Automatic test method and equipment for display module
By classifying and prioritizing the test items of the display module, the problem of existing equipment being unable to subdivide sub-test items is solved, and more efficient test result analysis and production improvement are achieved.
Patent Information
- Application Number
- CN202510710964.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-05-29
- Publication Date
- 2025-09-23
AI Technical Summary
Existing automated testing equipment does not subdivide sub-test items when testing display modules, resulting in staff being unable to understand the specific test status of the product and reducing the efficiency of subsequent processing.
By classifying the test items of the display module, multiple test items are obtained, and the priority of each sub-test item is determined. Tests are performed in sequence according to the priority, and the test results are assigned values. The current display module information is partitioned and stored according to the assigned values.
The test automation rate and accuracy are improved, and the test items with high defect rates can be identified, thereby improving the production process and improving the efficiency of subsequent processing.
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Figure CN120687890A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the technical field of test classification of display modules, and in particular to an automated testing method and equipment for display modules. Background Art
[0002] During the product production process, automated equipment is used to test display modules. When testing display modules, multiple items are often tested as add-ons, generally including focus testing and white field image quality analysis (including IR stain test, IC stain test, bright bad pixel test, optical center test, shading test, etc.). Therefore, the test item results fed back to the robot by the detection module are only good or bad products. If a display module needs to test multiple sub-items at the same time for a certain test item, there is no way to classify them, and there is no way to know the test status of each item. For example, in white field image quality analysis (including IR stain test, IC stain test, bright bad pixel test, optical center test, shading test, etc.), if any sub-test item tests as bad, the robot can only classify it as bad and cannot further subdivide it. Summary of the Invention
[0003] When testing display modules, existing automated testing equipment does not subdivide sub-test items, resulting in staff being unable to understand the specific test status of the product, reducing the efficiency of subsequent processing.
[0004] To address the above issues, an automated testing method and equipment for display modules are proposed. This method categorizes the test items for the current display module according to environmental requirements, obtains multiple test items, and determines the priority of each sub-test item. The sub-test items are then tested sequentially according to the priority, and the test results are assigned values. The current display module information is then partitioned and stored based on the assigned values. This facilitates statistical analysis of test results, identifying areas with high defect rates, and thereby improving production processes. This increases test automation and accuracy, and addresses the problem of existing automated testing equipment, which, when testing display modules, fails to segment sub-test items, resulting in staff being unable to understand the specific test results of the product, reducing the efficiency of subsequent processing.
[0005] In a first aspect, a method for automatically testing a display module includes: Step 100: Classify the items that need to be tested for the current display module according to environmental requirements, obtain multiple test items, each of which includes multiple sub-test items, and determine the priority of each sub-test item; Step 200: Test the sub-test items in order of priority, assign values to the test results, and partition and store the current display module information according to the assigned values.
[0006] In conjunction with the automated testing method for a display module according to the first aspect of the present invention, in a first possible implementation, step 100 includes: Step 110: Divide the test items into dark field test items and white field test items according to the test environment requirements. The white field test items include IR stain sub-test items, IC stain sub-test items, bright bad pixel sub-test items, optical center sub-test items, and shading sub-test items. Step 120 : Sort the IR stain sub-test item, IC stain sub-test item, bright bad pixel sub-test item, optical center sub-test item, and shading sub-test item from high to low according to their priorities.
[0007] In conjunction with the automated testing method for a display module according to the first aspect of the present invention, in a second possible implementation, step 200 includes: Step 210: Test each of the sub-test items according to their priority level to obtain a sub-test result. Step 220: judge the sub-test result. If the sub-test result is good, continue to test the sub-test item of the next priority.
[0008] In conjunction with the automated testing method for a display module according to the first aspect of the present invention, in a third possible implementation, step 200 includes: Step 230: Test each of the sub-test items according to their priority level to obtain a sub-test result. Step 240: judge the sub-test result. If the sub-test result is defective, assign a value to the sub-test result to obtain a defective value.
[0009] In conjunction with the third possible implementation manner of the first aspect of the present invention, in a fourth possible implementation manner, step 240 includes: Step 241: sequentially judging the subtest results of the plurality of subtest items; Step 242: If the test results of multiple sub-test items are judged as defective, different values are assigned to the multiple sub-test results judged as defective.
