Display panel and display device

By setting a test lead on the first main surface of the display panel and electrically connecting it to the test connection pad to form a test connection loop, the problem of wiring damage caused by the flip test is solved. Through the technical features of the borderless display panel, contact resistance measurement is achieved without the need for flip testing, reducing process damage.

CN120673686APending Publication Date: 2025-09-19TIANMA ADVANCED DISPLAY TECH INST (XIAMEN) CO LTD +1
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Patent Information

Application Number
CN202510812310.1
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-06-17
Publication Date
2025-09-19

AI Technical Summary

Technical Problem

When testing the contact resistance between the side traces and the signal lead pads of a borderless display panel, the prior art requires turning the display panel over for testing, which can easily damage the traces on the front.

Method used

A test lead is arranged on the first main surface of the display panel to be electrically connected to an adjacent test connection pad, and a test connection loop is formed through side wiring to avoid flip testing.

Benefits of technology

Contact resistance can be measured without flipping the display panel, which reduces damage to the wiring and lowers the risk of process damage.

✦ Generated by Eureka AI based on patent content.

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Abstract

The embodiment of the invention discloses a display panel and a display device. A plurality of connection pads, a plurality of light-emitting elements and at least two test connection pads are arranged on a first main surface of the display panel, and the connection pads are coupled with the light-emitting elements. The display panel further comprises a plurality of side wires, the side wires are electrically connected with the connection bonding pads, and every two adjacent test connection bonding pads at least form a test connection loop through the side wires. At least part of the test lead is located on the first main surface, and the test lead is electrically connected with the two adjacent test connection bonding pads. Wherein one end of each test lead is electrically connected with the corresponding test connection bonding pad, the other end of each test lead is electrically connected with the test equipment, the resistance of the test connection loop is measured through the test equipment, and the test leads are arranged on the first main surface, so that the test can be carried out without overturning the display panel; and the damage to the wiring of the first main surface when the first main surface faces downwards for testing after overturning is avoided.
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Description

Technical Field

[0001] The present invention relates to the field of display technology, and in particular to a display panel and a display device. Background Art

[0002] Due to their borderless nature, existing borderless display panels lack the stepped structure found on traditional display panels. Instead, they feature corresponding side signal lead pads on the bottom edge for transmitting and receiving all the drive signals required for display. These side signal lead pads are paired with side traces, which route the signals to the back of the display panel for backside binding.

[0003] Currently, when testing the contact resistance between the side traces and the side signal lead-out pads, a needle test is usually performed on the back of the display panel. However, the display panel must be flipped over during the test, that is, the front side of the display panel faces down and the back side faces up, which can easily cause damage to the front traces during the test. Summary of the Invention

[0004] The present invention provides a display panel display device. At least a portion of a test lead is arranged on a first main surface, and one end of the test lead is electrically connected to a test connection pad, and the other end is electrically connected to a test device. Therefore, when the contact resistance of a test connection loop is measured by the test device and the test lead, the test can be performed without flipping the display panel, thereby avoiding damage to the wiring on the first main surface when the test is performed with the first main surface facing downward after flipping.

[0005] In a first aspect, an embodiment of the present invention provides a display panel, including:

[0006] a base substrate including adjacently disposed first major surfaces;

[0007] a plurality of connection pads, a plurality of light emitting elements, and at least two test connection pads disposed on the first main surface, wherein the connection pads are coupled to the light emitting elements;

[0008] a plurality of side traces, wherein the side traces are electrically connected to the connection pads; two adjacent test connection pads form a test connection loop at least through the side traces;

[0009] At least two test leads, at least parts of the test leads are located on the first main surface, and the test leads are electrically connected to two adjacent test connection pads respectively.

[0010] In a second aspect, an embodiment of the present invention further provides a display device, comprising the display panel provided by any embodiment of the first aspect of the present invention.

[0011] The first main surface of the display panel provided by an embodiment of the present invention includes a plurality of connection pads, a plurality of light-emitting elements, and at least two test connection pads. The connection pads are electrically connected to the side traces and the light-emitting elements, respectively, and then provide display signals to the light-emitting elements through the side traces and the connection pads. In addition, two adjacent test connection pads form a test connection loop at least through the side traces, and are electrically connected to the test connection loop through a test lead at least partially located on the first main surface, that is, two test leads are electrically connected to two adjacent test connection pads, respectively. In this way, the loop resistance of the test connection loop is measured by the test lead at least provided on the first main surface, and testing can be performed without flipping the display panel over, thereby avoiding damage to the traces on the first main surface when testing with the first main surface facing downward after flipping, thereby reducing process damage to the display panel. BRIEF DESCRIPTION OF THE DRAWINGS

