Transmitting / receiving device and method for characterizing transmitting / receiving device
By introducing test devices and operating devices into the sending/receiving equipment to generate and process test signals, the problem of equipment self-diagnosis and adjustment is solved, the equipment's instant self-testing and fault diagnosis are realized, and the equipment's operating stability and customer experience are improved.
Patent Information
- Application Number
- CN202510324687.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Priority Date
- 2024-03-20
- Filing Date
- 2025-03-19
- Publication Date
- 2025-09-23
AI Technical Summary
Existing sending/receiving equipment is difficult to self-diagnose and adjust after long-term use and needs to be sent to the laboratory regularly for measurement and parameter reset, affecting the customer experience.
A test device is introduced into the transmitting/receiving equipment to characterize the parameters of the analog part by generating and processing the test signal, to achieve self-testing and fault diagnosis, including the combination of digital and analog parts, using the manipulator to simulate the object detection environment, and to generate and analyze electromagnetic signals.
It enables instant self-testing and fault diagnosis during equipment use, reduces the need for laboratory measurements, and improves equipment operational stability and customer satisfaction.
Smart Images
Figure CN120686205A_ABST
Abstract
Description
Technical Field
[0001] The present application relates to a transmitting / receiving device for transmitting and receiving electromagnetic signals and a method for characterizing a transmitting / receiving device for transmitting and receiving electromagnetic signals. Background Art
[0002] The applicant has disclosed a transceiver device that can be used as a simulation system for sensors for object detection. Such sensors for object detection can be designed, for example, as vehicle sensors that operate with electromagnetic waves. Examples of such vehicle sensors are radar sensors or lidar sensors. The sensors for object detection are tested by the transceiver device receiving electromagnetic signals from the sensors for object detection and returning electromagnetic signals to the sensors. These electromagnetic signals are perceived by the sensors for object detection as echoes of objects in road traffic. Summary of the Invention
[0003] In a transceiver for transmitting and receiving electromagnetic signals, the electromagnetic signals are provided for exchanging with a sensor for object detection. For example, a radar signal may be provided as the electromagnetic signal.
[0004] The transmitting / receiving device includes an analog portion, wherein the analog portion includes a transmitting portion and a receiving portion. The testing device is configured to transmit a first test signal to the transmitting portion. The transmitting portion is configured to generate a first electromagnetic signal from the first test signal and transmit the first electromagnetic signal. The receiving portion is configured to receive a second electromagnetic signal derived from the first electromagnetic signal, convert the second electromagnetic signal into a second test signal, and transmit the second test signal to the testing device. The testing device is configured to determine at least one parameter characterizing the analog portion based on the first test signal and the second test signal.
[0005] Such a test device can be used to characterize the analog part of a transceiver. In one embodiment, the test device can be part of the transceiver, thereby enabling a self-test of the analog part. In particular, the test device can have a digital part that generates the first and second test signals as digital signals.
[0006] In a method for characterizing a transceiver device for transmitting and receiving electromagnetic signals, the electromagnetic signals are provided for exchanging signals with a sensor for object detection, and the transceiver device has an analog part with a transmitting part and a receiving part. The method comprises:
[0007] The testing device transmits a first test signal to the transmitting part.
[0008] The transmitting section generates a first electromagnetic signal from a first test signal and transmits the first electromagnetic signal.
[0009] The receiving portion receives a second electromagnetic signal derived from the first electromagnetic signal, converts the second electromagnetic signal into a second test signal, and transmits the second test signal to the test device.
[0010] The test device determines at least one parameter characterizing the analog part based on the first and second test signals.
[0011] This makes it possible to characterize the analog part of the transceiver device using the test device and to determine and provide at least one parameter characterizing the analog part. The one or more characterizing parameters can then be used, for example, in exchanging electromagnetic signals with a sensor for object detection.
[0012] In various embodiments, the test device can be part of the transceiver, thereby enabling the transceiver to perform a self-test of its analog part. In particular, the first and second test signals can be generated as digital signals by the test device.
