Detector inlet and sampling method

Abstract

An inlet device for providing sample analyte vapors to a detector, the device comprising: a sample receptacle (110); a heater (120); a steam preconcentrator (130); and a sampling inlet (140); wherein the sample receiving portion is arranged to receive a gas stream carrying an aerosol sample analyte, and the heater is arranged to heat the aerosol sample analyte to provide a sample analyte vapor; and wherein the device is arranged to provide the sample analyte vapor to (i) the vapor pre-concentrator, and (ii) the detector via the sampling inlet.

Description

Technical Field

[0001] The present disclosure relates to the field of sample detection. Background Art

[0002] There are many different detection techniques for identifying the presence of substances of interest in a given sample. Implementation of these techniques can be used to detect the presence of chemical warfare agents ("CWAs") or toxic industrial chemicals ("TICs") or any other chemical of interest (including, for example, explosives and their precursors). A spectrometer can be used to identify one or more properties of a sample analyte (i.e., a component of the sample to be analyzed) and, based on such identified properties of the sample analyte, determine an indication of one or more substances present in the sample. In some cases, the sample to be analyzed must be in vapor form in order for the detector to function as intended. In such cases, the vapor is passed to the detector, and the detector measures one or more properties of the vapor (and, based on these measured properties, detects the presence of the substance of interest). For example, in an ion mobility spectrometer ("IMS") or a mass spectrometer ("MS"), ionized molecules can be identified based on their mobility in a carrier buffer gas or air, or based on other properties. Detection devices that utilize these techniques to detect the presence of dangerous or illegal materials (e.g., CWAs and TICs) are known. Summary of the Invention

[0003] Various aspects of the disclosure are set out in the independent claims, and optional features are set out in the dependent claims. Various aspects of the disclosure may be provided in combination with each other, and features of one aspect may be applied to other aspects.

[0004] In one aspect, an inlet device for providing a sample analyte vapor to a detector is provided. The device comprises: a sample receiving portion; a heater; a vapor pre-concentrator; and a sampling inlet. The sample receiving portion is arranged to receive a gas stream carrying an aerosol sample analyte, and the heater is arranged to heat the aerosol sample analyte to provide a sample analyte vapor. The device is arranged to provide the sample analyte vapor to: (i) the vapor pre-concentrator, and (ii) the detector via the sampling inlet.

[0005] Embodiments can promote the accuracy, reliability and speed of improving detection of any substance of interest in aerosol sample analyte. For example, after a large amount of this vaporized aerosol has accumulated on the steam pre-concentrator, aerosols present in a smaller amount can be more reliably detected. At the same time, it is possible to detect aerosols present in a larger amount while accumulating steam on the pre-concentrator. In other words, the device can be configured to enable sample detection (carried out by the detector for the steam sampled via the sampling inlet) and sample accumulation (accumulation of sample steam on the steam pre-concentrator) to be performed simultaneously. For both steam sampling and steam accumulation, the steam includes vaporized aerosols (for example, wherein those aerosols are vaporized by a heater in the inlet device).

[0006] The device can be configured to desorb the sample analyte vapor accumulated on the vapor preconcentrator to provide desorbed sample analyte vapor. The device can be configured to provide the desorbed sample analyte vapor to the detector via the sampling inlet. The device can be configured to operate in: (i) a first mode, wherein the sample analyte vapor from the heated aerosol sample analyte is provided to the detector via the sampling inlet; and (ii) a second mode, wherein the desorbed sample analyte vapor from the vapor preconcentrator is provided to the detector via the sampling inlet. When operating in the first mode, the device can be configured to simultaneously accumulate some sample analyte vapor (from the heated aerosol sample analyte) on the vapor preconcentrator (and provide some of the sample analyte vapor to the detector). The device can be configured to operate in the first mode for a selected time period before switching to the second mode.

[0007] The device can be configured to reduce the flow rate of gas flow through the device when switching from the first mode to the second mode. The device can be configured to inhibit gas flow through the device when operating in the second mode. For example, in response to switching from the first mode to the second mode, the device can be configured to reduce (e.g., stop) the flow through the device, for example, by disengaging or reducing the operation of an air mover of the device.

[0008] The device can be configured to heat the steam preconcentrator to provide desorption from the steam preconcentrator. The steam preconcentrator can include a steam preconcentrator heater. The preconcentrator can be configured to accumulate steam on its outer surface. The outer surface can include a silicone material. The outer surface of the preconcentrator can at least partially surround the heater (e.g., it can completely surround it). In the first mode, heating of the steam preconcentrator can be suppressed.

[0009] The steam concentrator may be located between the sample receiving portion and the sampling inlet. The heater may be arranged to span a flow path from the sample receiving portion toward the steam pre-concentrator and the sampling inlet. The flow path through the device may include at least one bend. At least a portion of the steam pre-concentrator may be located outside the bend. The device may be arranged to provide sample vapor to an ion mobility spectrometer. The sampling inlet may include a pinhole inlet and / or a membrane covering. The device may include two steam pre-concentrators and / or two sampling inlets.

[0010] In one aspect, a detector is provided that is configured to detect the presence of one or more substances of interest in a sample analyte vapor, the detector having an inlet device and a detection portion. The inlet device includes: a sample receiving portion; a heater; a vapor preconcentrator; and a sampling inlet. The sample receiving portion is arranged to receive a gas stream carrying an aerosol sample analyte, and the heater is arranged to heat the aerosol sample analyte to provide a sample analyte vapor. The device is arranged to provide the sample analyte vapor to: (i) the vapor preconcentrator, and (ii) the detector portion via the sampling inlet. The detection portion is configured to detect the presence of one or more substances of interest in the sample analyte vapor received from the sampling inlet.

