Deposition layer thickness determination method, apparatus, device, and medium

Abstract

Embodiments of the present disclosure relate to a method, device, equipment and medium for determining thickness of a sedimentary layer, the method comprising: obtaining an initial sedimentary layer model corresponding to a geological area; adjusting the initial sedimentary layer model according to first Bouguer gravity data of the geological area and a first thickness of a sedimentary layer at a calibration position in the geological area to obtain a target sedimentary layer model; wherein the first Bouguer gravity data is determined by observing the sedimentary layer of the geological area, and the first thickness of the sedimentary layer is determined by measuring the sedimentary layer at the calibration position; and determining a thickness of a sedimentary layer at a to-be-detected position in the geological area according to the target sedimentary layer model. Embodiments of the present disclosure significantly reduce the uncertainty of the inversion process, improve the inversion accuracy and the geological reasonableness of the finally determined model, and achieve a higher accuracy of the thickness of the sedimentary layer in a larger area at a lower cost.

Description

TECHNICAL FIELD

[0001] The present disclosure relates to the technical field of geological exploration, and in particular to a sediment layer thickness determination method, device, equipment and medium. BACKGROUND

[0002] The three-dimensional spatial variation data of the sediment layer thickness in the foreland thrust belt has important significance in many fields such as geological structure analysis, seismic risk assessment, resource exploration, engineering construction, and environmental geological research. The data reveals the sedimentary evolution process, guides the influence on seismic wave propagation and ground stability, and is important basic data to support energy security, disaster prevention and control, and engineering site design.

[0003] In the scene of seismic risk assessment, it is necessary to obtain accurate data of the sediment layer thickness in a large area, but in the related technology, it is difficult to obtain relatively accurate sediment layer thickness while covering a large area. SUMMARY

[0004] In order to solve the above technical problems or at least partially solve the above technical problems, the present disclosure provides a sediment layer thickness determination method, device, equipment and medium.

[0005] The present disclosure provides a sediment layer thickness determination method, comprising:

[0006] obtaining an initial sediment layer model corresponding to a geological area;

[0007] adjusting the initial sediment layer model according to first Bouguer gravity data of the geological area and first sediment layer thickness of a calibration position in the geological area to obtain a target sediment layer model; wherein the first Bouguer gravity data is determined by observing the sediment layer of the geological area, and the first sediment layer thickness is determined by measuring the sediment layer of the calibration position;

[0008] determining the sediment layer thickness of a to-be-detected position in the geological area according to the target sediment layer model.

[0009] The present disclosure also provides a sediment layer thickness determination device, comprising:

[0010] A first obtaining module is configured to obtain an initial sediment layer model corresponding to a geological area;

[0011] An adjusting module is configured to adjust the initial sediment layer model according to first Bouguer gravity data of the geological area and first sediment layer thickness of a calibration position in the geological area to obtain a target sediment layer model; wherein the first Bouguer gravity data is determined by observing the sediment layer of the geological area, and the first sediment layer thickness is determined by measuring the sediment layer of the calibration position.

[0012] determining a sedimentary layer thickness of a position to be detected in the geological area according to the target sedimentary layer model.

[0013] The embodiment of the present disclosure further provides an electronic device, which comprises a processor, a memory for storing executable instructions of the processor, and the processor is used for reading the executable instructions from the memory and executing the instructions to implement the sedimentary layer thickness determination method provided by the embodiment of the present disclosure.

[0014] The embodiment of the present disclosure further provides a computer readable storage medium, which stores a computer program used for executing the sedimentary layer thickness determination method provided by the embodiment of the present disclosure.

[0015] The technical scheme provided by the embodiment of the present disclosure has the following advantages compared with the prior art: the sedimentary layer thickness determination scheme provided by the embodiment of the present disclosure comprises: obtaining an initial sedimentary layer model corresponding to a geological area; adjusting the initial sedimentary layer model according to first Bouguer gravity data of the geological area and a first sedimentary layer thickness of a calibration position in the geological area to obtain a target sedimentary layer model; wherein the first Bouguer gravity data is determined by observing the sedimentary layer of the geological area, and the first sedimentary layer thickness is determined by measuring the sedimentary layer of the calibration position; and determining a sedimentary layer thickness of a position to be detected in the geological area according to the target sedimentary layer model. By using the above technical scheme, the initial sedimentary layer model is coarsely adjusted in a large range based on the initial sedimentary layer model, the smooth continuity of the model in a large range is improved, the initial sedimentary layer model is accurately adjusted and constrained at a specific position by using the first sedimentary layer thickness corresponding to the specific calibration position in the geological area, the target sedimentary layer model obtained can combine the first Bouguer gravity data caused by the density difference and match the measured first sedimentary layer thickness, the uncertainty of the inversion process is significantly reduced, the inversion accuracy and the geological reasonableness of the finally determined model are improved, and the sedimentary layer thickness with high accuracy is determined in a large area at a low cost. BRIEF DESCRIPTION OF DRAWINGS

[0016] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present disclosure and serve to explain the principles of the present disclosure together with the specification.

[0017] In order to more clearly illustrate the technical solutions in the embodiments of the present disclosure or the prior art, the following will briefly introduce the drawings needed to be used in the embodiments or prior art description. Obviously, for those skilled in the art, other drawings can also be obtained based on these drawings without any creative effort.

[0018] Figure 1 A flowchart of a deposition layer thickness determination method provided by an embodiment of the present disclosure is shown in the figure.

[0019] Figure 2 A flowchart of another deposition layer thickness determination method provided by an embodiment of the present disclosure is shown in the figure.

[0020] Figure 3 A schematic diagram of a first deposition layer thickness and updating a deposition layer model provided by an embodiment of the present disclosure is shown in the figure.

[0021] Figure 4 A schematic diagram of a deposition layer thickness determination method provided by an embodiment of the present disclosure is shown in the figure.

[0022] Figure 5 A structural schematic diagram of a deposition layer thickness determination device provided by an embodiment of the present disclosure is shown in the figure.

[0023] Figure 6 A structural schematic diagram of an electronic device provided by an embodiment of the present disclosure is shown in the figure. DETAILED DESCRIPTION

[0024] In order to more clearly illustrate the technical solutions in the embodiments of the present disclosure or the prior art, the following will briefly introduce the drawings needed to be used in the embodiments or prior art description. Obviously, for those skilled in the art, other drawings can also be obtained based on these drawings without any creative effort.

