LED lamp panel test method, device and equipment and storage medium

Abstract

The embodiment of the invention provides an LED lamp panel test method, device and equipment and a computer storage medium, and the method comprises the steps: outputting a picture control signal to a detection lamp panel to control the detection lamp panel to display a test picture according to the picture control signal, collecting a picture image of the test picture, carrying out the binarization processing of the picture image, and obtaining a binarization result; the method comprises the steps of obtaining a picture binary image according to a picture control signal, determining a communication region of the picture binary image and a communication region parameter of the communication region based on a pixel value of each pixel in the picture binary image, and comparing the communication region parameter with a lamp bead light-emitting control parameter corresponding to the picture control signal to obtain a lamp bead defect test result of the detected lamp panel. By collecting the picture image of the test picture of the detection lamp panel, the connected region and the connected region parameter in the picture image are confirmed, and the lamp bead defect detection is realized according to the connected region and the connected region parameter, so that the detection efficiency is improved, and the detection cost is reduced.

Description

Technical Field

[0001] The present invention relates to the field of testing technology, and in particular to an LED light board testing method, device, equipment and computer storage medium. Background Art

[0002] The quality of display panels is a key factor in the quality of all-in-one displays, so each panel must be inspected before shipment. Each panel requires a significant number of LEDs, and due to the extremely fast production line cycle times, this large number of LEDs must be inspected quickly. Currently, panel inspections are performed visually by human operators. Summary of the Invention

[0003] The main purpose of this specification is to provide a method, device, equipment and storage medium for testing LED light panels, aiming to achieve fast, accurate and low-cost testing of light panels. The technical solution is as follows: In a first aspect, the embodiments of this specification provide a method for testing an LED light panel, comprising: Outputting a picture control signal to the detection light board to control the detection light board to display a test picture according to the picture control signal; Acquiring a screen image of the test screen; Binarizing the image to obtain a binary image. Determining a connected area of ​​the binary image and connected area parameters of the connected area based on a pixel value of each pixel in the binary image; The connected area parameter is compared with the lamp bead light emitting control parameter corresponding to the picture control signal to obtain the lamp bead defect test result of the detection lamp board.

[0004] In a second aspect, an embodiment of this specification provides an LED light panel testing device, comprising: A control module, configured to output a picture control signal to the detection light board, so as to control the detection light board to display a test picture according to the picture control signal; An acquisition module, configured to acquire the image of the test screen; A processing module, configured to perform binarization processing on the screen image to obtain a screen binary image; A confirmation module, configured to confirm a connected area of ​​the binary image and connected area parameters of the connected area based on a pixel value of each pixel in the binary image; The result confirmation module is used to compare the connected area parameter with the lamp bead light emitting control parameter corresponding to the picture control signal to obtain the lamp bead defect test result of the detection lamp board.

[0005] In a third aspect, an embodiment of this specification provides an electronic device, which includes: a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the computer program implements the steps of the above method when executed by the processor.

[0006] In a fourth aspect, an embodiment of this specification provides a computer storage medium having a computer program stored thereon, and when the computer program is executed by a processor, the steps of the above method are implemented.

[0007] In an embodiment of the present specification, after the detection light board is controlled to display a test screen according to a screen control signal, a screen image is obtained by capturing the test screen, and the pixel values ​​in the screen image are confirmed for a connected area, thereby obtaining connected area parameters. Finally, by comparing the connected area parameters and the lamp bead light control parameters corresponding to the screen control signal, the test results of the lamp bead defects of the detection light board are automatically and efficiently determined, without the need for manual participation in the detection process. This further ensures the accuracy of the lamp board detection on the basis of improving the efficiency of the lamp board detection. BRIEF DESCRIPTION OF THE DRAWINGS

[0008] In order to more clearly illustrate the embodiments of this specification or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of this specification. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0009] Figure 1 This is a schematic diagram of an application environment of an LED light board testing method provided in an embodiment of this specification; Figure 2 This is a flow chart of a method for testing an LED light panel provided in an embodiment of this specification; Figure 3 This is an example schematic diagram of an LED light board testing method provided in an embodiment of this specification; Figure 4 This is a flow chart of a method for testing an LED light panel provided in an embodiment of this specification; Figure 5 This is an example schematic diagram of an LED light board testing method provided in an embodiment of this specification; Figure 6 This is an example schematic diagram of an LED light board testing method provided in an embodiment of this specification; Figure 7 This is an example schematic diagram of an LED light board testing method provided in an embodiment of this specification; Figure 8This is an example schematic diagram of an LED light board testing method provided in an embodiment of this specification; Figure 9 This is a flow chart of a method for testing an LED light panel provided in an embodiment of this specification; Figure 10 This is an overall flow chart of the LED light board testing method provided in the embodiments of this specification; Figure 11 This is a structural diagram of an LED light board testing device provided in an embodiment of this specification; Figure 12 This is a structural diagram of an LED light board testing device provided in an embodiment of this specification; Figure 13 This is a schematic diagram of the structure of an electronic device provided in an embodiment of this specification. DETAILED DESCRIPTION

[0010] The following will be combined with the drawings in the embodiments of this specification to clearly and completely describe the technical solutions in the embodiments of this specification. Obviously, the embodiments described are only part of the embodiments of this specification, not all of the embodiments. Based on the embodiments in this specification, all other embodiments obtained by ordinary technicians in this field without making any creative efforts are within the scope of protection of this specification.

[0011] See also Figure 1 , which is a schematic diagram of the application environment of an LED light board testing method provided in an embodiment of this specification. The LED light board testing device provided in the embodiment of this specification can be a terminal device such as a mobile phone, a computer or a tablet computer, or a module in the terminal device for implementing the transaction configuration method. The detection light board can be a light emitting diode (LED) light board, such as Figure 1 As shown, the detection lamp board can be provided with lamp beads arranged in a certain order ( Figure 1 In the middle circle), the LED light board test device can be electrically connected to the test light board and output a picture control signal to the test light board. After receiving the picture control signal, the test light board is controlled by the picture control signal to display the test picture. At this time, the LED light board test device collects the picture image of the test picture, and obtains a picture binary image according to the collected picture image processing. Based on the pixel value of each pixel in the picture binary image, the connected area of ​​the picture binary image and the connected area parameters of the connected area are confirmed, and the connected area parameters are compared with the lamp bead light-emitting control parameters corresponding to the picture control signal to obtain the lamp bead defect test result of the test light board.