[0013] This allows for more consistent operation of the analog part over a longer period of time. This also facilitates fault diagnosis. In particular, the transceiver device or the corresponding method can potentially eliminate the need to re-measure such a transceiver device in a laboratory after a certain period of time and, if necessary, re-adjust parameters. This offers a high level of customer benefit, as the transceiver device no longer has to be taken to the laboratory, and the analog part can instead be characterized in the application.
[0014] A transceiver for transmitting and receiving electromagnetic signals may include a simulation device that is connected to the object detection sensor to be tested via the electromagnetic signals. The simulation device can then, for example, serve as an object simulator for the object detection sensor. To this end, in addition to the necessary electronics in the transmitter for generating the electromagnetic signals and the receiver for receiving the electromagnetic signals, the transceiver may also include a control device that analyzes the received electromagnetic signals to test the object detection sensor based on these and other data. This additional data may include, for example, a predetermined object scenario, i.e., the type of object to be located in the simulated environment used by the object detection sensor. The data may also include the direction of movement and speed, as well as any changes in speed. The electromagnetic signal may be a radar signal or a lidar signal. The object detection sensor may accordingly be a radar sensor or a lidar sensor. To transmit and receive optical signals, the transmitter and receiver may include corresponding optoelectronic converters. For example, the transmitter may include a laser, while the receiver may include light-sensitive components.
[0015] The operating device can in particular include a test device. In various embodiments, the operating device is designed as a digital part that, in addition to the tasks of the operating device, can also perform the tasks of the test device. For example, a test or characterization operating mode can be provided, in which the operating device then functions as a test device. For example, a simulation operating mode can be provided, in which the operating device then functions as a simulation device and, in particular, as an object simulator for a sensor used for object detection.
[0016] The transmitting / receiving device has an analog part, which includes a transmitting part and a receiving part. The transmitting part is configured to generate a first electromagnetic signal, such as a high-frequency signal (e.g., in the microwave range) or a lidar signal or optical signal, from a first test signal and transmit it. To this end, the transmitting part may include an amplifier, a mixer, and a filter. The mixer is configured, for example, to modulate the frequency of the electromagnetic signal onto a signal at the transmission frequency. If the first test signal is generated as a digital signal by the test device, it can be converted into an analog signal by a digital-to-analog converter, which can be processed by the transmitting part. The receiving part is correspondingly configured to filter, amplify, and mix the second electromagnetic signal to an intermediate frequency that enables simpler processing of the electromagnetic signal. If the test device has a digital part, an analog-to-digital converter may also be provided to convert the second electromagnetic signal into a digital signal, which can be digitally processed by the test device as the second test signal.
[0017] A first test signal is transmitted to the transmitting part by a testing device. The first test signal can be generated by the testing device, for example, or read from a memory. In various embodiments, the testing device can include or be configured as a digital part. The digital part includes digital circuits, for example, including one or more processors. However, it is also possible that the first test signal is present in an analog form and transmitted to the transmitting part in an analog form. The first test signal can be supplied to the transmitting part externally via the testing device, for example, or read from a memory by the testing device.
[0018] The test device then determines at least one parameter characterizing the analog part based on the first and second test signals. If the test signals are also analog, corresponding evaluation circuits are provided, for example. If the test device is digital, the first and second test signals can also be digital, and the evaluation of the first and second test signals to determine the characteristic parameters can then be performed by corresponding digital circuits or by algorithms executed on a processing unit. In particular, the test device can also be configured to be removed from the transceiver device, or the test device and the transceiver device can be arranged in a single unit.
[0019] Characteristic parameters can be, for example, parameters for describing the signal properties of electrical and / or optical components and networks using wave parameters. However, other alternative values can also be used as characteristic parameters that describe the transmission properties of the analog part.
[0020] In one embodiment, the test device is configured to determine and store at least one operating parameter of the analog component based on the at least one characterizing parameter, wherein the at least one operating parameter includes an amplification value, a delay, and / or an isolation value. That is, at least one operating parameter is determined from the at least one parameter characterizing the analog component and stored accordingly, wherein the operating parameter includes amplification, a delay, or an isolation value. Amplification refers to increasing or attenuating the amplitude of the first and / or second electromagnetic signal. Delay refers to a time delay of the first and / or second electromagnetic signal. Isolation refers to the degree of crosstalk between a transmission path and a reception path. The transmission path refers to the signal path through which the first electromagnetic signal passes in the transmission component. The reception path refers to the signal path through which the second electromagnetic signal passes in the reception component.