[0012] Figure 1 is a structural schematic diagram of a display panel provided by an embodiment of the present invention;

[0013] Figure 2 is a schematic diagram of an expanded display panel provided by an embodiment of the present invention;

[0014] Figure 3 is a schematic diagram of an expanded display panel provided by an embodiment of the present invention;

[0015] Figure 4 is a schematic diagram of an expanded display panel provided by an embodiment of the present invention;

[0016] Figure 5 is a schematic diagram of an expanded display panel provided by an embodiment of the present invention;

[0017] Figure 6 is a schematic diagram of an expanded display panel provided by an embodiment of the present invention;

[0018] Figure 7 is a schematic diagram of an expanded display panel provided by an embodiment of the present invention;

[0019] Figure 8 yes Figure 1 A schematic cross-sectional view along the A-A' direction;

[0020] Figure 9 yes Figure 1 Another cross-sectional schematic diagram along the A-A' direction;

[0021] Figure 10 A schematic structural diagram of a display device provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0022] To make the objectives, technical solutions, and advantages of the present invention more clear, the technical solutions of the present invention will be fully described below in conjunction with the accompanying drawings of the embodiments of the present invention through specific implementation methods. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making any creative efforts shall fall within the scope of protection of the present invention.

[0023] Figure 1 Schematic diagram of the structure of a display panel provided by an embodiment of the present invention. Figure 1 The display panel includes a base substrate 10, which includes a first main surface 110. A plurality of connection pads 20, a plurality of light-emitting elements 140, and at least two test connection pads 30 are provided on the first main surface 110. The connection pads 20 are coupled to the light-emitting elements 140. In addition, the display panel also includes a plurality of side traces 40 and at least two test leads 50. The side traces 40 are electrically connected to the connection pads 20, and two adjacent test connection pads 30 form a test connection loop at least through the side traces 40. At least a portion of the test lead 50 is located on the first main surface 110, and the test lead 50 is electrically connected to two adjacent test connection pads 30, respectively.

[0024] Specifically, the display panel may include a first main surface 110, a second main surface ( Figure 1 Not shown) and multiple side surfaces ( Figure 1 (not shown in the figure). The first main surface 110 and the second main surface are arranged opposite to each other, and the first main surface 110 and the second main surface are both arranged adjacent to multiple side surfaces, that is, the multiple side surfaces connect the first main surface 110 and the second main surface. Among them, the first main surface 110 can be the light-emitting side surface of the display panel, that is, the first main surface 110 includes a display area, and the display area includes multiple light-emitting elements 140. The display of the picture is realized by the light emission of the multiple light-emitting elements 140. The first main surface 110 of the display panel is also provided with multiple signal lines 150. The signal lines 150 may include at least one of a scan signal line, a data signal line, a positive power signal line, a negative power signal line, and a reset signal line. The signal lines 150 are electrically connected to the light-emitting elements 140, and then provide the light-emitting elements 140 with various driving signals required for lighting through the signal lines 150 to ensure the normal operation of the light-emitting elements 140. The second main surface of the display panel can be the back side of the display panel, that is, the second main surface of the display panel is the non-light-emitting side surface of the display panel. A flexible circuit board (not shown in the figure) can be provided on the second main surface, and the flexible circuit board can provide various driving signals for the signal lines 150.

[0025] In addition, the first main surface 110 also includes a plurality of connection pads 20. The connection pads 20 are located on a side of the light-emitting element 140 close to the side surface, that is, the connection pads 20 are located in a position close to the side surface of the first main surface 110. The side trace 40 includes a portion located on the first main surface 110, a portion located on the side surface, and a portion located on the second main surface, and each portion is electrically connected. The light-emitting element 140 on the first main surface 110 is electrically connected to one end of the side trace 40 via the connection pads 20, enabling signal transmission between the light-emitting element 140 and the side trace 40. The other end of the side trace 40 is bound to the flexible circuit board on the second main surface, enabling signal transmission between the flexible circuit board and the side trace 40.

[0026] In addition, after the side routing process is completed, there will be process-induced contact resistance at the contact position between the side routing and the connecting pad. In order to measure the contact resistance between the side routing and the connecting pad, multiple test pads will be set in the edge area of ​​the connecting pad setting area, and two adjacent test pads will be short-circuited together, and electrically connected to the pin pads on the back of the display panel through two side routings, thereby forming a test loop, and finally the contact resistance of the pin pads on the back is measured through the test pen. During this measurement process, the display panel must be flipped, that is, the front of the display panel faces down and the back faces up before the measurement can be performed, which in turn risks damaging the routing on the front of the display panel.