[0012] In the related art, display screens such as light board electronic screens are composed of a dot matrix composed of LED lamp beads, which display different pictures or subtitles by turning the lamp beads on and off. With the development of customer customization, the production of LED electronic screens is diverse, with various product models, so it is necessary to adapt to the detection of light boards of different models. In addition, the number of lamp beads on a light board is usually very large, and the content that needs to be tested may include the display effect of animated pictures and the display effect of static pictures, which requires high detection accuracy. The inspection efficiency of visual inspection is low, and the damage to human eyes is very large during the inspection. The fatigue of the operator leads to missed inspections. In addition, some minor defects are difficult to detect using human eyes.

[0013] In response to the above problems, the present application proposes a method for testing LED light boards, which can output the required picture control signal to the detection light board, so that the detection light board displays the test picture according to the picture control signal. It is only necessary to collect the picture image of the test picture, and obtain the picture binary image by binarizing the picture image. The connected area is further confirmed according to the pixel value of each pixel in the picture binary image, and the connected area parameters are obtained. The connected area parameters are compared with the lamp bead light control parameters corresponding to the picture control signal, and the lamp bead test results of the detection light board can be automatically and quickly obtained. The implementation process is simple, the detection efficiency is high, and the computing power requirements for the computer are low. At the same time, the lamp bead defect detection accuracy is high, and the identification of minor defects can be achieved. In addition, the LED light board testing method of the present application can be used to test detection light boards of different specifications by outputting different picture control signals.

[0014] The LED light board testing method provided in this specification is described in detail below with reference to specific embodiments.

[0015] See Figure 2 , is a flow chart of a method for testing an LED light panel according to an embodiment of this specification. Figure 2 As shown, the method of the embodiment of this specification may include the following steps S101 to S105.

[0016] S101, outputting a picture control signal to the detection light board to control the detection light board to display a test picture according to the picture control signal; In one embodiment, the detection light board is a light board that needs to be tested. Different picture control signals can be output according to the required test purpose. For example, if the light board usually needs to be tested for static pictures and dynamic pictures, the picture control signal can be a control signal for controlling the light board to display a static picture, or a control signal for controlling the light board to display a dynamic picture. The output picture control signal can control the on and off of one or more lamp beads on the detection light board, and the picture control signal can control the lamp beads to display according to the preset refresh rate, switching time, display mode, color and other set parameters. The picture obtained after controlling the on and off of the detection light board based on the picture control signal is the test picture. Exemplarily, the picture control signal includes at least one of a color control signal and a dynamic picture control signal. The color control signal is used to control the display of pictures of different colors. The dynamic picture control signal is used to control the detection light board to display a dynamic picture. The dynamic picture can be a dynamically scrolling horizontal, vertical or diagonal pattern. Please refer to Figure 3 , Figure 3 This is a schematic diagram of an example of a method for testing an LED light panel provided in an embodiment of this specification, showing that the test screens are static and dynamic.

[0017] S102, collecting a picture image of a test picture; In one embodiment, when the detection light board displays a test screen, an image of the test screen displayed by the detection light board is collected to obtain a screen image. For example, the screen image can be a photo of the test screen taken by a camera. In a feasible implementation, image acquisition is performed based on the establishment of a visual detection system, and the visual detection system includes a camera, a lens, a host, a display, a communication connection line, etc. Image acquisition is performed by triggering. Since dynamic picture acquisition may be involved, there are certain requirements for the selected camera frame rate, and the camera frame rate must ensure that the motion picture image is not tailed. In order to obtain a better quality dynamic picture, it is necessary to match the frame rate of the corresponding camera according to the test picture. For example, the camera frame rate can be matched with the picture change frequency indicated by the picture control signal.

[0018] S103, performing binarization processing on the screen image to obtain a screen binary image; In one embodiment, after the image of the detection light board is captured by the camera and lens, the image is binarized, that is, the image is converted into black and white, that is, the pixel values ​​in the image are limited between two thresholds. In a feasible implementation, if the original image is a color image, it needs to be converted into a grayscale image first. A formula can be used to weight the average of the red, green, and blue channel values ​​of the color image to obtain the corresponding grayscale value, and then a suitable threshold is selected to divide the pixels in the image into two categories (black and white). Common threshold selection methods include manually selecting a fixed threshold, using an adaptive threshold, or using a histogram-based threshold selection method. Each pixel in the image is compared with the threshold, and the pixel value is set to black or white based on the comparison result. The specific operation is that if the pixel value is less than the threshold, it is set to black (0), otherwise it is set to white (255).

[0019] S104, based on the pixel value of each pixel in the binary image, determining the connected area of ​​the binary image and the connected area parameters of the connected area; In one embodiment, a Blob (Binary Large Object) refers to a connected area in an image that is composed of features such as similar color and texture. Generally speaking, this area is the foreground of the image. By traversing each pixel in the binary image of the screen row by row, the connected areas therein can be confirmed based on whether the pixel values ​​are the same. For example, adjacent pixels with the same pixel values ​​can be confirmed as connected areas, and the connected area parameters of the connected areas can be confirmed. Exemplarily, the connected area parameters may include parameters such as the position, shape, direction, area, perimeter, centroid coordinates, and number of the connected areas.

[0020] S105 , comparing the connected area parameter with the lamp bead light emitting control parameter corresponding to the image control signal to obtain a lamp bead defect test result of the lamp board.

[0021] It is understandable that since the lamp beads are normally emitting light, they appear as regular luminous areas (such as a white dot) in the test image, while the non-luminous lamp beads appear dark in the test image. Therefore, there is a large difference in the color of the luminous part and the non-luminous part. By binarizing the image, the difference between the two can be made more obvious, and the confirmed connected area can be used to represent the location of the normally luminous lamp beads. The lamp bead lighting control parameters corresponding to the picture control signal can indicate the position, number, brightness and other parameters of the luminous lamp beads in the indicator board. Therefore, by comparing the connected area parameters with the lamp bead lighting control parameters corresponding to the picture control signal, it can be confirmed whether the lamp beads are emitting light normally according to the picture control signal. For example, if the number of connected areas is 499, and the number of luminous lamp beads indicated by the lamp bead lighting control parameters is 500, it means that one lamp bead is not emitting light, and the corresponding position of the non-luminous lamp bead can be confirmed, and the lamp bead defect test result can be obtained.

