MLCC failure analysis method, system and device for poor capacitance loss, medium and product

Abstract

The invention discloses a failure analysis method, system and device for an MLCC with poor capacitance loss, a medium and a product, and relates to the field of MLCC analysis, and the method comprises the steps: obtaining the initial capacitance and initial loss value of the MLCC with poor capacitance loss; terminal electrodes at the two ends of the MLCC with poor capacitance loss are removed through a terminal electrode removing device, and the MLCC with the terminal electrodes removed is obtained; soaking the two ends of the MLCC after the end electrodes are removed by adopting a metal tank filled with liquid metal to obtain a soaked MLCC; measuring the capacitance and the loss value of the soaked MLCC to obtain the capacitance and the loss value of the soaked MLCC; according to the capacitance of the soaked MLCC, the loss value of the soaked MLCC, the initial capacitance and the initial loss value, the failure reason of the MLCC with poor capacitance loss is determined, the connectivity of the end electrode and the inner electrode of the MLCC product with poor capacitance loss can be accurately judged from the whole product, and therefore the failure analysis accuracy of the MLCC with poor capacitance loss is improved.

Description

Technical Field

[0001] The present application relates to the field of MLCC analysis, and in particular to a method, system, equipment, medium and product for analyzing MLCC failures due to poor capacitance loss. Background Art

[0002] The product structure of multilayer ceramic capacitors (MLCC) is as follows: Figure 1 As shown, both the external terminal electrodes and the internal inner electrodes are primarily composed of metallic conductive materials. During the product's use or testing phase, the terminal electrodes are connected to the circuit, allowing charge to be smoothly transferred from the terminal electrodes to the inner electrodes to form capacitance. However, a common failure mode of MLCCs is a poor or complete disconnection between the terminal electrodes and the inner electrodes. This prevents charge from being properly transferred to the inner electrodes, leading to a decrease in the product's capacitance or an increase in losses, ultimately resulting in poor electrical performance.

[0003] Currently, the main analytical methods used to identify potential defects within MLCCs include destructive physical analysis (DPA) and ultrasonic scanning. The main steps in DPA include sample preparation, grinding and polishing, and microscopic examination. The specific operation is as follows: First, the MLCC product is placed in a mold and filled with resin to secure it. Next, grinding is performed starting from one side of the MLCC product, gradually exposing the internal electrode structure. Finally, careful observation under a microscope is performed to detect internal defects. Ultrasonic scanning is a non-destructive detection method. Its principle is that when ultrasonic waves pass through the MLCC product and encounter different interfaces, they produce reflections. By analyzing the characteristics of the reflected and transmitted waves, the location of abnormalities or defects within the product can be determined.

[0004] However, for poor capacitance loss caused by poor connection between the terminal and internal electrodes, existing destructive physical analysis methods can only examine the condition of a single cross-section of the product and cannot assess the overall condition of the product. Ultrasonic scanning primarily detects voids and delamination within the product, but cannot observe the distribution of the internal electrodes within the continuous ceramic body. These methods make analyzing the connectivity between the internal and terminal electrodes of MLCCs extremely difficult. Consequently, there is currently no direct and effective failure analysis method to accurately assess the connectivity between the terminal and internal electrodes of MLCCs that cause poor capacitance loss. Summary of the Invention

[0005] The purpose of this application is to provide a failure analysis method, system, equipment, medium and product for MLCC with poor capacitance loss, which can accurately judge the connectivity between the terminal electrodes and internal electrodes of MLCC with poor capacitance loss from the overall perspective, thereby improving the accuracy of failure analysis of MLCC with poor capacitance loss.

