Visual inspection equipment and surface defect detection method

Abstract

The invention discloses visual inspection equipment and a surface defect detection method, and the visual inspection equipment comprises an image collection device which comprises a first collection assembly and a second collection assembly which are arranged at an interval in the height direction; a detection space is defined in the mounting bracket, and the first acquisition assembly is movably mounted on the mounting bracket so as to move in the detection space; the supporting device is arranged at the bottom in the detection space and comprises a first supporting assembly and a second supporting assembly, the first supporting assembly is used for supporting a first to-be-detected piece with a first thickness in the first direction, and the second supporting assembly is used for supporting a second to-be-detected piece with a second thickness in the first direction; the second acquisition assembly is mounted on the second supporting assembly to acquire a bottom image of a second to-be-tested piece; the first thickness is less than the second thickness. According to the visual detection equipment and the surface defect detection method, different parts are comprehensively collected in different modes, so that the detection accuracy and the detection efficiency are improved.

Description

Technical Field

[0001] The present application belongs to the technical field of detection equipment, and in particular relates to a visual inspection device and a surface defect detection method. Background Art

[0002] When inspecting large parts, it is usually necessary to detect surface defects to avoid problems with the parts fitting with other parts or insufficient structural strength at the defects after they are put into use.

[0003] Currently, the method for detecting surface defects in parts typically involves first capturing images using manual visual inspection or industrial cameras, then determining the defects on the part surface, and ultimately detecting the surface defects. However, current inspection equipment suffers from incomplete image acquisition and cannot fully meet the different acquisition requirements of different parts, resulting in low inspection accuracy and efficiency. Summary of the Invention

[0004] The present application provides a visual inspection device and a surface defect detection method, which can use different methods to comprehensively collect data on different parts, thereby improving the accuracy and efficiency of detection.

[0005] The present application provides a visual inspection device, which includes an image acquisition device, including a first acquisition component and a second acquisition component arranged at intervals along the height direction; a mounting bracket, the interior of which defines a detection space, and the first acquisition component is movably mounted on the mounting bracket to move within the detection space; a supporting device, which is arranged at the bottom of the detection space, and the supporting device includes a first supporting component and a second supporting component, the first supporting component is used to support a first piece to be tested having a first thickness in a first direction, the second supporting component is used to support a second piece to be tested having a second thickness in the first direction, and the second acquisition component is mounted on the second supporting component to capture a bottom image of the second piece to be tested; wherein the first thickness is less than the second thickness.

[0006] As shown in the above visual inspection equipment, the second support assembly includes a support member and a mounting member, the mounting member is arranged below the support member along the height direction, and is used to install the second acquisition assembly, the support member includes two second support structures arranged at intervals along the first direction, and the two second support structures are used to support the second test piece on both sides.

[0007] As described above, the visual inspection equipment, wherein the first support assembly is at the top of the support device, the first support assembly includes a support platform and two first support structures, the top surface of the support platform is a planar structure, the first support structure is arranged to protrude from the top surface of the support platform, and the two first support structures are connected to opposite sides of the support platform at intervals along a first direction, for supporting the first test piece placed on the top surface of the support platform.

[0008] As above, the visual inspection equipment, wherein the first support structure includes a first support part and a second support part connected to each other, the first support part is connected to the side of the support platform, and at least part of the first support part protrudes from the support platform in the height direction, and the second support part protrudes from the support platform in the second direction.

[0009] As described above, the visual inspection equipment, wherein the first acquisition component includes a driving member and a acquisition member and an auxiliary light source installed on the driving member, the driving member is used to drive the acquisition member and the auxiliary light source to move in any direction, the number of the acquisition members and the auxiliary light source are both multiple, and the multiple acquisition members and the multiple auxiliary light sources correspond one to one and are arranged in relative positions.

[0010] The visual inspection equipment as above, wherein the collecting part includes a first collecting part and a second collecting part, the collecting range of the first collecting part is larger than the collecting range of the second collecting part, the auxiliary light source includes a first auxiliary light source and a second auxiliary light source, the first auxiliary light source is arranged opposite to the first collecting part, the second auxiliary light source is arranged opposite to the second collecting part, and the brightness of the first auxiliary light source is greater than the brightness of the second auxiliary light source.