[0025] In the following description, many specific details are set forth in order to provide a thorough understanding of the present disclosure, but the present disclosure can also be implemented in other ways different from those described herein; obviously, the embodiments in the specification are only some of the embodiments of the present disclosure, not all the embodiments.

[0026] In the related art, the deposition layer thickness of the foreland thrust belt at a specific point can be obtained by drilling and the like. Although this method has high accuracy, the construction cost is high, and the point is sparse and difficult to reflect the three-dimensional change. In addition, the deposition layer thickness can also be obtained under certain conditions by remote sensing, geoelectricity and seismic receiving function and the like. The above-mentioned methods for determining the deposition layer thickness are all accurate detection for specific points, and it is difficult to cover a larger area.

[0027] In order to solve at least one of the above problems, an embodiment of the present disclosure provides a deposition layer thickness determination method, which will be introduced in combination with specific embodiments.

[0028] Figure 1 A flowchart of a deposition layer thickness determination method is provided for an embodiment of the present disclosure. The deposition layer thickness determination method can be applied to a deposition layer thickness determination apparatus. The deposition layer thickness determination apparatus can be implemented by software and / or hardware, and can be generally integrated in an electronic device. As shown in Figure 1 the deposition layer thickness determination method includes the following steps.

[0029] In step 101, an initial deposition layer model corresponding to a geological region is obtained.

[0030] The geological region can be a region to be determined for deposition layer thickness, and can be a region including a foreland thrust belt. The scope of the geological region is not limited in the embodiment, for example, the scope of the geological region can be consistent with the scope of a region where Bouguer gravity data is measured, and the geological region can be a relatively large region. The initial deposition layer model can be a pre-set three-dimensional model of a deposition layer, which can represent the initial set thickness of the deposition layer at different positions in the geological region, and can be understood as an initial model for model iteration of the deposition layer thickness. Optionally, the initial deposition layer model can represent the average thickness of the initially set deposition layer.

[0031] The deposition layer, also known as a foreland thrust belt deposition layer, is a rock layer formed by the deposition of sediments accumulated under the background of extrusion orogenesis and the formation and development of a foreland thrust belt. The foreland thrust belt can be a tectonic unit resulting from plate convergence and collision. The thickness of the deposition layer is approximately the same as the depth of the decollement layer.

[0032] In the embodiment of the present disclosure, according to the geological characteristics of the geological region, the initial deposition layer model can be generated for the deposition layer of the geological region in an artificial or automated manner.

[0033] In some embodiments of the present disclosure, obtaining the initial deposition layer model corresponding to the geological region includes: constructing the initial deposition layer model according to geological prior information of the geological region and a first deposition layer thickness.

[0034] The geological prior information can be geological information related to the deposition layer of the geological region obtained through preliminary work before the deposition layer thickness is determined. For example, the geological prior information can include the position of the surface exposed rock layer, etc. The first deposition layer thickness can be the deposition layer thickness of a calibration position determined by measurement. The calibration position can be a pre-calibrated position point in the geological region. The measurement method of the first deposition layer thickness is not limited in the embodiment. In an optional implementation, the first deposition layer thickness can be determined based on the seismic reflection profile technology, which can provide high-resolution subsurface horizon information.

[0035] Limited by data coverage, acquisition cost, etc., the first sediment layer thickness determined by the seismic reflection profile has limited coverage, and it is difficult to apply to large-scale seismic risk assessment work. The data directly determined by the seismic reflection profile technology is the imaging data in the travel time domain, which needs to be interpreted and identified to determine the corresponding interface position, and then determine the thickness boundary between each layer.

[0036] In this embodiment, the sediment layer thickness determination apparatus can display the first sediment layer thickness and the geological prior information to the user, and obtain an initial thickness model constructed by the user according to the first sediment layer thickness and the geological prior information. Alternatively, the sediment layer thickness determination apparatus can input the first sediment layer thickness and the geological prior information into a pre-set function, and the function outputs the corresponding thickness, and then constructs the initial thickness model based on the thickness output by the function.

[0037] In step 102, the initial sediment layer model is adjusted according to the first Bouguer gravity data of the geological region and the first sediment layer thickness of the calibration position in the geological region, and a target sediment layer model is obtained; wherein the first Bouguer gravity data is determined by observing the sediment layer in the geological region, and the first sediment layer thickness is determined by measuring the sediment layer at the calibration position.

[0038] The first Bouguer gravity data can be the Bouguer gravity anomaly data of the sediment layer in the geological region obtained by ground or satellite observation. The underground rock density structure can be inferred from the Bouguer gravity anomaly data. Specifically, different lithology or tectonic units have different density distribution, which will produce measurable abnormal signals in the gravity field. The Bouguer gravity anomaly data reflects the abnormal gravity field caused by the difference in underground density by excluding the influence of one or more of topography, seawater, and normal crust density distribution. Then, the underground structure can be estimated based on the Bouguer gravity anomaly data. The lithospheric structure can be quickly obtained from the Bouguer gravity anomaly data, which can be applied to scenarios such as crust-mantle boundary (also known as Moho surface) fluctuation, identification of low-density sedimentary basin, rock mass boundary, and estimation of crustal thickness. It is especially suitable for research in areas with extensive coverage and limited geological outcrops, but the results are greatly affected by the complexity of the underground structure, and the accuracy is limited. There are problems such as low spatial resolution, non-unique interpretation, and low accuracy.

[0039] The target sediment layer model can be a three-dimensional model of the sediment layer finally determined by model adjustment, and the final thickness of the sediment layer in the geological region at different positions can be represented by the target sediment layer model.

[0040] In the embodiments of the present disclosure, the sediment thickness determination apparatus can obtain first Bouguer gravity data determined by observation of the geological region, the first Bouguer gravity data representing the underground density anomaly of the geological region as a whole; and can also obtain first sediment thickness of the calibration position in the geological region, the first sediment thickness representing the more accurate sediment thickness determined by measurement of the specific calibration position in the geological region.

[0041] Further, the sediment thickness determination apparatus can take the first sediment thickness corresponding to the calibration position as a constraint, perform forward processing and inversion processing based on the first Bouguer gravity data, and perform model adjustment processing on the initial sediment model to obtain the target sediment model.

