Calibration method, device to be calibrated, calibration apparatus, calibration system, and storage medium

Abstract

The application provides a calibration method, a to-be-calibrated device, a calibration device, a calibration system and a storage medium, and is applied to the technical field of electronic measurement. The calibration method comprises obtaining a first target to-be-calibrated parameter set. In a first calibration process of to-be-calibrated parameters in the first target to-be-calibrated parameter set, based on a detected abnormal event, a first calibrated parameter set and a first to-be-calibrated parameter set are obtained; wherein the first calibrated parameter set comprises a parameter set after calibration of to-be-calibrated parameters in the first target to-be-calibrated parameter set which are not affected by the abnormal event, and the first to-be-calibrated parameter set comprises a parameter set in the first target to-be-calibrated parameter set which is affected by the abnormal event. The application can improve the calibration efficiency of the measuring instrument in the calibration process.

Description

Technical Field

[0001] This application relates to the field of electronic measurement technology, and in particular to a calibration method, a device to be calibrated, a calibration apparatus, a calibration system, and a storage medium. Background Technology

[0002] During use, changes in external conditions such as the measurement environment or internal factors such as aging of instrument components may introduce uncertainties in measurement results. Therefore, measuring instruments need to be calibrated regularly or according to the requirements of the usage scenario to reduce measurement errors and improve measurement accuracy.

[0003] However, current related technologies suffer from low calibration efficiency during the calibration process of measuring instruments. Summary of the Invention

[0004] This application discloses a calibration method, a device to be calibrated, a calibration apparatus, a calibration system, and a storage medium, which are used to solve the problem of low calibration efficiency in the calibration process of measuring instruments.

[0005] Firstly, this application provides a calibration method, comprising: obtaining a first target set of parameters to be calibrated. During the initial calibration of the parameters in the first target set of parameters to be calibrated, based on detected abnormal events, a first set of calibrated parameters and a first set of parameters to be calibrated are obtained. The first set of calibrated parameters includes a set of parameters calibrated from the parameters in the first target set of parameters to be calibrated that are not affected by the abnormal events, and the first set of parameters to be calibrated includes a set of parameters in the first target set of parameters to be calibrated that are affected by the abnormal events.

[0006] In this embodiment of the application, during the initial calibration process, based on the detected abnormal events, the parameters to be calibrated in the first target set of parameters to be calibrated that are not affected by the abnormal events are calibrated. This can generate partially usable calibration parameters (the first set of calibrated parameters) when an abnormality occurs, avoiding the problem of global failure due to a single point of failure, thereby improving calibration efficiency.

[0007] In one possible implementation, during the initial calibration of the parameters to be calibrated in the first target set of parameters to be calibrated, a first set of calibrated parameters and a first set of parameters to be calibrated are obtained based on detected abnormal events. This includes: sequentially calibrating each parameter to be calibrated in the current set of parameters to be calibrated; wherein, when an abnormal event is detected during the calibration process, isolation processing is performed; the isolation processing includes: identifying one or more affected parameters to be calibrated due to the abnormal event, and updating the current set of parameters to be calibrated based on the one or more affected parameters; the current set of parameters to be calibrated is initially the set of parameters to be calibrated for the first target set of parameters to be calibrated. The set of items to be calibrated in the row calibration; each affected item to be calibrated is an item to be calibrated that depends on the affected calibrated parameters, and / or is affected by the affected uncalibrated parameters; each item to be calibrated in the updated set of items to be calibrated is calibrated, and when an abnormal event is detected during the calibration of each item to be calibrated in the updated set of items to be calibrated, the isolation process and the calibration process of each item to be calibrated in the updated set of items to be calibrated are iteratively executed until the calibration of all items to be calibrated in the updated set of items to be calibrated is completed, so as to obtain the first set of calibrated parameters and the first set of parameters to be calibrated.

[0008] In this embodiment, an iterative anomaly isolation and dynamic update mechanism is used to achieve dynamic fault tolerance and adaptive calibration of the calibration process under abnormal conditions during parameter calibration. Specifically, the method sequentially performs calibration work on each item in the current set of items to be calibrated. During the calibration process, once an abnormal event is detected, isolation processing is immediately performed: one or more items to be calibrated affected by the abnormal event are accurately identified, and the current set of items to be calibrated is updated accordingly. Each affected item to be calibrated includes items that depend on the affected calibrated parameters, as well as items that will be affected by the affected uncalibrated parameters. After the update is completed, the calibration, anomaly detection, and isolation processing process is repeated for the new set of items to be calibrated until the calibration work of all items to be calibrated is completed, ultimately obtaining a partially useful or valid first set of calibrated parameters. This processing method can accurately lock the items to be calibrated affected by abnormal events, effectively avoid the interference of anomalies on other normal items to be calibrated, and thus improve the accuracy and reliability of calibration.

[0009] In one possible implementation, updating the current set of calibrated items based on one or more affected calibrated items includes: removing at least one of the one or more affected calibrated items from the current set of calibrated items; correspondingly, calibrating each calibrated item in the updated set of calibrated items includes: calibrating the remaining affected calibrated items that were not removed from the current set of calibrated items using historical / default parameters.

[0010] In this embodiment, by clearly defining the specific method of updating the current set of calibrated items based on the affected items, when an abnormal event is detected, at least one of the affected items is removed from the current set. This avoids the situation where continuing to calibrate items affected by abnormal events not only makes it difficult to obtain accurate calibration results but also wastes a lot of time and resources due to repeated calibration attempts, thus reducing overall calibration efficiency. By removing these affected items in a timely manner, invalid calibration operations can be effectively avoided, allowing the calibration work to focus on items that are more likely to yield accurate results. At the same time, for the remaining affected items that are not removed from the current set, historical / default parameters are used for calibration. This utilizes existing reliable parameter resources to ensure that the calibration process is not interrupted by abnormal events, maintaining the continuity of the calibration work. Moreover, with the help of these relatively reliable parameters, these calibrated items can obtain relatively reasonable parameter values ​​as much as possible, making the entire parameter calibration process more flexible and adaptable in the face of abnormal situations.

[0011] In one possible implementation, the affected calibrated parameter is configured with identification information that indicates the affected calibrated parameter.

[0012] In this embodiment of the application, a parameter identification management mechanism is used to configure dedicated identification information for calibrated parameters affected by anomalies, so as to manage invalid parameters (affected calibrated parameters), such as quick location, to provide accurate guidance for subsequent maintenance and improve parameter maintenance efficiency.

[0013] In one possible implementation, during the initial calibration of the parameters to be calibrated in the first target set of parameters to be calibrated, after obtaining the first calibrated parameter set and the first set of parameters to be calibrated based on detected abnormal events, the method further includes: obtaining a second target set of parameters to be calibrated, the second target set of parameters to be calibrated including at least one parameter from the first set of parameters to be calibrated; calibrating the parameters to be calibrated in the second target set of parameters to be calibrated to obtain a second calibrated parameter set.

[0014] In this embodiment, through incremental calibration following an anomaly, after completing the initial calibration and isolating the abnormal parameters, further incremental calibration is performed on the affected parameters to be calibrated (the first set of parameters to be calibrated), thereby achieving full calibration and self-repair capability of the calibration system. This technical solution has the following significant benefits: Firstly, by constructing a second target set of parameters to be calibrated that includes at least one parameter from the first set of parameters to be calibrated, accurate recovery of abnormal parameters is achieved, significantly improving efficiency compared to full parameter recalibration. Secondly, by splitting the calibration of abnormal parameters into initial calibration and subsequent incremental calibration, both timely output of normal parameters and final calibration of abnormal parameters are ensured, thereby improving system availability.

[0015] In one possible implementation, obtaining a first target set of parameters to be calibrated includes: receiving a calibration instruction triggered by a user interaction module of the device to be calibrated, the calibration instruction being used to determine the first target set of parameters to be calibrated and a calibration strategy for the parameters to be calibrated in the first target set of parameters to be calibrated; during the initial calibration of the parameters to be calibrated in the first target set of parameters to be calibrated, obtaining a first set of calibrated parameters and a first set of parameters to be calibrated based on detected abnormal events, including: in response to the calibration instruction, during the initial calibration of the parameters to be calibrated in the first target set of parameters to be calibrated, obtaining the first set of calibrated parameters and the first set of parameters to be calibrated according to the calibration strategy and detected abnormal events.

