Abnormal detection circuit and abnormal detection method of DCDC chip

Abstract

The invention discloses an anomaly detection circuit and an anomaly detection method for a DCDC chip. The anomaly detection circuit comprises a sampling module, a load module, a comparison module and a judgment module, the sampling module responds to the load module and is connected with the output end of the DCDC chip, acquires an inductive current flowing through an inductor of the DCDC chip, converts the inductive current into a corresponding first voltage and outputs the first voltage to the comparison module; the comparison module is also connected with the judgment module, and the comparison module outputs a second voltage to the judgment module in response to a magnitude relationship between the first voltage and a first preset reference voltage; and the judgment module extracts a direct current voltage corresponding to the second voltage, and determines whether the output of the DCDC chip is abnormal in response to the magnitude relationship between the direct current voltage and a second preset reference voltage. Therefore, whether the output of the DCDC chip is abnormal or not can be determined without storing a large amount of data.

Description

Technical Field

[0001] The present invention relates to the technical field of power supply, and in particular to an abnormality detection circuit and method for a DCDC chip. Background Art

[0002] When a DCDC chip experiences loop instability or circuit malfunctions related to current limiting, it can cause an abnormal output state. When the DCDC chip is in this state, the actual ripple characteristics of the inductor current in the DCDC chip may manifest as increased output ripple, thus failing to meet application requirements. Conventional DCDC chip testing typically uses an oscilloscope or ADC (analog-to-digital converter) to directly sample and observe the actual inductor current characteristics. However, this method requires storing a large amount of data, making it difficult to implement in mass production.

[0003] Therefore, how to realize abnormal detection of DCDC chip output without storing a large amount of data has become a technical problem that needs to be solved urgently in this field. Summary of the Invention

[0004] The embodiments of the present invention provide an abnormality detection circuit and an abnormality detection method for a DCDC chip, which are used to detect abnormalities in the output of the DCDC chip without storing a large amount of data.

[0005] In a first aspect, an embodiment of the present invention provides an abnormality detection circuit for a DCDC chip, comprising: a sampling module, a load module, a comparison module, and a judgment module;

[0006] The DCDC chip includes an inductor, and the load module is used to be connected to the output end of the DCDC chip;

[0007] The sampling module is connected to the inductor, the output terminal of the DCDC chip, and the comparison module respectively. The sampling module is used to: in response to the connection between the load module and the output terminal of the DCDC chip, collect the inductor current flowing through the inductor, and convert the inductor current into a corresponding first voltage and output it to the comparison module;

[0008] The comparison module is further connected to the decision module, and the comparison module is configured to: output a second voltage to the decision module in response to a magnitude relationship between the first voltage and a first preset reference voltage;

[0009] The judgment module is used to extract a DC voltage corresponding to the second voltage, and determine whether an output of the DCDC chip is abnormal in response to a magnitude relationship between the DC voltage and a second preset reference voltage.

[0010] In a second aspect, an embodiment of the present invention provides a method for detecting anomalies in a DCDC chip using the anomaly detection circuit described in the first aspect, including:

[0011] The sampling module collects the inductor current flowing through the inductor of the DCDC chip in response to the load module being connected to the output terminal of the DCDC chip, converts the inductor current into a corresponding first voltage, and outputs the converted voltage to the comparison module;

[0012] The comparison module outputs a second voltage to the decision module in response to a magnitude relationship between the first voltage and a first preset reference voltage;

[0013] The determination module extracts a DC voltage corresponding to the second voltage, and determines whether an output of the DCDC chip is abnormal in response to a magnitude relationship between the DC voltage and a second preset reference voltage.

[0014] The beneficial effects of the present invention are as follows:

[0015] An embodiment of the present invention provides a DCDC chip anomaly detection circuit and an anomaly detection method, comprising: a sampling module, a load module, a comparison module, and a decision module. The DCDC chip includes an inductor, and the load module is connected to the output terminal of the DCDC chip. The sampling module is respectively connected to the inductor, the output terminal of the DCDC chip, and the comparison module. The sampling module is configured to: in response to the connection between the load module and the output terminal of the DCDC chip, collect the inductor current flowing through the inductor, convert the inductor current into a corresponding first voltage, and output the converted voltage to the comparison module. The comparison module is also connected to the decision module. The comparison module is configured to: in response to the magnitude relationship between the first voltage and a first preset reference voltage, output a second voltage to the decision module. The decision module is configured to: extract a DC voltage corresponding to the second voltage, and determine whether the output of the DCDC chip is abnormal based on the magnitude relationship between the DC voltage and the second preset reference voltage. In this way, through the interaction of the modules, only the DC voltage and the second preset reference voltage data need to be stored to determine whether the output of the DCDC chip is abnormal. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 A schematic diagram of an abnormality detection circuit provided in an embodiment of the present invention;