[0010] In conjunction with the fourth possible implementation manner of the first aspect of the present invention, in a fifth possible implementation manner, step 200 further includes: Step 250: partition the storage units according to different assigned values; Step 260: Store the current display module information in the corresponding partition according to the sub-test results.
[0011] In a second aspect, an automated testing device for a display module adopts the automated testing method for a display module described in the first aspect, comprising: The classification module is used to classify the items that need to be tested on the current display module according to the environmental requirements, obtain multiple test items, each of which includes multiple sub-test items, and determine the priority of each sub-test item. The test module is used to test the sub-test items in order according to the priority, assign values to the sub-test results, and partition and store the current display module information according to the assigned values.
[0012] In conjunction with the automated testing device for display modules according to the second aspect of the present invention, in a first possible implementation, the classification module includes: The sorting unit is used to sort the IR stain sub-test item, the IC stain sub-test item, the bright bad pixel sub-test item, the optical center sub-test item, and the shading sub-test item from high to low according to their priorities.
[0013] In conjunction with the automated testing device for the display module according to the second aspect of the present invention, in a second possible implementation manner, the testing module includes: An assignment unit is used to judge the sub-test result. If the sub-test result is defective, the sub-test result is assigned a value to obtain a defective value. If the test results of multiple sub-test items are judged to be defective, different values are assigned to the multiple sub-test results judged to be defective.
[0014] In conjunction with the second possible implementation of the second aspect of the present invention, in a third possible implementation, the test module further includes: The storage unit is used to partition the storage unit according to different assignments, and store the current display module information in the corresponding partition according to the sub-test results.
[0015] The automated testing method and equipment for display modules described in the present invention categorizes the items to be tested on the current display module according to environmental requirements, obtains multiple test items, determines the priority of each sub-test item, tests the sub-test items sequentially according to the priority, assigns values to the test results, and partitions and stores the current display module information based on the assigned values. This facilitates statistical analysis of test results, identifying high defect rates, and thus improving production processes, increasing test automation and accuracy. This addresses the problem of existing automated testing equipment, which, when testing display modules, fails to segment sub-test items, resulting in staff being unable to understand the specific test results of the product, reducing the efficiency of subsequent processing. BRIEF DESCRIPTION OF THE DRAWINGS
[0016] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.
[0017] Figure 1 This is a flowchart of a specific embodiment of an automated testing method for a display module in the present application; Figure 2 yes Figure 1 A schematic flow chart of a specific embodiment of step 100; Figure 3 yes Figure 1 A schematic flow chart of a specific embodiment of step 200; Figure 4 yes Figure 3 Another specific embodiment of step 200 is shown in the flowchart; Figure 5 yes Figure 4 A schematic flow chart of a specific embodiment of step 240; Figure 6 yes Figure 5 A schematic flow chart of a specific embodiment after step 240; Figure 7 This is a schematic diagram of the module structure of a specific embodiment of an automated testing device for a display module in the present application. DETAILED DESCRIPTION
[0018] The following will clearly and completely describe the technical solutions of the present invention in conjunction with the accompanying drawings. Obviously, the embodiments described are only part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, other embodiments obtained by ordinary technicians in this field without creative work are all within the scope of protection of the present invention.
[0019] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one skilled in the art to which this invention pertains. The terms used in this specification of the present invention are for the purpose of describing specific embodiments only and are not intended to limit the present invention. The term "and / or" as used herein includes any and all combinations of one or more of the associated listed items.
[0020] It should be noted that when an element is referred to as being “fixed on” or “disposed on” another element, it may be directly on the other element or indirectly on the other element. When an element is referred to as being “connected to” another element, it may be directly connected to the other element or indirectly connected to the other element.
[0021] It should be understood that the terms "length", "width", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", etc., indicating the orientation or position relationship, are based on the orientation or position relationship shown in the accompanying drawings, and are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on this application.
[0022] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of the technical features being referred to. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of the features. Throughout the description of this application, "plurality" means two or more, unless otherwise specifically defined.
[0023] When testing display modules, existing automated testing equipment does not subdivide sub-test items, resulting in staff being unable to understand the specific test status of the product, reducing the efficiency of subsequent processing.
[0024] In order to solve the above problems, an automatic testing method and device for a display module are proposed.