[0016] In this embodiment, the integration of a user interaction module and automated calibration allows users to directly specify the set of parameters to be calibrated and the calibration strategy, enabling the system to adapt to the personalized needs of different application scenarios. Simultaneously, the interaction between user commands and automated calibration retains the flexibility of manual control while leveraging the efficiency advantages of automated calibration.

[0017] In one possible implementation, after receiving a calibration command triggered by a user interaction module of the device to be calibrated, the method further includes: during the initial calibration of the parameters to be calibrated in the first target set of parameters to be calibrated, after detecting an abnormal event, outputting indication information according to the calibration strategy and the detected abnormal event; the indication information is used to indicate the end of the calibration of the parameters to be calibrated in the first target set of parameters to be calibrated.

[0018] In this embodiment, through an anomaly response mechanism and calibration strategy, when an abnormal event is detected during the initial calibration process, an indication message indicating the termination of calibration is output in real time. The abnormal calibration process is actively terminated through a clear interruption signal, which avoids invalid calibration operations from continuously occupying computing resources and can reduce resource waste.

[0019] Secondly, this application provides a device to be calibrated, comprising: a first acquisition module, configured to acquire a first target set of parameters to be calibrated; and a first calibration module, configured to, during the initial calibration of the parameters to be calibrated in the first target set of parameters to be calibrated, obtain a first set of calibrated parameters and a first set of parameters to be calibrated based on detected abnormal events. The first set of calibrated parameters includes a set of parameters from the first target set of parameters to be calibrated that are not affected by the abnormal events, and the first set of parameters to be calibrated includes a set of parameters from the first target set of parameters to be calibrated that are affected by the abnormal events.

[0020] Thirdly, this application provides a device to be calibrated, comprising: a memory and a processor. The memory stores a computer program. The processor invokes the computer program in the memory to execute a calibration method as described in any embodiment of the first aspect.

[0021] Fourthly, this application provides a calibration apparatus, comprising: a user interaction module for acquiring a first target set of parameters to be calibrated; and a decision execution module for obtaining a first set of calibrated parameters and a first set of parameters to be calibrated based on detected abnormal events during the initial calibration of the parameters to be calibrated in the first target set of parameters to be calibrated. The first set of calibrated parameters includes the set of parameters after calibration of the parameters in the first target set of parameters to be calibrated that are not affected by the abnormal events, and the first set of parameters to be calibrated includes the set of parameters in the first target set of parameters to be calibrated that are affected by the abnormal events.

[0022] Fifthly, this application provides a device to be calibrated, comprising: a device body and a calibration device as described in any embodiment of the fourth aspect, wherein the calibration device is communicatively connected to the device body.

[0023] Sixthly, this application provides a calibration system, including: a signal source and a device to be calibrated as described in any embodiment of the fifth aspect, wherein the signal source is communicatively connected to the device to be calibrated, and the signal source provides a calibration signal to the device body.

[0024] In a seventh aspect, this application provides a calibration system, comprising: a signal source and a device to be calibrated, wherein the signal source is communicatively connected to the device to be calibrated, and the signal source provides a calibration signal to the device to be calibrated. As in any embodiment of the fourth aspect, the calibration device is communicatively connected to both the signal source and the device to be calibrated.

[0025] Eighthly, this application provides a computer-readable storage medium including instructions. When executed on a processor, the instructions cause the processor to perform any of the calibration methods described in the first aspect.

[0026] For the technical principles and beneficial effects of the second, third, fourth, fifth, sixth, seventh and eighth aspects, please refer to the relevant explanations in the first aspect above, which will not be repeated here. Attached Figure Description

[0027] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0028] Figure 1 This is a schematic diagram illustrating the structure of a calibration system according to some embodiments of this application;

[0029] Figure 2 This is a schematic diagram of the structure of a calibration device according to some embodiments of this application. Figure 1 ;

[0030] Figure 3 This is a schematic diagram of the structure of a calibration device according to some embodiments of this application. Figure 2 ;

[0031] Figure 4 The present application provides a schematic diagram of the structure of a device to be calibrated, according to some embodiments thereof. Figure 1 ;

[0032] Figure 5 This is a flowchart illustrating a calibration method according to some embodiments of this application. Figure 1 ;

[0033] Figure 6 This is a flowchart illustrating a calibration method according to some embodiments of this application. Figure 2 ;

[0034] Figure 7 This is a flowchart illustrating a calibration method according to some embodiments of this application. Figure 3 ;

[0035] Figure 8 This is a flowchart illustrating a calibration method according to some embodiments of this application. Figure 4 ;

[0036] Figure 9 This is a flowchart illustrating a calibration method according to some embodiments of this application. Figure 5 ;

[0037] Figure 10The present application provides a schematic diagram of the structure of a device to be calibrated, according to some embodiments thereof. Figure 2 .

[0038] Explanation of reference numerals in the attached figures:

[0039] 10-Calibration system;

[0040] 101 - Signal source; 102 - Device to be calibrated; 103 - Calibration device;

[0041] 1021 - Device body; 1022 - First acquisition module; 1023 - First calibration module;

[0042] 1031 - Exception Decision Module; 1032 - Decision Execution Module; 1033 - User Interaction Module;

[0043] 10311 - Calibration process adjustment unit; 10312 - Abnormal parameter management unit;

[0044] 10321 - Calibration process execution unit; 10322 - Calibration status update unit;

[0045] 10331 - Anomaly handling strategy configuration unit; 10332 - Calibration parameter application unit. Detailed Implementation

[0046] It should be noted that the terms "first" and "second" used in the embodiments of this application are only used to distinguish features of the same type and should not be construed as indicating relative importance, quantity, order, etc.

[0047] The terms "exemplary" or "for example" used in the embodiments of this application are used to indicate examples, illustrations, or descriptions. Any embodiment or design described as "exemplary" or "for example" in this application should not be construed as being more preferred or advantageous than other embodiments or designs. Specifically, the use of terms such as "exemplary" or "for example" is intended to present the relevant concepts in a specific manner.

[0048] The terms “coupling,” “coupled,” and “connection” used in the embodiments of this application should be interpreted broadly. For example, they can refer to a physical direct connection or an indirect connection achieved through electronic devices, such as a connection achieved through resistors, inductors, capacitors, or other electronic devices.

[0049] Measuring instruments or equipment, including but not limited to oscilloscopes, spectrum analyzers, power meters, and network analyzers, are core devices in the field of electronic measurement, widely used in communication systems, radar systems, aerospace equipment, medical electronic equipment, and industrial automation systems. These instruments typically work in conjunction with external devices such as signal generators, power meters, sensors, and data acquisition cards to accurately measure and analyze key parameters (such as voltage, frequency, phase, and waveform distortion) of signals (including but not limited to electrical and optical signals) to ensure that the performance of the system under test meets design requirements.

[0050] In communication systems, for example, a spectrum analyzer can be used to analyze the spectral characteristics of wireless communication signals, while an oscilloscope can be used to observe the timing integrity of high-speed digital signals. For aerospace equipment, network analyzers are used to calibrate the impedance matching characteristics of antennas and RF links, among other things.

[0051] The measurement accuracy of a measuring instrument directly affects the performance evaluation results of the system under test. However, during long-term use, factors such as changes in ambient temperature and humidity, and component aging introduce uncertainties into the measurement results, leading to deviations. For example, a single calibration item may correspond to multiple parameters; a temperature-sensitive calibration item may correspond to different parameters under different temperature conditions to adapt to varying ambient temperature measurement requirements. To eliminate this deviation, the instrument needs to be calibrated regularly or as needed to reduce measurement errors and ensure the accuracy and precision of the equipment.

[0052] Measuring instruments contain many parameters, including calibrable parameters (which can include parameters in a calibrated state and parameters in a state to be calibrated) and non-calibrable parameters. Calibrable parameters may include those that may drift over time or with changes in the environment, such as gain, offset, and frequency response. Non-calibrable parameters may include those related to the inherent hardware properties of the device or user-configurable options, such as input impedance, screen brightness, and language settings.

[0053] When calibrating calibrable parameters, the methods include full calibration, partial calibration, and incremental calibration.

[0054] Full calibration can be interpreted as performing a systematic and global calibration of all calibrable parameters of the device to be calibrated. Based on the dependencies between all calibrable parameters, the entire self-calibration process is completed sequentially according to a predefined execution order, and finally all relevant calibration parameters are updated.

[0055] Partial calibration can mean calibrating only a portion of the calibrable parameters, supporting on-demand calibration.

[0056] Incremental calibration, similar to partial calibration, can also refer to calibrating only a subset of calibrable parameters. Incremental calibration can involve identifying all failing parameters among the calibrable parameters, determining the set of items to be calibrated for this subset of failing parameters, and then performing the calibration.

