Lightning and HIRF system-level comprehensive effect test device and method

Abstract

The invention relates to the technical field of electromagnetic environment effect tests, and discloses a thunder and lightning and HIRF (High Impact Radio Frequency) system-level comprehensive effect test device and a thunder and lightning and HIRF system-level comprehensive effect test method. Comprising an anechoic chamber, an EUT measuring instrument, a line impedance stabilization network, a transient signal generator, an oscilloscope, a lightning injection probe, a lightning current monitoring probe, a lightning voltage detection ring, a radiation signal generator, a radio frequency amplifier, a receiver, a photoelectric converter near end, a synchronous position adjusting assembly, a photoelectric converter far end, an antenna and an electric field sensor. The system-level thunder and HIRF comprehensive effect test under different polarization modes, HIRF environments at different irradiation angles and various thunder and lightning waveforms can be supported, the problem that thunder and HIRF comprehensive protection performance of an electronic and electrical system of an airplane is unknown can be solved, and potential hidden dangers of safe flight of the airplane in the thunder and HIRF environments can be reduced; and through the synchronous position adjusting assembly, synchronous adjustment of the transmitting antenna and the electric field sensor can be realized.

Description

Technical Field

[0001] The present invention relates to the technical field of electromagnetic environment effect testing, and more particularly to a lightning and HIRF system-level comprehensive effect testing device and method. Background Art

[0002] With the rapid development of avionics technology, aircraft electrical and electronic systems are becoming increasingly sensitive to electromagnetic environments. Lightning and high-frequency radiation (HIRF) are the primary strong electromagnetic environments encountered by aircraft during flight, posing a serious threat to the performance and safety of aircraft electrical and electronic systems. Currently, research on the combined effects of lightning and HIRF is limited, and there is a lack of testing methods for their combined protection performance. Therefore, it is crucial to construct a system-level lightning and HIRF combined effects test device and propose a new combined effects testing method to support the evaluation of combined lightning and HIRF protection performance.

[0003] Currently, patents related to indirect effects of lightning and HIRF mainly focus on separate testing of lightning or HIRF, with fewer focusing on comprehensive testing methods.

[0004] For example, invention patent application number 1, "Test device and method for indirect effects of lightning on aircraft and HIRF conducted sensitivity" (patent publication number: CN119165283A), and invention patent application number 2, "A comprehensive test device and test method for indirect effects of lightning on aircraft and HIRF radiation sensitivity at the system level" (patent publication number: CN119024087A), are based on a reverberation chamber environment. However, due to the random polarization direction and isotropy of the irradiation angle in the reverberation chamber HIRF environment, this method cannot accurately analyze and evaluate the combined lightning and HIRF effects of equipment and systems under different polarization directions and irradiation angles. In addition, the high field strength outside the reverberation chamber has a significant impact on the lightning indirect effects test equipment. The lightning indirect effects equipment needs to be placed outside the reverberation chamber, and the lightning signal needs to be injected through a long cable, making it difficult to inject a narrow pulse lightning signal with a fast rising edge. This results in a limited waveform for the lightning indirect effects test. Summary of the Invention

[0005] The purpose of the present invention is to provide a lightning and HIRF system-level comprehensive effect test device and method in order to solve the above problems.

[0006] The present invention provides a lightning and HIRF system-level comprehensive effect test device, comprising:

[0007] Anechoic chamber, which is used to provide a HIRF radiation sensitivity test environment for the electronic and electrical systems under test;

[0008] A test monitoring module includes an EUT measuring instrument and a line impedance stabilization network located in the anechoic chamber, wherein the EUT measuring instrument and the line impedance stabilization network are both electrically connected to a test cable on the electronic and electrical system under test;

[0009] A lightning indirect effect test module, comprising a transient signal generator, an oscilloscope, a lightning injection probe, a lightning current monitoring probe, and a lightning voltage detection ring, all located in an anechoic chamber. The lightning injection probe and lightning current monitoring probe are sequentially located on the cable under test.

[0010] The HIRF sensitivity test module includes a radiation signal generator, a radio frequency amplifier, a receiver, a near-end photoelectric converter located outside the anechoic chamber, a synchronous position adjustment component located inside the anechoic chamber, a far-end photoelectric converter, and an antenna and an electric field sensor located on the synchronous position adjustment component. The synchronous position adjustment component is used to adjust the three-dimensional coordinate data of the antenna in the anechoic chamber and drive the electric field sensor to move synchronously with the antenna.

[0011] The integrated control terminal, the accompanying test monitoring module, the lightning indirect effect test module and the HIRF sensitivity test module are all electrically connected to the integrated control terminal.

[0012] As a further optimization solution of the present invention, the antenna, the radio frequency amplifier and the radiation signal generator are electrically connected in sequence, and the radiation signal generator is used to output a set HIRF radiation sensitivity test signal to the radio frequency amplifier;

[0013] The radio frequency amplifier is used to amplify the input HIRF radiation sensitivity test signal and transmit it to the antenna;

[0014] The antenna is used to radiate electromagnetic energy to the electronic and electrical system under test.

