Quality detection method and device of full-color micro-layer, electronic equipment and storage medium

Abstract

The invention provides a quality detection method and device for a full-color micro-image layer, electronic equipment and a storage medium, and the method comprises the steps: controlling a multispectral light source to irradiate a to-be-detected full-color micro-image layer with visible light of different wavelengths, and for each visible light, detecting the quality of the full-color micro-image layer; when the visible light is used for irradiating the full-color micro-image layer, the brightness value of each pixel point in the full-color micro-image layer under the irradiation of the visible light is recognized; for each pixel point in the full-color micro-image layer, determining the display color of the pixel point according to the brightness value of the pixel point under the irradiation of each visible light; taking the color of the pixel point in the original image as the standard color of the pixel point, and comparing whether the display color of the pixel point is the same as the standard color or not to obtain a comparison result of the pixel point; and according to the comparison result of each pixel point, judging whether a quality defect exists in the full-color micro-image layer or not. Through the method, the problem of poor subjectivity and consistency of defect detection is solved, the detection precision and efficiency are improved, and the false detection rate is reduced.

Description

Technical Field

[0001] The present application relates to the field of quality inspection technology, and in particular to a quality inspection method, device, electronic device and storage medium for a full-color micro-layer. Background Art

[0002] Full-color micro-coating technology is a cutting-edge technique for creating high-resolution color images on substrate surfaces. This technology has widespread applications in areas such as photovoltaic module beautification and industrial product customization. Its core value lies in integrating functional materials (such as photovoltaic panels) with environmental aesthetics.

[0003] Currently, the quality of full-color micro-layers is typically inspected manually through visual inspection to detect surface defects such as scratches and ink spots. Differences in experience, vision, and subjective standards among inspectors can lead to inconsistent defect determination results. Furthermore, the multi-color overlay and texture variations of full-color micro-layers can mask defects such as bubbles and dirt, making it difficult for manual visual inspection to isolate abnormal areas against a complex background. Furthermore, repeated inspections over extended periods can easily lead to distraction, especially in strong light environments, where the false detection rate increases significantly with duration. Furthermore, manual visual inspections are inefficient and difficult to integrate with automated production lines. Summary of the Invention

[0004] In view of this, the purpose of this application is to provide a full-color micro-layer quality inspection method, device, electronic equipment and storage medium to solve the problems of subjectivity and poor consistency in defect detection, while improving detection accuracy and efficiency and reducing the false detection rate.

[0005] In a first aspect, an embodiment of the present application provides a method for quality inspection of a full-color micro-layer, wherein a multi-spectral light source integrates multiple visible lights of different wavelengths, the method comprising: Controlling the multi-spectral light source to switch visible light of different wavelengths so that the multi-spectral light source uses visible light of different wavelengths to illuminate the full-color micro-layer to be inspected; For each visible light in the multi-spectral light source, when the multi-spectral light source uses the visible light to illuminate the full-color micro-layer, identifying the brightness value of each pixel in the full-color micro-layer under the illumination of the visible light; For each pixel in the full-color micro-layer, determining the display color of the pixel according to the brightness value of the pixel under the illumination of each visible light; The color of the pixel in the original image is used as the standard color of the pixel, and the displayed color of the pixel is compared with the standard color to determine whether it is the same, so as to obtain a comparison result for each pixel; wherein the full-color micro-layer is produced based on the original image; According to the comparison results of each pixel point, it is determined whether there are quality defects in the full-color micro-layer.

[0006] In combination with the first aspect, an embodiment of the present application provides a first possible implementation of the first aspect, wherein, when the multi-spectral light source uses the visible light to illuminate the full-color micro-layer, identifying the brightness value of each pixel in the full-color micro-layer under the visible light illumination includes: When the multi-spectral light source uses the visible light to illuminate the full-color micro-layer, the spectral camera is used to identify the brightness value of each pixel in the full-color micro-layer under the visible light illumination; wherein, a semi-transparent beam splitter is used to coaxially set the illumination light path of the multi-spectral light source and the imaging light path of the spectral camera.

