Damage identification method and device and storage medium
Through far-field eddy current technology and signal processing methods, the accuracy and sensitivity problems of internal damage identification of railway switch machines were solved, efficient detection of internal defects was achieved, and detection efficiency and accuracy were improved.
Patent Information
- Application Number
- CN202511198268.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-08-26
- Publication Date
- 2025-09-23
- Estimated Expiration
- Not applicable · inactive patent
AI Technical Summary
In the existing technology, the health status monitoring and fault diagnosis technology of key components of railway switch machines has the problems of low detection efficiency, sensitivity and accuracy that cannot meet the needs of modern high-speed railways, especially when identifying early potential defects such as tiny cracks and internal inclusions, it shows obvious limitations.
The far-field eddy current technology is used to stimulate far-field eddy currents in the test piece through the excitation coil, and the initial detection signal is received by the detection coil. The two-stage amplification and selective frequency band extraction method are used to improve the detection signal quality and identify the damage of the test piece.
It achieves accurate identification of internal damage of the test piece, improves the sensitivity and accuracy of detection, overcomes the shortcomings of traditional methods that are limited to measuring surface and sub-surface defects, reduces noise interference, and improves detection efficiency.
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Figure CN120685769A_ABST
Abstract
Description
Technical Field
[0001] The present application belongs to the field of rail transit technology and relates to a damage identification method, device and storage medium. Background Art
[0002] In the current rail transit technology landscape, railway switches serve as core electrical signal control equipment that ensures train safety and enables precise track switching. Their performance stability and reliability are directly linked to the safe and efficient operation of the entire railway transportation network. However, current domestic health monitoring and fault diagnosis technologies for key railway switch components still face significant shortcomings. Existing detection methods are extremely limited, relying primarily on traditional ultrasonic nondestructive testing (NDT). Manual inspection is commonly used in practical applications. This method not only relies heavily on operator skill and experience, complicating the process, but also significantly lengthens the inspection cycle and reduces overall inspection efficiency. More importantly, this traditional method exhibits significant limitations when dealing with complex internal structures (such as irregular cavities and cross welds) within switch machines, as well as when identifying early-stage potential defects such as microcracks and internal inclusions. Detection is challenging, and the sensitivity and accuracy required to meet the refined equipment health management requirements of modern high-speed and heavy-haul railways. Therefore, improving the accuracy and sensitivity of railway switch damage detection has become an urgent technical challenge. Summary of the Invention
[0003] The present application provides a damage identification method, device and storage medium, which are used to solve the technical problem of the lack of accurate damage identification of switch machines in the prior art.
[0004] In a first aspect, the present application provides a damage identification method, the method comprising: determining a piece to be tested; exciting far-field eddy currents in the piece to be tested based on an excitation coil; receiving an initial detection signal generated after the far-field eddy currents penetrate the piece to be tested based on a detection coil; amplifying the initial detection signal to obtain an amplified signal corresponding to the initial detection signal; filtering the amplified signal to extract the amplified signal of a preset frequency; amplifying the amplified signal of the preset frequency to obtain a target detection signal; and identifying the damage condition of the piece to be tested based on the positional relationship between the target detection signal and a preset signal area.
[0005] In this application, an excitation coil excites far-field eddy currents within the test object; a detection coil receives an initial detection signal generated by the far-field eddy currents penetrating the test object; and preprocesses the initial detection signal to obtain a target detection signal. A two-stage amplification method combined with selective frequency band extraction effectively improves the quality of the target detection signal. The first stage of amplification enhances the signal amplitude and initially suppresses noise, facilitating subsequent processing. The frequency band extraction stage focuses on the target frequency, filtering out redundant information and optimizing computational efficiency. The second stage of amplification further improves the signal-to-noise ratio of the target detection signal, ensuring the clarity of useful information. Far-field eddy current technology can penetrate the test object and detect buried defects at least 3mm deep. This overcomes the limitation of eddy current technology, which is limited to detecting surface and subsurface defects, enabling the detection of deeply buried defects in the test object and improving the accuracy and sensitivity of damage identification. Based on the positional relationship between the target detection signal and the pre-set signal area, the damage condition of the test point can be intuitively identified, avoiding the errors easily encountered in manual identification and significantly improving the accuracy of damage detection.
