Enabling fault threshold testing method, device and equipment and storage medium

Abstract

The invention relates to the technical field of electronic circuits, and discloses an enabling fault threshold test method, device and equipment and a storage medium, and the method comprises the steps: selecting a to-be-tested bridge arm and a to-be-tested phase from a power module to construct a power module test loop; initializing a test environment of a power module test loop and carrying out enabling fault detection to obtain a phase enabling fault threshold value; judging whether the current bridge arm completes all phase tests or not to obtain a phase test judgment result; if the phase test judgment result is completion, obtaining a bridge arm enabling fault threshold according to all phase enabling fault thresholds of the selected bridge arm; the systematic test of the enabling fault threshold in the development stage of the power module is realized through a bridge arm and phase hierarchical selection mechanism, independent test loop construction, differential power supply configuration, voltage scanning detection and the like.

Description

Technical Field

[0001] The present invention relates to the technical field of electronic circuits, and in particular to an enabling fault threshold test method, device, equipment and storage medium. Background Art

[0002] In the early stages of intelligent power module development, engineers need to conduct parameter tests on the enable fault threshold by building their own circuits. However, existing technologies lack a systematic testing method, which can easily lead to short-circuit risks or detection deviations during testing due to problems such as disordered bridge arm and phase connections and inaccurate power supply configuration. Furthermore, circuit construction relies on engineers' experience, resulting in irregular processes, high missed detection rates, and high costs. This makes it difficult to meet the needs of low-cost and efficient enable fault threshold parameter testing during the development phase. Summary of the Invention

[0003] In order to overcome the shortcomings of the prior art, the purpose of the present invention is to provide an enabling fault threshold test method, device, equipment and storage medium, which realizes the systematic testing of enabling fault thresholds in the power module development stage through a hierarchical selection mechanism of bridge arms and phases, independent test loop construction, differentiated power supply configuration and voltage scanning detection.

[0004] A first aspect of the present invention provides an enable fault threshold test method, comprising: selecting a bridge arm to be tested from a power module; selecting a phase to be tested from the selected bridge arm; constructing a power module test loop according to the selected phase; initializing a test environment of the power module test loop according to the selected bridge arm to obtain the power module to be tested; performing enable fault detection on the power module to be tested to obtain a phase enable fault threshold; judging whether all phase tests of the selected bridge arm have been completed to obtain a phase test judgment result; if the phase test judgment result is completed, obtaining a bridge arm enable fault threshold according to all phase enable fault thresholds of the selected bridge arm.

[0005] Optionally, in a first implementation method of the first aspect of the present invention, constructing a power module test circuit based on the selected phase includes: determining whether the power module is in a power-on state; if the power module is in a power-on state, cutting off the high-voltage power supply and low-voltage power supply of the power module to obtain a power module in a power-off state; selecting a corresponding external phase control unit according to the selected phase; connecting the power module in the power-off state to the selected external phase control unit to obtain a power module test circuit.

[0006] Optionally, in a second implementation method of the first aspect of the present invention, the test environment of the power module test circuit is initialized according to the selected bridge arm to obtain the power module to be tested, including: obtaining configuration parameters corresponding to the bridge arm from a preset power supply parameter library according to the selected bridge arm; and initializing the test environment of the power module test circuit according to the configuration parameters to obtain the power module to be tested.

[0007] Optionally, in a third implementation method of the first aspect of the present invention, the enable fault detection is performed on the power module to be tested to obtain the phase enable fault threshold, including: performing an upward scan on the enable fault input port of the power module to be tested to obtain the enable fault turn-on threshold; performing a downward scan on the enable fault input port of the power module to be tested to obtain the enable fault turn-off threshold; and performing data aggregation on the enable fault turn-on threshold and the enable fault turn-off threshold to obtain the phase enable fault threshold.

[0008] Optionally, in a fourth implementation method of the first aspect of the present invention, the determination of whether the selected bridge arm has completed all phase tests to obtain a phase test judgment result includes: counting the number of completed phase tests in the selected bridge arm, and comparing it with the total number of phases of the selected bridge arm; if the number of completed phase tests is equal to the total number of phases, marking the phase test judgment result as completed; if the number of completed phase tests is less than the total number of phases, marking the phase test judgment result as incomplete.

[0009] Optionally, in the fifth implementation method of the first aspect of the present invention, after determining whether the selected bridge arm has completed all phase tests to obtain the phase test judgment result, it also includes: if the phase test judgment result is incomplete, selecting one of the phases that have not been tested in the selected bridge arm as the selected phase, and returning to execute the power module test loop constructed according to the selected phase.