[0015] As a further optimization solution of the present invention, the electric field sensor is electrically connected to the far end of the photoelectric converter, and the near end of the photoelectric converter is electrically connected to the receiver, and the far end of the photoelectric converter and the near end of the photoelectric converter are connected by an optical fiber. The electric field sensor is used to measure the field strength data at a set position near the electronic and electrical system under test;

[0016] The photoelectric converter is used at the far end to convert the electrical signal into an optical signal;

[0017] The proximal end of the photoelectric converter is used to convert the optical signal into an electrical signal;

[0018] The receiver is used to measure the calibration field strength data received by the electric field sensor and the field strength data monitored during the test.

[0019] As a further optimization solution of the present invention, the lightning injection probe is electrically connected to the transient signal generator, and the lightning current monitoring probe and the lightning voltage detection ring are both electrically connected to the oscilloscope;

[0020] The lightning voltage detection ring is used to detect the lightning voltage injection signal in the tested cable;

[0021] The transient signal generator is used to generate a set test level and adjust the waveform parameters of the test level;

[0022] The lightning injection probe is used to couple and inject the test level into the tested cable;

[0023] The lightning current monitoring probe is used to monitor the lightning current injection signal in the tested cable.

[0024] As a further optimization scheme of the present invention, the synchronous position adjustment assembly includes a bracket group, a motor 1 fixedly connected to the bracket group, a screw rod 1 and a limit slide symmetrically connected to the bracket group, a limit slide rail connected between the screw rod 1 and the limit slide rail, a motor 2 fixedly connected to the limit slide rail, a screw rod 2 movably connected to the limit slide rail, a limit slide seat slidably connected to the limit slide rail, a motor 3 and a limit column fixedly connected to the limit slide rail, a screw rod 3 movably connected to the limit slide, a sliding support plate slidably connected to the limit column, a fixed support rod fixedly connected to the sliding support plate, and a fixed support plate fixedly connected to the other end of the fixed support rod, the screw rod 1, screw rod 2, and screw rod 3 are respectively connected to the output shaft ends of the motor 1, motor 2, and motor 3, the limit slide rail, the limit slide and the sliding support plate are respectively threadedly connected to the screw rod 1, screw rod 2, and screw rod 3, the electric field sensor is connected to the fixed support plate, and the fixed support plate is provided with an adapter hole for the limit column and the screw rod 3 to pass through.

[0025] As a further optimization solution of the present invention, an irradiation angle adjustment mechanism is connected between the sliding support plate and the antenna, and the irradiation angle adjustment mechanism is used to adjust the irradiation angle of the antenna.

[0026] As a further optimization scheme of the present invention, the irradiation angle adjustment mechanism includes a rotating shaft movably connected to the sliding support plate, a ring gear fixedly connected to the outer wall of the rotating shaft, a motor four fixedly connected to the sliding support plate, a gear connected to the output shaft end of the motor four, a gear fixedly connected to the rotating shaft, a motor five fixedly connected to the articulated frame, and a hinged plate hinged to the articulated frame, the hinged plate is fixedly connected to the antenna, the ring gear is engaged with the gear, and the output shaft end of the motor five is fixedly connected to the articulated plate.

[0027] As a further optimization scheme of the present invention, a telescopic isolation mechanism is connected between the sliding support plate and the limiting slide, between motor three and the radio wave darkroom, between the antenna and the radio wave darkroom, and between the electric field sensor and the far end of the photoelectric converter. The telescopic isolation mechanism includes a telescopic isolation sleeve and a through hole connected to the internal space of the telescopic isolation sleeve. The through hole is provided on the limiting slide or the radio wave darkroom or the far end of the photoelectric converter.

[0028] As a further optimization scheme of the present invention, a pressure regulating mechanism is connected between the motor three and the radio wave darkroom, and the pressure regulating mechanism includes a telescopic isolation sleeve two, a plurality of air holes one provided on the telescopic isolation sleeve two, a plurality of air holes two provided on the telescopic isolation sleeve one, and an air pressure regulator provided outside the radio wave darkroom, the air holes one and the air holes two do not overlap, the telescopic isolation sleeve one, the telescopic isolation sleeve two and the inner wall of the radio wave darkroom are all provided with absorbing materials, the telescopic isolation sleeve two is provided on the outside of the telescopic isolation sleeve one, and the air pressure regulator is used to obtain and adjust the air pressure parameters inside the radio wave darkroom.

[0029] A lightning and HIRF system-level comprehensive effect test method, using the lightning and HIRF system-level comprehensive effect test device as described above, includes the following steps:

[0030] Step S1, building an anechoic chamber, a test monitoring module, a lightning indirect effect test module, and a HIRF sensitivity test module;

[0031] Step S2: Performing a HIRF radiation sensitivity test field strength calibration in the range of 100 MHz to 18 GHz, calibrating the transient signal generator at a specified test level, and recording the voltage waveform when the calibration loop is open and the current waveform when the calibration loop is short-circuited;

[0032] Step S3: Power on the electronic and electrical system under test, select an operating mode, and keep the electronic and electrical system under test in a stable operating state;

[0033] Step S4: For an electrical and electronic system under test that cannot be fully covered by the overall HIRF irradiation, the 3dB beamwidth of the antenna is calculated based on the size of the electrical and electronic system under test and the HIRF test distance. The displacement step of the antenna is calculated based on the 3dB beamwidth of the antenna. A single-antenna equivalent test is performed, and a synchronous position adjustment component is used to control the single displacement of the antenna to not exceed the 3dB beamwidth.

