Test device

Abstract

The invention discloses test equipment. The test equipment comprises a test mechanism and a material taking mechanism, the testing mechanism comprises a detection jig, a limiting part and a detector, a detection groove for placing a chip is formed in the detection jig, a terminal of the detector is arranged in the detection groove, the limiting part is movably arranged on the detection jig between a first position and a second position, and the material taking mechanism comprises a driving module, a material taking module and a linkage module. The driving module is in driving connection with the material taking module and the linkage module and is used for driving the material taking module and the linkage module to be close to or away from the detection jig, and the linkage module can push the limiting part so that the limiting part can move to the second position from the first position. After the chip is arranged in the detection groove, the chip is in contact with the terminal of the detector, and the limiting part at the first position can abut against the side, away from the terminal, of the chip, so that the chip is tightly connected with the terminal, and the detection accuracy is ensured.

Description

Technical Field

[0001] The present application relates to the field of chip testing technology, and in particular to a testing device. Background Art

[0002] After the chip is burned, it needs to be tested to check whether the chip is burned successfully. In the related technology, the chip is grabbed by a robot and placed in a detection fixture. The terminals of the detector are set at the bottom of the groove of the detection fixture. The chip contacts the terminals of the detector. The detector is electrically connected to the chip to detect the chip. The chip is placed on the terminals only by gravity. There is a problem of inaccurate detection due to poor contact between the chip and the terminals. Summary of the Invention

[0003] The present application aims to solve at least one of the technical problems existing in the prior art. To this end, the present application proposes a testing device that can tightly connect a chip with a terminal of a detector to ensure the accuracy of the detection.

[0004] The testing equipment according to the embodiment of the present application includes: a testing mechanism and a material taking mechanism.

[0005] A testing mechanism includes a testing jig, a limiting portion, and a detector. The testing jig is formed with a testing slot for placing a chip. The terminal of the detector is disposed in the testing slot and is configured to electrically connect to the chip in the testing slot. The limiting portion is movably disposed on the testing jig between a first position and a second position. When the limiting portion is in the first position, the limiting portion abuts against a side of the chip in the testing slot that is away from the terminal. When the limiting portion is in the second position, the limiting portion is offset from a projection of the testing slot on a horizontal plane. The material picking mechanism includes a driving module, a material picking module and a linkage module. The driving module drives and connects the material picking module and the linkage module to drive the material picking module and the linkage module to approach or move away from the detection fixture. The linkage module can push the limiting part to move the limiting part from the first position to the second position. The material picking module is used to pick up and place chips.

[0006] The testing device according to the embodiment of the present application has at least the following beneficial effects: after the chip is placed in the detection slot, the chip contacts the terminal of the detector, and the limiting portion in the first position can abut against the side of the chip facing away from the terminal, so that the chip and the terminal are tightly connected, thereby ensuring the accuracy of the detection. In addition, the linkage module can push the limiting portion from the first position to the second position, so that the limiting portion moves to a position where the projection on the horizontal plane is offset from the detection slot, allowing the detection slot to open, facilitating the material extraction module to remove and place the chip relative to the detection slot, and preventing the limiting portion from interfering with the material extraction module's chip removal process.

[0007] According to some embodiments of the present application, the detection fixture includes a base, a floating seat and an elastic member, the base is provided with the detection slot, the floating seat is connected to the base through the elastic member, one end of the limiting part is rotatably connected to the base or the floating seat, and the other end can abut against the chip, and the linkage module can push the floating seat to drive the limiting part to rotate.

[0008] According to some embodiments of the present application, the base is provided with a movable groove, the floating seat is provided with a movable block, one end of the limiting portion is rotatably connected to the movable block, the movable block can be raised and lowered in the movable groove, and the limiting portion can be against the edge of the movable groove.

[0009] According to some embodiments of the present application, the testing mechanism further includes a sensor, which is electrically connected to the material taking module. The floating seat is provided with a convex column, and the sensing end of the sensor is arranged in the lifting path of the convex column.

[0010] According to some embodiments of the present application, the material picking mechanism also includes a mounting seat, the driving module is driven and connected to the mounting seat, the mounting seat has a first mounting surface and a second mounting surface, the first mounting surface and the second mounting surface intersect, the material picking module is arranged on the first mounting surface, and the linkage module is arranged on the second mounting surface.

[0011] According to some embodiments of the present application, the material picking module includes a first lifting drive and a material picking head. The first lifting drive is fixed to the first mounting surface. The first lifting drive drives the material picking head to drive the material picking head to rise and fall. The material picking head is used to adsorb chips.

[0012] According to some embodiments of the present application, the material taking module further includes a pump body, the pump body is fixed to the mounting seat, and the suction end of the pump body is connected to the material taking head.

[0013] According to some embodiments of the present application, the linkage module includes a second lifting drive and a pressure plate, the second lifting drive is fixed to the second mounting surface, the second lifting drive drives the pressure plate to drive the pressure plate to rise and fall, and the pressure plate is used to push the limiting part.