[0010] Optionally, in the sixth implementation method of the first aspect of the present invention, if the phase test judgment result is completed, then after obtaining the bridge arm enable fault threshold based on all phase enable fault thresholds of the selected bridge arm, it also includes: counting the number of bridge arms that have completed the test in the power module, and comparing it with the total number of bridge arms of the power module; if the number of bridge arms that have completed the test is equal to the total number of bridge arms, generating the power module enable fault threshold based on all bridge arm enable fault thresholds; if the number of bridge arms that have completed the test is less than the total number of bridge arms, selecting another bridge arm from the power module as the selected bridge arm, and returning to execute the selection of the phase to be tested from the selected bridge arm.

[0011] The second aspect of the present invention provides an enable fault threshold test device, including: a bridge arm selection module, used to select a bridge arm to be tested from a power module; a phase selection module, used to select a phase to be tested from the selected bridge arm; a construction module, used to construct a power module test loop according to the selected phase; an initialization module, used to initialize the test environment of the power module test loop according to the selected bridge arm to obtain the power module to be tested; a detection module, used to perform enable fault detection on the power module to be tested to obtain a phase enable fault threshold; a phase judgment module, used to judge whether the selected bridge arm has completed all phase tests to obtain a phase test judgment result; a generation module, used to obtain the bridge arm enable fault threshold according to all phase enable fault thresholds of the selected bridge arm if the phase test judgment result is completed.

[0012] A third aspect of the present invention provides an enabling fault threshold testing device, which includes: a memory and at least one processor, wherein instructions are stored in the memory; at least one of the processors calls the instructions in the memory so that the enabling fault threshold testing device performs each step of the enabling fault threshold testing method described above.

[0013] A fourth aspect of the present invention provides a computer-readable storage medium having instructions stored thereon, wherein the instructions, when executed by a processor, implement the various steps of any of the above-mentioned methods for enabling fault threshold testing.

[0014] In the technical solution of the present invention, a hierarchical selection of bridge arms and phases is first performed, and then a single phase in a power-off state is connected to construct a test loop, and then an adaptive power supply and control signal are applied to the constructed loop to activate the fault detection logic to obtain the power module to be tested; then an enabling fault detection is performed on it to obtain the phase enabling fault threshold; and a judgment mechanism is combined to ensure that no phase is missed to test, so as to obtain the bridge arm enabling fault threshold; the testing method of the present invention provides a standardized testing process for the enabling fault threshold, designs corresponding test contents for different bridge arms and phases, improves the accuracy of the enabling threshold test, avoids missed tests or misjudgments caused by human experience, provides a reliable quantitative basis for optimizing the power module selection scheme, realizes the systematic testing of the enabling fault threshold in the power module development stage, and meets the low-cost and efficient enabling fault threshold parameter testing requirements in the power module development stage. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] The above and / or additional aspects and advantages of the present invention will become apparent and readily understood from the following description of the embodiments with reference to the accompanying drawings, in which:

[0016] Figure 1 A first flow chart of a method for enabling fault threshold testing provided by an embodiment of the present invention;

[0017] Figure 2 A second flow chart of the enabling fault threshold test method provided by an embodiment of the present invention;

[0018] Figure 3 A third flow chart of the enabling fault threshold test method provided by an embodiment of the present invention;

[0019] Figure 4 A fourth flow chart of the enabling fault threshold test method provided by an embodiment of the present invention;

[0020] Figure 5 A fifth flow chart of the enabling fault threshold test method provided in an embodiment of the present invention;

[0021] Figure 6 A sixth flow chart of the enabling fault threshold test method provided by an embodiment of the present invention;

[0022] Figure 7 A seventh flow chart of the enabling fault threshold test method provided by an embodiment of the present invention;

[0023] Figure 8 A schematic structural diagram of an enabling fault threshold test device provided by an embodiment of the present invention;

[0024] Figure 9 A schematic diagram of the structure of an enabling fault threshold test device provided in an embodiment of the present invention;

[0025] Figure 10 A test circuit diagram of a power module provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0026] The present invention provides an enabling fault threshold test method, device, equipment and storage medium, which first performs hierarchical selection of bridge arms and phases, then connects a single phase in a power-off state to construct a test loop, and then applies an adaptive power supply and control signal to the constructed loop to activate the fault detection logic to obtain a power module to be tested; then an enabling fault detection is performed on it to obtain a phase enabling fault threshold; and a judgment mechanism is combined to ensure that no phase is missed to test, so as to obtain the bridge arm enabling fault threshold; the testing method of the present invention provides a standardized test process for the enabling fault threshold, designs corresponding test contents for different bridge arms and phases, improves the accuracy of the enabling threshold test, avoids missed tests or misjudgments caused by human experience, provides a reliable quantitative basis for optimizing the power module selection scheme, realizes systematic testing of the enabling fault threshold in the power module development stage, and meets the low-cost and efficient enabling fault threshold parameter testing requirements in the power module development stage.