[0057] Parameter calibration is accomplished by executing calibration items, which include the configuration of operating parameters, calibration algorithms, and data acquisition involved in the calibration process for the corresponding parameter to be calibrated. Each parameter has a corresponding calibration item.

[0058] Calibration of measuring instruments generally includes two methods: factory calibration and self-calibration (or user calibration).

[0059] Factory calibration: This involves a professional laboratory performing a full calibration using high-precision standard equipment (such as a reference signal source and a precision impedance analyzer), covering all calibrable parameters such as gain, bias, linearity, and noise figure, and providing a calibration certificate. Its disadvantages include a long cycle time, high cost (requiring downtime for transportation), and inability to respond to environmental changes in real time.

[0060] Self-calibration, also known as user-calibration, involves the user performing calibration on-site using the instrument's built-in functions or external calibration kits (such as GPS synchronization sources or standard loads). Compared to factory calibration, self-calibration offers advantages in convenience and real-time performance, reducing time and transportation costs, and easily adapting to changes in the equipment's operating environment.

[0061] However, self-calibration often faces various uncertain external factors when performed in the user's field environment, such as the stability of the calibration environment, the standardization of operations, the reliability of the calibration network, and the accuracy of the calibration source. These issues significantly increase the possibility of anomalies during the self-calibration process. For high-precision measurement equipment, there are usually many parameters that need to be calibrated, and the calibration process is complex and time-consuming. Because there is a correlation between calibration steps and calibration parameters, when one or more of the calibrated parameters are abnormal, it may affect the correctness and availability of other parameters. In this case, it is usually necessary to recalibrate all parameters to ensure the correctness of the overall calibration result.

[0062] In scenarios where the number of parameters on the device to be calibrated is large and the probability of single-point anomalies is high, this full recalibration method significantly increases the impact of anomalies on the entire self-calibration process, reduces the success rate of self-calibration, and increases the difficulty of repairing single-point anomalies. Furthermore, the validity of some parameters may change over time and with environmental changes. Due to the mutual coupling effects between parameters, a full self-calibration re-execution is usually required, further increasing the difficulty of repairing invalid parameters.

[0063] Due to the large number of parameters and the coupling between them, single-point anomalies in the calibration process often render the entire set of calibration parameters unusable, or compromise the accuracy and validity of the calibration parameters. Limited by the user's on-site networking conditions and various uncertainties, current high-precision measuring instruments typically struggle to achieve reliable and effective self-calibration functions, exhibiting problems such as low self-calibration success rates, difficulties in handling anomalies, and poor usability. Therefore, there is an urgent need for a technical solution that can efficiently handle anomalies and reduce the need for full recalibration, thereby improving the success rate and practicality of self-calibration.

[0064] Example 1:

[0065] In view of this, in order to solve one or more of the above-mentioned technical problems, this embodiment provides a calibration system, such as... Figure 1 The diagram illustrates a calibration system 10 according to some embodiments of this application. The calibration system 10 includes a signal source 101, a device to be calibrated 102, and a calibration device 103. The signal source 101 is communicatively connected to the device to be calibrated 102 and provides a calibration signal to the device to be calibrated 102, such as generating an electrical signal with a specific waveform (e.g., sine wave, square wave, pulse), frequency, amplitude, and phase to simulate the input signal of the system under test. The calibration device 103 is communicatively connected to both the signal source 101 and the device to be calibrated 102.

[0066] like Figure 2 As shown, the calibration device 103 includes an anomaly decision module 1031 and a decision execution module 1032.

[0067] The anomaly decision module 1031 includes a calibration process adjustment unit 10311 and an anomaly parameter management unit 10312. The calibration process adjustment unit 10311 identifies the impact range of a single-point anomaly and isolates calibrated parameters already generated in the self-calibration process that are affected by the anomaly. The anomaly parameter management unit 10312 adaptively adjusts the self-calibration process based on the isolated calibrated parameters and user-configurable anomaly handling strategies.

[0068] The decision execution module 1032 includes a calibration process execution unit 10321 and a calibration status update unit 10322. Under the control of the anomaly decision module 1031, the decision execution module 1032 executes the self-calibration process through the calibration process execution unit 10321, and detects and updates the self-calibration status in real time through the calibration status update unit 10322, and reports anomalies.

[0069] The adaptive control of self-calibration anomalies can be achieved through the coordinated operation of the above modules. For example, the coordinated operation of the anomaly decision module 1031 and the decision execution module 1032 can achieve adaptive control and calibration of self-calibration anomalies.

[0070] like Figure 3 As shown, the calibration device 103 may further include a user interaction module 1033.

[0071] The user interaction module 1033, used to support user interaction, may include an exception handling strategy configuration unit 10331 and a calibration parameter application unit 10332. The exception handling strategy configuration unit 10331 allows users to configure calibration strategies. The calibration parameter application unit 10332 allows users to select the application of calibrated parameters, such as applying all or part of the parameters to the device 102 to be calibrated.

[0072] By directly integrating the user interaction module 1033 into the calibration device 103, the calibration process is streamlined and the human-machine interaction is optimized. Furthermore, by optimizing the human-machine interface, the entire calibration process becomes more intuitive, efficient, and reliable, providing a more convenient and user-friendly solution for measurement equipment requiring high-frequency, high-timeliness calibration operations.

[0073] In some possible implementations, the calibration device 103 may be integrated into the device 102 to be calibrated. For example... Figure 4 As shown, the device to be calibrated 102 includes a device body 1021 and, as shown, ... Figure 2 The calibration device 103 is shown. The calibration device 103 is communicatively connected to the device body 1021. The device 102 to be calibrated may further include a user interaction module 1033. Figure 4 (Not shown in the image).

[0074] In some instances, the device to be calibrated 102 may also include a device body 1021 and, for example, a device body 1021. Figure 3 The calibration device 103 shown.

[0075] Based on such Figure 1 , Figure 2 , Figure 3 and Figure 4 The calibration system shown below will be combined with Figure 5 , Figure 6 , Figure 7 , Figure 8 and Figure 9 The specific calibration process will be explained. Figure 5 , Figure 6 , Figure 7 , Figure 8 and Figure 9 These are schematic flowcharts illustrating a calibration method according to some embodiments of this application.

[0076] like Figure 5 The calibration method shown specifically includes steps S11-S12:

[0077] S11. Obtain the first target set of parameters to be calibrated.

[0078] In some implementations, it can be as follows Figure 1 , Figure 2 or Figure 3 The calibration device 103 shown or as Figure 4 The device 102 shown acquires a first target set of parameters to be calibrated. The parameters to be calibrated in the first target set of parameters to be calibrated can be parameters selected by the user through the user interaction module 1033.

[0079] In some examples, such as Figure 4 Taking the device to be calibrated 102 as an example to obtain the first target set of parameters to be calibrated, the user interaction module 1033 receives the calibration command triggered by the user. The calibration command is used to indicate the first target set of parameters to be calibrated and the calibration strategy for the parameters to be calibrated in the first target set of parameters to be calibrated.

[0080] The calibration strategy refers to the optional measures for specific situations during the self-calibration execution process. It can include various processing methods defined under different calibration states. For example, when the first target set of parameters to be calibrated includes parameters U and V, whether to continue calibrating parameter V after parameter U fails to be calibrated. When parameter W exists in the set of parameters preceding parameter U, whether to calibrate parameter W, or directly use the default parameter or historical calibration parameter of parameter W, etc.

[0081] For example, a user can select parameters that do not meet preset conditions (such as correctness, accuracy or timeliness requirements) as target calibration parameters through the user interaction module 1033 according to the actual usage needs of the device 102 to be calibrated (such as changes in external conditions such as ambient temperature or humidity). This will trigger the calibration process and cause the calibration device 103 to execute the corresponding (full / partial / incremental) self-calibration process in the form of an instruction.

[0082] In this embodiment, the calibration command is directly triggered through the user interaction module 1033, and the target parameter to be calibrated can be flexibly selected, reducing unnecessary parameter calibration, reducing the complexity of the calibration algorithm, and reducing the occupation of computing resources during the calibration process, thereby reducing the impact on the normal operation of the device and improving the availability of the device and the user experience.

[0083] S12. During the initial calibration of the parameters to be calibrated in the first target set of parameters to be calibrated, the first set of calibrated parameters and the first set of parameters to be calibrated are obtained based on the detected abnormal events.