[0011] In one aspect, a method of providing a sample analyte vapor to a detector is provided, the method comprising: receiving a gas flow carrying an aerosol sample analyte in an inlet device; heating the aerosol sample analyte to provide a sample analyte vapor; and providing the sample analyte vapor to: (i) a vapor preconcentrator in the inlet device, and (ii) the detector via a sampling inlet in the inlet device.

[0012] The sample analyte vapor accumulated on the vapor preconcentrator can be provided to the vapor preconcentrator for a selected period of time before being desorbed from the vapor preconcentrator to provide desorbed sample analyte vapor. The method can include providing the desorbed sample analyte vapor from the preconcentrator to the detector via a sampling inlet. Desorbing the sample analyte vapor from the vapor preconcentrator to provide the desorbed sample analyte vapor can include heating the vapor preconcentrator. When the vapor preconcentrator is heated, a flow rate of a gas stream through an inlet device can be reduced.

[0013] In one aspect, a method of operating a detector to detect the presence of one or more substances of interest in a sample analyte vapor is provided, the method comprising: receiving a gas stream carrying an aerosol sample analyte; heating the aerosol sample analyte to provide a sample analyte vapor; providing the sample analyte vapor to: (i) a vapor preconcentrator, and (ii) a detector via a sampling inlet; and operating the detector to detect the presence of one or more substances of interest in the sample analyte vapor received from the sampling inlet.

[0014] Aspects of the present disclosure may include one or more computer program products comprising computer program instructions configured to program a controller to operate an inlet device and / or a detector to implement any of the methods disclosed herein. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Some examples of the present disclosure will now be described, by way of example only, with reference to the accompanying drawings, in which:

[0016] Figure 1 A schematic diagram of the inlet device is shown.

[0017] Figure 2 A schematic diagram of the inlet device is shown.

[0018] Figure 3 A schematic diagram of an ion mobility spectrometer is shown.

[0019] In the drawings, the same reference numerals are used to denote the same elements. DETAILED DESCRIPTION

[0020] The present disclosure relates to a system and method for providing sample analyte vapor to a detector. An input gas stream from a sample to be analyzed flows through an inlet device. The gas stream passing through the inlet device may contain sample analyte vapor and / or sample analyte aerosol. The input gas stream is heated to generate sample analyte vapor from the aerosol. Some of the sample analyte vapor in the inlet device is then provided to the detector (via a sampling inlet in the inlet device), and some of the sample analyte vapor in the inlet device accumulates on a vapor preconcentrator in the inlet device. Thus, the sample vapor can simultaneously accumulate on the vapor preconcentrator and be provided to the detector via the sampling inlet. Periodically, the vapor that has accumulated on the vapor preconcentrator can be desorbed from the vapor preconcentrator, and some of the desorbed vapor can then be provided to the detector via the sampling inlet. The vapor desorbed from the preconcentrator will be at a higher concentration, and therefore, sample analytes at relatively low concentrations in the gas stream can be more reliably detected. At the same time, when the vapor analyte also accumulates on the vapor preconcentrator, the higher concentration of analyte can still be detected by the detector.

[0021] Now refer to Figure 1 Describe an example of an inlet device.

[0022] Figure 1 An inlet device 100 is shown. The device 100 comprises a sample receiving portion 110, a heater 120, a vapor pre-concentrator 130 and a sampling inlet 140. The vapor pre-concentrator 130 comprises a surface 131 and a desorber 132. Figure 1 The arrows in show exemplary flow through device 100 .

[0023] The device 100 defines a flow path for a fluid / aerosol to flow through the device 100. The device 100 may include a housing that defines (e.g., constrains) the flow path. For example, the housing may provide a conduit through which the fluid and aerosol will flow. Flow through the device 100 will be from an upstream location to a downstream location.

[0024] The sample receiving portion 110 is located upstream of the apparatus 100. The heater 120 is located upstream of the steam pre-concentrator 130 / sampling inlet 140. The heater 120 is located between the sample receiving portion 110 and the steam pre-concentrator 130 / sampling inlet 140.

[0025] The heater 120 is located in the flow path through the device 100. The heater 120 may include a resistive heater. The heater 120 may provide an aerosol heater. The heater 120 may be formed of a plurality of electrical conductors (having a relatively high electrical resistance). The conductors may be arranged in a grid or "grid-like" pattern. The conductors of the heater 120 may span the flow path (e.g., they may extend across the entire cross-section of the conduit providing the flow path). For example, the heater 120 may include a plurality of elongated conductive elements extending across the sample receiving portion 110. The conductive elements may be arranged in a grid such as a mesh or a woven mesh. The conductors may be arranged to at least partially interrupt the air flow through the inlet device 100 (e.g., between the sample receiving portion 110 and the vapor pre-concentrator 120). The conductive elements may be arranged to provide a surface of the heater that contacts the gas flow that is larger than the inner surface of the sample receiving portion 110).

[0026] The steam pre-concentrator 130 is located downstream of the heater 120 and upstream of the sampling inlet 140. In other words, the steam pre-concentrator 130 is located between the heater 120 and the sampling inlet 140. The steam pre-concentrator 130 may be located near (e.g., just before) the sampling inlet 140. The separation of the steam pre-concentrator 130 from the sampling inlet 140 allows the steam desorbed from the steam pre-concentrator 130 to be close to the sampling inlet 140.