[0027] To this end, the embodiment of the present invention sets the measurement position of the test equipment on the front of the display panel, so that the display panel does not need to be flipped over, that is, the first main surface is facing down, and the contact resistance can be measured. Specifically, at least two test connection pads 30 are also provided on the first main surface 110, and different test connection pads 30 are independently set, that is, two adjacent test connection pads 30 are not short-circuited, but are provided with a gap, and the two adjacent test connection pads 30 form a test connection loop through at least the side traces 40. It can be understood that since the two adjacent test connection pads 30 are not short-circuited, if a test loop is to be formed through the test connection pads 30, it is necessary to short-circuit the traces or devices electrically connected to the test connection pads 30. Exemplarily, the test connection pads 30 are connected to the second main surface of the display panel through the side traces 40, and are electrically connected to the test binding pads on the second main surface through the connection traces on the second main surface. In this way, a test connection loop can be formed with the two adjacent test connection pads 30 by short-circuiting the side traces 40, the connecting traces, or at least one of the test binding pads that are electrically connected to the two adjacent test connection pads 30. Since the short-circuit position is not on the test connection pads 30, the two test leads 50 can be electrically connected to the two adjacent test connection pads 30 to measure the contact resistance of the test connection loop. That is, at least a portion of the test leads 50 is set on the first main surface 110. In this way, the loop resistance of the test connection loop is measured by the test leads at least set on the first main surface 110, and testing can be performed without flipping the display panel. This avoids damage to the traces on the first main surface 110 when testing with the first main surface 110 facing downward after flipping, thereby reducing process damage to the display panel.

[0028] It should be noted that one end of the test lead 50 is electrically connected to the test connection pad 30, and the other end extends to the peripheral area of ​​the display panel boundary line and is electrically connected to the test equipment, so that the contact resistance of the test connection loop can be measured by the test equipment. Because the peripheral area of ​​the display panel boundary line is cut and removed when the display panel is formed, at least a portion of the test lead 50 is disposed on the first major surface 110 and electrically connected to the test connection pad 30.

[0029] It is also necessary to explain that Figure 1 The example in which the side trace 40 electrically connected to the two adjacent test connection pads 30 is short-circuited to form a test connection loop is used for illustration, but this is not limited to this. In other embodiments, the two adjacent test connection pads 30 can also form a test connection loop through connecting traces or test binding pads, and those skilled in the art can set it as needed.

[0030] In summary, in the embodiment of the present invention, a test connection loop is formed by forming two adjacent test connection pads through at least side traces, that is, at least one of the side traces, connection traces or test binding pads electrically connected to the test connection pads is short-circuited to form a test connection loop. Since the short-circuit position is not on the test connection pad, at least two test leads can be set on the first main surface and electrically connected to the test connection loop, that is, the test leads are electrically connected to the two adjacent test connection pads respectively. In this way, the loop resistance of the test connection loop is measured by the test leads at least set on the first main surface, and the test can be performed without flipping the display panel over, avoiding damage to the traces on the first main surface when testing with the first main surface facing down after flipping, thereby reducing the process damage to the display panel.

[0031] Optionally, based on the above embodiment, continue to refer to Figure 1 The side trace 40 includes a first portion 410 located on the first main surface 110. Two adjacent test connection pads 30 are overlapped with the same first portion 410. Specifically, the first portion 410 is the overlapping portion of the side trace 40 and the test connection pad 30, and then two adjacent test connection pads 30 are overlapped with the same first portion 410, that is, along the thickness direction of the display panel, the first portion 410 covers the two test connection pads 30 electrically connected thereto. In this way, the two adjacent test connection pads 30 form a test connection loop through the same first portion 410, and the contact resistance of the test connection loop is measured through the test lead 50 located on the first main surface 110. On the basis of reducing the process damage of the display panel, the method of forming the test connection loop is ensured to be simple.

[0032] Optional, Figure 2 Schematic diagram of an expanded display panel provided by an embodiment of the present invention. Figure 2 The substrate 10 further includes a side surface 120 and a second main surface 130. The side surface 120 is disposed adjacent to the first main surface 110, and the second main surface 130 is disposed opposite to the first main surface 110. The side trace 40 further includes a second portion 420 located on the side surface 120 and a third portion 430 located on the second main surface 130. The second portion 420 is electrically connected to the first portion 410 and the third portion 430, respectively. The two adjacent test connection pads 30 overlapped with the same first portion 410 include a first test connection pad 310 and a second test connection pad 320. The first test connection pad 310 and the second test connection pad 320 are electrically connected to the same second portion 420, and the first test connection pad 310 and the second test connection pad 320 are electrically connected to the same third portion 430.