[0007] In combination with the first possible implementation of the first aspect, the present application provides a second possible implementation of the first aspect, wherein a translucent beam splitter is provided at a 45-degree angle above the full-color micro-layer, one side of which is coated with a semi-transparent and semi-reflective coating; When the multispectral light source uses visible light to illuminate the full-color micro-layer to be inspected, the visible light passes through the collimating lens and the first polarizer in sequence, and is irradiated at a 45-degree angle to the semi-transparent and semi-reflective coating side of the translucent beam splitter. Part of the light reflected by the translucent beam splitter is vertically irradiated to the full-color micro-layer, forming an illumination light path; The reflected light from the full-color micro-layer is directed at a 45-degree angle toward the semi-transparent and semi-reflective film coating side of the translucent beam splitter. After being transmitted through the translucent beam splitter, the reflected light passes through the second polarizer and the imaging lens in sequence and enters the spectral camera to form an imaging light path.

[0008] In combination with the first possible implementation manner of the first aspect, the embodiment of the present application provides a third possible implementation manner of the first aspect, wherein, when the multi-spectral light source uses the visible light to illuminate the full-color micro-layer, identifying the brightness value of each pixel in the full-color micro-layer under the visible light illumination by a spectral camera includes: When the multi-spectral light source uses the visible light to illuminate the full-color micro-layer, the reflected light from the full-color micro-layer under the visible light passes through the tunable filter and enters the spectral camera; wherein the tunable filter switches to split the reflected light entering the spectral camera into multiple sub-wavelengths of visible light; the sub-wavelengths are wavelengths within the wavelength range of the color corresponding to the visible light; The spectral camera outputs the brightness value of each pixel in the full-color micro-layer under the illumination corresponding to each sub-wavelength of the visible light.

[0009] In combination with the third possible implementation of the first aspect, the embodiment of the present application provides a fourth possible implementation of the first aspect, wherein, for each pixel in the full-color micro-layer, determining the display color of the pixel according to the brightness value of the pixel under each visible light irradiation includes: For each pixel in the full-color micro-layer, the brightness values ​​of the pixel under illumination corresponding to each sub-wavelength are connected into a curve in the order of the size of each sub-wavelength to obtain the reflectance spectrum of the pixel; The display color of the pixel is determined based on the shape of the curve in the reflectance spectrum of the pixel.

[0010] In combination with the fourth possible implementation of the first aspect, the embodiment of the present application provides a fifth possible implementation of the first aspect, wherein determining the display color of the pixel point based on the shape of the curve in the reflectance spectrum of the pixel point includes: Comparing the shape of the curve in the reflectance spectrum of the pixel with the shapes of the curves in the standard reflectance spectra corresponding to the respective preset colors, and finding the standard reflectance spectrum with the highest similarity to the shape of the curve in the reflectance spectrum of the pixel from among the standard reflectance spectra; The preset color corresponding to the standard reflectance spectrum is determined as the display color of the pixel.

[0011] In combination with the first aspect, an embodiment of the present application provides a sixth possible implementation of the first aspect, wherein, among the multiple visible lights of different wavelengths integrated in the multi-spectral light source, the wavelength interval between any two adjacent wavelengths is the same.

[0012] In a second aspect, an embodiment of the present application further provides a full-color micro-layer quality inspection device, wherein a multi-spectral light source integrates multiple visible lights of different wavelengths, and the device comprises: a control module, configured to control the multi-spectral light source to switch between visible lights of different wavelengths, so that the multi-spectral light source uses visible lights of different wavelengths to illuminate the full-color micro-layer to be inspected; an identification module, configured to identify, for each visible light in the multi-spectral light source, a brightness value of each pixel in the full-color micro-layer under illumination of the visible light when the multi-spectral light source uses the visible light to illuminate the full-color micro-layer; a determination module, configured to determine, for each pixel in the full-color micro-layer, a display color of the pixel according to the brightness value of the pixel under illumination of each visible light; a comparison module, configured to use the color of the pixel in the original image as the standard color of the pixel, and compare the displayed color of the pixel with the standard color to determine whether they are the same, thereby obtaining a comparison result for each pixel; wherein the full-color micro-layer is produced based on the original image; The judgment module is used to judge whether there is a quality defect in the full-color micro-layer according to the comparison result of each pixel point.

[0013] In a third aspect, an embodiment of the present application further provides an electronic device comprising: a processor, a memory and a bus, wherein the memory stores machine-readable instructions executable by the processor. When the electronic device is running, the processor and the memory communicate through the bus, and when the machine-readable instructions are executed by the processor, the steps of any possible implementation method of the first aspect above are performed.

[0014] In a fourth aspect, an embodiment of the present application further provides a computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, the steps of any possible implementation method of the first aspect are executed.

