Corresponding test method and device for dual-path power supply

Abstract

The invention discloses a correspondence test method and device for a dual-path power supply, and the method comprises the steps: configuring the variable output voltage of a first path of power supply in the dual-path power supply as a first voltage value, and the variable output voltage of a second path of power supply as a second voltage value, so as to carry out the output voltage differentiation of the two paths of power supplies; determining voltage data of each link node in each path of power supply of the two paths of power supplies; by comparing the voltage of the first link node in the first path of power supply with the voltage of the second link node in the same link position in the second path of power supply, the correspondence test result of each link node in the two paths of power supplies is determined, and the correspondence test result of each link node in the two paths of power supplies can be determined without additionally increasing hardware overhead and instrument wiring. The corresponding test is realized by carrying out differential output and voltage differential judgment on the voltages of the two paths of power supplies, so that the manual test cost is reduced, and the test efficiency is improved.

Description

Technical Field

[0001] The present application relates to the field of computer technology, and in particular to a method and device for testing the correspondence of a dual power supply. Background Art

[0002] With the rapid development of information technology and the increasing intelligence of critical infrastructure, dual power supply systems, as a core configuration to ensure power continuity, have become widely used in data centers, industrial control systems, medical equipment, transportation hubs, and other scenarios requiring extremely high power reliability. However, during on-site wiring, dual power supplies can experience mismatching due to poor construction quality, leading to server downtime. Therefore, compatibility testing of dual power supplies is necessary to ensure their reliability.

[0003] Traditional data center dual-power supply compatibility testing relies primarily on manual verification, checking each cabinet's dual power supply link nodes to confirm any confusion or errors. However, given that large data centers often contain tens of thousands of cabinets, manual testing of each cabinet is time-consuming and labor-intensive, resulting in low testing efficiency. Summary of the Invention

[0004] Based on the above problems, the present application provides a method and device for testing the correspondence of dual power supplies, the purpose of which is to reduce manual testing costs and improve testing efficiency.

[0005] The embodiments of this application disclose the following technical solutions:

[0006] In a first aspect, the present application provides a method for testing the correspondence of a dual power supply, comprising:

[0007] The variable output voltage of a first power supply in a dual power supply is configured to be a first voltage value, and the variable output voltage of a second power supply in the dual power supply is configured to be a second voltage value; the variable output voltage is an output voltage obtained by voltage regulation of a UPS or a transformer; and the difference between the first voltage value and the second voltage value is not less than a preset difference;

[0008] Scanning each first link node in the first power supply and each second link node in the second power supply in real time, and respectively acquiring first voltage data corresponding to each first link node and second voltage data corresponding to each second link node; the first link nodes and the second link nodes have a one-to-one correspondence and are in the same link position in the dual power supply;

[0009] By comparing the first voltage data and the second voltage data corresponding to each group of the first link node and the second link node at the same link position, the correspondence test result of each link node in the dual power supply is determined.

[0010] Optionally, in the above method, if the configured first voltage value is greater than the second voltage value, determining the correspondence test result of each link node in the dual power supply by comparing the first voltage data and the second voltage data corresponding to each group of first link nodes and second link nodes at the same link position includes:

[0011] For each first link node and the second link node corresponding to the first link node, perform the following operations:

[0012] When a voltage difference obtained by subtracting the second voltage data from the first voltage data is greater than or equal to a preset threshold, a correspondence test result of the first link node and the second link node is obtained, indicating that both are connected normally;

[0013] When a voltage difference obtained by subtracting the second voltage data from the first voltage data is smaller than a preset threshold, the correspondence test results of the first link node and the second link node are both abnormal connections.

[0014] Optionally, in the above method, the connection abnormality includes false dual-circuit and reverse connection of the line; the false dual-circuit means that at any link node, both lines of the dual-circuit power supply are connected to the same power supply; the reverse connection of the line means that at any link node, the two lines of the dual-circuit power supply are connected to the power supply interchangeably;

[0015] When a voltage difference obtained by subtracting the second voltage data from the first voltage data is less than a preset threshold, obtaining a correspondence test result that both the first link node and the second link node are abnormally connected includes:

[0016] When the absolute value of the voltage difference obtained by subtracting the second voltage data from the first voltage data is less than a preset threshold, the correspondence test result of the first link node and the second link node is obtained as a false two-way;

[0017] When the voltage difference obtained by subtracting the second voltage data from the first voltage data is less than a preset threshold and the voltage difference is a negative number, the correspondence test result between the first link node and the second link node is reverse connection of the line.

[0018] Optionally, in the method described above, the link node includes at least one of a transformer node, a UPS node, a power distribution cabinet node, and a PDU node.

[0019] Optionally, in the method described above, the real-time scanning of each first link node in the first power supply and each second link node in the second power supply, and respectively obtaining first voltage data corresponding to each first link node and second voltage data corresponding to each second link node, includes:

[0020] Running a pre-configured GUI script to initiate a real-time scanning operation on a sensor provided in each link node of the dual power supply;

[0021] The first voltage data corresponding to each first link node and the second voltage data corresponding to each second link node are obtained.

[0022] Optionally, the method as described above is characterized in that the visualization interface corresponding to the GUI script includes a visualization link, and the visualization link represents the entire link of the dual power supply and each link node.

