Crystal orientation detection method and related device

Abstract

The invention discloses a crystal orientation detection method and a related device, and relates to the technical field of crystal detection. The method comprises the following steps: irradiating a to-be-detected area of a to-be-detected sample by using rays generated by a synchrotron radiation light source; controlling the to-be-detected sample to rotate at a preset interval, and determining a diffraction vector of the diffracted light corresponding to each rotation angle in the sample coordinate system based on the transmitted light spot position and the diffracted light spot position respectively corresponding to the projection light and the diffracted light of the to-be-detected area to the ray at each rotation angle collected by the detector; and according to a preset crystal face index corresponding to the at least one rotation angle and the diffraction vector, determining an expression representing a conversion relationship between the sample coordinate system and the crystal coordinate system, and taking the expression as the crystal orientation of the to-be-detected sample. By rotating the sample to be detected, the crystal face detection blind area is reduced, and the crystal face indexes and the diffraction vectors of the multiple crystal faces are combined to jointly determine the conversion relation between the sample coordinate system and the crystal coordinate system, so that the accuracy of crystal orientation is improved.

Description

Technical Field

[0001] The present application relates to the field of crystal detection technology, and in particular to a crystal orientation detection method and related devices. Background Art

[0002] Single-crystal superalloys are the core material for turbine blades in high-end devices such as aircraft engines and gas turbines. Turbine blades are often exposed to extreme environments such as high temperature, high pressure, high stress, and strong oxidation and corrosion. To ensure the performance of turbine blades, single-crystal superalloys, as the core material, must meet stringent comprehensive performance requirements. Crystallographic orientation is a key quality indicator for single-crystal superalloy blades.

[0003] At present, visual or laboratory X-ray diffraction technology is usually used to test the crystal orientation of single-crystal high-temperature alloy blades. However, with the development of technology, blades have gradually developed into hollow blades and double-walled hollow blades, and the internal matrix crystal orientation and recrystallized grain orientation cannot be detected.

[0004] Therefore, there is an urgent need for a crystal orientation detection method to accurately detect the crystal orientation of blades with complex structures. Summary of the Invention

[0005] In view of the above problems, this application provides a crystal orientation detection method and related devices to achieve the purpose of accurately detecting the crystal orientation of complex structure blades. The specific solution is as follows:

[0006] In a first aspect, the present application provides a crystal orientation detection method, which is applied to a controller of a crystal orientation detection system. The crystal orientation detection system further comprises at least: a synchrotron radiation source and a detector, respectively disposed on both sides of a sample to be tested. The crystal orientation detection method comprises:

[0007] Controlling the rays generated by the synchrotron radiation source to vertically illuminate the area to be tested of the sample to be tested;

[0008] Controlling the sample to be tested to rotate at preset intervals, determining the rotation angle of the sample to be tested after the rotation, and obtaining the projected light and diffracted light of the test area to the ray at each rotation angle, as collected by the detector, and the corresponding transmitted light spot position and diffracted light spot position, respectively, where the rotation angle is the deviation angle of the sample to be tested relative to the initial angle;

[0009] Based on the position of the transmitted light spot and the position of the diffracted light spot, determining the diffraction vector of the diffracted light corresponding to each of the rotation angles in a sample coordinate system, wherein the sample coordinate system is a three-dimensional coordinate system constructed with the center of the area to be measured as the origin;

[0010] An expression characterizing the conversion relationship between the sample coordinate system and the crystal coordinate system is determined according to a preset crystal plane index corresponding to at least one of the rotation angles and the diffraction vector as the crystal orientation of the sample to be measured.

[0011] In a possible implementation, determining the diffraction vector of the diffracted light corresponding to each rotation angle in the sample coordinate system based on the transmitted light spot position and the diffracted light spot position includes:

[0012] Performing vector processing on the transmitted light spot position and the diffracted light spot position corresponding to each rotation angle to obtain a diffraction vector of the diffracted light corresponding to each rotation angle in the sample coordinate system, the vector processing comprising:

[0013] Determining a diffraction radius of the diffracted light in a laboratory coordinate system based on the transmitted light spot position and the diffracted light spot position, wherein the laboratory coordinate system is a three-dimensional coordinate system constructed with the transmitted light spot position as an origin and having the same direction as the sample coordinate system;

[0014] Obtaining the diffraction angle of the crystal plane illuminated by the rotation angle;

[0015] determining a first diffraction vector of the diffracted light in the laboratory coordinate system based on the diffraction angle and the diffraction radius;

[0016] The diffraction vector of the diffracted light corresponding to the rotation angle in the sample coordinate system is determined according to the conversion relationship between the laboratory coordinate system and the sample coordinate system.

[0017] In one possible implementation, determining an expression representing the conversion relationship between the sample coordinate system and the crystal coordinate system as the crystal orientation of the sample to be measured based on the preset crystal plane index corresponding to at least one of the rotation angles and the diffraction vector, includes:

[0018] Constructing a linear regression equation according to the preset crystal plane index corresponding to at least one of the rotation angles and the diffraction vector;

[0019] Based on the linear regression equation, a transformation matrix from the sample coordinate system to the crystal coordinate system is determined as the crystal orientation of the sample to be measured.

