Array substrate, display panel and repairing method
By setting repair lines in the metal layer of the array substrate and constructing a loop to transmit signals to repair broken lines in the LCD, the problem of easy breakage of scan lines and data lines is solved, the product yield is improved and the cost is reduced.
Patent Information
- Application Number
- CN202511163873.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-08-19
- Publication Date
- 2025-09-26
AI Technical Summary
In existing liquid crystal displays (LCDs), scan lines and data lines are easily broken due to their minimum width design, resulting in a decrease in product yield. This is especially difficult to effectively repair in array substrates without an organic cover insulating layer.
Repair lines are set in the first and second metal layers of the array substrate to construct a loop between the broken data lines and scan lines. Signals are transmitted through the repair lines to achieve repair without increasing the mask or sacrificing the aperture ratio.
Without increasing the number of masks and affecting the aperture ratio, the product yield is improved and the manufacturing complexity and production cost are reduced.
Smart Images
Figure CN120704026A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the field of display technology, and in particular to an array substrate, a display panel, and a repair method. Background Art
[0002] Liquid crystal displays (LCDs) have been widely used in mobile phones, laptops and other fields due to their low radiation, small size and low power consumption.
[0003] Currently, LCDs typically use thin-film transistors (TFTs) to drive liquid crystal pixels. For example, a TFT can be turned on or off under the control of a scan line. When the TFT is on, the voltage from the data line is written into the pixel electrode, thereby realizing liquid crystal display.
[0004] However, to maintain the aperture ratio of LCDs, the space occupied by scan and data lines on the array substrate must be reduced. This results in the scan and data line widths being designed to the minimum width required for the manufacturing process. This makes them susceptible to breakage, impacting the LCD product yield. Therefore, repairing these broken scan or data lines has become a technical challenge, particularly for array substrates without an organic cover (OC) insulating layer. Summary of the Invention
[0005] The present application provides an array substrate, a display panel, and a repair method. The technical solution provided by the present application can repair broken data lines and / or scan lines in an array substrate without an organic cover (OC) insulating layer.
[0006] In a first aspect, the present application provides an array substrate, which includes a first metal layer, a second metal layer and a transparent electrode layer arranged in sequence from bottom to top, the first metal layer including a scan line and a first repair line, the second metal layer including a data line and a second repair line, the transparent electrode layer including a common electrode line, and the transparent electrode layer is connected in parallel with the first metal layer or the second metal layer; the projection of the data line on the first metal layer is arranged perpendicularly to the scan line, a pixel area is formed at the intersection of the scan line and the data line, the common electrode line and the first repair line are arranged within the spacing on the upper and lower sides of the pixel area, the projection of the common electrode line on the first metal layer is parallel to the first repair line, the first repair line is arranged parallel to the scan line, the second repair line is arranged parallel to the data line, and the second repair line is arranged in the non-display area of the array substrate.
[0007] In combination with the first aspect, in a possible implementation manner, the common electrode line and the first repair line are arranged in different intervals.
[0008] In combination with the first aspect, in a possible implementation manner, the common electrode lines and the first repair lines are alternately distributed.
[0009] In combination with the first aspect, in a possible implementation manner, the common electrode line and the first repair line are arranged in the same interval.
[0010] In combination with the first aspect, in a possible implementation, the array substrate further includes a source driver chip and a gate driver chip, and the source driver chip is connected to the data line.
[0011] In a second aspect, the present application provides a data line repair method, which can be applied to an array substrate as in the first aspect or any possible implementation of the first aspect, the method comprising: determining a target data line, the target data line being a data line having a breakpoint in the array substrate, the target data line comprising a first data line located on a first side of the breakpoint and a second data line located on a second side of the breakpoint; connecting the first data line to a first sub-repair line, and connecting the second data line to a second sub-repair line, the first sub-repair line being a repair line in the first repair line that is located on the first side of the breakpoint and has the shortest vertical distance to the position of the breakpoint, and the second sub-repair line being a repair line in the first repair line that is located on the second side of the breakpoint and has the shortest vertical distance to the position of the breakpoint; connecting the first sub-repair line and the second sub-repair line to a third sub-repair line, the third sub-repair line being a repair line in the second repair line that has the shortest vertical distance to the target data line.