[0027] The steam pre-concentrator 130 is formed by a surface 131 and a desorber 132. The desorber 132 may be in the form of a heater. The desorber 132 is positioned close to the surface 131 (e.g., so that the desorber 132 can provide heating of the surface 131). The surface 131 may at least partially surround the desorber 132 (e.g., it may completely surround the desorber 132). The surface 131 may be based on silicone. For example, the steam pre-concentrator 130 may be formed by a silicone-covered heating element. The surface 131 is located in the flow path through the device 100. For example, the surface 131 may protrude into a conduit providing the flow path. The surface 131 is arranged to provide an obstruction to the flow along the flow path.

[0028] The sampling inlet 140 is located downstream of the steam pre-concentrator 130. The sampling inlet 140 is used to connect the inlet device 100 (and the flow path therethrough) to the detector. When the inlet device 100 is coupled to the detector, a flow path from the sampling inlet 140 to the detector is provided. In other words, the sampling inlet 140 can provide a flow path coupling between the inlet device 100 and the detector. The sampling inlet 140 may include a pinhole inlet. For example, the pinhole can be provided in the body of the inlet device 100 that defines the flow path (e.g., a conduit that provides a fluid / aerosol flow through). The sampling inlet 140 may optionally include a membrane covering.

[0029] The inlet device 100 is configured for gas to flow through a flow path passing through the inlet device 100. For example, although not shown, the device 100 may include a blower configured to selectively provide a flow through the device 100. The blower may include a pump or a fan. Additionally or alternatively, the blower may be provided to the inlet device 100 by a separate component. The device 100 (e.g., the blower) may be arranged to provide a flow of gas from the sample receiving portion 110 toward the heater 120, the vapor preconcentrator 130, and the sampling inlet 140. The device 100 is arranged for heating the flow by the heater 120 and for directing the heated flow toward the vapor preconcentrator 130 and the sampling inlet 140.

[0030] The sample receiving portion 110 is arranged to receive a sample analyte. The sample analyte includes a sample substance (one or more) to be analyzed by a detector coupled to the inlet device 100. The sample receiving portion 110 is arranged to receive a gas stream containing the sample analyte. The sample analyte can be in the form of vapor and / or aerosol. The gas stream can carry sample analyte vapor as well as sample analyte aerosol. The sample receiving portion 110 can provide an opening for the sample analyte to enter the flow path through the inlet device 100. For example, the sample receiving portion 110 can be configured to receive a sample analyte from, for example, a swab.

[0031] The heater 120 is configured to heat the sample analyte. Specifically, the heater 120 is configured to heat the sample analyte aerosol to generate a sample analyte vapor therefrom. In other words, the heater 120 is configured to increase the proportion of the sample analyte in vapor form. The heater 120 is configured to heat the material flowing from the sample receiving portion 110 toward the vapor preconcentrator 130 and the sampling inlet 140. The heater 120 is configured to provide the sample analyte vapor from the sample analyte aerosol, such that the sample analyte material provided to the vapor preconcentrator 130 / sampling inlet 140 is in vapor form.

[0032] The vapor preconcentrator 130 is configured to accumulate sample analyte vapor. For example, the sample analyte vapor can be adsorbed onto the surface 131 of the vapor preconcentrator 130. In other words, the vapor preconcentrator 130 is arranged to store some of the sample analyte vapor flowing through the inlet device 100. The vapor preconcentrator 130 is configured to retain the sample analyte vapor on the surface 131 (and also accumulate more sample analyte vapor on its surface 131 over time). In this way, the vapor preconcentrator 130 is configured to store some of the sample analyte vapor that has entered the inlet device 100. As will be understood in the context of this disclosure, the concentration of the sample analyte in the gas flowing through the inlet device 100 can vary depending on the sample to be analyzed (among other things). At any one time, the concentration of the sample analyte vapor in the inlet device 100 that can be provided to the detector (via the sampling inlet 140) can vary. Vapor preconcentrator 130 is configured to store sample analyte vapor to provide an increased concentration of the stored sample analyte vapor (eg, sample analyte vapor stored on surface 131 of vapor preconcentrator 130 ).

[0033] In other words, the vapor concentrator is arranged to accumulate sample analyte vapor in the inlet device 100. The vapor concentrator is selectively operable to desorb such sample analyte vapor therefrom to provide desorbed sample analyte vapor in the inlet device 100. To this end, the desorber 132 is configured to interact with the surface 131 to provide desorbed sample analyte vapor therefrom. For example, the desorber 132 may include a heater, and the heater may be configured to heat the surface 131 to desorb sample analyte vapor therefrom (to provide desorbed sample analyte vapor). As will be appreciated, by desorbing such sample vapor from the vapor pre-concentrator 130, the final concentration of the sample analyte vapor in the inlet device 100 will increase (due to the sudden influx of desorbed sample analyte vapor). In other words, the vapor concentrator may be configured to: (i) accumulate sample analyte vapor and then (ii) offload the desorbed sample analyte vapor.