[0034] Step S5: Set the frequency, polarization mode, and irradiation angle of the HIRF radiation sensitivity test and start the test. Simultaneously, start the transient signal generator to inject a lightning test level into the cable under test during the dwell time at each HIRF test frequency point.

[0035] For the single return stroke test, at least ten transient signals shall be applied, and the longest interval between the applied single return stroke transient signals shall not exceed one minute;

[0036] For the multiple return stroke test, at least ten multiple return stroke transient signals are applied, and the maximum interval between the multiple return stroke transient signals does not exceed five minutes;

[0037] For the multiple pulse set test, a multiple pulse set was applied every three seconds for at least five minutes;

[0038] Step S6, change the transient signal generator output polarity, repeat step S5;

[0039] Step S7, for each tested cable, repeat steps S5 to S6;

[0040] Step S8, adjust the position of the antenna, the electric field sensor moves the same, repeat steps S4 to S7;

[0041] Step S9, change the antenna's radiation angle, repeat steps S4 to S8;

[0042] Step S10, change the polarization of the antenna, repeat steps S4 to S9;

[0043] Step S11, changing the frequency of the HIRF sensitivity test, and repeating steps S3 to S10 until the termination frequency of the HIRF test is reached;

[0044] Step S12: Change the operating mode of the electronic and electrical system under test, and repeat steps S3 to S11 until all operating modes of the electronic and electrical system under test are reached.

[0045] The beneficial effects of the present invention are as follows: the present invention can support system-level lightning and HIRF comprehensive effect testing in HIRF environments under different polarization modes and irradiation angles and various lightning waveforms, can solve the unknown problem of the comprehensive lightning and HIRF protection performance of aircraft electronic and electrical systems, and can reduce the potential hidden dangers to the safe flight of aircraft in lightning and HIRF environments. Through the synchronous position adjustment component, the present invention can achieve synchronous adjustment of the transmitting antenna and the electric field sensor. BRIEF DESCRIPTION OF THE DRAWINGS

[0046] Figure 1 It is a schematic diagram of the overall structure of the present invention;

[0047] Figure 2 The present invention Figure 1 A partial cross-sectional view of

[0048] Figure 3 This is a flowchart of the steps of the lightning and HIRF system-level comprehensive effect test method of the present invention;

[0049] Figure 4 It is a structural schematic diagram of the synchronous position adjustment assembly of the present invention;

[0050] Figure 5 The present invention Figure 2 A magnified view of point A in FIG;

[0051] Figure 6 The present invention Figure 2 Magnified view at B in FIG;

[0052] Figure 7 The present invention Figure 4 Magnified view of point C in FIG.

[0053] In the figure: 1. Anechoic chamber; 21. Radiation signal generator; 22. RF amplifier; 23. Antenna; 24. Synchronous position adjustment assembly; 2401. Bracket assembly; 2402. Motor 1; 2403. Screw 1; 2404. Limiting slide; 2405. Limiting slide rail; 2406. Motor 2; 2407. Screw 2; 2408. Limiting slide; 2409. Motor 3; 2410. Limiting column; 2411. Screw 3; 2412. Sliding support plate; 2413. Fixed support rod; 2414. Fixed support plate; 25. Receiver; 26. Photoelectric converter proximal end; 27. Photoelectric converter Remote end; 28. Electric field sensor; 31. Transient signal generator; 32. Oscilloscope; 33. Lightning injection probe; 34. Lightning current monitoring probe; 35. Lightning voltage detection ring; 41. EUT measuring instrument; 42. Line impedance stabilization network; 5. Telescopic isolation mechanism; 501. Perforation; 502. Telescopic isolation sleeve one; 6. Pressure regulating mechanism; 601. Telescopic isolation sleeve two; 602. Air hole one; 7. Irradiation angle adjustment mechanism; 701. Rotating shaft; 702. Ring gear; 703. Motor four; 704. Gear; 705. Articulated frame; 706. Motor five; 707. Articulated plate. DETAILED DESCRIPTION

[0054] The subject matter described herein will now be discussed with reference to example embodiments. It should be understood that these embodiments are discussed solely to enable those skilled in the art to better understand and implement the subject matter described herein. Additionally, features described with respect to some examples may also be combined in other examples.

[0055] like Figure 1 and Figure 2 As shown, a lightning and HIRF system-level comprehensive effect test device includes:

[0056] Anechoic chamber 1: Anechoic chamber 1 is used to provide a HIRF radiation sensitivity test environment for the electronic and electrical systems under test;

[0057] A test monitoring module includes an EUT measuring instrument 41 and a line impedance stabilization network 42 provided in the anechoic chamber 1. The EUT measuring instrument 41 and the line impedance stabilization network 42 are both electrically connected to a test cable on the electronic and electrical system under test.