[0021] Over time, the analog part may lose its originally set amplification due to, for example, aging or temperature effects, or may have a different delay than originally set. Alternatively, the isolation between the transmitter and receiver may change. The described transceiver device with a test device and the described method allow the determined operating parameters to be taken into account in the following use of the transceiver device. This allows for consistently consistent performance of the analog part.
[0022] In various embodiments, the electromagnetic signal provided for exchange with the sensor for object detection may be dependent on the at least one characterizing parameter and / or the at least one operating parameter. For example, the electromagnetic signal may be dependent on the at least one operating parameter in terms of its amplitude, phase, and / or frequency.
[0023] In various embodiments, the test device is configured to determine the at least one characterizing parameter using a system identifier of the analog part while applying first and second test signals. The system identifier here refers to the systematic determination of a qualitative relationship between an output variable and an input variable of the system. The input variable is the first test signal. The output variable is the second test signal, and the system is the analog part. The mathematical method employed can be deterministic or stochastic. For example, a neural network can also be used.
[0024] The system identification can be used to determine characteristic parameters, such as the following: the transmission coefficient provides information about the amplification or attenuation of the first test signal through the analog component. The scattering parameter provides information about the signal portion that crosstalks from the analog component's output to its input. The scattering parameter can also be called isolation. Isolation is related to the dynamic range of the analog component that can be utilized.
[0025] In one embodiment, the test device is configured to determine the at least one characterizing parameter in the frequency domain and transform it into the time domain. This embodiment has the advantage that some determinations in the time domain can be mathematically performed more simply than, for example, in the frequency domain.
[0026] Furthermore, it is proposed that the test device is configured to transform the at least one parameter characterizing the analog component from the frequency domain into the time domain and to ascertain the at least one operating parameter based on the at least one parameter characterizing the analog component transformed into the time domain.
[0027] In one embodiment, the second electromagnetic signal can be derived from the first electromagnetic signal using a predefined reflection criterion. The predefined reflection criterion can be used to create a predetermined environment so that the second electromagnetic signal is generated in a defined and known manner by the reflection. This allows for a simple device for determining the at least one parameter characterizing the analog component. This simplifies, in particular, how the transmitting / receiving device can be set up and configured proportionally to the defined reflection criterion in order to determine the at least one parameter characterizing the analog component.
[0028] Here, the predefined reflection criteria may include resistance matching, no load, short circuit, or reflection of the first electromagnetic signal on a reflector or a corner reflector. The resistance matching may be, for example, wave impedance matching. Predeterminable reflection may be achieved by the reflector or corner reflector.
[0029] By using a predefined reflection standard, the measurement can be attributed to said standard. This allows calibration or recalibration of the analog part.
[0030] In various embodiments, the transmitting / receiving device is configured to determine a crosstalk signal based on the at least one characterizing parameter when exchanging electromagnetic signals with a sensor for object detection. The crosstalk signal can optionally be compensated for by the transmitting / receiving device. Crosstalk signals can occur between the transmitting part and the receiving part. This represents an undesirable mutual influence of originally unrelated signal channels. Therefore, the interference signal can be determined and can compensate for an ideal situation. The crosstalk signal is particularly dependent on a scattering parameter and can be compensated based on the previously determined scattering parameter.
[0031] Different predefined reflection criteria can be defined by the distance of the corner reflector from the transceiver. This makes it possible to achieve the most accurate possible characterization of the analog component by repeated measurements on the corner reflector, which is repeatedly positioned at different distances from the transceiver.