[0042] Figure 2 Another flowchart of a sediment thickness determination method provided by the embodiments of the present disclosure is shown in FIG. 2. In some embodiments of the present disclosure, the target sediment model is obtained by adjusting the initial sediment model according to the first Bouguer gravity data of the geological region and the first sediment thickness of the calibration position in the geological region, and the adjusting the initial sediment model comprises: Figure 2

[0043] In step 201, an intermediate sediment model is determined according to the initial sediment model.

[0044] The intermediate sediment model can be a sediment model determined in the process of adjusting the initial sediment model.

[0045] In the embodiments, the sediment thickness determination apparatus can determine a corresponding intermediate sediment model according to the initial sediment model according to different model adjustment methods.

[0046] In some embodiments of the present disclosure, the model adjustment method can be to adjust the model in different ways first, and then determine the final model from the multiple models obtained by adjustment. Accordingly, the intermediate sediment model is determined according to the initial sediment model, comprising: adjusting the initial sediment model by a plurality of thickness adjustment values respectively to obtain a plurality of intermediate sediment models corresponding to the plurality of thickness adjustment values.

[0047] The thickness adjustment value can be a numerical value for adjusting the thickness of the initial sediment model as a whole. The thickness adjustment value can be set according to the geological features of the geological region, which is not limited in the embodiments.

[0048] In the embodiments, the sediment thickness determination apparatus can obtain a plurality of thickness adjustment values set in advance, and for each thickness adjustment value, adjust the thickness of the intermediate sediment based on the thickness adjustment value to obtain an intermediate sediment model corresponding to the thickness adjustment value.

[0049] ​In some embodiments of the present disclosure, the model adjustment method adopted can be model iteration. Accordingly, the intermediate sedimentary layer model is determined according to the initial sedimentary layer model, which includes determining the initial sedimentary layer as the intermediate sedimentary layer model.

[0050] In the present embodiment, the initial sedimentary layer model is taken as the original model in the model iteration process, and the initial sedimentary layer model is determined as the intermediate sedimentary layer model.

[0051] In step 202, the intermediate sedimentary layer model is forward processed by a gravity field forward algorithm to obtain second Bouguer gravity data.

[0052] The gravity field forward algorithm can be an algorithm for converting a geological model into Bouguer gravity anomaly data. Since there is a significant density difference between the sedimentary layer and the underlying basement, the function relationship between the sedimentary layer thickness and the Bouguer gravity anomaly data can be established through the gravity field forward algorithm. The second Bouguer gravity data is the Bouguer gravity anomaly data determined by forward processing the sedimentary layer model of the geological region.

[0053] In the present embodiment, the sedimentary layer thickness determination device can take the intermediate sedimentary layer model as the input of the gravity field forward algorithm to obtain the second Bouguer gravity data corresponding to the intermediate sedimentary layer model output by the gravity field forward algorithm.

[0054] In step 203, the intermediate sedimentary layer model is perturbed and increased according to the first Bouguer gravity data and the second Bouguer gravity data to obtain an updated sedimentary layer model.

[0055] The updated sedimentary layer model can be a sedimentary layer model obtained by increasing the perturbation thickness on the basis of the intermediate sedimentary layer model. The perturbation thickness can be used to fine-tune the thickness on the basis of the intermediate sedimentary layer model.

[0056] In the present embodiment, the sedimentary layer thickness determination device can perform inversion processing based on the difference between the first Bouguer gravity data and the second Bouguer gravity data, and increase the perturbation thickness of the intermediate sedimentary layer model according to the inversion result to obtain the updated sedimentary layer model. The inversion processing can be a processing for inferring the spatial form of the underground density interface according to the Bouguer gravity anomaly data.

[0057] In some embodiments of the present disclosure, the intermediate sedimentary layer model is perturbed and increased according to the first Bouguer gravity data and the second Bouguer gravity data to obtain an updated sedimentary layer model, which includes:

[0058] The first Bouguer gravity data and the second Bouguer gravity data are subtracted to obtain Bouguer gravity residual data; the Bouguer gravity residual data is converted to obtain a sedimentary layer perturbation model corresponding to the geological region; and the intermediate sedimentary layer model is updated according to the sedimentary layer perturbation model to obtain the updated sedimentary layer model.

[0059] Among them, the Bouguer gravity residual data can characterize the difference between the actual measured Bouguer gravity data and the Bouguer gravity data obtained by forward modeling based on the sedimentary layer model. The sedimentary layer perturbation model can characterize the variation of sedimentary layer thickness based on the intermediate sedimentary layer model, and can record the thickness adjustments made to the intermediate sedimentary layer model at different locations.

[0060] In this embodiment, after determining the second Bouguer gravity data through forward modeling, the sediment layer thickness determination device can subtract the second Bouguer gravity data from the first Bouguer gravity data to obtain gravity residual data reflecting the difference between the two types of Bouguer gravity data. This gravity residual data is then transformed using a gravity field inversion algorithm to obtain a sediment layer perturbation model. Further, for each location, the sediment layer thickness recorded by the sediment layer perturbation model is superimposed on the sediment layer thickness recorded by the intermediate sediment layer model to obtain an updated sediment layer model.

[0061] In the above scheme, by comparing the observed Bouguer gravity data with the forward modeling Bouguer gravity data and then performing inversion processing, an updated sedimentary layer model with thickness adjustments at different locations of the intermediate sedimentary layer model is obtained, thus realizing fine adjustment of the sedimentary layer model through forward and inversion processing.

[0062] Step 204: Determine the thickness of the second sedimentary layer at the calibration location of the updated sedimentary layer model, and determine the thickness error value between the thickness of the second sedimentary layer and the thickness of the first sedimentary layer.

[0063] The second sedimentary layer thickness can be the sedimentary layer thickness at the calibration location determined by the sedimentary layer model. The thickness error value can characterize the magnitude of the error between the first and second sedimentary layer thicknesses corresponding to each calibration location, and is used to evaluate the degree of agreement between the updated sedimentary layer model and the actual sedimentary layer thickness in the geological region.

[0064] In this embodiment, the sedimentary layer thickness determination device can extract the second sedimentary layer thickness corresponding to the calibration location based on the updated sedimentary layer model, and compare the second sedimentary layer thickness with the first sedimentary layer thickness obtained from seismic interpretation using an error algorithm to obtain a thickness error value. This embodiment does not limit the error algorithm used; for example, the error algorithm can be a L2 norm error algorithm. Figure 3 A schematic diagram of a first sedimentary layer thickness and an updated sedimentary layer model provided for embodiments of this disclosure, as shown below. Figure 3 As shown, Figure 3 The dots in the diagram are used to indicate the calibration location, and the color intensity within the dots represents the thickness of the first deposition layer corresponding to that calibration location. Figure 3The background image in the figure is used to represent the updated sedimentary layer model, and the color depth of the background image represents the thickness of the sedimentary layer corresponding to each position in the updated sedimentary layer model. Through model iteration and other adjustment methods, the first sedimentary layer thickness and the sedimentary layer thickness corresponding to the updated sedimentary layer model at the same calibration position can be made to tend to be close in value.