[0022] In the embodiments of the present specification, a screen control signal is output to the detection lamp board to control the detection lamp board to display a test screen according to the screen control signal, a screen image of the test screen is collected, and the screen image is binarized to obtain a screen binary image. Based on the pixel value of each pixel in the screen binary image, the connected area of ​​the screen binary image and the connected area parameters of the connected area are confirmed, and the connected area parameters are compared with the lamp bead light control parameters corresponding to the screen control signal to obtain the lamp bead defect test results of the detection lamp board. By collecting the screen image of the test screen of the detection lamp board and confirming the connected area and the connected area parameters therein, the lamp board lamp bead defects can be detected according to the connected area and the connected area parameters, which can help to control the process quality and optimize the production process parameters, thereby improving the quality and efficiency of the product.

[0023] See Figure 4 , is a flow chart of a method for testing an LED light panel according to an embodiment of this specification. Figure 4 As shown, the method of the embodiment of this specification may include the following steps S201-S208.

[0024] S201, obtaining the product model code of the detection light board; In one embodiment, the inspection items and inspection requirements required for different product models may be different. In order to realize the inspection of various types of light boards, the inspection program can be configured for each product model, that is, the inspection parameters required for the product model are stored in the inspection program. Among them, the inspection parameters may include lamp bead light control parameters, and the lamp bead light control parameters are used to output corresponding picture control signals to test whether the light board has defects when displaying different pictures. Exemplarily, the product model code can be marked on the light board, and the product model code can be obtained by, for example, scanning the product model barcode, so that it is possible to quickly switch to the inspection program corresponding to the different product models, and realize the inspection of multiple types of light boards on one light board inspection device. Optionally, the inspection parameters may also include S202, calling the lamp bead lighting control parameters corresponding to the product model code; Specifically, after obtaining the product model code, the lamp bead lighting control parameters corresponding to the product model are obtained. The lamp bead lighting control parameters can be pre-configured corresponding to the product model, for example, including the number of lamps to be controlled, as well as dynamic image control parameters, static image control parameters, etc., and can be specifically set according to the desired test image display.

[0025] S203, outputting a picture control signal to the detection light board based on the light bead lighting control parameter, so as to control the detection light board to display a test picture according to the picture control signal; S204, collecting a picture image of the test picture; For details, please refer to the description of steps S101-S102 in the above embodiment, which will not be repeated here.

[0026] S205, performing color conversion on the screen image to obtain a screen grayscale image; In one embodiment, the captured screen image is a color image, so for ease of processing, the color image needs to be processed into a grayscale image. Specifically, the color image can be converted into a grayscale image using a weighted average method of each color channel.

[0027] S206, performing binarization processing on the grayscale image to obtain a binary image of the image; Specifically, see Figure 5 , Figure 5 This is an example diagram of an LED light board testing method provided in an embodiment of this specification. Figure 5 The binary image shown is composed of a number of individual image units (ie, pixels), and the value of each image unit may be 0 or 1. The binary image can be obtained by binarizing the grayscale image.

[0028] In a feasible implementation, for a grayscale image, the brightness distribution function of the image is first defined, denoted as k(x). For a very small θx in the setting, the size of the small area in the image whose brightness value is greater than or equal to x and less than x+θx is k(x)*θx.

[0029] The cumulative brightness distribution function P(x) is the integral of the brightness distribution function. For a given x, the cumulative brightness distribution function P(x) refers to the size of the area in the image where the brightness is less than or equal to x, that is, formula (1): Formula (1) The number of image cells (pixels) with a certain grayscale value is calculated by summing the grayscale value histogram to obtain a cumulative grayscale value histogram. Based on this cumulative grayscale value histogram, the Otsu algorithm is used to generate a binary image. The Otsu algorithm is an adaptive threshold segmentation method that automatically selects the optimal threshold based on the cumulative grayscale value histogram to convert the image into a binary image.

[0030] In another feasible implementation, the binarization process is performed on the grayscale image to obtain a binary image, including: Compare the grayscale value of each pixel in the grayscale image with the grayscale threshold corresponding to the detection light board to obtain a comparison result; Based on the comparison result, the binary pixel value of each pixel is determined to obtain a binary image of the screen.

[0031] Specifically, the grayscale threshold corresponding to the detection light board is the threshold set according to the detection light board of different product models. The threshold may include an upper threshold and a lower threshold. The pixels in the screen image whose grayscale values ​​are between the upper threshold and the lower threshold are extracted, and their pixel values ​​are set to 1. The pixel values ​​of the pixels that are not between the upper threshold and the lower threshold are set to 0. The coordinates of the pixels are represented by run-length encoding to obtain a binary image of the screen. The structure of the run-length encoding is as follows: (x, y, length), where x and y represent the coordinates of the start and end points of the run, respectively, and length represents the length of the run. The basic principle of run-length encoding is to replace continuous strings with the same value with a representative value and string length, so that the symbol length is less than the length of the original data; pixels with the same grayscale value arranged in a certain direction can be regarded as continuous symbols. Replacing these continuous symbols with strings can greatly reduce the amount of data. Please refer to Figure 6 , Figure 6 This is an example schematic diagram of an LED light board testing method provided in an embodiment of this specification, specifically showing the implementation method of recording the binary image of the lower screen based on run length encoding.

[0032] In one embodiment, the method provides an implementation method for denoising a binary image, including: confirming the area width of a pixel area with the same pixel value; if the area width is less than a width threshold, confirming that the pixel in the pixel area is a noise pixel.

[0033] During image acquisition, it is inevitable that some pixels will interfere with image segmentation. Most noise can be easily removed by thresholding. When some noise points are relatively small, setting the width of all areas to be greater than a certain threshold (such as a width of 1) can remove these noise pixels and ensure detection reliability. Figure 7 , Figure 7 This is an example diagram of an LED light board testing method provided in an embodiment of this specification. Figure 7 Shown are noise data identified based on region width.