[0011] As described above, the visual inspection equipment further comprises a transfer device, comprising a transfer member and a transfer guide rail, the transfer guide rail extends along a first direction, the transfer member is movably mounted on the transfer guide rail along the first direction, support devices are provided on both sides of the transfer guide rail along the second direction, and the spacing distance between the two relatively arranged support devices in the second direction is greater than the length of the transfer member in the second direction.

[0012] As shown in the above visual inspection equipment, the mounting bracket includes two support frames arranged at intervals along a first direction, a detection space is formed between the two support frames, and each support frame is correspondingly installed with a first acquisition component to capture images of the surfaces on both sides of the first or second test piece in the first direction.

[0013] As shown in the above visual inspection equipment, the support frame includes two support columns and a sliding guide rail. The two support columns are respectively arranged on both sides of the transfer guide rail in the second direction. The support columns extend along the height direction. The two ends of the sliding guide rail are respectively connected to the top of the two support columns. The first collection component is slidably installed on the sliding guide rail along the second direction.

[0014] On the other hand, the present application also provides a surface defect detection method, wherein the above-mentioned visual inspection equipment is used for detection, and the surface defect detection method includes:

[0015] Load the test piece to the transfer device and determine the model of the test piece;

[0016] If the piece to be tested is determined to be the first piece to be tested, the transfer device transfers the first piece to be tested to the first supporting assembly of the supporting device;

[0017] Using a first acquisition component to acquire an image of a side surface of a first object to be tested;

[0018] If the piece to be tested is determined to be the second piece to be tested, the transfer device transfers the second piece to be tested to the second support assembly of the support device;

[0019] Using the first acquisition component to acquire images of the top surface and side surfaces of the second piece to be tested, and using the second acquisition component to acquire images of the bottom surface of the second piece to be tested;

[0020] The surface defects of the test piece are judged based on the image acquisition results.

[0021] In the visual inspection equipment and surface defect inspection method of the present application, the visual inspection equipment includes an image acquisition device, a mounting bracket, and a support device. The interior of the mounting bracket defines an inspection space. The image acquisition device includes a first acquisition component and a second acquisition component spaced apart in a height direction. The first acquisition component is movably mounted on the mounting bracket for movement within the inspection space. The support device is disposed at the bottom of the inspection space. The first support component of the support device is used to support a first test piece having a first thickness in a first direction. When the first test piece with a smaller thickness is supported on the top of the first support component, the first acquisition component installed at a higher height can capture images of a larger side surface of the first test piece, thereby achieving inspection of the first test piece with higher efficiency. The second support component of the support device is used to support a second test piece having a second thickness in the first direction. When the second test piece with a larger thickness is supported on the top of the second support component, the second acquisition component installed on the second support component can capture images of the bottom surface of the second test piece. At the same time, the first acquisition component installed at a higher height can capture images of the side and top surfaces of the second test piece, thereby achieving comprehensive inspection of the second test piece. Therefore, the visual inspection equipment and surface defect detection method of the present application can use different methods to comprehensively collect data from different parts, thereby improving the accuracy and efficiency of detection. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the following is a brief introduction to the drawings required for use in the embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0023] Figure 1 This is an overall structural diagram of the visual inspection device according to an embodiment of the present application;

[0024] Figure 2A schematic diagram of a support device for a visual inspection device according to an embodiment of the present application;

[0025] Figure 3 A schematic diagram of a first acquisition component of a visual inspection device according to an embodiment of the present application;

[0026] Figure 4 A schematic diagram of the visual inspection device according to an embodiment of the present application at another angle;

[0027] Figure 5 This is a flow chart of a surface defect detection method according to an embodiment of the present application.

[0028] Description of Figure Numbers:

[0029] 1. Image acquisition device; 11. First acquisition component; 111. Driving member; 112. Acquisition component; 1121. First acquisition component; 1122. Second acquisition component; 113. Auxiliary light source; 1131. First auxiliary light source; 1132. Second auxiliary light source; 12. Second acquisition component;

[0030] 2. Mounting bracket; 21. Detection space; 22. Support frame; 221. Support column; 222. Sliding guide rail;

[0031] 3. Support device; 31. First support assembly; 311. Support platform; 312. First support structure; 3121. First support portion; 3122. Second support portion; 32. Second support assembly; 321. Support member; 3211. Second support structure; 322. Mounting member; 33. Base column;