[0006] To achieve the above objectives, this application provides the following solutions:

[0007] In a first aspect, the present application provides a method for analyzing MLCC failures due to poor capacitance loss, comprising:

[0008] Obtaining the initial capacitance and initial loss value of the MLCC with poor capacitance loss; the MLCC with poor capacitance loss is an MLCC with a capacitance lower than the center value of the capacitance of all MLCCs in the same batch or an MLCC with a loss value higher than the center value of the loss values ​​of all MLCCs in the same batch;

[0009] The terminal electrode removal device is used to remove the terminal electrodes at both ends of the MLCC with poor capacitance loss to obtain the MLCC after the terminal electrodes are removed;

[0010] Using a metal tank filled with liquid metal to soak both ends of the MLCC after removing the terminal electrodes to obtain a soaked MLCC;

[0011] Measure the capacitance and loss value of the MLCC after immersion to obtain the capacitance and loss value of the MLCC after immersion;

[0012] Determine the cause of failure of MLCC with poor capacitance loss based on the capacitance of MLCC after immersion, the loss value of MLCC after immersion, the initial capacitance and the initial loss value.

[0013] In a second aspect, the present application provides a failure analysis system for MLCCs with poor capacitance loss, comprising:

[0014] An acquisition module is used to obtain the initial capacitance and initial loss value of the MLCC with poor capacitance loss; the MLCC with poor capacitance loss is an MLCC with a capacitance lower than the center value of the capacitance of all MLCCs in the same batch or an MLCC with a loss value higher than the center value of the loss values ​​of all MLCCs in the same batch;

[0015] The terminal electrode removal module is used to remove the terminal electrodes at both ends of the MLCC with poor capacitance loss using the terminal electrode removal device to obtain the MLCC after the terminal electrodes are removed;

[0016] The metal tank module is used to soak both ends of the MLCC after the terminal electrodes are removed using a metal tank filled with liquid metal to obtain the soaked MLCC;

[0017] A measuring module is used to measure the capacitance and loss value of the MLCC after immersion, and obtain the capacitance and loss value of the MLCC after immersion;

[0018] The failure analysis module is used to determine the failure cause of the MLCC with poor capacitance loss based on the capacitance of the MLCC after immersion, the loss value of the MLCC after immersion, the initial capacitance and the initial loss value.

[0019] In a third aspect, the present application provides a computer device comprising: a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the steps of the MLCC failure analysis method for poor capacitance loss described in the first aspect above.

[0020] In a fourth aspect, the present application provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the steps of the MLCC failure analysis method for poor capacitance loss described in the first aspect above.

[0021] In a fifth aspect, the present application provides a computer program product, comprising a computer program, which, when executed by a processor, implements the steps of the MLCC failure analysis method for poor capacitance loss described in the first aspect above.

[0022] According to the specific embodiments provided in this application, this application has the following technical effects:

[0023] (1) Compared with the traditional destructive physical analysis method, the present application does not need to cut the MLCC to obtain a cross section for analysis. It only needs to remove the terminal electrodes at both ends of the MLCC and measure the capacitance and loss values ​​after removing the terminal electrodes. The capacitance and loss values ​​are compared with the initial capacitance and initial loss values. The connectivity between the terminal electrodes and the internal electrodes of the MLCC with poor capacitance loss can be accurately judged from the overall perspective, thereby improving the accuracy of failure analysis of MLCC with poor capacitance loss.

[0024] (2) Compared with the ultrasonic scanning method, the present application does not require scanning. By removing the end electrodes at both ends of the MLCC, the internal electrodes in the porcelain body can be observed. Then, the method of re-leading out the internal electrodes of the MLCC with poor capacitance loss through the metal groove can ensure that the reprocessed internal electrodes are reliably led out, thereby improving the accuracy of measuring the capacitance and loss values ​​of the internal electrodes. Finally, by comparing and analyzing the measured capacitance and loss values, the connectivity of the end electrodes and the internal electrodes of the MLCC with poor capacitance loss can be accurately judged as a whole. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] In order to more clearly illustrate the technical solutions in the embodiments of the present application or related technologies, the following briefly introduces the drawings required for use in the embodiments. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0026] Figure 1 This is a schematic diagram of the product structure of MLCC;

[0027] Figure 2 A flowchart of a method for analyzing MLCC failure due to poor capacitance loss is shown below.