[0023] Optionally, in the above method, if the configured first voltage value is greater than the second voltage value, determining the correspondence test result of each link node in the dual power supply by comparing the first voltage data and the second voltage data corresponding to each group of first link nodes and second link nodes at the same link position includes:

[0024] In the visualization link, for each first link node and a second link node corresponding to the first link node, perform the following operations:

[0025] When the voltage difference between the first voltage data and the second voltage data is greater than or equal to a preset threshold, the link node corresponding to the maximum value between the first voltage data and the second voltage data is represented by a first color, and the link node corresponding to the minimum value between the first voltage data and the second voltage data is represented by a second color;

[0026] When the voltage difference between the first voltage data and the second voltage data is less than a preset threshold, the first link node corresponding to the first voltage data and the second link node corresponding to the second voltage data are represented by a third color, so that the user can judge the correspondence test result of the dual power supply according to the color of each link node in the visual link.

[0027] In a second aspect, the present application provides a dual-power supply correspondence testing device, comprising:

[0028] a voltage configuration module, configured to configure a variable output voltage of a first power supply in a dual power supply to a first voltage value, and to configure a variable output voltage of a second power supply in the dual power supply to a second voltage value; the variable output voltage is an output voltage obtained by voltage regulation of a UPS or a transformer; and the difference between the first voltage value and the second voltage value is not less than a preset difference;

[0029] a voltage acquisition module, configured to scan in real time each first link node in the first power supply and each second link node in the second power supply, and respectively acquire first voltage data corresponding to each first link node and second voltage data corresponding to each second link node; the first link nodes and the second link nodes have a one-to-one correspondence and are located in the same link position in the dual power supply;

[0030] The testing module is used to determine the correspondence test result of each link node in the dual power supply by comparing the first voltage data and the second voltage data corresponding to each group of the first link node and the second link node at the same link position.

[0031] In a third aspect, the present application provides an electronic device, comprising: a processor, and a memory communicatively connected to the processor;

[0032] Memory stores computer-executable instructions;

[0033] The processor executes the computer-executable instructions stored in the memory to implement the correspondence testing method for the dual power supplies described in any one of the above embodiments.

[0034] In a fourth aspect, the present application provides a computer-readable storage medium, in which computer-executable instructions are stored. When the computer-executable instructions are executed by a processor, they are used to implement the correspondence testing method of the dual power supply described in any of the above embodiments.

[0035] Compared with the existing technology, this application has the following beneficial effects:

[0036] The solution of the present application configures the variable output voltage of the first power supply in the dual power supply to be a first voltage value, and configures the variable output voltage of the second power supply in the dual power supply to be a second voltage value, wherein the difference between the first voltage value and the second voltage value is not less than a preset difference, thereby realizing voltage differentiation configuration of the supply voltages of the two power supplies in the dual power supply. At the same time, the first link node in the first power supply and each second link node of the second power supply are scanned in real time, and the first voltage data corresponding to the first link node and the second voltage data corresponding to the second link node at the same link position in the dual power supply are respectively obtained, so as to be used for subsequent voltage correspondence verification testing of each link node in the entire link, without the need for manual point-by-point testing for verification. Finally, by comparing the first voltage data and the second voltage data corresponding to each group of first link nodes and second link nodes at the same link position, the correspondence test result of each link node can be directly determined, thereby realizing efficient correspondence testing of the entire link of the dual power supply, reducing the manpower and material resources consumed by the correspondence testing of the entire link of the dual power supply. At the same time, by comparing the voltages of the link nodes at the same link position, it is possible to simply and quickly determine whether the line connection of the link node is normal, thereby improving the efficiency of the correspondence test. BRIEF DESCRIPTION OF THE DRAWINGS

[0037] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative labor.

[0038] Figure 1 A schematic diagram of a flow chart of a method for testing the correspondence of a dual power supply provided in an embodiment of the present application;

[0039] Figure 2 A schematic diagram of a visual link provided in an embodiment of the present application;

[0040] Figure 3 A schematic diagram of the structure of a dual-power supply correspondence testing device provided in an embodiment of the present application;

[0041] Figure 4 A schematic diagram of the structure of an electronic device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0042] In order to make the purpose, technical solutions and advantages of this application more clear, the following is a further detailed description of this application in conjunction with specific embodiments and with reference to the accompanying drawings. It should be noted that the embodiments described in the embodiments of this application are only part of the embodiments of this application, not all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of this application.

[0043] It should be noted that, unless otherwise defined, the technical terms or scientific terms used in the embodiments of the present application should have the usual meanings understood by people with ordinary skills in the field to which this application belongs. The "first", "second" and similar words used in the embodiments of the present application do not indicate any order, quantity or importance, but are only used to distinguish different components. "Include" or "comprise" and similar words mean that the elements or objects appearing before the word cover the elements or objects listed after the word and their equivalents, without excluding other elements or objects. "Connect" or "connected" and similar words are not limited to physical or mechanical connections, but may include electrical connections, whether direct or indirect. "Up", "down", "left", "right" and the like are only used to indicate relative positional relationships. When the absolute position of the described object changes, the relative positional relationship may also change accordingly.