[0014] According to some embodiments of the present application, a loading mechanism is further included, which is used to transport a first carrier tape, on which chips to be tested are placed. The picking mechanism is arranged next to the picking mechanism, and the driving module can drive the picking module to approach or move away from the first carrier tape.

[0015] According to some embodiments of the present application, a unloading mechanism is further included, which is used to transport a second carrier tape, on which the inspected chips are placed. The picking mechanism is arranged next to the picking mechanism, and the driving module can drive the picking module to approach or move away from the second carrier tape.

[0016] Additional aspects and advantages of the present application will be given in part in the description below, and in part will become obvious from the description below, or will be learned through practice of the present application. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] The present application is further described below with reference to the accompanying drawings and embodiments, wherein: Figure 1 A schematic structural diagram of a test device according to an embodiment of the present application; Figure 2 for Figure 1 Schematic diagram of the structure of the center reclaiming mechanism; Figure 3 for Figure 2 A schematic diagram of the structure of the middle reclaiming mechanism in another direction; Figure 4 for Figure 1 Schematic diagram of the structure of the test organization; Figure 5 for Figure 1 Schematic diagram of the structure of the positioning fixture.

[0018] Reference numerals: Reclaiming mechanism 1000; Driving module 100; Retrieving module 200, first lifting driver 210, belt transmission assembly 211, first transmission wheel 2111, second transmission wheel 2112, transmission belt 2113, first motor 212, retrieving head 220, pump body 230, first guide assembly 240, first slide rail 241, first slide seat 242, first shielding piece 250, first position sensor 260; Linkage module 300, second lifting driver 310, second motor 311, connecting block 312, pressing plate 320, avoidance hole 321, second guide assembly 330, second slide rail 331, second slide seat 332, second shielding piece 340, second position sensor 350; Mounting seat 400, first mounting surface 410, second mounting surface 420, third mounting surface 430; through slot 440; Testing Agency 2000; Detection fixture 500, detection tank 510, base 520, movable tank 521, floating seat 530, movable block 531, protruding column 532, elastic member 540; Limiting portion 600; Sensor 700; Positioning fixture 800, positioning groove 810; Platform 900; Feeding mechanism 3000; Unloading mechanism 4000. DETAILED DESCRIPTION

[0019] The following describes in detail embodiments of the present application. Examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present application and are not to be construed as limiting the present application.

[0020] In the description of this application, it should be understood that descriptions involving orientations, such as up, down, front, back, left, right, etc., indicating orientations or positional relationships, are based on the orientations or positional relationships shown in the accompanying drawings. They are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation. Therefore, they cannot be understood as limitations on this application.

[0021] In the description of this application, "several" means more than one, "plurality" means more than two, "greater than," "less than," and "exceed" are understood to exclude the number itself, while "above," "below," and "within" are understood to include the number itself. The use of "first" and "second" in the description is solely for the purpose of distinguishing technical features and should not be construed as indicating or implying relative importance, implicitly specifying the number of the indicated technical features, or implicitly specifying the order of the indicated technical features.

[0022] In the description of this application, unless otherwise clearly defined, terms such as setting, installing, and connecting should be understood in a broad sense, and technicians in the relevant technical field can reasonably determine the specific meanings of the above terms in this application based on the specific content of the technical solution.

[0023] In the description of this application, reference to the terms "one embodiment," "some embodiments," "illustrative embodiments," "examples," "specific examples," or "some examples" means that the specific features, structures, materials, or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of this application. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials, or characteristics described can be combined in any appropriate manner in any one or more embodiments or examples.

[0024] Reference Figures 1 to 4 The testing equipment according to the embodiment of the present application includes: a testing mechanism 2000 and a material taking mechanism 1000 .

[0025] Testing mechanism 2000 includes a testing fixture 500, a stopper 600, and a detector (not shown). A testing slot 510 for placing a chip is formed on the testing fixture 500. The detector's terminals are disposed in the testing slot 510 for electrically connecting to the chip within the testing slot 510. The stopper 600 is movably disposed on the testing fixture 500 between a first position and a second position. When the stopper 600 is in the first position, the stopper 600 abuts against a side of the chip within the testing slot 510 that faces away from the terminal. When the stopper 600 is in the second position, the stopper 600 and the projection of the testing slot 510 on the horizontal plane are offset. The material picking mechanism 1000 includes a driving module 100, a material picking module 200 and a linkage module 300. The driving module 100 drives and connects the material picking module 200 and the linkage module 300 to drive the material picking module 200 and the linkage module 300 to approach or move away from the detection fixture 500. The linkage module 300 can push the limiting part 600 to move the limiting part 600 from the first position to the second position. The material picking module 200 is used to pick up and place chips.