[0033] Specifically, such as Figure 2In the illustrated embodiment, the first main surface 110 is a light-emitting side surface of the display panel, the second main surface 130 is a non-light-emitting side surface of the display panel, and two adjacent test connection pads 30 include a first test connection pad 310 and a second test connection pad 320. The first test connection pad 310 and the second test connection pad 320 are electrically connected to the same side trace 40. In other words, the side trace 40 includes a first side trace electrically connected to the first test connection pad 310 and a second side trace electrically connected to the second test connection pad 320. The first side trace and the second side trace are short-circuited to form a side trace. Exemplarily, the side trace 40 includes a first portion 410 located on the first main surface 110, a second portion 420 located on the side surface 120, and a third portion 430 located on the second main surface 130. In the same side trace 40, the first portion 410, the second portion 420, and the third portion 430 are electrically connected to each other. Then, the first portion 410 of the first side trace is short-circuited with the first portion 410 of the second side trace, the second portion 420 of the first side trace is short-circuited with the second portion 420 of the second side trace, and the third portion 430 of the first side trace is short-circuited with the third portion 430 of the second side trace, thereby forming a side trace 40 with a thicker line width. In this way, while ensuring that at least two test leads 50 are arranged on the first main surface 110 and electrically connected to the test connection loop, the arrangement method of the side trace 40 is simple.

[0034] It should be noted that the expanded schematic diagram of the present invention illustrates the positional relationship of the side traces 40, thereby allowing the first major surface 110, side surface 120, and second major surface 130 of the display panel to be expanded into the same plane. It is understood that in actual products, the first major surface 110, side surface 120, and second major surface 130 are located on different planes of the display panel and cannot be expanded into the same plane. This will not be further described below.

[0035] It should also be noted that, in an embodiment of the present invention, the display panel may include connection pads 20 located on the first main surface 110 and connection pads (not shown) located on the second main surface 130. The connection pads 20 located on the first main surface 110 are arranged corresponding to the connection pads located on the second main surface 130. The side traces 40 are electrically connected to the connection pads 20 located on the first main surface 110 and the connection pads located on the second main surface 130, respectively, to achieve electrical connection between the first main surface 110 and the second main surface 130. In addition, the display panel may also include only the connection pads 20 located on the first main surface 110, and the side traces 40 include a first portion 410 located on the first main surface 110, a second portion 420 located on the side surface 120, and a third portion 430 located on the second main surface 130, wherein the third portion 430 includes a patterned binding connection trace, and the first portion 410, the second portion 420, and the third portion 430 are integrally arranged to achieve electrical connection between the first main surface 110 and the second main surface 130. In other implementations, the side traces 40 may also achieve electrical connection from the first main surface 110 to the second main surface 130 in other ways. The present invention is not limited to this, and those skilled in the art may configure it as needed.

[0036] Optionally, in yet another embodiment, Figure 3 FIG is a schematic diagram of another display panel provided by an embodiment of the present invention. Figure 3 The substrate 10 further includes a side surface 120 and a second main surface 130. The side surface 120 is arranged adjacent to the first main surface 110, and the second main surface 130 is arranged opposite to the first main surface 110. The side trace 40 further includes a second portion 420 located on the side surface 120 and a third portion 430 located on the second main surface 130. The second portion 420 is electrically connected to the first portion 410 and the third portion 430, respectively. The two adjacent test connection pads 30 overlapping the same first portion 410 include a third test connection pad 330 and a fourth test connection pad 340. The third test connection pad 330 and the fourth test connection pad 340 are electrically connected to different second portions 420, respectively, and the third test connection pad 330 and the fourth test connection pad 340 are electrically connected to different third portions 430, respectively.