[0027] The terms "first," "second," "third," "fourth," and the like (if any) in the description and claims of the present invention and in the accompanying drawings are used to distinguish similar objects and are not necessarily used to describe a particular order or precedence. It should be understood that the terms used in this manner are interchangeable where appropriate so that the embodiments described herein can be implemented in an order other than that illustrated or described herein. In addition, the terms "including" or "having" and any variations thereof are intended to cover non-exclusive inclusions, for example, a process, method, system, product, or apparatus that includes a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units that are not explicitly listed or that are inherent to these processes, methods, products, or apparatus.

[0028] For easier understanding, see Figure 10 , Figure 10 This is a power module test circuit diagram provided by an embodiment of the present invention.

[0029] When performing the upper arm U / V / W phase test process, taking the U phase as an example, it is divided into the following steps:

[0030] Step 1: Connect the target phase in the off-power state. Specifically, after confirming that all power sources are disconnected, close relay K1 to connect the upper bridge arm U phase to the test circuit. The other relays (K2-K6) remain disconnected to form an independent test circuit. This step is intended to avoid busbar short circuits caused by multiple phases being turned on at the same time, ensuring test safety.

[0031] Step 2: Apply power and initialization signals. Specifically, first connect the low-voltage power supply (VCC = 15V, EN = 5V), then connect the upper bridge arm drive power supply (VBU = 15V), and finally connect the high-voltage power supply (bus voltage input terminal P); then connect the control signal INUH = 5V, the upper bridge arm PWM signal (INVH / INWH) = 5V, and turn off the lower bridge arm PWM signal; the purpose of this step is to activate the U-phase upper bridge arm triode transistor, initialize the fault detection logic, and prepare for enabling fault threshold scanning;

[0032] Step 3: Perform FAULT port voltage scanning and threshold capture. Specifically: first perform an upward scan, starting from an initial voltage lower than the expected threshold, gradually increase the FAULT port voltage with a preset step size, and monitor the bus current of the current detection device in real time; when the current suddenly increases, record the voltage at this time as the turn-on threshold THon; then perform a downward scan, increase the FAULT port voltage to a voltage higher than the expected threshold, and gradually decrease it with a preset step size. When the current suddenly decreases to the normal range, record the voltage at this time as the turn-off threshold THoff; in this process, the voltage scan range is based on the fault design threshold setting of the driver chip of the power module; the step size depends on the size of the threshold range. If the action threshold range is large, the step size interval can be set larger, which can shorten the test time. If the product threshold range is small, the step size interval can be set smaller, so that the action threshold can be measured more accurately; the principle of this step is based on the internal overcurrent protection mechanism of the FAULT port voltage trigger module, and its current mutation point is the threshold critical point;

[0033] Step 4: Disconnect the relay and reset. Specifically, first disconnect the high-voltage power supply, wait for the internal capacitor of the module to discharge for a period of time (for example, 5 seconds), and then disconnect the low-voltage power supply; finally, disconnect the relay K1 to restore the initial state. This step is to prevent the low-voltage side chip from being damaged by high-voltage backflow.

[0034] Step 5: Switch phases and repeat the test. Specifically, after completing the U-phase test, repeat steps 1 to 4 to complete the upper arm V-phase and W-phase tests.

[0035] The test logic for the lower-arm NU / NV / NW phases is similar to that for the upper-arm U / V / W phases. The difference is that the upper-arm test requires the application of the VBU / VBV / VBW drive power supply (15V) to match the drive requirements of the upper-arm triode transistors. The lower-arm test only requires a low-voltage control power supply (VCC = 15V) to avoid signal interference caused by redundant power supply.

[0036] Through single-closure control of relays K1-K6 (for example, only K1 is closed when measuring phase U), the module design principle of "the same bridge arm phase cannot be turned on at the same time" is strictly adhered to, eliminating the risk of short circuits at the hardware level. It is applicable to all power modules with upper and lower bridge arm structures, providing engineers with a replicable standardized process for building their own circuits, effectively shortening the development cycle and reducing testing costs.

[0037] For ease of understanding, the specific process of the embodiment of the present invention is described below. Figure 1 , an embodiment of a method for enabling fault threshold testing in an embodiment of the present invention includes:

[0038] 101. Select a bridge arm to be tested from the power module;

[0039] In this embodiment, the power module usually includes an upper bridge arm and a lower bridge arm, and there are differences in the driving characteristics of the two (for example, the upper bridge arm requires an independent driving power supply, and the lower bridge arm only requires a control signal). The hierarchical selection of bridge arms can realize the configuration of a differentiated test environment and avoid signal interference or power backflow caused by mixed driving. Through the bridge arm selection mechanism, the test object is limited to a single bridge arm (upper bridge arm or lower bridge arm), ensuring that the applied power and control signals only activate the target bridge arm and suppress the malfunction of the non-test bridge arm. For example, when testing the upper bridge arm, the lower bridge arm drive signal is turned off to prevent the upper and lower bridge arms from short-circuiting and improve test safety; when testing the lower bridge arm, the upper bridge arm drive power supply is cut off to avoid energy loss caused by redundant power supply.