[0020] In a possible implementation, the process of presetting the crystal plane index includes:

[0021] Determining the diffraction pole figure of the sample to be measured based on the diffraction vector corresponding to at least one of the rotation angles;

[0022] Obtaining a standard diffraction pole figure corresponding to the crystal type of the sample to be tested;

[0023] The crystal plane indices of different crystal planes of the sample to be measured are determined according to the difference between the diffraction pole figure and the standard diffraction pole figure.

[0024] A second aspect of the present application provides a crystal orientation detection system, comprising: a controller, and a synchrotron radiation source and a detector respectively arranged on both sides of a sample to be measured, wherein the sample to be measured, the synchrotron radiation source and the detector are in the same horizontal plane;

[0025] The synchrotron radiation light source is used to generate radiation to vertically illuminate the area to be tested of the sample to be tested;

[0026] The detector is used to collect the position of the transmitted light spot of the transmitted light and the position of the diffracted light spot of the diffracted light of the area to be measured;

[0027] The controller is used to implement the crystal orientation detection method of the first aspect or any implementation of the first aspect.

[0028] A third aspect of the present application provides a crystal orientation detection device, which is applied to the controller of the crystal orientation detection system described in the second aspect. The crystal orientation detection device includes:

[0029] An irradiation control unit is used to control the radiation generated by the synchrotron radiation source to vertically irradiate the area to be tested of the sample to be tested;

[0030] a position acquisition unit, controlling the sample to be tested to rotate at preset intervals, determining the rotation angle of the sample to be tested after the rotation, and acquiring the projected light and diffracted light of the test area to the ray at each rotation angle, as collected by the detector, and the corresponding transmitted light spot position and diffracted light spot position, respectively, where the rotation angle is the deviation angle of the sample to be tested relative to the initial angle;

[0031] a diffraction vector determining unit, configured to determine, based on the transmitted light spot position and the diffracted light spot position, a diffraction vector of the diffracted light corresponding to each of the rotation angles in a sample coordinate system, wherein the sample coordinate system is a three-dimensional coordinate system constructed with the center of the area to be measured as the origin;

[0032] The crystal orientation determination unit is used to determine an expression characterizing the conversion relationship between the sample coordinate system and the crystal coordinate system based on a preset crystal plane index corresponding to at least one of the rotation angles and the diffraction vector, as the crystal orientation of the sample to be measured.

[0033] In a possible implementation, the diffraction vector determining unit includes:

[0034] a diffraction radius determination subunit, configured to determine the diffraction radius of the diffracted light in a laboratory coordinate system based on the transmitted light spot position and the diffracted light spot position, wherein the laboratory coordinate system is a three-dimensional coordinate system constructed with the transmitted light spot position as an origin and having the same direction as the sample coordinate system;

[0035] a diffraction angle acquisition subunit, configured to acquire the diffraction angle of the crystal plane illuminated by the rotation angle;

[0036] a first vector determining subunit, configured to determine a first diffraction vector of the diffracted light in the laboratory coordinate system based on the diffraction angle and the diffraction radius;

[0037] The vector conversion subunit is used to determine the diffraction vector of the diffracted light corresponding to the rotation angle in the sample coordinate system according to the conversion relationship between the laboratory coordinate system and the sample coordinate system.

[0038] In a possible implementation, the crystal orientation determining unit includes:

[0039] an equation construction subunit, configured to construct a linear regression equation based on a preset crystal plane index corresponding to at least one of the rotation angles and the diffraction vector;

[0040] The orientation determination subunit is used to determine the transformation matrix of the sample coordinate system to the crystal coordinate system based on the linear regression equation as the crystal orientation of the sample to be measured.

[0041] In a possible implementation, the functional unit for presetting the crystal plane index includes:

[0042] a diffraction pole figure determining unit, configured to determine the diffraction pole figure of the sample to be tested based on the diffraction vectors corresponding to at least one of the rotation angles;

[0043] A standard pole figure acquisition unit, used to obtain a standard diffraction pole figure corresponding to the crystal type of the sample to be tested;

[0044] The crystal plane index determination unit is used to determine the crystal plane indices of different crystal planes of the sample to be tested based on the difference between the diffraction pole figure and the standard diffraction pole figure.

[0045] The fourth aspect of the present application provides a computer storage medium, which carries one or more computer programs. When the one or more computer programs are executed by an electronic device, the electronic device can implement the crystal orientation detection method of the above-mentioned first aspect or any implementation method of the first aspect.

[0046] By means of the above-mentioned technical solution, the crystal orientation detection method provided in this application first uses the radiation generated by a synchrotron radiation source to irradiate the test area of ​​the sample to be tested. Due to the high penetrating power of the radiation generated by the synchrotron radiation source, the internal structure of the sample to be tested diffracts the radiation, providing a collectible basis for crystal orientation testing. Furthermore, using the crystal plane indices of the crystal planes of the preset crystal sample at different rotation angles and the vector information of the diffracted light of the crystal plane in the sample coordinate system that can be measured, the conversion relationship between the crystal coordinate system and the sample coordinate system is derived, thereby determining the crystal orientation of the crystal sample.