[0026] It is understandable that the driving module 100 can drive the material taking module 200 and the linkage module 300 to move, so that the material taking module 200 and the linkage module 300 move to above the detection fixture 500 . In the initial state, the limiter 600 is in the first position, and the projection of the limiter 600 and the detection slot 510 on the horizontal plane overlap. The limiter 600 will hinder the process of the material retrieving module 200 placing the chip in the detection slot 510. Therefore, the linkage module 300 can first push the limiter 600 to move the limiter 600 from the first position to the second position. When the limiter 600 moves to the second position, the projection of the limiter 600 and the detection slot 510 on the horizontal plane are staggered, thereby causing the detection slot 510 to open and leak. The limiter 600 will not hinder the process of the material retrieving module 200 placing the chip in the detection slot 510. In addition, the linkage module 300 remains in contact with the limiter 600, and the limiter 600 remains in the second position. Subsequently, the material retrieving module 200 places the chip in the detection slot 510, and one side of the chip is connected to the terminal of the detector, and the detector is electrically connected to the chip through the terminal. Next, the linkage module 300 moves away from the limiting portion 600. Under the action of gravity, the push of the linkage module 300, or the pulling action of the reset structure, the limiting portion 600 moves from the second position to the first position. The limiting portion 600 abuts against the side of the chip away from the terminal, and the limiting portion 600 can give the chip a force squeezing toward the terminal, so that the chip and the terminal are tightly connected. Subsequently, the detector can detect the chip. Accordingly, after the chip detection is completed, the linkage module 300 pushes the limiting portion 600 to move from the first position to the second position, and the material removal module 200 removes the chip that has completed the detection in the detection slot 510.

[0027] Thus, after the chip is placed in the detection slot 510, the chip contacts the terminals of the detector. The limiting portion 600 in the first position can abut against the side of the chip facing away from the terminals, ensuring a tight connection between the chip and the terminals, thereby ensuring detection accuracy. Furthermore, the linkage module 300 can push the limiting portion 600 from the first position to the second position, moving the limiting portion 600 to a position where its projection on the horizontal plane is offset from the detection slot 510, allowing the detection slot 510 to open, facilitating the retrieval module 200 to remove and place the chip relative to the detection slot 510, and preventing the limiting portion 600 from interfering with the retrieval module 200's chip removal process.

[0028] Reference Figure 4 According to some embodiments of the present application, the detection fixture 500 includes a base 520, a floating seat 530 and an elastic member 540. The base 520 is provided with a detection slot 510. The floating seat 530 is connected to the base 520 through the elastic member 540. One end of the limiting portion 600 is rotatably connected to the base 520 or the floating seat 530, and the other end can abut against the chip. The linkage module 300 can push the floating seat 530 to drive the limiting portion 600 to rotate.

[0029] It can be understood that the linkage module 300 can push the floating seat 530 from top to bottom to drive the floating seat 530 to descend, and the elastic member 540 is compressed. In some embodiments, one end of the limiting portion 600 is rotatably connected to the floating seat 530. The descent of the floating seat 530 drives one end of the limiting portion 600 to descend, and the lower side of the limiting portion 600 is against the base 520. As the floating seat 530 descends and approaches the base 520, the limiting portion 600 rotates relative to the floating seat 530, so that the other end of the limiting portion 600 is tilted to move away from the detection slot 510 and staggered with the projection of the detection slot 510 on the horizontal plane, that is, the limiting portion 600 reaches the second position. After the chip is placed in the detection groove 510, the linkage module 300 moves away from the floating seat 530, the elastic member 540 stretches, the elastic member 540 pushes the floating seat 530 to rise, and the floating seat 530 drives one end of the limiting part 600 to rise, so that the other end of the limiting part 600 is pressed down and abuts against one side of the chip, and the limiting part 600 returns to the first position. It should be understood that the terminal of the detector is arranged at the bottom of the detection groove 510, the lower side of the chip is connected to the terminal, and the floating seat 530 drives the limiting part 600 to swing, so that the limiting part 600 can abut against the upper side of the chip from top to bottom, so that the chip can be tightly connected with the terminal under the action of gravity and the pressure of the limiting part 600, and under the elastic force of the elastic part 540, the floating seat 530 without external force is maintained at a certain height, so that the limiting part 600 is maintained in the first position, and the elastic force of the elastic part 540 is converted into the pressure of the limiting part 600 abutting the chip, so that the pressure of the limiting part 600 on the chip will not be too large, reducing the risk of chip damage.

[0030] In other embodiments, one end of the stopper 600 is rotatably connected to the base 520, and the floating seat 530 descends to press the stopper 600 downward, causing the other end of the stopper 600 to tilt upward, and the stopper 600 reaches the second position. After the chip is placed in the testing tank 510, the linkage module 300 moves away from the floating seat 530, and the elastic member 540 extends, pushing the floating seat 530 upward, and the stopper 600 returns to the first position under the action of gravity.

[0031] Reference Figure 4 According to some embodiments of the present application, the base 520 is provided with a movable groove 521, the floating seat 530 is provided with a movable block 531, one end of the limiting portion 600 is rotatably connected to the movable block 531, the movable block 531 can be raised and lowered in the movable groove 521, and the limiting portion 600 can be against the edge of the movable groove 521.