[0012] In combination with the second aspect, in a possible implementation, the method further includes: cutting at least one of the following items outside the first loop: the first sub-repair line, the second sub-repair line, or the third sub-repair line, the first loop being a loop composed of the first sub-repair line, the second sub-repair line, the third sub-repair line and the target data line.
[0013] In a third aspect, the present application provides a scan line repair method, which can be applied to an array substrate such as in the first aspect or any possible implementation of the first aspect, the method comprising: determining a target scan line, the target scan line being a scan line having a breakpoint in the array substrate; determining a fourth sub-repair line, the fourth sub-repair line being a repair line in the first repair line with the shortest vertical distance to the target scan line; connecting the target scan line to the fourth sub-repair line through a fifth sub-repair line and a sixth sub-repair line, the fifth sub-repair line being a repair line in the second repair line that is located on one side of the breakpoint and has the shortest vertical distance to the position of the breakpoint, and the sixth sub-repair line being a repair line in the second repair line that is located on the other side of the breakpoint and has the shortest vertical distance to the position of the breakpoint.
[0014] In combination with the third aspect, in a possible implementation, the method also includes: cutting the fifth sub-repair line and / or the sixth sub-repair outside the second loop, where the second loop is a loop composed of the target scan line, the fourth sub-repair line, the fifth sub-repair line and the sixth sub-repair line.
[0015] In a fourth aspect, the present application further provides a display panel, which includes an array substrate as in the first aspect or any possible implementation of the first aspect.
[0016] In a fifth aspect, the present application further provides a display device, which includes an array substrate as in the first aspect or any possible implementation of the first aspect.
[0017] The present application provides an array substrate, a display panel, and a repair method. In the technical solution provided by the present application, when the array substrate is not provided with an OC insulating layer, by providing a repair line in the first metal layer and the second metal layer of the array substrate, when the data line and / or the scan line is broken, a loop can be constructed between the repair line and the broken data line and / or the scan line, and the data signal and / or the scan signal can be transmitted through the constructed loop, thereby repairing the broken data line and / or the scan line, thereby improving the product yield. The technical solution provided by the present application can realize the repair of the scan line and / or the data line without increasing the mask and without sacrificing the aperture ratio. In addition, the repair line in the present application is provided in the plane, so that the distance between the data line and / or the scan line and the repair line can be shortened, thereby reducing the manufacturing complexity and production cost. BRIEF DESCRIPTION OF THE DRAWINGS
[0018] Figure 1 A schematic structural diagram of an array substrate of a conventional LCD; Figure 2 A schematic structural diagram of an array substrate provided in this application; Figure 3 A schematic structural diagram of another array substrate provided in this application; Figure 4 A schematic flow chart of a data line repair method provided by the present application; Figure 5 A schematic structural diagram of a repair data line provided in this application; Figure 6 A schematic flow chart of a scan line repair method provided in this application; Figure 7 This is a schematic structural diagram of a repair scan line provided in this application. DETAILED DESCRIPTION
[0019] The technical solutions of the present invention will be described clearly and completely below with reference to the accompanying drawings. It is apparent that the embodiments described are only a portion of the embodiments of the present invention, not all of them. All other embodiments derived by persons of ordinary skill in the art based on the embodiments of the present invention without inventive effort are intended to fall within the scope of protection of the present invention.
[0020] The following combination Figure 1 Describe the technical problems that need to be solved by this application.
[0021] Liquid crystal displays (LCDs) have been widely used in mobile phones, laptops and other fields due to their low radiation, small size and low power consumption.
[0022] Figure 1 The schematic structure diagram of an array substrate of a conventional LCD is shown. Figure 1 The array substrate shown includes a first metal (metal 1, M1) layer, a second metal (M2) layer and a transparent electrode layer arranged in sequence from bottom to top. The M1 layer includes a gate line (such as Figure 1 G1 to G8 in the M2 layer, including the data line (source line) (such as Figure 1 D0 to D7 in FIG), the transparent electrode layer includes common electrode lines (such as Figure 1 C1 to C3 in ). It should be understood that Figure 1 The numbers of scan lines, data lines and common electrode lines are just examples.