[0047] In addition, by rotating the sample to be tested, as many diffraction signals of different crystal planes of the sample to be tested as possible can be collected to reduce the blind spots of crystal plane detection of the sample to be tested. Furthermore, by combining the crystal plane indices and diffraction vectors of multiple crystal planes, the conversion relationship between the sample coordinate system and the crystal coordinate system is jointly determined to improve the accuracy of crystal orientation testing. BRIEF DESCRIPTION OF THE DRAWINGS

[0048] The above and other features, advantages, and aspects of the various embodiments of the present disclosure will become more apparent with reference to the following detailed description in conjunction with the accompanying drawings. Throughout the drawings, the same or similar reference numerals represent the same or similar elements. It should be understood that the drawings are schematic and that the originals and elements are not necessarily drawn to scale.

[0049] Figure 1 A schematic diagram of a process for implementing a crystal orientation detection method provided in an embodiment of the present application;

[0050] Figure 2 A schematic structural diagram of a crystal orientation detection system provided in an embodiment of the present application;

[0051] Figure 3 A schematic diagram of crystal diffraction provided in an embodiment of the present application;

[0052] Figure 4 A schematic structural diagram of a crystal orientation detection device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0053] The following describes the embodiments of the present application in conjunction with the accompanying drawings. The terms used in the implementation methods of the present application are only used to explain the specific embodiments of the present application and are not intended to limit the present application.

[0054] The embodiments of the present application are described below in conjunction with the accompanying drawings. Those skilled in the art will appreciate that, with the development of technology and the emergence of new scenarios, the technical solutions provided in the embodiments of the present application are also applicable to similar technical problems.

[0055] The terms "first", "second", etc. in the specification and claims of the present application and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequential order. It should be understood that the terms used in this way can be interchangeable under appropriate circumstances, and this is merely a way of distinguishing the objects of the same attributes when describing them in the embodiments of the present application. In addition, the terms "including" and "having" and any of their variations are intended to cover non-exclusive inclusions, so that the process, method, system, product or equipment comprising a series of units need not be limited to those units, but may include other units that are not clearly listed or inherent to these processes, methods, products or equipment.

[0056] To address the problem in the prior art of being unable to detect the internal matrix crystal orientation and recrystallized grain orientation of hollow blades and double-walled hollow blades, the present invention provides a crystal orientation detection method. The crystal orientation detection method of the present invention is described in detail below with reference to the accompanying drawings.

[0057] Reference Figure 1 , Figure 1 A flow chart of a method for realizing crystal orientation detection provided in an embodiment of the present application is shown as follows: Figure 1 As shown, a method for implementing crystal orientation detection provided by an embodiment of the present application may include steps S110 to S150, and these steps are described in detail below.

[0058] It should be noted that the crystal orientation detection method provided in the embodiment of the present application is applied to the controller of the crystal orientation detection system, referring to Figure 2 The present invention provides a schematic structural diagram of a crystal orientation detection system. The system may further include a synchrotron radiation source and a detector, wherein the synchrotron radiation source and the detector are respectively disposed on either side of a sample to be tested, and together perform crystal orientation testing on the sample to be tested. The sample to be tested may be a crystal sample, the turbine blade mentioned in the background technology above, or other objects made of crystal as a core material, without limitation herein.

[0059] Based on the above crystal orientation detection system, the controller performs the following steps:

[0060] Step S110 , controlling the rays generated by the synchrotron radiation source to vertically illuminate the area to be tested of the sample to be tested.

[0061] In step S120 , the sample to be tested is controlled to rotate at a preset interval, and a rotation angle of the sample to be tested after rotation is determined. The rotation angle is a deviation angle of the sample to be tested relative to an initial angle.

[0062] The rays generated by synchrotron radiation sources have strong penetrating properties, and their penetration depth and effectiveness depend on the energy of the rays. The greater the energy, the stronger the penetrating ability. Testers can determine the requirements for the penetrating power of the rays required for the test of the crystal to be tested based on the structure and crystal type of the crystal to be tested, and adjust the synchrotron radiation source so that the rays it generates can meet the test requirements. For example, if the sample to be tested is a hollow blade or a double-walled hollow blade, and it is necessary to detect the internal matrix crystal orientation and recrystallized grain orientation, it is necessary to jointly determine the synchrotron radiation source's ray intensity based on the blade's crystal material type and blade thickness information so that it can penetrate the blade, allowing the detector to collect signals such as the transmitted light and diffracted light of the internal crystal, providing a basis for subsequent crystal orientation detection.

[0063] While controlling the radiation to irradiate the test area of ​​the sample vertically, the sample is controlled to rotate so that the detector can collect information on the diffraction effect of the radiation on the test area at different angles, thereby obtaining more comprehensive diffraction data of the sample. These diffraction data contain structural information of the sample in different directions, which helps to more accurately determine the crystal information of the sample.

[0064] Optional, see Figure 3 , a schematic diagram of crystal diffraction provided in an embodiment of the present application, with the center (x, y, z) of the test area of ​​the test sample as the center of the sample coordinate system, the direction of the incident rays generated by the synchrotron radiation source as the X-axis, and the direction perpendicular to the X-axis as the longitudinal axis Z. In the embodiment of the present application, the test sample is controlled to rotate around the Z-axis at a preset interval. It can be understood that because the center of the test area is located on the straight line where the Z-axis is located, even if the test sample rotates around the Z-axis, the position of the test sample will not change. The only thing that actually changes is the angle at which the test sample is irradiated by the synchrotron radiation source. Based on this, the detector behind the test sample collects diffraction information of the test area for rays at different angles.