[0058] A lightning indirect effect test module includes a transient signal generator 31, an oscilloscope 32, a lightning injection probe 33, a lightning current monitoring probe 34, and a lightning voltage detection ring 35, which are arranged in the anechoic chamber 1. The lightning injection probe 33 and the lightning current monitoring probe 34 are sequentially arranged on the test cable.

[0059] The HIRF sensitivity test module includes a radiation signal generator 21, a radio frequency amplifier 22, a receiver 25, and a near-end photoelectric converter 26, which are located outside the anechoic chamber 1; a synchronous position adjustment component 24, a far-end photoelectric converter 27, and an antenna 23 and an electric field sensor 28, which are located on the synchronous position adjustment component 24. The synchronous position adjustment component 24 is used to adjust the three-dimensional coordinate data of the antenna 23 in the anechoic chamber 1 and drive the electric field sensor 28 to move synchronously with the antenna 23.

[0060] The integrated control terminal, the accompanying test monitoring module, the lightning indirect effect test module and the HIRF sensitivity test module are all electrically connected to the integrated control terminal.

[0061] The antenna 23, the radio frequency amplifier 22 and the radiation signal generator 21 are electrically connected in sequence, and the radiation signal generator 21 is used to output a set HIRF radiation sensitivity test signal to the radio frequency amplifier 22;

[0062] The radio frequency amplifier 22 is used to amplify the input HIRF radiation sensitivity test signal and transmit it to the antenna 23;

[0063] The antenna 23 is used to radiate electromagnetic energy to the electronic and electrical system under test.

[0064] The electric field sensor 28 is electrically connected to the far end 27 of the photoelectric converter, and the near end 26 of the photoelectric converter is electrically connected to the receiver 25. The far end 27 of the photoelectric converter and the near end 26 of the photoelectric converter are connected by an optical fiber. The electric field sensor 28 is used to measure the field strength data at a set position near the electronic and electrical system under test.

[0065] The photoelectric converter distal end 27 is used to convert the electrical signal into an optical signal;

[0066] The photoelectric converter proximal end 26 is used to convert the optical signal into an electrical signal;

[0067] The receiver 25 is used to measure the calibration field strength data received by the electric field sensor 28 and the field strength data monitored during the test.

[0068] The lightning injection probe 33 is electrically connected to the transient signal generator 31 , and the lightning current monitoring probe 34 and the lightning voltage detection ring 35 are both electrically connected to the oscilloscope 32 ;

[0069] The lightning voltage detection ring 35 is used to detect the lightning voltage injection signal in the tested cable;

[0070] The transient signal generator 31 is used to generate a set test level and adjust the waveform parameters of the test level;

[0071] The lightning injection probe 33 is used to couple and inject the test level into the cable under test;

[0072] The lightning current monitoring probe 34 is used to monitor the lightning current injection signal in the tested cable.

[0073] It should be noted that if Figure 3 As shown in the figure, when conducting a lightning and HIRF system-level comprehensive effect test on the electronic and electrical system under test, the following steps are specifically included:

[0074] Step S1, building an anechoic chamber 1, a test monitoring module, a lightning indirect effect test module, and a HIRF sensitivity test module;

[0075] Step S2: Perform HIRF radiation sensitivity test field strength calibration in the range of 100 MHz to 18 GHz, calibrate the transient signal generator 31 at a specified test level, and record the voltage waveform when the calibration loop is open and the current waveform when it is short-circuited;

[0076] Step S3: Power on the electronic and electrical system under test, select an operating mode, and keep the electronic and electrical system under test in a stable operating state;

[0077] Step S4: For an electronic and electrical system under test that cannot be fully covered by the overall HIRF irradiation, the 3dB beamwidth of the antenna 23 is calculated based on the size of the electronic and electrical system under test and the HIRF test distance. The displacement step of the antenna 23 is calculated based on the 3dB beamwidth of the antenna 23. An equivalent test is performed using a single antenna 23, and the single displacement of the antenna 23 is controlled by the synchronous position adjustment component 24 to not exceed the 3dB beamwidth.

[0078] Step S5: Set the frequency, polarization mode, and irradiation angle of the HIRF radiation sensitivity test and start the test. Simultaneously, start the transient signal generator 31 to inject a lightning test level into the cable under test during the dwell time at each HIRF test frequency point.