[0006] In an implementation of the first aspect, the expression corresponding to the spatial electromagnetic field distribution of the excitation coil is: in, H represents the magnetic field strength, J represents the conduction current density, Je represents the transport current density, E represents the electric field strength, B represents the magnetic induction intensity, D Represents the electric flux density.
[0007] In an implementation of the first aspect, the diffusion characteristic of the far-field eddy current around the excitation coil is expressed as: in, μ It represents the magnetic permeability of the test piece, and A represents the vector magnetic potential.
[0008] In an implementation of the first aspect, another expression for the diffusion characteristics of the far-field eddy current around the excitation coil is: in, r、z denote the basis vectors of the cylindrical coordinate system, ω represents the angular frequency, σ represents the conductivity, Represents an imaginary unit.
[0009] In the present application, based on the far-field eddy current penetrating the test piece, rather than just scanning the surface of the test piece, the detection of the interior of the test piece is achieved, thereby improving the accuracy and sensitivity of damage identification of the test piece; by performing a preprocessing operation on the initial detection signal, a target detection signal is obtained, and noise and other signals are filtered out, which is conducive to obtaining a more accurate detection signal of the test piece, and provides a more accurate detection signal basis for subsequent judgment of whether the test piece is damaged based on the target detection signal.
[0010] In an implementation of the first aspect, the damage condition of the point to be detected is identified based on the positional relationship between the detection signal and the preset signal area, including: if the detection signal moves completely within the preset signal area, the piece to be detected corresponding to the detection signal is not damaged; if at least one point in the detection signal is not within the preset signal area, the piece to be detected corresponding to the detection signal is damaged.
[0011] In an implementation of the first aspect, the part to be tested includes at least one of a switch machine, a rail, and a sleeper.
[0012] In a second aspect, an embodiment of the present application provides a computer-readable storage medium having a computer program stored thereon. When the computer program is executed by a processor, the damage identification method described in any one of the first aspects of the embodiments of the present application is implemented.
[0013] In a third aspect, an embodiment of the present application provides an electronic device, comprising: a memory storing a computer program; and a processor communicatively connected to the memory, for executing any one of the damage identification methods described in the first aspect of the embodiment of the present application when the computer program is called.
[0014] As described above, the damage identification method, device and storage medium described in the present application have the following beneficial effects: far-field eddy current technology can penetrate the test piece to detect buried defects with a depth of not less than 3 mm, enabling eddy current technology to overcome the disadvantage of "only limited to measuring surface and sub-surface defects", realize the detection of buried defects of the test piece, and improve the accuracy and sensitivity of damage identification of the test piece.
[0015] Based on the positional relationship between the target detection signal and the preset signal area, the damage condition of the point to be detected can be intuitively identified, avoiding the problem of errors easily generated by manual identification and greatly improving the accuracy of identifying and detecting damage.
[0016] By preprocessing the initial detection signal to obtain the target detection signal, noise and other signals are filtered out, which is conducive to obtaining a more accurate detection signal of the device under test, and provides a more accurate detection signal basis for subsequent judgment of whether the device under test is damaged based on the target detection signal.
[0017] By amplifying the initial detection signal, the amplitude of the initial detection signal is increased, and the relative influence of noise is reduced, providing a clearer basis for the subsequent extraction of the amplified signal of the preset frequency; extracting the amplified signal of the preset frequency can avoid processing a large number of useless signals and reduce the waste of computing resources; the second amplification extracts the amplified signal of the preset frequency, further reducing noise interference and making the useful signal more prominent.
[0018] This method effectively improves the quality of target detection signals by combining two-stage amplification with selective frequency band extraction. The first stage of amplification enhances signal amplitude and initially suppresses noise, facilitating subsequent processing. The frequency band extraction stage focuses on the target frequency, filtering out redundant information and optimizing computational efficiency. The second stage of amplification further enhances the signal-to-noise ratio of the target detection signal, ensuring clear and discernible useful information. BRIEF DESCRIPTION OF THE DRAWINGS
[0019] Figure 1 Shown is a schematic diagram of an application scenario corresponding to the damage identification method described in an embodiment of the present application.