[0034] The sampling inlet 140 is arranged to provide the sample analyte vapor from the flow path in the inlet device 100 to the detector. The sampling inlet 140 can be selectively operated to allow / prohibit the flow to the detector. The sampling inlet 140 can be arranged to suppress unexpected flow from reaching the detector. For example, when the sampling inlet 140 includes a pinhole, the device 100 (or the detector to which the device 100 is connected) can be configured to apply negative pressure to inhale steam through the pinhole (wherein the normal gas flow through the inlet device 100 will not cause flow into the sampling inlet 140). In other words, the device 100 (or the detector connected thereto) can be configured to select when the sample analyte is transferred to the detector for analysis (and when not to be transferred to the detector). The sampling inlet 140 is operable to actively inhale steam from the flow path through the inlet device 100 (and provide the steam to the detector).

[0035] Device 100 is configured to selectively use vapor preconcentrator 130 for either: (i) accumulating sample analyte vapor, and (ii) unloading sample analyte vapor. Device 100 can be configured to switch between these two modes of operation (eg, between accumulation and unloading).

[0036] When used to accumulate sample analyte vapor, the device 100 is configured to simultaneously provide: (i) supplying the sample analyte vapor to the vapor preconcentrator 130, and (ii) supplying the sample analyte vapor to the detector through the sampling inlet 140. In other words, the device 100 is configured to operate in a first (e.g., accumulation) mode in which the sample analyte vapor is simultaneously accumulated on the vapor preconcentrator 130 and also supplied to the detector (via the sampling inlet 140). In this first operating mode, some of the sample analyte vapor in the inlet device 100 will be stored by the vapor preconcentrator 130, and some will be analyzed by the detector. Some or all of the sample vapor in the inlet device 100 (which is stored on the vapor preconcentrator 130 and / or supplied to the detector) will be received in the inlet device 100 in aerosol form, but will be in vapor form after being heated by the heater 120.

[0037] When used to unload sample analyte vapor, the device 100 is configured to: (i) desorb vapor from the vapor preconcentrator 130 to provide desorbed sample analyte vapor, and (ii) provide some of the desorbed sample analyte vapor to the detector for analysis. Desorption and providing the desorbed sample analyte vapor to the detector can occur simultaneously, or they can occur sequentially. For example, the device 100 can be configured to simultaneously desorb analyte vapor and provide vapor to the detector, or the device 100 can be configured to first begin desorbing analyte vapor before beginning to provide desorbed sample analyte vapor to the detector. In other words, the device 100 is configured to operate in a second (e.g., unloading) mode, in which the sample analyte vapor already stored by the vapor preconcentrator 130 is analyzed by the detector. In this second operating mode, the analyte vapor analyzed by the detector will be vapor from the preconcentrator 130 (e.g., whereas in the first operating mode, the analyte vapor analyzed will be vapor that has not accumulated on the vapor preconcentrator 130).

[0038] When operating in the first operating mode, a flow through the inlet device 100 will be provided. In the first operating mode, the device 100 can therefore be configured for sample analyte steam to flow from the heater 120 to the steam preconcentrator 130 / sampling inlet 140. The steam preconcentrator 130 is arranged to receive some of the sample analyte steam, and the sampling inlet 140 can be configured to obtain some of the sample analyte steam and provide the sample analyte steam to the detector. The remaining sample analyte steam can continue to flow along the flow path (after the sampling inlet 140) and flow towards the outlet of the device 100. In the first operating mode, the desorber 132 can be in an inactive state (for example, the heater can be turned off). The steam preconcentrator 130 can therefore be arranged to promote the accumulation of sample analyte steam in the first operating mode rather than unloading.

[0039] When operating in the second operating mode, the flow through the inlet device 100 can be reduced or completely stopped. In the second operating mode, the through flow of the sample analyte vapor will be reduced. For example, the blower is inactive. The desorber 132 is configured to drive the desorption of the sample analyte vapor from the vapor pre-concentrator 130. The resulting desorbed sample analyte vapor will be unlikely to flow away downstream. The sampling inlet 140 can be operated to actively inhale some of this desorbed sample analyte vapor to provide to the detector. In this mode, the vapor pre-concentrator 130 can therefore be configured to facilitate unloading rather than accumulating sample analyte vapor.

[0040] Although not shown, the device 100 (or the detector to which it is connected) may include a controller. The controller may be configured to control the operation of the components and / or detectors of the inlet device 100. For example, the controller may be configured to control the heater 120 to selectively provide heating of the sample analyte aerosol. The controller may be configured to control desorption to selectively provide desorption of sample vapor from the vapor pre-concentrator 130. The controller may be configured to control the operation of the blower to provide or suppress flow through the inlet device 100. The controller may be configured to control the operation of the detector and / or the sampling inlet 140 to actively aspirate vapor (e.g., to apply negative pressure at the sampling inlet 140) through the sampling inlet 140.

[0041] The controller can be configured to control the operation of such components to control the device 100 to operate in the first and second modes. For example, the controller can be configured to control the operation of different components to switch between the first operating mode and the second operating mode. The controller can be configured to control the device 100 to operate in the first operating mode for a selected period of time (e.g., before subsequently switching the device 100 to operate in the second operating mode).

[0042] The controller can be configured to control operation in the first mode such that: (i) the blower is active to generate air flow through the inlet device 100, (ii) the heater 120 is active to generate sample analyte vapor from the sample analyte aerosol, (iii) the desorber 132 is inactive to promote accumulation of sample analyte vapor on the vapor preconcentrator 130, and (iv) some sample analyte vapor is actively drawn from the inlet device 100 through the sampling inlet 140 to be provided to the detector.

