engineering device with a detachable dual-source interface provided in at least one embodiment of the present application; Figure 2 A schematic diagram of a test fixture structure for engineering equipment with a detachable dual-source interface provided in at least one embodiment of the present application; Figure 3A circuit schematic diagram of an engineering device with a detachable dual-source interface provided in at least one embodiment of the present application.

[0017] Description of reference numerals: 1 Test fixture, 2 column, 3 work station, 4 positioning partition, 5 first lateral circuit board, 6 first telescopic spring probe, 7 first red positive power wire, 8 second lateral circuit board, 9 second telescopic spring probe, 10 first black negative power wire, 11 end circuit board, 12 upper connecting plate, 13 lower connecting plate, 14 middle support block, 15 support leg, 16 limit bar, 17 third telescopic spring probe, 18 fourth telescopic spring probe, 19 second red positive power wire, 20 second black negative power wire, 21 hanging hook, 22 single-chip microcomputer, 23 first switch, 24 second switch, 25 third switch, 26 fourth switch, 27 first welding pad, 28 second welding pad, 29 third welding pad, 30 fourth welding pad. DETAILED DESCRIPTION

[0018] The following specific embodiments illustrate the implementation of this application. Those familiar with the art can easily understand the other advantages and functions of this application from the content disclosed in this specification. Obviously, the described embodiments are part of the embodiments of this application, but not all of them. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of this application.

[0019] In the description of the present application, it should be noted that the terms "center", "up", "down", "left", "right", "vertical", "horizontal", "inside", "outside" and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present application. In addition, the terms "first", "second", "third" and the like are only used for descriptive purposes and cannot be understood as indicating or implying relative importance. Unless otherwise expressly specified and limited, the terms "set", "install", "connect", and "connect" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or an indirect connection through an intermediate medium, or it can be a communication between the internal parts of two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the present application can be understood according to the specific circumstances.

[0020] In addition, the technical features involved in the different embodiments of the present application described below can be combined with each other as long as they do not conflict with each other.

[0021] The present application embodiment provides an engineering device with a detachable dual-source interface, referring to Figures 1 to 3 ,include: Multiple test fixtures 1 and columns 2, wherein: The test fixture 1 is assembled into a fixed structure according to a specific rule. The test fixture 1 is provided with at least one workstation 3. Each of the workstations 3 is provided with a first lateral circuit board 5, a second lateral circuit board 8 and an end circuit board 11. The assembled test fixtures 1 are arranged in a row on at least two vertically arranged columns 2; The first lateral circuit board 5 is connected to a first telescopic spring probe 6 and a first red positive current conducting wire 7, and the second lateral circuit board 8 is connected to a second telescopic spring probe 9 and a first black negative current conducting wire 10; The end circuit board 11 is integrated with internally supplied positive and negative circuits.

[0022] Specifically, the first telescopic spring probe 6 and the second telescopic spring probe 9 are connected to the positive and negative poles of the test workpiece respectively. The end circuit board 11 integrates the internally supplied positive and negative circuits to facilitate connection with the external input power supply.

[0023] refer to Figure 2 In some embodiments, at least one positioning partition 4 is provided in the workstation 3 , and the positioning partition 4 divides the workstation 3 into a plurality of sub-workstations 3 , in which the workpieces to be tested are placed.

[0024] refer to Figure 1 In some embodiments, the column 2 and the upper connecting plate 12 and the lower connecting plate 13 form a frame.

[0025] refer to Figure 1 In some embodiments, there are four columns 2 , and two columns 2 are provided on each side of the assembled test fixture 1 , and a middle support block 14 for reinforcement is provided between the two columns 2 on each side.

[0026] refer to Figure 1 In some embodiments, a support leg 15 is connected to the bottom of the frame; a limit strip 16 is provided on the side of the column 2 to prevent the test tool 1 from accidentally falling off, and an equal number of wire hooks 21 are set on the column 2 at the outlet end of the frame according to the number of layers of the test tool 1 layout.

[0027] refer to Figure 3 In some embodiments, a first switch 23 is provided between the first telescopic spring probe 6 and the first red positive current conducting wire 7 , and a second switch 24 is provided between the second telescopic spring probe 9 and the first black positive current conducting wire.

[0028] refer to Figure 3In some embodiments, a first solder pad 27 is connected between the first switch 23 and the first red positive electrode power-carrying wire 7, and a second solder pad 28 is connected between the second switch 24 and the first black positive electrode power-carrying wire.

[0029] refer to Figure 3 In some embodiments, the end circuit board 11 is connected to a third telescopic spring probe 17 , a fourth telescopic spring probe 18 , a second red positive electrode power conducting wire 19 , and a second black negative electrode power conducting wire 20 .

[0030] refer to Figure 3 In some embodiments, a third switch 25 is provided between the third telescopic spring probe 17 and the second red positive electrode power conducting wire 19 , and a fourth switch 26 is provided between the fourth telescopic spring probe 18 and the second black positive electrode power conducting wire.

[0031] refer to Figure 3 In some embodiments, a third pad 29 is connected between the third switch 25 and the second red positive electrode power-carrying wire 19 , and a fourth pad 30 is connected between the fourth switch 26 and the second black positive electrode power-carrying wire.