[0032] 4. Transfer device; 41. Transfer member; 42. Transfer guide rail;

[0033] 51. First piece to be tested; 52. Second piece to be tested;

[0034] 6. Master control device;

[0035] X, first direction; Y, second direction. DETAILED DESCRIPTION

[0036] The features and exemplary embodiments of various aspects of the present application will be described in detail below. In order to make the purpose, technical solutions and advantages of the present application clearer, the present application will be further described in detail below in conjunction with the accompanying drawings and specific embodiments. It should be understood that the specific embodiments described herein are only intended to explain the present application, rather than to limit the present application. For those skilled in the art, the present application can be implemented without the need for some of these specific details. The following description of the embodiments is merely to provide a better understanding of the present application by illustrating the examples of the present application.

[0037] like Figures 1 to 4As shown, an embodiment of the present application provides a visual inspection device, which includes an image acquisition device 1, including a first acquisition component 11 and a second acquisition component 12 arranged at intervals along the height direction; a mounting bracket 2, the mounting bracket 2 defines a detection space 21 inside, and the first acquisition component 11 is movably mounted on the mounting bracket 2 to move within the detection space 21; a support device 3, arranged at the bottom of the detection space 21, the support device 3 includes a first support component 31 and a second support component 32, the first support component 31 is used to support a first test piece 51 having a first thickness in a first direction X, the second support component 32 is used to support a second test piece 52 having a second thickness in the first direction X, and the second acquisition component 12 is installed on the second support component 32 to capture a bottom image of the second test piece 52; wherein the first thickness is less than the second thickness.

[0038] It should be noted that the first part to be tested 51 in the embodiment of the present application is the side frame of the bogie of a rail vehicle, and its overall thickness is relatively thin. During testing, only the side surface with a larger area needs to be tested; the second part to be tested 52 is the bolster of the bogie of a rail vehicle, and its overall thickness is relatively thick. During testing, all surfaces need to be tested to ensure that the bolster fully meets the requirements.

[0039] In specific implementation, the visual inspection equipment of the embodiment of the present application includes an image acquisition device 1, a mounting bracket 2 and a support device 3. The interior of the mounting bracket 2 defines a detection space 21. The image acquisition device 1 includes a first acquisition component 11 and a second acquisition component 12 arranged at intervals along the height direction. The first acquisition component 11 is movably installed on the mounting bracket 2 to move in the detection space 21. The support device 3 is arranged at the bottom of the detection space 21. The support device 3 includes a first support component 31 and a second support component 32. The second acquisition component 12 is installed on the second support component 32, and its setting height is lower than the first acquisition component 11, so that image acquisition can be performed at the bottom of the detection space 21. The first acquisition component 11 can perform image acquisition at a higher position in the detection space 21. Therefore, the coordinated setting of the first acquisition component 11 and the second acquisition component 12 enables image acquisition to be achieved at any position in the detection space 21, thereby ensuring the comprehensiveness and accuracy of the detection of the image acquisition device 1.

[0040] The first support assembly 31 of the support device 3 is used to support a first test piece 51 having a first thickness in a first direction X. When the first test piece 51 having a smaller thickness is supported on top of the first support assembly 31, the first acquisition assembly 11, which is installed at a higher height, can capture images of the larger side surface of the first test piece 51, thereby efficiently inspecting the first test piece 51. The second support assembly 32 of the support device 3 is used to support a second test piece 52 having a second thickness in the first direction X. When the second test piece 52 having a larger thickness is supported on top of the second support assembly 32, the second acquisition assembly 12 installed on the second support assembly 32 can capture images of the bottom surface of the second test piece 52. At the same time, the first acquisition assembly 11, which is installed at a higher height, can capture images of the side and top surfaces of the second test piece 52, thereby achieving comprehensive inspection of the second test piece 52. Therefore, the visual inspection equipment and surface defect inspection method of the present application can use different methods to comprehensively capture images of different parts, thereby improving inspection accuracy and efficiency.

[0041] like Figure 2 As shown, the visual inspection equipment of an embodiment of the present application, wherein the second support assembly 32 includes a support member 321 and a mounting member 322, the mounting member 322 is arranged below the support member 321 along the height direction, and is used to install the second collection assembly 12, the support member 321 includes two second support structures 3211 arranged at intervals along the first direction X, and the two second support structures 3211 are used to support the second test piece 52 on both sides.