[0079] For the single return stroke test, at least ten transient signals shall be applied, and the longest interval between the applied single return stroke transient signals shall not exceed one minute;

[0080] For the multiple return stroke test, at least ten multiple return stroke transient signals are applied, and the maximum interval between the multiple return stroke transient signals does not exceed five minutes;

[0081] For the multiple pulse set test, a multiple pulse set was applied every three seconds for at least five minutes;

[0082] Step S6, changing the output polarity of the transient signal generator 31, repeating step S5;

[0083] Step S7, for each tested cable, repeat steps S5 to S6;

[0084] Step S8, adjust the position of the antenna 23, the electric field sensor 28 is moved in the same manner, and steps S4 to S7 are repeated;

[0085] Step S9, changing the radiation angle of the antenna 23, repeating steps S4 to S8;

[0086] Step S10, changing the polarization of the antenna 23, repeating steps S4 to S9;

[0087] Step S11, changing the frequency of the HIRF sensitivity test, and repeating steps S3 to S10 until the termination frequency of the HIRF test is reached;

[0088] Step S12: Change the working mode of the electronic and electrical system under test, and repeat steps S3 to S11 until all working modes of the electronic and electrical system under test are reached; thereby completing the comprehensive lightning and HIRF protection performance evaluation of the electronic and electrical system. The lightning and HIRF comprehensive effect test device constructed based on the anechoic chamber environment can solve the problem that the existing lightning and HIRF comprehensive effect test device cannot accurately analyze and evaluate the equipment and system under different polarization directions and different irradiation angles due to the randomness of the polarization direction and the isotropy of the irradiation angle in the reverberation chamber HIRF environment. The problems of the combined effects of lightning and HIRF and the limitation of lightning test waveforms can be solved. Through the synchronous position adjustment component 24, the antenna 23 and the electric field sensor 28 can be synchronously adjusted in the three-dimensional space of up and down, left and right, and front and back. It has good compatibility and simple engineering implementation. It can support system-level lightning and HIRF combined effect testing in HIRF environments under different polarization modes and irradiation angles and various lightning waveforms. It can solve the unknown problem of the comprehensive lightning and HIRF protection performance of the aircraft's electronic and electrical systems, and can reduce the potential risks of safe flight of aircraft in lightning and HIRF environments.

[0089] In an optional embodiment of the present invention, Figure 4 and Figure 7As shown, the synchronous position adjustment component 24 includes a bracket group 2401, a motor 1 2402 fixedly connected to the bracket group 2401, a screw rod 1 2403 and a limit slide 2404 symmetrically connected to the bracket group 2401, a limit slide 2405 connected between the screw rod 1 2403 and the limit slide 2404, a motor 2 2406 fixedly connected to the limit slide 2405, a screw rod 2407 movably connected to the limit slide 2405, a limit slide 2408 slidably connected to the limit slide 2405, a motor 3 2409 and a limit column 2410 fixedly connected to the limit slide 2408, a screw rod 3 2411 movably connected to the limit slide 2408, and a limit plate 2410 connected to the limit slide 2408. The sliding support plate 2412 on the limiting column 2410, the fixed support rod 2413 fixedly connected to the sliding support plate 2412 and the fixed support plate 2414 fixedly connected to the other end of the fixed support rod 2413, the screw rod 1 2403, the screw rod 2407 and the screw rod 3 2411 are respectively connected to the output shaft ends of the motor 1 2402, the motor 2406 and the motor 3 2409, the limiting slide rail 2405, the limiting slide seat 2408 and the sliding support plate 2412 are respectively threadedly connected to the screw rod 1 2403, the screw rod 2407 and the screw rod 3 2411, the electric field sensor 28 is connected to the fixed support plate 2414, and the fixed support plate 2414 is provided with an adapter hole for the limiting column 2410 and the screw rod 3 2411 to pass through.

[0090] It should be noted that, as mentioned above, when the positions of the antenna 23 and the electric field sensor 28 in the radio wave darkroom 1 are adjusted by the synchronous position adjustment component 24, the motor 1 2402 can be used to drive the screw rod 1 2403 to rotate, and one end of the limiting slide 2405 is threadedly connected to the screw rod 1 2403, and the other end thereof is slidably connected to the limiting slide 2404. Therefore, when the screw rod 1 2403 rotates, the limiting slide 2405 whose movement direction is restricted can only move along the X-axis under the drive of the screw rod 1 2403, and when the limiting slide 2405 moves, it can drive the motor 2 2406, screw rod 2407, limiting slide 2408, motor 3 2409, limiting column 2410, screw rod 3 2411, sliding support plate 2412, fixed support rod 2413, and fixed support plate 2414 connected thereto to move in the same direction and at the same distance, thereby simultaneously driving the antenna 23 and the electric field sensor 2 8 moves synchronously along the X-axis, and when the motor 2406 drives the screw rod 2407 to rotate, the limiting slide 2408 slidably connected to the limiting slide rail 2405 can be driven to move along the Y-axis, thereby driving the motor 3 2409, the limiting column 2410, the screw rod 3 2411, the sliding support plate 2412, the fixed support rod 2413, and the fixed support plate 2414 connected thereto to move in the same direction and at the same distance, thereby achieving the effect of driving the antenna 23 and the electric field sensor 28 to move synchronously along the Y-axis, and when the motor 3 2409 drives the screw rod 3 2411 to rotate, the sliding support plate 2412, the moving direction of which is cooperatively restricted by the limiting column 2410 and the screw rod 3 2411, can only move along the Z-axis, and drive the fixed support rod 2413 and the fixed support plate 2414 connected thereto to move synchronously, thereby achieving the effect of achieving the effect of synchronous movement of the antenna 23 and the electric field sensor 28 along the Z-axis;