[0044] As previously described, current power distribution methods carry a high risk of errors during on-site wiring, potentially leading to IT cabinets being connected to the wrong power supplies or actually being powered by a single power source, potentially causing widespread server downtime in the event of a power failure. Traditional methods rely on manual continuity testing with a multimeter for dual-power supply consistency testing. This method can only verify the connectivity of a local physical link. Limited by the multimeter's single-point testing capabilities, it cannot meet the needs of long-distance consistency testing across floors, computer rooms, or even cabinets. Furthermore, manual point-by-point testing is inefficient and can easily lead to missed critical links due to operational oversight, making it difficult to fully guarantee the reliability of dual-power systems. This results in manual testing being time-consuming, labor-intensive, and inefficient.

[0045] After research, the inventors proposed a correspondence testing method and device for dual power supplies. Without the need for additional hardware overhead and instrument wiring, the correspondence test can be achieved by differentially outputting the voltages of the dual power supplies and judging the voltage differential, thereby reducing manual testing costs and improving testing efficiency.

[0046] In order to help those skilled in the art better understand the present invention, the following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative work are within the scope of protection of this application.

[0047] Dual power supply: Data centers should utilize dual utility power connections, originating from two different municipal high-voltage substations. The national standard, "Data Center Design Specification" (GB50174-2017), stipulates that dual power supply means that power to a single load is provided by two circuits, which are considered independent for the purpose of safe power supply.

[0048] Link: refers to the upstream and downstream relationship from the low-voltage terminal output to the mains high-voltage input. For example, the power supply link from the low-voltage terminal output to the mains high-voltage input includes the power distribution unit (PDU) - industrial connector - terminal cabinet sub-switch - terminal cabinet main switch / or busbar - uninterruptible power supply (UPS) output distribution switch - UPS - UPS input switch - low-voltage distribution main switch - transformer - high-voltage switch - high-voltage line; among them, in the complete power supply link from the low-voltage terminal output to the mains high-voltage input, key equipment or connection points such as PDU, distribution cabinet, UPS and transformer that undertake the functions of power transmission, distribution, conversion or control can be called link nodes.

[0049] See also Figure 1 , which is a flow chart of a method for testing the correspondence of a dual power supply provided by an embodiment of the present application. Figure 1 As shown, the method includes:

[0050] S101: configuring a variable output voltage of a first power supply in a dual power supply to a first voltage value, and configuring a variable output voltage of a second power supply in the dual power supply to a second voltage value.

[0051] The variable output voltage is an output voltage obtained by voltage regulation of the UPS or the transformer; and the difference between the first voltage value and the second voltage value is not less than a preset difference.

[0052] In this embodiment, if the first power source of the dual power sources is power source A and the second power source is power source B, since the output voltage of the transformer and UPS is configurable, the supply voltage of power source A and the supply voltage of power source B can be adjusted by remotely configuring the variable output voltage of the transformer. For example, if power source A initially has a 10kV incoming line, and the on-load tap changer is used to increase the high-voltage incoming line tap of the transformer of power source A by one level to 10.5kV, the transformer output of power source A will be increased to 405V. If the difference between the first voltage value and the second voltage value is not less than the preset difference of 10V, the high-voltage incoming line tap of power source B can be reduced by one level, and the transformer output voltage of power source B will be reduced to 395V, thereby creating a more significant voltage difference between power sources A and B.

[0053] S102: Scan each first link node in the first power supply and each second link node in the second power supply in real time, and obtain first voltage data corresponding to each first link node and second voltage data corresponding to each second link node.

[0054] The first link node and the second link node correspond one to one and are located at the same link position in the dual power supply.

[0055] In this embodiment, for example, power supply A includes two first link nodes, and power supply B includes two second link nodes; the first link node includes at least one of a transformer node, a UPS node, a distribution cabinet node, and a PDU node. Similarly, the first link node also includes at least one of a transformer node, a UPS node, a distribution cabinet node, and a PDU node. If the two first link nodes are a transformer node and a UPS node, respectively, then the two second link nodes are a transformer node and a UPS node, respectively; and the transformer node in power supply A and the transformer node in power supply B are in the same link position. Similarly, the UPS node in power supply A and the UPS node in power supply B are in the same link position. By real-time scanning of each first link node in the first power supply and each second link node in the second power supply, the first voltage data corresponding to each first link node and the second voltage data corresponding to each second link node are detected in real time.

[0056] S103: Determine a correspondence test result of each link node in the dual power supply by comparing the first voltage data and the second voltage data corresponding to each group of first link nodes and second link nodes at the same link position.

[0057] In this embodiment, taking a group of UPS nodes in which the first link node and the second link node are at the same link position as an example, real-time scanning detects that the first voltage data is 405V and the second voltage data is 395V. By comparing the voltage data of the link nodes at the same link position of the two power supplies, it is determined whether the power connection of the UPS node is normal.