[0025] In the first aspect, an automated testing method for a display module is provided. Figure 1 , Figure 1This is a flow chart of a specific embodiment of an automated testing method for a display module in this application; it includes: Step 100: Classify the items that need to be tested for the current display module according to environmental requirements, obtain multiple test items, each test item includes multiple sub-test items, and determine the priority of each sub-test item.
[0026] In a preferred embodiment, Figure 2 , Figure 2 yes Figure 1 A flowchart of a specific embodiment of step 100 in FIG. 1 is provided; step 100 includes: step 110, dividing the test items into dark field test items and white field test items according to the test environment requirements, the white field test items including IR stain sub-test items, IC stain sub-test items, bright bad pixel sub-test items, optical center sub-test items, and shading sub-test items; step 120, sorting the IR stain sub-test items, IC stain sub-test items, bright bad pixel sub-test items, optical center sub-test items, and shading sub-test items from high to low according to their priorities.
[0027] In this embodiment, a dark field test item and a white field test item are respectively performed according to the test environment, and sub-test items of the dark field test item can be tested together.
[0028] Step 200: Test the sub-test items in order of priority, assign values to the test results, and partition and store the current display module information according to the assigned values.
[0029] In a preferred embodiment, Figure 3 , Figure 3 yes Figure 1 A flowchart of a specific embodiment of step 200 is provided; step 200 includes: step 210, testing each sub-test item according to the priority level to obtain a sub-test result; step 220, judging the sub-test result, if the sub-test result is a good product, continuing to test the sub-test item of the next priority level.
[0030] In this embodiment, the test is performed according to the priority. If the sub-test result is normal, it is judged as OK and the next sub-test item is performed.
[0031] In a preferred embodiment, Figure 4 , Figure 4 yes Figure 3 A flow chart of another specific embodiment of step 200 is provided; step 200 includes: step 230, testing each sub-test item according to the priority level to obtain a sub-test result; step 240, judging the sub-test result, and if the sub-test result is a defective product, assigning a value to the sub-test result to obtain a defective value.
[0032] In a preferred embodiment, Figure 5 , Figure 5 yes Figure 4 A flowchart of a specific embodiment of step 240 is provided; step 240 includes: step 241, judging the sub-test results of multiple sub-test items in sequence; step 242, if the test results of multiple sub-test items are judged to be defective, assigning different values to the multiple sub-test results judged to be defective.
[0033] In this embodiment, when the sub-test result of the IR stain sub-test item is a defective product, the value is assigned to 0x01, and other sub-test results that are defective products can be assigned values 0x02... in sequence, and different values are assigned.
[0034] In a preferred embodiment, Figure 6 , Figure 6 yes Figure 5 A flow chart of a specific embodiment after step 240 in FIG. 200 further includes: step 250, partitioning the storage unit according to different assignments; step 260, storing the current display module information in the corresponding partition according to the sub-test results.
[0035] In this embodiment, a dedicated storage unit (NG disk) is provided to store defective product sub-test results, which are divided into different partition units for storage according to assigned values, and then the current display module information is stored in the corresponding partition unit.
[0036] In an embodiment of the present application, the items that need to be tested on the current display module are classified according to environmental requirements, multiple test items are obtained, and the priority of each sub-test item is determined. The sub-test items are tested in sequence according to the priority, and the test results are assigned values. The current display module information is partitioned and stored according to the assigned values. This is conducive to statistical analysis of the test results, knowing which defect rate is high, so that the production process can be improved, the test automation rate and accuracy are improved, and the problem of existing automated testing equipment that, when testing the display module, does not subdivide the sub-test items, resulting in the staff being unable to understand the specific test status of the product, thereby reducing the efficiency of subsequent processing.
[0037] In the second aspect, an automated testing device for a display module, such as Figure 7 , Figure 7This is a schematic diagram of the module structure of a specific embodiment of an automated testing device for a display module in the present application. The automated testing method for a display module according to the first aspect includes: a classification module 301 for classifying items to be tested for the current display module according to environmental requirements, obtaining multiple test items, each test item including multiple sub-test items, and determining the priority of each sub-test item; and a testing module 302 for testing the sub-test items in sequence according to priority, assigning values to the sub-test results, and partitioning and storing the current display module information according to the assigned values.
[0038] Furthermore, the classification module 301 includes: a sorting unit for sorting the IR stain sub-test item, IC stain sub-test item, bright bad pixel sub-test item, optical center sub-test item, and shading sub-test item from high to low according to their priorities.