[0065] Step S130 , obtaining the projected light and diffracted light of the test area at each rotation angle, which are collected by the detector, and the corresponding transmitted light spot position and diffracted light spot position, respectively.

[0066] Step S140 : determining the diffraction vector of the diffracted light corresponding to each rotation angle in the sample coordinate system based on the position of the transmitted light spot and the position of the diffracted light spot.

[0067] After the radiation irradiates the area to be tested, two beams of light are usually generated. One beam is the projected light obtained by part of the radiation directly transmitting through the sample to be tested, and the other beam is the diffracted light formed by the diffraction phenomenon caused by the interaction between the radiation and the sample to be tested. The projected light and the diffracted light form a projected light spot and a diffracted light spot respectively. The detector captures the transmitted light spot and the diffracted light spot and records their position coordinates. Based on this, in the embodiment of the present application, the detector can adopt a pixel array detector, in which each pixel corresponds to a specific position. When a photon hits a pixel, the pixel generates an electrical signal, and the photon position is recorded. Based on this, the detector can collect the positions of the projected light spot and the diffracted light spot.

[0068] Each time the sample is rotated, the detector reads the position of the projected and diffracted light spots in the test area. As you can see, the direction of the projected light is typically the same as the direction of the radiation. Therefore, the projected light spot position corresponds to the location of the illuminated area within the test area, while the position and intensity distribution of the diffracted light spot reflect important structural information about the sample, such as lattice parameters and atomic arrangement.

[0069] Furthermore, the corresponding transmitted light spot position and diffracted light spot position at each rotation angle are processed to obtain the diffraction vector of the test area for the ray at each rotation angle. The diffraction vector is a vector representation of the diffracted light relative to the sample coordinate system. It can be understood that crystal orientation refers to the spatial arrangement direction of a crystal plane or crystal direction in a crystal relative to an external reference coordinate system (such as the sample coordinate system or the laboratory coordinate system). Therefore, in an embodiment of the present application, the transmitted light spot position and the diffracted light spot position in the laboratory coordinate system, i.e., the coordinate system under the pixel array of the detector, collected by the detector are firstly determined. Further, the positional relationship between the laboratory coordinate system and the sample coordinate system is used to determine the vector information of the diffracted light in the sample coordinate system. Furthermore, based on the relationship between the sample coordinate system, the crystal coordinate system, and the diffraction vector, the relative relationship between the crystal coordinate system and the sample coordinate system is derived, thereby detecting the crystal orientation of the sample to be tested.

[0070] In one possible implementation, vector processing is performed on the transmitted light spot position and the diffraction light spot position corresponding to each rotation angle to obtain the diffraction vector of the diffracted light corresponding to each rotation angle in the sample coordinate system. The vector processing includes: determining the diffraction radius of the diffracted light in the laboratory coordinate system based on the transmitted light spot position and the diffraction light spot position, where the laboratory coordinate system is a three-dimensional coordinate system constructed with the transmitted light spot position as the origin and having the same direction as the sample coordinate system; obtaining the diffraction angle of the crystal plane irradiated by the rotation angle; determining the first diffraction vector of the diffracted light in the laboratory coordinate system based on the diffraction angle and the diffraction radius; and determining the diffraction vector of the diffracted light corresponding to the rotation angle in the sample coordinate system based on the conversion relationship between the laboratory coordinate system and the sample coordinate system.

[0071] Reference Figure 3 , the process of determining the diffraction vector of the diffracted light corresponding to a rotation angle in the sample coordinate system is used as an example to illustrate, and the determination of the diffraction vectors of other rotation angles can be referred to accordingly, which will not be repeated here.

[0072] Specifically, based on the position of the transmitted light spot and the position of the diffracted light spot (y det ,z det ), and the pixel size p of each pixel in the pixel array detector, refer to the following formula (1) to determine the diffraction radius t in the laboratory coordinate system. It can be understood that the laboratory coordinate system is the pixel coordinate system of the pixel array detector, the origin of this coordinate system is the position of the projected light spot, and the directions of the coordinate axes of this pixel coordinate system are the same as the directions of the coordinate axes in the sample coordinate system.

[0073] (1)

[0074] Furthermore, by comparing the reference data in the material standard card (such as JCPDS / ICDD card), the crystal plane and diffraction angle 2θ under the rotation angle are determined. Based on this, referring to formula (2), the physical distance D of the detector under the current test environment is determined, and the complete coordinates of the diffraction light spot position in the laboratory coordinate system can be determined as (D, y det ,z det ).

[0075] (2)

[0076] Use the object distance D and the position of the diffracted light spot to determine the direction of the diffracted light , where a and b are the components of the diffracted light in the Y-axis and Z-axis in the laboratory coordinate system, respectively. D After normalization, we get the vector .

[0077] The diffracted light direction is normalized by With the incident light direction , determine the first diffraction vector in laboratory coordinates Furthermore, combined with the current rotation angle of the sample to be tested , obtain the diffraction vector e of the diffracted light in the sample coordinate system, refer to the following formula (3).

[0078] (3)

[0079] Step S150 , determining an expression representing the conversion relationship between the sample coordinate system and the crystal coordinate system according to a preset crystal plane index and a diffraction vector corresponding to at least one rotation angle as the crystal orientation of the sample to be measured.