[0065] In some embodiments of the present disclosure, a thickness error value of the second sedimentary layer thickness and the first sedimentary layer thickness is determined, including:

[0066] A plurality of wave velocities are obtained, for each wave velocity, a first sedimentary layer thickness corresponding to each calibration position is determined according to the wave velocity and the travel time information corresponding to each calibration position, the first sedimentary layer thickness corresponding to the same wave velocity is divided into the same sedimentary layer thickness group, the second sedimentary layer thickness and the thickness error candidate value corresponding to each sedimentary layer thickness group are calculated, and the minimum value in the thickness error candidate value is determined as the thickness error value.

[0067] The wave velocity can be the propagation speed of the wave in the corresponding geological structure, and the wave velocity can be recorded in the regional wave structure data. The travel time information can represent the time interval experienced by the wave from the wave source to the receiving point after reflection on the underground rock layer interface. A sedimentary layer thickness group can include the first sedimentary layer thickness corresponding to each calibration position determined based on the same wave velocity.

[0068] In some embodiments of the present disclosure, if the wave velocity has been obtained through logging or geophysical methods, the travel time information corresponding to each calibration position can be converted into the first sedimentary layer thickness corresponding to each calibration position based on the wave velocity, to realize the conversion from the travel time domain to the depth domain, and the first sedimentary layer thickness corresponding to each calibration position is determined. Further, the sedimentary layer thickness determination device can calculate a thickness error value according to the first sedimentary layer thickness corresponding to each calibration position and the second sedimentary layer thickness, and perform subsequent processing based on the thickness error value. In the above scheme, the high-precision wave velocity provides more accurate spatial position constraints for subsequent three-dimensional sedimentary layer thickness inversion, which can effectively improve the accuracy of the sedimentary layer thickness inversion result, reduce the non-uniqueness and uncertainty of the sedimentary layer model, and improve the overall inversion quality.

[0069] In some embodiments of the present disclosure, if the wave velocity is unknown, the wave velocity can be taken as a parameter to be solved in the inversion process. A user can pre-set a plurality of wave velocities according to experience, and the sediment layer thickness determination apparatus can obtain the plurality of wave velocities. For each wave velocity, the sediment layer thickness determination apparatus can convert the travel time information corresponding to each calibration position into the first sediment layer thickness corresponding to each calibration position based on the wave velocity. The first sediment layer thickness corresponding to the same wave velocity is divided into the same sediment layer thickness group, and the sediment layer thickness group corresponding to the wave velocity is obtained. Further, for each sediment layer thickness group, the sediment layer thickness determination apparatus can determine a thickness error candidate value corresponding to the wave velocity according to the first sediment layer thickness corresponding to each calibration position in the sediment layer thickness group and the second sediment layer thickness corresponding to the calibration position in the updated sediment layer model. The minimum value in the plurality of thickness error candidate values is determined as the thickness error value. In the above scheme, the determination of the thickness error value is realized in the case where the wave velocity is unknown, which is suitable for a wider range of scenarios and has a certain flexibility.

[0070] In step 205, the target sediment layer model is determined according to the thickness error value and the intermediate sediment layer model.

[0071] In the present embodiment, the sediment layer thickness determination apparatus can determine a corresponding intermediate sediment layer model according to the thickness error value and the intermediate sediment layer model based on different adjustment modes of the initial sediment layer model.

[0072] In some embodiments of the present disclosure, the adjustment mode adopted can be to adjust the model in different ways first, and then determine the final model from the plurality of models obtained by adjustment. Accordingly, determining the target sediment layer model according to the thickness error value and the intermediate sediment layer model includes: determining the intermediate sediment layer model corresponding to the minimum value in the plurality of thickness error values as the target sediment layer model.

[0073] In the present embodiment, the thickness error value corresponding to each intermediate sediment layer model is determined, and the sediment layer thickness determination apparatus can determine the minimum value in the plurality of thickness error values and determine the intermediate sediment layer model corresponding to the minimum value as the target sediment layer model. In the above scheme, the target sediment layer model is determined by enumerating the intermediate sediment layer model, and the determination of the target sediment layer model is realized.

[0074] In some embodiments of the present disclosure, the model adjustment manner adopted can be model iteration. Accordingly, the target sedimentary layer model is determined according to the thickness error value and the intermediate sedimentary layer model, including: if the thickness error value is not less than the error value threshold, adjusting the thickness of the intermediate sedimentary layer model according to the thickness error value to obtain an adjusted sedimentary layer model; returning the adjusted sedimentary layer model as a new intermediate sedimentary layer model to determine a new thickness error value, until an iteration termination condition is met, and determining the new intermediate sedimentary layer model as the target sedimentary layer model.

[0075] The thickness error value can be a threshold value set in advance for the thickness error value, and the present embodiment does not limit the thickness error value. The adjusted sedimentary layer model can be a new sedimentary layer model obtained by adjusting the thickness of the intermediate sedimentary layer model according to the current thickness error value. The iteration termination condition can be a condition for terminating the model iteration, and the present embodiment does not limit the iteration termination condition. For example, the iteration termination condition can include that the new thickness error value is less than the error value threshold, or the iteration number is greater than a number threshold.

[0076] In the present embodiment, if the thickness error value is not less than the error value threshold, it means that the current thickness error value is too large. The thickness of the intermediate sedimentary layer model is updated by a pre-set error adjustment algorithm with the thickness error value as a constraint condition to obtain an adjusted sedimentary layer model. The error adjustment algorithm can be a function of calculating the corresponding thickness adjustment size according to the input thickness error value, and the present embodiment does not limit the error adjustment algorithm. Further, the adjusted sedimentary layer model is returned as a new intermediate sedimentary layer model, and the inversion of the Bouguer gravity anomaly data is re-executed to realize the iterative adjustment of the model thickness, so as to obtain a new thickness error value corresponding to the new intermediate sedimentary layer model. Until the new thickness error value is less than the error value threshold, or the iteration number is greater than the number threshold, the new intermediate sedimentary layer model is determined as the target sedimentary layer model. In the above scheme, the thickness error value is used as a constraint to determine the target sedimentary layer model by iteration, thereby improving the accuracy of the target sedimentary layer model.