[0042] In specific implementation, when the second support assembly 32 supports the second piece to be tested 52, the second piece to be tested 52 is supported on the top of the two second support structures 3211, and the height of the second acquisition assembly 12 installed on the mounting member 322 is lower than the second piece to be tested 52, so that the image of the bottom surface of the second piece to be tested 52 can be acquired, thereby ensuring the comprehensiveness of the detection of the second piece to be tested 52.

[0043] Specifically, the second acquisition component 12 is installed on the part of the mounting member 322 between the two second supporting structures 3211. When the second piece to be measured 52 is supported by the two second supporting structures 3211, the second acquisition component 12 can directly acquire images of the bottom of the second piece to be measured 52, thereby reducing the interference of the second supporting structures 3211 on the acquisition process of the second acquisition component 12, and enabling the second acquisition component 12 to acquire comprehensive and clear images.

[0044] Specifically, the top of the second support structure 3211 is a conical structure, and the inclined surfaces of the two second support structures 3211 are arranged opposite to each other. When the second test piece 52 is installed on the second support structure 3211 from top to bottom, the two side surfaces of the second test piece 52 slide along the conical surfaces on both sides respectively, and finally are clamped between the two second support structures 3211. At this time, the conical surface can not only support the second test piece 52 in the height direction, but also provide auxiliary support for the two side surfaces of the second test piece 52 in the first direction X, thereby preventing the second test piece 52 from tipping over, thereby further improving the support stability of the second support assembly 32.

[0045] like Figure 2 As shown, a visual inspection device of an embodiment of the present application, wherein a first support assembly 31 is arranged on the top of the support device 3, the first support assembly 31 includes a support platform 311 and two first support structures 312, the top surface of the support platform 311 is a planar structure, the first support structure 312 is arranged to protrude from the top surface of the support platform 311, and the two first support structures 312 are connected to opposite sides of the support platform 311 at intervals along the first direction X, for supporting the first test piece 51 placed on the top surface of the support platform 311.

[0046] In specific implementation, the top surface of the support platform 311 is a planar structure, which facilitates the horizontal placement of the first DUT 51 on the support platform 311 and prevents the first DUT 51 from tilting in any direction, thereby ensuring the support stability of the first DUT 51; the two first support structures 312 spaced apart and connected to opposite sides of the support platform 311 along the first direction X can respectively support the two side surfaces of the first DUT 51 perpendicular to the first direction X, thereby preventing the thin first DUT 51 from tipping over, thereby further improving the support stability of the first support assembly 31 for the first DUT 51.

[0047] Specifically, the first support assembly 31 and the support member 321 are both arranged on the top of multiple base columns 33, and the base columns 33 are extended in the height direction, so that the first support assembly 31 and the support member 321 have sufficient height to support the first test piece 51 and the second test piece 52, and the mounting member 322 is connected to the middle and lower part of the base column 33.

[0048] Specifically, there are multiple base columns 33, which are divided into two groups spaced apart along a first direction X. Each group of base columns 33 includes two base columns 33 spaced apart along a second direction Y. The first support assembly 31 is mounted on top of one group of base columns 33, one second support structure 3211 of the second support assembly 32 is connected to the top surface of the support platform 311, and the other second support structure 3211 of the second support assembly 32 is mounted on top of the other group of base columns 33. This structural arrangement eliminates the need for additional groups of base columns 33, thereby reducing the manufacturing cost of the support device 3.

[0049] like Figure 2 As shown, the visual inspection equipment of an embodiment of the present application, wherein the first support structure 312 includes a first support portion 3121 and a second support portion 3122 connected to each other, the first support portion 3121 is connected to the side of the support platform 311, and at least a portion of the first support portion 3121 protrudes from the support platform 311 in the height direction, and the second support portion 3122 protrudes from the support platform 311 in the second direction Y.