[0017] Figure 2 A schematic diagram of another abnormality detection circuit provided in an embodiment of the present invention;

[0018] Figure 3 This is a flow chart of an anomaly detection method provided in an embodiment of the present invention;

[0019] Figure 4 A flowchart of a self-test process provided in an embodiment of the present invention;

[0020] Figure 5 The following is a flowchart of an anomaly detection process provided in an embodiment of the present invention. DETAILED DESCRIPTION

[0021] The following, in conjunction with the accompanying drawings, describes in detail the specific implementation of a DCDC chip anomaly detection circuit and anomaly detection method provided by an embodiment of the present invention. It should be noted that the described embodiments are only some of the embodiments of the present invention, and not all of them. All other embodiments derived by persons of ordinary skill in the art based on the embodiments of the present invention without inventive effort are within the scope of protection of the present invention.

[0022] The embodiment of the present invention provides an abnormality detection circuit of a DCDC chip, such as Figure 1 As shown, it includes: a sampling module 100, a load module 200, a comparison module 300, and a judgment module 400;

[0023] The DCDC chip X10 includes an inductor L, and the load module 200 is used to be connected to the output terminal A of the DCDC chip X10; wherein, the load module 200 is also connected to the ground terminal GND;

[0024] The sampling module 100 is connected to the inductor L, the output terminal A of the DCDC chip X10, and the comparison module 300, respectively. The sampling module 200 is configured to: in response to the connection between the load module 200 and the output terminal A of the DCDC chip X10, collect the inductor current flowing through the inductor L, convert the inductor current into a corresponding first voltage, and output the converted voltage to the comparison module 300;

[0025] The comparison module 300 is further connected to the decision module 400. The comparison module 300 is configured to: output a second voltage to the decision module 400 in response to a magnitude relationship between the first voltage and the first preset reference voltage U1;

[0026] The decision module 400 is configured to extract a DC voltage corresponding to the second voltage, and determine whether an output of the DCDC chip X10 is abnormal based on a magnitude relationship between the DC voltage and a second preset reference voltage U2.

[0027] In this way, through the cooperation of each module, it is only necessary to store the data of the DC voltage and the second preset reference voltage to determine whether the output of the DCDC chip is abnormal, which can be used for abnormality detection in mass-produced DCDC chips.

[0028] It should be understood that Figure 1As shown, the DCDC chip X10 includes an inductor L, a capacitor C, and a conversion structure. The inductor L is connected between the output terminal A of the DCDC chip X10 and the conversion structure, and the capacitor C is connected between the output terminal A of the DCDC chip X10 and the ground terminal GND. The conversion structure can be, but is not limited to, a step-down conversion structure, a step-up conversion structure, or a step-up / step-down conversion structure. The specific configuration can be based on actual needs and is not limited here.

[0029] The following describes each module of the abnormality detection circuit.

[0030] 1. Sampling Module

[0031] Alternatively, as Figure 2 As shown, the sampling module 100 includes a sampling resistor R1 and a proportional amplifier;

[0032] A first end of the sampling resistor R1 is connected to the inductor L and the first input end of the proportional amplifier, respectively. A second end of the sampling resistor R1 is connected to the output end A of the DCDC chip X10 and the second input end of the proportional amplifier, respectively. The output end of the proportional amplifier is connected to the comparison module 300. The proportional amplifier is configured to amplify the voltage across the sampling resistor R1 to form a first voltage, and output the first voltage to the comparison module.

[0033] The sampling resistor R1 can convert the change of the current flowing through the inductor L into the change of the voltage across the sampling resistor R1 .