[0077] Since the inversion of the Bouguer gravity anomaly data is not unique, the inversion result has a large spatial error and uncertainty. In the above scheme, the first sedimentary layer thickness determined by actual measurement is introduced as an external constraint and correction of the inversion result, thereby improving the accuracy and geological rationality of the finally determined target sedimentary layer model.

[0078] Step 103, determining the sedimentary layer thickness of the to-be-detected position in the geological region according to the target sedimentary layer model.

[0079] The to-be-detected position can be any position in the geological region.

[0080] In the embodiments of the present disclosure, the deposition layer thickness determination apparatus can acquire a to-be-detected position, and query a deposition layer thickness corresponding to the to-be-detected position in a target deposition layer model.

[0081] The deposition layer thickness determination method provided in the embodiments of the present disclosure comprises: acquiring an initial deposition layer model corresponding to a geological region; adjusting the initial deposition layer model according to first Bouguer gravity data of the geological region and first deposition layer thicknesses of calibration positions in the geological region to obtain a target deposition layer model; wherein the first Bouguer gravity data is determined by observing the deposition layer of the geological region, and the first deposition layer thicknesses are determined by measuring the deposition layer of the calibration positions; and determining deposition layer thicknesses of to-be-detected positions in the geological region according to the target deposition layer model. With the above technical solution, on the basis of the initial deposition layer model, the initial deposition layer model is coarsely adjusted in a large range by the first Bouguer gravity data corresponding to the geological region as a whole, the smooth continuity of the model in a larger range is improved, the initial deposition layer model is accurately adjusted and constrained at specific positions by the first deposition layer thicknesses corresponding to specific calibration positions in the geological region, so that the target deposition layer model obtained can combine the first Bouguer gravity data caused by density differences and match the measured first deposition layer thicknesses, the uncertainty in the inversion process is significantly reduced, the inversion accuracy and the geological reasonableness of the finally determined model are improved, and the deposition layer thicknesses with high accuracy are determined in a larger region at a lower cost.

[0082] In some embodiments of the present disclosure, before the initial deposition layer model is adjusted and processed according to the first Bouguer gravity data of the geological region and the first deposition layer thicknesses of the calibration positions in the geological region to obtain the target deposition layer model, the deposition layer thickness determination method further comprises:

[0083] acquiring original Bouguer gravity data determined by observing the geological region; and filtering the original Bouguer gravity data according to a wavelength interval corresponding to the deposition layer to obtain the first Bouguer gravity data.

[0084] The original Bouguer gravity data can be original data of Bouguer gravity anomalies obtained by ground or satellite observation. The original Bouguer gravity data reflects the comprehensive effect of density differences of different layers underground, and is jointly affected by multiple density interfaces such as the deposition layer interface, the Moho interface of the crust, and the bottom of the lithosphere. The wavelength region corresponding to the deposition layer can be an interval in which the wavelength corresponding to the deposition layer is located in the Bouguer gravity data.

[0085] The deeper the density anomaly interface is, the longer the wavelength of the Bouguer gravity anomaly generated by the density anomaly interface is on the surface. Generally, the thickness of the crust is about 40-100 km, and the thickness of the sedimentary layer is usually 0.5-10 km, so the Bouguer gravity anomaly data caused by the density boundary of the sedimentary layer has a shorter spatial wavelength, which is expressed as a small-scale local gravity anomaly. In this embodiment, in order to effectively extract the data related to the sedimentary layer from the original Bouguer gravity anomaly data, before inverting the thickness of the sedimentary layer, the sedimentary layer thickness determination apparatus can perform high-pass filtering processing on the original Bouguer gravity data according to the wavelength interval corresponding to the sedimentary layer to obtain first Bouguer gravity data.

[0086] In the above scheme, by filtering out long wavelengths, the deep structure influence of the Moho surface and the bottom interface of the lithosphere is filtered out, and the short-wavelength Bouguer gravity anomaly data mainly caused by the density change of the shallow sedimentary layer is retained, thereby improving the accuracy and pertinence of subsequent model inversion.

[0087] Next, the sedimentary layer thickness determination method in the embodiments of the present disclosure is further described through a specific example. Figure 4 A schematic diagram of a sedimentary layer thickness determination method provided in the embodiments of the present disclosure is shown in FIG. 1. Figure 4 As shown in FIG. 1, the sedimentary layer thickness determination method includes the following steps.

[0088] First, the wave velocity and the two-dimensional seismic reflection profile are obtained by collecting and arranging the geological prior data and the geophysical data.

[0089] Specifically, the wave velocity can be recorded in the regional wave velocity structure data obtained by logging or geophysical methods. The seismic reflection profile can be used to characterize the geometric shape of the stratigraphic interface. The wave velocity can be selectively used according to specific requirements. Alternatively, the wave velocity can be used as a known input parameter to assist in calculating the first sedimentary layer thickness; or the wave velocity can be set as an unknown quantity to be solved in the inversion process, so that the inversion process has a certain flexibility. High-precision wave velocity can effectively improve the accuracy of the inversion result of the sedimentary layer thickness, reduce the non-uniqueness and uncertainty of the sedimentary layer model, and thus improve the overall inversion quality.

[0090] Further, the two-dimensional first sedimentary layer thickness is obtained by interpreting the two-dimensional seismic reflection profile according to the wave velocity.

[0091] Specifically, the seismic reflection profile is travel time domain imaging data, and the interface position of the sedimentary layer needs to be identified through interpretation to determine the thickness boundary between layers. This step is the key to obtaining the geometric structure of the stratum. If the wave velocity is accurate, the travel time information can be converted into first sedimentary layer depth information on the basis of interpretation, realizing the conversion from the travel time domain to the depth domain, and obtaining an accurate first sedimentary layer thickness, which provides more accurate spatial position constraints for the subsequent inversion of the three-dimensional sedimentary layer thickness.

[0092] Further, the original Bouguer gravity data determined by satellite observation is high-pass filtered to obtain first Bouguer gravity anomaly data.