[0091] It should be noted that the specific structure and / or material and / or size and / or position of the above-mentioned bracket group 2401, screw rod 1 2403, limiting slide 2404, limiting slide rail 2405, screw rod 2407, limiting slide 2408, limiting column 2410, screw rod 3 2411, sliding support plate 2412, fixed support rod 2413, and fixed support plate 2414 in the radio wave darkroom 1 can be adjusted according to the experimental design parameters, and motor 1 2402, motor 2406, and motor 3 2409 are all treated with anti-electromagnetic interference to prevent the electromagnetic radiation they may generate from interfering with the HIRF radiation environment.

[0092] In an optional embodiment of the present invention, Figure 2 and Figure 6 As shown, an irradiation angle adjustment mechanism 7 is connected between the sliding support plate 2412 and the antenna 23, and the irradiation angle adjustment mechanism 7 is used to adjust the irradiation angle of the antenna 23;

[0093] The irradiation angle adjustment mechanism 7 includes a rotating shaft 701 movably connected to the sliding support plate 2412, a ring gear 702 fixedly connected to the outer wall of the rotating shaft 701, a motor four 703 fixedly connected to the sliding support plate 2412, a gear 704 connected to the output shaft end of the motor four 703, a gear 704 fixedly connected to the rotating shaft 701, a motor five 706 fixedly connected to the articulated frame 705, and a hinged plate 707 hinged to the articulated frame 705. The hinged plate 707 is fixedly connected to the antenna 23, the ring gear 702 is engaged with the gear 704, and the output shaft end of the motor five 706 is fixedly connected to the hinged plate 707.

[0094] It should be noted that, as mentioned above, when adjusting the irradiation angle, the gear 704 can be driven to rotate by the motor four 703, and when the gear 704 rotates, the gear ring 702 can be driven to rotate. When the gear ring 702 rotates, the rotating shaft 701, the articulated frame 705, the motor five 706, the articulated plate 707 and the antenna 23 can be driven to rotate in the same direction and at the same angle. The motor five 706 can drive the articulated plate 707 to rotate around the axis of the hinge with the articulated frame 705 to set the angle, thereby adjusting the specific irradiation angle of the antenna 23.

[0095] In an optional embodiment of the present invention, Figure 2 、 Figure 4 and Figure 5 As shown, a telescopic isolation mechanism 5 is connected between the sliding support plate 2412 and the limiting slide 2408, between the motor three 2409 and the radio wave darkroom 1, between the antenna 23 and the radio wave darkroom 1, and between the electric field sensor 28 and the far end 27 of the photoelectric converter. The telescopic isolation mechanism 5 includes a telescopic isolation sleeve 502 and a through hole 501 connected to the internal space of the telescopic isolation sleeve 502. The through hole 501 is provided on the limiting slide 2408 or the radio wave darkroom 1 or the far end 27 of the photoelectric converter.

[0096] It should be noted that, as mentioned above, the antenna 23 and the electric field sensor 28 need to be position adjusted. The motor 1 2402, motor 2406, motor 3 2409, motor 4 703 and motor 5 706 in the synchronous position adjustment component 24 are all in a movable state, so that the telescopic isolation mechanism 5 is used to wrap the power supply line of the above-mentioned electrical components. On the one hand, the electromagnetic radiation that may be generated by it is processed to prevent it from affecting the HIRF radiation environment. On the other hand, its shape during movement can be constrained to prevent the power supply line from affecting other structures. In addition, the telescopic structure can prevent the power supply line from being mostly spread on the inner wall of the radio wave darkroom 1. If a protective layer that follows the shape of the power supply cable is used for covering, its position and shape cannot be constrained. This method will cause distributed capacitance to form between the protective layer and the absorbing material on the inner wall of the radio wave darkroom 1, thereby causing interference with the measurement results.

[0097] In an optional embodiment of the present invention, Figure 2 、 Figure 4 and Figure 5 As shown, a pressure regulating mechanism 6 is connected between the motor three 2409 and the radio wave darkroom 1. The pressure regulating mechanism 6 includes a telescopic isolation sleeve two 601, a plurality of air holes one 602 provided on the telescopic isolation sleeve two 601, a plurality of air holes two provided on the telescopic isolation sleeve one 502, and an air pressure regulator provided outside the radio wave darkroom 1. The air holes one 602 and the air holes two do not overlap. The inner walls of the telescopic isolation sleeve one 502, the telescopic isolation sleeve two 601 and the radio wave darkroom 1 are all provided with absorbing materials. The telescopic isolation sleeve two 601 is provided on the outside of the telescopic isolation sleeve one 502. The air pressure regulator is used to obtain and adjust the air pressure parameters inside the radio wave darkroom 1.