[0050] During specific implementation, at least a portion of the first supporting portion 3121 of the first supporting structure 312 protrudes from the supporting platform 311 in the height direction, and can support the two side surfaces of the first test piece 51 placed on the top surface of the supporting platform 311, preventing the first test piece 51 from tipping toward the sides, thereby ensuring the support stability; the second supporting portion 3122 protrudes from the supporting platform 311 in the second direction Y. The provision of the second supporting portion 3122 increases the overall length of the first supporting structure 312 in the second direction Y, thereby increasing the contact length between the first supporting structure 312 and the first test piece 51 in the second direction Y, thereby further improving the support stability for the first test piece 51.

[0051] like Figure 3 As shown, the visual inspection equipment of an embodiment of the present application, wherein the first collection component 11 includes a driving member 111 and a collection member 112 and an auxiliary light source 113 installed on the driving member 111, the driving member 111 is used to drive the collection member 112 and the auxiliary light source 113 to move in any direction, the number of the collection members 112 and the auxiliary light source 113 are both multiple, and the multiple collection members 112 and the multiple auxiliary light sources 113 correspond to each other one by one and are arranged in relative positions.

[0052] During specific implementation, the driving member 111 can drive the acquisition member 112 and the auxiliary light source 113 to move in any direction, so that the acquisition member 112 can acquire images of any position of the test piece except the bottom, and the setting of multiple acquisition members 112 further improves the comprehensiveness of the acquisition of the test piece, and can synchronously acquire the test piece at different angles; the auxiliary light source 113 is opposite to the acquisition member 112 and can illuminate the acquisition position to improve the clarity of image acquisition, thereby improving the accuracy of detection.

[0053] Specifically, the driving member 111 is a multi-axis manipulator, and the collecting member 112 and the auxiliary light source 113 are installed at the end of the multi-axis manipulator. The multi-axis manipulator can control the collecting member 112 and the auxiliary light source 113 to move and rotate in multiple directions, so that the collecting member 112 and the auxiliary light source 113 can reach any position in the detection space 21, ensuring the comprehensiveness and flexibility of the first collecting component 11 in collecting images.

[0054] like Figure 3 As shown, the visual inspection equipment of the embodiment of the present application, wherein the collecting part 112 includes a first collecting part 1121 and a second collecting part 1122, the collecting range of the first collecting part 1121 is larger than the collecting range of the second collecting part 1122, the auxiliary light source 113 includes a first auxiliary light source 1131 and a second auxiliary light source 1132, the first auxiliary light source 1131 is arranged opposite to the first collecting part 1121, the second auxiliary light source 1132 is arranged opposite to the second collecting part 1122, and the brightness of the first auxiliary light source 1131 is greater than the brightness of the second auxiliary light source 1132.

[0055] In specific implementation, when the acquisition component 112 acquires images of the test piece, the acquisition range of the first acquisition component 1121 is larger, and it can acquire the overall structure of the test piece. The acquisition range of the second acquisition component 1122 is smaller, and it can acquire the detailed structure of the test piece, and its acquisition accuracy is higher. Therefore, using the first acquisition component 1121 and the second acquisition component 1122 for acquisition at the same time can take into account both the acquisition range and the acquisition accuracy, thereby improving the overall detection effect.

[0056] The first auxiliary light source 1131, located opposite the first acquisition component 1121, has a higher brightness, thus providing sufficient brightness over a larger area of ​​the object to be tested, allowing the first acquisition component 1121 to capture a clear and wide-area image. The second auxiliary light source 1132, located opposite the second acquisition component 1122, has a lower brightness, allowing it to precisely illuminate the area captured by the second acquisition component 1122, thus avoiding situations where excessive brightness makes it impossible to identify structures in the image. Therefore, the use of the first and second auxiliary light sources 1131, 1132 in conjunction with the first and second acquisition components 1121, 1122 can further enhance the image acquisition performance of the acquisition component 112, thereby further improving the overall detection effect.

[0057] like Figure 1 As shown, the visual inspection equipment of an embodiment of the present application, wherein the visual inspection equipment also includes a transfer device 4, including a transfer member 41 and a transfer guide rail 42, the transfer guide rail 42 extends along the first direction X, the transfer member 41 is movably installed on the transfer guide rail 42 along the first direction X, and support devices 3 are provided on both sides of the transfer guide rail 42 along the second direction Y, and the spacing distance between the two relatively arranged support devices 3 in the second direction Y is greater than the length of the transfer member 41 in the second direction Y.