[0093] Specifically, the original Bouguer gravity data reflects the comprehensive effect of the density difference of different layers of the underground, which is jointly affected by multiple density interfaces such as the sedimentary layer interface, the Moho interface of the crust, and the bottom of the lithosphere. The deeper the density anomaly interface is, the longer the wavelength of the Bouguer gravity anomaly generated at the surface is. Generally, the thickness of the crust is about 40-100 km, and the thickness of the sedimentary layer is usually 0.5-10 km, so the Bouguer anomaly signal caused by the density boundary of the sedimentary layer has a shorter spatial wavelength, which is manifested as a small-scale local gravity anomaly.

[0094] In order to effectively extract the signal related to the sedimentary layer from the original Bouguer gravity data, the original Bouguer gravity data needs to be high-pass filtered before the sedimentary layer model is inverted. By filtering out the long-wavelength deep structure influence and retaining the short-wavelength gravity anomaly mainly caused by the density change of the shallow sedimentary layer, first Bouguer gravity anomaly data is obtained, thereby improving the accuracy and pertinence of subsequent sedimentary layer model inversion.

[0095] Further, the first Bouguer gravity anomaly data and the two-dimensional first sedimentary layer thickness are used to iteratively correct the model to obtain a three-dimensional target sedimentary layer model.

[0096] Specifically, the density change of the underground medium will cause abnormal change of the surface gravity field, and the inversion process is to infer the spatial form of the underground density interface according to the observed Bouguer gravity data at the surface. Since there is a significant density difference between the sedimentary layer and the underlying basement, a reasonable forward model can be constructed to establish the functional relationship between the sedimentary layer thickness and the Bouguer gravity data. The iterative optimization can include: establishing an initial sedimentary layer model based on geological prior information and the first sedimentary layer thickness, taking the initial sedimentary layer model as an intermediate sedimentary layer model, forward modeling the Bouguer gravity anomaly according to the intermediate sedimentary layer model to obtain second Bouguer gravity data, subtracting the second Bouguer gravity data from the first Bouguer gravity data to obtain Bouguer gravity residual data, converting the Bouguer gravity residual data into a sedimentary layer disturbance model, superimposing the sedimentary layer disturbance model on the intermediate sedimentary layer model to obtain an updated sedimentary layer model, determining the second sedimentary layer thickness according to the updated sedimentary layer model, determining the thickness error value according to the first sedimentary layer thickness and the second sedimentary layer thickness corresponding to each calibration position, and if the thickness error value is not less than the error value threshold, returning to adjust the intermediate sedimentary layer model according to the thickness error value for repeated iteration until the thickness error value is less than the error value threshold.

[0097] In the process of iteration, the inversion of Bouguer gravity anomaly has non-uniqueness, and the inversion result has large spatial error and uncertainty. In order to improve the model accuracy and geological rationality, the first sedimentary layer thickness is introduced to externally constrain and correct the updated sedimentary layer model determined by inversion.

[0098] The sedimentary layer thickness determination method provided by the embodiments of the present disclosure combines the first sedimentary layer thickness determined by the Bouguer gravity data and the seismic reflection profile, constructs forward and inversion for model iteration, and uses the first sedimentary layer thickness as a geometric constraint condition in the iteration process, thereby realizing dynamic correction of the inversion result of the Bouguer gravity data and realizing accurate inversion of the sedimentary layer thickness under data driving. The advantages of the wide range of Bouguer gravity data and the high accuracy and high resolution of the first sedimentary layer thickness are organically combined. Accurate horizons and geometric boundaries are provided for scenarios such as seismic data risk assessment, and the density information is supplemented by the Bouguer gravity data, which can effectively improve the stability and spatial resolution of inversion. The dependence on intensive seismic and drilling data is reduced, the exploration cost is saved, and the three-dimensional spatial distribution of the sedimentary layer thickness of the foreland thrust belt in a wide range is obtained at a low cost. In the area where the first sedimentary layer thickness determined by the seismic reflection profile is relatively sparse, the method has a significant advantage, and the result is smooth and continuous, which has good adaptability and generalization, and has a wide application prospect in the fields of seismic risk assessment, geological survey, resource exploration and engineering site selection. The method has significant advantages in data utilization efficiency, accuracy control, engineering implementability and environmental protection.

[0099] In addition, the shallow layer density anomaly signal can be extracted by high-pass filtering, and the physical rationality of the model can be enhanced by introducing prior information such as wave velocity, thereby significantly reducing the non-uniqueness and uncertainty of the inversion result.

[0100] Figure 5 The structure diagram of the sedimentary layer thickness determination device provided by the embodiments of the present disclosure is shown in the figure. The device can be realized by software and / or hardware, and the device can also be integrated in an electronic device.

[0101] As Figure 5 shown, the sedimentary layer thickness determination device comprises:

[0102] The first acquisition module 501 is configured to acquire an initial sedimentary layer model corresponding to a geological area.

[0103] The adjustment module 502 is configured to adjust the initial sedimentary layer model according to the first Bouguer gravity data of the geological area and the first sedimentary layer thickness of the calibration position in the geological area, and obtain a target sedimentary layer model. The first Bouguer gravity data is determined by observing the sedimentary layer of the geological area, and the first sedimentary layer thickness is determined by measuring the sedimentary layer of the calibration position.

[0104] The determination module 503 is configured to determine a thickness of a sedimentary layer at a position to be detected in the geological area according to the target sedimentary layer model.

[0105] Optionally, the adjustment module 502 comprises:

[0106] A first determination sub-module is configured to determine an intermediate sedimentary layer model according to the initial sedimentary layer model.

[0107] A forward sub-module is configured to perform forward processing on the intermediate sedimentary layer model by using a gravity field forward algorithm to obtain second Bouguer gravity data.

[0108] A processing sub-module is configured to perform perturbation increase processing on the intermediate sedimentary layer model according to the first Bouguer gravity data and the second Bouguer gravity data to obtain an updated sedimentary layer model.

[0109] A second determination sub-module is configured to determine a second sedimentary layer thickness of the updated sedimentary layer model at the calibration position and determine a thickness error value between the second sedimentary layer thickness and the first sedimentary layer thickness.

[0110] A third determination sub-module is configured to determine the target sedimentary layer model according to the thickness error value and the intermediate sedimentary layer model.

[0111] Optionally, the first determination sub-module is specifically configured to:

[0112] perform thickness adjustment on the initial sedimentary layer model according to a plurality of preset thickness adjustment values to obtain a plurality of intermediate sedimentary layer models corresponding to the plurality of thickness adjustment values.