[0020] Figure 2 Shown is a flowchart of the damage identification method described in an embodiment of the present application.
[0021] Figure 3 A schematic diagram showing that the test piece provided in an embodiment of the present application is undamaged.
[0022] Figure 4 A schematic diagram showing a damaged device under test provided in an embodiment of the present application is shown.
[0023] Figure 5 Shown is a schematic diagram of detecting a test piece provided by an embodiment of the present application.
[0024] Figure 6 Shown is a schematic diagram of another method for detecting a test piece provided by an embodiment of the present application.
[0025] Figure 7 Shown is another flowchart for determining a target detection signal provided by an embodiment of the present application.
[0026] Figure 8 A schematic diagram showing an electronic device provided by an embodiment of the present application is shown.
[0027] Component number description DETAILED DESCRIPTION
[0028] The following describes the embodiments of the present application through specific examples. Those skilled in the art can easily understand the other advantages and effects of the present application from the content disclosed in this specification. The present application can also be implemented or applied through other different specific embodiments. The details in this specification can also be modified or changed based on different viewpoints and applications without departing from the spirit of the present application. It should be noted that the following embodiments and features in the embodiments can be combined with each other unless they conflict.
[0029] It should be noted that the illustrations provided in the following embodiments are only schematic illustrations of the basic concept of the present application. Therefore, the illustrations only show components related to the present application and are not drawn according to the number, shape and size of components in actual implementation. In actual implementation, the type, quantity and proportion of each component can be changed at will, and the component layout type may also be more complicated.
[0030] The following embodiments of the present application provide a damage identification method, device, and storage medium, including but not limited to the hardware application scenarios listed in this embodiment. The following description will take the hardware application scenario corresponding to the damage identification method as an example.
[0031] like Figure 1 As shown, this embodiment provides a schematic diagram of a hardware scenario corresponding to a damage identification method. The hardware application scenario corresponding to the damage identification method specifically includes: an electronic device 80, a probe 11, and a device under test 12. The electronic device is communicatively connected to the probe, which is placed on the device under test. The probe sends an initial detection signal of the device under test to the electronic device, which preprocesses the initial detection signal to obtain a preprocessed target detection signal and displays the damage status of the device under test on the display screen of the electronic device.
[0032] The technical solutions in the embodiments of the present application will be described in detail below with reference to the accompanying drawings in the embodiments of the present application.
[0033] like Figure 2 As shown in FIG, this embodiment provides a flowchart of a damage identification method. Figure 2 As shown, the damage identification method provided in the embodiment of the present application includes the following steps S21 to S27.
[0034] S21, determining the piece to be tested.
[0035] In some embodiments, the part to be tested includes at least one of a switch machine, a rail, and a sleeper.
[0036] It should be noted that the types of test pieces listed in the above embodiments are only for illustrative purposes. In actual applications, test pieces made of any other material that can generate a magnetic field can also be tested, and this application will not elaborate on this.
[0037] S22: Exciting far-field eddy currents in the device under test based on the excitation coil.
[0038] For example, power may be supplied to the excitation coil so that the excitation coil excites far-field eddy currents in the device under test under the action of an electrical signal.
[0039] In some embodiments, the expression corresponding to the spatial electromagnetic field distribution of the excitation coil is: in, H represents the magnetic field strength, J represents the conduction current density, Je represents the transport current density, E represents the electric field strength, B represents the magnetic induction intensity, D Represents the electric flux density.
[0040] In some embodiments, the diffusion characteristics of the far-field eddy current around the excitation coil are expressed as follows: in, μ It represents the magnetic permeability of the test piece, and A represents the vector magnetic potential.
[0041] In some embodiments, another expression for the diffusion characteristics of the far-field eddy current around the excitation coil is: in, r、z denote the basis vectors of the cylindrical coordinate system, ω represents the angular frequency, σ represents the conductivity, Represents an imaginary unit.
[0042] Specifically, for the time-harmonic magnetic field, the expression for the diffusion characteristics of the far-field eddy current around the above excitation coil can be simplified to: , in the axisymmetric case, Can be simplified to: .
[0043] S23: Receive, based on the detection coil, an initial detection signal generated after the far-field eddy current penetrates the device under test.