[0084] The first calibrated parameter set includes the parameter set after calibration of the parameters to be calibrated in the first target parameter set to be calibrated that are not affected by abnormal events, and the first parameter set to be calibrated includes the parameter set in the first target parameter set to be calibrated that is affected by abnormal events.

[0085] In some implementations, abnormal events include those that prevent the calibration process from being completed as expected or result in unreliable calibration results due to factors such as external environment, operational procedures, or equipment status. Self-calibration is performed in the user's field environment, which is subject to various uncertain external factors, such as the stability of the calibration environment, operational standardization, and the difficulty in guaranteeing the reliability of the calibration network and calibration source. These issues increase the likelihood of abnormalities occurring during self-calibration. Specifically, abnormal events include, but are not limited to, the following:

[0086] Abnormal calibration environment, such as environmental parameters such as temperature, humidity, and air pressure exceeding the allowable calibration range; electromagnetic interference or vibration causing calibration signal distortion or loss.

[0087] Abnormalities in operational procedures, such as user errors (e.g., incorrect connection to the calibration source, incorrect configuration parameters); or failure to follow the calibration procedure (e.g., skipping critical steps).

[0088] The calibration source is abnormal, such as insufficient accuracy or inaccuracy of external calibration equipment (such as GPS, signal source); the calibration source signal is unstable or interrupted.

[0089] Abnormal equipment status, such as aging or malfunction of internal components (e.g., amplifier gain drift, filter bandwidth change); calibration parameters exceeding preset thresholds (e.g., excessive frequency response deviation, abnormal noise figure).

[0090] Abnormal process execution, such as calibration steps failing to complete due to dependencies (e.g., failure of a preceding calibration item prevents subsequent calibration from being performed); calibration results failing verification (e.g., calibration parameters deviating too much from expected values).

[0091] Data anomalies, such as incomplete or lost calibration data.

[0092] A single point of failure can represent any of the above-mentioned abnormal events. The probability of a single point of failure occurring is relatively high during the calibration of the equipment to be calibrated.

[0093] For the detection of abnormal events, it can be achieved by executing, such as Figure 6 The calibration method shown is used for testing, such as Figure 6 As shown, a calibration method according to an embodiment of this application is provided, specifically including steps a1-a2:

[0094] Step a1: Detect the operating parameters of the device to be calibrated during operation.

[0095] Step a2: When the operating parameters fall outside the preset parameter range, an abnormal event of the device to be calibrated is obtained.

[0096] In some examples, operating parameters are key indicators reflecting the working status of the equipment being calibrated, and abnormal changes in these parameters can directly or indirectly lead to calibration failure or unreliable calibration results. By detecting whether operating parameters exceed preset ranges, abnormal events can be quickly identified and appropriate measures taken.

[0097] If the operating parameters exceed the preset range, it indicates that the equipment may be in an abnormal state (such as sudden environmental changes, device failure, signal distortion, etc.), and the abnormal event handling mechanism needs to be triggered. If the operating parameters are within the preset range, it indicates that the equipment is working normally, and the calibration process can be executed as planned.

[0098] The preset parameter range is a threshold interval determined based on equipment design specifications, calibration accuracy requirements, and actual usage needs. It is used to determine whether the operating parameters are normal. This includes, but is not limited to, environmental parameter ranges (such as temperature, humidity, and air pressure), electrical parameter ranges (such as signal amplitude, frequency range, and noise figure), calibration source parameter ranges (such as calibration signal accuracy and calibration source stability), and process execution parameter ranges (such as calibration step time and data acquisition integrity). Taking temperature anomalies in the calibration environment as an example, if the hardware of the device to be calibrated 102 (such as an oscilloscope) exhibits performance differences in different temperature environments, some parameters (or parameter indicators) of the device to be calibrated 102 will have temperature differences. These parameters need to be adjusted to achieve the nominal values ​​of the indicators at different temperatures. The calibration items corresponding to these parameters can be classified as temperature-sensitive calibration items. By executing these calibration items, the corresponding parameters to be calibrated can be calibrated. During calibration, stable ambient temperature conditions must be maintained; for example, the ambient temperature fluctuation during the calibration process should not exceed ±2℃. Other calibration items unrelated to ambient temperature are classified as non-temperature-sensitive calibration items and are not subject to this restriction. For temperature-sensitive calibration items, in addition to the default calibration parameters within the core operating temperature range provided by the equipment manufacturer, users can generate self-calibration parameters that match the actual operating environment temperature of the measuring equipment through the self-calibration function when the ambient temperature changes. If the change in ambient temperature exceeds a predetermined threshold during the self-calibration process, a self-calibration temperature anomaly is considered to have occurred.

[0099] The implementation shown in steps a1-a2 can detect the parameters of the device under calibration in real time during operation and trigger an abnormal event when the parameters exceed the preset range, thereby quickly identifying potential calibration problems. This mechanism can respond promptly in the early stages of an anomaly, preventing the problem from escalating further and improving the reliability and stability of the calibration process.

[0100] In other embodiments, the user interaction module 1033 receives a calibration command triggered by the user, and the calibration device 103 responds to the calibration command by obtaining a first calibrated parameter set and a first set of parameters to be calibrated based on the calibration strategy and detected abnormal events during the initial calibration of the parameters to be calibrated in the first target set of parameters to be calibrated. By integrating the user interaction module with automated calibration, users can directly specify the set of parameters to be calibrated and the calibration strategy, enabling the system to adapt to the personalized needs of different application scenarios. Simultaneously, the interaction between user commands and automated calibration retains the flexibility of manual control while leveraging the efficiency advantages of automated calibration.

[0101] For example, in response to a calibration command, the anomaly decision module 1031 determines an execution strategy based on the calibration strategy and currently detected anomalies during the initial calibration of the parameters in the first target set of parameters to be calibrated. The execution strategy corresponds to the currently detected anomalies. The decision execution module 1032 obtains the first calibrated parameter set and the first set of parameters to be calibrated based on the execution strategy. By generating the optimal execution plan through real-time fusion of preset strategies and anomaly states, the accuracy of strategy adaptation in anomaly scenarios is improved. Simultaneously, considering the user-preset calibration strategy and real-time detected anomalies, the efficiency of calibration decisions in complex environments is improved. The specific method for adjusting the self-calibration process is controlled by user-configurable anomaly handling strategies. Different types of anomalies can be handled, such as whether to directly exit the calibration process after a single-point anomaly occurs, or to use default configurations or other avoidance strategies to complete subsequent calibration. The anomaly handling strategy is configured before the self-calibration process begins. During the execution of the self-calibration process, the calibration device automatically performs adaptive processing based on the real-time calibration status and real-time anomaly detection results, reducing or avoiding manual intervention required when anomalies occur. The above adaptive control of the self-calibration process based on anomaly isolation can reduce the impact of single-point anomalies on the main self-calibration process, reduce manual intervention in anomaly handling, and improve the flexibility and fault tolerance of the self-calibration process.

[0102] In other examples, during the initial calibration of the parameters in the first target set of parameters to be calibrated, upon detecting an anomaly, an indication message is output based on the calibration strategy and the detected anomaly. This indication message indicates the termination of calibration for the parameters in the first target set of parameters to be calibrated. Through the anomaly response mechanism and calibration strategy, when an anomaly is detected during the initial calibration, an indication message indicating calibration termination is output in real time. This explicit interruption signal proactively terminates the abnormal calibration process, preventing invalid calibration operations from continuously consuming computational resources and reducing resource waste.

[0103] For the implementation shown in steps S11-S12, during the initial calibration process, based on the detected abnormal events, the parameters to be calibrated in the first target set of parameters to be calibrated that are not affected by the abnormal events are calibrated. This can generate partially usable calibration parameters (the first set of calibrated parameters) when an abnormality occurs, avoiding the problem of global failure due to a single point of abnormality, thereby improving calibration efficiency.

[0104] In other implementations, such as Figure 7 The diagram shown is a flowchart of a calibration method according to an embodiment of this application. Step S12 specifically includes steps S121-S125:

[0105] S121. Perform calibration on each item in the current set of items to be calibrated in turn.

[0106] The current set of calibration items is used to perform initial calibration on the parameters in the first target set of calibration parameters. The execution order of the calibration items in the current set of calibration items has been determined based on the parameters in the first target set of calibration parameters. In some examples, during the initial calibration of the parameters in the first target set of calibration parameters, the calibration order of the parameters is determined based on the coupling or dependency between the parameters. Specifically, the dependency can be determined manually or automatically by an algorithm within the device. Since the parameters are calibrated through calibration items, once the calibration order of the parameters is determined, the execution order of the calibration items can then be determined.