[0023] like Figure 1 As shown, the projection of the data line on the M1 layer is arranged perpendicularly to the scan line. A pixel area is formed at the intersection of the scan line and the data line. The common electrode line is set within the spacing on the upper and lower sides of the pixel area. The pixel area may include at least one pixel unit. Figure 1The pixel area in the middle consists of two pixel units. Each pixel unit includes a thin film transistor (TFT) and a pixel electrode. The gate of the TFT is connected to the scan line, the source is connected to the data line, and the drain is connected to the pixel electrode. During LCD operation, a scan signal is sent to the gate of the TFT via the scan line, turning the TFT on and off row by row. When the TFT is on, the data signal on the data line is applied to the pixel electrode through the TFT source, thus achieving liquid crystal display.
[0024] Currently, the main material of the transparent electrode layer is indium tin oxide (ITO), which results in a relatively large resistance value of the common resistor. To improve the driving capability of the array substrate, metal lines can be set in parallel with the common electrode lines in the plane, or the transparent electrode layer can be connected in parallel with the M1 layer or the M2 layer to reduce the resistance value of the common resistor. Figure 1 The array substrate shown has a dual gate + zigzag architecture, which allows the transparent electrode layer and the M1 layer to be connected in parallel to reduce the resistance of the common resistor. For example, a bridge hole can be provided between the transparent electrode layer and the M1 layer to achieve parallel connection of the transparent electrode layer and the M1 layer.
[0025] In practical applications, to ensure the LCD's aperture ratio, the space occupied by scan and data lines on the array substrate must be compressed. This results in the scan and data line widths being designed to the minimum width required for the manufacturing process. This can easily lead to breakage of these lines, impacting product yield. Therefore, repairing broken scan or data lines becomes a technical challenge, particularly for array substrates without an organic cover (OC) insulating layer. It should be noted that aperture ratio is a key parameter used to measure LCD display quality. A higher aperture ratio results in better LCD display quality, such as brighter and clearer images.
[0026] In view of this, the present application provides an array substrate, a display panel and a repair method. In the technical solution provided by the present application, when the array substrate is not provided with an OC insulating layer, a repair line is provided in the first metal layer and the second metal layer of the array substrate. Therefore, when the data line and / or the scan line is broken, a loop is constructed between the repair line and the broken data line and / or the scan line, and the data signal and / or the scan signal is transmitted through the constructed loop, thereby repairing the broken data line and / or the scan line, thereby improving the product yield. The technical solution provided by the present application can realize the repair of the scan line and / or the data line without adding a mask and without sacrificing the aperture ratio. Not adding a mask can be understood as not changing the existing layers of the array substrate (such as the M1 layer, the M2 layer and the transparent electrode layer mentioned above), thereby reducing the manufacturing complexity and production cost. In addition, the repair line in the present application is provided in the plane, thereby shortening the distance between the data line and / or the scan line and the repair line, thereby reducing the manufacturing complexity and production cost.
[0027] The following combination Figures 2 to 7 , the technical solution provided by this application is described in detail. It should be noted that the following description of the technical solution provided by this application takes the architecture of the array substrate as a dual-gate + zigzag architecture as an example, which does not limit the technical solution of this application, or in other words, the technical solution provided by this application can be applied to array substrates of other architectures.
[0028] Figure 2 This is a schematic structural diagram of an array substrate provided in this application. Figure 2 The array substrate shown includes an M1 layer, an M2 layer, and a transparent electrode layer arranged in sequence from bottom to top.
[0029] like Figure 2 As shown, the M1 layer includes scan lines (G1 to G8 in the figure) and first repair lines (R11 to R13 in the figure), and the scan lines and the first repair lines are arranged in parallel. The M2 layer includes data lines (D0 to D7 in the figure) and second repair lines (R21 and R22 in the figure), and the data lines are arranged in parallel with the second repair lines. The transparent electrode layer includes common electrode lines (C1 and C2 in the figure). The transparent electrode layer can be connected in parallel with the M1 layer or the M2 layer, and can be set according to actual conditions, which is not limited here. Among them, the relevant description of the data line and the scan line can be referred to. Figure 1 The relevant description in will not be repeated here. It should be noted that Figure 2 The number of the scan lines, data lines, and common electrode lines is only an example. The distribution position and number of the first repair lines and the second repair lines are only examples and are not intended to limit the technical solution of this application.