[0113] Correspondingly, the third determination sub-module is specifically configured to:

[0114] determine, as the target sedimentary layer model, an intermediate sedimentary layer model corresponding to a minimum value in the plurality of thickness error values.

[0115] Optionally, the first determination sub-module is specifically configured to:

[0116] determine the initial sedimentary layer as the intermediate sedimentary layer model.

[0117] Correspondingly, the third determination sub-module is specifically configured to:

[0118] if the thickness error value is not less than an error value threshold, perform thickness adjustment on the intermediate sedimentary layer model according to the thickness error value to obtain an adjusted sedimentary layer model.

[0119] The thickness error value is determined between the second sedimentary layer thickness and each of the sedimentary layer thickness groups, and the thickness error value is determined as the thickness error value between the second sedimentary layer thickness and the sedimentary layer thickness group corresponding to the minimum thickness error candidate value.

[0120] Optionally, the processing submodule is specifically used for:

[0121] The first Bouguer gravity data and the second Bouguer gravity data are subtracted to obtain Bouguer gravity residual data.

[0122] The Bouguer gravity residual data is converted to obtain a sedimentary layer disturbance model corresponding to the geological region.

[0123] The intermediate sedimentary layer model is updated according to the sedimentary layer disturbance model to obtain an updated sedimentary layer model.

[0124] Optionally, the thickness error value is determined between the second sedimentary layer thickness and the first sedimentary layer thickness, including:

[0125] A plurality of wave velocities are obtained, for each wave velocity, a first sedimentary layer thickness corresponding to each calibration position is determined according to the wave velocity and travel time information corresponding to each calibration position, and the first sedimentary layer thickness corresponding to the same wave velocity is divided into the same sedimentary layer thickness group.

[0126] The second sedimentary layer thickness and a thickness error candidate value corresponding to each sedimentary layer thickness group are calculated.

[0127] The minimum value in the thickness error candidate value is determined as the thickness error value.

[0128] Optionally, the apparatus further includes:

[0129] The second obtaining module is configured to obtain original Bouguer gravity data determined by observation of the geological region.

[0130] The filtering module is configured to filter the original Bouguer gravity data according to a wavelength interval corresponding to the sedimentary layer to obtain the first Bouguer gravity data.

[0131] The sedimentary layer thickness determination apparatus provided in the embodiments of the present disclosure can perform the sedimentary layer thickness determination method provided in any of the embodiments of the present disclosure, and has the corresponding function modules and beneficial effects of performing the method.

[0132] Figure 6 A structural schematic diagram of an electronic device provided in the embodiments of the present disclosure is shown in FIG. 6. Figure 6 As shown in FIG. 6, the electronic device 600 includes one or more processors 601 and a memory 602.

[0133] The processor 601 can be a central processing unit (CPU) or other form of processing unit having deposit layer thickness determination capability and / or instruction execution capability, and can control other components in the electronic device 600 to perform desired functions.

[0134] The memory 602 can include one or more computer program products, which can include various forms of computer-readable storage media, such as volatile memory and / or non-volatile memory. The volatile memory, for example, can include random access memory (RAM), cache memory, and / or the like. The non-volatile memory, for example, can include read-only memory (ROM), hard disk, flash memory, and / or the like. One or more computer program instructions can be stored on the computer-readable storage media, and the processor 601 can run the program instructions to implement the deposit layer thickness determination method of the embodiments of the present disclosure described above and / or other desired functions. Various contents such as input signals, signal components, noise components, and the like can also be stored in the computer-readable storage media.

[0135] In one example, the electronic device 600 can further include an input device 603 and an output device 604, which are interconnected through a bus system and / or other forms of connection mechanism (not shown).

[0136] In addition, the input device 603 can further include, for example, a keyboard, a mouse, and the like.

[0137] The output device 604 can output various information to the outside, including determined distance information, direction information, and the like. The output device 604 can include, for example, a display, a speaker, a printer, a communication network and a remote output device connected thereto, and the like.

[0138] Of course, in order to simplify, Figure 6 Only some of the components in the electronic device 600 related to the present disclosure are shown in the figure, and components such as buses, input / output interfaces, and the like are omitted. In addition, the electronic device 600 can further include any other appropriate components according to specific application cases.

[0139] In addition to the above method and device, the embodiments of the present disclosure can also be a computer program product including computer program instructions, which, when run by a processor, cause the processor to perform the deposit layer thickness determination method provided by the embodiments of the present disclosure.

[0140] The computer program product can be written in any combination of one or more programming languages, including an object oriented programming language such as Java, C++, or the like, and conventional procedural programming languages, such as the "C" programming language or similar programming languages. The program code can execute entirely on the user's computing device, partly on the user's device, as a stand-alone software package, partly on the user's computing device and partly on a remote computing device or entirely on the remote computing device or server. The embodiments of the present disclosure can be a computer program product, which can include a computer program tangibly embodied in a machine readable storage medium.

[0141] In addition, an embodiment of the present disclosure can also be a computer readable storage medium, having stored thereon computer program instructions which, when executed by a processor, cause the processor to perform the deposition layer thickness determination method provided by the embodiments of the present disclosure.

[0142] The computer readable storage medium can be any combination of one or more computer readable media. The computer readable medium can be a computer readable signal medium or a computer readable storage medium. The computer readable storage medium can include, for example, but not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, device, or apparatus, or any suitable combination of the above. More specific examples (a non-exhaustive list) of the computer readable storage medium include an electrical connection having one or more wires, a portable disc, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the above.

[0143] It should be noted that, in this document, the terms such as "first" and "second" are merely used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply that there is any such actual relationship or order between these entities or operations. Moreover, the terms "include", "contain" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements not only includes those elements, but also includes other elements not explicitly listed or inherent to such process, method, article or device. Without more limitations, the element defined by the statement "including a" does not exclude the presence of other identical elements in the process, method, article or device including the element.

[0144] The foregoing is merely illustrative of the various implementations of the present disclosure and the general principles thereof. Numerous modifications can be made to these illustrations, and equivalents can be substituted therefor, without departing from the scope of the present disclosure. The specific embodiments commensurate with the specific application are intended to be illustrative only and not limiting of the scope of the application as set forth in the following claims.