[0080] Based on the above method, the diffraction vector corresponding to each rotation angle is determined. Using the diffraction vector of each rotation angle and the preset crystal plane index corresponding to each rotation angle, linear regression equations are established in the sample coordinate system and the crystal coordinate system respectively, so as to determine the matrix for transforming the sample coordinate system into the crystal coordinate system, and use this matrix as the crystal orientation of the sample to be tested.

[0081] In one possible implementation, the preset crystal plane index can be determined by the crystal type, and the crystal plane index is determined by the standard diffraction crystal plane corresponding to the crystal type. Specifically, the process of presetting the crystal plane index includes: determining the diffraction pole figure of the sample to be tested based on the diffraction vector corresponding to at least one rotation angle; obtaining the standard diffraction pole figure corresponding to the crystal type of the sample to be tested; and determining the crystal plane index of different crystal planes of the sample to be tested based on the difference between the diffraction pole figure and the standard diffraction pole figure.

[0082] The polar stereographic projection method is used to draw the X-ray diffraction pole figures of the diffraction signals of the diffraction crystal planes at all rotation angles of the above-mentioned sample to be tested. At the same time, the standard diffraction pole figures of the single crystal material corresponding to the sample to be tested are compared to determine the crystal plane indices at different poles, which are used as the preset crystal plane indices of the sample to be tested.

[0083] Furthermore, a linear regression equation is constructed based on the preset crystal plane index and diffraction vector corresponding to at least one rotation angle; based on the linear regression equation, a transformation matrix from the sample coordinate system to the crystal coordinate system is determined as the crystal orientation of the sample to be measured.

[0084] The diffraction vector e in the sample coordinate system obtained in step S140 is recorded as (X, Y, Z), and the preset crystal plane index is (h1, k1, l1), where the crystal plane index in the X-axis direction of the sample coordinate system is (u, v, w), the crystal direction index in the Y-axis direction is (r, s, t), and the crystal direction index in the Z-axis direction is (h, k, l). Based on this, the following regression equation (4) is established:

[0085] (4)

[0086] Where (X1, Y1, Z1), (X2, Y2, Z2), and (X3, Y3, Z3) represent the diffraction vectors at different rotation angles, and (h1, k1, l1), (h2, k2, l2), and (h3, k3, l3) represent the crystal plane indices at the corresponding rotation angles of (X1, Y1, Z1), (X2, Y2, Z2), and (X3, Y3, Z3). The crystal coordinate system is fixed to the internal grain of the sample to be measured, with the three crystal axes

[100] ,

[010] , and

[001] of the grain as the X-axis, Y-axis, and Z-axis.

[0087] The above formula (4) uses the diffraction vectors and crystal plane indices corresponding to three rotation angles. It is only used as an example. In the embodiment of the present application, a regression equation can be established using more than three groups of diffraction vectors and crystal plane indices of different crystal planes to determine the transformation relationship between the sample coordinate system and the crystal coordinate system, and the following formula (5) is obtained as the crystal orientation of the sample to be measured.

[0088] (5)

[0089] Where S represents the sample coordinate system, C represents the crystal coordinate system, G represents the matrix of the transformation relationship between the sample coordinate system and the crystal coordinate system, and g is the inverse matrix of G.

[0090] In summary, the crystal orientation detection method provided by the present application first uses the rays generated by the synchrotron radiation source to irradiate the test area of ​​the sample to be tested. Due to the high penetrating power of the rays generated by the synchrotron radiation source, the internal structure of the sample to be tested diffracts the rays, providing a collectible basis for crystal orientation testing. Furthermore, the crystal plane index of the crystal plane of the preset crystal sample at different rotation angles, as well as the vector information of the diffracted light of the crystal plane in the sample coordinate system that can be measured, is used to deduce the conversion relationship between the crystal coordinate system and the sample coordinate system, thereby determining the crystal orientation of the crystal sample.

[0091] In addition, by rotating the sample to be tested, as many diffraction signals of different crystal planes of the sample to be tested as possible can be collected to reduce the blind spots of crystal plane detection of the sample to be tested. Furthermore, by combining the crystal plane indices and diffraction vectors of multiple crystal planes, the conversion relationship between the sample coordinate system and the crystal coordinate system is jointly determined to improve the accuracy of crystal orientation testing.

[0092] Next, the practical application of a crystal orientation detection method provided by the present application is exemplified in combination with the following embodiments.

[0093] A synchrotron radiation source is used to generate a monochromatic surface spot, which is perpendicular to the surface of the sample to be tested and illuminates the test area. The detector is placed perpendicular to the synchrotron radiation source and behind the sample to be tested to collect the projected light and diffracted light after being projected and diffracted by the test area. At the same time, the sample to be tested is controlled to rotate along the longitudinal axis Z of the sample coordinate system within a preset rotation angle range, such as -45° to 45°, with a rotation interval of 0.1°, and the rotation angle of the sample to be tested is recorded after each rotation. , as well as the projected light spot position and diffracted light spot position collected by the detector corresponding to each rotation angle.

[0094] Based on the hardware structure of the crystal orientation system, the laboratory coordinate system, sample coordinate system and crystal coordinate system are established. Figure 3 , where the positive direction of the X-axis of the laboratory coordinate system is the direction of ray incidence, and the Z-axis is the direction perpendicular to the X-axis and pointing vertically upward; the sample coordinate system is consistent with the laboratory coordinate system when the rotation angle is 0; the crystal coordinate system is fixed to the grain inside the sample, with the three crystal axes

[100] ,

[010] , and

[001] of the grain as the X-axis, Y-axis, and Z-axis.