[0044] The detection coil and the excitation coil are located in the same probe, and the detection coil is far away from the excitation coil.
[0045] Specifically, the initial detection signal is a magnetic field signal.
[0046] Specifically, when the detection coil is not close to the device under test, the corresponding no-load impedance expression is: in, represents the resistance component, Indicates inductance.
[0047] S24, performing an amplification operation on the initial detection signal to obtain an amplified signal corresponding to the initial detection signal.
[0048] Exemplarily, the initial detection signal may be amplified based on a pre-adjustable gain amplifier to obtain an amplified signal corresponding to the initial detection signal.
[0049] Exemplarily, the preamplifier with adjustable gain includes a voltage-controlled variable gain amplifier, a digitally controlled variable gain amplifier, a current-sensitive preamplifier, a charge-sensitive preamplifier, and the like.
[0050] It should be noted that the types of pre-adjustable gain amplifiers listed in the above examples are only for illustrative purposes. In actual applications, any other suitable pre-adjustable gain amplifier can be selected according to specific application requirements, and this application does not impose any restrictions on this.
[0051] S25 , performing a screening operation on the amplified signal to extract the amplified signal of a preset frequency.
[0052] The preset frequency refers to the built-in excitation or driving frequency of the device for extracting and amplifying the signal.
[0053] It should be noted that in actual applications, the preset frequency can be determined with any appropriate value according to specific application requirements, and this application does not limit the specific value of the preset frequency.
[0054] Exemplarily, the amplified signal may be screened based on a detection module to extract the amplified signal of a preset frequency.
[0055] S26 , performing an amplification operation on the amplified signal of the preset frequency to obtain a target detection signal.
[0056] Exemplarily, the target detection signal may be obtained by performing an amplification operation on the amplified signal of a preset frequency based on a post-adjustable gain amplifier.
[0057] Exemplarily, the post-adjustable gain amplifier includes HMC8120, DPCA-300, AD8338, F30PV / F70PV, etc.
[0058] It should be noted that the types of post-adjustable gain amplifiers listed in the above examples are only for illustrative purposes. In actual applications, any other suitable pre-adjustable gain amplifier can be selected according to specific application requirements, and this application does not impose any restrictions on this.
[0059] Exemplarily, the method further includes converting the target detection signal into a digital signal.
[0060] Exemplarily, the target detection signal can be converted into a digital signal based on an analog-to-digital converter. After the target detection signal is converted into a digital signal, it is convenient to directly identify the damage condition of the point to be detected based on the positional relationship between the target detection signal and the preset signal area.
[0061] S27 , identifying damage conditions of the device under test based on a positional relationship between the target detection signal and a preset signal area.
[0062] The preset signal area is the maximum area corresponding to the lossless signal on the standard test block.
[0063] The preset signal area may be a circular area with R as the radius.
[0064] It should be noted that the specific value of the above-mentioned radius R can be reasonably determined according to the needs of the specific application scenario, and this application does not impose any restrictions on this.
[0065] It should be noted that the preset signal area can also be an elliptical area, a fan-shaped area, etc. In actual applications, a preset signal area of a suitable shape can be selected according to specific application requirements, and this application does not impose any restrictions on this.
[0066] In some embodiments, the identification of the damage condition of the device under test based on the positional relationship between the target detection signal and the preset signal area includes: if the detection signal moves completely within the preset signal area, the device under test corresponding to the detection signal is not damaged; if at least one point in the detection signal is not within the preset signal area, the device under test corresponding to the detection signal is damaged.
[0067] The embodiment of the present application provides a damage identification method, in which the initial detection signal is amplified to obtain an amplified signal corresponding to the initial detection signal; the amplified signal is filtered to extract the amplified signal of a preset frequency; the amplified signal of the preset frequency is amplified to obtain a target detection signal; the amplitude of the initial detection signal is increased by amplifying the initial detection signal, while the noise signal often has a fixed phase. In the process of removing noise, the phase of the noise signal can be adjusted to 0° or 180°, that is, the noise signal is horizontal on the impedance diagram, that is, the noise signal has only a real part and no imaginary part. This reduces the relative impact of the noise, providing a clearer basis for the subsequent extraction of the amplified signal of the preset frequency; extracting the amplified signal of the preset frequency can avoid processing a large number of useless signals and reduce the waste of computing resources; the second amplification extracts the amplified signal of the preset frequency, further reducing noise interference and making the useful signal more prominent.