[0058] During specific implementation, the transfer guide rail 42 extends along the first direction X, and support devices 3 are provided on both sides of the transfer guide rail 42 along the second direction Y. When the transfer member 41 moves along the first direction X, it can move between two support devices 3 with a longer distance between them in the second direction Y, so that the transferred workpiece is placed on the two support devices 3. The support devices 3 on both sides can respectively support the two ends of the workpiece to be tested, thereby completing the overall transfer process.

[0059] When the support device 3 supports both ends of the workpiece to be tested, the workpiece to be tested can be arranged across the transfer guide rail 42 along the second direction Y. This can not only ensure the support stability of the workpiece to be tested, but also avoid blocking the bottom surface of the workpiece to be tested. When the workpiece to be tested is the second workpiece to be tested 52, the second acquisition component 12 can perform comprehensive image acquisition of the bottom of the second workpiece to be tested 52.

[0060] like Figure 1 As shown, the visual inspection equipment of the embodiment of the present application, wherein the mounting bracket 2 includes two support frames 22 spaced apart along the first direction X, a detection space 21 is formed between the two support frames 22, and each support frame 22 is correspondingly installed with a first acquisition component 11 to capture images of the surfaces of the first test piece 51 or the second test piece 52 on both sides in the first direction X, so that the first acquisition component 11 no longer needs to move significantly in the second direction Y, thereby further improving the image acquisition efficiency.

[0061] like Figure 1 As shown, the visual inspection equipment of an embodiment of the present application, wherein the support frame 22 includes two support columns 221 and a sliding guide rail 222, the two support columns 221 are respectively arranged on both sides of the transfer guide rail 42 in the second direction Y, the support columns 221 extend along the height direction, the two ends of the sliding guide rail 222 are respectively connected to the top of the two support columns 221, and the first collection component 11 is slidably installed on the sliding guide rail 222 along the second direction Y.

[0062] During specific implementation, the support column 221 of the support frame 22 extends in the height direction, and the two ends of the sliding guide rail 222 are respectively connected to the top of the two support columns 221, so that the first acquisition component 11 installed on the sliding guide rail 222 has a sufficient height to be able to capture images of the top and side surfaces of the test piece.

[0063] In addition, the sliding guide rail 222 extends along the second direction Y, and the first acquisition component 11 is slidably installed on the sliding guide rail 222 along the second direction Y, thereby ensuring that the first acquisition component 11 has a sufficient range of motion and can perform more comprehensive image acquisition on the side of the test piece, thereby further improving the detection effect of the test piece.

[0064] like Figure 1 As shown, in the embodiment of the present application, the visual inspection equipment further includes a master control device 6, which is communicatively connected to the image acquisition device 1. After the image acquisition device 1 acquires images of the first and second test pieces 51, 52, it can transmit all acquired images to the master control device 6. The master control device 6 includes a control system, which includes a data acquisition module, a data storage module, a data processing module, and a data display module. The data acquisition module can collect images transmitted by the image acquisition device 1 and further transmit them to the data storage module; the data storage module can store historical images and data files as well as the transmitted image information; the data processing module can analyze the currently inspected image based on the historical images or data and standard images or data stored in the data storage module to determine whether the first and second test pieces 51, 52 have defects, as well as the size and location of the defects; and the data display module can report the processing results of the data processing module to the user, realizing human-computer interaction. The user can then perform corresponding repairs or further processing on the first and second test pieces 51, 52 based on the processing results.

[0065] Among them, the data processing module can identify defects in the test image through the image detection algorithm. The image detection algorithm can judge and analyze the borders and types of each part in the image to quickly detect the specific shapes of each part of the test piece; the data processing module can also judge defects through algorithmic reasoning, that is, combining the image data information collected in the data storage module and the target image information input by the user to perform specific analysis and processing on the test piece to be tested, thereby achieving accurate defect detection and judgment.

[0066] The master control device 6 is also in communication with the mounting bracket 2, the supporting device 3, and the transfer device 4 to control the movement of the first acquisition component 11 on the mounting bracket 2, the movement or rotation of the second acquisition component 12 on the supporting device 3, and the movement of the transfer member 41 of the transfer device 4 on the transfer guide rail 42, thereby realizing the operation of the first to-be-tested piece 51 or the second to-be-tested piece 52 waiting for the test piece to move into the detection space 21, and the first acquisition component 11 and the second acquisition component 12 moving to appropriate acquisition positions to perform image acquisition on the test piece.