[0034] S207, based on the pixel value of each pixel in the binary image, identifying a set of adjacent pixels having the same pixel value as a connected area of ​​the binary image; In one embodiment, after obtaining the binary image, based on the pixel values ​​of each pixel in the binary image, a set of adjacent pixels with the same pixel value is identified as a connected area of ​​the binary image. The determination of whether pixels are adjacent can be divided into four-connected and eight-connected. Figure 8 , Figure 8 This is an example diagram of a method for testing an LED light panel provided in an embodiment of this specification. It determines whether pixel C is adjacent to other pixels. For the 4-neighbor type, there are 4 pixels adjacent to C. For the 8-neighbor type, there are 8 pixels adjacent to C. It should be noted that, please refer to Figure 5 , Figure 5 The medium gray area can be regarded as a connected area, and the pixel values ​​of the pixels in this area are all 1.

[0035] S208 , determining connected area parameters of the connected area based on the pixel features of each pixel in the pixel set.

[0036] In one embodiment, after a connected region is identified, since the connected region contains pixels, connected region parameters of the connected region can be determined based on the pixel features of each pixel in the pixel set. Pixel features can include pixel values, pixel coordinates, pixel sizes, etc., and connected region parameters such as the centroid coordinates and area of ​​the connected region can be determined.

[0037] In the embodiments of this specification, by obtaining the product model code of the detection light board, calling the lamp bead lighting control parameters corresponding to the product model code, and outputting a screen control signal to the detection light board based on the lamp bead lighting control parameters, the detection light board is controlled to display a test screen according to the screen control signal, thereby adapting to different product model detection. Furthermore, by performing color conversion on the screen image to obtain a screen grayscale image, and then binarizing the screen grayscale image to obtain a screen binary image, based on the pixel value of each pixel in the screen binary image, a set of adjacent pixels with the same pixel value is identified as a connected area of ​​the screen binary image, and the connected area parameters of the connected area are identified based on the pixel features of each pixel in the pixel set, thereby quickly and accurately obtaining the connected area parameters for detection corresponding to the detection light board.

[0038] See Figure 9 , is a flow chart of a method for testing an LED light panel according to an embodiment of this specification. Figure 9 As shown, the method of the embodiment of this specification may include the following steps S301 to S308.

[0039] S301, confirming the difference between the number of connected areas and the number of light-emitting lamp beads; S302, comparing the difference with the difference threshold to obtain a lamp bead defect test result of the detection lamp board; In one embodiment, the connected area parameter is the number of connected areas, and the lamp bead lighting control parameter is the number of emitting lamp beads. The number of emitting lamp beads is also the set number of emitting lamp beads. By confirming the difference between the number of connected areas and the number of emitting lamp beads, and comparing the difference with the difference threshold, it can be confirmed that the lamp beads are able to emit light normally, and then the lamp bead defect test results can be obtained. When performing dynamic image detection, the detection specification requires that there are no defects or fewer spray points at a certain moment of the dynamic state. However, when the picture changes dynamically, one or two lamp beads may be in a half-bright state in the captured picture image. Therefore, there may be a deviation of one or two lamp beads from the number of connected areas and the number of emitting lamp beads. In this case, it can be considered that the lamp beads are normal, but if the difference between the number of connected areas and the number of emitting lamp beads is too large, it means that there are defective lamp beads. Exemplarily, the difference threshold can be set to 2. If the difference is greater than 2, there are defective lamp beads, and if it is less than or equal to 2, there are no defective lamp beads. It should be noted that if the detection is a static picture, the collected picture image is the image after all the controlled lamp beads are lit. The difference between the number of connected areas and the number of luminous lamp beads should be 0. If it is not 0, there are defective lamp beads.

[0040] S303, calculating the standard deviation of the number of connected regions based on the number of connected regions corresponding to each screen image; S304, comparing the standard deviation with the standard deviation threshold to obtain a lamp bead defect test result of the detection lamp board; In one embodiment, there are multiple screen images, the connected area parameter is the number of connected areas, and the lamp bead light control parameter is the standard deviation threshold. In order to reduce the possibility of misjudgment or missed judgment, multiple screen images can be obtained, and the multiple screen images can be binarized to obtain screen binary images. Then, the connected areas and connected area parameters of each screen binary image are confirmed, and the standard deviation of the number of connected areas of the multiple screen images is calculated. The lamp bead defect result is confirmed based on the standard deviation and the standard deviation threshold. If the standard deviation exceeds the standard deviation threshold, the result is judged to be defective; if the standard deviation is lower than the standard deviation threshold, the result is judged to be normal. The calculation formula of the standard deviation is as follows: σ = √(Σ(xi - μ)² / N)Formula (2) Among them, σ represents the standard deviation, Σ represents the summation symbol, that is, the sum is taken over all data points, xi represents the value of each data point, μ represents the mean of the data set, and N represents the number of data points in the data set.

[0041] S305, confirming the arrangement shape of the connected regions based on the connected region positions; S306, confirming whether the arrangement shape is consistent with the arrangement shape of the light-emitting lamp beads to obtain a lamp bead defect test result of the detection lamp board; In one embodiment, the connected area parameter is the location of the connected area, and the lamp bead illumination control parameter is the arrangement of the illuminated lamp beads. The arrangement of the illuminated lamp beads is the arrangement of the lamp beads according to the set illumination pattern. Based on the locations of the connected areas, the arrangement of the multiple connected areas can be determined. When the lamp beads are illuminating normally, the arrangement of the connected areas should match the arrangement of the illuminated lamp beads. If not, a defective lamp bead is present. If they match, the test result is normal.

[0042] For example, see Figure 3 When detecting static images, the arrangement shape of the connected areas should be orderly arranged rectangles; when detecting dynamic images, the arrangement shape of the connected areas should be consistent with the texture of the dynamic images, such as diagonal stripes, vertical bars, etc.

[0043] It should be noted that the lamp bead defect test result confirmation methods provided in steps S301-S302, steps S303-S304 and steps S305-S306 in the above embodiments can be used in combination.

[0044] S307, confirming the image color of the screen image; Specifically, after capturing the test screen image, the color of the screen image can be confirmed, and then the color detection of the test light board can be performed. For example, the color screen detection includes four colors: R (red), G (green), B (blue), and W (white). That is, the test screen can be controlled to the above four colors through the image control signal, and the light board display effect under each color can be detected.