[0107] For example, in one example, the first target set of parameters to be calibrated includes a first parameter b1, a second parameter c1, and a third parameter d1. The calibration items include a first calibration item A and a second calibration item B. The first calibration item A is used to calibrate the first parameter b1, denoted as A(b1). The second calibration item B is used to calibrate both the second parameter c1 and the third parameter d1, denoted as B(c1, d1). If the second parameter c1 is related to the first parameter b1, meaning the calibration of the second parameter c1 depends on the validity or accuracy of the first parameter b1, then the first calibration item A needs to be performed or calibrated before the second calibration item B. The calibration order among the calibration items is determined based on this coupling or correlation between the parameters.

[0108] In another example, step S121 can be performed by calibration process execution unit 10321.

[0109] S122. Were any abnormal events detected during the calibration process?

[0110] If an abnormal event is detected during the calibration process, proceed to steps S123-S124; if no abnormal event is detected during the calibration process, proceed to step S125.

[0111] S123. Identify one or more affected calibration items affected by the abnormal event, and update the current calibration item set based on one or more affected calibration items.

[0112] In some examples, each affected calibrator includes calibrators that depend on the affected calibrated parameters, and / or calibrators that will be affected by the affected uncalibrated parameters.

[0113] In one example, each affected calibrator is a calibrator that depends on the affected calibrated parameter, which represents a parameter that was calibrated before the detected anomaly. Specifically, taking the sequential calibration of the first calibrator A and the second calibrator B as an example, if the second calibrator parameter c1 is related to the first calibrator parameter b1, meaning the calibration of the second calibrator parameter c1 depends on the validity or accuracy of the first calibrator parameter b1, and if, during the calibration of the second calibrator B, the first calibrator parameter b1 has already been calibrated to the first calibrated parameter b2, and an anomaly is detected that affects the calibration of the first calibrator parameter b1, then the first calibrated parameter b2 is the affected calibrated parameter, and the second calibrator B is a calibrator that depends on the affected calibrated parameter.

[0114] In another example, each affected calibrator includes calibrators that are affected by the uncalibrated parameters. Specifically, taking the sequential calibration of the first calibrator A and the second calibrator B as an example, if the second calibrator parameter c1 is not related to the first calibrator parameter b1, and if an abnormal event is detected during the calibration of the second calibrator B, and this abnormal event affects the calibration of the second calibrator parameter c1, then the second calibrator parameter c1 is an affected uncalibrated parameter, and the second calibrator B is a calibrator affected by the affected uncalibrated parameter.

[0115] In yet another example, each affected calibrator includes calibrators that depend on the affected calibrated parameters and calibrators that will be affected by the affected uncalibrated parameters. Please refer to the examples above for details; they will not be repeated here.

[0116] In another example, the affected calibrated parameters are configured with identification information to indicate which calibrated parameters are affected. Through a parameter identification management mechanism, dedicated identification information is configured for calibrated parameters affected by anomalies, enabling the management of invalid parameters (affected calibrated parameters), such as rapid location, providing accurate guidance for subsequent maintenance, and improving parameter maintenance efficiency.

[0117] In some other examples, the current set of items to be calibrated is initially the set of items to be calibrated for the first target set of parameters to be calibrated. That is, in the parameter calibration process, the current set of items to be calibrated has a clear initial setting. It starts from the set of items to be calibrated for the first target set of parameters to be calibrated, which defines the initial scope and object of the entire calibration work.

[0118] However, during the calibration process, the occurrence of anomalous events can disrupt this initial stable state. Once an anomalous event is detected, the current set of items to be calibrated can be dynamically adjusted based on its impact. Specifically:

[0119] In one example, items affected by an anomaly can be removed from the current set of calibrators. This involves removing at least one affected item from the current set. This is because calibration results are often inaccurate if affected. Continuing to calibrate items affected by anomalies not only makes it difficult to obtain accurate results but also wastes significant time and resources due to repeated calibration attempts, thus reducing overall calibration efficiency. Therefore, calibration can be performed only when certain conditions meet calibration standards (such as when environmental parameters like temperature are normal).

[0120] Of course, this removal operation is not arbitrary, but based on a precise assessment of the degree of interference of abnormal events with these items to be calibrated, ensuring that only items that are truly affected and may impact calibration accuracy are removed. After the removal operation is completed, the current set of items to be calibrated is updated, resulting in a completely new set. This means that the items to be calibrated in the current set are constantly changing. At different calibration times, due to the different occurrences and scope of impact of abnormal events (see the aforementioned introduction to abnormal events for details), the corresponding current set of items to be calibrated will also differ. This dynamic change mechanism allows the calibration work to flexibly respond to various abnormal situations, promptly eliminate interfering factors, and thus ensure that the calibration process continues to advance in a direction of accuracy and efficiency.

[0121] For example, the self-calibration function of a digital oscilloscope is used as an example. Because oscilloscope hardware exhibits performance differences in different temperature environments, some calibration parameters of the oscilloscope vary with temperature. The calibration items corresponding to these parameters can be categorized as temperature-sensitive calibration items. Performing these calibrations requires maintaining stable ambient temperature conditions, such as ambient temperature fluctuations not exceeding ±2℃ during the calibration process. Other calibration items unrelated to ambient temperature are categorized as non-temperature-sensitive calibration items and are not subject to this restriction. For temperature-sensitive calibration items, in addition to the default calibration parameters within the core operating temperature range provided by the instrument manufacturer, users can generate self-calibration parameters that match the actual operating ambient temperature of the instrument through the self-calibration function when the ambient temperature changes. When the ambient temperature change exceeds a predetermined threshold during the self-calibration process, a self-calibration temperature anomaly is considered to have occurred, and an adaptive control method based on anomaly isolation is used for anomaly handling. Specifically, firstly, temperature-sensitive parameters that have completed calibration are identified and marked as invalid. Secondly, temperature-sensitive parameters that have not completed calibration are identified, and the corresponding calibration items are removed from the set of items to be calibrated.

[0122] In another example, the calibration items affected by the abnormal event can also be retained in the current set of calibration items without being removed. These calibration items affected by the abnormal event can be calibrated by using historical / default parameters to calibrate the remaining affected calibration items. For example, non-temperature-sensitive parameters associated with temperature-sensitive parameters can be calibrated based on the factory default configuration or based on the parameters of the previous normal calibration. For details, please refer to the explanation of step S124.

[0123] In yet another example, step S123 can be performed by calibration state update unit 10322.

[0124] S124. Calibrate each item in the updated set of items to be calibrated in turn.

[0125] Specifically, when calibrating each item in the updated set of items to be calibrated sequentially, steps S122-S124 are executed iteratively to calibrate each item in the updated set of items to be calibrated. If no abnormal event is detected during the calibration process, step S125 is executed.

[0126] In one example, steps S124-S125 can be performed by calibration process execution unit 10321.

[0127] In some examples, if the updated set of calibrators includes remaining affected calibrators that were not removed from the current set of affected calibrators, the remaining affected calibrators can be calibrated using historical / default parameters. Historical / default parameters refer to parameters that have been previously calibrated, while default parameters are system default parameters, typically provided by the manufacturer.

[0128] In another example, the measuring instrument can provide some prompts or interactive interfaces (such as pop-up dialog boxes) at this time to allow the user to choose whether to calibrate or use historical / default parameters for calibration. Alternatively, it can read pre-configured default options (such as a configuration file that typically stores the user's configuration) to choose whether to calibrate the affected items or use historical / default parameters for calibration.

[0129] In another example, if the second parameter to be calibrated, c1, is related to the first parameter to be calibrated, b1 (i.e., the calibration of c1 depends on the validity or accuracy of b1), and b1 is a temperature-sensitive parameter, and if, during the calibration of the second parameter to be calibrated, b1 has already been calibrated to b2, and an abnormal event is detected (a temperature anomaly affecting the calibration of b1), then b2 becomes the affected parameter, and b2 becomes a parameter dependent on the affected parameter. In this case, the historical / default parameters of b1 can be used to continue calibrating b2.

[0130] In another example, if the second parameter to be calibrated, c1, is not related to the first parameter to be calibrated, and c1 is a temperature-sensitive parameter, and an abnormal event is detected during the calibration of the second calibrated item B, and this abnormal event affects the calibration of c1, then c1 becomes an affected uncalibrated parameter, and B becomes a calibrated item affected by the affected uncalibrated parameter. In this case, the historical / default parameters of c1 can be used to continue calibrating B.