[0032] It is understood that when the linkage module 300 pushes the floating seat 530 downward, the movable block 531 on the floating seat 530 moves downward within the movable groove 521 of the base 520, driving one end of the limiting portion 600 downward, and the middle portion of the limiting portion 600 abuts against the edge of the movable groove 521, thereby causing the other end of the limiting portion 600 to move upward and tilt, and the other end of the limiting portion 600 is moved away from the detection groove 510. Correspondingly, when the floating seat 530 rises under the elastic force of the elastic member 540, the movable block 531 on the floating seat 530 moves upward within the movable groove 521 of the base 520, driving one end of the limiting portion 600 upward and the other end of the limiting portion 600 downward, so that it can abut against the chip in the detection groove 510. Thus, by attaching the stopper 600 to the floating seat 530, the stopper 600 can rise and fall with the floating seat 530, thereby swinging. Consequently, when the elastic member 540 pushes the floating seat 530 back to its original position, the stopper 600 can move from the second position to the first position, converting the elastic force of the elastic member 540 into pressure on the chip. Furthermore, by connecting the stopper 600 to the movable block 531, the movable block 531 rises and falls within the movable slot 521, causing the stopper 600 to swing, thereby reducing the size of the inspection jig 500.

[0033] Specifically, the limiting portion 600 is roughly rod-shaped, with the end of the limiting portion 600 that contacts the chip forming a downward hook to facilitate contact between the limiting portion 600 and the chip. Two limiting portions 600 are provided: two movable blocks 531 are provided on the floating seat 530, and two movable slots 521 are provided on the base 520. Each limiting portion 600 is connected to a movable block 531, and each movable block 531 is movably positioned within a movable slot 521. The floating seat 530 is frame-shaped, with a hollowed-out portion in the middle of the floating seat 530 corresponding to the detection slot 510 to allow the material removal module 200 to pass through. The movable blocks 531 are provided on either side of the lower end of the floating seat 530. Movable slots 521 are formed on either side of the upper end of the base 520. Four elastic members 540 are provided, connected to the four corners of the floating seat 530 and the base 520, respectively.

[0034] Reference Figure 4 According to some embodiments of the present application, the testing mechanism 2000 further includes a sensor 700 , which is electrically connected to the material taking module 200 , and the floating seat 530 is provided with a boss 532 , and the sensing end of the sensor 700 is arranged in the lifting path of the boss 532 .

[0035] It can be understood that when the linkage module 300 presses down the floating seat 530, the boss 532 on the floating seat 530 follows and descends. When the floating seat 530 pushes the limit part 600 to swing to the second position, the boss 532 can contact the sensing end of the sensor 700. The sensor 700 can transmit the signal to the material picking module 200. After receiving the signal, the material picking module 200 can perform the material discharge action.

[0036] Specifically, the protrusion 532 is disposed on a side of the floating seat 530 , and the sensor 700 is disposed on a side of the base 520 .

[0037] Reference Figure 2 and Figure 3 According to some embodiments of the present application, the material picking mechanism 1000 also includes a mounting seat 400, the driving module 100 drives the connected mounting seat 400, the mounting seat 400 has a first mounting surface 410 and a second mounting surface 420, the first mounting surface 410 and the second mounting surface 420 intersect, the material picking module 200 is arranged on the first mounting surface 410, and the linkage module 300 is arranged on the second mounting surface 420.

[0038] It is understood that the retrieving module 200 and the linkage module 300 are both disposed on the mounting base 400, and the drive module 100 drives the mounting base 400. The drive module 100 drives the retrieving module 200 and the linkage module 300 to move simultaneously by driving the mounting base 400. This can reduce the use of drivers, thereby reducing the space occupied by the retrieving mechanism 1000 and saving production costs. Furthermore, arranging the retrieving module 200 and the linkage module 300 on the intersecting first mounting surface 410 and second mounting surface 420, respectively, can further reduce the space occupied by the retrieving mechanism 1000, making the structure more compact.

[0039] Specifically, the cross section of the mounting base 400 is L-shaped, and the first mounting surface 410 and the second mounting surface 420 are perpendicular to each other and are two adjacent vertical surfaces of the L-shaped mounting base 400 .

[0040] Specifically, in this embodiment, the drive module 100 includes a translation screw assembly, which drives the mounting base 400 to translate in a linear direction, thereby allowing the retrieving module 200 to move above the loading station, above the inspection fixture 500, and above the unloading station. In other embodiments, the drive module 100 may also include a lifting screw assembly, which is disposed at the driving end of the translation screw assembly, and the mounting base 400 is disposed at the driving end of the lifting screw assembly. The lifting screw assembly can respectively drive the retrieving module 200 and the linkage module 300 to rise and fall.

[0041] Reference Figure 2 According to some embodiments of the present application, the material picking module 200 includes a first lifting drive 210 and a material picking head 220. The first lifting drive 210 is fixed to the first mounting surface 410. The first lifting drive 210 drives the connected material picking head 220 to drive the material picking head 220 to rise and fall. The material picking head 220 is used to adsorb chips.