[0030] The common electrode line and the first repair line can be both arranged within the spacing between the upper and lower sides of the pixel area. The projection of the common electrode line on the M1 layer is parallel to the first repair line.
[0031] In one possible implementation, the common electrode line and the first repair line can be arranged at different intervals. In this implementation, the common electrode line and the first repair line can be arranged alternately. Taking "A" as the first repair line and "B" as the common electrode line as an example, the first repair line and the common electrode line can be arranged alternately in sequence according to the "ABAB" rule, such as Figure 2 At least one first repair line can be set within one spacing, and this application does not impose any limitation on this.
[0032] It should be noted that the rule for alternating the distribution of the common electrode lines and the first repair lines can be set according to actual needs, and this application does not impose any restrictions on this. For example, the common electrode lines and the first repair lines can also be alternately distributed according to the rule of "BABA", "ABBA", or "ABBAB". Among them, in order to ensure the transmission quality of the signal in the array substrate and thus ensure the display effect of the LCD, the resistance value of the common resistor can be evenly distributed, or the common electrode lines can be evenly distributed within the spacing on the upper and lower sides of the pixel area to avoid the situation where the common electrode lines are only distributed on the upper side or the lower side of the array substrate.
[0033] like Figure 2 As shown, the array substrate includes a display area and a non-display area. The second repair line can be set in the non-display area of the array substrate so that the second repair line does not occupy the effective display area of the array substrate, thereby reducing the impact on the LCD aperture ratio.
[0034] In one possible implementation, the second repair line can be located in the display area of the array substrate. Compared to locations in the non-display area, this approach can reduce the wiring distance during the repair process, but it will affect the aperture ratio to some extent. It should be understood that the specific location of the second repair line can be determined based on actual needs and is not limited in this application.
[0035] In a possible implementation, the common electrode lines and the first repair lines can be arranged in the same spacing. This implementation does not change the distribution of the common electrode lines in the existing array substrate, and at least one first repair line can be added in the spacing where the common electrode lines are located. Figure 3 As shown, the first repair line includes R11 to R14, wherein R12 and C1, and R13 and C3 are arranged in the same interval.
[0036] like Figure 3As shown, the array substrate may further include a source driver chip and a gate driver chip. The source driver chip and the gate driver chip may be disposed in the non-display area of the array substrate. The source driver chip is connected to the data lines and is used to send data signals to the data lines; the gate driver chip is connected to the scan lines and is used to send scan signals to the scan lines.
[0037] In this application, the gate driver chip can be understood as a gate integrated circuit (gate IC). The source driver chip can be understood as a source integrated circuit (source IC), or can be understood as a timing controller embedded driver IC (TED IC) formed by integrating a timing controller (TCON) and a source integrated circuit (source IC), or can be understood as a touch and display driver integration (TDDI) chip, and this application does not impose any restrictions on this.
[0038] In the array substrate provided by the present application, a first repair line arranged parallel to the scan line is added to the M1 layer, and a second repair line arranged parallel to the data line is added to the M2 layer. When the data line and / or the scan line is broken, a loop is constructed between the repair line and the broken data line and / or scan line, and the data signal and / or scan signal is transmitted through the constructed loop, thereby repairing the broken data line and / or scan line and improving the product yield. It can be seen that there are no breakpoints in the repair line in the present application, so there is no need to add additional masks and processes, which can reduce manufacturing complexity and production costs.
[0039] Figure 4 This is a schematic flow chart of a data line repair method provided by this application. Figure 4 As shown, the method may include S401, S402 and S403.
[0040] S401, determining target data lines, where the target data lines are data lines with breakpoints in the array substrate, and the target data lines include a first data line located on a first side of the breakpoint and a second data line located on a second side of the breakpoint.
[0041] When a data line is broken, it can be understood that there is a breakpoint in the data line. In this application, the data line with the breakpoint is referred to as the target data line. It should be understood that the target data line is divided into two parts by the breakpoint, such as a first data line located on a first side of the breakpoint and a second data line located on a second side of the breakpoint.