[0040] 102. Select a phase to be tested from the selected bridge arm;

[0041] In this embodiment, a single bridge arm contains multiple phases (such as U / V / W phases or NU / NV / NW phases), and single-phase selection is the core step to achieve "independent phase isolation testing" to avoid bus short circuit or parameter cross-interference caused by multiple phases being turned on at the same time; through the phase selection unit (such as electrical isolation components, switching circuits, relays), only a single phase is connected at a time to build an independent test loop; for example, when testing the upper bridge arm U phase, only the upper and lower bridge arm transistors of the U phase are activated, and the V / W phase remains disconnected to ensure that the test current only flows through the target phase, eliminating the influence of other phase parasitic parameters, so that the threshold detection result more truly reflects the performance of a single phase.

[0042] 103. Construct a power module test circuit according to the selected phase;

[0043] In this embodiment, the test circuit must meet the three requirements of "power-off connection, single-phase conduction, and safe isolation" to ensure that there is no high-voltage residual or phase crosstalk during the test process; first, the circuit is constructed in an off-power state to eliminate the interference of residual charge inside the module on threshold detection (such as voltage offset caused by capacitor energy storage), while avoiding instantaneous high voltage damage to the port caused by live operation; then, the phase to be tested is connected to the external test equipment through an isolation device (such as a relay or optocoupler) to form a closed loop to ensure the uniqueness of signal transmission; finally, the non-test phase is kept electrically disconnected to prevent bus voltage drops or current surges caused by multi-phase conduction.

[0044] 104. Initialize the test environment of the power module test circuit according to the selected bridge arm to obtain the power module to be tested;

[0045] In this embodiment, the driving requirements of the upper and lower bridge arms are different, and power and control signals need to be applied in a targeted manner to activate the fault detection logic of the target bridge arm while suppressing the interference signal of the non-test bridge arm.

[0046] 105. Perform enable fault detection on the power module to be tested to obtain a phase enable fault threshold;

[0047] In this embodiment, the critical point of the fault protection mechanism is captured by dual-edge voltage scanning (rising edge + falling edge) to ensure the bidirectional consistency of threshold detection; first, the rising edge scan is performed to gradually increase the voltage of the enabled fault port from a low voltage, and monitor the current mutation point (THon). The current mutation point represents the activation threshold of the fault protection and reflects the module's response sensitivity to overcurrent; then the falling edge scan is performed: the voltage of the enabled fault port is gradually reduced from a high voltage to capture the current recovery point (THoff). The current recovery point represents the release threshold of the fault protection and reflects the hysteresis characteristics of the module to fault elimination; the phase enable fault threshold of the current phase can be obtained by combining the activation threshold and the release threshold.

[0048] 106. Determine whether all phase tests of the selected bridge arm have been completed to obtain a phase test determination result;

[0049] In this embodiment, a counting or marking mechanism is used to ensure that all phases in a single bridge arm are tested without omission, thereby avoiding missed tests due to manual operation negligence.

[0050] 107. If the phase test result is completed, the bridge arm enable fault threshold is obtained according to all phase enable fault thresholds of the selected bridge arm;

[0051] In this embodiment, the phase enable fault thresholds of all phases of the current bridge arm are combined to obtain the bridge arm enable fault threshold of the current bridge arm.

[0052] In an embodiment of the present invention, it first performs hierarchical selection of bridge arms and phases, then connects to a single phase in a power-off state to construct a test loop, and then applies an adaptive power supply and control signal to the constructed loop to activate the fault detection logic to obtain the power module to be tested; then it performs enable fault detection to obtain the phase enable fault threshold; and combines the judgment mechanism to ensure that the phase is tested without omission to obtain the bridge arm enable fault threshold; the testing method of the present invention provides a standardized test process for the enable fault threshold, designs corresponding test content for different bridge arms and phases, improves the accuracy of the enable threshold test, avoids missed tests or misjudgments caused by human experience, provides a reliable quantitative basis for the optimization of power module selection schemes, realizes systematic testing of the enable fault threshold in the power module development stage, and meets the low-cost and efficient enable fault threshold parameter testing requirements in the power module development stage.

[0053] See also Figure 2 A second embodiment of the method for enabling fault threshold testing in an embodiment of the present invention includes:

[0054] 201. Determine whether the power module is in a powered state;

[0055] In this embodiment, the power supply status of the power module is first monitored in real time through the voltage detection circuit; the voltage of the power supply terminal VCC of the control chip is measured (15V under normal power supply), and if VCC>3V, it is determined to be in a low-voltage power-on state; the voltage of the bus voltage input terminal P is measured (high voltage DC under normal power supply, such as 300V), and if the P terminal voltage is>50V, it is determined to be in a high-voltage power-on state; before constructing the test loop, the power-on state is forcibly detected to avoid instantaneous high-voltage breakdown of the port due to live connection (for example, the FAULT port has a withstand voltage of only 20V, and live operation may cause overvoltage damage due to back electromotive force).