[0042] It is understood that after the material picking module 200 is translated to the top of the detection jig 500, the first lifting drive 210 drives the material picking head 220 to descend, and the material picking head 220 approaches the detection slot 510 of the detection jig 500. The material picking head 220 places the chip it has adsorbed into the detection slot 510. Subsequently, the first lifting drive 210 drives the material picking head 220 to rise and move away from the detection jig 500. Correspondingly, after the chip inspection is completed, the first lifting drive 210 drives the material picking head 220 to descend, and the material picking head 220 approaches the detection slot 510 of the detection jig 500. The material picking head 220 adsorbs the inspected chip in the detection slot 510. Subsequently, the first lifting drive 210 drives the material picking head 220 to rise and move away from the detection jig 500.

[0043] Reference Figure 2According to some embodiments of the present application, the material taking module 200 further includes a pump body 230 , which is fixed to the mounting base 400 , and the suction end of the pump body 230 is connected to the material taking head 220 .

[0044] It is understood that the pump body 230 is in communication with the dispensing head 220. When the pump body 230 is in operation, it can generate a vacuum in the dispensing head 220, causing the dispensing head 220 to absorb the chip. The pump body 230 is fixed to the mounting base 400, thereby reducing the length of the air pipe connecting the pump body 230 and the dispensing head 220. The pump body 230 and the dispensing head 220 move simultaneously with the mounting base 400, thereby preventing the air pipe from bending excessively during the movement of the mounting base 400.

[0045] Reference Figure 2 According to some embodiments of the present application, the linkage module 300 includes a second lifting driver 310 and a pressure plate 320. The second lifting driver 310 is fixed to the second mounting surface 420. The second lifting driver 310 drives the connected pressure plate 320 to drive the pressure plate 320 to rise and fall. The pressure plate 320 is used to push the limiting portion 600.

[0046] It is understood that after the retrieving module 200 translates to above the inspection jig 500, the second lifting actuator 310 drives the pressure plate 320 downward, and the pressure plate 320 approaches the limit portion 600 on the inspection jig 500. The pressure plate 320 pushes the limit portion 600 to swing to the second position, allowing the inspection slot 510 to open. After the retrieving head 220 places the chip in the inspection slot 510, the second lifting actuator 310 drives the pressure plate 320 upward and away from the inspection jig 500, and the limit portion 600 swings back to the first position and abuts against one side of the chip. Correspondingly, after the chip inspection is completed, the second lifting driver 310 drives the pressure plate 320 to descend, and the pressure plate 320 approaches the limit part 600 on the inspection fixture 500. The pressure plate 320 pushes the limit part 600 to swing to the second position to allow the inspection slot 510 to open, and the material head 220 adsorbs the chip that has been inspected in the inspection slot 510. Then, the second lifting driver 310 drives the pressure plate 320 to rise and away from the inspection fixture 500.

[0047] Reference Figure 2 and Figure 3 According to some embodiments of the present application, the first lifting drive 210 includes a belt transmission assembly 211 and a first motor 212. The side of the mounting seat 400 facing away from the first mounting surface 410 forms a third mounting surface 430. The first motor 212 is arranged on the third mounting surface 430. The driving end of the first motor 212 passes through the mounting seat 400 and is driven and connected to the belt transmission assembly 211. The belt transmission assembly 211 is driven and connected to the material picking head 220. The belt transmission assembly 211 is located between the material picking module 200 and the first mounting surface 410.

[0048] It is understood that the first motor 212 drives the reclaiming head 220 up and down via the belt drive assembly 211. The first motor 212 is positioned on the third mounting surface 430, thereby reducing the space occupied on the first mounting surface 410. The third mounting surface 430 and the first mounting surface 410 are located on opposite sides of the mounting base 400. The drive end of the first motor 212 passes through the mounting base 400 and connects to the belt drive assembly 211 on the first mounting surface 410, making connection convenient. Furthermore, the belt drive assembly 211 is relatively narrow and is positioned between the reclaiming module 200 and the first mounting surface 410. This effectively utilizes the gap between the reclaiming module 200 and the first mounting surface 410, resulting in a compact structure.

[0049] Reference Figure 2 According to some embodiments of the present application, the belt drive assembly 211 includes a first transmission wheel 2111, a second transmission wheel 2112 and a transmission belt 2113. The first transmission wheel 2111 and the second transmission wheel 2112 are rotatably connected to the first mounting surface 410. The first motor 212 drives the first transmission wheel 2111. The transmission belt 2113 is wound around the first transmission wheel 2111 and the second transmission wheel 2112. The material taking head 220 is connected to the transmission belt 2113. The first transmission wheel 2111 and the second transmission wheel 2112 are distributed along the height direction. The axis line of the first transmission wheel 2111 and the axis line of the second transmission wheel 2112 are both perpendicular to the first mounting surface 410.