[0042] Figure 5 This is a schematic structural diagram of a repair data line provided in this application. Figure 5 D2 is the target data line. A breakpoint 51 exists in D2. D2 includes a first data line D21 located above the breakpoint 51 and a second data line D22 located below the breakpoint 51.
[0043] S402, connect the first data line to the first sub-repair line, and connect the second data line to the second sub-repair line, where the first sub-repair line is the repair line in the first repair line that is located on the first side of the breakpoint and has the shortest vertical distance to the breakpoint position, and the second sub-repair line is the repair line in the first repair line that is located on the second side of the breakpoint and has the shortest vertical distance to the breakpoint position.
[0044] In this application, after determining the target data line, a first sub-repair line and a second sub-repair line can be further determined, and the first data line can be connected to the first sub-repair line, and the second data line can be connected to the second sub-repair line. The first sub-repair line and the first data line are located on the same side of the breakpoint and are the first repair line on that side with the shortest vertical distance from the breakpoint. The second sub-repair line and the second data line are located on the same side of the breakpoint and are the first repair line on that side with the shortest vertical distance from the breakpoint.
[0045] In this application, connecting a data line to a repair line can be understood as fusing the data line and the repair line together via welding, thereby forming a weld point between the data line and the repair line. This welding method can be laser welding, which is not limited in this application. For example, a first weld point can be formed between a first data line and a first sub-repair line, and a second weld point can be formed between a second data line and a second sub-repair line.
[0046] like Figure 5 As shown, the first sub-repair line is R12, the second sub-repair line is R13, the first welding point is W1, and the second welding point is W2.
[0047] S403: Connect the first sub-repair line and the second sub-repair line to the third sub-repair line, where the third sub-repair line is the repair line with the shortest vertical distance to the target data line among the second repair lines.
[0048] In this application, after determining the first and second sub-repair lines, a third sub-repair line can be further determined to construct the first loop. The third sub-repair line is the second repair line with the shortest vertical distance to the target data line, or in other words, the third sub-repair line is the second repair line with the shortest vertical distance to the breakpoint.
[0049] After determining the third sub-repair line, the first sub-repair line, the second sub-repair line, and the third sub-repair line can be connected. For example, the first sub-repair line and the third sub-repair line can be welded together to form a third weld point between the first and third sub-repair lines. The second sub-repair line and the third sub-repair line can also be welded together to form a fourth weld point between the second and third sub-repair lines.
[0050] like Figure 5 As shown, the third sub-repair line is R21, the third welding point is W3, and the fourth welding point is W4. The first loop is a loop consisting of the target data line D2, the first sub-repair line R12, the third sub-repair line R21, and the second sub-repair line R13.
[0051] In the present application, when the data line is broken, a first circuit of the data line can be constructed through the first repair line and the second repair line, and a data signal can be transmitted to the source of the TFT connected to the data line through the first circuit, thereby realizing the repair of the data line.
[0052] In some implementations, the method may further include S404.
[0053] S404 , performing a cutting process on at least one of the following items outside the first loop: the first sub-repair line, the second sub-repair line, or the third sub-repair line.
[0054] In the present application, any of the following items outside the first loop can be cut: the first sub-repair line, the second sub-repair line, or the third sub-repair line, thereby improving the transmission efficiency of the data signal. The cutting process can be a laser cutting process method, which is not limited in the present application.
[0055] Figure 5 The first sub-repair line, the second sub-repair line and the third sub-repair line are all cut, and the cutting points are E1, E2 and E3 respectively.
[0056] It should be understood that the repair method provided in this application can repair multiple data lines. The repair method can refer to Figure 4 and Figure 5 The method of repairing a single data cable is not described here.
[0057] Figure 6 This is a schematic flow chart of a scan line repair method provided in this application. Figure 6 As shown, the method may include S601, S602 and S603.
[0058] S601, determining a target scan line, where the target scan line is a scan line with a breakpoint in the array substrate.
[0059] When a scan line is broken, it can be understood that there is a breakpoint in the scan line. In this application, the scan line with the breakpoint is referred to as the target scan line. It should be understood that the target scan line is divided into two parts by the breakpoint, such as a first scan line located on a first side of the breakpoint and a second scan line located on a second side of the breakpoint.