[0015] The present invention provides a method, device, electronic device, and storage medium for quality inspection of a full-color micro-coating. By controlling a multispectral light source to switch between different wavelengths of visible light, the brightness of each pixel in the full-color micro-coating under each visible light source is determined. The brightness value represents the reflection / absorption characteristics of the full-color micro-coating under specific visible light (i.e., specific color light). Therefore, the displayed color of each pixel can be determined based on the brightness value under each visible light source. The full-color micro-coating is produced based on an original image. By using the color of the pixels in the original image as the standard color for the pixels and comparing the displayed color of the pixels with the standard color, quality defects in the full-color micro-coating can be detected. The inspection method of this embodiment ensures that inspection results are unaffected by the inspector's subjective experience, vision, and subjective standards, enabling unified inspection standards and addressing the issue of inconsistent judgment results caused by subjective differences. Furthermore, the displayed color of each pixel is reconstructed based on the brightness values ​​of the pixels at each wavelength, avoiding visual confusion caused by color overlay during manual inspection and improving inspection accuracy. Moreover, this embodiment completely replaces manual visual inspection with automated detection, thereby solving the problem of increased false detection rate due to manual fatigue, and simultaneously solving the problem of low efficiency and difficulty in matching production lines with manual visual inspection.

[0016] In order to make the above-mentioned objects, features and advantages of the present application more obvious and easy to understand, preferred embodiments are given below and described in detail with reference to the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the following is a brief introduction to the drawings required for use in the embodiments. It should be understood that the following drawings only show certain embodiments of the present application and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other relevant drawings can be obtained based on these drawings without creative work.

[0018] Figure 1 A flow chart of a quality inspection method for a full-color micro-layer provided in an embodiment of the present application is shown; Figure 2 A schematic diagram showing a coaxial arrangement of an illumination light path and an imaging light path provided in an embodiment of the present application is shown; Figure 3 A schematic structural diagram of a full-color micro-layer quality inspection device provided in an embodiment of the present application is shown; Figure 4 A schematic structural diagram of an electronic device provided in an embodiment of the present application is shown. DETAILED DESCRIPTION

[0019] In order to make the purpose, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. The components of the embodiments of the present application generally described and shown in the drawings here can be arranged and designed in various different configurations. Therefore, the following detailed description of the embodiments of the present application provided in the drawings is not intended to limit the scope of the application for protection, but merely represents the selected embodiments of the present application. Based on the embodiments of the present application, all other embodiments obtained by those skilled in the art without making creative work are within the scope of protection of this application.

[0020] Considering the subjective differences in manual visual inspection leading to inconsistent defect determination results, visual confusion caused by color overlay, increased false detection rates due to manual fatigue, and the low efficiency of manual visual inspection and difficulty in matching production lines, the present application provides a full-color micro-layer quality inspection method, device, electronic device, and storage medium, which are described below through examples.

[0021] It is worth noting that in this embodiment, the full-color micro-layer refers to a colored layer formed by inkjet printing on a substrate surface (e.g., a photovoltaic surface) through processes such as spraying, printing, coating, laminating, and laminating. For example, the full-color micro-layer can be produced by inputting an electronic original image into an inkjet printer, which then inkjet prints a colored layer on the substrate surface (e.g., a photovoltaic surface) that matches the original image.

[0022] To facilitate understanding of this embodiment, a quality inspection method for a full-color micro-layer disclosed in the embodiment of this application is first described in detail. The multi-spectral light source integrates multiple visible lights of different wavelengths, such as Figure 1 As shown, the following steps S101-S105 are included: S101: Controlling the multi-spectral light source to switch visible light of different wavelengths, so that the multi-spectral light source uses visible light of different wavelengths to illuminate the full-color micro-layer to be inspected.

[0023] In this embodiment, visible light of different wavelengths has different colors. Among the multiple visible lights of different wavelengths integrated in the multi-spectral light source, the wavelength interval between any two adjacent wavelengths is the same.

[0024] Exemplarily, the multispectral light source integrates six different wavelengths of visible light, namely, visible light with a wavelength of 390nm (purple light), visible light with a wavelength of 450nm (blue light), visible light with a wavelength of 510nm (green light), visible light with a wavelength of 570nm (yellow light), visible light with a wavelength of 630nm (red light), and visible light with a wavelength of 690nm (deep red light).

[0025] In this embodiment, a multispectral light source is controlled to rapidly switch between different wavelengths of visible light at millisecond speeds, so that the multispectral light source uses different wavelengths of visible light to illuminate the full-color micro-layer to be inspected. For example, the multispectral light source sequentially switches between violet, blue, green, yellow, red, and deep red light to illuminate the full-color micro-layer to be inspected. While one visible light source is illuminating the full-color micro-layer, the other visible light sources are turned off.