[0028] Figure 3 A detailed flow chart of a failure analysis method for MLCCs with poor capacitance loss is shown;

[0029] Figure 4 It is a schematic diagram of the overall structure of the end electrode removal device;

[0030] Figure 5 is a schematic diagram of a cross section of an end electrode removal device;

[0031] Figure 6 This is a schematic diagram of placing the product to be tested in a metal tank;

[0032] Figure 7 is a schematic diagram of the grinding range;

[0033] Figure 8 A schematic diagram of the structure of a computer device provided in one embodiment of the present application.

[0034] Figure markings: 1-capacitor porcelain body; 2-inner electrode; 3-solder layer; 4-metal barrier layer; 5-metallized bottom layer; 6-dielectric layer; 7-groove; 8-cylindrical block; 9-MLCC with poor capacitance loss; 10-first locking screw; 11-second locking screw. DETAILED DESCRIPTION

[0035] The following will be combined with the drawings in the embodiments of this application to clearly and completely describe the technical solutions in the embodiments of this application. Obviously, the embodiments described are only part of the embodiments of this application, not all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of this application.

[0036] Because the terminal electrodes of MLCC products are primarily made of metal and have excellent conductivity, they are unlikely to cause product connection abnormalities. Therefore, the analysis method used in this application involves grinding away the terminal electrodes and reconnecting the internal electrodes to observe whether the product's electrical parameters can be restored. If this can be done, it indicates that the original connection between the internal electrode and the terminal electrode was poor.

[0037] The method adopted in this application can accurately judge the connectivity between the terminal electrodes and internal electrodes of MLCCs with poor capacitance loss as a whole, thereby improving the accuracy of failure analysis of MLCCs with poor capacitance loss.

[0038] In order to make the above-mentioned purposes, features and advantages of the present application more obvious and easy to understand, the present application is further described in detail below with reference to the accompanying drawings and specific implementation methods.

[0039] In an exemplary embodiment, Figure 2 and Figure 3 As shown, a method for analyzing MLCC failures due to poor capacitance loss is provided. The method is executed by a computer device, specifically a terminal or a server, or a terminal and a server. In the embodiment of the present application, the method is described by taking the application of the method to a server as an example, and includes the following steps 1 to 8. Among them:

[0040] Step 1: Obtain the initial capacitance and initial loss values ​​of MLCCs with poor capacitance loss; MLCCs with poor capacitance loss are MLCCs with capacitance lower than the center value of the capacitance of all MLCCs in the same batch or MLCCs with loss values ​​higher than the center value of the loss values ​​of all MLCCs in the same batch.

[0041] Specifically, among the abnormal batches to be analyzed, products with abnormally low capacitance (farad) or abnormally high loss value (loss tangent value) are selected as MLCCs with poor capacitance loss. Among them, abnormally low capacitance (farad) refers to capacitance lower than the center value of capacitance of all MLCCs in the same batch, and abnormally high loss value (loss tangent value) refers to loss value higher than the center value of loss value of all MLCCs in the same batch.

[0042] Step 2: Use the terminal electrode removal device to remove the terminal electrodes at both ends of the MLCC with poor capacitance loss to obtain the MLCC after the terminal electrodes are removed. Step 2 specifically includes:

[0043] Step 21: Determine the thickness of the terminal electrodes at both ends of the MLCC with poor capacitance loss based on the specifications of the MLCC with poor capacitance loss.

[0044] Step 22: Based on the thickness, the terminal electrodes at both ends of the MLCC with poor capacitance loss are removed using a terminal electrode removal device to obtain the MLCC after the terminal electrodes are removed.

[0045] Specifically, such as Figure 4-Figure 5 As shown, the terminal electrode removal device includes: a cylindrical block 8, a groove 7, a first locking screw 10, and a second locking screw 11. The groove is located at the top of the cylindrical block and is used to place an MLCC with poor capacitance loss. The first locking screw penetrates the cylindrical block and the side of the groove to secure the MLCC with poor capacitance loss. The second locking screw penetrates the cylindrical block and the bottom of the groove to secure the MLCC with poor capacitance loss, allowing the terminal electrodes at both ends of the MLCC with poor capacitance loss to protrude from the groove. The second locking screw is a graduated locking screw, and the graduations on the second locking screw are used to quantify the thickness of the terminal electrodes at both ends of the MLCC with poor capacitance loss.