[0095] The projected light spot position and diffracted light spot position (y det ,z det ), and the pixel size of the pixel array in the detector, determine the diffraction radius t in the laboratory coordinate system. Specifically, in the experiment of this example, multiple rotations can be performed to determine the diffraction radius t corresponding to multiple rotation angles, as shown in Table 1 below.

[0096] Table 1 Diffraction radius corresponding to sample rotation angle

[0097]

[0098] Furthermore, by comparing the material standard card, the diffraction angle 2θ of the crystal plane corresponding to each rotation angle is determined, and then the geometric relationship between the diffraction radius and the diffraction angle is combined to determine the geophysical distance corresponding to the rotation angle during the experiment. Using the geophysical distance, the direction vector of the diffracted light is determined. . The direction vector of the diffracted light is normalized by , and the incident light direction vector , together determine the direction vector of the diffraction vector in the laboratory coordinate system , i.e. the first diffraction vector. Further, the rotation angle corresponding to the first diffraction vector is used , determine the first diffraction vector in the laboratory coordinate system, and the diffraction vector e after conversion to the sample coordinate system. Based on this, determine the diffraction light spot coordinates and diffraction vectors corresponding to each rotation angle in Table 1, see Table 2.

[0099] Table 2 Diffraction vector calculation results

[0100]

[0101] The polar projection method is used to draw X-ray diffraction pole figures for all diffraction crystal planes, and the standard diffraction pole figures of single crystal materials are compared to determine the crystal plane indices at different poles. Linear regression equations are established in the sample coordinate system and the crystal coordinate system respectively to determine the conversion matrix from the sample coordinate system to the crystal coordinate system, thereby completing the determination of the crystal orientation. The conversion matrix between the sample coordinate system and the crystal coordinate system corresponding to this example that represents the crystal curve is .

[0102] A crystal orientation detection method provided by an embodiment of the present application is described above. The following describes an apparatus for executing the above crystal orientation detection method.

[0103] See also Figure 4 , Figure 4 This is a schematic diagram of the structure of a crystal orientation detection device provided in an embodiment of the present application. Figure 4 As shown, the crystal orientation detection device is applied to a controller in a crystal orientation detection system, comprising:

[0104] An irradiation control unit 100 is used to control the radiation generated by the synchrotron radiation source to vertically irradiate the area to be tested of the sample to be tested;

[0105] A position acquisition unit 200 is configured to control the sample to be tested to rotate at preset intervals, determine the rotation angle of the sample to be tested after rotation, and obtain the projected light and diffracted light of the test area at each rotation angle, the corresponding transmitted light spot position and diffracted light spot position, respectively, collected by the detector. The rotation angle is the deviation angle of the sample to be tested relative to the initial angle.

[0106] a diffraction vector determining unit 300, configured to determine, based on the transmitted light spot position and the diffracted light spot position, a diffraction vector of the diffracted light corresponding to each of the rotation angles in a sample coordinate system, wherein the sample coordinate system is a three-dimensional coordinate system constructed with the center of the area to be measured as the origin;

[0107] The crystal orientation determination unit 400 is used to determine an expression representing the conversion relationship between the sample coordinate system and the crystal coordinate system based on a preset crystal plane index corresponding to at least one of the rotation angles and the diffraction vector, as the crystal orientation of the sample to be measured.

[0108] In a possible implementation, the diffraction vector determining unit includes:

[0109] a diffraction radius determination subunit, configured to determine the diffraction radius of the diffracted light in a laboratory coordinate system based on the transmitted light spot position and the diffracted light spot position, wherein the laboratory coordinate system is a three-dimensional coordinate system constructed with the transmitted light spot position as an origin and having the same direction as the sample coordinate system;

[0110] a diffraction angle acquisition subunit, configured to acquire the diffraction angle of the crystal plane illuminated by the rotation angle;

[0111] a first vector determining subunit, configured to determine a first diffraction vector of the diffracted light in the laboratory coordinate system based on the diffraction angle and the diffraction radius;

[0112] The vector conversion subunit is used to determine the diffraction vector of the diffracted light corresponding to the rotation angle in the sample coordinate system according to the conversion relationship between the laboratory coordinate system and the sample coordinate system.

[0113] In a possible implementation, the crystal orientation determining unit includes:

[0114] an equation construction subunit, configured to construct a linear regression equation based on a preset crystal plane index corresponding to at least one of the rotation angles and the diffraction vector;

[0115] The orientation determination subunit is used to determine the transformation matrix of the sample coordinate system to the crystal coordinate system based on the linear regression equation as the crystal orientation of the sample to be measured.

[0116] In one possible implementation, the process of the crystal orientation determination unit presetting the crystal plane index includes: determining the diffraction pole figure of the sample to be tested based on the diffraction vector corresponding to at least one of the rotation angles; obtaining the standard diffraction pole figure corresponding to the crystal type of the sample to be tested; and determining the crystal plane index of different crystal planes of the sample to be tested based on the difference between the diffraction pole figure and the standard diffraction pole figure.