[0043] The controller can be configured to control operation in the second mode such that: (i) the blower can be inactive and / or produce a reduced flow rate through the inlet device 100 (compared to the first mode), (ii) the heater 120 can optionally be inactive, (iii) the desorber 132 is active to promote desorption of sample analyte vapor therefrom (e.g., such that desorbed sample analyte vapor is present in the inlet device 100 proximate the sampling inlet 140), and (iv) some sample analyte vapor is actively drawn from the inlet device 100 through the sampling inlet 140 to be provided to the detector.

[0044] In operation, the inlet device 100 may begin operating in its first operating mode.

[0045] In this first operating mode, gas from the sample to be analyzed is received at the sample receiving portion 110 of the inlet device 100. The gas contains some sample analyte aerosol. The gas and any sample analyte aerosol it carries flow through the inlet device 100 along a flow path. The heater 120 heats the flow (which comes from the sample receiving portion 110). As a result of the heating, some sample analyte aerosol is evaporated to provide sample analyte vapor. The sample analyte vapor flows along the flow path in the inlet device 100. Some of the sample analyte vapor accumulates on the surface 131 of the vapor preconcentrator 130. The accumulated sample analyte vapor will remain on the surface 131 (e.g., as long as the desorber 132 remains inactive). Some of the sample analyte vapor in the inlet device 100 (i.e., the vapor that does not accumulate on the surface 131 of the vapor preconcentrator 130) is provided to the detector for analysis. To this end, vapor from the flow path of inlet device 100 can be actively drawn through sampling inlet 140, for example, by applying negative pressure to draw some of the vapor through sampling inlet 140. The accumulation of vapor on vapor pre-concentrator 130 and the sampling of vapor through sampling inlet 140 occur simultaneously. In this way, sample analysis can be performed on some sample analyte vapor from inlet device 100 while other sample analyte vapor in inlet device 100 accumulates on vapor pre-concentrator 130.

[0046] Operation in this first mode can continue for a selected period of time. During this period of time, gas can continue to flow through the flow path of the inlet device 100. Therefore, sample analyte (e.g., aerosol) will continue to enter the inlet device 100, be evaporated into sample analyte vapor, and then accumulate on the vapor pre-concentrator 130. Over time, the vapor pre-concentrator 130 will effectively store the sample analyte vapor at a higher concentration than the concentration present in the gas flow through the inlet device 100. The selected period of time can be selected so that sufficient time has passed for a substantial amount of sample analyte vapor to have accumulated on the vapor pre-concentrator 130 (e.g., so that any relevant substances of interest in the resulting desorbed sample analyte vapor can be identified by the detector).

[0047] During this first mode of operation, the detector can analyze one or more sample portions obtained through the sampling inlet 140 (and from the flow path of the inlet device 100). Based on the analysis of these one or more sample portions, an indication of the presence (or absence) of any substance(s) of interest in the sample can be identified. If any substances of interest are present in the sample in relatively large quantities, it is likely that sample analyte vapors indicative of those substances will be obtained from the inlet device 100 (through the sampling inlet 140) and then analyzed during operation in the first mode. As a result, any substances of interest that are present in large quantities can be reliably detected by the detector. However, for any substances of interest that are only present in relatively small quantities in the sample (one or more), it is unlikely that these substances can be reliably identified by the detector because the concentration of the sample vapor analyte for these substances will be much lower.

[0048] To facilitate more reliable detection of these substances, the device 100 may then switch to operation in the second mode.

[0049] In the second operating mode, the flow rate through the inlet device 100 is reduced. For example, the blower can be turned off (or switched to a lower power level). As a result, the air flow through the flow path of the inlet device 100 will be significantly reduced compared to the first operating mode. Optionally, during operation in the second mode, the heater 120 can be turned off (or switched to a lower power level) (for example, because there will be less or no sample analyte aerosol to be vaporized by the heater 120). The desorber 132 will be turned on. When activated, the desorber 132 will cause the desorption of the sample analyte vapor from the vapor pre-concentrator 130. For example, the desorber 132 can begin to heat the surface 131 of the vapor pre-concentrator 130. The operation of the desorber 132 causes the desorption of the vapor from the vapor pre-concentrator 130 to provide desorbed sample analyte vapor.

[0050] The operation of the desorber 132 can produce a cloud of desorbed sample analyte vapor. Since the vapor pre-concentrator 130 is located near the sampling inlet 140 and the air flow through the inlet device 100 is significantly reduced, a high concentration of desorbed sample analyte vapor may be present near the sampling inlet 140. Then, one or more sample vapor portions are aspirated through the sampling inlet 140 to be provided to the detector (e.g., by applying negative pressure). The portion (s) to be analyzed by the detector can therefore contain a relatively high concentration of desorbed sample analyte vapor. As the desorbed sample analyte vapor accumulates over an extended period of time, this will typically contain a higher concentration of any potential substance of interest in the sample being analyzed. Therefore, the detector can be operated to analyze a vapor sample containing a higher proportion of desorbed sample analyte vapor. Therefore, this can facilitate more reliable detection of substances (particularly aerosols) that are only present in a relatively small amount in the sample to be analyzed.

[0051] After the vapor sample to be analyzed has been obtained, the device 100 can be switched back to operation in the first mode. To this end, the heater 120 can be turned on again (if it was off), the desorber 132 can be closed, and the flow through the inlet device 100 can be increased.