[0131] In the above embodiments, the introduction of a parameter compensation mechanism is a key means to cope with abnormal situations and ensure the smooth progress of calibration work during the complex process of parameter calibration. When parameters affected by anomalies are identified in the set of parameters to be calibrated, this mechanism will quickly take effect and automatically replace these abnormal parameters with default parameters or historical calibration parameters.

[0132] This replacement operation, by promptly replacing abnormal parameters, effectively prevents the entire calibration process from being interrupted due to anomalies in individual parameters. If the calibration strategy dictates that the entire calibration process must abruptly halt upon the occurrence of an abnormal parameter, it not only wastes previously invested time and resources but may also prevent the system from obtaining accurate calibration results at critical moments, thus affecting the normal operation of the system. The application of the parameter compensation mechanism, however, allows some core calibration functions to be maintained even in the face of abnormal conditions during the calibration process, ensuring that the calibration work does not completely stop and providing strong support for the stable operation of the system.

[0133] In terms of the effectiveness of the calibration range, replacing parameters with historical calibration parameters or default values ​​significantly expands the effective calibration range compared to completely terminating the calibration process. If calibration is terminated directly in the event of an anomaly, all parameters to be calibrated will be unprocessable, resulting in a zero effective calibration range. The parameter compensation mechanism, however, replaces the abnormal parameters, allowing parameters unaffected by the anomaly to continue calibration. This enables the completion of as many calibration tasks as possible under abnormal conditions, improving the efficiency and effectiveness of the calibration work.

[0134] For the remaining affected calibration items that haven't been removed from the current set of items to be calibrated, using historical / default parameters also offers significant advantages. Historical / default parameters are reliable resources that have been validated through long-term practice or are pre-set. Using them for calibration ensures that the calibration process won't be interrupted by abnormal events, maintaining the continuity of the calibration work. Moreover, these relatively reliable parameters provide a reasonable reference benchmark for the affected calibration items, enabling them to obtain relatively reasonable parameter values. This makes the entire parameter calibration process more flexible and adaptable in the face of abnormal situations, allowing for rapid adjustments to the calibration strategy based on different anomalies, ensuring the accuracy and reliability of the calibration results, and laying a solid foundation for stable system operation and performance optimization.

[0135] S125. Calibrate the next item to be calibrated until all items to be calibrated in the updated set of items to be calibrated are calibrated, so as to obtain the first set of calibrated parameters and the first set of parameters to be calibrated.

[0136] The first set of calibrated parameters includes all calibration parameters generated before the single-point anomaly occurred and unaffected by the anomaly, as well as all calibration parameters generated after the anomaly was isolated.

[0137] For the implementation methods provided in steps S121-S125, an iterative anomaly isolation and dynamic update mechanism is used to achieve dynamic fault tolerance and adaptive calibration of the calibration process under abnormal conditions during parameter calibration. Specifically, the method sequentially performs calibration work on each item in the current set of items to be calibrated. During the calibration process, once an abnormal event is detected, isolation processing is immediately performed: one or more items to be calibrated affected by the abnormal event are accurately identified, and the current set of items to be calibrated is updated accordingly. Each affected item to be calibrated includes items that depend on the affected calibrated parameters, as well as items that will be affected by the affected uncalibrated parameters. After the update is completed, the calibration, anomaly detection, and isolation processing process is repeated for the new set of items to be calibrated until the calibration work of all items to be calibrated is completed, ultimately obtaining a partially useful or valid first set of calibrated parameters. This processing method can accurately lock the items to be calibrated affected by abnormal events, effectively avoid the interference of anomalies on other normal items to be calibrated, and thus improve the accuracy and reliability of calibration.

[0138] In some other implementations, such as Figure 8 The diagram shown is a flowchart of a calibration method according to an embodiment of this application, used to address situations where an anomaly occurs during the self-calibration process in the initial calibration or previous calibration, resulting in the failure to generate all self-calibration parameters. Step S12 is followed by steps S13-S14:

[0139] S13. Obtain the set of parameters to be calibrated for the second target.

[0140] In some examples, the second target set of parameters to be calibrated includes at least one parameter from the first set of parameters to be calibrated.

[0141] S14. Calibrate the parameters to be calibrated in the second target parameter set to be calibrated to obtain the second calibrated parameter set.

[0142] For steps S13-S14, through incremental calibration following an anomaly, after completing the initial calibration and isolating the abnormal parameters, further incremental calibration is performed on the affected parameters to be calibrated (at least one parameter in the first set of parameters to be calibrated), thereby achieving full calibration and self-repair capability of the calibration system. This technical solution has the following significant benefits: On the one hand, by constructing a second target set of parameters to be calibrated that includes at least one parameter from the first set of parameters to be calibrated, accurate recovery of abnormal parameters is achieved, significantly improving efficiency compared to full parameter recalibration; on the other hand, by splitting the calibration of abnormal parameters into initial calibration and subsequent incremental calibration, both timely output of normal parameters and final calibration of abnormal parameters are ensured, thereby improving system availability.

[0143] In some examples, such as Figure 9As shown, step S14 specifically includes steps S141-S145:

[0144] S141. Take the second target set of parameters to be calibrated as the current set of parameters to be calibrated. Based on the parameters to be calibrated in the current set of parameters to be calibrated, determine the current set of items to be calibrated. The current set of items to be calibrated is used to calibrate the parameters to be calibrated in the current set of parameters to be calibrated.

[0145] S142. Determine the associated parameters of the parameters to be calibrated in the current set of parameters to be calibrated.

[0146] In one example, the parameters to be calibrated are correlated or coupled, with one parameter depending on the validity or correctness of another.

[0147] Specifically, the device 102 to be calibrated includes parameter X, parameter Y, and parameter Z. There is a sequential dependency between these three parameters; for example, the correctness of parameter Y depends on the correctness of parameter X, and the correctness of parameter Z depends on the correctness of parameter Y. Therefore, the correct calibration order for these three parameters in the device 102 should be: parameter X, parameter Y, and parameter Z should be calibrated sequentially.

[0148] When a user determines that the parameters Y and Z to be calibrated do not meet the preset conditions (such as accuracy requirements) based on the actual usage needs of the device 102 to be calibrated, they can choose to perform incremental calibration on the parameters Y and Z to be calibrated. In this case, the parameter X to be calibrated is the associated parameter of the parameter Y to be calibrated.

[0149] S143. Determine whether there are parameters to be calibrated among the associated parameters.

[0150] If there are parameters to be calibrated (i.e., invalid parameters) among the associated parameters, proceed to steps S144 and S142-S143. If all associated parameters are calibrated (i.e., valid parameters), proceed to step S145.

[0151] S144. Adjust the current set of items to be calibrated according to the associated parameters to obtain the adjusted current set of items to be calibrated.

[0152] In one example, since the associated parameter is a parameter to be calibrated, it is necessary to calibrate the associated parameter using the calibration item corresponding to the associated parameter. Therefore, it is necessary to add the calibration item corresponding to the associated parameter to the current set of items to be calibrated.

[0153] S145. Calibrate the current set of items to be calibrated to obtain the second set of calibrated parameters.

[0154] For steps S141-S145, through the parameter-association-aware iterative calibration mechanism, dynamic dependency management and adaptive calibration strategy adjustment are achieved when incrementally calibrating abnormal parameters. On the one hand, the real-time identification and processing of associated parameters, and the dynamic determination of parameter dependencies in each iteration, ensure that the calibration order always conforms to the physical constraints between parameters, reducing the calibration failure rate caused by incorrect dependencies. On the other hand, the current set of items to be calibrated is adjusted according to the associated parameters, and the calibration item set is continuously corrected during the iteration process, enabling the system to autonomously adapt to different abnormal scenarios, demonstrating a higher scenario adaptability than traditional methods in communication equipment calibration testing.

[0155] Incremental calibration methods are suitable for different application scenarios, such as:

[0156] (1) If a single point of failure occurs in the self-calibration main process and no full calibration parameters are generated, the abnormal incremental calibration can be completed based on the partially available set of calibration items that have been generated, thereby obtaining the parameters corresponding to the full calibration items.

[0157] (2) Due to changes in time and environment, some parameters corresponding to calibration items may become invalid. In this case, incremental calibration method can also be used.

[0158] During the self-calibration process of incremental calibration, single-point anomalies may also occur. In this process, the calibration method shown in Example 1 is also applicable. By isolating the anomalies, some usable calibration items are generated.