[0117] In summary, the present application first uses the rays generated by the synchrotron radiation source to irradiate the test area of ​​the sample to be tested. Due to the high penetrating power of the rays generated by the synchrotron radiation source, the internal structure of the sample to be tested diffracts the rays, providing a collectible basis for crystal orientation testing. Furthermore, the crystal plane index of the crystal plane of the preset crystal sample at different rotation angles, and the vector information of the diffracted light of the crystal plane in the sample coordinate system that can be measured, are used to deduce the conversion relationship between the crystal coordinate system and the sample coordinate system, thereby determining the crystal orientation of the crystal sample.

[0118] In addition, by rotating the sample to be tested, as many diffraction signals of different crystal planes of the sample to be tested as possible can be collected to reduce the blind spots of crystal plane detection of the sample to be tested. Furthermore, by combining the crystal plane indices and diffraction vectors of multiple crystal planes, the conversion relationship between the sample coordinate system and the crystal coordinate system is jointly determined to improve the accuracy of crystal orientation testing.

[0119] A computer storage medium is also provided in an embodiment of the present application. The storage medium carries one or more computer programs. When the one or more computer programs are executed by an electronic device, the electronic device can implement any crystal orientation detection method provided in the embodiment of the present application.

[0120] It should also be noted that the device embodiments described above are merely illustrative, wherein the units described as separate components may or may not be physically separate, and the components displayed as units may or may not be physical units, that is, they may be located in one place, or they may be distributed across multiple network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the present embodiment. In addition, in the drawings of the device embodiments provided in this application, the connection relationship between the modules indicates that there is a communication connection between them, which can be specifically implemented as one or more communication buses or signal lines.

[0121] Through the description of the above embodiments, those skilled in the art can clearly understand that the present application can be implemented by means of software plus necessary general hardware, and of course can also be implemented by special hardware including application-specific integrated circuits, special CPUs, special memories, special components, etc. In general, all functions performed by computer programs can be easily implemented with corresponding hardware, and the specific hardware structures used to implement the same function can also be diverse, such as analog circuits, digital circuits or special circuits, etc. However, for the present application, software program implementation is a better implementation method in most cases. Based on this understanding, the technical solution of the present application is essentially or the part that contributes to the prior art can be embodied in the form of a software product, which is stored in a readable storage medium, such as a computer's floppy disk, USB flash drive, mobile hard disk, ROM, RAM, magnetic disk or optical disk, etc., and includes a number of instructions to enable a computer device (which can be a personal computer, training equipment, or network equipment, etc.) to execute the methods described in each embodiment of the present application.

[0122] In the above embodiments, all or part of the embodiments may be implemented by software, hardware, firmware, or any combination thereof. When implemented by software, all or part of the embodiments may be implemented in the form of a computer program product.

[0123] The computer program product includes one or more computer instructions. When the computer program instructions are loaded and executed on a computer, the process or function described in the embodiment of the present application is generated in whole or in part. The computer can be a general-purpose computer, a special-purpose computer, a computer network, or other programmable devices. The computer instructions can be stored in a computer-readable storage medium, or transmitted from one computer-readable storage medium to another computer-readable storage medium. For example, the computer instructions can be transmitted from a website, a computer, a training device or a data center by wired (e.g., coaxial cable, optical fiber, digital subscriber line (DSL)) or wireless (e.g., infrared, wireless, microwave, etc.) mode to another website, a computer, a training device or a data center. The computer-readable storage medium can be any available medium that a computer can store or a data storage device such as a training device, a data center, etc. that includes one or more available media integrations. The available medium can be a magnetic medium, (e.g., a floppy disk, a hard disk, a tape), an optical medium (e.g., a DVD), or a semiconductor medium (e.g., a solid-state drive (SSD)).

Claims

1. A method for detecting crystal orientation, characterized in that: A controller for a crystal orientation detection system, wherein the crystal orientation detection system further comprises at least: a synchrotron radiation source and a detector respectively disposed on both sides of a sample to be tested; and the crystal orientation detection method comprises: Controlling the rays generated by the synchrotron radiation source to vertically illuminate the area to be tested of the sample to be tested; Controlling the sample to be tested to rotate at preset intervals, determining the rotation angle of the sample to be tested after the rotation, and obtaining the projected light and diffracted light of the test area to the ray at each rotation angle, as collected by the detector, and the corresponding transmitted light spot position and diffracted light spot position, respectively, where the rotation angle is the deviation angle of the sample to be tested relative to the initial angle; Based on the position of the transmitted light spot and the position of the diffracted light spot, determining the diffraction vector of the diffracted light corresponding to each of the rotation angles in a sample coordinate system, wherein the sample coordinate system is a three-dimensional coordinate system constructed with the center of the area to be measured as the origin; An expression characterizing the conversion relationship between the sample coordinate system and the crystal coordinate system is determined according to a preset crystal plane index corresponding to at least one of the rotation angles and the diffraction vector as the crystal orientation of the sample to be measured.