[0052] The above arrangement (and corresponding operating method) can achieve the simultaneous detection of relatively high concentrations of substances of interest (i.e., in the first operating mode) and relatively low concentrations of substances of interest (i.e., in the second operating mode). That is, when operating in the first mode, substances of interest can be detected by the detector (especially those present in higher amounts). When this occurs, some substances of interest (including those present in lower amounts) may accumulate on the vapor pre-concentrator 130. The device 100 can then switch to operating in the second mode, in which higher concentration sampling is performed (i.e., sampling the desorbed sample analyte vapor). The lower concentration substance can then be identified based on analysis of this higher concentration sample.

[0053] Figure 2 Another inlet arrangement is shown. Figure 2 The device and Figure 1 Similar to the device, Figure 1 An exemplary inlet arrangement is shown in cross-section (when viewed from the side). Figure 2 A portion of the inlet arrangement is shown when viewed in plan. The arrows show the direction of flow through the inlet arrangement.

[0054] like Figure 2 As can be seen in FIG, the inlet device defines a tortuous flow path for the flow of the fluid / aerosol. The flow path includes at least one bend ( Figure 2The arrangement of each steam preconcentrator 130 / sampling inlet 140 is similar to that described above. Figure 1 The same as described above, that is, each steam preconcentrator 130 is arranged upstream of and adjacent to its associated sampling inlet 140. In addition, each steam preconcentrator 130 is located at a bend in the flow path. In particular, each steam preconcentrator 130 is located on an outer region of the bend (e.g., radially outward of the bend). Each steam preconcentrator 130 can be located on a portion of the bend immediately following a straight portion of the flow path. Each steam preconcentrator 130 can be arranged in an area of ​​the inlet device where the flow is more turbulent. Each sampling inlet 140 can be located directly downstream of the steam preconcentrator 130.

[0055] The operation of the device can be the same as described above, wherein both operating modes are simultaneously performed for both pairs of steam pre-concentrators and sampling inlets. That is, each steam pre-concentrator 130 and sampling inlet 140 can be operated in the first operating mode for a selected period of time. After the selected period of time has elapsed, both steam pre-concentrators 130 and sampling inlets 140 can be switched to the second operating mode.

[0056] The examples described herein relate to a detector inlet device 100. The inlet device 100 is configured to provide sample analyte vapor to a detector. The device 100 is configured to vaporize a sample analyte aerosol to provide sample analyte vapor, and to provide some of the resulting sample analyte vapor to the detector via a sampling inlet 140. Some of the vaporized sample analyte vapor will be provided directly to the detector, and some will be provided by accumulating on a vapor preconcentrator 130 and then desorbing therefrom. For both the first and second operating modes, the sample analyte provided to the detector will be in vapor form.

[0057] In the context of the present disclosure, it will be understood that the particular type of detector need not be considered limiting. The detector is configured to identify the presence of one or more substances of interest in a sample. The detector may include an ion analyzer. The detector may include a spectrometer. For example, the detector may include an ion mobility spectrometer or a mass spectrometer. It will be appreciated that the inlet device of the present disclosure has particular utility for providing a sample vapor to an ion mobility spectrometer, and reference will now be made to Figure 3 An example of the ion mobility spectrometer is described.

[0058] Figure 3 is a diagrammatic representation of a partial cross section through a detector in the form of an ion mobility spectrometer (“IMS”) 280 .

[0059] Figure 3 The ion mobility spectrometer 280 shown in FIG includes an ionizer 288 separated from a drift chamber 292 by a door 282. The door 282 can control the passage of ions from the ionizer 288 to the drift chamber 292. As shown, the IMS 280 includes an inlet 281 for enabling material to be introduced from a sample of interest to the ionizer 288 (e.g., via the sampling inlet 140 of the inlet device 100).

[0060] exist Figure 3 In the example shown, a drift chamber 292 is located between the ionizer 288 and the detector 287, such that ions can reach the detector 287 by passing through the drift chamber 292. The drift chamber 292 can include a series of drift electrodes 283, 284 for applying a voltage profile along the drift chamber 292 to move ions from the ionizer 288 along the drift chamber 292 toward the detector 287.

[0061] The IMS 280 can be configured to provide a drift gas flow in a direction generally opposite to the path of travel of the ions to the detector 287. For example, the drift gas can flow from near the detector 287 to the door 282. As shown, a drift gas inlet 289 and a drift gas outlet 290 can be used to pass the drift gas through the drift chamber. Exemplary drift gases include, but are not limited to, nitrogen, helium, air, recycled air (e.g., clean and / or dry air), etc.

[0062] The detector 287 can be coupled to provide a signal to a detection controller 294. The current from the detector 287 can be used by the controller 294 to infer that the ion has arrived at the detector 287, and the characteristics of the ion can be determined based on the time it takes for the ion to travel from the gate 282 along the drift chamber 292 to reach the detector 287. Examples of the detector 287 are configured to provide a signal indicating that the ion has arrived at the detector 287. For example, the detector can include a conductive electrode (e.g., a Faraday plate).

[0063] The electrodes 283, 284 may be arranged to direct ions toward the detector 287, for example, the drift electrodes 283, 284 may include rings that may be arranged around the drift chamber 292 to focus the ions onto the detector 287. Figure 3 The example includes only two drift electrodes 283 , 284 , but in some examples, multiple electrodes may be used, or a single electrode may be used in combination with detector 287 to apply an electric field to direct ions toward detector 287 .