[0058] In this embodiment, by configuring the variable output voltage of the first power supply in the dual power supply to be a first voltage value and the variable output voltage of the second power supply in the dual power supply to be a second voltage value, and by configuring the difference between the first voltage value and the second voltage value to be no less than a preset difference, voltage differentiation configuration is achieved for the supply voltages of the two power supplies in the dual power supply. Simultaneously, the first link node in the first power supply and each second link node in the second power supply are scanned in real time to obtain first voltage data corresponding to the first link node and second voltage data corresponding to the second link node at the same link position in the dual power supply, respectively, for subsequent voltage correspondence verification testing of each link node in the entire link, eliminating the need for manual point-by-point testing for verification. Finally, by comparing the first voltage data and the second voltage data corresponding to each group of first link nodes and second link nodes at the same link position, the correspondence test result of each link node can be directly determined, thereby achieving efficient correspondence testing of the entire link of the dual power supply, reducing the manpower and material resources consumed in performing correspondence testing on the entire link of the dual power supply. At the same time, by comparing the voltages of the link nodes at the same link position, it is possible to simply and quickly determine whether the line connection of the link node is normal, thereby improving the efficiency of the correspondence testing.

[0059] Further, based on the above embodiment, if the configured first voltage value is greater than the second voltage value, a specific implementation of "determining the correspondence test result of each link node in the dual power supply by comparing the first voltage data and the second voltage data corresponding to each group of first link nodes and second link nodes at the same link position" in S103 may include:

[0060] For each first link node and the second link node corresponding to the first link node, perform the following operations:

[0061] S1031: When the voltage difference obtained by subtracting the second voltage data from the first voltage data is greater than or equal to a preset threshold, the correspondence test results of the first link node and the second link node are obtained, indicating that the connection is normal.

[0062] In this embodiment, taking the preset threshold of 8V as an example, if the configured first voltage value is 405V and the second voltage value is 395V, the obtained first voltage data is 405V and the second voltage value is 395V; when the voltage difference value obtained by subtracting the second voltage data 395V from the first voltage data 405V is 10V, since 10V is greater than the preset threshold 8V, it is judged that the correspondence test results of the first link node corresponding to the first voltage data and the second link node corresponding to the second voltage data are both normal connections.

[0063] S1032: When the voltage difference obtained by subtracting the second voltage data from the first voltage data is less than a preset threshold, the correspondence test results of the first link node and the second link node are both abnormal connections.

[0064] In this embodiment, taking the preset threshold of 8V as an example, if the configured first voltage value is 395V and the second voltage value is 405V, the obtained first voltage data is 395V and the second voltage value is 405V; when the voltage difference value obtained by subtracting the second voltage data 405V from the first voltage data 395V is -10V, since -10V is less than the preset threshold of 8V, it is judged that the correspondence test results of the first link node corresponding to the first voltage data and the second link node corresponding to the second voltage data are both connection abnormalities.

[0065] In this embodiment, for each first link node and the second link node corresponding to the first link node, the following operations are performed: when the voltage difference obtained by subtracting the second voltage data from the first voltage data is greater than or equal to a preset threshold value, the correspondence test results of the first link node and the second link node are both normal connections; when the voltage difference obtained by subtracting the second voltage data from the first voltage data is less than the preset threshold value, the correspondence test results of the first link node and the second link node are both abnormal connections. This can quickly and accurately identify link nodes with normal connections and link nodes with abnormal connections, thereby improving the efficiency of the correspondence test of the dual power supplies.

[0066] As a possible implementation, abnormal connection may include false dual-circuit and reverse connection; false dual-circuit means that at any link node, both branches of a dual-circuit power supply are connected to the same power supply; reverse connection means that at any link node, the two branches of a dual-circuit power supply are connected to the same power supply interchangeably. Based on the above embodiment, the specific implementation steps of "when the voltage difference obtained by subtracting the second voltage data from the first voltage data is less than a preset threshold, the correspondence test results of the first link node and the second link node are both abnormal connection" in S1032 may include:

[0067] When the absolute value of the voltage difference obtained by subtracting the second voltage data from the first voltage data is smaller than the preset threshold, the correspondence test result between the first link node and the second link node is false dual-path.

[0068] In this embodiment, taking the preset threshold of 8V as an example, if the configured first voltage value is 405V and the second voltage value is 395V, the first voltage data obtained is 405V, the second voltage value is 402V, and the voltage difference obtained by subtracting the second voltage data 402V from the first voltage data 405V is 3V; or, the first voltage data obtained is 402V, the second voltage value is 405V, and the voltage difference obtained by subtracting the second voltage data 405V from the first voltage data 402V is -3V. Since the absolute value corresponding to the voltage difference is 3V and is less than the preset threshold of 8V, it is judged that the correspondence test results of the first link node corresponding to the first voltage data and the second link node corresponding to the second voltage data are both connection abnormalities.

[0069] When the voltage difference obtained by subtracting the second voltage data from the first voltage data is less than the preset threshold and the voltage difference is a negative number, the correspondence test result between the first link node and the second link node is reverse connection of the line.

[0070] In this embodiment, taking the preset threshold of 8V as an example, if the configured first voltage value is 395V and the second voltage value is 405V, the obtained first voltage data is 395V and the second voltage value is 405V; when the voltage difference value obtained by subtracting the second voltage data 405V from the first voltage data 395V is -10V, since -10V is less than the preset threshold of 8V and is a negative number, it is judged that the correspondence test results of the first link node corresponding to the first voltage data and the second link node corresponding to the second voltage data are both reversed lines.