[0056] 202. If the power module is in a power-on state, cutting off the high-voltage power supply and the low-voltage power supply of the power module to obtain a power-off state of the power module;

[0057] In this embodiment, the power-off operation follows the safety order of "high voltage first, low voltage later". First, the high-voltage power supply is cut off, and the external high-voltage switch of the bus voltage input terminal P is disconnected to reduce the bus capacitor voltage to a safety threshold. The discharge time is calculated according to the capacitor capacity; then the low-voltage power supply is cut off, and the control chip power supply VCC and the upper and lower bridge arm drive power supplies are disconnected in turn to ensure that the low-voltage side chip is no longer powered to avoid high-voltage backflow and damage to the chip; there are high-frequency filter capacitors and bus energy storage capacitors inside the power module. If they are connected with power, the residual charge may cause the FAULT port voltage to jump abnormally, causing the enable fault threshold detection result to deviate.

[0058] 203. Select a corresponding external phase control unit according to the selected phase;

[0059] In this embodiment, the external phase control unit is a relay group (such as Figure 10 Relays K1-K6 in the figure) or equivalent switching devices (such as solid-state relays, multi-way selector switches) are used to achieve electrical isolation of a single phase.

[0060] 204. Connect the power module in the power-off state to the selected external phase control unit to obtain a power module test circuit;

[0061] In this embodiment, each phase corresponds to an independent control unit, ensuring that only one phase is connected to the same bridge arm at a time, building an interference-free independent test loop, reducing noise interference during FAULT port voltage scanning, and thus meeting high-precision testing requirements.

[0062] See also Figure 3 A third embodiment of the method for enabling fault threshold testing in the embodiment of the present invention includes:

[0063] 301. According to the selected bridge arm, obtain configuration parameters corresponding to the bridge arm from a preset power supply parameter library;

[0064] In this embodiment, the power parameter library and configuration parameters are generally constructed based on the preliminary test data. The configuration parameters include the driving power supply voltage, control chip voltage, PWM signal level and high-voltage power supply range required for the upper and lower bridge arm tests; the configuration parameters of different bridge arms are different. For example, the upper bridge arm applies the driving power supply, and the lower bridge arm only uses the control power supply to avoid the upper bridge arm transistor from being misleadingly turned on due to leakage current when the lower bridge arm is tested; Figure 10 Take the upper arm U phase test in as an example: the driving power supply voltage VBU=VBV=VBW=15V; the control chip power supply VCC=15V, EN=5V; the upper arm PWM signal INUH=5V; the bus voltage P=300V; and if the lower arm NU phase test is performed, it is only necessary to connect the low voltage power supply VCC=15V, EN=5V, and no VBU driving power supply is required.

[0065] 302. Initialize a test environment of a power module test circuit according to configuration parameters to obtain a power module to be tested;

[0066] In this embodiment, the initialization step needs to follow the power-on sequence of low voltage first and high voltage later to ensure that the control chip starts before the power devices to prevent the high voltage side energy from flowing back into the low voltage circuit.

[0067] See also Figure 4 A fourth embodiment of the method for enabling fault threshold testing in the embodiments of the present invention includes:

[0068] 401. Perform a rising scan on the enable fault input port of the power module to be tested to obtain an enable fault turn-on threshold;

[0069] In this embodiment, the enable fault activation threshold is the critical value for activating the power module fault protection mechanism and is crucial to module reliability. By gradually increasing the voltage at the enable fault threshold port from a voltage lower than the expected threshold, the instant when the power module fault protection mechanism is triggered can be accurately captured, thereby determining the activation threshold. This rising scan method ensures that the critical point for activating the fault protection mechanism is accurately found while the module is operating normally, avoiding premature or late triggering of the protection mechanism and improving the accuracy of threshold detection.

[0070] Specifically, refer to Figure 10 Connect an adjustable power supply to the enable fault input port (FAULT port), set the initial voltage to a value below the module's design threshold, and gradually increase the voltage in fixed steps while monitoring the bus current in real time. When a sudden increase in current is detected, record the voltage at that moment; this is the enable fault activation threshold, THon.

[0071] 402. Perform a downward scan on the enable fault input port of the power module to be tested to obtain an enable fault shutdown threshold;

[0072] In this embodiment, the enable fault shutdown threshold is the critical value at which the power module fault protection mechanism is disengaged. By gradually reducing the voltage at the enable fault port from a voltage above the expected threshold, it is possible to determine when the fault protection mechanism ceases to operate, i.e., the critical voltage at which the module resumes normal operation. The descending scan complements the ascending scan information, fully depicting the activation and disengagement process of the power module fault protection mechanism.