[0026] In this embodiment, the interference of ambient light is eliminated by rapidly switching visible light of different wavelengths.

[0027] S102: for each visible light in the multi-spectral light source, when the multi-spectral light source uses the visible light to illuminate the full-color micro-layer, identifying the brightness value of each pixel in the full-color micro-layer under the illumination of the visible light.

[0028] In this embodiment, when one of the visible lights is used to illuminate the full-color micro-layer (the other visible lights are in the off state), the brightness value of each pixel in the full-color micro-layer under the visible light is identified, thereby obtaining the brightness value of each pixel in the full-color micro-layer under each visible light.

[0029] In one possible implementation, when executing step S102 and the multispectral light source uses the visible light to illuminate the full-color micro-layer, identifying the brightness value of each pixel in the full-color micro-layer under the visible light illumination can be performed in the following steps: When the multi-spectral light source uses the visible light to illuminate the full-color micro-layer, the spectral camera is used to identify the brightness value of each pixel in the full-color micro-layer under the visible light illumination; wherein, a translucent spectrometer is used to coaxially set the illumination light path of the multi-spectral light source and the imaging light path of the spectral camera.

[0030] In this embodiment, when shadows appear on the surface of the full-color micro-layer, the brightness values ​​of the pixels identified in the shadows may be inaccurate, which can affect the accuracy of the subsequent displayed colors of the pixels in the shadows. To prevent shadows on the surface of the full-color micro-layer, this embodiment uses a translucent beam splitter to coaxially position the illumination path of the multispectral light source and the imaging path of the spectral camera, thereby preventing shadows on the surface of the full-color micro-layer.

[0031] In this embodiment, the transparency of the semi-transparent beam splitter is 50%.

[0032] In one possible implementation, Figure 2 As shown, a translucent beam splitter is set at a 45-degree angle above the full-color micro-layer, one side of which is coated with a semi-transparent and semi-reflective film; When the multi-spectral light source uses visible light to illuminate the full-color micro-layer to be inspected, the visible light passes through the collimating lens and the first polarizer in sequence, and illuminates the semi-transparent and semi-reflective film coating side of the translucent beam splitter at a 45-degree angle. Part of the light reflected by the translucent beam splitter is vertically illuminated to the full-color micro-layer, forming an illumination light path (such as Figure 2 ( ) The reflected light from the full-color micro-layer is directed at a 45-degree angle to the semi-transparent and semi-reflective coating of the translucent beam splitter. After being transmitted through the translucent beam splitter, the reflected light passes through the second polarizer and the imaging lens and enters the spectral camera, forming an imaging light path (such as Figure 2 solid line in the figure).

[0033] In this embodiment, a collimating lens is used to convert visible light (scattered light) emitted by a multi-spectral light source into a parallel light beam, and the first polarizer and the second polarizer are used to allow only light with a specific vibration direction to pass through (such as only allowing "vertically vibrating" light waves to pass through) and block random reflected light.

[0034] The second polarizer is placed close to the front of the imaging lens to block stray light reflected from the mirror. The imaging lens is used to focus the image, precisely focusing the reflected light from the full-color micro-layer onto the multispectral camera.

[0035] In a possible implementation, when executing step S102, the following steps S1021-S1022 may be specifically performed: S1021: When the multi-spectral light source uses the visible light to illuminate the full-color micro-layer, the reflected light from the full-color micro-layer under the visible light passes through the tunable filter and enters the spectral camera. The tunable filter switches to split the reflected light entering the spectral camera into multiple sub-wavelengths of visible light. The sub-wavelengths are wavelengths within the wavelength range of the color corresponding to the visible light. S1022: Outputting the brightness value of each pixel in the full-color micro-layer under the illumination corresponding to each sub-wavelength of the visible light through the spectral camera.

[0036] In this embodiment, a tunable filter is also provided in front of the spectral camera. In the multi-spectral light source using different visible light illumination stages, only one visible light (eg 450nm blue light) is used for illumination at a time, and the other visible lights are turned off.

[0037] The reflected light from the full-color micro-layer under visible light (e.g., 450nm blue light) passes through a tunable filter and enters the spectral camera. The tunable filter switches at high speed, splitting the reflected light entering the spectral camera into multiple (e.g., 10) sub-wavelengths.