[0060] Figure 7 This is a schematic structural diagram of a repair scan line provided in this application. Figure 7 In FIG, G4 is the target scan line. A breakpoint 71 exists in G4. G4 includes a first scan line G41 located on the left side of the breakpoint 71 and a second scan line G42 located on the right side of the breakpoint 71.
[0061] S602: Determine a fourth sub-repair line, where the fourth sub-repair line is a repair line among the first repair lines having the shortest vertical distance to the target scan line.
[0062] In this application, after determining the target scan line, a fourth sub-repair line can be further determined. The fourth sub-repair line can be the first repair line with the shortest vertical distance to the target scan line, or the first repair line with the shortest vertical distance to the breakpoint.
[0063] like Figure 7 As shown, the fourth sub-repair line is R12.
[0064] S603, connect the target scan line with the fourth sub-repair line through the fifth sub-repair line and the sixth sub-repair line, the fifth sub-repair line is the repair line on the second repair line that is located on one side of the breakpoint and has the shortest vertical distance to the breakpoint position, and the sixth sub-repair line is the repair line on the other side of the breakpoint and has the shortest vertical distance to the breakpoint position.
[0065] In this application, considering that the fourth sub-repair line is arranged parallel to the target scan line, and the connection between the target scan line and the fourth sub-repair line is more difficult, the target scan line and the fourth sub-repair line can be connected via the fifth and sixth sub-repair lines, thereby forming a second loop. The fifth sub-repair line is located on one side of the breakpoint and is the second repair line on that side with the shortest vertical distance to the breakpoint. The sixth sub-repair line is located on the other side of the breakpoint and is the second repair line on that side with the shortest vertical distance to the breakpoint.
[0066] In this application, the connection between a scan line and a repair line can be understood as fusing the scan line and the repair line together using a welding method, thereby forming a weld point between the scan line and the repair line. For example, if the first scan line and the fifth sub-repair line are located on the same side of the breakpoint, a fifth weld point can be formed between the first scan line and the fifth sub-repair line; if the second scan line and the sixth sub-repair line are located on the same side of the breakpoint, a sixth weld point can be formed between the second scan line and the sixth sub-repair line. A seventh weld point can be formed between the fifth sub-repair line and the fourth sub-repair line. An eighth weld point can be formed between the sixth sub-repair line and the fourth sub-repair line.
[0067] like Figure 7 As shown, the fifth sub-repair line is R21, the sixth sub-repair line is R22, the fifth welding point is W5, the sixth welding point is W6, the seventh welding point is W7, and the eighth welding point is W8.
[0068] In the present application, the second loop is a loop consisting of the target scan line G4, the fifth sub-repair line R21, the fourth sub-repair line R12, and the sixth sub-repair line R22.
[0069] In the present application, when a scan line is broken, a second loop of the scan line can be constructed through the first repair line and the second repair line, and a scan signal can be transmitted to the gate of the TFT connected to the scan line through the second loop, thereby realizing the repair of the scan line.
[0070] In some implementations, the method may further include S604.
[0071] S604: Cut the fifth sub-repair line and / or the sixth sub-repair line outside the second loop.
[0072] In the present application, the fifth and / or sixth sub-repair lines outside the second loop may be cut to improve the transmission efficiency of the scanning signal. The cutting process may be a laser cutting process, which is not limited in the present application.
[0073] Figure 7 The fifth and sixth sub-repair lines are both cut, with the cutting points being E4 to E7.
[0074] It should be understood that the repair method provided in this application can repair multiple scan lines. The repair method can refer to Figure 6 and Figure 7 The method of repairing a single scan line in is not described here.
[0075] The present application also provides a display panel, which includes the array substrate as shown in the above embodiment. Optionally, the display panel may further include a liquid crystal layer and a color filter (CF) substrate.
[0076] The present application also provides a display device, which includes the array substrate as described in the aforementioned embodiment, or may include the display panel as described in the aforementioned embodiment.
[0077] In the description of the present invention, it should be noted that the terms "first", "second" and "third" are only used for descriptive purposes and should not be understood as indicating or implying relative importance.