[0046] Among them, groove 7 is a rectangular groove. The size of the rectangular groove is slightly larger than that of the MLCC9 with poor capacitance loss, so that the product will not rotate or fall therein. The product terminal electrode can be exposed to a specific size by adjusting the second locking screw 11 with a scale. The thickness to which the terminal electrode should be ground is determined according to the product design specifications. In combination with the overall size of the MLCC9 with poor capacitance loss and the size of the rectangular groove 7, the scale to which the second locking screw 11 with a scale should be tightened to allow the terminal electrode to leak out is then tightened to secure the product. Use sandpaper to grind off the terminal electrode at one end of the product to expose the internal electrode of the product. Then, flip the product and repeat the above steps to grind off the terminal electrode at the other end and expose the internal electrode.

[0047] In addition, the method of removing the product end electrode is not limited to using the cylindrical block 8 to assist with sandpaper polishing. Directly using tweezers or manual polishing can also achieve the same purpose. Using tools such as grinding wheels, hand files, lathes, milling machines and other equipment can also effectively remove the product end electrode.

[0048] Step 3: Use a metal tank filled with liquid metal to soak both ends of the MLCC after the end electrodes are removed to obtain the soaked MLCC.

[0049] Specifically, such as Figure 6As shown, a small metal slot for leading out wires is designed, with a square hole on the side that is similar in size to the MLCC to be tested (i.e., the MLCC after the terminal electrodes are removed). A liquid metal gallium-indium alloy is selected. It is liquid at room temperature and has a large surface tension that prevents it from overflowing from the side holes. It also has good conductivity and wettability with the product electrodes, which can quickly and effectively lead out the product electrodes. The MLCC after the terminal electrodes are removed is inserted into the hole on the side of the metal slot. The gallium-indium alloy, which is liquid at room temperature, is injected into the metal slot until the surface of the liquid metal covers the MLCC. At this point, the liquid metal adheres to the end parts of the product at both ends, making good contact with each internal electrode.

[0050] Furthermore, the method for re-extracting the internal electrode is not limited to using a metal tank containing a gallium-indium alloy. Re-extracting the internal electrode can also be achieved by placing other metals that are liquid at room temperature, or metals that become liquid upon heating, in the tank, or by soaking in a conductive solution. This can also be achieved by directly applying liquid metal to the tip surface, solidifying molten metal on the surface, using sputtering, atomic deposition, and re-coating the tip.

[0051] Step 4: Measure the capacitance and loss value of the MLCC after immersion to obtain the capacitance and loss value of the MLCC after immersion.

[0052] Step 5: Determine the failure cause of the MLCC with poor capacitance loss based on the capacitance of the MLCC after immersion, the loss value of the MLCC after immersion, the initial capacitance, and the initial loss value. Step 5 specifically includes:

[0053] Step 51: When the capacitance of the MLCC after soaking is consistent with the initial capacitance, or the loss value of the MLCC after soaking is consistent with the initial loss value, grind the two ends of the soaked MLCC multiple times according to a preset grinding distance and a preset number of grindings until the opposite inner electrodes of the soaked MLCC are ground out, and measure the capacitance and loss value of the MLCC after each grinding. If the capacitance of the MLCC after each grinding is consistent with the initial capacitance, or the loss value of the MLCC after each grinding is consistent with the initial loss value, it is determined that the failure cause of the MLCC with poor capacitance loss is other reasons. Other reasons include: internal electrode offset, discontinuity, abnormal product sintering state, etc.

[0054] Step 52: When the capacitance of the MLCC after immersion is inconsistent with the initial capacitance, or the loss value of the MLCC after immersion is inconsistent with the initial loss value, the two ends of the MLCC after immersion are ground multiple times according to a preset grinding distance and a preset number of grindings until the opposite inner electrodes of the MLCC after immersion are ground out, and the capacitance and loss value of the MLCC after each grinding are measured.