[0032] The method can be implemented using a predefined reflection standard. Alternatively or additionally, the method can be implemented multiple times in succession using different predefined reflection standards. It is then possible to work with a single predefined reflection standard or to work with different reflection standards in succession, depending on the desired reliability or accuracy. When using system identification, for example, three characterizing parameters or a complete error network can be determined using three predefined reflection standards. BRIEF DESCRIPTION OF THE DRAWINGS
[0033] Various embodiments of the present application are shown in the accompanying drawings and further explained in the following description. In the drawings:
[0034] Figure 1 A block diagram showing a transmitting / receiving device with a test apparatus;
[0035] Figure 2 Shows a test environment with a sending / receiving device;
[0036] Figure 3 A flow chart illustrating a method for characterizing a transmitting / receiving device;
[0037] Figure 4A simplified equivalent circuit diagram of a transmitting / receiving device with a test device is shown;
[0038] Figure 5 An amplitude-frequency diagram is shown;
[0039] Figure 6 An amplitude-time diagram is shown;
[0040] Figure 7 showing a simulated environment; and
[0041] Figure 8 Another block diagram of the transmitting / receiving device in a simulation operating mode is shown. DETAILED DESCRIPTION
[0042] In the drawings, the same reference numerals are used for the same or similar elements. The illustrations in the drawings may not be to scale.
[0043] Figure 1 The block diagram shows a transceiver 10 having an analog part ANA and a test device DIG. In the exemplary embodiment shown, the test device DIG is designed as the digital part of the transceiver 10.
[0044] If the transmitting / receiving device 10 is in the simulation operating mode ( Figure 7 、 Figure 8 ), the test device DIG then simultaneously serves as a simulation device for the object simulation.
[0045] exist Figure 1 FIG. 1 shows a transmitting / receiving device 10 in a characterization operating mode. In the characterization operating mode, at least one characterization parameter SXX, e of the analog part ANA is determined. 01 e 10 、e 11 .
[0046] The analog part ANA has a coupler KO, via which the electromagnetic signal is transmitted to the reflection standard 18. The analog part ANA is designed monostatically, meaning it has a single interface, the coupler KO, through which both the transmit signal, the first electromagnetic signal HF1, and the receive signal, the second electromagnetic signal HF2, are transmitted. The coupler KO ensures that the two signals can be separated from one another. A reference plane RP is provided downstream of the coupler KO on the side facing away from the analog part ANA. The reference plane RP is an imaginary surface, to which the characteristic and operating parameters, which are calculated or, in this case, measured (particularly for system identification), and determined, are related.
[0047] In the test device DIG, a first test signal TS1 is generated by a signal generator 14. Generation by the signal generator 14 includes, optionally, loading the first test signal TS1 from a memory 16 according to a predetermined setting. Optionally, the signal generator can also modify the first test signal TS1 loaded from the memory 16. Generation by the signal generator 14 includes, optionally, generating the first test signal TS1 as required, for example, by the signal generator 14. Generation of the first test signal TS1 can be controlled, for example, by the processor 12 of the test device DIG. The first test signal TS1 is transmitted to a digital-to-analog converter DAC, which connects the test device DIG to the analog part ANA. Here, the digital-to-analog converter DAC is assigned to the analog part ANA. However, it is also possible to assign it to the test device DIG or to provide it as a component of the transmit / receive device 10 itself.
[0048] The first test signal TS1 is also transmitted to the processor 12. The processor 12 determines the at least one parameter SXX, e XX, which characterizes the analog part ANA, using the first test signal TS1 and the second test signal TS2. 01 e 10 、e 11 In order to obtain the at least one parameter SXX, e characterizing the simulation part ANA 01 e 10 、e 11 , the processor performs, for example, a system identification by applying the first test signal TS1 and the second test signal TS2 .
[0049] The first test signal TS1, converted to an analog signal by the digital-to-analog converter DAC, is amplified by amplifier V2 in the transmit section TX and converted into a high-frequency first electromagnetic signal HF1 in the transmit converter TX-SCC. Additional components, such as a mixer, may also be provided in the signal path. For reasons of clarity, the mixer is not included in the figure. In the transmit converter TX-SCC, the first test signal TS1, converted to an analog signal, is mixed up to a higher frequency, for example, by the mixer. The first electromagnetic signal HF1 is then transmitted to the coupler KO. The coupler KO then outputs the first electromagnetic signal HF1 to a reflection standard 18. A second electromagnetic signal HF2 is derived from the first electromagnetic signal HF1 via the reflection standard 18. This signal is coupled into the analog section ANA via the coupler KO. The second electromagnetic signal then reaches the receive section RX. In the receive converter RX-SCC, the second electromagnetic signal HF2 is mixed down to an intermediate frequency. The thus converted signal is then amplified by amplifier V1 and reaches the analog-to-digital converter ADC, which digitizes the second electromagnetic signal HF2 and outputs it as the second test signal TS2 to the test device DIG. Furthermore, further components, such as mixers, which are not included in the figures, may be provided in the signal path.