[0034] In this way, the voltage across the sampling resistor can reflect the current flowing through the inductor, and the ripple characteristics of the voltage across the sampling resistor can be used to determine whether the output of the DCDC chip is abnormal. The proportional amplifier can amplify the voltage across the sampling resistor by a certain ratio and output a first voltage. This makes the first voltage more obvious than the ripple characteristics of the voltage across the sampling resistor, facilitating processing by the comparison module and making the detection results of the abnormality detection circuit more accurate and reliable. When amplifying by a certain ratio, the specific amplification ratio can be, but is not limited to, 1 / 2, 1, 2, 3, 4, or other ratios. The specific design can be based on actual needs and is not specifically limited here.

[0035] It should be understood that the sampling module may also be provided with only a sampling resistor without a proportional amplifier. In this case, the voltage across the sampling resistor will be directly output to the comparison module, simplifying the circuit structure and reducing detection costs. Alternatively, the sampling module may also use a device such as a constantan wire plus an operational amplifier or a Hall effect sensor to collect the inductor current. Furthermore, the specific implementation of the sampling module can be designed according to actual needs and is not limited here. In addition, the specific structure of the proportional amplifier can be any structure familiar to those skilled in the art and is not specifically limited here.

[0036] 2. Load Module

[0037] Alternatively, as Figure 2 As shown, the load module 200 includes a load resistor R2 and a first switch K1 , and the load resistor R2 and the first switch K1 are connected in series between the ground terminal GND and the output terminal A of the DCDC chip X10 .

[0038] After the first switch is closed, the load resistor is connected to the output terminal of the DCDC chip, connecting the DCDC chip to the load resistor and providing power to the load resistor. This process is called pulling the load. At the moment the first switch is closed, the DCDC chip is in a transient state with the load resistor connected. This is called a transient load.

[0039] In this way, the first switch can cause the DCDC chip to exhibit load-pulling and transient load states. Because the inductor current of the DCDC chip is prone to abnormalities during these conditions, the load module can increase the frequency of these abnormalities. If the DCDC chip is unloaded or has not experienced any load transients, it's likely that the output of the abnormal DCDC chip will not exhibit abnormalities, or the frequency of abnormal inductor current will not be high enough. In this case, detecting the inductor current may result in misjudgments. However, if the DCDC chip is in load-pulling or transient load states, abnormalities in the DCDC chip's output are more likely to be reflected in the inductor current. In this case, detecting the inductor current can reduce misjudgments and improve detection accuracy.

[0040] 3. Comparison Module

[0041] Alternatively, as Figure 2 As shown, the comparison module 300 includes a comparator. The comparator can compare the first voltage with a first preset reference voltage U1. When the first voltage is greater than the first preset reference voltage U1, the output second voltage may be a high-level signal. When the first voltage is less than the first preset reference voltage U1, the output second voltage may be a low-level signal.

[0042] Among them, the built-in power supply of the comparator can be used as the comparison power supply, the first preset reference voltage can be generated by the comparison power supply through resistor voltage division, or it can be directly generated by an external DC regulated power supply; the specific value of the first preset reference voltage can be set according to actual needs, as long as it can realize abnormal detection of the output of the DCDC chip, and is not limited here.

[0043] In this way, the comparison module can convert the first voltage in the form of a ripple into the second voltage in the form of a square wave, so as to facilitate subsequent processing of the second voltage and implement abnormality detection of the output of the DCDC chip.

[0044] 4. Judgment Module

[0045] Alternatively, as Figure 2 As shown, the decision module 400 includes a filtering unit and a detection unit, and the filtering unit is connected between the comparison module and the detection unit;

[0046] The filtering unit is used to: extract a DC voltage corresponding to the second voltage;

[0047] The detection unit is used to determine whether an output of the DCDC chip X10 is abnormal in response to a magnitude relationship between the DC voltage and the second preset reference voltage U2.

[0048] The filtering unit may be a low-pass filter. The type of low-pass filter may be, but is not limited to, a passive low-pass filter or an active low-pass filter. The order of the low-pass filter may be selected based on actual needs and is not limited here. The detection unit may be, but is not limited to, an ADC sampling circuit or a comparator. The second preset reference voltage may be obtained by debugging the operating status of the DCDC chip. It should be understood that when the first voltage is greater than the first preset reference voltage and a high-level signal is output, if the DC voltage is greater than the second preset reference voltage, the output of the DCDC chip is abnormal.