[0078] In the description of the present invention, it should be noted that, unless otherwise clearly specified and limited, the term "connection" should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or an indirect connection through an intermediate medium, or it can be internal communication between two components. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances. In addition, the technical features involved in the different embodiments of the present invention described above can be combined with each other as long as they do not conflict with each other.
[0079] It should be emphasized that the above are only preferred embodiments of the present invention and do not limit the present invention in any form. Any simple modifications, equivalent changes and modifications made to the above embodiments based on the technical essence of the present invention are still within the scope of the technical solution of the present invention.
Claims
1. An array substrate, characterized in that: The array substrate includes a first metal layer, a second metal layer, and a transparent electrode layer arranged in sequence from bottom to top, the first metal layer includes a scan line and a first repair line, the second metal layer includes a data line and a second repair line, the transparent electrode layer includes a common electrode line, and the transparent electrode layer is connected in parallel with the first metal layer or the second metal layer; The projection of the data line on the first metal layer is arranged perpendicular to the scan line, and a pixel area is formed at the intersection of the scan line and the data line. The common electrode line and the first repair line are arranged in the spacing on the upper and lower sides of the pixel area. The projection of the common electrode line on the first metal layer is parallel to the first repair line, the first repair line is arranged parallel to the scan line, the second repair line is arranged parallel to the data line, and the second repair line is arranged in the non-display area of the array substrate.
2. The array substrate according to claim 1, wherein: The common electrode line and the first repair line are arranged in different intervals.
3. The array substrate according to claim 2, wherein: The common electrode lines and the first repair lines are alternately distributed.
4. The array substrate according to claim 1, wherein: The common electrode lines and the first repair lines are arranged in the same interval.
5. The array substrate according to any one of claims 1 to 4, characterized in that: The array substrate further includes a source driver chip and a gate driver chip, and the source driver chip is connected to the data line.
6. A method for repairing a data line, characterized in that: Applied to the array substrate according to any one of claims 1 to 5, the method comprises: Determining target data lines, where the target data lines are data lines having a breakpoint in the array substrate, and the target data lines include a first data line located on a first side of the breakpoint and a second data line located on a second side of the breakpoint; Connecting the first data line to a first sub-repair line, and connecting the second data line to a second sub-repair line, wherein the first sub-repair line is a repair line located on a first side of the breakpoint and having the shortest vertical distance to the breakpoint among the first repair lines, and the second sub-repair line is a repair line located on a second side of the breakpoint and having the shortest vertical distance to the breakpoint among the first repair lines; The first sub-repair line and the second sub-repair line are connected to a third sub-repair line, where the third sub-repair line is a repair line among the second repair lines having the shortest vertical distance to the target data line.
7. The repair method according to claim 6, characterized in that: The method further comprises: performing a cutting process on at least one of the following outside the first loop: the first sub-repair line, the second sub-repair line, or the third sub-repair line; The first loop is a loop formed by the first sub-repair line, the second sub-repair line, the third sub-repair line, and the target data line.
8. A scan line repair method, characterized in that: Applied to the array substrate according to any one of claims 1 to 5, the method comprises: determining a target scan line, where the target scan line is a scan line having a breakpoint in the array substrate; determining a fourth sub-repair line, where the fourth sub-repair line is a repair line among the first repair lines having the shortest vertical distance to the target scan line; The target scan line is connected to the fourth sub-repair line through the fifth sub-repair line and the sixth sub-repair line. The fifth sub-repair line is the repair line in the second repair line that is located on one side of the breakpoint and has the shortest vertical distance to the position of the breakpoint. The sixth sub-repair line is the repair line in the second repair line that is located on the other side of the breakpoint and has the shortest vertical distance to the position of the breakpoint.
9. The repair method according to claim 8, characterized in that: The method further comprises: performing a cutting process on the fifth sub-repair line and / or the sixth sub-repair line outside the second loop; The second loop is a loop formed by the target scan line, the fourth sub-repair line, the fifth sub-repair line, and the sixth sub-repair line.
10. A display panel, characterized in that: The invention comprises the array substrate according to any one of claims 1 to 5.