[0073] Specifically, refer to Figure 10 , set the output voltage of the adjustable power supply to a value higher than the upper threshold of the module design, and gradually reduce the voltage in a fixed step size while continuously monitoring the bus current. When the current returns to the normal operating range, record the voltage value at this time, which is the enable fault shutdown threshold THoff.

[0074] 403. Aggregate the data of the enable fault on threshold and the enable fault off threshold to obtain a phase enable fault threshold.

[0075] In this embodiment, the enable fault turn-on threshold and turn-off threshold reflect the conditions for initiating and disabling the power module fault protection mechanism, respectively. Combining the two can fully understand the module's behavior characteristics under fault conditions, providing more complete data for evaluating the module's reliability and performance. The difference between the enable fault turn-on threshold and the turn-off threshold reflects the hysteresis of the module's fault protection mechanism. The smaller this difference, the more sensitive the module's response to faults and the faster it can resume normal operation.

[0076] Furthermore, after completing the test of all phases of all bridge arms, the enable fault thresholds of different phases and different bridge arms can be compared and analyzed to evaluate the consistency and stability of the module. For example, if it is found that the turn-on threshold and turn-off threshold of a phase are significantly different from those of other phases, it may indicate that there is a fault or performance abnormality in that phase, and further inspection and debugging are required.

[0077] See also Figure 5 , a fifth embodiment of the method for enabling fault threshold testing in the embodiment of the present invention includes:

[0078] 501. Count the number of completed phase tests in the selected bridge arm and compare it with the total number of phases in the selected bridge arm;

[0079] In this embodiment, the bridge arm of the power module typically includes multiple phases (such as the U / V / W phases in a three-phase system). The fault thresholds of each phase may vary, and all phases must be tested to fully evaluate the performance of the bridge arm. By quantifying and counting the number of tested phases and establishing a numerical comparison relationship with the total number of phases in the bridge arm, a closed-loop test verification mechanism is formed to ensure that no tests are missed.

[0080] Specifically, the total number of phases N of the current bridge arm can be preset in the host computer test program. Each time the threshold test of a phase is completed, the test program automatically adds 1 to the counter. After each test is completed, the counter value is immediately compared with the preset total number of phases N. The bridge arm test is complete only when and only when the number of measured phases is equal to the total number of phases.

[0081] 502. If the number of completed phase tests is equal to the total number of phases, mark the phase test judgment result as completed.

[0082] 503. If the number of completed phase tests is less than the total number of phases, the phase test judgment result is marked as incomplete.

[0083] See also Figure 6 A sixth embodiment of the method for enabling fault threshold testing in the embodiments of the present invention includes:

[0084] 601. If the phase test result is incomplete, select one of the untested phases in the selected bridge arm as the selected phase, and return to execute the construction of the power module test loop based on the selected phase;

[0085] In this embodiment, when there is an untested phase in the bridge arm (the phase test judgment result is "incomplete"), it is necessary to automatically locate the next untested phase in a preset order to ensure that all phases in the bridge arm are tested without omission, avoiding duplication or missed tests caused by manual intervention; before switching phases, the power is turned off in the order of "high voltage first, then low voltage" to eliminate the residual charge in the current phase test and avoid signal crosstalk when testing different phases.

[0086] See also Figure 7 , a seventh embodiment of the method for enabling fault threshold testing in the embodiments of the present invention includes:

[0087] 701. Count the number of bridge arms in the power module that have completed the test, and compare the number with the total number of bridge arms in the power module;

[0088] In this embodiment, the power module generally includes two independent upper and lower bridge arms. A counting and comparison mechanism of the bridge arm dimensions is used to ensure the test integrity of the multi-bridge arm power module and avoid performance evaluation deviations caused by missing bridge arms.

[0089] 702. If the number of bridge arms that have completed the test is equal to the total number of bridge arms, generate a power module enable fault threshold according to the enable fault thresholds of all bridge arms;

[0090] In this embodiment, after all bridge arms in the power module have completed the test, the power module enable fault threshold can be generated based on the bridge arm enable fault thresholds of all bridge arms; the power module enable fault threshold integrates the enable fault thresholds of all bridge arms / phases therein, thereby being able to comprehensively reflect the enable fault threshold of the power module.

[0091] 703. If the number of bridge arms that have completed the test is less than the total number of bridge arms, select another bridge arm from the power module as the selected bridge arm, and return to executing the selection of the phase to be tested from the selected bridge arm;

[0092] In this embodiment, based on the bridge arm status comparison result, the test process of the untested bridge arm is triggered, the test connection of the current bridge arm is cut off, the test environment of the new bridge arm is initialized, another bridge arm is selected from the power module as the new bridge arm to be tested, and then the first phase to be tested is selected from the new bridge arm to be tested, and the phase test cycle is restarted until all bridge arms of the current power module have completed the test.