Claims

1. A method of deposit layer thickness determination, characterized by, The method comprises the following steps: obtaining an initial sedimentary layer model corresponding to a geological area; adjusting the initial sedimentary layer model according to first Bouguer gravity data of the geological area and first sedimentary layer thicknesses of calibration positions in the geological area to obtain a target sedimentary layer model; wherein the first Bouguer gravity data is determined by observing the sedimentary layer of the geological area, and the first sedimentary layer thicknesses are determined by measuring the sedimentary layer of the calibration positions; determining the sedimentary layer thicknesses of detection positions in the geological area according to the target sedimentary layer model; wherein the adjusting the initial sedimentary layer model according to the first Bouguer gravity data of the geological area and the first sedimentary layer thicknesses of the calibration positions in the geological area to obtain a target sedimentary layer model comprises: determining an intermediate sedimentary layer model according to the initial sedimentary layer model; performing forward processing on the intermediate sedimentary layer model by a gravity field forward algorithm to obtain second Bouguer gravity data; performing perturbation increase processing on the intermediate sedimentary layer model according to the first Bouguer gravity data and the second Bouguer gravity data to obtain an updated sedimentary layer model; determining second sedimentary layer thicknesses of the updated sedimentary layer model at the calibration positions and thickness error values between the second sedimentary layer thicknesses and the first sedimentary layer thicknesses; determining the target sedimentary layer model according to the thickness error values and the intermediate sedimentary layer model; wherein the performing perturbation increase processing on the intermediate sedimentary layer model according to the first Bouguer gravity data and the second Bouguer gravity data to obtain an updated sedimentary layer model comprises: subtracting the first Bouguer gravity data from the second Bouguer gravity data to obtain Bouguer gravity residual data; performing conversion processing on the Bouguer gravity residual data to obtain a sedimentary layer perturbation model corresponding to the geological area; updating the intermediate sedimentary layer model according to the sedimentary layer perturbation model to obtain the updated sedimentary layer model; wherein the determining the thickness error values between the second sedimentary layer thicknesses and the first sedimentary layer thicknesses comprises: obtaining multiple wave velocities, for each wave velocity, determining first sedimentary layer thicknesses corresponding to each calibration position according to the wave velocity and travel time information corresponding to each calibration position, and dividing the first sedimentary layer thicknesses corresponding to the same wave velocity into the same sedimentary layer thickness group; calculating thickness error candidate values corresponding to each sedimentary layer thickness group between the second sedimentary layer thicknesses and the sedimentary layer thicknesses; determining the minimum value in the thickness error candidate values as the thickness error value.

2. The method of claim 1, wherein, The determining the intermediate sedimentary layer model according to the initial sedimentary layer model comprises: respectively adjusting the initial sedimentary layer model according to multiple thickness adjustment values to obtain multiple intermediate sedimentary layer models corresponding to the multiple thickness adjustment values; correspondingly, the determining the target sedimentary layer model according to the thickness error values and the intermediate sedimentary layer model comprises: determining the intermediate sedimentary layer model corresponding to the minimum value in the multiple thickness error values as the target sedimentary layer model.

3. The method of claim 1, wherein, The determining the intermediate deposition layer model according to the initial deposition layer model comprises: determining the initial deposition layer as the intermediate deposition layer model; Correspondingly, the determining the target deposition layer model according to the thickness error value and the intermediate deposition layer model comprises: if the thickness error value is not less than an error value threshold, performing thickness adjustment on the intermediate deposition layer model according to the thickness error value to obtain an adjusted deposition layer model; returning the adjusted deposition layer model as a new intermediate deposition layer model to determine a new thickness error value until an iteration termination condition is met, and determining the new intermediate deposition layer model as the target deposition layer model.

4. The method of claim 1, wherein, The method further comprises: obtaining original Bouguer gravity data determined by observing the geological region; performing filtering processing on the original Bouguer gravity data according to the wavelength interval corresponding to the deposition layer to obtain the first Bouguer gravity data.

5. A deposited layer thickness determination apparatus, characterized by Comprise: a first obtaining module configured to obtain an initial deposition layer model corresponding to a geological region; an adjusting module configured to perform adjustment processing on the initial deposition layer model according to first Bouguer gravity data of the geological region and a first deposition layer thickness of a calibration position in the geological region to obtain a target deposition layer model; wherein the first Bouguer gravity data is determined by observing deposition layers of the geological region, and the first deposition layer thickness is determined by measuring deposition layers of the calibration position; a determining module configured to determine a deposition layer thickness of a to-be-detected position in the geological region according to the target deposition layer model; The adjustment processing on the initial deposition layer model according to the first Bouguer gravity data of the geological region and the first deposition layer thickness of the calibration position in the geological region to obtain the target deposition layer model comprises: determining an intermediate deposition layer model according to the initial deposition layer model; performing forward processing on the intermediate deposition layer model by a gravity field forward algorithm to obtain second Bouguer gravity data; performing perturbation increase processing on the intermediate deposition layer model according to the first Bouguer gravity data and the second Bouguer gravity data to obtain an updated deposition layer model; determining a second deposition layer thickness of the updated deposition layer model at the calibration position and determining a thickness error value between the second deposition layer thickness and the first deposition layer thickness; determining the target deposition layer model according to the thickness error value and the intermediate deposition layer model; The perturbation increase processing on the intermediate deposition layer model according to the first Bouguer gravity data and the second Bouguer gravity data to obtain the updated deposition layer model comprises: subtracting the first Bouguer gravity data from the second Bouguer gravity data to obtain Bouguer gravity residual data; performing conversion processing on the Bouguer gravity residual data to obtain a deposition layer perturbation model corresponding to the geological region; updating the intermediate deposition layer model according to the deposition layer perturbation model to obtain the updated deposition layer model; The determining the thickness error value between the second deposition layer thickness and the first deposition layer thickness comprises: obtaining a plurality of wave velocities, for each wave velocity, determining a first deposit layer thickness corresponding to each calibration position according to the wave velocity and the travel time information corresponding to each calibration position, dividing the first deposit layer thickness corresponding to the same wave velocity into the same deposit layer thickness group; calculating a thickness error candidate value corresponding to each deposit layer thickness group and the second deposit layer thickness; determining the minimum value in the thickness error candidate value as the thickness error value.

6. An electronic device, comprising: The electronic device comprises: a processor; a memory for storing executable instructions of the processor; the processor is configured to read the executable instructions from the memory and execute the instructions to implement the deposit layer thickness determination method according to any one of claims 1-4.

7. A computer readable storage medium characterized by, The storage medium stores a computer program, and the computer program is configured to execute the deposit layer thickness determination method according to any one of claims 1-4.

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