[0064] The spectrometer 280 is shown as including ion modifier electrodes 285, 286 arranged in the drift chamber, but it will be understood in the context of the present disclosure that these may not be included.

[0065] like Figure 3 As shown, a voltage provider 293 is coupled to be controlled by a controller 294. The voltage provider 293 can also be coupled to provide a voltage to the ionizer 288 to enable material from the sample to be ionized. In one embodiment, the voltage provider 293 is coupled to the gate electrode 282 to control the passage of ions from the ionization chamber into the drift chamber 292. The voltage provider 293 can be coupled to the drift electrodes 283, 284 to provide a voltage profile for moving ions from the ionizer 288 toward the detector 287.

[0066] As described above, the drift electrodes 283, 284 can provide a voltage profile that moves ions along the drift chamber, causing the ions to travel from the ionizer to the detector. Figure 3 As shown, the first ion modification electrode 285 and the second ion modification electrode 286 may be spaced apart in the direction of ion travel.

[0067] The spectrometer and voltage provider can be contained in a common housing. In spectrometry, ion counts can be measured by peaks on the spectrum, and the height of the peak can be an indicator of the number of ions reaching the detector at a particular time. Ions produced by reactions with neutral molecules of a substance of interest can be referred to as "daughter ions," and the ions that produced the daughter ions can be referred to as "parent ions."

[0068] As mentioned above, other types of detectors can be used. For example, a mass spectrometer, such as a time-of-flight mass spectrometer, can be used. In such a spectrometer, the mass-to-charge ratio of the ions can be inferred from their time of flight through a vacuum. In other types of mass spectrometers, ions can be separated based on their mass-to-charge ratio in other ways, such as by being deflected in an electric or magnetic field.

[0069] The detection device comprising the detector and the inlet device may be provided in a portable unit. For example, the detection device may be handheld.

[0070] It will be understood in the context of the present disclosure that the vapor preconcentrator 130 can be provided in any suitable form. To this end, the vapor preconcentrator 130 includes a portion for accumulating sample vapor (e.g., surface 131) and a component for driving the sample vapor to desorb therefrom (e.g., desorber 132). The desorber 132 may include a heater for causing desorption by heating, but other forms of the desorber 132 may also be provided. For example, the desorber 132 may be configured to subject the surface 131 to radiation, pressure, vibration, etc., so as to cause the sample vapor to desorb therefrom. The surface 131 may contain an adsorbent material (e.g., during the adsorption phase, the sample analyte will bind to the adsorbent material). The surface 131 may have an adsorbent coating. For example, the vapor preconcentrator 130 may include a heating element having an adsorbent coating. The surface 131 (e.g., adsorbent coating) may be based on silicone.

[0071] As described herein, the heater 120 may be provided by a resistive heater in the form of a mesh grid of conductors arranged across the inlet flow path. However, it should be understood that this should not be considered restrictive, as other forms of heaters may be provided. For example, a radiant heater (e.g., an IR heater) may be used. Similarly, in an example, a blower is provided to control the air flow through the inlet device. It should be understood that the blower may be provided as part of the inlet device, or it may be provided by a separate component. For example, the blower may be provided by a component that couples the sample to the inlet device (e.g., to blow air from the sample through the inlet device), or the blower may be located downstream of the sampling inlet (e.g., to draw air through the inlet device).

[0072] It will be understood from the above discussion that the examples shown in the figures are exemplary only and include features that may be generalized, removed, or replaced as described herein and as set forth in the claims. With reference to the drawings generally, it will be understood that the schematic functional block diagrams are used to indicate the functionality of the systems and devices described herein. In addition, processing functionality may also be provided by devices supported by the electronic device. However, it will be understood that functionality need not be divided in this manner and should not be construed to imply any particular hardware structure other than the hardware described and claimed below. The functionality of one or more elements shown in the drawings may be further subdivided and / or distributed throughout the apparatus of the present disclosure. In some examples, the functionality of one or more elements shown in the drawings may be integrated into a single functional unit.

[0073] As will be understood by those skilled in the art in the context of this disclosure, each example described herein can be implemented in a variety of different ways. Any feature of any aspect of the present disclosure can be combined with any other aspect of the present disclosure. For example, method aspects can be combined with device aspects, and features described with reference to the operation of specific elements of a device can be provided in a method that does not use those specific types of devices. In addition, each feature of each example is separable from the features described in conjunction therewith, unless it is explicitly stated that some other features are necessary for its operation. Of course, each of these separable features can be combined with any other feature in the examples in which these features are described, or combined with any other feature or combination of features in any other example described herein. Equivalents and modifications not described above can also be adopted.

[0074] Certain features of the methods described herein can be implemented in hardware, and one or more functions of the device can be implemented in method steps. It will also be understood in the context of the present disclosure that the methods described herein do not need to be performed in the order in which they are described, nor in the order in which they are depicted in the accompanying drawings. Therefore, the aspects of the present disclosure described with reference to products or devices are also intended to be implemented as methods, and vice versa. The methods described herein can be implemented in a computer program, or in hardware, or in any combination thereof. Computer programs include software, middleware, firmware, and any combination thereof. Such programs can be provided as signals or network messages and can be recorded on a computer-readable medium, such as a tangible computer-readable medium that can store a computer program in a non-transitory form. Hardware includes computers, handheld devices, programmable processors, general-purpose processors, application-specific integrated circuits (ASICs), field programmable gate arrays (FPGAs), and logic gate arrays.