[0050] The second test signal TS2 arrives in the test device DIG in the processor 12 of the test device DIG. The processor 12 implements the method for characterizing the analog part ANA and derives the at least one parameter SXX, e from the first test signal TS1 and the second test signal TS2. 01 e 10 、e 11 , which characterizes the analog part ANA. The processor 12 can store intermediate results, but also the final results, in the memory 16. The processor 12 can determine the characterizing parameters SXX, e in the frequency domain, for example. 01 e 10 、e 11 The data are then transformed into the time domain. The operating parameters can then be determined from the data thus obtained.
[0051] Figure 2 A test environment 20 is shown with a transceiver 10 having an antenna 22 for transmitting and receiving a first electromagnetic signal HF1 and a second electromagnetic signal HF2. In the test environment, the transceiver 10 is operated in a characterization operating mode.
[0052] A first electromagnetic signal HF1 is transmitted in the direction of the corner reflector KF. Reflection occurs at the corner reflector KF, so that a reflected second electromagnetic signal HF2 is generated from the first electromagnetic signal HF1. This is reflected in the direction of the transmitting / receiving device 10. The second electromagnetic signal HF2 is received by the antenna 22 and processed in the manner described above in order to determine the at least one parameter SXX, e that characterizes the analog part. 01 e 10 、e 11 .
[0053] Instead of the corner reflector KF, another reflection standard 18 can also be provided, such as another type of reflector, a resistor matching or a no-load or short circuit. The resistor matching, no-load or short circuit can be connected directly to the coupler KO, so that the antenna 22 is unnecessary for the reflection standard 18.
[0054] In particular, it is also possible to carry out a plurality of measurements in succession with different reflection standards 18. With a plurality of different reflection standards 18, a plurality of unknown characterizing parameters SXX, e can be determined with greater accuracy. 01 e 10 、e 11 .
[0055] In particular, it is also possible to carry out a plurality of measurements in succession in which the corner reflector KF is at different distances from the transceiver 10. If the corner reflector KF is at a different distance from the transceiver 10, then the corner reflector corresponds to a different reflection standard 18 in this case.
[0056] Figure 3 A flow chart of a method for characterizing a transceiver 10 for transmitting and receiving electromagnetic signals HF1 , HF2 , in particular an analog part ANA of the transceiver 10 , is shown.
[0057] In method step 300, the testing device DIG generates a first test signal TS1 and transmits it to the transmission part TX. The first test signal TS1 can be, for example, a sinusoidal signal which is used for repeated measurements with different frequencies.
[0058] In method step 301, the transmit part TX generates a first electromagnetic signal HF1 from the first test signal TS1. To this end, the first test signal TS1 is first converted to an analog signal by a digital-to-analog converter DAC, amplified by an amplifier V2, and converted into the first electromagnetic signal HF1 by a transmit converter TX-SCC. Furthermore, the signal path may include further components, such as a mixer.
[0059] In method step 302 , a first electromagnetic signal HF1 is transmitted via the coupler KO and optionally via the antenna 22 .
[0060] In method step 303, the receiving part RX receives a second electromagnetic signal HF2 derived from the first electromagnetic signal HF1. The derivation is performed by means of a predefined reflection criterion 18. The derivation, ie, the conversion of the first electromagnetic signal HF1 into the second electromagnetic signal HF2, is known by means of the predefined reflection criterion 18.
[0061] In method step 304, the receiving part RX converts the second electromagnetic signal HF2 into a second test signal TS2. The second test signal TS2 is transmitted to the testing device DIG.
[0062] In method step 305, the at least one parameter SXX, e , which characterizes the analog part ANA, is then determined based on the first test signal TS1 and the second test signal TS2. 01 e 10 、e 11 .