[0045] In one embodiment, confirming the image color of the screen image includes: Obtain the color parameters of each pixel in the screen image and confirm the target color parameters that belong to the preset color range; Selecting target pixel points corresponding to target color parameters to generate a color segmentation image of the screen image; The image color of the color segmentation image is used as the image color of the screen image.

[0046] Specifically, the color parameters of each pixel in the screen image, such as the RBG value, can be confirmed, the target color parameters in the color parameters that belong to the preset color range can be confirmed, the target pixel points corresponding to the target color parameters can be selected, and the screen image can be segmented. The color style image can be segmented from the screen image, thereby removing the irrelevant background, and the image color of the color style image can be collected as the image color of the screen image, so as to perform color detection of the screen image.

[0047] S308: Compare the image color with the set luminous color in the picture control signal to obtain a test result of the lamp bead color of the detection lamp board.

[0048] In one embodiment, a set luminous color corresponding to a picture control signal is obtained, and the set luminous color is the color that the lamp beads need to present. The image color is compared with the set luminous color in the picture control signal. If the image color matches the set luminous color, it means that the lamp beads can emit color normally. If the image color does not match the set luminous color, it means that the lamp beads have problems such as color cast or no color, and the lamp bead color test result of the detection lamp board is obtained. Exemplarily, the image color obtained can be an image color histogram of the screen image, and the image color histogram is matched with the color histogram template corresponding to the set luminous color to obtain the degree of matching, and the lamp bead color test result of the detection lamp board is confirmed based on the degree of matching.

[0049] See Figure 10 , Figure 10The overall flow chart of the LED light board testing method provided in the embodiment of this specification, when starting the light board test, first obtain the product model of the detection light board by scanning the code, confirm the lamp bead light control parameters according to the detection program corresponding to the product model, and then generate a picture control signal according to the lamp bead light control parameters and transmit it to the detection light board, so that the detection light board displays the test picture, collects the picture image of the test picture, and judges the image color, that is, compares the image color with the set light color in the picture control signal to obtain the lamp bead color test result of the detection light board. In addition, the test image can be color converted to obtain a picture grayscale image, and the picture grayscale image can be binarized to obtain a picture binary image. When processing the picture binary image, information image enhancement, that is, noise data can be performed at the same time. Remove to obtain the enhanced binary image of the picture. At this time, the connected area analysis is performed on the binary image according to the test type (static picture test type or dynamic picture test type). For the dynamic picture test type, the robustness calculation can be performed on the picture image (also called dynamic image) that collects multiple dynamic pictures, such as the calculation of the standard deviation, to confirm the lamp bead defect test results. It can be understood that the lamp bead light control parameters corresponding to the picture control signals used for different test types are different. Therefore, the dynamic picture test results and the test results corresponding to the static picture can be obtained. The results of the two test types and the above-mentioned lamp bead color test results are comprehensively analyzed to confirm whether there are defective lamp beads on the lamp board. At the same time, the test-related data can be uploaded to the Manufacturing Execution System (MES), such as bad data and bad pictures, to facilitate the subsequent optimization of production process parameters, thereby improving product quality and efficiency.

[0050] In the embodiments of this specification, by confirming the difference between the number of connected areas and the number of luminous lamp beads, the difference is compared with the difference threshold to obtain the lamp bead defect test result of the detection lamp board; based on the number of connected areas corresponding to each screen image, the standard deviation of the number of connected areas is calculated, and the standard deviation is compared with the standard deviation threshold to obtain the lamp bead defect test result of the detection lamp board; based on the position of the connected areas, the arrangement shape of the connected areas is confirmed, and whether the arrangement shape is consistent with the arrangement shape of the luminous lamp beads is confirmed to obtain the lamp bead defect test result of the detection lamp board. Three implementation methods for confirming the lamp bead defect test results are provided. The lamp beads of the detection lamp board can be detected based on multiple dimensions, and the color of the detection lamp board can be detected to obtain the lamp bead color test result of the lamp board. The lamp bead defect test result is generated based on multi-dimensional evaluation criteria, which improves the richness and accuracy of the test and ensures the function and quality of the detection lamp board that passes the test.

[0051] The following will be combined with the Figure 11-12, the LED light board testing device provided in the embodiment of this specification is introduced in detail. Figure 11-12 The LED light board test device in this manual is used to perform Figure 2-Figure 10 For the convenience of explanation, only the part related to the embodiment of this specification is shown. For the specific technical details not disclosed, please refer to this specification. Figure 2-Figure 10 The embodiment shown.

[0052] See Figure 11 , which shows a schematic diagram of the structure of an LED light panel testing device provided by an exemplary embodiment of this specification. This LED light panel testing device can be implemented as all or part of a device through software, hardware, or a combination of both. The device 1 includes a control module 11, a collection module 12, a processing module 13, a confirmation module 14, and a result confirmation module 15.

[0053] The control module 11 is used to output a picture control signal to the detection light board to control the detection light board to display a test picture according to the picture control signal; The acquisition module 12 is used to acquire the image of the test screen; The processing module 13 is used to perform binarization processing on the screen image to obtain a screen binary image; A confirmation module 14 is used to confirm the connected area of ​​the binary image and the connected area parameters of the connected area based on the pixel value of each pixel in the binary image; The result confirmation module 15 is used to compare the connected area parameters with the lamp bead light emitting control parameters corresponding to the image control signal to obtain the lamp bead defect test result of the detection lamp board.

[0054] Optionally, the processing module 13 is specifically configured to perform color conversion on the screen image to obtain a screen grayscale image; The grayscale image of the picture is binarized to obtain a binary image of the picture.

[0055] Optionally, the processing module 13 is specifically configured to compare the grayscale value of each pixel in the grayscale image of the screen with the grayscale threshold corresponding to the detection light board to obtain a comparison result; Based on the comparison result, the binary pixel value of each pixel is determined to obtain a binary image of the screen.

[0056] Optionally, the confirmation module 14 is specifically configured to confirm, based on the pixel value of each pixel in the binary image, a set of adjacent pixels having the same pixel value as a connected area of ​​the binary image; The connected region parameters of the connected region are determined based on the pixel features of each pixel in the pixel set.

[0057] Optionally, the connected area parameter is the number of connected areas, and the lamp bead light emitting control parameter is the number of emitting lamp beads. The result confirmation module 15 is specifically used to confirm the difference between the number of connected areas and the number of emitting lamp beads. The difference is compared with the difference threshold to obtain the lamp bead defect test result of the detection lamp board.