[0050] As can be understood, the first motor 212 drives the first transmission wheel 2111 to rotate, and the first transmission wheel 2111 cooperates with the second transmission wheel 2112 to drive the transmission belt 2113 to rotate. Since the first transmission wheel 2111 and the second transmission wheel 2112 are arranged in the vertical direction, the transmission belt 2113 is partially arranged in the vertical direction, and the material retrieving head 220 is connected to the vertical portion of the transmission belt 2113. Therefore, the first motor 212 drives the first transmission wheel 2111 to rotate forward or reverse, thereby driving the transmission belt 2113 to rotate forward or reverse, and the vertical portion of the transmission belt 2113 drives the material retrieving head 220 to rise and fall. The radial dimensions of the first transmission wheel 2111 and the radial dimensions of the second transmission wheel 2112 are relatively small, and the axis of the first transmission wheel 2111 and the axis of the second transmission wheel 2112 are both perpendicular to the first mounting surface 410. This allows the spacing between the material retrieving module 200 and the first mounting surface 410 to be set smaller, making the structure more compact.

[0051] Reference Figure 2According to some embodiments of the present application, the material picking module 200 also includes a first guide assembly 240, the first guide assembly 240 includes a first slide rail 241 and a first slide seat 242, the first slide rail 241 is fixed to the first mounting surface 410, the first slide rail 241 is located next to the belt transmission assembly 211, the first slide rail 241 extends along the height direction, the first slide seat 242 is slidably connected to the first slide rail 241, and the material picking head 220 is fixed to the first slide seat 242.

[0052] It is understood that when the first lift actuator 210 drives the reclaiming head 220 to rise and fall, the first slide 242 moves along the first slide rail 241. The sliding fit between the first slide rail 241 and the first slide 242 guides the reclaiming head 220 during its rise and fall. Since both the first slide rail 241 and the belt drive assembly 211 extend in the height direction, positioning the first slide rail 241 beside the belt drive assembly 211 utilizes the horizontal space of the first mounting surface 410, resulting in a more compact structure.

[0053] Specifically, the transmission belt 2113 of the belt transmission assembly 211 is connected to the first slide 242 , and drives the first slide 242 to move up and down, thereby driving the material taking head 220 to move up and down.

[0054] Reference Figure 2 and Figure 3 According to some embodiments of the present application, the material picking module 200 also includes a first shielding piece 250 and at least two first position sensors 260. The first position sensor 260 is arranged on the third mounting surface 430. Multiple first position sensors 260 are distributed along the height direction. The first position sensor 260 is electrically connected to the first lifting drive 210. The mounting seat 400 is provided with a through slot 440 passing through the first mounting surface 410 and the second mounting surface 420. The first shielding piece 250 can be movably provided with the through slot 440 along the height direction. One end of the first shielding piece 250 is fixedly connected to the first slide 242, and the other end of the first shielding piece 250 can pass through the detection area of ​​the first position sensor 260.

[0055] It can be understood that when the first slide 242 drives the material picking head 220 to rise and fall, the first shielding plate 250 follows the first slide 242 to rise and fall. When the first slide 242 slides to a certain horizontal height, the first shielding plate 250 can pass through the detection area of ​​the first position sensor 260, and the first position sensor 260 can transmit the signal to the first lifting drive 210 to control the first lifting drive 210 to stop driving. For example, there are two first position sensors 260. The first slide 242 rises to drive the material picking head 220 away from the detection fixture 500, and the first blocking piece 250 will reach the detection area of ​​the first position sensor 260 located at a high place, that is, the material picking head 220 has completed picking up or placing the material, and the first lifting drive 210 stops driving to keep the material picking head 220 at the current height; the first slide 242 descends to drive the material picking head 220 close to the detection fixture 500, and the first blocking piece 250 will reach the detection area of ​​the first position sensor 260 located at a low place, that is, the material picking head 220 has reached a height at which the chip can be placed in the detection slot 510 or can adsorb the chip in the detection slot 510, and the first lifting drive 210 stops driving to facilitate the material picking head 220 to pick up and place the chip.

[0056] It is also understood that the first position sensor 260 is disposed on the third mounting surface 430, which can reduce the space occupied on the first mounting surface 410. The third mounting surface 430 and the first mounting surface 410 are located on opposite sides of the mounting base 400, and the first shielding piece 250 passes through the through slot 440 on the mounting base 400 to cooperate with the first position sensor 260 on the third mounting surface 430.

[0057] Reference Figure 2 According to some embodiments of the present application, the second lifting drive 310 includes a second motor 311 and a connecting block 312. The second motor 311 is fixed to the second mounting surface 420. The driving end of the second motor 311 is connected to the upper end of the connecting block 312. The connecting block 312 is located between the material taking head 220 and the second mounting surface 420. The pressing plate 320 is fixed to the lower end of the connecting block 312.