[0067] like Figure 5 As shown, the embodiment of the present application further provides a surface defect detection method, wherein the above-mentioned visual inspection equipment is used for detection, and the surface defect detection method includes:

[0068] S100 , loading the workpiece to be tested onto the transfer device 4 , and determining the model of the workpiece to be tested.

[0069] S211 : If it is determined that the DUT is the first DUT 51 , the transfer device 4 transfers the first DUT 51 to the first support assembly 31 of the support device 3 .

[0070] S212 , using the first acquisition component 11 to acquire an image of the side surface of the first test piece 51 .

[0071] S221 : If it is determined that the piece to be tested is the second piece to be tested 52 , the transfer device 4 transfers the second piece to be tested 52 to the second support assembly 32 of the support device 3 .

[0072] S222 , using the first acquisition component 11 to acquire images of the top surface and side surfaces of the second test piece 52 , and using the second acquisition component 12 to acquire images of the bottom surface of the second test piece 52 .

[0073] Among them, the transfer member 41 of the transfer device 4 can move along the transfer guide rail 42, so as to transfer the workpiece to be tested to the support device 3 along the first direction X, and make the workpiece to be tested between the two support devices 3; optionally, the transfer device 4 can place the workpiece to be tested on the top surface of the support device 3 for support by extending and retracting in the height direction.

[0074] S300: Surface defect determination of the workpiece to be tested is performed based on the image acquisition result.

[0075] When determining surface defects, the control system within the master control device 6 can collect, store, process, and display data so that the user can repair or further process the first test piece 51 or the second test piece 52 accordingly based on the processing results.

[0076] In specific implementation, using the surface defect detection method of the embodiment of the present application, the first acquisition component 11 installed at a higher height can capture images of the larger side surface of the first test piece 51, thereby achieving high-efficiency detection of the first test piece 51; the second acquisition component 12 installed on the second support component 32 can capture images of the bottom surface of the second test piece 52. At the same time, the first acquisition component 11 installed at a higher height can capture images of the side and top surfaces of the second test piece 52, thereby achieving comprehensive detection of the second test piece 52. Therefore, the surface defect detection method of the present application can use different methods to comprehensively capture images of different parts, thereby improving detection accuracy and detection efficiency.

[0077] It should be noted that, in this document, relational terms such as first and second, etc., are used only to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. Moreover, the terms "comprises," "comprising," or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article, or device comprising a series of elements includes not only those elements, but also other elements not explicitly listed, or elements inherent to such process, method, article, or device. In the absence of further limitations, the elements defined by the phrase "comprising..." do not exclude the presence of other identical elements in the process, method, article, or device comprising the elements.

[0078] The above description is only a specific embodiment of the present application. Those skilled in the art will clearly understand that for the convenience and brevity of description, the specific working processes of the systems, modules and units described above can refer to the corresponding processes in the aforementioned method embodiments, and will not be repeated here. It should be understood that the scope of protection of the present application is not limited thereto. Any person skilled in the art can easily think of various equivalent modifications or replacements within the technical scope disclosed in the present application, and these modifications or replacements should be included in the scope of protection of the present application.

Claims

1. A visual inspection device, characterized in that: include: An image acquisition device (1) comprises a first acquisition component (11) and a second acquisition component (12) spaced apart in a height direction; A mounting bracket (2), wherein a detection space (21) is defined inside the mounting bracket (2), and the first acquisition component (11) is movably mounted on the mounting bracket (2) to move within the detection space (21); A support device (3) is provided at the bottom of the detection space (21), the support device (3) comprising a first support component (31) and a second support component (32), the first support component (31) being used to support a first piece to be tested (51) having a first thickness in a first direction (X), the second support component (32) being used to support a second piece to be tested (52) having a second thickness in the first direction (X), and the second acquisition component (12) being installed on the second support component (32) to acquire a bottom image of the second piece to be tested (52); Wherein, the first thickness is smaller than the second thickness.

2. The visual inspection device according to claim 1, characterized in that The second support assembly (32) comprises a support member (321) and a mounting member (322); the mounting member (322) is arranged below the support member (321) along the height direction and is used to install the second acquisition assembly (12); the support member (321) comprises two second support structures (3211) spaced apart along the first direction (X); the two second support structures (3211) are used to support the second test piece (52) on both sides.