[0068] See also Figure 3 , Figure 3 The schematic diagram showing the undamaged piece under test provided by the embodiment of the present application is shown. Figure 3 It can be seen that Figure 3 The black circle in the figure indicates the preset signal area. Figure 3 The signal curve of the target detection signal on the right shows that the target detection signal is relatively stable as a whole, and the target detection signals are all within Figure 3 If the device is within the preset signal area on the left, it means that the device under test is not damaged.
[0069] See also Figure 4 , Figure 4 A schematic diagram showing a damaged piece under test provided in an embodiment of the present application is shown. Figure 4 It can be seen that Figure 4 The black circle in the middle indicates the preset signal area and is indicated by Figure 4 As can be seen from the signal curve of the target detection signal on the right, the target detection signal has an obvious peak. If the target detection signal corresponding to the peak moves outside the preset signal area, it means that the device under test is damaged.
[0070] Specifically, the damage condition of the test piece includes crack damage.
[0071] An embodiment of the present application provides a damage identification method, in which a piece to be tested is determined; a far-field eddy current is excited in the piece to be tested by an excitation coil, and an initial detection signal is generated after the far-field eddy current penetrates the piece to be tested and is received by the detection coil. Based on the far-field eddy current penetrating the piece to be tested, rather than just scanning the surface of the piece to be tested, the interior of the piece to be tested is detected, thereby improving the accuracy and sensitivity of damage identification of the piece to be tested; a target detection signal is obtained by preprocessing the initial detection signal, and noise and other signals are filtered out, which is conducive to obtaining a more accurate detection signal of the piece to be tested, and provides a more accurate detection signal basis for subsequent judgment of whether the piece to be tested is damaged based on the target detection signal; based on the positional relationship between the target detection signal and the preset signal area, the damage condition of the piece to be tested is identified, wherein the far-field eddy current technology can penetrate the piece to be tested and detect a damage of not less than 3mm Deeply buried defects enable eddy current technology to overcome the shortcoming of "only limited to measuring surface and sub-surface defects", realize the detection of deeply buried defects in the test piece, and improve the accuracy and sensitivity of damage identification of the test piece; far-field eddy current technology can detect deeper areas, and a single detection process can cover a larger material volume, rather than just scanning the surface. Under the same detection path, richer internal information can be obtained, thereby improving the "volume coverage" of the detection; based on the positional relationship between the target detection signal and the preset signal area, the damage condition of the test piece is directly identified, which facilitates relevant technical personnel to directly observe whether the test piece is damaged, improves the work efficiency of relevant technical personnel in detecting the test piece, and provides a more powerful detection method for the safety inspection of critical infrastructure such as railways.
[0072] See also Figure 5 , Figure 5 Shown is a schematic diagram of a test piece provided by an embodiment of the present application. Figure 5 It can be seen that, when the test piece is not damaged, the initial detection signal (magnetic field signal) received by the detection coil is in a balanced state.
[0073] See also Figure 6 , Figure 6 Shown is another schematic diagram of detecting a test piece provided by an embodiment of the present application. Figure 6 It can be seen that when the device under test is damaged, the initial detection signal (magnetic field signal) received by the detection coil will vary. Based on the principle of whether the initial detection signal received by the detection coil varies, it is determined whether the device under test is damaged.
[0074] Figure 7 Shown is another flow chart for determining target detection signals provided by an embodiment of the present application. Figure 7 It can be seen that the signal generator is used to drive the current to generate a corresponding sine wave and load it onto the excitation coil; the excitation coil is used to excite far-field eddy currents in the test piece where the detection point is located, and the detection coil is used to receive the initial detection signal generated after the far-field eddy current penetrates the test piece; the front adjustable gain amplifier is used to preliminarily amplify the initial detection signal; the detection unit is used to extract the preliminarily amplified initial detection signal of a preset frequency; the post-adjustable gain amplifier is used to amplify the initial detection signal of the preset frequency again to obtain a target detection signal, the A / D conversion unit is used to convert the target detection signal amplified by the post-adjustable gain amplifier into a digital signal, and the electronic device is used to receive the digital signal of the target detection signal and display the damage condition on its display screen.