[0058] It is understood that the second motor 311 drives the connection block 312 to move up and down, thereby driving the pressure plate 320 to move up and down. The second motor 311 is connected to the upper end of the connection block 312, and the pressure plate 320 is located at the lower end of the connection block 312. This allows the second motor 311, the connection block 312, and the pressure plate 320 to be distributed along the height direction, thereby utilizing the height space on the second mounting surface 420. The connection block 312 only serves to connect the pressure plate 320 and the second motor 311. The connection block 312 is located between the material reclaiming head 220 and the second mounting surface 420. This allows the thickness of the connection block 312 to be set smaller, thereby reducing the distance between the material reclaiming head 220 and the second mounting surface 420, making the structure more compact.

[0059] Reference Figure 2 According to some embodiments of the present application, the linkage module 300 also includes a second guide assembly 330, the second guide assembly 330 includes a second slide rail 331 and a second slide seat 332, the second slide rail 331 is fixed to the second mounting surface 420, the second slide rail 331 and the second slide seat 332 are located between the connecting block 312 and the second mounting surface 420, the second slide rail 331 extends in the height direction, the second slide seat 332 is slidably connected to the second slide rail 331, and the connecting block 312 is fixed to the second slide seat 332.

[0060] It is understood that as the second motor 311 drives the pressure plate 320 up and down via the connecting block 312, the second slide 332 moves along the second slide rail 331. The sliding fit between the second slide rail 331 and the second slide 332 guides the lifting and lowering of the pressure plate 320. The second slide rail 331 and the connecting block 312 both extend in the height direction. The second slide rail 331 and the second slide 332 are positioned between the connecting block 312 and the second mounting surface 420, so that the projections of the connecting block 312, the second slide rail 331, and the second slide 332 on the second mounting surface 420 overlap, thereby reducing the space occupied by the second mounting surface 420 in the width direction.

[0061] Reference Figure 2 According to some embodiments of the present application, the linkage module 300 also includes a second shielding piece 340 and at least two second position sensors 350. The second position sensor 350 is arranged on the second mounting surface 420 and is located next to the connecting block 312. Multiple second position sensors 350 are distributed along the height direction. The second position sensor 350 is signal-connected to the second lifting driver 310. One end of the second shielding piece 340 is fixedly connected to the connecting block 312, and the other end of the second shielding piece 340 can pass through the detection area of ​​the second position sensor 350.

[0062] It is understood that when the connecting block 312 drives the pressure plate 320 to rise and fall, the second shielding piece 340 follows the connection block 312 in its rise and fall. When the connection block 312 slides to a certain horizontal height, the second shielding piece 340 can pass through the detection area of ​​the second position sensor 350. The second position sensor 350 can transmit this signal to the second lifting actuator 310 to control the second lifting actuator 310 to stop driving. For example, if two second position sensors 350 are provided, the connection block 312 descends, driving the pressure plate 320 closer to the detection fixture 500. The second shielding piece 340 will reach the detection area of ​​the second position sensor 350 located at the lower position, indicating that the pressure plate 320 has pushed the limiter 600 to a position away from the detection slot 510. The second lifting actuator 310 stops driving, maintaining the pressure plate 320 at its current height and the limiter 600 in its current position, facilitating subsequent chip removal by the retrieving head 220. The connecting block 312 rises and drives the pressing plate 320 away from the detection fixture 500. The second shielding piece 340 will reach the detection area of ​​the second position sensor 350 located at a high place. That is, the material picking head 220 completes the picking of the detected chip and the pressing plate 320 returns to the initial height. The second lifting drive 310 stops driving to facilitate the detection of the next chip.

[0063] Reference Figure 2 According to some embodiments of the present application, an avoidance hole 321 is opened in the middle of the pressing plate 320, and the material taking head 220 corresponds to the avoidance hole 321 along the height direction and can pass through the avoidance hole 321.

[0064] It is understandable that in the initial state, the pressing plate 320 is located below the material picking head 220. After the pressing plate 320 pushes the limiting portion 600, the material picking head 220 can move downward through the avoidance hole 321 in the middle of the pressing plate 320 to pick up and place the chip relative to the detection slot 510.

[0065] Reference Figure 1 According to some embodiments of the present application, it also includes a loading mechanism 3000, which is used to transport the first carrier, on which the chips to be tested are placed. The picking mechanism 1000 is arranged next to the picking mechanism 1000, and the driving module 100 can drive the picking module 200 to approach or move away from the first carrier.

[0066] It can be understood that the loading mechanism 3000 transports the first carrier to the side of the picking mechanism 1000, the driving module 100 drives the picking module 200 to move above the first carrier, the first lifting drive 210 drives the picking head 220 to descend, and the picking head 220 absorbs the chip to be tested on the first carrier.

[0067] Reference Figure 1According to some embodiments of the present application, a unloading mechanism 4000 is further included, which is used to transport the second carrier tape on which the inspected chips are placed. The picking mechanism 1000 is arranged next to the picking mechanism 1000, and the driving module 100 can drive the picking module 200 to approach or move away from the second carrier tape.

[0068] It can be understood that the unloading mechanism 4000 transports the second carrier to the side of the picking mechanism 1000, the driving module 100 drives the picking module 200 to move above the second carrier, the second lifting drive 310 drives the picking head 220 to descend, and the picking head 220 places the chips that have completed inspection on the second carrier.