[0071] In this embodiment, when the absolute value corresponding to the voltage difference obtained by subtracting the second voltage data from the first voltage data is less than a preset threshold value, the correspondence test result between the first link node and the second link node is a false dual-path; when the voltage difference obtained by subtracting the second voltage data from the first voltage data is less than the preset threshold value and the voltage difference is a negative number, the correspondence test result between the first link node and the second link node is a reverse connection of the line. The method of this embodiment can more accurately identify the specific reason why the test result is a connection abnormality by performing a more detailed differential judgment on the first voltage data and the second voltage data, thereby improving the accuracy and efficiency of the correspondence test of the dual-source circuit.

[0072] It is understandable that after all correspondence tests are completed, the dual power supplies need to be restored to default settings to avoid normal use, such as restoring the transformer tap output to 400V and the UPS output to 220V.

[0073] Based on the above embodiment, as a specific implementation method, the specific implementation steps of "scanning each first link node in the first power supply and each second link node in the second power supply in real time, and respectively obtaining first voltage data corresponding to each first link node and second voltage data corresponding to each second link node" in S102 include:

[0074] S1021: Run a pre-configured GUI script to start a real-time scanning operation for a sensor set in each link node of the dual power supply.

[0075] S1022: Obtain first voltage data corresponding to each first link node and second voltage data corresponding to each second link node.

[0076] In this embodiment, the preconfigured GUI script includes a scanning process. The operation and maintenance personnel only need to click the "Start Detection" button on the GUI interface or automatically trigger the operation after configuring the first voltage value and the second voltage value in step S101 to automatically start the full-link scan of the sensors set in each link node, and obtain the voltage data corresponding to the link node where the sensor is located from each sensor.

[0077] In this embodiment, a preconfigured GUI script is run to start a real-time scanning operation on the sensor set in each link node of the dual power supply, so as to obtain the first voltage data corresponding to each first link node and the second voltage data corresponding to each second link node, thereby realizing the automatic and rapid acquisition of the voltage of each link node in the entire link, eliminating the need for manual detection one by one, eliminating the risk of manual intervention, and improving the efficiency of collecting the voltage of the nodes in the entire link.

[0078] Based on the above embodiment, the visualization interface generated by running the GUI script includes a visualization link, which represents the entire link of the dual power supply and each link node.

[0079] It is understandable that the visualization interface generated by running the GUI script may also include voltage data display units for nodes such as transformers, UPSs, and distribution cabinets, as well as a voltage difference comparison result area corresponding to each node.

[0080] If the configured first voltage value is greater than the second voltage value, a specific implementation of "determining a correspondence test result of each link node in the dual power supply by comparing the first voltage data and the second voltage data corresponding to each group of first link nodes and second link nodes at the same link position" in S103 includes:

[0081] In the visualized link, for each first link node and the second link node corresponding to the first link node, perform the following operations:

[0082] When the voltage difference between the first voltage data and the second voltage data is greater than or equal to a preset threshold, the link node corresponding to the maximum value of the first voltage data and the second voltage data is represented by a first color, and the link node corresponding to the minimum value of the first voltage data and the second voltage data is represented by a second color.

[0083] In this embodiment, if the configured first voltage value is 405V and the second voltage value is 395V, then taking the power supply with a higher voltage represented by the first color red and the power supply with a lower voltage represented by the second color blue as an example, if the full link connection is normal, the first link nodes in the first power supply should all be red, and correspondingly, the second link nodes in the second power supply should all be blue, as shown in FIG. Figure 2 If the entire link has reverse connection, the color corresponding to the first link node is blue, and the color corresponding to the second link node at the same link position is red. This allows users to intuitively determine the corresponding test results of each link node based on the color representation in the visualized link.

[0084] When the voltage difference between the first voltage data and the second voltage data is less than a preset threshold, the first link node corresponding to the first voltage data and the second link node corresponding to the second voltage data are represented by a third color, so that the user can judge the correspondence test result of the dual power supply based on the color of each link node in the visualized link.

[0085] In this embodiment, when the voltage difference between the first voltage data and the second voltage data is less than a preset threshold, it indicates that the first link node and the second link node are connected to the same power supply, and a third color, such as yellow, can be used to represent the first link node and the second link node.

[0086] In order to further determine which power source the first link node and the second link node connected to the same power source are connected to, based on the above embodiment, the method may further include:

[0087] When the voltage difference between the first voltage data and the second voltage data is less than a preset threshold, a first difference between the first voltage data and the first voltage value is calculated, and a second difference between the second voltage data and the second voltage value is calculated. If the first difference is the minimum of the first difference and the second difference, it indicates that the first link node and the second link node are powered by power supply A with a relatively high voltage, and the first link node and the second link node are represented by the first color red.

[0088] If the second difference is the minimum of the first and second differences, it indicates that the first and second link nodes are powered by power supply B, which has a relatively low voltage. Therefore, the first and second link nodes are represented by the second color, blue. Thus, by visualizing the colors in the link, the user can directly identify link nodes in each power line that have a color different from the current line.