[0055] Specifically, re-measure the product capacity loss on the wiring leading out of the metal slot. If the product capacity loss level changes and is closer to the product standard value, but fails to recover to the qualified level, continue to grind the product end, such as Figure 7 As shown, based on the product design margin (i.e., grinding range), the grinding range is roughly divided into 2 to 5 equal parts, starting from just exposing the inner electrode until the opposite inner electrode is ground out, causing a short circuit. The grinding range is the preset grinding distance, and the preset number of grindings is 2 to 5. Grind to the corresponding size multiple times based on the preset grinding distance and preset number of grindings to fully expose the inner electrode before retesting.

[0056] Step 53: Determine whether the terminal electrode and the internal electrode of the MLCC are poorly connected based on the capacitance of the MLCC after each grinding, the loss value of the MLCC after each grinding, the initial capacitance and the initial loss value, specifically including: performing the following three judgments in sequence.

[0057] The first judgment is that for the MLCC after each grinding, if the capacitance of the MLCC is within the first preset range at least once after grinding, and the loss value of the MLCC after at least one grinding is less than the standard loss value, then it is determined that the failure cause of the MLCC with poor capacitance loss is poor connection between the terminal electrode and the internal electrode of the MLCC; the first preset range is the range from the center value of the capacitance of all MLCCs in the same batch minus three times the standard deviation to the center value of the capacitance of all MLCCs in the same batch plus three times the standard deviation.

[0058] The second judgment is that for the MLCC after each grinding, if the capacitance of the MLCC after each grinding is within the second preset range, and the loss value of the MLCC after each grinding is within the third preset range, then it is determined that the failure cause of the MLCC with poor capacitance loss is other reasons; the second preset range is the initial capacitance minus the capacitance meter error to the initial capacitance plus the capacitance meter error range; the third preset range is the initial loss value minus the loss meter error to the initial loss value plus the loss meter error range.

[0059] The third judgment is that for the MLCC after each grinding, if the capacitance of the MLCC after at least one grinding is within the fourth preset range, or the loss value of the MLCC after at least one grinding is within the fifth preset range, then it is determined that the failure cause of the MLCC with poor capacitance loss includes poor connection between the terminal electrode and the internal electrode of the MLCC and other reasons; the fourth preset range is greater than the initial capacitance plus the capacitance meter error; the fifth preset range is less than the initial loss value minus the loss meter error.

[0060] For the results of the first and third judgments, if it has been confirmed that the cause of failure is wholly or partially due to poor connection between the terminal electrodes and internal electrodes of the MLCC, for the MLCC after each grinding, if the capacitance of the MLCC after the current grinding is greater than the capacitance of the MLCC after the last grinding, or the loss value of the MLCC after the current grinding is smaller than the loss value of the MLCC after the last grinding, then it is determined that the cause of failure of the MLCC with poor capacitance loss is poor connection between the terminal electrodes and internal electrodes of the MLCC, and the specific reasons include insufficient exposure of the internal electrode.

[0061] The beneficial effects of the MLCC failure analysis method for poor capacitance loss proposed in this application are mainly manifested in:

[0062] This application only needs to remove the terminal electrodes at both ends of the MLCC to perform an overall failure analysis on the MLCC with poor capacitance loss. This can avoid the problem of using traditional destructive physical analysis methods to obtain a cross-section for analysis, and the inability to observe the internal electrode using an ultrasonic scanning method. The internal electrode of the MLCC with poor capacitance loss is re-leaded out through a metal groove, which can ensure that the reprocessed internal electrode is reliably led out, thereby improving the accuracy of measuring the capacitance and loss value of the internal electrode. By comparing and analyzing the capacitance of the MLCC after immersion, the loss value of the MLCC after immersion, the initial capacitance and the initial loss value, the connectivity of the terminal electrodes and the internal electrodes of the MLCC product with poor capacitance loss can be accurately judged from the overall product, thereby improving the accuracy of failure analysis of poor capacitance loss of MLCC.