[0093] The above describes the enabling fault threshold test method in the embodiment of the present invention. The following describes the enabling fault threshold test device in the embodiment of the present invention. Figure 8 In one embodiment of the present invention, a device for enabling a fault threshold test includes:

[0094] A bridge arm selection module 801 is used to select a bridge arm to be tested from a power module;

[0095] A phase selection module 802 is configured to select a phase to be tested from the selected bridge arm;

[0096] A construction module 803 is configured to construct a power module test loop according to the selected phase;

[0097] Initialization module 804, configured to initialize the test environment of the power module test loop according to the selected bridge arm to obtain the power module to be tested;

[0098] A detection module 805 is configured to perform enable fault detection on the power module to be tested to obtain a phase enable fault threshold;

[0099] Phase determination module 806, used to determine whether the selected bridge arm has completed all phase tests to obtain a phase test determination result;

[0100] A generating module 807 is configured to obtain a bridge arm enabling fault threshold value based on all phase enabling fault threshold values ​​of the selected bridge arm if the phase test result is completed;

[0101] In this embodiment, the bridge arm selection module 801 and the phase selection module 802 first perform hierarchical selection of bridge arms and phases, then the construction module 803 constructs a single phase connection in a power-off state to construct a test loop, and the initialization module 804 then applies an adaptive power supply and control signal to the constructed loop to activate the fault detection logic to obtain the power module to be tested; then the detection module 805 performs enable fault detection on the power module to be tested to obtain the phase enable fault threshold; the phase judgment module 806 ensures that no phase is missed in the test; and finally, the generation module 807 generates the bridge arm enable fault threshold based on all phase enable fault thresholds. The enable fault threshold test device of the present invention provides a standardized test method for the enable fault threshold, designs corresponding test content for different bridge arms and phases, improves the accuracy of the enable threshold test, avoids missed tests or misjudgments caused by human experience, provides a reliable quantitative basis for optimizing the power module selection scheme, realizes systematic testing of the enable fault threshold in the power module development stage, and meets the low-cost and efficient enable fault threshold parameter testing requirements in the power module development stage.

[0102] above Figure 8 The enabling fault threshold test device in the embodiment of the present invention is described in detail from the perspective of modular functional entities. The enabling fault threshold test device in the embodiment of the present invention is described in detail from the perspective of hardware processing.

[0103] Figure 9 FIG. 9 is a schematic diagram of the structure of an enabling fault threshold test device provided by an embodiment of the present invention. The enabling fault threshold test device 900 may vary significantly due to different configurations or performance. The enabling fault threshold test device 900 may include one or more central processing units (CPUs) 910 (e.g., one or more processors), a memory 920, and one or more storage media 930 (e.g., one or more mass storage devices) storing application programs 933 or data 932. The memory 920 and storage medium 930 may be either transient or persistent storage. The program stored in the storage medium 930 may include one or more modules (not shown), each of which may include a series of instruction operations on the enabling fault threshold test device 900. Furthermore, the processor 910 may be configured to communicate with the storage medium 930, and the enabling fault threshold test device 900 may execute the series of instruction operations in the storage medium 930 to implement the steps of the enabling fault threshold test method provided in the above-described method embodiments.

[0104] The enabling fault threshold test device 900 may further include one or more power supplies 940, one or more wired or wireless network interfaces 950, one or more input and output interfaces 960, and / or one or more operating systems 931, such as Windows Server, Mac OS X, Unix, Linux, FreeBSD, etc. It will be understood by those skilled in the art that Figure 9 The illustrated structure of the enabled fault threshold test device does not constitute a limitation on the enabled fault threshold test device, and may include more or fewer components than shown, or combine certain components, or arrange components differently.

[0105] The present invention also provides a computer-readable storage medium, which may be a non-volatile computer-readable storage medium or a volatile computer-readable storage medium. The computer-readable storage medium stores instructions that, when executed on a computer, cause the computer to execute the steps of the method for enabling a fault threshold test.

[0106] Those skilled in the art will clearly understand that, for the convenience and brevity of description, the specific working processes of the above-described systems, devices, and units can refer to the corresponding processes in the aforementioned method embodiments and will not be repeated here.

[0107] If the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention is essentially or the part that contributes to the prior art or all or part of the technical solution can be embodied in the form of a software product. The computer software product is stored in a storage medium and includes several instructions for enabling a computer device (which can be a personal computer, server, or network device, etc.) to perform all or part of the steps of the method described in each embodiment of the present invention. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (ROM), random access memory (RAM), magnetic disk or optical disk, etc., various media that can store program code.