[0089] In this embodiment, if the configured first voltage value is greater than the second voltage value, in the visual link, for each first link node and the second link node corresponding to the first link node, the following operations are performed: when the voltage difference between the first voltage data and the second voltage data is greater than or equal to a preset threshold, the link node corresponding to the maximum value of the first voltage data and the second voltage data is characterized by a first color, and the link node corresponding to the minimum value of the first voltage data and the second voltage data is characterized by a second color. When the voltage difference between the first voltage data and the second voltage data is less than the preset threshold, the first link node corresponding to the first voltage data and the second link node corresponding to the second voltage data are characterized by a third color, so that the user can determine the correspondence test results of the dual power supply based on the color of each link node in the visual link, thereby achieving a visual display of the voltage of each link node in the entire link. Therefore, the user can intuitively see the abnormal link nodes through the color representation of the link nodes in the visual link, quickly lock the link nodes with abnormal test results, and improve the efficiency of abnormal location.

[0090] See also Figure 3 , which is a schematic diagram of the structure of a dual-power supply correspondence test device provided in an embodiment of the present application. Figure 3 As shown, the device 20 includes a voltage configuration module 21 , a voltage acquisition module 22 and a testing module 23 .

[0091] The voltage configuration module 21 is used to configure the variable output voltage of the first power supply in the dual power supply to a first voltage value, and to configure the variable output voltage of the second power supply in the dual power supply to a second voltage value; the variable output voltage is the output voltage obtained by voltage regulation of the UPS or transformer; the difference between the first voltage value and the second voltage value is not less than a preset difference. The voltage acquisition module 22 is used to scan each first link node in the first power supply and each second link node in the second power supply in real time, and respectively obtain the first voltage data corresponding to each first link node and the second voltage data corresponding to each second link node; the first link node and the second link node have a one-to-one correspondence and are located in the same link position in the dual power supply; the test module 23 is used to determine the correspondence test result of each link node in the dual power supply by comparing the first voltage data and the second voltage data corresponding to each group of first link nodes and second link nodes in the same link position.

[0092] The embodiment of the present application provides a dual-power supply correspondence testing device that can execute the technical solution shown in the above method embodiment. Its implementation principle and beneficial effects are similar and will not be repeated here.

[0093] Further, based on the above embodiment, if the configured first voltage value is greater than the second voltage value, the test module 23 is specifically used to perform the following operations for each first link node and the second link node corresponding to the first link node: when the voltage difference obtained by subtracting the second voltage data from the first voltage data is greater than or equal to the preset threshold value, the correspondence test results of the first link node and the second link node are both normal connections; when the voltage difference obtained by subtracting the second voltage data from the first voltage data is less than the preset threshold value, the correspondence test results of the first link node and the second link node are both abnormal connections.

[0094] The embodiment of the present application provides a dual-power supply correspondence testing device that can execute the technical solution shown in the above method embodiment. Its implementation principle and beneficial effects are similar and will not be repeated here.

[0095] Furthermore, based on the above embodiment, connection abnormalities include false dual-circuit and reversed line connection; false dual-circuit means that at any link node, both sides of the dual-circuit power supply are connected to the same power supply; reversed line means that at any link node, the two sides of the dual-circuit power supply are connected to the power supply interchangeably. When the test module 23 is used to obtain the correspondence test results of the first link node and the second link node as a connection abnormality when the voltage difference obtained by subtracting the second voltage data from the first voltage data is less than a preset threshold, the test module 23 is specifically used to obtain the correspondence test result of the first link node and the second link node as a false dual-circuit when the absolute value corresponding to the voltage difference obtained by subtracting the second voltage data from the first voltage data is less than a preset threshold; when the voltage difference obtained by subtracting the second voltage data from the first voltage data is less than the preset threshold and the voltage difference is a negative number, the correspondence test result of the first link node and the second link node is reversed line connection.

[0096] The embodiment of the present application provides a dual-power supply correspondence testing device that can execute the technical solution shown in the above method embodiment. Its implementation principle and beneficial effects are similar and will not be repeated here.

[0097] Furthermore, based on the above embodiment, the link node includes at least one of a transformer node, a UPS node, a power distribution cabinet node and a PDU node.

[0098] The embodiment of the present application provides a dual-power supply correspondence testing device that can execute the technical solution shown in the above method embodiment. Its implementation principle and beneficial effects are similar and will not be repeated here.

[0099] Furthermore, based on the above embodiment, the voltage acquisition module 22 is specifically used to run a preconfigured GUI script to start a real-time scanning operation on the sensor set in each link node of the dual power supply; and obtain the first voltage data corresponding to each first link node and the second voltage data corresponding to each second link node.

[0100] The embodiment of the present application provides a dual-power supply correspondence testing device that can execute the technical solution shown in the above method embodiment. Its implementation principle and beneficial effects are similar and will not be repeated here.

[0101] Furthermore, based on the above embodiment, the test module 23 may further include a visualization submodule. The visualization submodule is used to display a visualization interface corresponding to the GUI script, which includes a visualization link that represents the entire link of the dual power supply and each link node.

[0102] The embodiment of the present application provides a dual-power supply correspondence testing device that can execute the technical solution shown in the above method embodiment. Its implementation principle and beneficial effects are similar and will not be repeated here.

[0103] Further, based on the above embodiment, if the configured first voltage value is greater than the second voltage value, the visualization display submodule is used to perform the following operations in the visualization link for each first link node and the second link node corresponding to the first link node: when the voltage difference between the first voltage data and the second voltage data is greater than or equal to the preset threshold, the link node corresponding to the maximum value of the first voltage data and the second voltage data is represented by the first color, and the link node corresponding to the minimum value of the first voltage data and the second voltage data is represented by the second color; when the voltage difference between the first voltage data and the second voltage data is less than the preset threshold, the first link node corresponding to the first voltage data and the second link node corresponding to the second voltage data are represented by the third color, so that the user can judge the correspondence test results of the dual power supply according to the color of each link node in the visualization link.