[0038] For example, when the visible light is 450nm blue light, the wavelength range of the visible light is 450-495 nm. Then, the sub-wavelengths within the wavelength range of the color corresponding to the visible light can be: 450nm, 455nm, 460nm, 465nm, 470nm, 475nm, 480nm, 485nm, 490nm, and 495nm.

[0039] The spectral camera can then output the brightness value of each pixel in the full-color micro-layer under each sub-wavelength (e.g., 450nm, 455nm, 460nm, 465nm, 470nm, 475nm, 480nm, 485nm, 490nm, and 495nm) of visible light (e.g., 450nm blue light). In other words, a single exposure generates 10 brightness values ​​for each pixel.

[0040] Then, when different visible lights (for example, 6) are used for illumination, each pixel will generate 6×10 brightness values.

[0041] S103: For each pixel in the full-color micro-layer, determine the display color of the pixel according to the brightness value of the pixel under various visible light illuminations.

[0042] In this embodiment, the brightness value represents the reflection / absorption characteristics of a pixel in the full-color micro-coating under visible light of a specific color.

[0043] For example, when 450nm blue light is used to illuminate the pixels in the full-color micro-coating, the blue ink pixels will be bright (strong reflection) and the yellow areas will be dark (strong absorption). When 620nm red light is used to illuminate the pixels in the full-color micro-coating, the red ink pixels will be bright and the cyan areas will be dark.

[0044] For example, when a pixel in a full-color micro-coating is illuminated by 450nm blue light, if the pixel's brightness value is 85, it means that the pixel reflects blue light. When a pixel in a full-color micro-coating is illuminated by 510nm green light, if the pixel's brightness value is 10, it means that the pixel hardly reflects green light. When a pixel in a full-color micro-coating is illuminated by 630nm red light, if the pixel's brightness value is 92, it means that the pixel strongly reflects red light.

[0045] For example, if a pixel is "non-reflective" under all blue / green bands of visible light, then its display color can be ruled out as blue / green. If a pixel is "bright" only under red light, then its display color can be confirmed to be true red.

[0046] Even if there is ambient light interference, such as blue light is added to the ambient light, the brightness value of the pixel under blue light changes from 20 to 40, but the brightness value of the pixel under red light is still 220, then it can still be determined that the display color of the pixel is red.

[0047] In a possible implementation, when executing step S103, the following steps S1031-S1032 may be specifically performed: S1031: For each pixel in the full-color micro-layer, the brightness values ​​of the pixel under illumination corresponding to each sub-wavelength are connected into a curve in the order of the size of each sub-wavelength to obtain the reflectance spectrum of the pixel.

[0048] S1032: Determine the display color of the pixel point according to the shape of the curve in the reflection spectrum of the pixel point.

[0049] In this embodiment, illustratively, for each pixel, 6×10 brightness values ​​corresponding to the pixel are connected into a curve to obtain the reflectance spectrum of the pixel.

[0050] For example, in the red reflectance spectrum, the curve only bulges at 620nm (like a red mountain peak).

[0051] In the red (purple) reflectance spectrum, the curve bulges at 620nm and has a small bump at 450nm.

[0052] In a possible implementation, when executing step S1032, the following steps S10321-S10322 may be specifically performed: S10321: Compare the shape of the curve in the reflectance spectrum of the pixel with the shapes of the curves in the standard reflectance spectra corresponding to the respective preset colors, and find the standard reflectance spectrum that has the highest similarity to the shape of the curve in the reflectance spectrum of the pixel. S10322: Determine the preset color corresponding to the standard reflectance spectrum as the display color of the pixel.

[0053] In this embodiment, by building in “standard reflection spectra corresponding to multiple preset colors”, the actual display color of each pixel is locked by comparing the curve shape of the standard reflection spectrum with the reflection spectrum of each pixel.

[0054] S104: The color of the pixel in the original image is used as the standard color of the pixel, and the displayed color of the pixel is compared with the standard color to determine whether they are the same, so as to obtain the comparison results of each pixel; wherein, the full-color micro-layer is produced based on the original image.

[0055] In this embodiment, for example, the full-color micro-layer can be printed out by an inkjet printer based on the original image, so the color of each pixel in the original image is used as the standard color of each pixel, and the displayed color of the pixel is compared to see whether it is the same as the standard color.

[0056] S105: Based on the comparison results of each pixel point, determine whether there are quality defects in the full-color micro-layer.

