Automatic photonic scanning collimator for germanium crystal dead layer thickness and measuring method

By designing an automated photon scanning collimator for the dead layer thickness of germanium crystals, and employing multi-angle scanning and count rate measurement combined with linear attenuation coefficient fitting, the problem of the inability to measure the dead layer thickness of germanium crystals was solved, enabling accurate measurement of the dead layer thickness of high-purity germanium crystals and improving the accuracy of gamma-ray radionuclide analysis.

CN120685024BActive Publication Date: 2026-03-24ZHEJIANG INSTITUTE OF QUALITY SCIENCES
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Patent Information

Application Number
CN202510906882.6
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2025-07-02
Publication Date
2026-03-24
Estimated Expiration
2045-07-02

AI Technical Summary

Technical Problem

Current technology cannot accurately measure the dead layer thickness of germanium crystals in high-purity germanium gamma spectrometers, which affects the accuracy of quantitative analysis of gamma radionuclides.

Method used

An automated photon scanning collimator for germanium crystal dead layer thickness is designed, including an adjustable pose measurement component and a photon generator. The dead layer thickness is calculated by multi-angle scanning and count rate measurement, combined with linear attenuation coefficient fitting.

Benefits of technology

Accurate measurement of the dead layer thickness of high-purity germanium crystals has been achieved, reducing measurement costs. The measurement can be completed without disassembling the detector, thus improving the accuracy of gamma-ray radionuclide analysis.

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Abstract

The application discloses a kind of germanium crystal dead layer thickness automation photon scanning collimator and measuring method, wherein the germanium crystal dead layer thickness automation photon scanning collimator includes the plexiglass plate being set in the top of lead chamber and being rotatable relative to lead chamber, the pose adjustable measuring component is arranged on the plexiglass plate, the upper surface of lead chamber is provided with the openable and closable lead cover for covering the plexiglass plate and pose adjustable measuring component.The application can realize the measurement of high-purity germanium crystal dead layer thickness, solve the problem that dead layer related parameters cannot be measured.The whole device is easy to process and install, and can realize measurement in multiple directions;The method creatively uses photon scanning method, which can further reduce cost, and the accurate measurement of dead layer can be realized without disassembling the detector to expose high-purity germanium crystal.
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