[0037] Specifically, such as Figure 3In the illustrated embodiment, two adjacent test connection pads 30 include a third test connection pad 330 and a fourth test connection pad 340, with a gap provided between the third test pad 330 and the fourth test pad 340. The side trace 40 electrically connected to the third test pad 330 is a third side trace, and the side trace 40 electrically connected to the fourth test pad 340 is a fourth side trace. Part of the third side trace is short-circuited with part of the fourth side trace. Exemplarily, the first portion 410 of the third side trace is short-circuited with the first portion 410 of the fourth side trace to form a whole, while the second portion 420 of the third side trace is independently arranged with the second portion 420 of the fourth side trace, and the third portion 430 of the third side trace is independently arranged with the third portion 430 of the fourth side trace. In other words, the second portion 420 of the third side trace and the second portion 420 of the fourth side trace are spaced apart, and the third portion 430 of the third side trace and the third portion 430 of the fourth side trace are spaced apart. Only the first portion 410 of the third side trace is electrically connected to the first portion 410 of the fourth side trace. In this way, the third test pad 330 and the fourth test pad 340 form a test connection loop through their respective first portions 410, and the contact resistance of the test connection loop is measured through the test lead 50 located on the first main surface 110. On the basis of reducing damage to the display panel process, the method of forming the test connection loop is ensured to be simple.

[0038] It should be noted that Figure 2 and Figure 3 The example of short-circuiting the first portion 410 of the side trace 40 electrically connected to two adjacent test connection pads 30 to form a test connection loop is used for illustration only, but the present invention is not limited thereto. In other embodiments, Figure 4 is a schematic diagram of an expanded display panel provided by an embodiment of the present invention. Figure 5 FIG. 1 is a schematic diagram of another expanded display panel provided by an embodiment of the present invention. Figure 4 In the embodiment shown, a test connection loop can also be formed by short-circuiting the second portion 420 of the side trace 40 electrically connected to two adjacent test connection pads 30, or as shown in FIG. Figure 5 In the illustrated embodiment, the third portion 430 of the side trace 40 electrically connected to two adjacent test connection pads 30 is short-circuited to form a test connection loop, which can be configured by those skilled in the art as needed.

[0039] In yet another embodiment, Figure 6 FIG is a schematic diagram of another display panel provided by an embodiment of the present invention. Figure 6The substrate 10 further includes a side surface 120 and a second main surface 130. The side surface 120 is disposed adjacent to the first main surface 110, and the second main surface 130 is disposed opposite the first main surface 110. The second main surface 130 includes a plurality of signal bonding pads 610, a plurality of test bonding pads 620, and a plurality of connecting traces 70. The signal bonding pads 610 are electrically connected to the connecting pads 20 via the connecting traces 70 and the side traces 40. Two adjacent test connection pads 30 form a test connection loop via the side traces 40, the connecting traces 70, and the test bonding pads 620.

[0040] Specifically, such as Figure 6 In the embodiment shown, the first main surface 110 is the light-emitting side surface (front) of the display panel, and the second main surface 130 is the non-light-emitting side surface (back) of the display panel. Furthermore, a binding area is further provided on the second main surface 130, and the binding area includes a plurality of binding pads 60, and the binding pads 60 include signal binding pads 610 and test binding pads 620. Among them, the signal binding pads 610 are electrically connected to the connecting pads 20 through the connecting traces 70 and the side traces 40, and then various types of driving signals are transmitted to the connecting pads 20 through the signal binding pads 610. Two adjacent test connecting pads 30 form a test connection loop through the side traces 40, the connecting traces 70, and the test binding pads 620. For example, as Figure 6 In the embodiment shown, two adjacent test connection pads 30 are independently provided, and two side traces 40 electrically connected to the two adjacent test connection pads 30 are independently provided. To ensure that the two adjacent test connection pads 30 form a test connection loop through the side traces 40, the connecting traces 70, and the test binding pads 620, the two connecting traces 70 electrically connected to the two adjacent test connection pads 30 can be short-circuited or the two test binding pads 620 electrically connected to the two adjacent test connection pads 30 can be short-circuited. Since the short-circuit position in the test connection loop is on the second main surface 130, at least two test leads 50 can be provided on the first main surface 110 and electrically connected to the test connection loop, that is, the test leads 50 are electrically connected to the two adjacent test connection pads 30 respectively. In this way, the loop resistance of the test connection loop is measured by the test leads 50 provided at least on the first main surface 110, and testing can be performed without flipping the display panel, thereby avoiding testing with the first main surface 110 facing downward after flipping, thereby damaging the traces on the first main surface 110, and reducing process damage to the display panel.

[0041] On the basis of the above embodiment, continue to refer to Figure 6The two adjacent test connection pads 30 include a fifth test connection pad 350 and a sixth test connection pad 360. The side trace 40 includes a first side trace 401 and a second side trace 402. The connection trace 70 includes a first connection trace 710 and a second connection trace 720. The test binding pad 620 includes a first test binding pad 621. The fifth test connection pad 350 is electrically connected to the first test binding pad 621 through the first side trace 401 and the first connection trace 710, and the sixth test connection pad 360 is electrically connected to the first test binding pad 621 through the second side trace 402 and the second connection trace 720.