[0069] Specifically, the unloading mechanism 4000 , the loading mechanism 3000 and the testing mechanism 2000 are distributed in the horizontal direction, and the driving module 100 can drive the material taking module 200 to move in the horizontal direction.

[0070] Reference Figure 1 and Figure 5 According to some embodiments of the present application, a positioning jig 800 is further included. The positioning jig 800 is arranged between the feeding mechanism 3000 and the testing mechanism 2000. The positioning jig 800 is provided with a positioning groove 810. The groove wall of the positioning groove 810 is inclined from high to low toward the middle.

[0071] It can be understood that before the material picking mechanism 1000 places the uninspected chip in the inspection jig 500, the driving module 100 drives the material picking module 200 to move to the top of the positioning jig 800, and the material picking module 200 places the chip in the positioning groove 810, and positions the position of the chip through the inclined groove wall of the positioning groove 810. Subsequently, the material picking module 200 places the positioned chip in the inspection groove 510 of the inspection jig 500 to improve the placement accuracy of the chip relative to the inspection groove 510.

[0072] Reference Figure 1 According to some embodiments of the present application, a platform 900 is further included, and a detection fixture 500 is detachably mounted on the platform 900. Specifically, a plurality of detection fixtures 500 are provided and distributed on the platform 900 along the driving direction of the driving module 100, and each detection fixture 500 corresponds to at least one limiting portion 600.

[0073] The embodiments of the present application have been described in detail above with reference to the accompanying drawings. However, the present application is not limited to the above embodiments. Various modifications can be made within the scope of knowledge possessed by ordinary technicians in the relevant technical field without departing from the purpose of the present application. In addition, the embodiments of the present application and the features of the embodiments can be combined with each other unless there is a conflict.

Claims

1. Test equipment, characterized in that, include: A testing mechanism includes a testing jig, a limiting portion, and a detector. The testing jig is formed with a testing slot for placing a chip. The terminal of the detector is disposed in the testing slot and is configured to electrically connect to the chip in the testing slot. The limiting portion is movably disposed on the testing jig between a first position and a second position. When the limiting portion is in the first position, the limiting portion abuts against a side of the chip in the testing slot that is away from the terminal. When the limiting portion is in the second position, the limiting portion is offset from a projection of the testing slot on a horizontal plane. The material picking mechanism includes a driving module, a material picking module and a linkage module. The driving module drives and connects the material picking module and the linkage module to drive the material picking module and the linkage module to approach or move away from the detection fixture. The linkage module can push the limiting part to move the limiting part from the first position to the second position. The material picking module is used to pick up and place chips.

2. The testing device according to claim 1, characterized in that The detection fixture includes a base, a floating seat and an elastic member. The base has the detection slot, and the floating seat is connected to the base through the elastic member. One end of the limiting part is rotatably connected to the base or the floating seat, and the other end can abut against the chip. The linkage module can push the floating seat to drive the limiting part to rotate.

3. The testing device according to claim 2, characterized in that The base is provided with a movable groove, the floating seat is provided with a movable block, one end of the limiting portion is rotatably connected to the movable block, the movable block is liftably provided in the movable groove, and the limiting portion can abut against the edge of the movable groove.

4. The testing device according to claim 2, characterized in that The testing mechanism further includes a sensor, which is electrically connected to the material taking module. The floating seat is provided with a convex column, and the sensing end of the sensor is arranged in the lifting path of the convex column.

5. The testing device according to claim 1, characterized in that The material picking mechanism also includes a mounting seat, the driving module is driven and connected to the mounting seat, the mounting seat has a first mounting surface and a second mounting surface, the first mounting surface and the second mounting surface intersect, the material picking module is arranged on the first mounting surface, and the linkage module is arranged on the second mounting surface.

6. The testing device according to claim 5, characterized in that The material picking module includes a first lifting driver and a material picking head. The first lifting driver is fixed to the first mounting surface. The first lifting driver is driven and connected to the material picking head to drive the material picking head to rise and fall. The material picking head is used to adsorb chips.

7. The testing device according to claim 6, characterized in that The material taking module further includes a pump body, which is fixed to the mounting seat, and the air suction end of the pump body is connected to the material taking head.

8. The testing device according to claim 5, characterized in that The linkage module includes a second lifting driver and a pressure plate. The second lifting driver is fixed to the second mounting surface. The second lifting driver is driven and connected to the pressure plate to drive the pressure plate to rise and fall. The pressure plate is used to push the limiting portion.

9. The testing device according to claim 1, characterized in that It also includes a loading mechanism, which is used to transport a first carrier tape, on which chips to be tested are placed. The picking mechanism is arranged next to the picking mechanism, and the driving module can drive the picking module to approach or move away from the first carrier tape.

10. The testing device according to claim 1, wherein: It also includes a material unloading mechanism, which is used to transport a second carrier tape, on which the detected chips are placed. The material picking mechanism is arranged next to the material picking mechanism, and the driving module can drive the material picking module to approach or move away from the second carrier tape.

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