[0058] Optionally, there are multiple screen images, the connected area parameter is the number of connected areas, and the lamp bead light control parameter is the standard deviation threshold. The result confirmation module 15 is specifically used to calculate the standard deviation of the number of connected areas based on the number of connected areas corresponding to each screen image; The standard deviation is compared with the standard deviation threshold to obtain the lamp bead defect test result of the detection lamp board.

[0059] Optionally, the connected area parameter is the connected area position, the lamp bead light emitting control parameter is the arrangement shape of the light emitting lamp beads, and the result confirmation module 15 is specifically used to confirm the arrangement shape of the connected area based on the connected area position; Confirm whether the arrangement shape is consistent with the arrangement shape of the light-emitting lamp beads to obtain the lamp bead defect test results of the detection lamp board.

[0060] Optionally, the control module 11 is specifically used to obtain the product model code of the detection light board; Call the lamp bead lighting control parameters corresponding to the product model code; Based on the lamp bead light control parameters, the picture control signal is output to the detection light board to control the detection light board to display the test picture according to the picture control signal.

[0061] Optional, see Figure 12 , is a schematic diagram of the structure of an LED light board testing device provided by an exemplary embodiment of this specification. Figure 12 As shown, the LED light board testing device further includes a color detection module 16 for confirming the image color of the screen image; Compare the image color with the set luminous color in the picture control signal to obtain the lamp bead color test result of the detection lamp board.

[0062] Optionally, the color detection module 16 is specifically used to obtain the color parameters of each pixel in the screen image and confirm the target color parameters belonging to the preset color range; Selecting target pixel points corresponding to target color parameters to generate a color segmentation image of the screen image; The image color of the color segmentation image is used as the image color of the screen image.

[0063] It should be noted that the LED light board testing device provided in the above embodiment only uses the division of the above functional modules as an example when executing the LED light board testing method. In actual applications, the above functions can be assigned to different functional modules as needed, that is, the internal structure of the device can be divided into different functional modules to complete all or part of the functions described above. In addition, the LED light board testing device provided in the above embodiment and the LED light board testing method embodiment are based on the same concept. The implementation process is detailed in the method embodiment and will not be repeated here.

[0064] The serial numbers of the embodiments in this specification are for descriptive purposes only and do not represent the merits of the embodiments. In some cases, the actions or steps recited in the claims may be performed in an order different from that in the embodiments and still achieve the desired results. In addition, the processes depicted in the accompanying drawings do not necessarily require the specific order or sequential order shown to achieve the desired results. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.

[0065] The embodiment of this specification also provides a computer storage medium having a computer program stored thereon, which implements the above-mentioned Figure 2-Figure 10 The LED light board testing method of the embodiment shown, the specific execution process can be found in Figure 2-Figure 10 The detailed description of the illustrated embodiment will not be repeated here.

[0066] Please refer to Figure 13 , which shows a schematic diagram of the structure of an electronic device provided by an exemplary embodiment of this specification. The electronic device described in this specification may include one or more of the following components: a processor 110, a memory 120, an input device 130, an output device 140, and a bus 150. The processor 110, the memory 120, the input device 130, and the output device 140 may be connected via the bus 150.

[0067] The processor 110 may include one or more processing cores. The processor 110 utilizes various interfaces and circuits to connect various components within the electronic device. It executes instructions, programs, code sets, or instruction sets stored in the memory 120, as well as accesses data stored in the memory 120, to perform various functions and process data for the terminal 100. Optionally, the processor 110 may be implemented using at least one of the following hardware forms: a digital signal processing (DSP), a field-programmable gate array (FPGA), or a programmable logic array (PLA). The processor 110 may integrate one or a combination of a central processing unit (CPU), a graphics processing unit (GPU), and a modem. The CPU primarily processes the operating system, user interfaces, and applications; the GPU is responsible for rendering and drawing display content; and the modem handles wireless communications. It is understood that the modem may not be integrated into the processor 110 and may instead be implemented via a separate communications chip.

[0068] The memory 120 may include a random access memory (RAM) or a read-only memory (ROM). Optionally, the memory 120 includes a non-transitory computer-readable storage medium (Non-Transitory Computer-Readable Storage Medium). The memory 120 may be used to store instructions, programs, codes, code sets, or instruction sets. The memory 120 may include a program storage area and a data storage area, wherein the program storage area may store instructions for implementing an operating system, instructions for implementing at least one function (such as a touch function, a sound playback function, an image playback function, etc.), instructions for implementing the above-mentioned various method embodiments, etc. The operating system may be an Android system, including a system deeply developed based on the Android system, an iOS system developed by Apple, including a system deeply developed based on the iOS system, or other systems.

[0069] The memory 120 can be divided into an operating system space and a user space. The operating system runs in the operating system space, and native and third-party applications run in the user space. In order to ensure that different third-party applications can achieve better operating results, the operating system allocates corresponding system resources to different third-party applications. However, the requirements for system resources in different application scenarios in the same third-party application are also different. For example, in the local resource loading scenario, the third-party application has higher requirements for disk reading speed; in the animation rendering scenario, the third-party application has higher requirements for GPU performance. The operating system and the third-party application are independent of each other, and the operating system often cannot perceive the current application scenario of the third-party application in a timely manner, resulting in the operating system being unable to perform targeted system resource adaptation according to the specific application scenario of the third-party application.

[0070] In order for the operating system to distinguish the specific application scenarios of third-party applications, it is necessary to open up data communication between third-party applications and the operating system so that the operating system can obtain the current scenario information of third-party applications at any time, and then perform targeted system resource adaptation based on the current scenario.

[0071] The input device 130 is used to receive input commands or data and includes, but is not limited to, a keyboard, a mouse, a camera, a microphone, or a touch-sensitive device. The output device 140 is used to output commands or data and includes, but is not limited to, a display device and a speaker. In one example, the input device 130 and the output device 140 may be combined, and the input device 130 and the output device 140 may be a touch-sensitive display.

[0072] The touch display screen can be designed as a full screen, a curved screen or a special-shaped screen. The touch display screen can also be designed as a combination of a full screen and a curved screen, or a combination of a special-shaped screen and a curved screen, which is not limited in the embodiments of this specification.