3. The visual inspection device according to claim 1, characterized in that The first support assembly (31) is located at the top of the support device (3), and the first support assembly (31) comprises a support platform (311) and two first support structures (312). The top surface of the support platform (311) is a planar structure, and the first support structure (312) is arranged to protrude from the top surface of the support platform (311). The two first support structures (312) are spaced apart and connected to opposite sides of the support platform (311) along the first direction (X), and are used to support the first test piece (51) placed on the top surface of the support platform (311).

4. The visual inspection device according to claim 3, characterized in that The first supporting structure (312) includes a first supporting portion (3121) and a second supporting portion (3122) connected to each other, wherein the first supporting portion (3121) is connected to the side of the supporting platform (311), and at least a portion of the first supporting portion (3121) protrudes from the supporting platform (311) in the height direction, and the second supporting portion (3122) protrudes from the supporting platform (311) in the second direction (Y).

5. The visual inspection device according to claim 1, characterized in that The first collecting component (11) comprises a driving member (111) and a collecting member (112) and an auxiliary light source (113) mounted on the driving member (111); the driving member (111) is used to drive the collecting member (112) and the auxiliary light source (113) to move in any direction; the collecting member (112) and the auxiliary light source (113) are both multiple in number, and the multiple collecting members (112) and the multiple auxiliary light sources (113) are in one-to-one correspondence and are arranged in relative positions.

6. The visual inspection device according to claim 5, characterized in that: The collecting component (112) comprises a first collecting component (1121) and a second collecting component (1122); the collecting range of the first collecting component (1121) is greater than the collecting range of the second collecting component (1122); the auxiliary light source (113) comprises a first auxiliary light source (1131) and a second auxiliary light source (1132); the first auxiliary light source (1131) is arranged opposite to the first collecting component (1121); the second auxiliary light source (1132) is arranged opposite to the second collecting component (1122); and the brightness of the first auxiliary light source (1131) is greater than the brightness of the second auxiliary light source (1132).

7. The visual inspection device according to claim 1, characterized in that The visual inspection equipment also includes: The transfer device (4) comprises a transfer member (41) and a transfer guide rail (42), wherein the transfer guide rail (42) extends along the first direction (X), the transfer member (41) is movably mounted on the transfer guide rail (42) along the first direction (X), the support devices (3) are provided on both sides of the transfer guide rail (42) along the second direction (Y), and the spacing distance between the two relatively arranged support devices (3) in the second direction (Y) is greater than the length of the transfer member (41) in the second direction (Y).

8. The visual inspection device according to claim 7, characterized in that: The mounting bracket (2) comprises two support frames (22) spaced apart along the first direction (X), the detection space (21) being formed between the two support frames (22), and each support frame (22) being correspondingly mounted with the first acquisition component (11) for acquiring images of the surfaces of the first test piece (51) or the second test piece (52) on both sides in the first direction (X).

9. The visual inspection device according to claim 8, characterized in that: The support frame (22) includes two support columns (221) and a sliding guide rail (222). The two support columns (221) are respectively arranged on both sides of the transfer guide rail (42) in the second direction (Y). The support columns (221) extend along the height direction. The two ends of the sliding guide rail (222) are respectively connected to the top of the two support columns (221). The first collection component (11) is slidably installed on the sliding guide rail (222) along the second direction (Y).

10. A surface defect detection method, characterized in that: The surface defect detection method is performed using the visual inspection equipment according to any one of claims 1 to 9, wherein the surface defect detection method comprises: Loading the test piece onto the transfer device (4) and determining the model of the test piece; If it is determined that the piece to be tested is the first piece to be tested (51), the transfer device (4) transfers the first piece to be tested (51) to the first support assembly (31) of the support device (3); Using the first acquisition component (11) to acquire an image of the side surface of the first test piece (51); If it is determined that the piece to be tested is the second piece to be tested (52), the transfer device (4) transfers the second piece to be tested (52) to the second support assembly (32) of the support device (3); The first acquisition component (11) is used to acquire images of the top surface and side surfaces of the second test piece (52), and the second acquisition component (12) is used to acquire images of the bottom surface of the second test piece (52); Surface defects of the test piece are judged based on the image acquisition results.

Images