[0104] The embodiment of the present application provides a dual-power supply correspondence testing device that can execute the technical solution shown in the above method embodiment. Its implementation principle and beneficial effects are similar and will not be repeated here.

[0105] See also Figure 4 , which is a schematic diagram of the structure of an electronic device provided in an embodiment of the present application, including:

[0106] Memory 11, for storing computer programs;

[0107] The processor 12 is configured to implement the steps of a method for testing the correspondence of a dual power supply as described in any of the above method embodiments when executing the computer program.

[0108] In this embodiment, the device may be an in-vehicle computer, a PC (Personal Computer), or a terminal device such as a smart phone, a tablet computer, a PDA, or a portable computer.

[0109] The device may include a memory 11 , a processor 12 , and a bus 13 .

[0110] The memory 11 includes at least one type of readable storage medium, including flash memory, a hard disk, a multimedia card, a card-type memory (e.g., SD or DX memory), a magnetic storage device, a magnetic disk, an optical disk, etc. In some embodiments, the memory 11 may be an internal storage unit of the device, such as the device's hard disk. In other embodiments, the memory 11 may also be an external storage device, such as a plug-in hard disk, a SmartMedia Card (SMC), a Secure Digital (SD) card, a flash memory card, etc. Furthermore, the memory 11 may include both an internal storage unit and an external storage device. The memory 11 can be used not only to store application software installed in the device and various data, such as program code for executing the dual power supply correspondence test method, but also to temporarily store data that has been output or is about to be output. In some embodiments, the processor 12 may be a central processing unit (CPU).

[0111] In some embodiments, the processor 12 can be a central processing unit (CPU), a controller, a microcontroller, a microprocessor, or other data processing chip, used to run the program code stored in the memory 11 or process data, such as the program code for executing the correspondence test method of the dual power supply.

[0112] The bus 13 may be a peripheral component interconnect (PCI) bus or an extended industry standard architecture (EISA) bus. The bus may be divided into an address bus, a data bus, a control bus, etc. For ease of representation, Figure 4 Only one thick line is used in the diagram, but this does not mean that there is only one bus or one type of bus.

[0113] Furthermore, the device may also include a network interface 14, which may optionally include a wired interface and / or a wireless interface (such as a WI-FI interface, a Bluetooth interface, etc.), which is generally used to establish a communication connection between the device and other electronic devices.

[0114] Optionally, the device may further include a user interface 15, which may include a display and an input unit such as a keyboard. Optionally, the user interface 15 may also include a standard wired interface or a wireless interface. Optionally, in some embodiments, the display may be an LED display, a liquid crystal display, a touch-sensitive liquid crystal display, or an OLED (Organic Light-Emitting Diode) touchscreen. The display may also be appropriately referred to as a display screen or display unit, and is used to display information processed by the device and to display a visual user interface.

[0115] Figure 4 Only the device with components 11-15 is shown, and it will be understood by those skilled in the art that Figure 4 The structure shown does not constitute a limitation of the device, and may include fewer or more components than shown, or combine certain components, or arrange the components differently.

[0116] Based on the same inventive concept, corresponding to any of the above-mentioned embodiments and methods, an embodiment of the present application also provides a computer-readable storage medium, wherein the computer-readable storage medium stores computer instructions, and the computer instructions are used to enable the computer to execute the correspondence test method of the dual power supply as described in any of the above embodiments.

[0117] The computer-readable media of the embodiments of the present application include permanent and non-permanent, removable and non-removable media that can be used to store information by any method or technology. The information can be computer-readable instructions, data structures, modules of programs or other data. Examples of computer storage media include, but are not limited to, phase change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technology, read-only compact disc read-only memory (CD-ROM), digital versatile disc (DVD) or other optical storage, magnetic cassettes, magnetic tape magnetic disk storage or other magnetic storage devices or any other non-transmission media that can be used to store information that can be accessed by a computing device.

[0118] The computer instructions stored in the storage medium of the above embodiment are used to enable the computer to execute the correspondence test method of the dual power supply as described in any of the above embodiments, and have the beneficial effects of the corresponding method embodiments, which will not be repeated here.

[0119] It should be noted that the various embodiments in this specification are described in a progressive manner. The same or similar parts between the various embodiments can be referred to each other, and each embodiment focuses on the differences from other embodiments. In particular, for methods, devices, electronic devices and media, since they are basically similar to the method embodiments, the description is relatively simple. For relevant parts, refer to the partial description of the method embodiments. The methods, devices, electronic devices and media described above are merely illustrative. The units described as separate components may or may not be physically separated, and the components indicated as units may or may not be physical units, that is, they may be located in one place or distributed across multiple network units. Some or all of the modules can be selected according to actual needs to achieve the purpose of the solution of this embodiment. A person of ordinary skill in the art can understand and implement them without expending any creative effort.

[0120] The above is merely one specific embodiment of the present application, but the scope of protection of the present application is not limited thereto. Any changes or substitutions that can be easily conceived by a person skilled in the art within the technical scope disclosed in this application should be included in the scope of protection of the present application. Therefore, the scope of protection of the present application should be based on the scope of protection of the claims.