2. The crystal orientation detection method according to claim 1, characterized in that: The determining, based on the transmitted light spot position and the diffracted light spot position, a diffraction vector of the diffracted light corresponding to each of the rotation angles in the sample coordinate system comprises: Performing vector processing on the transmitted light spot position and the diffracted light spot position corresponding to each rotation angle to obtain a diffraction vector of the diffracted light corresponding to each rotation angle in the sample coordinate system, the vector processing comprising: Determining a diffraction radius of the diffracted light in a laboratory coordinate system based on the transmitted light spot position and the diffracted light spot position, wherein the laboratory coordinate system is a three-dimensional coordinate system constructed with the transmitted light spot position as an origin and having the same direction as the sample coordinate system; Obtaining the diffraction angle of the crystal plane illuminated by the rotation angle; determining a first diffraction vector of the diffracted light in the laboratory coordinate system based on the diffraction angle and the diffraction radius; The diffraction vector of the diffracted light corresponding to the rotation angle in the sample coordinate system is determined according to the conversion relationship between the laboratory coordinate system and the sample coordinate system.

3. The crystal orientation detection method according to claim 1, characterized in that: The step of determining, based on the preset crystal plane index corresponding to at least one of the rotation angles and the diffraction vector, an expression representing the conversion relationship between the sample coordinate system and the crystal coordinate system as the crystal orientation of the sample to be measured, comprises: Constructing a linear regression equation according to the preset crystal plane index corresponding to at least one of the rotation angles and the diffraction vector; Based on the linear regression equation, a transformation matrix from the sample coordinate system to the crystal coordinate system is determined as the crystal orientation of the sample to be measured.

4. The crystal orientation detection method according to any one of claims 1 to 3, characterized in that: The process of presetting the crystal plane index includes: Determining the diffraction pole figure of the sample to be measured based on the diffraction vector corresponding to at least one of the rotation angles; Obtaining a standard diffraction pole figure corresponding to the crystal type of the sample to be tested; The crystal plane indices of different crystal planes of the sample to be measured are determined according to the difference between the diffraction pole figure and the standard diffraction pole figure.

5. A crystal orientation detection system, characterized in that: include: A controller, and a synchrotron radiation source and a detector respectively arranged on both sides of the sample to be measured, wherein the sample to be measured, the synchrotron radiation source and the detector are in the same horizontal plane; The synchrotron radiation light source is used to generate radiation to vertically illuminate the area to be tested of the sample to be tested; The detector is used to collect the position of the transmitted light spot of the transmitted light and the position of the diffracted light spot of the diffracted light of the area to be measured; The controller is used to implement the crystal orientation detection method according to any one of claims 1 to 4.

6. A crystal orientation detection device, characterized in that: The controller used in the crystal orientation detection system according to claim 5, wherein the crystal orientation detection device comprises: An irradiation control unit is used to control the radiation generated by the synchrotron radiation source to vertically irradiate the area to be tested of the sample to be tested; a position acquisition unit, configured to control the sample to be tested to rotate at preset intervals, determine the rotation angle of the sample to be tested after the rotation, and obtain the projected light and diffracted light of the test area to the ray at each rotation angle, as collected by the detector, and the corresponding transmitted light spot position and diffracted light spot position, respectively, where the rotation angle is the deviation angle of the sample to be tested relative to the initial angle; a diffraction vector determining unit, configured to determine, based on the transmitted light spot position and the diffracted light spot position, a diffraction vector of the diffracted light corresponding to each of the rotation angles in a sample coordinate system, wherein the sample coordinate system is a three-dimensional coordinate system constructed with the center of the area to be measured as the origin; The crystal orientation determination unit is used to determine an expression characterizing the conversion relationship between the sample coordinate system and the crystal coordinate system based on a preset crystal plane index corresponding to at least one of the rotation angles and the diffraction vector, as the crystal orientation of the sample to be measured.

7. The crystal orientation detection device according to claim 6, characterized in that: The diffraction vector determining unit includes: a diffraction radius determination subunit, configured to determine the diffraction radius of the diffracted light in a laboratory coordinate system based on the transmitted light spot position and the diffracted light spot position, wherein the laboratory coordinate system is a three-dimensional coordinate system constructed with the transmitted light spot position as an origin and having the same direction as the sample coordinate system; a diffraction angle acquisition subunit, configured to acquire the diffraction angle of the crystal plane illuminated by the rotation angle; a first vector determining subunit, configured to determine a first diffraction vector of the diffracted light in the laboratory coordinate system based on the diffraction angle and the diffraction radius; The vector conversion subunit is used to determine the diffraction vector of the diffracted light corresponding to the rotation angle in the sample coordinate system according to the conversion relationship between the laboratory coordinate system and the sample coordinate system.

8. The crystal orientation detection device according to claim 6, characterized in that: The crystal orientation determining unit comprises: an equation construction subunit, configured to construct a linear regression equation based on a preset crystal plane index corresponding to at least one of the rotation angles and the diffraction vector; The orientation determination subunit is used to determine the transformation matrix of the sample coordinate system to the crystal coordinate system based on the linear regression equation as the crystal orientation of the sample to be measured.

9. The crystal orientation detection device according to any one of claims 6 to 8, characterized in that: The process of presetting the crystal plane index by the crystal orientation determination unit includes: determining the diffraction pole figure of the sample to be tested based on the diffraction vector corresponding to at least one of the rotation angles; obtaining the standard diffraction pole figure corresponding to the crystal type of the sample to be tested; and determining the crystal plane index of different crystal planes of the sample to be tested based on the difference between the diffraction pole figure and the standard diffraction pole figure.

10. A computer storage medium, characterized in that The storage medium carries one or more computer programs, and when the one or more computer programs are executed by an electronic device, the electronic device can implement the crystal orientation detection method according to any one of claims 1 to 4.

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