[0159] Incremental repair methods are suitable for different application scenarios, such as:

[0160] (1) If a single point of failure occurs in the self-calibration main process and no full set of calibration parameters is generated, the abnormal incremental repair can be completed based on the partially available set of calibration parameters that have already been generated, thereby obtaining the full set of calibration parameters.

[0161] (2) Due to changes in time and environment, some calibration parameters may become invalid. In such cases, incremental repair methods can also be used.

[0162] During the self-calibration process of incremental repair, single-point anomalies may also occur, and the adaptive control method based on anomaly isolation in Implementation Example 2 is also applicable in this process.

[0163] The anomaly incremental repair method can make full use of some available calibration parameters in the system. By iteratively analyzing the correlation between invalid parameters to be repaired and other parameters, as well as the validity of the correlated parameters, and based on the user-configurable repair strategy, the self-calibration anomaly decision module adaptively adjusts the set of items to be calibrated, which can improve the repair efficiency of self-calibration.

[0164] This adaptive control mechanism for the self-calibration process, based on anomaly isolation, effectively reduces the impact of single-point anomalies on the main self-calibration process, lowers the need for manual intervention in anomaly handling, and improves the flexibility and fault tolerance of the self-calibration process. By supporting incremental calibration and adaptive anomaly handling, the system can achieve more efficient and reliable self-calibration in complex and ever-changing field environments, providing a more optimized solution for the calibration of high-precision measuring instruments.

[0165] Example 2:

[0166] Based on the above embodiments, this embodiment provides a device to be calibrated, such as... Figure 10 As shown, a device to be calibrated is provided according to an embodiment of this application. The device to be calibrated 102 includes a first acquisition module 1022 and a first calibration module 1023.

[0167] The first acquisition module 1022 is used to acquire the first target set of parameters to be calibrated.

[0168] The first calibration module 1023 is used to obtain a first calibrated parameter set and a first calibrated parameter set based on detected abnormal events during the initial calibration of the parameters to be calibrated in the first target set of parameters to be calibrated; wherein, the first calibrated parameter set includes the parameter set after calibration of the parameters to be calibrated in the first target set of parameters to be calibrated that are not affected by abnormal events, and the first calibrated parameter set includes the parameter set in the first target set of parameters to be calibrated that are affected by abnormal events.

[0169] In some embodiments, the first calibration module 1023 is further configured to calibrate each item to be calibrated in the current set of items to be calibrated sequentially, wherein when an abnormal event is detected during the calibration process, isolation processing is performed; the isolation processing includes: identifying one or more affected items to be calibrated by the abnormal event, and updating the current set of items to be calibrated based on one or more affected items to be calibrated; the current set of items to be calibrated is initially a set of items to be calibrated for calibrating a first target set of parameters to be calibrated; each affected item to be calibrated includes items to be calibrated that depend on the affected calibrated parameters, and / or items to be calibrated that are affected by the affected uncalibrated parameters; calibrating each item to be calibrated in the updated set of items to be calibrated, and when an abnormal event is detected while calibrating each item to be calibrated in the updated set of items to be calibrated, iteratively executing the isolation processing and the process of calibrating each item to be calibrated in the updated set of items to be calibrated, until the calibration of all items to be calibrated in the updated set of items to be calibrated is completed, so as to obtain a first set of calibrated parameters and a first set of parameters to be calibrated.

[0170] In some implementations, the first calibration module 1023 is further configured to update the current set of items to be calibrated based on the affected items, including: removing at least one of the affected items from the current set of items to be calibrated; accordingly,

[0171] Calibrate each item in the updated set of items to be calibrated, including: calibrating the remaining affected items that were not removed from the current set of affected items using historical / default parameters.

[0172] In some implementations, the affected calibrated parameters in the first calibration module 1023 are configured with identification information, which is used to indicate the affected calibrated parameters.

[0173] In some embodiments, the device to be calibrated 102 further includes:

[0174] The second acquisition module is used to acquire a second target set of parameters to be calibrated, which includes at least one parameter from the first set of parameters to be calibrated.

[0175] The second calibration module is used to calibrate the parameters to be calibrated in the second target parameter set to be calibrated, so as to obtain the second calibrated parameter set.

[0176] In some embodiments, the device to be calibrated 102 further includes:

[0177] The output module is used to output indication information based on the calibration strategy and the detected abnormal event during the initial calibration of the parameters to be calibrated in the first target set of parameters to be calibrated. The indication information is used to indicate the end of the calibration of the parameters to be calibrated in the first target set of parameters to be calibrated.

[0178] In some implementations, the first acquisition module 1022 is further configured to receive a calibration instruction triggered by a user interaction module of the device to be calibrated, the calibration instruction being used to determine a first target set of parameters to be calibrated and a calibration strategy for the parameters to be calibrated in the first target set of parameters to be calibrated.

[0179] The first calibration module 1023 is also used to respond to a calibration command and, during the initial calibration of the parameters to be calibrated in the first target set of parameters to be calibrated, obtain a first set of calibrated parameters and a first set of parameters to be calibrated based on the calibration strategy and detected abnormal events.

[0180] This embodiment also provides a device to be calibrated, including a memory and a processor. The memory stores a computer program; the processor invokes the computer program in the memory to execute the calibration method in any of the above embodiments.

[0181] This embodiment also provides a computer-readable storage medium. Those skilled in the art will understand that all or part of the processes in the methods of the above embodiments can be implemented by a computer program instructing related hardware. The program can be stored in a computer-readable storage medium, and when executed, it can include the processes of the embodiments of the methods described above. The storage medium can be a magnetic disk, optical disk, read-only memory (ROM), or random access memory (RAM), etc.

[0182] Each of the above modules or units can be implemented through software, hardware, or a combination of both. For example, the calibration device 103 and the user interaction module 1033 can both be implemented based on software.

[0183] In this application, "implemented through software" means that the processor reads and executes program instructions stored in memory to implement the functions corresponding to the aforementioned modules or units. Here, the processor refers to a processing circuit capable of executing program instructions, including but not limited to at least one of the following: a central processing unit (CPU), a microprocessor, a digital signal processor (DSP), a microcontroller unit (MCU), or an artificial intelligence processor, etc., and other processing circuits capable of running program instructions. In other embodiments, the processor may also include circuits with other processing functions (such as hardware circuits for hardware acceleration, bus and interface circuits, etc.). The processor can be presented as an integrated chip, for example, as an integrated chip whose processing function only includes executing software instructions, or it can also be presented as a system on a chip (SoC), that is, on a single chip, in addition to the processing circuit capable of running program instructions (often referred to as the "core"), it also includes other hardware circuits for implementing specific functions (of course, these hardware circuits can also be implemented separately based on ASIC or FPGA). Correspondingly, the processing functions, in addition to executing software instructions, may also include various hardware acceleration functions (such as AI calculation, encoding / decoding, compression / decompression, etc.).

[0184] In this application, "implemented in hardware" means that the functions of the above-mentioned modules or units are implemented through hardware processing circuits that do not have program instruction processing capabilities. These hardware processing circuits can be composed of discrete hardware components or integrated circuits. To reduce power consumption and size, integrated circuits are typically used. The hardware processing circuits can include application-specific integrated circuits (ASICs) or programmable logic devices (PLDs); PLDs can include field-programmable gate arrays (FPGAs), complex programmable logic devices (CPLDs), and so on. These hardware processing circuits can be a single packaged semiconductor chip (e.g., packaged as an ASIC); or they can be integrated with other circuits (e.g., CPUs, DSPs) and packaged into a single semiconductor chip. For example, multiple hardware circuits and a CPU can be formed on a silicon substrate and packaged into a single chip, also known as a System-on-a-Chip (SoC). Alternatively, circuits for implementing FPGA functions and a CPU can be formed on a silicon substrate and packaged into a single chip, also known as a System-on-a-Chip (SoPC).

[0185] It should be noted that when this application is implemented through software, hardware, or a combination of both, different software or hardware can be used, and it is not limited to using only one type of software or hardware. For example, one module or unit can be implemented using a CPU, while another module or unit can be implemented using a DSP. Similarly, when implemented using hardware, one module or unit can be implemented using an ASIC, while another module or unit can be implemented using an FPGA. Of course, it is not limited to using the same software (e.g., all through a CPU) or the same hardware (e.g., all through an ASIC) to implement some or all modules or units. Furthermore, those skilled in the art will understand that software is generally more flexible but less performant than hardware, while hardware is the opposite. Therefore, those skilled in the art can choose software, hardware, or a combination of both based on actual needs.