[0063] Figure 4 The transmitting / receiving device 10 is shown in the equivalent circuit diagram. The analog part ANA is shown here by the system equivalent circuit diagram. The first test signal TS1 is again transmitted to the analog part ANA by the test device DIG. The analog part ANA is characterized in terms of system identification by the scattering parameter SXX and the further characteristic parameter e 01 e 10 、e 11 representation.
[0064] The first test signal TS1 passes through the analog part ANA and is output as a first electromagnetic signal HF1 on the reference plane RP. The first electromagnetic signal HF1 is converted into a second electromagnetic signal HF2 by the reflection standard 18. The second electromagnetic signal HF2 is derived from the first electromagnetic signal HF1 by reflection on the reflection standard 18.
[0065] The second electromagnetic signal HF2 is coupled in turn into the analog part ANA and subsequently reaches the testing device DIG as a second test signal TS2.
[0066] The performance of the simulation part ANA in transmitting the first test signal TS1 and the second test signal TS2 is characterized by the scattering parameter SXX and the further characteristic parameter e 01 e 10 、e 11 Characterization. The performance of the characterization simulation part ANA is also described in the simulation operating mode ( Figure 7 、 Figure 8 The determined parameters can therefore be used in the simulation operating mode to improve the accuracy of the object of the simulation of the first electromagnetic signal HF1 and the second electromagnetic signal HF2.
[0067] Figure 5 The graph of amplitude and frequency is shown. The curve below describes the scattering parameter SXX, which describes the isolation loss from the transmit path to the receive path. It can be seen that the scattering parameter SXX varies with frequency. The scattering parameter e 01 e 10 , SXX also varies with frequency. However, the operating parameters of the analog ANA cannot be directly inferred from the graph.
[0068] Figure 6 The scattering parameters SXX and the parameters e for further characterization are shown. 01 e 10 The amplitude time diagram of one of the above is shown. It can be seen that the parameters SXX, e 01 e 10 The local maximum of Figure 6 The temporal representation of the parameters in ANA can already be visually inferred by the simulation part ANA they represent.
[0069] For example, it can be seen that the scattering parameter SXX has two local maxima. The isolation is characterized by the scattering parameter SXX. A maximum value corresponds to a significant isolation weakness. It can be seen that the maximum value of the scattering parameter SXX is located in the reference plane RP. This allows one to infer an isolation weakness at the output of the analog part ANA. Another maximum value of the scattering parameter SXX is located within the analog part ANA. The exemplary curve of the scattering parameter SXX shown thus allows one to infer a point within the analog part ANA where the isolation is low.
[0070] Another characterizing parameter e 01 e 10 It also has a maximum value in the reference plane. Another characterizing parameter e 01 e 10 The maximum of the curve here describes the operating parameters of the system's amplification and delay.
[0071] Figure 7A simulation environment 70 is shown, which shows a transmitting / receiving device 10, which includes an antenna 22 for transmitting and receiving a first electromagnetic signal HF1 and a second electromagnetic signal HF2. A sensor for object detection OD is also included, which transmits the second electromagnetic signal HF2 and, in response, receives the first electromagnetic signal HF1. The received electromagnetic signal HF1 is detected by the sensor for object detection OD as an echo of the second electromagnetic signal HF2 it has emitted. This echo is detected, for example, as a reflection from a simulated object in road traffic. The sensor for object detection OD can be a radar sensor. In the simulation environment 70 shown, the transmitting / receiving device 10 is in a simulation operating mode. The transmitting / receiving device exchanges electromagnetic signals HF1 and HF2 with the sensor for object detection OD. An environment with objects is simulated for the sensor for object detection OD, allowing the sensor to be tested.
[0072] Figure 8 A further block diagram shows a transceiver 10 comprising a test device DIG and an analog part ANA. The transceiver 10 is operated in an analog operating mode.
[0073] The analog part ANA has a transmitting part TX and a receiving part RX as well as a coupler KO. An antenna 22 is connected to the coupler KO, via which the second electromagnetic signal HF2 can be received by the sensor for object detection OD and the first electromagnetic signal HF1 can be transmitted to the sensor for object detection.