[0063] Based on the same inventive concept, the present application also provides an embodiment of a failure analysis system for MLCCs with poor capacitance loss. The implementation solution provided by this system is similar to the implementation solution described in the above method. Therefore, the specific limitations of one or more embodiments of the failure analysis system for MLCCs with poor capacitance loss provided below can be found in the above-mentioned limitations of the failure analysis method for MLCCs with poor capacitance loss, and will not be repeated here.

[0064] In an exemplary embodiment, a MLCC failure analysis system for poor capacitance loss is provided, comprising:

[0065] The acquisition module is used to obtain the initial capacitance and initial loss value of the MLCC with poor capacitance loss; the MLCC with poor capacitance loss is an MLCC whose capacitance is lower than the central value of the capacitance of all MLCCs in the same batch or an MLCC whose loss value is higher than the central value of the loss value of all MLCCs in the same batch.

[0066] The terminal electrode removal module is used to remove the terminal electrodes at both ends of the MLCC with poor capacitance loss using the terminal electrode removal device to obtain the MLCC after the terminal electrodes are removed.

[0067] The metal tank module is used to soak the two ends of the MLCC after the terminal electrodes are removed using a metal tank filled with liquid metal to obtain the soaked MLCC.

[0068] The measuring module is used to measure the capacitance and loss value of the MLCC after soaking, and obtain the capacitance and loss value of the MLCC after soaking.

[0069] The failure analysis module is used to determine the failure cause of the MLCC with poor capacitance loss based on the capacitance of the MLCC after immersion, the loss value of the MLCC after immersion, the initial capacitance and the initial loss value.

[0070] In an exemplary embodiment, a computer device is provided. The computer device may be a server or a terminal. The internal structure diagram thereof may be as follows: Figure 8 As shown. The computer device includes a processor, a memory, an input / output interface (Input / Output, abbreviated as I / O) and a communication interface. The processor, memory and input / output interface are connected through a system bus, and the communication interface is connected to the system bus through the input / output interface. The processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program and a database. The internal memory provides an environment for the operation of the operating system and computer program in the non-volatile storage medium. The database of the computer device is used to store the capacitance of the MLCC after each grinding, the loss value of the MLCC after each grinding, the initial capacitance and the initial loss value. The input / output interface of the computer device is used to exchange information between the processor and an external device. The communication interface of the computer device is used to communicate with an external terminal through a network connection. When the computer program is executed by the processor, a failure analysis method for MLCC with poor capacitance loss is implemented.

[0071] Those skilled in the art will understand that Figure 8 The structure shown in the figure is merely a block diagram of a portion of the structure related to the solution of the present application and does not constitute a limitation on the computer device to which the solution of the present application is applied. A specific computer device may include more or fewer components than shown in the figure, or combine certain components, or have a different component arrangement. In an exemplary embodiment, a computer device is provided, including a memory and a processor. The memory stores a computer program, and the processor implements the steps of the above-mentioned method embodiments when executing the computer program.

[0072] In an exemplary embodiment, a computer-readable storage medium is provided, storing a computer program. When the computer program is executed by a processor, the steps in the above-mentioned method embodiments are implemented.

[0073] In an exemplary embodiment, a computer program product is provided, including a computer program. When the computer program is executed by a processor, the steps in the above method embodiments are implemented.

[0074] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, stored data, displayed data, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties, and the collection, use and processing of relevant data must comply with relevant regulations.

[0075] Those skilled in the art will understand that all or part of the processes in the above-mentioned embodiment methods can be implemented by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to memory, database or other media used in the embodiments provided in this application may include at least one of non-volatile and volatile memory. Non-volatile memory may include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory may include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM may be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM).

[0076] The databases involved in the various embodiments provided herein may include at least one of a relational database and a non-relational database. Non-relational databases may include, but are not limited to, distributed databases based on blockchains. The processors involved in the various embodiments provided herein may include, but are not limited to, general-purpose processors, central processing units, graphics processing units, digital signal processors, programmable logic units, data processing logic units based on quantum computing, and the like.