[0186] The foregoing preferred embodiments have further illustrated the objectives, technical solutions, and advantages of the present invention. It should be understood that the above descriptions are merely preferred embodiments of the present invention and are not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the protection scope of the present invention.

Claims

1. A method of calibrating a measuring instrument, characterized by, The method comprises: obtaining a first target to-be-calibrated parameter set; calibrating each to-be-calibrated item in a current to-be-calibrated item set in turn; wherein, when an abnormal event is detected in the calibration process, isolation processing is performed; the isolation processing comprises: determining one or more affected to-be-calibrated items affected by the abnormal event, and updating the current to-be-calibrated item set based on the one or more affected to-be-calibrated items; the current to-be-calibrated item set is initially a to-be-calibrated item set for calibrating the first target to-be-calibrated parameter set; each affected to-be-calibrated item is a to-be-calibrated item that depends on an affected calibrated parameter, and / or a to-be-calibrated item that will be affected by an affected uncalibrated parameter; calibrating each to-be-calibrated item in the updated to-be-calibrated item set, and when an abnormal event is detected in the calibration of each to-be-calibrated item in the updated to-be-calibrated item set, iteratively performing the isolation processing and the process of calibrating each to-be-calibrated item in the updated to-be-calibrated item set until the calibration of all to-be-calibrated items in the updated to-be-calibrated item set is completed, to obtain a first calibrated parameter set and a first to-be-calibrated parameter set; wherein, the first calibrated parameter set comprises a parameter set calibrated for to-be-calibrated parameters in the first target to-be-calibrated parameter set that are not affected by the abnormal event, and the first to-be-calibrated parameter set comprises a parameter set in the first target to-be-calibrated parameter set that is affected by the abnormal event.

2. The method of calibrating a surveying instrument according to claim 1, wherein, The updating of the current to-be-calibrated item set based on the one or more affected to-be-calibrated items comprises: removing at least one of the one or more affected to-be-calibrated items from the current to-be-calibrated item set; accordingly, The calibration of each to-be-calibrated item in the updated to-be-calibrated item set comprises: for the remaining affected to-be-calibrated items that are not removed from the current to-be-calibrated item set among the one or more affected to-be-calibrated items, calibrating the remaining affected to-be-calibrated items using historical or default parameters.

3. The method of calibrating a surveying instrument according to claim 1, wherein, The affected calibrated parameter is configured with identification information, and the identification information is used to indicate the affected calibrated parameter.

4. The method of calibrating a surveying instrument according to any of claims 1-3, characterized in that, After the first calibrated parameter set and the first to-be-calibrated parameter set are obtained based on the detected abnormal event in the initial calibration of the to-be-calibrated parameters in the first target to-be-calibrated parameter set, the method further comprises: obtaining a second target to-be-calibrated parameter set, the second target to-be-calibrated parameter set comprising at least one parameter in the first to-be-calibrated parameter set; calibrating to-be-calibrated parameters in the second target to-be-calibrated parameter set to obtain a second calibrated parameter set.

5. The method of calibrating a surveying instrument according to any of claims 1-3, characterized in that, The method comprises: receiving a calibration instruction triggered by a user interaction module of a to-be-calibrated device, the calibration instruction being used to determine the first target to-be-calibrated parameter set and a calibration strategy for to-be-calibrated parameters in the first target to-be-calibrated parameter set; The first calibrated parameter set and the first to-be-calibrated parameter set are obtained based on the detected abnormal event in the initial calibration process of the to-be-calibrated parameters in the first target to-be-calibrated parameter set. In response to the calibration instruction, the first calibrated parameter set and the first to-be-calibrated parameter set are obtained according to the calibration strategy and the detected abnormal event in the initial calibration process of the to-be-calibrated parameters in the first target to-be-calibrated parameter set.

6. The method of calibrating a surveying instrument according to claim 5, wherein, After receiving the calibration instruction triggered by the user interaction module of the to-be-calibrated device, the method further comprises: After detecting the abnormal event in the initial calibration process of the to-be-calibrated parameters in the first target to-be-calibrated parameter set, the indication information is output according to the calibration strategy and the detected abnormal event; the indication information is used to indicate the end of calibration of the to-be-calibrated parameters in the first target to-be-calibrated parameter set.

7. A device to be calibrated, characterized by Comprise: The first acquisition module is used to acquire the first target to-be-calibrated parameter set; The first calibration module is used to calibrate each to-be-calibrated item in the current to-be-calibrated item set in turn; When an abnormal event is detected in the calibration process, isolation processing is performed; the isolation processing comprises: determining one or more affected to-be-calibrated items affected by the abnormal event, and updating the current to-be-calibrated item set based on the one or more affected to-be-calibrated items; the current to-be-calibrated item set is initially a to-be-calibrated item set for calibrating the first target to-be-calibrated parameter set; each affected to-be-calibrated item is a to-be-calibrated item that depends on an affected calibrated parameter, and / or a to-be-calibrated item that will be affected by an affected uncalibrated parameter; Each to-be-calibrated item in the updated to-be-calibrated item set is calibrated, and when an abnormal event is detected in the calibration of each to-be-calibrated item in the updated to-be-calibrated item set, the isolation processing and the calibration process of each to-be-calibrated item in the updated to-be-calibrated item set are iteratively performed until the calibration of all to-be-calibrated items in the updated to-be-calibrated item set is completed, to obtain the first calibrated parameter set and the first to-be-calibrated parameter set; The first calibrated parameter set comprises a parameter set calibrated by the to-be-calibrated parameters in the first target to-be-calibrated parameter set that are not affected by the abnormal event, and the first to-be-calibrated parameter set comprises a parameter set in the first target to-be-calibrated parameter set that is affected by the abnormal event.

8. A device to be calibrated, characterized by Comprise: The memory is used to store a computer program; The processor is used to call the computer program in the memory, and execute the measurement instrument calibration method according to any one of claims 1-6.

9. A measuring instrument calibration device, characterized by Comprise: The user interaction module is used to acquire the first target to-be-calibrated parameter set; The decision execution module is used to calibrate each to-be-calibrated item in the current to-be-calibrated item set in turn; When an abnormal event is detected in the calibration process, an isolation process is performed; the isolation process includes determining one or more affected to-be-calibrated items affected by the abnormal event, and updating the current to-be-calibrated item set based on the one or more affected to-be-calibrated items; the current to-be-calibrated item set is initially a to-be-calibrated item set for calibrating the first target to-be-calibrated parameter set; each affected to-be-calibrated item is a to-be-calibrated item that includes a dependent affected calibrated parameter, and / or a to-be-calibrated item that will be affected by an affected uncalibrated parameter; When an abnormal event is detected in the calibration process, an isolation process is performed; the isolation process includes determining one or more affected to-be-calibrated items affected by the abnormal event, and updating the current to-be-calibrated item set based on the one or more affected to-be-calibrated items; the current to-be-calibrated item set is initially a to-be-calibrated item set for calibrating the first target to-be-calibrated parameter set; each affected to-be-calibrated item is a to-be-calibrated item that includes a dependent affected calibrated parameter, and / or a to-be-calibrated item that will be affected by an affected uncalibrated parameter; The first calibrated parameter set includes a parameter set of to-be-calibrated parameters in the first target to-be-calibrated parameter set that are not affected by the abnormal event, and the first to-be-calibrated parameter set includes a parameter set of to-be-calibrated parameters in the first target to-be-calibrated parameter set that are affected by the abnormal event.

10. The measuring instrument calibrating apparatus according to claim 9, wherein Further comprising: An abnormal decision module configured to determine an execution strategy according to a calibration strategy and a detected abnormal event type; the calibration strategy includes a plurality of execution strategies, and the abnormal event type and the execution strategy have a corresponding relationship.

11. A device to be calibrated, characterized by Comprising: A device body; The measurement instrument calibration device of claim 9 or 10, in communication with the device body.

12. A measurement instrument calibration system characterized by, Comprising: A signal source; The to-be-calibrated device of claim 11, in communication with the signal source, the signal source providing a calibration signal for the device body.

13. A measurement instrument calibration system characterized by, Comprising: A signal source; A to-be-calibrated device, in communication with the signal source, the signal source providing a calibration signal for the to-be-calibrated device ； The measurement instrument calibration device of claim 9 or 10, in communication with both the signal source and the to-be-calibrated device.

14. A computer-readable storage medium, characterized in that, The computer-readable storage medium includes instructions; when the instructions run on the processor, the processor performs the measurement instrument calibration method of any one of claims 1-6.

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