[0057] In this embodiment, if the displayed color of a pixel differs from the standard color, it indicates that a quality defect exists at the location of the pixel in the full-color micro-layer. Examples of quality defects include inaccurate printed colors, scratches, ink spots, or dust.

[0058] If the displayed color of a pixel is the same as the standard color, it means that there is no quality defect at the location of the pixel in the full-color micro-layer.

[0059] Based on the same technical concept, the embodiment of the present application also provides a full-color micro-layer quality detection device, wherein a multi-spectral light source integrates multiple visible lights of different wavelengths, such as Figure 3 As shown, the device includes: The control module 301 is used to control the multi-spectral light source to switch visible light of different wavelengths, so that the multi-spectral light source uses visible light of different wavelengths to illuminate the full-color micro-layer to be inspected; An identification module 302 is configured to identify, for each visible light in the multi-spectral light source, a brightness value of each pixel in the full-color micro-layer when the multi-spectral light source uses the visible light to illuminate the full-color micro-layer; A determination module 303 is configured to determine, for each pixel in the full-color micro-layer, a display color of the pixel according to the brightness value of the pixel under each visible light illumination; The comparison module 304 is configured to use the color of the pixel in the original image as the standard color of the pixel, and compare the displayed color of the pixel with the standard color to determine whether they are the same, thereby obtaining a comparison result for each pixel; wherein the full-color micro-layer is produced based on the original image; The judgment module 305 is used to judge whether there is a quality defect in the full-color micro-layer according to the comparison result of each pixel point.

[0060] Optionally, when the multi-spectral light source uses the visible light to illuminate the full-color micro-layer, the identification module 302 is configured to identify the brightness value of each pixel in the full-color micro-layer under the visible light illumination, specifically: When the multi-spectral light source uses the visible light to illuminate the full-color micro-layer, the spectral camera is used to identify the brightness value of each pixel in the full-color micro-layer under the visible light illumination; wherein, a semi-transparent beam splitter is used to coaxially set the illumination light path of the multi-spectral light source and the imaging light path of the spectral camera.

[0061] Optionally, a translucent beam splitter is provided above the full-color micro-layer at a 45-degree angle, one side of which is coated with a semi-transparent and semi-reflective film coating; When the multispectral light source uses visible light to illuminate the full-color micro-layer to be inspected, the visible light passes through the collimating lens and the first polarizer in sequence, and is irradiated at a 45-degree angle to the semi-transparent and semi-reflective coating side of the translucent beam splitter. Part of the light reflected by the translucent beam splitter is vertically irradiated to the full-color micro-layer, forming an illumination light path; The reflected light from the full-color micro-layer is directed at a 45-degree angle toward the semi-transparent and semi-reflective film coating side of the translucent beam splitter. After being transmitted through the translucent beam splitter, the reflected light passes through the second polarizer and the imaging lens in sequence and enters the spectral camera to form an imaging light path.

[0062] Optionally, when the multi-spectral light source uses the visible light to illuminate the full-color micro-layer, the recognition module 302 is configured to identify the brightness value of each pixel in the full-color micro-layer under the visible light through a spectral camera, specifically for: When the multi-spectral light source uses the visible light to illuminate the full-color micro-layer, the reflected light from the full-color micro-layer under the visible light passes through the tunable filter and enters the spectral camera; wherein the tunable filter switches to split the reflected light entering the spectral camera into multiple sub-wavelengths of visible light; the sub-wavelengths are wavelengths within the wavelength range of the color corresponding to the visible light; The spectral camera outputs the brightness value of each pixel in the full-color micro-layer under the illumination corresponding to each sub-wavelength of the visible light.

[0063] Optionally, when the determination module 303 is used to determine the display color of each pixel in the full-color micro-layer according to the brightness value of the pixel under the illumination of each visible light, it is specifically used to: For each pixel in the full-color micro-layer, the brightness values ​​of the pixel under illumination corresponding to each sub-wavelength are connected into a curve in the order of the size of each sub-wavelength to obtain the reflectance spectrum of the pixel; The display color of the pixel is determined based on the shape of the curve in the reflectance spectrum of the pixel.

[0064] Optionally, when the determination module 303 is used to determine the display color of the pixel point according to the shape of a curve in the reflectance spectrum of the pixel point, it is specifically used to: Comparing the shape of the curve in the reflectance spectrum of the pixel with the shapes of the curves in the standard reflectance spectra corresponding to the respective preset colors, and finding the standard reflectance spectrum with the highest similarity to the shape of the curve in the reflectance spectrum of the pixel from among the standard reflectance spectra; The preset color corresponding to the standard reflectance spectrum is determined as the display color of the pixel.