[0077] The technical features of the above embodiments can be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0078] This document uses specific examples to illustrate the principles and implementation methods of this application. The description of the above examples is only intended to help understand the method and core concept of this application. At the same time, for those skilled in the art, based on the concept of this application, there may be changes in the specific implementation methods and application scope. In summary, the content of this specification should not be understood as limiting this application.

Claims

1. A method for analyzing MLCC failure due to poor capacitance loss, characterized in that: The MLCC failure analysis method for poor capacitance loss includes: Obtaining the initial capacitance and initial loss value of the MLCC with poor capacitance loss; the MLCC with poor capacitance loss is an MLCC with a capacitance lower than the center value of the capacitance of all MLCCs in the same batch or an MLCC with a loss value higher than the center value of the loss values ​​of all MLCCs in the same batch; The terminal electrode removal device is used to remove the terminal electrodes at both ends of the MLCC with poor capacitance loss to obtain the MLCC after the terminal electrodes are removed; Using a metal tank filled with liquid metal to soak both ends of the MLCC after removing the terminal electrodes to obtain a soaked MLCC; Measure the capacitance and loss value of the MLCC after immersion to obtain the capacitance and loss value of the MLCC after immersion; The failure cause of MLCC with poor capacitance loss is determined based on the capacitance of the MLCC after immersion, the loss value of the MLCC after immersion, the initial capacitance, and the initial loss value.

2. The MLCC failure analysis method for poor capacitance loss according to claim 1, characterized in that: The terminal electrode removal device is used to remove the terminal electrodes at both ends of the MLCC with poor capacitance loss to obtain the MLCC after the terminal electrodes are removed, specifically including: Determine the thickness of the terminal electrodes at both ends of the MLCC with poor capacitance loss based on the specifications of the MLCC with poor capacitance loss; Based on the thickness, a terminal electrode removal device is used to remove the terminal electrodes at both ends of the MLCC with poor capacitance loss to obtain an MLCC with the terminal electrodes removed.

3. The MLCC failure analysis method for poor capacitance loss according to claim 2, characterized in that: The end electrode removal device comprises: a cylindrical block, a groove, a first locking screw and a second locking screw; The groove is provided on the top of the cylindrical block, and the groove is used to place an MLCC with poor capacitance loss; The first locking screw passes through the cylindrical block and the side of the groove to fix the MLCC with poor capacitance loss; The second locking screw passes through the cylindrical block and the bottom surface of the groove to fix the MLCC with poor capacitance loss, so that the terminal electrodes at both ends of the MLCC with poor capacitance loss leak out of the groove.

4. The MLCC failure analysis method for poor capacitance loss according to claim 3, characterized in that: The second locking screw is a locking screw with a scale, and the scale on the second locking screw is used to quantify the thickness of the terminal electrodes at both ends of the MLCC with poor capacitance loss.

5. The MLCC failure analysis method for capacitance loss failure according to claim 1, wherein: Based on the capacitance of the MLCC after immersion, the loss value of the MLCC after immersion, the initial capacitance and the initial loss value, the failure cause of the MLCC with poor capacitance loss is determined, including: When the capacitance of the MLCC after immersion is consistent with the initial capacitance, or the loss value of the MLCC after immersion is consistent with the initial loss value, the two ends of the MLCC after immersion are ground multiple times according to a preset grinding distance and a preset number of grindings until the opposite inner electrodes of the MLCC after immersion are ground out, and the capacitance and loss value of the MLCC after each grinding are measured; if the capacitance of the MLCC after each grinding is consistent with the initial capacitance, or the loss value of the MLCC after each grinding is consistent with the initial loss value, it is determined that the failure cause of the MLCC with poor capacitance loss is other reasons; When the capacitance of the MLCC after soaking is inconsistent with the initial capacitance, or the loss value of the MLCC after soaking is inconsistent with the initial loss value, the two ends of the MLCC after soaking are ground multiple times according to a preset grinding distance and a preset number of grindings until the inner electrodes on the opposite sides of the MLCC after soaking are ground out, and the capacitance and loss value of the MLCC after each grinding are measured; According to the capacitance of the MLCC after each grinding, the loss value of the MLCC after each grinding, the initial capacitance and the initial loss value, it is determined whether the terminal electrode and the internal electrode of the MLCC are poorly connected.