[0042] Specifically, such as Figure 6 In the illustrated embodiment, the third test connection pad 350 and the sixth test connection pad 360 are independently provided, i.e., a gap is provided between the third test connection pad 350 and the sixth test connection pad 360. The two side traces 40 electrically connected to two adjacent test connection pads 30 are independently provided, i.e., a gap is provided between the first side trace 401 and the second side trace 402. The two connecting traces 70 electrically connected to two adjacent test connection pads 30 are independently provided, i.e., a gap is provided between the first connecting trace 710 and the second connecting trace 720. On this basis, in order to ensure that two adjacent test connection pads 30 form a test connection loop through the side traces 40, the connecting traces 70, and the test binding pad 620, the two test binding pads 620 electrically connected to the two adjacent test connection pads 30 are short-circuited together, that is, the fifth test connection pad 350 and the sixth test connection pad 360 are connected to the same test binding pad, that is, the first test binding pad 621, through different side traces 40 and different connecting traces 70. In this way, on the basis of reducing the process damage of the display panel, since there is no need to short-circuit the side traces or the connecting traces, the arrangement of the traces can be simplified.

[0043] Optionally, in yet another embodiment, Figure 7 FIG is a schematic diagram of another display panel provided by an embodiment of the present invention. Figure 7 The two adjacent test connection pads 30 include a seventh test connection pad 370 and an eighth test connection pad 380. The side trace 40 includes a third side trace 403 and a fourth side trace 404. The connection trace 70 includes a third connection trace 730, and the test binding pad 620 includes a second test binding pad 622 and a third test binding pad 623. The seventh test connection pad 370 is electrically connected to the second test binding pad 622 through the third side trace 403 and the third connection trace 730, and the eighth test connection pad 380 is electrically connected to the third test binding pad 623 through the fourth side trace 404 and the third connection trace 730.

[0044] Specifically, such as Figure 7 In the illustrated embodiment, the third test connection pad 350 and the sixth test connection pad 360 are independently provided, i.e., a gap is provided between the third test connection pad 350 and the sixth test connection pad 360. The two side traces 40 electrically connected to two adjacent test connection pads 30 are independently provided, i.e., a gap is provided between the first side trace 401 and the second side trace 402. The two test binding pads 620 electrically connected to two adjacent test connection pads 30 are independently provided, i.e., a gap is provided between the second test binding pad 622 and the third test binding pad 623. On this basis, in order to ensure that the two adjacent test connection pads 30 form a test connection loop through the side routing 40, the connecting routing 70, and the test binding pad 620, the two connecting routings 70 electrically connected to the two adjacent test connection pads 30 are short-circuited together, that is, the seventh test connection pad 370 and the eighth test connection pad 380 are connected to different test binding pads 620 through different side routings 40 and the same connecting routing 70, wherein the same connecting routing 70 is the third connecting routing 730, and compared with other connecting routings 70, the line width of the third connecting routing 730 is slightly wider. Since the short-circuit position in the test connection loop is on the second main surface 130 (connecting trace 70), at least two test leads can be set on the first main surface 110 and electrically connected to the test connection loop, that is, the test lead 50 is electrically connected to two adjacent test connection pads 30 respectively. In this way, the loop resistance of the test connection loop is measured by at least the test lead 50 set on the first main surface 110, and the test can be performed without flipping the display panel. This avoids damage to the traces on the first main surface 110 when testing after the display panel is flipped, thereby reducing process damage to the display panel.

[0045] Optionally, based on the above embodiment, Figure 8 yes Figure 1 A schematic cross-sectional view along the A-A' direction. Figure 8The substrate 10 includes a substrate 101 and a first metal layer 102 and a second metal layer 103 located on one side of the substrate 101. The first metal layer 102 is located on the side of the second metal layer 103 closer to the substrate 101, that is, the first metal layer 102 is located between the substrate 101 and the second metal layer 103. The test lead 50 includes a first test lead section 510 close to the boundary a of the display panel and a second test lead section 520 away from the boundary a of the display panel. The first test lead section 510 is electrically connected to the second test lead section 520 by punching, that is, at the boundary a of the display panel, the test lead 50 is led out of the boundary a of the display panel by changing the metal layer, that is, the first test lead section 510 located in the second metal layer 102 is led out of the boundary a of the display panel and electrically connected to the test equipment, and the contact electrode of the test connection loop is measured by the test equipment. In addition, since the first test lead section 510 and the first metal layer 102 are arranged on the same layer, during the production, the first test lead section 510 and the first metal layer 102 can be produced using the same mask plate in the same production process, and there is no need to produce mask plates for the first test lead section 510 and the first metal layer 102 respectively, which saves costs, reduces the number of processes, and improves production efficiency. Similarly, since the second test lead section 520 and the second metal layer 103 are arranged on the same layer, during production, the second test lead section 520 and the second metal layer 103 can be produced using the same mask plate in the same production process. There is no need to produce mask plates for the second test lead section 520 and the second metal layer 103 separately, which saves costs, reduces the number of processes, and improves production efficiency.