[0098] It should be noted that, as mentioned above, the telescopic isolation sleeve 1 502 will cause the air pressure inside the anechoic chamber 1 to change when it is stretched or compressed. In order to keep the pressure inside the anechoic chamber 1 at a set value, a telescopic isolation sleeve 2 601 is installed on the outside of one of the telescopic isolation sleeves 1 502, and air hole 1 602 and air hole 2 are respectively opened on the telescopic isolation sleeve 2 601 and the telescopic isolation sleeve 1 502. The air pressure change value in the anechoic chamber 1 is obtained by the air pressure sensor in the air pressure regulator, and the air pressure in the anechoic chamber 1 is adjusted by the air pump in the air pressure regulator, so that the air pressure inside the anechoic chamber 1 can be dynamically adjusted in the process of adjusting the position of the antenna 23 and the electric field sensor 28 by following the synchronous position adjustment component 24, thereby reducing the test interference factors and improving the accuracy of the test data. At the same time, by changing the air pressure in the anechoic chamber 1, the real simulation degree can be improved, which can further improve the authority and accuracy of the test data.

[0099] The above describes this embodiment, but this embodiment is not limited to the above-mentioned specific implementation methods. The above-mentioned specific implementation methods are merely illustrative and not restrictive. Ordinary technicians in this field can also make many forms based on the inspiration of this embodiment, all of which are protected by this embodiment.

Claims

1. A lightning and HIRF system-level comprehensive effect test device, characterized in that: include: Anechoic chamber, which is used to provide a HIRF radiation sensitivity test environment for the electronic and electrical systems under test; A test monitoring module includes an EUT measuring instrument and a line impedance stabilization network located in the anechoic chamber, wherein the EUT measuring instrument and the line impedance stabilization network are both electrically connected to a test cable on the electronic and electrical system under test; A lightning indirect effect test module, comprising a transient signal generator, an oscilloscope, a lightning injection probe, a lightning current monitoring probe, and a lightning voltage detection ring, all located in an anechoic chamber. The lightning injection probe and lightning current monitoring probe are sequentially located on the cable under test. The HIRF sensitivity test module includes a radiation signal generator, a radio frequency amplifier, a receiver, a near-end photoelectric converter located outside the anechoic chamber, a synchronous position adjustment component located inside the anechoic chamber, a far-end photoelectric converter, and an antenna and an electric field sensor located on the synchronous position adjustment component. The synchronous position adjustment component is used to adjust the three-dimensional coordinate data of the antenna in the anechoic chamber and drive the electric field sensor to move synchronously with the antenna. The integrated control terminal, the accompanying test monitoring module, the lightning indirect effect test module and the HIRF sensitivity test module are all electrically connected to the integrated control terminal.

2. A lightning and HIRF system-level comprehensive effect test device according to claim 1, characterized in that: The antenna, radio frequency amplifier and radiation signal generator are electrically connected in sequence, and the radiation signal generator is used to output a set HIRF radiation sensitivity test signal to the radio frequency amplifier; The radio frequency amplifier is used to amplify the input HIRF radiation sensitivity test signal and transmit it to the antenna; The antenna is used to radiate electromagnetic energy to the electronic and electrical system under test.

3. The lightning and HIRF system-level comprehensive effect test device according to claim 1, characterized in that: The electric field sensor is electrically connected to the far end of the photoelectric converter, and the near end of the photoelectric converter is electrically connected to the receiver. The far end of the photoelectric converter and the near end of the photoelectric converter are connected by an optical fiber. The electric field sensor is used to measure the field strength data at a set position near the electronic and electrical system under test; The photoelectric converter is used at the far end to convert the electrical signal into an optical signal; The proximal end of the photoelectric converter is used to convert the optical signal into an electrical signal; The receiver is used to measure the calibration field strength data received by the electric field sensor and the field strength data monitored during the test.

4. The lightning and HIRF system-level comprehensive effect test device according to claim 1, characterized in that: The lightning injection probe is electrically connected to the transient signal generator, and the lightning current monitoring probe and the lightning voltage detection ring are both electrically connected to the oscilloscope; The lightning voltage detection ring is used to detect the lightning voltage injection signal in the tested cable; The transient signal generator is used to generate a set test level and adjust the waveform parameters of the test level; The lightning injection probe is used to couple and inject the test level into the tested cable; The lightning current monitoring probe is used to monitor the lightning current injection signal in the tested cable.

5. The lightning and HIRF system-level comprehensive effect test device according to claim 1, characterized in that: The synchronous position adjustment assembly includes a bracket group, a motor 1 fixedly connected to the bracket group, a screw rod 1 and a limit slide symmetrically connected to the bracket group, a limit slide rail connected between the screw rod 1 and the limit slide rail, a motor 2 fixedly connected to the limit slide rail, a screw rod 2 movably connected to the limit slide rail, a limit slide seat slidably connected to the limit slide rail, a motor 3 and a limit column fixedly connected to the limit slide rail, a screw rod 3 movably connected to the limit slide, a sliding support plate slidably connected to the limit column, a fixed support rod fixedly connected to the sliding support plate, and a fixed support plate fixedly connected to the other end of the fixed support rod, the screw rod 1, screw rod 2, and screw rod 3 are respectively connected to the output shaft ends of the motor 1, motor 2, and motor 3, the limit slide rail, the limit slide and the sliding support plate are respectively threadedly connected to the screw rod 1, screw rod 2, and screw rod 3, the electric field sensor is connected to the fixed support plate, and the fixed support plate is provided with an adapter hole for the limit column and the screw rod 3 to pass through.