[0075] The protection scope of the damage identification method described in the embodiment of the present application is not limited to the execution order of the steps listed in this embodiment. All solutions implemented by adding, reducing, or replacing steps in the existing technology based on the principles of the present application are included in the protection scope of the present application.
[0076] In the several embodiments provided in this application, it should be understood that the disclosed systems, devices or methods can be implemented in other ways. For example, the method embodiments described above are only schematic. For example, the division of modules / units is only a logical function division. There may be other division methods in actual implementation. For example, multiple modules or units can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be an indirect coupling or communication connection through some interfaces, devices or modules or units, which can be electrical, mechanical or other forms.
[0077] The modules / units described as separate components may or may not be physically separate, and the components displayed as modules / units may or may not be physical modules, that is, they may be located in one place or distributed across multiple network elements. Some or all of the modules / units may be selected according to actual needs to achieve the purpose of the embodiments of the present application. For example, the functional modules / units in the various embodiments of the present application may be integrated into a processing module, or each module / unit may exist physically separately, or two or more modules / units may be integrated into a single module / unit.
[0078] Those skilled in the art should further appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of the two. In order to clearly illustrate the interchangeability of hardware and software, the above description has generally described the composition and steps of each example according to function. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of this application.
[0079] An embodiment of the present application also provides an electronic device. Figure 8 The diagram shows the structure of an electronic device 80 in one embodiment of the present application. The image storage method provided in the embodiment of the present application can be applied to Figure 8 The electronic device 80 is shown, but is not limited thereto. Figure 8 As shown, the electronic device 80 includes a processor 81 , a memory, a system bus 83 , and a network interface 85 , wherein the memory may include a non-volatile storage medium 82 and an internal memory 84 .
[0080] The non-volatile storage medium 82 can store an operating system and a computer program. The computer program includes program instructions, which, when executed, can cause the processor to execute any one of the damage identification methods provided in the embodiments of the present application.
[0081] The processor is used to provide computing and control capabilities and support the operation of the entire computer equipment.
[0082] The internal memory 84 provides an environment for the operation of the computer program in the non-volatile storage medium. When the computer program is executed by the processor, the processor can execute any damage identification method provided in the embodiments of the present application.
[0083] The network interface 85 is used for network communication, such as sending assigned tasks, etc. It will be understood by those skilled in the art that Figure 8The structure shown in the figure is only a block diagram of a part of the structure related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than shown in the figure, or combine certain components, or have a different component arrangement.
[0084] It should be understood that the processor 81 may be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose processor may be a microprocessor or any conventional processor.
[0085] The electronic device 80 in the embodiment of the present application may include terminal devices such as tablet computers, laptop computers, mobile phones, supercomputers, smart wearable devices, etc., and can also be applied to databases, servers, and service response systems based on terminal artificial intelligence. The embodiment of the present application does not impose any restrictions on the specific type of electronic device.
[0086] For example, the electronic device can be a station (STAION, ST) in a WLAN, a cellular phone, a cordless phone, a Session Initiation Protocol (SIP) phone, a Wireless Local Loop (WLL) station, a handheld device with wireless communication capabilities, a computing device or other processing device connected to a wireless modem, a computer, a laptop computer, a handheld communication device, a handheld computing device, and / or other devices for communicating on a wireless system and a next-generation communication system, such as a mobile terminal in a 5G network, a mobile terminal in a future-evolved Public Land Mobile Network (PLMN), or a mobile terminal in a future-evolved Non-terrestrial Network (NTN).
[0087] The present application also provides a computer-readable storage medium. Those skilled in the art will appreciate that all or part of the steps in the methods of the above embodiments can be performed by instructing a processor through a program. The program can be stored in a computer-readable storage medium, which is a non-transitory medium, such as random access memory, read-only memory, flash memory, a hard disk, a solid-state drive, magnetic tape, a floppy disk, an optical disc, or any combination thereof. The storage medium can be any available medium accessible by a computer, or a data storage device such as a server or data center that integrates one or more available media. The available medium can be a magnetic medium (e.g., a floppy disk, a hard disk, a magnetic tape), an optical medium (e.g., a digital video disc (DVD)), or a semiconductor medium (e.g., a solid-state drive (SSD)).