[0046] Optional, Figure 9 yes Figure 1 Another cross-sectional view along the A-A' direction. Figure 8 , the display panel also includes an electrostatic protection structure 80. Along the thickness direction of the display panel, the electrostatic protection structure 80 at least partially overlaps with the first test lead division 510. Specifically, in the process of cutting along the boundary a of the display panel to form the display panel, static electricity will pass through the first test lead division 510 to the interior of the display panel, which can easily cause damage to the light-emitting elements and the like in the display panel. For this reason, the embodiment of the present invention provides an electrostatic protection structure 80 in the display panel, and along the thickness direction of the display panel, the electrostatic protection structure 80 at least partially overlaps with the first test lead division 510, thereby preventing the damage to the display panel caused by static electricity through the electrostatic protection structure, thereby improving the reliability of the display panel.

[0047] Optionally, based on the above embodiment, continue to refer to Figure 9The base substrate 10 further includes an active layer 104, which is located on the side of the first metal layer 102 closest to the substrate 101. That is, the active layer 101 is located between the first metal layer 102 and the substrate 101. The electrostatic protection structure 80 is provided on the same layer as the active layer 101. Thus, during fabrication, the electrostatic protection structure 80 and the active layer 101 can be formed using the same mask in the same fabrication process, eliminating the need to prepare separate masks for the electrostatic protection structure 80 and the active layer 101. This saves costs, reduces the number of manufacturing processes, and improves production efficiency.

[0048] Optional, see Figure 2 The substrate 10 further includes a side surface 120 and a second main surface 130. The side surface 120 is disposed adjacent to the first main surface 110, and the second main surface 130 is disposed opposite the first main surface 110. That is, the first main surface 110 is the light-emitting side surface of the display panel, and the second main surface 130 is the non-light-emitting side surface of the display panel. The side surface 120 connects the first main surface 110 and the second main surface 130. The side trace 40 includes a first portion 410 located on the first main surface 110, a second portion 420 located on the side surface 120, and a third portion 430 located on the second main surface 130. The first portion 410, the second portion 420, and the third portion 430 are integrally formed, that is, the first portion 410, the second portion 420, and the third portion 430 are all manufactured simultaneously in the same process, and there is no other overlapping area on any two sides, thereby ensuring the accuracy of the contact resistance measurement.

[0049] Optionally, based on the above embodiment, continue to refer to Figure 2 The test connection pad 30 is located in an area where multiple connection pads 20 are close to the boundary of the display panel, that is, the test connection pad 30 is located in the corner area of ​​the display panel, which facilitates the electrical connection of the test lead 50 with two adjacent test connection pads 30 to form a test connection loop. In addition, different connection pads 20 are electrically connected to different side traces 40, thereby ensuring that the connection pad 20 can transmit signals normally through the side traces 40.

[0050] Based on the same inventive concept, an embodiment of the present invention further provides a display device. Figure 10 Schematic diagram of the structure of a display device provided by an embodiment of the present invention. Figure 10 As shown, the display device includes the display panel 01 in the above embodiment. The display device includes the display panel 01 of any embodiment of the present invention. Therefore, the display device provided by the embodiment of the present invention has the corresponding beneficial effects of the display panel 01 provided by the embodiment of the present invention, which will not be described in detail here. Exemplarily, the display device can be an electronic device such as a mobile phone, a computer, a smart wearable device (for example, a smart watch), and an in-vehicle display device, which is not limited in the embodiment of the present invention.

[0051] Note that the above are only preferred embodiments of the present invention and the technical principles employed. Those skilled in the art will appreciate that the present invention is not limited to the specific embodiments described herein, and that various obvious changes, readjustments, combinations, and substitutions are possible for those skilled in the art without departing from the scope of the present invention. Therefore, although the present invention has been described in detail through the above embodiments, the present invention is not limited to the above embodiments and may include many other equivalent embodiments without departing from the scope of the present invention. The scope of the present invention is determined by the scope of the appended claims.