Claims

1. A method for testing the correspondence of a dual power supply, characterized in that: include: configuring the variable output voltage of a first power supply in a dual power supply to a first voltage value, and configuring the variable output voltage of a second power supply in the dual power supply to a second voltage value; The variable output voltage is the output voltage obtained by voltage regulation of the UPS or transformer; The difference between the first voltage value and the second voltage value is not less than a preset difference; Scanning each first link node in the first power supply and each second link node in the second power supply in real time, and respectively acquiring first voltage data corresponding to each first link node and second voltage data corresponding to each second link node; The first link node and the second link node have a one-to-one correspondence and are located at the same link position in the dual power supply; By comparing the first voltage data and the second voltage data corresponding to each group of the first link node and the second link node at the same link position, the correspondence test result of each link node in the dual power supply is determined.

2. The method according to claim 1, characterized in that If the configured first voltage value is greater than the second voltage value, determining the correspondence test result of each link node in the dual power supply by comparing the first voltage data and the second voltage data corresponding to each group of first link nodes and second link nodes at the same link position, includes: For each first link node and the second link node corresponding to the first link node, perform the following operations: When a voltage difference obtained by subtracting the second voltage data from the first voltage data is greater than or equal to a preset threshold, a correspondence test result of the first link node and the second link node is obtained, indicating that both are connected normally; When a voltage difference obtained by subtracting the second voltage data from the first voltage data is smaller than a preset threshold, the correspondence test results of the first link node and the second link node are both abnormal connections.

3. The method according to claim 2, characterized in that The connection anomaly includes false dual-circuit and reverse connection of the line; the false dual-circuit means that at any link node, both lines of the dual-circuit power supply are connected to the same power supply; the reverse connection means that at any link node, the two lines of the dual-circuit power supply are connected to the power supply interchangeably; When a voltage difference obtained by subtracting the second voltage data from the first voltage data is less than a preset threshold, obtaining a correspondence test result that both the first link node and the second link node are abnormally connected includes: When the absolute value of the voltage difference obtained by subtracting the second voltage data from the first voltage data is less than a preset threshold, the correspondence test result of the first link node and the second link node is obtained as a false two-way; When the voltage difference obtained by subtracting the second voltage data from the first voltage data is less than a preset threshold and the voltage difference is a negative number, the correspondence test result between the first link node and the second link node is reverse connection of the line.

4. The method according to claim 3, characterized in that The link node includes at least one of a transformer node, a UPS node, a power distribution cabinet node and a PDU node.

5. The method according to claim 1, wherein The real-time scanning of each first link node in the first power supply and each second link node in the second power supply, and respectively acquiring first voltage data corresponding to each first link node and second voltage data corresponding to each second link node, includes: Running a pre-configured GUI script to initiate a real-time scanning operation on a sensor provided in each link node of the dual power supply; The first voltage data corresponding to each first link node and the second voltage data corresponding to each second link node are obtained.

6. The method according to claim 5, characterized in that The visualization interface corresponding to the GUI script includes a visualization link, and the visualization link represents the entire link of the dual power supply and each link node.

7. The method according to claim 6, characterized in that If the configured first voltage value is greater than the second voltage value, determining the correspondence test result of each link node in the dual power supply by comparing the first voltage data and the second voltage data corresponding to each group of first link nodes and second link nodes at the same link position, includes: In the visualization link, for each first link node and a second link node corresponding to the first link node, perform the following operations: When the voltage difference between the first voltage data and the second voltage data is greater than or equal to a preset threshold, the link node corresponding to the maximum value between the first voltage data and the second voltage data is represented by a first color, and the link node corresponding to the minimum value between the first voltage data and the second voltage data is represented by a second color; When the voltage difference between the first voltage data and the second voltage data is less than a preset threshold, the first link node corresponding to the first voltage data and the second link node corresponding to the second voltage data are represented by a third color, so that the user can judge the correspondence test result of the dual power supply according to the color of each link node in the visual link.

8. A dual-power supply correspondence test device, characterized in that: include: a voltage configuration module, configured to configure the variable output voltage of a first power supply in a dual power supply to a first voltage value, and to configure the variable output voltage of a second power supply in the dual power supply to a second voltage value; The variable output voltage is the output voltage obtained by voltage regulation of the UPS or transformer; The difference between the first voltage value and the second voltage value is not less than a preset difference; a voltage acquisition module, configured to scan in real time each first link node in the first power supply and each second link node in the second power supply, and respectively acquire first voltage data corresponding to each first link node and second voltage data corresponding to each second link node; The first link node and the second link node have a one-to-one correspondence and are located at the same link position in the dual power supply; The testing module is used to determine the correspondence test result of each link node in the dual power supply by comparing the first voltage data and the second voltage data corresponding to each group of the first link node and the second link node at the same link position.

9. An electronic device, characterized in that: The device includes: a processor, and a memory communicatively connected to the processor; The memory stores computer-executable instructions; The processor executes the computer-executable instructions stored in the memory to implement the method according to any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that The computer-readable storage medium stores computer-executable instructions, which are used to implement the method according to any one of claims 1 to 7 when executed by a processor.

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