[0088] The embodiments of the present application may also provide a computer program product, which includes one or more computer instructions. When the computer instructions are loaded and executed on a computing device, the process or function described in the embodiments of the present application is generated in whole or in part. The computer instructions can be stored in a computer-readable storage medium or transmitted from one computer-readable storage medium to another computer-readable storage medium. For example, the computer instructions can be transmitted from one website, computer, or data center to another website, computer, or data center via wired (e.g., coaxial cable, optical fiber, digital subscriber line (DSL)) or wireless (e.g., infrared, wireless, microwave, etc.) means.
[0089] When the computer program product is executed by a computer, the computer executes the method described in the above method embodiment. The computer program product can be a software installation package. When the above method is needed, the computer program product can be downloaded and executed on the computer.
[0090] The descriptions of the processes or structures corresponding to the above figures have different emphases. For parts that are not described in detail in a certain process or structure, please refer to the relevant descriptions of other processes or structures.
[0091] The above embodiments are merely illustrative of the principles and effects of this application and are not intended to limit this application. Anyone skilled in the art may modify or alter the above embodiments without departing from the spirit and scope of this application. Therefore, all equivalent modifications or alterations made by one of ordinary skill in the art without departing from the spirit and technical concepts disclosed in this application shall be covered by the claims of this application.
Claims
1. A damage identification method, characterized in that: Applied to rail transit components, the method includes: determining a component to be tested; Exciting far-field eddy currents in the test piece based on an excitation coil; receiving, based on a detection coil, an initial detection signal generated after the far-field eddy current penetrates the device under test; performing an amplification operation on the initial detection signal to obtain an amplified signal corresponding to the initial detection signal; performing a screening operation on the amplified signal to extract the amplified signal of a preset frequency; performing an amplification operation on the amplified signal of the preset frequency to obtain a target detection signal; Based on the positional relationship between the target detection signal and the preset signal area, the damage condition of the device under test is identified.
2. The damage identification method according to claim 1, characterized in that: The expression corresponding to the spatial electromagnetic field distribution of the excitation coil is: in, H represents the magnetic field strength, J represents the conduction current density, Je represents the transport current density, E represents the electric field strength, B represents the magnetic induction intensity, D Represents the electric flux density.
3. The damage identification method according to claim 1, characterized in that: The diffusion characteristics of the far-field eddy current around the excitation coil are expressed as follows: in, μ It represents the magnetic permeability of the test piece, and A represents the vector magnetic potential.
4. The damage identification method according to claim 1, characterized in that: Another expression for the diffusion characteristics of the far-field eddy current around the excitation coil is: in, r、z denote the basis vectors of the cylindrical coordinate system, ω represents the angular frequency, σ represents the conductivity, Represents an imaginary unit.
5. The damage identification method according to claim 1, characterized in that: The identifying the damage condition of the device under test based on the positional relationship between the detection signal and the preset signal area includes: If the detection signal moves completely within the preset signal area, the device under test corresponding to the detection signal is not damaged; If at least one point of the detection signal is not within the preset signal area, the device under test corresponding to the detection signal is damaged.
6. The damage identification method according to claim 1, characterized in that: The part to be tested includes at least one of a switch machine, a rail, and a sleeper.
7. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the damage identification method according to any one of claims 1 to 6 is implemented.
8. An electronic device, characterized in that: The electronic device comprises: a memory storing a computer program; A processor is communicatively connected to the memory and executes the damage identification method according to any one of claims 1 to 6 when calling the computer program.
Citation Information
Patent Citations
Apparatus and method for detecting internal and external crack defects of metal material
CN102841130A
Eddy current reflection and transmittance based nondestructive testing method
CN106442711A
High-speed rail braking and track eddy current detection device and use method thereof
CN115958963A
Method and device for detecting defects of heat exchanger tube bundle
CN117517450A
Method for detecting welding edge of thick-wall workpiece welding seam under high-temperature environment based on low-frequency far-field eddy current
CN119413885A