6. The lightning and HIRF system-level comprehensive effect test device according to claim 5, characterized in that: An irradiation angle adjustment mechanism is connected between the sliding support plate and the antenna, and the irradiation angle adjustment mechanism is used to adjust the irradiation angle of the antenna.

7. The lightning and HIRF system-level comprehensive effect test device according to claim 6, characterized in that: The irradiation angle adjustment mechanism includes a rotating shaft movably connected to the sliding support plate, a gear ring fixedly connected to the outer wall of the rotating shaft, a motor four fixedly connected to the sliding support plate, a gear connected to the output shaft end of the motor four, a gear fixedly connected to the rotating shaft, a motor five fixedly connected to the articulated frame, and a hinged plate hinged to the articulated frame, the hinged plate is fixedly connected to the antenna, the gear ring is engaged with the gear, and the output shaft end of the motor five is fixedly connected to the articulated plate.

8. The lightning and HIRF system-level comprehensive effect test device according to claim 7, characterized in that: A telescopic isolation mechanism is connected between the sliding support plate and the limiting slide, between motor three and the radio wave darkroom, between the antenna and the radio wave darkroom, and between the electric field sensor and the far end of the photoelectric converter. The telescopic isolation mechanism includes a telescopic isolation sleeve and a through hole connected to the internal space of the telescopic isolation sleeve. The through hole is provided on the limiting slide or the radio wave darkroom or the far end of the photoelectric converter.

9. The lightning and HIRF system-level comprehensive effect test device according to claim 8, characterized in that: A pressure regulating mechanism is connected between the motor three and the radio wave darkroom, and the pressure regulating mechanism includes a telescopic isolation sleeve two, a plurality of air holes one provided on the telescopic isolation sleeve two, a plurality of air holes two provided on the telescopic isolation sleeve one, and an air pressure regulator provided outside the radio wave darkroom, the air holes one and the air holes two do not overlap, the telescopic isolation sleeve one, the telescopic isolation sleeve two and the inner wall of the radio wave darkroom are all provided with absorbing materials, the telescopic isolation sleeve two is provided on the outside of the telescopic isolation sleeve one, and the air pressure regulator is used to obtain and adjust the air pressure parameters inside the radio wave darkroom.

10. A lightning and HIRF system-level comprehensive effect test method, characterized in that: A lightning and HIRF system-level comprehensive effect test device according to any one of claims 1 to 9 is used, comprising the following steps: Step S1, building an anechoic chamber, a test monitoring module, a lightning indirect effect test module, and a HIRF sensitivity test module; Step S2: Performing a HIRF radiation sensitivity test field strength calibration in the range of 100 MHz to 18 GHz, calibrating the transient signal generator at a specified test level, and recording the voltage waveform when the calibration loop is open and the current waveform when the calibration loop is short-circuited; Step S3: Power on the electronic and electrical system under test, select an operating mode, and keep the electronic and electrical system under test in a stable operating state; Step S4: For an electrical and electronic system under test that cannot be fully covered by the overall HIRF irradiation, the 3dB beamwidth of the antenna is calculated based on the size of the electrical and electronic system under test and the HIRF test distance. The displacement step of the antenna is calculated based on the 3dB beamwidth of the antenna. A single-antenna equivalent test is performed, and a synchronous position adjustment component is used to control the single displacement of the antenna to not exceed the 3dB beamwidth. Step S5: Set the frequency, polarization mode, and irradiation angle of the HIRF radiation sensitivity test and start the test. Simultaneously, start the transient signal generator to inject a lightning test level into the cable under test during the dwell time at each HIRF test frequency point. For the single return stroke test, at least ten transient signals shall be applied, and the longest interval between the applied single return stroke transient signals shall not exceed one minute; For the multiple return stroke test, at least ten multiple return stroke transient signals are applied, and the maximum interval between the multiple return stroke transient signals does not exceed five minutes; For the multiple pulse set test, a multiple pulse set was applied every three seconds for at least five minutes; Step S6, change the transient signal generator output polarity, repeat step S5; Step S7, for each tested cable, repeat steps S5 to S6; Step S8, adjust the position of the antenna, the electric field sensor moves the same, repeat steps S4 to S7; Step S9, change the antenna's radiation angle, repeat steps S4 to S8; Step S10, change the polarization of the antenna, repeat steps S4 to S9; Step S11, changing the frequency of the HIRF sensitivity test, and repeating steps S3 to S10 until the termination frequency of the HIRF test is reached; Step S12: Change the operating mode of the electronic and electrical system under test, and repeat steps S3 to S11 until all operating modes of the electronic and electrical system under test are reached.

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