[0073] In addition, those skilled in the art will understand that the structures of the electronic devices shown in the above figures do not limit the electronic devices. The electronic devices may include more or fewer components than shown, or may combine certain components or arrange the components differently. For example, the electronic devices may also include radio frequency circuits, input units, sensors, audio circuits, WiFi modules, power supplies, Bluetooth modules, and other components, which will not be described in detail here.

[0074] exist Figure 13 In the electronic device shown, the processor 110 may be configured to call a computer application stored in the memory 120 and specifically perform the following operations: Output the picture control signal to the detection light board to control the detection light board to display the test picture according to the picture control signal; Collecting a screen image of a test screen; Binarization is performed on the screen image to obtain a screen binary image; Determining connected regions of the binary image and connected region parameters of the connected regions based on pixel values ​​of pixels in the binary image; The connected area parameters are compared with the lamp bead light emitting control parameters corresponding to the picture control signal to obtain the lamp bead defect test results of the detection lamp board.

[0075] In one embodiment, when the processor 110 performs a binarization process on the screen image to obtain a screen binary image, the processor 110 specifically performs the following operations: performing a color conversion on the screen image to obtain a screen grayscale image; The grayscale image of the picture is binarized to obtain a binary image of the picture.

[0076] In one embodiment, when the processor 110 performs binarization processing on the grayscale image to obtain a binary image, the processor 110 specifically performs the following operations: Compare the grayscale value of each pixel in the grayscale image with the grayscale threshold corresponding to the detection light board to obtain a comparison result; Based on the comparison result, the binary pixel value of each pixel is determined to obtain a binary image of the screen.

[0077] In one embodiment, when the processor 110 determines the connected regions and connected region parameters of the binary image based on the pixel values ​​of each pixel in the binary image, the processor 110 specifically performs the following operations: Based on the pixel value of each pixel in the binary image, a set of adjacent pixels having the same pixel value is identified as a connected area of ​​the binary image; The connected region parameters of the connected region are determined based on the pixel features of each pixel in the pixel set.

[0078] In one embodiment, the connected area parameter is the number of connected areas, and the lamp bead light control parameter is the number of lighted lamp beads. When the processor 110 compares the connected area parameter with the lamp bead light control parameter to obtain a lamp bead defect test result for the lamp board, the processor 110 specifically performs the following operations: Confirm the difference between the number of connected areas and the number of light-emitting beads; The difference is compared with the difference threshold to obtain the lamp bead defect test result of the detection lamp board.

[0079] In one embodiment, there are multiple screen images, the connected area parameter is the number of connected areas, and the lamp bead light control parameter is the standard deviation threshold. When the processor 110 compares the connected area parameter with the lamp bead light control parameter to obtain the lamp bead defect test result of the lamp board, the processor 110 specifically performs the following operations: Based on the number of connected regions corresponding to each image, calculate the standard deviation of the number of connected regions; The standard deviation is compared with the standard deviation threshold to obtain the lamp bead defect test result of the detection lamp board.

[0080] In one embodiment, the connected area parameter is the connected area position, and the lamp bead light control parameter is the arrangement shape of the light-emitting lamp beads. When the processor 110 compares the connected area parameter with the lamp bead light control parameter to obtain the lamp bead defect test result of the lamp board, the processor 110 specifically performs the following operations: Determine the arrangement shape of the connected regions based on their positions; Confirm whether the arrangement shape is consistent with the arrangement shape of the light-emitting lamp beads to obtain the lamp bead defect test results of the detection lamp board.

[0081] In one embodiment, after acquiring the image of the test screen, the processor 110 further performs the following operations: Confirm the image color of the screen image; Compare the image color with the set luminous color in the picture control signal to obtain the lamp bead color test result of the detection lamp board.

[0082] In one embodiment, when executing the image color confirmation screen image, the processor 110 specifically performs the following operations: Obtain the color parameters of each pixel in the screen image and confirm the target color parameters that belong to the preset color range; Selecting target pixel points corresponding to target color parameters to generate a color segmentation image of the screen image; The image color of the color segmentation image is used as the image color of the screen image.

[0083] In one embodiment, when the processor 110 outputs the image control signal to the detection light board to control the detection light board to display the test image according to the image control signal, the processor 110 specifically performs the following operations: Get the product model code of the detection light board; Call the lamp bead lighting control parameters corresponding to the product model code; Based on the lamp bead light control parameters, the picture control signal is output to the detection light board to control the detection light board to display the test picture according to the picture control signal.

[0084] In the embodiment of the present specification, by outputting the required picture control signal to the detection light board, the detection light board displays the test picture according to the picture control signal, and only the picture image of the test picture needs to be collected. By binarizing the picture image, a picture binary image is obtained, and the connected area is further confirmed according to the pixel value of each pixel in the picture binary image, and the connected area parameters are obtained. The connected area parameters are compared with the lamp bead light control parameters corresponding to the picture control signal, and the lamp bead test results of the detection light board can be quickly obtained. The implementation process is simple, the detection efficiency is high, the computing power requirements of the computer are reduced, and the detection accuracy is improved. The LED light board testing method of the present application can be used to test detection light boards of different specifications by outputting different picture control signals.

[0085] Furthermore, by obtaining the product model code of the detection light board, calling the lamp bead lighting control parameters corresponding to the product model code, and outputting a screen control signal to the detection light board based on the lamp bead lighting control parameters, the detection light board is controlled to display a test screen according to the screen control signal, thereby adapting to different product model detection. Furthermore, by performing color conversion on the screen image to obtain a screen grayscale image, and then binarizing the screen grayscale image to obtain a screen binary image, based on the pixel value of each pixel in the screen binary image, a set of adjacent pixels with the same pixel value is identified as a connected area of ​​the screen binary image, and the connected area parameters of the connected area are identified based on the pixel features of each pixel in the pixel set, thereby quickly and accurately obtaining the connected area parameters for detection corresponding to the detection light board.