[0075] Other examples and variations of the present disclosure will be apparent to those skilled in the art in light of the context of this disclosure.

Claims

1. An inlet device for providing a sample analyte vapor to a detector, the device comprising: Sample receiving department; heater; steam pre-concentrator; as well as Sampling inlet; wherein the sample receiving portion is arranged to receive a gas flow carrying an aerosol sample analyte, and the heater is arranged to heat the aerosol sample analyte to provide a sample analyte vapor; as well as wherein the apparatus is arranged to provide the sample analyte vapor to: (i) the vapor pre-concentrator, and (ii) the detector via the sampling inlet. 2 . The device of claim 1 , wherein the device is configured to desorb sample analyte vapor accumulated on the vapor preconcentrator to provide desorbed sample analyte vapor.

3. The device according to claim 2, wherein The device is configured to provide the desorbed sample analyte vapor to the detector via the sampling inlet.

4. The apparatus of claim 3 , wherein the apparatus is configured to operate in the following modes: a first mode in which sample analyte vapor from a heated aerosol sample analyte is provided to the detector via the sampling inlet; and A second mode wherein desorbed sample analyte vapor from the vapor preconcentrator is provided to the detector via the sampling inlet. 5 . The apparatus of claim 4 , wherein the apparatus is configured to operate in the first mode for a selected period of time before switching to the second mode.

6. An apparatus according to claim 4 or 5, wherein the apparatus is configured to reduce the flow rate of the gas flow through the apparatus when switching from the first mode to the second mode.

7. The apparatus of claim 6, wherein the apparatus is configured to inhibit the flow of gas through the apparatus when operating in the second mode.

8. The apparatus according to any one of claims 2 to 7, wherein the apparatus is configured to heat the steam pre-concentrator to provide desorption from the steam pre-concentrator.

9. The apparatus of claim 8, wherein the steam pre-concentrator comprises a steam pre-concentrator heater.

10. The apparatus of claim 9, wherein the preconcentrator is configured to accumulate steam on an outer surface thereof, optionally wherein the outer surface comprises a silicone material.

11. The apparatus of claim 10, wherein the outer surface of the preconcentrator at least partially surrounds the heater.

12. The apparatus according to any one of claims 8 to 11, wherein in the first mode, heating of the steam pre-concentrator is suppressed.

13. The device according to any one of the preceding claims, wherein The steam concentrator is located between the sample receiving portion and the sampling inlet.

14. The device according to any one of the preceding claims, wherein The heater is arranged across a flow path from the sample receiving portion toward the vapor pre-concentrator and the sampling inlet.

15. The device according to any one of the preceding claims, wherein The flow path through the device includes at least one bend.

16. The apparatus of claim 15, wherein at least a portion of the steam pre-concentrator is located on an outside of the bend.

17. An apparatus according to any preceding claim, wherein the apparatus is arranged to provide a sample vapour to an ion mobility spectrometer, and / or wherein the sampling inlet comprises a pinhole inlet and / or a membrane covering.

18. The device according to any one of the preceding claims, wherein the device comprises two steam pre-concentrators and / or two sampling inlets.

19. A detector configured to detect the presence of one or more substances of interest in a sample analyte vapor, the detector having an inlet device and a detection portion, wherein the inlet device comprises: Sample receiving department; heater; steam pre-concentrator; as well as Sampling inlet; wherein the sample receiving portion is arranged to receive a gas flow carrying an aerosol sample analyte, and the heater is arranged to heat the aerosol sample analyte to provide a sample analyte vapor; wherein the apparatus is arranged to provide the sample analyte vapor to: (i) the vapor pre-concentrator, and (ii) the detector portion via the sampling inlet; and The detection portion is configured to detect the presence of one or more substances of interest in the sample analyte vapor received from the sampling inlet.

20. A method of providing a sample analyte vapor to a detector, the method comprising: receiving a gas stream carrying an aerosol sample analyte in an inlet device; heating the aerosol sample analyte to provide a sample analyte vapor; as well as The sample analyte vapor is provided to: (i) a vapor pre-concentrator in the inlet device, and (ii) the detector via a sampling inlet in the inlet device.

21. The method according to claim 20, wherein The sample analyte vapor is provided to the vapor preconcentrator for a selected period of time before the sample analyte vapor accumulated on the vapor preconcentrator is desorbed from the vapor preconcentrator to provide desorbed sample analyte vapor.

22. The method of claim 21, wherein the method comprises providing the desorbed sample analyte vapor from the preconcentrator to the detector via the sampling inlet.

23. The method of claim 22, wherein desorbing the sample analyte vapor from the vapor preconcentrator to provide the desorbed sample analyte vapor comprises: heating the steam pre-concentrator; as well as Wherein when the steam pre-concentrator is heated, the flow rate of the gas stream through the inlet device is reduced.

24. A method of operating a detector to detect the presence of one or more substances of interest in a sample analyte vapor, the method comprising: receiving a gas stream carrying an analyte of the aerosol sample; heating the aerosol sample analyte to provide a sample analyte vapor; providing the sample analyte vapor to both: (i) a vapor preconcentrator, and (ii) a detector via a sampling inlet; and The detector is operated to detect the presence of one or more substances of interest in the sample analyte vapor received from the sampling inlet.

25. A computer program product comprising computer program instructions configured to program a controller to operate an access device and / or a detector to implement the method according to any one of claims 20 to 24.

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