[0039] Furthermore, the test module 302 includes: an assignment unit, which is used to judge the sub-test results. If the sub-test result is defective, the sub-test result is assigned a value to obtain a defective value. If there are multiple sub-test items whose test results are judged to be defective, different values are assigned to the multiple sub-test results judged to be defective.
[0040] Furthermore, the test module 302 further includes: a storage unit, configured to partition the storage unit according to different assignments, and store the current display module information in corresponding partitions according to the sub-test results.
[0041] The automated testing method and equipment for display modules of the present invention classify the items that need to be tested on the current display module according to environmental requirements, obtain multiple test items, determine the priority of each sub-test item, test the sub-test items in sequence according to the priority, assign values to the test results, and partition and store the current display module information based on the assigned values. This facilitates statistical analysis of test results, identifying which types have high defect rates, thereby improving the production process, increasing the test automation rate and accuracy, and resolving the problem of existing automated testing equipment that, when testing display modules, fails to subdivide sub-test items, resulting in staff being unable to understand the specific test status of the product, thereby reducing the efficiency of subsequent processing.
[0042] The above are only preferred embodiments of the present invention and are not intended to limit the present invention. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.
Claims
1. An automated testing method for a display module, characterized in that: include: Step 100: Classify the items that need to be tested for the current display module according to environmental requirements, obtain multiple test items, each of which includes multiple sub-test items, and determine the priority of each sub-test item; Step 200: Test the sub-test items in order of priority, assign values to the test results, and partition and store the current display module information according to the assigned values.
2. The automated testing method for a display module according to claim 1, wherein: The step 100 includes: Step 110: Divide the test items into dark field test items and white field test items according to the test environment requirements. The white field test items include IR stain sub-test items, IC stain sub-test items, bright bad pixel sub-test items, optical center sub-test items, and shading sub-test items. Step 120 : Sort the IR stain sub-test item, IC stain sub-test item, bright bad pixel sub-test item, optical center sub-test item, and shading sub-test item from high to low according to their priorities.
3. The automated testing method for a display module according to claim 1, wherein: The step 200 includes: Step 210: Test each of the sub-test items according to their priority level to obtain a sub-test result. Step 220: judge the sub-test result. If the sub-test result is good, continue to test the sub-test item of the next priority.
4. The automated testing method for a display module according to claim 1, wherein: The step 200 includes: Step 230: Test each of the sub-test items according to their priority level to obtain a sub-test result. Step 240: judge the sub-test result. If the sub-test result is defective, assign a value to the sub-test result to obtain a defective value.
5. The automated testing method for a display module according to claim 4, wherein: The step 240 includes: Step 241: sequentially judging the subtest results of the plurality of subtest items; Step 242: If the test results of multiple sub-test items are judged as defective, different values are assigned to the multiple sub-test results judged as defective.
6. The automated testing method for a display module according to claim 5, wherein: The step 200 further includes: Step 250: partition the storage units according to different assigned values; Step 260: Store the current display module information in the corresponding partition according to the sub-test results.
7. An automated testing device for a display module, characterized in that: An automated testing method for a display module according to any one of claims 1 to 7, comprising: The classification module is used to classify the items that need to be tested on the current display module according to the environmental requirements, obtain multiple test items, each of which includes multiple sub-test items, and determine the priority of each sub-test item. The test module is used to test the sub-test items in order according to the priority, assign values to the sub-test results, and partition and store the current display module information according to the assigned values.
8. The automated testing equipment for display modules according to claim 7, wherein: The classification module includes: The sorting unit is used to sort the IR stain sub-test item, the IC stain sub-test item, the bright bad pixel sub-test item, the optical center sub-test item, and the shading sub-test item from high to low according to their priorities.
9. The automated testing equipment for display modules according to claim 7, wherein: The test module includes: An assignment unit is used to judge the sub-test result. If the sub-test result is defective, the sub-test result is assigned a value to obtain a defective value. If the test results of multiple sub-test items are judged to be defective, different values are assigned to the multiple sub-test results judged to be defective.
10. The automated testing equipment for display modules according to claim 7, wherein: The test module also includes: The storage unit is used to partition the storage unit according to different assignments, and store the current display module information in the corresponding partition according to the sub-test results.