[0049] In this way, by setting up a filtering unit, the AC part in the second voltage can be filtered out to extract the DC voltage, which makes it easier for the detection unit to make a judgment based on the DC voltage and the second preset reference voltage, thereby realizing abnormality detection of the output of the DCDC chip and achieving the purpose of abnormality detection.

[0050] 5. Other modules

[0051] Alternatively, as Figure 2 As shown, the abnormality detection circuit also includes a front-stage voltage following module 500, which is connected between the comparison module 300 and the decision module 400. The front-stage voltage following module 500 is used to: perform voltage following processing on the second voltage and then output it to the decision module 400.

[0052] Among them, the front-stage voltage follower module can process the second voltage output by the comparison module. The voltage after processing is the same as the voltage before processing, and the current after processing is increased, that is, the power output to the judgment module is increased, so that the judgment module can work smoothly, and the voltage signal received by the judgment module will not be distorted; in addition, when the judgment module includes a low-pass filter, the larger current can enable the low-pass filter to obtain sufficient current in a shorter time, thereby shortening the time of abnormality detection and improving the efficiency of abnormality detection.

[0053] Alternatively, as Figure 2As shown, the front-stage voltage follower module 500 includes a voltage follower. Of course, the front-stage voltage follower module 500 only needs to ensure that the electrical signal output by the comparison module 300 can drive the post-stage decision module 400 to operate normally and the voltage signal is not distorted. The specific structure of the front-stage voltage follower module 500 is not limited here.

[0054] Alternatively, as Figure 2 As shown, the abnormality detection circuit further includes a switch module 600, which is connected to the sampling module 100, the comparison module 300 and the voltage providing module 700 respectively. The switch module 600 is used to:

[0055] In response to an abnormality detection, controlling the sampling module 100 to be connected to the comparison module 300 so that the first voltage provided by the sampling module 100 is output to the comparison module 300;

[0056] In response to the self-test, the voltage providing module 700 is controlled to be connected to the comparison module 300 , so that the third voltage provided by the voltage providing module 700 is output to the comparison module 300 .

[0057] The switch module 600 may include, but is not limited to, a first single-pole double-throw switch, wherein the m1 terminal of the first single-pole double-throw switch is connected to the sampling module 100, the n1 terminal of the first single-pole double-throw switch is connected to the voltage providing module 700, and the s1 terminal of the first single-pole double-throw switch is connected to the comparison module 300; the switch module 600 may be manually controlled by an operator according to needs; of course, the switch module 600 may also be controlled by a controller. For example, a program may be set in the controller so that each time an abnormality detection is performed at power-on, the s1 terminal of the first single-pole double-throw switch is first connected to the n1 terminal, so that the comparison module 300 is connected to the power supply module 700. The voltage providing module 700 is connected to the comparison module 300, and the comparison module 300 is disconnected from the sampling module 100, so that the voltage providing module 700 outputs the third voltage to the comparison module 300 to facilitate self-testing. After the self-test is normal, the s1 terminal and the m1 terminal of the first single-pole double-throw switch are automatically connected, so that the comparison module 300 is connected to the sampling module 100, and the comparison module 300 is disconnected from the voltage providing module 700, so that the sampling module 100 can output the first voltage to the comparison module 300 to facilitate abnormality detection. The control method of the switch module 600 can be set according to actual needs and is not limited here.

[0058] In this way, by setting up a switch module and a voltage supply module, the abnormality detection circuit can perform self-inspection, thereby performing abnormality detection when the self-inspection is normal, and reminding the operator when the self-inspection is abnormal, so as to eliminate the abnormality of the abnormality detection circuit and improve the reliability and accuracy of abnormality detection.

[0059] Alternatively, as Figure 2As shown, when the comparison module 300 includes the comparison power supply 31, the voltage providing module 700 is also connected to the comparison power supply 31; the voltage providing module 700 is specifically used to: output a third voltage after performing voltage division processing on the power supply voltage provided by the comparison power supply 31. Figure 2 As shown in the filled part with slash lines, it can be a part of a comparator.

[0060] Alternatively, as Figure 2 As shown, the voltage providing module 700 may include a voltage dividing resistor R3 and a voltage dividing resistor R4, so that the power supply voltage of the comparison power supply 31 can be output as a third voltage after being divided by the voltage dividing resistors R3 and R4. Of course, the voltage providing module 700 can also be configured in a manner well known to those skilled in the art and is not limited here.