[0065] Optionally, among the multiple visible lights of different wavelengths integrated in the multi-spectral light source, the wavelength interval between any two adjacent wavelengths is the same.

[0066] Figure 4 A structural diagram of an electronic device provided in an embodiment of the present application includes: a processor 401, a memory 402 and a bus 403, wherein the memory 402 stores machine-readable instructions executable by the processor 401. When the electronic device runs the above-mentioned information processing method, the processor 401 communicates with the memory 402 through the bus 403, and the processor 401 executes the machine-readable instructions to perform the method steps described in Example 1.

[0067] An embodiment of the present application further provides a computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, the method steps described in the first embodiment are executed.

[0068] Those skilled in the art will clearly understand that, for the convenience and brevity of description, the specific working processes of the above-described devices, electronic devices, and computer-readable storage media can refer to the corresponding processes in the aforementioned method embodiments and will not be repeated here.

[0069] In the several embodiments provided in this application, it should be understood that the disclosed methods, devices, electronic devices and computer-readable storage media can be implemented in other ways. The device embodiments described above are merely schematic. For example, the division of the modules is only a logical function division. There may be other division methods in actual implementation. For example, multiple modules or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some communication interfaces, indirect coupling or communication connection of devices or modules, which can be electrical, mechanical or other forms.

[0070] The units described as separate components may or may not be physically separate, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed across multiple network units. Some or all of these units may be selected to achieve the purpose of this embodiment according to actual needs.

[0071] In addition, each functional unit in each embodiment of the present application may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit.

[0072] If the functions are implemented in the form of software functional units and sold or used as independent products, they can be stored in a non-volatile computer-readable storage medium that is executable by a processor. Based on this understanding, the technical solution of the present application, or the part that contributes to the prior art, or the part of the technical solution, can be embodied in the form of a software product. The computer software product is stored in a storage medium and includes several instructions for enabling a computer device (which can be a personal computer, server, or network device, etc.) to execute all or part of the steps of the method described in each embodiment of the present application. The aforementioned storage medium includes various media that can store program code, such as a USB flash drive, a mobile hard disk, a read-only memory (ROM), a random access memory (RAM), a magnetic disk, or an optical disk.

[0073] Finally, it should be noted that the above-described embodiments are only specific implementation methods of the present application, which are used to illustrate the technical solutions of the present application, rather than to limit them. The scope of protection of the present application is not limited thereto. Although the present application has been described in detail with reference to the above-described embodiments, those skilled in the art should understand that any person skilled in the art can modify or easily conceive of changes to the technical solutions described in the above-described embodiments within the technical scope disclosed in the present application, or perform equivalent replacements for some of the technical features thereof. Such modifications, changes, or replacements do not deviate from the spirit and scope of the technical solutions of the embodiments of the present application, and should be included in the scope of protection of the present application. Therefore, the scope of protection of the present application shall be based on the scope of protection of the claims.

Claims

1. A quality inspection method for full-color micro-layers, characterized in that: A multi-spectral light source integrates multiple visible lights of different wavelengths, and the method includes: Controlling the multi-spectral light source to switch visible light of different wavelengths so that the multi-spectral light source uses visible light of different wavelengths to illuminate the full-color micro-layer to be inspected; For each visible light in the multi-spectral light source, when the multi-spectral light source uses the visible light to illuminate the full-color micro-layer, identifying the brightness value of each pixel in the full-color micro-layer under the illumination of the visible light; For each pixel in the full-color micro-layer, determining the display color of the pixel according to the brightness value of the pixel under the illumination of each visible light; The color of the pixel in the original image is used as the standard color of the pixel, and the displayed color of the pixel is compared with the standard color to determine whether it is the same, so as to obtain a comparison result for each pixel; wherein the full-color micro-layer is produced based on the original image; According to the comparison results of each pixel point, it is determined whether there are quality defects in the full-color micro-layer.

2. The method according to claim 1, characterized in that When the multi-spectral light source uses the visible light to illuminate the full-color micro-layer, identifying the brightness value of each pixel in the full-color micro-layer under the visible light illumination includes: When the multi-spectral light source uses the visible light to illuminate the full-color micro-layer, the spectral camera is used to identify the brightness value of each pixel in the full-color micro-layer under the visible light illumination; wherein, a semi-transparent beam splitter is used to coaxially set the illumination light path of the multi-spectral light source and the imaging light path of the spectral camera.