6. The MLCC failure analysis method for poor capacitance loss according to claim 5, characterized in that: Based on the capacitance of the MLCC after each grinding, the loss value of the MLCC after each grinding, the initial capacitance and the initial loss value, determine whether the terminal electrode and the internal electrode of the MLCC are poorly connected, specifically including: For the MLCC after each grinding, if the capacitance of the MLCC after grinding is within a first preset range at least once, and the loss value of the MLCC after grinding is less than the standard loss value at least once, then it is determined that the failure cause of the MLCC with poor capacitance loss is poor connection between the terminal electrode and the internal electrode of the MLCC; the first preset range is the range from the capacitance center value of all MLCCs in the same batch minus three times the standard deviation to the capacitance center value of all MLCCs in the same batch plus three times the standard deviation; For the MLCC after each grinding, if the capacitance of the MLCC after each grinding is within the second preset range, and the loss value of the MLCC after each grinding is within the third preset range, then it is determined that the failure cause of the MLCC with poor capacitance loss is other reasons; the second preset range is the initial capacitance minus the capacitance meter error to the initial capacitance plus the capacitance meter error range; the third preset range is the initial loss value minus the loss meter error to the initial loss value plus the loss meter error range; For the MLCC after each grinding, if the capacitance of the MLCC after at least one grinding is within a fourth preset range, or the loss value of the MLCC after at least one grinding is within a fifth preset range, it is determined that the failure cause of the MLCC with poor capacitance loss includes poor connection between the terminal electrode and the internal electrode of the MLCC and other reasons; the fourth preset range is greater than the initial capacitance plus the capacitance meter error; the fifth preset range is less than the initial loss value minus the loss meter error; For the MLCC after each grinding, if the capacitance of the MLCC after the current grinding is greater than the capacitance of the MLCC after the last grinding, or the loss value of the MLCC after the current grinding is smaller than the loss value of the MLCC after the last grinding, it is determined that the failure cause of the MLCC with poor capacitance loss is poor connection between the terminal electrode and the internal electrode of the MLCC.

7. A failure analysis system for MLCC with poor capacitance loss, characterized in that: The MLCC failure analysis system for poor capacitance loss includes: An acquisition module is used to obtain the initial capacitance and initial loss value of the MLCC with poor capacitance loss; the MLCC with poor capacitance loss is an MLCC with a capacitance lower than the center value of the capacitance of all MLCCs in the same batch or an MLCC with a loss value higher than the center value of the loss values ​​of all MLCCs in the same batch; The terminal electrode removal module is used to remove the terminal electrodes at both ends of the MLCC with poor capacitance loss using the terminal electrode removal device to obtain the MLCC after the terminal electrodes are removed; The metal tank module is used to soak both ends of the MLCC after the terminal electrodes are removed using a metal tank filled with liquid metal to obtain the soaked MLCC; A measuring module is used to measure the capacitance and loss value of the MLCC after immersion, and obtain the capacitance and loss value of the MLCC after immersion; The failure analysis module is used to determine the failure cause of the MLCC with poor capacitance loss based on the capacitance of the MLCC after immersion, the loss value of the MLCC after immersion, the initial capacitance and the initial loss value.

8. A computer device comprising: A memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the MLCC failure analysis method for poor capacitance loss according to any one of claims 1 to 6.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the computer program implements the MLCC failure analysis method for poor capacitance loss according to any one of claims 1 to 6.

10. A computer program product comprising a computer program, characterized in that When the computer program is executed by a processor, the computer program implements the MLCC failure analysis method for poor capacitance loss according to any one of claims 1 to 6.

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