[0061] In this way, the voltage supply module does not need to be connected to an additional power supply, which simplifies the structure of the abnormality detection circuit and reduces costs.

[0062] Furthermore, when the abnormality detection circuit further includes a switch module, the comparison module is further configured to: output a fourth voltage to the decision module in response to a magnitude relationship between the third voltage and the ground signal;

[0063] The decision module is further configured to: in response to receiving the fourth voltage, determine that the self-test of the abnormality detection circuit is normal.

[0064] Among them, during self-test, the comparison module compares the size of the third voltage and the ground signal. When the third voltage is always higher than the ground signal, the comparison module will output a high-level signal, that is, the fourth voltage is a high-level signal. When the judgment module receives the high-level signal, it can determine that the self-test of the abnormality detection circuit is normal, otherwise the self-test of the abnormality detection circuit is abnormal. The self-test process is simple and fast, which improves the efficiency of abnormality detection.

[0065] In addition, the judgment module can determine that the abnormality detection circuit self-test is normal upon receiving a high-level signal. Alternatively, the judgment module can receive a signal at intervals of time t and determine that the abnormality detection circuit self-test is normal upon receiving a preset number of high-level signals. This can avoid misjudgments caused by interference and improve the accuracy of the self-test. The time t and the preset number can be set according to actual needs and are not limited here.

[0066] Continue to refer to Figure 2As shown, the comparison module 300 may further include: a second single-pole double-throw switch, wherein the S2 terminal of the second single-pole double-throw switch is connected to the comparator, the M2 terminal of the second single-pole double-throw switch is connected to the input terminal of the first preset reference voltage, and the N2 terminal of the second single-pole double-throw switch is connected to the ground terminal GND. During a self-test, the S2 terminal of the second single-pole double-throw switch is connected to the N2 terminal, so that the comparator is connected to the ground terminal GND and the comparator is disconnected from the input terminal of the first preset reference voltage, thereby inputting a ground signal to the comparison module 300. During an abnormality detection, the S2 terminal of the second single-pole double-throw switch is connected to the M2 terminal, so that the comparator is connected to the input terminal of the first preset reference voltage and the comparator is disconnected from the ground terminal GND, thereby inputting the first preset reference voltage to the comparison module 300. Of course, the second single-pole double-throw switch can also be manually controlled by an operator or controlled by a controller, and the specific control method is not limited here.

[0067] It should be understood that Figure 2 As shown, when performing self-test, the S1 end of the first single-pole double-throw switch can also be connected to the M1 end. At this time, after the DCDC chip X10 is powered on, the proportional amplifier can send an electrical signal to the comparator. Since the electrical signal is usually always greater than the ground signal, the comparator will also output a high-level signal (i.e., the fourth voltage) after comparing the electrical signal with the ground signal, thereby determining whether the abnormality detection circuit self-tests normally.

[0068] Based on the same inventive concept, an embodiment of the present invention further provides a method for detecting abnormalities in a DCDC chip using the abnormality detection circuit described above. The implementation principle of this method is similar to that of the aforementioned abnormality detection circuit. The specific implementation of this method can be found in the embodiment of the aforementioned abnormality detection circuit, and the repeated parts will not be repeated here.

[0069] Specifically, an embodiment of the present invention provides a method for detecting anomalies, such as Figure 3 Shown, including:

[0070] S301: In response to the load module being connected to the output terminal of the DCDC chip, the sampling module collects the inductor current flowing through the inductor of the DCDC chip, converts the inductor current into a corresponding first voltage, and outputs the converted voltage to the comparison module.

[0071] S302, the comparison module outputs a second voltage to the determination module in response to a magnitude relationship between the first voltage and the first preset reference voltage;

[0072] S303: The judgment module extracts the DC voltage corresponding to the second voltage, and determines whether the output of the DCDC chip is abnormal in response to the magnitude relationship between the DC voltage and the second preset reference voltage.

[0073] Thus, through the above steps S301 to S303 , it is only necessary to store the data of the DC voltage and the second preset reference voltage to determine whether the output of the DCDC chip is abnormal, which can be used for abnormality detection in mass-produced DCDC chips.