[0086] Furthermore, by confirming the difference between the number of connected areas and the number of luminous lamp beads, the difference is compared with the difference threshold to obtain the lamp bead defect test result of the detection lamp board; based on the number of connected areas corresponding to each screen image, the standard deviation of the number of connected areas is calculated, and the standard deviation is compared with the standard deviation threshold to obtain the lamp bead defect test result of the detection lamp board; based on the position of the connected areas, the arrangement shape of the connected areas is confirmed, and whether the arrangement shape is consistent with the arrangement shape of the luminous lamp beads is confirmed to obtain the lamp bead defect test result of the detection lamp board. Three implementation methods for confirming the lamp bead defect test results are provided. The lamp beads of the detection lamp board can be detected based on multiple dimensions, and the color of the detection lamp board can be detected to obtain the lamp bead color test result of the lamp board. The lamp bead defect test result is generated based on multi-dimensional evaluation standards, which improves the richness and accuracy of the test and ensures the function and quality of the detection lamp board that passes the test.

[0087] In addition, the embodiments of this specification provide a computer program product, which includes a computer program. When the computer program is executed by a processor of an electronic device, the processor can at least implement the above-mentioned Figures 2 to 10The LED light board testing method provided in the illustrated embodiment.

[0088] Those skilled in the art will appreciate that all or part of the processes in the above-described method embodiments can be implemented by instructing the relevant hardware through a computer program. The aforementioned program can be stored in a computer-readable storage medium. When executed, the program can include the processes in the above-described method embodiments. The aforementioned storage medium can be a magnetic disk, an optical disk, a read-only memory (ROM), or a random access memory (RAM).

[0089] The above disclosure is only a preferred embodiment of this specification, and certainly cannot be used to limit the scope of rights of this specification. Therefore, equivalent changes made according to the claims of this specification are still within the scope covered by this specification.

Claims

1. A method for testing an LED light board, characterized in that: include: Outputting a picture control signal to the detection light board to control the detection light board to display a test picture according to the picture control signal; Acquiring a screen image of the test screen; Performing binarization processing on the screen image to obtain a screen binary image; Determining a connected area of ​​the binary image and connected area parameters of the connected area based on a pixel value of each pixel in the binary image; The connected area parameter is compared with the lamp bead light emitting control parameter corresponding to the picture control signal to obtain the lamp bead defect test result of the detection lamp board.

2. The method according to claim 1, wherein The binarization process is performed on the screen image to obtain a screen binary image, comprising: Performing color conversion on the screen image to obtain a screen grayscale image; The picture grayscale image is binarized to obtain a picture binary image.

3. The method according to claim 2, wherein The binarization process is performed on the grayscale image to obtain a binary image, including: Comparing the grayscale value of each pixel in the grayscale image with the grayscale threshold corresponding to the detection light board to obtain a comparison result; The binary pixel value of each pixel is determined based on the comparison result to obtain a binary image of the screen.

4. The method according to claim 1, wherein The determining, based on the pixel value of each pixel in the binary image, a connected area of ​​the binary image and connected area parameters of the connected area, includes: Based on the pixel value of each pixel in the binary image, a set of adjacent pixels having the same pixel value is identified as a connected area of ​​the binary image; A connected region parameter of the connected region is determined based on a pixel feature of each pixel in the pixel set.

5. The method according to claim 1, wherein The connected area parameter is the number of connected areas, and the lamp bead light emitting control parameter is the number of light-emitting lamp beads; The comparing the connected area parameter with the lamp bead light emitting control parameter to obtain the lamp bead defect test result of the detection lamp board includes: Determine the difference between the number of the connected areas and the number of the light-emitting lamp beads; The difference is compared with a difference threshold to obtain a lamp bead defect test result of the detection lamp board.

6. The method according to claim 1, wherein There are multiple images, the connected area parameter is the number of connected areas, and the lamp bead light control parameter is the standard deviation threshold; The comparing the connected area parameter with the lamp bead light emitting control parameter corresponding to the picture control signal to obtain the lamp bead defect test result of the detection lamp board includes: Calculating a standard deviation of the number of connected regions based on the number of connected regions corresponding to each screen image; The standard deviation is compared with the standard deviation threshold to obtain a lamp bead defect test result of the detection lamp board.

7. The method according to claim 1, wherein The connected area parameter is the connected area position, and the lamp bead light emitting control parameter is the arrangement shape of the light emitting lamp beads; The comparing the connected area parameter with the lamp bead light emitting control parameter corresponding to the picture control signal to obtain the lamp bead defect test result of the detection lamp board includes: Determining an arrangement shape of the connected regions based on the positions of the connected regions; Confirm whether the arrangement shape is consistent with the arrangement shape of the light-emitting lamp beads to obtain the lamp bead defect test result of the detection lamp board.

8. The method according to claim 1, wherein After acquiring the image of the test screen, the method further includes: confirming the image color of the screen image; The image color is compared with the set luminous color in the picture control signal to obtain the lamp bead color test result of the detection lamp board.

9. The method according to claim 8, wherein The confirming the image color of the screen image includes: Obtaining color parameters of each pixel in the screen image and confirming target color parameters that fall within a preset color range; Selecting target pixel points corresponding to the target color parameters to generate a color segmentation image of the screen image; The image color of the color segmentation image is used as the image color of the screen image.

10. The method according to claim 1, wherein The outputting of the picture control signal to the detection light board to control the detection light board to display the test picture according to the picture control signal includes: Obtain the product model code of the detection light board; Call the lamp bead lighting control parameters corresponding to the product model code; Based on the lamp bead light emitting control parameters, a picture control signal is output to the detection light board to control the detection light board to display a test picture according to the picture control signal.

11. The method according to claim 1 or 10, wherein: The picture control signal includes at least one of a color control signal and a dynamic picture control signal.

12. An LED light board testing device, characterized in that: The device comprises: A control module, configured to output a picture control signal to the detection light board, so as to control the detection light board to display a test picture according to the picture control signal; An acquisition module, configured to acquire the image of the test screen; A processing module, configured to perform binarization processing on the screen image to obtain a screen binary image; A confirmation module, configured to confirm a connected area of ​​the binary image and connected area parameters of the connected area based on a pixel value of each pixel in the binary image; The result confirmation module is used to compare the connected area parameter with the lamp bead light emitting control parameter corresponding to the picture control signal to obtain the lamp bead defect test result of the detection lamp board.

13. An electronic device, characterized in that: include: processor and memory; The memory stores a computer program, which is suitable for being loaded by the processor and executing the steps of the method according to any one of claims 1 to 11.

14. A computer storage medium, characterized in that The computer storage medium stores a computer program, and when the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 11 are implemented.

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