[0032] refer to Figure 3 In some embodiments, a single-chip microcomputer 22 is further included, and the single-chip microcomputer 22 is respectively connected to the first lateral circuit board 5, the second lateral circuit board 8 and the end circuit board 11, and the model of the single-chip microcomputer 22 is STM32G031G8U6.

[0033] refer to Figure 3 In some embodiments, the VDD pin of the microcontroller 22 is connected to the power supply VCC and one end of the capacitor C1, respectively, and the other end of the capacitor C1 is grounded; the PF2-NRST pin of the microcontroller 22 is connected to one end of the capacitor C2, and the other end of the capacitor C2 is grounded, and the VSS pin of the microcontroller 22 is grounded.

[0034] In summary, compared with existing technologies, the above-mentioned engineering equipment adopts an overall lightweight design, simple and compact structure, convenient installation and commissioning, stable and reliable performance, and greatly improves the work efficiency of workpiece testing operators. It also meets the requirements of overall stability, simplicity, easy assembly and disassembly, simple and convenient operation, and overall movable adjustment.

[0035] Note that, unless otherwise explicitly stated, all features disclosed in this specification (including any accompanying claims, abstracts, and drawings) may be replaced by alternative features that achieve the same, equivalent, or similar purposes. Therefore, unless explicitly stated otherwise, each feature disclosed is merely an example of a group of equivalent or similar features. Where used, further, preferably, further, and more preferably are simply the beginning of another embodiment based on the previous embodiment, and the content following further, preferably, further, or more preferably is combined with the previous embodiment as a complete construction of another embodiment. Several further, preferably, further, or more preferably settings following the same embodiment can be arbitrarily combined to form another embodiment.

[0036] In the implementation of functions and steps, the corresponding functions and steps in various embodiments may also occur in a different order than shown. For example, two consecutive functions and steps can actually be performed or implemented substantially in parallel, or they can sometimes be performed or implemented in the opposite order, depending on the functions involved.

[0037] Although the present application has been described in detail above using general descriptions and specific embodiments, it will be apparent to those skilled in the art that modifications or improvements may be made based on the present application. Therefore, such modifications or improvements, which do not depart from the spirit of the present application, are within the scope of protection claimed in the present application.

Claims

1. An engineering device with a detachable dual-source interface, characterized in that: include: Multiple test fixtures and columns, including: The test fixture is assembled into a fixed structure according to a specific rule, and at least one workstation is provided on the test fixture, and each of the workstations is provided with a first lateral circuit board, a second lateral circuit board and an end circuit board; The assembled test fixtures are arranged in a row on at least two vertically arranged columns; The first side circuit board is connected to a first telescopic spring probe and a first red positive current conducting wire, and the second side circuit board is connected to a second telescopic spring probe and a first black negative current conducting wire; The end circuit board is integrated with internally supplied positive and negative circuits.

2. The engineering equipment with detachable dual-source interface according to claim 1, characterized in that: At least one positioning partition is provided in the workstation, and the positioning partition divides the workstation into a plurality of sub-workstations, wherein the workpieces to be tested are placed in the sub-workstations.

3. The engineering equipment with detachable dual-source interface according to claim 1, characterized in that: The uprights, upper connecting plates and lower connecting plates form a frame; There are four columns in total. After the test tool is assembled, two columns are provided on each side, and a middle support block is provided between the two columns on each side.

4. The engineering equipment with detachable dual-source interface according to claim 3, characterized in that: The bottom of the frame is connected to a support leg; A limiting strip is provided on the side of the column, and an equal number of wire hanging hooks are provided on the column at the wire outlet end of the frame according to the number of layers of the test tooling layout.

5. The engineering equipment with detachable dual-source interface according to claim 1, characterized in that: A first switch is provided between the first telescopic spring probe and the first red positive electrode current conducting wire, and a second switch is provided between the second telescopic spring probe and the first black positive electrode current conducting wire.

6. The engineering equipment with detachable dual-source interface according to claim 5, characterized in that: A first pad is connected between the first switch and the first red positive electrode power conducting wire, and a second pad is connected between the second switch and the first black positive electrode power conducting wire.

7. The engineering equipment with detachable dual-source interface according to claim 1, characterized in that: The end circuit board is connected to a third telescopic spring probe, a fourth telescopic spring probe, a second red positive electrode power conducting wire, and a second black negative electrode power conducting wire.

8. The engineering equipment with detachable dual-source interface according to claim 7, characterized in that: A third switch is provided between the third telescopic spring probe and the second red positive electrode current conducting wire, and a fourth switch is provided between the fourth telescopic spring probe and the second black positive electrode current conducting wire.

9. The engineering equipment with detachable dual-source interface according to claim 8, characterized in that: A third pad is connected between the third switch and the second red positive electrode power conducting wire, and a fourth pad is connected between the fourth switch and the second black positive electrode power conducting wire.

10. The engineering equipment with detachable dual-source interface according to claim 1, characterized in that: It also includes a single-chip microcomputer, which is connected to the first lateral circuit board, the second lateral circuit board and the end circuit board respectively, and the single-chip microcomputer model is STM32G031G8U6; The VDD pin of the microcontroller is connected to the power supply VCC and one end of the capacitor C1 respectively, and the other end of the capacitor C1 is grounded; the PF2-NRST pin of the microcontroller is connected to one end of the capacitor C2, and the other end of the capacitor C2 is grounded, and the VSS pin of the microcontroller is grounded.

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