[0074] The received second electromagnetic signal HF2 is received by the receiving part RX and output as a first digital signal DS1 to the testing device via the analog-to-digital converter ADC.
[0075] The test device DIG is used as a manipulation device to simulate an object used by a sensor for object detection OD. To simulate the object, the test device DIG receives a first digital signal DS1. The first digital signal DS1 is modified by a processor 12 of the test device DIG and output as a second digital signal DS2.
[0076] The second digital signal DS2 is fed via a digital-to-analog converter DAC into the transmission part TX and is transmitted by it as a first electromagnetic signal HF1 .
[0077] The object is simulated by changing the first digital signal in processor 12. The change is carried out in such a way that it has an effect in first electromagnetic signal HF1, for example, by a change in phase and / or amplitude, as is caused by an object in road traffic.
[0078] Additionally Figure 8 , a crosstalk signal 80 is shown, since crosstalk can occur between the transmit part TX and the receive part RX and thus interfere with the functioning of the transmit / receive device 10. Using the scattering parameter SXX, the crosstalk signal 80 can be determined while the transmit / receive device 10 is operating in analog mode. This can be taken into account and optionally compensated for in the generation of the second digital signal. Compensation can be achieved, for example, by generating a signal with a 180° phase shift, which can cancel or at least reduce interference signals generated by the crosstalk signal.
[0079] Reference Signs List
[0080] 10 sending / receiving devices
[0081] 12 processors
[0082] 14Signal generator
[0083] 16 memory
[0084] 18 reflection standards
[0085] 20Test Environment
[0086] 22 antennas
[0087] 70 simulation environments
[0088] 80 crosstalk signal
[0089] HF1, HF2 electromagnetic signals
[0090] KO coupler
[0091] RP reference plane
[0092] TS1 and TS2 test signals
[0093] V1, V2 amplifiers
[0094] TX-SCC Transmit Converter
[0095] RX-SCC Receive Converter
[0096] TX sending part
[0097] RX receiving part
[0098] DIG test device
[0099] ANA simulation part
[0100] ADC analog-to-digital converter
[0101] DAC digital-to-analog converter
[0102] KF corner reflector
[0103] OD sensors for object detection
[0104] SXX scattering parameters
[0105] e 01 e 10 、e 11 Additional characterization parameters
[0106] DS1 and DS2 digital signals
[0107] 300-305 Method Steps
[0108] fFrequency
[0109] t time
Claims
1. A transmitting / receiving device (10) for transmitting and receiving electromagnetic signals (HF1, HF2), wherein: The electromagnetic signals (HF1, HF2) are provided for exchanging with a sensor for object detection (OD), the transmitting / receiving device (10) having an analog part (ANA) with a transmitting part (TX) and a receiving part (RX), The test device (DIG) is configured to transmit a first test signal (TS1) to the transmitting part (TX), The transmitting part (TX) is configured to generate a first electromagnetic signal (HF1) from a first test signal (TS1) and to transmit the first electromagnetic signal, The receiving part (RX) is configured to receive a second electromagnetic signal (HF2) derived from the first electromagnetic signal (HF1), convert the second electromagnetic signal into a second test signal (TS2) and transmit the second test signal to a test device (DIG), The test device (DIG) is configured to determine at least one parameter (SXX, e) characterizing an analog part (ANA) based on a first test signal (TS1) and a second test signal (TS2) 01 e 10 、e 11 ).
2. The transmitting / receiving device (10) according to claim 1, wherein The test device (DIG) is configured to determine the value of the at least one characterizing parameter (SXX, e 01 e 10 、e 11 ) Obtain and store at least one operating parameter of the analog part, wherein the at least one operating parameter includes an amplification value and / or a delay and / or an isolation degree.
3. The transmitting / receiving device (10) according to claim 1 or 2, wherein: The electromagnetic signal (HF1, HF2) is configured to be exchanged with a sensor for object detection (OD) and the at least one characterizing parameter (SXX, e 01 e 10 、e 11 ) and / or at least one operating parameter.