3. The method according to claim 2, characterized in that A translucent beam splitter is provided above the full-color micro-layer at a 45-degree angle, one side of which is coated with a semi-transparent and semi-reflective film coating; When the multispectral light source uses visible light to illuminate the full-color micro-layer to be inspected, the visible light passes through the collimating lens and the first polarizer in sequence, and is irradiated at a 45-degree angle to the semi-transparent and semi-reflective coating side of the translucent beam splitter. Part of the light reflected by the translucent beam splitter is vertically irradiated to the full-color micro-layer, forming an illumination light path; The reflected light from the full-color micro-layer is directed at a 45-degree angle toward the semi-transparent and semi-reflective film coating side of the translucent beam splitter. After being transmitted through the translucent beam splitter, the reflected light passes through the second polarizer and the imaging lens in sequence and enters the spectral camera to form an imaging light path.

4. The method according to claim 2, characterized in that When the multi-spectral light source uses the visible light to illuminate the full-color micro-layer, identifying the brightness value of each pixel in the full-color micro-layer under the visible light illumination by the spectral camera includes: When the multi-spectral light source uses the visible light to illuminate the full-color micro-layer, the reflected light from the full-color micro-layer under the visible light passes through the tunable filter and enters the spectral camera; wherein the tunable filter switches to split the reflected light entering the spectral camera into multiple sub-wavelengths of visible light; the sub-wavelengths are wavelengths within the wavelength range of the color corresponding to the visible light; The spectral camera outputs the brightness value of each pixel in the full-color micro-layer under the illumination corresponding to each sub-wavelength of the visible light.

5. The method according to claim 4, characterized in that: The step of determining, for each pixel in the full-color micro-layer, the display color of the pixel according to the brightness value of the pixel under the illumination of each visible light, includes: For each pixel in the full-color micro-layer, the brightness values ​​of the pixel under illumination corresponding to each sub-wavelength are connected into a curve in the order of the size of each sub-wavelength to obtain the reflectance spectrum of the pixel; The display color of the pixel is determined based on the shape of the curve in the reflectance spectrum of the pixel.

6. The method according to claim 5, characterized in that Determining the display color of the pixel point according to the shape of a curve in the reflectance spectrum of the pixel point includes: Comparing the shape of the curve in the reflectance spectrum of the pixel with the shapes of the curves in the standard reflectance spectra corresponding to the respective preset colors, and finding the standard reflectance spectrum with the highest similarity to the shape of the curve in the reflectance spectrum of the pixel from among the standard reflectance spectra; The preset color corresponding to the standard reflectance spectrum is determined as the display color of the pixel.

7. The method according to claim 1, characterized in that: Among the multiple visible lights of different wavelengths integrated in the multi-spectral light source, the wavelength interval between any two adjacent wavelengths is the same.

8. A full-color micro-layer quality inspection device, characterized in that: A multi-spectral light source integrates multiple visible lights of different wavelengths, and the device includes: a control module, configured to control the multi-spectral light source to switch between visible lights of different wavelengths, so that the multi-spectral light source uses visible lights of different wavelengths to illuminate the full-color micro-layer to be inspected; an identification module, configured to identify, for each visible light in the multi-spectral light source, a brightness value of each pixel in the full-color micro-layer under illumination of the visible light when the multi-spectral light source uses the visible light to illuminate the full-color micro-layer; a determination module, configured to determine, for each pixel in the full-color micro-layer, a display color of the pixel according to the brightness value of the pixel under illumination of each visible light; a comparison module, configured to use the color of the pixel in the original image as the standard color of the pixel, and compare the displayed color of the pixel with the standard color to determine whether they are the same, thereby obtaining a comparison result for each pixel; wherein the full-color micro-layer is produced based on the original image; The judgment module is used to judge whether there is a quality defect in the full-color micro-layer according to the comparison result of each pixel point.

9. An electronic device, characterized in that: include: A processor, a memory and a bus, wherein the memory stores machine-readable instructions executable by the processor, and when the electronic device is running, the processor and the memory communicate via the bus, and when the machine-readable instructions are executed by the processor, the steps of the method according to any one of claims 1 to 7 are performed.

10. A computer-readable storage medium, characterized in that The computer-readable storage medium stores a computer program, which, when executed by a processor, executes the steps of the method according to any one of claims 1 to 7.

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