[0074] Optionally, when the anomaly detection circuit further includes a front-stage voltage following module, after executing step S302 and before executing step S303, the method may further include: the front-stage voltage following module performing voltage following processing on the second voltage and outputting the result to the decision module. In this manner, the front-stage voltage following module enables the decision module to operate smoothly, shortens anomaly detection time, and improves anomaly detection efficiency.

[0075] Optionally, when the abnormality detection circuit further includes a switch module, before executing step S301, the method may further include: the switch module, in response to self-test, controlling the connection between the voltage supply module and the comparison module so that the third voltage provided by the voltage supply module is output to the comparison module; and the switch module, in response to abnormality detection, controlling the connection between the sampling module and the comparison module so that the first voltage provided by the sampling module is output to the comparison module. In this way, the abnormality detection circuit can perform self-test, thereby improving the reliability and accuracy of abnormality detection.

[0076] Optionally, before executing step S301, the method may further include: the comparison module outputting a fourth voltage to the determination module in response to the magnitude relationship between the third voltage and the ground signal; and the determination module further determining, in response to receiving the fourth voltage, that the anomaly detection circuit self-test is normal. Thus, by determining whether the fourth voltage is received and performing a self-test, the self-test process is simplified and rapid, thereby improving the efficiency of anomaly detection.

[0077] Optionally, when the comparison module includes a comparison power supply, before executing step S301, the method may further include: the voltage providing module performing voltage division processing on the power supply voltage provided by the comparison power supply and outputting the third voltage. In this manner, the voltage providing module does not need to be connected to an additional power supply, thereby reducing the production cost of the abnormality detection circuit.

[0078] The following describes the anomaly detection process provided by the embodiments of the present invention in conjunction with specific embodiments.

[0079] Example 1: Combination Figure 2 The abnormality detection circuit shown is Figure 4 As shown in the figure, the self-test process includes:

[0080] S11. Connect the S1 terminal and the N1 terminal of the first single-pole double-throw switch so that the voltage-dividing resistors R3 and R4 divide the power supply voltage of the comparison power supply 31 and output a third voltage to the comparator; connect the S2 terminal and the N2 terminal of the second single-pole double-throw switch so that the ground signal provided by the ground terminal GND is transmitted to the comparator;

[0081] S12, the comparator determines whether the third voltage is greater than the ground signal; if so, execute step 13; if not, execute step S14;

[0082] S13, the comparator outputs a high level signal; go to step S15;

[0083] S14, the comparator outputs a low level signal; go to step S15;

[0084] S15, the voltage follower and the filter unit process the received signal in sequence and output it to the detection unit;

[0085] S16, the detection unit determines whether the received signal is a high-level signal; if so, execute step S17; if not, execute step S18;

[0086] S17, confirm that the self-test is normal;

[0087] S18: Determine that the self-test is abnormal and issue a warning to remind the operator to troubleshoot the abnormality detection circuit, and execute steps S11 to S18 again after troubleshooting.

[0088] Example 2: Combination Figure 2 The abnormality detection circuit shown is Figure 5 As shown in Figure 2, the anomaly detection process includes:

[0089] S21, connecting the S1 terminal of the first single-pole double-throw switch to the M1 terminal, so that the proportional amplifier is connected to the comparator; connecting the S2 terminal of the second single-pole double-throw switch to the M2 terminal, so that the first preset reference voltage U1 can be input to the comparator;

[0090] S22, closing the first switch K1, so that the DCDC chip is in a load-pulling state;

[0091] S23, the proportional amplifier amplifies the voltage across the sampling resistor R1 by a certain ratio to obtain a first voltage and outputs it to the comparator;

[0092] S24, the comparator determines whether the first voltage is greater than the first preset reference voltage U1; if so, execute step S25; if not, execute step S26;

[0093] S25: The second voltage output by the comparator is a high-level signal; go to step S27;

[0094] S26: The second voltage output by the comparator is a low-level signal; go to step S27;

[0095] S27, the voltage follower performs voltage following processing on the received second voltage and outputs the voltage to the filtering unit;

[0096] S28, the filtering unit filters the AC voltage in the second voltage, retains the DC voltage, and outputs it to the detection unit;

[0097] S29, the detection unit determines whether the DC voltage is greater than the second preset reference voltage U2; if so, execute step S210; if not, execute step S211;

[0098] S210, determining that the output of the DCDC chip X10 is abnormal;

[0099] S211. Determine whether the output of the DCDC chip X10 is normal.