Claims

1. A display panel, characterized in that: include: a base substrate, the base substrate comprising a first major surface; a plurality of connection pads, a plurality of light emitting elements, and at least two test connection pads disposed on the first main surface, wherein the connection pads are coupled to the light emitting elements; a plurality of side traces, wherein the side traces are electrically connected to the connection pads; two adjacent test connection pads form a test connection loop at least through the side traces; At least two test leads, at least parts of the test leads are located on the first main surface, and the test leads are electrically connected to two adjacent test connection pads respectively.

2. The display panel according to claim 1, wherein: The side trace includes a first portion located on the first major surface; Two adjacent test connection pads are overlapped with the same first portion.

3. The display panel according to claim 2, wherein: The base substrate further includes a side surface and a second main surface, the side surface is adjacent to the first main surface, and the second main surface is opposite to the first main surface; The side trace further includes a second portion located on the side surface and a third portion located on the second main surface; The second part is electrically connected to the first part and the third part respectively; The two adjacent test connection pads overlapped with the same first portion include a first test connection pad and a second test connection pad; The first test connection pad and the second test connection pad are electrically connected to the same second portion, and the first test connection pad and the second test connection pad are electrically connected to the same third portion.

4. The display panel according to claim 2, wherein: The base substrate further includes a side surface and a second main surface, the side surface is adjacent to the first main surface, and the second main surface is opposite to the first main surface; The side trace further includes a second portion located on the side surface and a third portion located on the second main surface; The second part is electrically connected to the first part and the third part respectively; The two adjacent test connection pads overlapped with the same first portion include a third test connection pad and a fourth test connection pad; The third test connection pad and the fourth test connection pad are electrically connected to different second portions, respectively, and the third test connection pad and the fourth test connection pad are electrically connected to different third portions, respectively.

5. The display panel according to claim 1, wherein: The base substrate further includes a side surface and a second main surface, the side surface is adjacent to the first main surface, and the second main surface is opposite to the first main surface; The second main surface includes multiple signal binding pads, multiple test binding pads and multiple connecting traces. The signal binding pads are electrically connected to the connecting pads through the connecting traces and the side traces. Two adjacent test connecting pads form a test connection loop through the side traces, the connecting traces and the test binding pads.

6. The display panel according to claim 5, wherein: The two adjacent test connection pads include a fifth test connection pad and a sixth test connection pad; The side routing includes a first side routing and a second side routing; The connecting wires include a first connecting wire and a second connecting wire; The test bonding pads include a first test bonding pad; The fifth test connection pad is electrically connected to the first test binding pad through the first side trace and the first connection trace; The sixth test connection pad is electrically connected to the first test binding pad through the second side trace and the second connection trace.

7. The display panel according to claim 5, wherein: The two adjacent test connection pads include a seventh test connection pad and an eighth test connection pad; The side routing includes a third side routing and a fourth side routing; The connecting wires include a third connecting wire; The test bonding pads include a second test bonding pad and a third test bonding pad; The seventh test connection pad is electrically connected to the second test binding pad through the third side trace and the third connection trace; The eighth test connection pad is electrically connected to the third test binding pad through the fourth side trace and the third connection trace.

8. The display panel according to claim 1, wherein: The substrate base comprises a substrate and a first metal layer and a second metal layer located on one side of the substrate; The first metal layer is located on a side of the second metal layer close to the substrate; The test lead includes a first test lead section close to the boundary of the display panel and a second test lead section away from the boundary of the display panel; The first test lead section is disposed in the same layer as the first metal layer, and the second test lead section is disposed in the same layer as the second metal layer.

9. The display panel according to claim 8, wherein: The display panel further includes an electrostatic protection structure; Along the thickness direction of the display panel, the electrostatic protection structure and the first test lead portion at least partially overlap.

10. The display panel according to claim 9, wherein: The substrate further includes an active layer, and the active layer is located on a side of the first metal layer close to the substrate; The electrostatic protection structure is arranged on the same layer as the active layer.

11. The display panel according to claim 1, wherein The base substrate further includes a side surface and a second main surface, the side surface is adjacent to the first main surface, and the second main surface is opposite to the first main surface; The side trace includes a first portion located on the first main surface, a second portion located on the side surface, and a third portion located on the second main surface; The first part, the second part and the third part are integrally arranged.

12. The display panel according to claim 1, wherein The test connection pad is located in an area where the plurality of connection pads are close to a boundary of the display panel; Different of the connecting pads are electrically connected to different of the side traces.

13. A display device, characterized in that: The display panel comprises the display panel according to any one of claims 1 to 12.