[0108] Finally, it should be noted that the above description is merely a preferred embodiment of the present invention and is not intended to limit the present invention. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art will be able to modify the technical solutions described in the aforementioned embodiments or substitute equivalents for some of the technical features. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of the present invention shall be included within the scope of protection of the present invention.

Claims

1. A method for enabling fault threshold testing, characterized in that: include: Select the bridge arm to be tested from the power module; Selecting the phase to be tested from the selected bridge arm; Construct a power module test loop according to the selected phase; Initializing the test environment of the power module test circuit according to the selected bridge arm to obtain the power module to be tested; Performing enable fault detection on the power module to be tested to obtain a phase enable fault threshold; Determine whether all phase tests of the selected bridge arm have been completed to obtain a phase test judgment result; If the phase test is determined to be completed, the bridge arm enable fault threshold is obtained according to all phase enable fault thresholds of the selected bridge arm.

2. The enabling fault threshold test method according to claim 1, characterized in that: The step of constructing a power module test loop according to the selected phase includes: Determine whether the power module is in a powered state; If the power module is in a power-on state, cutting off the high-voltage power supply and the low-voltage power supply of the power module to obtain a power-off state of the power module; selecting a corresponding external phase control unit according to the selected phase; The power module in the power-off state is connected to the selected external phase control unit to obtain a power module test loop.

3. The enabling fault threshold test method according to claim 1, characterized in that: Initializing the test environment of the power module test loop according to the selected bridge arm to obtain the power module to be tested includes: According to the selected bridge arm, the configuration parameters corresponding to the bridge arm are obtained from the preset power supply parameter library; The test environment of the power module test loop is initialized according to the configuration parameters to obtain the power module to be tested.

4. The enabling fault threshold test method according to claim 1, characterized in that: The enabling fault detection is performed on the power module to be tested to obtain a phase enabling fault threshold, including: Performing a rising scan on the enable fault input port of the power module to be tested to obtain the enable fault turn-on threshold; Performing a downward scan on the enable fault input port of the power module to be tested to obtain an enable fault shutdown threshold; The enable fault turn-on threshold and the enable fault turn-off threshold are aggregated to obtain the phase enable fault threshold.

5. The enabling fault threshold test method according to claim 1, wherein: The determining whether all phase tests of the selected bridge arm are completed to obtain a phase test determination result includes: Count the number of completed phase tests in the selected bridge arm and compare it with the total number of phases in the selected bridge arm; If the number of completed phase tests is equal to the total number of phases, the phase test judgment result is marked as completed; If the number of completed phase tests is less than the total number of phases, the phase test judgment result is marked as incomplete.

6. The enabling fault threshold test method according to claim 1, characterized in that: After determining whether all phase tests of the selected bridge arm have been completed to obtain the phase test determination result, the method further includes: if the phase test determination result is incomplete, selecting one of the untested phases in the selected bridge arm as the selected phase, and returning to execute the power module test loop constructed according to the selected phase.

7. The enabling fault threshold test method according to claim 1, characterized in that: If the phase test result is completed, after obtaining the bridge arm enable fault threshold according to all phase enable fault thresholds of the selected bridge arm, the method further includes: Count the number of bridge arms in the power module that have completed the test and compare it with the total number of bridge arms in the power module; If the number of bridge arms that have completed the test is equal to the total number of bridge arms, the power module enable fault threshold is generated according to the enable fault thresholds of all bridge arms; If the number of bridge arms that have completed the test is less than the total number of bridge arms, another bridge arm is selected from the power module as the selected bridge arm, and the process returns to selecting a phase to be tested from the selected bridge arm.

8. An enabling fault threshold test device, characterized in that: include: A bridge arm selection module is used to select a bridge arm to be tested from the power module; A phase selection module, used for selecting a phase to be tested from the selected bridge arm; A building module, used for building a power module test loop according to the selected phase; An initialization module is used to initialize the test environment of the power module test circuit according to the selected bridge arm to obtain the power module to be tested; A detection module, configured to perform enable fault detection on the power module to be tested to obtain a phase enable fault threshold; The phase judgment module is used to judge whether the selected bridge arm has completed all phase tests to obtain the phase test judgment result; The generating module is used to obtain the bridge arm enabling fault threshold according to all phase enabling fault thresholds of the selected bridge arm if the phase test judgment result is completed.

9. An enabling fault threshold test device, characterized in that, The enabling fault threshold testing device includes: a memory and at least one processor, wherein the memory stores instructions; at least one of the processors calls the instructions in the memory so that the enabling fault threshold testing device performs the various steps of the enabling fault threshold testing method according to any one of claims 1 to 7.

10. A computer-readable storage medium having instructions stored thereon, characterized in that: When the instructions are executed by a processor, the steps of the method for enabling fault threshold testing as claimed in any one of claims 1 to 7 are implemented.

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