4. The transmitting / receiving device (10) according to one of the preceding claims, wherein: The test device (DIG) is configured to determine the at least one characterizing parameter (SXX, e) by means of a system identifier of an analog part (ANA) when applying a first test signal (T1) and a second test signal (T2). 01 e 10 、e 11 ).
5. The transmitting / receiving device (10) according to one of the preceding claims, wherein The test device (DIG) is configured to determine the at least one characterizing parameter (SXX, e 01 e 10 、e 11 ).
6. The transmitting / receiving device (10) according to claim 5, wherein The test device (DIG) is configured to measure the at least one characterizing parameter (SXX, e 01 e 10 、e 11 ) is transformed from the frequency domain into the time domain, and according to the at least one characterizing parameter (SXX, e 01 e 10 、e 11 ) to obtain the at least one operating parameter.
7. The transmitting / receiving device (10) according to one of the preceding claims, wherein: The second electromagnetic signal (HF2) can be derived from the first electromagnetic signal (HF1) by means of a predefined reflection criterion (18).
8. The transmitting / receiving device (10) according to claim 7, wherein The predefined reflection criteria (18) include resistance matching or no load or short circuit or reflection of the first electromagnetic signal (HF1) on a reflector or on a corner reflector (KF).
9. The transmitting / receiving device (10) according to one of the preceding claims, wherein: The transmitting / receiving device (10) is configured to exchange electromagnetic signals (HF1, HF2) with a sensor for object detection (OD) according to the characterizing parameters (SXX, e 01 e 10 、e 11 ) to determine and, in particular, compensate for the crosstalk signal (80).
10. Method for characterizing a transmitting / receiving device (10) for transmitting and receiving electromagnetic signals (HF1, HF2), wherein: The electromagnetic signals (HF1, HF2) are provided for exchanging with a sensor for object detection (OD), the transmitting / receiving device (10) has an analog part (ANA) having a transmitting part (TX) and a receiving part (RX), wherein the method comprises: The test device (DIG) transmits a first test signal (TS1) to the transmitting part (TX), The transmitting part (TX) generates a first electromagnetic signal (HF1) from a first test signal (TS1) and transmits the first electromagnetic signal (HF1), The receiving part (RX) receives a second electromagnetic signal (HF2) derived from the first electromagnetic signal (HF1), converts the second electromagnetic signal (HF2) into a second test signal (TS2), and transmits the second test signal (TS2) to the test device (DIG), The test device (DIG) obtains at least one parameter (SXX, e) characterizing the analog part (ANA) based on the first test signal (TS1) and the second test signal (TS2). 01 e 10 、e 11 ).
11. The method according to claim 10, wherein: According to the at least one characterizing parameter (SXX, e 01 e 10 、e 11 ) determine at least one operating parameter, wherein the at least one operating parameter includes an amplification value and / or a delay and / or an isolation.
12. The method according to claim 10 or 11, wherein: The at least one characterizing parameter (SXX, e 01 e 10 、e 11 ) is determined by means of an analog part (ANA) using a first test signal (T1) and a second test signal (T2).
13. The method according to any one of claims 10 to 12, wherein: Determine the at least one characterizing parameter (SXX, e) in the frequency domain 01 e 10 、e 11 ).
14. The method according to claim 13, wherein The at least one characterizing parameter (SXX, e 01 e 10 、e 11 ) is transformed from the frequency domain into the time domain, and according to the at least one characterizing parameter (SXX, e 01 e 10 、e 11 ) to obtain the at least one operating parameter.
15. The method according to any one of claims 10 to 14, wherein: The second electromagnetic signal (HF2) is derived from the first electromagnetic signal (HF1) by means of a predefined reflection criterion (18), wherein the predefined reflection criterion (18) comprises resistance matching or no load or short circuit or reflection of the first electromagnetic signal (HF1) on a corner reflector (KF).
16. The method according to claim 15, wherein Different predefined reflection criteria (18) are defined by the distance of the corner reflector (KF) from the transmitting / receiving device (10).
17. The method according to claim 15 or 16, wherein The method is carried out with one predefined reflection criterion (18) or a plurality of times in succession, each with different predefined reflection criteria (18).