[0100] Obviously, those skilled in the art may make various changes and modifications to the present invention without departing from the spirit and scope of the present invention. Thus, if such changes and modifications fall within the scope of the claims and their equivalents, the present invention is intended to include such changes and modifications.

Claims

1. An abnormality detection circuit for a DCDC chip, characterized in that: include: Sampling module, load module, comparison module, and judgment module; The DCDC chip includes an inductor, and the load module is used to be connected to the output end of the DCDC chip; The sampling module is connected to the inductor, the output terminal of the DCDC chip, and the comparison module respectively. The sampling module is used to: in response to the connection between the load module and the output terminal of the DCDC chip, collect the inductor current flowing through the inductor, and convert the inductor current into a corresponding first voltage and output it to the comparison module; The comparison module is further connected to the decision module, and the comparison module is configured to: output a second voltage to the decision module in response to a magnitude relationship between the first voltage and a first preset reference voltage; The judgment module is used to extract a DC voltage corresponding to the second voltage, and determine whether an output of the DCDC chip is abnormal in response to a magnitude relationship between the DC voltage and a second preset reference voltage.

2. The abnormality detection circuit according to claim 1, wherein: The abnormality detection circuit further includes a front-stage voltage following module, which is connected between the comparison module and the decision module. The front-stage voltage following module is used to perform voltage following processing on the second voltage and then output it to the decision module.

3. The abnormality detection circuit according to claim 2, wherein: The front-stage voltage follower module includes a voltage follower.

4. The abnormality detection circuit according to claim 1, wherein: The sampling module includes a sampling resistor and a proportional amplifier; The first end of the sampling resistor is connected to the inductor and the first input end of the proportional amplifier respectively, the second end of the sampling resistor is connected to the output end of the DCDC chip and the second input end of the proportional amplifier respectively, the output end of the proportional amplifier is connected to the comparison module, and the proportional amplifier is configured to amplify the voltage across the sampling resistor to form the first voltage, and output the first voltage to the comparison module.

5. The abnormality detection circuit according to claim 1, wherein: The decision module includes a filtering unit and a detection unit, wherein the filtering unit is connected between the comparison module and the detection unit; The filtering unit is used to: extract a DC voltage corresponding to the second voltage; The detection unit is configured to determine whether an output of the DCDC chip is abnormal in response to a magnitude relationship between the DC voltage and the second preset reference voltage.

6. The abnormality detection circuit according to claim 1, wherein: The load module includes a load resistor and a first switch, and the load resistor and the first switch are connected in series between a ground terminal and an output terminal of the DCDC chip.

7. The abnormality detection circuit according to any one of claims 1 to 6, characterized in that: The abnormality detection circuit further includes a switch module, which is connected to the sampling module, the comparison module and the voltage providing module respectively, and is used to: In response to an abnormality detection, controlling the sampling module to connect with the comparison module so that the first voltage provided by the sampling module is output to the comparison module; In response to the self-test, the voltage providing module is controlled to be connected to the comparison module, so that the third voltage provided by the voltage providing module is output to the comparison module.

8. The abnormality detection circuit according to claim 7, wherein: The comparison module is further configured to: output a fourth voltage to the decision module in response to a magnitude relationship between the third voltage and the ground signal; The decision module is further configured to: in response to receiving the fourth voltage, determine that the self-test of the abnormality detection circuit is normal.

9. The abnormality detection circuit according to claim 7, wherein: The comparison module includes a comparison power supply, and the voltage providing module is also connected to the comparison power supply; The voltage providing module is specifically configured to perform voltage division processing on the power supply voltage provided by the comparison power supply and then output the third voltage.

10. A method for detecting abnormalities in a DCDC chip using the abnormality detection circuit according to any one of claims 1 to 9, characterized in that: include: The sampling module collects the inductor current flowing through the inductor of the DCDC chip in response to the load module being connected to the output terminal of the DCDC chip, converts the inductor current into a corresponding first voltage, and outputs the converted voltage to the comparison module; The comparison module outputs a second voltage to the decision module in response to a magnitude relationship between the first voltage and a first preset reference voltage; The determination module extracts a DC voltage corresponding to the second voltage, and determines whether an output of the DCDC chip is abnormal in response to a magnitude relationship between the DC voltage and a second preset reference voltage.

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